201205059 六、發明說明： 【發明所屬之技術領域】 本發明係關於一氣密測試設備與方法，特別是一種電子產品 的氣密測試設備與方法。 °σ 【先前技術】 近年來’ Ρ4著科技與資訊的日新月異，電子產品的製造技術 亦曰漸進步。在現代人追求輕便性與實用性的考量下，電子產品 不但朝輕、薄、短、小的特性邁進，更要有優良的防水性能，= 別是強調運動魏型的電子產品。由於運動魏型的電子產品需 要在汗水·濕的環境下被使用，因此電子產品的防水性能Ζ 劣往往是消費者考量是否購買的要素。 、習知的时贱是將水分麵於-電子錢上或是將電子裳 置浸泡於水中，再將電子裝置拆解後瞭解電子裝置内部的渗水狀 況是否能符合防水f求。但是習知的防水測試無可避免的會對電 子裝置造成破壞，因此對於電子裝置的完成品只能進行隨機抽 測，是以這樣的做法僅能瞭解單—批量的電子裝置的完成品是否 可達成預躺需求。當然，對於已經在使用中而被送回維修的電 子裝置也無法使用上述這種方式測試。至於實施所有產品的防 水測試(即全檢)只能針對電子裝置的半成品中的一殼體測試，但是 當殼體完顧m之後’仍必_殼體拆解後再安裝内部電子零 件Λ’;、而電子裝置經過殼體拆解再裝配電子零件的過程之後，並 P方水特性已，喊料職時的狀態有所落差。 因此直接以水測試電子裝置防水效果的測試方法，僅能評 5 201205059 估電子裝置初始設計及單—批量㈣子裝置產品衫可以達成預 定防水效果，無法確認每一個被製造出來的電子裝置之完成品都 可以達成預期的防水效果。 由於習知技術中的防水測試必須直接以水潑灑或是浸泡一被 測物的方式來測試，因此只能針對被測物的半成品進行全面測 試，而被測物的完成品必須透過抽樣的方式來進行測試。並且， 習知防水測試需要較久的時間來對被測物進行測試。再者，當被 測物測試完畢後須進行拆解被測物以利判讀結果，也需要花上一 段時間。 【發明内容】 馨於以上的問題’本發明在於提供—種電子產品的氣密測試 设備與方法，藉贿決先前麟所存麵離品防水性時所花費 的時間過長以及無法翻所有產品進行全檢要求的問題。 本發明所揭露一實施例之電子產品的氣密測試設備包含一氣 欲箱 h壓器以及-壓力計。其巾氣密箱具有—腔室設置於氣 密箱内’氣密箱更具有-檢測口連通腔室，氣密箱經由檢測口與 位於氣密料的-制物連結。加壓關包含—通氣管，通氣管 以氣密的關係接固至氣密箱，且通氣管内的—通氣孔連通腔室， 加壓器使-氣體經由通氣管送入腔室。另外，壓力計具有一感測 單元及-顯不單元’朗單元設置於腔室，_單元侧腔室内 的一氣壓’顯示單元設置於氣_外’顯示單·示感測單元所 偵測到腔室内的氣壓的一氣壓值。 本發明所揭露-實施例之電子產品的氣密測試設備，其中氣 201205059 密箱更包含-下殼體及-上蓋，下殼體及上蓋系共同包覆腔室， 檢測口係由下殼體與上蓋共同形成。 * 本發明所揭露一實施例之電子產品的氣密測試設備，其中上 蓋更包含一把手以及一扣勾，下殼體更包含一卡扣結構，卡扣結 構係匹配於扣勾。 本發明所揭露一實施例之電子產品的氣密測試設備，其中氣 密箱更具有-密封膠塊’密娜塊具有—貫纽，㈣膠塊設置 •於檢測口’且貫穿孔連通氣密箱的腔室，待測物之-端套設至貫 穿孔並與密封膠塊共同封閉檢測口。 本發明所揭露-實施例之電子產品的氣密測試設備，其中加 壓器更具有一計時器設置於其上。 八本發明所揭露-實施例之電子產品的氣密測試方法步驟包 3·首先设定一測試時間、一預定壓力以及一壓力下限，並提供 一待測物，待測物具有一開口 ’開口連通待測物的-内部腔體， 籲料=待測物之開口與一氣密箱的一檢測口連結，使氣密箱内的 二腔室與待測物_部腔體連通，並令—加壓器送人—氣體至氣 密Is的腔至，對腔室加壓。並令一麼力計檢測腔室内的一氣壓值， 直到氣壓值到達預定壓力時，開始計算一加壓時間。當加壓時間 j達間B夺’觀察當下壓力計顯示的氣壓值，接著比較氣壓 值與C力下限的大小。當氣壓值大於或等於壓力下限，則判定通 過，當氣壓值小於壓力下限，則判定不通過。 y本發明所揭露-實施例之電子產品的氣密測試方法，其中將 待測物具有開口的一端與一氣密箱的一檢測口連結的步驟更包 201205059 含：提供一密封膠塊，密封膠塊具有一貫通孔，使待測物具有間 口的一端穿設至貫通孔，接著打開包含有一上蓋及一下殼體的氣 密箱的上蓋，並令待測物具有開口的一端面向氣密箱，使密封膠 塊設至於由上蓋及下殼體共同形成的檢測口，接著將上蓋蓋至下 殼體’使上蓋與下殼體密合。 本發明所揭露一實施例之電子產品的氣密測試方法，其中打 開包含有一上蓋及一下殼體的氣密箱的上蓋的步驟更包含：拉起 下忒體的一卡扣結構，使卡扣結構的一扣環與上蓋的一扣勾分 離，接著握住上蓋的把手，將上蓋掀起。 —本發明所揭露-實施例之電子產品的氣密測試方法，其中將 上蓋蓋至下殼體’使上蓋與下殼體密合的步驟更包含：握住上蓋 的把手’將上蓋蓋至下殼體’接著將卡扣結構的—扣環扣上扣勾， 並壓抵卡扣轉使扣躲扣扣勾，以令上蓋與下殼體密合。 =據上述本實施例所揭露之電子產品的氣密測試設備以及方 需將待測物與軋密箱做連結，使待測物的内部腔體i氣 密箱_室彼此間有連通的關係。接著施以—氣體於上述腔室並 對腔至加壓，錢察氣體壓力變化即可制物的氣密性是否 ί到要求。故，本魏靖财之電子產品魏❹m設備以及 =可料大量_試時間，並且本實施例由卿懷咖快以及 而拆解待测物本體’所以可進行成品的全面檢測而非習知的部 伤抽測’如此—來可確保所有產品的品質穩定度。 詳二=明的特徵、實作與功效’兹配合圖式作最佳實施例 201205059 【實施方式】 請同時參照「第1圖」與「第2圖」，「第1圖」係為根據本 發明一實施例之電子產品的氣密測試方法(S100)的流程圖，「第2 圖」係為根據本發明一實施例之電子產品的氣密測試設備1〇〇結 構爆炸示意圖。電子產品氣密測試設備100包含一氣密箱110、一 加壓器120以及一壓力計130。氣密箱11〇具有一腔室11〇1設置 於氣密箱110内。氣密箱110更具有一檢測口 116連通腔室1101， 鲁 氣密箱可經由檢測口 116與位於氣密箱11〇外的一待測物200 連結。加壓器120包含一通氣管122以氣密的關係接固至氣密箱 110 ’且通氣管122内的一通氣孔連通腔室ποι，加壓器12〇使一 氣體經由通氣管122送入腔室1101内，用以對腔室1101内進行 加壓。另外，壓力計130用以偵測並顯示腔室11〇1内的氣壓值。 壓力計130具有一感測單元132及一顯示單元134，感測單元132 設置於腔室lioi内，感測單元132用來偵測腔室11〇1内的一氣 • 壓。另外，顯示單元則設置於氣密箱11〇外，顯示單元134 顯示感測單元132所偵測到腔室11〇1内的一氣壓值。 介紹完上述測試設備的基本構造後，接著針對氣密測試方法 搭配測試設備細部結構一起作說明。在對一待測物2〇〇進行氣密 貝J式時首先而要5又疋一測試時間T、一預定壓力pi以及一壓力 下限P2(S1G1)。其巾預定壓力ρι為加黯㈣對氣密箱⑽進行 加壓時，腔室1101内所需要達到的壓力值，即腔室服内的壓 f需要達到預定麗力P1時’加屋器12〇才可停止對氣密箱ιι〇進 行加壓。戦_ τ則為加壓器12G停止加壓的動作後所維持的 201205059 -段時間之時間值，測試時間τ的值通常為一經驗值。壓力下限 Ρ2為-設定值’壓力下限打會與腔室11〇1内的氣壓值作比較， 用以判斷待測物200是否達到氣密要求的一壓力基準值。 接著提供一待測物200，待測物2〇〇具有一開口連通待測物 200的一内部腔體(S102)。以本實施例而言，待測物2〇〇為一攝影 設備，攝影設備具有一線組接固於攝影設備的一本體並與攝影設 備有電性聯結賴係。由於敎於末端會分錢組支線組，支線 組並分別連接-接頭’於是這些支線關便會有—賺存在，此 間隙便為待測物200的開口’此間隙會連通至攝影設備的内部腔 體。需注意的是，本實施例的制物2⑻是以攝影設備為例子， 但並非用以限定本發明’只要是含有—開口連通本翻部的内部 腔體之產品，皆能適用此氣密測試設備與此氣密測試方法。 請同時參照「第3圖」，「第3圖」係為根據「第2圖」之待 測物200穿設至貫穿孔ι182的示意圖。另外氣密測試設備1〇〇更 可具有一密封膠塊118與氣密箱110搭配，因此提供此密封膠塊 118,密封膠塊118具有一貫穿孔1182(sl〇3)，如「第2圖」所示。 另外，密娜塊118為_雜體其材質可為娜但並不以此為限， 舉例而言也可以是矽膠。密封膠塊118設置於檢測口 116上，且 貫穿孔1182連通氣密箱11〇的腔室1101。當氣密箱11〇經由檢測 口 116與位於氣密箱ho外的一待測物2⑻連結時，密封膠塊 用以封閉待測物200與檢測口 Π6間的間隙，以防止腔室n〇1内 的氣體由此間隙宣洩出來。接著使待測物2〇〇具有開口的一端穿 认至貫穿孔1182(S104)，如「第3圖」所示。就本實施例之待測 201205059 物200為一攝影設備而言，是以攝影設備的線組穿設此貫穿孔 1182，且線組的直控較貫穿孔H82大，即線組與貫穿孔1182之 間是以緊配的關係結合以達氣密效果。 另外’氣密箱110更可包含一下殼體114及一上蓋112,其中 上蓋112藉由一樞軸119與下殼體Π4結合。下殼體ι14及上蓋 112係共同包覆腔室1101，檢測口 116係由下殼體114與上蓋 共同形成。其中上蓋112更可包含一把手1121以及一扣勾η。， • 下殼體114更可包含一·扣結構115，卡扣結構115係匹配於扣勾 1122。由於氣密箱11〇具有下殼體114及上蓋112,因此可將上蓋 112以樞軸119為軸心而相對下殼體114旋轉，以進行開合的動 作’並藉由卡扣結構115與扣勾1122的設置，使上蓋112可緊密 蓋上下殼體114。如此可方便腔室iioi内的清理以及方便密封膠 塊118設置於檢測口 116上，並確保上蓋U2與下殼體114間的 密封性。當密封膠塊Π8要設置於檢測口 116時，首先會拉起下 _ 殼體U4的卡扣結構115，使卡扣結構115的一扣環1151與上蓋 112的扣勾1122分離(S105)。接著握住上蓋112的把手1121，將 上蓋112由下殼體114相對拖軸119之一侧掀起(si〇6)。 接著請同時參照「第4圖」及「第5圖」，「第4圖」係為根 據「第3圖」之密封膠塊118設置於檢測口 116的示意圖，「第5 圖」係為根據「第4圖」之上蓋112蓋至下殼體114的示意圖。 令待測物200具有開口的一端面向氣密箱丨丨〇，使密封膠塊丨丨8設 置於檢測口 _116(S107) ’如「第4圖」所示。就本實施例而言★係 以攝影設備的具有線組之一端面向氣密箱110,當密封膠塊118設 201205059 置於檢測口 116時，線組末端的支線組以及接頭係位於腔室ιι〇1 内。另外，密封膠塊118更可具有一溝槽1181，密封膠塊118藉 由溝槽1181嵌合於檢測口 116上，且密封膠塊118係以緊配的方 式嵌合於檢測口 116上，以防止氣體由密封膠塊118與檢測口 116 間的間隙宣洩出來。接著握住上蓋112的把手1121，使上蓋112 蓋至下殼體114(S108) ’如「第5圖」所示。並且將卡扣結構115 的扣環1151扣上扣勾1122，並壓抵卡扣結構115使扣環1151緊 扣扣勾1122，令上蓋112與下殼體114密合（S109)。如此一來， 可確保腔室1101為一密閉空間且腔室1101藉由待測物2〇〇的開 口與待測物200的内部腔體連通。就本實施例而言，腔室11〇1藉 由攝影設備的支線組間的間隙與攝影設備内的内部腔體連通。 此時’令加壓器120送入氣體至氣密箱11〇的腔室11〇1，對 腔室1101加壓，並令壓力計130檢測腔室1101内的一氣壓值， 直到氣壓值到達預定壓力P1時，開始計算時間(幻1〇)。其中加壓 器120更可設置有一計時器124,測試者可藉由計時器124來計算 時間。當時間到達測試時間τ時，觀察t下壓力計13G顯示的氣 壓值（S111)。接著判定氣壓值是否大於或等於壓力下限 (S112)。測試者藉由待測物2〇〇内部腔體與腔室11⑴的連通之特 性’可由觀察腔室1101内的氣壓值變化判定待測物2〇〇的内部腔 體是否有漏氣的縣。當氣壓值大於或料壓力下限p2時，則判 定通過測試，意即腔室_ _氣體沒有經由待測物·的内部 腔體旦冷出待測物2〇〇外。當氣壓值小於壓力下限p2時則判定 不通過測試’意即腔室11G1内的氣體經由待測物的内部腔體 201205059 宣洩出待測物200外而使得腔室丨101内的氣壓值下降。201205059 VI. Description of the Invention: [Technical Field] The present invention relates to an airtight test apparatus and method, and more particularly to an airtight test apparatus and method for an electronic product. °σ [Prior Art] In recent years, 科技4 technology and information are changing with each passing day, and the manufacturing technology of electronic products is gradually improving. Under the consideration of modern people's pursuit of portability and practicality, electronic products not only move toward light, thin, short, and small characteristics, but also have excellent waterproof performance. = Do not emphasize sports Wei-type electronic products. Since sports Wei-type electronic products need to be used in a sweaty/wet environment, the poor waterproof performance of electronic products is often a factor that consumers consider whether to purchase. The well-known time is to immerse the water on the electronic money or soak the electronic device in the water, and then disassemble the electronic device to know whether the water seepage inside the electronic device can meet the requirements of waterproofing. However, the conventional waterproof test inevitably causes damage to the electronic device. Therefore, the finished product of the electronic device can only be randomly sampled, so that it is only possible to know whether the finished product of the single-batch electronic device can be achieved. Pre-lying needs. Of course, the electronic device that has been sent back for repair in use cannot be tested in this manner. As for the implementation of all products waterproof test (ie full inspection) can only be tested for a shell in the semi-finished product of the electronic device, but after the shell is finished with m, it is still necessary to install the internal electronic component after the shell is disassembled. After the process of disassembling the electronic device through the housing and then assembling the electronic components, and the characteristics of the P-square water, there is a gap in the state of the job. Therefore, the test method for directly testing the waterproof effect of the electronic device with water can only evaluate 5 201205059. The initial design of the electronic device and the single-batch (four) sub-device product shirt can achieve the predetermined waterproof effect, and the completion of each manufactured electronic device cannot be confirmed. The products can achieve the desired waterproof effect. Since the waterproof test in the prior art must be directly tested by means of water splashing or soaking a test object, only the semi-finished product of the test object can be thoroughly tested, and the finished product of the test object must be sampled. To test. Moreover, the conventional waterproof test requires a long time to test the test object. Furthermore, it takes a while for the test object to be disassembled to facilitate the interpretation of the test result after the test object is completed. SUMMARY OF THE INVENTION The present invention is to provide a gas-tight test apparatus and method for an electronic product, and it takes too long and cannot turn over all products when the bribe is damaged. The problem of conducting a full inspection request. The hermetic testing device for an electronic product according to an embodiment of the present invention comprises a gas box and a pressure gauge. The airtight case of the towel has a chamber disposed in the airtight box. The airtight box further has a detecting port communicating chamber, and the airtight box is connected to the product located at the airtight material through the detecting port. The pressure shut-off includes a vent pipe which is connected to the airtight box in a gastight relationship, and the vent hole in the vent pipe communicates with the chamber, and the pressurizer causes the gas to be sent into the chamber through the vent pipe. In addition, the pressure gauge has a sensing unit and a display unit 'language unit is disposed in the chamber, and an air pressure 'display unit in the unit side chamber is disposed in the air_outside display unit and the sensing unit detects A value of the air pressure of the chamber. The airtight test apparatus for an electronic product according to the embodiment of the present invention, wherein the gas 201205059 closet further comprises a lower case and an upper cover, the lower case and the upper cover jointly cover the chamber, and the detecting port is a lower case Formed together with the upper cover. The airtight test device for an electronic product according to an embodiment of the present invention, wherein the upper cover further comprises a handle and a buckle, and the lower casing further comprises a snap structure, and the buckle structure is matched with the buckle. The airtight test device for an electronic product according to an embodiment of the present invention, wherein the airtight case further has a sealant block, the Mina block has a through button, and (4) the rubber block is disposed at the detecting port and the through hole is connected to the airtight port. The chamber of the box, the end of the object to be tested is sleeved to the through hole and the detection port is closed together with the sealant block. The airtight test apparatus for an electronic product of the embodiment of the present invention, wherein the press further has a timer disposed thereon. VIII. The airtight test method step of the electronic product disclosed in the present invention includes a test time, a predetermined pressure, and a lower pressure limit, and provides a test object, the test object has an opening Connect the internal cavity of the object to be tested, and call the opening of the object to be tested to be connected with a detection port of an airtight box, so that the two chambers in the airtight box are connected with the object to be tested, and The pressurizer delivers a gas to the chamber of the airtight Is to pressurize the chamber. And let a force meter detect a pressure value in the chamber until the pressure value reaches a predetermined pressure, and start calculating a pressurization time. When the pressurizing time j reaches B, the gas pressure value displayed by the current pressure gauge is observed, and then the gas pressure value and the C oil lower limit are compared. When the air pressure value is greater than or equal to the lower pressure limit, it is determined that the air pressure value is less than the lower pressure limit, and the determination is not passed. The method for testing the airtightness of an electronic product according to the embodiment of the present invention, wherein the step of connecting the end of the object to be tested with a detecting port of an airtight box is further included 201205059: providing a sealing block, a sealant The block has a through hole, so that one end of the object to be tested has a gap to the through hole, and then the upper cover of the airtight case including the upper cover and the lower case is opened, and the end with the opening of the object to be tested faces the airtight box. The sealing block is provided to the detecting port formed by the upper cover and the lower casing, and then the upper cover is attached to the lower casing 'to make the upper cover and the lower casing close to each other. The airtight test method for an electronic product according to an embodiment of the present invention, wherein the step of opening the upper cover of the airtight case including the upper cover and the lower case further comprises: pulling up a snap structure of the lower body to make the buckle A buckle of the structure is separated from a buckle of the upper cover, and then the handle of the upper cover is grasped to lift the upper cover. The airtight test method of the electronic product of the embodiment of the present invention, wherein the step of attaching the upper cover to the lower casing to close the upper cover and the lower casing further comprises: holding the handle of the upper cover to cover the upper cover to the lower The casing 'cends the buckle of the buckle structure to the buckle, and presses the buckle to turn the buckle to the buckle, so that the upper cover and the lower casing are in close contact with each other. According to the airtight test equipment of the electronic product disclosed in the above embodiment, the object to be tested is connected with the rolling box, so that the internal cavity of the object to be tested is connected to each other. . Then, a gas is applied to the chamber and the chamber is pressurized, and the gas pressure of the gas can be changed to determine whether the gas tightness of the product is required. Therefore, this Wei Jingcai electronic product Wei Wei m equipment and = can be expected to a large number of _ test time, and this embodiment by the Qing Huai fast and dismantle the object to be tested 'so can be a comprehensive inspection of the finished product rather than the known department Injury tests 'so-to ensure the quality stability of all products. Detailed description of the characteristics, implementation, and efficacy of the following: "The best example is to match the pattern 201205059. [Embodiment] Please refer to "1" and "2" at the same time. "1" is based on this A flowchart of a hermetic testing method (S100) for an electronic product according to an embodiment of the present invention, and a "second drawing" is a schematic exploded view of a hermetic testing device 1 according to an embodiment of the present invention. The electronic product airtight test apparatus 100 includes an airtight box 110, a pressurizer 120, and a pressure gauge 130. The airtight housing 11 has a chamber 11〇1 disposed in the airtight housing 110. The airtight box 110 further has a detecting port 116 communicating with the chamber 1101, and the airtight box can be connected to a sample to be tested 200 located outside the airtight box 11 via the detecting port 116. The pressurizer 120 includes a vent tube 122 that is fixed in an airtight relationship to the airtight box 110' and a vent hole in the vent tube 122 communicates with the chamber ποι, and the pressurizer 12 〇 causes a gas to be sent into the chamber via the vent tube 122. In 1101, it is used to pressurize the inside of the chamber 1101. In addition, the pressure gauge 130 is used to detect and display the air pressure value in the chamber 11〇1. The pressure gauge 130 has a sensing unit 132 and a display unit 134. The sensing unit 132 is disposed in the chamber lioi, and the sensing unit 132 is configured to detect a gas pressure in the chamber 11〇1. In addition, the display unit is disposed outside the airtight box 11 , and the display unit 134 displays a value of the air pressure detected by the sensing unit 132 in the chamber 11〇1. After introducing the basic structure of the above test equipment, the airtight test method is then described together with the detailed structure of the test equipment. In the case of performing a gas-tight method for a sample to be tested 2, a test time T, a predetermined pressure pi, and a lower pressure limit P2 (S1G1) are first used. The predetermined pressure of the towel is 黯ι (4). When the airtight box (10) is pressurized, the pressure value required in the chamber 1101, that is, the pressure f in the chamber service needs to reach the predetermined power P1, the room-adder 12 Only then can you pressurize the airtight box ιι.戦_ τ is the time value of 201205059 - period time maintained after the pressurization of the pressurizer 12G is stopped, and the value of the test time τ is usually an empirical value. The lower pressure limit Ρ2 is the set value. The lower pressure limit is compared with the air pressure value in the chamber 11〇1 to determine whether the test object 200 has reached a pressure reference value for the airtightness requirement. Next, an object to be tested 200 is provided, and the object to be tested 2 has an opening that communicates with an internal cavity of the object to be tested 200 (S102). In this embodiment, the object to be tested 2 is a photographic device, and the photographic device has a wire set attached to a body of the photographic device and electrically coupled to the photographic device. Since the end will divide the money group branch group, the branch line group will be connected to the joint - so that these branch lines will be closed - the existing gap will be the opening of the object to be tested 200. This gap will be connected to the interior of the photographing device. Cavity. It should be noted that the workpiece 2 (8) of the present embodiment is exemplified by a photographic apparatus, but is not intended to limit the present invention. As long as it is a product containing an internal cavity that is open to communicate with the lap, the airtight test can be applied. Equipment and this airtight test method. Please refer to "Fig. 3" at the same time. "Fig. 3" is a schematic view of the object to be tested 200 according to "Fig. 2" being passed through the through hole ι182. In addition, the airtight testing device 1 can further have a sealing block 118 and the airtight box 110. Therefore, the sealing block 118 is provided, and the sealing block 118 has a consistent perforation 1182 (sl〇3), as shown in FIG. 2 Shown. In addition, the Mina block 118 is a _heterogen, and the material thereof may be Na, but not limited thereto. For example, it may also be silicone. The sealant block 118 is disposed on the detection port 116, and the through hole 1182 communicates with the chamber 1101 of the airtight case 11''. When the airtight box 11 is connected to a test object 2 (8) located outside the airtight box ho via the detecting port 116, the sealant block is used to close the gap between the object to be tested 200 and the detecting port 6 to prevent the chamber from being closed. The gas in 1 is vented from this gap. Next, the end of the object to be tested 2 having the opening is passed through the through hole 1182 (S104), as shown in Fig. 3. In the case where the 201205059 object 200 to be tested is a photographic device, the through hole 1182 is pierced by a wire set of the photographic device, and the direct control of the wire group is larger than the through hole H82, that is, the wire group and the through hole 1182 The combination is in a tight relationship to achieve an airtight effect. In addition, the airtight box 110 further includes a lower housing 114 and an upper cover 112, wherein the upper cover 112 is coupled to the lower housing 4 by a pivot 119. The lower casing ι14 and the upper cover 112 collectively cover the chamber 1101, and the detecting port 116 is formed by the lower casing 114 and the upper cover. The upper cover 112 further includes a handle 1121 and a buckle η. The lower housing 114 further includes a buckle structure 115, and the buckle structure 115 is matched to the buckle 1122. Since the airtight case 11 has the lower case 114 and the upper cover 112, the upper cover 112 can be rotated relative to the lower case 114 with the pivot 119 as the axis to perform the opening and closing action 'and by the snap structure 115 and The setting of the hook 1122 allows the upper cover 112 to tightly cover the upper and lower housings 114. This facilitates the cleaning of the chamber iioi and facilitates the sealing of the rubber block 118 on the detection port 116 and ensures the tightness between the upper cover U2 and the lower casing 114. When the sealing block 8 is to be disposed at the detecting port 116, the snap structure 115 of the lower casing U4 is first pulled up, so that a buckle 1151 of the buckle structure 115 is separated from the buckle 1122 of the upper cover 112 (S105). Next, the handle 1121 of the upper cover 112 is held, and the upper cover 112 is lifted from the lower casing 114 by one side of the towing shaft 119 (si〇6). Please refer to "Fig. 4" and "Fig. 5" at the same time. "Fig. 4" is a schematic view of the sealing block 118 according to "Fig. 3" installed in the detecting port 116. The "Fig. 5" is based on FIG. 4 is a schematic view of the cover 112 covering the lower casing 114. The end of the test object 200 having the opening faces the airtight box, and the sealant block 8 is placed at the detecting port _116 (S107)' as shown in Fig. 4. For the present embodiment, the one end of the photographic apparatus has a wire group facing the airtight box 110. When the sealing block 118 is placed at the detection port 116 at 201205059, the branch group at the end of the wire group and the connector are located in the chamber. 〇1 inside. In addition, the sealing block 118 can have a groove 1181. The sealing block 118 is fitted to the detecting port 116 by the groove 1181, and the sealing block 118 is fitted to the detecting port 116 in a tightly fitting manner. To prevent gas from escaping from the gap between the sealant block 118 and the detection port 116. Next, the handle 1121 of the upper cover 112 is held, and the upper cover 112 is brought to the lower casing 114 (S108)' as shown in Fig. 5. The buckle 1151 of the buckle structure 115 is fastened to the buckle 1122, and the buckle structure 115 is pressed to fasten the buckle 1151 to the buckle 1122, so that the upper cover 112 is in close contact with the lower casing 114 (S109). In this way, the chamber 1101 is ensured to be a closed space and the chamber 1101 communicates with the internal cavity of the object to be tested 200 through the opening of the object to be tested 2'. In the present embodiment, the chamber 11〇1 communicates with the internal cavity in the photographing apparatus by the gap between the branch groups of the photographing apparatus. At this time, the pressurizer 120 is fed with gas into the chamber 11〇1 of the airtight tank 11〇, pressurizes the chamber 1101, and causes the pressure gauge 130 to detect a gas pressure value in the chamber 1101 until the air pressure value reaches When the pressure P1 is predetermined, the calculation time (magic 1) is started. The presser 120 can be further provided with a timer 124, and the tester can calculate the time by the timer 124. When the time reaches the test time τ, the gas pressure value displayed by the pressure gauge 13G at t is observed (S111). It is then determined whether the air pressure value is greater than or equal to the lower pressure limit (S112). The tester's characteristic of the connection between the internal cavity and the chamber 11(1) by the object to be tested 2 can be determined by the change in the pressure value in the observation chamber 1101 to determine whether or not the internal cavity of the object to be tested 2 is leaking. When the air pressure value is greater than or lower than the material pressure lower limit p2, it is judged that the test passes, that is, the chamber __ gas is not cooled out of the object to be tested through the internal cavity of the object to be tested. When the air pressure value is less than the lower pressure limit p2, it is determined that the test does not pass the test, meaning that the gas in the chamber 11G1 is vented out of the object to be tested 200 through the internal cavity 201205059 of the object to be tested, so that the pressure value in the chamber 丨101 is lowered.
，由於氣體分子體積小於水分子體積，因此針對產品的密封 眭使用氣密測試來測試產品會較防水測試來的嚴苛，若產品可 通過氣密測断，防水測試也姆可以通過。根據上述本實施例 之電子產品的氣密測試設備以及方法，只需將—待測物與 乳雄'箱做連結，使待測物_部腔體與氣密箱的腔室彼此間有連 通的關係。接著施以-氣體於上述腔室並對腔室加壓，並觀察氣 體堡力變化即可觸制_密雖是科到要求。 因此相較於習知防水職檢測待測物之密封性時， 潑灑於待測物或將酬物浸泡於水中，上述的實施動作皆需花費 力，但是本實施_氣密職只需驗騎可找氣體 判=果由氣密測試不需要將待測物進行 解果’因此可節省進行判讀結果的時間。也由於本 =的氣細顯纖騎彳爾，㈣會破壞待測 合上述的_，本實關所揭露贼密職設備與方 需拆解待_本體來，Γ m時間快以及不 的可進行成品的全面檢測而非習知 伤抽測’如此—㈣確保所有產品的品質穩定度。 定本=本彳發__之較佳實施·露如上，然其並非用以限 内，當可作:::=象技藝者，在不脫離本發明之精神和範圍 本說明翻飾，本㈣之專··圍須視 錢明書_之申請專_騎界定者為準。 【圖式簡單說明】 13 201205059 第1圖係為娜本發明—實施例之電子產品的氣密測試設備 方法的流程圖； 第 圖係為根據本發明一 f施例之電子產品的氣密測試設備結構 爆炸示意圖； 第3圖係為根據第2圖之待測物穿設至貫穿孔的示意圖； 第4圖係為根據第3圖之密封膠塊設置於檢測口的示意圖；以及 第5圖係為根據第4圖之上蓋蓋至下殼體的示意圖。 【主要元件符號說明】 100 氣密測試設備 110 氣密箱 1101 腔室 112 上蓋 1121 把手 1122 扣勾 114 下殼體 115 卡扣結構 1151 扣環 116 檢測口 118 密封膠塊 1181 溝槽 1182 貫穿孔 119 拖轴 120 加壓器 201205059 122 通氣管 124 計時器 130 壓力計 132 感測單元 134 顯示單元 200 待測物Since the volume of the gas molecules is smaller than the volume of the water molecules, the sealing test for the product 眭 using the airtight test to test the product will be more stringent than the waterproof test. If the product can be tested by airtightness, the waterproof test can also pass. According to the airtight test apparatus and method of the electronic product of the present embodiment, it is only necessary to connect the object to be tested with the yam's box, so that the chambers of the object to be tested and the chambers of the airtight box are connected to each other. Relationship. Then, a gas is applied to the chamber and the chamber is pressurized, and the gas fortune change can be observed to be touched. Therefore, compared with the conventional waterproofing device to detect the sealing property of the object to be tested, it is necessary to spend the above-mentioned implementation actions when it is spilled on the object to be tested or immersed in the water, but the implementation of this method is only required to be tested. Gas can be found = the result of the airtight test does not need to solve the problem of the test object 'thus, so the time for the interpretation result can be saved. Also because of this = the fine-grained fiber-optic rider, (4) will destroy the above-mentioned _, the actual customs revealed that the thief secret equipment and the party need to dismantle the _ body, Γ m time is fast and not Carry out a comprehensive inspection of the finished product rather than a conventional injury test. [This—(4) to ensure the quality stability of all products. The preferred embodiment of this book is the same as the above, but it is not intended to be used within the limits. When it can be used as:::=, the artist can, without departing from the spirit and scope of the present invention, this description (4) The special ··Wei Shi Qian Mingshu _ application _ ride definition is subject to. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a flow chart of a method for testing a gas tightness test of an electronic product of an invention according to an embodiment of the present invention; FIG. 1 is a gas tight test of an electronic product according to an embodiment of the present invention. Schematic diagram of the explosion of the structure of the device; Figure 3 is a schematic view of the object to be tested according to Figure 2 through the through hole; Figure 4 is a schematic view of the sealing block according to Figure 3 placed on the detection port; and Figure 5 It is a schematic view of the cover to the lower casing according to FIG. 4 . [Main component symbol description] 100 Airtight test equipment 110 Airtight box 1101 Chamber 112 Upper cover 1121 Handle 1122 Buckle 114 Lower case 115 Buckle structure 1151 Buckle 116 Detection port 118 Sealant block 1181 Groove 1182 Through hole 119 Tow shaft 120 pressurizer 201205059 122 vent pipe 124 timer 130 pressure gauge 132 sensing unit 134 display unit 200 object to be tested