201009365 九、發明說明 【發明所屬之技術領域】 本發明通常係相關於列印領域。尤其是，本發明係相 關於測試位在載體上的列印頭積體電路之校準。 【先前技術】 結合微電機組件之頁寬印表機通常具有包括具有大量 • 密、㈣歹丨J 的微電機噴嘴配置之矽基板的列印頭積體電路。 各個噴嘴配置負責噴射一股墨水滴。 爲了讓此種印表機能夠準確列印和維持品質，列印頭 積體電路的測試是重要的。在此種積體電路的設計和發展 期間尤其重要。 【發明內容】 根據本發明的第一觀點，設置有測試裝置，用以測試 # 安裝在載體中之積體電路，此測試裝置包含： 一支撐組件； 一控制器，安裝在支撐組件中，控制器被程式化，以 處理來自積體電路的測試信號； —保持組件，配置在支撐組件上，且被組配成在測試 期間接收和保持載體； 一移位機構，配置在支撐組件上，用以在使用中，相 對於支撐組件而移位保持組件進及出一操作環境；及 測試電路，操作式連接到控制器，及具有至少測試信 -5- 201009365 號產生和量測電路與用於與被測試的積體電路操作嚙合之 配接器電路，配接器電路被組配成提供與積體電路的一實 體和一電介面。 較佳的是，積體電路是噴墨列印頭。 支撐組件包括一機殼組件，控制器係爲安裝在由一操 作者可存取之機殼中的觸控面板PC (個人電腦）形式， 機殼組件包括一桌面組件，以及保持組件包括可移位進及 ❿ 出該操作環境之一測試台。 保持組件包括一夾箝組件，其被配置在測試台上，以 在移位測試台到操作環境之前將載體夾箝到適當位置。 保持機構包括定位構造，其被組配成與載體上的定位 構造合作，以確保在測試之前將載體正確地定位。 配接器電路包括一配接器板，其被組配成嚙合積體電 路，以及提供與列印頭積體電路的電和實體介面。 信號產生和測試電路包括一測試器板；和一多工器 Φ 板，插入在測試器板和配接器板之間，以路由測試器板和 積體電路之間的測試和控制信號。 信號產生和測試電路包括一重設板，用以產生已多工 化的列印頭積體電路所需之重設信號。 根據本發明的第二觀點，提供有一測試安裝在一載體 上的積體電路之方法，此方法包含以下步驟： 牢固載體； 將載體移位到一操作位置，在此操作位置中，積體電 路與一診斷探針實體和電通訊； -6- .201009365 在至少與診斷探針電通訊之測試電路中產生測試信 號’並且利用診斷探針將測試信號通訊到積體電路； 透過診斷探針接收測試電路中的測試信號； 透過通訊鏈路和自動化伺服器使已接收的測試信號可 用於控制器；及 利用控制器顯示測試狀態。 較佳的是，積體電路是噴墨列印頭。 • 方法可包括，在移位載體到操作位置內的步驟期間， 查驗載體的識別符號之步驟。 牢固載體的步驟可包括在可程式化邏輯控制器 (PLC )的控制之下，以氣控夾箝組件夾箝載體。 產生信號的步驟可被組配成在列印頭積體電路上完成 包含下面群組的其中之一的測試：一毛Idd測試、一lpos 測試、一保護二極體電壓臨界測試、一引線接合連續性測 試、一漏流測試、一信號輸入電壓臨界測試、一信號輸出 〇 電壓測試、及一功能向量之測試。 方法可包括轉送信號到遠端監視系統之步驟。轉送信 號到遠端監視系統之步驟可包括透過連接到測試電路的 Ethernet (乙太網路）鏈路來轉送測試信號之步驟。 通訊和接收信號之步驟可包括多工化信號以路由信號 進及出列印頭積體電路中之個別晶粒之步驟。 根據本發明的第三觀點，設置有一平台，用於列印頭 積體電路測試器，此列印頭積體電路測試器用於安裝在載 體上之列印頭積體電路的測試操作，平台包含： -7- 201009365 一支撐結構； —固定裝置，配置在支撐結構上，且被配置成接收和 定位載體； 一夾箝機構，配置在固定裝置上，夾箝機構具有至少 一夾箝組件，用以夾箝載體到平台；及 —控制器，用以控制夾箝機構的操作。 固定裝置可包括一基座構件和從基座構件延伸之定位 ❹ 梢，以幫助載體定位在固定裝置上，定位梢被整型和按尺 寸切割成能被接收在載體所定義之配對的孔隙中。 基座構件可以是細長的，及夾箝機構可包括定位在基 座構件的各別末端上之兩相對夾箝組件。 各個夾箝組件可包括一活塞和汽缸配置，安裝於基座 構件上；及一夾箝板，樞軸轉動式安裝於基座構件上，以 利用活塞和汽缸配置轉動進及出一夾箝位置。 各個夾箝板可定義一夾箝指，被組配成當夾箝板轉動 Φ 到夾箝位置時覆蓋於載體之上。 各個夾箝組件可包括一氣動耦合，用以將活塞和汽缸 配置耦合到一加壓氣體供應器，以致動夾箝組件。 控制器可以是可程式化邏輯控制器（PLC )形式，被 組配成控制一加壓氣體供應器以及活塞和汽缸配置的操 作。 根據本發明的第四觀點，提供有一診斷探針組件，用 於診斷列印頭積體電路之一測試器，探針組件包含： 一支撐組件； -8- 201009365 一控制器板，安裝於支撐組件上，且具有被組配成產 生用以測試一列印頭積體電路的信號之一處理器； 一路由板，安裝於支撐組件上，且與控制器板以操作 信號通訊，路由板被組配成多工化用於列印頭積體電路的 各別晶粒之產生的信號；及 一探針介面，安裝於支撐組件上，且與路由板以操作 信號通訊，探針介面被組配成用以轉送多工化的測試信號 φ 進及出各別晶粒。 探針介面可包括一配接器板，其具有將信號轉換成列 印頭積體電路電信號之轉換器。 轉換器被組配成產生一重設信號，以幫助多工化到列 印頭積體電路的各別晶粒之信號。 探針介面可包括一推進棒，用以在嚙合介面與列印頭 積體電路期間提供剛性和機械支撐到介面。 路由板可包括板連接器，用以接收控制器板和配接器 • 板，路由板具有電力電路，用以供應電力給控制器和配接 器板。 支撐組件可包括一支撐板和從支撐板延伸出的托架， 控制器板被固定於托架，而路由板被固定於支撐板，它們 定義到探針介面的存取之孔隙。 控制器板的處理器被組配成產生適合由下面所組成之 一群測試的其中之一的測試信號：一毛Idd測試、一 Ipos 測試、一保護二極體電壓臨界測試、一引線接合持續性測 試、一漏流測試、一信號輸入電壓臨界測試、一信號輸出 -9 - .201009365 電壓測試、及一功能向量之測試。 根據本發明的第五觀點’提供有一測試積體電路之系 統，系統包含： 一局部計算裝置； —通訊鏈路，連接到計算裝置； 測試電路，透過通訊鏈路操作式連接到計算裝置，且 被組配成產生積體電路測試信號； φ 配接器電路，連接到測試電路，且被組配成提供與積 體電路的一電和實體介面； 路由電路’插入在測試和配接器電路之間，以路由測 試信號到積體電路中的各別晶粒； 一處理機構’用以保持和操作積體電路所在的一載 體；及 一控制器，操作式連接到處理機構，以控制其操作： 及連接到通訊裝置，以由計算裝置管理。 φ 較佳的是，積體電路是噴墨列印頭。 計算裝置可以是一 PC (個人電腦），其具有用以顯 示測試結果給一操作者之圖型使用者介面。 通訊鏈路可以是Ethernet (乙太網路）交換器，其可 連接到一遠端計算裝置，以提供到局部計算裝置的遠端存 取。 測試電路，可以是單一積體電路測試板形式，局部通 訊裝置被程式化’以定義用於與測試板通訊之一測試伺服 器。 -10- 201009365 配接器電路係由一配接器板所定義，配接器板具有用 於與積體電路實體和電嚙合之一列印頭電介面。 路由電路可以是一路由板形式，其被組配成多工化各 別晶粒的測試信號。 處理機構包括一氣控夾箝機構，用以在測試積體電路 期間牢固地夾箝載體。 控制器可以是一程式化邏輯控制器（PLC )形式。 φ 根據本發明的第六觀點，提供有一軟體產品，如上 述’係由一量測裝置的控制器所執行，該軟體產品使裝置 能夠執行上述方法。 根據本發明的第七觀點，提供有結合軟體產品之電腦 可讀取式媒體，如上述。 現在參考附圖以及經由例子說明本發明的實施例。下 面說明欲用於圖解說明本發明的特定實施例，以及允許精 於本技藝之人士能夠將本發明的那些實施例付諸實行。因 φ 此’下面說明並不用於以任何方式侷限前面各段落的範 圍。 【實施方式】 現在將參考特定實施例來說明本發明的觀點。以包含 性觀點而非限制性觀點來參考“實施例”。因此，參考一實 施例中所出現的特定特徵並不表示那些特徵不能出現在他 實施例中。 下面說明欲用於幫助精於本技藝之人士瞭解本發明。 -11 - 201009365 因此’並不特別詳細說明技藝中司空見慣的特徵，因爲精 於本技藝之人士相當明白此種特徵。 槪述. 廣義而言，本發明係相關於安裝於載體（未圖示）上 之諸如列印頭微晶片或積體電路（1C )等列印頭積體電路 的測試。載體典型上包括以列印流體供應1C之列印流體 φ 分佈通道，以及用於1C之捲帶式自動接合（TAB )電連 接。1C透過TAB連接從適當的列印機之列印機控制器接 收控制信號。通常，本發明提供到1C的電連接之測試裝 置和方法以確保其適當運作。 尤其是’本發明包括測試裝置，被組配成操作式接收 和保持此種載體’以及在位於其上之1C中執行電測試。 本發明又包括用於測試器之測試台、此種測試器的診斷探 針組件、及用以測試具有1C的載體之系統。亦提供測試 # 方法。下面分開說明這些觀點，但是精於本技藝之人士將 可明白本發明的各別觀點及/或組件之間的重疊性。 測試裝置槪述 參考圖1 ’其圖示列印頭積體電路的測試裝置或測試 器10之一實施例。測試器10包括定義支撐組件17之機 殼12。如圖所不，觸碰面板顯示電腦14被覆蓋在機殼12 中，且提供介面給測試器1 0的操作者。 測試器又包括控制器72 (如下述）以及用以操作式保 -12- 201009365 持載體之保持組件1 6。亦提供移位組件1 9，以移位保持 在保持組件1 6中之載體接觸測試器的測試電路之測試探 針接點1 8。控制器72被程式化，以在測試電路在載體上 執行電測試的同時，處理從載體的積體電路所接收之測試 信號。 測試電路的測試探針1 8被操作式連接到控制器72， 及包括測試信號產生和量測電路，與配接器電路用於與受 φ 測試的積體電路之操作式嚙合。配接器電路被組配成提供 與載體上的積體電路之實體和電介面。下面將更詳細討論 這些組件。 支撐組件17係由機殼12所支撐，且包括支撐保持組 件1 6之一桌面組件23。保持組件包括可移位進及出操作 環境之測試台2 1，其中透過探針1 8將列印頭1C與測試電 路接合。當測試台不在操作環境中時，操作者能夠從保持 組件16插入或移開載體。保持組件16包括配置在測試台 Φ 21上之夾箝或保持機構117(如下述），以在移位測試台 21到操作環境之前將載體夾箝到適當位置。 測試器1 〇又包括操作者控制面板22，其包括啓動按 鈕、夾箝按鈕、重設按鈕、及緊急停止按鈕。在一實施例 中，兩最外面的按鈕是啓動按鈕，此二者必須同時按壓才 能起動測試器10。這是防止意外起動測試器10的安全特 徵。 重設按鈕典型上重設測試器1 〇，其結束任何測試，並 且將保持組件1 6從操作環境移出，而到能夠載入或不載 -13- 201009365 入載體之載入位置。夾箝按鈕指示測試器10,尤其是控制 器72，以起動夾箝組件1 7夾箝載體到測試台2 1。緊急停 止按鈕是立即將測試器10關機之另一安全特徵。本發明 人已發現Sprecher&Schuh所製造的按鈕適合此申請案。 應明白，操作者控制面板22的按鈕以及觸碰面板14 被配置成與控制器22信號通訊，如下述。控制器負責執 行透過觸碰面板14所接收之按鈕或輸入所指示的動作。 φ 機殻12又包括兩壓力指示器26及28。應明白，測試 器1 〇包括用於測試台2 1之移位組件1 9和夾箝組件1 1 7 的氣動電路。因此，壓力指示器26表示夾箝組件117的 氣動壓力，而指示器28表示移位組件19的氣動壓力。 測試器1 〇又包括控制器所控制之光幕20安全系統。 光幕20讓使用者能夠偵測在測試期間何時外來物體靠近 測試台2 1。當偵測到外來物體時，測試器1 〇撤銷以防止 傷害。 φ 機殻12又包括電腦介面30，諸如USB插座等，透過 此，控制器能夠與外部電腦通訊。另外提供條碼掃描器 24，其被組配成掃描來自受測的各個載體之條碼，以儲存 各個測試載體的測試結果。 控制器組件 現在參考圖式中的圖2，以打開位置之機殼12的後上 封閉體圖示測試器1 〇的上部位。封閉體覆蓋控制器所管 理之控制系統的一些組件。 -14- 201009365 可看見平面PC 14，以及壓力指示器26及28。本發 明人已發現 Advantech PPC-123T整合單元適合當作本申 請案的平面PC 14。5V DC電力供應器46和9V DC電力 供應器42提供電力到控制系統的電組件。本發明人已發 現Omron DIN安裝交換電力供應模組號碼S8K-00705適 合5V供應器46，及CoselPBA50F-9適合供應器42。201009365 IX. Description of the Invention [Technical Field to Which the Invention Is Ascribed] The present invention is generally related to the field of printing. In particular, the present invention relates to the calibration of a print head integrated circuit for testing a carrier on a carrier. [Prior Art] A page wide printer incorporating a micro-motor assembly generally has a print head integrated circuit including a 矽 substrate having a large number of micro-motor nozzle configurations of (4) 歹丨J. Each nozzle configuration is responsible for jetting an ink drop. In order for this printer to accurately print and maintain quality, testing of the printed head unit circuit is important. This is especially important during the design and development of such integrated circuits. SUMMARY OF THE INVENTION According to a first aspect of the present invention, a test apparatus is provided for testing an integrated circuit mounted in a carrier, the test apparatus comprising: a support assembly; a controller mounted in the support assembly, controlled The device is programmed to process test signals from the integrated circuit; the retention component is disposed on the support assembly and is configured to receive and retain the carrier during testing; a shifting mechanism disposed on the support assembly for use In use, shifting the holding assembly into and out of an operating environment relative to the support assembly; and testing the circuit, operatively coupled to the controller, and having at least test letter-5-201009365 generation and measurement circuitry and for An adapter circuit that is in operative engagement with the integrated circuit under test, the adapter circuit is configured to provide a physical and a dielectric interface with the integrated circuit. Preferably, the integrated circuit is an ink jet print head. The support assembly includes a housing assembly in the form of a touch panel PC (Personal Computer) mounted in an operator accessible enclosure, the housing assembly including a desktop assembly, and the retention assembly including the removable assembly The test bench is placed in and out of the operating environment. The retaining assembly includes a clamp assembly that is configured on the test bench to clamp the carrier into position prior to shifting the test station to the operating environment. The retention mechanism includes a positioning configuration that is assembled to cooperate with the positioning configuration on the carrier to ensure proper positioning of the carrier prior to testing. The adapter circuit includes an adapter plate that is configured to engage the integrated circuit and to provide an electrical and physical interface to the integrated circuit of the printhead. The signal generation and test circuit includes a tester board; and a multiplexer Φ board interposed between the tester board and the adapter board to route test and control signals between the tester board and the integrated circuit. The signal generation and test circuit includes a reset board for generating the reset signal required by the multiplexed print head integrated circuit. According to a second aspect of the present invention, there is provided a method of testing an integrated circuit mounted on a carrier, the method comprising the steps of: securing a carrier; displacing the carrier to an operational position in which the integrated circuit Physical and electrical communication with a diagnostic probe; -6-.201009365 generates a test signal in a test circuit that communicates at least with the diagnostic probe' and communicates the test signal to the integrated circuit using the diagnostic probe; receives through the diagnostic probe Testing the test signal in the circuit; making the received test signal available to the controller via the communication link and the automation server; and displaying the test status using the controller. Preferably, the integrated circuit is an ink jet print head. • The method may include the step of verifying the identification of the carrier during the step of shifting the carrier into the operational position. The step of securing the carrier can include clamping the carrier with an air controlled clamp assembly under the control of a programmable logic controller (PLC). The step of generating a signal can be configured to perform a test comprising one of the following groups on the printhead integrated circuit: a hair Idd test, a lpos test, a protective diode voltage critical test, a wire bond Continuity test, a leakage current test, a signal input voltage critical test, a signal output 〇 voltage test, and a functional vector test. The method can include the steps of forwarding the signal to a remote monitoring system. The step of forwarding the signal to the remote monitoring system may include the step of forwarding the test signal over an Ethernet (Ethernet) link connected to the test circuit. The steps of communicating and receiving signals may include the step of multiplexing the signals to route signals into and out of individual dies in the printhead integrated circuit. According to a third aspect of the present invention, there is provided a platform for a print head integrated circuit tester for testing operation of a print head integrated circuit mounted on a carrier, the platform comprising : -7- 201009365 A support structure; - a fixing device disposed on the support structure and configured to receive and position the carrier; a clamping mechanism disposed on the fixing device, the clamping mechanism having at least one clamp assembly, The clamp carrier is used to the platform; and the controller is used to control the operation of the clamp mechanism. The fixture can include a base member and a positioning tip extending from the base member to assist in positioning the carrier on the fixture, the locating tip being shaped and sized to be received in a pair of apertures defined by the carrier . The base member can be elongate, and the jaw mechanism can include two opposing jaw assemblies positioned on respective ends of the base member. Each of the jaw assemblies can include a piston and cylinder arrangement mounted to the base member; and a clamp plate pivotally mounted to the base member for pivoting into and out of the clamp position using the piston and cylinder arrangement . Each clamp plate defines a clamp finger that is configured to overlie the carrier when the clamp plate is rotated Φ to the clamp position. Each of the jaw assemblies can include a pneumatic coupling for coupling the piston and cylinder configuration to a pressurized gas supply to actuate the jaw assembly. The controller can be in the form of a programmable logic controller (PLC) that is configured to control the operation of a pressurized gas supply and piston and cylinder configurations. According to a fourth aspect of the present invention, there is provided a diagnostic probe assembly for diagnosing a tester of a printhead integrated circuit, the probe assembly comprising: a support assembly; -8- 201009365 a controller board mounted on the support a processor having a signal that is configured to generate a signal for testing a column of integrated circuit circuits; a routing board mounted on the support assembly and communicating with the controller board in an operational signal, the routing board being grouped The multiplexed signal for generating the respective dies of the head unit circuit; and a probe interface mounted on the support assembly and communicating with the routing board for operating signals, the probe interface being assembled It is used to transfer the multiplexed test signal φ into and out of the respective crystal grains. The probe interface can include an adapter plate having a transducer that converts the signal into an electrical signal of the integrator circuit. The converters are configured to generate a reset signal to aid in multiplexing the signals to the individual dies of the printhead integrated circuit. The probe interface can include a pusher bar for providing rigidity and mechanical support to the interface during the engagement interface and the print head assembly circuit. The routing board can include a board connector for receiving the controller board and the adapter board, the routing board having power circuitry for supplying power to the controller and the adapter board. The support assembly can include a support plate and a bracket extending from the support plate, the controller plate being secured to the bracket, and the routing plate being secured to the support plate defining apertures for access to the probe interface. The controller board's processor is configured to generate test signals suitable for one of the following test groups: a hair Idd test, an Ipos test, a protective diode voltage critical test, and a wire bond continuity. Test, a leakage test, a signal input voltage critical test, a signal output -9 - .201009365 voltage test, and a function vector test. According to a fifth aspect of the present invention, there is provided a system for testing an integrated circuit, the system comprising: a local computing device; a communication link connected to the computing device; a test circuit operatively connected to the computing device via the communication link, and Is configured to generate an integrated circuit test signal; a φ adapter circuit connected to the test circuit and configured to provide an electrical and physical interface to the integrated circuit; the routing circuit 'insert in the test and adapter circuit Between the routing test signals to the respective dies in the integrated circuit; a processing mechanism 'used to hold and operate a carrier on which the integrated circuit is located; and a controller operatively connected to the processing mechanism to control Operation: and connected to the communication device for management by the computing device. Preferably, the integrated circuit is an ink jet print head. The computing device can be a PC (Personal Computer) having a graphical user interface for displaying test results to an operator. The communication link can be an Ethernet (Ethernet) switch that can be coupled to a remote computing device to provide remote access to the local computing device. The test circuit can be in the form of a single integrated circuit test board, and the local communication device is programmed to define a test server for communicating with the test board. -10-201009365 The adapter circuit is defined by an adapter plate having a printhead interface for physical and electrical engagement with the integrated circuit. The routing circuit can be in the form of a routing board that is configured to multiplex the test signals of the individual dies. The processing mechanism includes a pneumatically controlled clamp mechanism for securely clamping the carrier during testing of the integrated circuit. The controller can be in the form of a stylized logic controller (PLC). According to a sixth aspect of the invention, there is provided a software product, as described above, carried out by a controller of a measuring device which enables the device to perform the above method. According to a seventh aspect of the present invention, there is provided a computer readable medium incorporating a software product, as described above. Embodiments of the present invention will now be described with reference to the drawings and by way of example. The following description is intended to be illustrative of the specific embodiments of the invention and the embodiments of the invention The following description is not intended to limit the scope of the preceding paragraphs in any way. [Embodiment] The viewpoint of the present invention will now be described with reference to specific embodiments. Reference is made to the "embodiment" in an inclusive and non-limiting sense. Thus, reference to specific features appearing in an embodiment does not indicate that those features are not present in the embodiments. The following description is intended to assist those skilled in the art to understand the invention. -11 - 201009365 Therefore, the characteristics that are commonplace in the art are not specifically described, as those skilled in the art are quite aware of this feature. DETAILED DESCRIPTION OF THE INVENTION Broadly speaking, the present invention relates to the testing of a print head integrated circuit such as a print head microchip or an integrated circuit (1C) mounted on a carrier (not shown). The carrier typically includes a printing fluid φ distribution channel with a print fluid supply 1C, and a tape and tape automated bonding (TAB) electrical connection for 1C. The 1C receives the control signal from the printer controller of the appropriate printer via the TAB connection. In general, the present invention provides test apparatus and methods for electrical connection to 1C to ensure proper operation. In particular, the present invention includes a test device that is configured to operatively receive and hold such a carrier and perform an electrical test in 1C located thereon. The invention further includes a test station for a tester, a diagnostic probe assembly for such a tester, and a system for testing a carrier having 1C. Test # method is also available. These points are set forth below separately, but those skilled in the art will be able to understand the various aspects and/or overlaps between the components of the present invention. Test Apparatus Description Referring to Figure 1 'an embodiment of the test apparatus or tester 10 of the print head integrated circuit is shown. Tester 10 includes a housing 12 that defines a support assembly 17. As shown, the touch panel display computer 14 is covered in the housing 12 and provides an interface to the operator of the tester 10. The tester in turn includes a controller 72 (as described below) and a holding assembly 16 for operating the carrier. A shifting assembly 1 9 is also provided to shift the test probe contact 18 of the test circuit that holds the carrier in the holding assembly 16 in contact with the tester. The controller 72 is programmed to process the test signals received from the integrated circuits of the carrier while the test circuit is performing electrical tests on the carrier. The test probe 18 of the test circuit is operatively coupled to the controller 72 and includes test signal generation and measurement circuitry for interoperating with the operative circuit of the integrated circuit being tested by φ. The adapter circuit is assembled to provide physical and electrical interfaces to the integrated circuitry on the carrier. These components are discussed in more detail below. The support assembly 17 is supported by the casing 12 and includes a table top assembly 23 that supports one of the holding assemblies 16. The holding assembly includes a test stand 2 1 that is displaceable into and out of the operating environment, wherein the print head 1C is coupled to the test circuit through the probe 18. The operator can insert or remove the carrier from the retention assembly 16 when the test station is not in the operating environment. The retaining assembly 16 includes a clamp or retaining mechanism 117 (as described below) disposed on the test station Φ 21 to clamp the carrier into position prior to shifting the test station 21 to the operating environment. The tester 1 further includes an operator control panel 22 that includes an activation button, a clamp button, a reset button, and an emergency stop button. In one embodiment, the two outermost buttons are start buttons, both of which must be pressed simultaneously to activate the tester 10. This is a safety feature that prevents accidental starting of the tester 10. The reset button typically resets the tester 1 〇, which ends any tests and moves the component 16 out of the operating environment to the loading position of the carrier that can be loaded or not loaded with -13- 201009365. The clamp button indicates the tester 10, and in particular the controller 72, to activate the clamp assembly 17 to clamp the carrier to the test station 21. The emergency stop button is another security feature that immediately shuts down the tester 10. The inventors have found that buttons made by Sprecher & Schuh are suitable for this application. It will be appreciated that the buttons of the operator control panel 22 and the touch panel 14 are configured to signally communicate with the controller 22 as described below. The controller is responsible for performing the actions indicated by the buttons or inputs received by the touch panel 14. The φ housing 12 in turn includes two pressure indicators 26 and 28. It should be understood that the tester 1 includes a pneumatic circuit for the shifting assembly 19 of the test stand 21 and the clamp assembly 1 1 7 . Thus, the pressure indicator 26 represents the pneumatic pressure of the jaw assembly 117 and the indicator 28 represents the pneumatic pressure of the displacement assembly 19. The tester 1 further includes a light curtain 20 security system controlled by the controller. The light curtain 20 allows the user to detect when a foreign object is approaching the test bed 21 during the test. When a foreign object is detected, the tester 1 is revoked to prevent damage. The φ housing 12 further includes a computer interface 30, such as a USB socket, through which the controller can communicate with an external computer. Also provided is a barcode scanner 24 that is configured to scan bar codes from the various carriers under test to store test results for each test carrier. Controller Assembly Referring now to Figure 2 of the drawings, the upper rear enclosure of the casing 12 in the open position illustrates the upper portion of the tester 1 〇. The enclosure covers some of the components of the control system managed by the controller. -14- 201009365 The flat PC 14, and the pressure indicators 26 and 28 are visible. The inventors have discovered that the Advantech PPC-123T integrated unit is suitable as a planar PC 14 of the present application. The 5V DC power supply 46 and the 9V DC power supply 42 provide electrical power to the electrical components of the control system. The inventors have found that the Omron DIN-mounted switching power supply module number S8K-00705 is suitable for the 5V supply 46, and the CoselPBA 50F-9 is suitable for the supplier 42.
Ethernet交換器44將平面PC 14和條碼掃描器24與 φ 控制器72連接。Ethernet交換器44又提供一介面給遠端 監視系統，如下述。本發明人已發現 Netgear FS605 Ethernet交換器適合本申請案。 亦可看見控制器板5 0和相關配接器、測試器和多工 器板（共同以參考號碼48表示）。控制器板50和相關板 件48 —起形成診斷探針組件的一部分，如下述。亦提供 線槽40，藉以利用整齊並且容易的存取方式來幫助組件的 電和氣動連接。 ❹ 現在參考圖式中的圖3，以打開位置之機殼1 2的後下 封閉體圖示測試器1 〇的下部位。控制器72是看得見的， 其爲可程式化邏輯控制器（PLC )。本發明人已發現 Mitsubishi FX3U-16M PLC 適合此申請案。 PLC 72可程式化，以能夠控制測試器1 〇的不同型 態。PLC 72又包括網路通訊模組70，其爲與Ethernet交 換器 44 接合之 Mitsubishi FX3 U-ENET 模組，Ethernet 交 換器44接著提供介面給平面PC 14、條碼掃描器24，及 到遠端監視系統的外部連接，如上述。 -15- 201009365 PLC 72又包括類比介面模組74，以使PLC 72能夠隅 測試台21的氣動致動器以及支撐組件1 7的移位機構1 9 接合。類比介面模組74可以是Mitsubishi FX2N-4AD模 組。PLC 72亦被配置成與控制器板50和相關配接器、測 試器和多工器板48利用信號通訊。 應明白，PLC或控制器72負責測試器1 0的功能和操 作。所有電和氣動組件都在PLC 72的控制之下。機殻12 φ 的封閉體又包括線槽60，以利用整齊並且容易的存取方式 來幫助電組件的連接。如圖所示，將組件安裝在軌道62 上。 如圖所示，若需要的話，封閉體又覆蓋幹線電力隔離 交換器 64，以隔幹線 AC電力。本發明人已發現 Sprecher&Schuh模組號碼LE2- 1 2- 1 782隔離交換器適合本 申請案。 又包括光幕電力供應器68以及相關光幕安全繼電器 φ 66。本發明人已發現Keyence SL-U2 24V電力供應器和 Omron G7S-4A2B DC24插入式安全繼電器適合本申請案。 連同提供額外過電壓和相關電力保護之安全繼電器76和 熔線80，將剩餘電流斷路器78用於過電流和接地漏流保 護。本發明人已發現連同 Omron G7S-4A2B繼電器和 Wieland SNO 4003K繼電器之Hager AD 810T斷路器適合 本申請案。 圖11至14爲上述組件的某一些及其互連的電路圖。 -16- 201009365 測試台 圖6及7爲包括測試台21之保持組件16的實施例’ 此測試台21包括保持機構或夾箝機構117。將測試台21 安裝於支撐結構17的桌面組件23上’如上述。 測試台21包括固定裝置124，其被整型並且按尺寸切 割成能夠接收和定位載體。另外又包括配置在固定裝置 124上之保持機構或夾箝機構117,此夾箝機構117具有 φ 至少一夾箝組件1 1 8，用以夾箝載體到測試台2 1。應明白 的是，透過適當的氣動組件和電路，控制器72負責控制 夾箝機構117的操作，如下述。 固定裝置124包括基座構件123和從基座構件123延 伸之定位梢116，以幫助定位載體在固定裝置124上。定 位梢116被整型和按尺寸切割成能被接收在載體所定義之 配對的孔隙中。基座構件123是細長的，及夾箝機構117 可包括定位在基座構件123的各別末端上之兩相對夾箝組 件1 1 8 ^如圖所不。 各個夾箝組件118包括一活塞和汽缸配置112，安裝 於基座構件123上；及一夾箝板122，具有一夾箝指，樞 軸轉動式安裝於基座構件123上，以利用活塞和汽缸配置 112轉動進及出一夾箝位置。如圖所示，經由樞軸梢114 安裝夾箝板122。各個活塞和汽缸配置.112包括一致動器 耦合120和按鈕頭蓋126，以透過氣動供應器幫助夾箝配 置1 12的致動。 夾箝組件1 1 8又包括氣動耦合1 1 〇，用以耦合活塞和 -17- 201009365 汽缸配置1 1 2到加壓氣體供應器，以致動保持組件1 6。如 上述，可程式化邏輯控制器（PLC )形式之控制器72被組 配成，控制加壓氣體供應器以及活塞和汽缸配置1 1 2的操 作。下面將更詳細討論測試器10的氣動組件。 氣動組件 測試器10以一般氣動組件爲特徵，以幫助PLC 72控 0 制保持組件1 6和移位機構1 9。這些氣動組件包括壓力指 示器26及28，如上述。氣動組件典型上包括諸如SMC AR2000-02調節器等主要供應調節器，以控制整個氣動系 統壓力。諸如SMC BM43 0-0 1 -00三埠機械閥等機械式關 閉閥被設置當作氣動系統的機械式關閉》包括微霧分離 器，以去除雜質和從測試器10的氣動系統排出濕氣。本 發明人已發現SMCAFD20-02-C模組適合本申請案。 這些組件被鏈結到一些內置卡匣式螺線管閥，以控制 移位組件19和測試台21的夾箝1 17，如上述。由PLC 72 控制這些閥，諸如SMC SY3 160螺線管閥等，它們是具有 6mm氣動管配件的24V DC。 如上述，測試台21使用兩單一作用、單一桿、彈簧 轉回梢汽缸用於活塞和汽缸配置112，以夾箝載體到測試 台2 1。移位機構1 9使用SMC MGPM系列雙重作用小型引 導汽缸以將台21致動成隅測試電路的探針18接觸。移位 機構19典型上包括兩SMC D-Y7P萬用型自動交換器，以 指示測試台2 1的移位之行進限制。爲了幫助PLC 72控制 -18- 201009365 測試台21和移位組件1 9的必要壓力，通常又包括s MC 電子壓力交換器。 可進一步使用第三交換器，以當台21舉向探針18 時，開始實施條碼掃描器24的操作。實際上，當舉起台 21由台21起動此種第三交換器。本發明人已發現手持式 產品3 800LR條碼掃描器適合本申請案》 氣動組件典型上又包括燒結消音器，以降低來自氣動 系統的排氣雜音。SMC AN1 0 1-〇 1燒結消音器適合本申請 案。 下面參考圖14說明氣動組件。 診斷探針組件 圖4及5爲測試器10的診斷探針組件51圖。診斷探 針組件5 1包括測試電路，以及被用於診斷載體上的列印 頭積體電路。探針組件51包括具有支撐托架的支撐板形 % 式之支撐組件91»支撐托架90將控制器板50支撐在支撐 組件9 1上，其定義用以接收探針介面配置1 8之孔隙，如 圖所示。 控制器板50通常包括處理器（未圖示），此處理器 被組配成產生用以測試載體上的列印頭積體電路之測試信 號。將路由或多工器板48安裝在支撐組件91上，並且被 配置成與控制器板50以操作信號通訊。路由板48被組配 成多工化到載體上之列印頭積體電路的各別列印頭晶粒之 已產生的測試信號。 -19- 201009365 透過固定螺釘92將探針介面18安裝於支撐組件91 上’如圖所示。探針介面18被配置成與路由板48以操作 信號通訊’以及探針介面18被組配成，當測試台21與探 針18接觸時，轉送已多工化測試信號進及出載體上之列 印頭電路的各別晶粒。 路由板48典型上包括具有轉換器（未圖示）在其上 之重設板95 ’此轉換器用以將測試信號轉換成適當的列印 φ 頭積體電路電信號。轉換器被組配成產生重設信號，以幫 助到列印頭積體電路的各自晶粒之測試信號的多工化。探 針介面18另外定義一些探針接點130，它們嚙合載體上之 列印頭積體電路的類似接點。 路由板48典型上包括板連接器，用以連接控制器板 50和配接器板97，路由板48具有分別用以供應該控制器 和配接器板50及97電力之電力電路。本質上，配接器板 97包括配接器電路，其被組配成嚙合列印頭積體電路，以 φ 及提供與列印頭積體電路的電和實體介面。 探針介面18又包括推進棒98’用以在嚙合介面18與 載體上之列印頭積體電路期間提供剛性和機械支撐到介面 18° 控制器板50的處理器被組配成產生適合由下面所組 成之一群測試的其中之一的測試信號：一毛1dd測試、一 Ipos測試、一保護一極體電壓臨界測試、一引線接合持續 性測試、一漏流測試、一信號輸入電壓臨界測試、一信號 輸出電壓測試、及一功能向量之測試。 -20- 201009365 控制器板50包含信號產生和測試電路，利用 板97形成具有轉換器的測試器板，或重設板95形 在控制器5 0和配接器板4 8之間的多工器板。信號 測試電路包括重設板9 5，用以產生多工化列印頭積 所需之重設信號。重設板95被組配成透過探針18 接器板48和列印頭積體電路之間的測試和控制信號 圖8爲測試台21的操作對準圖，利用測試電 φ 針18操作式保持載體。若測試探針18與載體未對 產生有誤的讀數。爲了保證適當對準，將暫時性 (以1 0 5表示）插入測試台1 6，以對準測試探針] 進棒9 8中之對應孔或定位腳1 〇 1，如圖所示。亦圖 進棒9 8和測試探針接點〗3 〇 ^ 測試系統 現在參考圖9，圖示有用以使用測試器1 〇測試 積體電路之系統100，如上述。通常，系統100包 器1〇以及遠端監視系統（RMS) 140，如上述。 系統100包括測試器10，其被配置成與RMS 信號通訊。以槪要表示圖圖示測試器10的其中一 功能組件。Ethernet交換器44形成通訊集線器， 接合測試器1 0與RM S 1 4 0的各別組件，如圖所示< 測試器1 〇包括具有相關類比介面模組74和網 70之PLC 72。類比介面模組74形成PLC 72和螺 之間的介面’這些螺線管閥控制測試台2 1的氣動 配接器 成插入 產生和 體電路 路由配 ί 〇 路的探 準，則 定位梢 [8的推 示有推 列印頭 括測試 140以 些主要 其用以 路模組 線管閥 組件和 -21 - 201009365 移位機構1 9，如上述。網路模組70形成PLC 72和圖9 所指出的其他組件之間的網路介面》 遠端監視系統或RMS 140形成局部計算裝置，其具有 透過Ethernet交換器44到計算裝置或RMS 140的通訊鏈 路。如上述，測試器1 0包括診斷探針組件5 1，其包括透 過Ethernet交換器44的通訊鏈路操作式連接到計算裝置 或RMS 140之測試電路。組件51的測試電路被組配成產 φ 生積體電路測試信號，以測試列印頭積體電路。 配接器板97包括配接器電路，其操作式連接到控制 器板50上之測試電路，且配接器電路被組配成，提供透 過具有接觸器130之探針18與載體上的積體電路一電和 實體介面，如上述。 路由板48包括插入在控制器板50上的測試電路和配 接器板48上的配接器電路之間的路由電路，以路由測試 信號到載體上的各別積體電路。氣動測試台2 1和移位機 φ 構1 9能夠一起被視作處理機構99，用以保持和操作積體 電路所在的載體。PLC或控制器72被操作式連接到此處 理機構，如上述，用以控制其操作。PLC 72另外被連接 到Ethernet交換器44形式之通訊裝置，以計算裝置或 RMS 1 40 管理。 應明白，RMS或計算裝置140可以是PC，其具有用 以顯示載體列印頭積體電路的測試結果給一操作者之圖型 使用者介面。因此，RMS或局部通訊裝置140典型上被程 式化，以定義透過PLC 72與組件5 1的測試電路通訊之測 -22- 201009365 試伺服器。 RMS 140執行測試器1〇的遠端監視。測試器10所測 試之各個載體的條碼和測試結果被發送到RMS 1 40，作爲 品質和保證控制。RMS 140又能夠與PLC 72通訊，以提 供控制測試器1 0的操作參數和指令。 測試載體之方法 φ 圖10爲使用測試器10測試載體上之列印頭積體電路 時所執行的可能方法步驟。應明白，參考表示特定方法步 驟之參考號碼意指附圖中由此種號碼所指出的各別方塊。 就方法而言，包括在本發明中的方法並不限制或侷限於此 方式所意指之特定方法。精於本技藝之人士應明白，在可 能除去這些步驟的某一些或包括額外的步驟之本發明下， 仍能夠有其他方法。 在一實施例中，方法開始於方塊160，在方塊160 • 中，操作者透過觸碰面板14由PLC 72提示去載入載體到 測試台21內（方塊162) 〇PLC 72又使操作者使控制面 板22上之夾箝按鈕能夠運作（方塊164)。然後，操作者 能夠載入載體到測試21內（方塊166)並且壓下夾箝按 鈕，指示PLC 72致動夾箝機構117，以將載體牢固在固 定裝置124。 一旦已夾箝載體，PLC 72能夠起動條碼掃描器24去 掃描載體的條碼（分別爲方塊170及172)。若PLC 72 成功地掃描條碼，則條碼被儲存和發送到RMS 140，如上 -23- 201009365 述。然後，PLC 72使起動按鈕能夠運作’讓載體的測試 能夠繼續。若條碼有問題’則PLC 72透過觸碰面板14顯 示一錯誤訊息’也通知RMS140。如下面所述一般’在載 體上未執行測試。由方塊174、176、178、及180所指 出。 假設成功掃描條碼，操作者繼續壓下起動按鈕，如上 述（方塊182)。然後，PLC 72致動移位機構19，以舉 φ 起測試台21以及牢固在其上之載體到探針1 8 (方塊 184 )。探針接觸載體上的列印頭積體電路，使得測試能 夠發生。一旦測試台的夾箝在適當位置上（方塊186)， 則PLC準備（方塊188)執行測試常式（方塊190)。 在一實施例中，測試常式典型上包括PLC 72載入之 軟體指令。RMS 140又透過通訊鏈路44供應此種測試常 式軟體到PLC 72。PLC 72透過觸碰面板14顯示“測試即 將開始”的訊息給操作者（方塊190)。一旦已由PLC 72 Φ 載入測試常式，則PLC 72透過觸碰面板14顯示“測試正 在進行中”的訊息給操作者（方塊192)。觸碰面板PC 14 典型上執行軟體指令以顯示圖型使用者介面（GUI)給操 作者。 然後，PLC 72透過診斷組件51在積體電路上執行列 印頭測試常式（方塊194)，如上述。測試常式包括控制 器板50產生測試信號以執行下面電測試類型的任一種或 全部：一毛Idd測試、一 Ipos測試、一保護二極體電壓臨 界測試、一引線接合連續性測試、—漏流測試、—信號輸 -24- 201009365 入電壓臨界測試、一信號輸出電壓測試、及一功能向量之 測試。 當完成不同的測試時，觸碰面板14透過GUI顯示結 果給操作者。PLC 72儲存結果（方塊198)，並且也能夠 發送結果給RMS 140。當完成所有的測試時，PLC停止測 試，如方塊200所示。當完成測試時，PLC 72以夾箝1 17 將測試台21下降到與探針18未接觸的載入位置（方塊 0 202 )，及鬆開夾箝（方塊204 )，以能夠移除載體。 觸碰面板1 4的GUI又可顯示完成測試之訊息（方塊 196)，及提示操作者去載入下一載體（方塊206 )。操作 者在測試循環結束時（方塊 210)移除載體（方塊 208 )。針對下一載體重複方法步驟。 電路圖 圖11至14爲上述控制器組件的電路圖。圖11爲網 φ 路通訊模組70、Ethernet交換器44、觸碰面板電腦14、 及條碼掃描器24之間的互連圖。 圖12爲幹線電力絕緣交換器64、剩餘電流斷路器 78、光幕電力供應器68、光幕安全繼電器66、DC電力供 應器46、及安全繼電器76之間的互連圖。如上述，安全 繼電器76包括兩安全繼電器76.1及76.2，如所指出一 般。亦指出緊急停止和重設按鈕的位置。 圖13爲具有類比介面模組74之PLC 72。圖14爲其 他氣動和按鈕互連圖。圖示有自動交換器220，如上述， -25- 201009365 爲了限制移位組件1 9的行進’與螺線管閥2 2 2 —起負責 致動移位組件19。螺線管閥224負責致動夾箝機構117, 亦圖示有起動按鈕226和夾辩按鈕234。數位壓力感測器 230圖示系統氣動壓力，及指出系統壓力交換器232。 雖然不詳細說明圖11至14的電路圖所示之互連，但 是精於本技藝之人士應明白。 φ 【圖式簡單說明】 從提供足夠資訊給精於本技藝之人士來執行本發明之 “實施方式”可辨識本發明的較佳特徵、實施例、及變化。 “實施方式”並不可以任何方式視作侷限前面本發明的“發 明內容”之範圍。“實施方式”將參考以下的一些圖式： 圖1爲根據本發明的一實施例之用以測試安裝於載體 上的列印頭積體電路之測試裝置或測試器的槪要圖； 圖2爲圖1之裝置的控制器組件之槪要圖； φ 圖3爲圖1之裝置的控制器之槪要規劃圖； 圖4爲根據本發明的一實施例之圖1的測試器之診斷 探針組件圖； 圖5爲圖4所示之組件的探針介面圖； 圖6爲根據本發明的一實施例之用以保持載體到圖1 的測試器之支撐組件的保持組件之側槪略圖； 圖7爲圖6之保持組件的俯視槪略圖； 圖8爲分別保持在圖6及4之保持組件和測試探針組 件中的載體之槪要對準圖； -26- 201009365 測 的 路 電 體 積 頭 印 列 之 例 施 實 一 的 明 發圖 本劃 據規 根要 爲槪 9 之 圖統 系 試 ο 圖 用圖 利程 之流 例的 施驟 實步 一 法 的方 明之 發路 本電 據體 根積 爲頭 印 列 圖試 測 來 器 試 測 的 ❹ 圖 圖圖圖The Ethernet switch 44 connects the plane PC 14 and the barcode scanner 24 to the φ controller 72. The Ethernet switch 44 in turn provides an interface to the remote monitoring system as described below. The inventors have discovered that the Netgear FS605 Ethernet switch is suitable for this application. Controller board 50 and associated adapters, testers, and multiplexers (collectively referred to by reference numeral 48) are also visible. Controller board 50 and associated board 48 together form part of a diagnostic probe assembly, as described below. A wire slot 40 is also provided to facilitate the electrical and pneumatic connection of the components with a neat and easy access. ❹ Referring now to Figure 3 of the drawings, the lower rear enclosure of the casing 12 in the open position illustrates the lower portion of the tester 1 〇. Controller 72 is visible and is a programmable logic controller (PLC). The inventors have found that the Mitsubishi FX3U-16M PLC is suitable for this application. The PLC 72 can be programmed to control the different types of tester 1 。. The PLC 72 further includes a network communication module 70, which is a Mitsubishi FX3 U-ENET module that interfaces with the Ethernet switch 44. The Ethernet switch 44 then provides an interface to the plane PC 14, the barcode scanner 24, and remote monitoring. The external connection of the system, as described above. -15- 201009365 PLC 72 in turn includes an analog interface module 74 to enable the PLC 72 to engage the pneumatic actuator of the test station 21 and the shifting mechanism 19 of the support assembly 17. The analog interface module 74 can be a Mitsubishi FX2N-4AD module. PLC 72 is also configured to communicate with controller board 50 and associated adapters, testers, and multiplexer boards 48. It should be understood that the PLC or controller 72 is responsible for the function and operation of the tester 10. All electrical and pneumatic components are under the control of the PLC 72. The enclosure of the casing 12 φ in turn includes a wire slot 60 to facilitate the connection of the electrical components with a neat and easy access. As shown, the assembly is mounted on rail 62. As shown, the enclosure, in turn, covers the mains power isolation switch 64 to isolate the mains AC power. The inventors have found that the Sprecher & Schuh module number LE2- 1 2- 1 782 isolation exchanger is suitable for this application. Also included is a light curtain power supply 68 and associated light curtain safety relay φ 66. The inventors have found that the Keyence SL-U2 24V power supply and the Omron G7S-4A2B DC24 plug-in safety relay are suitable for this application. The residual current circuit breaker 78 is used for overcurrent and earth leakage protection, along with a safety relay 76 and a fuse 80 that provide additional overvoltage and associated power protection. The inventors have found that a Hager AD 810T circuit breaker in conjunction with an Omron G7S-4A2B relay and a Wieland SNO 4003K relay is suitable for this application. Figures 11 through 14 are circuit diagrams of some of the above components and their interconnections. -16- 201009365 Test Bench Figures 6 and 7 are embodiments of a retaining assembly 16 including a test station 21. This test stand 21 includes a retaining mechanism or clamp mechanism 117. The test stand 21 is mounted on the table top assembly 23 of the support structure 17 as described above. The test station 21 includes a fixture 124 that is shaped and sized to receive and position the carrier. In addition, a retaining mechanism or clamping mechanism 117 is provided on the fixture 124. The jaw mechanism 117 has φ at least one clamp assembly 1 1 8 for clamping the carrier to the test station 21. It will be appreciated that the controller 72 is responsible for controlling the operation of the jaw mechanism 117 through appropriate pneumatic components and circuitry, as described below. The fixture 124 includes a base member 123 and a locating tip 116 extending from the base member 123 to assist in positioning the carrier on the fixture 124. The positioning tip 116 is shaped and sized to be received in a pair of apertures defined by the carrier. The base member 123 is elongate, and the jaw mechanism 117 can include two opposing jaw assemblies 1 18 that are positioned on respective ends of the base member 123. Each of the jaw assemblies 118 includes a piston and cylinder arrangement 112 mounted to the base member 123; and a clamping plate 122 having a jaw finger pivotally mounted to the base member 123 for utilizing the piston and The cylinder configuration 112 is rotated into and out of a clamp position. As shown, the clamp plate 122 is mounted via a pivot tip 114. Each piston and cylinder configuration .112 includes an actuator coupling 120 and a button head cover 126 to assist actuation of the clamp configuration 1 12 through a pneumatic supply. The clamp assembly 1 1 8 in turn includes a pneumatic coupling 1 1 〇 for coupling the piston and the -17-201009365 cylinder configuration 1 1 2 to the pressurized gas supply to actuate the retaining assembly 16 . As noted above, a controller 72 in the form of a programmable logic controller (PLC) is configured to control the operation of the pressurized gas supply and the piston and cylinder configuration 112. The pneumatic components of the tester 10 are discussed in more detail below. Pneumatic Assembly Tester 10 features a general pneumatic assembly to assist PLC 72 to control assembly 16 and shifting mechanism 19. These pneumatic components include pressure indicators 26 and 28 as described above. Pneumatic components typically include a main supply regulator such as the SMC AR2000-02 regulator to control the entire pneumatic system pressure. Mechanical shut-off valves such as the SMC BM43 0-0 1 -00 three-turn mechanical valve are configured as mechanical shut-offs for pneumatic systems, including micro-mist separators to remove impurities and vent moisture from the pneumatic system of the tester 10. The inventors have found that the SMCAFD20-02-C module is suitable for this application. These components are linked to some built-in cartridge solenoid valves to control the shifting assembly 19 and the clamps 17 of the test station 21 as described above. These valves are controlled by PLC 72, such as the SMC SY3 160 solenoid valve, etc., which are 24V DC with 6mm pneumatic tube fittings. As described above, the test station 21 uses two single acting, single rod, spring-backed tip cylinders for the piston and cylinder configuration 112 to clamp the carrier to the test station 21. The shifting mechanism 19 uses the SMC MGPM series dual-acting small pilot cylinder to actuate the stage 21 into contact with the probe 18 of the 隅 test circuit. The shifting mechanism 19 typically includes two SMC D-Y7P universal automatic exchangers to indicate the travel limit of the displacement of the test station 21. In order to help the PLC 72 control the necessary pressure of the test bench 21 and the shifting assembly 19, it usually includes the s MC electronic pressure exchanger. The third exchanger can be further used to initiate the operation of the barcode scanner 24 when the stage 21 is lifted toward the probe 18. In fact, when the lift table 21 is activated by the table 21, such a third exchanger is activated. The inventors have discovered that the hand held product 3 800LR bar code scanner is suitable for the present application. Pneumatic components typically include a sintered muffler to reduce exhaust noise from the pneumatic system. The SMC AN1 0 1-〇 1 sintered silencer is suitable for this application. The pneumatic assembly will be described below with reference to FIG. Diagnostic Probe Assembly Figures 4 and 5 are diagrams of the diagnostic probe assembly 51 of the tester 10. The diagnostic probe assembly 51 includes test circuitry and a printhead integrated circuit that is used to diagnose the carrier. The probe assembly 51 includes a support plate-shaped support assembly 91 having a support bracket. The support bracket 90 supports the controller plate 50 on the support assembly 91, which is defined to receive the aperture of the probe interface arrangement 18. ,as the picture shows. Controller board 50 typically includes a processor (not shown) that is configured to generate test signals for testing the print head integrated circuits on the carrier. A routing or multiplexer board 48 is mounted on the support assembly 91 and is configured to communicate with the controller board 50 in operational signals. The routing board 48 is configured to multiplex the test signals generated by the individual printhead dies of the printhead integrated circuit on the carrier. -19- 201009365 The probe interface 18 is mounted to the support assembly 91 via a set screw 92 as shown. The probe interface 18 is configured to communicate with the routing board 48 in an operational signal' and the probe interface 18 is configured to forward the multiplexed test signal into and out of the carrier when the test station 21 is in contact with the probe 18. The individual dies of the print head circuit. Routing board 48 typically includes a reset board 95' having a converter (not shown) thereon for converting test signals into appropriate print φ header circuit electrical signals. The converters are configured to generate reset signals to aid in the multiplexing of test signals to the respective dies of the printhead integrated circuit. The probe interface 18 additionally defines probe contacts 130 that engage similar contacts of the printhead integrated circuit on the carrier. The routing board 48 typically includes a board connector for connecting the controller board 50 and the adapter board 97, the routing board 48 having power circuits for supplying power to the controller and adapter boards 50 and 97, respectively. In essence, the adapter plate 97 includes adapter circuitry that is configured to engage the printhead integrated circuit to provide electrical and physical interfaces to the printhead integrated circuit. The probe interface 18, in turn, includes a pusher bar 98' for providing rigidity and mechanical support to the interface 18 of the controller board 50 during engagement of the interface 18 with the carrier on the carrier. The processor is assembled to produce a suitable The test signals of one of the group tests are as follows: a hair 1dd test, an Ipos test, a protective one-pole voltage critical test, a wire bonding continuity test, a leakage current test, and a signal input voltage critical test. , a signal output voltage test, and a functional vector test. -20- 201009365 The controller board 50 contains signal generation and test circuits, using a board 97 to form a tester board with a converter, or a reset board 95 shaped between the controller 50 and the adapter board 48. Board. The signal test circuit includes a reset board 915 for generating the reset signal required for the multiplexed print head product. The reset board 95 is assembled to pass the test and control signals between the probe 18 connector board 48 and the print head integrated circuit. FIG. 8 is an operational alignment diagram of the test stand 21, using the test electric φ pin 18 operation type. Keep the carrier. If the test probe 18 is not aligned with the carrier, an erroneous reading is produced. To ensure proper alignment, a temporary (indicated by 1 0 5) is inserted into the test station 16 to align the corresponding hole in the test probe] into the rod 9 or the positioning pin 1 〇 1, as shown. Also shown as the rod 9 8 and the test probe contact 〇 3 测试 ^ Test System Referring now to Figure 9, a system 100 for testing an integrated circuit using the tester 1 图示 is illustrated, as described above. Typically, system 100 packet 1 and remote monitoring system (RMS) 140 are as described above. System 100 includes a tester 10 that is configured to communicate with an RMS signal. One of the functional components of the tester 10 is illustrated in a schematic representation. The Ethernet switch 44 forms a communication hub that engages the various components of the tester 10 and RM S 1 40 as shown. < Tester 1 includes a PLC 72 having associated analog interface module 74 and network 70. The analog interface module 74 forms the interface between the PLC 72 and the screw 'These solenoid valves control the test bench 2 1's pneumatic adapter into the insertion and the body circuit routing with the 的 path of the probe, then the positioning tip [8] The derivation has a push head including test 140 to some of its main use for the road module spool valve assembly and the 21 - 201009365 shift mechanism 1 9, as described above. The network module 70 forms the network interface between the PLC 72 and the other components indicated in Figure 9. The remote monitoring system or RMS 140 forms a local computing device with communication through the Ethernet switch 44 to the computing device or RMS 140. link. As described above, the tester 10 includes a diagnostic probe assembly 513 that includes a test circuit operatively coupled to the computing device or RMS 140 via a communication link of the Ethernet switch 44. The test circuit of component 51 is assembled to produce a φ bulk circuit test signal to test the print head integrated circuit. The adapter board 97 includes an adapter circuit operatively coupled to the test circuit on the controller board 50, and the adapter circuit is assembled to provide a product through the probe 18 with the contactor 130 and the carrier. The body circuit is an electrical and physical interface, as described above. Routing board 48 includes routing circuitry interposed between test circuitry on controller board 50 and adapter circuitry on adapter board 48 to route test signals to respective integrated circuitry on the carrier. The pneumatic test stand 2 1 and the shifter φ 1 9 can be considered together as a processing mechanism 99 for holding and operating the carrier in which the integrated circuit is located. The PLC or controller 72 is operatively coupled to the mechanism, as described above, to control its operation. The PLC 72 is additionally connected to a communication device in the form of an Ethernet switch 44, managed by a computing device or RMS 1 40. It will be appreciated that the RMS or computing device 140 can be a PC having a graphical user interface for displaying the test results of the carrier printhead circuitry to an operator. Thus, the RMS or local communication device 140 is typically programmed to define a test server communication with the test circuit of the component 51 through the PLC 72. The RMS 140 performs remote monitoring of the tester. The bar code and test results of the various carriers tested by the tester 10 are sent to the RMS 1 40 as quality and warranty control. The RMS 140 is in turn capable of communicating with the PLC 72 to provide operational parameters and instructions for controlling the tester 10. Method of Testing a Carrier φ Figure 10 shows the possible method steps performed when testing the printhead integrated circuit on a carrier using the tester 10. It will be understood that reference to a reference number indicating a particular method step means the individual blocks indicated by the number in the figures. In terms of methods, the methods included in the present invention are not limited or limited to the specific methods referred to in this manner. Those skilled in the art will appreciate that other methods are possible under the invention that may remove some of these steps or include additional steps. In one embodiment, the method begins at block 160 where the operator prompts the PLC 72 to load the carrier into the test station 21 via the touch panel 14 (block 162). The PLC 72 in turn causes the operator to The clamp button on control panel 22 is operable (block 164). The operator can then load the carrier into the test 21 (block 166) and depress the clamp button to instruct the PLC 72 to actuate the clamp mechanism 117 to secure the carrier to the fixture 124. Once the carrier has been clamped, the PLC 72 can activate the barcode scanner 24 to scan the carrier barcode (blocks 170 and 172, respectively). If the PLC 72 successfully scans the bar code, the bar code is stored and sent to the RMS 140 as described in -23-201009365. Then, the PLC 72 enables the start button to operate 'to allow the test of the carrier to continue. If the barcode has a problem, the PLC 72 displays an error message via the touch panel 14 and also notifies the RMS 140. As described below, the test was not performed on the carrier. It is indicated by blocks 174, 176, 178, and 180. Assuming the barcode is successfully scanned, the operator continues to depress the start button as described above (block 182). The PLC 72 then actuates the shifting mechanism 19 to lift the test stand 21 and the carrier secured thereto to the probe 18 (block 184). The probe contacts the print head integrated circuit on the carrier so that testing can occur. Once the clamp of the test bench is in place (block 186), the PLC is ready (block 188) to execute the test routine (block 190). In one embodiment, the test routine typically includes software instructions loaded by the PLC 72. The RMS 140 in turn supplies such test routine software to the PLC 72 via the communication link 44. The PLC 72 displays a message "Test will begin" to the operator via the touch panel 14 (block 190). Once the test routine has been loaded by the PLC 72 Φ, the PLC 72 displays a message "Test is in progress" to the operator via the touch panel 14 (block 192). The touch panel PC 14 typically executes a software command to display a graphical user interface (GUI) to the operator. PLC 72 then performs a printhead test routine on block circuit via diagnostic component 51 (block 194), as described above. The test routine includes the controller board 50 generating test signals to perform any or all of the following electrical test types: a hair Idd test, an Ipos test, a protective diode voltage critical test, a wire bond continuity test, a drain Flow test, - signal transmission -24 - 201009365 Into the voltage critical test, a signal output voltage test, and a functional vector test. When the different tests are completed, the touch panel 14 displays the results to the operator via the GUI. The PLC 72 stores the results (block 198) and is also able to send the results to the RMS 140. When all tests are completed, the PLC stops testing as shown in block 200. When the test is completed, the PLC 72 lowers the test station 21 to a loading position that is not in contact with the probe 18 with the clamp 1 17 (block 0 202), and releases the clamp (block 204) to enable removal of the carrier. The GUI of touch panel 14 in turn displays the message to complete the test (block 196) and prompts the operator to load the next carrier (block 206). The operator removes the carrier (block 208) at the end of the test cycle (block 210). The method steps are repeated for the next vector. Circuit Diagram Figures 11 through 14 are circuit diagrams of the above controller components. 11 is an interconnection diagram between the network φ communication module 70, the Ethernet switch 44, the touch panel computer 14, and the barcode scanner 24. 12 is an interconnection diagram between the mains electrical insulation exchanger 64, the residual current circuit breaker 78, the light curtain power supply 68, the light curtain safety relay 66, the DC power supply 46, and the safety relay 76. As mentioned above, the safety relay 76 includes two safety relays 76.1 and 76.2, as indicated. Also indicates the location of the emergency stop and reset button. FIG. 13 shows a PLC 72 having an analog interface module 74. Figure 14 shows other pneumatic and button interconnection diagrams. An automatic exchanger 220 is illustrated, as described above, -25-201009365 is responsible for actuating the shifting assembly 19 in order to limit the travel of the shifting assembly 19 with the solenoid valve 2 2 2 . The solenoid valve 224 is responsible for actuating the clamp mechanism 117, as well as the start button 226 and the play button 234. Digital pressure sensor 230 illustrates system pneumatic pressure and indicates system pressure exchanger 232. Although the interconnections shown in the circuit diagrams of Figures 11 through 14 are not described in detail, it will be apparent to those skilled in the art. φ [Simplified Description of the Drawings] The preferred features, embodiments, and variations of the present invention will be apparent from the <RTIgt; </ RTI> <RTIgt; </ RTI> <RTIgt; The "embodiment" is not to be construed as limiting the scope of the "invention" of the present invention in any way. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a schematic diagram of a test apparatus or tester for testing a print head integrated circuit mounted on a carrier according to an embodiment of the present invention; BRIEF DESCRIPTION OF THE DRAWINGS FIG. 3 is a schematic diagram of a controller of the apparatus of FIG. 1. FIG. 4 is a diagnostic diagram of the tester of FIG. 1 according to an embodiment of the present invention. Figure 5 is a probe interface view of the assembly of Figure 4; Figure 6 is a side elevational view of the retention assembly of the support assembly for holding the carrier to the tester of Figure 1 in accordance with an embodiment of the present invention. Figure 7 is a top plan view of the retaining assembly of Figure 6; Figure 8 is a schematic view of the carrier held in the retaining assembly and test probe assembly of Figures 6 and 4, respectively; -26- 201009365 The example of the volume head prints the implementation of the Mingfa map. The plan is to use the map of the map of the map of the 槪9. According to the body root product, the test chart of the head print map tester Fig.
圖 ;路 圖電 路之 電件 之組 件全 組安 路和 網電 的的 置置 裝裝 之之 IX 圖圖 爲爲 1 2 1* 1A 圖 路 電 及之 •’ 件 圖組 路電 8 勺 ipir 之置 器裝 制連 控互 的件 置組 裝動 之氣 1 用 圖利 爲爲 3 4 ^1 明 說 號器 符試 件測 一兀 ...... 要101214 主 7890123468 1112222222 腦 電 板 示 面 顯 制 器器器 板件件針件 控件描示示 面組組探組 台者組掃指指 殻碰持撐試位幕試作面碼力力 機觸保支測移光測操桌條壓壓 -27- 201009365 3 0 :電腦介面 40 :線槽 42: 9V直流電電力供應器 44 :乙太網路交換器 46: 5V直流電電力供應器 48 :測試器和多工器板 48 :路由板 φ 5 0 :控制器板 5 1 :探針組件 60 :線槽 62 :軌道 64 :幹線電力隔離交換器 66:光幕安全繼電器 68 :光幕電力供應器 70 :網路通訊模組 φ 72 :控制器 74 :類比介面模組 76 :安全繼電器 7 6.1 :安全繼電器 76.2 :安全繼電器 78 :剩餘電流斷路器 8 0 :熔線 90 :支撐托架 91 :支撐組件 -28 201009365 9 2 :固定螺釘 95 :轉換器 97 :配接器板 98 :推進棒 99 :處理機構 1 0 〇 :系統 105 :暫時性定位梢 φ 1 1 〇 :氣動耦合 112:活塞和汽缸配置 1 1 4 :樞軸梢 1 1 6 :定位梢 1 1 7 :夾箝機構 1 1 8 :夾箝組件 120 :致動器耦合 122 :夾箝板 φ I23 :基座構件 124 :固定裝置 126 :按鈕頭蓋 1 3 0 :探針接點 1 4 0 :遠端監視系統Figure; The components of the circuit diagram circuit The components of the whole group of Anlu and the grid of the installation of the IX diagram is 1 2 1 * 1A diagram of the road and the ''piece diagram group of electricity 8 spoon ipir The device is installed with the control unit and the assembly of the gas 1 with the figure of 3 4 ^1 Ming said the test piece of the test piece ... to 101214 main 7890123468 1112222222 EEG board display器器板件件件件控制示面组组组组组组扫指指壳碰持试幕幕试面面力力机触保支测光光测操表压压-27 - 201009365 3 0 : Computer Interface 40: Trunking 42: 9V DC Power Supply 44: Ethernet Switch 46: 5V DC Power Supply 48: Tester and Multiplexer Board 48: Routing Board φ 5 0 : Controller board 5 1 : probe assembly 60 : trunking 62 : track 64 : mains power isolating exchanger 66 : light curtain safety relay 68 : light curtain power supply 70 : network communication module φ 72 : controller 74 : Analog Interface Module 76: Safety Relay 7 6.1: Safety Relay 76.2: Safety Relay 78: Residual Current Circuit Breaker 8 0 : Fuse 90: Support bracket 91: Support assembly -28 201009365 9 2 : Fixing screw 95: Converter 97: Adapter plate 98: Push rod 99: Processing mechanism 1 0 〇: System 105: Temporary positioning tip φ 1 1 〇: Pneumatic coupling 112: Piston and cylinder configuration 1 1 4 : Pivot tip 1 1 6 : Positioning tip 1 1 7 : Clamping mechanism 1 1 8 : Clamp assembly 120 : Actuator coupling 122 : Clamp plate φ I23: Base member 124: Fixing device 126: Button head cover 1 3 0 : Probe contact 1 4 0 : Remote monitoring system