TW201007920A - Memory package module - Google Patents

Memory package module Download PDF

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Publication number
TW201007920A
TW201007920A TW097130596A TW97130596A TW201007920A TW 201007920 A TW201007920 A TW 201007920A TW 097130596 A TW097130596 A TW 097130596A TW 97130596 A TW97130596 A TW 97130596A TW 201007920 A TW201007920 A TW 201007920A
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Taiwan
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module
memory
package structure
semiconductor package
module substrate
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TW097130596A
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Chinese (zh)
Inventor
Hong-Chi Yu
ke-wen Lu
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Walton Advanced Eng Inc
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    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32225Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/26Layer connectors, e.g. plate connectors, solder or adhesive layers; Manufacturing methods related thereto
    • H01L2224/31Structure, shape, material or disposition of the layer connectors after the connecting process
    • H01L2224/32Structure, shape, material or disposition of the layer connectors after the connecting process of an individual layer connector
    • H01L2224/321Disposition
    • H01L2224/32151Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/32221Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/32245Disposition the layer connector connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48225Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation
    • H01L2224/48227Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being non-metallic, e.g. insulating substrate with or without metallisation connecting the wire to a bond pad of the item
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/01Means for bonding being attached to, or being formed on, the surface to be connected, e.g. chip-to-package, die-attach, "first-level" interconnects; Manufacturing methods related thereto
    • H01L2224/42Wire connectors; Manufacturing methods related thereto
    • H01L2224/47Structure, shape, material or disposition of the wire connectors after the connecting process
    • H01L2224/48Structure, shape, material or disposition of the wire connectors after the connecting process of an individual wire connector
    • H01L2224/481Disposition
    • H01L2224/48151Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive
    • H01L2224/48221Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked
    • H01L2224/48245Connecting between a semiconductor or solid-state body and an item not being a semiconductor or solid-state body, e.g. chip-to-substrate, chip-to-passive the body and the item being stacked the item being metallic
    • H01L2224/4826Connecting between the body and an opposite side of the item with respect to the body
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73201Location after the connecting process on the same surface
    • H01L2224/73215Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L2224/00Indexing scheme for arrangements for connecting or disconnecting semiconductor or solid-state bodies and methods related thereto as covered by H01L24/00
    • H01L2224/73Means for bonding being of different types provided for in two or more of groups H01L2224/10, H01L2224/18, H01L2224/26, H01L2224/34, H01L2224/42, H01L2224/50, H01L2224/63, H01L2224/71
    • H01L2224/732Location after the connecting process
    • H01L2224/73251Location after the connecting process on different surfaces
    • H01L2224/73265Layer and wire connectors
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L24/00Arrangements for connecting or disconnecting semiconductor or solid-state bodies; Methods or apparatus related thereto
    • H01L24/73Means for bonding being of different types provided for in two or more of groups H01L24/10, H01L24/18, H01L24/26, H01L24/34, H01L24/42, H01L24/50, H01L24/63, H01L24/71

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Abstract

Disclosed is a memory package module, primarily comprising a first semiconductor package and a second semiconductor package. The manufacture of the first semiconductor package is Chip-On-Board packaging on an inner surface of a module substrate to deposit a controller chip and to form a molding compound. The module substrate has a plurality of external fingers on its outer surface. The second semiconductor package is mounted on the outer surface without capping the external fingers by SMT technology. Therein, the molding compound covers the entire inner surface of a module substrate to make the external fingers and the second semiconductor package be supported above the molding compound.

Description

201007920 九、發明說明: 【發明所屬之技術領域】201007920 IX. Description of invention: [Technical field to which the invention belongs]

本發明係有關於一種半薄雜壯 ^ . B 干导體裝置’特別係有關於一種記 憶體封裝模組。 【先前技術】 半導體記憶體裝置朝向微小化與容量持續擴大發展以 符口更同等級的儲存需求’例如可運用於usb隨身碟、記 ❹It卡與固態硬碟等等 而在每_世代的演進中,記憶體容量 的增加幾乎是以倍數增加的。以往的解決方法都是利用半導 體製程的精進產生更微小線徑與更高密度的龍電路,以使 得半導體晶片内記憶體容量倍增,也因此已封裝之半導體記 憶鱧裝置的模組基板須重作線路設計。在到下__世代的過渡 期間,一種已知可以增加記憶體容量但尚未改變半導體晶片 的5己憶體封裝模組便是在模組基板的上下表面更設置有一 記憶體封裝構造。 © 如美國專利第7,074,052號所揭示之記憶體封裝模 組’以表面接合(SMT)方式在模組基板的上下表面各結合有 一記憶體封裝構造,模組基板在其上表面之一側另設有複數 個外接指。同時,控制晶片亦設置於模組基板之上表面,故 兩個記憶體封裝構造與控制晶片皆承載於模組基板,模組基 板材質必須夠硬,否則易有彎翹變形的問題。除此之外,在 產品使用時’模組基板在設有外接指之一側須經得起重覆磨 擦與壓迫的使用狀況,故要有一具有支撐條的專用外殼卡合 方式結合模組基板並包覆記憶體封裝構造。這種卡合組合方 201007920 式在多次使用後也會有對不準的鬆脫問題。此外,模組基板 之下表面對應在外接指與控制晶片的位置係以外殼支撐無 法設置任何元件,造成空間浪費。 【發明内容】 、本發明之主要目的係在於提供—種記憶體封裝模組,可 以在封裝之後選擇是否加大記憶體容量。 本發明之次一目的係在於提供-種記憶體封裝模組,在 φ同-模組基板上可適詩封裝不同尺寸的記憶體晶片,故不 需要重新設計模組基板,並可降低背負庫存晶圓的風險。 本發明的目的及解決其技術問題是採用以下技術方 案來實現ι依據本發明之__種記憶體封裝模組,主要包 3第5己憶體封裝構造以及一第二記憶體封裝構造。該第 一記憶體封裝構造係包含__模組基板、—第—記憶體晶片以 及一第-封膠體,其中該模組基板係具有—内表面與一外表 面,該第-記憶體晶片係設置於該模組基板之該内表面並被 馨該第-封膠體所密封,該模組基板之該外表面係設有複數個 外接指。該第三記憶體封裝構造係表面接合於該模組基板之 該外表面但不覆蓋該些外接指H該第—封膠體係全面 包覆該模組基板之該内表面,以使該些外接指與該第二記憶 體封裝構造承載於該第一封膠體之上。 在上述記憶體封裝模組中,該第一記憶體封裝構造可更 包3控制甜片,其係設置於該模組基板之該内表面並被該 第一封膠體所密封。 在上述記憶體封裝模組中,該模組基板未被該第二記憶 201007920 體封裝構造覆蓋之部 可m & I位以及該第一封膠體之-對應部位係 二插碩部,其中該些外接指係位於該插頭部上。 部内在上述記憶體封裝模組中,該控制晶片係可位於該插頭 在上述記憶體封裝模組中 之USB金手指。 ’該些外接指係可為平行排列 ❹ ❹ 在上述記憶體封裝模組中,該模組基板位在該插頭部的 兩侧係可被該第一封膠體覆蓋。 在上述記憶體封裝模組中,該模組基板之該外表面係可 更設有複數個接合墊,並且該第二記憶體封裝構造係包含複 數個外接端子,其係結合於該些接合墊。 在上述把憶體封裝模組中,該些外接端子係可為導線架 之外引腳’並且該些接合塾係可呈雙排排列其排列方向係 與該些外接指之排列方向互為平行。 在上述記憶體封裝模組中,該第一記憶體封裝構造係可 為碑塊狀並具有相等且互為平行之第一側邊與第二側邊,該 些外接指係鄰近地平行排列於該第一側邊。 在上述記憶體封裝模組中,該第二記憶體封裝構造係具 有一寬度’稍大於該第一側邊之長度。 在上述記憶體封裝模組中,該第二記憶體封裝構造係可 包含一第一 §己憶體晶片與一第二封膠體。 在上述記憶體封裝模組中,該第二記憶鱧晶片之位置係 可與該第一記憶體晶片為縱向對應。 在上述記憶體封裝模組中,該模組基板之線路密度係可 201007920 大致集中在該内表面。 在上述記憶體封裝模組中 貼附在該模組基板之該内表面 該模組基板。 該第一記憶體晶片係可直接 並以複數個銲線電性連接至 在上述記憶趙封裝模組中’該第—半導體封裝構造内係 可缺乏任何記憶體晶片,並使該記憶體封裝模組所需要的記 憶體晶片集中封裝在第二半導體封裝構造内。 馨 ❹ 由乂上技術方案可以看出’本發明之記憶體封裝模 組’有以下優點與功效: 、利用模組基板整合^第-半導體封裝構造並以其封膠體 承載第二半導體封裝構造與模組基板之外接指,使得多 顆記憶鱧晶片分散在不同的記憶體封裝構造可以在封 震之後選擇是否以表面接合的方式加大記憶趙容量充 份運用模組基板的内外表面的面積。 利用多顆記憶體晶片 >散到能整合模組基板之第一半導 體封裝構造與可表面接合之第二半導體封裝構造,在同 -模組基板上可適用於封裝不同尺寸的記憶體晶片故 不需要重新設計模組基板’並可降低背負庫存晶圓的風 險0 、利用模組基板未被該第二半導體封㈣造覆蓋之部位以 及第-封勝體之-對應部位係可形成為一插頭部,在第 —封膠體的結構支撐下使得漁基板更㈣拔並且插 頌部的第一封膠體可密封其它晶片並為—體密封,有效 運用模組空間。 8 201007920 四、 利用模組基板之線路密度係可大致集中在其内表面以 避免線路受損。 五、 利时隔在不同封裝構造中的第一與第二記憶體晶片為 位置縱向對應,以使縮短模組基板之外接指至記憶體晶 片的走線長度差距。 9 六、 利用該第-半導體封裝構造内可缺之任冑第一記憶體晶 片,並將一 S己憶體封裝模組所需要的記憶體晶片集中封 ❹ 裝在第二半導體封裝構造内,其優點為無記憶體容量但 有控制功能之該第一半導體封裝構造與僅有記憶體容量 之第二半導體封裝構造可以分開製作,縮短記憶體封裝 模組在製作過程中使用記憶體晶片的生產周期,以提高 記憶體晶片的庫存周轉率0 【實施方式】 以下將配合所附圖示詳細說明本發明之具體實施 例,應注意的是,所附圖示為簡化之示意圖,僅用以示 © 意方式來說明本發明之基本架構或實施方法,故僅顯示 與本案有關之元件’其中所顯示之有關元件可非依照實 際實施之數目、形狀、尺寸比例緣製,某些尺寸比例與 其他相關尺寸比例可能被修飾放大或是簡化,以提供更 清楚的描述’實際實施之數目、形狀及尺寸比例為一種 選置性之設計,且詳細之元件佈局可能更為複雜。 依據本發明之一具體實施例,一種記憶體封裝模組舉例 說明於第1圖之截面示意圖與第2圖之俯視圖。該記憶體封 裝模組10主要包含一第一半導體封裝構造100以及一第二The present invention relates to a semi-thin composite. The B dry conductor device is particularly related to a memory package module. [Prior Art] The development of semiconductor memory devices towards miniaturization and capacity continues to grow at the same level of storage requirements as the 'susages, such as usb flash drives, record cards and solid state drives, etc. The increase in memory capacity is almost multiplied. In the past, the solution was to use a semiconductor process to produce a smaller diameter and a higher density of the dragon circuit, so that the memory capacity of the semiconductor chip was doubled, and thus the module substrate of the packaged semiconductor memory device had to be reworked. Line design. During the transition to the next __ generation, a five-replica package module known to increase the memory capacity but not yet change the semiconductor wafer is provided with a memory package structure on the upper and lower surfaces of the module substrate. The memory package module disclosed in US Pat. No. 7,074,052 has a memory package structure on the upper and lower surfaces of the module substrate by surface bonding (SMT), and the module substrate is provided on one side of the upper surface thereof. There are multiple external fingers. At the same time, the control chip is also disposed on the upper surface of the module substrate. Therefore, the two memory package structures and the control chip are all carried on the module substrate, and the material of the module substrate must be hard enough, otherwise the problem of bending deformation is easy. In addition, when the product is used, the module substrate must be subjected to repeated friction and compression on one side of the external finger. Therefore, a special housing with a support strip is required to be coupled with the module substrate. And covered with a memory package structure. This type of snap-in combination 201007920 will also have a problem of looseness after repeated use. In addition, the lower surface of the module substrate corresponding to the position of the external finger and the control wafer is not supported by the outer casing, so that space is wasted. SUMMARY OF THE INVENTION The main object of the present invention is to provide a memory package module that can select whether to increase the memory capacity after packaging. The second object of the present invention is to provide a memory package module, which can package different sizes of memory chips on the φ-module substrate, so that it is not necessary to redesign the module substrate and reduce the load-bearing inventory. Wafer risk. The object of the present invention and the technical problem thereof are to implement the following technical solutions to realize the memory package module according to the present invention, the main package 3, the fifth memory package structure and the second memory package structure. The first memory package structure includes a __module substrate, a first memory chip and a first sealant, wherein the module substrate has an inner surface and an outer surface, and the first memory chip system The inner surface of the module substrate is disposed on the inner surface of the module substrate and sealed by the first sealing body. The outer surface of the module substrate is provided with a plurality of external fingers. The third memory package structure is surface-bonded to the outer surface of the module substrate but does not cover the external fingers H. The first sealant system completely covers the inner surface of the module substrate to make the external contacts The second memory package structure is carried on the first encapsulant. In the above memory package module, the first memory package structure can further control the sweet sheet, which is disposed on the inner surface of the module substrate and sealed by the first gel. In the above memory package module, the module substrate is not covered by the second memory 201007920 body package structure, the m & I position and the corresponding portion of the first sealant are two plugged parts, wherein Some external fingerings are located on the plug portion. In the memory package module, the control chip can be located in the USB gold finger of the plug in the memory package module. The external fingerings may be arranged in parallel. In the memory package module, the module substrate is disposed on both sides of the plug portion to be covered by the first sealing body. In the above-mentioned memory package module, the outer surface of the module substrate may further include a plurality of bonding pads, and the second memory package structure includes a plurality of external terminals, which are coupled to the bonding pads. . In the above-mentioned memory module, the external terminals may be pins other than the lead frame, and the connecting wires may be arranged in a double row, and the arrangement direction thereof is parallel to the arrangement direction of the external fingers. . In the above memory package module, the first memory package structure may be in the shape of a block and have equal and parallel first and second sides, and the external fingers are adjacently arranged in parallel The first side. In the above memory package module, the second memory package structure has a width 'slightly larger than the length of the first side. In the above memory package module, the second memory package structure may include a first CMOS film and a second seal. In the above memory package module, the position of the second memory chip can be longitudinally corresponding to the first memory chip. In the above memory package module, the line density of the module substrate can be substantially concentrated on the inner surface of 201007920. The module substrate is attached to the inner surface of the module substrate in the memory package module. The first memory chip can be electrically connected directly to a plurality of bonding wires to the memory module package. The first semiconductor package structure can lack any memory chip, and the memory package module can be The memory chips required for the group are collectively packaged within the second semiconductor package structure. Xin❹ It can be seen from the above technical solution that the 'memory package module of the present invention has the following advantages and effects: using the module substrate to integrate the first-semiconductor package structure and carrying the second semiconductor package structure with the sealant The module substrate is externally connected, so that the plurality of memory chips are dispersed in different memory package structures. After the shock is sealed, whether the surface of the inner and outer surfaces of the module substrate can be fully increased by surface bonding is used. Using a plurality of memory chips> a first semiconductor package structure that can be integrated into the module substrate and a second semiconductor package structure that can be surface-bonded, and can be packaged on the same-module substrate for packaging different sizes of memory chips. There is no need to redesign the module substrate' and the risk of carrying the stock wafer is reduced. 0. The portion of the module substrate that is not covered by the second semiconductor package (4) and the corresponding portion of the first sealing body can be formed into one. The plug portion, under the structural support of the first sealing body, makes the fishing substrate more (four) and the first sealing body of the insertion portion can seal other wafers and seal the body, effectively utilizing the module space. 8 201007920 IV. The line density of the module substrate can be roughly concentrated on the inner surface to avoid line damage. 5. The first and second memory chips in different package configurations are longitudinally corresponding to each other so as to shorten the trace length difference between the module substrate and the memory chip. 9: utilizing the first memory chip which is indispensable in the first semiconductor package structure, and concentrating the memory chip required for the S-recovery package module in the second semiconductor package structure, The advantage is that the first semiconductor package structure having no memory capacity but having a control function can be separately fabricated from the second semiconductor package structure having only the memory capacity, and shortening the production of the memory package using the memory package module during the manufacturing process. The cycle is to increase the inventory turnover rate of the memory chip. [Embodiment] Hereinafter, the specific embodiment of the present invention will be described in detail with reference to the accompanying drawings. In order to explain the basic architecture or implementation method of the present invention, only the components related to the present invention are shown. The related components shown therein may not be in accordance with the actual number, shape, and size ratio, and some size ratios and The relevant size ratios may be modified or simplified to provide a clearer description of the actual implementation of the number, shape and size ratio It is an optional design and the detailed component layout can be more complicated. According to an embodiment of the present invention, a memory package module is illustrated in a cross-sectional view of Fig. 1 and a plan view of Fig. 2. The memory package module 10 mainly includes a first semiconductor package structure 100 and a second

參 置於該模組基板U〇之該内表面ln並被該第—封膠體 所密封此外,該s己憶體封裝模組1〇所需要的被動元件(圖 中未繪出)亦可設置於該模組基no之該内表® 1U並被 該第封膠體130所密封。在本實施例巾,該控制晶片14〇 係可直接貼附在該模組基板11〇之該内表面m,並以複數 個録線160電性連接至該模組基板no之複數個第二内接塾 201007920 半導體封裝構造200。第一 沪私继半導體封裝構造100與第二半導 體封裝構造200為不同的封奘 ^ φ β ^ 的封裝類型,該記憶體封裝模組10 需”記憶體晶片主要是封裝在第二半導趙封裝構造· 内,或疋分別封裝在第—半導體 封裝構造,其中_體封封裝广1(>°與第二半導體 a 5己隐體封裝模組10所需要的模組 =板m、控制晶片14〇與被動元件等更整合於該第一半導 强封裝構造100内。該第二半導體封裝構造的長度尺寸 稍小於該第-半導體封裝構造⑽的長度尺寸並表 該第-半導體封裝構造⑽上,以露出一插頭部。 如第1及6圖所示’該第一半導體封裝構造⑽係包含 s模、基;& 110、至少一控制晶片14〇以及一第一封膠體 130。該第-半導體封裝構㊣1〇〇係為板上晶片 (㈤P_〇n-B〇ard,C〇B)的封裝類型。其令該模組基板ιι〇係 具有一内表面m與-外表面112。在__具體實施例中,該 内表面111係如第3圖所示,該外表面112係如第4圖所示。 所稱之内表面111係為該模組基板11〇被該第一封膠體 所密封的表面;所稱之外表面112係為該模組基板no不被 該第封膠體130所密封的外露表面。該控制晶片14〇係設 201007920 116。在不同實施例中,該控制晶片14〇可為覆晶接合(圖中 未繪出更具體而言,除了部分數量或一半以上數量的記The inner surface ln of the module substrate U is mounted and sealed by the first sealing body. In addition, the passive components (not shown) required for the sufficiency package module 1 can also be set. The inner surface of the module base no. 1U is sealed by the first sealing body 130. In the embodiment of the present invention, the control chip 14 can be directly attached to the inner surface m of the module substrate 11 and electrically connected to the module substrate no by a plurality of recording lines 160. Inscribed 塾201007920 semiconductor package construction 200. First, the semiconductor package structure 100 and the second semiconductor package structure 200 are different package types, and the memory package module 10 requires the memory chip to be mainly packaged in the second semiconductor. The package structure is internally packaged or packaged in a first semiconductor package structure, wherein the package is widely used (>° and the module required for the second semiconductor a 5 hidden package module 10 = board m, control) The chip 14A is integrated with the passive component or the like in the first semiconductor package structure 100. The length of the second semiconductor package structure is slightly smaller than the length dimension of the first semiconductor package structure (10) and the first semiconductor package structure (10) Upper portion to expose a plug portion. As shown in FIGS. 1 and 6, the first semiconductor package structure (10) includes a s-die, a base, a & 110, at least one control wafer 14A, and a first sealant 130. The first semiconductor package is a package type of an on-wafer ((5) P_〇nB〇ard, C〇B). The module substrate has an inner surface m and an outer surface 112. In the specific embodiment, the inner surface 111 is like As shown in Fig. 3, the outer surface 112 is as shown in Fig. 4. The inner surface 111 is referred to as the surface of the module substrate 11 which is sealed by the first sealing body; The module substrate no is not exposed by the first sealing body 130. The control wafer 14 is provided with 201007920 116. In different embodiments, the control wafer 14 can be flip-chip bonded (not shown in the figure) More specifically, except for a partial number or more than half of the number

憶體晶片之外,該第一半導體封裝構造1〇〇已包含有μ &呢 體封裝模組10基本上所需要的主被動元件,使得在未接合 該第二半導體封裝構造2〇〇之前,該第一半導體封裝構造 100便可發揮記憶體儲存的主動功能。該第一半導體封裝構 造100可更包含至少一第一記憶體晶片120,該第一記憶體 晶片120係設置於該模組基板11〇之該内表面1U並被該第 一封膠體130所密封。通常該第一記憶體晶片12〇係為快閃 記憶體或其它非揮發性記憶體。在本實施例中該第一記憶 體晶片120係可直接貼附在該模組基板11〇之該内表面 111 ’並以複數個銲線150電性連接至該模組基板11〇之複 數個第-内接墊115。在不同實施例中,該第一記憶體晶片 120亦可為覆晶接合(圖中未緣出),或為多晶片堆眷。舉例 如下β該第|導體封裝構造1〇〇包含有該第一記憶體晶 片120時|單使用該第—半導體封裝構造⑽便可正常運 作並具有某-記憶體儲存容量(例如咖或皿等等當接 合上該第二半導體封裝構造跡該記憶體封裝模組10便具 有兩倍或以上的記憶體儲存容量(例如勘或偏等等),故 可以在封裝之後選擇是否以志 禪疋否以表面接合的方式加大記憶醴容 量,充份運用該模組基板UG的内外表面的面積。 該模組基板U0之該外表自112係設有複數個外接指 113。該些外接指113係作為該記憶體封裝模㈣的對外端 子,通常是集中排列在該外表面112之某―特定#卜該模組 11 201007920 基板110並應具有該記憶體封裝模組1〇所需要的線路結 構,以使該些外接指113可電性導接至該些記憶體晶片^0 與220。此外’該第二半導體封裝構造2〇〇係表面接合於該 模組基板no之該外表面112但不覆蓋該些外接指ιΐ3。'前 述表面接合方法可利用銲料300或其它電性導接元' 更具體地’ h第4圖所示,該模組基板11〇之該外表面In addition to the memory chip, the first semiconductor package structure 1 〇〇 already includes the active and passive components substantially required by the μ & body package module 10, such that before the second semiconductor package structure is bonded The first semiconductor package structure 100 can perform an active function of memory storage. The first semiconductor package structure 100 further includes at least one first memory chip 120 disposed on the inner surface 1U of the module substrate 11 and sealed by the first sealing body 130. . Typically, the first memory chip 12 is a flash memory or other non-volatile memory. In this embodiment, the first memory chip 120 can be directly attached to the inner surface 111 ′ of the module substrate 11 , and electrically connected to the module substrate 11 by a plurality of bonding wires 150 . First-inner pad 115. In various embodiments, the first memory wafer 120 can also be a flip chip bond (not shown) or a multi-wafer stack. For example, when the first memory chip 120 includes the first memory chip 120, the first semiconductor package structure (10) can be normally operated and has a certain memory storage capacity (for example, a coffee or a dish). When the memory package module 10 has twice or more memory storage capacity (such as a survey or a bias), the package may be selected after the package. The memory capacity is increased by surface bonding, and the area of the inner and outer surfaces of the module substrate UG is fully utilized. The outer surface of the module substrate U0 is provided with a plurality of external fingers 113 from the 112 system. The external terminals of the memory package module (4) are generally arranged in a certain order on the outer surface 112. The module 11 201007920 substrate 110 should have the line structure required for the memory package module 1 . So that the external fingers 113 can be electrically connected to the memory chips ^0 and 220. Further, the second semiconductor package structure 2 is bonded to the outer surface 112 of the module substrate no but not cover Refers to the plurality of external ιΐ3. 'Engages the front surface of said methods may utilize a solder 300 or other electrically conductive connection element' More specifically 'h shown in FIG. 4, the outer surface of the module substrate 11〇

112係可更設有複數個接合墊114,與該些外接指I〗〗在同 一表面但位於不同的區域。並且,如第2及5圖所示,該第 二半導體封裝㈣200係、包含複數個外接端+ 21〇其係可 經由銲料则結合於該些接合墊114。該些外接端子2'1〇、係 可為-導線架之外5丨腳’或可選自於基板的連接塾或鲜球等 等。該第二半導體封裝構造2〇〇係可包含該第二記憶體晶片 220與一第二封膠體23〇。較佳地,該第二記憶體晶片⑽ 之位置係可與該第一記憶體晶片12〇為縱向對應以使縮短The 112 series may further include a plurality of bonding pads 114 on the same surface as the external fingers but in different regions. Further, as shown in Figs. 2 and 5, the second semiconductor package (four) 200 series including a plurality of external terminals + 21 结合 can be bonded to the bonding pads 114 via solder. The external terminals 2'1" may be - 5 feet outside the lead frame or may be selected from a connection port of a substrate or a fresh ball or the like. The second semiconductor package structure 2 can include the second memory chip 220 and a second encapsulant 23A. Preferably, the position of the second memory chip (10) is longitudinally corresponding to the first memory chip 12 以 to shorten

該模組基& 11G之該些外接指113至該些記憶體晶片12〇與 220的走線長度差距。在本實施例中,如第2與$圖所示, 該第二半導體封裝構造200係為薄小尺寸外觀封裝構造 (TSOP’ Thin Small Outline Package),連接該些外接端子 之導線架内引腳係贴附於該第二記憶體晶片22〇之一主動 面,並利用複數個銲線240電性連接該第二記憶體晶片22〇 之複數個銲墊221與導線架内引腳,進而電性連接至該些外 接鈿子210。但非限定地,該第二半導體封裝構造2⑽亦可 選自於球格陣列封裝構造(BGA package)、平面陣列封裝 構造(LGA package)、小尺寸外觀無外接腳封裝構造 12 201007920 (SON package)、四方扁平無外接腳封裝構造(qfn package)與凸塊晶片載體封裝構造(BCc package,Bump Chip Carrier package)等半導體封裝構造之其中之一。 ❹ 並且,該第一封膠體130係全面包覆該模組基板ιι〇之 該内表面111,以使該些外接指113與該第二半導體封裝構 造200承載於該第一封膠體130之上(如第i圖所示卜在此 所稱之「承載」係指無論是產品使用或是表面接合過程中施 加於該些外接指Π3與該第二半導體封裝構造2〇〇的力量都 會經由該模組基板110傳導到該第一封膠體13〇,以避免該 模組基板110單獨受力。該第一封膠體13〇係可為一模封化 合物(EMC)’具有良好的硬度、電絕緣性與包覆性,可使該 些外接指H3與該第二半導體封裝構造2〇〇得到良好的2 撐’不需要另行設計具有支撐條的專用外殼也不會有對不準 的鬆脫問題’故在該第二半導體封裝構造2⑽之表面接合過 程中或是產品使用上不會有f鍾與變形的問題。通常合計該 第-封膠體m與該模組基板11()的總厚度約為1 3_ j 提供良好的強度支持。而該第二半導體封裝構造200在表面 接合之後包含該第-半導體封襄構造⑽之厚度(即該記憶 體封裝模組之厚度則2.6mme此外,較佳地該第一封 ㈣㈣些外接指113的下方可密封其它元件例 如控制晶片U0’以有效運用該記憶體封裝模組心有限空 間。 二 因此,利用控制晶片140與至少—記憶體晶片22〇 到能整合該模組基板110之第一半導體封裝構造ι〇〇與可表 13 201007920 σ之第二半導雜封裝構造細。第—半導體封裝構造· 半導體封裝構造的尺寸可為Μ並模組化,在同 -模組基板m上可適用於封裝不同尺寸的記憶體晶片故 不需要重新設計模組基板,並可降低背負庫存晶圓的風險。 夺本實施例中,該模組基板11G未被該第二半導體封裝 構造200覆蓋之部位以及該第—封膠體⑽之—對應部位係 jr形成為-插頭部1G1,其中該些外接指ιΐ3係位於該插頭 部1〇1上。在該第一封膠體130的結構支撐下使得該模組基 板no更耐插拔,並且位在該插頭部101㈣一封膠體13〇 可密封其它晶片並為-體密封,有效運用模組空間。較佳 地,該控制晶片140係可位於該插頭部1〇1内以被該第一 封膠體130密封,可以縮短該控制晶片140與該些外接指⑴ 的電性傳遞路徑並有效運用該第—封膠體13G之内部空間。 參 在t實施例中’該些外接指113係可為平行排列之刪金 手指(如第2圖所示),以作為溝通介面使用,以使該記憶體 封裝模組U)成為-内含有不同封裝方式㈣記隨之刪 隨身碟。 較佳地’如第2圖所示’該模組基板m位在該插頭部 101的兩侧係可與該第一封膠體130之侧面切齊以使製程 中該模組基板110可多個矩陣列排列在一基板條中以模封 陣列封裝(MAP,Mold Array Packaging)方式形成一大尺寸之 封膠塊並單離化切割出包含該第一封膠體13〇與該模組基板 110之結合物。 在一較佳實施例中,如第3圖所示,該模組基板11〇所 201007920The distance between the external fingers 113 of the module base & 11G to the memory chips 12 and 220 is different. In the present embodiment, as shown in FIGS. 2 and #, the second semiconductor package structure 200 is a TSOP' Thin Small Outline Package, and the lead pins of the lead terminals are connected to the external terminals. Attached to one of the active surfaces of the second memory chip 22, and electrically connected to the plurality of pads 221 of the second memory chip 22 and the leads of the lead frame by a plurality of bonding wires 240, thereby electrically Sexually connected to the external dice 210. However, the second semiconductor package structure 2 (10) may also be selected from a BGA package, a LGA package, and a small-sized appearance without an external package structure. 12 201007920 (SON package) One of the semiconductor package structures such as a quartet flat package and a bump package carrier structure (BCc package, Bump Chip Carrier package). The first encapsulant 130 completely covers the inner surface 111 of the module substrate, so that the external fingers 113 and the second semiconductor package structure 200 are carried on the first encapsulant 130. (As referred to in Figure ii, "bearing" as used herein means that the force applied to the external finger 3 and the second semiconductor package structure 2 during the use of the product or during the surface bonding process is passed through The module substrate 110 is conducted to the first encapsulant 13〇 to prevent the module substrate 110 from being separately stressed. The first encapsulant 13 can be a molding compound (EMC) with good hardness and electrical insulation. And the covering property can make the external finger H3 and the second semiconductor package structure 2 〇〇 get a good 2 ′′. There is no need to separately design a special outer casing with a support strip, and there is no problem of looseness. Therefore, there is no problem of f clock and deformation during the surface bonding process of the second semiconductor package structure 2 (10) or the use of the product. Generally, the total thickness of the first sealing body m and the module substrate 11 () is approximately Provides good strength support for 1 3_ j. The second semiconductor package structure 200 includes the thickness of the first semiconductor package structure (10) after surface bonding (that is, the thickness of the memory package module is 2.6 mme. Further, preferably the first cover (four) (four) of the external fingers 113 The other components, such as the control wafer U0', can be sealed to effectively utilize the limited space of the memory package module. Second, the control wafer 140 and at least the memory chip 22 are used to reach the first semiconductor capable of integrating the module substrate 110. Package structure 〇〇 〇〇 可 13 201007920 σ second semi-conductive package structure is fine. - semiconductor package structure · semiconductor package structure size can be modularized, applicable on the same - module substrate m In order to package the memory chips of different sizes, it is not necessary to redesign the module substrate, and the risk of carrying the stock wafer is reduced. In the embodiment, the module substrate 11G is not covered by the second semiconductor package structure 200. And the corresponding portion jr of the first sealing body (10) is formed as a plug portion 1G1, wherein the external fingers ι 3 are located on the plug portion 1〇1. In the first sealing body 1 The structural support of 30 makes the module substrate no more pluggable, and the gel portion 13 located in the plug portion 101 (4) can seal other wafers and be sealed, effectively using the module space. Preferably, the control The wafer 140 can be located in the plug portion 1〇1 to be sealed by the first sealing body 130, and can shorten the electrical transmission path of the control chip 140 and the external fingers (1) and effectively utilize the inside of the first sealing body 13G. In the embodiment t, the external fingers 113 can be parallel-arranged gold fingers (as shown in FIG. 2) for use as a communication interface, so that the memory package module U) becomes - There are different packaging methods (4) and the following is deleted. Preferably, as shown in FIG. 2, the module substrate m is cut on both sides of the plug portion 101 and can be cut from the side of the first sealing body 130. The module substrate 110 can be arranged in a plurality of matrix rows in a substrate strip to form a large-sized sealant in a matrix array package (MAP, Mold Array Packaging). The first colloid 13〇 is combined with the module substrate 110 Things. In a preferred embodiment, as shown in FIG. 3, the module substrate 11 is replaced by 201007920

參 需要的線路117中多數形成於該内表面m,故該模組基板 11〇之線路密度係可大致集中在該内表面ill。在該第一封 膠體130的覆蓋保護下可以避免該模組基板丨丨〇之線路受 損。此外’部分的線路117係連接該些第一内接墊115或第 二内接墊116至對應導通孔118,並可電性連接至該些外接 指113或該些接合墊114。因此,利用該模組基板11〇的線 路結構,可使該些外接指113先電性連接至該控制晶片 140,再電性連接至不同封裝類型之該第一記憶體晶片12〇 與該第-一 s己憶體晶片220,具有實用性。 在本實施例中之更細部具體說明中,由於該第二半導體 封裝構造200之該些外接端子21〇係可為導線架之外引腳, 會超出該第二封膠體230之其中兩側邊(如第5圖所示),如 不考慮在該第-半導體封裝構造1〇〇上的表面接合關係會 導致該第-半導體封裝構造100在有限寬度下無法承載該第 二半導體封裝構造2GG。故較佳地’如第4圖所示,該些接 合墊m係可呈雙排排歹,卜其#列方向係與該些外接指 之排列方向互為平行。當該第二半導體封裝構造2〇〇之寬度 略大於或等於該第一半導體封裝構造1〇〇,該些外接端子 仍可結合於該些接合墊114,以使該第二半導體封裝構造鳩 有效承載於寬度受限之該第一半導體封裝構造⑽。 更具體而言’該第—半導體封裝構造1GG之所以需要寬 度受限,是基於其上設有該些外接指113之該第—插頭部 ⑻(例如USB插頭)有固定的規格限制並希望可以達到微小 化與容易單體化切割之功效。較佳地,如第^2圖所示, 15 .201007920 該第一半導體封裝構造100係可為磚塊狀並具有相等且互為 平行之第一側邊102與第二侧邊1〇3,該些外接指ιΐ3係鄰 近地平行排列於該第一側邊102。在此一較佳結構之製造 中,可以在大面積模封之後以直線鋸切方式得到該第一半導 體封裝構造100。在本實施例中,第一侧邊1〇2之長度與第 一側邊103之長度各約在12 3mm。尤佳地,利用上述的該 些接合墊114的排列方式與該第一半導體封裝構造1〇〇的形 〇 狀特徵,該第二半導體封裝構造200係具有一寬度201,稍 大於該第一側邊102之長度,與該寬度2〇1平行向的侧邊排 列有該些該些外接端子21G,即使如此亦能有效地被厚度受 限之該第一半導體封裝構造1〇〇所承載(如第2圖所示)。在 本實施例中,該寬度2〇1約在12.4mm。因此,該第二半導 體封裝構造200係可以採用固定封裝規格,例如Ts〇p48或 ts〇P5“縱上所述,在此一較佳結構中,本發明可以使Ts〇p 封裝規格之第二半導醴封裝構造2〇〇承載在寬度受限並以 0 COB封裝之碑塊狀第一半導體封裝構㉟1〇〇,第—半導體封 裝構造1〇〇所露出該第一插頭部101恰可符合腦插頭的 規格(如第!及2圖所示)並可封裝如控制晶片14〇等元件, 充份運用該模組基板110之有限空間達到微小化與模组化, 深具實用價值。此外,該第一半導體封裝構S⑽可直接出 貨(如第6圖所示)’由模組廠選擇是否再表面接合第二半導 體封裝構造200,在同-規格尺寸下,未表面接合第二半導 體封裝構造200可提供-特定記憶體容量的記憶體封装模 組。當表面接合第二半導體封裝構造2〇〇之後便可提供記憶 16 201007920 髏容量擴充的記憶體封裝模組。 在另—應用場合中,該第一半導體封裝構造1〇〇内可缺 乏任何第一記憶體晶片12〇,可以將該記憶體封裝模組1〇 所需要的記憶體晶片集中封裝在第二半導體封裝構造2〇〇 内,其優點為無記憶體容量但有控制功能之該第一半導體封 裝構造100可以預先製作完成,又僅有記憶體容量之第二半 導體封裝構造200能規格化大量生產,這樣的好處是由於記 φ 憶體晶片的價格波動相當的大,可以等待價格較佳的機會以 表面接合方式便可大量製造產生,縮短該記憶體封裝模組⑺ 製作過程中使用記憶體晶片的生產周帛,也就是說,記憶體 晶片由晶圓狀態到記憶體封裝模組的製作過程中有—段製 造Τ程(即該第一半導體封裝構造1〇〇的製造)是不需要記憶 體晶片的加入,故可以提高記憶體晶片的庫存周轉率,減少 待製庫存數。 以上所述,僅是本發明的較佳實施例而已,並非對本發 明作任何形式上的限制’本發明技術方案範圍當依所附申請 範圍為準。任何熟悉本專業的技術人員可利用上述揭示 的技術内容作出些許更動或修飾賤化的等效實施 例但凡疋未脫離本發明技術方案的内容,依據本發明的技 術實質對以上實施例所作的任何簡單修改、等同變化與修 飾,均仍屬於本發明技術方案的範圍内。 【圖式簡單說明】 圖依據本發明之一具體實施{列,一帛記憶體封裝模組 之截面示意圖。 17 201007920 第2圖:依據本發明之一具體實施例,該記憶體封裝模組之 俯視圖。 第3圖:依據本發明之一具體實施例,該記憶體封裝模組之 模組基板之内表面示意圖》 第4圓:依據本發明之一具體實施例,該記憶體封装模組之 模組基板之外表面示意圖。Most of the required lines 117 are formed on the inner surface m, so that the line density of the module substrate 11 can be substantially concentrated on the inner surface ill. Under the cover protection of the first sealing body 130, the circuit of the module substrate can be prevented from being damaged. In addition, the portion of the line 117 is connected to the first inner pad 115 or the second inner pad 116 to the corresponding via hole 118, and is electrically connected to the external fingers 113 or the bonding pads 114. Therefore, by using the circuit structure of the module substrate 11 , the external fingers 113 can be electrically connected to the control chip 140 first, and then electrically connected to the first memory chip 12 and the different package types. - A s memory wafer 220, which has practicality. In the detailed description of the second embodiment, the external terminals 21 of the second semiconductor package structure 200 may be pins other than the lead frame, and may extend beyond the two sides of the second sealing body 230. (As shown in FIG. 5), if the surface bonding relationship on the first semiconductor package structure 1 is not considered, the first semiconductor package structure 100 cannot carry the second semiconductor package structure 2GG with a limited width. Therefore, as shown in Fig. 4, the mats m can be arranged in a double row, and the direction of the column and the direction of arrangement of the external fingers are parallel to each other. When the width of the second semiconductor package structure 2 is slightly greater than or equal to the first semiconductor package structure 1 , the external terminals can still be bonded to the bonding pads 114 to make the second semiconductor package structure effective. The first semiconductor package structure (10) is limited in width. More specifically, the reason why the first semiconductor package structure 1GG requires a limited width is based on the fact that the first plug portion (8) (for example, a USB plug) on which the external fingers 113 are provided has a fixed specification limit and is expected to be It achieves the effect of miniaturization and easy singulation. Preferably, as shown in FIG. 2, the first semiconductor package structure 100 may be brick-shaped and have equal and parallel first sides 102 and second sides 1〇3, The external fingers ι 3 are arranged adjacent to each other in parallel to the first side 102. In the fabrication of this preferred structure, the first semiconductor package structure 100 can be obtained by straight sawing after extensive area camination. In the present embodiment, the length of the first side 1〇2 and the length of the first side 103 are each about 12 3 mm. More preferably, the second semiconductor package structure 200 has a width 201 slightly larger than the first side by using the above-mentioned arrangement of the bonding pads 114 and the shape of the first semiconductor package structure 1 . The length of the side 102, the side terminals parallel to the width 2〇1 are arranged with the external terminals 21G, and even if so, can be effectively carried by the first semiconductor package structure 1厚度 with limited thickness (such as 2 is shown). In the present embodiment, the width 2 〇 1 is about 12.4 mm. Therefore, the second semiconductor package structure 200 can adopt a fixed package specification, such as Ts〇p48 or ts〇P5. In the preferred structure, the present invention can make the Ts〇p package specification second. The semi-conducting package structure 2 is carried by a first semiconductor package 351 of a monumental shape with a width limited and encapsulated in 0 COB, and the first plug portion 101 is exposed by the first semiconductor package structure 1 The specifications of the brain plug (as shown in Figures ! and 2) can be packaged, such as the control chip 14 ,, and the use of the limited space of the module substrate 110 to achieve miniaturization and modularization, and has practical value. The first semiconductor package S(10) can be directly shipped (as shown in FIG. 6). 'The module factory selects whether to surface-bond the second semiconductor package structure 200, and the second semiconductor is not surface-bonded in the same-size. The package structure 200 can provide a memory package module with a specific memory capacity. When the surface is bonded to the second semiconductor package structure 2, the memory package module of the memory 16 201007920 髅 capacity expansion can be provided. In the first semiconductor package structure, the first memory chip 12 缺乏 can be lacking, and the memory chip required for the memory package module 1 can be collectively packaged in the second semiconductor package structure 2 . In the case, the first semiconductor package structure 100 having no memory capacity but having a control function can be pre-fabricated, and the second semiconductor package structure 200 having only the memory capacity can be standardized and mass-produced. Because the price fluctuation of the φ memory chip is quite large, it can wait for the price to be better. It can be mass-produced by surface bonding, shortening the production cycle of the memory chip using the memory package module (7). That is to say, in the process of fabricating the memory chip from the wafer state to the memory package module, the manufacturing process of the first semiconductor package structure (ie, the fabrication of the first semiconductor package structure) does not require the addition of a memory chip. Therefore, it is possible to increase the inventory turnover rate of the memory chip and reduce the number of stocks to be manufactured. As described above, it is only a preferred embodiment of the present invention. The present invention is not limited to the scope of the invention. The scope of the present invention is subject to the scope of the appended claims. Any one skilled in the art can make a few modifications or modifications using the technical contents disclosed above. Any simple modifications, equivalent changes and modifications made to the above embodiments in accordance with the technical spirit of the present invention are still within the scope of the technical solutions of the present invention. A cross-sectional view of a memory package module according to one embodiment of the present invention. 17 201007920 FIG. 2 is a top view of the memory package module according to an embodiment of the present invention. According to an embodiment of the present invention, a schematic diagram of an inner surface of a module substrate of the memory package module: a fourth circle: an external surface of the module substrate of the memory package module according to an embodiment of the present invention .

第5圖:依據本發明之一具體實施例,該記憶體封裝模組之 第二半導體封裝構造之俯視圖。 第6圖:依據本發明之一具體實施例,該記憶體封裝模組之 第一半導體封裝構造之截面示意圖。 【主要元件符號說明】 101插頭部 112外表面 115第一内接墊 118導通孔 121銲墊 150銲線 10記憶體封裝模組 100第一半導體封裝構造 102第一侧邊 103第二侧邊 110模組基板 111内表面 113外接指 114接合墊 116第二内接墊117線路 120第一記憶體晶片 13〇第一封膠體140控制晶片 160銲線 200 210 230 201寬度 體晶片221銲墊 第二半導體封裴構造 外接端子 220第二記憶 第二封膠體 240銲線 300銲料 18Figure 5 is a top plan view of a second semiconductor package structure of the memory package module in accordance with an embodiment of the present invention. Figure 6 is a cross-sectional view showing a first semiconductor package structure of the memory package module in accordance with an embodiment of the present invention. [Main component symbol description] 101 plug portion 112 outer surface 115 first inner pad 118 via hole 121 pad 150 wire bond 10 memory package module 100 first semiconductor package structure 102 first side 103 second side 110 Module substrate 111 inner surface 113 external finger 114 bonding pad 116 second inner pad 117 line 120 first memory chip 13 〇 first encapsulant 140 control wafer 160 bonding wire 200 210 230 201 width body wafer 221 pad second Semiconductor sealing structure external terminal 220 second memory second sealing body 240 bonding wire 300 solder 18

Claims (1)

201007920 十、申請專利範面: 1、一種記憶體封裝模組,包含: 第半導體封裝構造,包含一模組基板、至少一控制 晶片以及一第一封膠體,其中該模組基板係具有一内表 面與-外表面’該控制晶片係設置於該模組基板之該内 表面並被該第一封膠體所密冑,該帛組基板之該外表面 係設有複數個外接指;以及 ❹ —第二半導體封裝構造’係表面接合於該模組基板之該 外表面但不覆蓋該些外接指; 丨中’該第-封膠體係全面包覆該模組基板之該内表 面以使該些外接指與該第二半導體封裝構造承載於該 第一封膠體之上。 2'如申請專利範圍第i項所述之記憶體封裝模組其中 該第-半導體封裝構造更包含至少一第一記憶體晶片, 其係設置於該模組基板之該内表面並被該第一封膠體所 ❹ 密封。 3、 如申請專利範圍第i項所述之記憶體封裝模組,其中 肖模組基板未被該第二半導體封裝構造覆蓋之部位以及 該第一封膠體之一對應部位係形成為一插頭部其中該 些外接指係位於該插頭部上。 4、 如申請專利範圍第3項所述之記憶體封裝模組,其中 該控制晶片係位於該插頭部_内。 5、 如申請專利範圍第3項所述之記憶體封裝模組,其中 該些外接指係為平行排列之USB金手指。 、 19 201007920 6、 如申請專利範圍第3項所述之記憶體封裝模組其中 該模組基板位在該插頭部的兩侧係與該第一封膠體之侧 面切齊。 7、 如申請專利範圍第1項所述之記憶體封裝模組,其中 該模組基板之該外表面係更設有複數個接合墊並且該 第二半導體封裝構造係包含複數個外接端子,其係結合 於該些接合墊。 瘳 8、如申請專利範圍第7項所述之記憶體封裝模組,其中 該些外接端子係為導線架之外引腳,並且該些接合墊係 呈雙排排列,其排列方向係與該些外接指之排列方向互 為平行。 9如申研專利範圍第1或8項所述之記憶艘封裝模組, 其中該第一半導體封裝構造係為磚塊狀並具有相等且互 為平行之第-側邊與第二側彡,該些外接指係鄰近地平 行排列於該第一側邊。 〇 1G &中請專利範圍第9項所述之記憶體封裝模組,其中 該第二半導體封裝構造係具有—寬度,稍大於該第—側 邊之長度。 11如申請專利範圍第7項所述之記憶體封裝模組,其中 該第二半導體封裝構造係包含至少一第二記憶體晶片與 一第二封膠體。 12如申請專利範圍第2項所述之記憶體封裝模組,其中 該第一半導體封裝構造係包含至少一第二記憶體晶片與 第一封膠體’該第二記憶體晶片之位置係與該第—記 20 201007920 憶體晶片為縱向對應。 13、 如申请專利範圍第1項所述之記憶體封裝模組,其中 該模組基板之線路密度係大致集中在該内表面。 14、 如申請專利範圍第2項所述之記憶體封裝模組,其中 該第一記憶體晶片係直接貼附在該模組基板之該内表 面,並以複數個銲線電性連接至該模組基板。 15、 如申請專利範圍第丨項所述之記憶體封裝模組,其中 ❹ 該第二半導體封裝構造係為一薄小尺寸外觀封裝構造 (TSOP)。 16、 如申請專利範圍第1項所述之記憶體封裝模組,其中 該第二半導體封裝構造係選自於球格陣列封裝構造 (BGA package)、平面陣列封裝構造(L(3A package)、 小尺寸外觀無外接腳封裝構造(s〇N package)、四方 扁平無外接腳封裝構造(QFN package)與凸塊晶片 載體封裝構造(BCC package)之其中之一。 ® 17、如中請專利脑第1項所述之記憶體封裝模組,其中 該第一半導體封裝構造内係缺乏任何記憶體晶片,並使 該記憶體封裝模組所需要的記憶體晶片集中封裝在第二 半導體封裝構造内。 18、一種記憶體封裝模組之第一半導體封裝構造,包含 一模組基板、至少一控制晶片以及一第一封膠體其中 該模組基板係具有一内表面與一外表面,該控制晶片係 叹置於該模組基板之該内表面並被該第一封膠鱧所密 封,該模組基板之該外表面係設有複數個外接指並可供 21 201007920 表面接合—第二半導體封裝構造。 19、如申凊專利範圍第“項所述之記憶體封裝模組之第 半導體封裝構造,另包含至少一第一記憶體晶片,其 係权置於該模組基板之該内表面並被該第一封膠體所密 封。 2〇如申凊專利範圍第1 8項所述之記憶體封裝模組之第 半導體封裝構造,其中該模組基板在未被該第二半導201007920 X. Patent application: 1. A memory package module comprising: a semiconductor package structure comprising a module substrate, at least one control chip, and a first encapsulant, wherein the module substrate has an inner The surface and the outer surface are disposed on the inner surface of the module substrate and are sealed by the first sealing body. The outer surface of the group substrate is provided with a plurality of external fingers; The second semiconductor package structure is bonded to the outer surface of the module substrate but does not cover the external fingers; the first capping system completely covers the inner surface of the module substrate to make the The external finger and the second semiconductor package structure are carried on the first encapsulant. The memory package module of claim 1, wherein the first semiconductor package structure further comprises at least one first memory chip disposed on the inner surface of the module substrate and configured by the first A gel is sealed. 3. The memory package module of claim 1, wherein the portion of the stencil module that is not covered by the second semiconductor package structure and the corresponding portion of the first sealant are formed as a plug portion The external fingers are located on the plug portion. 4. The memory package module of claim 3, wherein the control chip is located in the plug portion. 5. The memory package module of claim 3, wherein the external fingers are parallel gold fingers. The memory package module of claim 3, wherein the module substrate is located on both sides of the plug portion and is flush with the side surface of the first sealant. 7. The memory package module of claim 1, wherein the outer surface of the module substrate is further provided with a plurality of bonding pads, and the second semiconductor package structure comprises a plurality of external terminals, It is bonded to the bonding pads. The memory package module of claim 7, wherein the external terminals are pins outside the lead frame, and the bonding pads are arranged in a double row, and the arrangement direction is The alignment directions of the external fingers are parallel to each other. The memory module module of claim 1, wherein the first semiconductor package structure is brick-shaped and has equal and parallel sides-side and second side 彡, The external fingers are arranged adjacent to each other in parallel on the first side. The memory package module of claim 9, wherein the second semiconductor package structure has a width that is slightly larger than a length of the first side. The memory package module of claim 7, wherein the second semiconductor package structure comprises at least a second memory chip and a second seal. The memory package module of claim 2, wherein the first semiconductor package structure comprises at least a second memory chip and a position of the first encapsulant 'the second memory chip No. 20 201007920 The memory chip corresponds to the vertical direction. 13. The memory package module of claim 1, wherein a line density of the module substrate is substantially concentrated on the inner surface. The memory package module of claim 2, wherein the first memory chip is directly attached to the inner surface of the module substrate, and is electrically connected to the plurality of bonding wires. Module substrate. 15. The memory package module of claim 2, wherein the second semiconductor package structure is a thin small outline package structure (TSOP). The memory package module of claim 1, wherein the second semiconductor package structure is selected from a BGA package, a planar array package structure (L(3A package), The small-size appearance has no external package structure (s〇N package), square flat no-pin package structure (QFN package) and bump wafer carrier package structure (BCC package). The memory package module of claim 1, wherein the first semiconductor package structure lacks any memory chip, and the memory chips required by the memory package module are collectively packaged in the second semiconductor package structure. The first semiconductor package structure of a memory package module, comprising a module substrate, at least one control chip, and a first seal body, wherein the module substrate has an inner surface and an outer surface, the control chip The sigh is placed on the inner surface of the module substrate and sealed by the first sealant, and the outer surface of the module substrate is provided with a plurality of external fingers and is available for 21 201007 920. Surface bonding—a second semiconductor package structure. 19. The semiconductor package structure of the memory package module according to the above-mentioned claim, further comprising at least one first memory chip, The inner surface of the module substrate is sealed by the first encapsulant. The semiconductor package structure of the memory package module according to claim 18, wherein the module substrate is not The second half 體封裝構造覆蓋之部位以及該第一封膠體之一對應部位 係形成為一插頭部,其中該些外接指係位於該插頭部上。 21如申請專利範圍第20項所述之記憶體封裝模組之第 半導體封裝構造,其中該控制晶片係位於該插頭部内。 如申明專利範圍第2〇項所述之記憶體封裝模組之第 —半導體封|構造’其中該些外接指係為平行排列之 USB金手指。 如申請專利範圍帛20 #所述之記憶艘封裝模組之第 一半導體封裝構造,其中該模組基板位在該插頭部的兩 側係與該第一封膠體之側面切齊。 如申請專利範圍第i 8項所述之記憶體封裝模組之第 半導體封裝構造,其中該模組基板之該外表面係更設 有複數個接合塾’並且該些接合塾係呈雙排排列,其排 列方向係與該些外接指之排列方向互為平行。 申請專利範圍第! 8或24項所述之記憶體封裝模組 =第-半導體封裝構造,其中該第—半導體封裝構造係 磚鬼狀並具有相等且互為平行之第一侧邊與第二側 22 201007920 邊’該些外接指係鄰近地平行排列於該第一側邊β 26、如申請專利範圍第18項所述之記憶體封裝模組之第 一半導體封裝構造,其中該模組基板之線路密度係大致 集中在該内表面。 27如申清專利範圍第19項所述之記憶體封裝模組之第 半導體封裝構造,其中該第一記憶體晶片係直接貼附The portion covered by the body package structure and the corresponding portion of the first seal body are formed as a plug portion, wherein the external finger fingers are located on the plug portion. The first semiconductor package structure of the memory package module of claim 20, wherein the control chip is located in the plug portion. The invention relates to a first semiconductor finger of a memory package module according to the second aspect of the invention, wherein the external fingers are parallel arranged USB gold fingers. The first semiconductor package structure of the memory package module according to the patent application 帛20 #, wherein the module substrate is located on both sides of the plug portion and is aligned with a side surface of the first sealant. The semiconductor package structure of the memory package module of claim i, wherein the outer surface of the module substrate is further provided with a plurality of joints 并且 and the joint rafts are arranged in a double row. The alignment direction is parallel to the arrangement direction of the external fingers. Apply for patent coverage! The memory package module of claim 8 or 24, wherein the first semiconductor package structure is brick-like and has equal and parallel first sides and a second side 22 201007920 side The first external semiconductor package structure of the memory package module according to claim 18, wherein the external density of the module substrate is substantially parallel to the first side of the first semiconductor package Focus on the inner surface. The first semiconductor package structure of the memory package module according to claim 19, wherein the first memory chip is directly attached ^模組基板之該内表面,並以複數個銲線電性連接至 該模組基板。 28、如申請專利範圍第a項 — 項所述之记憶體封裝模組之第 —丰導體封裝構造,其中該第一邋 .,, 弟半導體封裝構造内係缺 乏任何記憶體晶片。The inner surface of the module substrate is electrically connected to the module substrate by a plurality of bonding wires. 28. The first-bump conductor package structure of the memory package module of claim 4, wherein the first semiconductor package structure lacks any memory chip. 23twenty three
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102931524A (en) * 2011-08-12 2013-02-13 群丰科技股份有限公司 Electronic device and method for manufacturing the same

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102931524A (en) * 2011-08-12 2013-02-13 群丰科技股份有限公司 Electronic device and method for manufacturing the same

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