201011317 九、發明說明： 【發明所屬之技術領域】 本發明是有關於一種測試裝置與方法，且特別是有關 於一種顯示器的測試裝置與方法。 【先前技術】 顯示器除提供家庭娛樂功能外，更可作為教育宣傳的 媒介’故目前顯示器已廣泛地融入社會大眾的日常生活 中。為檢驗顯示器之平面顯示面板的色彩表現能力，以作 為《X 4參考的依據，通常係採用一電路板，其連接於平面 顯不面板的驅動電路，此電路板内儲存測試晝面的資料， 而驅動電路將測试晝面顯示在顯示面板以便進行檢視作 業。 然而’平面顯示面板通常存在畫面閃燦的現象。此種 畫面閃爍的原因之一在於顯示面板的製程差異’導致不同 的平面顯示面板所需的高準位共同電壓與低準位共同電壓 間的電壓差不一致。 然而’傳統上用來調整前述電壓差需同時連接多個體 積龐大的設備’例如電腦與電源供應器，故佔據許多空間。 另一方面’電腦需下載與調整電壓差有關的特定軟體，且 需鍵入多個參數值進入電腦中，才能開始進行電壓差的調 整作業，因此耗費大量人力。 有鑑於此’有必要提供一種顯示器的測試裝置與測試 方法’其除可檢視平面顯示面板的畫質，亦可藉由方便且 201011317 有效的方式而將電壓寫入至驅動電路。201011317 IX. Description of the Invention: [Technical Field] The present invention relates to a test apparatus and method, and more particularly to a test apparatus and method for a display. [Prior Art] In addition to providing home entertainment functions, the display can be used as a medium for educational propaganda. Therefore, the display has been widely integrated into the daily life of the public. In order to verify the color performance of the flat display panel of the display, as a basis for the X 4 reference, a circuit board is usually used, which is connected to a driving circuit of a flat panel display panel, and the data of the test surface is stored in the circuit board. The drive circuit displays the test surface on the display panel for viewing. However, a flat display panel usually has a phenomenon in which a picture is flashed. One of the reasons for such a flickering of the screen is that the manufacturing process difference of the display panel causes the voltage difference between the high-level common voltage and the low-level common voltage required by different flat display panels to be inconsistent. However, 'traditionally used to adjust the aforementioned voltage difference requires simultaneous connection of a plurality of bulky devices, such as a computer and a power supply, so it takes up a lot of space. On the other hand, the computer needs to download a specific software related to the adjustment of the voltage difference, and it is necessary to input a plurality of parameter values into the computer to start the adjustment of the voltage difference, which requires a lot of manpower. In view of the need to provide a test device and test method for a display, in addition to viewing the image quality of the flat display panel, voltage can be written to the drive circuit by a convenient and efficient method in 201011317.
【發明内容】 本發明一方面提供一種顯示器的測試裝置，其可使顯 示器的平面顯示面板顯示多個樣本圖框影像以檢驗畫質。 選擇性地，此測試裝置可在平面顯示面板顯示測試圖框影 像的情況下，將此電壓值寫入至平面顯示面板驅動電路， 以改善晝質。 依照本發明一實施方式提出一種顯示器的測試裝置， 其包含切換單元、圖框產生單元、電壓調整單元和電壓寫 入單元。顯不器具有平面顯示面板與驅動電路，而驅動電 路可驅動平面顯示面板》切換單元將輸出—致能信號，圖SUMMARY OF THE INVENTION An aspect of the present invention provides a test apparatus for a display that can display a plurality of sample frame images on a flat display panel of a display to verify image quality. Optionally, the test device can write the voltage value to the flat display panel driving circuit to improve the enamel in the case where the flat display panel displays the test frame image. According to an embodiment of the present invention, a test apparatus for a display includes a switching unit, a frame generating unit, a voltage adjusting unit, and a voltage writing unit. The display device has a flat display panel and a driving circuit, and the driving circuit can drive the flat display panel. The switching unit outputs an output signal.
框產生單元可使平面顯示面板顯示多個樣本圖框影像或測 試圖框影像。當平面顯示面板顯示測試圖框影像時，電壓 調整單元根據致能信號而被致能’並變化供應至驅動電路 的電壓值而調整測試圖框影像至標準影像。此時，變化後 的電壓值便藉由電壓寫入單元而寫入至驅動電路。 本發明另一方面提供一種顯示器的測試方法，立可使 顯示器的平面顯示面板顯示多個樣本圖框影像以檢驗畫 質。並且，選擇性地，此測試裝置可在平面顯 測試圖《彡㈣,以下，㈣化電隸絲 電路，以改善畫質。 王相勒 法 其具有下述㈣：輸出致能信號 示器的測試方 面顯示面板顯 7 201011317 示多筆樣本圖框影像或測試圖框影像；當平面顯示面板顯 示測試圖框影像時，變化供應至驅動電路的電壓值而調整 測試圖框影像至標準影像；並將變化後的電壓值寫入至驅 動電路。 此測試方法之顯示器具有平面顯示面板與驅動電路， 且驅動電路係用來驅動平面顯示面板。 由上述說明可知，顯示器的測試裝置與測試方法不但 可於平面顯示面板上顯示多筆樣本圖框影像’並且在平面 顯示面板上顯示測試圖框影像時，將電壓值寫入至平面顯 示面板的驅動電路，以改善顯示器顯示的品質。 【實施方式】 需說明的是，在第一實施例與第二實施例中之驅動電 路為一晶片，其嵌入一次性可程式（〇ne_time programmable，OTP)非揮發性記憶體β 〇τρ非揮發性記憶 體可透過第一實施例與第二實施例所示的寫入作業而使驅 動電路更符合顯示面板的需求，而使顯示面板生命週期得 以延長。 請參照第1圖，其係繪示依照本發明第一實施例的顯 示器的測試裝置的功能方塊圖。測試裝置1〇〇包括電源供 應單元110、圖框產生單元120、電壓寫入單元13〇、電壓 調整單元143、樣本圖框選擇單元ι45和切換單元147。電 源供應早元110搞接於圖框產生單元120、電壓寫入單元 130、電壓調整單元143、切換單元147及驅動電路920， 8 201011317 以供應此些單元與電路作動時所需的電力。 測試裝置100可用來測試並改善顯示器的晝質，其具 有平面顯示面板910與驅動電路92〇，驅動電路92〇將驅動 平面顯示面板910以使平面顯示面板91〇顯示所欲的畫面。 在第-實施例中，使用者可藉由切換—開關（未緣示） 而使切換單元147選擇性地輸出致能信號S1。此時，圖框 產生單7L 120將使平面顯示面板91〇選擇性地顯示多筆樣 本圖框影像或測試圖框影像。 使用者藉由切換開關以設定測試裝置1〇〇執行顯示多 筆樣本圖框影像的功能或將例如高準位共同電壓寫入至驅 動電路的功能。 若使用者切換前述開關以將測試裝置1〇〇設定在執行 將高準位共同電壓寫入至驅動電路的功能，切換單元147 則輸出致能信號S1以致能電壓調整單元143，並使平面顯 示面板910顯示測試圖框影像。測試圖框影像例如為一閃 爍圖框影像。 此時，根據致能信號si而被致能的電壓調整單元143 變化供應至驅動電路920的高準位共同電壓值以調整閃爍 圖框影像至標準影像，並藉由電壓寫入單元130將變化後 的高準位共同電壓值寫入至驅動電路92〇。 如此一來’可在確認變化後的高準位共同電壓值能夠 改善測試圖框影像的閃爍情形下，將此高準位共同電壓值 寫入至驅動電路920 ’使因不適切共同電壓值造成平面顯示 面板910的晝面閃爍現象得以改善。 9 201011317 在此實施例中，測試裝置100之切換單元i47包括致 能模組1471與圖框⑽模组1473。若使用者欲改善平面顯 示器的閃燦現象而將測試裝置設定在執行電壓寫入的功能 時，致能模組1471將產生前述的致能信號S1，且圖框切換 模組1473產生圖㈣換信號以至圖框產生單元12〇以使 平面顯示面板910顯示測試圖框影像。 若使用者欲執行顯示多筆樣本圖框影像的功能時，圖 框切換模組丨473則產生圖框切換信號“至圖框產生單元 120以使平面顯示面板㈣顯示此些樣本圖框影像。在此實 施例中，圖框產生單元120係儲存此些樣本圖框影像。 並且，測試裝置100更包括樣本圖框選擇單元145，其 可使圖框產生單元12G選擇性地產生此些樣本圖框影像之 一。當樣本圖框選擇單元145開始選擇樣本圖框影像時， 圖框產生單το 120便依據來自樣本圖框選擇單元145的指 令而對應地產生樣本圖框影像。 樣本圖框選擇單元145可包括兩選擇按鍵’其位於測 試裝置上。使用者藉由壓下此些選擇按鍵，以控制圖框產 生單元120產生此些樣本圖框影像之一。 上述樣本圖框影像為選自紅色圖框、綠色圖框、藍色 圖框、黑色圖框、白色圖框、垂直十六灰階圖框、水平十 六灰階圖框或水平彩色條紋圖框所構成的組合。 使用者可對上述的紅色圖框、綠色圖框與藍色圖框進 行檢驗以分別判斷平面顯示面板91〇能否顯示預設的三原 色。並且’藉由檢驗黑色圖框與白色圖框可判斷當所有的 201011317 子像素同時設定為全暗與全亮時’平面顯示面板910對應 顯示之黑色與白色的色彩品質。 藉由觀察垂直十六灰階圖框和水平十六灰階圖框的層 次感可作為是否需調整平面顯示面板91〇的灰階變化情形 之依據。而觀察水平彩色條紋圖框可判斷全亮與全暗的三 原色的子像素在各種組合下的色彩變化，以作為設計時的 參考。 另外，測試裝置100的圖框產生單元12〇顯示一測試 圖框,ν像於平面顯不面板91〇上。此測試圖框影像例如為 門爍圖框圖框閃爍的原因在於高準位共同電歷與低 準位共同電壓間的電壓差不符合不同平面顯示面板910的 需求所致《由於不同平面顯示面板910間存在差異，故供 應至驅動電路92〇的高準位共同電壓與低準位共同電壓間 的電魔差也應隨著不同平面顯示面板910的需求作調整。 因此，在此實施例中，可藉由固定低準位共同電麼而 變化高準位共同電壓以使兩者的㈣差符合不同平面顯示 面板9Π)的需求。録其他實施例中，亦可藉由固定高準 位共同電Μ而變化低準位共同電壓，同射使兩者的電垄 差符合不同平面顯示面板91〇的需求。 第-實施例中是在低準位共同電壓值固定的情形下， 變化高準位共同電廢值。如此，便能依據相異顯示面板間 的不同特性而獲致適切的高準位共同電壓，麵 驅動電路920而降低畫面閃爍的程度。 此外’圖框產生單元120可採用元件可編程邏輯閉陣 11 201011317 列（Field Programmable Gate Array，FPGA) ’ 以儲存並輪出 測試晝面的資料。 ' 在第一實施例中，根據致能信號S1而致能測試裝置 • 100的電壓調整單元i 43，以變化供應至驅動電路92〇的高 準位共同電壓值，使測試圖框影像被調整至一標準影像。 在調整完測試圖框影像後，電壓寫入單元13〇可將變化後 的高準位共同電壓值寫入至驅動電路920。 φ 電壓調整單元143可控制電源供應單元11〇,以使自電 源供應單元110輸出至驅動電路920的高準位共同電壓值 產生變化。當電壓寫入單元13〇欲將變化後的高準位共同 電壓值寫入至驅動電路920,其亦可控制電源供應單元11〇 以輸出一組特定電壓至驅動電路920。此組特定電壓含有高 準位閘極電壓、低準位閘極電壓、高準位共同電壓與低準 位共同電壓。藉由將此組特定電壓依據特定時序自電源供 應軍元傳送至驅動電路92〇而進行寫入作業。 φ 舉例來說，若驅動電路920在正常作動時所需的高準 位間極電Μ為+15V，且低準位閘極電n15V，在寫入作 '、進行過程中，須設疋尚準位閘極電壓（例如是+7·5 V)，以 及、叹疋低準位閘極電壓（例如是〇v) ^此種電壓變化情形是 為滿足寫入尚準位共同電壓值至驅動電路時所需的條件。 然，前述的電壓值僅為例示性地說明電壓寫入單元13〇的 作動本發明不限於此，本發明所屬技術領域中具有通常 識者可隨不同的驅動電路與顯示面板的類型而改變此此 電壓值。 二 12 201011317 清參照第2圖，其係繪示第丨圖的測試裝置之電壓調 整單元的功能方塊圖。 電壓調整單元143具有影像擷取模組丨43 3、電壓調整 模組1431與比較模組1435。影像擷取模組1433可擷取測 試晝面，電壓調整模組1431則根據所掏取之測試圖框影像 調整高準位共同電壓值，並使測試圖框影像隨之變化，亦 即，變得較不閃燦。同時，比較模組1437將比較調整後的 測試圖框影像與標準影像。 此外，電壓調整模組1431包括兩調整開關1431a、 1431b，其可分別升高或降低高準位共同電壓值，而此些調 整開關1431a、1431b可例如藉由兩按鍵而具體實現。兩按 鍵皆位於測試裝置的表面上，使用者藉由按下此些按鍵而 升高或降低供應至驅動電路的高準位共同電壓值。 舉例來說，影像擷取模組1433可為一輝度測試器，此 輝度測試器將取得測試圖框影像的亮度值，然後比較模組 ❹以圖框影像的亮度值與標㈣像的亮度值兩者進行比 較。若兩者的差異值在例如2%以下，則判斷此時供應至驅 動電路920的高準位共同電塵值所造成的測試圖框影像近 似於標準影像。 因此，藉由影像擷取模組1433與比較模組1435，可自 動地福測測試圖框影像與標準影像的顯示參數，以在確切 此時供應至驅動電路920的高準位共同電壓值所造成測試 圖框影像與標準影像為近似的情況下，將此電麼值寫入至 驅動電路920中。 13 201011317 電壓調整單元143亦具有寫入觸發模組1437，當測試 模組1435判斷測試圖框影像近似標準影像時，寫入觸發模 組1437可觸發電壓寫入單元13〇以將變化後的高準位共同 電壓值寫入至驅動電路920。寫入觸發模組1437可自動地 產生觸發信號以觸發電壓寫入單元130。The frame generating unit may cause the flat display panel to display a plurality of sample frame images or test frame images. When the flat display panel displays the test frame image, the voltage adjustment unit is enabled according to the enable signal and changes the test frame image to the standard image by varying the voltage value supplied to the drive circuit. At this time, the changed voltage value is written to the drive circuit by the voltage writing unit. Another aspect of the present invention provides a test method for a display that allows a flat display panel of a display to display a plurality of sample frame images to verify image quality. And, optionally, the test device can be used to improve the picture quality in the plane test chart "彡(四), hereinafter, (4). Wang Xiang Le Faqi has the following (4): Test panel of the output enable signal display panel display 7 201011317 shows multiple sample frame image or test frame image; when the flat display panel displays the test frame image, the change supply Adjust the test frame image to the standard image to the voltage value of the driving circuit; and write the changed voltage value to the driving circuit. The display of the test method has a flat display panel and a driving circuit, and the driving circuit is used to drive the flat display panel. It can be seen from the above description that the test device and the test method of the display can not only display multiple sample frame images on the flat display panel and write the voltage values to the flat display panel when displaying the test frame images on the flat display panel. Drive the circuit to improve the quality of the display. [Embodiment] It should be noted that the driving circuit in the first embodiment and the second embodiment is a chip embedded in a one-time programmable (OTP) non-volatile memory β 〇τρ non-volatile The memory can extend the life of the display panel by making the driving circuit more conform to the requirements of the display panel through the writing operations shown in the first embodiment and the second embodiment. Referring to Fig. 1, there is shown a functional block diagram of a test apparatus for a display according to a first embodiment of the present invention. The test apparatus 1A includes a power supply unit 110, a frame generating unit 120, a voltage writing unit 13, a voltage adjusting unit 143, a sample frame selecting unit ι45, and a switching unit 147. The power supply unit 110 is coupled to the frame generating unit 120, the voltage writing unit 130, the voltage adjusting unit 143, the switching unit 147, and the driving circuits 920, 8 201011317 to supply the power required for the operation of the units and the circuit. The test apparatus 100 can be used to test and improve the enamel of the display, having a flat display panel 910 and a drive circuit 92, which will drive the flat display panel 910 to cause the flat display panel 91 to display the desired picture. In the first embodiment, the user can cause the switching unit 147 to selectively output the enable signal S1 by switching - the switch (not shown). At this time, the frame generation of the single 7L 120 will cause the flat display panel 91 to selectively display a plurality of sample frame images or test frame images. The user switches the switch to set the test device 1 to perform a function of displaying a plurality of sample frame images or a function of writing, for example, a high-level common voltage to the drive circuit. If the user switches the switch to set the test device 1〇〇 to perform the function of writing the high-level common voltage to the driving circuit, the switching unit 147 outputs the enable signal S1 to enable the voltage adjusting unit 143, and enables the flat display. Panel 910 displays a test frame image. The test frame image is, for example, a flashing frame image. At this time, the voltage adjustment unit 143 enabled according to the enable signal si changes the high-level common voltage value supplied to the driving circuit 920 to adjust the blink frame image to the standard image, and is changed by the voltage writing unit 130. The subsequent high level common voltage value is written to the drive circuit 92A. In this way, the high-level common voltage value can be improved to the flashing of the test frame image after the change is confirmed, and the high-level common voltage value is written to the driving circuit 920' to cause the common voltage value to be unsuitable. The flickering phenomenon of the face of the flat display panel 910 is improved. 9 201011317 In this embodiment, the switching unit i47 of the testing device 100 includes an enabling module 1471 and a frame (10) module 1473. If the user wants to improve the flashing phenomenon of the flat panel display and set the test device to perform the voltage writing function, the enabling module 1471 will generate the aforementioned enabling signal S1, and the frame switching module 1473 generates the map (4) The signal is then passed to the frame generating unit 12 to cause the flat display panel 910 to display the test frame image. If the user wants to perform the function of displaying a plurality of sample frame images, the frame switching module 473 generates a frame switching signal "to the frame generating unit 120 to cause the flat display panel (4) to display the sample frame images. In this embodiment, the frame generating unit 120 stores the sample frame images. Moreover, the testing device 100 further includes a sample frame selecting unit 145, which can cause the frame generating unit 12G to selectively generate the sample images. One of the frame images. When the sample frame selection unit 145 starts to select the sample frame image, the frame generation unit τ 120 generates a sample frame image correspondingly according to the instruction from the sample frame selection unit 145. Sample frame selection The unit 145 may include two selection buttons 'located on the test device. The user controls the frame generation unit 120 to generate one of the sample frame images by pressing the selection buttons. The sample frame image is selected from the group consisting of Red frame, green frame, blue frame, black frame, white frame, vertical sixteen grayscale frame, horizontal sixteen grayscale frame or horizontal color striped frame The user can check the red frame, the green frame and the blue frame to determine whether the flat display panel 91 can display the preset three primary colors, and 'by checking the black frame and the white color. The frame can judge the black and white color quality corresponding to the flat display panel 910 when all the 201011317 sub-pixels are set to be full dark and full bright. By observing the vertical sixteen gray scale frame and the horizontal sixteen gray scale The layering of the frame can be used as a basis for adjusting the gray scale change of the flat display panel 91. The horizontal color stripe frame can be used to determine the color change of the sub-pixels of the three primary colors of full bright and full dark under various combinations. In addition, the frame generating unit 12 of the testing device 100 displays a test frame, and ν is displayed on the flat display panel 91. The test frame image is, for example, a blinking block diagram frame. The reason is that the voltage difference between the high-level common electric calendar and the low-level common voltage does not meet the requirements of different flat display panels 910 "due to different flat display panels 9 There is a difference between the 10, so the electrical friction difference between the high-level common voltage and the low-level common voltage supplied to the driving circuit 92A should also be adjusted according to the requirements of different flat display panels 910. Therefore, in this embodiment The high-level common voltage can be changed by fixing the low-level common electric power so that the (four) difference between the two meets the requirements of different flat display panels. In other embodiments, the fixed high-level can also be used together. The electric cymbal changes the common voltage of the low level, and the same radiance makes the electric ridge difference of the two meet the requirements of different flat display panels 91. In the first embodiment, the common voltage is fixed at a low level and the common voltage value is fixed. The common electrical waste value. In this way, an appropriate high-level common voltage can be obtained according to different characteristics between the different display panels, and the surface driving circuit 920 can reduce the degree of flickering of the screen. In addition, the frame generation unit 120 may employ a Field Programmable Gate Array (FPGA) to store and rotate the data of the test surface. In the first embodiment, the voltage adjustment unit i 43 of the test device 100 is enabled according to the enable signal S1 to vary the high-level common voltage value supplied to the drive circuit 92A, so that the test frame image is adjusted. To a standard image. After the test frame image is adjusted, the voltage writing unit 13A can write the changed high level common voltage value to the driving circuit 920. The φ voltage adjusting unit 143 can control the power supply unit 11A to cause a change in the high-level common voltage value output from the power supply unit 110 to the driving circuit 920. When the voltage writing unit 13 wants to write the changed high level common voltage value to the driving circuit 920, it can also control the power supply unit 11 to output a specific set of voltages to the driving circuit 920. This group of specific voltages contains a high level gate voltage, a low level gate voltage, a high level common voltage and a low level common voltage. The write operation is performed by transmitting the set of specific voltages from the power supply unit to the drive circuit 92A according to a specific timing. For example, if the drive circuit 920 requires a high level of +15V between the high level and a low level of the low level of the n15V during the normal operation, it must be set during the writing process. The potential gate voltage (for example, +7·5 V), and the sigh low-level gate voltage (for example, 〇v) ^ This voltage change situation is to satisfy the write common level common voltage value to the drive The conditions required for the circuit. However, the foregoing voltage values are merely illustrative of the operation of the voltage writing unit 13A. The present invention is not limited thereto, and the general knowledge in the art to which the present invention pertains may vary depending on the type of the driving circuit and the display panel. Voltage value. 2 12 201011317 Referring to FIG. 2, it is a functional block diagram of a voltage adjustment unit of the test apparatus of the second diagram. The voltage adjustment unit 143 has an image capture module 丨43 3, a voltage adjustment module 1431, and a comparison module 1435. The image capturing module 1433 can capture the test surface, and the voltage adjusting module 1431 adjusts the high-level common voltage value according to the captured test frame image, and changes the test frame image, that is, changes It’s less flashy. At the same time, the comparison module 1437 compares the adjusted test frame image with the standard image. In addition, the voltage adjustment module 1431 includes two adjustment switches 1431a, 1431b, which can respectively raise or lower the high level common voltage value, and the adjustment switches 1431a, 1431b can be specifically implemented by, for example, two buttons. Both buttons are located on the surface of the test device, and the user raises or lowers the high-level common voltage value supplied to the drive circuit by pressing the buttons. For example, the image capturing module 1433 can be a luminance tester, and the luminance tester obtains the brightness value of the test frame image, and then compares the brightness value of the image of the frame image with the brightness value of the image of the standard (four) image. Compare the two. If the difference value between the two is, for example, 2% or less, it is judged that the test frame image caused by the high-level common electric dust value supplied to the driving circuit 920 at this time is similar to the standard image. Therefore, by using the image capturing module 1433 and the comparing module 1435, the display parameters of the test frame image and the standard image can be automatically measured to accurately supply the high-level common voltage value to the driving circuit 920 at this time. In the case where the test frame image is approximated to the standard image, the value of the electrical value is written into the drive circuit 920. 13 201011317 The voltage adjustment unit 143 also has a write trigger module 1437. When the test module 1435 determines that the test frame image is approximate to the standard image, the write trigger module 1437 can trigger the voltage write unit 13〇 to change the height. The level common voltage value is written to the drive circuit 920. The write trigger module 1437 can automatically generate a trigger signal to trigger the voltage write unit 130.
寫入觸發模組1437包括觸發開關1437a，觸發開關可 採用例如一按鍵。當測試圖框影像近似標準影像時，使用 者可按下此按鍵以觸發寫入作業，並將此時的電壓值寫入 至驅動電路。也就是，在按下觸發開關1437a後，寫入觸 發模組1437便經由傳輸介面1441傳輸此觸發信號至電壓 寫入單元130。 第一實施例提供之顯示器的測試裝置丨〇〇不但能檢驗 顯示器的平面顯示面板91〇所顯示多筆樣本圖框影像，並 可將高準位共同電壓值寫入至驅動電路92〇而降低畫面閃 爍的程度。 另一方面，於本發明之另一實施例中提供一種顯示器 的測試方法’其可對顯示器的平面顯示面& 9iq所顯示多 筆樣本圖框影像進行檢驗，並㈣高準位制電壓值寫入 至驅動電路920而降低畫面閃爍的程度。 在顯示㈣測試方法中，首先輸出-致能信號S1(步驟 31Q)’且平面顯示面板顯示多筆樣本圖框影像或測試圖框 =像（步驟32G)H當平面顯示面板顯示測試圖框影像 二’根據致能信號而開始變化供應至驅動電路的高準位共 Μ壓值而調整測__像至標準影像（㈣330)。在測 201011317 試圖框影像已調整至標準影像後，便將變化後的高準位共 同電壓值寫入至驅動電路（步驟340)。 °月參考第4圖’其係繪示第3圖中輸出致能信號之步 * 驟的流程圖。亦即，第3圖的步驟31〇可進一步包括：產 致at· 號（步驟41 〇);以及產生一圖框切換信號（步驟 420) ’以使平面顯示面板顯示樣本圖框影像，以檢測此些 樣本圖框影像的影像品質（步驟43〇)。或者，圖框切換信號 可使平面顯示面板顯示測試圖框影像以便調整此測試圖框 影像的畫質（步驟44〇)。 此外’第二實施例的測試方法亦可選擇性地產生樣本 圖框影像之一。也就是，測試方法可藉由例如兩按鍵而選 擇特疋的樣本圖框影像進行檢測，以作為調整例如平面顯 示面板的多原色參數之依據。 上述樣本圖框影像可為選自紅色圖框、綠色圖框、藍 色圖框、黑色圖框、白色圖框、垂直十六灰階圖框、水平 十六灰階圖框或水平彩色條紋圖框所構成的組合。然，本 $月不限於前述八種圖框，本發明所屬技術領域中具有通 节知識者亦可針對1G種或多達2()種圖框影像進行檢視。 使用者可對上述的紅色圖框、綠色圖框與藍色圓框進 行檢驗以分別判斷平面顯示面板91〇能否顯示預設的三原 色。並且，藉由檢驗黑色圖框與白色圖框可判斷當所有的 子像素同時設定為全暗與全亮時，平面顯示面板910對應 顯示之黑色與白色的色彩品質。 藉由觀察垂直十六灰階圖框和水平十六灰階圖框的層 15 201011317 次感可作為是否需調整平面顯示面板910的灰階變化情形 之依據。而觀察水平彩色條紋圖框可判斷全亮與全暗的三 原色的子像素在各種組合下的色彩變化，以作為設計時的 參考。 請參照第5圖，其係繪示第3圖中變化供應至驅動電 路的高準位共同電壓值而調整測試圖框影像至標準影像之 步驟的細部流程圖。亦即，第二實施例的調控方法之步驟 330尚包含藉由例如影像擷取設備而擷取測試圖框影像（步 驟510) ’以便處理測試圖框影像的信號。之後則根據所擷 取之測試圖框影像調整高準位共同電壓值（步驟52〇)，因為 高準位共同電壓值將影響測試圖框影像的閃爍程度，故調 整電壓值可有效降低閃爍程度。在此實施例中，使用者可 藉由手動切換兩調整開關1431a、1431b而分別升高或降低 高準位共同電壓值，且調整開關1431a和調整開關M3ib 分別藉由例如按鍵而具體實現。 在此實施例中，影像擷取設備可為一輝度測試器，此 輝度測試器將取得測試晝面的亮度值，然後對測試晝面的 亮度值與標準晝面的亮度值兩者進行分析處理。若兩者的 差異值在例如2%以下，則判斷此時供應至驅動電路的高準 位共同電壓值所造成的測試圖框影像近似於標準影像。 並且，當調整電壓值時，可藉由影像處理技術針對變 化後的測試圖框影像與標準影像（步驟53〇)進行比較。 當確認調整後的測試圖框影像更接近標準影像X時，可 藉由按下觸發開關而發出寫入觸發信號以將變化後的高準 16 201011317 位共同電壓值寫入至驅動電路（步驟540)。此外，在其他實 施例中’測試方法亦可藉由自動地發出寫入觸發信號而將 電壓值寫入至驅動電路。 由上述本發明第二實施例可知，應用第二實施例所提 供的測試方法不但可藉由檢測樣本圖框影像而評估平面顯 :面板的色彩顯示能力，更可將高準位共同電壓值寫入至 平面顯示面板的驅動電路，以改善平面顯示面板的畫質。 雖然本發明已以第一與第二實施例揭露如上，然其並 非用以限定本發明，何熟習此技藝者，在不脫離本發明 之精神和範圍内，當可作各種之更動與潤飾，因此本發明 之保護範圍當視後附之中請專利範圍所界定者為準。 【圖式簡單說明】 能更之上述和其他目的、特徵、優點與實施例 此更月顯易懂’所附圖式之詳細說明如下： I置的λ η暫不依照本發明第—實施例的顯示11的測試 裝置的功能方塊圖。 第2圖係繪示第1圖 能方塊圖。 裝置之電壓調整單元的功 第3圖係繪示依照本發 方法的流程圖。 第-實施例的顯示器的測試 示第3圖中輸出致 第5圖係繪示第3圖㉛之，驟的-程圖。 而調整測試圖框影像至標準影像:步: = 的電壓值 17 201011317 【主要元件符號說明】 110 :電源供應單元 120 :圖框產生單元 130 :電壓寫入單元 143 :電壓調整單元 145 :樣本圖框選擇單元 147 :切換單元 ⑩ 1471 :致能模組 1473 :圖框切換模組 910:平面顯示面板 920 :驅動電路 1431 :電壓調整模組 1431a :調整開關 1431b :調整開關 1433 :影像擷取模組 ❹ 1435 :比較模組 1437 :寫入觸發模組 1437a :觸發開關 1441 :傳輸介面 310 、 320 、 330 、 340 、 410 、 420 、 430 、 440 、 510 、 520 、 530、540 :步驟 18The write trigger module 1437 includes a trigger switch 1437a, which can employ, for example, a button. When the test frame image approximates the standard image, the user can press this button to trigger the write operation and write the voltage value at this time to the drive circuit. That is, after the trigger switch 1437a is pressed, the write trigger module 1437 transmits the trigger signal to the voltage writing unit 130 via the transmission interface 1441. The test device of the display provided by the first embodiment can not only verify the plurality of sample frame images displayed on the flat display panel 91 of the display, but also write the high-level common voltage value to the drive circuit 92 to reduce The degree to which the picture flickers. On the other hand, in another embodiment of the present invention, a test method for a display is provided, which can inspect a plurality of sample frame images displayed on a flat display surface & 9iq of the display, and (4) a high-level voltage value Writing to the drive circuit 920 reduces the degree of flickering of the picture. In the display (4) test method, first, the -enable signal S1 is output (step 31Q)' and the flat display panel displays a plurality of sample frame images or test frames = image (step 32G). H is displayed on the flat display panel. Second, according to the enable signal, the change is measured to the high-level common squeezing value of the driving circuit, and the __ image is adjusted to the standard image ((4) 330). After the test 201011317 attempts to frame the image has been adjusted to the standard image, the changed high level common voltage value is written to the drive circuit (step 340). Referring to Fig. 4', the flow chart of the step of outputting the enable signal in Fig. 3 is shown. That is, step 31 of FIG. 3 may further include: generating an at sign (step 41 〇); and generating a frame switching signal (step 420) 'to cause the flat display panel to display the sample frame image to detect The image quality of these sample frame images (step 43〇). Alternatively, the frame switching signal may cause the flat display panel to display the test frame image to adjust the image quality of the test frame image (step 44). Further, the test method of the second embodiment can also selectively produce one of the sample frame images. That is, the test method can select a special sample frame image for detection by, for example, two buttons, as a basis for adjusting a plurality of primary color parameters such as a flat display panel. The sample frame image may be selected from a red frame, a green frame, a blue frame, a black frame, a white frame, a vertical sixteen grayscale frame, a horizontal sixteen grayscale frame, or a horizontal color striped image. The combination of boxes. However, the present month is not limited to the above eight kinds of frames, and those skilled in the art to which the present invention pertains can also view 1G types or up to 2 () kinds of frame images. The user can check the red frame, the green frame and the blue circular frame to determine whether the flat display panel 91 can display the preset three primary colors. Moreover, by checking the black frame and the white frame, it can be judged that when all the sub-pixels are set to be full dark and full bright at the same time, the flat display panel 910 corresponds to the black and white color quality displayed. By observing the vertical sixteen gray scale frame and the horizontal sixteen gray scale frame, the layer 15 201011317 can be used as a basis for adjusting the gray scale change of the flat display panel 910. Observing the horizontal color fringe frame can judge the color change of the sub-pixels of the three primary colors of full bright and full dark in various combinations as a reference for design. Please refer to FIG. 5, which is a detailed flow chart showing the steps of adjusting the test frame image to the standard image by changing the common voltage value of the high level supplied to the driving circuit in FIG. That is, the step 330 of the control method of the second embodiment further includes capturing a test frame image (step 510) by, for example, an image capture device to process the signal of the test frame image. Then, the high-level common voltage value is adjusted according to the captured test frame image (step 52〇), because the high-level common voltage value will affect the degree of flicker of the test frame image, so adjusting the voltage value can effectively reduce the degree of flicker. . In this embodiment, the user can raise or lower the high-level common voltage value by manually switching the two adjustment switches 1431a, 1431b, respectively, and the adjustment switch 1431a and the adjustment switch M3ib are respectively realized by, for example, a button. In this embodiment, the image capturing device can be a luminance tester, and the luminance tester obtains the brightness value of the test surface, and then analyzes and processes both the brightness value of the test surface and the brightness value of the standard surface. . If the difference between the two values is, for example, 2% or less, it is judged that the test frame image caused by the high-level common voltage value supplied to the driving circuit at this time approximates the standard image. Moreover, when the voltage value is adjusted, the changed test frame image and the standard image (step 53A) can be compared by image processing technology. When it is confirmed that the adjusted test frame image is closer to the standard image X, the write trigger signal may be issued by pressing the trigger switch to write the changed Micro Motion 16 201011317 bit common voltage value to the driving circuit (step 540) ). Moreover, in other embodiments, the test method can also write a voltage value to the driver circuit by automatically issuing a write trigger signal. According to the second embodiment of the present invention, the test method provided by the second embodiment can not only evaluate the color display capability of the panel by detecting the image of the sample frame, but also write the high-level common voltage value. Enter the drive circuit of the flat display panel to improve the image quality of the flat display panel. Although the present invention has been described above with reference to the first and second embodiments, it is not intended to limit the invention, and various modifications and changes may be made without departing from the spirit and scope of the invention. Therefore, the scope of protection of the present invention is defined by the scope of the patent application. BRIEF DESCRIPTION OF THE DRAWINGS The above and other objects, features, advantages and embodiments will be more readily understood. The detailed description of the drawings is as follows: I λ η is not in accordance with the first embodiment of the present invention. A functional block diagram of the test device showing 11. Figure 2 is a block diagram showing the first figure. The function of the voltage adjustment unit of the device Fig. 3 is a flow chart showing the method according to the present invention. The test of the display of the first embodiment shows the output in Fig. 3, and Fig. 5 shows the process of Fig. 31. Adjusting the test frame image to the standard image: Step: Voltage value of = 17 201011317 [Description of main component symbols] 110: Power supply unit 120: Frame generation unit 130: Voltage writing unit 143: Voltage adjustment unit 145: Sample drawing Frame selection unit 147: switching unit 10 1471: enabling module 1473: frame switching module 910: flat display panel 920: driving circuit 1431: voltage adjusting module 1431a: adjusting switch 1431b: adjusting switch 1433: image capturing mode Group 1435: comparison module 1437: write trigger module 1437a: trigger switch 1441: transmission interface 310, 320, 330, 340, 410, 420, 430, 440, 510, 520, 530, 540: step 18