201136073 六、發明說明： 【發明所屬之技術領域】 本發明涉及用於同軸線纜的測試點適配器。本發明還 涉及用於測試線缆的測試點適配器的使用。 【先前技術】 使用測試適配器或測試點適配器，以便測試使用了同軸 線鏡的通信網路（例如，有線τν和電腦網路）的性能。 為了實施測試，必須提供可以連接測試設備的接入點。 由於越來越多的數位信號通過線纜傳送的事實情況，所 以對同軸線纜.的測試已經變得越來越重要。與只使用類比 信號時相比，信號中的干擾，即數位信號中的信/噪比更有 可能產生，因此確保包括有連接器的線纜的高品質變得愈 加關鍵。此外，通過例如使用IP電話、VPN以及類似產品’ 連接的終端用戶越來越依賴於這些連接的可靠性，並且不 接文例如當測試該連接時的掉線。因此舉例而言，網際網 路服務提供商要求增加對線路的測試以確保他們能夠以希 望的οσ質來供其服務，並且不會掉線。 US4738009中描述的系統是依靠移除部分介電材料的 系統。這種損傷性方法可能引起連接中的干擾，特別是數 位信號中的干擾。如果圍繞線纜的夾具鬆動，％ 了連接器 的扭絞可能會對導體造成損害。測試設備的連接和斷開最 終會引起Τ連接器的扭絞。 通吊’田插入測试設備時，同軸線纜被從該同軸線纜所 201136073 連接到的例如放大器或類似設備上斷開°組裝各種部件’ 以便實現具有用於測試的接入點的適配器’所述適配器被 插入在同軸線纜和例如放大器之間，從而以這種方式使這 種適配器線上纜使用期間提供測試。然而’當組裴這種適 配器的零件數量增加時，糟糕的性能和信號中斷的風險同 樣會類似地增加。此外，安裝該適配器和連接測試設備到 該適配器的人需要格外注意適配器的正確組裝以及小心地 使用該設備。 ϊ連接測§式设備至上述的適配器時，為了便於容易接 入，安裝該設備的人經常調整接入點的位置，例如通過轉 動連接測試設備的接入點。然 的干擾，並且這種對信號品質 測試後也不會得到糾正。通常 於操作設備的人員來說是看不 備的安裝就可能導致差的信號 而，這經常造成對信號品質 的干擾在已經進行了希望的 ，對線纜和/或連接的損壞對 見的，因此僅僅當今測試設 品質。 【發明内容】 因此，本發明的一個方面 杰县，工』i 楗供—種對要測量的作號 成最小干擾的測試點適配器。 。就1¾ 這個方面通過用於同軸綾 現。該測試點適配器可以包括、::試點冑配器而得以實 有包括第一介面的第一端部和c線的主體’其帶 以及至少從第一介面延伸到第-仑一介面的第二端部， 外’該測試點適配器可以包"面的第-中心導體。此 /、有縱向軸線的测試體，Α 201136073 側向於所述主體而佈置。該測試體包括第一 包括第三介面的第二測試體端部，以及導電性接二和 該接觸構件與第-中心導體電接冑，以允許該主體相對於 該第-令心導體轉動。該主體的第一端部可以稱作第一主 體端部。 當主體被轉動，從而測試體也被轉動時，第一中心導體 相對於所述兩個體而固定，第一中心導體和接觸構件相對 於彼此轉動。因此，第一中心導體和接觸構件之間的連接 不可能是剛性的，例如將它們焊接在一起。當測試點適配 器位於其安裝位置時，中心導體固定在例如放大器内部， 以實現牢固的連接。如果所述主體設置有用於將第一中心 導體定位在主體内的絕緣體，那麼該絕緣體將或者相對於 所述主體轉動，或者該絕緣體將與所述主體一起相對於第 一中心導體轉動》 在實施例中，第一中心導體和接觸構件之間的接觸可 以由滑動接觸來提供。 通過在第一中心導體和接觸構件之間使用滑動接觸，實 現了所述主體能夠繞第一中心導體自由轉動，並由此保持 與接觸構件的電連接。通常，第一中心導體關於它的縱向 軸線對稱，即具有圓形截面。 在一實施例中，接觸構件可以是彈簧載入的。 通過使用彈簧，實現了保持接觸而不用考慮中心導體的 公差。同樣，第一中心導體和接觸構件之間的接觸（即滑 動接觸）可以通過彈性裝置來獲得，例如橡膠、盤簧或螺 6 201136073 旋彈箐。該強1 -τ 緊件和測試體第是環形彈著板。該彈著可以定位在咬 心導體來定：第二：之間，其中所述咬緊件相對於第-中 m第一中心導體的端部。 置的連接實:：中’第一介面可以包括相對於主體可轉動佈 大器。 ，用於將第一介面連接至配合部件，例如放 〇 佈置的連接裝置或介面例如可以被稱作& II @ 母或旋轉構杜 饭蚺作旋轉螺 定，作、以這種方式’儘管第-中心導體被保持固 旋轉螺sr以轉動。當提供旋轉螺母時，主體相對於 第-中心導=第—令心導體佈置為使得相對於主體轉動 轉動所用的力，或者小於防：第：導;:絕緣體内 中心導體可相對於該主體保持固定。 哼第 在實施例中，測試點適配器可以包括： -旋轉構件，其限定了中心 端部，第—端部具㈣表面和内表面，並第二相對 該螺紋區域用於使旋轉構件、〃㉟紋區域’ 的螺紋部分螺紋地接合； 端部與配合部件的匹配 主體，其具有篦—如黎, —7 第—相對主體端部和中心孔，限 定了與旋轉構件的中心軸 “孔 體端部具有外圓柱表面；轴的縱向轴線，所述第一主 -第-中心導體’其沿著所逃縱向軸線延伸 _具有中心孔的螺母，其限定了内表面及第-和第二相 201136073 :側壁：第一側壁適於滑動地接合和峨鄰所述配合部件， 並且限疋内部傾斜表面區域； 其中所述旋轉構件可以延伸通過螺 的内表面與旋轉構件 茲螺母 轉構件的大幅轉動外表面接合，以防止螺母相對於旋 第Hi㈣轉構件可以被可旋轉地接納在所述主體的 弟一主體端部的外圓飪 们卜圓柱表面上，且該外圓柱表面與凹陷區 域相鄰’以便形成肩部，以& 陷£ 其中所述旋轉構件的第二端部可具有向内延伸的凸起 部和外部傾斜表面區域，且徑向可壓縮，所述螺母的内部 傾斜表面區域可適於與所述旋轉構件的外部傾斜表面區域 協作，以徑向縮旋轉構件的第二端部，從而使所述向内 延伸的凸起部與所述肩部接合。 以延種方式，實現了可將測試點適配器的主體製造成一 件式，由此將潮氣、灰塵和/或水滲透到主體内部的風 小化。此外，在測試點適配器安裝至配合部件的過程令， 只轉動螺母和旋轉構件，而主體和線纜則保持靜止。因此， 避免了對線纜和第一中心導體的損壞。 在一個實_中，旋轉構件的第二端可以包括至少一個 縫，以允許旋轉構件的第二端被壓縮。所述至少一個縫有 助於壓縮旋轉構件的第二端。以這種方式，可以墨縮所述 第二端以實現與所述主體的緊密連接。所述至少一個縫可 以通過例如切削或銑削來獲得，或者如果旋轉構件是模制 成型的，那麼可以在模制成型的過程中獲得。 201136073 在一實施例中，第一介面可以包括具有例如螺紋之類的 卜。p連接裝置的凸形（maie)部分。第一介面可以包括旋 轉構件或旋轉螺母。 在—實施例中，所述測試體可以包括電阻器。 在一實施例中，電阻器和測試體可以被可釋玫地連接。 在—實施例中，電阻器可以被可釋放地連接至測試體。 以這種方式，可以將測試體的特性（即測試點適配器的 測量特性）調整至待測試的特定測量設備和/或特定連接。 在一實施例中’測試體和主體可以彼此螺紋接合。 在一實施例中，測試體可以佈置為與主體基本垂直。 在一實施例中，測試體和主體之間的連接可以包括密封 裝置。 在一實施例中，所述密封裝置可以包括黏著劑。在螺紋 接合測試體和主體的情況下，可以施用黏著劑以實現兩個 體之間的緊密密封。 在一實施例中，接觸構件可以包括中心孔，該中心孔被 佈置為接納電阻器的一個端部。以這種方式，可以實現接 觸構件與電阻器之間的牢固電接觸。 在一實施例中，所述接觸構件可佈置在咬緊件中。以這 種方式，彳以關於咬緊件和接觸構件而使用不同的材料。 接觸構件可以由黃銅或電鍍黃銅製成。接觸構件可以由與 所述主體的中心導體類似的材料製成。 在一實施例中 端部中。以這種方 ，咬緊件可移動地佈置在測試體的第一 式，所述咬緊件易於安《，且能夠沿著 9 201136073 測S式體的縱向軸線移動而不轉動。此外，如果必需的話， 咬緊件的可移動佈置可以允許用於彈簧工作的頂部空間。 在一實施例中，咬緊件可以由介電材料製成。以這種方 式’實現了將接觸構件保持就位，而不在第一中心導體和 所述體中的任一個之間造成短路。 在一實施例中，所述測試體可以包括用於接納測試儀器 的内部隔間。 在一實施例中，接觸構件可以具有柔性指狀物，所述柔 性才曰狀物被佈置為夾持在電阻器的一個端部周圍。以這種 方式’在接觸構件與電阻器之間建立牢固的電接觸。 在一實施例中，接觸構件可以具有用於抵靠咬緊件的内 壁施加壓力的凸起部。以這種方式，實現了將接觸構件固 定在咬緊件内。 在-實施例中’測試體可以包括帽，用於密封測試體的 内部隔間。所述帽可以包括用於使信號停止的終止器。 本發明的一個方面涉及測試點適配器的使用。該測試點 適配器可以用於對使用了同軸線纜和/或光纖的連接進行 測試》 在一實施例中，該測試點適配器可以用於對使用了同軸 線纜和光纖以及這兩者的組合的連接進行測試。 在一實施例中，測試點適配器的密封裝置可以包括0 形環。 【實施方式】 10 201136073 圖1示出了具有主體2的測試點適配器1的實施例，主 體2包括具有第一介面4的第一端部3和具有第二介面6 的第二端部5，在這個實施例中，第一介面4為旋轉構件 或旋轉螺母。第一中心導體7佈置在主體2内，延伸超出 第一端部3❶測試體U附接至主體2。測試體u具有螺接 到主體2内的第—測試體端部13 (如圖2更佳地示出）和 具有第二介面1 5 (如圖2更佳地示出）的第二測試體端部 14。所不測試點適配器1具有陽螺紋介面4、6， 介面可以是陰螺紋，或者它們也可以是其他類型的、接：; 例作:：1㈣視圖，圖2示出了測試點適配器1的實施 :^中點適配器1包括主體2,主體2包括且有 第-介面4的第_端部 H、有 第一介面4為;μ 、 —介面6的第二端部5, 面4為旋轉構件或旋轉螺母。 主體2的縱向軸練 帛-中心導體7沿著 w跟8佈置。第一中 緊件（seizure) 導體7借助於第一咬 」9和第二咬緊件1() 中心内。具有丞本保持在主體2的 ，、百縱向軸線12的測試體 2。所示測試體2歲阁w l 從側向'安裝到主體 z與圖1相比，外部輪 試體11能夠以除 摩稍微有所改變。測 置，例如以15。部，或25。身 ^外的其他方式佈 角度佈置。測試體n — 35、70°，或35。-55。的 介面Η的第二挪試體端部14。第—體端心和具有第三 2螺紋接合。咬緊件16安裝在 體端部13與主體 緊件16設置有環形凸起：-：試體端部U處。咬 19佈置在咬緊件16 201136073 的環形凸起部1 7和第一丨 才弟測5式體端部13的端部邊綾 ::::置：夠沿著 在k個實施例中為環形彈性墊圈， 離測試體11的第-踹幫助在遠 卩的方向上沿著測試體的縱 線12對咬緊件16 的縱向軸 按觸構件2 0插入到咬緊杜 咬緊件中心孔21中。m“ 16 ^ 中接觸構件20設置有中心孔， 納電阻器23或齠仞铷认用於接 24定位在… 。在將第-電阻器端部 4疋位在咬緊件16的咬緊件令心孔21中的情況下 件2〇的中心孔22被佈置為接納第-電阻器端部24。者 接觸構件20被插入到咬緊 田 叉家件的咬緊件中心孔21中拄 ^ 觸構件20夾持在第一雷 崎’接 電阻器触部24周圍。因此，第— :且器端部24被保持就位，且接觸構件2〇被固定在咬緊： 236的中心孔中。由於接觸構件2〇是導電的，所以電阻器 23與同接觸構件2〇拯觫 器 接觸的物體電接觸。電阻器23201136073 VI. Description of the Invention: [Technical Field of the Invention] The present invention relates to a test point adapter for a coaxial cable. The invention also relates to the use of a test point adapter for testing a cable. [Prior Art] A test adapter or test point adapter is used to test the performance of a communication network using a coaxial mirror (for example, wired τν and computer network). In order to implement the test, an access point that can connect to the test equipment must be provided. Testing of coaxial cables has become increasingly important as the fact that more and more digital signals are transmitted over cables. The interference in the signal, that is, the signal/noise ratio in the digital signal, is more likely to occur than when only the analog signal is used, thus ensuring that the high quality of the cable including the connector becomes more critical. In addition, end users connected by, for example, using IP phones, VPNs, and the like, are increasingly relying on the reliability of these connections, and do not receive text, for example, when testing the connection. So for example, Internet service providers are asking to increase the testing of the lines to ensure that they can provide their services with the desired quality and will not drop the line. The system described in U.S. Patent 4,377,009 is a system that relies on the removal of a portion of the dielectric material. This damaging method can cause interference in the connection, especially in digital signals. If the clamp around the cable is loose, the twist of the connector may damage the conductor. The connection and disconnection of the test equipment will eventually cause the twisting of the Τ connector. When the test device is inserted into the field, the coaxial cable is disconnected from, for example, an amplifier or the like connected to the coaxial cable 201136073. The various components are assembled to realize an adapter having an access point for testing. The adapter is inserted between a coaxial cable and, for example, an amplifier to provide testing during use of such an adapter cable in this manner. However, when the number of parts of the adapter is increased, the risk of poor performance and signal interruption increases similarly. In addition, the person installing the adapter and connecting the test equipment to the adapter needs to pay special attention to the proper assembly of the adapter and the careful use of the device. ϊ When connecting a test device to the above adapter, the person installing the device often adjusts the location of the access point for easy access, for example by rotating the access point of the test device. However, this interference will not be corrected after the signal quality test. Installations that are generally unseen in the operation of the equipment may result in poor signals, which often cause interference with signal quality that has been desired, and is susceptible to damage to the cable and/or connection, thus Only the quality of today's tests is set. SUMMARY OF THE INVENTION Therefore, in one aspect of the present invention, Jiexian, a test point adapter that is the smallest interference to the measurement to be measured. . This aspect is used for coaxial convergence. The test point adapter can include: a pilot adapter having a body including a first end of the first interface and a body of the c-strip and a second end extending at least from the first interface to the first interface Department, outside 'The test point adapter can pack the " face-to-center conductor. This /, a test body having a longitudinal axis, Α 201136073 is arranged laterally to the body. The test body includes a first end of the second test body including a third interface, and a conductive contact and the contact member electrically coupled to the first-center conductor to allow the body to rotate relative to the first-center conductor. The first end of the body may be referred to as a first body end. When the body is rotated so that the test body is also rotated, the first center conductor is fixed relative to the two bodies, and the first center conductor and the contact member are rotated relative to each other. Therefore, the connection between the first center conductor and the contact member may not be rigid, such as welding them together. When the test point adapter is in its installed position, the center conductor is fixed inside, for example, the amplifier to achieve a secure connection. If the body is provided with an insulator for positioning the first center conductor within the body, the insulator will either rotate relative to the body or the insulator will rotate with the body relative to the first center conductor. In an example, the contact between the first center conductor and the contact member can be provided by a sliding contact. By using a sliding contact between the first center conductor and the contact member, it is achieved that the body is free to rotate about the first center conductor and thereby maintain electrical connection with the contact member. Typically, the first center conductor is symmetrical about its longitudinal axis, i.e., has a circular cross section. In an embodiment, the contact member can be spring loaded. By using a spring, it is achieved that the contact is maintained regardless of the tolerance of the center conductor. Also, the contact between the first center conductor and the contact member (i.e., the sliding contact) can be obtained by an elastic means such as rubber, coil spring or screw 6 201136073. The strong 1 -τ pinch and the test body are the ring-shaped bullets. The bounce can be positioned at the bite conductor: between: second, wherein the bite is opposite the end of the first center conductor of the first to middle m. The connected connection: the middle interface may include a rotatable fabric relative to the body. For connecting the first interface to the mating component, for example, the connection means or interface of the arranging arrangement, for example, may be referred to as & II@mother or rotating turret for rotation, in this manner 'although The first-center conductor is held to rotate by rotating the screw sr. When the rotating nut is provided, the body is disposed relative to the first-to-center conductor = the core conductor such that the force used for rotational rotation relative to the body, or less than:: guide: the inner conductor of the insulator can be held relative to the body fixed. In a further embodiment, the test point adapter may comprise: - a rotating member defining a central end, a first end having a (four) surface and an inner surface, and a second opposing threaded region for the rotating member, the cymbal 35 The threaded portion of the land area is threadedly engaged; the matching body of the end portion and the mating component has a 篦-, such as 黎, - 7 - opposite body end and a central hole, defining a central axis with the rotating member "hole end Portion having an outer cylindrical surface; a longitudinal axis of the shaft, the first main-first-center conductor 'extending along the escaped longitudinal axis_a nut having a central bore defining the inner surface and the first and second phases 201136073: sidewall: the first side wall is adapted to slidably engage and abut the mating component and to limit an inner inclined surface area; wherein the rotating member can extend through the inner surface of the screw and the large rotation of the rotating member nut runner member The outer surface is joined to prevent the nut from being rotatably received on the outer cylindrical surface of the body end of the body relative to the rotary Hi (four) rotating member, and the outer surface The cylindrical surface is adjacent to the recessed area to form a shoulder, wherein the second end of the rotating member may have an inwardly extending raised portion and an outer inclined surface area, and is radially compressible, An inner inclined surface region of the nut may be adapted to cooperate with an outer inclined surface region of the rotating member to radially retract the second end of the rotating member such that the inwardly extending projection and the shoulder Engaging. In an extended manner, it is achieved that the body of the test point adapter can be manufactured in one piece, thereby minimizing the penetration of moisture, dust and/or water into the interior of the body. In addition, the test point adapter is mounted to the mating component. The process is such that only the nut and the rotating member are rotated, while the body and the cable remain stationary. Therefore, damage to the cable and the first center conductor is avoided. In one embodiment, the second end of the rotating member may include at least a slit to allow the second end of the rotating member to be compressed. The at least one slit helps to compress the second end of the rotating member. In this manner, the second end can be inked to achieve A tight connection with the body. The at least one slit can be obtained, for example, by cutting or milling, or if the rotating member is molded, it can be obtained during molding. 201136073 In an embodiment The first interface may include a male portion having a p-connecting device such as a thread. The first interface may include a rotating member or a rotating nut. In an embodiment, the test body may include a resistor In an embodiment, the resistor and the test body may be releasably connected. In an embodiment, the resistor may be releasably coupled to the test body. In this manner, the characteristics of the test body may be (ie, the measurement characteristics of the test point adapter) are adjusted to the particular measurement device and/or the particular connection to be tested. In one embodiment the 'test body and body can be threadedly engaged with each other. In an embodiment, the test body can be arranged to The subject is basically vertical. In an embodiment, the connection between the test body and the body can include a sealing device. In an embodiment, the sealing device may comprise an adhesive. In the case where the thread is joined to the test body and the body, an adhesive can be applied to achieve a tight seal between the two bodies. In an embodiment, the contact member can include a central aperture that is arranged to receive one end of the resistor. In this way, a firm electrical contact between the contact member and the resistor can be achieved. In an embodiment, the contact member may be disposed in the bite member. In this way, different materials are used in relation to the gripping members and the contact members. The contact member can be made of brass or plated brass. The contact member may be made of a material similar to the center conductor of the body. In one embodiment the ends are. In this manner, the bite member is movably disposed in the first form of the test body, the bite member being easy to move, and capable of moving along the longitudinal axis of the S-type body without rotation. Furthermore, the movable arrangement of the grippers can allow for the head space for spring operation, if necessary. In an embodiment, the bite member can be made of a dielectric material. In this manner, it is achieved that the contact member is held in place without causing a short circuit between the first center conductor and either of the bodies. In an embodiment, the test body can include an internal compartment for receiving a test instrument. In an embodiment, the contact member may have a flexible finger that is arranged to be clamped around one end of the resistor. In this way, a firm electrical contact is established between the contact member and the resistor. In an embodiment, the contact member may have a raised portion for applying pressure against the inner wall of the gripping member. In this way, it is achieved that the contact member is fixed within the bite member. In the embodiment the test body may comprise a cap for sealing the inner compartment of the test body. The cap may include a terminator for stopping the signal. One aspect of the invention relates to the use of a test point adapter. The test point adapter can be used to test connections using coaxial cables and/or optical fibers. In one embodiment, the test point adapter can be used for both coaxial cable and fiber optics, and combinations of the two. Connect for testing. In an embodiment, the sealing means of the test point adapter may comprise an O-ring. [Embodiment] 10 201136073 FIG. 1 shows an embodiment of a test point adapter 1 having a body 2 comprising a first end 3 having a first interface 4 and a second end 5 having a second interface 6. In this embodiment, the first interface 4 is a rotating member or a rotating nut. The first center conductor 7 is disposed within the body 2 and extends beyond the first end portion 3 to which the test body U is attached. The test body u has a first test body end 13 (shown better in Figure 2) screwed into the body 2 and a second test body having a second interface 15 (shown better in Figure 2). End 14. The non-test point adapter 1 has a male thread interface 4, 6, the interface may be a female thread, or they may be other types of connections; for example: 1 (four) view, Figure 2 shows the implementation of the test point adapter 1 The midpoint adapter 1 includes a main body 2 including a first end portion H of the first interface 4, a first interface 4 having a first interface 4, a second end portion 5 of the interface 6, and a surface 4 being a rotating member Or rotate the nut. The longitudinal axis of the body 2 is sturdy-center conductor 7 arranged along w and 8. The first tensioning conductor 7 is centered by the first bite 9 and the second bite 1 (). A test body 2 having a plurality of longitudinal axes 12 held by the body 2 is provided. The test body 2 years old is shown as being mounted to the main body from the lateral direction. Compared with Fig. 1, the outer wheel test body 11 can be slightly changed by the removal. Measure, for example, at 15. Department, or 25. Other ways outside the body are arranged at an angle. Test body n — 35, 70°, or 35. -55. The second sample end 14 of the interface Η. The first body end has a third 2 threaded engagement. The gripping member 16 is attached to the body end portion 13 and the main body member 16 is provided with an annular projection: -: the end portion U of the test body. The bite 19 is disposed at the end of the ring-shaped projection 17 of the bite member 16 201136073 and the end edge of the first end portion 13 of the body 5:::: enough to be along in the k embodiments The annular elastic washer, from the first side of the test body 11, helps to insert the longitudinal member of the bite member 16 along the longitudinal line 12 of the test body in the distal direction into the centering hole of the bite-biting member. 21 in. m" 16 ^ The contact member 20 is provided with a center hole, and the nano resistor 23 or the clamp is used for the connection 24 to be positioned at the bite of the bite member 16 at the end of the first resistor. The center hole 22 of the member 2 in the case of the core hole 21 is arranged to receive the first-resistor end portion 24. The contact member 20 is inserted into the center hole 21 of the bite member of the biting fork member 拄^ The contact member 20 is clamped around the first Leisaki's contact resistor 24. Thus, the first and the end 24 are held in place and the contact member 2 is fixed in the center hole of the grip: 236. Since the contact member 2 is electrically conductive, the resistor 23 is in electrical contact with an object in contact with the contact member 2. The resistor 23
體11内部沿著縱向軸唆1251仙^ t J 聊線12延伸。在測試體丨丨的第二The inside of the body 11 extends along the longitudinal axis 唆1251仙^t J 线线12. In the second test body
14處，電阻器借助於 〇P & 、持佈置25被保持就位。握持佈置 X 26。中心孔26被佈置為接納第 端部27»握持佈置25、罗古4，… 器 r 、 5還有利於可將測試設備的中心插針 或插腳（pin))(未不出）插入並與電阻器η電接觸。在 ，2中測試體！ i的第二測試體端部μ通過包括有終止 器29的可移除帽28央故、 來終止。帽28與第二測試體端部14 的第三介面15螺紋垃人 . — 接〇。幀28能夠以其他方式連接到第 "面15伤]如通過開口（ hatches )或者直角轉彎鍵和槽。 密封裝置30確保了由帽2δ對第三介面15施加的密封是防 12 201136073 水的。此外，為了香， 配器卜晉古 現防水連接該實施例令的測試點適 配器1设置有〇形環3i、32、B。 ^點適 測試體11的所述實施例和它 二端部Μ的測試儀器（未接二接在測試體第 τ雷桩鎚m ;和接觸構件20之間提俾 了電接觸。因此，提供了第二中心導體。 供 件2。與佈置在主體2中的第一中心導體8接^ /發明的另-實施例中，電阻器23和握持佈置At 14 points, the resistor is held in place by means of the 〇P & holding arrangement 25. Hold the arrangement X 26. The central aperture 26 is arranged to receive the first end 27»the grip arrangement 25, the roco 4, the r, 5 also facilitates insertion of the central pin or pin of the test device (not shown) and Electrical contact with the resistor η. In 2, test the body! The second test body end μ of i is terminated by a removable cap 28 including a terminator 29. The cap 28 and the third interface 15 of the second test body end 14 are threaded. Frame 28 can be otherwise connected to the "face 15' such as through a hatches or right angle turn keys and slots. The sealing device 30 ensures that the seal applied by the cap 2δ to the third interface 15 is protected against water. Further, for the fragrance, the test point adapter 1 of the embodiment of the present invention is provided with the ring-shaped rings 3i, 32, B. ^ The embodiment of the point-suitable test body 11 and its two end-end test instruments (not connected to the test body, the τ thunder hammer m; and the contact member 20 are electrically contacted. Therefore, The second center conductor. The supply member 2. In another embodiment of the first central conductor 8 disposed in the body 2, the resistor 23 and the holding arrangement
以設置為測試設備（夫 T -侑I未不出）的一體部分。在這種 中’接觸構件20可以佑罟盔办丨上从 τ佈置為例如接納來自測試設備的第二 中心導體。 一 圖3八不出了用於安裝在第一測試體端部13中的咬緊 件16咬緊件！ 6設置有環形凸起部】7。此外咬緊件16 設置有咬緊件中心孔21，咬緊件中心孔21具有用於接納 接觸構件20的内表面38。邊緣區域34設置在咬緊件16 上’從咬緊件主端部35伸出並包圍咬緊件中心孔2ι。邊 緣區域34可以位於管子端的端部上。咬緊件16可以由介 電材料製成。咬緊件i 6的尺寸被製成能夠將咬緊件i 6安 裝到測試體11中，且仍允許咬緊件16根據彈簧19 (如圖 3C所示）的彈性沿著測試體11的縱向軸線移動。在咬緊 件16的另一實施例中，邊緣區域可以基本與咬緊件主端部 35持平。 圖3B示出了接觸構件2〇的實施例。為了使接觸構件便 於爽緊在電阻器端部（如圖2所示）周圍，在接觸構件上 切開有縫36 ’由此形成指狀物37。指狀物37可以各自具 13 201136073 有突起38，用於厭土 + 在組裝過程：第:件16的中心孔的内表面38。 構件2〇县 纟觸構件端部39的錐形輪廓使得接觸 =件入到咬緊件16的中心孔22中。當"將 37被凸起2〇壓入到咬緊件16的中心孔·22中時，指狀物 起部38施力而徑向向内蠻 #曲由此夾緊在所述電 =(未示出）周圍。第二接觸構件端部4〇基本上扁 &與位於主體2内的第-中心導體8接觸。第二 接觸端部40在其他實施例中可以是凸起的。 楛供溫士 * 了彈性墊圈19的實施例’彈性墊圈19用於 六、以保持接觸構件2G與第—中心導體8電接觸。該 β 乂由其他彈性裝置提供，例如橡膠或其他類型的 簧。 圖30示出了須的零部件的實施例。帽29安裝 在測試體11上’帽29和測試體之間的連接由密封裝置30 '在'則試體11内，握持佈置25用於握持在電阻器 2_3的第二端部周圍。0形環31密封測試體11和主體2(未 不出）之間的連接。電阻器23的第一端部插入且穿過咬緊 件16’並進人該咬緊件的中心'孔内，在那裏其被接觸構件 接納。當接觸構件2〇插入到咬緊件中心孔中時，接觸 構件20的指狀物徑向向内彎曲’且夾持在電阻器η的第 端周圍。咬緊件16定位於測試體11内，使彈簧19介 於測試體的邊緣和咬緊件16的環形凸起部之間。咬緊件 16可以以這種方式裝配到測試體11的第-端部中，使得如 果被施力（例如由彈簧19施力），則咬緊件可以移動。如 201136073 田饭戈褒到測試 果沒有施力 ，Μ ‘ A T町，m地"又冢仵 和測試體11之間的摩擦將使所述咬緊件保持在它的位置 中。握持佈置25可以如此佈置，以提供電阻器23相對於 測試體11移動的可能性。 圖4示出了安裝在配合部件41 (例如放大器41 (只示 出了局部））上的測試點適配器i。主體2的第一端部的介 面4(即旋轉構件或旋轉螺母）被安襄在配合部件（即放 大器⑴的配合介面42中。中心導體7借助於螺釘“而 :對於放大固^。螺釘43堅固地夾持在中心導體7 (插 :周圍，當固定後’中心導體7不能相對於放大。 :使相對於放大器41轉動測試點適配器U見箭頭A1)， 中：導體7將相對於放大器41保持在固定位置卜 被最小化。主艚，仲 移位的風險 7由… 對於旋轉螺母44旋轉。中心導體 、丁 3保持固定，由此中心導體7相對％ # 10被伴持固^ ’體7相對於咬緊件9、 -實：咬緊件Μ。則與主體2 -起轉動。在另 ，當主體轉動時，咬緊 2固定。如果主體2相對於中心導體7移/相對於主體 端部5處連拯η 導體7移動’那麼在第二 體被從中心導體ΓΓ適配器的線境（未示出）的内部導 ^ 導體7上的夾持機構45中抽出。 時當接主二2^ 在中心導體7上滑動。借助於彈簧19, 15 201136073 在中〜導體7和接觸構件2〇之間實現了牢固的接觸。因 此，實現了與測試體u聯接的測試 接觸。不管測試體η相對於中心導體7所取向::置的: 接觸都被保持。_ 4示出了將帽29安裝在測試體u上的 測s式點適配器1。當在測試過程中使用測試點適配器時， 移除帽29,並將測試儀器連接至第三介面（15)。 圖3不出了® 2的測試點適配器的剖視圖，以進一步顯 不旋轉構件4 °只示出了測試點適配器1的-部分。所示 處於其未連接到配合部件時。由點線圍繞的是放大 視圖，其示出了主體2、螺母1〇3和旋轉構件4相對於彼 Ζ位置的非壓縮狀態，即當測試點適配器i未安裝至配 (未不出）時。在該狀態下，可以看到在旋轉構件 的卜。P錐形區域1〇24和螺母1〇3的内部傾斜表面區域 簡之間存在有第—間隙⑻還可以看到第二間隙⑻6 位於外圓柱表面1015的凹陷區域㈣和旋轉構件4的可 壓縮第二端部1〇22的内表面的一部分之間。此外，可以看 到旋轉構件4的向内延伸凸起部1037以這種方式定位， 即：使得旋轉構件4不能從主體2滑下。這具有這樣的效 果’即：當旋轉構件4的螺紋區域連接到配合部件（未示 出）且螺母1〇3被轉動以將旋轉構件4拉入配合部件中時， 第一側壁1025將盥g?人卸从& _ /、- D。卩件接觸。相對於配合部件，螺母 103在與配合部件接觸時將位於固定位置中。 因此，旋轉構件4將朝著配合部件（即遠離主體2的 第二端部H)6)滑動’且旋轉構件4將由此相對於螺母⑻ 16 201136073 沿著主體2的縱向軸線滑動。旋轉構件4和螺母3的這種 相對運動將使得旋轉構件4的可壓縮第二端冑购的" 傾斜表面區域⑽與螺母3的内部傾斜表面區域助接 觸。傾斜區域1024、1〇25的傾斜將導致作用力，該作用力 在仏向上朝著主體2的縱向軸線8按壓向内延伸的凸起部 旋轉構件4的第二端部1022的可壓縮性可有利於只 向螺母103施加一個小的轉矩就能實現測試點適配器1(只 局4不出）和配合部件（未示出）之間的牢固連接。 【圖式簡單說明】 參考附圖對本發明進行詳盡描述，其中： 圖1不出了根據本發明的測試點適配器的實施例； 圖2示出了圖！的測試點適配器的剖視圖； 圖3A不出了用於測試點適配器的咬緊件； 圖3B不出了用於測試點適配器的接觸構件； 圖3C示出了彈簧的實施例； 圖3 D示出了測试體實施例的分解圖以及它的部件； 圖4示出了位於其安裝位置中的測試點適配器，以及 圖5示出了旋轉構件的實施例。 【主要元件符號說明】 1..適配器；2._主體； 3 5、13、14、24、27、39、40·.端部；4、6、15..介面； 7.·中心導體；8、12..縱向軸線；9、1〇 ' 16.咬緊件； 17 201136073 11.. 測試體；17..環形凸起部；18..邊緣；19..彈簧； 20·.接觸構件；21、22、26..中心孔；23..電阻器； 25.. 握持佈置；28..帽；29..終止器；30..密封裝置； 31、32、33..0形環；34..邊緣區域；35..主端部；36..縫； 37.·指狀物；38..内表面；41..放大器；42..配合介面； 43.. 螺釘；44、103·.螺母；45..夾持機構；10 18·.凹陷區域； 1024.. 錐形區域；1025..側壁；1035、1036..間隙； 1037.. 凸起部 18Set as an integral part of the test equipment (f-侑I not coming out). In this case, the contact member 20 can be arranged from τ to, for example, receive a second center conductor from the test equipment. A Figure 3 shows the bite member 16 for mounting in the end portion 13 of the first test body! 6 is provided with an annular raised portion] 7. Further, the gripping member 16 is provided with a gripping member central opening 21 having an inner surface 38 for receiving the contact member 20. The edge region 34 is disposed on the bite member 16 and extends from the bite member main end portion 35 and surrounds the bite member center hole 2ι. The edge region 34 can be located at the end of the tube end. The gripping member 16 can be made of a dielectric material. The gripping member i 6 is sized to mount the gripping member i 6 into the test body 11 and still allows the gripping member 16 to follow the elasticity of the spring 19 (shown in Fig. 3C) along the longitudinal direction of the test body 11. The axis moves. In another embodiment of the bite member 16, the edge region can be substantially flush with the bite member main end portion 35. FIG. 3B shows an embodiment of the contact member 2A. In order for the contact member to be easily wrapped around the end of the resistor (as shown in Figure 2), a slit 36' is cut into the contact member thereby forming the finger 37. The fingers 37 can each have a projection 38 of 201136073 for the anaesthetic + inner surface 38 of the central bore of the assembly: The tapered profile of the member 2 jaw member end portion 39 causes the contact member to be inserted into the central bore 22 of the gripping member 16. When " 37 is pressed into the center hole 22 of the gripping member 16, the finger starting portion 38 is biased and radially inwardly bent thereby being clamped at the electric= (not shown) around. The second contact member end portion 4 is substantially flat & in contact with the first-center conductor 8 located within the body 2. The second contact end 40 can be convex in other embodiments.楛 for the warmer * The embodiment of the resilient washer 19 'elastic washer 19' is used to keep the contact member 2G in electrical contact with the first central conductor 8. The beta is provided by other elastic means such as rubber or other types of springs. Figure 30 shows an embodiment of the required components. The cap 29 is mounted on the test body 11. The connection between the cap 29 and the test body is by the sealing device 30' in the test piece 11, and the grip arrangement 25 is for holding around the second end of the resistor 2_3. The O-ring 31 seals the connection between the test body 11 and the main body 2 (not shown). The first end of the resistor 23 is inserted through the bite member 16' and into the central 'hole' of the bite member where it is received by the contact member. When the contact member 2 is inserted into the center hole of the bite member, the fingers of the contact member 20 are bent radially inwardly and clamped around the first end of the resistor n. The gripping member 16 is positioned within the test body 11 such that the spring 19 is interposed between the edge of the test body and the annular projection of the gripping member 16. The gripping member 16 can be fitted into the first end portion of the test body 11 in such a manner that the gripping member can be moved if it is biased (e.g., by the spring 19). For example, 201136073 Tian Mei Ge褒 went to the test. If there is no force, the friction between the ‘A T town, m ground" and the test body 11 will keep the bite in its position. The grip arrangement 25 can be arranged to provide the possibility of the resistor 23 moving relative to the test body 11. Figure 4 shows the test point adapter i mounted on a mating component 41 (e.g., amplifier 41 (shown only partially)). The interface 4 of the first end of the body 2 (i.e., the rotating member or the rotating nut) is mounted in the mating component (i.e., the mating interface 42 of the amplifier (1). The center conductor 7 is by means of a screw": for amplifying the screw 43 Firmly clamped in the center conductor 7 (plug: around, when fixed) the center conductor 7 can not be enlarged relative to: .. to rotate the test point adapter U relative to the amplifier 41 see arrow A1), medium: the conductor 7 will be relative to the amplifier 41 Keeping in the fixed position is minimized. The main 艚, the risk of the secondary shift 7 is rotated by the rotating nut 44. The center conductor, the ding 3 remains fixed, whereby the center conductor 7 is held together with respect to % #10 7 with respect to the gripping member 9, - solid: the gripping member Μ, then rotates with the main body 2. In addition, when the main body rotates, the clench 2 is fixed. If the main body 2 is moved relative to the center conductor 7 / relative to the main body At the end 5, the conductor η conductor 7 moves 'then then the second body is extracted from the clamping mechanism 45 on the inner conductor 7 of the line (not shown) of the center conductor ΓΓ adapter. 2^ Slide on the center conductor 7. By means of the spring 19, 15 2 01136073 A firm contact is achieved between the mid-conductor 7 and the contact member 2A. Thus, a test contact to the test body u is achieved. Regardless of the orientation of the test body η relative to the central conductor 7:: placed: contact It is held. _ 4 shows the s-point adapter 1 that mounts the cap 29 on the test body u. When the test point adapter is used during the test, the cap 29 is removed and the test instrument is connected to the third interface. (15) Figure 3 shows a cross-sectional view of the test point adapter of the ® 2 to further show that the rotating member 4 ° shows only the - part of the test point adapter 1. It is shown when it is not connected to the mating part. The dotted line is surrounded by an enlarged view showing the uncompressed state of the body 2, the nut 1〇3 and the rotating member 4 relative to the position of the other, that is, when the test point adapter i is not mounted to the mating (not shown). In this state, it can be seen that there is a first gap (8) between the inner tapered surface region of the rotating portion of the rotating member, the P-conical region 1〇24 and the nut 1〇3, and the second gap (8) 6 is also visible. a recessed area (four) of the cylindrical surface 1015 and a rotating member 4 is compressible between a portion of the inner surface of the second end portion 1 22. Further, it can be seen that the inwardly extending projection 1037 of the rotating member 4 is positioned in such a manner that the rotating member 4 cannot be removed from the main body 2 slide down. This has the effect that the first side wall is when the threaded region of the rotating member 4 is coupled to the mating component (not shown) and the nut 1〇3 is rotated to pull the rotating member 4 into the mating component. 1025 will unload the 从g? person from & _, - D. The nut 103 will be in a fixed position when it comes into contact with the mating component with respect to the mating component. Therefore, the rotating member 4 will face toward the mating component ( That is, sliding away from the second end H) 6) of the body 2 and the rotating member 4 will thus slide along the longitudinal axis of the body 2 relative to the nut (8) 16 201136073. This relative movement of the rotating member 4 and the nut 3 will cause the "compressed second end-purchased " inclined surface area (10) of the rotating member 4 to be in contact with the inner inclined surface area of the nut 3. The inclination of the inclined regions 1024, 1 〇 25 will result in a force that compresses the compressibility of the second end 1022 of the inwardly extending raised portion of the rotating member 4 in the 仏 direction toward the longitudinal axis 8 of the body 2 It is advantageous to apply a small torque to the nut 103 to achieve a secure connection between the test point adapter 1 (only the unit 4) and the mating component (not shown). BRIEF DESCRIPTION OF THE DRAWINGS The invention will be described in detail with reference to the accompanying drawings in which: Fig. 1 shows an embodiment of a test point adapter according to the invention; Fig. 2 shows a diagram! Figure 3A shows a contact member for a test point adapter; Figure 3B shows a contact member for a test point adapter; Figure 3C shows an embodiment of the spring; Figure 3D shows An exploded view of the test body embodiment and its components are shown; Figure 4 shows the test point adapter in its installed position, and Figure 5 shows an embodiment of the rotating member. [Description of main component symbols] 1. Adapter; 2. _ body; 3 5, 13, 14, 24, 27, 39, 40 ·. End; 4, 6, 15 .. interface; 7. Center conductor; 8, 12.. longitudinal axis; 9, 1〇' 16. bite; 17 201136073 11.. test body; 17. annular protrusion; 18.. edge; 19. spring; 20. ; 21, 22, 26. center hole; 23. resistor; 25.. grip arrangement; 28. cap; 29.. terminator; 30.. sealing device; 31, 32, 33.. Ring; 34. edge area; 35. main end; 36.. slit; 37.·finger; 38.. inner surface; 41.. amplifier; 42. mating interface; 43.. , 103·. nut; 45.. clamping mechanism; 10 18·. recessed area; 1024.. tapered area; 1025.. side wall; 1035, 1036.. clearance; 1037..