201241621 發明說明： 【發明所屬之技術領域】 [0001] [0002] 本發明涉及一種主板測試流程自動調整系統及方法。 【先前技術】 在主板測試中，目前是依據個人經驗來安排不同測試項 的先後順序’而測試項在不同主板中的測試時間有一些 差別，測試失敗的情況也不盡相同。有—些測試項· 時間長，也有-些剛試項由於各種原因容易測試失敗 如果把-些容易失敗的測試項放在測試通過率高㈣ 項後面，或把職^仏的職項放在賴時 “ 试項後面’絲需要比較長的時間才能發現這些^ 敗的測試項，XI樣會導致在主板開發階段發現缺 或檢測軟體錯誤的料Μ，也會導致在主板測試階= 當測试通過率低的時候測試時間過長，測試效率不^又 【發明内容】 [0003] 鑒於以上内容 有必要提供一種主板測試流程自 系統，可以自動調整主板測試流程。 動調整 [0004] 鑒於以上内容’還有必要提供—種主板測試流程 整方法’可以自動調整线測試絲。 Μ [0005] 所迷王极判硪流程自動調整系統 100112882 • ％ 包嗎中，該 統包括.識別模組，用於識社板所要求·的待剛j 項；讀取難1於從t料庫巾讀取所要⑽試的早 單項的平均測試時間和測試通過率；策略模㉖，用二叫 測試通過率低於預設的通過率門檻值的待_單項分二將 -組將測4通過率不低於所述通過率門梭值的 表單編號麵 20I 1單 10〇2〇21456- 201241621 項分入第二組’並將第-組巾的各彳㈣單独照平均測 试時間由短到長的順序排列，@ _ 、 隹第二組中，隨機排列各 待測單項，將第-組置前而第二組置後，組合該第一组 和第二組⑽到—__試流程；測試模組，將所有 待測單項依新的測試流程利㈣試卫具進行測試，取得 測試結果；保存齡L待料項❹m結果，測 試用時間和測試通過情況存入資料庫中 “ [0006] Ο 所述主板測試餘自動㈣方法，應用於自動調整主板 測試流程，财法包㈣下_ :識社板所要求測試 的待測單項；根據__待解項，從資料庫"取 對應待測單項的平均測試時•職通過率；將測試通 過率低於預設的通過率Η檀值的_單項分201241621 Description of the Invention: [Technical Field] [0001] The present invention relates to a system and method for automatically adjusting a test flow of a motherboard. [Prior Art] In the motherboard test, the order of different test items is currently arranged according to personal experience. The test items have different test times in different motherboards, and the test failures are not the same. There are some test items, long time, and some - some test items are easy to test for various reasons. If you put some test items that are easy to fail, put the test pass rate high (4), or put the job of the job. Lai Shi "behind the test item" silk takes a long time to find these test items, XI will lead to the discovery of missing or detecting software errors in the motherboard development stage, and will also lead to test on the motherboard level = test When the test pass rate is low, the test time is too long, and the test efficiency is not good. [Invention content] [0003] In view of the above, it is necessary to provide a motherboard test flow self-system, which can automatically adjust the motherboard test flow. [0004] In view of the above The content 'also needs to provide - the whole method of the motherboard test process' can automatically adjust the line test wire. Μ [0005] The king of the process is automatically adjusted system 100112882 • % package, the system includes the identification module, It is used to understand the requirements of the board. It is difficult to read the average test time and test pass rate of the early single item of the (10) test. The second test pass rate is lower than the preset pass rate threshold. The single item will be divided into two. The group will measure the pass rate of not less than the pass rate of the door number. 20I 1 single 10〇2〇21456 - 201241621 items are classified into the second group' and the average test time for each of the first group of four-group towels is arranged in the order of short to long, and @_, 隹 in the second group, each item to be tested is randomly arranged. After the first group is placed and the second group is set, the first group and the second group (10) are combined to the -__ test process; the test module is used to test all the items to be tested according to the new test procedure (4) Test, obtain the test result; save the age L waiting item ❹m result, test time and test pass condition are stored in the database "[0006] Ο The motherboard test remaining automatic (four) method, used to automatically adjust the motherboard test process, wealth The legal package (4) _: the individual items to be tested required by the AIDS board; according to the __to be solved, the average test time corresponding to the item to be tested is taken from the database " the pass rate is lower than the pre-test _ single point of the pass rate
將測試通過率不低於所述通過率⑭值的待測單項= 第二組H組中的各待測單項按照平均測試時二由 短到長的順序排列，在第二組’隨機排列各待測單項； 將第-組置前而第二組置後，組合該第—組和第二組以 得到一個新的職流程；將所有制單項按新的測試流 程依次進行測試；將每個待測單項的測試用時間和測試 通過情況存入資料庫中。 [0007] 相較於習知技術，本發明所述之主板測試流程自動調整 系統及方法，能夠自動調整測試項的先後順序，重新安 排測試流程，減少發現測試失敗的時間，提高開發效率 100112882 【實施方式】 如圖1所示，係本發明主板測試流程自動調整系統較佳實 第5頁/共20頁 表單編號A0101 1002021456-0 [0008] 201241621 施例的架構圖。 [0009] 所述主板測試流程自動調整系統30運行於電腦主機10中 。所述主機10與顯示器50、鍵盤60、滑鼠70連接。顯示 器50用於查看系統測試結果，鍵盤60及滑鼠70用於用戶 在查看測試結果時與主機10的交互操作。所述主機10中 還包括主板20、資料庫40。 [0010] 主板20為待測主板，其待測單項項目繁多，包括CPU、記 憶體、硬碟、光碟機、南橋晶片組、北橋晶片組、PCI匯 流排等。每個待測單項的失敗原因都有可能與硬體有關 ，也可能與軟體有關，如P CI設備有時抓取數量不對，可 能是PCI插槽有問題，也可能是程式對新版的南橋晶片組 支援不好，致使某些設備抓取不到。 [0011] 資料庫40用於存儲待測單項的測試資料，其測試資料結 果存儲如圖5所示，其以每個待測單項為一行，以測試用 時間、測試通過次數、測試不通過次數、平均測試時間 、測試通過率等為列項。其中平均測試時間、測試通過 率能依據前面列項自動計算。在每次依流程測試完後將 測試時間和測試通過情況（通過或不通過）保存到資料 庫40 中。在圖5 中，Iteml 、Item2、 Item3、 Item4 …為待測單項，資料庫40會自動計算平均測試時間和測 試通過率。 [0012] 如圖2所示，係本發明主板測試流程自動調整系統較佳實 施例的功能模組圖。 [0013] 所述主板測試流程自動調整系統30包括預測試模組300、 100112882 表單編號A0101 第6頁/共20頁 1002021456-0 201241621 [0014] Ο [0015] 識別模組301 '讀取模組302、策略模組303、測試模組 304、保存模組305及判斷模組306。 所述識別模組301，用於識別主板所要求測試的待測單項 。待測單項項目繁多，包括CPU、記憶體、硬碟、光碟機 、南橋晶片組、北橋晶片組、PCI匯流排等。每個待測單 項的失敗原因都有可能與硬體有關，也可能與軟體有關 ，如pci設備有時抓取數量不對，可能是ρπ插槽有問題 ，也可能是程式對新版的南橋晶片組支援不好，致使某 些設備抓取不到。 所述讀取模組3Q2，用於從f料庫辦讀取所要求測試的 待測單項的平均測試時間和測試通過率。資料庫40中存 儲的待測單項資料’如圖5所示，其以每個待測單項為-行，以測試用時間、測試通過次數、測試不通過次數、 平均測試時間、測試通過率等為列項。其中平均測試時 間、測試通過率是依據前面列項自動計算得出的。The test item whose test pass rate is not lower than the pass rate 14 value = each test item in the second group H group is arranged in the order of short to long according to the average test time, and in the second group 'randomly arranged each The items to be tested are placed; the first group is placed before the second group is set, the first group and the second group are combined to obtain a new job process; all the system items are tested in turn according to the new test process; The test time and test pass of the test item are stored in the database. Compared with the prior art, the motherboard test flow automatic adjustment system and method according to the present invention can automatically adjust the sequence of test items, rearrange the test process, reduce the time for discovering test failures, and improve the development efficiency 100112882. Embodiments As shown in FIG. 1 , the main board test flow automatic adjustment system of the present invention is better. Page 5 of 20 Form No. A0101 1002021456-0 [0008] The architecture diagram of the 201241621 embodiment. [0009] The main board test flow automatic adjustment system 30 runs in the computer host 10. The host 10 is connected to the display 50, the keyboard 60, and the mouse 70. The display 50 is used to view system test results, and the keyboard 60 and the mouse 70 are used for user interaction with the host 10 when viewing test results. The host 10 further includes a motherboard 20 and a database 40. [0010] The main board 20 is a motherboard to be tested, and has a variety of items to be tested, including a CPU, a memory, a hard disk, an optical disk drive, a south bridge chipset, a north bridge chipset, a PCI bus, and the like. The cause of failure of each item to be tested may be related to hardware or software. For example, the number of P CI devices may not be crawled. It may be a problem with the PCI slot, or it may be a program for the new version of the South Bridge. Group support is not good, causing some devices to fail. [0011] The data base 40 is used for storing the test data of the single item to be tested, and the test data is stored as shown in FIG. 5, and each test item is taken as one line, and the test time, the test pass times, and the test pass times are used. , average test time, test pass rate, etc. are listed. The average test time and test pass rate can be automatically calculated according to the previous items. The test time and test pass (with or without pass) are saved to the database 40 each time the process is tested. In Figure 5, Iteml, Item2, Item3, Item4... are the items to be tested, and the database 40 automatically calculates the average test time and the test pass rate. [0012] As shown in FIG. 2, it is a functional module diagram of a preferred embodiment of the motherboard test flow automatic adjustment system of the present invention. [0013] The main board test flow automatic adjustment system 30 includes a pre-test module 300, 100112882 Form No. A0101 Page 6 / Total 20 pages 1002021456-0 201241621 [0014] [0015] Identification module 301 'Read module 302, a policy module 303, a test module 304, a save module 305, and a determination module 306. The identification module 301 is configured to identify a single item to be tested required by the motherboard. There are many items to be tested, including CPU, memory, hard disk, CD player, Southbridge chipset, Northbridge chipset, PCI busbar, etc. The reason for the failure of each item to be tested may be related to the hardware or related to the software. For example, the number of the pci device may be fetched incorrectly, which may be a problem with the ρπ slot, or it may be a program for the new version of the Southbridge chipset. Poor support, resulting in some devices not being able to capture. The reading module 3Q2 is configured to read an average test time and a test pass rate of the item to be tested required to be tested from the f library. The single item data to be tested stored in the database 40 is as shown in FIG. 5, and each item to be tested is a line, such as test time, number of test passes, number of test failures, average test time, test pass rate, etc. Is a column item. The average test time and test pass rate are automatically calculated based on the previous items.
[0016] G 100112882 所述策略模組303,用於對所有待測單項進行策略調整， 可生成-個新的測試流程。其策略的生成，為依據經驗 值設定-個通過率門難’將待測單項進行分組，測試 通過率低於所述通過率門檻值的待測單項為第―組，判 試通過率不低於所述通過率㈣值的為第二组；在第— 組’將待測單項按照平均測試時間長短進行排序，平均 :ΓΓ置前;在第二組，待測單項=順序： 要求’相單項_排列H 將兩組待測單項進行組合， 第一、旦置後 传到—個調整後的新的 4。所述通過率《值隨著各待測單項在工廠調 表單編珑A0101 第7頁/共20頁 1002021456-0 201241621 試時的通過率變化，通過率古 就大，通過率低，則對應的二:對應的通過率門檻值 [0017] [0018] [0019] 100112882 的通過率門檻值就小。 所述測試模組304,將所有待測 、 中的順序利用測試工具進行、則V 、依所述新的測試流程 °1，取得測試結果。 需要說明的是，在剛開始啟動 不存在測試資料的，此時需’在資料庫40中是 —個默認的測試流程多— 個預測試模組3 0 0依據 '、彳试母個待測單項，並且在測 我過程中，將母次母個待 胃本次測試時的測試資料 ’包括測試用時間、測試通過情沉存入資料庫4〇中；測 試通過的話，測試通過次數加i，如果測試沒有通過測 試不通過次數加1。如圖5所示，並依據所述測試資料自 動計算每個待測單項的平均測試時間及測試通過率。而 在資料庫40中有上述測試資料時’則依據策略模組3〇3調 整每個待測單項的測試順序形成新的測試流程。所述各 個待測單項在測試過程中對應的測試工具不同，對應的 測試工具可封裝於後臺，由一介面程式自動調度。 所述保存模組305，用於在測試過程中將每個待測單項的 每次測試通過情況及測試用時間存入資料庫40中。此時 測試通過情況包括通過和不通過兩種情形，測試通過的 話，測試通過次數加1，如果測試沒有通過，測試不通過 次數加1。如圖5所示，測試結果有測試用時間及測試通 過情況，測試通過次數、測試不通過次數由測試通過情 況結果每次累加而成，之後，資料庫40根據測試結果， 自動計算每個待測單項的平均測試時間和測試通過率， 平均測試時間=每次測試用時間的總和總測試次數，測 表單編號 Α0101 第 8 頁/共 20 I 1002021456-0 201241621 [0020] [0021] [0022] Ο [0023] [0024] [0025] G [0026] [0027] 下個待測單項。 自動調整方法較佳實 上識別出待測單 、光碟機、南橋晶 試通過率=測試通過 =測試通過次數+ m林通過次數。、中_試次數 所述判斷模組306,用於判斷是否有 如圖3所示，係本發明域測試流程 施例的流程圖。 步驟S1GG ’所述識別模組301在主板2〇 項。待測單項包括CPU、記憶體、硬碟 片組、北橋晶片組、PCI匯流排等。 步驟S101 ’所述讀取模組3〇2從資料 測單項的平均測試時間和測試通過率。巾4取所有待 ’當各項資料讀取成功後，策略模組3 2單項進行策略調整，以生成-個新的測試流程:Γ 浪略的生成，圖4中將詳細介紹。 其 步驟S103，所述測試模組3〇4依據新的測試流程 個待測單項。所述各待測單項的測試卫具*同，每個待 測單項的測試4封裝於後m面程式自動調度 0 步驟S104 ’所述保存模組3〇5將每個待測單項的測試結果 保存至資料庫4〇中。其中測試結果包括測試用時間和測 試通過ff’况冑試通過情況分為通過和不通過兩種。 步驟S105，保存成功後，所述判斷模組3〇6根據所述新的 測試流程判斷是否還有制單項騎測試。若還存在著 待測單項需要測試，則返回步驟S103。若不存在待測單 100112882 表單編號A0101 第9頁/共20頁 1002021456-0 201241621 項，則結束測試。 [0028] 如圖4所示，係本發明主板測試流程自動調整方法較佳實 施例的策略調整子流程圖。 [0029] 步驟S1 020，所述策略模組303依據經驗值來設定一個通 過率門檻值。所述經驗值的依據為，主板待測單項在工 廠調試時的通過率；通過率高，則設置的通過率門檻值 就大一些，通過率低，則設置的通過率門檻值就小一些 〇 [0030] 步驟S1021，所述策略模組303依據資料庫40中每個待測 單項的測試通過率與所述通過率門檻值的關係將測試流 程中的所有待測單項進行分組，測試通過率低於所述通 過率門檻值的為第一組，測試通過率不低於所述通過率 門檻值的為第二組。 [0031] 步驟S1 022，在第一組中，所述策略模組303依據每個待 測早項的平均測試時間長短進行排序’平均測試時間短 的置前，平均測試時間長的置後，從而形成一個按平均 測試時間由短到長的排列順序。在第二組的待測單項， 測試順序不做要求，其待測單項隨機排列。 [0032] 步驟S1 023，所述策略模組303將兩組資料進行組合，將 第一組置前，第二組置後，從而得到一個調整後的新的 測試流程。 [0033] 綜上所述，本發明符合發明專利要件，爰依法提出專利 申請。惟，以上所述者僅爲本發明之較佳實施例，本發 明之範圍並不以上述實施例爲限，舉凡熟悉本案技藝之 100112882 表單編號A0101 第10頁/共20頁 1002021456-0 201241621 [0034] [0035] [0036] Ο [0037] [0038] [0039] [0040][0016] The policy module 303 of G 100112882 is configured to perform policy adjustment on all items to be tested, and generate a new test process. The generation of the strategy is based on the empirical value setting - a pass rate is difficult to 'group the items to be tested, the test pass rate is lower than the pass rate threshold, the test item is the first group, the test pass rate is not low The value of the pass rate (four) is the second group; in the group - the items to be tested are sorted according to the average test time length, the average: before the set; in the second group, the single item to be tested = order: Single item _ arrangement H combines two groups of items to be tested, and the first one is transmitted to the new one after adjustment. The passing rate "value with the change of the pass rate of each item to be tested in the factory configuration form A0101 page 7 / total 20 pages 1002021456-0 201241621, the pass rate is large, the pass rate is low, then the corresponding Two: corresponding pass rate threshold [0017] [0019] 100112882 The pass rate threshold is small. The test module 304 performs all the steps to be tested and the test tool, and then obtains the test result according to the new test flow °1. It should be noted that, at the beginning of the startup, there is no test data. At this time, it is required to be in the database 40 - a default test flow is more - a pre-test module is based on 300, and the test is tested. Single item, and in the process of measuring me, the test data of the mother and the mother's stomach will be included in the test, including the test time and the test, and the test will be stored in the database. If the test is passed, the test passes the number of times. If the test does not pass the test, the number of passes is not increased by 1. As shown in FIG. 5, the average test time and the test pass rate of each item to be tested are automatically calculated according to the test data. When the above test data is included in the database 40, the test sequence of each item to be tested is adjusted according to the strategy module 3〇3 to form a new test flow. The corresponding test items in the test items are different in the test process, and the corresponding test tools can be packaged in the background and automatically scheduled by an interface program. The save module 305 is configured to store each test pass condition and test time of each item to be tested into the data base 40 during the test. At this time, the test pass situation includes pass and fail. If the test passes, the number of test passes is increased by 1. If the test fails, the test fails the number of times. As shown in FIG. 5, the test result has a test time and a test pass condition, and the test pass times and the test pass times are accumulated by the test pass result each time, and then the database 40 automatically calculates each wait according to the test result. Average test time and test pass rate of the test item, average test time = total test time of each test time, test form number Α0101, page 8 / total 20 I 1002021456-0 201241621 [0020] [0022] [0024] [0025] [00] [0027] Next item to be tested. The automatic adjustment method preferably identifies the test order, the optical disk drive, the south bridge crystal pass rate = test pass = test pass times + m forest pass times. The number of trials and the number of trials is used to determine whether there is a flowchart of the embodiment of the domain test flow of the present invention as shown in FIG. The identification module 301 of step S1GG' is on the main board 2. The items to be tested include CPU, memory, hard disk group, north bridge chipset, PCI bus, and so on. Step S101' The average test time and test pass rate of the reading module 3〇2 from the data measurement item. After the data is successfully read, the strategy module 3 2 adjusts the policy individually to generate a new test flow: 浪 Wave generation, which will be described in detail in Figure 4. In step S103, the test module 3〇4 tests the single item according to the new test process. The test fixtures of the individual items to be tested are the same, and the test 4 of each item to be tested is packaged in the automatic scheduling of the rear m-plane program. Step S104 'The save module 3〇5 will test the test result of each item to be tested. Save to the database 4〇. The test results include the test time and the test pass ff. In step S105, after the saving is successful, the determining module 〇6 determines whether there is a single riding test according to the new testing process. If there is still a single item to be tested that needs to be tested, then return to step S103. If there is no pending order 100112882 Form No. A0101 Page 9 / Total 20 Page 1002021456-0 201241621, the test ends. [0028] As shown in FIG. 4, it is a strategy adjustment sub-flowchart of a preferred embodiment of the automatic test method for testing the main board of the present invention. [0029] Step S1 020, the policy module 303 sets a pass rate threshold based on the empirical value. The empirical value is based on the pass rate of the single item of the main board to be tested at the factory; when the pass rate is high, the set pass rate is larger, and the pass rate is lower, the set pass rate is smaller. [0030] Step S1021, the policy module 303 groups all the items to be tested in the test process according to the relationship between the test pass rate of each item to be tested in the database 40 and the threshold of the pass rate, and the test pass rate. Below the pass rate threshold is the first group, and the test pass rate is not lower than the pass rate threshold is the second group. [0031] Step S1 022, in the first group, the policy module 303 sorts according to the average test time length of each of the early items to be tested, where the average test time is short, and the average test time is long. Thus, an order of the average test time from short to long is formed. In the second group of items to be tested, the test sequence is not required, and the items to be tested are randomly arranged. [0032] Step S1 023, the policy module 303 combines two sets of data, placing the first group before and the second group, thereby obtaining an adjusted new test flow. [0033] In summary, the present invention complies with the requirements of the invention patent, and submits a patent application according to law. However, the above description is only the preferred embodiment of the present invention, and the scope of the present invention is not limited to the above embodiment, and is familiar with the skill of the present invention 100112882 Form No. A0101 Page 10 / Total 20 Page 1002021456-0 201241621 [ [0036] [0040] [0040] [0040]
[0041] [0042] [0043] [0044] [0045] [0046] 人士援依本發明之精神所作之等效修飾或變化，皆應涵 蓋於以下申請專利範圍内。 【圖式簡單說明】 圖1係本發明主板測試流程自動調整系統較佳實施例的架 構圖。 圖2係本發明主板測試流程自動調整系統較佳實施例的功 能模組圖。 圖3係本發明主板測試流程自動調整方法較佳實施例的流 程圖。 圖4係本發明主板測試流程自動調整方法較佳實施例的策 略調整子流程圖。 圖5係本發明測試資料結果在資料庫中的存儲。 【主要元件符號說明】 主機10 主板20 主板測試流程自動調整系統30 資料庫40 顯示器50 鍵盤60 滑鼠70 預測試模組300 100112882 表單編號Α0101 第11頁/共20頁 1002021456-0 201241621 [0047] 識別模組 301 [0048] 讀取模組 302 [0049] 策略模組 303 [0050] 測試模組 304 [0051] 保存模組 305 [0052] 判斷模組 306 100112882 表單編號 AOlOi 第 12 頁/共 20 頁 1002021456-0[0046] [0046] Equivalent modifications or variations made by persons in accordance with the spirit of the present invention are intended to be included in the scope of the following claims. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a view showing the configuration of a preferred embodiment of the automatic test system for testing the main board of the present invention. 2 is a functional block diagram of a preferred embodiment of the automatic test system for testing the motherboard of the present invention. Fig. 3 is a flow chart showing a preferred embodiment of the method for automatically adjusting the test flow of the motherboard of the present invention. Fig. 4 is a flow chart showing the policy adjustment subroutine of the preferred embodiment of the automatic test method for testing the main board of the present invention. Figure 5 is a representation of the results of the test data of the present invention in a database. [Main component symbol description] Host 10 Motherboard 20 Motherboard test flow automatic adjustment system 30 Database 40 Display 50 Keyboard 60 Mouse 70 Pre-test module 300 100112882 Form number Α 0101 Page 11 / Total 20 pages 1002021456-0 201241621 [0047] Identification module 301 [0048] Reading module 302 [0049] Policy module 303 [0050] Test module 304 [0051] Saving module 305 [0052] Judging module 306 100112882 Form number AOlOi Page 12 of 20 Page 1002021456-0