TW201002859A - Catalyst-imparting liquid for solder plating - Google Patents

Catalyst-imparting liquid for solder plating Download PDF

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Publication number
TW201002859A
TW201002859A TW098116843A TW98116843A TW201002859A TW 201002859 A TW201002859 A TW 201002859A TW 098116843 A TW098116843 A TW 098116843A TW 98116843 A TW98116843 A TW 98116843A TW 201002859 A TW201002859 A TW 201002859A
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TW
Taiwan
Prior art keywords
catalyst
copper
solder
based metal
gold
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TW098116843A
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Chinese (zh)
Inventor
Shigeki Shimizu
Ryuji Takasaki
Yoshizou Kiyohara
Kenji Yoshiba
Yoshinori Kogure
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Japan Pure Chemical Co Ltd
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Publication of TW201002859A publication Critical patent/TW201002859A/en

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Classifications

    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/30Assembling printed circuits with electric components, e.g. with resistor
    • H05K3/32Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits
    • H05K3/34Assembling printed circuits with electric components, e.g. with resistor electrically connecting electric components or wires to printed circuits by soldering
    • H05K3/3457Solder materials or compositions; Methods of application thereof
    • H05K3/3473Plating of solder
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/18Pretreatment of the material to be coated
    • C23C18/1803Pretreatment of the material to be coated of metallic material surfaces or of a non-specific material surfaces
    • C23C18/1824Pretreatment of the material to be coated of metallic material surfaces or of a non-specific material surfaces by chemical pretreatment
    • C23C18/1827Pretreatment of the material to be coated of metallic material surfaces or of a non-specific material surfaces by chemical pretreatment only one step pretreatment
    • C23C18/1831Use of metal, e.g. activation, sensitisation with noble metals
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/07Treatments involving liquids, e.g. plating, rinsing
    • H05K2203/0703Plating
    • H05K2203/072Electroless plating, e.g. finish plating or initial plating

Abstract

A catalyst-imparting liquid which, when used in conducting electroless reductional solder plating directly on a copper-based conductor circuit material, can give an even coating film free from thickness unevenness and enables the formation of a solder deposit having no bridge between fine wiring lines. Also provided is a solder deposit formed using the catalyst-imparting liquid. The catalyst-imparting liquid, which is for conducting electroless reductional solder plating on a copper-based metal, is characterized by comprising a water-soluble gold compound and a chelating agent. The deposit is a solder deposit formed on a copper-based metal, and is characterized by being obtained by using the catalyst-imparting liquid to conduct electroless reductional solder plating. Furthermore provided is a solder deposit formed over a copper-based metal which has gold in an amount of 3x10-5 g/cm2 or smaller on the surface thereof, the deposit having been formed on the gold.

Description

201002859 六、發明說明: 【發明所屬之技術領域】 本發明係關於焊錫鍍敷用觸 銅系金屬上進行無電液’更詳言之’傳,扒 成的觸媒賦予液。$料錫賴時所狀具有轉、 【先前技術】 電子材料之焊錫接合部 由進行電解铲錫 、 ;斗之銅系導體電嗯 电解鑛锡、電解鍍錫斜 崎上轉 之電解錢敷而形成純錫 :鑛錫銀、電解•麵等 鑛敷型式被工業化。合金皮膜的方法’已巧缚 近年來’為了因應於電子材 電解鍍敷,對於以 /、,、型化、高密度化,不僅 高,實際上μ解取、錫鍍敷實用化的要求增 但是,此已'工 錄數已被工業化。 皮臈或锡合金皮滕b的無電解取代烊錫贿,為了形成純錫 材的必要性,於微細^有=4溶解/底之銅系導體電路素 電路之虞。於a , y形,有溶解量過多且切斷導體 基底鋼㈣2=_細的料,期望並非伴隨 會伴隨基底⑽、導題電H無電解取代焊錫鐘敷,而是不 的工業化。 東材溶解的無電解還原焊錫鍍敷 作為無電解還原烊鴒 示含有錫之二價離子1數的鍍敫浴,於專利文獻1中已揭 098116843 之價離子、錯化劑及作為還原劑 201002859 之三價鈦離子的鍍敷浴。此無電解還原焊錫鍍敷浴係與以還 原劑所進行之析出歧機構有關,為了形成鍍敷皮膜,並 無使基底㈣導體電路素材溶解—紐,但㈣敷浴本身 ^有銅溶解性,絲進行錢_原烊錫鍍敷之間確認到銅 溶解至鍍敷浴中,依然有切斷導體電路的情形。 於是,本發明者已開發出抑制浴本身的銅溶解性,主 且抑制無铸縣焊騎敷進洲溶⑽際申如 號:P⑽2°_564)。但是,此等無電解還原焊錫_ 若於銅“《路上直㈣行,則電路表關錢行的刹 反應稀疏,敎錢行慢之處的職轉變薄,成為膜厚巧 勻的原因,故有時亦無法取得均勻的皮膜。 於是,若為了使得還原反應的軸開始均勻,而欲提高無 電解逛原料魏浴的反應錄,輕液安定性受損,於德 細佈線間引起析出,並且有時引起液分解。 、、u 另一方面’作為僅使銅系導體電路活性化的方法 知於無電解還原鍍敷前處理 利文獻2〜6),但兮箄㈣⑽ 順媒的方法(例如’專 對於無__焊_敷的前處 因此對於热電解還原焊錫鑛敷並無法適用。 近年來係進行飾線的微細化, 會伴隨基底銅系導體電路素㈣解二=烈期望不 的工業化,但上述 早的無電解爾錫鍍敷 [先前技術讀]細私衫,縣職工業化。 098116843 4 201002859 [專利文獻] 專利文獻1:日本專利特開平6_101056號公報 專利文獻2:日本專利特開平4_365877號公報 專利文獻3 :日本專利特開平7-011448號公報 專利文獻4 :日本專利特開平8-269724號公報 專利文獻5 :日本專利特開2003-034876號公報 專利文獻6 :曰本專利特開2003-082468號公報 【發明内容] (發明所欲解決之問題) 本么明係有鑑於上述背景技術而完成者,其課題係在於提 ,•在銅系導體電路素材上直接進行無電解還原焊錫鑛敷 ^可取#無膜厚不勻的均勻皮膜,並且可形成微細佈線無 跨接線之蟬錫鍍敷皮膜的觸媒賦予液。 (解決問題之手段)201002859 VI. Description of the Invention: [Technical Field of the Invention] The present invention relates to a catalyst-imparting liquid which is obtained by electroless liquid electroplating on a copper-plated metal for solder plating. [Previous technology] The solder joint of the electronic material is made of electrolysis shovel, copper wire conductor electrolysis tin, and electrolytic tin plating Pure tin is formed: mineral deposits such as tin-silver, electrolysis and surface are industrialized. The method of the alloy film has been circumvented in recent years. In order to respond to electroplating of electronic materials, it is not only high in terms of /,, and type, and high density. In fact, the demand for practical use of μ solution and tin plating increases. However, this has already been industrialized. The electroless replacement of bismuth or tin alloy pittan b, in order to form a pure tin material, is the result of a fine copper-based conductor circuit circuit. In a, y shape, there is too much dissolved amount and the conductor base steel (4) 2 = _ thin material is expected to be accompanied by the base (10), the conductive electric H electroless replacement of the soldering bell, but not industrialization. Electroless reduction solder plating of East Wood is used as a non-electrolytic reduction ruthenium bath containing a number of divalent ions of tin. In Patent Document 1, the ionic ion, the dissolving agent and the reducing agent 201002859 have been disclosed. A plating bath of trivalent titanium ions. The electroless reduction solder plating bath is related to the precipitation mechanism by the reducing agent. In order to form the plating film, the substrate (4) conductor circuit material is not dissolved, but (4) the bath itself has copper solubility. It is confirmed that the copper is dissolved in the plating bath between the original bismuth tin plating, and the conductor circuit is still cut. Thus, the present inventors have developed a copper solubility which inhibits the bath itself, and mainly inhibits the welding of the non-casting county into the continent (10), the number of the application: P (10) 2 ° _ 564). However, such electroless reduction soldering _ If the copper "on the road straight (four) line, then the brake response of the circuit table to the money line is sparse, the job change is slow, the reason for the thick film thickness, so In some cases, it is not possible to obtain a uniform film. Therefore, in order to make the axis of the reduction reaction uniform, and to improve the reaction record of the electroless wrapstock Wei bath, the light liquid stability is impaired, causing precipitation between the wires of the fine wire, and In other cases, the method of activating the copper-based conductor circuit is known as the method of activating the copper-based conductor circuit, and it is known that the method of the electroless reduction plating is used in the prior art (2). 'Special for the absence of __ welding _ the front of the coating is therefore not applicable to the thermal electrolytic reduction of the solder deposit. In recent years, the miniaturization of the decorative line, accompanied by the base copper-based conductor circuit element (four) solution two = strong expectations Industrialization, but the above-mentioned early electroless tin plating [previously read] fine private shirt, industrialization of the prefecture. 098116843 4 201002859 [Patent Document] Patent Document 1: Japanese Patent Laid-Open No. Hei 6-101056 Patent Document 2: Japanese Patent Japanese Patent Laid-Open Publication No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. No. Hei. JP-A-2003-082468 SUMMARY OF INVENTION (Problems to be Solved by the Invention) The present invention has been made in view of the above-described background art, and its subject matter is to provide electroless direct electrolysis on copper-based conductor circuit materials. Reducing solder deposits can be obtained as a uniform coating film with no uneven film thickness, and can form a catalyst-imparting liquid for a fine-wired tin-plated coating without a jumper.

本發明者為了解決上述問題而重複致力檢討之 若為了使彳辣原絲的崎開始均自, D ★見 士曰愿蚀i , 紙敌同無電解還屑 :、邊洽本身的反應活性’則會使還原焊騎敷 二 定性受損,5丨起微細佈線間本來不會進 之女 的析出,發生所謂「跨接線」的基板佈線不良=緣體部分 分解。因此’於實用化方面,發現必須不 ^料液 還原焊錫鍍敷本相反應雜,即料無電解 的液安定性,而僅將鍍敷對象物之銅系導體電=焊錫趟數 098116843 表面活化後 5 201002859 進行無電解還原烊踢鑛敷。 於是,作為僅活化銅系導體電路的方法, 無電解取代焊錫鍍敷以形。式進订刖述的 乂屯成純錫皮膜或鵠 用自我觸媒機構於其上推一 & I反膜,並且利 、上進仃無電解還原埤 於微細佈狀飾,錢無電絲代=料方法,但 有擔心銅系電路素材溶解所造成的導體以=,因為依然 並未達成解決上述問題。 斷之虞,因此 又,雖然於無電解還频鎳、無電解還城 還原鎌以外之無電解還原鑛敷中,f試僅將鋼體” 活化方法之已知的賦予钿鎞此 义 導體电路 ]賦予鈀觸媒的方法,但發現無電 錫錢敷並未經由把觸媒核而被活化。 、原烊 於疋,本發明者為了解決上述問題,對於僅將銅 路活化_媒賦予液重複致力檢狀結果,發衫使用” 電In order to solve the above problems, the inventors have repeatedly tried to make a review in order to make the sizzling raw silk begin to be self-contained, D ★ sees the 曰 曰 ec, i the paper enemy with the electroless swarf: In this case, the reduction welding is damaged, and the precipitation of the substrate is not likely to occur in the fine wiring, and the substrate wiring failure of the so-called "jumper" is caused. Therefore, in terms of practical use, it has been found that it is necessary to reduce the soldering phase of the solder plating, that is, the electroless liquid stability, and only the copper-based conductor of the plating object = soldering number 098116843 surface activation After 5 201002859, the electroless reduction is carried out. Thus, as a method of activating only the copper-based conductor circuit, electroless substitution of solder plating is performed. The order of the pure tin film or the self-catalyst mechanism is used to push an & I anti-membrane, and the sputum, the sputum, the electroless reduction, the fine cloth, the money without the wire = material method, but there is concern about the conductor caused by the dissolution of the copper circuit material =, because the above problem has not been solved. Therefore, although in the electroless reduction mineralization other than electroless nickel, electroless reductive yttrium, f test only the steel body "activation method known to give this conductor circuit In the method of imparting a palladium catalyst, it was found that the electroless tin-free coating was not activated by the catalyst core. In order to solve the above problem, the inventors of the present invention have only repeated the activation of the copper channel. Committed to the results of the test, the use of hair shirts

3有水岭性金化合物和螯合劑的觸媒賦予液,則所得之" 解還原焊錫鍍敷皮膜並無微細佈線的跨接線,且膜于热 勻者,而達到完成本發明。 即’本發料提供在㈣金屬上進行無電解還原焊锡 用的觸媒職予液’其特徵為含有水溶性金化 人、’ 觸媒賦予液。 及螯合劑的 又’本發明提供以使用上述之觸媒射液*於鋼系 進行無電解還原焊錫鍍敷為其特徵之焊錫鍍數皮膜二= 方法,又’提供以使用上述之觸媒賦予液而進行無電解還= 098116843 201002859 焊錫鍍敷而得為其特徵之銅系金屬上的焊錫鍍數皮膜。 又,本發明提供於銅系金屬上具有3xlWg/cm2以下之 金,並於其上形成而成的焊錫鐘敷皮嫉。 (發明效果) 若根據本發明,則可取得在銅系金屬上無膜厚不勻之均勻 的無黾解還原焊錫鑛敷皮膜,且即使銅系導體電路為微細佈 線亦可形成無跨接線之無電解還原焊錫鍍敷皮犋,又,可抑 制焊錫球接合時發生空隙。 【實施方式】 以下說明本發明,但本發明不被限定於下列之具體形態, 且在技術思想的範圍内可任意變化。 本發明係在銅系金屬上進行無電解還原焊錫錢敷用的觸 媒賦予液。於本發明中,所謂「銅系金屬」,係指單獨銅或 §有60貝里4以上銅的銅合金。較佳為单獨銅或含有質 〇量%銅的銅合金。本發明可應用之銅或銅合金,若為通常形 成導體電路所用者,則無特別限定。即,作為鋼合金中銅以 外之金屬,若為取得本發明之上述效果者則無特別限定。 於本發明中,所謂「無電解還原焊錫鍍敷」的「焊錫」, 係才a單獨錫或含有錫的錫合金,且熔點為35〇它以下者。作 為構成錫合金之錫(Sn)以外的金屬並無特別限定,可列舉鉛 (Pb)、鉍(Βι)、銻(Sb)、銀(Ag)、銅(Cu)、鋁(A1)、鎘、 鋅(Zn)、銦(In)等。上述錫以外之金屬為i種或2種以上, 098116843 201002859 係用於與錫共同構成錫合金。即 並非限定於錫-鉛合金,亦包含無鉛焊錫。所礴「焊錫」’ 「焊錫」,亦包含單獨錫(炫點232;)干。,。又,本發明中之 本發明中之「烊錫」較佳為Μ 6(;Μ 90質量°/〇以上、特佳為95質 、更佳為 於更加取得上述本料縣等朴料又.踢—合金」, 實質上不含船的焊踢’因對於環境:負;:無:別限定’但 述本發明之效果等,故為佳。 更可取得上 於本發明之觸媒賦予液中, 主夕必須含有水 物和螯合劑。本發明中之「水溶性 〜吟性之金化合 媒賦予液中之濃度為具有合適之方合物」’若係在觸 溶性的金化合物,則無特別限定,於水的程度之水 化金鹽、氣化金鹽、亞硫酸金 彳舉例如氰 戈I、硫化硫酸金 合物之安定性及藥品取得的容易产方面 /1寺。就金化 鹽,特佳為氰化亞金鹽戋_ 而Q,較佳為氰化金 I及I化金鹽。對險 定,但作為調製觸媒賦予液昉 "子亚無特別限 其中以鉀鹽為特佳。 '斤力者以鹼金屬鹽為更佳, 藉由使用含有水溶性金作(3) The catalyst-imparting liquid having a water-based gold compound and a chelating agent, and the obtained "reduced solder plating film has no fine wiring jumper, and the film is heated to complete the present invention. That is, the present invention provides a catalyst-based liquid for performing electroless reduction solder on a (four) metal, which is characterized by containing a water-soluble gold-forming person and a catalyst-imparting liquid. And the chelating agent of the present invention provides a solder plating method 2 which is characterized by electroless reduction solder plating using the above-mentioned catalyst ejector*, and is provided by using the above-mentioned catalyst. Electrolyte without liquidation = 098116843 201002859 The number of solder plating on the copper-based metal characterized by solder plating. Further, the present invention provides a soldering bell skin which is formed on a copper-based metal and has a gold of 3 x 1 Wg/cm2 or less. (Effect of the Invention) According to the present invention, it is possible to obtain a uniform ruthenium-free reduction solder deposit film having no unevenness in film thickness on a copper-based metal, and a copper-based conductor circuit can be formed without a jumper wire even if it is finely wired. The electroless reduction solder plating is used to prevent voids from occurring when the solder balls are joined. [Embodiment] The present invention will be described below, but the present invention is not limited to the specific embodiments described below, and may be arbitrarily changed within the scope of the technical idea. The present invention is a catalyst-imparting liquid for performing electroless reduction soldering on a copper-based metal. In the present invention, the term "copper-based metal" means a copper alloy of copper alone or § 60 mils or more. It is preferably copper alone or a copper alloy containing a mass of copper. The copper or copper alloy to which the present invention is applicable is not particularly limited as long as it is generally used for forming a conductor circuit. In other words, the metal other than copper in the steel alloy is not particularly limited as long as the above effects of the present invention are obtained. In the present invention, the "solder" of "electroless reduction solder plating" is a single tin or a tin alloy containing tin, and has a melting point of 35 Å or less. The metal other than the tin (Sn) constituting the tin alloy is not particularly limited, and examples thereof include lead (Pb), bismuth (Sb), silver (Ag), copper (Cu), aluminum (A1), and cadmium. , zinc (Zn), indium (In), and the like. The metal other than the above tin is i type or two or more types, and 098116843 201002859 is used to form a tin alloy together with tin. That is, it is not limited to tin-lead alloys, but also contains lead-free solder. The so-called "solder" '"solder" also contains a separate tin (hyun point 232;) dry. ,. Further, in the present invention, the "ruthenium tin" is preferably Μ 6 (; Μ 90 mass ° / 〇 or more, particularly preferably 95 quality, more preferably in order to obtain the above-mentioned materials and other materials. Kick-alloy, which does not contain the ship's welding kick, 'because it is environmentally friendly: negative: no: not limited', but the effects of the present invention are described, etc., and it is preferable to obtain the catalyst-imparting liquid of the present invention. In the present invention, it is necessary to contain a water substance and a chelating agent. In the present invention, "the concentration in the water-soluble oxime-based gold-based vehicle-imparting liquid is a suitable compound", if it is in a thixotropic gold compound, There is no particular limitation, and the hydrated gold salt, gasified gold salt, and gold sulfite sulphate in the degree of water, such as the stability of cyanago I, sulfuric acid sulfate, and the easy production of medicines. Salt, especially good for cyanide gold salt 戋 _ and Q, preferably cyanide gold I and I gold salt. It is dangerous, but as a modulation catalyst to give liquid 昉 子 子 子 子 子 子Potassium salts are particularly good. 'Kings are better with alkali metal salts, by using water-soluble gold.

匕合物的觸媒賦+ Y 銅系金屬上無膜厚不勻之均 @媒賦予液’則可取得於 上述水溶性之金化合物的::電解還原烊錫錄敷皮膜。 賦予液全體,以換算金的2亚十無特舰定’相對於觸媒 2000Ppm以下,特佳為2 較佳為^Ppm以上 勹 υρι^ 以上 1000ppma 了 u 098116843 即U下。水溶性 201002859 之金化合物的濃度過大時,於觸媒賦予液中有析出金等之就 觸媒賦予液而言不安定的情形,過小時,觸媒能力不完全且 會有引起無電解還原焊錫鍍敷未析出的情形。 雖無特別限定,但於本發明之觸媒賦予液中,實質上不含 有I巴化合物為佳。原因在於,無電解還原煤錫鍵敷不會因I巴 觸媒核而被活化,故會變成徒然含有,又,若含有鈀化合物, 則觸媒賦予液的液安定性降低,會有在觸媒賦予液中產生金 屬金沈殿的情形。 本發明中的螯合劑,若可將銅系導體電路的銅系金屬溶解 於觸媒賦予液中,則無特別限定。藉由含有螯合劑作為必須 成分,則在促進銅系金屬於觸媒賦予液中均勻溶解之同時, 可防止銅系金屬再析出,故可均勻且確實進行觸媒核的賦 予,又可防止微細佈線間因金屬附著至絕緣體所造成之微細 佈線的跨接線產生。 作為螯合劑,較佳可列舉具有亞胺基二醋酸構造或亞曱基 膦酸構造的螯合劑。作為具有此類亞胺基二醋酸構造的螯合 劑,具體而言,可列舉例如乙二胺四醋酸、羥乙基亞胺基二 醋酸、亞硝基三醋酸、羥乙基乙二胺三醋酸、二伸乙基三胺 五醋酸、三伸乙基四胺六醋酸、二羧甲基鞑胺酸、丙烷二胺 四醋酸、1,3-二胺基-2-羥丙烷四醋酸等,或該等之水溶性 鹽。作為水溶性鹽並無特別限定,可列舉鈉鹽、鉀鹽、銨鹽 等。彼等可為1種或混合使用2種以上。 098116843 9 201002859 又,作為具有亞甲基膦酸構造之螯合劑,可列舉胺基三亞 甲基膦酸、羥基亞乙基二膦酸、乙二胺四亞甲基膦酸、二伸 乙基三胺五亞甲基膦酸、六亞甲基二胺四亞甲基膦酸等或其 水溶性鹽。作為水溶性鹽並無特別限定,可列舉鈉鹽、鉀鹽、 銨鹽等。彼等可為〗種或混合使用2種以上。 其中,就安定溶解銅系金屬的作用強之觀點而言,特佳為 具有亞胺基二醋酸構造的螯合劑。 螯合劑相對於觸媒賦予液全體,以使用lg/L〜100g/L之範 圍為佳’以2g/L〜60g/L為更佳,以3g/L〜40g/L為特佳。於 螯合劑濃度過大之情形中,有時於觸媒賦予液中析出,於過 小之情形中,會有抑制微細佈線發生跨接線的效果不夠充分 之情形。 本發明之觸媒賦予液中,進一步含有「分子内具有2個 上氮之雜環化合物」為佳。使用該含有「分子内具有2個 雜環化合物」之觸顧予液所形成的無電解 鍍敷皮胺,於JL由搜μ 生空隙,可㈣、 球接合時,於焊錫内不脅 ,、Ύ使用作為良好的安裝端子。 所謂「分子内具有 具有1個以上的•• 之雜環化合物」,係 為「雜環」的化人:之凡素之具芳香族性環(以下, 與未形成雜二’於此化合物分子中形成雜環之氮 作成構成^原子合計為2個以上的化合物。 098116843 乍成構成雜環之石炭以外的元素(以下’簡述為「雜元” 10 201002859 並無特別限定,可列舉氮、氧、硫等。作為雜元素,較佳為 氮。 作為「分子内具有2個以上氮之雜環化合物」的雜環並無 特別限定,可列舉例如,D比咯環、咬喃環、β塞吩環、味σ坐環、 崎嗤環、嗟嗤環、π比β坐環、u比σ定環、σ密σ定環、外淋環、π奎琳 環、異啥°林環、味0坐環、1,2,3-三11坐環、1,2,4-三σ坐環、四嗤 環、4丨σ朵環、苯并p米嗤環、苯并4 σ坐環、苯并嗟σ坐環、苯并 三唑環等。其中,於雜環内具有1個以上氮原子的雜環為更 佳。 作為結合至雜環的取代基並無特別限定,以胺基、烷基、 烧胺基等為佳。其中特佳者為胺基。 於本發明中,作為「分子内具有2個以上氮之雜環化合 物」,可列舉π比坐、3-胺基吼σ坐、4-胺基σ比峻、5-胺基σ比嗤、 口米嗤、坐、4-胺基ρ米嗤、5-胺基味'1坐、1,2,3-三。坐、 4-胺基-1,2,3-三唑、5-胺基-1,2,3-三唑、1,2,4-三唑、3-胺基 -1,2,4-三唑、5-胺基-1,2,4-三嗤、四嗤、5-胺基四唑、2-胺基 苯并咪唑、苯并三唑等之具有5員環的雜環化合物或其烷基 取代體、胺基取代體等為佳。彼等可為1種或混合使用2 種以上。 其中,於取得前述本發明效果上特佳為咪唑、2-胺基咪 唑、4-胺基咪唑、5-胺基咪唑、1,2,4-三唑、3-胺基-1,2,4-三 σ坐、5-胺基四σ坐等。 098116843 11 201002859 「分子内具有2個以上氮之雜環化合物」的濃度並無特別 限定,相對於觸媒賦予液全體’以質量1 Oppm以上1 OOOOppm 以下為佳,且以50ppm以上5000ppm以下為特佳。此類濃 度過大時,會有生成沈澱物之情形,過小時,則在焊錫球接 合時會有易發生空隙之情形。 於本發明之觸媒賦予液中,視需要可適當選擇含有pH緩 衝劑等。作為pH緩衝劑,若為對於觸媒賦予液的特性不會 造成不良影響且可緩和pH之變動者,則無特別限定。不論 有機物或無機物,可適當配合加入酸或其鹽。具體而言,可 列舉硼酸、磷酸、焦磷酸等之無機酸;檸檬酸、醋酸、蘋果 酸、琥珀酸、酒石酸等之有機酸;或其鹽等。 本發明之觸媒賦予液為pH3以上pH9以下為佳,且以pH4 以上pH8以下為特佳。pH若過低,則會有析出金等之作為 觸媒賦予液為不安定之情形,pH若過高,則會有觸媒活性 下降並且難以進行無電解還原焊錫鍍敷之情形。 本發明之觸媒賦予液的處理溫度為l〇°C以上95°C以下為 佳,特佳為20°C以上90°C以下。又,本發明之觸媒賦予液 的處理時間為5秒鐘以上15分鐘以下為佳,特佳為10秒鐘 以上10分鐘以下。 本發明之觸媒賦予液之觸媒核金屬的載持量,即在銅系金 屬上被賦予之金量,係為〇.〇5〜3mg/dm2(0.05xl〇-5〜3x 10.5g/cm3)為佳,且以 0.1 〜2mg/dm2(0.1xl〇-5〜2xl0_5g/cm3)為 098116843 12 201002859 特佳。此範圍時’容易取得前述本發明之效果。即,作為本 發明之其他態樣之「銅系金屬上具有3mg/dm2以下(3x 10—5g/cm2以下)之金,並於其上所形成之焊錫鍍敷皮膜」,因 具有前述效果,故為佳。 於鑛金中,為了以目視可確認析出金 可稱上「鍍金」,必須有6mg/dm2(6xl(T5g/cm3,厚度30nm) 左右以上的析出量,而通常的取代鍍金係附著12mg/dm2(12 g/em ’厚度6Qnm)左右以上。即’本發明之觸媒賦予 液相較於取代無電解鑛金係使大幅少量的金附著至銅系金 =因此,財發明觸媒賦予液進行之「觸媒核金屬的賦 量方面可與「無電解鑛金」明確區別。又,藉 X明之觸媒賦予液所賦予的金, 曰 本發明之觸媒賦予液_如使_;^要形成金皮膜。 1 導體電路等之銅系金屬選擇性進:^ ^订之無電_原賴職,僅 _以將其 金屬上選擇性形成者。此處,所謂^導心路等之銅系 璃環氧、陶究、聚酿亞胺等之絕^導體電路」係於玻 屬形成電路者。㈣、金狀形成^基材上,以銅系金 可列舉鍍數、麵、Cu板之層合等。、方法並無制限定, 使用本發明之觸媒賦予液 定,依照通常之無電解鑛敷中所^理步驟並無特別限 前處理方法即可。 T之制觸媒賦予液前的 098116843 13 201002859 關於無電解還原焊錫鍍敷液並無特別限定,全部可使用。 可列舉例如至少含有水溶性錫化合物、水溶性鈦化合物及有 機錯化劑者。又,亦可含有檸檬酸(鹽)等之羧酸(鹽)、pH調 整劑等。作為該有機錯化劑,可列舉 EDTA(Ethylenediaminetetraacetic Acid,乙二胺四醋酸)、 NTA(NitrilotriaceticAcid,氨三醋酸)等之「具有亞胺基二醋 酸構造的有機錯化劑」;具有亞曱基膦酸構造之有機錯化劑 等之「含有氧化數為3價的磷之有機錯化劑」等。根據前述 之本發明中的「焊錫」定義,可含有錫以外之金屬化合物。 [實施例] 以下,列舉實施例及比較例更加具體說明本發明,但本發 明只要不超過其要旨則不被限定於此些實施例。 [實施例1〜8] <觸媒賦予液之調整> 將表1所不之「水溶性金化合物」,以換算金屬金,才 於觸媒賦讀全如質量為觸ppm,絲丨所示之「 劑」相對於觸媒賦予 卞液王體以離,於實施例4〜7" 为子内具有2個以上氮原子之崎户π人此 相對於觸媒賦予液全體 關於實施例8,將_¥轉於純Μ 調整至PH5.0 ’%製H叫之f量濃度溶解於純水。# 高液。糾,PH調整1 乳化鈉水溶液,於下降時使用鹽酸。 098116843 14 201002859 [比較例1〜2] 作為比較例1,使用將市售之令古 ^3有把之無電解還原鍍鎳用 之觸媒賦予液(KAT-450,上材工金孤八 T業股份有限公司製)調整成 通常使用之狀態者。又’作為比較例2,使用將市售之含有 鈀之無電解還原鍍鎳用之觸媒賦予液(1〇:1> Acusela,奥野製 藥股份有限公司製)調製成通常使用之狀態者。 [比較例3〜6] (} 將表1最左攔所示之化合物,以換算金屬相對於觸媒賦予 液全體以質量為刚啊、及表丨所示之螯合劑相對於觸媒 賦予液全體以2〇g/L溶解於純水,調整至pH5.〇,調製各觸 媒賦予液。pH調整係於提冑pH時使用氫氧化 於下降時使用鹽酸。 / 合液, 09δ116843 15 201002859 [表i]The catalyst of the chelating agent + Y copper-based metal has no film thickness unevenness. The "media-enhancing liquid" can be obtained from the above-mentioned water-soluble gold compound: electrolytic reduction of bismuth tin coating film. The total amount of the liquid is given to the two sub-species of the conversion of gold. The relative to the catalyst is less than 2000 Ppm, preferably 2 is preferably ^Ppm or more 勹 ιρι^ above 1000 ppma u 098116843 is U. When the concentration of the gold compound of the water-soluble 201002859 is too large, there is a case where the catalyst-imparting liquid is precipitated in the catalyst-imparting liquid, and the catalyst-imparting liquid is unstable. When the temperature is too small, the catalyst is incomplete and the electroless reduction solder may be caused. The case where plating does not precipitate. Although it is not particularly limited, it is preferable that the catalyst-imparting liquid of the present invention contains substantially no I bar compound. The reason is that the electroless reduction of the coal-tin bond is not activated by the I-bar catalyst core, so it becomes vainly contained. If the palladium compound is contained, the liquid stability of the catalyst-imparting liquid is lowered, and there is a touch. The medium gives the case where metal gold is formed in the liquid. The chelating agent in the present invention is not particularly limited as long as it can dissolve the copper-based metal of the copper-based conductor circuit in the catalyst-imparting liquid. By containing a chelating agent as an essential component, the copper-based metal can be prevented from being uniformly dissolved in the catalyst-imparting liquid, and the copper-based metal can be prevented from being re-precipitated. Therefore, the catalyst core can be uniformly and surely supplied, and the fineness can be prevented. The wiring between the wirings is caused by the jumper of the fine wiring caused by the adhesion of the metal to the insulator. As the chelating agent, a chelating agent having an iminodiacetic acid structure or a fluorenylphosphonic acid structure is preferable. Specific examples of the chelating agent having such an iminodiacetic acid structure include ethylenediaminetetraacetic acid, hydroxyethyliminodiacetic acid, nitrosotriacetic acid, and hydroxyethylethylenediaminetriacetic acid. , di-ethyltriamine pentaacetic acid, tri-ethylidenetetraamine hexaacetic acid, dicarboxymethylproline, propanediaminetetraacetic acid, 1,3-diamino-2-hydroxypropanetetraacetic acid, etc., or These water soluble salts. The water-soluble salt is not particularly limited, and examples thereof include a sodium salt, a potassium salt, and an ammonium salt. These may be used alone or in combination of two or more. 098116843 9 201002859 Further, examples of the chelating agent having a methylene phosphonic acid structure include aminotrimethylenephosphonic acid, hydroxyethylidene diphosphonic acid, ethylenediaminetetramethylenephosphonic acid, and diethylidene ethyl ester. An amine penta methylene phosphonic acid, hexamethylene diamine tetramethylene phosphonic acid or the like or a water-soluble salt thereof. The water-soluble salt is not particularly limited, and examples thereof include a sodium salt, a potassium salt, and an ammonium salt. They may be used in combination or in combination of two or more. Among them, a chelating agent having an iminodiacetic acid structure is particularly preferable from the viewpoint of enhancing the action of dissolving a copper-based metal. The chelating agent is preferably in the range of lg/L to 100 g/L, more preferably 2 g/L to 60 g/L, and particularly preferably 3 g/L to 40 g/L, based on the total amount of the catalyst-imparting liquid. When the concentration of the chelating agent is too large, it may be precipitated in the catalyst-imparting liquid. In the case where the concentration is too small, the effect of suppressing the occurrence of the jumper of the fine wiring may be insufficient. In the catalyst-imparting liquid of the present invention, it is preferred to further contain "a heterocyclic compound having two nitrogens in the molecule". The electroless plating nitrile formed by the contact liquid containing "two heterocyclic compounds in the molecule" is used to form a void in the JL, and (4), when the ball is bonded, the solder is not threatened, ΎUse as a good mounting terminal. The "heterocyclic compound having one or more molecules in the molecule" is a "heterocyclic ring" of a chemical person: an aromatic ring (hereinafter, with no impurity formed in the compound molecule) In the case of a heterocyclic nitrogen, a total of two or more compounds are formed. 098116843 An element other than the carbonaceous material constituting the hetero ring (hereinafter referred to as "heterocarbon" 10 201002859 is not particularly limited, and examples thereof include nitrogen. The heterocyclic element is preferably a nitrogen atom. The heterocyclic ring having a "heterocyclic compound having two or more nitrogens in the molecule" is not particularly limited, and examples thereof include a D-ratio ring, a whistle ring, and β. The ceramide ring, the taste σ ring, the rugged ring, the anthracene ring, the π ratio β ring, the u ratio σ ring, the σ dense σ ring, the outer ring, the π quinidine ring, the isoindole ring, Odor 0 seat ring, 1,2,3-three 11 seat ring, 1,2,4-tri-sigma ring, four-ring ring, 4 丨 σ ring, benzo-p-methane ring, benzo 4 σ ring a benzopyrene sine ring, a benzotriazole ring, etc., wherein a heterocyclic ring having one or more nitrogen atoms in the hetero ring is more preferred. In the present invention, the amine group, the alkyl group, the alkyl group, and the like are preferably an amine group. In the present invention, the "heterocyclic compound having two or more nitrogens in the molecule" may be exemplified by π ratio. 3-amino 吼σ sitting, 4-amino σ ratio, 5-amino σ ratio 口, 嗤米嗤, sitting, 4-amino ρ rice 嗤, 5-amine based '1 sitting, 1, 2 , 3-III. Sodium, 4-amino-1,2,3-triazole, 5-amino-1,2,3-triazole, 1,2,4-triazole, 3-amino-1 , 2,4-triazole, 5-amino-1,2,4-triazole, tetraterpene, 5-aminotetrazole, 2-aminobenzimidazole, benzotriazole, etc. The heterocyclic compound, an alkyl group-substituted product thereof, or an amino group-substituted product, etc., may be used alone or in combination of two or more. Among them, imidazole and 2-amino group are particularly preferable in obtaining the effects of the present invention described above. Imidazole, 4-aminoimidazole, 5-aminoimidazole, 1,2,4-triazole, 3-amino-1,2,4-tris-sigma, 5-aminotetrazole, etc. 098116843 11 201002859 " The concentration of the heterocyclic compound having two or more nitrogen atoms in the molecule is not particularly limited, and is preferably 1 ppm or more and 1 OOO ppm or less with respect to the total amount of the catalyst-imparting liquid, and is 50 p or less. It is particularly preferable that pm or more is 5,000 ppm or less. When such a concentration is too large, a precipitate may be formed. When the concentration is too small, voids may occur when solder balls are joined. In the catalyst-imparting liquid of the present invention, The pH buffering agent is not particularly limited as long as it does not adversely affect the properties of the catalyst-imparting liquid and can alleviate the change in pH. The organic or inorganic substance can be appropriately blended. The acid or a salt thereof is added, and specific examples thereof include inorganic acids such as boric acid, phosphoric acid, and pyrophosphoric acid; organic acids such as citric acid, acetic acid, malic acid, succinic acid, and tartaric acid; and salts thereof. The catalyst-imparting liquid of the present invention is preferably pH 3 or higher and pH 9 or lower, and is preferably pH 4 or higher and pH 8 or lower. If the pH is too low, the catalyst-imparting liquid may be unstable as a precipitated gold. If the pH is too high, the catalytic activity may be lowered and electroless reduction solder plating may be difficult. The treatment temperature of the catalyst-imparting liquid of the present invention is preferably from 10 ° C to 95 ° C, more preferably from 20 ° C to 90 ° C. Further, the treatment time of the catalyst-imparting liquid of the present invention is preferably 5 seconds or longer and 15 minutes or shorter, and more preferably 10 seconds or longer and 10 minutes or shorter. The amount of catalyst metal supported by the catalyst-imparting liquid of the present invention, that is, the amount of gold imparted on the copper-based metal, is 〜. 5 to 3 mg/dm 2 (0.05 x l 〇 -5 to 3 x 10.5 g / Cm3) is preferred, and is preferably 098116843 12 201002859 with 0.1 〜2 mg/dm2 (0.1xl 〇-5~2xl0_5g/cm3). In this range, the effects of the present invention described above are easily obtained. In other words, the "gold-plated metal having 3 mg/dm 2 or less (3 x 10 - 5 g/cm 2 or less) and the solder plating film formed thereon" as the other aspect of the present invention has the aforementioned effects. Therefore, it is better. In the gold, it is necessary to visually confirm that the gold is "gold plating", and it is necessary to have a precipitation amount of 6 mg/dm2 (6xl (T5g/cm3, thickness: 30 nm) or more, and the usual substitution gold plating is 12 mg/dm2). (12 g/em 'thickness: 6Qnm) or so. That is, 'the catalyst of the present invention imparts a liquid phase to the copper-based gold compared to the substituted electroless gold alloy. Therefore, the catalyst liquid is supplied. The amount of the catalyst-based nuclear metal can be clearly distinguished from the "electroless gold". In addition, the gold given by the liquid of the catalyst of X Ming is used to give the liquid to the catalyst of the present invention. The gold film is formed. 1 The copper-based metal of the conductor circuit is selectively selected: ^^There is no electricity. The original 赖 赖 _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ Epoxy, ceramics, and polyaniline, etc. are based on the glass-forming circuit. (4) On the gold-formed substrate, the copper-based gold can be used to enumerate the number of plates, the surface, and the Cu plate. The method is not limited, and the catalyst is applied by using the catalyst of the present invention, according to the usual electroless mineral deposit. The treatment step is not particularly limited to the pretreatment method. 098116843 13 201002859 before the application of the catalyst to the liquid is not particularly limited, and all of them can be used. In addition, a carboxylic acid (salt) such as citric acid (salt), a pH adjuster, etc. may be contained, and EDTA (Ethylenediaminetetraacetic Acid) may be mentioned as the organic compounding agent. "Ethylenediaminetetraacetic acid), NTA (Nitrilotriacetic Acid, Ammonia Triacetate), etc. "Organic error-modifying agent having an iminodiacetic acid structure"; "Organic oxidation agent having a fluorenylphosphonic acid structure" The metal compound which is a trivalent phosphorus organic compound or the like may contain a metal compound other than tin according to the definition of "solder" in the above-mentioned invention. [Examples] Hereinafter, the examples and comparative examples will be more specifically described. The present invention is not limited to the embodiments as long as it does not exceed the gist of the invention. [Examples 1 to 8] <Adjustment of catalyst-imparting liquid> "In the case of the material", in order to convert the metal gold, the catalyst is read as the mass is in ppm, and the "agent" shown in the silk is separated from the catalyst by the sputum, in the examples 4~7" For the whole of the catalyst-providing liquid having two or more nitrogen atoms, the total amount of the catalyst-imparting liquid is adjusted to pH 5.0 with the total amount of the catalyst-imparting liquid. In Example, the amount of H is dissolved in pure water. #高液. Correction, pH adjustment 1 Emulsified sodium aqueous solution, hydrochloric acid was used when it was lowered. 098116843 14 201002859 [Comparative Example 1 to 2] As Comparative Example 1, the commercially available No. 3 was used for electroless reduction. The catalyst-imparting liquid for nickel plating (KAT-450, manufactured by Ueki K.K., Ltd.) is adjusted to the state of normal use. Further, as a comparative example 2, a commercially available catalyst-free liquid for electroless nickel plating containing palladium (1:1 > Acusela, manufactured by Okuno Pharmaceutical Co., Ltd.) was used to prepare a state of normal use. [Comparative Examples 3 to 6] (} The compound shown in the leftmost column of Table 1 is a chelating agent with respect to the catalyst as indicated by the mass of the conversion metal to the catalyst-imparting liquid. The whole solution was dissolved in pure water at 2 〇g/L, and adjusted to pH 5. 〇 to prepare each catalyst-imparting liquid. The pH adjustment was carried out using hydrochloric acid when the pH was lowered, and hydrochloric acid was used. / Liquid mixture, 09δ116843 15 201002859 [ Table i]

No. 水溶性之金化合物 螯合劑 於分子内具有氮原 子之雜環化合物 實施例1 氰化第一金钟 乙二胺四醋酸 — 實施例2 氰化第一金鉀 三伸乙基四胺六醋酸 — 實施例3 氰化第一金鉀 二伸乙基三胺五醋酸 — 實施例4 氰化第一金鉀 乙二胺四醋酸 口米U坐 (分子内氮為2個) 實施例5 氰化第一金鉀 乙二胺四醋酸 2-胺基咪唑 (分子内氮為3個) 實施例6 氰化第一金鉀 乙二胺四醋酸 3-胺基-1,2,4-三唑 (分子内氮為4個) 實施例7 氰化第一金鉀 乙二胺四醋酸 5-胺基四唑 (分子内氮為5個) 實施例8 氰化第一金鉀 乙二胺四醋酸 吡咬 (分子内氮為1個) 比較例1 市販之活化劑KAT-450 (上村工業股份有限公司製) — — 比較例2 市販之活化劑ICPAcusela (奥野製藥股份有限公司製) — — 比較例3 氣化鈀 — 比較例4 氣化1巴 乙二胺四醋酸 — 比較例5 氰化1巴 — — 比較例6 氰化第一金鉀 — — [評估] 將實施例1〜8、比較例1〜6所得之觸媒賦予液,使用下列 之無電解還原焊錫鍍敷液(a)及(b),以表2所示之步驟進行 無電解還原焊錫鍍敷,分別以下列方法評估所得之無電解還 原焊錫鍍敷皮膜。 <無電解還原焊錫鍍敷液之調製〉 相對於無電解還原焊錫鑛敷液全體,以下列所示之比例將 各成分溶解於純水,調製無電解還原焊錫鍍敷液(a)及(b)。 另外,含有結晶水之情形,係為換算成「無結晶水」的份量。 16 098116843 201002859 無電解還原焊錫鍍敷液(a)No. Water-soluble gold compound chelating agent Heterocyclic compound having a nitrogen atom in the molecule Example 1 Cyanidation First Admiral Ethylenediaminetetraacetic acid - Example 2 Cyanidation of the first gold potassium tri-ethyltetramine hexaacetate - Example 3 Cyanidation of the first gold potassium di-ethyltriamine pentaacetic acid - Example 4 Cyanidation of the first gold potassium ethylenediamine tetraacetic acid mouth U sit (intramolecular nitrogen is 2) Example 5 Cyanide One gold potassium ethylenediamine tetraacetic acid 2-aminoimidazole (three intramolecular nitrogens) Example 6 Cyanidation of the first gold potassium ethylenediamine tetraacetic acid 3-amino-1,2,4-triazole (molecule Example 4: Cyanidation of the first gold potassium ethylenediamine tetraacetic acid 5-aminotetrazole (5 intramolecular nitrogen) Example 8 Cyanidation of the first gold potassium ethylenediamine tetraacetate pyridine bite (1 in the intramolecular nitrogen) Comparative Example 1 Activator KAT-450 (manufactured by Uemura Kogyo Co., Ltd.) - Comparative Example 2 Activator of the market, ICPAcusela (manufactured by Okuno Pharmaceutical Co., Ltd.) - Comparative Example 3 Palladium - Comparative Example 4 Gasification 1 bar ethylenediaminetetraacetic acid - Comparative Example 5 Cyanide 1 bar - Comparative Example 6 Cyanide One gold potassium - [Evaluation] The catalyst-donating liquids obtained in Examples 1 to 8 and Comparative Examples 1 to 6 were used, and the following electroless reduction solder plating solutions (a) and (b) were used, as shown in Table 2. The steps were carried out by electroless reduction solder plating, and the obtained electroless reduction solder plating film was evaluated by the following method. <Preparation of Electroless Reduction Solder Plating Solution> The components are dissolved in pure water in the ratio shown below to prepare the electroless reduction solder plating solution (a) and b). In addition, in the case of containing crystal water, it is a part converted into "no crystal water". 16 098116843 201002859 Electroless reduction solder plating solution (a)

檸檬酸三鈉 100g/LTrisodium citrate 100g/L

乙二胺四醋酸二納 30g/LEthylenediamine tetraacetate di-nano 30g/L

亞硝基三醋酸 38g/LNitrosotriacetic acid 38g/L

氣化錫 18g/LGasification tin 18g/L

氯化鉛 0.4g/LLead chloride 0.4g/L

三氯化鈦 6g/LTitanium trichloride 6g/L

無電解還原焊錫鍍敷液(b)Electroless reduction solder plating solution (b)

甲烧石黃酸錫 10g/LSodium sulphate 10g/L

亞硝基三亞甲基膦酸 50g/LNitrosotrimethylenephosphonic acid 50g/L

檸檬酸鉀 30g/LPotassium citrate 30g/L

三氯化鈦 5g/L &lt;評估用基板之製作&gt; (§平估基板1) 製作圖1及圖2所示形態之評估用基板。使用於縱4〇mm X橫4〇mmx厚度1.0mm之聚醯亞胺樹脂製之基板上,將直徑 〇.76mm之圓形銅墊以橫盤格狀排列者,且各銅墊周邊以光 焊劑光阻所被覆者。各個鋼墊為以厚度以m之銅所形成, 且光焊劑光阻的厚度為心m、焊錫球塾的開口部直徑為 0.62mm ° (評估基板2) 40mmx 橫 作成圖3及圖4所示形態之評價基板。於縱 098116843 17 201002859 40mmx厚度1.0mm之聚It亞胺樹脂製基板,將寬80 /z mx厚 度40/zm之銅佈線以具有寬120//m之間隔排列者。 &lt;無電解還原焊錫鍍敷之析出性的評估方法&gt; 使用實施例1〜8、比較例1〜6所得之觸媒賦予液及無電解 還原焊錫鍍敷液(a)或(b),並使用上述評估基板1和評估基 板2,以下列表2之處理條件進行無電解還原焊錫鍍敷。另 外,以各觸媒賦予液的處理條件,以觸媒核金屬金之載持量 為 0.6mg/dm2(0.6xlCT5g/cm3)之條件進行。 [表2] 步 &lt;驟 處理藥劑 處理條件 脫脂 PAC-200 (股)Mulata 製) 50°Cx5 分 水洗 軟式#刻 MEOX (股)Mulata 製) 30°Cxl 分 水洗 酸洗 10 %硫酸 室溫x30秒 水洗 觸媒賦予液 各實施例及 比較例所得者 65°Cx2 分 水洗 無電解還原 焊錫鍍敷 上記之(a)或(b) 65t:x60 分 上述所得之無電解還原焊錫鍍敷皮膜分別以下列方法評 估。 〈無電解還原焊錫鍍敷之析出均勻性的評估方法〉 將評價基板1之焊錫球墊銅上所形成之無電解還原焊錫 皮膜的膜厚,使用螢光X射線膜厚計(SEA5120,精工儀器公 司製),測定10點,於比較平均膜厚、最大膜厚及最小膜厚 下,評估無電解還原焊錫鍍敷的析出均勻性。又,將最小膜 098116843 18 201002859 厚之測定值為極小者評價為「析出不句」。 〈微細佈線之跨接線的評估方法〉 將義基板2之鋼佈線以掃描型電子顯微鏡⑽·,日 衣乍斤衣)(以下簡稱為「⑽」)觀察,進行微細佈線之跨 接線的評估。於聚私胺龍上無頓還料職無析出, 僅於銅佈線表面形成無電解還原焊錫艘敷皮膜者判定為「良 好」「且於伞醯亞胺樹脂上察見無電解還原焊錫析出者判定 (、為*良」作為判定「良好」之判定基準(代表例)之實施 例1 If㈣觀察^片不於圖5,作為狀「不良」之判定基 準(代表例)之比%^例6情形的觀察照片示於圖6。 〈發生空隙之評估方法〉 使用別貝基板卜進行焊錫球接合時發生空隙之評估。將 上述無電解還原焊錫錢敷之析出性評估同樣處理且根據表 2之處理於球墊上形成焊錫職皮膜的評估用基板卜以IK U ^進行5小時加熱。此加熱條件為假設施加至基板之安裝步 驟的熱處理。對加熱處理後之基板的球墊塗佈助焊劑,搭載 直徑0. 76mm之Sn-Ag-Cu無鉛焊錫球,並將其以迴流爐裴置 (RF-430-M2、股份有限公司日本puise技術研究所公司製) 融黏。 將焊錫球融黏的評價基板1以15mmxl5mm左右之大小切斷 以便於操作,並設置於冷埋入樹脂用之成形模型,並於此成 形模型中流入冷埋入樹脂(No. 105,丸本Stolus公司製)和 098116843 19 201002859 其硬1匕劑使硬化。將硬化之樣品使用批研磨紙和研磨機予 以研磨,使剖面露出以察 見砵錫球與球墊的接合部剖面。 制二八,球剖面以婦描型電子顯微鏡⑶4300,日本 衣作所A司製)觀察5個球, 為「無」,於焊錫球内即使觀々球内未觀測到空隙則视 於觀” “ 到1個空隙亦視為「有」。又, 、親,τ、节取大的空隙直徑於 為判定「盔之并矣彳丨^ ,、表4中以加括弧表示。作 作為判^ 貫_ 4情形的觀察㈣示於圖7, ^ ^之代表例之比較例1情形的觀察照片示於圖 人4之結果關定般,含有本發明之水溶性金化 5物和螯,作為必須成分的觸媒賦予液,具有 ^ 丁…、電解還原焊錫鑛敷上充分的觸媒作用 無微:佈線之跨接線,且均㈣烊錫紐皮膜。^ 5,另因一為^ ’不含有水雜金化合物之比_ 1至比較例 薄的膜Γ原反應的開始進行稀疏,故發线_厚部分變 =Γ:又’即使含有水溶性之金化合物,但不含有 、匕較例0,於絕緣體部分發生焊錫析出, 謂跨接線之基板線不良。 仏生所 婢用含有分子内具有2個以上氣之雜環化合物的觸 系賦予液所形成的無電解還原焊锡鍍敷皮膜,於其皮臈上進 行焊錫球接合時,可知焊錫内並未發生空隙(實施例心乃。 [以無電解還原焊錫鍍敷液(a)之評估] 098116843 20 201002859 [表3]Titanium trichloride 5 g/L &lt;Production of evaluation substrate&gt; (§ Flat evaluation of substrate 1) The evaluation substrate of the form shown in Fig. 1 and Fig. 2 was produced. It is used on a substrate made of polytheneimide resin having a length of 4 mm x 4 mm x mm x 1.0 mm thick, and a circular copper pad having a diameter of 76.76 mm is arranged in a horizontal grid shape, and each copper pad is surrounded by light. The solder resist is covered by the solder. Each steel pad is formed of copper having a thickness of m, and the thickness of the photoresist of the soldering agent is the center m, and the diameter of the opening of the solder ball is 0.62 mm ° (evaluation substrate 2) 40 mmx horizontally as shown in FIG. 3 and FIG. Evaluation of the morphology of the substrate. In the longitudinal direction 098116843 17 201002859 40mm x 1.0mm thick polyimine resin substrate, copper wiring width 80 / z mx thickness 40 / zm is arranged at a width of 120 / / m. &lt;Method for Evaluating Precipitability of Electroless Reduction Solder Plating&gt; Using the catalyst-imparting liquids obtained in Examples 1 to 8 and Comparative Examples 1 to 6 and the electroless reduction solder plating solution (a) or (b), The electroless reduction solder plating was performed using the above-described evaluation substrate 1 and evaluation substrate 2, and the processing conditions of the following Table 2. Further, the treatment conditions of the respective catalyst-imparting liquids were carried out under the conditions of a carrier gold metal gold loading of 0.6 mg/dm2 (0.6 x 1 CT5 g/cm3). [Table 2] Step &lt;Split treatment agent treatment conditions Defatting PAC-200 (unit) Mulata system) 50 °Cx5 water wash soft type #刻 MEOX (股)Mulata system) 30 °Cxl water wash pickling 10% sulfuric acid room temperature x30 (2) or (b) 65t: x60 points of the electroless reduction solder plating film obtained as described above in each of the examples and the comparative examples obtained at 65 ° C x 2 parts of the electroless reduction solder plating. Column method evaluation. <Evaluation Method for Precipitation Uniformity of Electroless Reduction Solder Plating> The film thickness of the electroless reduction solder film formed on the solder ball pad copper of the substrate 1 was evaluated, and a fluorescent X-ray film thickness meter (SEA 5120, Seiko Instruments) was used. Co., Ltd.), 10 points were measured, and the precipitation uniformity of the electroless reduction solder plating was evaluated under the comparison of the average film thickness, the maximum film thickness, and the minimum film thickness. Further, the minimum measurement value of the minimum film 098116843 18 201002859 was evaluated as "precipitation". <Evaluation method of the jumper of the fine wiring> The steel wiring of the board 2 is observed by a scanning electron microscope (10), a Japanese clothing (hereinafter referred to as "(10)"), and the evaluation of the jumper of the fine wiring is performed. On the poly-polyamine, there was no precipitation in the material, and only the surface of the copper wiring formed an electroless reduction solder coating was judged as "good" and the non-electrolytic reduction solder precipitated on the umbrella imine resin. In the first example, the judgment (the representative example) of the determination of "good" is used as the criterion (denoted example) for determining "good". If the observation is not shown in Fig. 5, the ratio of the criterion (representative example) of the "defect" is %^example 6 The observation photograph of the situation is shown in Fig. 6. <Evaluation method of occurrence of voids> Evaluation of voids occurred when solder ball bonding was performed using a Bebe substrate. The evaluation of the precipitation of the above-mentioned electroless reduction solder paste was similarly treated and according to Table 2 The substrate for evaluation for forming a solder film on the ball pad is heated by IK U ^ for 5 hours. This heating condition is a heat treatment assuming a mounting step applied to the substrate. The flux pad is applied to the ball pad of the heat-treated substrate, A Sn-Ag-Cu lead-free solder ball with a diameter of 0.76 mm was used, and it was melted in a reflow oven (RF-430-M2, manufactured by Japan Puise Technology Co., Ltd.). The solder ball was melted. Comment The substrate 1 was cut to a size of about 15 mm x 15 mm to facilitate the operation, and was placed in a molding mold for cold-embedded resin, and a cold-embedded resin (No. 105, manufactured by Marumoto Stolus Co., Ltd.) and 098116843 19 were poured into the molding model. 201002859 The hardening agent hardens. The hardened sample is ground using a batch of abrasive paper and a grinder to expose the profile to see the joint section of the tin ball and the ball pad. Electron Microscope (3) 4300, manufactured by Nippon Seisakusho Co., Ltd.) Observe 5 balls, which is "None". Even if no gap is observed in the solder ball, it will be regarded as "a gap". "." In addition, the diameter of the gap between the pro, the τ, and the knuckle is judged as "the helmet of the helmet, and the brackets in Table 4 are shown in parentheses. The observation (4) of the case of the judgment _ 4 is shown in Fig. 7. The observation photograph of the case of Comparative Example 1 of the representative example is shown in Fig. 4, and the catalyst-containing liquid containing the water-soluble gold chemical substance 5 and the chelate of the present invention as an essential component has a ... The electrocatalytic reduction of solder deposits has sufficient effect on the catalyst: no wiring of the wiring, and (4) bismuth film. ^ 5, another factor is ^ ' does not contain the ratio of water-rich compounds _ 1 to the comparative example The thin film Γ original reaction begins to be sparse, so the hairline _ thick part becomes = Γ: 'even if it contains a water-soluble gold compound, but does not contain, 匕 is compared with the case 0, solder deposits occur in the insulator part, that is, jumper The substrate is defective. The electroless reduction solder plating film formed by the contact system containing a heterocyclic compound having two or more gases in the molecule is used for solder ball bonding on the skin. There is no void in the solder (the embodiment is the core. [Using electroless reduction welding Evaluation plating solution (a) of] 098 116 843 20 201 002 859 [Table 3]

No. 無電解還原焊錫鍍敷之析出性評估 發生空隙之評估 (最大空隙徑) 析出均勻性評〃 if ( ^ m) 微細佈線之 跨接線評估 平均膜厚 最大膜厚 最小膜厚 實施例1 1.0 1.2 0.9 良好 有(8 # m) 實施例2 1.0 1.2 0.8 良好 有(7 # m) 實施例3 1.0 1.1 0.9 良好 有(8 # m) 實施例4 1.0 1.2 0.8 良好 無 實施例5 1.0 1.1 0.9 良好 無 實施例6 1.0 1.2 0.8 良好 無 實施例7 1.0 1.2 0.9 良好 無 實施例8 1.0 1.1 0.9 良好 有(7 //m) 比較例1 0.5 0.7 〇.1(析出不勻) 良好 有(16#111) 比較例2 0.5 0.7 〇.1(析出不勻) 良好 有(lSym) 比較例3 0.5 0.7 〇.1(析出不勻) 良好 有(15//m) 比較例4 0.5 0.7 〇.1(析出不勻) 良好 有(16#111) 比較例5 0.5 0.7 〇.1(析出不勻) 良好 有(17#m) 比較例6 0.9 1.0 0.7 不良 有(16#111)No. Evaluation of the precipitation of electroless reduction solder plating. Evaluation of voids (maximum void diameter) Evaluation of precipitation uniformity if ( ^ m) Evaluation of the average thickness of the microwire wiring jumper The maximum film thickness Minimum film thickness Example 1 1.0 1.2 0.9 Good Yes (8 # m) Example 2 1.0 1.2 0.8 Good Yes (7 # m) Example 3 1.0 1.1 0.9 Good Yes (8 # m) Example 4 1.0 1.2 0.8 Good No Example 5 1.0 1.1 0.9 Good None Example 6 1.0 1.2 0.8 Good No Example 7 1.0 1.2 0.9 Good No Example 8 1.0 1.1 0.9 Good (7 //m) Comparative Example 1 0.5 0.7 〇.1 (uneven precipitation) Good (16#111 Comparative Example 2 0.5 0.7 〇.1 (uneven precipitation) Good (lSym) Comparative Example 3 0.5 0.7 〇.1 (uneven precipitation) Good (15//m) Comparative Example 4 0.5 0.7 〇.1 (precipitation) Uneven) Good (16#111) Comparative Example 5 0.5 0.7 〇.1 (uneven precipitation) Good (17#m) Comparative Example 6 0.9 1.0 0.7 Bad (16#111)

098116843 21 201002859 [以無電解還原焊錫鍍敷液(b)之評估 [表4]098116843 21 201002859 [Evaluation of electroless reduction solder plating solution (b) [Table 4]

(產業上之可利用性) 本發明之無電解還原焊錫錢敷用之觸媒賦予液於 屬上係無膜料勻,為均㈣,可取得無跨接線的自、金 原焊錫職錢,又,村―_合時發生㈣=解還 銅系導體電路焊錫接合等所用之所有領域中廣泛彻可於 本案為根據屬年5月21日申請之日本專利 2008-133701,其申請的全邱由6 月又特願 甲月 4内容於此處引用,並且以太安 發明之說明書揭示型式併入。 不茶 【圖式簡單說明】 圖1為本發明以實施例及比較例所使用之評價基板1的平 面圖。 卞 098116843 22 201002859 圖2為本發明以實施例及比較例所使用之評價基板1的剖 面圖。 圖3為本發明以實施例及比較例所使用之評價基板2的平 面圖。 圖4為本發明以實施例及比較例所使用之評價基板2的剖 面圖。 圖5為示出以微細佈線之跨接線評價判定為「良好」之判 定基準的SEM照片(100倍),係為實施例1之SEM照片例 (100 倍)。 圖6為示出以微細佈線之跨接線評價判定為「不良」之判 定基準的SEM照片(100倍),係為比較例6之SEM照片例 (100 倍) 圖7為示出以發生空隙評價判定為「無」之判定基準的 SEM照片(5000倍),係為實施例4之SEM照片例(5000倍)。 圖8為示出以發生空隙評價判定為「有」之判定基準的 SEM照片(5000倍),係為比較例1之SEM照片例(5000倍)。 098116843 23(Industrial Applicability) The catalyst-imparting liquid for the electroless reduction soldering of the present invention is uniform in the genus, and is uniform (four), and can obtain the self-free and gold-origin soldering service without the jumper, and , village _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ In June, the content of the special August 4th is quoted here, and is incorporated in the specification of the invention of Taian. [Brief Description of the Drawings] Fig. 1 is a plan view showing the evaluation substrate 1 used in the examples and comparative examples of the present invention. 098 098116843 22 201002859 Fig. 2 is a cross-sectional view showing the evaluation substrate 1 used in the examples and comparative examples of the present invention. Fig. 3 is a plan view showing the evaluation substrate 2 used in the examples and comparative examples of the present invention. Fig. 4 is a cross-sectional view showing the evaluation substrate 2 used in the examples and comparative examples of the present invention. Fig. 5 is a SEM photograph (100 magnifications) showing a criterion for determining "good" by the evaluation of the jumper of the fine wiring, and is an example of SEM photograph (100 times) of Example 1. 6 is an SEM photograph (100 times) which is a criterion for judging the determination of "defect" in the evaluation of the jumper of the fine wiring, and is an example of the SEM photograph of Comparative Example 6 (100 times). FIG. 7 is a view showing the occurrence of voids. The SEM photograph (5000 times) which is a criterion for judging "none" is an example of SEM photograph (5000 times) of Example 4. Fig. 8 is a SEM photograph (5000 magnifications) showing a criterion for determining that the void evaluation is "Yes", and is an SEM photograph example (5000 magnifications) of Comparative Example 1. 098116843 23

Claims (1)

201002859 七、申請專利範圍: 1·-種觸媒賦予液,制以於鋼系 焊錫鑛敷者,其特徵為,含有水之 H 1還原 2. 如申請專義第_二=== 有分子内具有2個以上氮原子之雜環化合物。 M 3. 如申請專利範圍第i項之觸媒賦讀, 性之金化合物為氰化金鹽。 八 述水洛 4. 如申請專利範圍第1至3 中,上述螯合料W其 頁之觸媒賦予液,其 d為具有亞私基二醋酸構造的螯合劑。 請專利範圍第1至3項中任-項之觸媒賦予液’盆 中,貫質上不含有鈀化合物。 八 6.如申請專利制第4項之觸媒賦予液 含有鈀化合物。 μ貝上不 範膜之製造方法,其特徵為使用申請專利 、任項之觸媒賦予液,於銅系金屬上 無電解逛原焊錫鍍敷。 丁 二:種47鐘敷皮膜之製造方法,其特徵為使用申請專利 項之觸翻讀,於銅系金屬上進行無電解還原谭 錫錢敷。 9. 一種焊錫鑛敷皮膜 ㈣之“方法,其特徵為制申請專利 :、之觸媒賦予液,於銅系金屬上進行無電解還原嬋 錫鐘敷。 098116843 24 201002859 10. —種銅系金屬上之焊錫鍍敷皮膜,其特徵為使用申請 專利乾圍第1至3項中任-項之觸媒賦讀,進行無電解還 原知錫鑛敷而得。 11. 一種銅系金屬上之焊錫鍍敷皮膜,其特徵為使用申請 專利範圍第4項之觸制普,進行無電解還原焊錫缝: 得。 ( 12·-種銅系金屬上之焊錫魏皮膜,其特徵為使用申請 專利範圍第5項之觸媒料液,進行無電解還原焊錫錢敷: 得。 又 13.-種銅系金屬上之焊錫職皮膜,其特徵為使用申试 =利範圍第6項之觸媒賦讀,進行無電解還原焊錫鑛敷: 得。 14·-種焊錫職皮膜,其特徵為於銅系金屬上具有3 lO'/cm2以下之金,並於其上形成而成。 ’、X 098116843 25201002859 VII. Patent application scope: 1·- Kind of catalyst-donating liquid, made by steel-based solder ore deposit, characterized by H 1 reduction containing water 2. If applying for special _ 2 === A heterocyclic compound having two or more nitrogen atoms therein. M 3. If the catalyst is read in the scope of patent application, the gold compound is a gold cyanide salt. 8. Water sulphate 4. In the first to third patent applications, the above-mentioned chelating agent W is a catalyst-imparting liquid, and d is a chelating agent having a sub-private diacetate structure. In the catalyst-providing liquid's tank of any of the first to third aspects of the patent range, the palladium compound is not contained in the permeate. 8. If the catalyst-donating liquid of the fourth application of the patent system contains a palladium compound. The manufacturing method of the film on the μ shell is characterized in that the patent application and the catalyst-donating liquid of any one are used, and the original solder plating is performed on the copper-based metal. Ding 2: A method for manufacturing a 47-hour coating film, which is characterized in that it is subjected to electroless reduction of Tan Xi Qian on a copper-based metal by using a touch-reading of the patent application. 9. A method for soldering a tin film (4), which is characterized by a patent application: a catalyst-donating liquid, and an electroless reduction of bismuth tin on a copper-based metal. 098116843 24 201002859 10. A copper-based metal The solder plating film on the top is characterized by using the catalyst of any one of the first to third items of the patent application, and performing the electroless reduction of the known tin ore. 11. A solder on a copper-based metal The plating film is characterized in that it is subjected to an electroless reduction solder joint using the touch method of the fourth item of the patent application: (12. - A solder film on a copper-based metal, which is characterized by the use of the patent scope 5 kinds of catalyst liquid, electroless reduction soldering money: get. Also 13.- kinds of copper-based metal soldering film, which is characterized by the use of the test = the scope of the sixth item of the catalyst, The electroless reduction soldering deposit is obtained: 14·- soldering film, which is characterized by having gold of 3 lO'/cm2 or less on the copper-based metal and formed thereon. ', X 098116843 25
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KR101197987B1 (en) * 2010-08-18 2012-11-05 삼성전기주식회사 Plating solution for forming tin alloy and method for forming tin alloy film using the same
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