TW201219803A - employing cooperation of host computer with four slave computers to enhance working efficiency and simplify processing procedures - Google Patents

Abstract

The present invention relates to a multi-functional convertible module testing apparatus, which may simultaneously test a plurality of objects to be tested, in which several objects to be tested are assigned as a first group, a second group, a third group and a fourth group. The multi-functional convertible module testing apparatus includes: a loading plate having a first sector, a second sector, a third sector and a fourth sector of receiving groups; a workstation having a first work zone, a second work zone, a third work zone, and a fourth work zone; a first, a second, a third and a fourth slave computers, and a host computer. The first, second, third and fourth slave computers control the first, the second, the third and the fourth work zones for the testing operations of the first, the second, the third and the fourth receiving groups located within the first, the second, the third and the fourth sectors respectively. At the same time, the first, the second, the third and the fourth slave computers receive the testing results completed for the first, the second, the third and the fourth work zones, and transmit to the host computer for data integration.

Description

201219803 VI. Description of the Invention: [Technical Field of the Invention] The present invention mainly discloses a multi-function convertible module testing device, and more particularly to a multi-functional convertible module testing device for integrating several servants by a host computer. . [Prior Art] The object to be tested is used in electronic products, and is commonly used in computers, cell phones, and digital cameras... and the like. The last step of the test object production process is to test the internal circuit of the test object by the test device, and further distinguish between good and bad products. Mai Zhao China Patent Certificate No. M331746 "Semiconductor Test Equipment", which comprises a test stand 'a fixed seat, a drive unit, a test unit and a display unit. The test unit comprises five H-type cards mounted in the detection seat, a transfer device connected to the telescopic rod and located relatively close to the detection area, and a test substrate connected to the moving part, wherein the test substrate There are a plurality of test cartridges respectively electrically connected to the test card, and the mother-test card can be processed by the test cartridge to determine whether each wafer is good or bad. , the chip is tested 'when five computers, and

The computer is easy to load because the load is too large, and the test card's five test cards will be connected to the computer - (4) all the m cards are applied to all the chips into the test card, and the test card is the same as 201219803 y «ζ or can not be provided immediately The test results, of course, the brain can not carry out the extra dragon integration of the king. ,

Furthermore, the display unit is disposed on the detecting base and is exposed to the test stand page unit 疋 electrically connected to each test 之 of the test substrate, and is used for displaying the “competition result corresponding to the waiting”. The display 70 includes a progress indicator for displaying the progress of the wafer test, a display of the wafer test time _ time indication it, and - correspondingly displaying the test disk = the test result is good or bad _ test indicator. The test indicator has = several indicators corresponding to the quality of the wafer test, if, 丨, , ·. If the party is good, the party green light, the wafer test results have problems, the red light test 4 personnel must take For the test, (5) use the visual comparison

:Slightly _ corresponding to the wafer on the disk to be tested, and then pick out the test. The white and the cymbal' read the comparison method, because of the mistake of the staff, the mistake of the chip, the missing chip is missing. The tester needs to repeat the action of = and bowing, and it is easy to produce fatigue. This kind of test method is easy to fatigue and cannot be correctly and correctly compared. When comparing errors, the test will be all mixed. So how good products meet the fast requirements at the same time, for the test device. A very important part of it. Therefore, the inventor hopes to be able to solve the above problems. [Summary of the Invention]

The lack of desire: ΐ: The technical problem lies in the multi-functional convertible module test device for the prior art. 201219803 > The main technical improvement of the present invention is that the main computer can integrate the first, second, third and fourth servant computers, and the first, second, third &third; fourth The servant computer controls the workstation to perform the inspection work, and the main computer is responsible for the cooperation of the division of the king to improve work efficiency and inter-operate procedures to achieve semi-automatic functions. And the main computer stores the results of the jins to be lining. This centralized storage method can effectively improve the statistics and analysis of the yield, which is more conducive to subsequent tracking. The technical means for the secondary improvement of the present invention is that the test result obtained by the main computer is displayed on the material screen, and the silk screen of the money screen (4) is placed for the carrier disk body. The result is displayed on the screen of the main computer. The block 'the curtain' (4) shows the way in which the light is on the job block and transmits light to the carrier body, and informs the inspector of the purpose, and further enables the inspector to judge that the carrier is located by the light of the member. The other objects, advantages, and novel features of the present invention will be more apparent from the following detailed description and the accompanying drawings. [Embodiment] The techniques, means, and effects of the present invention are described in detail with reference to the accompanying drawings, which are for illustrative purposes only. The application is not limited by the structure. Seeking Profits Referring to Figures -, Figure 2 and Figure 3, the block diagram and the predator of the multi-function convertible (4) test device of the present invention. The multi-function module test device of the present invention can simultaneously test a plurality of objects to be tested to be tested = 201219803. Have 1 ^ card, chip card or integrated circuit ( _ ) card number of objects to be tested! It is assigned as a group of first group Μ, a group of groups, and |Β group second group 1C and a group of fourth group ids. The multi-function convertible module testing device of the invention comprises a disk body I, a workstation 20, a first flapping computer 31, a jjf computer 32, a third servant computer 33, a fourth servant computer 34 spot. A host computer 40. The first, second, third and fourth servant computers],

First, 4 are electrically connected to the station 2 (), by the first, second, and

The test J ST"1 3 32, 33, 34 controls the workstation 20 to perform the test, the second, the third and the fourth servant (four), and the I receive the test result of the second station back to the station 2Q, The main computer 40 is connected to the second, the second, the third and the fourth servant computer 31, 32, 33, 34, and the second data integration. The main computer 4q can integrate the first, third, and fourth servants 31, 32, 33, and 34, and control the work by the first station and the fourth servant computer, and 32, 33, and 34. Ting Yusong test work, and the main computer 4〇

Sr's way to improve work efficiency and simple two: Result, = medium:; The main computer 40 stores all the test objects 1 test analysis, the storage method can be effective and the yield statistics and analysis is more conducive to the subsequent chase vertical. The number of groups to which the number of objects to be tested 1 is assigned depends on the number of multi-function variable ancient and other mm computers. In this embodiment, the group has four levels, and the servant computer has four units. Referring to FIG. 4 at the same time, a schematic diagram of the carrier body of the present invention for bearing the object to be tested is shown in 201219803. The accommodating portion 10 is provided with a plurality of accommodating portions 100, and each of the accommodating portions 100 is capable of accommodating a sample to be tested 1. The number of the accommodating portions 10 is equal to the number of the objects to be tested, and the number of the accommodating portions 100 is equal to a multiple of the total number of groups of the group, and the number of the accommodating portions 100 is also equivalent to the servant computer. The multiple of the total number. In this embodiment, the accommodating portion 1 of the carrier body 1 is allocated as a group of first area accommodating group 11, a group of second area accommodating group 12, and a group of second area accommodating group 13 and A set of fourth zones accommodates groups 14. The first, second,

The number of the second and fourth housing groups 11, 12, 13, 14 are all equal. The number of groups of the accommodating group is equivalent to the number of groups of the group, and the number of groups of the accommodating group is also equal to the number of the servants. The workstation 20 includes a first work area 21, a second work area 22 second work areas 23, and a fourth work area 24. The first, second, third, and fourth working areas 2, 22, 23, and 24 can perform the detecting operation on the object to be tested 1, and the first, second, third, and fourth working areas, 22 The inspection work performed by 23, 24 is the same. When the object to be tested 1 is placed in the accommodating portion 1 of the carrier body 1 , the first group 1A is located in the first group accommodating group j * The group 12 is located, and the third group lc is located in the third area accommodating group 3, and the fourth group id is located in the fourth area accommodating group 14. The carrier tray 10 carrying the object to be tested 1 is sent to the workstation 20, the first-region housing group 11 corresponds to the first-working area 21, and the i-th computer 31 controls the first working area 2! The first-area ia carries the detection work of the first-zone ia, and the first servant computer 31 receives the detection result of the first work area 21. 201219803 _ The second zone accommodating group 12 corresponds to the second work area 22, and the second servant computer 32 controls the second work area 22 to perform the second group 1B located in the second zone accommodating group 12. The detection work is performed, and the second servant computer 32 receives the test result completed by the second work area 22. The third zone accommodating group 13 corresponds to the third work area 23, and the third servant computer 33 controls the third work area 23 to perform detection work on the third group 1C located in the third zone accommodating group 13. At the same time, the third servant computer 33 receives the detection result completed by the third working area 23. • The fourth zone accommodating group 14 corresponds to the fourth work area 24, and the fourth servant computer 34 controls the fourth work area 24 to perform detection on the fourth group 1D located in the fourth zone accommodating group 14. At the same time, the fourth servant computer 34 receives the detection result of the fourth work area 24. The first, second, third, and fourth servants 31, 32, 33, 34 transmit the detection result of the workstation 20 to the host computer 40, and the host computer 40 is connected to a hub 41. The second, third, and fourth servants 31, 32, 33, 34 are connected to the host computer 40 by the hub 41. The host computer 40, the first, second, third, and fourth servants The computers 31, 32, 33, 34 are respectively connected to the hub 41, and the host computer 40 integrates the received data. Referring also to FIG. 5, it is a block diagram of a host computer, a plurality of servants, and a switcher of the present invention. The main computer 40 is connected to a screen 42 and an input device 43. The screen 42 and the input device 43 are simultaneously available to the host computer 40, the first, second, third or fourth servant computers 31, 32, 33, 34 manipulation. The main computer 40 is further provided with a switch 44. The main computer 40, 201219803, the first, second, third and fourth servants are disconnected from the switch 44, and the shreds 44, 32, 33, 34 are connected respectively. The immortal of the device 43 is the charm _ 4 (;, = screen 42 and the input fourth servant computer 31, 32, 33, 34. The younger brother, the second, the second or the same reference to Figure 6 and Figure 7, the current 窜: 31, 32, 33, 34 will test the object 1 :

The test result obtained by === is displayed on the surface of the second: the screen 42. The surface of the carrier disk body 10 can transmit light. The screen 42 can be 4 " size of the face, and the (4) 42_^m mesh_ the plurality of blocks 42 of the carrier body 10, the honor screen 42 = the same + the same as the housing 100 M a main The computer 4G integrated test j is displayed in the block 421, and the screen 42 is used to notify the inspecting person by means of displaying the bright light in the block 421 and transmitting light to the carrying body 1〇. The object to be tested i located on the carrier body ίο by the light displayed in the block 421 is a good or defective product. The surface of the screen 42 is parallel to the horizontal plane, so that the carrier disk 1 on the outer surface of the lining 42 is not automatically displaced. The test object 1 directly corresponds to the block 42 and allows the inspector to directly take out the test object 1 of the defective product, and provides the tester with a test device for easily detecting the test object 1 of the defective product, and The tester takes time to compare the test result on the screen with the test object and the test object 1 , and the tester can quickly take out the test object of the defective product directly and the present invention can simultaneously provide the workstation 20 The test object is tested U] 9 201219803 work 'and the screen 4 2 provides display so that the tester judges that the test object is a good product. In particular, the present invention can be summarized as follows: μ L The present invention "multi-function convertible module test device", with the main computer, the first, second, third and fourth The servant computer, and (4) the first, second, and fourth servants control the workstation for testing, and are responsible for data integration, and the division of labor and cooperation to improve the industrialization procedures to achieve semi-automatic functions. The transfer of the main computer results in the remaining test results of the object to be tested. This centralized storage method can have statistics and analysis of the rate of progress, which is more conducive to subsequent tracking. ^ "Multi-function convertible module" device of the present invention, the main computer will display the result of the = on the screen, and the surface of the (four) screen can be used for the integration of the main computer and the display of the main computer. 4 blocks ' _ curtains use the display light to the light in the block (4) to the body of the disk to reach the purpose of informing the inspectors, to make the test to determine the brightness of the test - the body on the waiting, only the above, The present invention is intended to be limited only by the scope of the invention, and the scope of the invention is to be construed as a limitation.丈^ " Schematic description] Figure • Block diagram of the multi-function convertible module test device of the present invention 201219803 Figure 2: The stereoscopic appearance of the multi-function convertible module test device of the present invention. Fig. 3 is a perspective view of the perspective of a multi-functional switchable module test device of the present invention. Figure 4 is a schematic view of the carrier body carrying the object to be tested according to the present invention. Figure 5: Block diagram of the main computer, several servant computers and switchers of the present invention. Figure 6 is a schematic view showing the test object of the present invention placed on the screen to detect the object to be tested. Figure 7: shows the good and bad products for the bright display of the screen of the present invention. [Description of main component symbols] 1 DUT 1A First group 1B Second group 1C Third group 1D Fourth group 10 Carrier disk 100 accommodating part 11 First area accommodating group 12 Second area Set group 13 Third area accommodating group 14 Fourth area accommodating group 20 Workstation 21 First working area 22 Second working area 23 Third working area 24 Fourth working area 31 First servant computer 32 Second servant computer 33 Three servant computer 34 fourth servant computer 40 main computer 41 hub 42 screen 421 block 43 input device 44 switch

Claims (1)

201219803 VII. Patent application scope: Multi-": Module test device, which can test two phases at the same time, and several objects to be tested are assigned as the first group and the third group. , , , ' and include: ° Hai Xigong 旎 convertible module test device is enough for i = disk body, which includes several accommodating parts, each of the accommodating (four) group 丄:: one thing 'the capacity The set is allocated as a group-area-receiving group second-region accommodating group and a group of third-region accommodating one workstation, which includes a first working area, two second working areas and a third working Zone, the first and second __ 乍 the object to be tested for detection work; "two work areas can be used for the σ 扑 电脑 computer and ί 丨丨 丨丨 - 区 区 区 区 罟 @ @ @ @ @ @ @ @ @ @ @ @ @ @ @ The first group in the valley group performs the detection work; - the computer, which controls the second work area to perform the detection work for the second group located in the valley group of the first area; - π I station third servant a computer that controls the third work area to perform detection work on a third group located in the second zone valley group; The brain receives the test results of the first, second, and third servants and integrates the data. The multi-function convertible module test device of claim 1, wherein the number of the accommodating portions is equal to The number of objects to be tested, the number of groups of the receiving group is the same as. The number of groups in the group of the group 'the number of groups of the group is also equivalent to the number of the computer. 3. The multi-function convertible module testing device according to claim 1, wherein the m 12 201219803 == is connected to a hub, and the first, second and third shame and the host computer are connected by the hub. 1. In the electric power, the 4 main 3 force energy changeable module test device 'the device f❻, the first, second and third servant computers are respectively connected to the assembly line 5. As described in claim 3, the main The computer connection secret exchange module test device 'its-, second and third servant computer control. The system of multi-function convertible module described in item 5 of Zhongdi Qingzhong, the main computer is connected to an input device, and the first, second or third servant computer is operated. 7. The multi-function transformable module _2 according to claim 6, wherein the main computer is further provided with a switch, the main computer, the first, the first: the switch is connected, the switch can switch the switch The user of the i-screen and the _ human device is the main computer, and the three servant computer.弟一或弟δ. The multi-function convertible module testing device according to claim 5, the test result obtained by the main computer is displayed on the screen, and the screen is sufficient for the carrier disk to be placed. The carrying tray body is capable of transmitting light, and the camping member is the same as the top surface of the carrying tray body, and has a plurality of blocks identical to the receiving portion, and the screen displays the test result of the main computer:杲 显示 显示 杲 杲 杲 杲 杲 杲 杲 显示 显示 显示 显示 显示 显示 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , It is judged that the phase on the carrier [SI 13 201219803 carrier is a good or defective product. ' Medium 1 = 4 The multi-function transformable die-test device described in Item 8, the outer surface of the screen is parallel to the horizontal plane, so that the carrier disk placed on the surface of the bezel is not automatically displaced. The lion test device is waiting in the table, #=): There are four groups of the group, the multi-function convertible module test package includes a fourth servant computer, and the carrier disk body is further equipped with - The grouping group further includes a fourth working area, the fourth area J group corresponding to the fourth working area, and the fourth servant computer controls the fourth working area to be located in the fourth area accommodating group The fourth group performs the detecting work, and the fourth servant computer receives the test result completed by the fourth working area and transmits the test result to the host computer.