TW201126582A - Apparatus for forming protective tape on compact camera chips and method of the same - Google Patents

Apparatus for forming protective tape on compact camera chips and method of the same Download PDF

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Publication number
TW201126582A
TW201126582A TW99102153A TW99102153A TW201126582A TW 201126582 A TW201126582 A TW 201126582A TW 99102153 A TW99102153 A TW 99102153A TW 99102153 A TW99102153 A TW 99102153A TW 201126582 A TW201126582 A TW 201126582A
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Taiwan
Prior art keywords
wafer
protective film
cover
support plate
wafers
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TW99102153A
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Chinese (zh)
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TWI430343B (en
Inventor
Yi-Chang Hsieh
Wei-Feng Lin
Wen-Jen Ho
Chi-Kuei Lee
Cheng-Hsiang Kao
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Omnivision Tech Inc
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Priority to TW99102153A priority Critical patent/TWI430343B/en
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  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
  • Solid State Image Pick-Up Elements (AREA)

Abstract

The present invention provides a method for forming a protective tape on compact camera chips. The method includes providing a support plate for carrying a chip tray to fix position of the chip tray with a plurality of chips formed thereon. A housing is provided for fixing the support plate. A protective tape is attached on the surface of the housing. A press plate is applied to the protective tape such that the protective film patterns on the protective tape are transferred to the chips.

Description

201126582 «201126582 «

I I 六、發明說明: 【發明所屬之技術領域】 本發明係有關於一種微型攝像晶片, θ 士 a月认仏 人付疋而吕’疋 有關於一種形成保護膜於微型攝像晶片上之方 【先前技術】 / ° 有半感測器已廣泛被用作為影像感測器,其具 極體可作為光電轉換元件。目前包括兩類 ==:測器,其一為電荷搞合式半導體影像感測器 件(CCD)可供檢測光並傳輸光電w 為電曰曰體式衫像感測器具有互補型 傳輸先電荷。互補型金氧 上述應用領域主要利用光二極體元件的 動旦素陣列或影像感測 成數位資料。 fj π入射之影像光能轉換 影傻咸.、目丨丨社十 佣1孟乳+%效電晶體等 杨,可提升影像擷取裝置(如··數位 手機及數位攝影機等)之像素品質。影 …、相 來偵測物件資訊並將之轉化 1。、 ’、種用 ^ oa t -. 二電子衫像信號之元件。哥;傻 感别7〇件可包括—攝 1干々像 例如是井^斤 固態影像感測器。攝像管 疋先導S、氧化鉛管或硒砷 測器例如是互補式 碲視像S ,而固怨影像感 補式金屬魏物半導體或電荷#合元件。 電何耦合元件與互補型金 nii M ja a ,, 平^干麥双電晶體可以作為外 尘躡像晶片。微型攝像晶片 4马铽 爾像s日片具有低功耗、體積小、重量小、 LSj 3 201126582 ; r 曝光時間短以及無需預熱 攜帶型影像掃描設備中得到了座使,、在阿速影像輸入和 以整合在具有掃描、傳真及"/乏應用。微型攝像晶片可 微型攝像晶片在運送的過 事務機中。 是粉塵(Particles)的污毕,刹A “成到傷、靜電或 其影像擷取品質甚至電性I 次疋叔塵巧染會影響 π』、 失效’所以在微型攝像f Κ夕u >成一保護臈以防止粉塵的污鈇 曰II. Description of the Invention: [Technical Field of the Invention] The present invention relates to a miniature imaging chip, θ 士 a 仏 疋 疋 疋 疋 吕 吕 吕 吕 疋 疋 疋 疋 疋 疋 吕 吕 吕 吕 吕 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成 形成Prior Art] / ° A semi-sensor has been widely used as an image sensor, and its polar body can be used as a photoelectric conversion element. At present, there are two types of ==: detectors, one of which is a charge-matching semiconductor image sensing device (CCD) for detecting light and transmitting photoelectric w. The electric body-like shirt-like sensor has a complementary transmission first charge. Complementary Gold Oxygen The above applications mainly utilize the dynamic diencephalic array of photodiode elements or image sensing into digital data. Fj π incident image light energy conversion shadow silly., witnessed the ten commissions 1 Meng milk +% effect crystal and other Yang, can improve the image quality of image capture devices (such as · digital mobile phones and digital cameras, etc.) . Shadow ..., to detect object information and convert it into 1. , ', kind of ^ oa t -. Two electronic shirt like signal components. Brother; silly feeling 7 pieces can include - photo 1 dry image such as well ^ kg solid state image sensor. Camera tube 疋 Pilot S, lead oxide tube or selenium arsenic detector is, for example, a complementary squint image S, and a resent image-sensing metal wafer semiconductor or charge-component. The electrical coupling element and the complementary gold nii M ja a , can be used as a dust mites wafer. Miniature imaging chip 4 Mamur image s day film has low power consumption, small size, small weight, LSj 3 201126582; r short exposure time and no need to preheat the portable image scanning device to get the seat, in the A-speed image Input and to integrate with scanning, faxing, and "/useless applications. The miniature imaging chip can be used in a transmissive transaction machine. It is the dirt of the Particles, and the brakes are “injury, static electricity, or the quality of the image. Even the electrical I times, the uncle dyeing will affect the π”, and the failure will be in the miniature camera f Κ u u > Into a protective plaque to prevent dust pollution

晶片之上形成保護膜的方法,伟=叙傳統的微型攝像 (P: by piece)將保護膜貼附於晶片上。此種方也 將單一保護膜準確地對準晶办 谷易 + 乃 令易產生保言蒦膜的尤白 率,並且對於大量的微型攝像a ' 又 多時間。 &amp;攝像-片之保護膜貼附需花費較 因此 目士 保護膜於微型攝像晶片上之形成方法 本發明提供一種優於習知保護膜貼附於微 1攝像Θη片上之方法以克服上述缺點。 【發明内容】 有鑑於此,本發明之主要目的在於提供 ,型攝像晶片上之裝置及其形成方法,其係利= 〜具之搭配以提升保護膜的貼附效率與組裝的精確度。 本發明之另-目的在於提供一種保護膜於微型ς像晶 片上之形成方法’其可以容易貼附保護膜於微型攝像晶片 上,使保護膜均勻地附著於微型攝像晶片上。 本發明之再-目的在於提供一種保護膜於冑型攝像晶 片上之形成方法,其可以允許保護膜依群組的方式放(配) 4 ,201126582 置。 本發明之又一目的就是在提一 晶片上之形成方法,利用更低的成:種保護膜於微型攝像 像晶片上,以節省產品的成本組裳保護膜於微型攝 综上所述,依據本發明之一 微型攝像晶片上之形成方法,包=二”—種保護膜於 ?片=,定晶片盤的位置’晶片盤上配置複數個 =上利用-外罩以固定支撐板;貼附—保護片於外罩之 ,以及加壓於一壓板以使該保護片 於禝數個晶片之上。 T艾肤将〒 支撐板包括一容置空間、複數 及第二榫眼,容置空間传 5 一榫眼 個第L #载晶片盤。外罩包括複數 m 二榫眼及凹洞’第二榫頭用以接合第二榫 二凹洞係用以容納複數個晶片。上蓋包括第四榫 U固料,第四榫眼用以接合第一榫 第三摔眼。保護片更包括一塾片貼 : 板係固定於一上蓋。 /再另實把例中’本發明之保護膜於微型攝像晶片上 之形成方法更包括舉起上蓋與外罩以分離晶片盤與支撐 板0 在實把例中,本發明之方法更包括貼附一壓合物件 於外罩之表面上’然後加壓該壓板於壓合物件之上使得保 護膜更緊地貼附晶片。之德,狡队L Λ广人 曰々^俊,移除上盍與壓合物件。最後, 利用上盖固定外罩,一把與Jtp 人 並&lt; i早 起舉起結合的上蓋與外罩以與晶片 201126582 » 盤及支撐板分離。 依據本發明之另一觀點扭 a u 规,,&quot;占,如出一種保護膜於微型摄 晶片上之形成方法,其包括提 攝像 捉仏支撐板,用於承载一曰 以固疋S曰片盤的位置’晶片盤上配置 利用一外罩以固定支撐板;貼附-保護片於外罩::面 &quot;一貝:附一轉印帶於外罩之上’其橫跨保護片之保護ί: 在區域;加壓一磨條於轉印帶之上,使得保護膜轉印至轉 丨::帶:上;移除外罩上之保護片,之後附著具有保護膜: 轉印π至外罩上,使得保護膜附著至複數個晶片之表面 上;以及移除轉印帶。 在一實施例中,本發明之方法更包括利用一上蓋固定 外罩’之後-起舉起結合的上蓋與外罩以與晶片盤及 板分離。 牙 依據本發明之又一觀點,提出一種保護膜於微型攝像 晶片上之形成方法’包含:提供—支撐板,用於承載一晶 片盤’以ϋ定晶片盤的位置’晶片盤上配置複數個晶片; 利用-外罩以固定支撐板;貼附-保護片於外罩之表面 士;t及加壓保護片上之保護膜圖帛,使得保護膜圖案附 著於複數個晶片之上表面,然後移除保護片,以將保護膜 圖案轉印至複數個晶片之上表面。 本發明之一種形成保護膜於晶片上之裝置,包含:一 支樓板,用於承载一晶片盤,以固定晶片盤的位置,晶片 盤上配置複數個晶片;一外罩,用以固定支撐板;一保護 片用於貼附外罩之表面上;以及一壓板,用以加壓使保 201126582 護片^上之保護膜轉印於複數個晶片之上,壓板係固定於— 上蓋之上。 本卷明之保護膜於微型攝像晶片上之形成方法與裝置 不^克服先則技術之缺點,且可有效增加保護膜於微型攝 像晶片上之形成方法之效率及可靠度,並可大幅降低成本。 【實施方式】 本發明將配合其較佳實施例與隨附之圖示詳述於下。 應可理解者為本發明中所有之較佳實施例僅為例示之用, 春並非用以限制。因此除文中之較佳實施例外,本發明亦可 廣泛地應用在其他貫施例中。且本發明並不受限於任何實 施例,應以隨附之申請專利範圍及其同等領域而定。 以下,將搭配參照相應之圖式,詳細說明依照本發明 之較佳實施例。關於本發明新穎概念之更多觀點以及優 點,將在以下的s兒明提出,並且使熟知或具有此領域通常 知識者可瞭解其内容並且據以實施。 • 本發明提供一種保護膜於微型攝像晶片上之形成方 法,其可以應用於微型攝像模組(C0mpact CameraA method of forming a protective film on the wafer, and a conventional microphotograph (P: by piece) attaches the protective film to the wafer. This method also accurately aligns a single protective film to the crystal grain, and it is easy to produce a white film, and it has a lot of time for a large number of miniature cameras. The invention relates to a method for forming a protective film attached to a micro-imaging wafer. The present invention provides a method for attaching a conventional protective film to a micro-imaging film to overcome the above disadvantages. . SUMMARY OF THE INVENTION In view of the above, the main object of the present invention is to provide a device for a type of imaging chip and a method for forming the same, which are used to improve the adhesion efficiency and assembly accuracy of the protective film. Another object of the present invention is to provide a method for forming a protective film on a micro-image wafer, which can easily attach a protective film to a micro-imaging wafer to uniformly adhere the protective film to the micro-imaging wafer. A further object of the present invention is to provide a method of forming a protective film on a 胄-type image-capturing wafer, which allows the protective film to be placed in a grouped manner, 4, 201126582. Another object of the present invention is to form a method for forming a wafer, using a lower protective film on a micro-image-image wafer, to save the cost of the product, and to protect the film on the micro-camera. A method for forming a micro-imaging wafer of the present invention, the package = two" - a protective film in the film =, the position of the fixed wafer disk - a plurality of on the wafer plate = upper use - outer cover to fix the support plate; attached - The protective sheet is mounted on the outer cover and pressurized on a pressing plate to make the protective sheet on the plurality of wafers. The T-shaped skin support plate includes a receiving space, a plurality of and a second blink, and the receiving space is transmitted. A blinking L-loaded wafer disc. The outer cover includes a plurality of m two blinks and a recess. The second pick is used to engage the second two recesses to accommodate a plurality of wafers. The upper cover includes a fourth U-shaped solid material. The fourth blinking eye is used to join the first third and third falling eyes. The protective sheet further comprises a cymbal patch: the slab is fixed on an upper cover. / Further, in the example, the protective film of the present invention is applied to the micro imaging wafer. The forming method further includes lifting the upper cover and the outer cover to separate the crystal The disc and the support plate 0. In a practical example, the method of the present invention further comprises attaching a embossing member to the surface of the outer cover and then pressing the pressing plate over the embossing member to make the protective film more closely attached to the wafer. Dezhi, 狡 L Λ Λ , , 俊 俊 俊 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , 俊 , , 俊 , , , , , , , , , , Separating from the wafer and the support plate according to another aspect of the present invention. According to another aspect of the present invention, the method of forming a protective film on a micro-photographing wafer includes a method of capturing and capturing a support plate for use. In the position of carrying a 曰 S 曰 ' ' 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片 晶片'The protection across the protective sheet ί: In the area; pressurize a strip on the transfer belt, so that the protective film is transferred to the transfer:: belt: upper; remove the protective sheet on the outer cover, then attach Protective film: Transfer π to the cover, so that the protective film is attached to the plural On the surface of the wafer; and removing the transfer belt. In one embodiment, the method of the present invention further includes securing the outer cover with an upper cover to lift the bonded upper cover and the outer cover to separate from the wafer disk and the plate. According to still another aspect of the present invention, a method for forming a protective film on a micro-imaging wafer is provided, which includes: providing a support plate for carrying a wafer disk to set a position of the wafer disk; a plurality of wafers are disposed on the wafer disk; Using a cover to fix the support plate; attaching a protective sheet to the surface of the cover; t and a protective film on the pressure protection sheet, so that the protective film pattern is attached to the upper surface of the plurality of wafers, and then the protective sheet is removed. To transfer the protective film pattern to the upper surface of the plurality of wafers. A device for forming a protective film on a wafer, comprising: a floor slab for carrying a wafer tray to fix the position of the wafer tray, the wafer tray Having a plurality of wafers disposed thereon; a cover for fixing the support plate; a protective sheet for attaching to the surface of the cover; and a pressure plate for pressurizing the protector 201126582 The protective film is transferred onto a plurality of wafers, and the platen is fixed on the upper cover. The method and apparatus for forming a protective film of the present invention on a micro-imaging wafer do not overcome the disadvantages of the prior art, and can effectively increase the efficiency and reliability of the formation method of the protective film on the micro-imaging wafer, and can greatly reduce the cost. [Embodiment] The present invention will be described in detail with reference to the preferred embodiments thereof and the accompanying drawings. It should be understood that all of the preferred embodiments of the present invention are for illustrative purposes only, and spring is not intended to be limiting. Therefore, the present invention is also widely applicable to other embodiments except for the preferred embodiments. The present invention is not limited to any embodiment, and should be determined by the scope of the appended claims and their equivalents. Hereinafter, preferred embodiments in accordance with the present invention will be described in detail with reference to the accompanying drawings. Further views and advantages of the novel concepts of the present invention will be set forth in the following description, and the <RTIgt; The present invention provides a method of forming a protective film on a miniature imaging chip, which can be applied to a miniature camera module (C0mpact Camera)

Module. CCM)以及晶圓級模組(Wafer Level Module: WLM) 產品。 如第一圖所示,其顯示依照本發明之第一實施例之支 撐板之不思圖。一支撑板100,其上包括一容置空間ιοί、 複數個榫頭102、榫眼103及榫眼1 〇4。值得注意者乃本發 明之支撐板1 〇〇包括容置空間101位於中央(心)區域,例 如為支撐板空腔101 ’以利於承載晶片盤,並固定晶片盤 201126582 « · 的位置。在本實施例中,榫頭102、榫目艮103及榫眼104 刀別位於支樓板1〇〇之上下左右二侧中,以利於提供後續 配件之接合。參考第二圖,晶片冑1〇5,其上包括複數個 凹洞以利於複數個微型攝像晶片106嵌入於其中,微型攝 像晶片1〇6例如為影像感測器1〇6。影像感測器包含電極 塾,其上表面具有一感測區域,用以接收影像光束,電極 塾係為感測區域將信號輸出(入)至(自)外界之介面。微型攝 像晶片106係以陣列方式配置於晶片盤1〇5之上。晶片盤 1〇5係對位支撐板空腔1G1以利於放置於支撐板_上二 然後,晶片盤105置放於支樓板1〇〇之空腔1〇1中參考 第三圖。 一外罩(h〇Using)107,其上包括一對準標記iu、小凸 (1〇9a及1〇9b、榫頭108a、榫眼108及凹洞11〇,參考 第四圖外罩1 〇7可針對不同的產品而改變其構造,其係 用以限制微型攝像晶片與保護片的位置。對準標記⑴, 例如為一圓形標記(亦可為其它形狀,端視使用而定),位 於左上方角落(亦可為其它位置,端視使用而定)以利於對 準。小凸起⑺外及109a分別位於外罩1〇7之上下二側以 利於後續保護膜之對位與接合,榫眼⑽位外罩丨们之左 右二側’格狀凹洞110位於外罩1〇7之中間區域。然後, 外罩W置放與固定於支撐板1GG與晶U 105之上,其 :榫頭108a嵌入以接合棒眼1〇4 ’格狀凹洞則係一對二 微型攝像晶片跡此格狀凹洞㈣實質上需與 ^ 晶片106對位,凹洞11〇之深度可以使微型攝像Module. CCM) and Wafer Level Module (WLM) products. As shown in the first figure, it shows a distraction of the support plate according to the first embodiment of the present invention. A support plate 100 includes an accommodation space ιοί, a plurality of boring heads 102, a mortise 103, and a mortise 1 〇4. It is noted that the support plate 1 of the present invention includes the accommodating space 101 in a central (heart) region, such as a support plate cavity 101' to facilitate carrying the wafer disk, and to fix the position of the wafer disk 201126582 «. In this embodiment, the boring head 102, the cymbal cymbal 103 and the mortise 104 are located in the lower left and right sides of the slab 1 , to facilitate the joining of the subsequent fittings. Referring to the second figure, the wafer 胄1〇5 includes a plurality of pits therein to facilitate the embedding of a plurality of micro-imaging wafers 106, such as image sensors 1〇6. The image sensor comprises an electrode 塾, the upper surface of which has a sensing area for receiving the image beam, and the electrode 为 is the sensing area for outputting (into) the signal to the (self) interface. The micro imaging wafers 106 are arranged in an array on the wafer trays 1 to 5. The wafer tray 1 〇 5 is aligning the support plate cavity 1G1 to facilitate placement on the support plate _ upper two. Then, the wafer tray 105 is placed in the cavity 1 〇 1 of the support slab 1 with reference to the third figure. An outer cover (h〇Using) 107, which includes an alignment mark iu, a small convex (1〇9a and 1〇9b, a boring head 108a, a mortise 108, and a recess 11〇, with reference to the fourth figure cover 1 〇7 The configuration is changed for different products, which is used to limit the position of the miniature imaging chip and the protective sheet. The alignment mark (1), for example, a circular mark (may also be other shapes, depending on the use), is located on the upper left Square corners (other positions may be used depending on the use) to facilitate alignment. The small protrusions (7) and 109a are respectively located on the lower two sides of the outer cover 1〇7 to facilitate the alignment and engagement of the subsequent protective film, blinking (10) The left and right sides of the outer cover are placed in the middle of the outer cover 1〇7. Then, the outer cover W is placed and fixed on the support plate 1GG and the crystal U 105, and the tread 108a is embedded to engage The rod eye 1〇4' lattice pit is a pair of two micro-image wafer traces. This lattice-shaped recess (4) essentially needs to be aligned with the ^ wafer 106. The depth of the recess 11 can make the miniature camera

SI 8 201126582 f \ 晶片丄06得以穿出其上,參考第五圖。 保错2護片112 ’例如為保護膠帶112,其上包括複數個 月、㈤案114,保護片112上下二側角落包括開口 113a ’以利於與外罩1们上之小凸S i 〇9a及職對位 :届二^&quot;考第六圖。舉一實施例而言,保護片112係由 -層材料層所構成’例如第—層為聚亞醯胺膜層 厂)’其上有複數個保護膜圖案ιΐ4;第二層為墊片 (叫’聚亞醯胺保護獏圖案ιΐ4黏附墊片之上。之後, 2過開口 U3a及113b與小⑽職及urn之對位斑接 5 ’保護片112貼合於外罩1〇7之表面上,其中每一保護 ΓοΓ夫Γ實質上對位凹㈤110内的每-微型攝像晶片 106,參考第七圖。 # IK t蓋(⑺猜Plate)U5,其上包括榫眼117、緊固部 二,Γ第八圖。在本實施例中,-愿板(P-師〇 ^ 5之下表面之下’壓W30具有凸起部131陣 货列形成於其中’壓板13〇利用一緊固部件132固定於上蓋 i15田之下。上蓋115可針對不同的產品而改變其構造,其 係用以承載壓板130,藉由外 外罩的對準標記可以更精確地 =同樣地’壓板130可針對不同的產品而改變其構造, ,用以使保護膜(膠帶)緊緊附著於微型攝像晶片上。舉 一貫施例而言,上蓋115鱼壓杯ηη_τ , /、壓板13〇可以依一體成型的方 1籌造。榫目艮U7位於上蓋115之上下二側中,緊固部件 夕置位於上蓋115之四個角落令’以利於與支稽板_及 卜罩1〇7之接合。接著’透過緊固部件ιΐ6嵌入棒眼⑽, S1 201126582 * \ ,眼in接合榫頭102,上蓋115置放並固定於支撐板ι〇〇 外罩1G7之上,錢,往下施力ιΐ8於上蓋⑴參考 =圖。於執行往下施力118於上蓋115之步驟前,微型 攝像晶片1G6微微地對準與貼合凹槽,然後往下適當的施 2使得微型攝像晶片1()6往上嵌人於凹槽之中,保護膜圖 案1H隨即轉印形成(黏貼/貼附)於微型攝像晶片⑽之上 =考第十圖之上圖。舉例而言,凹槽之大小與保護膜圖案 :之大小約略相等,複數個凹槽之配置與複數個保護臈 圖案114 一一對應。然後往上施力ιΐ9以舉起外罩⑽, ^考第十圖之下圖。基於結合的上蓋ιΐ5與外罩1〇7,微 线像晶片Η)6脫離上蓋115之後,上蓋ιΐ5與外罩ι〇7 傻^ Η邊下曰曰片I 1〇5置放於支撐板1〇0上,此時微型攝 日日106上已有保護膜圖案U4黏附於其上,以 广表示,參考第十一圖。本實施例中,保護膜圖案: 妾下來,分離上蓋115與外罩1〇7,並移除(剝 圖荦二鐘上的保護片112’此時保護片112上的保護膜 圖案U4以轉移至微型攝像晶片1〇6上,使得保護片⑴ 上原先的保護膜圖案位置留下空缺(開口仲,參考第十二 圖外罩107對位於晶片盤】〇5與支撐板_,參考第 =圖。上述之外罩107置放並結合於支 考第十四圖。 心丄茶 =,選擇性地將合物件m,例如橡膠膜⑽, d附於外I 107之表面上,橡膠膜120得以貼附曰 片盤105中的微型攝像晶片106上的保護膜圖案114,; .201126582SI 8 201126582 f \ The wafer 丄 06 is able to pass through it, refer to the fifth figure. The fault-protecting 2 piece 112' is, for example, a protective tape 112, which includes a plurality of months, (5) 114, and the upper and lower corners of the protective sheet 112 include openings 113a' to facilitate the small convex S i 〇 9a on the outer cover 1 and Positional match: the second two ^ &quot; test the sixth picture. In one embodiment, the protective sheet 112 is composed of a layer of a material layer (for example, the first layer is a polyimide film layer factory) having a plurality of protective film patterns ι 4 thereon; the second layer is a gasket ( It is called 'polyimide protection 貘 pattern ιΐ4 adhesive pad. After that, 2 through openings U3a and 113b and small (10) position and urn's alignment patch 5 'protective sheet 112 fits on the surface of the outer cover 1〇7 Each of the protective Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ Γ 五 五 五 五 五 五 五 五 五 五 五 五 五 五 五 # # # # # # # # # # # # # # # # # # # # # # # # # # # # In the eighth embodiment, in the present embodiment, the - (under the surface below the surface of the P-Shi 〇 ^ 5), the pressure W30 has a raised portion 131 in which the array is formed, and the pressing plate 13 〇 utilizes a fastening member 132 is fixed under the upper cover i15. The upper cover 115 can change its configuration for different products, which is used to carry the pressure plate 130, by the alignment mark of the outer cover can be more accurately = the same 'the pressure plate 130 can be different The product changes its structure, so that the protective film (adhesive tape) is tightly attached to the micro imaging chip. For example, the upper cover 115 fish cup ηη_τ, /, the pressure plate 13 〇 can be made according to the integrally formed side 1. The 艮 艮 U7 is located in the upper two sides of the upper cover 115, and the fastening members are located at the upper cover 115 The corner is made to facilitate the engagement with the slab _ and the hood 1 〇 7. Then 'embedded into the rod eye (10) through the fastening member ι 6 , S1 201126582 * \ , the eye is engaged with the hoe 102, and the upper cover 115 is placed and fixed on the support Above the 1G7 cover, the money is applied downwards to the upper cover (1) reference = Fig. Before the step of applying the downward force 118 to the upper cover 115, the micro imaging wafer 1G6 is slightly aligned and fitted with the groove Then, the appropriate application 2 is performed so that the micro-imaging wafer 1 () 6 is embedded in the groove, and the protective film pattern 1H is then transferred (applied/attached) onto the micro-imaging wafer (10) = For example, the size of the groove is approximately equal to the size of the protective film pattern: the arrangement of the plurality of grooves corresponds to the plurality of protection patterns 114. Then, the force is applied upwards to lift up Cover (10), ^ test chart below the tenth figure. Based on the combination of the upper cover ιΐ5 and outside After the cover 1〇7, the micro-line image wafer Η6 is separated from the upper cover 115, the upper cover ΐ5 and the outer cover ι〇7 silly ^ Η 曰曰 曰曰 I I I 置 置 置 置 置 置 置 置 , , , , , , , , , , , The protective film pattern U4 is adhered thereto on the day 106, as shown in the wide drawing, referring to the eleventh figure. In this embodiment, the protective film pattern is: smashed down, the upper cover 115 and the outer cover 1〇7 are separated, and removed ( The protective film 112' on the protective film 112 is peeled off onto the micro-imaging wafer 1〇6 at this time, so that the original protective film pattern position on the protective sheet (1) leaves a gap (opening) Referring to the twelfth figure, the outer cover 107 is located on the wafer tray 〇5 and the support plate _, refer to Fig. The outer cover 107 described above is placed and incorporated in the fourteenth drawing. Cardiac tea =, selectively attaching a component m, such as a rubber film (10), d, to the surface of the outer I 107, and the rubber film 120 is attached to the protective film pattern 114 on the micro imaging wafer 106 in the cymbal disk 105. ,; .201126582

I I 考第十五圖。 同理,上蓋115對位支撐板100與外罩1〇7,參考第 十六圖。上蓋115往下置放並固定於支撐板1〇〇與外罩1〇7 之上,往下適當的施力於上蓋115,利用橡膠膜12〇之壓 合,使得保護膜114緊緊地貼附微型攝像晶片1〇6,參考 第十七圖。之後,舉起結合的上蓋115,留下外罩ι〇7〔晶 片盤105與支撐板100,並移除外罩1〇7上的橡膠膜 參考第十八圖。 移除橡膠膜m之後,上蓋115往下對位置放並固定 於支樓板1〇〇與料107^,其對位與固定方式如前所 ,’參考第十九與二十圖。㈣,向上—起舉起結合的上 盍115與外罩1()7,留下晶片盤1〇5置放於支標板_上, 參考第二十一與第二十二圖。 下一步驟為分離晶片盤1〇5與支撐板1〇〇,此時微型I I test the fifteenth map. Similarly, the upper cover 115 is aligned with the support plate 100 and the outer cover 1〇7, refer to the sixteenth figure. The upper cover 115 is placed downward and fixed on the support plate 1〇〇 and the outer cover 1〇7, and is appropriately applied to the upper cover 115 downwardly, and is pressed by the rubber film 12 so that the protective film 114 is tightly attached. The micro imaging chip 1〇6, refer to the seventeenth figure. Thereafter, the combined upper cover 115 is lifted, leaving the cover ι 7 [the wafer disk 105 and the support plate 100, and the rubber film on the cover 1 〇 7 is removed. Refer to Fig. 18. After the rubber film m is removed, the upper cover 115 is placed in the lower position and fixed to the support plate 1 and the material 107, and the alignment and fixing manner are as described above, cf. Figs. 19 and 20. (4) Lifting up the combined upper jaw 115 and the outer cover 1 () 7 to leave the wafer tray 1〇5 placed on the support plate_, refer to the twenty-first and twenty-second figures. The next step is to separate the wafer tray 1〇5 from the support plate 1〇〇, at this time, the micro

攝像as片106上完成乾淨的保護膜圖案114黏附於其上以 保護其免於粒子的污染,參考第二十三圖。 八 值得注意者乃本發明之上述裝置之間的對位、結合與 分離等步驟可以透過手動或自動的方式完成。 ’、 如第二十四圖所示,其顯示依照本發明之第二實施例 之支撐板之示意圖。一去声把 + 支撐板200,其上包括一容置空間 、歿數個榫頭202及榫眼2〇3。容置空間2〇1位於中央 2區域,例如為支撐板空腔2〇1,以利於承載晶片盤。在 :::一中,榫頭202及榫眼2〇3分別位於支撐板之 一側,以利於後續配件之接合。參考第二十五圖, S] 201126582 b曰片盤204,其上包括複數個凹洞以利於複數個微型攝像 ,片/05嵌入於其中,微型攝像晶片2〇5例如為影像感測 器。微型攝像晶片205係以陣列方式配置於晶片盤2〇4之 上。晶片盤204係對位支撐板空腔2〇1以利於放置於支撐 板200上。晶片盤204置放於支撐板200之空腔2〇1中, 參考第二十五圖。 一卜罩206,其構造與第四圖類似或相同,其上包括 一對準標記207、小凸起施及雇、榫頭(類似棒頭 108a)、榫眼2〇9及凹洞2〇9a,參考第二十六圖。對準摔 記207’例如為一圓形標記,位於左上方角落以利於對準: 小凸起208a及208b分別位於外| 2〇6之上下二側以利於 後續保護膜之對位與接合,榫眼209位外罩206之左右二 ^^職位於外罩2〇6之中間區域。然後,外罩挪 ” s疋於於支撐板200與晶片盤2〇4之上,其 (類似榫頭l〇8a)嵌入以接合棒眼2〇3,凹洞職係 搭配微型攝像晶片205,此凹洞2 = …度可以使微型攝像= 付以穿出其上,參考第二十六圖。 m2護片21G’其構造與第六圖類似或相同,例如A 呆3膝帶210’其上包括複數個保護膜圖f 211,保譆: 210上下—側角落均有開口,以利於與外罩2%之、 :及鹰b對位與接合,參考第二十七圖。舉一^ :而「保護片2H)係由二層材料層所構貫: 為聚亞醯胺膜層,其上有複數個保護膜圖案^層 ,罘二層 12 S3 201126582A clean protective film pattern 114 is adhered to the image forming film 106 to protect it from particle contamination. Refer to Figure 23. It is noted that the steps of alignment, bonding and separation between the above devices of the present invention can be accomplished manually or automatically. As shown in Fig. 24, there is shown a schematic view of a support plate in accordance with a second embodiment of the present invention. The sound support + support plate 200 includes an accommodation space, a plurality of hoes 202 and a mortise 2 〇 3 . The accommodating space 2〇1 is located in the central 2 area, for example, the support plate cavity 2〇1 to facilitate carrying the wafer tray. In ::: 1, Shantou 202 and Blink 2〇3 are respectively located on one side of the support plate to facilitate the joining of subsequent accessories. Referring to the twenty-fifth diagram, S] 201126582 b cymbal disk 204, which includes a plurality of pits for facilitating a plurality of micro-imaging, in which the film /05 is embedded, and the micro-imaging wafer 2 〇 5 is, for example, an image sensor. The micro imaging wafers 205 are arranged in an array on the wafer trays 2 to 4. The wafer tray 204 is aligned with the support plate cavity 2〇1 to facilitate placement on the support plate 200. The wafer tray 204 is placed in the cavity 2〇1 of the support plate 200, with reference to the twenty-fifth diagram. A mask 206 having a configuration similar or identical to that of the fourth figure, including an alignment mark 207, a small projection application, a hammer (similar to the head 108a), a blink 2〇9, and a recess 2〇9a , refer to the twenty-sixth figure. The alignment mark 207' is, for example, a circular mark located at the upper left corner to facilitate alignment: the small protrusions 208a and 208b are respectively located on the lower side of the outer | 2〇6 to facilitate the alignment and engagement of the subsequent protective film, The left and right positions of the 209-position outer cover 206 are in the middle of the outer cover 2〇6. Then, the cover is moved over the support plate 200 and the wafer tray 2〇4, and the (like the head l8a) is embedded to engage the rod eye 2〇3, and the recessed grade is matched with the miniature imaging chip 205. Hole 2 = ... degrees can make a miniature camera = to be worn out, refer to the twenty-sixth figure. The m2 guard 21G' is constructed similarly or identically to the sixth figure, such as A stay 3 knee strap 210' including A plurality of protective film diagrams f 211, protection: 210 upper and lower sides have openings to facilitate the alignment with the outer cover 2: and the eagle b, refer to the twenty-seventh figure. The protective sheet 2H) is composed of two layers of material: a polyimine film layer having a plurality of protective film patterns thereon, and a second layer 12 S3 201126582

1 I 為塾•片(liner) ’聚亞醯胺保護膜圖案i 14黏附墊片之上。 之後,透過開口與小凸起2〇8a及208b之對位與接合,保 濩片210貼合於外罩2〇6之表面上,其中每一保護膜圖案 211貫貝上對位凹洞内的每一微型攝像晶片2〇5,參考第二 十七圖。 / 一 一轉印帶(transfer tape)212貼附於外罩206之上,其 検跨保護X 210之保護膜圖案211(聚亞醯胺膜層)所在區 域。轉印帶212約略與保護片21〇垂直配置,且轉印帶 必須確保完全覆蓋保護膜圖案211之所有的區域,如第二 十八圖所不。然後,一壓條(presskit)213置放於轉印帶 之表面上,如第二十九圖所示。基於保護膜圖案2ιι係朝 上配置,在施力於壓條213之後,將轉印帶212舉起,此 時保護膜圖案211將轉印至轉印帶212上,如第三十圖所 不。之後,移除外罩206上的保護片2丨〇之墊片,如第三 十一圖所示。 隨後,具有保護膜 木 i丄η汀q 六丄〈轉t卩带212 回覆至外罩206上,此時保護膜圖案211將貼附至微型攝 像晶片205々之表面上,如第三十二圖所示。然後,移除愿 條213,如第三十三圖所示。之後,透過緊固部件^嵌 入榫眼209’榫眼217接合榫頭搬,上蓋215置放並固定 於支撐板200與外罩鹰之上,_,往下施力於上蓋 ,=保護膜圖案21!緊緊地黏附於微型攝像晶片2〇5 之士,如第二十四圖所示。將外罩2〇6上之上蓋叫移除, 如第三十五圓所示。之後,再撕起轉印帶212 三、 201126582 • 4 六圖所示。撕起轉印帶212之後,留下支撐板2〇〇與外罩 2〇6,保護膜圖案211黏附於微型攝像晶片2〇5上,如第三 十七圖所示。 接下來,透過緊固部件216嵌入榫眼2〇9,榫眼217 接合榫頭202,上蓋215置放於支撐板2〇〇與外罩2〇6之 上,如第三十八圖所示。然後,下壓上蓋215,如第三十 九圖所示。將外罩206與上蓋215—起向上舉起,如^四 十圖所示彳放型攝像晶片204上具有保護膜圖案2丨丨黏附 於其上,以標號2〇5a表示。移除外罩2〇6與上蓋215之後, 留下支撐板200與外罩206,如第四十一圖所示。 “,同樣地,拿起晶片盤2〇4以與支撐板2〇〇分離,此時 微型攝像晶片2G5上完成乾淨的保護膜圖案2】i黏附於其 上以保護其免於粒子的污染。1 I is a lining • liner ‘polyimide protective film pattern i 14 is adhered to the spacer. Thereafter, through the alignment and bonding of the opening and the small protrusions 2〇8a and 208b, the protection sheet 210 is adhered to the surface of the outer cover 2〇6, wherein each protective film pattern 211 is aligned in the alignment hole For each micro imaging chip 2〇5, refer to the twenty-seventh figure. / A transfer tape 212 is attached to the outer cover 206, and spans the area where the protective film pattern 211 (polyimine film layer) of the protective layer X 210 is located. The transfer belt 212 is disposed approximately perpendicularly to the protective sheet 21〇, and the transfer belt must ensure that all areas of the protective film pattern 211 are completely covered, as in the twenty-eighth figure. Then, a presser 213 is placed on the surface of the transfer belt as shown in Fig. 29. The transfer film 212 is lifted after the application of the protective film pattern 2 ιι, and the protective film pattern 211 is transferred onto the transfer belt 212 as shown in Fig. 30. Thereafter, the spacer of the protective sheet 2 on the outer cover 206 is removed, as shown in FIG. Subsequently, a protective film is applied to the cover 206, and the protective film pattern 211 is attached to the surface of the micro-imaging wafer 205, as shown in the thirty-second figure. Shown. Then, the wish bar 213 is removed, as shown in the thirty-third figure. Thereafter, the mortise 209 is inserted through the fastening member ^ 榫 榫 217 217 to engage the hoe, and the upper cover 215 is placed and fixed on the support plate 200 and the outer eagle, _, and the lower cover is applied to the upper cover, = protective film pattern 21! Tightly adhere to the miniature imaging chip 2〇5, as shown in Figure 24. Remove the cover on the cover 2〇6 as shown in the thirty-fifth circle. After that, tear up the transfer belt 212 three, 201126582 • 4 six figures. After the transfer belt 212 is torn off, the support plate 2 and the cover 2〇6 are left, and the protective film pattern 211 is adhered to the micro-imaging wafer 2〇5 as shown in FIG. Next, the mortise 2 〇 9 is inserted through the fastening member 216, and the mortise 217 engages the boring head 202, and the upper cover 215 is placed on the support plate 2 〇〇 and the outer cover 2 〇 6 as shown in the thirty-eighth. Then, the upper cover 215 is pressed down as shown in Fig. IX. The cover 206 is lifted up with the upper cover 215, and the protective film pattern 2 is adhered thereto as shown in Fig. 4, 5a. After the outer cover 2〇6 and the upper cover 215 are removed, the support plate 200 and the outer cover 206 are left as shown in the 41st. " Similarly, the wafer tray 2 is picked up to be separated from the support plate 2, and at this time, a clean protective film pattern 2]i is adhered to the micro-imaging wafer 2G5 to protect it from particle contamination.

如第四十二圖所示,其顯示依照本發明之第三實施例 之不意圖。在保護片112貼合於外罩1〇7表面的步驟(如第 =圖所示)之後,直接加(按)壓保護片112之保護膜圖案的 心,使得核心保護臈(帶)緊緊地黏附微型攝像晶片ι〇6 η刑然後移除其他保護片材料,核心保護膜將留在 ::像晶片106之上表面。核心保護膜( 於微型攝像晶片⑽以標號腿來表示,如第 圖 戶斤不。 專^保護臈於微賴像晶片上之形成方法存在諸多 傳蛛切ΐ明之保護膜於微型攝像晶片上之形成方法優於 專、·先式保4膜於微型攝像晶片上之形成方法,並且具有傳 S3 14 201126582 * « 統式保護膜於微型攝像晶片 果0 上之形成方法無法 預期的效 從上述可知本發明之保護膜於微型攝像 及其形成方法,其特徵以及優點包括: 之裝置 1. ::用多種治具之搭配,因此可以提升保護膜的 貼附效率與組裝的精確度。 2. f用治具的組裝方式,可以容易組褒保護膜於As shown in the forty-second diagram, it is not intended to show a third embodiment in accordance with the present invention. After the protective sheet 112 is attached to the surface of the outer cover 1〇7 (as shown in FIG. 2), the core of the protective film pattern of the protective sheet 112 is directly applied (pressed) so that the core protective tape (belt) is tightly attached. Adhering to the miniature camera chip ι〇6 η and then removing the other protective sheet material, the core protective film will remain on: like the top surface of the wafer 106. The core protective film (the micro-imaging chip (10) is represented by the labeled leg, as shown in the figure. The protective film on the micro-image wafer has many kinds of protective films on the micro-camera. The formation method is superior to the method for forming a microfilm on a micro-imaging wafer, and has the effect that the formation method of the integrated protective film on the micro-photographing wafer 0 cannot be expected from the above. The protective film of the present invention is characterized by the following advantages: The device 1. The combination of a plurality of jigs can improve the adhesion efficiency and assembly accuracy of the protective film. With the assembly method of the jig, it is easy to form a protective film on the

象晶片上’並使保護膜均句地附著於微 型攝像晶片上。 3·可以允許保護膜依—群的方式放(配)置,而非 傳統的個別置放單一保護膠帶於單一晶片上。 4.利用更低的成本組裝保護臈於微型攝像晶片 上’以節省產品的成本。 對U領域技藝者,本發明雖以較佳實例闊明如 二二ί亚非用以限^本發明之精神。在不脫離本發明之 籲‘神與I㈣内所作之修改與類似的配置,均應包含在下述 =申晴專利範圍内,此範圍應覆蓋所有類似修改與類似結 構,且應做最寬廣的詮釋。 【圖式簡單說明】 上述元件,以及本發明其他特徵與優點,藉由閱讀實 施方式之内容及其圖式後,將更為明顯: 第-圖係根據本發明之第一實施例之支撐板之示意 第二圖係輯本發明之晶片盤對位支#板空腔之示意 t Si 15 201126582 • « » ·· 圖。 第三圖係根據本發明之晶片盤置放於切板空腔中之 示意圖。 第四圖係根據本發明之外罩對位支樓板與晶片盤之示 意圖。 第五圖係根據本發明之外罩固定於支撐板與晶片盤上 之示意圖。 第六圖係根據本發明之保護片對位外罩之示意圖。 第七圖係根據本發明之保護片貼合於外罩之示意圖。 第八圖係根據本發明之上蓋對位外罩之示意圖。 第九圖係根據本發明之上蓋固定外罩與支撐板之示咅 圖。 第十圖係根據本發明之往下施力與往上施力以舉起外 罩之不意圖。 第十一圖係根據本發明之一起舉起上蓋與外罩之示意 圖0 第十一圖係根據本發明之分離上蓋與外罩之示意圖。 第十三圖係根據本發明之移除外罩上的保護片之示魚 圖。 第十四圖係根據本發明之外罩置放並結合於支撐板上 之示意圖。 第十五圖係根據本發明之貼附壓合物件於外罩之表面 上之示意圖。 第十六圖係根據本發明之上蓋對位支樓板與外罩之示 201126582 意圖。 第十七圖係根據本發明之上蓋固定於支撐板與外罩之 上之示意圖。 第十八圖係根據本發明之舉起結合的上蓋之示意圖。 第十九圖係根據本發明之移除外罩上的橡膠臈之示意 圖。 第二十圖係根據本發明之上蓋固定於支撐板與外罩之 上之示意圖。 第一^圖係根據本發明之一起舉起結合的上蓋與外 罩之不意圖。 第二十二圖係根據本發明之晶片盤置放於支撐板上之 示意圖。 第二十三圖係根據本發明之舉起晶片盤以與支撐板分 離之示意圖。 第二十四圖係根據本發明之第二實施例之支撐板之示 Φ 意圖。 第二十五圖係根據本發明之晶片盤置放於支撐板空腔 中之示意圖。 第二十六圖係根據本發明之外罩固定於支撐板與晶片 盤上之示意圖。 第二十七圖係根據本發明之保護片貼合於外罩之示意 圖。 第二十八圖係根據本發明之轉印帶貼附於外罩上之示 意圖。 [s] 17 201126582 4 第二十九圖係根據本發明之壓條置放於轉印帶之表面 上之不意圖。 第三十圖係根據本發明之將轉印帶舉起之示意圖。 第三十一圖係根據本發明之移除外罩上的保護片之示 意圖。 第二十二圖係根據本發明之將轉印帶附著於外罩上之 示意圖。 第三十三圖係根據本發明之移除壓條之示意圖。 _ 第三十四圖係根據本發明之上蓋置放並固定於支撐板 與外罩之上之示意圖。 第三十五圖係根據本發明之移除上蓋之示意圖。 第三十六圖係根據本發明之撕起轉印帶之示意圖。 第二十七圖係根據本發明之撕起轉印帶留下支撐板與 外罩之示意圖。 、 第二十八圖係根據本發明之上蓋置放於支撐板與外罩 ^之上之不意圖。 第二十九圖係根據本發明之下壓上蓋於支撐板與外罩 之上之示意圖。 第四十圖係根據本發明之外罩與上蓋一起向上舉起之 示意圖。 第四十一圖係根據本發明之支撐板與外罩之示意圖。 曰第四十二圖係根據本發明之核心保護膜黏附微型攝像 晶片之上表面之示意圖。 第四十三圖係根據I發明之核心保護膜#附微型攝像 i Si 18 201126582The wafer is mounted on the wafer and the protective film is attached to the micro imaging wafer. 3. The protective film can be placed in a group-like manner instead of a conventional single protective tape placed on a single wafer. 4. Use a lower cost to assemble and protect the micro-camera wafers to save on product costs. For those skilled in the art of the U, the present invention is not limited to the spirit of the present invention by way of a preferred example. Modifications and similar configurations made without departing from the present invention should be included in the following = Shenqing patents, which should cover all similar modifications and similar structures and should be interpreted broadly. . BRIEF DESCRIPTION OF THE DRAWINGS The above-described elements, as well as other features and advantages of the present invention, will become more apparent after reading the embodiments and the drawings thereof. FIG. 1 is a support plate according to a first embodiment of the present invention. Illustrated second figure is a schematic diagram of the wafer disc alignment support of the present invention. The surface of the plate cavity t Si 15 201126582 • « » ·· Figure. The third figure is a schematic view of a wafer disc placed in a cavity of a cutting plate in accordance with the present invention. The fourth figure is intended to align the floor slab and the wafer platter according to the present invention. The fifth drawing is a schematic view of the outer cover fixed to the support plate and the wafer disk according to the present invention. Figure 6 is a schematic illustration of a protective sheet alignment cover in accordance with the present invention. The seventh drawing is a schematic view of the protective sheet according to the present invention attached to the outer cover. The eighth figure is a schematic view of the upper cover alignment cover according to the present invention. The ninth drawing is a schematic view of the outer cover and the support plate fixed by the upper cover according to the present invention. The tenth figure is a schematic view of the downward force application and the upward force according to the present invention to lift the outer cover. Fig. 11 is a schematic view showing the upper cover and the outer cover together according to the present invention. Fig. 11 is a schematic view showing the separation of the upper cover and the outer cover according to the present invention. The thirteenth figure is a fish diagram of the protective sheet on the removal cover according to the present invention. Fig. 14 is a schematic view showing the outer cover placed and bonded to the support plate according to the present invention. Fig. 15 is a schematic view showing the attachment of the embossed member to the surface of the outer cover according to the present invention. The sixteenth figure is an indication of the upper slab and the outer cover of the upper cover according to the present invention. Fig. 17 is a schematic view showing the upper cover fixed to the support plate and the outer cover according to the present invention. Fig. 18 is a schematic view of the upper cover combined in accordance with the present invention. Fig. 19 is a schematic view of the rubber crucible on the removal cover according to the present invention. Fig. 20 is a schematic view showing the upper cover fixed to the support plate and the outer cover according to the present invention. The first figure is a schematic illustration of the combination of the upper cover and the outer cover in accordance with the present invention. The twenty-second figure is a schematic view of the wafer disc placed on the support plate according to the present invention. The twenty-third figure is a schematic view of the wafer tray being separated from the support plate in accordance with the present invention. The twenty-fourth embodiment is an indication of the support plate according to the second embodiment of the present invention. The twenty-fifth diagram is a schematic view of the wafer disc placed in the cavity of the support plate according to the present invention. The twenty-sixth drawing is a schematic view of the outer cover fixed to the support plate and the wafer disk according to the present invention. The twenty-seventh drawing is a schematic view of the protective sheet according to the present invention attached to the outer cover. The twenty-eighthth embodiment is a view in which the transfer belt according to the present invention is attached to the outer cover. [s] 17 201126582 4 The twenty-ninth figure is not intended to be placed on the surface of the transfer belt according to the present invention. Figure 30 is a schematic view of lifting a transfer belt in accordance with the present invention. The thirty-first drawing is an illustration of the removal of the protective sheet on the outer cover in accordance with the present invention. The twenty-second figure is a schematic view of attaching the transfer belt to the outer cover according to the present invention. A thirty-third figure is a schematic view of a stripping strip in accordance with the present invention. The thirty-fourth embodiment is a schematic view of the upper cover placed and fixed on the support plate and the outer cover according to the present invention. The thirty-fifth diagram is a schematic view of the removal of the upper cover in accordance with the present invention. Figure 36 is a schematic view of a tear-off transfer belt in accordance with the present invention. The twenty-seventh embodiment is a schematic view of the tear-off transfer belt according to the present invention leaving the support plate and the outer cover. The twenty-eighth figure is not intended to be placed on the support plate and the outer cover ^ according to the present invention. A twenty-ninth embodiment is a schematic view of a cover plate attached to a support plate and a cover according to the present invention. The fortieth diagram is a schematic view of the outer cover being lifted up together with the upper cover in accordance with the present invention. A forty-first drawing is a schematic view of a support plate and a cover according to the present invention. Figure 42 is a schematic view showing the adhesion of the core protective film of the present invention to the upper surface of the micro-imaging wafer. The forty-third figure is based on the core protective film of the invention I. Attached to the miniature camera i Si 18 201126582

〇 I ί &gt; 晶片之上表面之不意圖。 【主要元件符號說明】 支撐板100、200 容置空間101、201 榫頭 102、108a、202 榫眼 103、104、108、117、203、209、217 晶片盤105、204 微型攝像晶片106、205 • 外罩 107、206 小凸起 109a、109b、208a、208b 格狀凹洞110、209a 對準標記111、207 保護片112、210 開口 113a 、 113b 保護膜圖案114、211 上蓋 115、215 * 有保護膜之微型攝像晶片106a、205a 緊固部件116 往下施力118 往上施力119 橡膠膜120 壓板130 凸起部131 緊固部件132、216 [S] 19 201126582 轉印帶212 壓條213〇 I ί &gt; Not intended for the top surface of the wafer. [Description of main component symbols] Supporting plates 100, 200 accommodating spaces 101, 201 boring heads 102, 108a, 202 榫 103, 104, 108, 117, 203, 209, 217 wafer platters 105, 204 micro imaging wafers 106, 205 Housing 107, 206 small projections 109a, 109b, 208a, 208b lattice recesses 110, 209a alignment marks 111, 207 protective sheets 112, 210 openings 113a, 113b protective film patterns 114, 211 upper covers 115, 215 * protective film Miniature imaging wafer 106a, 205a fastening member 116 downward biasing force 118 upward force 119 rubber film 120 pressure plate 130 convex portion 131 fastening member 132, 216 [S] 19 201126582 transfer belt 212 bead 213

Claims (1)

.201126582 » . 七、申請專利範圍: 1.:種形成保護膜於晶片上之方法包含: 提么、支撐板,用於承載U盤,以固定該晶片盤的 位置’該晶片盤上可配置複數個晶片,· 利用外罩以固定該支擇板並曝露出該複數個晶片; 貼附—保護片對位於該複數個晶片;以及 轉p °亥保6蒦片上之保護膜於該複數個晶片之上。 2.==:::==,其_ 3. 如請求項1之形成保護臈於晶片 包括複數個榫眼。 上之方法,其中該外罩.201126582 » . VII. Patent application scope: 1. The method for forming a protective film on a wafer comprises: providing a support plate for carrying a U disk to fix the position of the wafer disk ‘the platter is configurable a plurality of wafers, using a cover to fix the plurality of wafers and exposing the plurality of wafers; attaching a protective sheet to the plurality of wafers; and transferring a protective film on the plurality of wafers to the plurality of wafers Above. 2.==:::==, _ 3. If the formation of claim 1 is protected by the wafer, it includes a plurality of blinks. Method of the above, wherein the outer cover 4.如W求項1之形成保護膜於晶片上之方法 片包括一墊片貼附該保護膜。 ’其中該保護 5. 如請求項1之形成保護臈於晶片上 膜包含聚亞酿胺膜層。 之方法,其中該保護 6. 一法 ’其中該轉印4. The method of forming a protective film on a wafer according to claim 1, wherein the sheet comprises a spacer attached to the protective film. Wherein the protection 5. The formation of claim 1 protects the wafer from containing a layer of polyamidamine film. a method in which the protection is 6. a method wherein the transfer 如請求項6 之形成保護膜於晶片上之方法 ’其中該壓板 201126582 該上蓋包括至少一榫眼與一緊固部 8·如請求項7之 驟之後,更包括a 法’在該轉印步 與該支撐板。牛^盍與该外罩,以分離該晶片盤 護膜於晶片上之方法,更包括加壓 之上使得該保護膜更緊地貼附該 11.如凊求項1 〇之形成佯 驭俅邊膜於晶片上之方法,在該加壓A method of forming a protective film on a wafer according to claim 6, wherein the upper plate includes at least one mortise and a fastening portion 8 as in the case of claim 7, and further includes a method at the transfer step With the support plate. And the method for separating the wafer cover film on the wafer, and further comprising pressing the protective film to adhere the 11 more tightly. a method of filming on a wafer at which the pressurization 係固定於一上蓋 件。 10.如請求項9之形成保 該壓板於該壓合物件 晶片。 泫[板步驟之後,更包括移除該壓合物件。 12.如請求項U之形成保護膜於晶片上之方法更包括利 用該上蓋固定該外罩,之後分離該上蓋、該外罩與該晶 片盤及該支撐板。 13.—種形成保護膜於晶片上之方法,包含: 提供一支撐板,用於承葡一 s η般丨、,门— ^ Μ日日片盤,以固定該晶片盤的 位置,該晶片盤上配置複數個晶片; [S] 22 201126582 ::用-外罩以固定該支撐板,並 貼附-保護片對位於該複數個晶片上出。亥後數個晶片; 貼附一轉印帶於該外罩之上’ 所在區域; 么、5 °裹保禮片之保護膜 加堡於該轉印帶上,使該保 移除該外罩上之 w ^轉印帶之上,· 至該複數個日片之,卩_印帶上之該保護膜 晶片之表面:;以:面上,使該保護膜附著至該複數個 移除該轉印帶。 14.如請求項13 用一上笑… 曰片上之方法’更包括利 盘卞曰 U外罩,之後分離結合的該上蓋與該外罩 ,、°亥曰曰片盤及該支撐板分離。 15.:種複數個晶片保護膜於晶片上之方法,包含. =-支撐板,用於承載一晶片盤,以固定該晶片盤的 置,该晶片盤上配置複數個晶片; 利用一外罩以固定該支撐板; 貼附一保護片於該外罩之表面上;以及 1 °亥保濩片上之保護膜圖案,使得該保護膜圖案附著 於該複數個晶片之上表面。 16.如請求項15之保護膜於晶片上之形成方法更包括移 除。亥保5蔓片,以將該保護膜圖案轉印至該複數個晶片之 [S] 23 201126582 上表面 17. —種形成保護膜於晶片上之裝置,包含. 以固定該晶片盤的位 支撐板’用於承载一晶片盤, 置,該晶片盤上配置複數個晶片; 一外罩,用以固定該支撐板; 一保護片,用於貼附該外罩之表面上;以及 個晶片之上 壓板用以加壓使該保護片上之保護膜轉印於該複數 18如°月求項17之形成保護膜於晶片上之裝置,其中該支 撐板包括一容置空間係用以承載該晶片盤。 19.如請求項17之形成保護膜於晶片上之|置,其中該外 罩包括複數個榫頭。 月求㊉17之形成保護膜於晶片上之裝置,其中該上 括至^、一榫眼與一緊固部件。 21 ’如§青求^ ^ 、 之形成保護膜於晶片上之裝置,其中該保 °更包括一塾片貼附該保護膜。 2 2.如凊求項17夕五,丄 、 之形成保護膜於晶片上之裝置,其中該保 4膜包含聚亞酿胺膜層。 LSI 24 201126582 * « 23.如請求項】7之 板係固定於上蓋 形成保護膜於晶片上 之裝置 ,其中該壓 更包括一 24.如明求項17之形成保護膜於晶片上之裴置 壓合物件貼附於該外罩之表面上。、It is attached to an upper cover. 10. The formation of claim 9 ensures that the platen is on the embossed piece wafer.泫 [After the plate step, it is further included to remove the embossed part. 12. The method of forming a protective film on a wafer according to claim U, further comprising: securing the outer cover with the upper cover, and then separating the upper cover, the outer cover and the wafer tray and the support plate. 13. A method of forming a protective film on a wafer, comprising: providing a support plate for receiving a stencil, a gate-to-day disk to fix a position of the wafer, the wafer A plurality of wafers are disposed on the disk; [S] 22 201126582: A cover is used to secure the support plate, and a pair of attachment-protective sheets are placed on the plurality of wafers. a number of wafers after the hoist; attach a transfer belt on the outer cover of the 'area; ???, 5 ° wrapped protective film of the protective film on the transfer belt, so that the protection removes the cover w ^ Above the transfer belt, to the surface of the plurality of sheets, the surface of the protective film on the 卩 _ printing tape: on the surface, the protective film is attached to the plurality of the removal of the transfer band. 14. If the request item 13 is used as a smile... the method on the cymbal unit </ RTI> further includes a hood U cover, and then the separated upper cover is separated from the outer cover, the cymbal plate and the support plate. 15. A method of seeding a plurality of wafer protective films on a wafer, comprising: a support plate for carrying a wafer disk to fix the wafer disk, wherein the wafer disk is provided with a plurality of wafers; Fixing the support plate; attaching a protective sheet to the surface of the cover; and a protective film pattern on the 1 ° 濩 濩 , , , 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 16. The method of forming a protective film on a wafer according to claim 15 further comprising removing. a protective film pattern is transferred to the upper surface of the plurality of wafers [S] 23 201126582 upper surface 17. a device for forming a protective film on the wafer, comprising: a bit support for fixing the wafer disc The board 'for carrying a wafer tray, the wafer tray is provided with a plurality of wafers; an outer cover for fixing the support plate; a protective sheet for attaching the surface of the outer cover; and a pressure plate on the wafer And a device for pressurizing the protective film on the protective sheet to form a protective film on the wafer, wherein the support plate includes an accommodating space for carrying the wafer. 19. The method of claim 17, wherein the protective cover comprises a plurality of boring heads. A device for forming a protective film on a wafer, wherein the lens is attached to a fastening member. 21 ′, such as § 青, ^ ^, forming a protective film on the wafer device, wherein the protection further comprises a cymbal attached to the protective film. 2 2. A device for forming a protective film on a wafer, wherein the protective film comprises a layer of a poly-branched amine film. LSI 24 201126582 * « 23. The request plate 7 is fixed to the upper cover to form a protective film on the wafer, wherein the pressure further comprises a 24. forming a protective film on the wafer according to the item 17 The embossing member is attached to the surface of the outer cover. , ί S] 25S S] 25
TW99102153A 2010-01-26 2010-01-26 Apparatus for forming protective tape on compact camera chips and method of the same TWI430343B (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI584262B (en) * 2012-10-19 2017-05-21 Sharp Kk A display device and a driving method thereof
TWI596351B (en) * 2016-05-25 2017-08-21 豪威科技股份有限公司 Test socket for testing image sensor chip

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI584262B (en) * 2012-10-19 2017-05-21 Sharp Kk A display device and a driving method thereof
TWI596351B (en) * 2016-05-25 2017-08-21 豪威科技股份有限公司 Test socket for testing image sensor chip

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