TW201300755A - Electronic device with vibration testing function and method for establishing vibration testing algorithm - Google Patents
Electronic device with vibration testing function and method for establishing vibration testing algorithm Download PDFInfo
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本發明關於一種具有振動測試功能之電子裝置及用以建立振動測試演算法之方法，尤指一種具有振動測試功能之電子裝置，其可用來測試電子裝置本身之振動力或其它電子裝置之振動力。The invention relates to an electronic device with vibration testing function and a method for establishing a vibration testing algorithm, in particular to an electronic device with vibration testing function, which can be used for testing the vibration force of the electronic device itself or the vibration force of other electronic devices. .
許多電子裝置，例如行動電話、個人數位助理、平板電腦等，皆具備振動功能。目前，電子裝置的振動測試無論是在生產檢驗時或是終端用戶使用時，均存在很多不足之處。舉例而言，在生產檢驗時，主要還是依賴專門的振動測試儀器來測試電子裝置之振動力是否正常。由於利用專門的振動測試儀器來測試需要花費龐大的儀器購置成本以及操作時間(一台振動測試儀器通常只能同時測試二至四台電子裝置)，導致無法對大量的電子裝置進行百分之百的檢驗，進而無法篩選出所有的不良品。此外，在終端用戶使用時，由於往往是靠使用者主觀感覺振動力的大小，在缺少客觀的判斷機制下，使用者比較難察覺振動功能是否正常。Many electronic devices, such as mobile phones, personal digital assistants, and tablets, have vibration capabilities. At present, there are many deficiencies in the vibration test of electronic devices, both during production inspection and when used by end users. For example, in production inspection, it is mainly dependent on a special vibration test instrument to test whether the vibration force of the electronic device is normal. Because the use of specialized vibration test instruments to test the cost of equipment purchase and operating time (a vibration test instrument can usually only test two to four electronic devices at the same time), it is impossible to conduct 100% inspection of a large number of electronic devices. Furthermore, it is impossible to screen out all the defective products. In addition, when the end user uses it, since the user often feels the magnitude of the vibration force subjectively, in the absence of an objective judgment mechanism, it is difficult for the user to perceive whether the vibration function is normal.
因此，本發明的目的之一在於提供一種具有振動測試功能之電子裝置及用以建立振動測試演算法之方法，以解決上述問題。Accordingly, it is an object of the present invention to provide an electronic device having a vibration testing function and a method for establishing a vibration testing algorithm to solve the above problems.
根據一實施例，本發明之具有振動測試功能之電子裝置包含一記憶單元、一振動感測單元、一顯示單元以及一處理單元，其中該處理單元電連接於該記憶單元、該振動感測單元與該顯示單元。該記憶單元用以儲存一振動測試演算法。該振動感測單元用以感測一振動力。該處理單元用以根據該振動測試演算法計算對應該振動力之一補償值，將該振動力與該補償值相加以產生一補償後振動力，並且將該補償後振動力顯示於該顯示單元上。According to an embodiment, the electronic device with vibration test function of the present invention comprises a memory unit, a vibration sensing unit, a display unit and a processing unit, wherein the processing unit is electrically connected to the memory unit, the vibration sensing unit With the display unit. The memory unit is used to store a vibration test algorithm. The vibration sensing unit is configured to sense a vibration force. The processing unit is configured to calculate a compensation value corresponding to the vibration force according to the vibration test algorithm, add the vibration force to the compensation value to generate a compensated vibration force, and display the compensated vibration force on the display unit on.
根據另一實施例，本發明之用以建立一振動測試演算法之方法包含：(a)以一預設振動力使一電子裝置產生振動；(b)利用一振動測試儀器感測關於該電子裝置之一第一振動力；(c)利用內建於該電子裝置中之一振動感測單元感測關於該電子裝置之一第二振動力；(d)判斷該第二振動力是否等於該第一振動力；(e)若該第二振動力不等於該第一振動力，計算該第一振動力與該第二振動力之一差值，以該差值修正該振動感測單元之感測演算法，並且回到步驟(a)；(f)若該第二振動力等於該第一振動力，重複步驟(a)至(d)，以複數個不同的預設振動力使該電子裝置產生振動，以計算複數個第一振動力與複數個第二振動力之複數個差值；以及(g)根據該等第二振動力與該等差值之對應關係，建立該振動測試演算法。According to another embodiment, the method for establishing a vibration test algorithm of the present invention comprises: (a) causing an electronic device to generate vibration with a predetermined vibration force; and (b) sensing the electronic device with a vibration test instrument. a first vibration force of the device; (c) sensing, by a vibration sensing unit built in the electronic device, a second vibration force about the electronic device; (d) determining whether the second vibration force is equal to the a first vibration force; (e) if the second vibration force is not equal to the first vibration force, calculating a difference between the first vibration force and the second vibration force, and correcting the vibration sensing unit with the difference Sensing the algorithm and returning to step (a); (f) if the second vibrational force is equal to the first vibrational force, repeating steps (a) through (d) to cause the plurality of different predetermined The electronic device generates vibration to calculate a plurality of differences between the plurality of first vibration forces and the plurality of second vibration forces; and (g) establishing the vibration test according to the correspondence between the second vibration forces and the difference values Algorithm.
綜上所述，本發明係提供用以建立振動測試演算法之方法，並且將此振動測試演算法安裝於電子裝置中，以使電子裝置具有振動測試功能。藉此，於生產大量的電子裝置時，即可利用每一台電子裝置之振動測試功能自動測試電子裝置本身的振動力大小，以對大量的電子裝置進行百分之百的檢驗。此外，使用者可利用電子裝置之振動測試功能來獲取電子裝置所產生之振動力數據，以了解所使用之電子裝置的實際振動強度。使用者亦可根據獲取的振動力數據與對應的使用感受來設定所需的振動強度。再者，使用者還可利用電子裝置之振動測試功能來測試其它電子裝置的振動強度。In summary, the present invention provides a method for establishing a vibration test algorithm, and the vibration test algorithm is installed in an electronic device to enable the electronic device to have a vibration test function. Therefore, when a large number of electronic devices are produced, the vibration test function of each electronic device can be used to automatically test the vibration force of the electronic device itself, so as to perform 100% inspection on a large number of electronic devices. In addition, the user can use the vibration test function of the electronic device to acquire the vibration force data generated by the electronic device to know the actual vibration intensity of the electronic device used. The user can also set the required vibration intensity based on the acquired vibration force data and the corresponding usage experience. Furthermore, the user can also use the vibration test function of the electronic device to test the vibration intensity of other electronic devices.
關於本發明之優點與精神可以藉由以下的發明詳述及所附圖式得到進一步的瞭解。The advantages and spirit of the present invention will be further understood from the following detailed description of the invention.
請參閱第1圖，第1圖為根據本發明一實施例之具有振動測試功能之電子裝置1的功能方塊圖。如第1圖所示，電子裝置1包含一記憶單元10、一振動感測單元12、一顯示單元14以及一處理單元16以及一振動單元18，其中處理單元16電連接於記憶單元10、振動感測單元12、顯示單元14與振動單元18。記憶單元10用以儲存振動測試演算法100以及其它必要的程式或資料。振動感測單元12用以感測一振動力。處理單元16用以根據振動測試演算法100計算對應振動感測單元12所感測的振動力之一補償值，將振動力與補償值相加以產生一補償後振動力，並且將補償後振動力顯示於顯示單元14上。振動單元18用以產生振動力。Please refer to FIG. 1. FIG. 1 is a functional block diagram of an electronic device 1 having a vibration test function according to an embodiment of the present invention. As shown in FIG. 1 , the electronic device 1 includes a memory unit 10 , a vibration sensing unit 12 , a display unit 14 , a processing unit 16 , and a vibration unit 18 . The processing unit 16 is electrically connected to the memory unit 10 and vibrates. The sensing unit 12, the display unit 14 and the vibration unit 18. The memory unit 10 is used to store the vibration test algorithm 100 and other necessary programs or materials. The vibration sensing unit 12 is configured to sense a vibration force. The processing unit 16 is configured to calculate a compensation value corresponding to the vibration force sensed by the vibration sensing unit 12 according to the vibration test algorithm 100, add the vibration force and the compensation value to generate a compensated vibration force, and display the compensated vibration force. On the display unit 14. The vibration unit 18 is used to generate a vibration force.
於實際應用中，電子裝置1可為行動電話、個人數位助理、平板電腦或其它電子裝置，記憶單元10可為非揮發性記憶體或其它資料儲存裝置，振動感測單元12可為三軸加速度感測器或其它振動感測器，顯示單元14可為液晶顯示器或其它顯示器，處理單元16可為具有資料運算處理功能之處理器或控制器，且振動單元18可為振動馬達或其它振動體。In an actual application, the electronic device 1 can be a mobile phone, a personal digital assistant, a tablet computer or other electronic device. The memory unit 10 can be a non-volatile memory or other data storage device, and the vibration sensing unit 12 can be a three-axis acceleration. For the sensor or other vibration sensor, the display unit 14 can be a liquid crystal display or other display, the processing unit 16 can be a processor or controller having a data processing function, and the vibration unit 18 can be a vibration motor or other vibrating body. .
請參閱第2圖，第2圖為根據本發明一實施例之用以建立振動測試演算法100之方法的流程圖。首先，執行步驟S10，以一預設振動力使電子裝置1產生振動。若電子裝置1本身不具有振動功能(亦即，電子裝置1中無設置振動單元18)，則將電子裝置1設置於一振動平台(未顯示)上，並且利用振動平台以預設振動力使電子裝置1產生振動。另一方面，若電子裝置1本身具有振動功能(亦即，電子裝置1中有設置振動單元18)，則利用內建於電子裝置1中之振動單元18(例如，振動馬達)以預設振動力使電子裝置1產生振動，其中預設振動力可藉由施加於振動單元18之工作電壓或電流來設定。Referring to FIG. 2, FIG. 2 is a flow chart of a method for establishing a vibration test algorithm 100 in accordance with an embodiment of the present invention. First, step S10 is performed to cause the electronic device 1 to vibrate with a predetermined vibration force. If the electronic device 1 itself does not have a vibration function (that is, the vibration unit 18 is not disposed in the electronic device 1), the electronic device 1 is disposed on a vibration platform (not shown), and the vibration platform is used to preset the vibration force. The electronic device 1 generates vibration. On the other hand, if the electronic device 1 itself has a vibration function (that is, the vibration unit 18 is provided in the electronic device 1), the vibration unit 18 (for example, a vibration motor) built in the electronic device 1 is used to preset the vibration. The force causes the electronic device 1 to generate vibration, wherein the preset vibration force can be set by an operating voltage or current applied to the vibration unit 18.
接著，執行步驟S12，利用一振動測試儀器(未顯示)感測關於電子裝置1之一第一振動力。同時，執行步驟S14，利用內建於電子裝置1中之振動感測單元12感測關於電子裝置1之一第二振動力。於實際應用中，振動感測單元12可為三軸加速度感測器，用來感測電子裝置於X、Y、Z三軸向上的加速度變化，通過放大和濾除雜訊後，再將類比數據轉換為數位數據，之後再輸出至電子裝置1之處理單元16，處理單元16即可根據牛頓第二運動定律(f=ma，其中f表示力，m表示振動體質量，a表示振動加速度)計算出上述之第二振動力。Next, step S12 is performed to sense a first vibrational force with respect to one of the electronic devices 1 using a vibration tester (not shown). At the same time, step S14 is executed to sense a second vibration force with respect to one of the electronic devices 1 by using the vibration sensing unit 12 built in the electronic device 1. In practical applications, the vibration sensing unit 12 can be a three-axis acceleration sensor for sensing the acceleration changes of the electronic device in the three axial directions of X, Y, and Z. After amplifying and filtering the noise, the analogy is performed. The data is converted into digital data, and then output to the processing unit 16 of the electronic device 1, and the processing unit 16 can be based on Newton's second law of motion (f=ma, where f is the force, m is the vibration mass, and a is the vibration acceleration). The second vibration force described above is calculated.
接著，執行步驟S16，判斷第二振動力是否等於第一振動力。於實際應用中，可利用電腦、電子裝置本身或人工進行判斷，視實際應用而定。若第二振動力不等於第一振動力，則執行步驟S18，計算第一振動力與第二振動力之一差值，以此差值修正振動感測單元12之感測演算法，並且回到步驟S10。舉例而言，若振動測試儀器感測關於電子裝置1之第一振動力為10N，且振動感測單元12感測關於電子裝置1之第二振動力為8N，則第一振動力與第二振動力之差值即為2N。換言之，由於振動測試儀器感測關於電子裝置1之第一振動力係為電子裝置1之實際振動力，因此振動感測單元12之感測演算法所算出之第二振動力需再加上2N，才會符合電子裝置1之實際振動力。需說明的是，若第二振動力等於第一振動力，則可以第一振動力與第二振動力之差值等於0修正振動感測單元12之感測演算法，或不修正振動感測單元12之感測演算法，視實際應用而定。Next, step S16 is performed to determine whether the second vibration force is equal to the first vibration force. In practical applications, the computer, the electronic device itself or the manual can be used for judgment, depending on the actual application. If the second vibration force is not equal to the first vibration force, step S18 is performed to calculate a difference between the first vibration force and the second vibration force, and the difference is used to correct the sensing algorithm of the vibration sensing unit 12, and Go to step S10. For example, if the vibration testing instrument senses that the first vibration force about the electronic device 1 is 10N, and the vibration sensing unit 12 senses that the second vibration force about the electronic device 1 is 8N, the first vibration force and the second The difference in vibration force is 2N. In other words, since the vibration tester senses that the first vibration force about the electronic device 1 is the actual vibration force of the electronic device 1, the second vibration force calculated by the sensing algorithm of the vibration sensing unit 12 needs to be added 2N. In order to meet the actual vibration force of the electronic device 1. It should be noted that if the second vibration force is equal to the first vibration force, the difference between the first vibration force and the second vibration force may be equal to 0 to correct the sensing algorithm of the vibration sensing unit 12, or the vibration sensing may not be corrected. The sensing algorithm of unit 12 depends on the actual application.
若第二振動力等於第一振動力，則執行步驟S20，重複步驟S10至S16，以複數個不同的預設振動力使電子裝置1產生振動，以計算複數個第一振動力與複數個第二振動力之複數個差值。最後，執行步驟S22，根據第二振動力與差值之對應關係，建立振動測試演算法100。If the second vibration force is equal to the first vibration force, step S20 is performed, and steps S10 to S16 are repeated to generate vibrations of the electronic device 1 by using a plurality of different preset vibration forces to calculate a plurality of first vibration forces and plural numbers. The difference between the two vibrational forces. Finally, step S22 is performed to establish a vibration test algorithm 100 according to the correspondence between the second vibration force and the difference.
請參閱第3圖，第3圖為振動力與工作電流之對應關係圖。如第3圖所示，在橫軸設定用以使電子裝置1產生預設振動力之五個工作電流I1-I5(其中，I5是電子裝置1能正常振動的最大工作電流)，振動測試儀器感測關於電子裝置1對應此五個工作電流I1-I5之第一振動力為fe1-fe5，且振動感測單元12感測關於電子裝置1對應此五個工作電流I1-I5之第二振動力為fz1-fz5(以Z軸向之振動力為例，X、Y軸向之振動力可以此類推)，則fe1-fe5和fz1-fz5的差值就是fd1-fd5。需說明的是，工作電流I1-I5可施加於電子裝置1之振動單元18，以使電子裝置1本身產生振動，或者工作電流I1-I5可施加於上述之振動平台，以帶動電子裝置1產生振動。Please refer to Figure 3, and Figure 3 is a diagram showing the relationship between vibration force and operating current. As shown in FIG. 3, five operating currents I1-I5 for causing the electronic device 1 to generate a predetermined vibration force are set on the horizontal axis (where I5 is the maximum operating current that the electronic device 1 can normally vibrate), and the vibration testing instrument Sensing the first vibration force corresponding to the five operating currents I1-I5 of the electronic device 1 as fe1-fe5, and the vibration sensing unit 12 sensing the second vibration corresponding to the five working currents I1-I5 of the electronic device 1 The force is fz1-fz5 (taking the vibration force of the Z-axis as an example, the vibration force of the X and Y axes can be analogized), and the difference between fe1-fe5 and fz1-fz5 is fd1-fd5. It should be noted that the operating currents I1 - I5 can be applied to the vibration unit 18 of the electronic device 1 to cause the electronic device 1 to generate vibration, or the operating currents I1 - I5 can be applied to the above-mentioned vibration platform to drive the electronic device 1 to generate vibration.
工作電流為I3時，若振動測試儀器感測到的第一振動力fe3為19N，且振動感測單元12感測到的第二振動力fz3為18.4N，則兩者的差值fd3即為0.6N。因此，若電子裝置1之振動感測單元12感測到18.4N的振動力，電子裝置1之處理單元16即會根據振動測試演算法100計算對應振動力18.4N之補償值0.6N，將振動力18.4N與補償值0.6N相加以產生補償後振動力19N，並且將補償後振動力19N顯示於顯示單元14上。工作電流為I4時，若振動測試儀器感測到的第一振動力fe4為22N，且振動感測單元12感測到的第二振動力fz4為21.7N，則兩者的差值fd4即為0.3N。此時，電子裝置1之處理單元16即會根據振動測試演算法100計算對應振動力21.7N之補償值0.3N，將振動力21.7N與補償值0.3N相加以產生補償後振動力22N，並且將補償後振動力22N顯示於顯示單元14上。When the operating current is I3, if the first vibration force fe3 sensed by the vibration testing instrument is 19N, and the second vibration force fz3 sensed by the vibration sensing unit 12 is 18.4N, the difference fd3 between the two is 0.6N. Therefore, if the vibration sensing unit 12 of the electronic device 1 senses a vibration force of 18.4 N, the processing unit 16 of the electronic device 1 calculates a compensation value of 0.6 N corresponding to the vibration force of 18.4 N according to the vibration test algorithm 100, and the vibration is The force 18.4N is added to the compensation value 0.6N to generate the compensated vibration force 19N, and the compensated vibration force 19N is displayed on the display unit 14. When the operating current is I4, if the first vibration force fe4 sensed by the vibration testing instrument is 22N, and the second vibration force fz4 sensed by the vibration sensing unit 12 is 21.7N, the difference fd4 between the two is 0.3N. At this time, the processing unit 16 of the electronic device 1 calculates a compensation value of 0.3N corresponding to the vibration force 21.7N according to the vibration test algorithm 100, and adds the vibration force 21.7N to the compensation value 0.3N to generate the compensated vibration force 22N, and The compensated vibration force 22N is displayed on the display unit 14.
換言之，第一振動力fe1-fe5與第二振動力fz1-fz5之差值fd1-fd5即為本發明之振動測試演算法100用以補償電子裝置1之振動感測單元12所感測到的振動力之補償值。需說明的是，若電子裝置1之振動感測單元12所感測到的振動力介於fz3與fz4之間，則可根據內差法計算介於fd3與fd4之間的補償值。此外，在所需的工作電流範圍內測試越多組第一振動力與第二振動力(例如，可在第3圖中的工作電流0-I5範圍內選取十個工作電流來測試)，則所獲得的補償值就越精確。In other words, the difference fd1 - fd5 between the first vibration force fe1 - fe5 and the second vibration force fz1 - fz5 is the vibration test algorithm 100 of the present invention for compensating for the vibration sensed by the vibration sensing unit 12 of the electronic device 1. The compensation value of the force. It should be noted that if the vibration force sensed by the vibration sensing unit 12 of the electronic device 1 is between fz3 and fz4, the compensation value between fd3 and fd4 can be calculated according to the internal difference method. In addition, the more the first vibration force and the second vibration force are tested within the required operating current range (for example, ten operating currents can be selected within the operating current range of 0-I5 in FIG. 3 to test) The more accurate the compensation value obtained.
相較於先前技術，本發明係提供用以建立振動測試演算法之方法，並且將此振動測試演算法安裝於電子裝置中，以使電子裝置具有振動測試功能。藉此，於生產大量的電子裝置時，即可利用每一台電子裝置之振動測試功能自動測試電子裝置本身的振動力大小，以對大量的電子裝置進行百分之百的檢驗。舉例而言，在生產大量的本發明之電子裝置時，可事先在每一台電子裝置之測試介面下設定振動力規格(例如，10N? N)。接著，開啟電子裝置之振動單元產生振動，處理單元即會根據上述作用原理計算出對應的振動力，若計算出的振動力落在事先設定的振動力規格範圍內，則處理單元可控制顯示單元顯示合格，反之，則控制顯示單元顯示不合格，表示此電子裝置之振動單元品質有問題或電子裝置沒有組裝好，以使作業人員可據以找出原因。In contrast to the prior art, the present invention provides a method for establishing a vibration test algorithm, and the vibration test algorithm is installed in an electronic device such that the electronic device has a vibration test function. Therefore, when a large number of electronic devices are produced, the vibration test function of each electronic device can be used to automatically test the vibration force of the electronic device itself, so as to perform 100% inspection on a large number of electronic devices. For example, when a large number of electronic devices of the present invention are produced, the vibration force specifications (for example, 10 N? N) can be set in advance under the test interface of each electronic device. Then, the vibration unit of the electronic device is turned on to generate vibration, and the processing unit calculates the corresponding vibration force according to the above-mentioned action principle. If the calculated vibration force falls within the preset vibration force specification range, the processing unit can control the display unit. The display is qualified. Otherwise, the control display unit displays a failure, indicating that there is a problem with the quality of the vibration unit of the electronic device or the electronic device is not assembled, so that the operator can find out the cause.
此外，使用者可利用電子裝置之振動測試功能來獲取電子裝置所產生之振動力數據，以了解所使用之電子裝置的實際振動強度。使用者亦可根據獲取的振動力數據與對應的使用感受來設定所需的振動強度。In addition, the user can use the vibration test function of the electronic device to acquire the vibration force data generated by the electronic device to know the actual vibration intensity of the electronic device used. The user can also set the required vibration intensity based on the acquired vibration force data and the corresponding usage experience.
再者，使用者還可利用電子裝置之振動測試功能來測試其它電子裝置的振動強度。舉例而言，使用者可將本發明之電子裝置以及另一具有振動功能之電子裝置鄰近放置於同一平面上(例如，桌面)，在具有振動功能之電子裝置開啟振動後，本發明之電子裝置即可測試出此電子裝置之振動力(相對值而非絕對值)，例如5N。同理，使用者可利用本發明之電子裝置測試出另一具有振動功能之電子裝置之振動力，例如8N。此時，使用者即可比對此兩電子裝置之振動力的強弱關係。Furthermore, the user can also use the vibration test function of the electronic device to test the vibration intensity of other electronic devices. For example, the user can place the electronic device of the present invention and another electronic device having a vibration function on the same plane (for example, a desktop), and the electronic device of the present invention is turned on after the electronic device having the vibration function is turned on. The vibration force (relative value rather than absolute value) of the electronic device can be tested, for example 5N. Similarly, the user can use the electronic device of the present invention to test the vibration force of another electronic device having a vibration function, such as 8N. At this time, the user can have a stronger relationship than the vibrational force of the two electronic devices.
以上所述僅為本發明之較佳實施例，凡依本發明申請專利範圍所做之均等變化與修飾，皆應屬本發明之涵蓋範圍。The above are only the preferred embodiments of the present invention, and all changes and modifications made to the scope of the present invention should be within the scope of the present invention.
1．．．電子裝置1. . . Electronic device
10．．．記憶單元10. . . Memory unit
12．．．振動感測單元12. . . Vibration sensing unit
14．．．顯示單元14. . . Display unit
16．．．處理單元16. . . Processing unit
18．．．振動單元18. . . Vibration unit
100．．．振動測試演算法100. . . Vibration test algorithm
S10-S22．．．步驟S10-S22. . . step
I1-I5．．．工作電流I1-I5. . . Working current
fe1-fe5．．．第一振動力Fe1-fe5. . . First vibration force
fz1-fz5．．．第二振動力Fz1-fz5. . . Second vibration force
fd1-fd5．．．差值Fd1-fd5. . . Difference
第1圖為根據本發明一實施例之具有振動測試功能之電子裝置的功能方塊圖。1 is a functional block diagram of an electronic device having a vibration test function according to an embodiment of the present invention.
第2圖為根據本發明一實施例之用以建立振動測試演算法之方法的流程圖。2 is a flow chart of a method for establishing a vibration test algorithm in accordance with an embodiment of the present invention.
第3圖為振動力與工作電流之對應關係圖。Figure 3 is a diagram showing the relationship between vibration force and operating current.
1．．．電子裝置1. . . Electronic device
10．．．記憶單元10. . . Memory unit
12．．．振動感測單元12. . . Vibration sensing unit
14．．．顯示單元14. . . Display unit
16．．．處理單元16. . . Processing unit
18．．．振動單元18. . . Vibration unit
100．．．振動測試演算法100. . . Vibration test algorithm
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