TW201140004A - Interface-level meter - Google Patents

Interface-level meter Download PDF

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Publication number
TW201140004A
TW201140004A TW100104296A TW100104296A TW201140004A TW 201140004 A TW201140004 A TW 201140004A TW 100104296 A TW100104296 A TW 100104296A TW 100104296 A TW100104296 A TW 100104296A TW 201140004 A TW201140004 A TW 201140004A
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Taiwan
Prior art keywords
electrode
liquid
probe
interface
interface meter
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TW100104296A
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Chinese (zh)
Inventor
Yoshinori Takeuchi
Katsumasa Nakahara
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Kinotech Solar Energy Corp
Asahi Glass Co Ltd
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Application filed by Kinotech Solar Energy Corp, Asahi Glass Co Ltd filed Critical Kinotech Solar Energy Corp
Publication of TW201140004A publication Critical patent/TW201140004A/en

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    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25CPROCESSES FOR THE ELECTROLYTIC PRODUCTION, RECOVERY OR REFINING OF METALS; APPARATUS THEREFOR
    • C25C3/00Electrolytic production, recovery or refining of metals by electrolysis of melts
    • C25C3/34Electrolytic production, recovery or refining of metals by electrolysis of melts of metals not provided for in groups C25C3/02 - C25C3/32
    • CCHEMISTRY; METALLURGY
    • C25ELECTROLYTIC OR ELECTROPHORETIC PROCESSES; APPARATUS THEREFOR
    • C25CPROCESSES FOR THE ELECTROLYTIC PRODUCTION, RECOVERY OR REFINING OF METALS; APPARATUS THEREFOR
    • C25C7/00Constructional parts, or assemblies thereof, of cells; Servicing or operating of cells
    • C25C7/005Constructional parts, or assemblies thereof, of cells; Servicing or operating of cells of cells for the electrolysis of melts
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01FMEASURING VOLUME, VOLUME FLOW, MASS FLOW OR LIQUID LEVEL; METERING BY VOLUME
    • G01F23/00Indicating or measuring liquid level or level of fluent solid material, e.g. indicating in terms of volume or indicating by means of an alarm
    • G01F23/22Indicating or measuring liquid level or level of fluent solid material, e.g. indicating in terms of volume or indicating by means of an alarm by measuring physical variables, other than linear dimensions, pressure or weight, dependent on the level to be measured, e.g. by difference of heat transfer of steam or water
    • G01F23/24Indicating or measuring liquid level or level of fluent solid material, e.g. indicating in terms of volume or indicating by means of an alarm by measuring physical variables, other than linear dimensions, pressure or weight, dependent on the level to be measured, e.g. by difference of heat transfer of steam or water by measuring variations of resistance of resistors due to contact with conductor fluid

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  • Chemical & Material Sciences (AREA)
  • Metallurgy (AREA)
  • Engineering & Computer Science (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Materials Engineering (AREA)
  • Physics & Mathematics (AREA)
  • Organic Chemistry (AREA)
  • Fluid Mechanics (AREA)
  • General Physics & Mathematics (AREA)
  • Thermal Sciences (AREA)
  • Measurement Of Levels Of Liquids Or Fluent Solid Materials (AREA)
  • Electrolytic Production Of Metals (AREA)

Abstract

An area (SA) of contact with a probe (34, 134, 234, 334, 434, 534) of a first electrode (30, 130, 230, 330, 430, 530) with respect to a second liquid (24) kept beneath a first liquid (22) is set to exhibit a step of resistance for a detection section (70) when the probe of the first electrode crosses an interface between the first liquid and the second liquid, with a probe (44) of a second electrode (40) being immersed in the second liquid, while supplying an alternate current from an alternate current source (50).

Description

201140004 六、發明說明: L發明戶斤屬之技術領域3 發明領域 本發明係有關於一種根據電極間之電阻值變化,檢測 界面位置之界面計,特別是有關於一種用以檢測由高溫之 熔融金屬熔體位於高溫之熔融鹽液體下等比重不同,而不 易混合之2種高溫液體構成之2層構造液體的界面位置之界 面計。 t先前技術3 發明背景 近年來,檢測儲存槽或反應槽中之液體之液面位置的 液面計使用將複數個電極設置成前端之高度不同,以因液 面位置之變化引起之電極間之電阻值等的變化,檢測液面 位置者、將浮標設置於液中,以浮標位置之變化,檢測液 面位置者、及以超音波或雷射光,測定至液面之距離,以 檢測液面位置者等結構。 在該等中,使用超音波或雷射光,從上方檢測液面位 置之結構當在液面上存在液體之蒸氣冷卻而形成之霧層 時,不易進行穩定之液面位置之檢測,當使用超音波時, 亦可將振盪器設置於儲存槽之底部,從下方檢測液面,但 當以諸如熔融鹽之高溫液體為對象時,則不易將振盪器設 置於儲存槽之底部。 使用浮標之結構僅使用位置檢測容易之浮標檢測,來 取代液面之直接檢測,雖然關於測定構件之選擇類型廣, 201140004 但最終,在必須以一些方法檢測浮標位置上並無改變。 相對於此,根據電極間之電阻值等之變化,檢測液面 位置之結構有構造簡便’可將高溫液體作為對象來使用之 優點。 專利文獻1揭示一種液面液位測量裝置,該液面液位、則 量裝置係將3根電極棒中之1根電極棒作為基準,於各2根電 極棒間施加交流電極,以測量注入至槽2之液體之液面液位 者。 先行技術文獻 專利文獻 專利文獻1日本專利公開公報特開平6_147954號 【明内穷】 發明揭示 發明欲解決之課題 然而,根據本發明人之檢討,專利文獻1揭示之液面液 位測量裝置_用輪ih電壓之資料庫,測量1種液體之液面 位置者’非提出何檢測2種液體之界面之位置者。 、根據本發明人之進一步檢討,若液體與大氣等氣體構 ’可’液體之導電率與氣體之導電率有相當大 之差來檢,則界面之位置。而當比重不同,不易混合之2種 液體刀開貯存時’欲檢測相當於上層液體與下層液體之界 面之液面位置時’液體間之導電率之差不大至如氣體液體 ’之私度而不易檢測該液體位置。 舉例。之,相對於上層液體之導電率,下層液體之導 201140004 電率大數位數左右時,亦設定對應於上方電極之前端浸潰 於下層液體時之電阻測定範圍時’隨著此上方電極之前端 在上層液體内接近下層液體之液面,電極間之電阻值大致 變化成線形,而於上方電極之前端完全浸潰於下層液體 播 > 你 電阻值則無大幅變化。亦即,在上方電極之前端接觸 下曰液體之界面附近之電阻值係在反曲點標準變化者,而 無法期待如從氣體變化成液體之界面般,實際上從無限大 逢化至有限值之明確的電阻值變化。 亦即,相對於上層液體之導電率,下層液體之導電率 極大時,在上方電極之前端接觸下層液體之界面附近之電 阻值之變化顯示明確之段差(電阻段差),而於此電阻值之變 化不明確時,期望實現以高精確度檢測對應於界面位置之 液面位置之結構。 又,上層液體為電解液時,當上方電極之前端位於上 層液體中時’由於電極間形成為與電容器及電阻並聯連接 之電路等效的狀態,故當輕易地對電極間施加電壓時,有 流至電_之電流不穩定之傾向,在㈣1界面㈣< 電阻值之變化更不明確,對此,亦期望有—些對策。 本發明係經以上之檢討而發明者,其目的係提供—種 下述界面計,前述界面計係㈣存有上層㈣為電解 導電性低之液體,下層液體為比重較上層液體重,不該 上層液體混合,且導電性較上層液體高之液體的2拜構造液 體的儲存槽或反應槽中’可以高精確度檢測對應於上 體與下層液體之界面之液面位置者。 a 201140004 用以欲解決課題之手段 為達成以上之目的,本發明為一種界面計,在第1態 樣,該界面計包含有第1電極、第2電極、交流電源、及檢 測部,該第1電極具有可自由穿越由第1液體與第2液體構成 之界面,並可自由浸渍於前述第1液體及前述第2液體之導 電性探針,前述第1液體係積存於容器内,為電解質,而前 述第2液體則在前述容器内,積存於比前述第1液體靠近下 方,為導電性;該第2電極係配置於比前述第1電極靠近下 方,並具有可自由浸潰於前述第2液體之導電性探針;該交 流電源係可對前述第1電極之前述探針與前述第2電極之前 述探針間自由供給交流電流;該檢測部依據流動於前述第1 電極之前述探針與前述第2電極之前述探針間之前述交流 電流,算出電阻值,以檢測前述第1液體與前述第2液體之 界面;又,設定前述第1電極之前述探針對前述第2液體之 接觸面積,俾於一面從前述交流電源供給前述交流電流, 一面在前述第2電極之前述探針浸潰於前述第2液體之狀態 下,使前述第1電極之前述探針穿越前述界面時,可對前述 檢測部顯現電阻段差。 又,本發明第2態樣係在第1態樣中,令前述接觸面積 為SA(m2),令前述第1電極之前述探針對前述第2液體之接 觸電阻係數為ρ ιΧΩ . m2),令前述接觸電阻係數p l除以前 述第1電極之前述探針對前述第1液體之接觸電阻係數 /〇 υ(Ω . m2)之接觸電阻係數比為h,以及令在前述第1電極 之前述探針及前述第2電極之探針浸潰於前述第2液體之狀 201140004 態之測量糸統之固有電阻值為R〇( Γ})時^設定成滿足下式 (數 1)。 數1 (SA · h) ^ ( p l/R〇) 又,本發明第3態樣係在第1或第2態樣中,前述第1電 極之前述探針之前端部為錐體,前述錐體之高度小於前述 錐體之底面之外徑或長邊。 又,本發明第4態樣係在第1至第3任一態樣中,前述第 1電極之前述探針之前端部為自由設定成與前述界面平行 之平面。 又,本發明第5態樣係在第4態樣中,前述第1電極之前 述探針之前端部更具有複數個凹凸部。 又,本發明第6態樣係在第1至第5任一態樣中,前述第 1電極之前述探針之前端部以絕緣構件覆蓋至其前端。 又,本發明第7態係在第6態樣中,於覆蓋前述第1電極 之前述探針之前端部的前述絕緣構件設有對應於前述複數 個凹凸部之缺口部。 又,本發明第8態樣係在第1至第7任一態樣中,前述第 1電極之前述探針連結於前述第1電極之導電構件,前述導 電構件以絕緣構件覆蓋。 又,本發明第9態樣係在第8態樣中,覆蓋前述第1電極 之前述導電構件之前述絕緣構件的外面與前述第1電極之 前述探針之外面為同平面。 又,本發明第10態樣係在第1至第9任一態樣中,前述 201140004 交流電壓之最大電壓小於前述第1液體之電解電壓。 又,本發明第11態樣係在第1至第10任一態樣中,前述 第1液體為含有熔融氣化鋅之熔融鹽,前述第2液體為含有 溶融鋅之溶融金屬。 又,本發明第12態樣係在第11態樣中,前述交流電流 之頻率為5Hz以上,500Hz以下之範圍。 又,本發明第13態樣係在第1至第12任一態樣中,前述 第1電極之前述探針為石墨製。 發明效果 在本發明第1態樣之界面計中,由於設定第1電極之探 針對第2液體之接觸面積,俾於一面從交流電源供給交流電 流,一面在第2電極之探針浸潰於第2液體之狀態下,第1電 極之探針穿越界面時,可對檢測部顯現電阻段差,故在貯 存有上層液體為電解液等導電性低之液體,下層液體為比 重較上層液體重,不用與上層液體混合,且導電性較上層 液體高之液體的2層構造液體的儲存槽或反應槽中,可以高 精確度檢測對應於上層之第1液體與下層之第2液體之界面 之液面位置。 又,在本發明之第2態樣之界面計中,由於設定成滿足 式(數1),故於檢測對應於上層液體與下層液體之界面之液 面位置之際,可確實地獲得可以相當大之值獲得電阻段差 之第1電極之探針,而可以高精確度檢測液面位置。 又,在本發明第3態樣之界面計中,由於第1電極之探 針之前端部為錐體,錐體之高度小於錐體之底面之外徑或 201140004 長邊’故於探針通過上層之第1液體與下層之第2液體的界 面時’可獲得急遽之電阻值之變化’而可以高解析度高精 確度地檢測液面位置。 又’在本發明第4態樣之界面計中,由於第1電極之探 針之前端部為自由設定成與界面平行之平面,故於探針通 過上層之第1液體與下層之第2液的界面時’可瞬間增大探 針之接觸面積,而可獲得更急遽之電阻值之變化’而可以 更高之解析度高精確度地檢測液面位置。 又,在本發明第5態樣之界面計中,由於第1電極之探 針之前端部更具有複數個凹凸部,故可吸收相當於凹凸之 深度之液面位置之變動,將電阻值之變動納入一定範圍, 而可以更高之解析度高精確度地檢測對應於此界面之液面 位置。 又,在本發明第6態樣之界面計中,由於第1電極之探 針之前端部以絕緣構件覆蓋至其前端,故於探針通過上層 之第1液體與下層之第2液體的界面時,可更瞬間增大探針 之接觸面積,而可獲得更急遽之電阻值之變化’而可以更 高之解析度高精確度地檢測界面位置。 又,在本發明第7態樣之界面計中’由於於覆蓋第1電 極之前述探針之前端部的絕緣構件設有對應於前述複數個 凹凸部之缺口部,故第2液體等可從缺口部排出至外部’俾 不致不必要地捲入複數個凹凸部間積存’而可以更高之解 析度高精確度地檢測界面位置。 又,在本發明第8態樣之界面計中,由於第1電極之探 201140004 針連結之第1電極之導電構件以絕緣構件覆蓋,故可確實地 防止供給不必要之測定電流,檢測之電阻值變動。 又,在本發明第9態樣之界面計中,由於覆蓋第1電極 之導電構件之絕緣構件的外面與第1電極之探針之外面為 同平面,故不致於上層第1液體與下層第2液體之界面產生 不必要之混亂,而可以更高之解析度高精確度地檢測對應 於此界面之液面位置。 又,在本發明第10態樣之界面計中,由於交流電壓之 最大電壓設定成小於第1液體之電解電壓,故於檢測界面 時,可確實地防止因測定電流產生不必要之電解。 又,在本發明第11態樣之界面計中,由於第1液體為含 有熔融氣化辞之熔融鹽,第2液體為含有熔融鋅之熔融金 屬,故藉將熔融氣化鋅電解,可於其下層獲得熔融辞,而 可以高解析度高精確度地檢測對應於該等界面之液面位 置。 又,在本發明第12態樣之界面計,由於交流電流之頻 率設定為5Hz以上,500Hz以下之範圍,故當第1電極之探 針之前端部浸潰於第1液體時或穿越界面時,電阻值變化穩 定,而可以更之高解析度高精確度地檢測界面位置。 又,在本發明第13態樣之界面計中,由於第1電極之探 針為石墨製,故可將測定系統之電阻值抑制為低值,而可 以更高之解析度高精確度地檢測界面位置。 圖式簡單說明 第1圖係顯示本發明實施形態之界面計之結構的示意 10 201140004 截面圖,亦顯示儲存液體之儲存槽。 弟2圖係顯不以本貫施形態之界面計測定之電阻變化 曲線之圖表。 第3A圖係本實施形態之界面計之第1電極的部份截面 圖,相當於第3B圖之A-A截面圖。 第3B圖係本實施形態之界面計之第1電極的底面圖,相 當於第3A圖之Z箭號視圖。 第3C圖係本貫施形態之界面計之變形例之第1電極的 部份截面圖,相當於第3D圖之B-B截面圖。 第3D圖係本變形例之第1電極之底面圖,相當於第3C 之Z箭號視圖。 第4圖係分別顯示以具有第3A圖及第3B圖所示之電極 之界面計測定之電阻變化曲線、以及以具有第3C圖及第3D 圖所示之電極之界面計測定之電阻變化曲線的圖表。 第5 A圖係本實施形態之界面計之另一變形例之第i電 極的部份截面圖,相當於第5B圖之c_c截面圖。 第5B圖係此變化例之第1電極之底面圖,相當於第5A 圖之Z箭號視圖。 第5 C圖係本貫施形態之界面計之另一變形例之第1電 極的部份截面圖,相當於第5D圖之D_D截面圖。 第5D圖係此變形例之第1電極的底面圖,相當於第5C 圖之Z箭號視圖。 第6 A圖係本實施形態之界面計之又另一變形例之第^ 電極的部份截面圖,相當於第6B圖之E_E截面圖。 201140004 第6B圖係此變形例之第1電極的底面圖,相當於第6A 圖之Z箭號視圖。 第6C圖係本實施形態之界面計之又另一變形例之第1 電極的部份截面圖,相當於第6D圖之F-F截面圖。 第6D圖係此變形例之第1電極的底面圖,相當於第6C 圖之Z箭號視圖。 I:實施方式3 用以實施發明之形態 以下,就本發明之實施形態之界面計,適當參照圖式 來詳細說明。此外,圖中,X軸及Z軸構成垂直相交座標系, Z軸之方向為鉛直之上下方向。 第1圖係顯示本實施形態之界面計之結構的示意截面 圖,亦顯示儲存液體之儲存槽。又,第2圖係顯示以本實施 形態之界面計測定之電阻變化曲線之圖表。 如第1圖所示,本實施形態之裝置S包含有界面計10、 及自由儲存液體之儲存槽20。此裝置S可為僅積存液體之儲 存裝置,亦可為使用省略圖式之一對電解用電極,典型為 將炼融氣化鋅電解,而生成溶融鋅及氣氣之電解裝置。裝 置S為電解裝置時,儲存槽20便為電解反應容器。 此界面計10具有第1電極30、配置於比第1電極30還下 方之第2電極40、藉由供電線50a、50b,連結於第1電極30 及第2電極40,施加交流電壓,而使交流電流流動之交流電 源50、為測定從交流電源50流至第1電極30及第2電極40之 交流電流,而連結於供給線50a之交流電流計60、為將業經 12 201140004 乂父/瓜電々丨L。十60測定之交流電流值進行數據處理,算出電 阻值彳*錢阻值變化之程度,檢測2種液體間之界面位 置,而連結於交流電流計6〇之檢測部70。此外,檢測部7〇 具有省略圖式之運算裝置及記憶體等。 具體s之’第1電極30細節後述,具有具以絕緣性保護 管包圍棒狀導電構件之構造之電極部32、由導電構件構成 之箭頭51探針34。具體言之,在此第1電極3()巾,電極部 之保護管為圓筒狀絕緣構件,並覆蓋棒狀導電構件之周 圍,俾不致供給不必要之測定電流,測定之電阻值不致變 動。又,探針34連接於電極部32之保護管及導電構件之上 部之外面為與保護管之外面同平面之圓柱狀且具有形成 尖細之圓錐狀前端部。另一方面,第2電極4〇具有電極部42 及探針44,此電極部42之上下方向之全長除了設定成較第i 電極30之電極部32長外,具有與第1電極3〇之電極部32及探 針34相同之結構。 又,儲存槽20典型為石墨製,以省略圖式之加熱機構 保持在500°C,於其内部積存熔融氣化鋅22、從此電解生成 之炼融辞24。因在500°C之氣化辞之比重為2.4,鋅之比重為 6.4,故熔融氣化鋅22及熔融鋅24兩液體形成為上下分離, 以熔融氣化鋅22為上層,溶融辞24為下層之2層構造液體。 在此’檢測部70檢測炫融氣化鋅22及溶融辞24之界面。此 外,此2層構造液體不限於熔融氯化辞22及熔融辞24,只要 上層液體為電解液等導電性低之熔融鹽等液體,不層液體 為比重較上層液體重,不與上層液體不必要地混合,且導 13 201140004 電性高於上層液體之熔融金屬等液體即可。又,當一面將 熔融氣化鋅作為電解質來使用,一面進行電解,而獲得由 熔融氣化鋅22及熔融鋅24構成之2層構造液體時,使用氣化 鋰或氣化鉀等支撐電解質亦無妨,此時,於熔融氣化鋅22 及炼融鋅24混入氣化鋰或氣化鉀等亦無妨。 第1電極30之板針34及第2電極40之探針44可進入由此 熔融氣化鋅22及熔融鋅24構成之2層構造液體。更詳而言 之,第1電極30以探針34在熔融氣化鋅22及從其電解生成之 熔融辞24之上升界面26自由橫越之狀態固定而配置,第2電 極40以探針44完全自由浸潰於從熔融氣化鋅22電解生成之 熔融鋅24中之狀態固定而配置。此外,當熔融氣化鋅22及 熔融鋅24之界面26之位置為一定時等,將第丨電極30之探針 34移動’使其穿越該界面26亦無妨。又,此探針34相對地 穿越界面26之方向為上下方向’為垂直相交於界面26之方 向0 又,交流電源50係將交流電壓施加至第1電極3〇及第2 電極40 ’而使交流電流流動者。將此交流電源5〇作為測定 電源使用之理由可舉下述理由,前述理由係由於熔融氣化 鋅22為電解質,故施加直流電壓,使直流電流流動時,其 電流測定值不穩定,相對於此,當施加交流電壓,使交流 電壓流動時,可獲得穩定之電流測定值。又,此交流電壓 之最大電壓設定成小於熔融氯化辞22之電解電壓,俾不致 使熔融氣化鋅22產生不必要之電解。 如此從交流電源50施加之交流電流之頻率宜為5Hz以 14 201140004 上,500Hz以下之範圍。更詳而言之’關於施加之交流電流 之頻率之下限,當施加之交流電流之頻率越低,對應於測 定之電流值之電阻值越大,從在熔融氯化鋅22與熔融鋅24 之界面26中所得之電阻值之差可相對地較大之觀點而言, 較佳,而由於當為不到5Hz之低頻時,實際上無法獲得穩定 之電流測定值,故以5Hz以上為佳。 另一方面,關於如此施加之交流電流之頻率之上限, 因施加之交流電流之頻率越高,便可獲得越穩定之電流測 定值,故較佳,而當為超過500Hz之頻率時,對應於測定之 電流值之電阻值明顯縮小,在熔融氣化鋅22與熔融鋅24之 界面26所得之電阻值之段差相對小,且需對檢測部70等設 電磁遮蔽,或者交流電源50或交流電流計60等為特殊者, 而有高價之傾向,故以500Hz以下為佳。再者,從可使用較 接近商用電源頻率’低廉,且可靠度高之交流電源50或交 流電流計60等之觀點,施加之交流電流之頻率為5〇Hz以 上,100Hz以下之範圍在現實上更適合。 接著,在以上之結構中,若在第1電極3〇之探針34浸潰 於炫融氣化鋅22中,第2電極40之探針44浸潰於熔融鋅24中 之狀態下’從交流電源50施加交流電壓,而使交流電流流 動時,由於辞之導電率較氣化辞之導電率大5位數左右,故 流動之電流之路徑由在上下方向將第丨電極3〇之探針34之 前端部、溶融氣化鋅22及炫融鋅24之界面26以最短距離連 接之熔融氣化鋅22内之路徑、以及於斜向將熔融氣化鋅22 及熔融鋅24之界面:26、與第2電極4〇之探針44之前端部以最 15 201140004 短距離連接之熔融鋅24内的路徑構成。 又,若在第1電極30之探針34及第2電極40之探針44皆 浸潰於熔融鋅24中之狀態下,從交流電源5〇施加交流電 壓,而使交流電流流動,流動之電流之路徑由藉由熔融鋅 24,將第1電極30之探針34與第2電極40之探針44連接之炼 融鋅24内之路徑構成。 在此,在第2電極40之探針44浸潰於炼融鋅24中之狀態 下,第1電極30 —面相對地移動至下方,第!電極3〇之探針201140004 VI. INSTRUCTION DESCRIPTION: TECHNICAL FIELD OF THE INVENTION The present invention relates to an interface meter for detecting the position of an interface according to a change in resistance between electrodes, and more particularly to detecting melting from a high temperature. The metal melt is located at a high temperature molten salt liquid, and the interface of the interface position of the two-layer structured liquid composed of two kinds of high-temperature liquids which are not easily mixed. BACKGROUND OF THE INVENTION In recent years, a liquid level meter for detecting the liquid level position of a liquid in a storage tank or a reaction tank uses a plurality of electrodes to have different heights at the front end, so that the electrodes are caused by changes in the liquid level position. Change in resistance value, etc., to detect the liquid level position, to set the buoy in the liquid, to change the position of the buoy, to detect the liquid level position, and to measure the distance to the liquid surface by ultrasonic or laser light to detect the liquid level Position and other structures. In these, the structure of the liquid level is detected from above by using ultrasonic or laser light. When a mist layer formed by cooling the liquid vapor on the liquid surface is formed, it is difficult to detect the stable liquid level position. In the case of sound waves, the oscillator can also be placed at the bottom of the storage tank to detect the liquid level from below, but when it is used for a high temperature liquid such as molten salt, it is not easy to place the oscillator at the bottom of the storage tank. The structure using the buoy only uses the buoy detection which is easy to detect the position to replace the direct detection of the liquid surface. Although the selection type of the measuring member is wide, 201140004, in the end, there is no change in the position of the buoy which must be detected by some methods. On the other hand, according to the change in the resistance value between the electrodes and the like, the structure for detecting the liquid level position has a simple structure, and the high-temperature liquid can be used as an object. Patent Document 1 discloses a liquid level liquid level measuring device that applies an alternating current electrode between two electrode rods with one of the three electrode rods as a reference for measuring the injection. The liquid level of the liquid to the tank 2. In the prior art, the liquid level measuring device disclosed in Patent Document 1 is used in accordance with the review by the inventors of the present invention. The data library of the wheel ih voltage, the position of the liquid level of one liquid is measured, and the position of the interface of the two kinds of liquids is not proposed. According to a further review by the present inventors, the position of the interface is checked if there is a considerable difference between the conductivity of the liquid and the atmosphere and the conductivity of the gas. When the two kinds of liquid knives that are different in specific gravity and are difficult to mix are stored, 'when the liquid level position corresponding to the interface between the upper liquid and the lower liquid is to be detected, the difference between the conductivity of the liquid is not as large as the gas liquid'. It is not easy to detect the liquid position. For example. With respect to the conductivity of the upper layer liquid, when the conductivity of the lower layer liquid 201140004 is about a large number of digits, it is also set to correspond to the resistance measurement range when the front end of the upper electrode is immersed in the lower layer liquid. In the upper liquid close to the liquid level of the lower liquid, the resistance between the electrodes is roughly changed into a linear shape, and the front end of the upper electrode is completely immersed in the lower liquid broadcast. Your resistance value does not change significantly. That is, the resistance value near the interface of the lower electrode at the front end of the upper electrode is in the standard of the inflection point, and it cannot be expected to change from the gas to the liquid interface, and actually from infinity to a finite value. A clear change in resistance value. That is, when the conductivity of the lower layer liquid is extremely large with respect to the conductivity of the upper layer liquid, the change in the resistance value near the interface of the front end of the upper electrode contacting the lower layer liquid shows a clear step difference (resistance step difference), and the resistance value is When the change is not clear, it is desirable to realize a structure that detects the liquid level position corresponding to the interface position with high accuracy. Further, when the upper liquid is an electrolyte, when the front end of the upper electrode is in the upper liquid, 'because the electrodes are formed in a state equivalent to a circuit in which the capacitor and the resistor are connected in parallel, when voltage is easily applied between the electrodes, there is The tendency to flow current to electricity is unstable, and the change in the resistance value at (4) 1 interface (4) is less clear, and some countermeasures are also expected. The present invention has been made in view of the above review, and an object of the invention is to provide an interface meter in which the upper layer (4) is a liquid having low electrolytic conductivity, and the lower liquid is heavier than the liquid in the upper layer. The storage tank or the reaction tank in which the upper liquid is mixed and the liquid is higher in conductivity than the liquid of the upper liquid can detect the liquid surface position corresponding to the interface between the upper body and the lower liquid with high precision. a 201140004 means for solving the problem. In order to achieve the above object, the present invention is an interface meter. In the first aspect, the interface meter includes a first electrode, a second electrode, an AC power source, and a detecting unit. The first electrode has a conductive probe that can be immersed in the interface between the first liquid and the second liquid and can be immersed in the first liquid and the second liquid, and the first liquid system is stored in the container as an electrolyte. The second liquid is stored in the container below the first liquid and is electrically conductive; the second electrode is disposed below the first electrode and is immersible in the first a liquid conductive probe; the AC power source is capable of freely supplying an alternating current between the probe of the first electrode and the probe of the second electrode; and the detecting unit is configured to flow according to the first electrode Calculating a resistance value between the needle and the probe of the second electrode to detect an interface between the first liquid and the second liquid; and setting the probe pair of the first electrode The contact area of the second liquid is such that the probe of the first electrode is placed while the probe of the second electrode is immersed in the second liquid while the alternating current is supplied from the alternating current power source. When the interface is traversed, a resistance step difference can be exhibited to the detecting portion. Further, in the second aspect of the present invention, in the first aspect, the contact area is SA (m2), and the contact resistance of the probe of the first electrode to the second liquid is ρ ι Ω. m2), The contact resistance coefficient pl is divided by the contact resistance coefficient ratio of the probe of the first electrode to the contact resistivity / 〇υ (Ω m 2 ) of the first liquid, and the above-mentioned first electrode is probed. When the probe of the second electrode and the probe of the second electrode are immersed in the state of the second liquid, the measurement resistance of the measurement system of the state of the 201140004 state is R 〇 ( Γ }), it is set to satisfy the following formula (number 1). Further, the third aspect of the present invention is the first or second aspect, wherein the front end of the probe of the first electrode is a cone, and the cone is The height of the body is smaller than the outer diameter or the long side of the bottom surface of the aforementioned cone. According to a fourth aspect of the present invention, in the first aspect to the third aspect, the front end portion of the probe of the first electrode is freely set to a plane parallel to the interface. Further, in a fifth aspect of the present invention, in the fourth aspect, the first electrode has a plurality of concavo-convex portions at a front end portion of the probe. According to a sixth aspect of the invention, in the first aspect to the fifth aspect, the front end portion of the probe of the first electrode is covered with an insulating member to the front end thereof. According to a seventh aspect of the invention, in the sixth aspect, the insulating member covering the end portion of the probe of the first electrode is provided with a notch portion corresponding to the plurality of concavo-convex portions. According to an eighth aspect of the invention, in the first aspect, the probe of the first electrode is connected to the conductive member of the first electrode, and the conductive member is covered with an insulating member. According to a ninth aspect of the present invention, in the eighth aspect, the outer surface of the insulating member covering the conductive member of the first electrode is flush with the outer surface of the probe of the first electrode. Further, in a tenth aspect of the present invention, in the first aspect to the ninth aspect, the maximum voltage of the 201140004 alternating voltage is smaller than the electrolysis voltage of the first liquid. Further, in the eleventh aspect of the invention, the first liquid is a molten salt containing molten zinc oxide, and the second liquid is a molten metal containing molten zinc. Further, in a twelfth aspect of the present invention, in the eleventh aspect, the frequency of the alternating current is in a range of 5 Hz or more and 500 Hz or less. According to a thirteenth aspect of the invention, the first aspect of the invention, wherein the probe of the first electrode is made of graphite. Advantageous Effects of Invention In the interface meter according to the first aspect of the present invention, since the contact area of the probe of the first electrode with respect to the second liquid is set, the probe of the second electrode is immersed while the alternating current is supplied from the alternating current power source. In the state of the second liquid, when the probe of the first electrode crosses the interface, the resistance difference can be exhibited to the detecting portion. Therefore, the upper layer liquid is stored as a liquid having low conductivity such as an electrolyte solution, and the lower layer liquid is heavier than the upper layer liquid. The liquid corresponding to the interface between the first liquid of the upper layer and the second liquid of the lower layer can be detected with high precision in a storage tank or a reaction tank of a two-layer structure liquid which is not mixed with the upper liquid and has a higher conductivity than the liquid of the upper liquid. Face position. Further, in the interface meter according to the second aspect of the present invention, since it is set to satisfy the formula (number 1), when the liquid level position corresponding to the interface between the upper layer liquid and the lower layer liquid is detected, it can be reliably obtained. The large value obtains the probe of the first electrode of the resistance step difference, and the liquid level position can be detected with high accuracy. Further, in the interface meter according to the third aspect of the present invention, since the front end of the probe of the first electrode is a cone, the height of the cone is smaller than the outer diameter of the bottom surface of the cone or the long side of the 201140004. When the interface between the first liquid of the upper layer and the second liquid of the lower layer is 'a change in the resistance value that is rushed', the liquid level position can be detected with high accuracy and high precision. Further, in the interface meter according to the fourth aspect of the present invention, since the tip end portion of the probe of the first electrode is freely set to be parallel to the plane, the probe passes through the first liquid of the upper layer and the second liquid of the lower layer. At the interface, 'the contact area of the probe can be increased instantaneously, and the more rapid change in the resistance value can be obtained', and the liquid level position can be detected with higher resolution and high precision. Further, in the interface meter according to the fifth aspect of the present invention, since the front end portion of the probe of the first electrode further has a plurality of concavo-convex portions, the fluctuation of the liquid surface position corresponding to the depth of the concavities and convexities can be absorbed, and the resistance value is The variation is included in a certain range, and the liquid level position corresponding to the interface can be detected with high resolution with high resolution. Further, in the interface meter according to the sixth aspect of the present invention, since the tip end portion of the probe of the first electrode is covered with the insulating member to the tip end thereof, the probe passes through the interface between the first liquid of the upper layer and the second liquid of the lower layer. In this case, the contact area of the probe can be increased more instantaneously, and a more rapid change in the resistance value can be obtained, and the interface position can be detected with higher resolution and high precision. Further, in the interface meter according to the seventh aspect of the present invention, the second liquid or the like can be provided from the insulating member covering the end portion of the probe at the front end of the first electrode corresponding to the plurality of concave and convex portions. The notch portion is discharged to the outside, and the position of the interface can be detected with high resolution with high resolution without being unnecessarily involved in the accumulation of a plurality of uneven portions. Further, in the interface meter according to the eighth aspect of the present invention, since the conductive member of the first electrode to which the first electrode is connected to the 201140004 pin is covered with the insulating member, it is possible to surely prevent the supply of unnecessary measurement current and the resistance of the detection. Value changes. Further, in the interface meter according to the ninth aspect of the present invention, since the outer surface of the insulating member covering the conductive member of the first electrode is flush with the outer surface of the probe of the first electrode, the first liquid and the lower layer are not formed. 2 The interface of the liquid creates unnecessary confusion, and the liquid level corresponding to the interface can be detected with high resolution with high resolution. Further, in the interface meter according to the tenth aspect of the present invention, since the maximum voltage of the AC voltage is set to be smaller than the electrolysis voltage of the first liquid, it is possible to surely prevent unnecessary electrolysis from occurring due to the measurement current when the interface is detected. Further, in the interface meter according to the eleventh aspect of the present invention, since the first liquid is a molten salt containing a molten gas, and the second liquid is a molten metal containing molten zinc, the molten vaporized zinc can be electrolyzed. The lower layer obtains the melt word, and the liquid level position corresponding to the interfaces can be detected with high resolution and high precision. Further, in the interface meter according to the twelfth aspect of the present invention, since the frequency of the alternating current is set to be 5 Hz or more and 500 Hz or less, when the front end of the probe of the first electrode is immersed in the first liquid or when crossing the interface The resistance value changes stably, and the interface position can be detected with high resolution and high precision. Further, in the interface meter according to the thirteenth aspect of the present invention, since the probe of the first electrode is made of graphite, the resistance value of the measurement system can be suppressed to a low value, and the detection can be performed with higher resolution and high precision. Interface location. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic view showing the structure of an interface meter according to an embodiment of the present invention. 10 201140004 A cross-sectional view showing a storage tank for storing liquid. The second diagram shows a graph of the resistance change curve measured by the interface meter of the present embodiment. Fig. 3A is a partial cross-sectional view showing the first electrode of the interface meter of the embodiment, and corresponds to a cross-sectional view taken along line A-A of Fig. 3B. Fig. 3B is a bottom view of the first electrode of the interface meter of the embodiment, and corresponds to the Z arrow view of Fig. 3A. Fig. 3C is a partial cross-sectional view showing a first electrode of a modification of the interface meter of the present embodiment, and corresponds to a B-B cross-sectional view of Fig. 3D. The 3D drawing is a bottom view of the first electrode of the present modification, and corresponds to the Z arrow view of the 3C. Fig. 4 is a graph showing a resistance change curve measured by an interface meter having electrodes shown in Figs. 3A and 3B, and a resistance change curve measured by an interface meter having electrodes shown in Figs. 3C and 3D, respectively. . Fig. 5A is a partial cross-sectional view showing the i-th electrode of another modification of the interface meter of the embodiment, which corresponds to a c-c cross-sectional view of Fig. 5B. Fig. 5B is a bottom view of the first electrode of the modification, and corresponds to the Z arrow view of Fig. 5A. Fig. 5C is a partial cross-sectional view showing the first electrode of another modification of the interface according to the present embodiment, which corresponds to the D_D cross-sectional view of Fig. 5D. Fig. 5D is a bottom view of the first electrode of this modification, and corresponds to a Z arrow view of Fig. 5C. Fig. 6A is a partial cross-sectional view showing the electrode of still another modification of the interface meter of the embodiment, which corresponds to the E_E cross-sectional view of Fig. 6B. 201140004 Fig. 6B is a bottom view of the first electrode of this modification, and corresponds to the Z arrow view of Fig. 6A. Fig. 6C is a partial cross-sectional view showing a first electrode of still another modification of the interface meter of the embodiment, and corresponds to a F-F cross-sectional view of Fig. 6D. Fig. 6D is a bottom view of the first electrode of this modification, and corresponds to a Z arrow view of Fig. 6C. I. Embodiment 3 Mode for Carrying Out the Invention Hereinafter, an interface meter according to an embodiment of the present invention will be described in detail with reference to the drawings. In addition, in the figure, the X-axis and the Z-axis constitute a vertical intersecting coordinate system, and the direction of the Z-axis is a vertical upper and lower direction. Fig. 1 is a schematic cross-sectional view showing the structure of the interface meter of the present embodiment, and also shows a storage tank for storing liquid. Further, Fig. 2 is a graph showing a resistance change curve measured by the interface meter of the present embodiment. As shown in Fig. 1, the apparatus S of the present embodiment includes an interface meter 10 and a storage tank 20 for freely storing liquid. The apparatus S may be a storage device that stores only liquid, or may be an electrolysis device that uses one of the electroplating electrodes, which is an electrolysis device for electrolysis, to liquefy zinc and gas. When the device S is an electrolysis device, the storage tank 20 is an electrolytic reaction vessel. The interface meter 10 includes a first electrode 30, a second electrode 40 disposed below the first electrode 30, and the first electrode 30 and the second electrode 40 connected to the first electrode 30 and the second electrode 40 via the power supply lines 50a and 50b, and an alternating voltage is applied thereto. The AC power source 50 that causes the AC current to flow is an AC current meter 60 that is connected to the supply line 50a to measure the AC current flowing from the AC power source 50 to the first electrode 30 and the second electrode 40. Melon electric 々丨 L. The AC current value measured at twentieth 60 is subjected to data processing, and the degree of change in the resistance value 彳 * money resistance value is calculated, and the interface position between the two kinds of liquids is detected, and is connected to the detecting portion 70 of the alternating current meter 6 。. Further, the detecting unit 7A has an arithmetic unit, a memory, and the like which are omitted from the drawings. Specifically, the details of the first electrode 30 will be described later. The electrode portion 32 having a structure in which a rod-shaped conductive member is surrounded by an insulating protective tube and an arrow 51 probe 34 composed of a conductive member are provided. Specifically, in the first electrode 3 (), the protective tube of the electrode portion is a cylindrical insulating member and covers the periphery of the rod-shaped conductive member, so that unnecessary measurement current is not supplied, and the measured resistance value does not change. . Further, the probe 34 is connected to the protective tube of the electrode portion 32 and the outer surface of the upper portion of the conductive member in a cylindrical shape in the same plane as the outer surface of the protective tube, and has a conical tip end portion which is tapered. On the other hand, the second electrode 4A has the electrode portion 42 and the probe 44, and the entire length of the electrode portion 42 in the vertical direction is set to be longer than the electrode portion 32 of the i-th electrode 30, and has the same function as the first electrode 3. The electrode portion 32 and the probe 34 have the same structure. Further, the storage tank 20 is typically made of graphite, and the heating means for omitting the drawing is kept at 500 ° C, and the molten vaporized zinc 22 is accumulated therein, and the refining word 24 generated by electrolysis is formed therein. Since the specific gravity of the gasification at 500 °C is 2.4, and the specific gravity of zinc is 6.4, the two liquids of molten zinc oxide 22 and molten zinc 24 are formed to be separated from each other, and the molten zinc oxide 22 is used as the upper layer, and the melting word 24 is The second layer of the lower layer is constructed of liquid. Here, the detecting unit 70 detects the interface between the smelting zinc oxide 22 and the melting word 24. Further, the two-layer structure liquid is not limited to the molten chlorination 22 and the melamine 24, as long as the upper liquid is a liquid such as a molten salt having low conductivity such as an electrolytic solution, and the non-layer liquid is heavier than the upper liquid and does not. It is necessary to mix, and the conductivity of 201140004 is higher than that of the molten metal of the upper liquid. In addition, when the molten zinc oxide is used as an electrolyte, electrolysis is performed to obtain a two-layer structure liquid composed of molten zinc oxide 22 and molten zinc 24, and a supporting electrolyte such as lithium vapor or potassium vapor is used. In this case, it is also possible to mix the vaporized zinc oxide 22 and the molten zinc 24 with the vaporized lithium or the vaporized potassium. The plate needle 34 of the first electrode 30 and the probe 44 of the second electrode 40 can enter a two-layer structure liquid composed of the molten vaporized zinc 22 and the molten zinc 24. More specifically, the first electrode 30 is disposed in a state where the probe 34 is freely traversed in the molten vaporized tungsten 22 and the rising interface 26 of the molten metal 24 generated by the electrolysis thereof, and the second electrode 40 is provided with the probe 44. It is completely freely impregnated and placed in a state of being fixed from the molten zinc 24 produced by the molten zinc oxide 22 electrolysis. Further, when the position of the interface 26 of the molten vaporized zinc 22 and the molten zinc 24 is constant, it is also possible to move the probe 34 of the second electrode 30 so as to pass through the interface 26. Further, the direction in which the probe 34 relatively passes through the interface 26 is the vertical direction intersecting the direction of the interface 26 in the vertical direction, and the AC power source 50 applies an alternating voltage to the first electrode 3'' and the second electrode 40'. AC current flow. The reason why the AC power supply 5 使用 is used as the measurement power source is as follows. The reason for this is that since the molten zinc oxide 22 is an electrolyte, a DC voltage is applied, and when a DC current flows, the current measurement value is unstable, and the current measurement value is unstable. Thus, when an alternating voltage is applied to cause the alternating voltage to flow, a stable current measurement value can be obtained. Further, the maximum voltage of the alternating voltage is set to be smaller than the electrolytic voltage of the molten chlorination 22, so that the molten zinc carbide 22 does not cause unnecessary electrolysis. The frequency of the alternating current applied from the alternating current power source 50 is preferably in the range of 5 Hz to 14 201140004 and less than 500 Hz. More specifically, 'the lower limit of the frequency of the applied alternating current, the lower the frequency of the applied alternating current, the greater the resistance value corresponding to the measured current value, from the molten zinc chloride 22 and the molten zinc 24 It is preferable from the viewpoint that the difference in the resistance values obtained in the interface 26 can be relatively large, and since it is practically impossible to obtain a stable current measurement value when the frequency is less than 5 Hz, it is preferably 5 Hz or more. On the other hand, regarding the upper limit of the frequency of the alternating current thus applied, the higher the frequency of the applied alternating current, the more stable the current measurement value is obtained, which is preferable, and when it is a frequency exceeding 500 Hz, it corresponds to The measured value of the current value is significantly reduced, and the difference in the resistance value obtained at the interface 26 between the molten zinc oxide 22 and the molten zinc 24 is relatively small, and electromagnetic shielding is required for the detecting portion 70 or the like, or an alternating current source 50 or an alternating current is required. The 60 is a special one, and there is a tendency to be expensive, so it is preferably 500 Hz or less. Furthermore, from the viewpoint of being able to use an AC power source 50 or an AC current meter 60 which is relatively inexpensive and highly reliable, the frequency of the applied alternating current is 5 Hz or more, and the range of 100 Hz or less is realistic. More suitable. Then, in the above configuration, when the probe 34 of the first electrode 3 is immersed in the smelting zinc oxide 22, the probe 44 of the second electrode 40 is immersed in the molten zinc 24. When the AC power source 50 applies an AC voltage and the AC current flows, since the conductivity of the word is greater than the conductivity of the gasification word by about 5 digits, the path of the current flowing is detected by the third electrode in the up and down direction. The interface between the front end of the needle 34, the interface 26 of the molten zinc oxide 22 and the smelting zinc 24 at the shortest distance, and the interface between the molten zinc oxide 22 and the molten zinc 24 in the oblique direction: 26. The front end portion of the probe 44 of the second electrode 4 is formed by a path in the molten zinc 24 which is connected at a short distance of 15 201140004. Further, when both the probe 34 of the first electrode 30 and the probe 44 of the second electrode 40 are immersed in the molten zinc 24, an alternating current voltage is applied from the alternating current power source 5, and an alternating current flows and flows. The path of the current is constituted by a path in the molten zinc 24 in which the probe 34 of the first electrode 30 and the probe 44 of the second electrode 40 are connected by the molten zinc 24. Here, in a state where the probe 44 of the second electrode 40 is immersed in the molten zinc 24, the first electrode 30 is relatively moved to the lower side, and the first! Electrode 3 〇 probe

34之前端部與熔融氣化鋅22及熔融鋅24之界面26之距離L 一面相對地變化時,依據交流電流計6〇所測定之電流值, 檢測部7 0求出之電阻變化曲線呈現如第2圖以實線所示之 輪廓〇此外,在第2圖,橫軸顯示第1電極3〇之探針34之前 端部與熔融氣化辞22及熔融鋅24之界面26的距離L,以距離 L之值0為分界,在圖中右側區域,距離l之值為正,及在圖 中左側區域,距離L之值為負。又,在第2圖中,縱軸顯示 檢測部70依據交流電流計60所測定之電流值求出之電阻值 R。 此電阻變化曲線C在距離L之值為0與〇之負側附近間, 具有陡峭地變化之電阻段差輪廓C1,在其兩旁,有輪廓(:2 及C3 〇 具體言之,在如距離L取負之值之第1電極3〇之探針34 之前端部完全浸潰於熔融鋅24内之狀態下,檢測部7〇求出 之電阻值顯示按照第1電極30之探針34之前端部與第2電極 40之探針44之前端部之距離之值的輪廓C2,若此探針34、 201140004 44之前端部間之水平方向之距離充分大於該等間之上下方 向之距離時,便形成於熔融鋅24顯現之電阻值加上第1電極 30、第2電極4〇及供電線5〇&、5〇b之電阻值之實質一定之固 有值R〇。因此固有之電阻值R〇係當訂定第1電極3〇之探針34 之前端部及第2電極40之探針44之前端部間的距離或下層 液體之種類時’之後,以第1電極30、第2電極40及供電線 50a、50b之電阻值訂定者,故便稱為與下層液體相關之測 定系統之固有電阻值。此外,於此固有電阻值有梯度等時, 可將距離L之值從負接近0之〇附近的值視為與下層液體相 關之測定系統之固有電阻值。 另一方面,在如距離L取正之值之第1電極3〇之探針34 之前端部完全浸潰於熔融氣化鋅22内之狀態下,檢測部70 求出之電阻值顯示與距離L成比例變化之輪廓C3,此時之比 例常數對應於熔融氣化鋅22顯現之電阻值。 接著’在諸如距離L取0與〇之負側附近之間之第1電極 30之探針34之前端部位於熔融氣化辞22及熔融鋅24之界面 26附近的狀態下,檢測部7〇求出之電阻值顯現輪廓ci,該 輪靡C1係在第1電極3〇之探針34之前端部完全浸潰於熔融 鋅24内之狀態之固有電阻值R〇與第1電極3〇之探針34之前 端部在完全浸潰於熔融氣化鋅22内之狀態,接近界面26時 之電阻RE間陡峭地變化者。又,於如此距離L取〇與〇之負側 附近之間時,更詳細地分析此輪麻C1 ,輪廓C1為按電阻值 R〇與電阻值RE之差之電阻段差AR,陡峭地變化之曲線,同 時’亦呈現坡度AL。 17 201140004 在此,因檢測部70按2種液體間之電阻值變化之程度, 檢測該等間之界面位置’故第1電極3〇之探針34之前端部穿 越炫融氣化鋅22及熔融辞24之界面26之際,使檢測部70求 出之電阻值按為電阻值RG與電阻值以之差之電阻段差 △R,如此陡峭地變化時,檢測部7〇可確實地檢測可說是不 連續地變化之電阻段差AR之存在,而可檢測界面26之位 置。 亦即,若於熔融鋅24之上方,熔融氣化鋅22不存在, 僅有大氣時’第1電極30之探針34之前端部從完全浸潰於熔 融鋅24内之狀態移動至大氣内時,由於檢測部70求出之電 阻值從RG如輪廓C’所示般,往無限大變化,故利用其電阻 值變化,檢測界面26之位置極為容易。相對於此,於熔融 鋅24之上方存在熔融氣化鋅22之2層構造液體由於檢測部 70需利用電阻段差AR,檢測界面26之位置,故對檢測部70 要求採用可使電阻段差AR確實地顯現之結構。 在此,進一步,就此特性之電阻變化曲線C加以檢討, 可知電阻段差AR係因第1電極30之探針34之前端部對熔融 氣化鋅之接觸電阻係數pzncl大於第1電極30之探針34之前 端部對熔融鋅24之接觸電阻係數pzn而產生。在此,接觸電 阻係數(Ω . m2)規定為將接觸電阻(Ω)與接觸面積(m2)相乘 之值。 一般在2層構造液體中,位於上方之電極之探針之前端 部對下層液體之接觸電阻係數pL除以此電極之探針之前 端部對上層液體之接觸電阻係數p u之接觸電阻係數比 18 201140004 h( p l/ !〇 u)係依據位於上方之電極之探針之材料形狀等 結構或其料之㈣之麵來蚊者。此種情況在2層構造 液體之上層液體22為電解液等導電性低之液體,2層液體之 下層液體24比重較上層液體22重,不與上層液體22不必要 地犯〇,且導電性較上層液體22高之液體時亦相同,更詳 細檢討,可知若此接觸電阻係數比h為5以上左右時,藉進 一步加進追加之條件,可提高上層液體與下層液體之界面 檢測之解析度,而對檢測部7〇顯現電阻段差Λκ,亦即,實 際上,檢測部70可檢測電阻段差Δκ。又,一般當此接觸電 阻係數比h增大時,電阻段差AR便增大,反之,有坡度AL 亦增大之傾向。 是故,具體言之,2層構造液體使用熔融氣化鋅22及熔 融鋅24,探針34、44使用石墨時,第1電極30之探針34之前 端部對熔融鋅2 4之接觸電阻係數p z n除以第丨電極3 〇之探針 34之前端部對熔融氣化鋅22之接觸電阻係數ρ之接觸電 阻係數比h(=pzn/pzne|)可取得2〇左右之值,故可獲得電阻 變化曲線C,該電阻變化曲線c係對檢測部7〇顯現電阻段差 △R,而電阻段差AR雖會增大到某一程度,但在反面坡度 △L亦出現達某程度者。 亦即,如此有電阻段差AR大至某程度,而坡度亦 增大之傾向時,首先,需劃定用以更明確地獲得作為前提 之電阻段差AR,以提高上層液體與下層液體之界面檢測之 解析度之結構、亦即可對檢測部70使電阻段差AR顯現之結 構0 201140004 是故,進一步進行檢討,可知當接觸電阻係數比}1為5 以上時,若電阻段差為測定系統之固有之電阻值之 1/5以上之較大值時,檢測部70可檢測2層構造液體之界 面。然後,亦可知要如此使電阻段差AR採電阻值化之1/5 以上之較大值,刖提係將第1電極3〇之探針34之前端部對下 層液體之接觸面積SA設定為較小值。亦即,由於若可將第工 電極30之探針34之前端部對下層液體之接觸面積SA設定較 小時,電阻段差AR可形成為電阻值Rg之1/5以上之較大 值,而可對檢測部70確實地顯現電阻段差,故首先劃定 此種接觸面積SA。在此,第1電極30之探針34之前端部對下 層液體之接觸面積SA係指前端部為圓錐時,為此圓錐之外 面之表面積。又,此接觸面積SA亦為與第1電極3〇之探針34 之前端部對上層液體之接觸面積實質相等者。 具體言之,當2層構造液體之上層液體22為電解液等導 電性低之液體’ 2層液體之下層液體24為比重較上層液體22 重,不致不必要地與上層液體22混合,且導電性高於上層 液體22之液體時,關於第1電極3〇之探針34之前端部對下層 液體24之接觸面積SA(m2) ’可知使用此電極3〇之探針34之 前端部對下層液體24之接觸電阻係數· m2)除以此電 極30之探針34之前端部對上層液體22之接觸電阻係數 ρ υ(Ω · m2)之接觸電阻係數比h、此電極3〇之探針34之前端 部對下層液體24之接觸電阻係數p l(q . m2)、以及第1電極 30之彳未針34之刖端部及第2電極40之探針44之前端部完全 浸潰於熔融鋅24之狀態之測定系統的固有電阻值r〇( q ),訂 20 201140004 定接觸面積SA,以滿足下式(數2)時,可以純—之方針束 出諸如電阻段差△可取電阻值仏之1/5以上之較大值,並對 檢測部70確實地顯現電阻段差AR的接觸面積sa。在此, 探針34之前端狀接觸面積SA為此前料之外面之接觸面 積。此外,亦確認了式(數2)對電解時之支撐電解質之有無 不致實質影響。 數2 (SA * h) ^ (pL/R0) 如此,當訂定第1電極3 〇之探針3 4之前端部對下層液體 24之接觸面積SA時’維持此接觸面積SA,探針%之前端部 之^/狀係可自由變更者。舉例言之,當令探針34為箭頭型 時,可將其外控增大’高度(上下方向之長度)縮短等自由調 整形狀。 又’要同時相對於關於下層液體24之測定系統之固有 電阻值R〇 ’將電阻段差纽設定為較大值,因只要可將此電 阻值R〇6又疋為較小值即可’故第1電極3〇之探針34之材料也 適合採用抗高溫之熔融氯化鋅22或熔融辞24 ,且電阻低之 材料之石墨。 然後’要對檢測部70使電阻段差AR更明確地顯現,需 進行坡度AL為更小之值之設定,因此,需就第丨電極3〇之 探針34之構造作檢討。亦即,特別就此探針34之前端部之 形狀洋細地檢討。 第3A圖係本實施形態之界面計之第1電極的部份截面 圖’相當於第3B圖之A-A截面圖,第3B圖係此電極之底面 21 201140004 圖,相當於第3A圖之z箭號視圖。又,第3c圖係本實施形 態之界面計之變形例之第丨電極的部份截面圖,相當於第31) 圖之B-B截面圖,第3D圖係此電極之底面圖,相當於第3(: 之Z箭號視圖。又,第4圖係分別顯示以該等界面計測定之 電阻變化曲線之圖表。 首先,就在此之前所說明之第1電極30作檢討,如第3A 圖及第3B圖所示,電極部32之棒狀之導電構件321)為鐵製, 電極部32之保護管32&為覆蓋導電構件321)之圓筒狀氧化鋁 製’外徑為8mm,且’探針34為上下方向全長係1〇mm之石 墨製箭頭型,連接於電極部32之保護管32a及導電構件32b 之上部係與保護管32a為同平面,俾不致於熔融氣化鋅22及 熔融辞24之界面產生不必要之混亂,且外徑為8mm圓柱 狀,且,前端部34a係頂角為60。而形成尖細之圓錐狀。 使用此結構之第1電極30時’檢測部7〇依據交流電流計 6 0所測定之電流值所求出之電阻變化曲線之詳細輪廓顯示 於第4圖之輪廓CA。此電阻變化曲線CA與第2圖所示之電阻 變化曲線C相同,根據此曲線CA,可知探針34之前端部34a 位於熔融氣化鋅22及熔融鋅24之界面26 ,探針34之前端部 34a至界面26之距離L之值為0時,雖然產生左右之電阻 段差,但在距離L之負側,坡度拉長而圓鈍。此現象視為因 探針34之前端部34a之圓錐外面比較平滑地穿越界面26而 產生者,為使界面檢測之解析度降低之主要原因。 亦即’令第1電極30之探針34之前端部34a為圓錐狀 時,若扁平化成使圓錐之頂角增大,圓錐之上下方向之高 22 201140004 度小於底面之直徑,由於前端部34a之圓錐外面玎更迅速穿 越界面26,故可獲得急遽之電阻值之變化,玎更減低坡度, 而可&咼界面檢測之解析度。此外,此探針Μ之前端部34a 不限於圓錐狀,亦可為其他三角錐等錐體狀,此時,扁平 化成錐體之上下方向之高度小於底面之大小,亦即小於底 面之長邊及對頂角間之距離即可。 是故,進一步發展此結構,如第3C圖及第3〇圖所示之 第1電極130般,採用下述結構,前述結構係電極部32之結 構與第1電極30相同,探針ι34為連接於電極部32之保護管 32a及導電構件32b之圓柱狀係與第1電極3〇之探針34相 同,而其則端部134a更扁平化,為諸如高度為〇之垂直於上 下方向之平面狀者。 使用此結構之第1電極13〇時,檢測部7〇依據交流電流 計60所測定之電流值所求出之電阻變化曲線之詳細輪廓顯 示於第4圖之輪廓CB。根據此電阻變化曲線CB ,探針 之刖端部134a位於界面26,探針134之前端部13乜至界面% 之距離L之值為〇時’其負側之坡度更小,]Ω之電随段差幾 乎不圓鈍㈣確地產生。此視為因下述之故,卩卩,因探針 134之前端部i34a扁平化,而為垂直於上下方向,亦即平行 於界面26之平面狀,而可瞬間於上下方向穿越界面%,而 瞬間增大探針134之接觸面積,而可獲得更急遽之電限值之 變化,有助於使界面檢測之解析度更提高。 又,當如此使用探針134之前端部134&扁平化而為平面 狀之第1電極130時’由於探針134之前端部⑽為瞬間穿越 23 201140004 熔融氣化鋅22及熔融鋅24之界面26者,故可使界面檢測之 解析度更提高,另一方面,亦有呈界面26泛起波紋等之混 亂狀態’業經交流電流計60所測定之電流不必要地變動, 界面檢測自身不穩定之情形。是故,需就不致形成界面26 泛起波紋等之混亂狀態之探針134之前端部134a的形狀,詳 細檢討。 第5 A圖係本實施形態之界面計之另一變形例之第1電 極的部份截面圖’相當於第5B圖之C-C截面圖,第5B圖係 此電極之底面圖,相當於第5A圖之Z箭號視圖。 如第5A圖及第5B圖所示之第1電極230般,採用下述結 構’前述結構係電極部32之結構與第1電極30相同,探針234 為連接於電極部32之保護管32a及導電構件32b之圓柱狀係 與第1電極30相同,而其前端部234a設有複數個圓錐部者。 若為此結構,由於設於探針234之前端部234a之複數個圓錐 部對炫融氣化鋅22及熔融鋅24之界面26,形成細微之緩衝 構造,可一面吸收波紋等,一面穿越界面26,故可使界面 檢測呈穩定之狀態,而可使其解析度更提高。 又’亦可將探針134之前端部134&扁平化,而為平面狀 之第1電極130之結構進一步發展,令探針134之前端部13如 為更瞬間地穿越熔融氣化鋅22及熔融鋅24之界面26之結 構’而可使界面檢測之解析度更提高。 第5C圖係本貫施形態之界面計之另一變形例之第1電 極的部份載面圖,相當於第5D圖之ϋ-D截面圖,第5D圖係 此電極之底面圖,相當於第5C圖之z箭號視圖。 24 201140004 亦即,如第5C圖及第5D圖所示之第丨電極33〇般,採用 :述結構,前述結構係電極部32之結構與第i電極3_同, 探針334為連接於電極部32之保護管32&及導電構件32b之 圓柱狀,其前端部334a扁平化,而為於上下方向平行之平 面狀係與第1電極130相,再者,此前端部334a以延長電 極。卩32之保護官32a之氧化鋁等絕緣材製保護管33扑包圍 至與其前端在同平面為止者。藉此結構,探針334之前端部 334a可更瞬間地於上下方向穿越熔融氣化辞22及熔融鋅% 之界面26,電阻值之變化更清楚,而可使界面檢測之解析 度更提尚。此外,此前端部334a之保護管334b可與電極部 32之保護管32a設成一體,亦可設成獨立體。 又,亦可組合以上結構,一面吸收熔融氣化鋅22及熔 W鋅24之界面26之波紋等混亂,一面使界面檢測之解析度 更提高。 第6 A圖係本實施形態之界面計之又另一變形例之第i 電極的部份截面圖,相當於第6B圖之E-E截面圖,第όΒ圖 係此電極之底面圖,相當於第6Α圖之ζ箭號視圖。又,第 6C圖係本實施形態之界面計之又另一變形例之第丨電極的 部份截面圖,相當於第6D圖之F-F截面圖,第6D圖係此電 極之底面圖’相當於第6C圖之Ζ箭號視圖。 亦即’如第6Α圖及第6Β圖所示之第1電極430般,可採 用下述結構’前述結構係電極部32之結構與第1電極30相 同,探針434為連接於電極部32之保護管32a及導電構件32b 之圓柱狀’以保護管334b包圍至前端部434a係與第1電極 25 201140004 330相同,再者,於前端部434a設有複數個圓錐部者,亦可 如第6C圖及第6D圖所示,採用下述結構,前述結構係電極 部32之結構與第1電極30相同’探針534為連接於電極部32 之保護管32a及導電構件32b之圓柱狀,以保護管334b包圍 至前端部534a係與第1電極330相同,再者,於前端部534a 設有複數個凸部者。又,在此第1電極430、530之保護管334b 之端部,對應於設在前端部434a、534a之複數個圓錐部或 複數個凸部,以具體為與該等上下方向之高度相同之程度 或較大之長度,形成有於上下方向延伸之缺口 334c,以將 熔融鋅24從缺口 334c自由排出至外部,俾使熔融鋅24不致 不必要地捲入至複數個圓錐部或複數個凸部間而積存。此 缺口 334c在圖中以以相同之大小相對之一對顯示,亦可以 所期之大小或配置圖形設複數個。 在此第1電極430或第1電極530中,由於形成為緩衝構 造’該緩衝構造係設於探針434之前端部434a之複數個圓錐 部或設於探針534之前端部534a之複數個凸部一面對熔融 氣化辞22及熔融辞24之界面26吸收波紋等混亂,一面更瞬 間穿越者,故可使界面檢測呈穩定之狀態,而使其解析度 進一步提高。 此外,第1電極230、430及530之探針234、434及534之 前端部234a、434a及534a之細微之緩衝構造不限於複數個 圓錐或複數個凸部,可採用細微之凹凸形狀,該凹凸形狀 之大小等可按界面檢測必要之解析度,適當自由設定。 又,第1電極30、130、230、330、430、530為以探針 26 201140004 34、134、234、334、434、534在熔融氣化鋅22與從此電解 生成之炫融鋅24之界面26自由橫越之狀態固定而配置之結 構’舉例言之,亦可為在一直固定第2電極40之狀態下,將 第1電極30、130、230、330、430、530以一定週期上下自 由來回移動之結構,而於界面26之位置變化時,可檢測其 位置。 根據以上之結構,在一面從交流電源供給交流電流, 一面在第2電極之探針浸潰於第2液體之狀態下,第1電極之 探針穿越界面之際,以檢測部取得之電阻變化曲線中,由 於設定第1電極之探針對第2液體之接觸面積,俾使第丨電極 之探針之位置從第2液體側越接近界面,電阻變化曲線之梯 度越大,故在積存有上層液體為電解液等導電性低之液 體,下層液體為比重較上層液體重,不與上層液體不必要 地混合,且導電性較上層液體高之液體的2層構造液體的儲 存槽或反應槽中,可以高精確度檢測對應於上層第丨液體與 下層第2液體之界面之液面位置。 此外’在本發明中’構件之種類、配置、個數等不限 於前述實施形態,可將該構成要件適當置換成發揮同等之 作用效果者等在不脫離發明之要旨之範圍當然可適當變 更。 產業上之可利用性 如以上,在本發明,可提供下述界面計,前述界面計 係在積存有上層液體為電解液等導電性低之液體,下層液 體為比重較上層液體重,不致與上層液體不必要地混合, 27 201140004 且導電性較上層液體高之液體的2層構造液體的儲存槽或 反應槽中,可以高精確度檢測對應於上層液體與下層液體 之界面之液面位置者,而可期待因其通用普遍之性質,而 可廣泛地應用於以此種2層構造液體為對象之界面計者。 C圖式簡單說明3 第1圖係顯示本發明實施形態之界面計之結構的示意 截面圖,亦顯示儲存液體之儲存槽。 第2圖係顯示以本實施形態之界面計測定之電阻變化 曲線之圖表。 第3A圖係本實施形態之界面計之第1電極的部份截面 圖,相當於第3B圖之A-A截面圖。 第3B圖係本實施形態之界面計之第1電極的底面圖,相 當於第3A圖之Z箭號視圖。 第3C圖係本實施形態之界面計之變形例之第1電極的 部份截面圖,相當於第3D圖之B-B截面圖。 第3D圖係本變形例之第1電極之底面圖,相當於第3C 之Z箭號視圖。 第4圖係分別顯示以具有第3A圖及第3B圖所示之電極 之界面計測定之電阻變化曲線、以及以具有第3C圖及第3D 圖所示之電極之界面計測定之電阻變化曲線的圖表。 第5A圖係本實施形態之界面計之另一變形例之第1電 極的部份截面圖,相當於第5B圖之C-C截面圖。 第5B圖係此變化例之第1電極之底面圖,相當於第5A 圖之Z箭號視圖。 28 201140004 第5 C圖係本實施形態之界面計之另一變形例之第1電 極的部份截面圖,相當於第5D圖之D-D截面圖。 第5D圖係此變形例之第1電極的底面圖,相當於第5C 圖之Z箭號視圖。 第6A圖係本實施形態之界面計之又另一變形例之第1 電極的部份截面圖,相當於第6B圖之E-E截面圖。 第6B圖係此變形例之第1電極的底面圖,相當於第6A 圖之Z箭號視圖。 第6C圖係本實施形態之界面計之又另一變形例之第1 電極的部份截面圖,相當於第6D圖之F-F截面圖。 第6D圖係此變形例之第1電極的底面圖,相當於第6C 圖之Z箭號視圖。 【主要元件符號說明】 10.. .界面計 20.. .儲存槽 22···熔融氣化鋅(上層液體) 24···熔融鋅(下層液體) 26.. .界面 30 , 130 , 230 , 330 , 430 , 530 ...第1電極 32,42...電極部 32a,334b...保護管 32b...導電構件 34,44,134,234,334,434 ’ 534...探針 34a,134a,234a,334a,434a, 534a...則端部 40…第2電極 50.. .交流電源 50a,50b...供電線 60 ·..父流電流計 70.. .檢測部 334c...缺口 5.. .裝置 29When the distance L between the front end portion of the 34 and the interface 26 of the molten zinc oxide 22 and the molten zinc 24 is relatively changed, the resistance change curve obtained by the detecting portion 70 is expressed as follows according to the current value measured by the alternating current meter 6? 2 is a contour line indicated by a solid line. In addition, in FIG. 2, the horizontal axis shows the distance L between the end portion of the probe 34 of the first electrode 3A and the interface 26 of the molten gasification word 22 and the molten zinc 24, The value of the distance L is 0. In the right area of the figure, the value of the distance l is positive, and in the left area of the figure, the value of the distance L is negative. Further, in Fig. 2, the vertical axis indicates the resistance value R obtained by the detecting unit 70 based on the current value measured by the alternating current meter 60. The resistance change curve C has a steeply varying resistance step profile C1 between the value of the distance L and the negative side of the 〇, on both sides thereof, there are contours (: 2 and C3 〇 in particular, at a distance L In the state where the front end portion of the probe 34 of the first electrode 3A having a negative value is completely immersed in the molten zinc 24, the resistance value obtained by the detecting portion 7 is displayed in front of the probe 34 of the first electrode 30. The contour C2 of the distance between the portion and the front end portion of the probe 44 of the second electrode 40, if the distance between the front end portions of the probes 34 and 201140004 44 is sufficiently larger than the distance between the upper and lower directions, The resistance value formed by the molten zinc 24 is added to the specific value R 〇 of the resistance values of the first electrode 30, the second electrode 4 〇, and the power supply lines 5 〇 & 5 〇 b. Therefore, the inherent resistance value is obtained. When the distance between the front end of the probe 34 of the first electrode 3 and the front end of the probe 44 of the second electrode 40 or the type of the lower liquid is set, the first electrode 30 and the second electrode are used. The resistance value of the electrode 40 and the power supply lines 50a, 50b is determined, so it is called the measurement system related to the lower layer liquid. In addition, when the inherent resistance value has a gradient or the like, the value of the distance L from the vicinity of the negative value close to 0 can be regarded as the inherent resistance value of the measurement system related to the lower layer liquid. When the front end portion of the probe 34 of the first electrode 3A having the positive value of the distance L is completely immersed in the molten vaporized zinc 22, the resistance value obtained by the detecting portion 70 shows a contour which changes in proportion to the distance L. C3, the proportional constant at this time corresponds to the resistance value exhibited by the molten vaporized zinc 22. Next, 'the front end of the probe 34 of the first electrode 30 between the negative side of the distance L and 0 is located at the molten gas. In the state in which the interface 22 and the molten zinc 24 are in the vicinity of the interface 26, the resistance value obtained by the detecting portion 7A exhibits a contour ci, and the rim C1 is completely immersed in the end portion of the probe 34 of the first electrode 3〇. The intrinsic resistance value R〇 in the state of the molten zinc 24 and the state in which the front end portion of the probe 34 of the first electrode 3 is completely immersed in the molten zinc oxide 22, and the resistance RE in the vicinity of the interface 26 are steeply changed. In addition, when the distance L is between the vicinity of the negative side of the 〇 and 〇, it is more detailed. The ground hemp C1 is analyzed, and the contour C1 is a resistance step AR which is a difference between the resistance value R 〇 and the resistance value RE, which is steeply changed, and 'also exhibits a gradient AL. 17 201140004 Here, the detecting unit 70 presses 2 The degree of change in the resistance value between the liquids is detected, and the position of the interface between the electrodes is detected. Therefore, the front end of the probe 34 of the first electrode 3〇 passes through the interface 26 of the molten zinc oxide 22 and the melted remark 24, so that the detection is performed. When the resistance value obtained by the unit 70 is a resistance step ΔR which is a difference between the resistance value RG and the resistance value, the detection unit 7 确实 can surely detect the resistance step difference AR which can be said to be discontinuously changed. There is, and the location of the interface 26 can be detected. That is, if the molten zinc oxide 22 is not present above the molten zinc 24, the front end of the probe 34 of the first electrode 30 moves from the state completely immersed in the molten zinc 24 to the atmosphere only when the atmosphere is present. At this time, since the resistance value obtained by the detecting unit 70 changes infinitely from RG as indicated by the contour C', it is extremely easy to detect the position of the interface 26 by changing the resistance value. On the other hand, in the two-layer structure liquid in which the vaporized zinc oxide 22 is present above the molten zinc 24, since the detecting portion 70 needs to use the resistance step difference AR to detect the position of the interface 26, it is required for the detecting portion 70 to use the resistance step difference AR. The structure of the ground. Further, in reviewing the resistance change curve C of this characteristic, it is understood that the resistance step difference AR is because the contact resistance coefficient pzncl of the front end portion of the probe 34 of the first electrode 30 to the molten vaporized zinc is larger than that of the probe of the first electrode 30. The front end portion of 34 is generated by the contact resistance coefficient pzn of the molten zinc 24. Here, the contact resistance coefficient (Ω m 2 ) is defined as a value obtained by multiplying the contact resistance (Ω) by the contact area (m2). Generally, in the two-layer construction liquid, the contact resistance coefficient pL of the front end portion to the lower layer liquid of the probe of the upper electrode is divided by the contact resistance coefficient ratio of the contact resistance coefficient pu of the front end portion of the electrode to the upper layer liquid. 201140004 h( pl / !〇u) is based on the shape of the material of the probe located above the electrode or the structure of the material (4). In this case, the liquid 22 in the upper layer of the two-layer structure liquid is a liquid having low conductivity such as an electrolyte, and the liquid layer 24 of the lower liquid layer of the two layers is heavier than the liquid 22 of the upper layer, and is not unnecessarily smashed with the upper liquid 22, and is electrically conductive. The liquid is higher than the upper liquid 22, and in more detail, if the contact resistivity ratio h is about 5 or more, the resolution of the interface between the upper liquid and the lower liquid can be improved by further adding additional conditions. On the other hand, the detecting portion 7A exhibits a resistance step Λκ, that is, the detecting portion 70 can actually detect the resistance step Δκ. Further, generally, when the contact resistance coefficient ratio h is increased, the resistance step difference AR is increased, and conversely, the slope AL is also increased. Therefore, specifically, the two-layer structure liquid uses molten zinc oxide 22 and molten zinc 24, and when the probes 34 and 44 use graphite, the contact resistance of the front end of the probe 34 of the first electrode 30 to the molten zinc 2 4 The coefficient pzn divided by the contact resistance coefficient ratio h (=pzn/pzne|) of the contact resistance coefficient ρ of the melted vaporized zinc 22 at the front end of the probe 34 of the third electrode 3 可 can obtain a value of about 2 ,, so A resistance change curve C is obtained. The resistance change curve c exhibits a resistance step difference ΔR to the detecting portion 7〇, and the resistance step difference AR increases to a certain extent, but the reverse slope ΔL also appears to a certain extent. That is, when there is a tendency that the resistance step difference AR is large to a certain extent and the slope is also increased, first, it is necessary to delineate the resistance step difference AR which is used as a premise to improve the interface detection between the upper layer liquid and the lower layer liquid. The structure of the resolution can be obtained by the detection unit 70 having the structure of the resistance step AR 0 201140004. Further, when the contact resistance coefficient ratio is 1 or more, the resistance step is inherent to the measurement system. When the resistance value is greater than 1/5 of the resistance value, the detecting unit 70 can detect the interface of the two-layer structure liquid. Then, it is also known that the resistance value of the first step of the probe 34 is set to be larger than the upper limit of the resistance of the first step. Small value. That is, if the contact area SA of the front end portion of the probe 34 of the working electrode 30 to the lower layer liquid can be set small, the resistance step difference AR can be formed to a larger value of 1/5 or more of the resistance value Rg. The resistance section difference can be surely exhibited for the detecting portion 70, so that the contact area SA is first defined. Here, the contact area SA between the front end portion of the probe 34 of the first electrode 30 and the lower layer liquid refers to the surface area outside the cone when the tip end portion is a cone. Further, the contact area SA is also substantially equal to the contact area of the front end portion of the first electrode 3's probe 34 with respect to the upper layer liquid. Specifically, when the liquid layer 22 of the two-layer structure liquid is a liquid having low conductivity such as an electrolyte, the liquid layer of the lower layer liquid 24 is heavier than the liquid of the upper layer 22, is not unnecessarily mixed with the upper liquid 22, and is electrically conductive. When the liquid is higher than the liquid of the upper liquid 22, the contact area SA(m2) of the front end portion of the probe 34 of the first electrode 3〇 with respect to the lower layer liquid 24 is known to be the front end to the lower layer of the probe 34 using the electrode 3〇. The contact resistivity of the liquid 24 · m2) is the contact resistivity ratio h of the contact resistivity ρ Ω (Ω · m2) of the front end of the probe 34 to the upper liquid 22 of the electrode 30, and the probe of the electrode 3〇 The contact resistance coefficient pl(q.m2) of the front end portion 34 to the lower layer liquid 24, and the tip end portion of the first electrode 30 and the probe end 44 of the second electrode 40 are completely immersed in the melting portion. Determination of the state of the zinc 24 The inherent resistance value of the system r〇(q), order 20 201140004 The contact area SA is set to satisfy the following formula (number 2), and the pure phase can be bundled such as the resistance difference Δ. a larger value of 1/5 or more, and the resistance is reliably exhibited by the detecting unit 70 The difference between the area of contact AR sa. Here, the front end contact area SA of the probe 34 is the contact area of the outer surface of the preceding material. Further, it was confirmed that the formula (number 2) does not have a substantial influence on the presence or absence of the supporting electrolyte at the time of electrolysis. Number 2 (SA * h) ^ (pL/R0) Thus, when the contact area SA of the end portion of the probe 3 4 of the first electrode 3 对 to the lower layer liquid 24 is set, the contact area SA is maintained, the probe % The front end of the ^ / shape can be freely changed. For example, when the probe 34 is of the arrow type, its external control can be increased in a freely adjusted shape such as a decrease in height (length in the up and down direction). In addition, it is necessary to set the resistance step difference to a larger value relative to the inherent resistance value R〇' of the measurement system for the lower layer liquid 24, as long as the resistance value R〇6 can be reduced to a smaller value. The material of the probe 34 of the first electrode 3〇 is also suitably a graphite of a material having a high temperature resistant molten zinc chloride 22 or a molten material 24 and having a low electrical resistance. Then, the detection section 70 is required to make the resistance step difference A more clearly appear, and the gradient AL is set to a smaller value. Therefore, it is necessary to review the structure of the probe 34 of the second electrode 3A. That is, in particular, the shape of the front end portion of the probe 34 is carefully reviewed. Fig. 3A is a partial cross-sectional view of the first electrode of the interface meter of the embodiment, corresponding to the AA cross-sectional view of Fig. 3B, and Fig. 3B is the bottom surface of the electrode 21 201140004, which corresponds to the z arrow of Fig. 3A. Number view. Further, Fig. 3c is a partial cross-sectional view of a second electrode of a modification of the interface meter of the embodiment, corresponding to a BB cross-sectional view of Fig. 31), and Fig. 3D is a bottom view of the electrode, which corresponds to the third (: The view of the Z arrow. Further, Fig. 4 shows a graph of the resistance change curve measured by the interface meters. First, the first electrode 30 described above is reviewed, as shown in Fig. 3A and As shown in FIG. 3B, the rod-shaped conductive member 321) of the electrode portion 32 is made of iron, and the protective tube 32& of the electrode portion 32 is a cylindrical alumina made of the conductive member 321) having an outer diameter of 8 mm and The needle 34 is a graphite arrow type having a total length of 1 mm in the vertical direction, and the upper portion of the protective tube 32a and the conductive member 32b connected to the electrode portion 32 is flush with the protective tube 32a so as not to melt the vaporized zinc 22 and melt. The interface of the word 24 creates unnecessary confusion, and the outer diameter is 8 mm cylindrical, and the front end portion 34a has an apex angle of 60. And formed into a tapered conical shape. When the first electrode 30 of this configuration is used, the detailed outline of the resistance change curve obtained by the detecting unit 7 〇 based on the current value measured by the alternating current meter 60 is shown in the outline CA of Fig. 4. This resistance change curve CA is the same as the resistance change curve C shown in Fig. 2. According to the curve CA, it is understood that the front end portion 34a of the probe 34 is located at the interface 26 of the molten vaporized zinc 22 and the molten zinc 24, and the front end of the probe 34. When the value of the distance L between the portion 34a and the interface 26 is 0, although the left and right resistance step differences are generated, on the negative side of the distance L, the slope is elongated and blunt. This phenomenon is considered to be caused by the fact that the outer surface of the cone of the front end portion 34a of the probe 34 relatively smoothly passes through the interface 26, which is a factor for lowering the resolution of the interface detection. That is, when the front end portion 34a of the probe 34 of the first electrode 30 is tapered, if the flattening angle is increased so that the apex angle of the cone is increased, the height 22 in the upper and lower directions of the cone is 201140004 degrees smaller than the diameter of the bottom surface, due to the front end portion 34a. The outer ridge of the cone passes through the interface 26 more quickly, so that the change of the resistance value of the rush can be obtained, and the slope is further reduced, and the resolution of the interface detection can be detected. In addition, the front end portion 34a of the probe is not limited to a conical shape, and may be a pyramid shape such as other triangular pyramids. In this case, the height of the flattening into the upper and lower sides of the cone is smaller than the size of the bottom surface, that is, smaller than the long side of the bottom surface. And the distance between the top corners can be. Therefore, the structure is further developed. As in the case of the first electrode 130 shown in FIG. 3C and FIG. 3, the structure is the same as that of the first electrode 30, and the probe ι34 is The cylindrical tube of the protective tube 32a and the conductive member 32b connected to the electrode portion 32 is the same as the probe 34 of the first electrode 3'', and the end portion 134a is flattened, such as being perpendicular to the vertical direction. Plane. When the first electrode 13A of this configuration is used, the detailed contour of the resistance change curve obtained by the detecting unit 7〇 based on the current value measured by the alternating current meter 60 is displayed on the contour CB of Fig. 4. According to the resistance change curve CB, the tip end portion 134a of the probe is located at the interface 26, and the value of the distance L from the front end portion 13 of the probe 134 to the interface % is 〇 when the slope of the negative side is smaller,] Ω It is almost not blunt with the step (four). This is considered to be due to the fact that the front end portion i34a of the probe 134 is flattened, and is perpendicular to the vertical direction, that is, parallel to the plane of the interface 26, and can instantaneously cross the interface % in the up and down direction. Increasing the contact area of the probe 134 in an instant can obtain a more rapid change in the electrical limit value, which helps to improve the resolution of the interface detection. Further, when the first end portion 134 of the probe 134 is flattened and the flat first electrode 130 is used, the front end portion (10) of the probe 134 is instantaneously traversed 23 201140004. The interface between the molten zinc oxide 22 and the molten zinc 24 26, so the resolution of the interface detection can be improved, on the other hand, there is a chaotic state in which the interface 26 is rippled, etc. The current measured by the AC ammeter 60 unnecessarily changes, and the interface detection itself is unstable. The situation. Therefore, it is necessary to examine in detail the shape of the front end portion 134a of the probe 134 which does not cause the chaotic state of the interface 26 to rise. Fig. 5A is a partial cross-sectional view of the first electrode of another modification of the interface meter of the embodiment, corresponding to a CC cross-sectional view of Fig. 5B, and Fig. 5B is a bottom view of the electrode, corresponding to the 5A. Figure Z arrow view. In the same manner as the first electrode 230 shown in FIGS. 5A and 5B, the configuration of the structure electrode portion 32 is the same as that of the first electrode 30, and the probe 234 is a protective tube 32a connected to the electrode portion 32. The cylindrical member of the conductive member 32b is the same as the first electrode 30, and the front end portion 234a is provided with a plurality of conical portions. According to this configuration, since a plurality of conical portions provided at the front end portion 234a of the probe 234 form a fine buffer structure for the interface 26 of the smelting of the vaporized zinc oxide 22 and the molten zinc 24, the corrugated surface can be absorbed while traversing the interface. 26, so that the interface detection can be stabilized, and the resolution can be improved. Moreover, the front end portion 134 & of the probe 134 can be flattened, and the structure of the planar first electrode 130 can be further developed, so that the front end portion 13 of the probe 134 passes through the molten zinc oxide 22 more instantaneously. The structure of the interface 26 of the molten zinc 24 can improve the resolution of the interface detection. Fig. 5C is a partial elevational view of the first electrode of another modification of the interface according to the present embodiment, corresponding to the ϋ-D cross-sectional view of Fig. 5D, and Fig. 5D is a bottom view of the electrode, equivalent to View of the arrow arrow in Figure 5C. 24 201140004 That is, as in the fifth electrode and the fifth electrode shown in FIG. 5C and FIG. 5D, the structure of the structure electrode portion 32 is the same as that of the ith electrode 3_, and the probe 334 is connected to The protective tube 32& and the conductive member 32b of the electrode portion 32 have a cylindrical shape, and the distal end portion 334a is flattened, and is parallel to the first electrode 130 in a planar shape parallel to the vertical direction. Further, the distal end portion 334a is an elongated electrode. . The protection tube 33 made of insulating material such as alumina of the protection officer 32a of the 卩32 is surrounded by the same plane as the front end. With this configuration, the front end portion 334a of the probe 334 can pass through the interface of the melt gasification word 22 and the molten zinc % in an up-and-down direction more instantaneously, and the change in the resistance value is more clear, and the resolution of the interface detection can be further improved. . Further, the protective tube 334b of the distal end portion 334a may be integrally formed with the protective tube 32a of the electrode portion 32, or may be provided as an independent body. Further, in combination with the above configuration, the degree of resolution of the interface detection can be further improved while absorbing the disorder of the interface 26 of the molten vaporized zinc 22 and the molten zinc 24 . Fig. 6A is a partial cross-sectional view showing an ith electrode of still another modification of the interface meter of the embodiment, corresponding to the EE cross-sectional view of Fig. 6B, and the second drawing is a bottom view of the electrode, which is equivalent to 6 ζ diagram of the arrow view. 6C is a partial cross-sectional view of a second electrode of still another modification of the interface meter of the embodiment, which corresponds to a FF cross-sectional view of FIG. 6D, and FIG. 6D is a bottom view of the electrode. Figure 6C shows the arrow view. In other words, as in the case of the first electrode 430 shown in FIG. 6 and FIG. 6 , the configuration of the structure of the structure electrode portion 32 is the same as that of the first electrode 30, and the probe 434 is connected to the electrode portion 32. The protective tube 32a and the cylindrical shape of the conductive member 32b are surrounded by the protective tube 334b to the distal end portion 434a, which is the same as the first electrode 25 201140004 330. Further, the front end portion 434a is provided with a plurality of conical portions, and As shown in FIG. 6C and FIG. 6D, the structure of the structure-based electrode portion 32 is the same as that of the first electrode 30. The probe 534 is a columnar shape of the protective tube 32a and the conductive member 32b connected to the electrode portion 32. The front end portion 534a is surrounded by the protective tube 334b in the same manner as the first electrode 330, and further, a plurality of convex portions are provided in the distal end portion 534a. Further, the end portions of the protective tubes 334b of the first electrodes 430 and 530 correspond to a plurality of conical portions or a plurality of convex portions provided at the distal end portions 434a and 534a, specifically, the same height as the vertical direction. The length or the larger length is formed with a notch 334c extending in the up-and-down direction to freely discharge the molten zinc 24 from the notch 334c to the outside, so that the molten zinc 24 is not unnecessarily drawn into the plurality of conical portions or a plurality of convex portions. Accumulated between the ministries. The gap 334c is displayed in the same size as one pair, and may be plural in size or configuration pattern. In the first electrode 430 or the first electrode 530, the buffer structure is formed in a plurality of conical portions of the front end portion 434a of the probe 434 or a plurality of the front end portions 534a of the probe 534. When the convex portion faces the interface 26 of the melt gasification word 22 and the melt word 24, it absorbs the corrugation and the like, and the traverse is more instantaneous. Therefore, the interface detection can be stabilized, and the resolution can be further improved. Further, the fine buffer structure of the front end portions 234a, 434a, and 534a of the probes 234, 434, and 534 of the first electrodes 230, 430, and 530 is not limited to a plurality of conical shapes or a plurality of convex portions, and a fine concavo-convex shape may be employed. The size of the uneven shape or the like can be detected by the interface to detect the necessary resolution, and can be set as appropriate. Further, the first electrodes 30, 130, 230, 330, 430, and 530 are interfaces of the melted zinc oxide 22 and the molten zinc 24 electrolyzed therefrom by the probes 26 201140004 34, 134, 234, 334, 434, and 534. The structure in which the state of the free traverse is fixed and configured is exemplified. In the state in which the second electrode 40 is always fixed, the first electrodes 30, 130, 230, 330, 430, and 530 are freely opened and lowered at a constant period. The structure moves back and forth, and when the position of the interface 26 changes, its position can be detected. According to the above configuration, when the probe of the first electrode traverses the interface while the probe of the second electrode is immersed in the second liquid while the AC current is supplied from the AC power source, the resistance change obtained by the detecting portion is obtained. In the curve, since the contact area of the probe of the first electrode with respect to the second liquid is set, the position of the probe of the second electrode is closer to the interface from the second liquid side, and the gradient of the resistance change curve is larger, so that the upper layer is accumulated. The liquid is a liquid having low conductivity such as an electrolyte, and the lower liquid is a storage tank or a reaction tank of a two-layer structure liquid having a specific gravity lower than that of the upper liquid, not unnecessarily mixed with the upper liquid, and having a higher conductivity than the upper liquid. The liquid level position corresponding to the interface between the upper second liquid and the lower second liquid can be detected with high precision. In the present invention, the type, arrangement, number, and the like of the members are not limited to the above-described embodiments, and the components can be appropriately replaced with those having the same functions and functions, and the like can be appropriately changed without departing from the scope of the invention. INDUSTRIAL APPLICABILITY As described above, in the present invention, it is possible to provide an interface meter in which an upper layer liquid is a liquid having low conductivity such as an electrolyte solution, and the lower layer liquid is heavier than the upper layer liquid, and does not cause The upper layer liquid is unnecessarily mixed, and the liquid level position corresponding to the interface between the upper liquid layer and the lower liquid layer can be detected with high precision in the storage tank or reaction tank of the two-layer structure liquid in which the liquid is higher in conductivity than the upper liquid. However, it is expected that it can be widely applied to an interface meter for such a two-layer structure liquid because of its general general nature. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic cross-sectional view showing the structure of an interface meter according to an embodiment of the present invention, and also shows a storage tank for storing a liquid. Fig. 2 is a graph showing a resistance change curve measured by the interface meter of the present embodiment. Fig. 3A is a partial cross-sectional view showing the first electrode of the interface meter of the embodiment, and corresponds to a cross-sectional view taken along line A-A of Fig. 3B. Fig. 3B is a bottom view of the first electrode of the interface meter of the embodiment, and corresponds to the Z arrow view of Fig. 3A. Fig. 3C is a partial cross-sectional view showing a first electrode of a modification of the interface meter of the embodiment, and corresponds to a B-B cross-sectional view of Fig. 3D. The 3D drawing is a bottom view of the first electrode of the present modification, and corresponds to the Z arrow view of the 3C. Fig. 4 is a graph showing a resistance change curve measured by an interface meter having electrodes shown in Figs. 3A and 3B, and a resistance change curve measured by an interface meter having electrodes shown in Figs. 3C and 3D, respectively. . Fig. 5A is a partial cross-sectional view showing a first electrode of another modification of the interface meter of the embodiment, and corresponds to a C-C cross-sectional view of Fig. 5B. Fig. 5B is a bottom view of the first electrode of the modification, and corresponds to the Z arrow view of Fig. 5A. 28 201140004 Fig. 5C is a partial cross-sectional view showing a first electrode of another modification of the interface meter of the embodiment, corresponding to a D-D cross-sectional view of Fig. 5D. Fig. 5D is a bottom view of the first electrode of this modification, and corresponds to a Z arrow view of Fig. 5C. Fig. 6A is a partial cross-sectional view showing a first electrode of still another modification of the interface meter of the embodiment, and corresponds to a cross-sectional view taken along line E-E of Fig. 6B. Fig. 6B is a bottom view of the first electrode of this modification, and corresponds to a Z arrow view of Fig. 6A. Fig. 6C is a partial cross-sectional view showing a first electrode of still another modification of the interface meter of the embodiment, and corresponds to a F-F cross-sectional view of Fig. 6D. Fig. 6D is a bottom view of the first electrode of this modification, and corresponds to a Z arrow view of Fig. 6C. [Description of main component symbols] 10.. Interface meter 20.. Storage tank 22···Fused zinc vapor (upper liquid) 24···Molten zinc (lower liquid) 26.. Interface 30, 130, 230 , 330 , 430 , 530 ... first electrode 32, 42 ... electrode portion 32a, 334b ... protection tube 32b ... conductive member 34, 44, 134, 234, 334, 434 ' 534... Probes 34a, 134a, 234a, 334a, 434a, 534a... then end 40... second electrode 50.. AC power supply 50a, 50b... power supply line 60.. parent flow galvanometer 70.. Detection portion 334c...notch 5.. device 29

Claims (1)

201140004 七、申請專利範圍: 1 · 一種界面計,係包含有: 第1電極,係具有可自由穿越由第1液體與第2液體 構成之界面,並可自由浸潰於前述第1液體及前述第2液 體之導電性探針者,前述第1液體係積存於容器内,為 電解質,而前述第2液體則在前述容器内,積存於比前 述第1液體靠近下方,為導電性; 第2電極,係配置於比前述第1電極靠近下方,並具 有可自由浸潰於前述第2液體之導電性探針者;. 交流電源,係可對前述第1電極之前述探針與前述 第2電極之前述探針間自由供給交流電流者;及 檢測部,係依據流動於前述第1電極之前述探針與 前述第2電極之前述探針間之前述交流電流,算出電阻 值,以檢測前述第1液體與前述第2液體之界面者; 又,該界面計設定前述第1電極之前述探針對前述 第2液體之接觸面積,俾於一面從前述交流電源供給前 述交流電流,一面在前述第2電極之前述探針浸潰於前 述第2液體之狀態下,使前述第1電極之前述探針穿越前 述界面時,可對前述檢測部顯現電阻段差。 2.如申請專利範圍第1項之界面計,其中令前述接觸面積 為SA(m2),令前述第1電極之前述探針對前述第2液體之 接觸電阻係數為· m2),令前述接觸電阻係數 除以前述第1電極之前述探針對前述第1液體之接觸電 阻係數Ρυ(Ω · m2)的接觸電阻係數比為h,以及令在前 30 201140004 述第1電極之前述探針及前述第2電極之前述探針浸潰 於前述第2液體之狀態之測量系統之固有電阻值為 R〇(D)時,設定成滿足下式(數3): 【數3】 (SA · h)$(pL/R〇)。 3·如申請專利範圍第!項之界面計,其中前述第鴻極之前 述探針之前端部為錐體,前述錐體之高度小於前述錐體 之底面之外徑或長邊。 4. 如申請專利範圍第i項之界面計,其中前述第極之前 述探針之前端部為自由設定成與前述界面平行之平面。 5. 如申請專利範圍第4項之界面計,其中前述第】電極之前 述探針之前端部更具有複數個凹凸部。 6·如申請專利範圍第i項之界面計,其令前述第if極之前 述探針之前端部以絕緣構件覆蓋至其前端。 7·如申請專利範圍第6項之界面計,其中於覆蓋前述第1 極之前述探針之前端部的前述絕緣構件設有對應於前 述複數個凹凸部之缺口部。 8. 如申請專利範圍第i項之界面計,其中前述第if極之前 述探針連結於前述第1電極之導電構件,前述導電構件 以絕緣構件覆蓋。 9. 如申請專利範圍第8項之界面計,其中覆蓋前述第!電極 之:述導電構件之前述絕緣構件的外面與前述第i電極 之前述探針之外面為同平面。 1〇.如申請專利範圍第1項之界面計,其中前述交流電壓之 31 201140004 最大電壓小於前述第1液體之電解電壓。 π. 12. 13. 如申請專利範圍第1項之界面計,其中前述第1液體為含 有熔融氣化鋅之熔融鹽,前述第2液體為含有熔融鋅之 ')容触金屬。 如申請專利範圍第丨1項之界面計,其中前述交流電流之 頻率為5Hz以上,500Hz以下之範圍。 申叫專利範圍第1項之界面計,其中前述第1電極之前 述探針為石墨製。 32201140004 VII. Patent application scope: 1 . An interface meter comprising: a first electrode having an interface capable of traversing the first liquid and the second liquid, and being freely immersible in the first liquid and the foregoing In the conductive probe of the second liquid, the first liquid system is stored in the container as an electrolyte, and the second liquid is stored in the container so as to be lower than the first liquid, and is electrically conductive; The electrode is disposed below the first electrode and has a conductive probe that can be immersed in the second liquid; the AC power source is the probe and the second electrode of the first electrode And the detecting unit is configured to calculate a resistance value based on the alternating current flowing between the probe of the first electrode and the probe of the second electrode to detect the aforesaid And an interface between the first liquid and the second liquid; and the interface meter sets a contact area of the probe of the first electrode with respect to the second liquid, and is supplied from the AC power source before being supplied In the state in which the probe of the first electrode is immersed in the second liquid in a state where the probe of the second electrode is immersed in the second liquid, the probe may exhibit a resistance step difference to the detecting portion. 2. The interface meter according to claim 1, wherein the contact area is SA (m2), and the contact resistance of the probe of the first electrode to the second liquid is · m2), so that the contact resistance is The coefficient of contact resistance of the probe of the first electrode divided by the contact resistance coefficient Ρυ (Ω · m2) of the first liquid is h, and the probe of the first electrode of the first 30 201140004 and the aforementioned When the specific resistance value of the measurement system in which the probe of the two electrodes is immersed in the state of the second liquid is R 〇 (D), it is set to satisfy the following formula (number 3): [number 3] (SA · h) $ (pL/R〇). 3. If you apply for a patent scope! The interface meter of the item, wherein the front end of the aforementioned probe is a cone, and the height of the cone is smaller than the outer diameter or the long side of the bottom surface of the cone. 4. The interface meter of claim i, wherein the front end of the probe before the first pole is freely set to a plane parallel to the interface. 5. The interface meter of claim 4, wherein the front end of the probe has a plurality of concavo-convex portions. 6. The interface meter of claim i, wherein the front end of the probe before the aforementioned if-pole is covered with an insulating member to the front end thereof. 7. The interface meter according to claim 6, wherein the insulating member at an end portion of the probe before the first pole is provided with a notch portion corresponding to the plurality of concavo-convex portions. 8. The interface meter according to the invention of claim i, wherein the probe is coupled to the conductive member of the first electrode, and the conductive member is covered with an insulating member. 9. If you apply for the interface meter in item 8 of the patent scope, which covers the above! The electrode: the outer surface of the insulating member of the conductive member is flush with the outer surface of the probe of the i-th electrode. 1. The interface meter of claim 1, wherein the maximum voltage of the aforementioned AC voltage 31 201140004 is smaller than the electrolysis voltage of the first liquid. π. 12. 13. The interface meter according to claim 1, wherein the first liquid is a molten salt containing molten zinc vapor, and the second liquid is a contact metal containing molten zinc. For example, in the interface meter of claim 1, the frequency of the alternating current is 5 Hz or more and 500 Hz or less. An interface meter according to the first aspect of the invention, wherein the probe of the first electrode is made of graphite. 32
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