TW201305584A - 高速可控制負載 - Google Patents

高速可控制負載 Download PDF

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TW201305584A
TW201305584A TW101121416A TW101121416A TW201305584A TW 201305584 A TW201305584 A TW 201305584A TW 101121416 A TW101121416 A TW 101121416A TW 101121416 A TW101121416 A TW 101121416A TW 201305584 A TW201305584 A TW 201305584A
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waveform
current
controllable load
voltage
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TWI565956B (zh
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Paul W Brazis Jr
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Underwriters Lab Inc
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    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3272—Apparatus, systems or circuits therefor
    • G01R31/3274—Details related to measuring, e.g. sensing, displaying or computing; Measuring of variables related to the contact pieces, e.g. wear, position or resistance
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/327—Testing of circuit interrupters, switches or circuit-breakers
    • G01R31/3271—Testing of circuit interrupters, switches or circuit-breakers of high voltage or medium voltage devices
    • G01R31/3272—Apparatus, systems or circuits therefor

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)

Abstract

一種高速可控制負載使用電壓波形合成器及驅動電路來動態控制電氣可變負載，以便生成流經受試電弧故障斷路器(AFCI)設備之電流。感測器可用於監測源電壓及輸出電流，以便生成具有一系列電壓及電流相移之任意波形。光隔離電路使控制級與受試AFCI設備之間之接地分離。

Description

高速可控制負載
本專利係針對電氣波形之生成。詳言之，本專利係針對一種可用於測試電弧故障斷路器之高速可控制負載。
商業及居住環境中已廣泛認可接地故障斷路器(GFCI)，其用於在電路之火線與零線之間發生電流不平衡時切斷電流。另一日漸受關注之電氣保護設備為電弧故障斷路器(AFCI)。AFCI偵測電路中之起弧，該起弧可能主要由插座中之線路鬆動、電線損壞或裝置中之故障接線導致。當偵測到起弧條件，AFCI斷開電路，從而對防止起弧發展成火災提供某種程度之保護。
對AFCI之測試可分為幾大類，包括線尾測試、自測試及效能測試。在製造製程中執行線尾測試以確認AFCI設備之運作。此類環境中之測試儀僅需提供適合電弧故障之任何特性的電弧或波形，以導致正常運作之AFCI啟用。相似地，自測試要求生成將觸發運作中之AFCI的任何單一波形。
另一方面，效能測試應就寬泛範圍內的具有良好重複性之電弧故障條件而測試AFCI，以使得可準確地特徵化AFCI之設計及實施。
大多數線尾測試儀及一些效能測試儀使用機械技術來使用電纜之預備樣本實質地引起物理電弧，或使用其他技術來實現。雖然此舉在提供真實電弧方面為有效的，但既未 提供一系列電弧線圖，亦未提供用於效能測試之可重複測試環境。
本揭示案之一態樣提供一種高速可控制負載，其使用可控制電阻器及控制級來允許重複生成全部範圍內之電弧線圖。使用類比電壓波形來驅動可控制電阻器以使得所要量之電流流經受試AFCI設備。可控制電阻器能夠吸收自0至約500 A rms之電流。為重現複雜之電弧線圖，生成類比電壓波形之控制級提供對自約1 Hz至100 MHz以上之頻率之低失真響應。
輸出電流及電壓感測器允許波形驗證。輸入電壓上之跨零偵測器允許藉由定時源電壓跨零點之可控制電阻器之電阻改變以模擬寬泛範圍內之無功負載。高速可控制負載可使用多相電源以模擬源電壓跨零時需要非零電流之無功負載。
雖然以下文字闡述眾多不同實施例之詳細描述，應瞭解，描述之法律範疇係由本揭示案末尾闡述之申請專利範圍的措辭界定。此詳細描述應被解釋為僅為示範性的，且並未描述每個可能之實施例，因為描述每個可能之實施例即使可能，亦不切實際。使用當前技術或本專利的申請日之後研發的技術實施眾多替代實施例將仍屬於申請專利範圍之範疇。
亦應瞭解，除非使用句子「如本文所使用的，術語 『＿＿＿』此處界定為意謂...」或類似句子明確界定術語，否則本揭示案無意明確或暗示限制該術語之含義超出其簡單或普通含義，且此類術語不應被解釋為受限於基於本專利之任何部分所作之任何陳述之範疇(申請專利範圍之語言除外)。就本專利中以與單一含義一致之方式引用本專利末尾之申請專利範圍列舉之任何術語，如此僅為清晰起見以不使讀者混淆，且並不期望暗示或以其他方式將此術語限制於單一含義。最後，除非藉由措辭「手段」及未列舉任何結構之功能界定申請專利範圍元素，否則並不期望基於美國專利法第112條第6款的規定解釋任何申請專利範圍元素之範疇。
圖1展示與示範性電弧故障100相關聯之電壓102及電流104。波形之初始部分106展示起弧條件之前的標稱電壓及電流。在起弧事件期間，典型特徵元素包括具有極高頻分量108及高電流尖峰110之限幅電壓。
頻域考量
起弧會引發非常寬之頻寬範圍內的噪聲。大多數AFCI在高千赫茲(KHz)範圍內尋找起弧，但有研究表明更高頻率(諸如，超過1 MHz)下也存在顯著噪聲。因此，有必要特徵化頻域中之波形。然而，起弧事件在時間上為不連續的；例如，僅在超出起弧電壓之後起弧才會開始，且一旦電壓低於保持電弧所必要之最小值，電弧將熄滅。因此，電弧之寬頻噪聲特性僅在起弧存在之時間框架期間可觀測到，且在電弧熄滅期間就消失。
此特性可出現於電流波形104之「肩部」，但一般電路，諸如調光器電路中亦可能產生此等肩部，所以這本身並非電弧故障之足夠證據。除了行為上之此等週期性不連續外，起弧事件亦可包括暫態或其他非週期行為。此等特性推翻假設週期及連續行為之任何分析，諸如對波形之單個快速傅立葉轉換(FFT)。這將導致由FFT之取暫態及其他不連續之平均值的傾向所引起之誤差，且阻止了對此不連續行為之性質的進一步調查。然而，若需要關於電弧波形之頻譜的一般資訊(亦即，確定所需之訊號重現頻寬，或評估波形之間電弧訊號的統計變化)，只要記住生成之頻譜係整個波形之平均表示，則包含整個波形之簡單FFT即足夠。
時域考量
雖然電弧之頻域分析可揭示關於起弧事件之大量資訊，但時域分析對起弧分析而言亦至關重要。由於起弧相對於電源電壓之相位趨於熄滅及再起弧，僅可得大量時域資訊。自20世紀20年代以來已報導電弧建模之努力，文獻中亦有關於電弧建模之演進的廣泛評論。隨著分析工具於過去數十年之發展，此等模型日漸趨於描述性且變得愈加複雜。Kaufman及Page於1960年之研究採用了假設純電感負載及具有一假設值之恆定電弧電壓(對277 V rms系統而言為140 V)之電弧模型。以後之研究增加了複雜阻抗模型，隨後又增加了對作為電弧電流與間隙寬度之函數之電弧電壓的估計。現代電弧建模以Matthews模型(參見J.H. Matthews，Introduction to the Design and Analysis of Building Electrical Systems,New York：Van Nostrand Reinhold，1993年)為代表，其係基於電阻感應系統之廣義瞬時電弧模型。根據此模型，複雜電路之電弧故障藉由以下微分方程描述：
電弧電流之通解為： 其中V max =正弦電源電壓峰值
i arc =瞬時電弧電流
R=系統之負載電阻
L=系統負載電感
Z=系統負載阻抗
ω=系統頻率(弧度/秒)
=阻抗角
V arc =電弧電壓
t=時間
t arc =電弧電流開始流動之時刻
m=電弧電壓與峰值電壓之比(V arc/V max)
許多電弧測試儀使用機械手段使導體靠近以引起電弧。當在此真實電弧期間活動之AFCI滿足最低標準時，此類測試不進行特徵化一系列電弧條件之動作，亦不允許測試可 導致AFCI誤觸發(稱為干擾跳脫(tripping))的非電弧負載，諸如真空吸塵器或調光器。
圖2係根據本揭示案製造之電弧故障測試儀200之方塊圖，該電弧故障測試儀200能夠再現一系列用於在模擬電弧故障存在時進行跳脫驗證及在干擾環境中進行持續運作驗證之波形。
電弧故障測試儀200可包括儲存於非揮發性之儲存裝置(諸如，硬體或快閃驅動器)上之波形庫202。波形庫202可包含對應於電弧故障線圖及干擾負載線圖的電弧故障及干擾負載波形。可使用任何數目之波形格式儲存波形。一示範性格式為由National Instruments Corporation開發以用於其LabviewTM產品的流線化TDM(TDMS)格式。
波形生成器204可為現貨產品，其能夠根據儲存於波形庫202之波形檔案重現波形。安裝於電腦上之美國國家儀器公司(National Instruments)生產的PXI平臺或其他波形生成器適合此功能。
可使用波形同步電腦205協調測試電源跨零時來自波形生成器204之波形的時間。波形同步電腦205可使用來自控制級206之輸入，諸如邊緣在電壓跨零處之方波以供觸發波形生成器204。
控制級206可接收來自波形生成器204之波形。此外，控制級206可將受試AFCI設備216中之波形與來自波形生成器204之波形比較，且基於比較而生成輸出訊號，下文將進行更詳細描述。控制級206可以離散組件實施或可經由具 有儲存於非揮發性記憶體(未示出)中之對應程式的數位訊號處理器(DSP)實施。
控制級206之輸出可饋入光隔離級208，該光隔離級208允許分離控制級接地210及測試裝置接地212。光隔離級208亦可包括用於可控制負載218之驅動電路，其提供略負電壓以充分關閉可控制負載FET設備至+12 V之直流位準，以便確保可控制負載FET設備充分開啟。雖然測試在進行中，但測試電源本質上係有測試「雜質」的，故光隔離允許控制電路以純淨電源運作。或者，寬泛範圍內之電壓輸出可直接驅動將浮動接地作為測試電源之零線基準的輸出級。
以測試裝置接地212為基準之電源214，可耦接至受試AFCI設備216。電壓感測器220、222及電流感測器224可耦接至提供輸出訊號至控制級206及測試結果資料日誌228的感測電路226。當然，對於與耦接電壓相關聯之感測器及電路以及至控制級206及波形同步電腦205之電流資訊的佈置僅為一種可能之配置。一般技藝人士將易瞭解其他佈置，包括將感測電路226之所有元件與控制級相結合。電源214之供電連接可耦接至受試AFCI設備216及經由完成測試電路之測試裝置接地212的回程連接(未示出)。
運作時，控制級206經由感測電路226取得來自電源214及受試AFCI設備216的電壓及電流資訊，且使用該資訊在適合之起始時間提供觸發波形生成器204之資訊，且結合該等訊號以生成用於可控制負載218之驅動訊號。
在任何測試系列期間，受試AFCI設備216可呈現表示正常及異常運作條件的具有高度重複性之各種波形，使得可在設備之間執行統一及一致測試達一段時間。
圖3A係示出諸如圖2之電弧故障測試儀200之控制級206的控制級之一部分300的示範性電路。
控制級部分300可包括波形緩衝/增益級302及電流感測緩衝/增益級304。每一電路302、304提供各自之高阻抗輸入端306、308及各自之位準調整器310、312。組合器電路314結合波形與電流感測訊號以在輸出端316提供差動訊號。點316處之訊號表示在受試AFCI設備216中獲得所要波形所要求的可控制負載218之電流改變。
圖3B係示出諸如圖2之電弧故障測試儀200之控制級206的控制級之另一部分318的示範性電路。部分318可使用位準偏移電路320及調整電路322來執行圖3A之點316(『A』)處之訊號的位準偏移。當使用這種電路時，『B』之訊號可提供至光隔離級208。
在一些實施例中，控制級206中可包括100 MHz以上頻寬之高速運算放大器，以便可準確重現測試電弧線圖波形之細微處。
圖3C係示出諸如圖2之電弧故障測試儀200之控制級206的控制級之另一部分324的示範性電路。在一些實施例中，此電路之部分或全部可與感測電路226合併。在示範性實施例中，變壓器326將測試電源輸入電壓耦接至電壓監測器328。在此實施例中可調整實際輸出電壓位準。可 藉由(例如)上述波形同步電腦205於點330處提供及使用具有對應於測試電源電壓跨零之過渡的方波。
圖4係代表性及示範性之隔離電路400。隔離電路400可用於在使接地分離之同時傳遞訊號，如圖2之光隔離級208所示。示範性隔離電路400具有輸入級402、前置放大級404、驅動級406及功率輸出級408。輸入級402及前置放大級404經由光耦合器410耦合訊號。光耦合器410提供準確之訊號傳輸，同時允許前置放大級404中之輸入級402依靠獨立電源運作且使用獨立接地。
光耦合器解決方案允許自小於10 Hz至大於10 MHz之訊號頻寬，然而欲使用其他隔離技術(諸如，變壓器)實現此方案，即使可能亦將很困難。
功率輸出級408之接地基準浮動於約60 V交流電壓且可當測試側電源412浮動於電源214訊號時介於+/- 120 V範圍內變化。如上所述，電容耦合驅動級406允許輸出略負。10K ohm可調偏壓電阻器使輸出相對於測試裝置接地212產生偏移。在一實施例中，輸入級402、前置放大級404及驅動級406之電晶體可為2N3904電晶體。
圖5係諸如圖2之可控制負載218之可控制負載500的實施例。可控制負載500可具有一或多個電流級502。在所描繪之實例中，可控制負載218包括三個電流級502a、502b及502c。每一電流級502可包括一或多個電阻器504、506及一對N型FET 508、510。因為可能需要每一電流級502傳遞高達30 A或更高之電流。在本實例中，當FET 508、510充 分啟用時，每級皆具有3 ohm之電阻。所示之具有三個電流級502之實施例中，負載呈現1 ohm之總電阻。由於每一電流級502之電流能力極高，故本示範性設計之1.5 ohm電阻各自的額定功率為5 kW。若需要增加可控制負載500之額定電流，可增加額外之電流級，從而既增加了可用之電流處理能力，亦減少了有效串聯電阻。在本示範性實施例中，FET 508及510可為IXFB 100N50P設備或等效設備。使用此等或類似設備使可控制負載於約1微秒或更短之時間內執行電流改變。
電阻器512藉由使FET柵極電容放電以加快FET之速度。對於一些FET來說，欲達到所要之開關時間並非必須這樣做。受試AFCI設備216可連接至終端514。零線連接516及接地連接518經由隔離電路400與系統接地及電源隔離。電流感測器520可為環形變壓器，且可用於反饋至控制級206及用於將測試資料記錄至資料日誌228。
可藉由簡單調整源電壓波形中各點之可控制負載500的電阻以調節電壓與電流之間的寬泛範圍的相位角。然而，以上所討論之單相裝置無法模擬每一可能之無功負載，因為當源電壓為零時沒有電流可流過AFCI。可藉由使用帶有相移源之可控制負載之組合以模擬全部範圍內之無功負載。
圖6係根據本揭示案之測試電弧故障斷路器(ACFI)216之一個簡化及代表性之方法600。
可能會生成表示電弧故障及干擾故障之許多波形。此等 波形可以波形格式儲存，諸如TDMS格式(方塊602)，其係為吾人所熟知之由美國國家儀器公司界定之檔案格式。
AFCI 216可與可控制負載218及電源214串聯(方塊604)。
可藉由擷取特定波形及生成對應於儲存波形之輸出波形開始測試序列(方塊606)。
波形可於控制級206(如圖2所示)轉換為控制訊號。在測試開始時，受試設備中無可用反饋訊號，且波形將用於設定可控制負載218中的初始電阻。在測試程序開始後，控制級206之比較器308可比較該波形與於AFCI量測到之觀測波形(方塊608)。
可生成對應於波形與觀測波形之間差異之電壓，以用於調整可控制負載218之電阻(方塊610)。
可響應於該電壓以調整可控制負載218之電阻，以便使電流流經可控制負載218及AFCI 216以重現AFCI 216之波形(方塊612)。
測試週期後，可確定AFCI 216對電流流經可控制負載之響應的正確性(方塊614)。可能有幾種結果出現。舉例而言，AFCI 216可正確響應實際電弧故障且跳脫；錯誤響應實際電弧故障且不跳脫；正確響應干擾波形且不跳脫；或錯誤響應干擾負載且跳脫；或可能根本無法運作。
可儲存展示施加於AFCI 216的波形之輸出波形，以便用於以後對資料日誌228進行驗證或統計分析(方塊616)。
所揭示之設備及方法表示用於AFCI驗證之可重複測試 儀及測試程序。可向受測AFCI設備提供高達500 A rms、具有1 MHz以上電弧線圖頻寬分量之極高電流測試，及一系列無功負載。相較引出實際電弧用於測試之機械測試儀，所揭示之設備及方法具有極大改進。
雖然上述文字闡述了本發明之許多不同實施例之詳細描述，但應瞭解，本發明之範疇係由本專利末尾闡述之申請專利範圍的措辭界定。此詳細描述應被解釋為僅為示範性的，且並未描述本發明之每個可能之實施例，因為描述每個可能之實施例即使可能，亦不切實際。使用當前技術或本專利的申請日之後研發之技術實施眾多替代實施例將仍屬界定本發明之申請專利範圍之範疇。
因此，可對本文所描述及說明之技術及結構做出許多修改及改變而不違背本發明之精神及範疇。因此，應瞭解，本文描述之方法及裝置僅供說明而並非對本發明之範疇之限制。
100‧‧‧電弧故障
102‧‧‧電壓
104‧‧‧電流
106‧‧‧波形之初始部分
108‧‧‧極高頻分量
110‧‧‧高電流尖峰
200‧‧‧電弧故障測試儀
202‧‧‧波形庫
204‧‧‧波形生成器
205‧‧‧波形同步電腦
206‧‧‧控制級
208‧‧‧光隔離級
210‧‧‧控制級接地
212‧‧‧測試裝置接地
214‧‧‧電源
216‧‧‧受試AFCI設備
218‧‧‧可控制負載
220‧‧‧電壓感測器
222‧‧‧電壓感測器
224‧‧‧電流感測器
226‧‧‧感測電路
228‧‧‧資料日誌
300‧‧‧控制級部分
302‧‧‧波形緩衝/增益級
304‧‧‧電流感測緩衝/增益級
306‧‧‧高阻抗輸入端
308‧‧‧高阻抗輸入端
310‧‧‧位準調整器
312‧‧‧位準調整器
314‧‧‧組合器電路
316‧‧‧輸出端
318‧‧‧控制級的另一部分
320‧‧‧位準偏移電路
322‧‧‧調整電路
326‧‧‧變壓器
328‧‧‧電壓監測器
330‧‧‧點
400‧‧‧隔離電路
402‧‧‧輸入級
404‧‧‧前置放大級
406‧‧‧驅動級
408‧‧‧功率輸出級
410‧‧‧光耦合器
412‧‧‧測試側電源
500‧‧‧可控制負載
502a‧‧‧電流級
502b‧‧‧電流級
502c‧‧‧電流級
504‧‧‧電阻器
506‧‧‧電阻器
508‧‧‧N型FET
510‧‧‧N型FET
512‧‧‧電阻器
514‧‧‧終端
516‧‧‧零線連接
600‧‧‧方法
602‧‧‧方塊
604‧‧‧方塊
606‧‧‧方塊
608‧‧‧方塊
610‧‧‧方塊
612‧‧‧方塊
614‧‧‧方塊
616‧‧‧方塊
圖1展示與示範性電弧故障關聯之示範性電壓及電流；圖2係電弧故障測試儀之方塊圖；圖3A係示出圖2之電弧故障測試儀之控制級一部分之示範性電路；圖3B係示出圖2之電弧故障測試儀之控制級另一部分之示範性電路；圖3C係示出圖2之電弧故障測試儀之控制級另一部分之示範性電路； 圖4係圖2之隔離電路之示範性電路；圖5係圖2之可控制負載之示範性電路；及圖6係測試電弧故障斷路器之方法之流程圖。
200‧‧‧電弧故障測試儀
202‧‧‧波形庫
204‧‧‧波形生成器
205‧‧‧波形同步電腦
206‧‧‧控制級
208‧‧‧光隔離級
210‧‧‧控制級接地
212‧‧‧測試裝置接地
214‧‧‧電源
216‧‧‧受試AFCI設備
218‧‧‧可控制負載
220‧‧‧電壓感測器
222‧‧‧電壓感測器
224‧‧‧電流感測器
226‧‧‧感測電路
228‧‧‧資料日誌

Claims (20)

  1. 一種用於測試一電弧故障斷路器(AFCI)之方法，該方法包括：儲存表示一電弧故障之一波形；將該AFCI及一可控制負載與一電源串聯；擷取該波形；及調整該可控制負載之一電阻以使一電流自該電源流經該可控制負載及該AFCI，以重現該AFCI之該波形。
  2. 如請求項1之方法，其中儲存該波形包括：儲存表示對應複數個電弧故障之複數個波形。
  3. 如請求項1至2中任一項之方法，其更包括：儲存於該AFCI量測之一電壓或電流中之一者的一輸出波形。
  4. 如請求項1至3中任一項之方法，其更包括：比較該波形與於該AFCI量測之一觀測波形；生成一電壓，其中該電壓對應於該波形與該觀測波形之間的差異；及使用該電壓調整該可控制負載之該電阻。
  5. 如請求項1至4中任一項之方法，其更包括：確定該AFCI是否正確響應於流經該可控制負載之該電流。
  6. 一種用於一電弧故障斷路器(AFCI)之測試儀，包含：一電源，其具有經調試以耦接至一AFCI之一第一AFCI連接的一供電連接及一經調試以耦接至一AFCI之 一第二AFCI連接之一回程連接；一可控制負載，其具有一輸入端、一輸出端及一控制連接，該輸入端經調試以耦接至該第二AFCI連接且該輸出端耦接至該電源之該回程連接；一波形生成器，其重現指示一電弧故障之波形；及一控制級，其耦接至該波形生成器及該可控制負載之該控制連接，其中該控制級導致響應於該波形生成器之一輸出的該可控制負載之一值的改變。
  7. 如請求項6之測試儀，其更包含一由該控制級使用之電流感測器，以驗證在該波形生成器之一電壓輸出之後的流經該可控制負載之一電流。
  8. 如請求項6至7中任一項之測試儀，其更包含一電壓感測器，以驗證該AFCI之電流與電壓間之一相角。
  9. 如請求項6至8中任一項之測試儀，其更包含一跨零偵測器，以捕獲該電源之一電壓的一跨零及極性。
  10. 如請求項6至9中任一項之測試儀，其中該控制級包含一光隔離級，其使該電源之一電氣接地與該波形生成器之一電氣接地分離。
  11. 如請求項6至10中任一項之測試儀，其中該可控制負載包含與至少一個功率場效應電晶體(FET)串聯之一高功率電阻器。
  12. 如請求項11之測試儀，其中該至少一個功率FET包含一N通道功率FET陣列。
  13. 如請求項11至12中任一項之測試儀，其中該至少一個功 率FET具有100 A之一額定電流。
  14. 如請求項6至13中任一項之測試儀，其中該控制級具有約0.7 Hz至約200 MHz之一類比頻寬。
  15. 如請求項6至14中任一項之測試儀，其更包含一波形庫，該波形庫儲存複數個指示複數個對應電弧故障之波形，且其中該波形生成器重現指示該等儲存波形之波形。
  16. 如請求項15之測試儀，其中每一儲存波形儲存為一流波形檔案。
  17. 一種用於測試一電弧故障斷路器(AFCI)之方法包括：提供一具有複數個儲存波形之波形庫，其中該複數個儲存波形中之每一者表示該AFCI之一測試條件；提供一與該波形庫通迅之波形生成器，其用於生成用於該AFCI之效能測試之該複數個波形中之一者；提供一耦接至該波形生成器之控制級，該控制級用於將該複數個波形中之一者轉換成一控制訊號；提供一可控制負載，其響應於該控制訊號而改變其電阻；將一AFCI耦接至該可控制負載及一電源；接受該控制級之該複數個儲存波形中之該一者；於該控制級生成該控制訊號，該控制訊號對應於該複數個儲存波形中之該一者；調整流經該可控制負載及該AFCI、與該控制訊號成比例之一電流；及 確定該AFCI響應於流經該可控制負載及該AFCI之該電流的方式。
  18. 如請求項17之方法，其更包括：經由將該控制級之一接地與該可控制負載之一接地分離的一光隔離級傳遞該控制訊號。
  19. 如請求項17至18中任一項之方法，其中提供該可控制負載包括：提供一可控制負載，其具有至少100 A之一額定電流及介於兩個電流位準之間改變的至少1微秒之一響應時間。
  20. 如請求項17至19中任一項之方法，其中確定該AFCI響應於流經該可控制負載及該AFCI之該電流的方式包括：確定該AFCI中斷具有電弧線圖之電流並傳遞具有干擾負載線圖之電流。
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US9869719B2 (en) 2018-01-16
US20170097391A1 (en) 2017-04-06
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US9551751B2 (en) 2017-01-24
US20120319709A1 (en) 2012-12-20

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