TW201226885A - Workpiece inspection structure - Google Patents

Workpiece inspection structure Download PDF

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Publication number
TW201226885A
TW201226885A TW100120490A TW100120490A TW201226885A TW 201226885 A TW201226885 A TW 201226885A TW 100120490 A TW100120490 A TW 100120490A TW 100120490 A TW100120490 A TW 100120490A TW 201226885 A TW201226885 A TW 201226885A
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TW
Taiwan
Prior art keywords
workpiece
mold
inspection
optical
detecting
Prior art date
Application number
TW100120490A
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Chinese (zh)
Inventor
yong-kun Lin
Original Assignee
Golden Gate Chemical Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Golden Gate Chemical Co Ltd filed Critical Golden Gate Chemical Co Ltd
Priority to TW100120490A priority Critical patent/TW201226885A/en
Publication of TW201226885A publication Critical patent/TW201226885A/en

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  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)

Abstract

The invention is a workpiece inspection structure, which includes an inspection layer having a release agent body on which a plurality of optical inspection units are uniformly suspended. The optical inspection units are substances capable of emitting molecular cold light. The workpiece inspection structure is integrated with a surface of the pressed structure of a mold which is further filled with the material to form a workpiece. The molded workpiece is released from the mold, then the workpiece inspection structure is transferred to the surface of said workpiece, and the workpiece inspection structure is removed by using various processing methods. Then the optical equipment is used for inspecting the surface of said workpiece to determine whether the workpiece inspection structure is still left over and at the same time further determining the residual amount of the workpiece inspection structure, so as to decide whether an operation processing is necessary or choosing different operation processing method and the length of processing time, such that the workpiece defect and damage resulted from excessive processing can be effectively avoided.

Description

201226885 六、發明說明: 【發明所屬之技術領域】 本發明係指一種工件檢測結構,尤指一種用以檢測工 件表面疋否有離型劑殘留的檢測結構。 【先前技術】 在工業中,以模具壓鑄、擠製成型的工件繁多,舉凡 從金屬㈣至塑料,甚至利用IU乍方式不同所產生的各種 工件,其中以模具擠製成型的工件,最常發生問題的步驟 就是將成型的工件自模具上脫模&下的過程。 馮’肊夠順利的將成型的工件自模具中脫除,會於才 具表面塗佈一層離型劑,再注入壓製材料於模具中以形力 製作工件,以件成型後,藉由該離型劑自該模具中月 出’該離型劑會轉移到該工件201226885 VI. Description of the Invention: [Technical Field] The present invention relates to a workpiece detecting structure, and more particularly to a detecting structure for detecting the presence or absence of a release agent residue on a workpiece surface. [Prior Art] In the industry, there are many kinds of workpieces that are die-cast and extruded into molds, from metal (4) to plastics, and even to various workpieces produced by different methods of IU乍, among which the workpieces extruded by the mold are the most The often problematic step is the process of demolding the formed workpiece from the mold. Feng's smoothly removed the formed workpiece from the mold, and then applied a layer of release agent to the surface, and then injected the pressed material into the mold to form the workpiece by force. After the part was formed, the release type was formed. The agent is ejected from the mold. 'The release agent will transfer to the workpiece.

十耵表面,此時便需利用機I 研磨或是以溶劑清洗續1彳生| ^ .土、 月先紅件表面以去除離型劑,然而過g 的 >月洗或是研磨加工處理的過程, r- -ϋ- s - 易k成工件表面的瑪 疵甚至相壞,但未經完善去除 口 ^ , 雕至劑的工件亦不可作為一 W λ良好可販售的產品。 裝置可確認工件表面 貫需一有效的解決方 目前沒有一有效且簡便的結構或 是否有無離型劑的殘留,有鑑於此, 案以克服前述問題。 - 【發明内容】 本發明人有鑑於目前工業上沒 — 測工件表面是否有無離型劑的殘留的彳 發明的工件檢測結構,可解決前述問題為本 =:由; 201226885 本發明係提供-種工件檢測結構,其為一檢測層該 檢測層為—均句結合有複數個光學檢測單Tt的離型劑本 體,该光學檢測單元為可放出分子冷光的物質。 較佳的,該光學檢測單元為可放出螢光(F丨u〇rescenc 的物質。 本發明亦提供一種具有如前述的工件檢測結構的模 具,其中: 、 該模具,其具有一壓製結構,壓製結構形成有—表面; 該工件檢測結構,其結合於該模具之壓製結構的表面。 本發明亦提供一種具有如前述的工件檢測結構的工 件’其中該工件表面結合有該工件檢測結構。 藉由本發明所提供的工件檢測結構,可達到下述的優 點及功效: 本發明之工件檢測結構,可經由簡便的光學儀器檢測該 工件表面是否有部分的離型劑本體中之光學檢測單元的殘 留,藉以測定是否殘留有檢測層中的離型劑,同時可進一步 地由檢測結果判讀離型劑的殘留量,以決定是否需要進行去 除離型劑的加工處理或是加工處理的方法以及時間長短,可 有效地避免過度加工造成的工件瑕疵與損壞。 【實施方式】 本發明係有關於一種工件檢測結構,請參見圖2所示, 其為一檢測層20 ’該檢測層20包含一離型劑本體以及複數 個光學檢測單元30,該離型劑本體包含石蠟成分或梦膠成 分,該離型劑本體中均勻懸浮有該等光學檢測單元3〇,該 4 201226885 光學檢測單元30為可放出分子冷光(Luminescence)的物 質,所述的分子冷光可為:螢光(Fluorescence)、鱗光 (Phosphorescence)、化學發光或生物發光等,於本發明之 一較佳的實施例中,該光學檢測單元30為寸放出螢光之物 質。 請參見圖1至圖5所示,本發明之工件檢測結構之實 施方式如下所述:取一模具1 〇 (如圖1所示),於該模具’ 〇 之壓製結構1 〇 1表面塗佈一檢測層20,該檢測層20中均 勻懸浮有複數個光學檢測單元30 (如圖2所示),將欲壓製 的複合材料注入該模具1 〇中,模壓成型一工件4〇 (如圖3 所示)’藉由該檢測層20將該工件40自該模具1 〇上脫除, 該檢測層20會轉移附著於該工件4〇的表面(如圖4所示), 以喷砂、水磨或溶劑清洗等方式將該檢測層2〇自該工件4〇 表面去除,經過適t的加工處理後,進行檢測該工件4〇表 面是否有該檢測層20的殘留,以避免過度加工處理而造成 該工件40損壞’即可得到一去除該檢測層2〇的工件4〇 (如 圖5所示)。 製備成一待測的未知 檢測《玄工件40表面是否有檢測層2〇殘留的方式如下 所述I j工件40表面的殘留物質以適當溶劑溶離下來, 液’利用分子分光光譜儀偵測該光 學檢測單元30所放出沾组 出的螢光波長,該光學檢測單元30在 穩定基態(S 0)中,吸收姓* α特疋頻率的光能量後,會躍遷至激發 態振動能階的單重態(S1、ς — 、 S2)或是二重態(Τ1、Τ2),由於 激發態的能階並不穩定,m · a ,π k疋’因此會遷回到最低能階的基態, 201226885 產生波長一定的螢光,若 檢剛結果可測得該光學檢測單元 3。所放出的營光,表示該工件4。表面仍有該檢測層、]二 殘留,因此仍需進行去除該檢測層20的加工處理,進 一步地測量該光.學檢測單亓 ^ 延 主- 3〇的疋量分析,可判斷該工件 40表面殘留的檢測層2〇容宣 1 —、+ 夕暴,以決定加工處理的時間長短 或方法,若檢測結果並無測得-罄f x光予檢測早兀30所放出的 螢光,表不該工件4 〇表而& #认 表面無该檢測層2〇的殘留, 再進行去除該檢測層2〇的加I 則‘、,、而 ^ , 刃加工處理,經由前述簡易有效的 檢測方式,即可避免因過度的 度的加工處理而造成該工件40的 才貝壞與瑕疵ι。 以上所述僅是本發明之較佳’ 权佳霄施例,並非對本發明作 任何形式上的限制,雖然本發 u + 土月已以較佳貫施例揭露如 ,:,、、、而並非用以限定本發明,任 島 仕17热悉本專業之技術人 貝,在不脫離本發明之技術方案 卞J靶固内,當可利用上述 询不的技術内容作些許更動赤 干吏動或修飾為等同變化的等效實施 枯’但凡是未脫離本發明之技術方#内容,依據本發明的 術實質對以上實施例作的任何簡單修改、等同變化盥修 飾,均仍屬於本發明技術方案的範圍内。 【圖式簡單說明】 圖1為一未結合本發明的模具的侧視剖面圖。 圖2為一結合本發明的模具的側視剖面圖。 圖3為一結合本發明的模具注入複合材料模 工件的側視剖面圖。 、 圖4為一表面結合有本發明的工件的側視剖面圖。 6 201226885 4 圖5為表面去除本發明的工件的側視剖面圖。 【主要元件符號說明】 10模具 101壓製結構 20檢測層 30光學檢測單元 40工件The surface of the Ten Commandments, at this time, it is necessary to use the machine I to grind or to clean with a solvent. The surface of the red part is removed to remove the release agent, but the g is washed or polished. The process, r- -ϋ- s - easy to k into the surface of the workpiece is even worse, but the workpiece has not been perfected to remove the ^, the workpiece can not be used as a W λ good saleable products. The device can confirm that the surface of the workpiece requires an effective solution. There is currently no effective and simple structure or the presence or absence of release agent. In view of this, the above problems are overcome. - SUMMARY OF THE INVENTION The present inventors have solved the aforementioned problems by considering the workpiece detecting structure of the invention in the absence of the release of the release agent on the surface of the workpiece. The workpiece detecting structure is a detecting layer. The detecting layer is a stripping agent body which is combined with a plurality of optical detecting single Tt, and the optical detecting unit is a substance capable of releasing molecular cold light. Preferably, the optical detecting unit is a substance capable of emitting fluorescent light (F丨u〇rescenc. The present invention also provides a mold having the workpiece detecting structure as described above, wherein: the mold has a pressing structure and is pressed The structure is formed with a surface; the workpiece detecting structure is bonded to the surface of the pressed structure of the mold. The present invention also provides a workpiece having a workpiece detecting structure as described above, wherein the workpiece surface is bonded with the workpiece detecting structure. The workpiece detecting structure provided by the invention can achieve the following advantages and effects: The workpiece detecting structure of the invention can detect whether there is a part of the residual of the optical detecting unit in the release agent body through a simple optical instrument. In order to determine whether the release agent in the detection layer remains, and at the same time, the residual amount of the release agent can be further judged from the detection result to determine whether it is necessary to carry out the processing or processing method for removing the release agent and the length of time. The workpiece flaw and damage caused by over-machining can be effectively avoided. The present invention relates to a workpiece detecting structure, as shown in FIG. 2, which is a detecting layer 20'. The detecting layer 20 comprises a release agent body and a plurality of optical detecting units 30, the release agent body comprising a paraffin component or The optical component is uniformly suspended in the body of the release agent. The optical detection unit 30 is a substance capable of emitting molecular luminescence, and the luminescence of the molecule may be: fluorescent ( Fluorescence, phosphorescence or bioluminescence, etc. In a preferred embodiment of the invention, the optical detection unit 30 is a substance that emits fluorescent light. See Figures 1 to 5 The embodiment of the workpiece detecting structure of the present invention is as follows: take a mold 1 〇 (as shown in FIG. 1 ), and apply a detecting layer 20 on the surface of the pressed structure 1 〇 1 of the mold, the detecting layer 20 A plurality of optical detecting units 30 are uniformly suspended (as shown in FIG. 2), and the composite material to be pressed is injected into the mold 1 and molded into a workpiece 4 (as shown in FIG. 3). 20 will The workpiece 40 is removed from the mold 1 , and the detection layer 20 is transferred to the surface of the workpiece 4 (as shown in FIG. 4 ), and the detection layer 2 is immersed in sandblasting, water milling or solvent cleaning. The surface of the workpiece 4 is removed, and after a suitable processing, the surface of the workpiece 4 is detected to have any residual of the detection layer 20 to avoid damage caused by excessive processing to cause the workpiece 40 to be damaged. The workpiece 2〇 of the layer 2〇 (as shown in Fig. 5) is prepared as an unknown detection to be tested. “There is no detection layer 2〇 on the surface of the black workpiece 40. The following is a description of the residual material on the surface of the workpiece 40 with the appropriate solvent. After being dissolved, the liquid 'detects the wavelength of the fluorescent light emitted by the optical detecting unit 30 by using a molecular spectroscopic spectrometer, and the optical detecting unit 30 absorbs the light energy of the frequency of the last name * α in the stable ground state (S 0). After that, it will transition to the singlet state (S1, ς - , S2) or the doublet state (Τ1, Τ2) of the excited state vibration energy level. Since the energy level of the excited state is unstable, m · a , π k疋 ' Will move back to the ground state of the lowest energy level, 201226885 A certain wavelength of fluorescence is generated, and the optical detecting unit 3 can be measured if the result is detected. The camp light emitted indicates the workpiece 4. The surface still has the detection layer, and the two are still left. Therefore, the processing for removing the detection layer 20 is still required, and the measurement of the light quantity of the light detection and detection unit is further measured, and the workpiece 40 can be judged. The surface residual detection layer 2 is declared to be 1 -, + eve, to determine the length of time or method of processing, if the test results are not measured - 罄fx light to detect the fluorescence released by 30 The workpiece 4 is on the surface and the surface of the inspection layer is free of the detection layer 2〇, and the addition of the detection layer 2〇 is performed, and then the edge processing is performed, and the simple and effective detection method is performed. In order to avoid the damage of the workpiece 40 due to excessive processing. The above description is only a preferred embodiment of the present invention, and is not intended to limit the present invention in any way, although the present invention has been disclosed by a preferred embodiment such as:,,, and It is not intended to limit the present invention, and any of the technical personnel of the company can be used in the technical solution of the present invention, and the technical content of the above-mentioned inquiry can be used to make some changes. Equivalent implementations that are modified to equivalent changes, but any simple modifications, equivalent changes, modifications to the above embodiments in accordance with the teachings of the present invention are still within the skill of the present invention. Within the scope of the program. BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a side cross-sectional view of a mold not incorporating the present invention. Figure 2 is a side cross-sectional view of a mold incorporating the present invention. Figure 3 is a side cross-sectional view of a mold injecting a composite mold in accordance with the present invention. 4 is a side cross-sectional view of a surface incorporating a workpiece of the present invention. 6 201226885 4 Figure 5 is a side cross-sectional view of the surface from which the workpiece of the present invention is removed. [Main component symbol description] 10 mold 101 pressed structure 20 detection layer 30 optical detection unit 40 workpiece

S 7S 7

Claims (1)

201226885 七、申請專利範圍: 1. 一種工件檢測結構,其為一檢測層,該檢測層為一均 勻結合有複數個光學檢測單元的離型劑本體,其中該光學 檢測單元為可放出分子冷光的物質。 1·如中請專利範圍第1項所述之工件檢測㈣,該光學 檢測單元為可放出螢光的物質。 3·-種具有卫件檢測、结構的模具,其包括—模具,其具 有一壓製結構,該壓製結構 專利範圍第…項所面;以及一如申請 構#所相m丨結構,以件檢測結 口於δ亥模具之壓製結構的表面。 範圍第1或2項所牛::結構的工件’其包括-如申請專利 檢測結構結合^^檢縣構以及—工件,該工件 八、圖式·(如次頁) 8201226885 VII. Patent application scope: 1. A workpiece detecting structure, which is a detecting layer, wherein the detecting layer is a release agent body uniformly combined with a plurality of optical detecting units, wherein the optical detecting unit is capable of emitting molecular cold light. substance. 1. The workpiece inspection (4) as described in item 1 of the patent scope, wherein the optical detection unit is a substance that emits fluorescence. 3·- a mold having a guard detection and structure, comprising: a mold having a pressed structure, the pressed structure is in the scope of the patent item; and the same as the application structure The surface of the pressed structure of the δHai mold. The scope of the first or second item of the cow:: the structure of the workpiece 'includes - such as the patent application detection structure combined ^ ^ inspection county structure and - workpiece, the workpiece eight, schema · (such as the next page) 8
TW100120490A 2010-12-31 2010-12-31 Workpiece inspection structure TW201226885A (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111709921A (en) * 2020-06-02 2020-09-25 Oppo(重庆)智能科技有限公司 Detection method, detection device, electronic device and computer readable storage medium

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN111709921A (en) * 2020-06-02 2020-09-25 Oppo(重庆)智能科技有限公司 Detection method, detection device, electronic device and computer readable storage medium
CN111709921B (en) * 2020-06-02 2022-11-15 Oppo(重庆)智能科技有限公司 Detection method, detection device, electronic device and computer readable storage medium

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