201115356 六、發明說明： 【發明所屬之技術領域】 本發明係關於一種電子裝置的通用序列匯流排測試系統，特別 疋種旎夠在以磁碟作業系統(Disk Operating System，DOS)介面 下對通用序列匯流排連接埠進行測試的系統。 【先前技術】 現今的通用序列匯流排(Universai serial Bus，USB)相較傳統 電腦用標準匯流排，具有傳輸速度快以及更為普遍等優勢。原標 準t USB1.1❸最大傳輪頻寬為12Mbps(每秒百萬位元組)，咖 2.0的最大傳輸頻寬為48〇MbpS，而近期推出的USB 3 〇更從 Mbps提升到4.8Gbps(每秒十億位元組)以上。由於其傳輸速度 以及普遍性，USB細魏至今已成為各種電子裝置所具有的標 準傳輸介面，例如電腦可透過聰連接各種高速或低速周邊装 置’如USB耳機、聰健或是USB印表機。 然而即使是面對筆記型電腦或是電腦機殼等具有多個卿連 接槔的電子裝置，戦聰連接埠的方式健傳統且缺乏效率。 目前測試USB連接槔的方法一般為在卿連接埠上直接插上 USB硬碟或隨身料裝置，並由電子裝置傳輸槽案置 USB裝置， 以及開啟_並確認所傳輸之齡是否正確q上述插拔卿襄 置傳輸檔案以及確δ忍已傳輸之槽案正確性的步驟均須以人工進 行，不僅缺乏效率，亦可賴工作人員操作上的失誤(例如漏測某 個㈣連接埠’或是對於已傳輸之檔案比對錯誤)而造成錯誤的測 201115356 試結果。 • 再者，測試具有作㈣統的電子裝置時，每-次都要 業__。啟動_統會花_卜_ =作 的測試時_之延長，使制試蝴 ^成整體 接槔測試刪準備_ USB __ 二=二USB硬碟’則由於硬碟具有存取次數的壽命限二 使传傳統的測試裝置所需的成本更被提高。 #〜而若欲將傳統的測試方法自動化，又會因每- USB連接埠無 固定ID(identifleati，產生醜。聰連鱗會在電子裳置啟動 咖驅動程式後給予每—個連接物，細難仍與卿驅動 ，式啟動_序有關，並非給予每次都給予每—個㈣連接璋固 定的ID因此’即使自動測試程式顯示某個咖連接淳有問題， 但仍無法得知實體上是那個腦連接淳有問題。 基於上述’傳、_試USB連接埠的戦系統具有測試方法不 •便而造成測試時間冗長，以及所需設備成本高昂等問題。 【發明内容】 為了達成上述之目的，本發明提供一種通用序列匯流排 (Universal Serial Bus ’ USB)連接i阜的測試系统，適於測試具有至 ^ USB連接埠之電子裝置。測試系統包括測試程序以及測試設 備。測試程序係運行於電子裝置中，並具有至少-比對内容。測 式程序以磁碟作業系統(Disk 〇peratjng System，D〇s)指令經USB 連接埠發送難命令，且鍵齡令储合人齡面裝置(Hum叫 Γ *·. Ί 5 201115356201115356 VI. Description of the Invention: [Technical Field] The present invention relates to a universal serial busbar test system for an electronic device, particularly for use in a Disk Operating System (DOS) interface. The sequence bus is connected to the system for testing. [Prior Art] Today's Universal Serial Bus (USB) has the advantages of faster transmission speed and more general than conventional standard bus. The original standard t USB1.1❸ maximum transmission bandwidth is 12Mbps (megabytes per second), the maximum transmission bandwidth of the coffee 2.0 is 48〇MbpS, and the recently introduced USB 3〇 is increased from Mbps to 4.8Gbps ( One billion bits per second). Due to its speed and ubiquity, USB Fine Wei has become the standard transmission interface for various electronic devices. For example, computers can connect various high-speed or low-speed peripheral devices such as USB headphones, smart or USB printers. However, even in the face of electronic devices with multiple computers connected to notebook computers or computer cases, the way Cong Cong connects is traditional and inefficient. At present, the method of testing the USB port is generally to insert a USB hard disk or a portable device directly on the connection port, and the electronic device transmits the slot to set the USB device, and open _ and confirm whether the transmission age is correct. The steps of transferring the files and correcting the correctness of the transmitted cases must be carried out manually, which is not only inefficient, but also depends on the staff's operational errors (such as missing a (four) connection 埠' or For the transmitted file comparison error), the result of the test is 201115356. • In addition, when testing an electronic device with a system, the __ is used every time. Start _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ Second, the cost required to pass the traditional test device is further improved. #〜 and if you want to automate the traditional test method, there will be no fixed ID (identifleati) for each USB connection. The ugly scale will be given to each connector after the launch of the coffee driver. Difficulty still related to the Qing drive, the style start _ order, not given each time (four) connection 璋 fixed ID so 'even if the automatic test program shows a certain coffee connection 淳, but still can not know the physical is There is a problem with that brain connection. Based on the above-mentioned 'transmission, _ test USB port, the 戦 system has problems such as the test method is not enough, and the test time is cumbersome, and the required equipment cost is high. [Invention content] In order to achieve the above purpose The invention provides a universal serial bus (USB) connection test system, which is suitable for testing an electronic device having a USB connection port. The test system includes a test program and a test device. The test program runs on In the electronic device, and having at least-aligned content. The test program is connected via USB via a disk 系统peratjng System (D〇s) command. Send a difficult command, and the age of the key is to save the human age device (Hum called Γ *·. Ί 5 201115356
Iitek 絲。其中測試絲可㈣於電子裝置的 DOS模式之中。 ’則4備則包括控制器及微處理器。控制器係與聰連接埠 電性連接，控制器並透過_規範經由㈣連接埠接收鍵盤命 令。更佳的是，控制器係為USB控制器。 微處理器具有測試内容，其中測試内容可為鍵盤輸入信號。 依據鍵盤命令’微處理器使控制器透過啦規範選擇性地傳送或 不傳送測朗紅電子裝置。_試餅概被舰的測試内容 後，將接收到的測試内容與比對内容進行比對，並據以輸出比對 結果。 測試系統另可包含另—測試設備，㈣—測試設備之控制器 與另- USB連料電性連接。另—職設制微處㈣接收另一 鍵盤命令，並依據另—健命令使另—職設備的控制器透過 邮規範選擇性地傳送或不舰另—測朗容至電子裝置。測試 程序接收被傳送的另一測試内容後，將接收到的另一測試内容與 另一比對内容進行比對，並據以輸出比對結果。 上述鍵盤命令可包含定址命令，其中定址命令係用以指定須 接收鍵盤命令並傳制_容之職賴。更佳岐，定址命令 係為大小寫鎖定鍵雜以及數字鎖定鍵錄之組合。 ’’’’τ'上所述，根據本發明之實施例’測試設備模擬裝置透 ，USB連接埠接收電子f置以臟發_命令，細傳測試内 容予電子裝置使測試程序自動比對正確與否。且聰連接蜂的測 201115356 試系統係在DOS底下進行測試，而不須進入作業系統之中，而能 節省啟動作業系統的時間。是以上述的實施例可以減少USB連接 埠的測試裝置的成本，並大幅減低測試所需的時間。 【實施方式】 以下在實施方式中詳細敘述本發明之詳細特徵以及優點，其 内谷足以使任何熟習相關技蟄者了解本發明之技術内容並據以實 施，且根據本說明書所揭露之内容、申請專利範圍及圖式，任何 • 熟習相關技藝者可輕易地理解本發明相關之目的及優點。 根據本發明之-實施範例提供-種通用序列匯流排(Uni觸d Serial Bus ’ USB)連接埠的測試系統，適於測試具有至少一 usb 連接珲之-電子裝置。請參照「第i圖」，其係為根據本發明一實 施範例之USB連接埠的測試系統之方塊圖。由「第丨圖」可以見 悉，USB連接埠的測試系統包括一測試程序22以及至少一測試設 備30，其中測試程序22係運行於電子裝置2〇之中。電子裝置2〇 •具有一 USB匯流排24以及多個與USB匯流排24相連之USB連 接埠26a、26b以及26c，且USB連接埠26a、26b以及26c分別 與測試設備30a、30b以及30c相連。 電子裝置2〇可例如為伺㈣料算機祕，或是筆記型電 月®。而電子裝置20透過USB連接琿26可電性連接各種USB裝 置，如鍵盤、數位相機、印表機或是硬碟。電子裝置2〇具有一磁 碟作業系統(Disk Operating System ’ DOS)，可以是但不限定是 PC-DOS或疋MS-DOS專各種DOS系統。雖電子裝置2〇另可馬 201115356 有如徵軟之視窗(windows)等作業系5但拫據本發明之一實贼 例’ USB連接埠的測試系統之測試轉22係運行於電子 的DOS模式之下。 、 測試程序22以-DOS指令經由聰連接痒％發送一鍵盤 命令’而_命令制以❹以設| 3G吨—職内容。⑽ 指令係指運行於DOS環境之電子裝置2〇的一主控制器(未繪示） 對電子裝置20内其他元件或與電子裝置2〇相連之其他裝置所發 出的“令。舉例而言，電子寰置2〇的主控制器可以D〇s指令向 硬碟索取資料，亦可以D0S指令接收由鍵盤等輸入裝置所輸入的 資料。 然而一般而言’由於在DOS環境下並未啟動USB驅動程式， 故電子裝置20是無法與USB裝置進行溝通的。但於本實施範例， 測試程序22發出一符合人機介面裝置(Human interface Device， ΗΠ))規範之鍵盤命令，以使得透過USB連接埠26與電子裝置20 相連之測試設備3〇能互相傳送資料。 不論是鍵盤或是隨身碟等，使用能符合ΗΠ)規範進行傳輸通 信的裝置都可稱之為J2D裝置。在各種在HID描述子(HID descriptor)中自訂所需的參數名稱以及意義之後，ηπ)裝置便可依 據定義好的參數與計算機系統進行溝通。如此一來，電子裝置20 的主控制器雖不知所相連之測試設備3〇為何，但能彼此透過ΗΠ) 規乾傳送鍵盤命令等資料。 此外’測試程序22具有預設的至少一比對内容’用以進行 201115356 USB連接埠26之測試。而測試的方法請容後詳述。 請參照「第2圖」’其係為根據本發明一實施範例之測試設備 之方塊圖。測試設備30包括一控制器31以及一微處理器35 ;其 中控制器31可包括一 USB微控制器32、一序列傳輸介面(SerialIitek silk. The test wire can be (4) in the DOS mode of the electronic device. '4' includes a controller and a microprocessor. The controller is electrically connected to the Cong, and the controller receives the keyboard commands via the (4) port via the _ specification. More preferably, the controller is a USB controller. The microprocessor has test content, wherein the test content can be a keyboard input signal. According to the keyboard command, the microprocessor allows the controller to selectively transmit or not transmit the red electronic device through the specification. After the test piece is tested by the ship, the received test content is compared with the comparison content, and the comparison result is output accordingly. The test system can also include another test equipment, (4) - the controller of the test equipment is electrically connected to the other - USB. In addition, the job system (4) receives another keyboard command, and according to the other-health command, the controller of the other equipment is selectively transmitted through the mail specification or the other device is measured to the electronic device. After the test program receives another test content that is transmitted, the other test content received is compared with another comparison content, and the comparison result is output accordingly. The above keyboard command may include an address command, wherein the address command is used to specify that a keyboard command must be received and the message is passed. More preferably, the addressing command is a combination of a case lock key and a numeric lock key record. According to the embodiment of the present invention, the test device simulation device is transparent, the USB port receives the electronic f, and the test message is sent to the electronic device to make the test program automatically compare correctly. Whether or not. And the test of the Cong connected bee 201115356 test system is tested under DOS, without having to enter the operating system, but can save the time to start the operating system. The above embodiment can reduce the cost of the test device of the USB connection and greatly reduce the time required for the test. [Embodiment] Hereinafter, the detailed features and advantages of the present invention are described in detail in the embodiments, which are sufficient to enable any skilled artisan to understand the technical contents of the present invention and to implement the present invention, and according to the disclosure of the present specification, </ RTI> </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; In accordance with an embodiment of the present invention, a test system for a universal serial bus (USB) port is provided for testing an electronic device having at least one usb port. Please refer to the "figure i", which is a block diagram of a test system for a USB port according to an embodiment of the present invention. As can be seen from the "Figure", the test system of the USB port includes a test program 22 and at least one test device 30, wherein the test program 22 is run in the electronic device. The electronic device 2 has a USB bus bar 24 and a plurality of USB ports 26a, 26b and 26c connected to the USB bus bar 24, and the USB ports 26a, 26b and 26c are connected to the test devices 30a, 30b and 30c, respectively. The electronic device 2 can be, for example, a servo computer or a notebook computer. The electronic device 20 can be electrically connected to various USB devices such as a keyboard, a digital camera, a printer, or a hard disk via a USB port. The electronic device 2 has a Disk Operating System (DOS), which may be, but is not limited to, a PC-DOS or a MS-DOS dedicated DOS system. Although the electronic device 2〇马马201115356 has a working system such as a soft window (windows), but according to one of the inventions, the test system of the USB connection test system is running in the electronic DOS mode. under. The test program 22 sends a keyboard command via the singularity of the DOS command with the -DOS command, and the command system is set to |3G tons. (10) Command means a master controller (not shown) of an electronic device operating in a DOS environment ("not shown") for other components in the electronic device 20 or other devices connected to the electronic device 2". For example, The main controller of the electronic device can request data from the hard disk by the D〇s command, and can also receive the data input by the input device such as the keyboard by the D0S command. However, generally speaking, the USB driver is not activated in the DOS environment. Therefore, the electronic device 20 cannot communicate with the USB device. However, in this embodiment, the test program 22 issues a keyboard command conforming to the Human Interface Device (ΗΠ) specification to enable connection via the USB port. 26 The test equipment connected to the electronic device 20 can transmit data to each other. Whether it is a keyboard or a flash drive, etc., a device that can communicate and communicate according to the specification can be called a J2D device. After customizing the required parameter names and meanings in the (HID descriptor), the ηπ) device can communicate with the computer system based on the defined parameters. Thus, the electronics Although the main controller of the device 20 does not know the connected test equipment, it can transmit data such as keyboard commands to each other through the ΗΠ). In addition, the 'test program 22 has a preset at least one alignment content' for 201115356. The test of the USB port 26 is described. The method of the test is described in detail later. Please refer to FIG. 2, which is a block diagram of a test device according to an embodiment of the present invention. The test device 30 includes a controller 31 and a microprocessor 35. The controller 31 can include a USB microcontroller 32 and a serial transmission interface (Serial).
Interface Engine ’ S正)33 以及一 USB 收發器(USB transceiver^， 而微處理器35可包括一處理器36 ' —記憶體37以及一電子可擦 拭可編程唯讀記憶體（Electrically_Erasable • Read-〇nly Mem〇ry，EEPROM)38。此外，測試設備30具有預設 的一筆測試内容；較佳的是，每一個測試設備3〇的測試内容均不 同。 測試設備30之控制器31與USB連接埠26電性連接，且透 過hid規範接收測試程序22所發出的鍵盤命令。控制器μ的序 列傳輸介面33以及USB收發器34接收由電子裝置2〇所傳送的 資料’並將測勒容以符合ΗΠ)規範的方式傳送給電子裝置如 •之測試程序22。 、 )微處理器35之處理器36可以例如是一觀晶片用以控, 測试设備30之運作。微處理器％由控制器31承接測試程序： 所^出的鍵盤命令後’令控織31傳送測試内容給測試程序^ ^'體37可用以儲存測試内容，而EEPROM 38則儲存有測 備30所需的韌體。 曰，▲佳的是，測試設備30可以一 Cypress公司的EZ-USB系χ 曰曰月進仃實作。其巾EZ_USB FX2 “符合USBZ0規範，且其韻 201115356 處理器為一增強型8051核心。 根據本發明之一實施範例，測試設備30可模擬為鍵盤，而測 試内容則為測試設備30模擬鍵盤所產生的輸入資料。換句話說， 測試内容可以是鍵盤所產生的字串’例如「AS%/v〇5mna」D而上述 之比對内容則亦可為一與測試内容相同之字串，或是對鹿於測試 内容的資料。 如此一來，測試设備30藉由ΗΠ)規範模擬為鍵盤，與電子裝 置20進行溝通。運行於DOS環境的測試程序22透過規範經 由USB連接埠26傳送鍵盤命令給測試設備30。而測試設備3〇收 到鍵盤命令之後，選擇性地傳送或不傳送模擬鍵盤輸入資料予運 行於DOS下的測試程序22。 基於上述測試USB連接埠的系統之結構，接下來詳述測試的 方法。 請同時參照「第3圖」以及「第4A圖」，其分別為根據本發 明-實施範例之測試程序以及測試設備之執行流程示意圖。由圖 可以見悉，測試程序22執行步驟S50 :傳送鍵盤命令予測試設備 30 ;步驟S60 :接收測試設備30回傳之測試内容；步驟S7〇 :判 斷測試内容與比對内容是否相同；步驟S8〇 :測試結果為成功；以 及步驟S90 :測試結果為失敗。而測試設備3〇則執行步驟si〇〇 : 接收鍵盤命令；以及步驟S120 :傳送測試内容予電子裝置2〇。 測試程序22首先於步驟S50以DOS指令傳送符合ηπ)規範 之鍵盤命令予測試設備30，以開始進行測試。測試設備3〇則於步 201115356 驟S卿從USB連接埠26收到測試程序22所發出的鍵盤命令，· 再於步驟S120之中’測試設備3()模擬為鍵盤，令控制器^將測 試内容之字串(例如「.〇5_」）作為輸入資料以符合皿規 範的方式傳送給電子裝置20之測試程序22。 接著測試程序22於步驟S6G接❹m設備3()朗傳的測試 内容，並進行比對。假設預設之測朗容與比對内容為相同的字 串，於步驟S70,測試程序22判斷測試内容與比對内容是否相同。 S試内雜比對内容相同，則於步驟表示測試成功。也就 疋祝’方才用來傳送鍵盤命令以及測試内容的膽連接埠％運 作正常。朗試程序22可輸出「成功」作為一比對結果。反之， 若比對結果為測試内容與比對内容不相同，則於步驟_表示測 試失敗而此USB連接埠並無正常運作。測試程序則可輸出 「失敗」作為比對結果。 上述之測試USB連接埠的方法可測試單一的USB連接埠， 而根據本發明之另一實施例，USB連接埠的測試系統可包括另一 測試设備30或是多其他的測試設備3〇，以一次進行多個USB連 接埠的測試。 請再參閱「第1圖」’電子裝置20之USB連接埠26a、26b 以及26c分別與測試設備30a、30b以及30c相連。測試設備30a、 30b以及30c各自具有不同的一識別碼，以及測試内容。測試程序 22内可具有多組不同的比對内容，且與各個測試設備3〇a、30b以 及30c所具有的各個測試内容相對應。測試程序22可將不同的轉 11 201115356 並以不同的比 盤命令給予不同的US3連接埠25ε' 2奶以及2如 對内容判斷測試的結果。Interface Engine 'S positive) 33 and a USB transceiver (USB transceiver^, and microprocessor 35 can include a processor 36' - memory 37 and an electronically erasable programmable read-only memory (Electrically_Erasable • Read-〇 Nly Mem〇ry, EEPROM) 38. In addition, the test device 30 has a predetermined test content; preferably, the test content of each test device is different. The controller 31 of the test device 30 is connected to the USB port. 26 is electrically connected, and receives the keyboard command issued by the test program 22 through the hid specification. The sequence transmission interface 33 of the controller μ and the USB transceiver 34 receive the data transmitted by the electronic device 2' and match the measurement to match ΗΠ) The method of transmission is transmitted to an electronic device such as the test program 22. The processor 36 of the microprocessor 35 can be, for example, a wafer for controlling the operation of the test device 30. The microprocessor % is taken over by the controller 31 to test the program: after the keyboard command is issued, the control device 31 transmits the test content to the test program. ^ 'The body 37 can be used to store the test content, and the EEPROM 38 stores the test device 30. The required firmware.曰, ▲ It is good that the test equipment 30 can be implemented by Cypress's EZ-USB system. The towel EZ_USB FX2 "conforms to the USBZ0 specification, and its rhyme 201115356 processor is an enhanced 8051 core. According to an embodiment of the present invention, the test device 30 can be simulated as a keyboard, and the test content is generated by the test device 30 analog keyboard. In other words, the test content may be a string generated by the keyboard 'for example, "AS%/v〇5mna" D and the comparison content may be a string identical to the test content, or Information on the content of the deer test. As a result, the test device 30 communicates with the electronic device 20 by simulating the simulation as a keyboard. The test program 22 running in the DOS environment transmits keyboard commands to the test device 30 via the USB port 26 via the specification. After the test device 3 receives the keyboard command, the analog keyboard input data is selectively transmitted or not transmitted to the test program 22 running under DOS. Based on the above structure of the system for testing the USB port, the method of testing will be detailed next. Please also refer to "Fig. 3" and "Fig. 4A", which are schematic diagrams of the test procedure and the execution flow of the test equipment according to the embodiment of the present invention. As can be seen from the figure, the test program 22 performs step S50: transmitting a keyboard command to the test device 30; step S60: receiving the test content returned by the test device 30; step S7: determining whether the test content and the comparison content are the same; step S8 〇: The test result is successful; and Step S90: The test result is a failure. And the test device 3〇 performs step si〇〇: receiving a keyboard command; and step S120: transmitting the test content to the electronic device 2〇. The test program 22 first transmits a keyboard command conforming to the ηπ) specification to the test device 30 in DOS command at step S50 to start the test. The test device 3〇 receives the keyboard command issued by the test program 22 from the USB port 26 in step 201115356, and then in step S120, the test device 3() is simulated as a keyboard, so that the controller will test The content string (for example, ".〇5_") is transmitted as an input data to the test program 22 of the electronic device 20 in a manner consistent with the dish specification. Next, the test program 22 picks up the test contents transmitted by the m device 3() in step S6G, and performs comparison. Assuming that the preset measurement and the comparison content are the same string, in step S70, the test program 22 determines whether the test content and the comparison content are the same. If the content of the S test is the same, the test indicates that the test is successful. In other words, it is a good idea to use the biliary connection that is used to transmit keyboard commands and test content. The trial program 22 can output "success" as a comparison result. On the other hand, if the comparison result is that the test content is different from the comparison content, then in step _, the test fails and the USB port does not operate normally. The test program can output "failure" as a comparison result. The above method of testing the USB port can test a single USB port, and according to another embodiment of the present invention, the test system of the USB port can include another test device 30 or many other test devices. Test multiple USB ports at a time. Please refer to "FIG. 1" again. The USB ports 26a, 26b and 26c of the electronic device 20 are connected to the test devices 30a, 30b and 30c, respectively. The test devices 30a, 30b, and 30c each have a different identification code, as well as test content. The test program 22 can have multiple sets of different alignment contents and correspond to the respective test contents of the respective test devices 3a, 30b, and 30c. The test program 22 can assign a different turn to the different US3 connections 埠25ε' 2 milk and 2 as the result of the content judgment test with different turn orders 11 201115356.
當電子裝置20同時連接複數個測試設備3〇時，鍵盤命令可 令包含-定址命令。定址命令係為與電子裝置2〇相連之職 3〇其中之―_碼，接收_命令並__\ 之測試設備30。舉例而言，測試程序22可以藉由定址命 試設備地、則錢之—糊物。相_，測試設備 撕、通以及撕所傳回的測試内容也包含個別的識別碼，使得 測試程序22得以辨識_的測試内容屬於哪—個測試設備％。 當測試設備3G模擬為鍵盤時，測試程序22所發送的定址命 令可以為-大小寫敏_號以及—數字敎鍵信號之組合。鍵 盤作為輸人裝置’平料撕由鍵錄電子裝置20之單方向的資 料傳送。_盤所能收到來自電子裝置2〇的資料，一般僅限為用 以邊更蚊字母大小寫的A小寫較_號，以及肋變更數字 鍵^用與否的數字鎖定鍵錢。藉由組合大小寫鎖定鍵信號以 及子鎖定鍵信號，測試裎序22便能向多個測試設備3〇a、观 以及3〇c傳達指定的識別碼。假設測試設備如a、娜以及处的 識別碼被個別設定為i、2以及3。則例如並將大小寫鎖定鍵信號 作^二進位碼的「〇」’以數字鎖定鍵信號作為二進位碼的％， 用大】、寫鎖疋鍵信號與數字鎖定鍵信號之組合表示識別 碼。 藉由傳送大彳、寫較触號減字鎖糧信狀組合予模擬 12 201115356 為鍵瓜的暮⑭備3〇,並令測試設備3G回傳測朗容時—併回傳 識别碼的機制’測試程序22可輕鬆的得知比對結果為失敗之測試 設備30的識別碼，進而得知是哪一個USB連接埠26運作不正常。 如此一來’本實施範例之測試USB連接埠的系統解決每一㈣ 連接蜂26無111定10，而難以辨識狂常運作之USB連接埠26 的問題。 請同時參照「第3圖」以及「第4B圖」，其中「第犯圖」係 •為根據本發明另一實施範例之測試設備之執行流程示意圖。結構 上與前-實施範例不同的是，電子裝置2〇與多個測試設備施、 30b以及30c電性連接。假設測試設備3〇a、3〇b以及的識別 碼分別為「〇〇_!、「01」以及「10」。 由「第4B圖」可以見悉，每一測試設備3〇a、3〇b以及3〇c 個別執行步驟Si〇〇 :接收鍵盤命令；步驟S11(K判斷定址命令指 定之識別碼是否與自身之識別碼相同；步驟S120 :傳送測試内容 •予電子襞置；以及步驟S130 :結束。 測試％序22首先於步驟S50以DOS指令傳送符合HID規範 之鍵盤命令予所以的測試設備30a、30b以及30c，以開始進行測 試。其中鍵盤命令中包括定址命令，以指定此鍵盤命令對應之測 試設備30的識別碼。在此假設測試程序22欲測試USB連接埠 26b，故定址命令指定與USB連接埠2你電性相連之測試設備 30b(識別碼為「01」）。 所有的測試設備30a、30b以及30c則於步驟S100從USB考 13 201115356 凄箄26收到測試程序22所發ά的鍵盤会令5並於步驟s!ic中各 自比對定址命令所指定的識別碼「01」與自己的識別碼是否相同。 其中測試設備30b於步驟S110中判斷自己的辨識碼與定址命令所 指定的識別碼相同’便進行步驟S120將測試設備30b具有的測試 内容傳送給電子裝置20之測試程序22。 # 而測試設備30a以及3〇c於步驟S11〇中判斷自己的辨識碼與 定址命令所指定的_碼不同，便可*理會此鍵盤命令，而於步 驟S130巾不進彳了對此趣命令的反應。換句話說，根據測試設備 30之識別碼與定址命令所指定的識別碼之異同，測試設備如選擇 性地傳送或不傳送測試内容至電子裝置2〇。 於步驟S60，測試程序22接收到測試設備m的測試内容。 接著測試程序22於步驟S70比對接收之測試内容以及與測試設備 3〇b相對應之比對内容是否相同，並於步驟s8〇或步驟_ 比對結果。 此外’根據本發明之一實施範例，測試程序22被執行後，測 雖序22針對所有的測試模組3〇連續發出不同的鍵盤命令。而 母-個測試她3〇選雛地傳送或树制試内容至電子裝置 20測》式内谷接收所有的測試内容並依據不同的測試内容與對應 的比對内碰彳了_，再—次輸崎有触對結果。 根據本發明所提供之USB連接_測試系統 ，可在DOS環 境底下與彳議為鍵盤的測試設備進行資料的傳輸。由於是處於 DOS環境底下進行測試，故測試前不須等待wind_等作業系統 201115356 連的時間。且峨程序可自動對多個腦 =m：r細响增作之哪連 季工易地件知出錯之USB連接 備僅需使關㈣單—晶片 ' °再者，測试設 需的設備成本。 p了只作故此大幅降低測試系統所 —太2本發明以前述之較佳實施例揭露如上，然其並非用以限 疋本發月’任何熟f相像技藝者，在獨離本㈣之精神和範圍 …田可作二許之更動與潤飾，因此本發明之專利保護範圍須視 本5尤明書_之巾請專職騎界定者為準。 【圖式簡單說明】 第1圖係為根據本發明一實施範例之USB連接埠的測試系統 之方塊圖； 第2圖係為根據本發明一實施範例之測試設備之方塊圖； 第3圖係為根據本發明一實施範例之測試程序之執行流程示 意圖； 第4A圖係為根據本發明一實施範例之測試設備之執行流程 示意圖；以及 第4B圖係為根據本發明另一實施範例之測試設備之執行济 程示意圖。 電子裝置 測試程序 【主要元件符號說明】 20 22 15 201115356 24 USB匯流棑 26, 26a, 26b，26c USB連接埠 30, 30a, 30b, 30c 測試設備 31 控制器 32 USB微控制器 33 序列傳輸介面 34 USB收發器 35 微處理器 36 處理器 37 記憶體 38 電子可擦拭可編程唯讀記憶體When the electronic device 20 is connected to a plurality of test devices 3 at the same time, the keyboard command can cause the include-address command. The address command is a test device 30 that is connected to the electronic device 2, where the _ code, the _ command and the __\. For example, the test program 22 can be operated by addressing the device, the money-paste. Phase _, test equipment The test content returned by tearing, tearing and tearing also contains individual identification codes, so that the test program 22 can recognize _ the test content belongs to which -% of the test equipment. When the test device 3G is modeled as a keyboard, the address command sent by the test program 22 can be a combination of a - size sensitive _ number and a - digital 敎 key signal. The keyboard is used as the input device to transmit the material in one direction of the key recording electronic device 20. The _ disk can receive data from the electronic device 2 ,, generally only for the lowercase _ number with the upper and lower mosquito letters, and the number lock key for the rib change number key. By combining the uppercase and lowercase lock key signals and the sub-lock key signals, the test sequence 22 can communicate the specified identification codes to the plurality of test devices 3a, 3, and 3'. Assume that the test equipment such as a, Na, and the identification code are individually set to i, 2, and 3. For example, if the uppercase and lowercase lock key signal is used as the "bin" of the binary code, the digital lock key signal is used as the % of the binary code, and the combination of the write lock key signal and the digital lock key signal is used to indicate the identification code. . By transmitting the big 彳, writing the haptic lock and tying the food-like combination to the simulation 12 201115356 for the key 瓜 备 备 备 〇 〇 〇 〇 〇 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试 测试The test program 22 can easily know the identification code of the test device 30 that failed the comparison result, and then know which USB port 26 is not functioning properly. As a result, the system for testing the USB port of the present embodiment solves the problem that each (four) connection bee 26 has no 111 setting 10, and it is difficult to recognize the USB port 26 which is often operated. Please refer to "Fig. 3" and "Fig. 4B" at the same time. The "figure map" is a schematic diagram of the execution flow of the test equipment according to another embodiment of the present invention. The structure is different from the pre-implementation example in that the electronic device 2 is electrically connected to a plurality of test equipments, 30b and 30c. Assume that the test devices 3〇a, 3〇b and the identification codes are “〇〇_!, “01” and “10”, respectively. It can be seen from "Fig. 4B" that each test device 3〇a, 3〇b, and 3〇c individually performs step Si〇〇: receiving a keyboard command; step S11 (K determines whether the identification code specified by the address command is related to itself The identification code is the same; step S120: transmitting the test content to the electronic device; and step S130: ending. The test % sequence 22 first transmits the test device 30a, 30b according to the HID specification keyboard command to the DOS command in step S50. 30c, to start the test, wherein the keyboard command includes an address command to specify the identification code of the test device 30 corresponding to the keyboard command. It is assumed here that the test program 22 is to test the USB port 26b, so the address command is specified to be connected to the USB port. 2 You are connected to the test equipment 30b (identification code is “01”). All the test equipments 30a, 30b and 30c receive the keyboard from the test program 22 from the USB test 13 201115356 凄箄26 in step S100. Let the identification code "01" specified by the address command in the step s!ic be the same as the own identification code. The test device 30b determines its own identification code in step S110. The identification code specified by the address command is the same. Then, the test content of the test device 30b is transmitted to the test program 22 of the electronic device 20 in step S120. # The test devices 30a and 3〇c determine their own identification code in step S11. Different from the _code specified by the addressing command, the keyboard command can be ignored, and in step S130, the response to the interesting command is not entered. In other words, according to the identification code and the addressing command of the testing device 30. The test device, for example, selectively transmits or does not transmit the test content to the electronic device 2. In step S60, the test program 22 receives the test content of the test device m. The test program 22 then compares the reception at step S70. The test content and the comparison content corresponding to the test device 3〇b are the same, and the result is compared in step s8〇 or step_. Further, according to an embodiment of the present invention, after the test program 22 is executed, The sequence 22 successively issues different keyboard commands for all the test modules, and the mother-testing 3 selects the chicks to transmit or tree the test contents to the electronic device 20 The inner valley receives all the test content and touches the corresponding comparison content according to different test contents. The re-synchronization has the result of the touch. The USB connection_test system provided according to the present invention can be used in DOS. Under the environment, the data is transmitted with the test equipment for the keyboard. Since it is tested under the DOS environment, it is not necessary to wait for the operation time of the operation system 201115356 before the test, and the program can automatically multi-brain = m: r fine sounds to increase the number of quarters of the work and the knowledge of the wrong USB connection is only required to turn off (four) single-wafer ' ° again, test the equipment cost required. p has only made a drastic reduction in the test system - too 2 The present invention is disclosed above in the preferred embodiment of the foregoing, but it is not intended to limit the spirit of any of the familiar artists, in the spirit of independence (4) And the scope...Tianke can make two changes and refinements. Therefore, the scope of patent protection of the present invention shall be subject to the definition of the 5th ___ BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a block diagram of a test system for a USB port according to an embodiment of the present invention; FIG. 2 is a block diagram of a test device according to an embodiment of the present invention; FIG. 4A is a schematic diagram showing an execution flow of a test apparatus according to an embodiment of the present invention; and FIG. 4B is a test apparatus according to another embodiment of the present invention; The schematic diagram of the execution process. Electronic device test program [Key component symbol description] 20 22 15 201115356 24 USB bus 棑 26, 26a, 26b, 26c USB port 埠30, 30a, 30b, 30c Test device 31 Controller 32 USB microcontroller 33 Serial transmission interface 34 USB Transceiver 35 Microprocessor 36 Processor 37 Memory 38 Electronically Wipeable Programmable Read Only Memory