201132991 .六、發明說明： 專有名詞（Terminology)說明： RFanechoic chamber:射頻電波暗室 Feeding wall:饋入牆 Quiet zone:測試靜域 Homogeneous property:均態之特性 Measurement antenna:量測天線 【發明所屬之技術領域】 本發明關於一種矩形射頻電波暗室之創新設計，尤指一種貼附在 饋入牆面上之材料或吸波材料在XY平面方向具有均態之特性，且量 測天線安裝於該饋入牆面上之射頻電波暗室，得以大幅改善電波暗室 產生的測試靜域之品質，或以較小體積之電波暗室產生高品質之低頻 測試靜域者》 其中測試靜域之品質係指測試區内電磁波強度均勻度，或強度漣 波大小。 【先前技術】 在一射頻電波暗室測試天線之輕射場型（antenna radiation pattern)，天線之輻射效率（antenna radiation efficiency of antenna) ’ 無 線裝置之輕射功率（radiation power ) ’無線裝置之接收靈敏度（receiving sensitivity)，設備之射頻雜訊轄射（RF spurious emission of device)，其 測試靜域之品質會直接影響測量精度。 ί 3 201132991 傳統的矩形射頻電波暗室1 0 ’如第一圖及第一 A圖所示，通常 地，錐形吸收體13被貼附在饋入牆面12上，且量測天線丄4 (一 或多支）被安裝在饋入牆面1 2上（如第一A圖），或安裝在離饋入牆 面1 2 —距離（如第一圖）。此種類型的設計，在低頻率不易具有一高 品質的測試靜域1 5，例如低於700 MHz。為了在低頻率頻帶下得到 ―兩品質測試靜域15，則需一個較大型的矩形射頻電波暗室1〇 ^ 在執行低頻測試，常使用另一種型態射頻電波暗室，錐形電波暗室 (Tapered RF Chamber) ’其具有較好的低頻測試靜域1 5。但是，矩 形射頻電波暗室較錐形電波暗室容易建構，特別是在高屏蔽測試環境 需求下。 由於在低頻率頻帶的應用正漸增加，像是數位視頻廣播（Digitai201132991. VI. Description of the invention: Terminology: RFanechoic chamber: Feeding wall: Feeding wall: Feeding wall Quiet zone: Testing static area Homogeneous property: Characteristics of the measured element: Measuring antenna: Measuring antenna BACKGROUND OF THE INVENTION 1. Field of the Invention The present invention relates to an innovative design of a rectangular RF anechoic chamber, and more particularly to a material or absorbing material attached to a wall that has a uniformity in the XY plane direction, and the measuring antenna is mounted on the feeding The radio frequency anechoic chamber on the wall surface can greatly improve the quality of the test static field generated by the anechoic chamber, or generate a high-quality low-frequency test static field with a small volume of the anechoic chamber. The quality of the test static field refers to the test area. Internal electromagnetic wave intensity uniformity, or intensity chopping size. [Prior Art] The antenna radiation pattern of the antenna is tested in an RF anechoic chamber, and the antenna radiation efficiency of the antenna 'radiation power of the wireless device' Receiving sensitivity), the device's RF spurious emission of device, which tests the quality of the static domain directly affects the measurement accuracy. ί 3 201132991 Conventional rectangular RF anechoic chamber 10 ' As shown in the first and first A diagrams, generally, the tapered absorber 13 is attached to the feed wall 12 and the antenna 丄 4 is measured ( One or more) are mounted on the feed wall 1 2 (as in Figure A), or on the feed wall 1 2 - distance (as shown in the first figure). This type of design does not easily have a high quality test static field at low frequencies, such as below 700 MHz. In order to obtain the "two-quality test static domain 15" in the low frequency band, a larger rectangular RF anechoic chamber is required. In the low frequency test, another type of radio frequency anechoic chamber, tapered anechoic chamber (Tapered RF) is often used. Chamber) 'It has a good low frequency test static domain 1 5 . However, rectangular RF anechoic chambers are easier to construct than tapered anechoic chambers, especially in high shielding test environments. Due to the increasing use of applications in the low frequency band, such as digital video broadcasting (Digitai
Video Broadcasting，DVB )、甚高頻（Very High Frequency，vhf )通信、 及射頻辨識（RFID)技術等。因此，需要一種改良的矩形射頻電波暗 室，以能夠在低頻率頻帶下提高測量精度，以及降低成本。 【發明内容】 基於咼品質測試靜域及低頻矩形射頻電波暗室需求要件下，本發 明提供了一種創新類型的矩形射頻暗室設計，其中裝置在射頻電波暗 室之饋入牆面上的材料或吸收材料在XY平面上具有均態之特性，該 XY平面平行於饋入牆面。安裝在其他牆面的吸收材料在平行於所安 裝牆面之平面上，則不具有均態之特性。而量測天線（measurement antenna(s)，MA)，被安裝於該饋入牆面上，藉此，具有均態特性之材料 將可低來自該牆面所散射場之干涉並產生極少量的散射場；而接近 4 201132991 於饋入牆面之電磁場將被導引且在側牆上以近於垂直入射角度而被吸 收，相同地並將產生很少量的散射場，因此可產生—具有相當改善品 質之測„式靜域。尤其工作在低頻率，吸收材料具有強的散射特性，以 及較差的吸钱力，這樣的設計降健射場效果更涵著；此設計， 在正常操作頻帶以及低頻率頻帶下，能提供一高品質測試靜域。對低 頻應用’-個小驗形軸電波暗室將可節省電波暗室建構的成本。 以下，將依據圖面所示之實施例而詳加說明本發明之技術特點及 功效。 【實施方式】 明參見第二A圖，顯示了本發明矩形電波暗室2 〇之χγ z座標 相關方向，㈣三關為自U向所視之平面示意圖。本發明提供一 種矩形電波暗室2 0，在其饋人牆面（feeding wall) 2 2上貼附之材 料2 3於X Y方向具有均態之特性（h〇m〇gene〇us pr〇pert^)，且量測天 線（me_ementantenna⑻）2 4安裝於該饋入牆面2 2上；該矩形電 波暗室2⑽附在其他牆面之吸波材料，平行於該牆面平面方向不具 有均4之特性，如第三圖巾所示平行牆面呈非均態的材料2丨為錐狀。 本發明藉由將矩形電波暗室2 0的饋人牆面2 2 (錢收牆）改 設為在XY平面方向具均態特性的材料2 3後，其量測天線2 4之電 磁場在此敵料產生健（喊ering)财，減，便肢善測試靜 域（QuietZone) 2 5内之場強均勻度》這樣，將使得整個矩形電波暗 室2 0可以較小尺寸即可產較低頻之測試環境，有助於成本的降低。 可參見細®鮮之職絲，顯林發明可產生高品質之麵Video Broadcasting, DVB), Very High Frequency (vhf) communication, and Radio Frequency Identification (RFID) technology. Therefore, there is a need for an improved rectangular RF microwave chamber that is capable of improving measurement accuracy and reducing cost in a low frequency band. SUMMARY OF THE INVENTION The present invention provides an innovative type of rectangular RF darkroom design based on the quality requirements of the static and low frequency rectangular RF anechoic chambers, wherein the device or the absorbing material is applied to the wall of the RF anechoic chamber. It has a uniformity on the XY plane, which is parallel to the feed wall. Absorbent materials mounted on other walls are not parallel to the wall on which they are mounted. A measurement antenna (s), MA is mounted on the feed wall, whereby a material having a uniform property will have low interference from the scattered field of the wall and generate a very small amount of Scattering field; while near 4 201132991, the electromagnetic field fed into the wall will be guided and absorbed on the side wall at a near normal incidence angle, and will produce a very small amount of scattered field, thus producing - with considerable Improve the quality of the static field. Especially work at low frequencies, the absorption material has strong scattering characteristics, and poor suction power, this design is more effective in the field; this design, in the normal operating frequency band and low In the frequency band, a high-quality test static domain can be provided. For low-frequency applications, a small-accurate-axis anechoic chamber can save the cost of anechoic chamber construction. Hereinafter, the detailed description will be based on the embodiment shown in the figure. The technical features and effects of the invention. [Embodiment] Referring to FIG. 2A, the γ z coordinate of the rectangular anechoic chamber 2 of the present invention is shown in the relevant direction, and (4) the third level is the plane viewed from the U direction. The present invention provides a rectangular anechoic chamber 20 in which a material 2 3 attached to a feeding wall 2 2 has a uniform state in the XY direction (h〇m〇gene〇us pr〇pert^ And a measuring antenna (me_ementantenna (8)) 24 is mounted on the feeding wall 2 2; the rectangular anechoic chamber 2 (10) is attached to the absorbing material of the other wall surface, and has no uniformity in parallel to the plane direction of the wall surface. As shown in the third figure, the parallel wall surface is non-uniform, and the material 2 is tapered. The present invention changes the feeding wall 2 2 (money wall) of the rectangular anechoic chamber 20 to XY. After the material in the plane direction with the uniformity characteristic 2 3 , the electromagnetic field of the measuring antenna 24 is generated in this enemy material, and the field strength is uniform in the QuietZone. In this way, the entire rectangular anechoic chamber 20 can be produced in a smaller size to produce a lower frequency test environment, which contributes to cost reduction. See the fine product of the fresh ruth, and the invention can produce high quality. surface
L 5 201132991 /則《式靜域2 5。0主·第四圖電波暗室尺寸為咖咖*挪咖巧收爪，先 前技術第二㈣波暗室尺寸為：712em*365em*365em) 進者，請參見第簡，係為本發明另—種實施例，其中矩形電波 暗室3 0與刖實把例相同，具有平行牆面呈非均態的材料3卜饋 入牆面3 2、平行牆面呈均態的材料3 3 '量測天線3 4等，但與第 三圖平行牆面呈均態的材料2 3為單収波材料（flatabs〇齡）不同， 其中的平行牆面呈均態的材料3 3可為多層吸波材料（ ―)3 3 1、3 3 2及3 3 3。經由這樣的設計，將使得低頻測 試靜域3 5品質大為改善。另外，平行牆面呈均態的材料也可以是空 氣（air)。 紅上所陳’本發明所完全符合發明專利的新穎性及進步性要件， 爰依法提出申請。 【圖式簡單說明】 第一圖代表一種習知矩形射頻電波暗室的示意圖， 第一A圖代表一種習知矩形射頻電波暗室的示意圖， 第二圖代表習知矩形射頻電波暗室對不同頻率測試結果， 第三圖代表本發明之示意圖， 第三A圖代表本發明之χγζ座標相關方向示意圖， 第四圖代表本發明對不同頻率測試結果， 第五圖代表本發明之另一種實施例之示意圖。 201132991 【主要元件符號說明】 矩形射頻電波暗室1〇 饋入牆面12 錐形吸收體13 量測天線14 測試靜域15 矩形電波暗室2 0、3 0 (平行牆面呈非均態的）材料21、31 • 饋入牆面2 2、3 2 (平行牆面呈均態的）材料2 3、3 3 多層吸波材料3 31、3 3 2及3 3 3 量測天線24、34 測試靜域2 5、3 5L 5 201132991 / Then "The static field 2 5. 0 main · The fourth picture of the dark room size is the coffee coffee * No coffee clever claws, the second technique of the prior art (four) wave dark room size: 712em * 365em * 365em) Please refer to the first embodiment, which is another embodiment of the present invention, wherein the rectangular anechoic chamber 30 is the same as the tamping case, and the material having the parallel wall surface is non-uniformly fed into the wall surface 3 2. Parallel wall surface The homogeneous material 3 3 'measures the antenna 3 4 , etc., but the material parallel to the wall parallel to the third figure 2 3 is a single wave-receiving material (flatabs age), wherein the parallel wall is in a uniform state The material 3 3 may be a multilayer absorbing material ( ―) 3 3 1 , 3 3 2 and 3 3 3 . Through such a design, the quality of the low frequency test static domain will be greatly improved. In addition, the material that is parallel to the parallel wall may also be air. The invention is fully in line with the novelty and progressive requirements of the invention patent, and the application is filed according to law. BRIEF DESCRIPTION OF THE DRAWINGS The first figure represents a schematic diagram of a conventional rectangular RF anechoic chamber. The first A diagram represents a schematic diagram of a conventional rectangular RF anechoic chamber, and the second diagram represents a conventional rectangular RF anechoic chamber for different frequency test results. The third diagram represents a schematic diagram of the present invention, the third diagram A represents the relative direction of the χγζ coordinate of the present invention, the fourth diagram represents the test results of the different frequencies of the present invention, and the fifth diagram represents a schematic diagram of another embodiment of the present invention. 201132991 [Description of main component symbols] Rectangular RF anechoic chamber 1〇 feeding into wall 12 Cone absorber 13 Measuring antenna 14 Testing static domain 15 Rectangular anechoic chamber 2 0, 3 0 (parallel wall is non-uniform) material 21, 31 • Feed into the wall 2 2, 3 2 (parallel wall is homogeneous) material 2 3, 3 3 multi-layer absorbing material 3 31, 3 3 2 and 3 3 3 measuring antenna 24, 34 test static Domain 2 5, 3 5