201100944 r i ιυυ二> ：>i247twf.doc/n 六、發明說明： 【發明所屬之技術領域】 且 有關於—種電子裝置及其過溫保護方法， 特別疋有’-種投影機及其過溫保護方法。 【先前技術】 投影機的功能及表現—般201100944 ri ιυυ二>:>i247twf.doc/n VI. Description of the invention: [Technical field to which the invention pertains] and related to an electronic device and an over-temperature protection method thereof, particularly the '-type projector and its Over temperature protection method. [Prior Art] The function and performance of the projector
由執行韌體程式來達成，^士冰々口上1日曰片藉 的動作，包括尋^呈式控制所有投影機 T , ™ 訊说源、榮幕顯示控制（⑽财咖 ，〇SD)的動作、運轉風扇·.·等等，作業極為複雜。 在這麼複_料_下_聽在某錄訂會有當機 的情形發生’當投影機發生#機時，程式帽於溫度控制 的功能就會無法發揮制，而造成投職㈣元件因過熱 而造成損壞。先前技術的投影機中，會使用熱效開關 (thermal switch)來做為最後的保護機制，當溫度高到使 熱效開關斷開而形成斷路時，投影機就會自動斷電而關 機。然而，熱效開關對於溫度的敏感度過低，故有可能會 發生溫度太高但熱效開關卻仍未斷開的情況，而這樣的應 用風險太南’且安全性也令人擔憂。 此外’在中華民國專利公告號；[273881的專利中，揭 露了一種溫度偵測系統以及方法。請參考圖1，圖1即為 中華民國專利公告號1273881中所揭露的溫度偵測系統1 的應用架構示意圖。溫度偵測系統1應用於電子裝置2中， 包括第一溫度偵測模組11、第二溫度偵測模組12以及觸 201100944 π iouj j iz4/twf.doc/n 發模組13。第—溫度偵測模組u用以債測工作環境溫产 是否達到預設H度臨界值並於麵第一溫度臨界ς 產生第一觸發訊號。第一溫度偵測模組u包括第一溫度感 應分壓電路112與第-電壓偵測電路114。第二溫度& 核組12用以動江作環境溫度是否翻預^之第二溫度 臨界值並於達到第二溫度臨界值產生第二觸發訊號。第二 /m度偵測模組12包括第二溫度感應分壓電路122與第二 壓偵測電路124。當第-溫度偵測模組n或第二溫度_ 模組^2 工作環境溫度達咖設之第—溫度臨界值 或預設之第二溫度臨界值時，隨即將第—觸發訊號或第二 觸發訊號傳送至觸發模組13。#觸發模組13接收到第— 觸發訊號或第二觸發訊號時，隨即產生並傳送令硬式磁碟 3停止動作之致能訊號至硬式磁碟3。在這樣的架構下，溫 度偵測系統！並不會_任何的㈣晶片是否#機， 於投影機的防當過熱保護之貢獻非常的有限。 另外，在中華民國專利公告號546536的專利中，据 露了-種投影機以及投影機運轉髓方法。請參考圖2, 為中華民國專利公告號5 4 6 $ 3 6所揭露的投影機之結 構不思圖。此投影機包㈣源供應器1() ^ 操作時所需之系統電源。投影燈泡12β用 = =另外，投影燈泡细由點燈啟動器14所啟動。$ 機中設置熱感應遮斷哭nR 、卜 ^ 與傻心源供絲1G、投影燈泡12B、以及 汾像處理糸統16寻位置，用以降低設置處之溫度 201100944 ί ί 1247twf.doc/n 自之轉速而輸出對應之轉速信號。區間充放電 根據散熱風扇19A〜19C的轉速信號之脈 之轉速，並輸出轉速判斷信號，而投 特定風速過低或異常之判斷信號時即執行 :疋之“機㈣程序。上述投影機保護程序包括 處理益18、控制電源供絲1()以_純電源，^制 12 # ❹ ^目别各個政熱風扇19Α〜19C的轉速，而無法得知目前投 影機的操作溫度。此外，這樣的投影機並餘何可用以判 it微處理器18是否當機的機制。因此，_若微處理哭18 t生，機時’必須等待投影機保護裝置2U貞測出風扇轉速 =氐=異¥日守’微處理器18才會被重置。故有可能發生微 处理态18已經當機’但投影燈泡12B、散熱風扇19八〜 仍繼續運轉的情況’而造成能源的浪費。 ^ 因此，如何避免投影機因控制晶片的當機而空轉，而 造成能源的浪費以及可能發生過熱的情況，實為一個極須 面對的課題。 【發明内容】 抑本發明提出一種投影機的過溫保護方法，其利用微控 制單元偵測投影機的控制晶片是否當機，且使投影機的操 作溫度不因控制晶片當機而溫度過高，並可避免投影機之 元件因過熱而損壞之功效。 本發明提出一種具有過溫保護功能的投影機，其微控 201100944 IJ'I'1603 3J24 /twf.doc/n 制單元獨立於投影機的_晶片而運作，用以監控投影機 的才呆作，凰度疋否過向’進而避免先前技術中投影機的過溫 保護機制因控制晶片當機而喪失的缺點。 本發明的其他目的和優點可以從本發明所揭露的技術 特徵中得到進一步的了解。 為達上述之一或部份或全部目的或是其他目的，本發 明之一實施例提供一種投影機的過溫保護方法。上述過溫 保，方法包括下述步驟：利用投影機的溫度感測器，感測 投影機的操作溫度；利用投影機的微控制單元（MCU)， 判斷溫度感測器所感測的操作溫度是否大於預設溫度；當 紅作μ度大於預没溫度時，令微控制單元傳送偵測訊號至 投影機的控制晶片，並判斷控制晶片是否在偵測訊號被傳 顿的預定時_回傳回應訊號；以及#微控制單元未能 在偵測訊號被傳送後的預定時間内接收到控 的回應訊_，令微控制單元執行降溫程序，以 機的操作溫度。其中控制晶片適於控制投影機的操作。 本發明之-實施例提供一種投影機。投影機包括溫度 感測器、控制晶片以及微控制單元。溫度感，適於感測 杈影機的操作溫度。控制晶片適於控制投影機的摔作。微 ^制單元祕溫度感測II和控制晶片。當溫度感測器所感 測到的操作溫度大於預設溫度時，微控制單 =至控制晶片，並判斷控制晶片是否在_訊號被傳送後 =定時間内回傳回應訊號。當微控制單元未能在偵測訊 就破傳送後的預定時間内接收到控制晶片所回傳的回應訊 i247twf.doc/a 201100944 機的操作溫 號時，微控制單元執行降溫程序，以降低投影 度。 / 在本發明之—實_卜上述之過溫料方法更包 括：=度感測器輸出控制訊號。其中當操作溫度大於預 的電位為第—電位，且當操作溫度小 於或纽預故)皿度時，控制訊號的電位為第 Ο 〇 制訊號的電位為上述第—電位時，微控制單元產生偵= 號並傳送偵測訊號至控制晶片。 1生偵以 贿本！Γί—實施例中’上述之控制晶片執行第一章刃 月"'私式控制投影機的操作’當微控料元執行第二勃 體程式，以在溫度感測器所感測到的操作溫 翠元傳送偵測訊號至控制晶片。二 式的耘式碼少於第—韌體程式的程式碼。 影機之—實施财，上狀岐程料於控制投 影機蘭t，上叙降溫程相於切斷投 機的施::之:，降溫程序控制投影 供應。 ，羑上述之降溫程序切斷投影機的電源 影機ΐίΓ之—實施财’上叙降溫料適於關閉投 動投ΐΐ發明之—實施例中，上述之降溫程序適於重新啟 7 201100944 ir^i Ji^4/twf.d〇c/n 本發明之上述實施例中，微控制單元偵測控制晶片是 否已經當機。倘若控制晶片已經當機，微控制單元執行降 溫程序，以降低投影機的操作溫度。如此，即可避免因控 制晶片當機，而造成投影機之零件因過熱造成的損壞。 為讓本發明之上述特徵和優點能更明顯易懂，下文特 舉多個實施例，並配合所附圖式，作詳細說明如下。 【實施方式】 下列各實施例的說明是參考附加的圖式，用以例示本 發明可用以貫施之特定實施例。本發明所提到的方向用 :吾，例如「上」、「下」、「前」、「後」、「左」、「右」 等，僅是麥考附加圖式的方向。因此，使用的方向用語是 用來說明，而非用來限制本發明。 請參考圖3，圖3為本發明一實施例投影機3〇〇的功 能方塊圖。投影機300包括控制晶片3〇2、溫度感測器3〇4 以及微控制單元（miCr〇c〇ntr〇lunit ; MCU) 。在本實 施例中，控制晶片302執行第一韌體程式34〇，以控制投 影機的操作。控制晶片302㈣投影機之操作可 包括尋找顯示訊號源、螢幕顯示控制（〇SD)、調整投影 ，300所投影的晝面之屬性..等。但須說明的，上述控^ 晶片302㈣投影機300之操作僅為示範性的說明，本發 明並不以此為限。相對於控制晶片搬，微控制單元^ 則執行第二勒體程式35〇，以提供投影機遍防當過熱保 痩。在本實施例中’第二勒體程式35Q的程式瑪少於第— 201100944 i247twf.doc/n ，體私式340的程式碼，故第二韌體程式35〇相較於第一 韌體耘式340是較簡單的程式，第二韌體程式35〇之功能 也不會如第一韌體程式340般地複雜。因此，微控制單元 306不會發生當機的狀況，且可在有電源供應的情況下保 持正常的運作。 曰在本貝施例中，溫度感測器304和微控制單元306之 間疋藉由通用輪出入腳位（general purp〇se I/〇 , ) Ο Ο 320連結，且微控制單元3〇6與控制晶片之間是透過 埠（inter-integrated circuit) 33〇 進行聯繫。溫度感測 益304感測投影機3〇〇的操作溫度τ是否大於一預設溫度 fth級度感測裔304輸出控制訊號sT，並將控制訊號心 藉由上述的通用輪出入腳位32G傳送至微控制單元遍。 f 1二當Ϊ作溫度τ大於上述預設溫度Tth時，控·m號 包位雜弟—電位；當操作溫度T小於或等於上述的 預设溫度Tth日夺，控制訊號St的電位為第二電位 施例中，上述的第一電位為高電位，而第 ： 基於上述機制，微控制單元撕即可藉 為^位 之電位的高低，而得知投影機3〇〇的操作^ 預設溫度ΤΛ。 疋古超過 =機丄300另包括電源供應器3〇8、投影模組训、 ί;ST ί源驅動器Μ、風扇316以及開關318。在本 貝施例中，電源供應H期是—種低電 市昆）轉換為投影機減電子元件所需之低電壓j。此 201100944 PT1603 31247twfdoc/n 外，在本發明-實施例中，電 變㈣或是—種具有電池的^^器308可以是—般的 用來投影影像，而光源312貝' j、、且。投影模组训則是 f鱗時所需的光線。光源:動以=且， 用以控制光源312的操作，例:.j4箱接於光源阳， 關閉、亮度等。風扇316則是.控制光源312的開啟/ 空氣對流、將空氣排出投影機幾·内部的 300。此夕卜，在本實施例中氣吹進投影機 致能控制晶片3〇2。㈣318是否開啟，以決定是否 驟ς4〇月9參/圖4 ’圖4為投影機300開機的流程圖。在步 ’微控辟元306持續地偵測開關3二= 啟。虽開關318被開啟後，微控制單元3〇6則致能控^ 片302,以使控制晶片3〇2開始運作（步驟剛）二當= 制晶片302被致能後，即開始控制投影機3〇〇的操作，ς 使投影機300開始運作（步驟S4%)。此外，當投影機 3〇〇開始運作後，倘若微控制單元3〇6偵測到開關318為 未開啟狀態，則微控制單元306令投影機3〇〇進入一般的 關機程序。 晴參考圖5，圖5為本發明一實施例執行投影機3〇〇 之過溫保護方法的流程圖。當投影機3〇〇開始運作之後， 溫度感測器304就開始感測投影機300的操作溫度τ (步 驟S502)，並感測操作溫度τ是否大於預設溫度Tth (步 驟S504 )。倘若溫度感測器304所感測到的操作溫度τ未 10 201100944 rnouj Ji247twf.doc/n 〇 ❾ 大於上述的預設溫度Tth時，控制訊號St的電位被設定為 低電位（步驟S506)，且溫度感測器3〇4持續地感測投影 機300的操作溫度τ。反之，倘若溫度感測器3〇4所感測 到的#作溫度τ大於上述的預設溫度Tth時’控制訊號& 的電位被設定為高電位（步驟S5〇8)。當微控制單 偵測到控制訊仏的電位被設定為高電位之後^^貞6 測訊，sD至控制晶片302 (步驟S51〇)，以偵測控制晶片 302是否已經當機。詳言之’在步驟SM2中，微控制單元 3〇6判斷控制晶片3〇2是否在控制訊號&被傳送出去後的 預疋日寸間内回傳一回應訊號Sr。在本實施例中，上述的 =時間可為-秒鐘’但本發明並不以此為限，上述的預 定時間可依需要設定得更短或更長。倘若在步驟如2中， 控希曰片302在上述預定時間内回傳—回應訊號心，則表 不控制晶片302並未當機，而可執行步驟S5Q2，以繼續感 測皿度T。反之’倘若在步驟S5U中，控制晶片％; 上述預定__傳—回應訊號&，則表示控制晶 片_ 302已經當機’而在這樣的情況下，微控制單元鄕執 :丁降溫^序（步驟S514)，以降低投影機的操作溫度 切㈣巾，上相降溫程序雜㈣㈣彳單元 靖投㈣的電源供應。又在本發明—纽 溫程序適於以微控制單元遍關閉投影機_的光 鮮『又t本發明—實_中，上述的降溫程序適於以 私^早το 306控制投影機3⑻的—風扇316。 月實知例中，上述的降溫程序適於以微控制單元鄕^ 201100944 PT1603 31247twf.doc/n 制投影機300的-風扇316 if轉一預設時間後，上述之降 溫程序切斷投賴·的電源供應。上述預設時間例如為 30秒:又在本糾—實施例巾，上述崎蹄序適於以微 控制單元306重新啟動投影機3〇〇。此外，在本發明一實 施例中，，當微控制單元306進行步驟S51〇，以將偵測訊二 S〇傳送至控制晶片302並等待回應訊號心時，微控制單 凡306控制風扇316以最大轉速運轉，以 之前，就麵作溫度τ絲下來。. ^ 12 、’-不上所述，本發明之上述實施例中，微控制單元偵測 f制晶片是否已經當機。倘若控制晶片已經當機，微控制 單元執行降溫程序，以降低投影機的操作溫度。如此二即 可避免因控制晶片當機，而造成投影機之零件因過熱造成 勺損取此外，微控制單元係獨立於投影機的控制晶^而 ^作，用以監控投影機的操作溫度是否過高，進而避免先It is achieved by executing the firmware program, and the action of the 1st film on the 1st, including the search for all projectors T, TM, and the display control ((10) The operation, the operation of the fan, etc., the operation is extremely complicated. In the case of such a _ _ _ _ listen to a record will occur in the case of a crash when the projector occurs # machine, the function of the cap in the temperature control will not play, resulting in the job (four) components due to overheating And caused damage. In prior art projectors, a thermal switch is used as the last protection mechanism. When the temperature is high enough to cause the thermal switch to open and the circuit is broken, the projector will automatically power off and shut down. However, the sensitivity of the thermal switch to temperature is too low, so it may happen that the temperature is too high but the thermal switch is still not disconnected, and such application is too risky and the safety is also worrying. Further, in the Patent of the Republic of China Patent Publication No. [273881, a temperature detecting system and method are disclosed. Please refer to FIG. 1. FIG. 1 is a schematic diagram of an application architecture of the temperature detecting system 1 disclosed in the Patent Publication No. 1273881. The temperature detecting system 1 is applied to the electronic device 2, and includes a first temperature detecting module 11, a second temperature detecting module 12, and a touch module 201110944 π iouj j iz4/twf.doc/n. The first temperature detecting module u is used to determine whether the temperature of the working environment reaches the preset H degree threshold and generates a first trigger signal at the first temperature threshold. The first temperature detecting module u includes a first temperature sensing voltage dividing circuit 112 and a first voltage detecting circuit 114. The second temperature & nucleus 12 is used to move the river as the second temperature threshold for the ambient temperature and to generate a second trigger signal when the second temperature threshold is reached. The second /m degree detecting module 12 includes a second temperature sensing voltage dividing circuit 122 and a second voltage detecting circuit 124. When the temperature of the first temperature detecting module n or the second temperature _ module ^2 reaches the first temperature threshold or the preset second temperature threshold, the first trigger signal or the second The trigger signal is transmitted to the trigger module 13. When the trigger module 13 receives the first trigger signal or the second trigger signal, it generates and transmits an enable signal for stopping the hard disk 3 to the hard disk 3. Under such an architecture, the temperature detection system! It does not _ any (four) wafers are #机, the contribution of the projector to the protection against overheating is very limited. Further, in the patent of the Republic of China Patent Publication No. 546536, a projector and a method of operating the marrow of the projector are disclosed. Please refer to Figure 2 for the structure of the projector disclosed in the Republic of China Patent Bulletin No. 5 4 6 $ 36. This projector package (4) source supply 1 () ^ system power required for operation. The projection bulb 12β is used = = additionally, the projection bulb is activated by the lighting starter 14. $ Set the thermal sensing to block the crying nR, Bu ^ and the silly heart source wire 1G, the projection bulb 12B, and the image processing system 16 to find the position to reduce the temperature of the setting 201100944 ί ί 1247twf.doc/n The corresponding speed signal is outputted from the speed. The section charge and discharge is executed according to the rotation speed of the pulse signal of the heat dissipation fans 19A to 19C, and the rotation speed determination signal is output, and when the determination signal of the specific wind speed is too low or abnormal is executed, the "machine (4) program is executed. The above projector protection program Including processing benefits 18, control power supply wire 1 () to _ pure power supply, ^ system 12 # ❹ ^ visual speed of each political fan 19 Α ~ 19C, and can not know the current operating temperature of the projector. In addition, such The projector can be used to determine whether the microprocessor 18 is down. Therefore, if the microprocessor is crying for 18 seconds, the machine must wait for the projector protection device 2U to detect the fan speed = 氐 = different ¥ The Guardian 'Microprocessor 18 will be reset. Therefore, it may happen that the microprocessor 18 has crashed but the projection bulb 12B and the cooling fan 19 are still running. This causes waste of energy. ^ Therefore, How to avoid the projector from idling due to the control of the wafer crash, resulting in waste of energy and possible overheating, is a subject that must be faced. [Summary] The present invention proposes a projector The temperature protection method uses the micro control unit to detect whether the control chip of the projector is down, and the operating temperature of the projector is not excessively high due to the control of the wafer, and the components of the projector are prevented from being damaged due to overheating. The invention provides a projector with over-temperature protection function, and the micro-control 201100944 IJ'I'1603 3J24 / twf.doc/n unit operates independently of the projector's _-chip to monitor the projector's talent. Staying, phoenix, or not, and avoiding the disadvantage that the overheat protection mechanism of the projector in the prior art is lost due to the control of the wafer crash. Other objects and advantages of the present invention can be obtained from the technical features disclosed in the present invention. Further, in order to achieve one or a part or all of the above or other purposes, an embodiment of the present invention provides a method for over-temperature protection of a projector. The over-temperature protection method includes the following steps: using a projector a temperature sensor that senses the operating temperature of the projector; uses a micro control unit (MCU) of the projector to determine whether the operating temperature sensed by the temperature sensor is greater than a preset Temperature; when the red is greater than the pre-no temperature, the micro control unit transmits the detection signal to the control chip of the projector, and determines whether the control chip is in the predetermined time when the detection signal is propagated_returning the response signal; The micro control unit fails to receive the control response within a predetermined time after the detection signal is transmitted, and causes the micro control unit to perform a cooling program to control the operating temperature of the machine. The control chip is adapted to control the operation of the projector. The invention provides a projector comprising a temperature sensor, a control chip and a micro control unit. The temperature sense is adapted to sense the operating temperature of the photographic machine. The control chip is adapted to control the fall of the projector. Micro-control unit temperature sensing II and control chip. When the operating temperature sensed by the temperature sensor is greater than the preset temperature, the micro-control unit = to control the wafer, and determine whether the control chip is after the signal is transmitted = The response signal is returned within a fixed time. When the micro control unit fails to receive the operation temperature of the response message returned by the control chip within a predetermined time after the detection is broken, the micro control unit performs a cooling process to reduce Projection. / In the present invention - the above method of overheating further includes: = degree sensor output control signal. Wherein, when the operating temperature is greater than the pre-potential as the first potential, and when the operating temperature is less than or the delay, the potential of the control signal is the first potential of the third signal, the micro-control unit generates Detect the number and send the detection signal to the control chip. 1 Detective to bribe this! Γί—In the embodiment, the above-mentioned control wafer performs the operation of the first chapter of the blade and the 'private control of the projector'. When the micro-control element executes the second body program to sense the operation in the temperature sensor. Wen Cuiyuan sends a detection signal to the control chip. The second type of code is less than the code of the first firmware. The camera------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------------- The above-mentioned cooling program cuts off the power supply of the projector. 实施 Γ — 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 实施 — — — — — — 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 2011 i Ji^4/twf.d〇c/n In the above embodiment of the invention, the micro control unit detects whether the control wafer has been down. If the control chip has been down, the micro control unit performs a cooling program to lower the operating temperature of the projector. In this way, damage to the components of the projector caused by overheating can be avoided by controlling the wafer to crash. The above described features and advantages of the invention will be apparent from the following description. [Embodiment] The following description of the embodiments is provided to illustrate the specific embodiments of the invention. The directions mentioned in the present invention are: For example, "upper", "lower", "front", "back", "left", "right", etc., are only the direction of the additional pattern of the McCaw. Therefore, the directional terminology used is for the purpose of illustration and not limitation. Please refer to FIG. 3. FIG. 3 is a functional block diagram of a projector 3〇〇 according to an embodiment of the present invention. The projector 300 includes a control chip 3〇2, a temperature sensor 3〇4, and a micro control unit (miCr〇c〇ntr〇lunit; MCU). In the present embodiment, control wafer 302 executes a first firmware program 34A to control the operation of the projector. Control chip 302 (4) The operation of the projector may include finding a display signal source, a screen display control (〇SD), adjusting the projection, 300 attributes of the projected facet, etc. It should be noted that the operation of the above-mentioned control chip 302 (four) projector 300 is merely exemplary, and the present invention is not limited thereto. In contrast to the control wafer transfer, the micro control unit executes a second program 35 〇 to provide protection against overheating of the projector. In the present embodiment, the program code of the second Lexus program 35Q is less than the code of the 201100944 i247twf.doc/n, and the second firmware program is 35〇 compared to the first firmware file. The formula 340 is a relatively simple program, and the function of the second firmware program 35 is not as complicated as the first firmware program 340. Therefore, the micro control unit 306 does not suffer from a downtime condition and can maintain normal operation with power supply. In the present embodiment, the temperature sensor 304 and the micro control unit 306 are connected by a universal wheel, and the micro control unit 3〇6 The control wafer is contacted by an inter-integrated circuit 33〇. The temperature sensing benefit 304 senses whether the operating temperature τ of the projector 3〇〇 is greater than a preset temperature fth level sensing sensor 304 output control signal sT, and transmits the control signal heart through the above-mentioned universal wheel access pin 32G To the micro control unit. f 1 2 When the temperature τ is greater than the above-mentioned preset temperature Tth, the control m-package bit-potential; when the operating temperature T is less than or equal to the above-mentioned preset temperature Tth, the potential of the control signal St is the first In the two-potential embodiment, the first potential is high, and the first: based on the above mechanism, the micro control unit can be used as the potential of the potential, and the operation of the projector 3 is known. Temperature ΤΛ.超过古过=机丄300 further includes power supply 3〇8, projection module training, ;; ST 源 source driver Μ, fan 316 and switch 318. In this example, the power supply H period is the low voltage j required to convert the projector into electronic components. In addition, in the present invention-embodiment, the electric transformer (4) or the battery 308 having a battery can be generally used for projecting an image, and the light source 312 is 'j, and. The projection module training is the light required for the f scale. The light source is controlled by = and is used to control the operation of the light source 312. For example, the .j4 box is connected to the light source, the light, the off, the brightness, and the like. The fan 316 is for controlling the opening/air convection of the light source 312 and discharging the air out of the projector. Further, in the present embodiment, the air is blown into the projector to enable control of the wafer 3〇2. (4) Whether 318 is turned on to determine whether or not to expel 4 months/9/FIG. 4 FIG. 4 is a flow chart of the projector 300 being powered on. At step 'micro control unit 306 continuously detects switch 3 = = start. After the switch 318 is turned on, the micro control unit 3〇6 enables the control chip 302 to start the operation of the control chip 3〇2 (step just). When the chip 302 is enabled, the projector is controlled. 3〇〇 operation, ς The projector 300 starts to operate (step S4%). In addition, after the projector 3 starts to operate, if the micro control unit 3〇6 detects that the switch 318 is not turned on, the micro control unit 306 causes the projector 3 to enter a normal shutdown procedure. Referring to FIG. 5, FIG. 5 is a flow chart of a method for performing over-temperature protection of the projector 3A according to an embodiment of the present invention. After the projector 3 starts to operate, the temperature sensor 304 starts sensing the operating temperature τ of the projector 300 (step S502), and senses whether the operating temperature τ is greater than the preset temperature Tth (step S504). If the operating temperature τ sensed by the temperature sensor 304 is not 10 201100944 rnouj Ji247twf.doc/n 〇❾ is greater than the preset temperature Tth, the potential of the control signal St is set to a low potential (step S506), and the temperature The sensor 3〇4 continuously senses the operating temperature τ of the projector 300. On the other hand, if the temperature τ sensed by the temperature sensor 3〇4 is larger than the above-described preset temperature Tth, the potential of the control signal & is set to a high potential (step S5〇8). After the micro control unit detects that the potential of the control signal is set to a high potential, the signal is sd to the control chip 302 (step S51) to detect whether the control chip 302 has been down. In detail, in step SM2, the micro control unit 3〇6 determines whether the control chip 3〇2 returns a response signal Sr within the preview time interval after the control signal & In the present embodiment, the above-mentioned = time may be -second', but the invention is not limited thereto, and the predetermined time may be set shorter or longer as needed. If, in step 2, the control chip 302 returns back to the signal heart within the predetermined time period, then the control chip 302 is not down, and step S5Q2 can be performed to continue sensing the degree T. Conversely, 'if in step S5U, the control chip %; the above-mentioned predetermined__transmission-response signal & means that the control chip_302 has been down' and in this case, the micro-control unit 鄕: (Step S514), to reduce the operating temperature of the projector, cut the (four) towel, the upper phase cooling program (four) (four) 彳 unit Jingtou (four) power supply. In addition, in the present invention, the New Temperature program is adapted to close the projector by the micro control unit, and the above-described cooling program is adapted to control the fan 3 of the projector 3 (8) by private το 306. 316. In the monthly example, the above-mentioned cooling program is adapted to be turned off by the micro-control unit 2011^201100944 PT1603 31247twf.doc/n projector 300-fan 316 if a predetermined time has elapsed. Power supply. The preset time is, for example, 30 seconds: in the present embodiment, the above-described shovel sequence is adapted to restart the projector 3 by the micro control unit 306. In addition, in an embodiment of the present invention, when the micro control unit 306 performs step S51, to transmit the detection signal to the control chip 302 and waits for a response to the signal center, the micro control unit 306 controls the fan 316 to The maximum speed is run, before the surface is used as the temperature τ wire. ^12, '- Not mentioned, in the above embodiment of the present invention, the micro control unit detects whether the f-chip has been down. If the control chip has been down, the micro control unit performs a cooling program to lower the operating temperature of the projector. In this way, it can avoid the damage caused by the overheating of the parts of the projector due to the control of the wafer, and the micro control unit is independent of the control crystal of the projector to monitor whether the operating temperature of the projector is Too high, and thus avoiding
前技術中投影機的過溫保護機制因控制晶片當機而 缺點。 J 雖然本發明已以實施例揭露如上，然其並非用以限定 本發明’任何所屬技術領域中具有通常知識者，在不脫離 本發明之精神和範圍内，當可作些許之更動與潤飾，因此 本發明之保護範圍當視後附之申請專利範圍所界定者為 準另外本發明的任一實施例或申請專利範圍不須達成^ 明所揭露之全部目的或優點或特點。此外，摘要部分和 標題僅是用來辅助專歡件搜尋之用，並非用來限制= 明之權利範圍。 12 201100944 【圖式簡單說明】 圖1為中華民國專利公告號1273881中所揭露的溫度 偵測系統的應用架構示意圖。 圖2為甲華民國專利公告號546536 t所揭露的投影 機之結構示意圖。 圖3為本發明一實施例投影機的功能方塊圖。 圖4為圖3投影機開機的流程圖。The over-temperature protection mechanism of the projector in the prior art has the disadvantage of controlling the wafer to crash. Although the present invention has been disclosed in the above embodiments, it is not intended to limit the invention to those skilled in the art, and may be modified and modified without departing from the spirit and scope of the invention. The scope of the present invention is therefore intended to be limited by the scope of the appended claims. In addition, the abstract sections and headings are only used to assist in the search for exclusive items, and are not intended to limit the scope of the rights. 12 201100944 [Simple description of the diagram] Figure 1 is a schematic diagram of the application architecture of the temperature detection system disclosed in the Republic of China Patent Publication No. 1273881. Figure 2 is a schematic view showing the structure of the projector disclosed in the Patent Publication No. 546536 t. 3 is a functional block diagram of a projector in accordance with an embodiment of the present invention. FIG. 4 is a flow chart of the projector of FIG. 3 being powered on.
實施例執行投影機 之過溫保護方法的 【主要元件符號說明】 1 :溫度偵測系統 2 :電子裝置 3:硬式磁碟 10 :電源供應器 11 ·第一溫度偵測模組 12 .第一溫度價測模組 12B :投影燈泡 13 :觸發模組[Embodiment of the main component symbol for performing the overheat protection method of the projector] 1 : Temperature detecting system 2: Electronic device 3: Hard disk 10: Power supply 11 • First temperature detecting module 12. First Temperature price measurement module 12B: projection bulb 13: trigger module
13B : 14 ： I :熱感應遮斷器 14 .點燈啟動器 16 \影像處理系统 18 ·微處理器 散熱風扇 13 201100944 PTI603 3I247twf.doc/n 20 :區間充放電迴路 21 :投影機保護裝置 112:第一溫度感應分壓電路 114 :第一電壓偵測電路 122:第二溫度感應分壓電路 124 :第二電壓偵測電路 300 :投影機 3 02 :控制晶片 304 :溫度感測器 306 :微控制單元 308 :電源供應器 310 :投影模組 312 :光源 314 :光源驅動器 316 :風扇 318 :開關 320 :通用輸出入腳位 330 ·· I2C 埠 340 :第一韌體程式 350 :第二韌體程式13B : 14 : I : Thermal Inductive Interrupter 14 . Lighting Starter 16 \ Image Processing System 18 · Microprocessor Cooling Fan 13 201100944 PTI603 3I247twf.doc/n 20 : Interval Charge and Discharge Circuit 21 : Projector Protection Device 112 The first temperature sensing voltage dividing circuit 114: the first voltage detecting circuit 122: the second temperature sensing voltage dividing circuit 124: the second voltage detecting circuit 300: the projector 3 02: the control chip 304: the temperature sensor 306: Micro control unit 308: power supply 310: projection module 312: light source 314: light source driver 316: fan 318: switch 320: universal output pin 330 · · I2C 埠 340: first firmware program 350: Two firmware program
St :控制訊號 SD ··偵測訊號 SR :回應訊號 S402〜S406 ··開機步驟 S502〜S514 :過溫保護方法之步驟 14St : Control signal SD ··Detection signal SR : Response signal S402~S406 ··Startup procedure S502~S514: Step of overtemperature protection method 14