TW201003061A - Inspecting equipment - Google Patents

Inspecting equipment Download PDF

Info

Publication number
TW201003061A
TW201003061A TW97126173A TW97126173A TW201003061A TW 201003061 A TW201003061 A TW 201003061A TW 97126173 A TW97126173 A TW 97126173A TW 97126173 A TW97126173 A TW 97126173A TW 201003061 A TW201003061 A TW 201003061A
Authority
TW
Taiwan
Prior art keywords
display panel
liquid crystal
crystal display
light source
disposed
Prior art date
Application number
TW97126173A
Other languages
Chinese (zh)
Other versions
TWI375028B (en
Inventor
Shang-Chieh Chou
Yan-Jie Huang
Original Assignee
Au Optronics Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Au Optronics Corp filed Critical Au Optronics Corp
Priority to TW97126173A priority Critical patent/TWI375028B/en
Publication of TW201003061A publication Critical patent/TW201003061A/en
Application granted granted Critical
Publication of TWI375028B publication Critical patent/TWI375028B/en

Links

Landscapes

  • Investigating Materials By The Use Of Optical Means Adapted For Particular Applications (AREA)

Abstract

Inspecting equipment suitable for inspecting an LCD panel is provided. The inspecting equipment includes a tray, an image capturing device, a polarizer, a backlight and at least one light source. The LCD panel is disposed on the tray and the image capturing device is disposed above the front side of the LCD panel. The polarizer is between the image capturing device and the LCD panel, wherein the polarizer has a polarization different from that of the upper polarizer plate. The backlight is below the LCD panel, and the light source is aside the LCD panel.

Description

201003061 28209twf.doc/n 九、發明說明: 【發明所屬的技術領域】 本發明是有關於-種檢 能右埒公抛主工·^:由M 』又两且柯別疋有關於一種 月匕有效刀辨表面洛_粒或是面板本身缺陷的檢測設備。 【先前技術】 ^於技術不_進步,液 顯j-的產業正在 升產能利用率及良率無不積極地提 良筹也是製造《的-大課ι縣u卜’檢測產品的 目前檢測面板的方式有兩種:201003061 28209twf.doc/n IX. Description of the invention: [Technical field to which the invention pertains] The present invention relates to a type of inspection capable of right-handedly throwing a main worker·^: by M 』 two and that the 疋别疋 has a month An effective knives for detecting surface defects or defects in the panel itself. [Prior Art] ^In the technology is not _ progress, the industry is improving the capacity utilization rate and the yield is all positively raised. It is also the current inspection panel for the manufacture of the "Da-Miao County u Bu" inspection product. There are two ways to do this:

J (-)人貝㈣:由人員點亮晝面,利用目視並切換 板式來尋找面板的缺陷。然而其缺點有二:―从員雖缺 可以用肉眼辨別表面(例如是落麵是刮傷)與面板内部rI 巍(例如是雜異常或是内部.)所造成的亮暗缺陷之間 的差別’但S由人員檢測易造成人因差異導致標準不一, 或人員疲勞引起誤檢(例如是漏篩),導致不良品進行後續 ‘程並μ致客戶造成客訴。缺點二為:24小時設置常態 性人員作業,使得檢測所衍生的相關成本提高許多。 (二)自動檢測:此種檢測方式是先將背光源點亮, 使光線穿透液晶顯示面板之後,利用光學檢測系統進行檢 測。當液晶顯示面板内部存有瑕疵時,光學檢測系統會檢 測到亮點或亮線的訊號。但是當液晶顯示面板表面有落塵 201003061 ^28209twf.doc/n 顆粒或刮痕存在時,光學檢測系統無法正確辨識而誤判為 亮點或是亮線等液晶顯示面板之内部瑕疵。也就是說,自 動檢測方法存在著對於面板内部瑕疵所造成亮暗缺陷以及 面板表面的落塵顆粒或刮痕所造成的缺陷,光學檢測系統 都會顯示出同樣的檢測結果。但是,面板内部瑕疵所造成 亮暗缺陷才是淘汰的標準。因此,習知的檢測方式會造成 誤將良品淘汰的情況。J (-) person shell (four): The person illuminates the face, uses the visual view and switches the plate to find the defects of the panel. However, there are two disadvantages: “The difference between the bright and dark defects caused by the fact that the member can distinguish the surface with the naked eye (for example, the surface is scratched) and the rI 巍 inside the panel (for example, miscellaneous or internal). 'But the S is caused by human factors that may cause differences in human factors, or the personnel may cause mis-inspection (for example, sifting), resulting in the subsequent process of defective products and causing customer complaints. The second disadvantage is that the normal operation of the personnel is set at 24 hours, which makes the related costs derived from the test much higher. (2) Automatic detection: This detection method is to first illuminate the backlight, so that the light passes through the liquid crystal display panel, and then the optical detection system is used for detection. When there is a flaw inside the LCD panel, the optical detection system will detect the bright or bright line signal. However, when there is dust on the surface of the liquid crystal display panel, the optical detection system cannot be correctly identified and is mistakenly judged as the internal flaw of the liquid crystal display panel such as a bright spot or a bright line. That is to say, the automatic detection method has defects caused by bright and dark defects caused by flaws inside the panel and dust particles or scratches on the surface of the panel, and the optical detection system will display the same detection result. However, the dark and dark defects caused by the flaws inside the panel are the criteria for elimination. Therefore, the conventional detection method will cause the product to be eliminated by mistake.

【發明内容】 本發明提供一種檢測設備’可以有效地分辨面板表面 的落塵顆粒或是面板内部瑕疵所造成的缺陷。SUMMARY OF THE INVENTION The present invention provides a detecting device that can effectively distinguish the dust particles on the surface of the panel or the defects caused by the defects inside the panel.

表面上 為達上述或其他目的,本發明提出一種檢測設備,用 於檢測液晶顯示面板,其中液晶顯示面板具有一前表面以 及一後表面,液晶顯示面板的前表面設置有一上偏光片, 液晶顯示面板的後表面設置有一下偏光片。上述的檢測設 備包括一置具、一影像擷取器、一偏光元件、—背光源以 ^至少一光源。液晶顯示面板設置在置具上。影像擷取器 叹置於液晶顯示面板的前表面的上方。偏光元件設置於今 像擷取裝置與液晶顯示面板之間,其巾偏光元件的偏振方 向與上偏光片的偏振方向不同。背光源設置在液晶顯示面 |反的後表面的下方。另外,至少_光源設置在液晶顯^ ,的側邊處’且域所產生的光照射在液日日日顯示面板的前 暴貝示 本發明提出一種檢測設備,用於檢測顯示面板, 28209twf.doc/n 201003061 面板具有一前表面以及一後表面。上述的檢測設備包括一 置具、一景>像操取器、一偏光元件、一背光源以及至少一 光源。液晶顯示面板設置在置具上。影像擷取器設置於液 晶顯示面板的前表面的上方。偏光元件設置於傻 置與液晶顯示赌之間,其中偏光元件的偏 光片的偏振方向不同。背光源設置在液晶顯示面板的後表 面的下方。另外’至少-光源設置在液晶顯示面板的側邊 處,且光源所產生的光照射在液晶顯示面板的前表面上。 本發明因採用增加偏光元件及在待側面板的側邊處 設置一光源,因此能夠正確地將面板表面的落塵顆粒、刮 痕與面板内部瑕疵所造成的亮暗缺陷清楚分辨出來。相較 於習知的檢測技術大幅降低生產線上良品被誤判的機率。 為讓本發明的上述特徵和優點能更明顯易懂,下文特 舉較佳實施例,並配合所附圖式,作詳細說明如下。 【實施方式】 圖1為本發明實施例一種檢測設備的示意圖。請參照 圖1,本實施例之檢測設備300,適用於檢測液晶顯示面板 100。其中’液晶顯示面板100具有一前表面102以及一後 表面104,前表面102設置有一上偏光片110,液晶顯示面 板100的後表面104設置有一下偏光片120。上述的檢測 設備300包括一置具310、一影像操取器320、一偏光元件 330、一背光源340以及至少一光源350。 檢測液晶顯示面板的操作方式為:首先,將液晶顯示 201003061 28209twf.doc/n 面板100設置在置具上3丨〇。接著’將影像擷取器320設 置於液晶顯示面板100的前表面102的上方,並且將偏光 元件330設置於影像擷取器320與液晶顯示面板1〇0之 間。特別是,偏光元件330的偏振方向與上偏光片u〇的 偏振方向不同。此外,背光源340設置在液晶顯示面板1〇〇 的後表面104的下方。另外,至少一光源350設置在液晶 顯示面板100的側邊處’並且使光源350所產生的光照射 在液晶顯示面板100的前表面102上,在本實施例中光源 350可以是一高亮度直線側光光源。 檢測時,先點亮背光源340及光源350,背光源340 的光線在通過液晶顯示面板1〇〇後表面1〇4下方的下偏光 片120後’只剩下一種偏振方向。隨後,光線到達上偏光 片11〇時’就無法通過上偏光片11〇,因而影像擷取器320 不會擷取到任何訊號。 然而’當液晶顯示面板1〇〇内有缺陷時,已被下偏光 片120偏振的光線到達上偏光片110之後,仍會通過上偏 光片110 °接著,上述光線將到達偏光元件330之後,將 無法通過偏光元件330 ’因而影像擷取器320也不會擷取 到訊號。 另外’由於本發明於液晶顯示面板100的側邊處設置 有1源350 ’且其所產生的光源照射在液晶顯示面板100 的則,面102上。因此,當液晶顯示面板100上的落塵顆 粒或疋刮痕在受到光源35〇照射之後,散射的光線會同時 具有兩種偏振方向。而此光線在通過偏光元件330後會剩 201003061, 28209twf.doc/n 下一種偏振方向’因而被影像擷取器320擷取到訊號。光 源350較佳係為可調整照射角度的光源,在檢測時可以適 時地調整照射角度’使液晶顯示面板100上的落塵顆粒或 是刮痕在產生更多之散射光線,提高檢測裝置300之辨識 度。 在此需特別說明的是,光源350設置在液晶顯示面板 100側邊處的主要目的是為了方便讓偏光元件33〇設置在 光源350的光線由光源35〇發射至液晶顯示面板1〇〇之前 表面之行徑路徑以外的位置,也就是說,光源350也可以 是設置在檢測設備300之其他位置,甚至是由檢測設備3〇〇 以外之裝置額外提供一光源,只要此光源的光線在照射至 液晶顯示面板1〇〇之前表面前不會受到偏光元件33〇之干 擾即可。 且在本實施例t,偏光元件330較佳係為一與上偏光 片11〇的偏振方向垂直之偏光片,並且偏光元件33〇可以 裝設在影像擷取裝置32〇上,在此並不限定。 因此’由上述的說明可知,影像擷取器32〇所擷取到 訊號是液晶顯示面板100上的顆粒或刮痕所造成。因此, 利用本發明之檢測裝置可以分辨液晶顯示面板内部的缺陷 以及液晶顯示面板上的顆粒或刮痕所形成的缺陷訊號。 為使上述的實施例更容易了解,將上偏光片110及下 偏光片120用S型偏光片及p型偏光片為例來說明。當然’ 在其他實施例中’也可以將上偏光片110及下偏光片120 分別使用P型偏光片及S型偏光片。需要注意的一點是, 28209twf.doc/n 由於偏光7G件330與上偏光片110具有不同的偏振方向, 因此在本實施例中,偏光元件330例如是p型偏光片。 當點壳背光源340時,所發出的光線為具有p與s方 向的旋光方向性。此時,背光源340發出具有卩及8'偏振 方向光線在通過液晶顯示面板100後表面1〇4下方的下偏 光片120 (P型)後,只有p偏振方向的光可以通過。光 線到達上偏光片110 (S型)時,P偏振方向的光就無法通 ( ' 過上偏光片U0,因而影像擷取器320不會擷取到任何訊 號。 而若是液晶顯示面板100内部有瑕疵存在時,通過下 偏光片120的P偏振方向的光受到瑕疵偏折的緣故,又再 度同時具有P偏振方向及s偏振方向的光,這樣光線接連 通過上偏光片110 (S型)及偏光元件(P型)後,所有 的光線都被阻擋下來而沒有任何訊號到達影像擷取器 320。 另外’光源350所發出的光線同時具有p偏振方向及 I S偏振方向,當照射到液晶顯示面板1〇〇的前表面1〇2例 如是落塵顆粒或是刮痕時,光線散射所發出的光也同時具 有P偏振方向及S偏振方向。這樣的光線在經過偏光元件 330 (p型)後,!>偏振方向的光線可以通過而到達影像褐 取器320 ’因此影像擷取器320會擷取到此訊號。 因此’在背光源340及光源350同時的照射之下,在 通過偏光元件330還可以收到缺陷訊號的,即是液晶顯示 面板表面上的落塵顆粒或是刮痕所擷取到的訊號,此些表 28209twf.doc/n 201003061 而非液晶 面上的落塵顆粒或是刮痕在檢測規格屬於良品 利用 顯示面板100内部的瑕疵所擷取到的訊號。換言之, 本發明之檢測設備可以分辨出面板内部缺陷與面板寺面 粒或刮痕,因而可以降低自動檢測系統誤判率,並^升,In order to achieve the above or other objects, the present invention provides a detecting device for detecting a liquid crystal display panel, wherein the liquid crystal display panel has a front surface and a rear surface, and the front surface of the liquid crystal display panel is provided with an upper polarizing plate, and the liquid crystal display The lower surface of the panel is provided with a lower polarizer. The above detecting device comprises a mounting device, an image capturing device, a polarizing element, a backlight, and at least one light source. The liquid crystal display panel is placed on the fixture. The image capture device is placed above the front surface of the liquid crystal display panel. The polarizing element is disposed between the current image capturing device and the liquid crystal display panel, and the polarization direction of the towel polarizing element is different from the polarization direction of the upper polarizer. The backlight is placed below the rear surface of the LCD display surface. In addition, at least the _ light source is disposed at the side of the liquid crystal display, and the light generated by the field is irradiated on the front of the liquid day display panel. The present invention provides a detecting device for detecting the display panel, 28209 twf. Doc/n 201003061 The panel has a front surface and a rear surface. The above detecting device comprises a set, a scene, an imager, a polarizing element, a backlight and at least one light source. The liquid crystal display panel is placed on the fixture. The image picker is disposed above the front surface of the liquid crystal display panel. The polarizing element is disposed between the stupidity and the liquid crystal display bet, wherein the polarizing elements of the polarizing element have different polarization directions. The backlight is disposed below the rear surface of the liquid crystal display panel. Further, at least - the light source is disposed at a side of the liquid crystal display panel, and light generated by the light source is irradiated on the front surface of the liquid crystal display panel. The invention adopts the addition of the polarizing element and the provision of a light source at the side of the side panel to be correctly distinguished, so that the dust particles and scratches on the surface of the panel and the bright and dark defects caused by the internal flaws of the panel can be clearly distinguished. Compared with the conventional detection technology, the probability of misjudgment of good products on the production line is greatly reduced. The above described features and advantages of the present invention will be more apparent from the following description. Embodiment 1 FIG. 1 is a schematic diagram of a detecting device according to an embodiment of the present invention. Referring to FIG. 1, the detecting device 300 of the present embodiment is suitable for detecting the liquid crystal display panel 100. The liquid crystal display panel 100 has a front surface 102 and a rear surface 104. The front surface 102 is provided with an upper polarizer 110. The rear surface 104 of the liquid crystal display panel 100 is provided with a lower polarizer 120. The detecting device 300 includes a mounting device 310, an image capturing device 320, a polarizing element 330, a backlight 340, and at least one light source 350. The operation mode of the liquid crystal display panel is as follows: First, the liquid crystal display 201003061 28209 twf.doc/n panel 100 is placed on the fixture 3 。. Next, the image capturing device 320 is disposed above the front surface 102 of the liquid crystal display panel 100, and the polarizing element 330 is disposed between the image capturing device 320 and the liquid crystal display panel 110. In particular, the polarization direction of the polarizing element 330 is different from the polarization direction of the upper polarizer u〇. Further, the backlight 340 is disposed under the rear surface 104 of the liquid crystal display panel 1A. In addition, at least one light source 350 is disposed at a side of the liquid crystal display panel 100 and illuminates the light generated by the light source 350 on the front surface 102 of the liquid crystal display panel 100. In this embodiment, the light source 350 may be a high brightness straight line. Side light source. During the detection, the backlight 340 and the light source 350 are lighted first, and the light of the backlight 340 leaves only one polarization direction after passing through the lower polarizer 120 below the rear surface 1〇4 of the liquid crystal display panel 1. Then, when the light reaches the upper polarizer 11', it cannot pass through the upper polarizer 11, so that the image picker 320 does not capture any signal. However, when there is a defect in the liquid crystal display panel 1 ,, the light that has been polarized by the lower polarizer 120 reaches the upper polarizer 110, and still passes through the upper polarizer 110°, and then the light will reach the polarizing element 330, and The polarizer element 330' cannot be passed and thus the image picker 320 does not capture the signal. Further, since the present invention is provided with a source 350' at the side of the liquid crystal display panel 100 and the light source generated thereon is incident on the surface 102 of the liquid crystal display panel 100. Therefore, when the dust particles or the scratches on the liquid crystal display panel 100 are irradiated by the light source 35, the scattered light has both polarization directions. When the light passes through the polarizing element 330, 201003061, 28209twf.doc/n will be left in the next polarization direction, and thus the image capturing device 320 captures the signal. The light source 350 is preferably a light source capable of adjusting the illumination angle. The illumination angle can be adjusted at the time of detection to make the dust particles or scratches on the liquid crystal display panel 100 generate more scattered light, thereby improving the identification of the detecting device 300. degree. It should be particularly noted that the main purpose of the light source 350 disposed at the side of the liquid crystal display panel 100 is to facilitate the light emitted from the light source 350 by the polarizing element 33 to be emitted from the light source 35 to the surface of the liquid crystal display panel 1 The position other than the path of the path, that is, the light source 350 may be disposed at other positions of the detecting device 300, or even a device other than the detecting device 3〇〇, as long as the light of the light source is irradiated to the liquid crystal. The front surface of the display panel 1〇〇 is not disturbed by the polarizing element 33〇. In the embodiment t, the polarizing element 330 is preferably a polarizer perpendicular to the polarization direction of the upper polarizer 11〇, and the polarizing element 33 can be mounted on the image capturing device 32〇. limited. Therefore, it can be seen from the above description that the image captured by the image picker 32 is caused by particles or scratches on the liquid crystal display panel 100. Therefore, the defect device inside the liquid crystal display panel and the defect signal formed by the particles or scratches on the liquid crystal display panel can be distinguished by the detecting device of the present invention. In order to make the above-described embodiment easier to understand, the upper polarizer 110 and the lower polarizer 120 are exemplified by an S-type polarizer and a p-type polarizer. Of course, in other embodiments, the P-type polarizer and the S-type polarizer may be used for the upper polarizer 110 and the lower polarizer 120, respectively. It is to be noted that 28209 twf.doc/n Since the polarizing 7G member 330 and the upper polarizer 110 have different polarization directions, in the present embodiment, the polarizing element 330 is, for example, a p-type polarizer. When the shell backlight 340 is turned on, the emitted light is an optical directivity having a p-direction and an s-direction. At this time, after the backlight 340 emits the lower polarizer 120 (P type) having the 卩 and 8' polarization directions below the rear surface 1 〇 4 of the liquid crystal display panel 100, only the light of the p polarization direction can pass. When the light reaches the upper polarizer 110 (S-type), the light in the P-polarized direction cannot pass ('the upper polarizer U0 is passed, so the image extractor 320 does not capture any signal. If the liquid crystal display panel 100 has a built-in When the 瑕疵 is present, the light in the P-polarization direction of the lower polarizer 120 is deflected by the ytterbium, and the light having the P-polarization direction and the s-polarization direction is again simultaneously, so that the light passes through the upper polarizer 110 (S-type) and the polarized light in succession. After the component (P-type), all the light is blocked without any signal reaching the image extractor 320. In addition, the light emitted by the light source 350 has both the p-polarization direction and the IS polarization direction when the liquid crystal display panel 1 is illuminated. When the front surface 1〇2 of the crucible is, for example, a dust particle or a scratch, the light emitted by the light scattering also has a P polarization direction and an S polarization direction. Such light passes through the polarizing element 330 (p type)! > Light in the polarization direction can pass through to the image browning device 320' so the image capturing device 320 will capture this signal. Therefore, 'at the same time as the backlight 340 and the light source 350 are illuminated, The polarizing element 330 can also receive the defect signal, that is, the dust particles or the scratches on the surface of the liquid crystal display panel, such as the table 28209twf.doc/n 201003061 instead of the dust particles on the liquid crystal surface Or the scratching is a signal that the detection specification belongs to the inside of the display panel 100. In other words, the detecting device of the present invention can distinguish the internal defects of the panel and the face grain or scratches of the panel temple, thereby reducing the automatic detection. System misjudgment rate, and ^ rise,

圖2為本發明另一實施例之檢測設備的示意圖。情泉 照圖2 ’本實施例提供的檢測設備3〇〇a與圖1所示的 設備300相似,不同之處在於光源360為高亮度弧形 光源,其餘的實施方式同上所述’在此不再贅述。當光源 360為高亮度弧形側光光源,可以提供不同的照射角度 增加例如是具有方向性的刮痕被照射到的機會,提升辨識 圖3為本發明又一實施例的檢測設備的立體示意圖。 π參照圖3,為了方便且清楚的說明本實施例,圖3省略 綠示置具。圖3的實施例與圖2所述之實施例相似,不同 之處在於位於兩侧的光源為高亮度面型弧形侧光光源 3 7 〇。高亮度面型弧形側光光源3 70所產生的光線照射在液 晶顯示面板1〇〇的前表面上,液晶顯示面板1〇〇下方設置 有背光源340。而本實施例所提供的高亮度面型弧形側光 光源370可提供大面積與照度的光源,進一步提升檢測設 備之辨識能力。 綜上所述’本發明之檢測設備因採用了偏光元件及高 免度側光光源’因此當利用影像擷取裝置來檢測液晶顯示 面板表面的落塵顆粒或刮痕與液晶顯示面板内部的瑕疵 11 28209twf.doc/n 201003061 ------ i 時,是可以分辨出兩者的不同,因而可減低誤判的機率。 另外,本發明更採用了高亮度弧形侧光光源及高亮度 面型弧形侧光光源,對於具有方向性的表面刮痕辨識度更 疋大幅提升。相較於習知的檢測技術大幅降低生產線上良 品被誤判為不良品的機率。 雖然本發明已以較佳實施例揭露如上,然其並非用以 限定本發明’任何所屬技術領域中具有通常知識者,在不 脫離本發明的精神和範圍内,當可作些許的更動與潤飾, 因此本發明的保護範圍當視後附的申請專利範圍所界定者 為準。 【圖式簡單說明】 圖1為本發明—實施例的檢測設備的示意圖。 圖2為本發明另一實施例的檢測設備的示意圖。 圖3為本發明又一實施例的檢測設備的立體示意圖。 〇 【主要元件符號說明】 1〇〇 :液晶顯示面板 102 .前表面 1〇4 :後表面 110 :上偏光片 120 .下偏光片 200 ' 300 :檢測設備 210、310 :置具 12 28209twf.doc/n 201003061 220、320 :影像擷取器 230、340 :背光源 330 :偏光元件 350 :光源 360 :高亮度弧形侧光光源 370 :高亮度面型弧形侧光光源2 is a schematic diagram of a detecting device according to another embodiment of the present invention. 2, the detection device 3A provided in this embodiment is similar to the device 300 shown in FIG. 1, except that the light source 360 is a high-intensity curved light source, and the rest of the embodiments are the same as described above. No longer. When the light source 360 is a high-intensity curved side light source, different illumination angles can be provided to increase the chance that the scratch with the directionality is irradiated. FIG. 3 is a perspective view of the detecting device according to another embodiment of the present invention. . π Referring to Fig. 3, the present embodiment is illustrated for convenience and clarity, and the green display device is omitted in Fig. 3. The embodiment of Figure 3 is similar to the embodiment illustrated in Figure 2, except that the light sources on either side are high-brightness curved arc-shaped side light sources 3 7 〇. The light generated by the high-brightness curved side light source 370 is irradiated on the front surface of the liquid crystal display panel 1 ,, and the backlight 340 is disposed under the liquid crystal display panel 1 . The high-brightness curved side light source 370 provided in this embodiment can provide a large-area and illuminating light source, thereby further improving the identification capability of the detecting device. In summary, the detecting device of the present invention uses a polarizing element and a high-availability side light source. Therefore, when the image capturing device is used to detect dust particles or scratches on the surface of the liquid crystal display panel and the inside of the liquid crystal display panel, 28209twf.doc/n 201003061 ------ i can distinguish the difference between the two, thus reducing the chance of misjudgment. In addition, the invention further adopts a high-brightness curved side light source and a high-brightness curved side light source, and the visibility of the surface scratch with directionality is further improved. Compared with the conventional detection technology, the probability that the product on the production line is misjudged as a defective product is greatly reduced. Although the present invention has been disclosed in the above preferred embodiments, it is not intended to limit the invention to those skilled in the art, and may be modified and modified without departing from the spirit and scope of the invention. Therefore, the scope of the invention is defined by the scope of the appended claims. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic view of a detecting apparatus according to an embodiment of the present invention. 2 is a schematic diagram of a detecting device according to another embodiment of the present invention. FIG. 3 is a schematic perspective view of a detecting device according to still another embodiment of the present invention. 〇 [Main component symbol description] 1〇〇: liquid crystal display panel 102. front surface 1〇4: rear surface 110: upper polarizer 120. lower polarizer 200' 300: detecting device 210, 310: mounting 12 28209twf.doc /n 201003061 220, 320: image capture device 230, 340: backlight 330: polarizing element 350: light source 360: high-intensity curved side light source 370: high-brightness curved side light source

1313

Claims (1)

28209twf.doc/] 201003061 十、申請專利範圍: 、 仫―種檢測設備,用於檢測一液晶顯示面板,其中該 液晶顯示面板具有一前表面以及一後表面,該液晶顯示面 板的該前表面設置有一上偏光片,該液晶顯示面板的該下 表面設置有一下偏光片,該檢測設備包括: 〜置具,該液晶顯示面板設置在該置具上; 〜影像擷取器,設置於該液晶顯示面板的前表面的上28209twf.doc/] 201003061 X. Patent application scope: 仫-type detecting device for detecting a liquid crystal display panel, wherein the liquid crystal display panel has a front surface and a rear surface, and the front surface of the liquid crystal display panel is disposed The upper surface of the liquid crystal display panel is provided with a lower polarizer. The detecting device comprises: a device, the liquid crystal display panel is disposed on the device; and an image capturing device is disposed on the liquid crystal display. On the front surface of the panel —偏光元件,設置於該影像擷取裝置與該液晶顯示面 之間,其中§亥偏光元件的偏振方向與該上偏光片的偏振 方向不同; ' 、一背光源,設置在該液晶顯示面板的後表面的下 以及 乃’ 王夕一兀鄉,設置在該液晶顯示面板的側邊處,且該 源所產生的光照射在該液晶顯示面板的該前表面上。ΠΛ 光元It中請專利翻第1項所述之檢測設備,其中該偏 九凡件疋設置在該光源的光線所行徑的路徑以外的位置。 光元請專利範圍第1項所述之檢測設備,其中該偏 尤7G件是一偏光板。 W场 ’其中該偏 ’其中該光 ’其中該光 4. 如申請專利範圍第1項所述之檢測設 一凡件是裝設於該影像擷取裝置上。 5. 如申請專利範圍第丨項所述之檢測設 原為可調整照射角度的光源。 6·如中請專·圍第i項所述之檢測設 14 201003061 -28209twf.doc/n 源是高亮度直線側光光源、高亮度弧形側光光源或高亮度 面型弧形側光光源。 7. —種檢測設備,用於檢測一顯示面板,該顯示面板 具有一前表面以及一後表面,該檢測設備包括: 一置具,該顯示面板設置在該置具上; 一影像擷取器,設置於該顯示面板的前表面的上方; 一偏光元件,設置於該影像擷取裝置與該顯示面板之 間; /、 - 一背光源,設置在該顯呆面板的後表面的下方;以及 至少一光源,設置在該顯示面板的側邊處,且該光源 所產生的光照射在該顯示面板的該前表面上。 8. 如申請專利範圍第7項所述之檢測設備,其中該偏 光元件是設置在該光源的光線所行徑的路徑以外的位置。 9. 如申請專利範圍第7項所述之檢測設備,其中該偏 光元件是裝設於該影像擷取裝置上。 10. 如申請專利範圍第7項所述之檢測設備,其中該光 ij 源是高亮度直線側光光源、高亮度弧形側光光源或高亮度 面型弧形侧光光源。 15a polarizing element disposed between the image capturing device and the liquid crystal display surface, wherein a polarization direction of the polarizing element is different from a polarization direction of the upper polarizer; and a backlight is disposed on the liquid crystal display panel The lower surface of the rear surface is disposed at the side of the liquid crystal display panel, and the light generated by the source is irradiated on the front surface of the liquid crystal display panel. The invention relates to the detection device of the first item, wherein the partial 疋 is disposed at a position other than the path of the light path of the light source. The detecting device of the first aspect of the patent, wherein the partial 7G member is a polarizing plate. The W field 'where the ' is ' the light 'where the light 4. The detecting device according to the first aspect of the patent application is mounted on the image capturing device. 5. The test described in item bis of the patent application is a light source with adjustable illumination angle. 6.············································································· . 7. A detecting device for detecting a display panel having a front surface and a rear surface, the detecting device comprising: a mounting device, the display panel is disposed on the mounting; an image picker a polarizing element disposed between the image capturing device and the display panel; /, a backlight disposed below the rear surface of the display panel; At least one light source is disposed at a side of the display panel, and light generated by the light source is irradiated on the front surface of the display panel. 8. The detecting device of claim 7, wherein the polarizing element is disposed at a position other than the path of the light path of the light source. 9. The detecting device of claim 7, wherein the polarizing element is mounted on the image capturing device. 10. The detecting device according to claim 7, wherein the light source is a high-intensity linear side light source, a high-intensity curved side light source or a high-brightness curved side light source. 15
TW97126173A 2008-07-10 2008-07-10 Inspecting equipment TWI375028B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW97126173A TWI375028B (en) 2008-07-10 2008-07-10 Inspecting equipment

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW97126173A TWI375028B (en) 2008-07-10 2008-07-10 Inspecting equipment

Publications (2)

Publication Number Publication Date
TW201003061A true TW201003061A (en) 2010-01-16
TWI375028B TWI375028B (en) 2012-10-21

Family

ID=44825399

Family Applications (1)

Application Number Title Priority Date Filing Date
TW97126173A TWI375028B (en) 2008-07-10 2008-07-10 Inspecting equipment

Country Status (1)

Country Link
TW (1) TWI375028B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI502186B (en) * 2014-05-08 2015-10-01 Utechzone Co Ltd A bright spot detection device for filtering foreign matter noise and its method

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI502186B (en) * 2014-05-08 2015-10-01 Utechzone Co Ltd A bright spot detection device for filtering foreign matter noise and its method

Also Published As

Publication number Publication date
TWI375028B (en) 2012-10-21

Similar Documents

Publication Publication Date Title
TWI330253B (en)
WO2010024082A1 (en) Defect inspecting system, and defect inspecting method
JP5583102B2 (en) Glass substrate surface defect inspection apparatus and inspection method
TWI422815B (en) Test data processing apparatus and test data processing method
CN101329456A (en) Detection apparatus
JP3595226B2 (en) Method and apparatus for detecting edge defect in glass plate
US20070115464A1 (en) System and method for inspection of films
CN107084993A (en) Double camera single-station positive and negative vision inspection apparatus
CN211905129U (en) Dispensing detection device
TWI502186B (en) A bright spot detection device for filtering foreign matter noise and its method
JP2010048602A (en) Printed board inspection device and printed board inspection method
KR101203210B1 (en) Apparatus for inspecting defects
WO2011086634A1 (en) Liquid crystal panel inspection method and device
JP2000146554A (en) Method and apparatus for inspecting surface unevenness of transparent board
TW201341785A (en) A system and method for inspecting an article for defects
KR100769326B1 (en) Apparatus for inspecting polarized film
JPH08271433A (en) Tablet inspection equipment
KR101445126B1 (en) Back light unit inspecting apparatus and method
CN110082361B (en) Object appearance and crack detection device and detection method
TW201003061A (en) Inspecting equipment
CN111505008A (en) Method and apparatus for inspecting defects
KR102207900B1 (en) Optical inspection apparatus and method of optical inspection
TW201629470A (en) Separable multiple illumination sources in optical inspection
JP2002221496A (en) Instrument for inspecting diffraction pattern of light
CN209784216U (en) Liquid crystal display surface detection device based on polarized light

Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees