201219796 六、發明說明： L發明所 〜议婀領域】 具’更詳而言之，係關於 測待測電路板之晶振頻率 一本發明係有關於-種測試、z -種利：氣壓方式控制探針以: 的頻率量測敦置。 $ 【先前技術】 如電腦裴置、網路 〜 品量產或出貨前，1 5豕電裝置等之電子產品在產 測，藉此作為該電路板/電子產品之電路板進行檢 品之品質。 故障之判定，以保證商品化產 常見的電路板檢測作鳘a (例如計頻ns示波n) ϋ透過將^號引人測試治具 頻率或波形_取。電路板的量義進行信號 選取量測點以進行信號_取，檢測時需要用測試探針 _ , , 而所述的量測點往往是在雷 路㈣面的級引腳形成量測銲點，所以需要將 面以利於在其背面元件引腳上 反翻 π上鲜接篁測銲點，在 測銲點後，於該量測銲點或该置 ^ 0 ^ 連接計頻器或示波器之測試探 針’即可開始對該電路板進行檢測。 探 而前述量測銲點的銲接作業既相當麻煩外，在欲 的電路板數量多時，更得重複地執行此銲接作業，故造成 時間以及人力成本的増加。 此外，由於僅是將該量 試探針連接，故若不小心翻 可能因拉扯到與探針連接的 測銲點與計頻器或示波器之測 轉了檢測中的電路板，則極有 量剩銲點，而使該量測銲點與 111810 4 201219796 .該電路板的元件弓i卿分離 行銲接作業。 得不再次地進201219796 VI. Description of the invention: L invention office ~ discussion field] With more details, it is about measuring the crystal frequency of the circuit board to be tested. The invention is related to - kind of test, z - kind of profit: pneumatic mode control The probe is measured at the frequency of : . $ [Prior Art] If the computer is installed, the network is in mass production or shipped, the electronic products such as the 15 豕 electrical device are in production and test, and thus the board of the circuit board/electronic product is inspected. quality. The fault is judged to ensure that the common board test is performed as a 鳘a (for example, the frequency ns oscilloscope n) 引 by introducing the ^ number to the test fixture frequency or waveform _. The quantity of the circuit board is used to select the measurement point for the signal to be taken. The test probe _ is required for the detection, and the measurement point is often formed at the level of the lightning (four) surface. Therefore, it is necessary to face the surface of the component on the back of the component, and then connect the solder joint to the solder joint or the oscilloscope. Test the probe 'to start testing the board. The welding operation of the above-mentioned measuring solder joints is quite troublesome. When the number of boards to be used is large, the welding operation is repeatedly performed, resulting in an increase in time and labor costs. In addition, since the test probe is only connected, if it is accidentally turned over, it may be pulled by the solder joint connected to the probe and the frequency converter or the oscilloscope to measure the circuit board under test. Remaining solder joints, while making the solder joints with 111810 4 201219796. The board's components are separated from the welding line. Have to go again
U 另外在針對信號頻率檢 斷性地接觸電路板的量測點以進 要複數探針間 頻率檢測作業，不必如前述:::銲=信號 點，乃直接手持探棒將 反上知接该量測銲 行信號擷取，然，以手掊一路板的待測點接觸以進 板背面而不易於控制探針;常因測試點在電路 出現誤判等。 待測點’也比較容易 【發明内容】 雲於上述習知技術之缺點，本發明之 種頻率量測裝置，以解決 χ 的在於提一 ,H ,, ^ 知技術中量測待測電路板日f目 人工作業而易浪費工時以及造成誤判等問題。板手因 ㈣及其他相關目的，本發明提供-種頻率 置，以對待測電路板之複數待咖進行晶裝 業，該頻率量測裝置包括：载板，用 、量騎 該第=單元開合的第-電子開關單元;二= 探針，該崎__用《接收各該探= 111810 5 I. 201219796 所擷取到的各該待測點之晶振頻率信號以進行量測，並將 量測出的頻率值予以輸出；以及主控模組，電性連接於該 資訊處理裝置以及該頻率量測模組，用以依據該資訊處理 裝置的頻率測試程式控制該氣動模組，以使各該探針分別 接觸該待測電路板中對應的各該待測點，並於收集到該頻 率量測模組輸出之頻率值後將其傳輸至該資訊處理裝置， 以由該頻率測試程式得出該待測點的測試結果。 前述本發明之頻率量測裝置中，其還包括有測試座， 0 該載板係設置於該測試座上，且該測試座具有支撐架，該 支撐架上設有第二氣動單元以及與該第二氣動單元連接的 固定板，該第二氣動單元經由氣路連通該加壓單元，以氣 壓驅動方式使該固定板朝該載板向下移動而下壓夾固承載 於該載板上的該待測電路板及遠離該載板向上移動的其中 之一者。 再者，前述本發明之頻率量測裝置中，其還包括：第 二電子開關單元，用以控制前述第二氣動單元開合，以相 · 應控制前述固定板朝該載板而向下移動以夾固承載於該載 板上的該待測電路板及控制該固定板遠離該載板而向上移 動的其中之一者。 此外，前述本發明之頻率量測裝置中，還包括：第二 控壓單元，其具有第二氣壓錶以及第二調壓旋鈕，該第二 氣壓錶係用以顯示該第二氣動單元内的氣壓，且該第二調 壓旋鈕係用以供微調該加壓單元經由氣路輸入至該第二氣 動單元之氣壓。 6 111810 201219796 還有，前述本發明之頻率量測裝置中，還包括：第一 控壓單元，其具有第一氣壓錶以及第一調壓旋鈕，該第一 氣壓錶係用以顯示該第一氣動單元内的氣壓，且該第一調 壓旋鈕係用以供微調該加壓單元經由氣路輸入至該第一氣 動單元之氣壓。 如上所述，本發明之頻率量測裝置在進行擷取該待測 電路板之各該待測點之晶振頻率的量測作業時，由主控模 I 組與氣動模組聯動，以實現氣壓控制探針來代替人工手持 探棒方式在待測電路板的待測點上進行信號擷取，進而解 決了習知技術中浪費工時以及容易造成誤判等問題；再由 電性連接於如電腦的資訊處理裝置與頻率量測模組的主控 模組將所擷取到之頻率值輸至該資訊處理裝置，以由其所 裝載的該頻率測試程式得出該待測點的測試結果，進而實 現以較少時間對多個待測電路板進行頻率量測的作業，進 而大大提升了工作效率。 • 【實施方式】 以下係藉由特定的實施形態說明本發明之技術内容， 熟悉此技藝之人士可由本說明書所揭示之内容輕易地瞭解 本發明之其他優點與功效。本發明亦可藉由其他不同的具 體實例加以施行或應用，本說明書中的各項細節亦可基於 不同觀點與應用，在不悖離本發明之精神下進行各種修飾 與變更。 請參閲第1圖及第2圖，第1圖係為本發明之頻率量 測裝置之基本架構方塊圖；第2圖係為本發明之頻率量測 7 111810 201219796 裝置之外觀圖。需要特別説明的是，以下圖式均為簡化之 不意圖式’㈣料意方式朗本發明之基本構想，遂圖 式中僅顯示與本發明有關之元件而非按照實際實施時之元 件數目、形狀及尺寸繪製，其實際實施時各元件之型態、 數量及比例可為—種隨意之變更，且其元件佈局型態可能 更為複雜。 u 如圖所示，本發明之頻率量測裝置3係用於連接裝載 有頻率測試程式的資訊處理裝置1，以對待測電路板2之 複數待測點（未圖示）擷取其晶振頻率，該頻率量測裝置 3包括·複數探針31、氣動模組32、頻率量測模組33、主 控模組34、具有載板351以及固定板352之測試座。前 述資訊處理裝置1例如裝載有頻率測試程式的電腦。 該載板351用於承载該待測電路板2，該固定板脱 用以失固於承载於載板351上的待測電路板2，於具體的 實施態樣中，該固定板352朝向該載板351的表面上設置 有複數頂針3520’以在該固定板352下壓而夾固該待測電 路板2時’藉由該複數頂針352〇抵壓該待測電路板2進而 達到更穩定失固待測電路板2的效果。各該探針31設置於 該載板351之底部，該探針31被驅動時，凸出於該載板 351複數測試孔3510，以接觸設置於該載板351上之待測 電路板2背面之待測點（未圖示），進而在各該探針31通 電時可以擷取待測電路板2之複數待測點的晶振頻率信 號。具體而言，各該探針31係活動地設置於於一座體（未 圖示）上，而該座體係收容於該測試座35内，該座體連通 8 111810 201219796 -通氣導管（未圖示），並在該通氣導f内有氣體衝擊該探 針31時’該探針31由座體之頂端探出，進而凸出於該載 板35H則試孔351〇以接觸該待測電路板2背面之待測點， 以進行後續所述之制點晶振頻率域賴取作業。， 該氣動模組32用以驅動各該探針31以接觸該待測電 路板2的各待測點，以及用於驅動該固定板352下壓以夾 固該待測電路板2 ’該氣動模組32包括加壓單元321、第 -氣動W 322、第-電子開關單元323、第二氣動單元 324、第二電子開關單元325、第—控壓單元 二控壓單元327。 ^ 該加壓單元321係例如為空壓機，且可收容於該測試 座35内，或外接於制試座m為該氣動模組32提 供氣源，於具體的實施態樣中，該空M機㈣如第2圖所 示之通氣導管3210的氣路連通該第一氣動單元 二氣動單元324。 Sx 該第一氣動單元322經由氣路（例如通氣導管32⑻ 連通該加壓單元321並驅動各該探針31伸縮於該載板 351 ’而該第一氣動單元322係收容於該測試座35=，該 第一氣動單元322例如為氣動閥，其在開啟時導通r 該加壓單元321提供之氣壓驅動各該探針31探出，^利用 於該載板3 51測試孔3 510，而在氣動閥關閉時將今 收回，以埋入該載板351測試孔3510内。 衣 31 該第一電子開關單元323用以控制該第一氣動 322開啟及閉合，該第一電子開關單元323係收容於 111810 9 201219796 試座35内，藉此控制該探針31凸出於該載板351之測試 孔3510 ’或埋入該載板351之測試孔351〇中，亦即該第 —電子開關單元323經由氣路連通該加壓單元321以驅動 各該探針31伸縮於該載板351，該第一電子開關單元323 例如為繼電器。 該第一控壓單元326用以控制該加壓單元321經由氣 路輸入至該第一氣動單元322的氣壓，以防止氣壓過大使 探針31凸出於該載板351之測試孔3510的力道過大而傷 及待測電路板2。以第2圖為例，該第一控壓單元326具 有一第一氣壓錶3260和第一調壓旋鈕3261，該第一氣壓 錶3260和第一調壓旋钮3261係可設置於該測試座35上， 藉由該第一氣壓錶3260所顯示的氣壓值以供測試人員瞭 解探針31凸出於該載板351之測試孔3510的驅動壓力， 且測試人員可透過該第二調壓旋鈕3261微調該加壓單元 321經由氣路輸入至該第一氣動單元322的氣壓。 該第二氣動單元324經由氣路連通該加壓單元321並 φ 驅動s亥固疋板3 5 2朝者该載板3 51向下移動，以下壓夾固 該待測電路板2 ;以第2圖為例，該第二氣動單元324例 如為汽缸’且该第一氣動單元324透過支樓架350設於該 測試座3 5上’其在通氣時提供吸氣或排氣作用，以使氣壓 桿3500因排氣作用而帶動該固定板352朝著該載板351 向下移動，或使該氣壓桿3500因吸氣作用而帶動該固定板 352離開該載板351向上移動，且為避免固定板352移動 過程中旋轉而偏離原有位置，同時可使固定板352平順地 111810 10 201219796 隨著氣壓桿3500移動，該固定板352之一侧設有限制孔 3521，且在該支撐架350與載板352間設置有貫穿該限制U In addition, in the detection point of the board for detecting the signal frequency, the frequency detection operation between the multiple probes is required, and it is not necessary to use the following::: welding = signal point, but the hand-held probe directly touches the opposite The measurement of the welding line signal is taken, however, the contact point of the hand board is contacted to enter the back of the board without being easy to control the probe; often the test point is misjudged in the circuit. The point to be tested is also relatively easy. [Invention] The disadvantages of the above-mentioned prior art are that the frequency measuring device of the present invention solves the problem in that the circuit board is measured in the H, ^, It is easy to waste work hours and cause misjudgment, etc. For the purpose of (4) and other related purposes, the present invention provides a frequency setting for performing a crystal loading industry on a plurality of boards to be tested. The frequency measuring device comprises: a carrier board, and the unit is driven by the unit. The first electronic switch unit; the second = probe, the __ receives the crystal frequency signal of each of the points to be measured captured by each of the probes = 111810 5 I. 201219796 for measurement, and The measured frequency value is output; and the main control module is electrically connected to the information processing device and the frequency measurement module for controlling the pneumatic module according to the frequency test program of the information processing device, so that Each of the probes respectively contacts the corresponding one of the to-be-measured points in the circuit board to be tested, and after collecting the frequency value output by the frequency measurement module, transmits the frequency value to the information processing device, so that the frequency test program The test result of the point to be tested is obtained. The frequency measuring device of the present invention further includes a test socket, wherein the carrier is disposed on the test socket, and the test socket has a support frame, and the second pneumatic unit is disposed on the support frame a fixing plate connected to the second pneumatic unit, the second pneumatic unit is connected to the pressing unit via a gas path, and the fixing plate is moved downward toward the carrier plate by pneumatic driving, and is clamped and carried on the carrier plate by pressing down. The circuit board to be tested and one of the upward movements away from the carrier board. Furthermore, in the frequency measuring device of the present invention, the method further includes: a second electronic switch unit configured to control the opening and closing of the second pneumatic unit to control the movement of the fixing plate downward toward the carrier plate And clamping the circuit board to be tested carried on the carrier board and controlling one of the fixing boards to move upward away from the carrier board. In addition, the frequency measuring device of the present invention further includes: a second pressure control unit having a second air pressure gauge and a second pressure regulating knob, wherein the second air pressure gauge is used to display the second pneumatic unit Air pressure, and the second pressure regulating knob is used for fine-tuning the air pressure of the pressing unit to be input to the second pneumatic unit via the air path. 6111810 201219796 Further, the frequency measuring device of the present invention further includes: a first pressure control unit having a first air pressure gauge and a first pressure regulating knob, wherein the first air pressure gauge is configured to display the first The air pressure in the pneumatic unit, and the first pressure regulating knob is used for fine-tuning the air pressure of the pressing unit to be input to the first pneumatic unit via the air passage. As described above, when the frequency measuring device of the present invention performs the measurement operation of capturing the crystal frequency of each of the to-be-measured points of the circuit board to be tested, the main control mode group I is linked with the pneumatic module to realize the air pressure. The control probe replaces the manual hand-held probe method to perform signal extraction on the to-be-measured point of the circuit board to be tested, thereby solving the problem of wasteful working hours and easy misjudgment in the prior art; and then electrically connecting to a computer such as a computer The information processing device and the main control module of the frequency measurement module input the captured frequency value to the information processing device to obtain the test result of the to-be-measured point by the frequency test program loaded by the information processing device. Further, the operation of frequency measurement of a plurality of circuit boards to be tested is performed in a smaller time, thereby greatly improving work efficiency. [Embodiment] The technical contents of the present invention are described below by way of specific embodiments, and those skilled in the art can easily understand other advantages and effects of the present invention from the contents disclosed in the present specification. The present invention may be embodied or applied by other specific embodiments, and various modifications and changes can be made without departing from the spirit and scope of the invention. Please refer to FIG. 1 and FIG. 2, FIG. 1 is a block diagram showing the basic structure of the frequency measuring device of the present invention; and FIG. 2 is an external view of the frequency measuring device of the present invention 7 111810 201219796. It is to be noted that the following drawings are simplified and not intended to be in a simplistic manner. (4) The basic concept of the invention is shown in the drawings. Only the components related to the present invention are shown in the drawings, rather than the number of components in actual implementation. The shape and size are drawn. In the actual implementation, the type, quantity and proportion of each component can be changed at will, and the component layout pattern may be more complicated. u As shown in the figure, the frequency measuring device 3 of the present invention is used for connecting the information processing device 1 loaded with the frequency test program, and takes the crystal frequency of the plurality of points to be tested (not shown) of the circuit board 2 to be tested. The frequency measuring device 3 includes a plurality of probes 31, a pneumatic module 32, a frequency measuring module 33, a main control module 34, and a test socket having a carrier plate 351 and a fixing plate 352. The information processing device 1 described above is, for example, a computer loaded with a frequency test program. The carrier board 351 is configured to carry the circuit board 2 to be tested, and the fixing board is used to be unfixed on the circuit board 2 to be tested carried on the carrier board 351. In a specific implementation manner, the fixing board 352 faces the board. A plurality of ejector pins 3520' are disposed on the surface of the carrier plate 351 to press the circuit board 2 to be tested when the fixing plate 352 is pressed to clamp the circuit board 2 to be tested. The effect of the board 2 to be tested is lost. Each of the probes 31 is disposed at the bottom of the carrier 351. When the probe 31 is driven, it protrudes from the plurality of test holes 3510 of the carrier 351 to contact the back of the circuit board 2 to be tested disposed on the carrier 351. The point to be measured (not shown) can further capture the crystal frequency signal of the plurality of points to be tested of the circuit board 2 to be tested when each of the probes 31 is energized. Specifically, each of the probes 31 is movably disposed on a body (not shown), and the seat system is housed in the test seat 35. The seat is connected to the body. 8 111810 201219796 - Ventilation duct (not shown And when there is gas in the ventilating guide f striking the probe 31, the probe 31 is protruded from the top end of the seat body, and then protrudes from the carrier plate 35H to test the hole 351 〇 to contact the circuit board to be tested. 2 The point to be measured on the back side is used for the subsequent processing of the crystal frequency domain of the dot crystal. The pneumatic module 32 is configured to drive each of the probes 31 to contact the points to be tested of the circuit board 2 to be tested, and to drive the fixing plate 352 to press down to clamp the circuit board 2 to be tested. The module 32 includes a pressurizing unit 321, a first pneumatic W 322, a first electronic switch unit 323, a second pneumatic unit 324, a second electronic switch unit 325, and a first pressure control unit two pressure control unit 327. The pressing unit 321 is, for example, an air compressor, and can be received in the test socket 35, or externally connected to the test socket m to provide a gas source for the pneumatic module 32. In a specific implementation manner, the air is removed. M machine (4) The air path of the ventilation duct 3210 shown in FIG. 2 communicates with the first pneumatic unit two pneumatic unit 324. Sx The first pneumatic unit 322 communicates with the pressurizing unit 321 via a gas passage (for example, a ventilation duct 32 (8) and drives each of the probes 31 to expand and contract to the carrier plate 351 ', and the first pneumatic unit 322 is received in the test seat 35= The first pneumatic unit 322 is, for example, a pneumatic valve that turns on when the air is turned on. The air pressure provided by the pressing unit 321 drives the probes 31 to be detected, and the test holes 3 510 are used in the carrier plate 31. When the pneumatic valve is closed, it is retracted to be buried in the test hole 3510 of the carrier plate 351. The first electronic switch unit 323 is used to control the opening and closing of the first pneumatic device 322, and the first electronic switch unit 323 is received. In the test stand 35, the probe 31 is controlled to protrude from the test hole 3510 ′ of the carrier 351 or the test hole 351 埋 embedded in the carrier 351, that is, the first electronic switch unit 323 is connected to the pressurizing unit 321 via an air path to drive each of the probes 31 to expand and contract to the carrier plate 351. The first electronic switch unit 323 is, for example, a relay. The first pressure control unit 326 is configured to control the pressurizing unit 321 Input to the first pneumatic unit 322 via a pneumatic circuit Pressing to prevent the air pressure from being too large causes the force of the probe 31 to protrude from the test hole 3510 of the carrier plate 351 to be too large to damage the circuit board 2 to be tested. Taking the second figure as an example, the first pressure control unit 326 has a first A barometer 3260 and a first pressure regulating knob 3261, the first barometer 3260 and the first pressure regulating knob 3261 can be disposed on the test seat 35, and the air pressure value displayed by the first barometer 3260 is used for The tester knows that the probe 31 protrudes from the driving pressure of the test hole 3510 of the carrier 351, and the tester can finely adjust the pressing unit 321 to the first pneumatic unit 322 via the pneumatic circuit through the second pressure regulating knob 3261. The second pneumatic unit 324 communicates with the pressurizing unit 321 via a gas path and φ drives the sigma plate 3 5 2 toward the carrier plate 3 51 to move downward, and the lower pressing clamps the circuit board 2 to be tested. For example, in FIG. 2, the second pneumatic unit 324 is, for example, a cylinder ' and the first pneumatic unit 324 is disposed on the test seat 35 through the branch frame 350. 'It provides suction or exhaust during ventilation. So that the gas pressure rod 3500 drives the fixing plate 352 toward the carrier plate 351 due to the exhausting action. Moving, or causing the gas pressure rod 3500 to move the fixing plate 352 upwards away from the carrier plate 351 due to suction, and to avoid the rotation of the fixing plate 352 during the movement to deviate from the original position, and at the same time, the fixing plate 352 can be smoothly 111810 10 201219796 As the gas pressure rod 3500 moves, one side of the fixing plate 352 is provided with a restriction hole 3521, and a limit is provided between the support frame 350 and the carrier plate 352.
I 孔3521的定位柱3511，藉此可使該固定板352可在定位 柱3511的導引下，隨著該氣壓桿3500作動而平順地上下 移動。 該第二電子開關單元325用以控制該第二氣動單元 324開啟及閉合，該第二電子開關單元325係收容於該測 Φ 試座35内，藉此控制該固定板352朝向該載板351移動以 夾固待測電路板2或離開該載板351，該第二電子開關單 元325為繼電器。 該第二控壓單元327用以控制該加壓單元321經由氣 路輸入至該第二氣動單元324的氣壓，以防止氣壓過大使 固定板352朝該載板351移動的下壓力道過大而傷及待測 電路板2。以第2圖為例，該第二控壓單元327具有一第 二氣壓錶3270和第二調壓旋鈕3271，且該第二氣壓錶3270 • 和第二調壓旋鈕3271係可設置於測試座35上，藉由該第 二氣壓錶3270所顯示的氣壓值以供測試人員瞭解固定板 352朝該載板351移動的下壓壓力，且測試人員可透過該 第一調壓旋鈕3271微調該加壓單元321經由氣路輸入至該 第二氣動單元324的氣壓。 該頻率量測模組33電性連接各該探針31，且收容於 該測試座35内，以接收各該探針31所擷取到的各該待測 點之晶振頻率信號進行量測，並將量測出的頻率值予以輸 出’該頻率量測模組33係例如為一計頻器。 η 111810 201219796 该主控模組34電性連接於該資訊處理裝置1以及該 頻率量測模組33，且收容於該測試座35内，該主控模= 34具有-控制單元341以及—電性連接於該資訊處^裝置 的傳輸介面342，該控制單元341電性連接該氣動模組犯 之第一電子開關單元323,用以依據該資訊處理襄置i中 裝載的頻率測試程式控制該氣動模組32的第一電子開關 單元323 ’以使該第-電子開關單元323發送與該頻^ 試程式相對應之程序控制指令給第一氣動單元奶，使其 驅動各該探針31分別接觸該待測電路板2_ 測點，舉例而言，該第-氣動單元322對各梅 動方式可例如為以先後順序並間斷性接觸該待 中對應的各該待測點，以擷取各該待測點之晶 傳輸給該頻率量測模組33,該主控模組34於收集到^ 率量測模組33輸出之頻率值後，將其傳輸至資訊處理裝置 1，以由該頻率測試程式得出該待測點的測試結果。 忒主控模組34的傳輸介面342可為串列埠（Serial Port)例如rS_232介面等，相應地，在該資訊處理裝置 1端也具有與為串列埠的該傳輸介面342相互對應的串列 阜1該控制單元341係例如為一可編程邏輯器件The positioning post 3511 of the hole 3521, whereby the fixing plate 352 can be smoothly moved up and down as the pneumatic rod 3500 is actuated under the guidance of the positioning post 3511. The second electronic switch unit 325 is configured to control the opening and closing of the second pneumatic unit 324. The second electronic switch unit 325 is received in the Φ test stand 35, thereby controlling the fixing plate 352 toward the carrier plate 351. Move to clamp the circuit board 2 to be tested or leave the carrier board 351. The second electronic switch unit 325 is a relay. The second pressure control unit 327 is configured to control the air pressure input by the pressurizing unit 321 to the second pneumatic unit 324 via the air path, so as to prevent the air pressure from being too large to cause the lower pressure channel of the fixed plate 352 to move toward the carrier plate 351 to be excessively injured. And the circuit board 2 to be tested. Taking the second figure as an example, the second pressure control unit 327 has a second air pressure gauge 3270 and a second pressure regulating knob 3271, and the second air pressure gauge 3270 and the second pressure regulating knob 3271 can be disposed in the test seat. At 35, the pressure value displayed by the second air pressure gauge 3270 is used for the tester to know the downward pressure of the fixed plate 352 moving toward the carrier plate 351, and the tester can fine tune the plus through the first pressure regulating knob 3271. The pressure unit 321 is input to the air pressure of the second pneumatic unit 324 via a gas path. The frequency measuring module 33 is electrically connected to each of the probes 31 and is received in the test socket 35 to receive the crystal frequency signals of the points to be measured captured by the probes 31 for measurement. The measured frequency value is outputted. The frequency measuring module 33 is, for example, a frequency counter. η 111810 201219796 The main control module 34 is electrically connected to the information processing device 1 and the frequency measurement module 33, and is received in the test socket 35. The main control module=34 has a control unit 341 and an electric The control unit 341 is electrically connected to the first electronic switch unit 323 of the device, and is controlled by the frequency test program loaded in the information processing device i. The first electronic switch unit 323' of the pneumatic module 32 causes the first electronic switch unit 323 to send a program control command corresponding to the frequency test program to the first pneumatic unit milk to drive each of the probes 31 respectively. Contacting the circuit board 2_ measuring point to be tested, for example, the first pneumatic unit 322 can, for example, sequentially and intermittently contact each of the to-be-measured points corresponding to the to-be-measured point in order to capture each The crystal of the point to be measured is transmitted to the frequency measuring module 33. After collecting the frequency value output by the measuring module 33, the main control module 34 transmits the frequency value to the information processing device 1 to The frequency test program derives the test knot of the point to be tested fruit. The transmission interface 342 of the main control module 34 may be a serial port such as an rS_232 interface, etc., and correspondingly, the information processing device 1 has a string corresponding to the transmission interface 342 of the serial port. The control unit 341 is, for example, a programmable logic device.
Logic Controller ; pLC)，用以依據該資 π處理裝置1中的頻率測試程式生成相對應之程序控制指 令0 於實際的頻率量測操作過程中，需將該頻率量測裝置 3與裝载有頻率測試程式的#訊處縣置1連接，將待測 111810 12 201219796a logic controller (pLC) for generating a corresponding program control command according to the frequency test program in the π processing device 1. During the actual frequency measurement operation, the frequency measuring device 3 is loaded with The frequency test program of #讯处县1 connection, will be tested 111810 12 201219796
電路板2放置於載板351上，然後，開啟該加壓單元32i， 並由該第一控壓單元326及第二控壓單元327調節好該加 壓單元321經由氣路輸入至該第一氣動單元322及第二氣 動單元324的氣壓，以在開啟該第二氣動單元犯4而使今 固定板352朝向載板351移動，使該固定板352下壓夹固 設置於該載板351上的待測電路板2，該主控模級34之今 控制單元341依據該資訊處理裝置1中裝載的頻率測試S ^ 式控制該氣動模組32的第一電子開關單元323,以使該第 一電子開關單元323發送與該頻率測試程式相對廉之程序 控制指令給第一氣動單元322,使其驅動各該探針31分別 凸出於該載板351上的測試孔3510,並接觸該待測電路板 2中與之對應的待測點，以擷取各該待測點之晶振頻率信 號傳輸給該頻率量測模組33，該主控模組34於操取到該 頻率量測模組33輸出之頻率值後’再傳輸至資訊處理裝置 1由該頻率測試程式得出該待測點的測試結果。 _ 在此須提出說明的是’本發明之頻率量測裝置並不限 於須具備如第2圖所示之固定板352、第二氣動單元324、 通氣導管3210、第一氣壓錶3260、第二氣壓錶3270以及 第一調壓旋鈕3261及第二調壓旋鈕3271，換言之，本發 明之頻率量測裝置僅需具有用以承載待測電路板的載板 351、將加壓單元321所提供的氣壓依據第一氣動單元322 的開啟或閉合使埋設於載板351内的氣壓式探針31可凸出 或收容於該載板351上的測試孔3510、依據該氣壓式探針 31接觸該待測電路板2之待測點而擷取各該待測點之晶振 13 111810 201219796 頻率的頻率量測模組33以及用以上傳該待測電路板之複 數待測點的晶振頻率給資訊處理裝置1的主控模組34,即 可實現取代人工量測作業，而獲得節省時間以及作業簡便 的功效。 綜上所述，本發明之頻率量測裝置在對待測電路板進 行各待測點的晶振頻率量測作業時，由主控模組與氣動模 組聯動，以實現氣動控制探針，進而代替人工以手持探棒 方式以探棒之探針——接觸待測電路板的待測點來進行信 號擷取，進而解決了習知技術中浪費工時、操作不便以及 * 容易造成誤判等問題；再由電性連接於資訊處理裝置與頻 率量測模組的主控模組將收集到之頻率值輸至資訊處理裝 置由該頻率測試程式得出該待測點的測試結果，進而更可 實現快速對多個待測電路板完成頻率量測的工作，而大大 提升了工作效率。 上述實施形態僅例示性說明本發明之原理及其功 效，而非用於限制本發明。任何熟習此項技藝之人士均可 籲 在不違背本發明之精神及範疇下，對上述實施形態進行修 飾與改變。因此，舉凡所屬技術領域中具有通常知識者在 未脫離本發明所揭示之精神與技術思想下所完成之一切等 效修飾或改變，仍應由後述之申請專利範圍所涵蓋。 【圖式簡單說明】 第1圖係為本發明之頻率量測裝置之基本架構方塊 圖；以及 第2圖係為本發明之頻率量測裝置之外觀圖。 14 111810 201219796The circuit board 2 is placed on the carrier 351, and then the pressing unit 32i is turned on, and the first pressure control unit 326 and the second pressure control unit 327 adjust the pressure unit 321 to be input to the first via the gas path. The air pressure of the pneumatic unit 322 and the second pneumatic unit 324 is used to open the second pneumatic unit 4 to move the fixing plate 352 toward the carrier plate 351, so that the fixing plate 352 is press-fitted on the carrier plate 351. The circuit board 2 to be tested, the control unit 341 of the master mode 34 controls the first electronic switch unit 323 of the pneumatic module 32 according to the frequency test S in the information processing device 1 to make the first An electronic switch unit 323 sends a program control command that is relatively inexpensive to the frequency test program to the first pneumatic unit 322, so that each of the probes 31 respectively protrudes from the test hole 3510 on the carrier 351, and contacts the standby The pixel to be measured in the circuit board 2 is transmitted to the frequency measurement module 33 for capturing the crystal frequency signal of each of the points to be measured, and the main control module 34 operates the frequency measurement module. After the group 33 outputs the frequency value, it is transmitted to the information processing device 1 by the Test results The test results of the test program point. _ It should be noted here that the frequency measuring device of the present invention is not limited to having the fixing plate 352, the second pneumatic unit 324, the ventilation duct 3210, the first air pressure gauge 3260, and the second as shown in FIG. The air pressure gauge 3270 and the first pressure regulating knob 3261 and the second pressure regulating knob 3271, in other words, the frequency measuring device of the present invention only needs to have the carrier plate 351 for carrying the circuit board to be tested, and the pressing unit 321 is provided. The air pressure probe 31 embedded in the carrier plate 351 can be protruded or received in the test hole 3510 of the carrier plate 351 according to the opening or closing of the first pneumatic unit 322, and the pneumatic probe 31 is contacted according to the air pressure probe 31. Measuring the point to be measured of the circuit board 2 and extracting the crystal oscillator 13 111810 201219796 frequency frequency measurement module 33 and the crystal frequency of the plurality of points to be tested for uploading the circuit board to be tested to the information processing device The main control module 34 of 1 can replace the manual measurement operation, and the utility of saving time and simple operation is obtained. In summary, the frequency measuring device of the present invention performs the operation of measuring the crystal frequency of each point to be tested on the circuit board to be tested, and the main control module and the pneumatic module are linked to realize the pneumatic control probe, thereby replacing Manually using a probe to probe the probe of the probe - touching the point to be tested of the circuit board to be tested for signal acquisition, thereby solving the problems of wasted work, inconvenient operation and * easy to cause misjudgment in the prior art; And the main control module electrically connected to the information processing device and the frequency measurement module outputs the collected frequency value to the information processing device, and the frequency test program obtains the test result of the to-be-measured point, thereby further realizing Quickly perform frequency measurement on multiple boards to be tested, which greatly improves work efficiency. The above embodiments are merely illustrative of the principles and advantages of the invention and are not intended to limit the invention. Any person skilled in the art can revise and modify the above-described embodiments without departing from the spirit and scope of the invention. Therefore, all equivalent modifications or alterations made by those skilled in the art without departing from the spirit and scope of the inventions are to be covered by the appended claims. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a block diagram showing the basic structure of the frequency measuring device of the present invention; and Fig. 2 is an external view of the frequency measuring device of the present invention. 14 111810 201219796
【主要元件符號說明】 1 資訊處理裝置 11 串列埠 2 待測電路板 3 頻率量測裝置 31 探針 32 氣動模組 321 加壓單元 3210 通氣導管 322 第一氣動單元 323 第一電子開關單元 324 第二氣動單元 325 第二電子開關單元 326 第一控壓單元 327 第二控壓單元 3260 第一氣壓錶 3270 第二氣壓錶 3261 第一調壓旋紐 3271 第二調壓旋鈕 33 頻率量測模組 34 主控模組 341 控制單元 342 傳輸介面 35 測試座 350 支撐架 351 載板 3510 測試孔 3511 定位柱 352 固定板 3520 頂針 3521 限制孔 3500 氣壓桿 15 111810[Description of main component symbols] 1 Information processing device 11 Serial port 2 Circuit board to be tested 3 Frequency measuring device 31 Probe 32 Pneumatic module 321 Pressurizing unit 3210 Ventilation duct 322 First pneumatic unit 323 First electronic switching unit 324 Second pneumatic unit 325 Second electronic switching unit 326 First pressure control unit 327 Second pressure control unit 3260 First air pressure gauge 3270 Second air pressure gauge 3261 First pressure regulating knob 3271 Second pressure regulating knob 33 Frequency measurement mode Group 34 Main control module 341 Control unit 342 Transmission interface 35 Test stand 350 Support frame 351 Carrier plate 3510 Test hole 3511 Positioning post 352 Fixing plate 3520 Thimble 3521 Restricting hole 3500 Pneumatic rod 15 111810