TW201227852A - Manufacturing method of a solder ball - Google Patents

Manufacturing method of a solder ball Download PDF

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Publication number
TW201227852A
TW201227852A TW100138653A TW100138653A TW201227852A TW 201227852 A TW201227852 A TW 201227852A TW 100138653 A TW100138653 A TW 100138653A TW 100138653 A TW100138653 A TW 100138653A TW 201227852 A TW201227852 A TW 201227852A
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Taiwan
Prior art keywords
adhesive layer
substrate
solder
core body
layer
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TW100138653A
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Chinese (zh)
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TWI505382B (en
Inventor
Takashi Shoji
Takekazu Sakai
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Showa Denko Kk
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Publication of TW201227852A publication Critical patent/TW201227852A/en
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Publication of TWI505382B publication Critical patent/TWI505382B/en

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    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K35/00Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
    • B23K35/22Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by the composition or nature of the material
    • B23K35/24Selection of soldering or welding materials proper
    • B23K35/26Selection of soldering or welding materials proper with the principal constituent melting at less than 400 degrees C
    • B23K35/262Sn as the principal constituent
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K35/00Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
    • B23K35/40Making wire or rods for soldering or welding
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22FWORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
    • B22F1/00Metallic powder; Treatment of metallic powder, e.g. to facilitate working or to improve properties
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B22CASTING; POWDER METALLURGY
    • B22FWORKING METALLIC POWDER; MANUFACTURE OF ARTICLES FROM METALLIC POWDER; MAKING METALLIC POWDER; APPARATUS OR DEVICES SPECIALLY ADAPTED FOR METALLIC POWDER
    • B22F1/00Metallic powder; Treatment of metallic powder, e.g. to facilitate working or to improve properties
    • B22F1/16Metallic particles coated with a non-metal
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B23MACHINE TOOLS; METAL-WORKING NOT OTHERWISE PROVIDED FOR
    • B23KSOLDERING OR UNSOLDERING; WELDING; CLADDING OR PLATING BY SOLDERING OR WELDING; CUTTING BY APPLYING HEAT LOCALLY, e.g. FLAME CUTTING; WORKING BY LASER BEAM
    • B23K35/00Rods, electrodes, materials, or media, for use in soldering, welding, or cutting
    • B23K35/02Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape
    • B23K35/0222Rods, electrodes, materials, or media, for use in soldering, welding, or cutting characterised by mechanical features, e.g. shape for use in soldering, brazing
    • B23K35/0244Powders, particles or spheres; Preforms made therefrom
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/10Bump connectors; Manufacturing methods related thereto
    • H01L2224/11Manufacturing methods
    • H01L2224/113Manufacturing methods by local deposition of the material of the bump connector
    • H01L2224/1133Manufacturing methods by local deposition of the material of the bump connector in solid form
    • H01L2224/11334Manufacturing methods by local deposition of the material of the bump connector in solid form using preformed bumps

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  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Electric Connection Of Electric Components To Printed Circuits (AREA)

Abstract

The present invention relates to a manufacturing method of a solder ball 70, which includes; a first step wherein a core material 11 is applied to a surface 1a of a substrate 1 to which a first adhesive layer 5 is provided; a second step wherein a second adhesive layer 13 is applied to the surface 11a of the core material 11, a third step wherein solder particles 14 are adhered to the surface of the second adhesive layer 13; a fourth step wherein the solder particles 14 are melted to form a solder layer 15; and a fifth step wherein the core material is separated from the substrate 11 to obtain a solder ball.

Description

201227852 六、發明說明: 【發明所屬之技術領域】 本提出申請之 其內容援用於 3基板、陶瓷基 【電路圖案,在 =電容等的電子 Γ電子零件的引 在電路基板上 驟、在焊料薄 J電子零件進行 F熔焊之步驟、 ^電極接合之步 :小型化發展, 。作爲可實現 節距之 QFP ( Package ) 、 本發明係關於焊球之製造方法。 本申請是根據2010年10月27日於 日本特願2010-241029號主張優先權,並 此。 【先前技術】 近年來,作爲形成電路的手段,在塑磨 板、或是被覆有塑膠等之絕緣性基板上設濯 其上方焊接1C元件、半導體晶片、電阻窜 零件之方法已被廣泛地採用。 其中,作爲在電路基板的既定部分接会 線端子之方法,一般是依序進行以下步驟: 的導電性電路電極表面先形成焊料薄層之歩 層上印刷焊料糊或助焊劑之步驟、將既定的 定位載置之步驟、讓焊料薄層及焊料糊進行 以及讓焊料凝固而將電子零件與導電性電蹄 驟。 此外’最近隨著電子製品、電路基板之 是要求電子零件之細節距(fine pitch )化 這種細節距化之電子零件,例如〇.3mm Quad Flat Package ) 、CSP ( Chip Size 0.15mm節距之FC( Flip Chip) 、BGA構造的LSI晶片等 201227852 是已知的。此外,作爲將電子零件裝載於電路基板之方法 ’將電子零件的引線端子上所形成之焊料凸塊、與形成於 電路基板的既定部分之焊料凸塊重疊而進行熔焊的方法是 已知的。在這樣的方法中,爲了對應於電子零件之細節距 ’是要求焊料凸塊具有精細的圖案形狀。 此外,作爲在電路基板上形成焊料凸塊之方法,電鍍 法、無電解鍍敷法、印刷焊料粉末糊而進行熔焊的方法等 是已知的。然而,利用無電解鍍敷法之焊料凸塊製造方法 ’由於要將焊料層增厚有困難,並無法將電子零件與導電 性電路電極予以強固地接合。此外,利用電鍍法之焊料凸 塊製造方法,由於讓電鍍形成用的電流流過複雜的電路很 困難’並無法形成精細的圖案形狀之焊料凸塊。此外,印 刷焊料糊的方法,很難對應於細節距圖案,因此無法形成 精細的圖案形狀之焊料凸塊》 .基於以上的事情,作爲可對應於精細的圖案形狀而形 成具有一定且一致的高度之焊料凸塊的方法,是採用讓大 致球狀的焊料所構成的焊球附著在電路基板上之方法。 作爲讓焊球附著於電路上之方法,在電路基板之導電 性電路電極的表面讓黏著性賦予化合物反應而賦予黏著性 後’在前述黏著部讓焊球附著的方法是已知的。之後讓焊 球熔融而形成焊料凸塊(專利文獻1 )。再者,關於專利 文獻1所記載的方法之應用,在導電性電路電極上之必要 部分讓1個焊球附著的技術也已被開發出。(參照專利文 獻2 )201227852 VI. Description of the Invention: [Technical Fields of the Invention] The contents of the present application are applied to a three-substrate, ceramic-based [circuit pattern, on the circuit board of the electronic component such as a capacitor, etc. J electronic parts for F fusion welding steps, ^ electrode bonding steps: miniaturization development. As a QFP (Package) which can realize a pitch, the present invention relates to a method of manufacturing a solder ball. The present application claims priority from Japanese Patent Application No. 2010-241029, issued on Oct. 27, 2010. [Prior Art] In recent years, as a means for forming a circuit, a method of soldering a 1C element, a semiconductor wafer, and a resistor member on a plastic plate or an insulating substrate coated with a plastic or the like has been widely used. . Wherein, as a method of connecting the terminal to a predetermined portion of the circuit board, the following steps are generally performed in sequence: the step of printing a solder paste or a flux on the surface of the conductive circuit electrode surface to form a thin layer of solder first, The step of positioning the placement, the solder thin layer and the solder paste are performed, and the solder is solidified to eject the electronic component and the conductive electric shoe. In addition, recently, with electronic products and circuit boards, electronic components that require precise pitch of electronic components, such as 细节.3mm Quad Flat Package, CSP (Chip Size 0.15mm pitch) 201227852, such as an FC (Flip Chip) and an LSI wafer of a BGA structure, is known. Further, as a method of mounting an electronic component on a circuit board, a solder bump formed on a lead terminal of an electronic component is formed on a circuit board. A method of welding a predetermined portion of solder bumps is known. In such a method, the solder bumps are required to have a fine pattern shape in order to correspond to the fine pitch of the electronic parts. Further, as a circuit A method of forming a solder bump on a substrate, a plating method, an electroless plating method, a method of soldering a solder powder paste, and the like are known. However, a solder bump manufacturing method using an electroless plating method is It is difficult to thicken the solder layer, and it is impossible to firmly bond the electronic component and the conductive circuit electrode. In addition, the solder bump is formed by electroplating. In the manufacturing method, it is difficult to make a current for electroplating flow through a complicated circuit 'and it is impossible to form a solder bump of a fine pattern shape. Moreover, the method of printing a solder paste is difficult to correspond to a fine pitch pattern, and thus it is impossible to form a fine Solder bump of pattern shape. Based on the above, as a method of forming a solder bump having a certain and uniform height corresponding to a fine pattern shape, a solder ball composed of a substantially spherical solder is used. A method of adhering to a circuit board. As a method of attaching a solder ball to a circuit, the adhesive layer is allowed to react on the surface of the conductive circuit electrode of the circuit board to impart adhesiveness, and the solder ball is attached to the adhesive portion. The method is known. After that, the solder ball is melted to form a solder bump (Patent Document 1). Further, regarding the application of the method described in Patent Document 1, a solder ball is required in a necessary portion on the electrode of the conductive circuit. Adhesion technology has also been developed (refer to Patent Document 2).

S -6- 201227852 [專利文獻1]日本特開平7-7244號公報 [專利文獻2]日本特開2008-41803號公報 【發明內容】 然而,像BGA (球狀柵格陣列)構造的半導體装置 這種焊料凸塊必須具有一定高度的情況,若使用習知的焊 球,當將半導體晶片與電路基板經由熔焊進行連接時,會 發生焊球熔融而無法保持原有形狀的問題。因此,焊料凸 塊無法保持一定的高度,可能會讓半導體晶片以不均一地 下沉、傾斜狀態進行接合。 針對此問題,現在採用的方法,是讓高熔點的焊球一 旦在高溫下熔融而形成焊料凸塊後,藉由熔點比高熔點焊 球更低的低熔點焊料來將半導體晶片與電路基板進行接合 。作爲其他方法,’使用鍍敷有焊料層之銅等的金屬球(銅 核焊球)作爲焊球之方法也是已知的。依據此方法,將銅 核焊球配置於電路基板後一旦讓其熔融,藉此可形成焊料 凸塊,由於核體成爲間隔件,而能將電子零件和電路基板 間的距離保持一定。 然而,依據前述方法,高熔點焊料的材料有限’而必 須使用含有高濃度的鉛之組成。此外,已實用化之高熔點 焊料,是含有鉛9 5 %或8 0 %之鉛濃度極高者’鉛所釋放 出的α射線造成LSI等發生錯誤動作的原因。因此’必須 使用僅取出α射線低之鉛同位素的高價鉛’或完全無鉛的 201227852 高熔點焊料。 此外,使用銅核焊球的方法,要在銅核球上讓焊 一地附著是艱難的技術,而有製造成本顯著增高的問 因此,無法達成汎用化。 本發明是鑒於上述事情而開發完成的,其目的是 提供可對應於精細的圖案形狀且能低成本地形成之焊 造方法。 本發明人,爲了解決上述課題而深入探討的結果 本發明的完成。亦即本發明採用以下的技術手段。 〔1〕一種焊球之製造方法,其特徵在於,係具 在基材的表面所賦予之第一黏著層上讓核體附著之第 驟、在前述核體的表面塗布黏著性賦予化合物而形成 黏著層之第二步驟、在前述核體表面之第二黏著層上 料粒子附著之第三步驟、讓前述焊料粒子熔融而在前 體的表面形成焊料層之第四步驟、以及從前述核體將 基材剝離而獲得焊球之第五步驟。 〔2〕在〔1〕所記載的焊球之製造方法中,前述 是Cu所構成。 〔3〕在〔1〕或〔2〕所記載的焊球之製造方法 係在前述第一步驟之前包含前置步驟,該前置步驟, 具有讓前述第一黏著層表面的一部分露出的開口部之 構件配置在前述第一黏著層上; 之後,在前述第一步驟,在從前述開口部露出之 第一黏著層表面讓核體附著。 料均 題。 爲了 球製 到達 備: —步 第二 讓焊 述核 九 、r' 則述 核體 中, 是將 第一 前述 3 -8- 201227852 〔4〕在〔3〕所記載的焊球之製造方法中’前述第一 構件是由第一層及第二層所構成; 將前述第一構件配置在前述第一黏著層上之前置步驟 ,係包含: 將具有開口部的第一構件之第一層配置在前述第一黏 著層上的步驟;以及 在前述第一構件之第一層上,將具有直徑比前述開口 部更小的開口部之第一構件的第二層,以第一層之前述開 口部的中心部與第二層之前述開口部的中心部重疊的方式 進行配置的步驟; 在前述第一步驟和前述第二步驟之間’進一步具有將 前述第一構件之第二層從前述第一構件之第一層上剝離的 步驟。 〔5〕在〔3〕所記載的焊球之製造方法中’在前述第 一步驟和前述第二步驟之間具有: 將前述第一構件從前述第一黏著層上剝離的步驟:以 及 以覆蓋前述第一黏著層表面的方式’讓粒子構成的遮 罩附著的步驟;該粒子直徑比前述第一構件的厚度小。 〔6〕在〔1〕或〔2〕所記載的焊球之製造方法中, 在前述第一步驟之前,具有讓點狀之複數個前述第—黏著 層以互相離開的方式形成於前述基材表面之前置步驟。 〔7〕在〔6〕所記載的焊球之製造方法中’形成前述 第一黏著層之前置步驟,係包含: -9" 201227852 將具有讓前述基材表面的一部分露出之點狀的開口部 之第二構件配置在前述基材上之步驟;以及 以前述第二構件作爲遮罩而塗布用來形成前述第一黏 著層之黏著性物質,藉此獲得點狀的複數個前述第一黏著 層之步驟。 〔8〕在〔6〕所記載的焊球之製造方法中,形成前述 點狀的第一黏著層之前置步驟,係包含: 在轉印用基材表面以互相離開的方式形成點狀的金屬 膜之步驟; 在前述金屬膜塗布黏著性賦予化合物之步驟、以及 從前述轉印用基材將前述黏著性賦予化合物轉印於前 述基材表面而形成第一黏著層之步驟。 〔9〕在〔8〕所記載的焊球之製造方法中,形成前述 點狀的第一黏著層之前置步驟,係包含:在藉由具有開口 部之遮罩覆蓋前述基材表面後,在從遮罩的前述開□部露 出之前述基材表面上,從轉印用基材轉印前述黏著性賦予 化合物之步驟; 在第二步驟,是維持將前述基材表面藉由遮罩覆蓋, 而在核體上形成前述第二黏著層。 〔10〕在〔6〕所記載的焊球之製造方法中,形成前 述第一黏著層之前置步驟,係包含: 在前述基材表面以互相離開的方式形成點狀@ 之步驟、以及 在前述金屬膜塗布黏著性賦予化合物而形成[Patent Document 1] Japanese Laid-Open Patent Publication No. 2008-41803 (Patent Document 2) However, a semiconductor device such as a BGA (spherical grid array) structure Such a solder bump must have a certain height. When a conventional solder ball is used, when the semiconductor wafer and the circuit board are connected by fusion welding, the solder ball is melted and the original shape cannot be maintained. Therefore, the solder bumps cannot be maintained at a constant height, and the semiconductor wafer may be bonded in a state of uneven sinking and tilting. In response to this problem, the current method is to allow a high melting point solder ball to melt and form a solder bump, and then use a low melting point solder having a lower melting point than the high melting point solder ball to carry the semiconductor wafer and the circuit substrate. Engage. As another method, a method of using a metal ball (copper core solder ball) such as copper plated with a solder layer as a solder ball is also known. According to this method, the copper core solder balls are placed on the circuit board and then melted, whereby solder bumps can be formed, and since the core body serves as a spacer, the distance between the electronic component and the circuit board can be kept constant. However, according to the foregoing method, the material of the high melting point solder is limited, and it is necessary to use a composition containing a high concentration of lead. In addition, the high-melting-point solder that has been put to practical use is a high-concentration lead containing 95% or 80% of lead. The α-ray emitted by lead causes LSI and other malfunctions. Therefore, it is necessary to use a high-priced lead that removes only lead isotope with low alpha rays or a fully lead-free 201227852 high melting point solder. In addition, in the method of using the copper core ball, it is a difficult technique to attach the solder to the copper ball, and there is a problem that the manufacturing cost is remarkably increased, and therefore, the generalization cannot be achieved. The present invention has been made in view of the above circumstances, and an object thereof is to provide a welding method which can be formed at a low cost in accordance with a fine pattern shape. The inventors of the present invention have intensively studied the results of the present invention in order to solve the above problems. That is, the present invention employs the following technical means. [1] A method for producing a solder ball, characterized in that a tie is applied to a first adhesive layer provided on a surface of a substrate to adhere a core, and an adhesion-promoting compound is formed on a surface of the core body. a second step of adhering the layer, a third step of attaching the particles to the second adhesive layer on the surface of the core, a fourth step of melting the solder particles to form a solder layer on the surface of the precursor, and a nucleus from the core The fifth step of stripping the substrate to obtain a solder ball. [2] The method for producing a solder ball according to [1], wherein the method is Cu. [3] The method for producing a solder ball according to [1] or [2], before the first step, comprising a pre-step having an opening for exposing a part of a surface of the first adhesive layer The member is disposed on the first adhesive layer; and then, in the first step, the core body is adhered to the surface of the first adhesive layer exposed from the opening. The problem is the same. In order to achieve the ball, the second step is to make the core 9 and r'. In the core, the first 3-8-201227852 [4] is used in the method of manufacturing the solder ball described in [3]. The first member is composed of a first layer and a second layer; and the step of disposing the first member on the first adhesive layer comprises: forming a first layer of the first member having an opening a step of disposing on the first adhesive layer; and a second layer of the first member having an opening having a smaller diameter than the opening portion on the first layer of the first member, as described above in the first layer a step of disposing a central portion of the opening portion and a central portion of the opening portion of the second layer; between the first step and the second step, further having a second layer of the first member from the foregoing The step of peeling off the first layer of the first member. [5] The method for producing a solder ball according to [3], wherein the step of peeling the first member from the first adhesive layer is performed between the first step and the second step: and covering The manner of the surface of the first adhesive layer is a step of attaching a mask composed of particles; the particle diameter is smaller than the thickness of the first member. [6] The method for producing a solder ball according to [1] or [2], wherein before the first step, a plurality of the first adhesive layers having a dot shape are formed on the substrate so as to be apart from each other The surface is pre-stepped. [7] The method for producing a solder ball according to [6], wherein the step of forming the first adhesive layer comprises: -9 " 201227852 having a dot-like opening for exposing a part of the surface of the substrate a step of disposing a second member on the substrate; and coating the adhesive material for forming the first adhesive layer with the second member as a mask, thereby obtaining a plurality of the first adhesives in a dot shape The steps of the layer. [8] The method for producing a solder ball according to [6], wherein the step of forming the dot-shaped first adhesive layer comprises: forming a dot shape on a surface of the substrate for transfer from each other a step of applying a tackifying compound to the metal film, and a step of transferring the tackifying compound onto the surface of the substrate from the transfer substrate to form a first adhesive layer. [9] The method for producing a solder ball according to [8], wherein the step of forming the dot-shaped first adhesive layer comprises: covering the surface of the substrate with a mask having an opening; a step of transferring the adhesion-imparting compound from the transfer substrate on the surface of the substrate exposed from the opening portion of the mask; and in the second step, maintaining the surface of the substrate covered by a mask And forming the aforementioned second adhesive layer on the core body. [10] The method for producing a solder ball according to [6], wherein the step of forming the first adhesive layer comprises: forming a dot @ on the surface of the substrate so as to be apart from each other, and The metal film is coated with an adhesive imparting compound to form

S -10- 201227852 黏著層之步驟。 〔11〕在〔10〕所記載的焊球之製造方法中,形成前 述第~黏著層之前置步驟,係包含: 在前述基材表面以互相離開的方式形成點狀的金屬膜 之步驟;以及 在將前述基材表面藉由具有開口部之遮罩覆蓋後,在 從前述開口部露出之前述金屬膜表面塗布前述黏著性賦予 化合物之步驟。 〔12〕在〔10〕或〔11〕所記載的焊球之製造方法中 ,前述金屬膜是鎢所構成。 〔1 3〕在〔1〕至〔1 2〕任一者所記載的焊球之製造 方法中,前述焊料粒子的平均粒徑是前述核體的平均粒徑 之1/2倍以下。 依據本發明的焊球之製造方法,由於在核體表面透過 第二黏著層讓焊料粒子附著後再讓焊料粒子熔融,可在核 體表面均一地形成焊料層。此外,相較於利用電鍍等來形 成焊料層之習知方法,更容易形成焊料層。 此外,由於在讓核體透過第一黏著層而附著在基材表 面的狀態下,將焊料層形成於核體上,相較於習知方法, 可同時處理更多的核體。此外,由於在基材表面上透過第 一黏著層讓核體附著,在焊料層形成後,容易將核體從基 材去除。 依據以上說明’比起習知方法,可大幅簡化焊球的形 成步驟,並能高效率地進行生產。因此,能降低焊球的製 -11 - 201227852 造成本。 此外,藉由在核體表面覆蓋焊料層’在利用其等所形 成的焊球來形成焊料凸塊時,核體可發揮間隔件的作用。 因此,即使焊料層熔融,焊料凸塊仍可保持一定的高度。 因此,即使在焊料凸塊上裝載電子零件,電子零件不致因 本身的重量而造成下沉。如此,能將電子零件與電路基板 間的距離保持一定。 【實施方式】 以下針對本發明的較佳例做說明,但本發明並不僅限 定於該等例子。在不脫離發明的範圍內,當然可進行數量 、位置、大小、數値等的變更及追加。 (第一實施方式) 以下,參照圖式來說明本發明的第一實施方式之焊球 7〇製造方法。第1A圖至第1E圖係說明本實施方式的焊 球製造方法之步驟圖。 第一實施方式的焊球70製造方法,槪略包含:在設 有第一黏著層5之基材1的表面la讓核體11附著之第一 步驟、在核體11的表面11a形成第二黏著層13之第二步 驟' 在第二黏著層13表面讓焊料粒子14附著之第三步驟 、讓焊料粒子14熔融而在核體11上形成焊料層15之第 四步驟、以及從核體11將基材1剝離之第五步驟。 在黏著層13上,在讓核體11附著之前,配置具有開 3 -12- 201227852 口部的構件2 1 (第一構件),在第一步驟,在從構件2 1 的開口部內露出之黏著層5的表面上,讓核體11附著。 以下針對各步驟進行詳細的說明。 首先,準備好設有第一黏著層5之基材1。 作爲基材1,例如可使用聚醯亞胺構成的基材、耐酸 性樹脂構成的基材、陶瓷基材、及玻璃基材等。此外,基 材1並不限.定於在此列舉的材料,只要是能承受在後述焊 料粒子14熔融時的熱之材料所構成的基材即可,都能不 受限制地作爲本發明的基材來使用。 在基材1賦予第一黏著層5。形成第一黏著層5的材 料,只要是核體1 1能附著且能承受後述焊料粒子1 4熔融 時的熱,不管是使用什麼材料都可以。具體而言,可使用 矽系黏著材等之具有耐熱性的黏著材。此外,作爲具有第 —黏著層5之基材1,可使用聚醯亞胺載帶(tape)。 接著,以覆蓋第一黏著層5的表面5a的方式配置第 —構件2 1。 第一構件21,是在後述第一步驟中,用來在第一黏 著層5的表面5a上隔著間隔配置核體11之構件。在第一 構件21上,隔著間隔設置點狀的複數個第一開口部3 1。 開口部的間隔、配置形態可任意地選擇。藉由以覆蓋第一 黏著層5的表面5a的方式配置第一構件21,使第一黏著 層5的表面5a之一部分呈點狀地露出。 此外’作爲第一黏著層5 ’也能使用經由紫外線照射 、加熱等而使表面5a的黏著性消失的材料。此外,在使 -13- 201227852 用這種材料的情況,可在任意的階段,進行讓第一黏著層 5的黏著性消失之紫外線照射、加熱等。 第一構件21可使用:一般用來配置核體1 1之設有開 口部的金屬製的板狀構件。具體而言,作爲第一構件21 的材料,可使用60/zm厚左右的不鏽鋼、鎳。 此外,第一構件21的材料並不限於金屬,只要在後 述將第二黏著層13形成於核體11上之步驟中,不致讓黏 著性賦予被第一構件2 1覆蓋的部分者即可,其材料沒有 特別的限定。此外,第一構件2 1並不限於板狀構件,藉 由網版印刷將耐焊用糊劑塗布於第一黏著層5的表面而構 成者亦可。 此外,第一構件21的厚度Η (基材1之一面la和第 一構件21之上面的高低差),可配合核體11的粒徑D 而適當地設定,厚度Η較佳爲設定成比核體11的粒徑D 小,更佳爲設定在1 // m以上、粒徑D的1 /2以下的範圍 內。 另一方面,若厚度Η比粒徑D大,核體11變得不容 易進入第一開口部31內,因此不理想。此外,若厚度Η 未達lym,核體11容易脫落,因此也不理想。 此外,第一開口部31的直徑F!,爲了避免在第一開 口部31內配置2個以上的核體11,較佳爲配合第一構件 21的厚度Η和核體11的粒徑D而適當地設定。直徑F, 的範圍能用下述數學式(1)表示。 3 •14- 201227852 [數1】 2,/h(D-H)^F ^D+ZVHCD-H) · · · ( 1 ) 依據上述數學式,具體而言,例如粒徑D爲100ym 、且第一構件21的厚度Η爲20 // m的情況,第一開口部 31的直徑?!爲80/zm以上且未達180/zm。 此外,第一開口部31的直徑Fi之更佳範圍,假設核 體11表面上所附著之焊料粒子14的直徑爲d,則能用下 述數學式(2)表示。 【數2】 D+ 2 F1SD + 4 d · ·.⑵ 藉由使直徑?!在數學式(2)的範圍內,容易讓核體 1 1附著於第一開口部3 1內。 此外,相鄰接之第一開口部3 1彼此的間隔G ,,較佳 爲對應於核體1 1之粒徑D與焊料粒子14之粒徑d與第 一構件21之厚度Η而適當地設定。相鄰接之第一開口部 31彼此的間隔Gi,能用下述數學式(3)表示。 【數3】 2 d + D-2VH(D-H) <G-, · · · (3) 此外,相鄰接之第一開口部31彼此的間隔G,之更佳 範圍,假設焊料粒子1 4的直徑爲d,則能用下述數學式 (4 )表示。 -15- 201227852 【數4】 4 d+D-2VH(D-H) SG-,^8d + D-2VH(D-H) · · · (4) 藉由使相鄰接之第一開口部31彼此的間隔Gi在數學 式(4)的範圍內,能在基材1上以高密度形成焊球70, 並能防止相鄰接之焊球70彼此接合。 另一方面,若第一開口部3 1彼此的間隔G,比數學式 (3 )表示的最小値更小,焊球7 0彼此可能發生接合,因 此並不理想。此外,若第一開口部3 1彼此的間隔過寬, 一次可形成的焊球70數目減少,製造效率降低,並不理 想。 此外’第一開口部3 1之俯視形狀宜爲圓形,亦可爲 橢圓形、四角形。 (第一步驟) 接著,如第1A圖所示般’在從第一開口部31露出 之第一黏著層5的表面5a讓核體11附著。 這時’作爲在第一黏著層5上讓核體11附著的方法 ’可按照需要而選擇,例如可採用:在空氣中或非活性氛 圍中朝第一黏著層5直接供應核體11的方法;或在未圖 示的分散液中讓核體Π分散而形成漿體狀態,將該漿體 供應給第一黏著層5的方法。 11 氣 11。這時核體11的量 首先說明,在空氣中或非活性氣體氛圍中,讓核體 附著於第一黏著層5的方法的例子。首先,在充滿空 或非活性氣體的容器內投入核體11。這時核體n的畺S -10- 201227852 Adhesive layer steps. [11] The method for producing a solder ball according to [10], wherein the step of forming the first adhesive layer comprises: forming a dot-shaped metal film on the surface of the substrate; And after coating the surface of the substrate with a mask having an opening, the step of applying the adhesion-imparting compound to the surface of the metal film exposed from the opening. [12] The method for producing a solder ball according to [10] or [11], wherein the metal film is made of tungsten. [13] The method for producing a solder ball according to any one of [1] to [1], wherein the average particle diameter of the solder particles is 1/2 or less of an average particle diameter of the core body. According to the method of manufacturing a solder ball of the present invention, since the solder particles are adhered to the surface of the core body through the second adhesive layer and then the solder particles are melted, the solder layer can be uniformly formed on the surface of the core. Further, it is easier to form a solder layer than a conventional method of forming a solder layer by plating or the like. Further, since the solder layer is formed on the core body while the core body is allowed to adhere to the surface of the substrate through the first adhesive layer, more core bodies can be processed simultaneously than in the conventional method. Further, since the core body is adhered to the surface of the substrate through the first adhesive layer, the core body is easily removed from the substrate after the formation of the solder layer. According to the above description, the formation of the solder balls can be greatly simplified and the production can be performed efficiently as compared with the conventional method. Therefore, it can reduce the welding ball system -11 - 201227852 caused this. Further, the core body can function as a spacer by forming a solder bump on the surface of the core body by soldering a solder ball formed by the solder layer. Therefore, even if the solder layer is melted, the solder bumps can maintain a certain height. Therefore, even if electronic parts are mounted on the solder bumps, the electronic parts do not sink due to their own weight. In this way, the distance between the electronic component and the circuit board can be kept constant. [Embodiment] Hereinafter, preferred embodiments of the present invention will be described, but the present invention is not limited to the examples. It is of course possible to change and add quantities, positions, sizes, numbers, and the like without departing from the scope of the invention. (First Embodiment) Hereinafter, a method of manufacturing a solder ball 7 according to a first embodiment of the present invention will be described with reference to the drawings. Fig. 1A to Fig. 1E are diagrams showing the steps of a method of manufacturing a solder ball according to the present embodiment. The method of manufacturing the solder ball 70 of the first embodiment includes a first step of attaching the core body 11 to the surface 1 of the substrate 1 on which the first adhesive layer 5 is provided, and a second step on the surface 11a of the core body 11. The second step of the adhesive layer 13 'the third step of attaching the solder particles 14 on the surface of the second adhesive layer 13 , the fourth step of melting the solder particles 14 to form the solder layer 15 on the core body 11 , and the slave core 11 The fifth step of peeling off the substrate 1. On the adhesive layer 13, before the core body 11 is attached, the member 2 1 (first member) having the opening portion of the opening 3 -12 - 201227852 is disposed, and in the first step, the adhesive is exposed in the opening portion of the member 2 1 On the surface of the layer 5, the core body 11 is attached. Each step will be described in detail below. First, the substrate 1 provided with the first adhesive layer 5 is prepared. As the substrate 1, for example, a substrate made of polyimide, a substrate made of an acid-resistant resin, a ceramic substrate, a glass substrate, or the like can be used. In addition, the base material 1 is not limited to the materials exemplified herein, and any material that can withstand the heat of the solder particles 14 to be described later can be used as the substrate of the present invention without limitation. The substrate is used. The first adhesive layer 5 is applied to the substrate 1. The material forming the first adhesive layer 5 may be any material that can be used as long as it can adhere to the core body 1 1 and can withstand melting of the solder particles 14 to be described later. Specifically, a heat-resistant adhesive such as a lanthanum-based adhesive can be used. Further, as the substrate 1 having the first adhesive layer 5, a polyimide polyimide tape can be used. Next, the first member 21 is disposed so as to cover the surface 5a of the first adhesive layer 5. The first member 21 is a member for arranging the core body 11 on the surface 5a of the first adhesive layer 5 with a space therebetween in the first step to be described later. In the first member 21, a plurality of dot-shaped first opening portions 31 are provided at intervals. The interval and arrangement of the openings can be arbitrarily selected. By arranging the first member 21 so as to cover the surface 5a of the first adhesive layer 5, a part of the surface 5a of the first adhesive layer 5 is exposed in a dot shape. Further, as the first adhesive layer 5', a material which causes the adhesion of the surface 5a to disappear by ultraviolet irradiation, heating or the like can be used. Further, in the case of using such a material from -13 to 201227852, ultraviolet irradiation, heating, or the like which causes the adhesion of the first adhesive layer 5 to disappear can be performed at an arbitrary stage. The first member 21 can be used: generally, a metal plate-like member provided with an opening portion of the core body 1 1 is disposed. Specifically, as the material of the first member 21, stainless steel or nickel having a thickness of about 60/zm can be used. Further, the material of the first member 21 is not limited to a metal, and as long as the second adhesive layer 13 is formed on the core body 11 as will be described later, the adhesiveness is not imparted to the portion covered by the first member 21, The material thereof is not particularly limited. Further, the first member 21 is not limited to the plate member, and the solder paste may be applied to the surface of the first adhesive layer 5 by screen printing. Further, the thickness Η of the first member 21 (the height difference between the one surface 1a of the substrate 1 and the upper surface of the first member 21) can be appropriately set in accordance with the particle diameter D of the core body 11, and the thickness Η is preferably set to be larger than The particle diameter D of the core body 11 is small, and is more preferably set to be in the range of 1 / 2 m or more and 1 / 2 or less of the particle diameter D. On the other hand, if the thickness Η is larger than the particle diameter D, the core body 11 does not easily enter the first opening portion 31, which is not preferable. Further, if the thickness Η is not up to lym, the core body 11 is liable to fall off, which is not preferable. Further, in order to avoid arranging two or more core bodies 11 in the first opening portion 31, it is preferable to mix the thickness Η of the first member 21 and the particle diameter D of the core body 11 in the diameter F! of the first opening portion 31. Set it appropriately. The range of the diameter F, can be expressed by the following mathematical formula (1). 3 • 14- 201227852 [Number 1] 2, /h(DH)^F ^D+ZVHCD-H) · (1) According to the above mathematical formula, specifically, for example, the particle diameter D is 100 μm, and the first When the thickness Η of the member 21 is 20 // m, the diameter of the first opening portion 31? ! It is 80/zm or more and less than 180/zm. Further, in the range of the diameter Fi of the first opening portion 31, assuming that the diameter of the solder particles 14 adhering to the surface of the core body 11 is d, it can be expressed by the following formula (2). [Number 2] D+ 2 F1SD + 4 d · ·. (2) By making the diameter? ! In the range of the mathematical formula (2), the core body 1 1 is easily attached to the first opening portion 31. Further, the interval G between the adjacent first opening portions 31 is preferably corresponding to the particle diameter D of the core body 11 and the particle diameter d of the solder particles 14 and the thickness of the first member 21, and appropriately set up. The interval Gi between the adjacent first opening portions 31 can be expressed by the following mathematical expression (3). [Equation 3] 2 d + D-2VH (DH) < G-, · · · (3) Further, the interval G between the adjacent first opening portions 31 is a better range, assuming solder particles 14 The diameter d is expressed by the following mathematical formula (4). -15- 201227852 [Equation 4] 4 d+D-2VH(DH) SG-, ^8d + D-2VH(DH) · (4) By spacing the adjacent first opening portions 31 from each other Gi can form the solder balls 70 at a high density on the substrate 1 within the range of the mathematical formula (4), and can prevent the adjacent solder balls 70 from being bonded to each other. On the other hand, if the interval G between the first openings 3 1 is smaller than the minimum 値 represented by the formula (3), the solder balls 70 may be joined to each other, which is not preferable. Further, if the interval between the first openings 3 1 is too wide, the number of solder balls 70 that can be formed at one time is reduced, and the manufacturing efficiency is lowered, which is not desirable. Further, the first opening portion 31 has a circular shape in plan view, and may have an elliptical shape or a quadrangular shape. (First Step) Next, as shown in Fig. 1A, the core body 11 is adhered to the surface 5a of the first adhesive layer 5 exposed from the first opening portion 31. At this time, 'the method of attaching the core body 11 on the first adhesive layer 5' may be selected as needed, for example, a method of directly supplying the core body 11 toward the first adhesive layer 5 in air or in an inert atmosphere; Or a method in which a core body is dispersed in a dispersion liquid (not shown) to form a slurry state, and the slurry is supplied to the first adhesive layer 5. 11 gas 11. The amount of the core body 11 at this time First, an example of a method of allowing the core body to adhere to the first adhesive layer 5 in air or in an inert gas atmosphere will be described. First, the core body 11 is placed in a container filled with an empty or inert gas. At this time, the nucleus of the nuclei

-16- 201227852 可任意地選擇。接著,在容器內設置形成有第一黏著層5 之基材1。接著,利用讓容器傾斜或振動等的方法,讓第 一黏著層5與核體11接觸。藉此,在第一黏著層5的表 面5a讓核體11附著。未附著的核體,可按照需要而將其 除去。 接著說明,在液體中讓核體11附著於第一黏著層5 的方法的例子。首先,將水等的分散液投·入未圖示的容器 內,然後將核體1 1添加於分散液中。接著,將容器傾斜 而使分散液與核體11集中於一方後,以不與分散液和核 體11接觸的方式將基材1設置於容器內。接著,讓容器 左右傾斜,藉此在分散液中讓基材1上的第一黏著層5與 核體11接觸。藉此,在第一黏著層5上讓核體11附著。 如此般在液體中讓核體U附著,可防止核體1丨因靜 電而附著在無黏著性的部分,並防止核體11因靜電而發 生凝集。因此,在液體中讓核體11附著的方法,在使用 微小的核體11的情況特佳。 讓核體11附著於第一黏著層5的方法,並不限定於 在液體中附著的方法,依核體1 1的大小等的條件可適當 地採用合適的方法。 作爲核體1 1的材料可使用金屬,例如較佳爲使用錫 (bn),更佳爲使用銅(Cu)。核體丨丨的材料並不限於 該等’只要是具有比後述焊料粒子〗4的熔點更高的熔點 ’且藉由第二黏著性賦予化合物可獲得黏著性的物質即可 ,也能使用導電性物質、合金等其他的材料。除了銅、錫 -17- 201227852 以外,其他物質的例子包含:例如Ni、Ni-Au、或Au_Sl· 等的金屬、合金等。 此外,核體1 1之平均粒徑D,基於作業性的觀點, 宜在20仁m〜20 0 /zm的範圍內,較佳爲30/zm〜130"„!的 範圍內,更佳爲50/zm〜80/zm的範圍內。 (第二步驟) 接著如第1B圖所示般,在核體11的表面11a,塗布 黏著性賦予化合物而形成第二黏著層13。 首先,將以下所示的黏著性賦予化合物(第一黏著性 賦予化合物)當中至少1種或2種以上溶解於水或酸性水 中,較佳爲調整成pH 3〜4左右的微酸性。藉此形成黏著 性溶液。接著,在黏著性溶液浸入第一步驟所獲得的基材 1,或在基材1上塗布黏著性溶液,藉此在核體11的表面 Ila形成第二黏著層13。 在此,作爲黏著性賦予化合物可任意地選擇,例如可 使用:萘并三唑系衍生物、苯并三唑系衍生物、咪唑系衍 生物 '苯并咪唑系衍生物、锍基苯并噻唑系衍生物及苯并 噻唑硫脂肪酸等。該等的黏著性賦予化合物,對於金屬等 ,特別是對於銅之黏著性賦予作用的效果良好。此外,除 了銅以外,也能對於其他的導電性物質等賦予黏著性。 此外,適用於本發明之苯并三唑系衍生物,能用一般 式(1 )表示。 -18- 3 201227852 【化1】 R3 R4-16- 201227852 can be arbitrarily chosen. Next, the substrate 1 on which the first adhesive layer 5 is formed is placed in the container. Next, the first adhesive layer 5 is brought into contact with the core body 11 by a method of tilting or vibrating the container. Thereby, the core body 11 is attached to the surface 5a of the first adhesive layer 5. Unattached cores can be removed as needed. Next, an example of a method of attaching the core body 11 to the first adhesive layer 5 in a liquid will be described. First, a dispersion liquid such as water is placed in a container (not shown), and then the core body 1 1 is added to the dispersion liquid. Next, the container is tilted to concentrate the dispersion and the core body 11 on one side, and the substrate 1 is placed in the container so as not to come into contact with the dispersion liquid and the core body 11. Next, the container is tilted left and right, whereby the first adhesive layer 5 on the substrate 1 is brought into contact with the core body 11 in the dispersion. Thereby, the core body 11 is attached to the first adhesive layer 5. By attaching the core body U to the liquid in this manner, it is possible to prevent the core body 1 from adhering to the non-adhesive portion due to static electricity, and to prevent the core body 11 from agglomerating due to static electricity. Therefore, the method of attaching the core body 11 to the liquid is particularly preferable in the case of using the minute core body 11. The method of attaching the core body 11 to the first adhesive layer 5 is not limited to the method of adhering to the liquid, and a suitable method can be suitably employed depending on conditions such as the size of the core body 11. As the material of the core body 1, a metal can be used, and for example, tin (bn) is preferably used, and copper (Cu) is more preferably used. The material of the core ruthenium is not limited to such a material as long as it has a melting point higher than the melting point of the solder particles 4 described later, and the second adhesiveness-imparting compound can obtain adhesiveness, and conductive can also be used. Other materials such as substances and alloys. Examples of other materials other than copper and tin -17-201227852 include metals such as Ni, Ni-Au, or Au_Sl·, alloys, and the like. Further, the average particle diameter D of the core body 1 is preferably in the range of 20 Å to 20 0 /zm, preferably in the range of 30/zm to 130" „, based on workability, and more preferably In the range of 50/zm to 80/zm (Second step) Next, as shown in Fig. 1B, an adhesive adhesion-imparting compound is applied to the surface 11a of the core body 11 to form the second adhesive layer 13. First, the following At least one or two or more of the adhesion-imparting compound (first adhesion-imparting compound) are dissolved in water or acidic water, preferably to a slightly acidic pH of about 3 to 4. Thereby an adhesive solution is formed. Then, the adhesive solution is immersed in the substrate 1 obtained in the first step, or an adhesive solution is applied on the substrate 1, whereby the second adhesive layer 13 is formed on the surface 11a of the core body 11. Here, as the adhesive The property-imparting compound can be arbitrarily selected, and, for example, a naphthotriazole derivative, a benzotriazole derivative, an imidazole derivative, a benzimidazole derivative, a mercaptobenzothiazole derivative, and a benzene can be used. And thiazole sulfur fatty acids, etc. These adhesion imparting compounds, for The genus and the like have a good effect on the adhesion of copper. In addition to copper, it is also capable of imparting adhesion to other conductive materials, etc. Further, it is suitable for the benzotriazole derivative of the present invention. It can be expressed by the general formula (1). -18- 3 201227852 [Chemical 1] R3 R4

式(1)中,R1〜R4獨立爲氫原子、碳數1〜16(較佳 爲5〜16)之烷基、烷氧基、F、Br、C1、I、氰基、胺基 或OH基。 此外,適用於本發明之萘并三唑系衍生物,能用一般 式(2 )表不。 [化2】 R7 R8 R9 ΗIn the formula (1), R1 to R4 are independently a hydrogen atom, an alkyl group having 1 to 16 carbon atoms (preferably 5 to 16), an alkoxy group, F, Br, C1, I, a cyano group, an amine group or an OH group. base. Further, the naphthotriazole derivative which is suitable for use in the present invention can be represented by the general formula (2). [Chemical 2] R7 R8 R9 Η

式(2)中,R5〜R10獨立爲氫原子、碳數1~16(較 佳爲5~16)之烷基、烷氧基、F、Br、C1、I、氰基、胺 基或OH基。 再者,適用於本發明之咪唑系衍生物。能用一般式( 3 )表示。 I【化3】In the formula (2), R5 to R10 are independently a hydrogen atom, an alkyl group having 1 to 16 carbon atoms (preferably 5 to 16), an alkoxy group, F, Br, C1, I, a cyano group, an amine group or an OH group. base. Further, it is suitable for the imidazole-based derivative of the present invention. It can be expressed by the general formula (3). I [化3]

R11—C\N/C—R12 • · (3) 式(3)中,R11、R12獨立爲氫原子、碳數1〜16( -19- 201227852 較佳爲5〜16)之烷基、烷氧基、F、Br、Cl、I、氰基、 胺基或〇H基。 再者,適用於本發明之苯并咪唑系衍生物,能用一般 式(4 )表示。 【化4】R11—C\N/C—R12 • (3) In the formula (3), R11 and R12 are independently a hydrogen atom, an alkyl group having 1 to 16 carbon atoms (-19 to 201227852, preferably 5 to 16), and an alkane. An oxy group, F, Br, Cl, I, a cyano group, an amine group or a hydrazine H group. Further, the benzimidazole-based derivative to be used in the present invention can be represented by the general formula (4). 【化4】

• · · (4) 式(4)中,R13〜R17獨立爲氫原子、碳數1〜16(較 佳爲5~16)之烷基、烷氧基、F、Br、C1、I、氰基、胺 基或OH基。 此外,適用於本發明之锍基苯并噻唑系衍生物,能用 一般式(5 )表示。 【化5】(4) In the formula (4), R13 to R17 are independently a hydrogen atom, an alkyl group having 1 to 16 (preferably 5 to 16) carbon atoms, an alkoxy group, F, Br, C1, I, and cyanide. Base, amine or OH group. Further, the mercaptobenzothiazole derivative which is suitable for use in the present invention can be represented by the general formula (5). 【化5】

式(5 )中,R18~R2 1獨立爲氫原子、碳數1〜16(較 佳爲5〜16)之烷基、烷氧基、F、Br、C1、I、氰基、胺 基或OH基。 再者,適用於本發明之苯并噻唑硫脂肪酸系衍生物, 能用一般式(6 )表示。 -20- 3 • · (6) 201227852 【化6】 R24 R25 R26 y^·-N COOH * R22 式(6 )中,R2 2〜R26獨立爲氫原子、碳數 佳爲1或2)之烷基、烷氧基、F、Br、Cl、l、 基或OH基。 該等化合物當中,以一般式(1)表示之苯 衍生物中’ R1〜R4之碳數越多一般而言黏著性越 此外,一般式(3)及一般式(4)所表示之 生物及苯并咪唑系衍生物的R11-R17也是,一 數越多黏著性越強。 再者,一般式(6)所表示之苯并噻唑硫脂 生物中,R22〜R26之碳數較佳爲1或2。 此外,作爲黏著性溶液之pH調整用的物質 可列舉鹽酸、硫酸、硝酸、磷酸等的無機酸,或 又作爲有機酸的例子,可使用甲酸、乳酸、醋 蘋果酸、草酸、丙二酸、琥珀酸、酒石酸等。 黏著性溶液中黏著性賦予化合物的濃度,沒 限定,可對應於溶解性及使用狀況而適當地調整 相對於黏著性溶液全體在〇.〇5質量%〜20質量% 。藉由使黏著性賦予化合物的濃度在此範圍內, 11賦予充分的黏著性。另一方面’若相對於黏 全體未達0.05質量%,無法賦予充分的黏著性 -21 - 1〜16 (較 氰基、胺 并三唑系 強。 咪唑系衍 般而言碳 肪酸系衍 的例子, 有機酸。 、丙酸、 有特別的 ,較佳爲 的範圍內 能對核體 著性溶液 ,此外, 201227852 若相對於黏著性溶液全體超過20質量%,會消耗多量的 黏著性賦予化合物而使效率變差,並不理想。 將黏著性賦予核體11的表面11a時之處理溫度,較 佳爲比室溫高若干。藉此,使第二黏著層13具有足夠的 形成速度及形成量。此外,最佳處理溫度,雖依黏著性賦 予化合物的濃度、第二黏著層13之材料金屬種類等而有 不同,一般而言宜爲30 °C〜60 °C左右的範圍。此外,較佳 爲調整其他條件,而使在黏著性溶液中的浸漬時間成爲5 秒〜5分鐘左右的範圍。 此外,在黏著性溶液中,較佳爲讓離子形態的銅以 50〜1 000Ppm的量共存。藉由讓銅離子以該範圍的量共存 ’可提高第二黏著層13之形成速度及形成量等的形成效 率。 (第三步驟) 接著,如第1C圖所示般,在核體11表面上之第二黏 著層1 3上,讓焊料粒子1 4附著》 作爲在第二黏著層13讓焊料粒子14附著的方法之例 子’係包含··在空氣中或非活性氛圍中朝第二黏著層13 直接供應焊料粒子14的方法;或在未圖示的分散液中讓 焊料粒子1 4分散而形成漿體狀態,將該漿體供應給第二 黏著層13的方法。關於在第二黏著層13讓焊料粒子14 附著的方法,由於與第一步驟中在基材丨的表面la讓核 體1 1附著的方法相同,故省略詳細的說明。 -22- 3 201227852 又’在讓核體11附著前的階段,作爲第一黏著層5 ’當使用經由紫外線照射、加熱等會使表面5a的黏著性 消失的材料的情況,在將核體11設置於第一黏著層5上 之後’將第一構件21剝離亦可。在此情況,將第一構件 2 1剝離後經由紫外線照射、加熱等而實施讓表面5a的黏 著性消失之處理’可防止焊料粒子14附著於第一黏著層 的表面5 a。 此外’爲了在一粒的核體1 1上附著複數個焊料粒子 14’焊料粒子14的粒徑d設定成比核體n的平均粒徑D 小。焊料粒子14的粒徑d,可對應於核體1 1的粒徑D而 適當地設定,但較佳爲1 // m以上且粒徑D的1 /2倍以下 。藉由使焊料粒子14的粒徑d在此範圍內,可在一粒核 體11上附著複數個焊料粒子14。 另一方面,若焊料粒子14的粒徑d未達lym,焊料 層15的膜厚變得過薄,所形成的焊球70熔焊時的焊料量 變得不足。因此,在將焊球70熔焊時,焊料凸塊容易從 電路基板剝落,並不理想。亦即,焊料層1 5變得不足, 並不理想。此外,若焊料粒子14的粒徑d爲核體11的平 均粒徑D之1/2以上,無法在一粒核體11上附著充分數 量的焊料粒子1 4,並不理想。 此外,焊料粒子1 4的金屬組成,例如可列舉Sn-Pb 系、Sn-Pb-Ag 系、Sn-Pb-Bi 系、Sn-Pb-Bi-Ag 系、及 Sn-Pb-Cd系。又基於最近的事業廢棄物中排除Pb的觀點, 較佳爲不含Pb之Sn-In系、Sn-Bi系、In-Ag系、In-Bi -23- 201227852 系、Sn-Zn 系、Sn-Ag 系、S η - C u 系、S η - S b 系、Sn-Au 系 、Sn-Bi-Ag-Cu 系、Sn-Ge 系、S n - B i - C u 系、S n - C u - S b - A g 系、Sn-Ag-Zn 系、Sn-Cu-Ag 系、Sn-Bi-Sb 系、Sn-Bi-Sb-Zn 系、Sn-Bi-Cu-Zn 系、Sn-Ag-Sb 系、Sn·Ag-Sb-Zn 系、 Sn-Ag-Cu-Zn 系、及 Sn-Zn-Bi 系。 上述金屬組成的具體例,以Sn爲63質量%、Pb爲 37質量%之共晶焊料(以下稱63Sn/37Pb )爲中心,可列 舉 62Sn/36Pb/2Ag、6 2.6 S η/3 7 P b / 0.4 A g、60Sn/40Pb、 50Sn/50Pb、30Sn/70Pb、25Sn/75Pb ' 1OSn/8 8Pb/2Ag、 46Sn/8Bi/46Pb、5 7Sn/3 Bi/40Pb、42 Sn/42Pb/1 4Bi/2 Ag、 45 Sn/40Pb/15Bi 、 50Sn/32Pb/1 8Cd 、 48Sn/52In 、 43Sn/57Bi、97In/3Ag、58Sn/42In、95In/5Bi、60Sn/40Bi 、91Sn/9Zn、9 6.5 S n / 3 . 5 A g、9 9.3 S n/0.7 C u、95Sn/5Sb、 20Sn/80Au 、 90Sn/l OAg 、 9 0 S n/7.5 B i / 2 A g/0.5 C u 、 97Sn/3Cu、99Sn/lGe、9 2 S n / 7.5 B i / 0.5 C u、 97Sn/2Cu/0.8Sb/0.2Ag、9 5.5 S n / 3 · 5 A g/1 Z n、 95.5 Sn/4Cu/0.5 Ag ' 5 2 S n/4 5 B i / 3 S b、5 1 S n / 4 5 B i / 3 S b /1 Z n、 85Sn/10Bi/5Sb、84Sn/I0Bi/5Sb/lZn、 88.2Sn/l 0Bi/0.8Cu/l Zn ' 8 9 S n/4 A g/7 S b、 88Sn/4Ag/7Sb/l Zn、98Sn/l Ag/lSb、97Sn/1 Ag/1 Sb/1 Zn、 91.2Sn/2Ag/0.8Cu/6Zn、89Sn/8Zn/3Bi、86Sn/8Zn/6Bi、 及89.1Sn/2Ag/0.9Cu/8Zn等。此外,作爲本實施方式之焊 料粒子1 4,也能將2種以上不同組成的焊料粒子混合而 構成。 -24- 201227852 (第四步驟) 接著,如第ID圖所示般進行熔焊步驟而形成焊料層 15 〇 在第三步驟是在分散液中讓焊料粒子14附著於核體 11的情況,先讓基材1乾燥。 接著,進行核體11及焊料粒子14之固著。固著是指 ’在核體11和焊料粒子14之間,讓核體11的構成材料 往焊料粒子14側擴散的反應。藉由讓該反應進展,而將 焊料粒子14固定於核體11。 這時’固著溫度較佳爲,相對於所使用的焊料之熔點 ’在-50 °C〜+ 50 °C的範圍內,更佳爲-30 °C〜+ 30。(:的範圍內 。固著溫度在此範圍內的情況,焊料粒子14不會發生熔 融’或即使其內部溶解,利用存在於表面之氧化膜的效果 可防止發生熔融而流出。因此,可保持焊料粒子1 4的形 狀而進行固著。 接著,在設有核體11 (固著有焊料粒子14)之基材 1上塗布水溶性助焊劑。作爲水溶性助焊劑,例如可使用 曰本特開2004-282062號公報所記載的助焊劑。藉由在基 材1塗布水溶性助焊劑,可除去焊料粒子1 4表面與核體 11的表面11a之氧化膜。 接著進行熔焊,讓焊料粒子14熔融。藉由該熔焊, 使焊料粒子14熔融,而遍及核體n的表面na全體形成 焯料層15。這時的加熱溫度較佳爲200。(:~3 00。(:的範圍, -25- 201227852 更佳爲焊料熔點+10°C〜5 0 °c。藉由在此範圍內的溫度進行 加熱,能使焊料粒子14的熔融焊料與核體11的表面11a 充分地反應,而形成擴散層。 (第五步驟) 接著,如第1E圖所示般,從第一黏著層5的表面5a 將第一構件21剝離。然後,從基材1將核體! 1剝離。這 時,將核體11從基材1剝離的方法,可按照第一黏著層 5的材料而適當地選擇。具體而言,例如可採用:藉由超 音波洗淨機對基材1賦予振動的方法、藉由溶劑讓第一黏 著層5溶解的方法。將核體11從基材〗剝離的方法,並 不限定於上述方法,當基材1具有可撓性的情況,藉由將 基材1彎折而將核體1 1剝離亦可。 經由以上手法來形成焊球7 0。 依據第一實施方式的焊球70之製造方法,由於在核 體11的表面11a透過第二黏著層13讓焊料粒子14附著 後再讓焊料粒子14熔融,可在核體11的表面iia均一地 形成焊料層1 5。此外,相較於藉由電鍍等來形成焊料層 之習知方法,更容易形成焊料層15。 此外,是在讓核體11透過第一黏著層5附著於基材 1的表面la的狀態下’來形成焊料層15,比起習知方法 ’可同時處理更多的核體11。此外,由於在基材1的表 面la透過第一黏著層5讓核體11附著,在焊料層15形 成後,容易將核體11從基材1除去。In the formula (5), R18 to R2 1 are independently a hydrogen atom, an alkyl group having 1 to 16 (preferably 5 to 16) carbon atoms, an alkoxy group, F, Br, C1, I, a cyano group, an amine group or OH group. Further, the benzothiazole sulfur fatty acid derivative which is suitable for use in the present invention can be represented by the general formula (6). -20- 3 • · (6) 201227852 [Chem. 6] R24 R25 R26 y^·-N COOH * R22 In the formula (6), R2 2 to R26 are independently a hydrogen atom, and the carbon number is preferably 1 or 2). Alkyl, alkoxy, F, Br, Cl, 1, base or OH group. Among these compounds, the more the carbon number of 'R1 to R4' in the benzene derivative represented by the general formula (1), the more generally the adhesion is, and the organisms represented by the general formula (3) and the general formula (4) The R11-R17 of the benzimidazole-based derivative is also such that the more the number, the stronger the adhesion. Further, in the benzothiazole thiolipate represented by the general formula (6), the carbon number of R22 to R26 is preferably 1 or 2. Further, examples of the pH adjusting agent for the adhesive solution include inorganic acids such as hydrochloric acid, sulfuric acid, nitric acid, and phosphoric acid, and examples of organic acids, formic acid, lactic acid, vinegar malic acid, oxalic acid, and malonic acid can be used. Succinic acid, tartaric acid, etc. The concentration of the adhesion-imparting compound in the adhesive solution is not particularly limited, and can be appropriately adjusted in accordance with the solubility and the use condition, and is 5 mass% to 20 mass% with respect to the entire adhesive solution. By setting the concentration of the adhesion-imparting compound within this range, 11 gives sufficient adhesion. On the other hand, if it is less than 0.05% by mass relative to the total amount of the adhesive, it is impossible to impart sufficient adhesion to the range of -1 to 16 (more than the cyano group and the amine triazole system. For example, an organic acid, a propionic acid, a special, preferably a range of nucleus-producing solutions, and, in addition, 201227852, if it exceeds 20% by mass relative to the adhesive solution, a large amount of adhesiveness is consumed. The efficiency of the compound is deteriorated, which is not preferable. The treatment temperature at which the adhesiveness is applied to the surface 11a of the core body 11 is preferably higher than room temperature. Thereby, the second adhesive layer 13 has a sufficient formation speed and In addition, the optimum treatment temperature differs depending on the concentration of the adhesion-imparting compound and the type of the material of the second adhesive layer 13, and is generally in the range of about 30 ° C to 60 ° C. Preferably, the other conditions are adjusted so that the immersion time in the adhesive solution is in the range of about 5 seconds to 5 minutes. Further, in the adhesive solution, it is preferable to make the ionic form of copper 50 to 1 000 Ppm. The amount coexists. By allowing copper ions to coexist in the range of the range, the formation efficiency of the second adhesive layer 13 and the formation efficiency of the second adhesive layer 13 can be improved. (Third step) Next, as shown in Fig. 1C, on the surface of the core body 11. On the second adhesive layer 1 3, the solder particles 14 are attached as an example of a method of attaching the solder particles 14 to the second adhesive layer 13 to include a second adhesion in the air or in an inert atmosphere. The method of directly supplying the solder particles 14 to the layer 13 or the method of dispersing the solder particles 14 in a dispersion liquid (not shown) to form a slurry state, and supplying the slurry to the second adhesive layer 13. Regarding the second adhesive layer The method of attaching the solder particles 14 to the layer 13 is the same as the method of attaching the core body 11 to the surface of the substrate crucible in the first step, and thus detailed description thereof will be omitted. -22- 3 201227852 In the stage before the adhesion, the first adhesive layer 5' is used as a material which causes the adhesion of the surface 5a to disappear by ultraviolet irradiation or heating, and after the core body 11 is placed on the first adhesive layer 5, The first member 21 can also be peeled off. In the case where the first member 21 is peeled off and the adhesiveness of the surface 5a is removed by ultraviolet irradiation, heating, or the like, the solder particles 14 are prevented from adhering to the surface 5a of the first adhesive layer. The plurality of solder particles 14 are attached to the core body 1'. The particle diameter d of the solder particles 14 is set to be smaller than the average particle diameter D of the core body n. The particle diameter d of the solder particles 14 can correspond to the particles of the core body 1 1 . The diameter D is appropriately set, but is preferably 1 // m or more and 1 / 2 times or less of the particle diameter D. By making the particle diameter d of the solder particles 14 within this range, it is possible to form a core body 11 On the other hand, when the particle diameter d of the solder particles 14 is less than lym, the film thickness of the solder layer 15 becomes too thin, and the amount of solder when the formed solder balls 70 are welded is insufficient. Therefore, when the solder ball 70 is welded, the solder bumps are easily peeled off from the circuit board, which is not preferable. That is, the solder layer 15 becomes insufficient, which is not preferable. Further, when the particle diameter d of the solder particles 14 is 1/2 or more of the average particle diameter D of the core body 11, a sufficient number of solder particles 14 cannot be adhered to one core body 11, which is not preferable. Further, examples of the metal composition of the solder particles 14 include a Sn-Pb system, a Sn-Pb-Ag system, a Sn-Pb-Bi system, a Sn-Pb-Bi-Ag system, and a Sn-Pb-Cd system. Further, based on the viewpoint of excluding Pb from recent commercial waste, it is preferably a Sn-In system, a Sn-Bi system, an In-Ag system, an In-Bi-23-201227852 system, a Sn-Zn system, or a Sn-free Pb. -Ag system, S η - C u system, S η - S b system, Sn-Au system, Sn-Bi-Ag-Cu system, Sn-Ge system, S n - B i - C u system, S n - C u - S b - A g system, Sn-Ag-Zn system, Sn-Cu-Ag system, Sn-Bi-Sb system, Sn-Bi-Sb-Zn system, Sn-Bi-Cu-Zn system, Sn - Ag-Sb system, Sn.Ag-Sb-Zn system, Sn-Ag-Cu-Zn system, and Sn-Zn-Bi system. Specific examples of the metal composition described above are eutectic solders having a Sn of 63% by mass and a Pb of 37% by mass (hereinafter referred to as 63Sn/37Pb), and examples thereof include 62Sn/36Pb/2Ag and 6 2.6 S η/3 7 P b . / 0.4 A g, 60Sn/40Pb, 50Sn/50Pb, 30Sn/70Pb, 25Sn/75Pb ' 1OSn/8 8Pb/2Ag, 46Sn/8Bi/46Pb, 5 7Sn/3 Bi/40Pb, 42 Sn/42Pb/1 4Bi/ 2 Ag, 45 Sn/40Pb/15Bi, 50Sn/32Pb/1 8Cd, 48Sn/52In, 43Sn/57Bi, 97In/3Ag, 58Sn/42In, 95In/5Bi, 60Sn/40Bi, 91Sn/9Zn, 9 6.5 S n / 3.5 A g, 9 9.3 S n/0.7 C u, 95Sn/5Sb, 20Sn/80Au, 90Sn/l OAg, 9 0 S n/7.5 B i / 2 A g/0.5 C u , 97Sn/3Cu, 99Sn /lGe, 9 2 S n / 7.5 B i / 0.5 C u, 97Sn/2Cu/0.8Sb/0.2Ag, 9 5.5 S n / 3 · 5 A g/1 Z n, 95.5 Sn/4Cu/0.5 Ag ' 5 2 S n/4 5 B i / 3 S b, 5 1 S n / 4 5 B i / 3 S b /1 Z n, 85Sn/10Bi/5Sb, 84Sn/I0Bi/5Sb/lZn, 88.2Sn/l 0Bi /0.8Cu/l Zn ' 8 9 S n/4 A g/7 S b, 88Sn/4Ag/7Sb/l Zn, 98Sn/l Ag/lSb, 97Sn/1 Ag/1 Sb/1 Zn, 91.2Sn/ 2Ag/0.8Cu/6Zn, 89Sn/8Zn/3Bi, 86Sn/8Zn/6Bi, and 89.1Sn/2Ag/0.9Cu/8Zn. Further, as the solder particles 14 of the present embodiment, two or more kinds of solder particles having different compositions can be mixed. -24-201227852 (Fourth step) Next, the soldering step is performed as shown in the ID drawing to form the solder layer 15. In the third step, the solder particles 14 are attached to the core body 11 in the dispersion, first The substrate 1 was allowed to dry. Next, the core body 11 and the solder particles 14 are fixed. The fixation refers to a reaction in which the constituent material of the core body 11 is diffused toward the solder particles 14 between the core body 11 and the solder particles 14. The solder particles 14 are fixed to the core body 11 by allowing the reaction to progress. At this time, the fixing temperature is preferably in the range of -50 ° C to + 50 ° C with respect to the melting point of the solder used, more preferably -30 ° C to + 30. In the range of (: in the range where the fixing temperature is within this range, the solder particles 14 are not melted or even if they are dissolved inside, the effect of the oxide film existing on the surface can be prevented from melting and flowing out. Therefore, it can be maintained The shape of the solder particles 14 is fixed. Next, a water-soluble flux is applied to the substrate 1 on which the core body 11 (the solder particles 14 are fixed). As the water-soluble flux, for example, 曰Bent The flux described in Japanese Laid-Open Patent Publication No. 2004-282062. The water-soluble flux is applied to the substrate 1 to remove the oxide film on the surface of the solder particles 14 and the surface 11a of the core 11. Next, the solder is welded to the solder particles. 14 is melted, and the solder particles 14 are melted to form the tantalum layer 15 over the entire surface na of the core n. The heating temperature at this time is preferably 200. (:~3 00. More preferably, the melting point of the solder is +10 ° C to 50 ° C. By heating at a temperature within this range, the molten solder of the solder particles 14 can be sufficiently reacted with the surface 11a of the core body 11, and Forming a diffusion layer. (Fifth step) Next As shown in Fig. 1E, the first member 21 is peeled off from the surface 5a of the first adhesive layer 5. Then, the core body !1 is peeled off from the substrate 1. At this time, the core body 11 is peeled off from the substrate 1. The method can be appropriately selected according to the material of the first adhesive layer 5. Specifically, for example, a method of imparting vibration to the substrate 1 by an ultrasonic cleaner, and dissolving the first adhesive layer 5 by a solvent can be employed. The method of peeling the core body 11 from the substrate is not limited to the above method, and when the substrate 1 has flexibility, the core body 1 may be peeled off by bending the substrate 1 The solder ball 70 is formed by the above method. According to the manufacturing method of the solder ball 70 of the first embodiment, since the solder particles 14 are adhered after the surface 11a of the core body 11 is passed through the second adhesive layer 13, the solder particles 14 are melted. The solder layer 15 can be uniformly formed on the surface iia of the core body 11. Further, the solder layer 15 is more easily formed than the conventional method of forming a solder layer by plating or the like. Forming solder by attaching the first adhesive layer 5 to the surface la of the substrate 1 The layer 15 can process more of the core body 11 at the same time as the conventional method. Further, since the core body 11 is adhered through the first adhesive layer 5 on the surface 1a of the substrate 1, after the solder layer 15 is formed, it is easy to The core body 11 is removed from the substrate 1.

•26- S 201227852 依據以上說明,比起習知方法,可大幅簡化焊球70 的形成步驟,而能效率良好地進行生產。因此可降低焊球 7()的製造成本。 此外,由於核體11的表面11a是藉由焊料層15覆蓋 ,當利用所製造的焊球70來形成焊料凸塊時,核體11成 爲間隔件。因此,即使焊料層1 5熔融,焊料凸塊仍能保 持一定的高度。因此,即使在焊料凸塊上裝載電子零件, 電子零件仍不致因本身重量而發生下沉。如此,可將電子 零件與電路基板的距離保持一定。 此外,由於核體11是金屬所構成,在作爲焊球70使 用時,可確保電子零件與電路基板之導通。特別當核體 1 1是銅所構成的情況,由於銅的電阻低,可確保電子零 件與電路基板間形成良好的導通。 此外,由於核體11是Cu所構成,更容易塗布黏著性 化合物。因此,可形成具有充分厚度的第二黏著層13。 因此,在核體11的表面11a,容易透過第二黏著層13而 讓焊料粒子14附著。因此,能形成均一且充分膜厚的焊 料層15。如此,能形成粒徑均一的焊球70,可良好地進 行電子零件與電路基板之接合。 此外,由於核體1 1成爲間隔件,能將電子零件與基 材的距離保持一定。因此,能解決所裝載的電子零件在基 材上發生不均一下沉的問題,可獲得相對於核體11之高 度爲一定之可靠性高的基材。此外,由於讓焊料粒子14 透過第二黏著層13而附著於核體11,不需使用習知之高 -27- 201227852 價的銅核焊球。因此’可實現低成本化與步驟的簡略化。 依據以上說明,本實施方式之製造方法’是適用於微細基 材的方法,可提供集積度高且可靠性高的電子機器。 此外,依據以上的方法,不需使用含鉛量高之高熔點 焊料即可形成焊球7〇。因此,可實現焊球7〇的無鉛化。 因此,不致從焊料凸塊中所含的Pb放射出α射線。因此 ,能防止α射線造成電子零件之錯誤動作。 此外,由於第一構件21是使用金屬製的板狀構件, 在焊球70製造中,可重複使用第一構件。因此,可降低 焊球70製造步驟的製造成本。 此外,藉由將第一構件21的厚度Η設定在lym以 上且粒徑D的1/2以下的範圍,讓核體11容易進入第— 開口部3 1內。因此,可提昇作業性,而能效率良好地製 造焊球7 0 »此外’核體1 1的側面可利用第一開口部3 i 的側壁予以保持,而能防止核體1 1脫落。 此外’由於是在基材1上配置具有第一開口部31之 第一構件21的狀態下,在核體Π上形成第二黏著層13 ’因此在核體11的表面11a以外的部分不會形成第二黏 著層13。第二黏著層不會形成在第—構件21上的理由, 是因爲導電性物質、金屬等之核體所使用的材料,是藉由 黏著性賦予物質可賦予黏著性的材料,而第一構件、第一 黏著劑所使用的材料,則是藉由黏著性賦予物質無法賦予 黏著性的材料。因此,能讓焊料粒子1 4選擇性地附著於 核體〗1。此外,由於在第一開口部31的內側讓核體Η• 26- S 201227852 According to the above description, the formation process of the solder ball 70 can be greatly simplified compared to the conventional method, and production can be performed efficiently. Therefore, the manufacturing cost of the solder ball 7 () can be reduced. Further, since the surface 11a of the core body 11 is covered by the solder layer 15, when the solder bumps 70 are used to form the solder bumps, the core body 11 becomes a spacer. Therefore, even if the solder layer 15 is melted, the solder bumps can maintain a certain height. Therefore, even if electronic parts are mounted on the solder bumps, the electronic parts do not sink due to their own weight. In this way, the distance between the electronic component and the circuit board can be kept constant. Further, since the core body 11 is made of metal, when used as the solder ball 70, it is possible to ensure conduction between the electronic component and the circuit board. In particular, when the core body 1 1 is made of copper, since the resistance of copper is low, it is possible to ensure good conduction between the electronic component and the circuit board. Further, since the core body 11 is made of Cu, it is easier to apply an adhesive compound. Therefore, the second adhesive layer 13 having a sufficient thickness can be formed. Therefore, the solder particles 14 are easily adhered to the surface 11a of the core body 11 through the second adhesive layer 13. Therefore, a uniform and sufficient film thickness of the solder layer 15 can be formed. Thus, the solder ball 70 having a uniform particle diameter can be formed, and the bonding between the electronic component and the circuit board can be favorably performed. Further, since the core body 1 1 serves as a spacer, the distance between the electronic component and the substrate can be kept constant. Therefore, it is possible to solve the problem that the mounted electronic component is unevenly deposited on the substrate, and it is possible to obtain a substrate having high reliability with respect to the height of the core body 11. Further, since the solder particles 14 are adhered to the core body 11 through the second adhesive layer 13, it is not necessary to use a conventional copper core solder ball having a high price of -27 - 201227852. Therefore, cost reduction and simplification of steps can be achieved. According to the above description, the manufacturing method of the present embodiment is a method suitable for a fine substrate, and an electronic device having high integration and high reliability can be provided. Further, according to the above method, the solder ball 7 can be formed without using a high melting point solder having a high lead content. Therefore, lead-free solder ball 7〇 can be achieved. Therefore, the α rays are not emitted from the Pb contained in the solder bumps. Therefore, it is possible to prevent the alpha rays from causing erroneous actions of the electronic components. Further, since the first member 21 is made of a metal plate member, the first member can be reused in the manufacture of the solder ball 70. Therefore, the manufacturing cost of the manufacturing process of the solder ball 70 can be reduced. Further, by setting the thickness Η of the first member 21 to a range of lym or more and 1/2 or less of the particle diameter D, the core body 11 can easily enter the first opening portion 31. Therefore, the workability can be improved, and the solder ball 70 can be efficiently manufactured. Further, the side surface of the core body 1 1 can be held by the side wall of the first opening portion 3 i to prevent the core body 11 from falling off. Further, since the second adhesive layer 13' is formed on the core body in a state where the first member 21 having the first opening portion 31 is disposed on the substrate 1, the portion other than the surface 11a of the core body 11 does not A second adhesive layer 13 is formed. The reason why the second adhesive layer is not formed on the first member 21 is that the material used for the core material such as the conductive material or the metal is a material which can impart adhesiveness by the adhesive imparting substance, and the first member The material used for the first adhesive is a material that cannot impart adhesiveness by the adhesive imparting substance. Therefore, the solder particles 14 can be selectively attached to the core body 〖1. Further, since the core body is placed inside the first opening portion 31

S -28- 201227852 附著’即使第一黏著層5的黏著力減弱的情況,仍能防止 核體11往第一開口部31的外部脫落。因此,能在全部的 第一開口部31確實讓核體π附著。 (第二實施方式) 接著參照圖式來說明’本發明的第二實施方式的焊球 70之製造方法。第2A圖至第2E圖係說明第二實施方式 的焊球70製造方法之步驟圖。 第二實施方式之焊球70製造方法,係槪略包含:在 基材1表面la所形成之第一黏著層5的表面5a讓核體 附著之第一步驟、在核體11的表面11a形成第二黏著 層13之第二步驟、在第二黏著層13表面讓焊料粒子14 附著之第三步驟、讓焊料粒子1 4熔融而形成焊料層1 5之 第四步驟 '以及從核體1 1將基材1剝離之第五步驟。 其中,在第一步驟,第一構件21是由第一層21a( 第一構件的第一層)和第二層21b (第一構件的第二層) 所組成,且在第一步驟和前述第二步驟之間具有將前述第 二層21b從第一層21a剝離的步驟,除此以外是與第一實 施方式相同,因此關於相同的部分是省略詳細的說明。 以下說明第一步驟。 (第一步驟) 第二實施方式之第一步驟’作爲將第一構件21配置 在第一黏著層5上之步驟(前置步驟)’係包含:(i) -29- I·' 201227852 將具有開口部32a (第二開口下部)之第一構件的第一層 21a配置在第一黏著層5上的步驟、(ϋ)在第一構件的 第一層2 1 a上,將具有直徑比開口部3 2更小的開口部 32b (第二開口上部)之第一構件的第二層21b,以開口 部3 2a與開口部32b重疊的方式進行配置的步驟。 以下針對各步驟進行詳細的說明。 首先,以覆蓋第一黏著層5的表面5a的方式,配置 第一構件之第一層21a。在第一構件之第一層21a設有: 隔著間隔讓第一黏著層5的表面5 a露出之開口部3 2 a。 第一構件之第一層21a的材料沒有特別的限定,具體而言 ,例如可使用藉由網版印刷而將耐焊用糊劑塗布於基材1 所構成者。 此外,第一層21a之開口部32a的直徑F2a範圍,假 設後述第二層21b的開口部32b的直徑爲F2b,則能用下 述數學式(5 )表示。 【數5】 F2b + 2d$F2a · · · (5) 開口部32a的更佳範圍能用下述數學式(6)表示。 【數6】 F2b + 3 d^F2a^F2b + 4d . · · ( 6 ) 接著,在第一構件之第一層21a上配置第一構件之第 二層21b。在第一構件的第二層21b,設有直徑比第一層 2 1 a的開口部3 2a更小之開口部3 2b。在配置第一構件的S -28 - 201227852 Adhesion ' Even if the adhesion of the first adhesive layer 5 is weakened, the core body 11 can be prevented from falling off the outside of the first opening portion 31. Therefore, the core body π can be surely adhered to all of the first openings 31. (Second Embodiment) Next, a method of manufacturing the solder ball 70 according to the second embodiment of the present invention will be described with reference to the drawings. 2A to 2E are process diagrams illustrating a method of manufacturing the solder ball 70 of the second embodiment. The manufacturing method of the solder ball 70 of the second embodiment includes a first step of attaching the core body to the surface 5a of the first adhesive layer 5 formed on the surface 1 of the substrate 1, and forming on the surface 11a of the core body 11. a second step of the second adhesive layer 13, a third step of attaching the solder particles 14 on the surface of the second adhesive layer 13, a fourth step of melting the solder particles 14 to form the solder layer 15, and a slave core 1 The fifth step of peeling off the substrate 1. Wherein, in the first step, the first member 21 is composed of the first layer 21a (the first layer of the first member) and the second layer 21b (the second layer of the first member), and in the first step and the foregoing The step of peeling the second layer 21b from the first layer 21a between the second steps is the same as that of the first embodiment, and therefore the detailed description of the same portions will be omitted. The first step is explained below. (First Step) The first step of the second embodiment 'as a step (pre-step) of disposing the first member 21 on the first adhesive layer 5 includes: (i) -29-I·' 201227852 The step of disposing the first layer 21a of the first member having the opening portion 32a (the lower portion of the second opening) on the first adhesive layer 5, on the first layer 2 1 a of the first member, will have a diameter ratio The second layer 21b of the first member of the opening portion 32b (the second opening upper portion) having the smaller opening portion 32 has a step in which the opening portion 32a overlaps the opening portion 32b. Each step will be described in detail below. First, the first layer 21a of the first member is disposed so as to cover the surface 5a of the first adhesive layer 5. The first layer 21a of the first member is provided with an opening portion 3 2 a in which the surface 5 a of the first adhesive layer 5 is exposed at intervals. The material of the first layer 21a of the first member is not particularly limited. Specifically, for example, a paste-resistant paste can be applied to the substrate 1 by screen printing. In the range of the diameter F2a of the opening 32a of the first layer 21a, the diameter of the opening 32b of the second layer 21b to be described later is F2b, and can be expressed by the following formula (5). [Equation 5] F2b + 2d$F2a · (5) A more preferable range of the opening portion 32a can be expressed by the following formula (6). [6] F2b + 3 d^F2a^F2b + 4d . Next, the second layer 21b of the first member is placed on the first layer 21a of the first member. In the second layer 21b of the first member, an opening portion 3 2b having a smaller diameter than the opening portion 3 2a of the first layer 2 1 a is provided. In configuring the first component

S -30- 201227852 第二層21b時,以開口部32a與開口部3 2b重疊的方式調 整配置位置。 作爲第一構件之第二層21b,可使用金屬製的板狀構 件。藉由使用這種構件作爲第一構件之第二層21b,由於 在製造步驟中可重複使用,能提高焊球70的製造效率。 此外,假設第一構件之第一層21a與第二層21b的合 計厚度爲Η,Η爲核體11的粒徑D之1/2以上,開口部 32b的直徑F2b之範圍能用下述數學式(7)表示。 【數7】 D^F2b<2D · · ·⑺ 此外,開口部32b的直徑F2b之更佳範圍能用下述數 學式(8 )表示。 【數8】 1. 1D^F2b^1.5D ... (8) 此外,相鄰接之開口部3 2b彼此的間隔G2,假設第 —構件之第二層21b厚度爲Hb,則能用下述數學式(9) 表示。 【數9】 2 d + D-2VHb (D-Hb)^G2^4 d+ D - 2^/H b (D - H b) · · . (9) 藉由使開口部3 2b彼此的間隔G2在數學式(9 )的範 圍內,能在基材1上高密度地形成焊球70,並能防止相 鄰接的焊球70彼此接合。 接著,如第2A圖所示般,讓核體11附著於第一黏 -31 - 201227852 著層5的表面5a。 接著’如第2B圖所示般,從第一構件之第—層21a 上將第一構件之第二層21b剝離。由於開口部32b的直徑 F2b比開口部32a的直徑F2a小,核體1 1成爲配置於第二 開口下部3 2 a之中心部的狀態。 (第二步驟) 接著’如第2B圖所示般,以第一構件之第一層21a 覆蓋第一黏著層5表面5a的狀態,在核體11的表面11a 塗布黏著性賦予化合物而形成第二黏著層13。這時,由 於第一黏著層5的表面5a大致被第一構件之第一層21a 所覆蓋,可防止在核體11表面11a以外形成第二黏著層 13。亦即,核體11是藉由黏著賦予化合物賦予黏著性之 材料所形成,但第一構件之第一層21a及第一黏著層則是 藉由黏著賦予化合物無法賦予黏著性的材料所形成。因此 ,在第一層21a上不會形成黏著層13。 然後,如第2C圖〜第2E圖所示般進行第三步驟、第 四步驟、第五步驟,關於第三步驟以後的步驟由於是與第 —實施方式相同,故省略第三步驟以後的詳細說明。 依據第二實施方式的焊球70製造方法,由於在第一 構件之第一層21a上,將具有直徑比開口部32a更小的開 口部32b之第一構件的第二層21b,以開口部32a之中心 與開口部32b之中心重疊的方式進行配置,藉此能將開口 部3 2b配置於開口部3 2 a的中心部上。此外,由於在讓核 -32-S -30- 201227852 In the second layer 21b, the arrangement position is adjusted so that the opening 32a overlaps the opening 3bb. As the second layer 21b of the first member, a plate member made of metal can be used. By using such a member as the second layer 21b of the first member, the manufacturing efficiency of the solder ball 70 can be improved because it can be reused in the manufacturing steps. Further, it is assumed that the total thickness of the first layer 21a and the second layer 21b of the first member is Η, Η is 1/2 or more of the particle diameter D of the core body 11, and the range of the diameter F2b of the opening portion 32b can be mathematically described below. Expressed by the formula (7). Further, a better range of the diameter F2b of the opening portion 32b can be expressed by the following mathematical formula (8). [8] 1. 1D^F2b^1.5D (8) Further, the interval G2 between the adjacent opening portions 32b is assumed to be Hb, and the thickness of the second layer 21b of the first member is Hb. Said mathematical formula (9). [9] 2 d + D-2VHb (D-Hb)^G2^4 d+ D - 2^/H b (D - H b) · (9) By spacing the openings 3 2b from each other G2 Within the scope of the mathematical formula (9), the solder balls 70 can be formed on the substrate 1 at a high density, and the adjacent solder balls 70 can be prevented from being bonded to each other. Next, as shown in Fig. 2A, the core body 11 is attached to the surface 5a of the first adhesive layer 31. Next, as shown in Fig. 2B, the second layer 21b of the first member is peeled off from the first layer 21a of the first member. Since the diameter F2b of the opening 32b is smaller than the diameter F2a of the opening 32a, the core body 1 1 is placed in the center of the second opening lower portion 32a. (Second Step) Next, as shown in FIG. 2B, the first layer 21a of the first member covers the surface 5a of the first adhesive layer 5, and the adhesive layer is applied to the surface 11a of the core 11 to form a first Two adhesive layers 13. At this time, since the surface 5a of the first adhesive layer 5 is substantially covered by the first layer 21a of the first member, the formation of the second adhesive layer 13 outside the surface 11a of the core body 11 can be prevented. That is, the core body 11 is formed of a material which imparts adhesiveness to the adhesion-imparting compound, but the first layer 21a of the first member and the first adhesive layer are formed of a material which cannot impart adhesion by the adhesion-imparting compound. Therefore, the adhesive layer 13 is not formed on the first layer 21a. Then, the third step, the fourth step, and the fifth step are performed as shown in FIGS. 2C to 2E. Since the steps after the third step are the same as those of the first embodiment, the details after the third step are omitted. Description. According to the method of manufacturing the solder ball 70 of the second embodiment, the second layer 21b having the first member having the opening 32b having a smaller diameter than the opening portion 32a is formed on the first layer 21a of the first member as the opening portion The center of 32a is disposed so as to overlap the center of the opening 32b, whereby the opening portion 3 2b can be disposed on the center portion of the opening portion 3 2 a. In addition, due to the nuclear -32-

S 201227852 體II附著於第一黏著層5後,從第一構件之第一層21a 上將第一構件之第二層21b剝離,因此能充分地保持核體 11與第一構件之第一層的距離。亦即,在讓核體n附著 於第一黏著層5時,能將核體11配置於開口部3 2a之中 心部。 依據第二實施方式的焊球70製造方法,除了第一實 施方式的效果以外,還能更有效地防止相鄰接之焊球7〇 彼此發生接合。 (第三實施方式) 接著’參照圖式來說明本發明之第三實施方式的焊球 70製造方法。第3A圖至第3F圖係說明第三實施方式的 焊球70製造方法之步驟圖。 第三實施方式之焊球70製造方法,係槪略包含:在 基材1所賦予之第一黏著層5的表面5a讓核體11附著之 第一步驟、在核體11的表面11a形成第二黏著層13之第 二步驟、在第二黏著層13表面讓焊料粒子14附著之第三 步驟、讓焊料粒子14熔融而形成焊料層15之第四步驟、 以及從核體1 1將基材1剝離之第五步驟。 在第三實施方式,與第一實施方式的不同點在於,在 第一步驟和第二步驟之間具有將第一構件21剝離的步驟 ,且以覆蓋第一黏著層5之表面5a的方式,讓具有直徑r (比第一構件21之厚度Η小)的粒子附著於第一黏著層 上而形成遮罩41 (第一遮罩)。因此,關於與第一實施 -33- 201227852 方式同樣的步驟則省略其詳細的說明。 首先,如第3A圖所示般,在第一步驟,讓核體 u 附者於基材1 (設有第一構件21)之第一黏著層5的表面 5a。這時,第一構件之相鄰接的開口部33 (第三開口部 )彼此的間隔G3,較佳爲第三步驟所使用之焊料粒子i 4 的直徑d之1〇〜2 0倍左右。此外,第一構件21的厚度Η ’較佳爲核體1 1的粒徑D之丨/2倍以上。此外,第一構 件之開口部3 3的直徑F3,宜爲比核體1 1的粒徑D大且 爲核體1 1之粒徑D之未達2倍,較佳爲比粒徑D大上 1 0〜2 0以m。 接著,如第3B圖所示般’將第一構件21從第一黏著 層5上剝離。 藉此’讓第一黏著層5的表面5a露出。 接著’如第3C圖所示般,以覆蓋第—黏著層5之袠 面5a的方式,讓粒狀材料所形成之遮罩41附著。作爲遮 罩41的材料,例如可使用玻璃、陶瓷、及高分子等,只 要具有不溶解於水且在表面不致形成第二黏著層13的性 質即可’其材料沒有特別的限定。 此外’遮罩41材料之直徑r,是比第一構件21的厚 度Η小。此外,直徑、高度r越小越好,基於作業效率的 點,較佳爲次// m〜數y m左右。作爲具體例,較佳爲使 用直徑〇.5 y m〜2 的材料。藉由將遮罩41的高度、直 徑r設定在此範圍內,連核體n與第一黏著層5之接觸 面附近都能讓焊料粒子14附著。因此,能在核體n的表S 201227852 After the body II is attached to the first adhesive layer 5, the second layer 21b of the first member is peeled off from the first layer 21a of the first member, so that the first layer of the core body 11 and the first member can be sufficiently maintained the distance. That is, when the core body n is attached to the first adhesive layer 5, the core body 11 can be disposed in the center of the opening portion 3 2a. According to the method of manufacturing the solder ball 70 of the second embodiment, in addition to the effects of the first embodiment, it is possible to more effectively prevent the adjacent solder balls 7 to be joined to each other. (Third Embodiment) Next, a method of manufacturing the solder ball 70 according to a third embodiment of the present invention will be described with reference to the drawings. 3A to 3F are process diagrams illustrating a method of manufacturing the solder ball 70 of the third embodiment. The method for producing the solder ball 70 according to the third embodiment includes a first step of attaching the core body 11 to the surface 5a of the first adhesive layer 5 provided on the substrate 1, and forming a surface on the surface 11a of the core body 11. a second step of the second adhesive layer 13, a third step of attaching the solder particles 14 on the surface of the second adhesive layer 13, a fourth step of melting the solder particles 14 to form the solder layer 15, and a substrate from the core body 1 1 The fifth step of stripping. In the third embodiment, the difference from the first embodiment is that there is a step of peeling off the first member 21 between the first step and the second step, and in a manner of covering the surface 5a of the first adhesive layer 5, A particle having a diameter r (which is smaller than the thickness of the first member 21) is attached to the first adhesive layer to form a mask 41 (first mask). Therefore, the detailed description of the same steps as the first embodiment -33-201227852 will be omitted. First, as shown in Fig. 3A, in the first step, the core body u is attached to the surface 5a of the first adhesive layer 5 of the substrate 1 (provided with the first member 21). At this time, the interval G3 between the adjacent opening portions 33 (third opening portions) of the first member is preferably about 1 to 20 times the diameter d of the solder particles i 4 used in the third step. Further, the thickness Η ' of the first member 21 is preferably 丨/2 times or more the particle diameter D of the core body 11. Further, the diameter F3 of the opening portion 3 3 of the first member is preferably larger than the particle diameter D of the core body 11 and less than 2 times the particle diameter D of the core body 1 1 , preferably larger than the particle diameter D On 1 0~2 0 to m. Next, the first member 21 is peeled off from the first adhesive layer 5 as shown in Fig. 3B. Thereby, the surface 5a of the first adhesive layer 5 is exposed. Next, as shown in Fig. 3C, the mask 41 formed of the granular material is adhered so as to cover the surface 5a of the first adhesive layer 5. As the material of the mask 41, for example, glass, ceramics, polymer, or the like can be used, and the material is not dissolved in water and the second adhesive layer 13 is not formed on the surface. The material is not particularly limited. Further, the diameter r of the material of the mask 41 is smaller than the thickness of the first member 21. Further, the smaller the diameter and the height r, the better, and the point based on the work efficiency is preferably about /m to ym. As a specific example, a material having a diameter of 〇5 y m 2 is preferably used. By setting the height and the diameter r of the mask 41 within this range, the solder particles 14 can be attached in the vicinity of the contact surface between the core body n and the first adhesive layer 5. Therefore, the table that can be in the nuclei n

S -34- 201227852 面Ua全體形成焊料層15。 另一方面,若高度、直徑r成爲第一構件21的厚度 Η以上,在核體11與第一黏著層5之接觸面附近無法讓 焊料粒子1 4充分地附著’並不理想。此外’在以覆蓋第 一黏著層5之表面5a的方式讓遮罩41附著時’由於在相 鄰接之遮罩41材料彼此間會產生間隙’在第三步驟可能 在第一黏著層5表面讓焊料粒子14附著。因此’在第四 步驟,附著於第一黏著層5表面之焊料粒子14熔融後可 能接合於焊球7 0。如此造成焊球7 0的粒徑變得不均一, 並不理想。 然後,如第3D圖〜第3F圖所示般,進行第二步驟、 第三步驟、第四步驟、第五步驟,關於第二步驟〜第五步 驟,由於與第一實施方式相同,在此省略其詳細的說明。 又如第3F圖所示般,從第一黏著層5將第一遮罩41剝離 的方法可任意地選擇,具體而言,例如可採用藉由超音波 洗淨機對基材1賦予振動的方法。 經由以上手法而形成焊球70。 依據第三實施方式的焊球70製造方法,由於在使用 第一構件21而於黏著層5的表面5a配置核體11後,再 將第一構件2 1剝離,可適當地保持核體〗1彼此的間隔。 此外’由於在第一黏著層5的表面5a讓第一遮罩41附著 後’在核體1 1的表面1 1 a讓焊料粒子1 4附著,因此連核 體11與第一黏著層5之接觸面附近都能讓焊料粒子14附 著。如此’在核體11的表面11a全體可形成焊料層15。 -35- 201227852 此外’作爲第一遮罩41的材料,由於是使用不转 且不會形成第二黏著層13的物質,在第二步驟, 在第一遮罩41表面形成第二黏著層13。因此,肯; 料粒子14附著於第一遮罩41表面。 根據以上說明,依據第三實施方式的焊球70 法,除了第一實施方式的效果以外,還能使焊球 料層15厚度均一地形成。 (第四實施方式) 接著’參照圖式來說明本發明之第四實施方 70製造方法。第4A圖〜第4E圖係說明第四實施 球70製造方法之步驟圖。 第四實施方式的焊球70製造方法,係槪略 基材1所賦予之第一黏著層5的表面5a讓核體11 第一步驟、在核體11的表面11a形成第二黏著層 二步驟、在第二黏著層13表面讓焊料粒子14附i 步驟、讓焊料粒子14溶融而形成焊料層15之第E 以及從核體1 1將基材1剝離之第五步驟。 在第四實施方式’是在第一步驟之前,透過J 黏著層’藉此將點狀之複數個第一黏著層5以互;I 方式形成於基材1的表面la,這點是與在黏著f 第1構件之第一實施方式不同。關於與第一實施: 的步驟則省略其詳細的說明。 首先,以覆蓋基材1之表面la的方式配置| I解於水 能防止 I防止焊 製造方 7〇之焊 的焊球 式的焊 含:在 附著之 13之第 之第三 步驟、 罩塗布 離開的 上配置 式同樣 二構件S -34 - 201227852 The solder layer 15 is formed on the entire surface Ua. On the other hand, when the height and the diameter r are equal to or larger than the thickness 第一 of the first member 21, it is not preferable that the solder particles 14 are sufficiently adhered in the vicinity of the contact surface between the core body 11 and the first adhesive layer 5. Further, 'when the mask 41 is attached in such a manner as to cover the surface 5a of the first adhesive layer 5', a gap may occur between the materials of the adjacent masks 41. In the third step, the surface of the first adhesive layer 5 may be present. The solder particles 14 are allowed to adhere. Therefore, in the fourth step, the solder particles 14 attached to the surface of the first adhesive layer 5 may be joined to the solder balls 70 after being melted. As a result, the particle diameter of the solder ball 70 becomes uneven, which is not preferable. Then, as shown in FIGS. 3D to 3F, the second step, the third step, the fourth step, and the fifth step are performed, and regarding the second step to the fifth step, since it is the same as the first embodiment, Detailed descriptions thereof are omitted. Further, as shown in FIG. 3F, the method of peeling off the first mask 41 from the first adhesive layer 5 can be arbitrarily selected. Specifically, for example, vibration can be applied to the substrate 1 by an ultrasonic cleaner. method. The solder ball 70 is formed by the above method. According to the method of manufacturing the solder ball 70 of the third embodiment, after the core member 11 is placed on the surface 5a of the adhesive layer 5 by using the first member 21, the first member 21 is peeled off, and the core body can be appropriately held. The interval between each other. In addition, 'because the first mask 41 is attached to the surface 5a of the first adhesive layer 5', the solder particles 14 are attached to the surface 11a of the core body 11. Therefore, the core body 11 and the first adhesive layer 5 are attached. The solder particles 14 can be attached in the vicinity of the contact surface. Thus, the solder layer 15 can be formed on the entire surface 11a of the core body 11. -35- 201227852 Further, as the material of the first mask 41, since the material which does not rotate and does not form the second adhesive layer 13 is used, in the second step, the second adhesive layer 13 is formed on the surface of the first mask 41. . Therefore, the material particles 14 are attached to the surface of the first mask 41. According to the above description, according to the solder ball 70 method of the third embodiment, in addition to the effects of the first embodiment, the thickness of the solder ball layer 15 can be uniformly formed. (Fourth embodiment) Next, a method of manufacturing the fourth embodiment 70 of the present invention will be described with reference to the drawings. 4A to 4E are diagrams showing the steps of the fourth embodiment of the manufacturing method of the ball 70. In the method of manufacturing the solder ball 70 of the fourth embodiment, the surface 5a of the first adhesive layer 5 provided by the substrate 1 is subjected to the first step of the core body 11 and the second adhesive layer is formed on the surface 11a of the core body 11. The second step of forming the solder particles 14 on the surface of the second adhesive layer 13 and melting the solder particles 14 to form the Eth of the solder layer 15 and peeling off the substrate 1 from the core body 1 is formed. In the fourth embodiment, 'before the first step, through the J adhesive layer', the plurality of first adhesive layers 5 in a dot shape are formed on the surface 1a of the substrate 1 in a mutual manner, which is Adhesion f The first embodiment of the first member is different. The detailed description of the steps related to the first embodiment will be omitted. First, the solder ball type soldering containing the surface of the substrate 1 is disposed so as to cover the surface of the substrate 1 : the third step of the adhesion 13 , the cover coating The same two components of the upper configuration

S -36- 201227852 22。作爲第二構件22,可使用板狀構件。在第二構件22 以互相離開的方式設有開口部3 4 (第四開口部),該開 口部34能讓基材1之表面的一部分呈點狀露出。第二 構件22,是與基材1分離或與基材1接觸皆可。 此外,開口部34之直徑F4的範圍,假設黏著材的厚 度爲Η,則能用下述數學式(.〗〇 )表示。 I【數10】 F4<D-27H(D-H) · · · (1 〇) 此外’開口部34之直徑ρ4之更佳範圍能用下述數學 式(1 1 )表示。 .【數11】 0.7 (D-2Vh(D-H) F4^〇. g (D-27h(D-H) ) . . · (1 1) 此外’相鄰接之開口部3 4彼此的間隔G4,假設黏著 材的厚度爲Η、第四開口部3 4的直徑爲p4,則能用下述 數學式(12 )表示。 I【數12】 2d + D+27H(D-H)<G4 ... (1 2) 此外較佳爲’開口部34彼此的間隔G4能用下述數學 式(13 )表示。 【數13】 4 cI + D + 2,/h(D-H) SG4^8 d + D + 27H(D-H) -37- 201227852 接著如第4A圖所示般,以第二構件22作爲遮罩, 以塡充開口部34的方式塗布黏著性物質。按照需要而採 用塗布以外的方法亦可。藉此,在基材1的表面la以互 相離開的方式形成厚度Η、直徑F4之點狀的複數個第一 黏著層5。 接著,將第二構件22從基材1的表面la剝離而讓表 面1 a露出。 接著,如第4B圖所示般,讓核體11附著於第一黏著 層5。 然後,如第4C圖〜第4E圖所示般進行第二步驟、第 三步驟、第四步驟及第五步驟,由於第二步驟以後是與第 一實施方式相同,在此省略其詳細的說明。 經由以上手法來形成焊球7 0。 依據第四實施方式之焊球70製造方法,是將點狀的 複數個第一黏著層5以互相離開的方式形成於基材1的表 面1 a之後,再將第二構件22從基材1剝離,藉此形成點 狀的第一黏著層5。因此,核體11容易附著於第一黏著 層5。此外’在讓焊料粒子14附著於核體11的表面11a 時,由於基材1的表面la是露出的,連核體II與第一黏 著層5之黏著面附近都能讓焊料粒子14充分地附著。因 此,能在核體11的表面11a全體形成焊料層15。 如以上所說明,依據第四實施方式之焊球70製造方 法’除了第一實施方式的效果以外,還能讓焊球70之焊 料層15厚度均一地形成。S -36- 201227852 22. As the second member 22, a plate-like member can be used. The second member 22 is provided with an opening portion 34 (fourth opening portion) so as to be apart from each other, and the opening portion 34 allows a part of the surface of the substrate 1 to be exposed in a dot shape. The second member 22 may be separated from the substrate 1 or in contact with the substrate 1. Further, the range of the diameter F4 of the opening portion 34 can be expressed by the following mathematical expression (. 〇), assuming that the thickness of the adhesive member is Η. I [10] F4 < D-27H (D-H) · · · (1 〇) Further, a more preferable range of the diameter ρ4 of the opening portion 34 can be expressed by the following mathematical formula (1 1 ). [Number 11] 0.7 (D-2Vh(DH) F4^〇. g (D-27h(DH) ) . . . (1 1) In addition, the gap between the adjacent openings 3 4 is G4, assuming adhesion The thickness of the material is Η, and the diameter of the fourth opening portion 34 is p4, which can be expressed by the following formula (12). I [number 12] 2d + D+27H(DH)<G4 ... (1 2) Further preferably, the interval G4 between the opening portions 34 can be expressed by the following mathematical formula (13). [13] 4 cI + D + 2, /h(DH) SG4^8 d + D + 27H ( DH) -37-201227852 Next, as shown in Fig. 4A, the second member 22 is used as a mask, and the adhesive substance is applied so as to fill the opening 34. A method other than coating may be employed as needed. A plurality of first adhesive layers 5 having a thickness Η and a diameter F4 are formed on the surface 1a of the substrate 1 so as to be apart from each other. Next, the second member 22 is peeled off from the surface 1a of the substrate 1 to allow the surface 1 to be removed. Then, as shown in Fig. 4B, the core body 11 is attached to the first adhesive layer 5. Then, the second step, the third step, and the fourth step are performed as shown in Figs. 4C to 4E. And the fifth step, due to the second step The detailed description is omitted here, and the detailed description thereof is omitted here. The solder ball 70 is formed by the above method. According to the fourth embodiment, the solder ball 70 is manufactured by a plurality of first adhesive layers 5 in a dot shape. After being formed on the surface 1a of the substrate 1 so as to be separated from each other, the second member 22 is peeled off from the substrate 1, thereby forming a dot-shaped first adhesive layer 5. Therefore, the core body 11 is easily attached to the first layer. Adhesive layer 5. In addition, when the solder particles 14 are attached to the surface 11a of the core body 11, since the surface la of the substrate 1 is exposed, the solder can be allowed in the vicinity of the bonding surface of the core body II and the first adhesive layer 5. The particles 14 are sufficiently adhered. Therefore, the solder layer 15 can be formed on the entire surface 11a of the core body 11. As described above, the method of manufacturing the solder ball 70 according to the fourth embodiment can be performed in addition to the effects of the first embodiment. The thickness of the solder layer 15 of the solder ball 70 is uniformly formed.

S -38- 201227852 (第五實施方式) 接著,參照圖式來說明本發明的第五實施方式之焊球 70製造方法。第5A圖至第5E圖係說明第五實施方式的 焊球70製造方法之步驟圖。 第五實施方式的焊球7〇製造方法,係槪略包含:在 基材1所賦予之第一黏著層5的表面5a讓核體11附著之 第一步驟、在核體Μ的表面11a形成第二黏著層13之第 二步驟、在第二黏著層13表面讓焊料粒子14附著之第三 步驟、讓焊料粒子14熔融而形成焊料層15之第四步驟、 以及從核體11將基材1剝離之第五步驟。 在第五實施方式,是在第一步驟之前,使用轉印用基 材將黏著性賦予化合物轉印於基體,藉此將點狀的複數個 第一黏著層以互相離開的方式形成於基材的表面,這點是 與在第一步驟前於基材上的黏著層上形成第一構件之第一 實施方式不同。 以下針對各步驟進行說明’但關於與第一實施方式同 樣的步驟則省略其詳細的說明。 (第一步驟) 第五實施方式之第一步驟係包含:在轉印用基材61 的表面61a以互相離開的方式形成點狀的複數個金屬膜 51 (第一金屬膜)之步驟、在金屬膜51上讓黏著性賦予 化合物5 b (第一黏著性賦予化合物)附著的步驟、從轉 -39- 201227852 印用基材61將前述黏著性賦予化合物轉印於基材1的表 面la而形成第一黏著層5的步驟、以及在第一黏著層5 讓核體1 1附著的步驟。 以下針對各步驟進行詳細的說明。 首先,在轉印用基材61的表面61a,以互相離開的 方式形成例如膜厚20/zm之點狀的複數個金屬膜51。形 成方法可採用任意的方法。金屬膜51的材料例如宜使用 錫(Sn) ’更佳爲使用銅(Cu)。第一金屬膜51的材料 並不限定於此,只能是藉由黏著性賦予化合物可獲得黏著 性的物質即可,也能採用其他的材料。作爲這種物質,除 了銅、錫以外,例如包含Ni、Ni-Au、Au-Sn合金等的物 質。 接著’如第5A圖所示般,在第一金屬膜51上藉由 塗布等任意的方法讓黏著性賦予化合物5 b附著。關於此 步驟’由於與第一實施方式之第二步驟大致相同,在此省 略詳細的說明。藉此,以覆蓋金屬膜51表面的方式形成 黏著性賦予化合物5b。又與第一實施方式之第二步驟不 同’在本步驟雖必須在金屬膜51上讓黏著性賦予化合物 5b附著,但可選擇任意的方法。 接著,如第5B圖所示般,從轉印用基材6 1將黏著性 賦予化合物5b轉印於基材1的表面la。 這時’基材1的表面la較佳爲藉由遮罩42 (第二遮 罩)所覆蓋。作爲遮罩42的材料可使用板狀構件。此外 ’作爲其材料,具體而言可使用不鏽鋼、鎳、玻璃、陶瓷 -40-S - 38 - 201227852 (Fifth Embodiment) Next, a method of manufacturing the solder ball 70 according to the fifth embodiment of the present invention will be described with reference to the drawings. 5A to 5E are process diagrams for explaining a method of manufacturing the solder ball 70 of the fifth embodiment. The method for producing a solder ball 7 of the fifth embodiment includes a first step of attaching the core body 11 to the surface 5a of the first adhesive layer 5 provided on the substrate 1, and forming a surface 11a of the core body. a second step of the second adhesive layer 13, a third step of attaching the solder particles 14 on the surface of the second adhesive layer 13, a fourth step of melting the solder particles 14 to form the solder layer 15, and a substrate from the core 11 1 The fifth step of stripping. In the fifth embodiment, before the first step, the adhesion imparting compound is transferred to the substrate by using the transfer substrate, whereby the plurality of dot-shaped first adhesive layers are formed on the substrate in such a manner as to be separated from each other. The surface is different from the first embodiment in which the first member is formed on the adhesive layer on the substrate before the first step. The respective steps will be described below. However, detailed descriptions of the same steps as those of the first embodiment will be omitted. (First Step) The first step of the fifth embodiment includes a step of forming a plurality of dot-shaped metal films 51 (first metal films) on the surface 61a of the transfer substrate 61 so as to be apart from each other, a step of adhering the adhesion-imparting compound 5b (first adhesion-imparting compound) to the metal film 51, and transferring the adhesion-promoting compound to the surface 1a of the substrate 1 from the substrate 61 for printing -39-201227852 The step of forming the first adhesive layer 5 and the step of attaching the core body 11 to the first adhesive layer 5. Each step will be described in detail below. First, a plurality of metal films 51 having a dot thickness of 20/zm are formed on the surface 61a of the transfer substrate 61 so as to be apart from each other. The formation method can adopt any method. For the material of the metal film 51, for example, tin (Sn) is preferably used, and copper (Cu) is more preferably used. The material of the first metal film 51 is not limited thereto, and only the adhesive property can be obtained by the adhesive imparting compound, and other materials can be used. As such a material, in addition to copper or tin, for example, a material containing Ni, Ni-Au, Au-Sn alloy or the like is contained. Then, as shown in Fig. 5A, the adhesion imparting compound 5b is adhered to the first metal film 51 by any method such as coating. This step ' is substantially the same as the second step of the first embodiment, and a detailed description thereof will be omitted herein. Thereby, the adhesiveness imparting compound 5b is formed so as to cover the surface of the metal film 51. Further, unlike the second step of the first embodiment, the adhesiveness imparting compound 5b must be adhered to the metal film 51 in this step, but any method can be selected. Then, as shown in Fig. 5B, the adhesive imparting compound 5b is transferred from the transfer substrate 6 1 to the surface 1a of the substrate 1. At this time, the surface la of the substrate 1 is preferably covered by the mask 42 (second mask). As the material of the mask 42, a plate member can be used. In addition, as its material, specifically, stainless steel, nickel, glass, ceramics -40- can be used.

S 201227852 、高分子等’只要是不溶解於水且不致形成第二黏 1 3的物質即可’其材料沒有特別的限定。 此外,在遮罩42設有直徑f5之開口部35 (第五 部)。開口部3 5的作用,是在第四步驟以後防止焊3 脫落。因此的値,可對應於核體11的直徑D和 粒子14的直徑d、遮罩42的厚度Η而適當地設定。 這時,遮罩42之相鄰接的開口部35彼此的間ρ ,假設遮罩42的厚度爲Η、核體11的直徑爲D、焊 子14的直徑爲d’則能用下述數學式(14)表示。 【數14】 2d + D + 2VH(2d + D-H)^G5 · · · 此外,遮罩42的厚度Η,雖必須比金屬膜5 1厚 黏著性賦予化合物5b厚度之合計値更小,但較佳爲 屬膜51的厚度同樣程度。遮罩42厚度Η,若比金 5 1厚度和黏著性賦予化合物5b厚度的合計値更大, 法將黏著性賦予化合物5b轉印於基材1的表面la, 理想。 藉此’在基材1的表面la,以互相離開的方式 點狀的複數個第一黏著層5。 接著’如第5C圖所示般,讓核體11附著於第一 層5的表面5a。然後如第5C圖〜第5E圖所示般,進 二步驟、第三步驟、第四步驟及第五步驟,由於在第 驟以後是取代第一構件21而使用遮罩42,除此外是 者層 開口 t 7〇 焊料 S g5 料粒 (14) 度和 與金 屬膜 就無 並不 形成 黏著 行第 二步 與第 -41 - 201227852 —實施方式大致相同,在此省略詳細的說明。 經由以上手法來形成焊球70。 依據第五實施方式的焊球70製造方法,藉由在點狀 的金屬膜51上塗布黏著性賦予化合物5b來形成第一黏著 層5,因此能將黏著性賦予化合物5b的用量降低至最少 。又由於使用轉印用基材,相較於僅使用遮罩來形成第一 黏著層5的情況,能對應於更微細的圖案。 此外,在維持基材1表面1 a被遮罩42覆蓋的狀態下 將黏著性賦予化合物5b轉印於基材1的表面1 a,藉此能 將第一黏著層5形成在更正確的位置。此外,在維持基材 1表面la被遮罩42覆蓋的狀態下於核體11上形成第二 黏著層13,因此能防止在基材1的表面la讓第二黏著層 13附著。如此可防止在基材1的表面la讓焊料粒子14 附著。 如以上所說明,依據第五實施方式之焊球70製造方 法,除了第四實施方式的效果以外,還能讓焊球7 0的形 成位置對應於更微細的圖案。 (第六實施方式) 接著’參照圖式來說明本發明的第六實施方式之焊球 70製造方法。第6A圖至第6E圖係說明第六實施方式的 焊球70製造方法之步驟圖。 第六實施方式的焊球70製造方法,係槪"略包含:在 基材1所賦予之第一黏著層5的表面5a讓核體11附著之S 201227852, a polymer, etc.' is not particularly limited as long as it is a substance which does not dissolve in water and does not form a second viscosity. Further, the mask 42 is provided with an opening portion 35 (fifth portion) having a diameter f5. The function of the opening portion 35 is to prevent the solder 3 from falling off after the fourth step. Therefore, the flaw can be appropriately set in accordance with the diameter D of the core body 11, the diameter d of the particles 14, and the thickness Η of the mask 42. At this time, the distance ρ between the adjacent opening portions 35 of the mask 42 is assumed to be Η, the diameter of the core body 11 is D, and the diameter of the solder 14 is d'. (14) indicates. [Equation 14] 2d + D + 2VH (2d + DH)^G5 · · · In addition, the thickness 遮 of the mask 42 must be smaller than the total thickness of the thick film of the metal film 51 to give the compound 5b, but The thickness of the film 51 is the same. When the thickness of the mask 42 is larger than the total thickness of the thickness of the gold compound and the thickness of the adhesive compound 5b, the adhesion imparting compound 5b is preferably transferred to the surface la of the substrate 1. Thereby, a plurality of first adhesive layers 5 are formed in a manner of being separated from each other on the surface 1 of the substrate 1. Next, as shown in Fig. 5C, the core body 11 is attached to the surface 5a of the first layer 5. Then, as shown in FIGS. 5C to 5E, the second step, the third step, the fourth step, and the fifth step are used, since the mask 42 is used instead of the first member 21 after the second step, except for The layer opening t 7 〇 solder S g5 granules (14) degrees and the absence of adhesion to the metal film are substantially the same as in the fourth embodiment, and the detailed description is omitted here. The solder ball 70 is formed by the above method. According to the method of manufacturing the solder ball 70 of the fifth embodiment, the first adhesive layer 5 is formed by applying the adhesive imparting compound 5b to the dot-shaped metal film 51, so that the amount of the adhesive imparting compound 5b can be minimized. Further, since the substrate for transfer is used, it is possible to correspond to a finer pattern than when the first adhesive layer 5 is formed using only a mask. Further, the adhesion imparting compound 5b is transferred onto the surface 1a of the substrate 1 while maintaining the surface 1a of the substrate 1 covered by the mask 42, whereby the first adhesive layer 5 can be formed at a more correct position. . Further, the second adhesive layer 13 is formed on the core body 11 while maintaining the surface 1a of the substrate 1 covered by the mask 42, so that the second adhesive layer 13 can be prevented from adhering to the surface 1 of the substrate 1. This prevents the solder particles 14 from adhering to the surface 1 of the substrate 1. As described above, according to the manufacturing method of the solder ball 70 of the fifth embodiment, in addition to the effects of the fourth embodiment, the position of the solder ball 70 can be made to correspond to a finer pattern. (Sixth embodiment) Next, a method of manufacturing the solder ball 70 according to a sixth embodiment of the present invention will be described with reference to the drawings. 6A to 6E are diagrams showing the steps of a method of manufacturing the solder ball 70 of the sixth embodiment. The method of manufacturing the solder ball 70 of the sixth embodiment is a simplification of: attaching the core body 11 to the surface 5a of the first adhesive layer 5 provided by the substrate 1.

S -42- 201227852 第一步驟、在核體11的表面lla形成第二黏著層13之第 二步驟、在第二黏著層13表面讓焊料粒子14附著之第三 步驟、讓焊料粒子14熔融而形成焊料層15之第四步驟、 以及從核體11將基材1剝離之第五步驟。 第六實施方式,是在第一步驟之前,於基材表面以互 相離開的方式形成點狀的第二金屬膜,並在第二金屬膜上 塗布黏著性賦予化合物而形成黏著層,這點是與在第一步 驟之前於設有黏著層之基材上形成具有開口的第一構件之 第一實施方式不同。 以下針對各步驟進行說明,關於與第一實施方式同樣 的步驟則省略其詳細的說明。 (第一步驟.) 第六實施方式之第一步驟係包含:在基材1上的第一 黏著層5讓核體1丨附著的步驟,以及其前置步驟,亦即 (Ο在基材1的表面la形成點狀的複數個第二金屬膜52 之步驟、(Π)在露出的第二金屬膜52表面塗布黏著性 賦予化合物(第一黏著性賦予化合物)而形成第一黏著層 5的步驟。 以下針對各步驟進行詳細的說明。 首先’在基材1的表面la,藉由任意的方法以互相 離開的方式形成點狀的金屬膜52(第二金屬膜)。作爲 金屬膜5 2的材料,宜爲對焊料具有濕潤性的金屬,可按 照需要而選擇’更佳爲使用鎢。 -43- 201227852 接著,以覆蓋基材1表面la的方式,配置具有開口 部36(第六開口部)之遮罩43(第三遮罩)。遮罩43是 在第一黏著層5形成後再配置亦可。 在遮罩43設有直徑F62開口部36。開口部36的作 用,是在第四步驟以後防止焊球70脫落。因此,F6的値 可對應於核體11的直徑D和焊料粒子14的直徑d、遮罩 43的厚度Η而適當地設定。作爲遮罩43材料,宜具有不 致在表面形成第二黏著層13的性質。 這時,相鄰接之開口部36彼此的間隔G6,假設遮罩 43厚度爲Η、核體11直徑爲D、焊料粒子14直徑爲d, 能用下述數學式(15)表示。 【數15】 2 d + D + 2 VH(2 d +D-H) ^G6 ...(15) 此外,遮罩43的厚度Η,必須比金屬膜52厚度和第 ~黏著層_ 5厚度的合計値更小,更佳爲比第二金屬膜52 厚度厚上20//m左右。若遮罩43厚度Η比金屬膜52厚 度和第一黏著層5厚度的合計値更大,要讓核體11附著 於第一黏著層5的表面5a變困難,並不理想。 接著,如第6A圖所示般,以覆蓋金屬膜52表面的 方式形成第一黏著層5。第一黏著層5的形成方法,與第 五實施方式同樣的,可藉由在金屬膜52塗布黏著性賦予 化合物等而形成。亦可使用具有開口的遮罩等。 經由以上手法,在基材1的表面1 a以互相離開的方 式形成點狀的複數個第一黏著層5。S-42-201227852 First step, a second step of forming the second adhesive layer 13 on the surface 11a of the core body 11, a third step of attaching the solder particles 14 to the surface of the second adhesive layer 13, and melting the solder particles 14 A fourth step of forming the solder layer 15 and a fifth step of stripping the substrate 1 from the core body 11. In the sixth embodiment, before the first step, a dot-shaped second metal film is formed on the surface of the substrate so as to be separated from each other, and an adhesion-promoting compound is applied on the second metal film to form an adhesive layer. A first embodiment different from forming a first member having an opening on a substrate provided with an adhesive layer prior to the first step. The respective steps will be described below, and the detailed description of the same steps as those of the first embodiment will be omitted. (First Step.) The first step of the sixth embodiment includes a step of attaching the core body 1 to the first adhesive layer 5 on the substrate 1, and a pre-step thereof, that is, a step of forming a plurality of dot-shaped second metal films 52 on the surface 1a of the first layer, and applying an adhesion-imparting compound (first adhesion-imparting compound) to the surface of the exposed second metal film 52 to form the first adhesive layer 5 In the following, each step will be described in detail. First, a point-shaped metal film 52 (second metal film) is formed on the surface 1 of the substrate 1 by any method to separate from each other. The material of 2 is preferably a metal having a wettability to the solder, and may be selected as needed. More preferably, tungsten is used. -43- 201227852 Next, the opening portion 36 is disposed so as to cover the surface la of the substrate 1 (sixth The mask 43 (third mask) of the opening portion. The mask 43 may be disposed after the first adhesive layer 5 is formed. The mask 43 is provided with a diameter F62 opening 36. The function of the opening 36 is After the fourth step, the solder ball 70 is prevented from falling off. Therefore, the F6 is defective. The diameter D of the core body 11 and the diameter d of the solder particles 14 and the thickness Η of the mask 43 can be appropriately set. As the material of the mask 43, it is preferable to have the property of not forming the second adhesive layer 13 on the surface. The gap G6 between the adjacent openings 36 is assumed to be Η, the diameter of the core 11 is D, and the diameter of the solder particles 14 is d, which can be expressed by the following formula (15). d + D + 2 VH(2 d + DH) ^G6 (15) Further, the thickness 遮 of the mask 43 must be smaller than the total thickness of the metal film 52 and the thickness of the first adhesive layer _ 5, and Preferably, the thickness of the second metal film 52 is about 20/m thick. If the thickness Η of the mask 43 is larger than the total thickness of the metal film 52 and the thickness of the first adhesive layer 5, the core body 11 is attached to the first layer. The surface 5a of the adhesive layer 5 becomes difficult, which is not preferable. Next, as shown in Fig. 6A, the first adhesive layer 5 is formed so as to cover the surface of the metal film 52. The first adhesive layer 5 is formed, and the fifth Similarly to the embodiment, it can be formed by applying an adhesive imparting compound or the like to the metal film 52. A mask having an opening or the like can also be used. The above technique, the surface of the substrate 1 a formed of a plurality of dot-like first adhesive layer 5 away from each other in a way.

-44 - 'S 201227852 接者,如第6B圖所示般,讓核體〗丨附著於第一黏著 層5的表面5a。然後’如第6C圖〜第6E圖所示般進行第 —步驟、第二步驟、第四步驟及第五步驟,在第二步驟以 後,是取代第一構件21而使用第三遮罩43,除此外是與 第一實施方式大致相同,在此省略詳細的說明。 經由以上手法來形成焊球7〇。 依據第六實施方式的焊球70製造方法,藉由在金屬 膜52上塗布黏著性賦予化合物5b來形成第—黏著層5, 因此可將第一黏著層5的材料用量降低至最少。此外,比 起僅使用遮罩來形成第一黏著層5的情況,可對應於更微 細的圖案。 此外’由於第一黏著層5是直接形成於基材1上的金 屬膜52表面,可防止第一黏著層5發生位置偏移。 此外’作爲金屬膜52的材料是使用鎢,在第四步驟 形成焊料層15時’即使焊料層15附著於第二金屬膜仍能 輕易地剝離。因此’即使在第二金屬膜52上形成焊球70 ,仍能將焊球70輕易地去除。 如以上所說明’依據第六實施方式的焊球70製造方 法’除了第五實施方式的效果以外,還能使焊球7 0的形 成位置對應於更微細的圖案。 [實施例] 以下列舉實施例來說明本發明,但本發明並不限定於 這些。 -45- 201227852 (實施例1 ) 首先,作爲設有第一黏著層5之基材1,係準備聚醯 亞胺載帶。接著如第1A圖所示般,以覆蓋第一黏著層5 之表面5a的方式配置金屬所構成的第一構件21。在第一 構件21設有直徑Fi=80/zm的開口部31(第一開口部) 。此外,相鄰接之開口部3 1彼此的間隔爲200 // m。又第 —構件21的厚度約25#m。 接著,如第1A圖所示般,在空氣氛圍中,於基材1 的表面la讓直徑D = 50/zm之銅構成的核體11附著。第 7A圖係顯示,核體11附著於基材1的表面la的狀態。 接著,如第1B圖所示般,在核體11的表面iia塗布 黏著性賦予化合物而形成第二黏著層13。這時,作爲含 有黏著性賦予化合物之黏著性溶液,是準備:上述一般式 (3)之R12的烷基爲CUH23,R11爲氫原子之咪唑系化 合物的2質量%水溶液。接著’用醋酸將前述黏著性溶液 調整成P Η約4後’於4 0 °C加溫。接著,將基材1浸漬於 黏著性溶液3分鐘,於核體11的表面lla形成第二黏著 層13。 接著,如第1C圖所示般’在第二黏著層13上讓金屬 組成爲Sn/3.5Ag之直徑d =約10/zm的焊料粒子14附著 。接著,使用氣刀將多餘的焊料粒子14除去。 接著’如第1 D圖所示般進行熔焊步驟,而形成焊料 層15。首先,將基材1藉由180 °C的烘箱加熱20分鐘,-44 - 'S 201227852 Receiver, as shown in Fig. 6B, the core body 丨 is attached to the surface 5a of the first adhesive layer 5. Then, the first step, the second step, the fourth step, and the fifth step are performed as shown in FIGS. 6C to 6E. After the second step, the third mask 43 is used instead of the first member 21. It is substantially the same as the first embodiment, and a detailed description thereof will be omitted. The solder ball 7 is formed by the above method. According to the method of manufacturing the solder ball 70 of the sixth embodiment, the first adhesive layer 5 can be formed by applying the adhesive imparting compound 5b to the metal film 52, so that the amount of the first adhesive layer 5 can be minimized. Further, the case where the first adhesive layer 5 is formed using only the mask can correspond to a finer pattern. Further, since the first adhesive layer 5 is formed on the surface of the metal film 52 directly on the substrate 1, the positional displacement of the first adhesive layer 5 can be prevented. Further, the material used as the metal film 52 is tungsten, and when the solder layer 15 is formed in the fourth step, the solder layer 15 can be easily peeled off even if it is attached to the second metal film. Therefore, even if the solder ball 70 is formed on the second metal film 52, the solder ball 70 can be easily removed. As described above, the method of manufacturing the solder ball 70 according to the sixth embodiment can make the position of the solder ball 70 correspond to a finer pattern in addition to the effects of the fifth embodiment. [Examples] Hereinafter, the present invention will be described by way of examples, but the invention is not limited thereto. -45-201227852 (Example 1) First, as the substrate 1 provided with the first adhesive layer 5, a polyimide carrier tape was prepared. Next, as shown in FIG. 1A, the first member 21 made of metal is placed so as to cover the surface 5a of the first adhesive layer 5. The first member 21 is provided with an opening portion 31 (first opening portion) having a diameter Fi = 80 / zm. Further, the interval between the adjacent opening portions 31 is 200 // m. Further, the thickness of the member 21 is about 25 #m. Next, as shown in Fig. 1A, a core body 11 made of copper having a diameter D = 50 / zm is adhered to the surface 1 of the substrate 1 in an air atmosphere. Fig. 7A shows a state in which the core body 11 is attached to the surface la of the substrate 1. Next, as shown in Fig. 1B, the adhesive layer is applied to the surface iia of the core body 11 to form the second adhesive layer 13. In this case, the adhesive solution containing the adhesion-imparting compound is prepared as a 2% by mass aqueous solution of the imidazole-based compound in which the alkyl group of R12 in the above general formula (3) is CUH23 and R11 is a hydrogen atom. Then, the above-mentioned adhesive solution was adjusted to P Η about 4 with acetic acid, and then heated at 40 °C. Next, the substrate 1 was immersed in an adhesive solution for 3 minutes to form a second adhesive layer 13 on the surface 11a of the core body 11. Next, as shown in Fig. 1C, the solder particles 14 having a metal composition of Sn/3.5Ag diameter d = about 10/zm are adhered to the second adhesive layer 13. Next, the excess solder particles 14 are removed using an air knife. Next, the soldering step is performed as shown in Fig. 1D to form the solder layer 15. First, the substrate 1 was heated in an oven at 180 ° C for 20 minutes.

S -46- 201227852 讓核體11與焊料粒子14固著。接著,將助焊劑( 工製SJ-FL2000 )朝基材1的表面進行噴霧。接著 240°C的熔焊爐於氮氣氛圍中將基材1加熱3分鐘 蓋核體11的表面11a的方式形成膜厚5ym的焊; 。經由以上手法,如第1 E圖所示般製造出直徑約 的焊球70。第7B圖顯示焊球70。 (實施例2 ) 接著說明實施例2。首先,如第2A圖所示般 璃片構成的基材1上塗布矽系黏著劑所構成的第一 5«接著藉由網版印刷,將耐焊用糊劑構成之第一 第一層21a被覆於第一黏著層5的表面5a。 這時,作爲第一構件之第一層21a,是設: F2a = 80 // m的開口部32a (第二開口下部)。 接著,在第一構件的第一層21a上,配置金屬 的第一構件的第二層21b。第一構件的第二層21b 有直徑F2b = 60〆m的開口部32b (第二開口上部) ’在配置第一構件的第二層21b時’是以第一層2. 口部32a之中心部與第二層21b的開口部32b之中 疊的方式,調整第一構件的第二層21b之配置位置 ,相鄰接之開口部32b彼此的間隔G2爲200 v m。 接著,如第2A圖所示般,在空氣氛圍中,於 的表面la讓直徑D = 5〇ym之銅構成的核體11附 著,如第2B圖所示般,從第一構件的第一層21a 昭和電 ,使用 ,以覆 斗層1 5 6 0 " m ,在玻 黏著層 構件的 有直徑 所構成 ,是設 。此外 L a的開 心部重 。此外 基材1 著。接 上將第 -47- 201227852 一構件的第二層2 1 b剝離。 接著,如第2B圖所示般,在核體11的表面11a塗布 黏著性賦予化合物而形成第二黏著層1 3。這時,作爲含 有黏著性賦予化合物之黏著性溶液,係準備:上述一般式 (3)之R12的烷基爲C^H^、R11爲氫原子之咪唑系化 合物的2質量%水溶液。接著,用醋酸將前述黏著性溶液 調整成pH約4後,於40°C加溫。接著,將基材1浸漬於 黏著性溶液3分鐘,藉此於核體1 1的表面1 1 a形成第二 黏著層13。 接著,如第2C圖所示般,在第二黏著層13上讓金屬 組成爲Sn/3.5Ag之直徑d =約10//m的焊料粒子14附著 。接著’藉由氣刀將多餘的焊料粒子14除去。 胃著’如第2D圖所示般進行熔焊步驟而形成焊料層 15 °首先’使用i8〇t的烘箱將基材1加熱2〇分鐘,讓核 體1 1與焊料粒子1 4固著。接著,將助焊劑朝基材1的表 面進行噴霧。接著,使用24〇°C的熔焊爐於氮氣氛圍中將 基材1加熱3分鐘,以覆蓋核體n的表面lla的方式形 成膜厚5^m的焊料層15。經由以上手法製造出直徑約 60 // m的焊球7〇。 (實施例3 ) 接著說明實施例3。首先,作爲設有第一黏著層5之 基材1 ’係準備聚醯亞胺載帶。接著如第3A圖所示般, 以覆盖第〜黏著層5的表面5a的方式配置金屬構成的第 -48 -S -46- 201227852 Fixes the core body 11 and the solder particles 14. Next, a flux (manufactured by SJ-FL2000) was sprayed toward the surface of the substrate 1. Next, a welding furnace of 240 ° C was used to heat the substrate 1 in a nitrogen atmosphere for 3 minutes to form a surface having a thickness of 5 μm by covering the surface 11 a of the core body 11; Through the above method, a solder ball 70 having a diameter of about 100 is produced as shown in Fig. 1E. Figure 7B shows the solder ball 70. (Embodiment 2) Next, Embodiment 2 will be described. First, as shown in FIG. 2A, the first 5' of the base material 1 made of a glazing sheet is coated with a ruthenium-based adhesive, and then the first first layer 21a is formed by screen printing. Covered on the surface 5a of the first adhesive layer 5. At this time, the first layer 21a as the first member is an opening portion 32a (lower opening portion) of F2a = 80 // m. Next, on the first layer 21a of the first member, the second layer 21b of the first member of metal is disposed. The second layer 21b of the first member has an opening portion 32b having a diameter F2b = 60 〆m (the second opening upper portion) 'when the second layer 21b of the first member is disposed' is the first layer 2. The center of the mouth portion 32a The arrangement position of the second layer 21b of the first member is adjusted so as to overlap the opening 32b of the second layer 21b, and the interval G2 between the adjacent openings 32b is 200 vm. Next, as shown in FIG. 2A, in the air atmosphere, the surface la to the core body 11 made of copper having a diameter D = 5 〇 ym is attached, as shown in FIG. 2B, from the first member The layer 21a is a display of the diameter of the glass-adhesive layer member, which is formed by the surface of the glass-adhesive layer. In addition, the open heart of L a is heavy. In addition, the substrate is 1 . Next, the second layer 2 1 b of a member of the -47-201227852 is peeled off. Next, as shown in Fig. 2B, an adhesive adhesion-imparting compound is applied to the surface 11a of the core body 11 to form a second adhesive layer 13 . In this case, as the adhesive solution containing the adhesion-imparting compound, the alkyl group of R12 in the above general formula (3) is a 2% by mass aqueous solution of an imidazole-based compound in which C?H? and R11 are hydrogen atoms. Next, the adhesive solution was adjusted to a pH of about 4 with acetic acid, and then heated at 40 °C. Next, the substrate 1 was immersed in an adhesive solution for 3 minutes to form a second adhesive layer 13 on the surface 11a of the core body 11. Next, as shown in Fig. 2C, solder particles 14 having a metal composition of Sn/3.5Ag diameter d = about 10/m are adhered to the second adhesive layer 13. The excess solder particles 14 are then removed by an air knife. The stomach is subjected to a welding step as shown in Fig. 2D to form a solder layer. 15 ° First, the substrate 1 is heated in an oven of i8 〇t for 2 minutes to fix the core 1 1 and the solder particles 14 . Next, the flux is sprayed toward the surface of the substrate 1. Next, the substrate 1 was heated in a nitrogen atmosphere at a sintering furnace of 24 ° C for 3 minutes to form a solder layer 15 having a film thickness of 5 μm so as to cover the surface 11a of the core n. A solder ball 7 直径 having a diameter of about 60 // m was produced by the above method. (Embodiment 3) Next, Embodiment 3 will be described. First, a polyimide polyimide carrier tape is prepared as the substrate 1' on which the first adhesive layer 5 is provided. Next, as shown in FIG. 3A, the metal is formed so as to cover the surface 5a of the first adhesive layer 5.

S 201227852 一構件21。第一構件21設有直徑F3 = 7 0# m的第一開口 部3 1。此外,相鄰接之第一開口部3 1彼此的間隔爲200 β τη。 接著如第3Α圖所示般,在空氣氛圍中,於基材1的 表面la讓直徑D = 5 0y m之銅構成的核體11附著。接著 如第3 B圖所示般將第一構件2 1剝離。 接著如第3C圖所示般,以覆蓋第一黏著層5的表面 5a的方式讓直徑約lym之玻璃粒子構成的第一遮罩41 附著。 接著如第3D圖所示般,於核體11的表面11a塗布黏 著性賦予化合物而形成第二黏著層13。這時,作爲含有 黏著性賦予化合物之黏著性溶液,係準備:上述一般式( 3)之R12的烷基爲CuH^、R11爲氫原子之咪唑系化合 物的2質量%水溶液。接著,用醋酸將前述黏著性溶液調 整成pH約4後,於40°C加溫。接著,將基材1浸漬於黏 著性溶液3分鐘,藉此於核體1 1的表面1 1 a形成第二黏 著層1 3。 接著如第3E圖所示般,於第二黏著層13上讓金屬組 成爲Sn/3.5Ag之直徑d =約10ym的焊料粒子14附著。 接著,藉由氣刀將多餘的焊料粒子14除去。 接著如第3 F圖所示般進行熔焊步驟而形成焊料層1 5 。首先,使用180°C的烘箱將基材1加熱20分鐘,讓核體 11與焊料粒子14固著。接著,將助焊劑朝基材1的表面 進行噴霧。接著,使用240°C的熔焊爐於氮氣氛圍中將基 -49- 201227852 材1加熱3分鐘,以覆蓋核體11的表面lia的方3 膜厚5vm的焊料層15。經由以上手法製造出直徑 m的焊球7 0。 (實施例4) 接著說明實施例4。首先,準備好玻璃片構成的 1 ° 接著如第4A圖所示般,以覆蓋基材1的表面la 式配置5 μ m之金屬構成的構件2 2 (第二構件)。這 作爲構件22,係設有直徑F4 = 25 v m的開口部34 ( 開口部)。此外,相鄰接之開口部3 4彼此的間隔爲 β m。 接著如第4A圖所示般,使用構件22作爲遮罩 塡充開口部34的方式塗布矽系黏著劑。藉此,將 H = 5 // m、直徑F4 = 25 /zm的第一黏著層5形成於基材 表面1 a。 接著如第4B圖所示般,在空氣氛圍中,於基材 表面la讓直徑D = 5 0/z m的銅構成的核體11附著。 接著如第4C圖所示般,於核體11的表面11a塗 著性賦予化合物而形成第二黏著層13。這時,作爲 黏著性賦予化合物之黏著性溶液,係準備:上述一般 3) R〗2的烷基爲ChH23、R11爲氫原子之咪唑系化 的2質量%水溶液。接著,用醋酸將前述黏著性溶液 成p Η約4後,於4 0 °C加溫。接著,將基材1浸漬於 形成 3 60 基材 的方 時, 第四 200 ,以 厚度 1的 1的 布黏 含有 式( 合物 調整 黏著S 201227852 A component 21. The first member 21 is provided with a first opening portion 31 of a diameter F3 = 70#. Further, the interval between the adjacent first opening portions 31 is 200 β τη. Next, as shown in Fig. 3, the core body 11 made of copper having a diameter D = 50 μm is adhered to the surface of the substrate 1 in an air atmosphere. Next, the first member 21 is peeled off as shown in Fig. 3B. Next, as shown in Fig. 3C, the first mask 41 made of glass particles having a diameter of about lym is adhered so as to cover the surface 5a of the first adhesive layer 5. Next, as shown in Fig. 3D, the adhesive layer is applied to the surface 11a of the core body 11 to form the second adhesive layer 13. In this case, as the adhesive solution containing the adhesion-imparting compound, the alkyl group of R12 in the above general formula (3) is a 2% by mass aqueous solution of an imidazole-based compound in which CuH^ and R11 are hydrogen atoms. Next, the above-mentioned adhesive solution was adjusted to a pH of about 4 with acetic acid, and then heated at 40 °C. Next, the substrate 1 was immersed in an adhesive solution for 3 minutes to form a second adhesive layer 13 on the surface 1 1 a of the core body 1 1 . Next, as shown in Fig. 3E, the solder particles 14 having a metal group of Sn/3.5Ag diameter d = about 10 μm are adhered to the second adhesive layer 13. Next, the excess solder particles 14 are removed by an air knife. Next, as shown in Fig. 3F, a soldering step is performed to form a solder layer 15 . First, the substrate 1 was heated in an oven at 180 ° C for 20 minutes to fix the core body 11 and the solder particles 14. Next, the flux is sprayed toward the surface of the substrate 1. Next, the base-49-201227852 material 1 was heated in a nitrogen atmosphere at a 240 ° C welding furnace for 3 minutes to cover the solder layer 15 of the surface 3 of the core body 11 having a film thickness of 5 vm. A solder ball 70 of diameter m is manufactured by the above method. (Embodiment 4) Next, Embodiment 4 will be described. First, 1 ° of the glass piece is prepared. Next, as shown in Fig. 4A, a member 2 2 (second member) made of a metal of 5 μm is disposed to cover the surface of the substrate 1. As the member 22, an opening portion 34 (opening portion) having a diameter F4 = 25 v m is provided. Further, the interval between the adjacent opening portions 34 is β m . Next, as shown in Fig. 4A, the enamel-based adhesive is applied as the mask accommodating opening portion 34 as shown in Fig. 4A. Thereby, the first adhesive layer 5 of H = 5 // m and diameter F4 = 25 /zm is formed on the surface 1a of the substrate. Next, as shown in Fig. 4B, a core body 11 made of copper having a diameter D = 5 0 / z m is adhered to the surface of the substrate in an air atmosphere. Next, as shown in Fig. 4C, a compound is applied to the surface 11a of the core body 11 to form a second adhesive layer 13. In this case, as an adhesive solution for the adhesion-imparting compound, the above-mentioned general 3) R 2 alkyl group is an imidazole-based 2 mass % aqueous solution in which ChH 23 and R 11 are hydrogen atoms. Next, the adhesive solution was made into p Η about 4 with acetic acid, and then heated at 40 °C. Next, the substrate 1 is immersed in a side where the 3 60 substrate is formed, and the fourth 200 is adhered to the cloth having a thickness of 1 (the adhesive is adjusted).

S -50- 201227852 性溶液3分鐘,藉此於核體丨〗的表面〗丨a形成第二黏 層13。 接著如第4D圖所示般,在第二黏著層13上,讓 屬組成爲Sn/3 · 5 Ag之直徑d =約i〇;Win的焊料粒子14 著。接著’藉由氣刀將多餘的焊料粒子14除去。 接者如第4E圖所示般進行熔焊步驟而形成焊料層 。首先’使用180°C的烘箱將基材丨加熱2〇分鐘,讓核 11與焊料粒子14固著。接著,將助焊劑朝基材丨的表 進行噴霧。接著,使用240°C的熔焊爐於氮氣氛圍中將 材1加熱3分鐘’以覆蓋核體的表面的方式形 膜厚5/zm的焊料層15。經由以上手法製造出直徑約 仁m的焊球7 0。 (實施例5) 接著說明實施例5。首先,於轉印用基材61的表 61a形成膜厚18//m的銅構成的金屬膜51 (第一金屬 )。這時,金屬膜51的圖案,是直徑爲25/zm的點, 鄰接之金屬膜51圖案彼此的間隔爲200 // m。 此外,事先將基材1的表面la藉由厚度H=18ym 遮罩42 (第二遮罩42)予以覆蓋。遮罩42設有直 F5 = 7〇Ai m的開口部35 (第五開口部)。此外,相鄰接 開口部3 5彼此的間隔爲200 // m。 接著,於金屬膜51的表面讓黏著性賦予化合物5b 著。這時,作爲含有黏著性賦予化合物之黏著性溶液, 著 金 附 15 體 面 基 成 60 面 膜 相 的 徑 之 附 係 -51 - 201227852 準備:上述一般式(3)之R12的烷基爲ChH^、R11爲 氫原子之咪唑系化合物的2質量%水溶液。接著,用醋酸 將前述黏著性溶液調整成pH約4後,於40 °C加溫。接著 ’將基材1浸漬於黏著性溶液1 0分鐘,藉此於金屬膜51 的表面讓黏著性賦予化合物5b附著。 接著如第5 B圖所示般,從轉印用基材6 1將黏著性賦 予化合物5b轉印到基材1的表面la,藉此形成第一黏著 層5。 接著如第5C圖所示般,於空氣氛圍中,在基材1的 表面la讓直徑D = 50/zm之銅構成的核體11附著。 接著,於核體11的表面11a塗布黏著性賦予化合物 而形成第二黏著層13。 接著如第5D圖所示般,於第二黏著層13上讓金屬 組成爲Sn/3.5Ag之直徑d =約10 μ m的焊料粒子14附著 。接著,藉由氣刀將多餘的焊料粒子14除去。 接著如第5E圖所示般進行熔焊步驟而焊料層15。首 先,使用1 8 0 °C的烘箱將基材1加熱2 0分鐘,讓核體1 1 與焊料粒子14固著。接著,將助焊劑朝基材1的表面進 行噴霧。接著,使用24〇°C的熔焊爐於氮氣氛圍中將基材 1加熱3分鐘,以覆蓋核體11的表面11a的方式形成膜 厚5/zm的焊料層15。經由以上手法製造出直徑約60ym 的焊球70。 (實施例6)S -50- 201227852 Sex solution for 3 minutes, thereby forming a second adhesive layer 13 on the surface of the core body. Next, as shown in Fig. 4D, on the second adhesive layer 13, the diameter d of the composition of Sn/3 · 5 Ag is about i 〇; the solder particles of Win 14 are formed. The excess solder particles 14 are then removed by an air knife. The soldering step is performed as shown in Fig. 4E to form a solder layer. First, the substrate was heated for 2 minutes using an oven at 180 ° C to allow the core 11 and the solder particles 14 to be fixed. Next, the flux is sprayed toward the surface of the substrate. Next, the material 1 was heated in a nitrogen atmosphere for 3 minutes using a 240 ° C welding furnace to form a solder layer 15 having a film thickness of 5 / zm so as to cover the surface of the core body. A solder ball 70 having a diameter of about m is manufactured by the above method. (Example 5) Next, Example 5 will be described. First, a metal film 51 (first metal) made of copper having a thickness of 18/m is formed on the surface 61a of the substrate 61 for transfer. At this time, the pattern of the metal film 51 is a point having a diameter of 25/zm, and the interval between the patterns of the adjacent metal films 51 is 200 // m. Further, the surface 1a of the substrate 1 is covered in advance by a mask 42 (second mask 42) having a thickness of H = 18 μm. The mask 42 is provided with an opening portion 35 (fifth opening portion) of straight F5 = 7 〇 Ai m . Further, the interval between the adjacent opening portions 35 is 200 // m. Next, the adhesion imparting compound 5b is allowed to be formed on the surface of the metal film 51. In this case, as the adhesive solution containing the adhesion-imparting compound, the addition of the surface of the gold-coated 15-form surface to the 60-mask phase is prepared. -51 - 201227852 Preparation: The alkyl group of R12 in the above general formula (3) is ChH^ and R11. A 2% by mass aqueous solution of an imidazole compound of a hydrogen atom. Next, the above-mentioned adhesive solution was adjusted to a pH of about 4 with acetic acid, and then heated at 40 °C. Next, the substrate 1 was immersed in the adhesive solution for 10 minutes to adhere the adhesive imparting compound 5b to the surface of the metal film 51. Next, as shown in Fig. 5B, the adhesive imparting compound 5b is transferred from the transfer substrate 6 1 to the surface 1a of the substrate 1, whereby the first adhesive layer 5 is formed. Next, as shown in Fig. 5C, a core body 11 made of copper having a diameter D = 50 / zm is adhered to the surface of the substrate 1 in an air atmosphere. Next, an adhesive adhesion-imparting compound is applied to the surface 11a of the core body 11 to form a second adhesive layer 13. Next, as shown in Fig. 5D, solder particles 14 having a metal composition of Sn/3.5Ag diameter d = about 10 μm are adhered to the second adhesive layer 13. Next, the excess solder particles 14 are removed by an air knife. Next, as shown in FIG. 5E, the soldering step is performed to the solder layer 15. First, the substrate 1 was heated for 20 minutes using an oven at 180 ° C to fix the core body 1 1 and the solder particles 14 . Next, the flux is sprayed toward the surface of the substrate 1. Next, the substrate 1 was heated in a nitrogen atmosphere at a sintering furnace of 24 ° C for 3 minutes to form a solder layer 15 having a film thickness of 5 / zm so as to cover the surface 11a of the core body 11. A solder ball 70 having a diameter of about 60 μm is produced by the above method. (Example 6)

-52- 201227852 接著說明實施例6。首先如第6A圖所示般,在鋁構 成的基材1的表面la,藉由網版印刷呈點狀地塗布鎢糊 劑。接著,將前述鎢糊劑燒結而形成點狀的鎢構成的金屬 膜52(第二金屬膜)。這時,金屬膜52的圖案,是直徑 25 " m的點,且相鄰接之金屬膜52圖案彼此的間隔爲 2 0 0 μ m 〇 接著,以覆蓋基材1的表面la的方式配置遮罩43( 第三遮罩)。 ^ 這時,遮罩43是使用設有直徑F6 = 7 0 // m的開口部 36(第六開口部)者。此外,相鄰接之開口部36彼此的 間隔爲200 μ m。此外,以金屬膜52構成的點位於開口部 36中心的方式,調整遮罩43的配置位置。 接著,於金屬膜52的表面讓黏著性賦予化合物(第 一黏著性賦予化合物)附著。這時,作爲含有黏著性賦予 化合物之黏著性溶液,係準備:上述一般式(3)之R12 的烷基爲CuHu、R11爲氫原子之咪唑系化合物的2質量 %水溶液。接著,用醋酸將前述黏著性溶液調整成pH約 4後,於40°C加溫。接著,將基材1浸漬於黏著性溶液1 0 分鐘,如第6A圖所示般於金屬膜52的表面形成第一黏 著層5。 接著如第6B圖所示般,於空氣氛圍中,在第一黏著 層5的表面讓直徑D = 5 0// m的銅構成的核體11附著。 接著如第6C圖所示般,於核體11的表面11a塗布黏 著性賦予化合物而形成第二黏著層1 3。 -53- 201227852 接著如第6D圖所示般,於第二黏著層13上讓金屬 組成爲Sn/3.5Ag之直徑d =約10/z m的焊料粒子ι4附著 。接著,藉由氣刀將多餘的焊料粒子14除去。 接著如第6E圖所示般進行熔焊步驟而焊料層15。首 先,使用180°C的烘箱將基材1加熱20分鐘,讓核體u 與焊料粒子14固著。接著,將助焊劑朝基材1的表面進 行噴霧。接著,使用24〇°C的熔焊爐於氮氣氛圍中將基材 1加熱3分鐘,以覆蓋核體11的表面11a的方式形成膜 厚5//m的焊料層15。經由以上手法製造出直徑約6〇ym 的焊球70 » 實施例1〜實施例6的結果,都沒有發生核體U脫落; 。此外,也看不到未形成焊料層1 5之核體1 1。 依據以上方法,不需使用含鉛量高之高熔點焊料即司· 形成良好的焊球70。因此,可實現焊球70的無鉛化。因 此,不致從焊料凸塊中所含的Pb放射出α射線。因此, 能防止α射線造成電子零件之錯誤動作。 此外,由於可便宜地製造出以核體11爲核心之焊球 70,可低成本地解決焊料凸塊之高度不均一問題、裝載晶 片而進行熔焊時晶片下沉的問題。本方法是適用於微細基 材1的方法,可提供高集積度且高可靠性之電子機器。 本發明之目的是爲了提供:可對應於精細的圖案形狀 且可低成本地形成焊球之製造方法。 U 明 說 單 簡 式 圖 s -54- 201227852 第1A圖係說明本發明的第一實施方式之焊球製造步 驟之步驟圖。 第1Β圖係說明本發明的第一實施方式之焊球製造步 驟之步驟圖。 第1C圖係說明本發明的第一實施方式之焊球製造步 驟之步驟圖。 第1D圖係說明本發明的第一實施方式之焊球製造步 驟之步驟圖。 第1Ε圖係說明本發明的第一實施方式之焊球製造步 驟之步驟圖。 第2Α圖係說明本發明的第二實施方式之焊球製造步 驟之步驟圖。 第2Β圖係說明本發明的第二實施方式之焊球製造步 驟之步驟圖。 第2C圖係說明本發明的第二實施方式之焊球製造步 驟之步驟圖。 第2D圖係說明本發明的第二實施方式之焊球製造步 驟之步驟圖。 第2Ε圖係說明本發明的第二實施方式之焊球製造步 驟之步驟圖。 第3Α圖係說明本發明的第三實施方式之焊球製造步 驟之步驟圖。 第3Β圖係說明本發明的第三實施方式之焊球製造步 驟之步驟圖。 -55- 201227852 第3C圖係說明本發明的第三實施方式之焊球製造步 驟之步驟圖。 第3D圖係說明本發明的第三實施方式之焊球製造步 驟之步驟圖。 第3E圖係說明本發明的第三實施方式之焊球製造步 驟之步驟圖。 第3F圖係說明本發明的第三實施方式之焊球製造步 驟之步驟圖。 第4A圖係說明本發明的第四實施方式之焊球製造步 驟之步驟圖。 第4B圖係說明本發明的第四實施方式之焊球製造步 驟之步驟圖。 第4C圖係說明本發明的第四實施方式之焊球製造步 驟之步驟圖。 第4D圖係說明本發明的第四實施方式之焊球製造步 驟之步驟圖。 第4E圖係說明本發明的第四實施方式之焊球製造步 驟之步驟圖。 第5A圖係說明本發明的第五實施方式之焊球製造步 驟之步驟圖。 第5B圖係說明本發明的第五實施方式之焊球製造步 驟之步驟圖。 第5C圖係說明本發明的第五實施方式之焊球製造步 驟之步驟圖。 -56--52-201227852 Next, the embodiment 6 will be described. First, as shown in Fig. 6A, a tungsten paste is applied in a dot shape by screen printing on the surface la of the substrate 1 made of aluminum. Next, the tungsten paste is sintered to form a metal film 52 (second metal film) made of tungsten in a dot shape. At this time, the pattern of the metal film 52 is a dot having a diameter of 25 " m, and the interval between the adjacent metal film 52 patterns is 200 μm. Next, the mask is disposed so as to cover the surface la of the substrate 1. Cover 43 (third mask). ^ At this time, the mask 43 is an opening portion 36 (sixth opening portion) having a diameter F6 = 7 0 // m. Further, the adjacent opening portions 36 are spaced apart from each other by 200 μm. Further, the arrangement position of the mask 43 is adjusted so that the point formed by the metal film 52 is located at the center of the opening portion 36. Then, the adhesion-imparting compound (first adhesion-imparting compound) adheres to the surface of the metal film 52. In this case, as the adhesive solution containing the adhesiveness-imparting compound, the alkyl group of R12 of the above general formula (3) is a 2 mass% aqueous solution of an imidazole compound in which CuHu and R11 are hydrogen atoms. Next, the above-mentioned adhesive solution was adjusted to a pH of about 4 with acetic acid, and then heated at 40 °C. Next, the substrate 1 was immersed in the adhesive solution for 10 minutes, and the first adhesive layer 5 was formed on the surface of the metal film 52 as shown in Fig. 6A. Next, as shown in Fig. 6B, a core body 11 made of copper having a diameter D = 50 / / m is adhered to the surface of the first adhesive layer 5 in an air atmosphere. Next, as shown in Fig. 6C, an adhesive property-imparting compound is applied to the surface 11a of the core body 11 to form a second adhesive layer 13 . -53- 201227852 Next, as shown in Fig. 6D, solder particles ι4 having a metal composition of Sn/3.5Ag diameter d = about 10/z m are attached to the second adhesive layer 13. Next, the excess solder particles 14 are removed by an air knife. Next, the soldering step is performed as shown in FIG. 6E to the solder layer 15. First, the substrate 1 was heated in an oven at 180 ° C for 20 minutes to fix the core body u and the solder particles 14 . Next, the flux is sprayed toward the surface of the substrate 1. Next, the substrate 1 was heated in a nitrogen atmosphere at a sintering temperature of 24 ° C for 3 minutes to form a solder layer 15 having a film thickness of 5 / m so as to cover the surface 11 a of the core body 11 . The solder balls 70 having a diameter of about 6 μm were produced by the above method. As a result of Examples 1 to 6, no nucleus U detachment occurred. Further, the core body 11 in which the solder layer 15 is not formed is also not seen. According to the above method, it is not necessary to use a high melting point solder having a high lead content, that is, a good solder ball 70 is formed. Therefore, lead-free solder ball 70 can be achieved. Therefore, α rays are not emitted from Pb contained in the solder bumps. Therefore, it is possible to prevent the alpha rays from causing erroneous actions of the electronic components. Further, since the solder ball 70 having the core body 11 as a core can be manufactured inexpensively, the problem of height unevenness of the solder bumps and the problem of wafer sinking when the wafer is mounted and welded can be solved at low cost. This method is a method suitable for the fine substrate 1, and can provide an electronic machine with high integration and high reliability. SUMMARY OF THE INVENTION An object of the present invention is to provide a manufacturing method capable of forming a solder ball at a low cost in accordance with a fine pattern shape. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1A is a view showing a step of a solder ball manufacturing step of a first embodiment of the present invention. Fig. 1 is a view showing a step of a solder ball manufacturing step of the first embodiment of the present invention. Fig. 1C is a view showing the steps of the solder ball manufacturing step of the first embodiment of the present invention. Fig. 1D is a view showing the steps of the solder ball manufacturing step of the first embodiment of the present invention. Fig. 1 is a view showing a step of a solder ball manufacturing step of the first embodiment of the present invention. Fig. 2 is a view showing the steps of the solder ball manufacturing step of the second embodiment of the present invention. Fig. 2 is a view showing the steps of the solder ball manufacturing step of the second embodiment of the present invention. Fig. 2C is a view showing the steps of the solder ball manufacturing step of the second embodiment of the present invention. Fig. 2D is a view showing the steps of the solder ball manufacturing step of the second embodiment of the present invention. Fig. 2 is a view showing the steps of the solder ball manufacturing step of the second embodiment of the present invention. Fig. 3 is a view showing the steps of the solder ball manufacturing step of the third embodiment of the present invention. Fig. 3 is a view showing the steps of the solder ball manufacturing step of the third embodiment of the present invention. -55-201227852 Fig. 3C is a view showing the steps of the solder ball manufacturing step of the third embodiment of the present invention. Fig. 3D is a view showing the steps of the solder ball manufacturing step of the third embodiment of the present invention. Fig. 3E is a view showing the steps of the solder ball manufacturing step of the third embodiment of the present invention. Fig. 3F is a view showing the steps of the solder ball manufacturing step of the third embodiment of the present invention. Fig. 4A is a view showing the steps of the solder ball manufacturing step of the fourth embodiment of the present invention. Fig. 4B is a view showing the steps of the solder ball manufacturing step of the fourth embodiment of the present invention. Fig. 4C is a view showing the steps of the solder ball manufacturing step of the fourth embodiment of the present invention. Fig. 4D is a view showing the steps of the solder ball manufacturing step of the fourth embodiment of the present invention. Fig. 4E is a view showing the steps of the solder ball manufacturing step of the fourth embodiment of the present invention. Fig. 5A is a view showing the steps of the solder ball manufacturing step of the fifth embodiment of the present invention. Fig. 5B is a view showing the steps of the solder ball manufacturing step of the fifth embodiment of the present invention. Fig. 5C is a view showing the steps of the solder ball manufacturing step of the fifth embodiment of the present invention. -56-

S 201227852 第5D圖係說明本發明的第五實施方式之焊球製造步 驟之步驟圖。 第5E圖係說明本發明的第五實施方式之焊球製造步 驟之步驟圖。 第6A圖係說明本發明的第六實施方式之焊球製造步 驟之步驟圖。 第6B圖係說明本發明的第六實施方式之焊球製造步 驟之步驟圖。 第6C圖係說明本發明的第六實施方式之焊球製造步 驟之步驟圖。 第6D圖係說明本發明的第六實施方式之焊球製造步 驟之步驟圖。 第6E圖係說明本發明的第六實施方式之焊球製造步 驟之步驟圖。 第7A圖係用來示意地說明本發明的核體與焊球之俯 視相片^ 第7B圖係用來示意地說明本發明的核體與焊球之俯 視相片。 [主要元件符號說明】 1 :基材 la :基材的表面 5 :第一黏著層 5a:第一黏著層的表面 -57- 201227852 5b :第一黏著性賦予化合物 1 1 :核體 1 1 a :核體的表面 13 :第二黏著層 1 4 :焊料粒子 1 5 :焊料層 2 1 :第一構件 2 1 a :第一構件之第一層 21b:第一構件之第二層 22 :第二構件 3 1 :第一開口部 3 2 a :第二開口下部 3 2 b :第二開口上部 3 3 :第三開口部 3 4 :第四開口部 3 5 :第五開口部 3 6 :第六開口部 41 :第一遮罩 42 :第二遮罩 43 :第三遮罩 51 :第一金屬膜 5 2 :第二金屬膜 61 :轉印用基材 61a:轉印用基材的表面 -58-S 201227852 Fig. 5D is a view showing the steps of the solder ball manufacturing step of the fifth embodiment of the present invention. Fig. 5E is a view showing the steps of the solder ball manufacturing step of the fifth embodiment of the present invention. Fig. 6A is a view showing the steps of the solder ball manufacturing step of the sixth embodiment of the present invention. Fig. 6B is a view showing the steps of the solder ball manufacturing step of the sixth embodiment of the present invention. Fig. 6C is a view showing the steps of the solder ball manufacturing step of the sixth embodiment of the present invention. Fig. 6D is a view showing the steps of the solder ball manufacturing step of the sixth embodiment of the present invention. Fig. 6E is a view showing the steps of the solder ball manufacturing step of the sixth embodiment of the present invention. Fig. 7A is a view schematically showing a photograph of the core body and the solder ball of the present invention. Fig. 7B is a view schematically showing a photograph of the core body and the solder ball of the present invention. [Description of main component symbols] 1 : Substrate la : Surface of substrate 5 : First adhesive layer 5 a : Surface of first adhesive layer - 57 - 201227852 5b : First adhesive property imparting compound 1 1 : Nucleo body 1 1 a : surface 13 of the core body: second adhesive layer 1 4 : solder particles 1 5 : solder layer 2 1 : first member 2 1 a : first layer 21b of the first member: second layer 22 of the first member: Two members 3 1 : first opening portion 3 2 a : second opening lower portion 3 2 b : second opening upper portion 3 3 : third opening portion 3 4 : fourth opening portion 3 5 : fifth opening portion 3 6 : Six opening portion 41: first mask 42: second mask 43: third mask 51: first metal film 5 2 : second metal film 61: substrate for transfer 61a: surface of substrate for transfer -58-

S 201227852 7 0 :焊球 F j :第一開口部的直徑 F2a :第二開口下部的直徑 F2b :第二開口上部的直徑 F3 :第三開口部的直徑 F4 :第四開口部的直徑 F5 :第五開口部的直徑 F6 :第六開口部的直徑 D :核體的粒徑 d :焊料粒子的粒徑 r :第一遮罩的直徑 -59 -S 201227852 7 0 : solder ball F j : diameter F2a of the first opening: diameter F2b of the lower portion of the second opening: diameter F3 of the upper portion of the second opening: diameter F4 of the third opening portion: diameter F5 of the fourth opening portion: The diameter F6 of the fifth opening portion: the diameter D of the sixth opening portion: the particle diameter d of the core body: the particle diameter of the solder particles r: the diameter of the first mask - 59 -

Claims (1)

201227852 七、申請專利範園: 1. 一種焊球之製造方法,其特徵在於, 係具備: 在基材的表面所賦予之第一黏著層上讓核體附著之第 一步驟、 在前述核體的表面塗布黏著性賦予化合物而形成第二 黏著層之第二步驟、 在前述核體表面之第二黏著層上讓焊料粒子附著之第 三步驟、 讓前述焊料粒子熔融而在前述核體的表面形成焊料層 之第四步驟、以及 從前述核體將前述基材剝離而獲得焊球之第五步驟。 2. 如申請專利範圍第1項所述之焊球之製造方法, 其中, 前述核體是Cu所構成。 3. 如申請專利範圍第1或2項所述之焊球之製造方 法,其中, 在前述第一步驟之前包含前置步驟,該前置步驟,是 將具有讓前述第一黏著層表面的一部分露出的開口部之第 一構件配置在前述第一黏著層上; 之後,在前述第一步驟,在從前述開口部露出之前述 第一黏著層表面讓核體附著。 4 ·如申請專利範圍第3項所述之焊球之製造方法, 其中, S -60- 201227852 前述第一構件是由第一層及第二層所構成; 將前述第一構件配置在前述第一黏著層上之前置步驟 ,係包含: 將具有開口部的第一構件之第一層配置在前述第一黏 著層上的步驟;以及 在前述第一構件之第一層上,將具有直徑比前述開口 部更小的開口部之第一構件的第二層,以第一層之前述開 口部的中心部與第二層之前述開口部的中心部重疊的方式 進行配置的步驟; 在前述第一步驟和前述第二步驟之間,進一步具有將 前述第一構件之第二層從前述第一構件之第一層上剝離的 步驟。 5. 如申請專利範圍第3項所述之焊球之製造方法, 其中, 在前述第一步驟和前述第二步驟之間具有: 將前述第一構件從前述第一黏著層上剝離的步驟;以 及 以覆蓋前述第一黏著層表面的方式,讓粒子構成的遮 罩附著的步驟;該粒子直徑比前述第一構件的厚度小。 6. 如申請專利範圍第1或2項所述之焊球之製造方 法,其中, 在前述第一步驟之前,具有讓點狀之複數個前述第一 黏著層以互相離開的方式形成於前述基材表面之前置步驟 -61 - 201227852 7.如申請專利範圍第6項所述之焊球之製造方法, 其中, 形成前述第一黏著層之前置步驟,係包含: 將具有讓前述基材表面的一部分露出之點狀的開口部 之第二構件配置在前述基材上之步驟;以及 以前述第二構件作爲遮罩而塗布用來形成前述第一黏 著層之黏著性物質,藉此獲得點狀的複數個前述第一黏著 層之步驟。 8·如申請專利範圍第6項所述之焊球之製造方法, 其中, 形成前述點狀的第一黏著層之前置步驟,係包含·· 在轉印用基材表面以互相離開的方式形成點狀的金屬 膜之步驟; 在前述金屬膜塗布黏著性賦予化合物之步驟、以及 從前述轉印用基材將前述黏著性賦予化合物轉印於前 述基材表面而形成第一黏著層之步驟。 9.如申請專利範圍第8項所述之焊球之製造方法, 其中, 形成前述點狀的第一黏著層之前置步驟,係包含:在 藉由具有開口部之遮罩覆蓋前述基材表面後,在從前述遮 罩的開口部露出之前述基材表面上,從轉印用基材轉印前 述黏著性賦予化合物之步驟; 在第二步驟,是維持將前述基材表面藉由遮罩覆蓋, 而在核體上形成前述第二黏著層。 S -62- 201227852 I 〇.如申請專利範圍第6項所述之焊球之製造方法, 其中, 形成前述第一黏著層之前置步驟,係包含: 在前述基材表面以互相離開的方式形成點狀的金 之步驟、以及 在前述金屬膜塗布前述黏著性賦予化合物而形成前$ 第一黏著層之步驟。 II ·如申請專利範圍第1 〇項所述之焊球之製造方法 ,其中, 形成前述第一黏著層之前置步驟,係包含: 在前述基材表面以互相離開的方式形成點狀的金屬膜 之步驟:以及 在將前述基材表面藉由具有開口部之遮罩覆蓋後,在 從前述開口部露出之前述金屬膜表面塗布前述黏著性賦予 化合物之步驟。 1 2 ·如申請專利範圍第1 0項所述之焊球之製造方法 ,其中, W述金屬膜是鎢所構成。 13.如申請專利範圍第1或2項所述之焊球之製造方 法,其中, 前述焊料粒子的平均粒徑是前述核體的平均粒徑之 1/2倍以下。 -63 -201227852 VII. Patent application garden: 1. A method for manufacturing a solder ball, comprising: a first step of attaching a core body to a first adhesive layer provided on a surface of a substrate, and the core body a second step of applying a tackifying property to the compound to form the second adhesive layer, a third step of attaching the solder particles to the second adhesive layer on the surface of the core body, and melting the solder particles on the surface of the core body A fourth step of forming a solder layer, and a fifth step of stripping the substrate from the core body to obtain a solder ball. 2. The method of manufacturing a solder ball according to claim 1, wherein the core body is made of Cu. 3. The method of manufacturing a solder ball according to claim 1 or 2, wherein before the first step, a pre-step is provided, the pre-step having a portion of the surface of the first adhesive layer The first member of the exposed opening is disposed on the first adhesive layer. Thereafter, in the first step, the core body is adhered to the surface of the first adhesive layer exposed from the opening. 4. The method of manufacturing a solder ball according to claim 3, wherein the first member is composed of the first layer and the second layer; and the first member is disposed in the foregoing a pre-step on an adhesive layer comprising: a step of disposing a first layer of a first member having an opening portion on the first adhesive layer; and a first layer of the first member having a diameter a second layer of the first member having an opening smaller than the opening portion, wherein the central portion of the opening of the first layer overlaps with the central portion of the opening of the second layer; Between the first step and the second step, there is further provided a step of peeling the second layer of the first member from the first layer of the first member. 5. The method of manufacturing a solder ball according to claim 3, wherein, between the first step and the second step, the step of: peeling the first member from the first adhesive layer; And a step of adhering the mask formed by the particles so as to cover the surface of the first adhesive layer; the particle diameter is smaller than the thickness of the first member. 6. The method of manufacturing a solder ball according to claim 1 or 2, wherein before the first step, a plurality of the first adhesive layers having a dot shape are formed apart from each other The method of manufacturing a solder ball according to claim 6, wherein the step of forming the first adhesive layer comprises: a step of disposing a second member of the dot-shaped opening portion of the surface on the substrate; and applying an adhesive material for forming the first adhesive layer by using the second member as a mask, thereby obtaining a step of a plurality of the aforementioned first adhesive layers in a dot shape. 8. The method for producing a solder ball according to claim 6, wherein the step of forming the first adhesive layer in the form of a dot is performed by removing the surfaces of the substrate for transfer from each other. a step of forming a dot-shaped metal film; a step of applying an adhesion-imparting compound to the metal film; and a step of transferring the adhesion-imparting compound from the substrate for transfer onto the surface of the substrate to form a first adhesive layer . 9. The method of manufacturing a solder ball according to claim 8, wherein the step of forming the dot-shaped first adhesive layer comprises: covering the substrate with a mask having an opening; After the surface, the step of transferring the adhesion-imparting compound from the substrate for transfer on the surface of the substrate exposed from the opening of the mask; in the second step, maintaining the surface of the substrate by masking The cover is covered, and the aforementioned second adhesive layer is formed on the core body. The method for manufacturing a solder ball according to claim 6, wherein the step of forming the first adhesive layer comprises: separating the surfaces of the substrate from each other The step of forming a dot-like gold and the step of forming the front-first adhesive layer by applying the adhesion-imparting compound to the metal film. The method for manufacturing a solder ball according to the first aspect of the invention, wherein the step of forming the first adhesive layer comprises: forming a point-like metal on the surface of the substrate to leave each other And a step of applying the adhesion-imparting compound to the surface of the metal film exposed from the opening after covering the surface of the substrate with a mask having an opening. 1 2 The method for producing a solder ball according to claim 10, wherein the metal film is made of tungsten. The method of producing a solder ball according to claim 1 or 2, wherein the average particle diameter of the solder particles is 1/2 or less of an average particle diameter of the core body. -63 -
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