201000992 九、發明說明： 【發明所屬之技術領域】 本發明係讎啦路射法，制是—種液晶齡面板的檢測 電路與方法。 【先前技術】 液晶顯示面板(LCD _)於出薇之前，所需經過的檢測過程，會隨著 使用不同的檢測設備而需設計不同的檢測電路之佈線。傳統上，不論是哪 -纖測電路的舰，在-般面板_完概，皆需顧雷射洲的製程， 用以切斷檢測電路與面板走線，使後續忙在點附後，不至於產生訊號錯誤 的問題。 然而，增加雷射切割的製程除了容易降低產品的產出率之外，在切割 時所產生的錄也容易污黯；再者，更鮮增加雷射切誠台的採蹲 成本。因此，f知技射提出在制電财包含㈣簡，於短路佈線與 掃描線、資料線之間加入控制開關，巾在測試時讓控制開關導通，待測試 結束後則讓控侧騎路。如此，便可以省去舰上使用雷射切觸步驟， 可得到更為簡化的製程與If低成本的功效。 利用控制開關雖可省略檢測完畢後的雷射切割製程，然而由於液晶顯 厂、面板條掃&線與資料線，而每—條條掃描線與資料線便需連接 一個控制開關’因此檢測電路中需具有多個控制開關。由於檢舰號是透 過控制開I,、:後ί懷n顯示面板内的丫鋒描線與m透過檢測訊號 而:試掃备線與祕線交集之處，用以控制各個畫素恤e】)顯示的薄膜電晶 201000992 體_ film transistor ’ τττ)之運作是否正常。而在控制開關為魔大的數目之 下’ S其中某-個或少數幾個控制開關發生異常時，將使得某幾個晝素無 法正常顯示檢測訊號，如此容易讓檢測人Μ或檢測設備判斷為掃描線、資 料線或TFT開關發生異常，而造成誤判報廢實際上功能正常之顯示面板。 因此’如何改善習知技術中液晶顯示面板的檢測電路所衍生之問題， 為一亟待解決的議題。 【發明内容】 有鑑於此本發明提出-種液晶顯示面板的檢測電路與方法。當控制開 關中有某-個發生異常時，藉由本發明所提出之檢測電路或方法，仍可輕 易完成正常的檢測步驟’不會因為誤判而報廢功能正f之顯示面板，進而 提升液晶顯示面板的檢測效率以及產出良率。 本發明提出-驗晶顯示面板的檢職路’用赌測具有複數個驅動 單元與複數條訊號線之液晶顯示面板，該檢測電路包含複數個第一接合 墊、複數個第二接合墊、複數個控制開關以及一連接模組。複數個第一接 &墊为別對應親接訊號線；複數個第二接合塾轉接於至少一個測試墊；複 數個控制開關電性連接於對應之第一接合墊與第二接合墊之間，用來傳送 由測試墊提供之測試訊號至液晶顯示面板内；連接模組配置在控制開關周 圍，當控制開關其中之一發生異常時，用來傳送測試訊號。 本發明亦提出一種液晶顯示面板的檢測方法，用以檢測具有複數條訊 號線之液晶顯示面板’該檢測方法包含下列步驟：提供複數個第一接合墊， 並對應耦接該些訊號線至該些第一接合墊；提供複數個第二接合墊，並耦 6 201000992 接於至少一個測試墊；提供複數個控制開關，並藉由該些控制開關電性連 接對應之該些第一接合墊與該些第二接合墊，傳送由測試墊提供之測試訊 號至該液晶顯示面板内；以及當該些控制開關其中之一控制開關發生異常 時’提供一連接模組取代異常之控制開關以傳送該測試訊號。 有關本發明的較佳實施例及其功效，茲配合圖式說明如後。 【實施方式】 °月參知'「第1圖」，該圖所示為液晶顯示面板的檢測電路之一實施例示 意圖。本發明所提出之液晶顯示面板的檢測電路，用以檢測具有複數個驅 動單元64與複數條訊號線62之液晶顯示面板，其中該檢測電路包含.： 第一接合墊10、1〇,、第二接合墊2〇、2〇，、測試墊3〇、3〇，、控制開關4〇、 40’及連接模组5〇、5〇,。 由「第1圖」所示可知，訊號線62包含複數條資料線622和複數條掃 描線624。複數個第_接合塾1〇對應耦接於複數條掃描線624，複數個第 一接合塾20麵接於測試墊3〇，第一接合墊1〇與第二接合墊2〇係用來在後 續製程中與例如掃描線驅動電路晶片(讲访IQ耦接用之接合墊。其 中’測趟3G用來傳送測試訊號至液晶顯示面板60之掃描線624。在本實 鉍例中’係包含兩個測試墊3()傳送測試訊號至掃描線624，且該些第二接 合塾2〇係、以間隔方式輕接於兩個測試塾3峨句話說，由上而下之奇數個 接〇塾2〇與偶數個接合墊20係分別耦接於不同的測試墊30)。當然，在本 發月之其他實紅例中’也可以僅利用一侧試塾％傳送測試訊號至掃描線 624此時所有之第二接合墊％係輕接於同一測試塾％。 7 201000992 相同地，複數個第-接合墊10，對應耦接於複數條資料線必，複數個 第二接合塾20,輕接於測試塾3〇,，第一接合塾1〇，與第二接合塾2〇,係用來 在後續製程中’與例如資料線驅動電路晶片_此㈣K賊用之接合 墊。其中，測試塾30,用來傳送測試訊號至液晶顯示面板6〇之資料線奶。 在本實施财’係包含三__3()’傳送戦峨靖樣奶，且該些 第二接合墊20,係以每三個為一麵環方式輕接於三侧試塾3〇，(換句話 說’由左而右之第-個、第四個、第七個"接合塾2g，減於其中之一個測 试墊30，帛二個、第五個、第八個…接合塾2〇，減於另一個測試塾％，， 而第二個、第六個 '第九個…接合塾2〇，编接於剩下之一個測試塾抑）。當 然，在本發明之其他實施例中，也可以僅利用一侧試墊3〇,傳送測試訊號 至資料線622，此時所有之第二接合墊20,係輕接於同-測試墊30,。 複數個控綱關4G電性連接於帛—接合塾1G鄕三接轉2()之間， 用來傳送由測試墊30所提供的測試訊號至液晶顯示面板6〇之掃描線似， 複數個控侧關4〇，電性連帛_接合塾1G，鄕二接合塾Μ，之間，用來 傳送由30所k供的測號至液晶顯*面板之資料線622，藉由 測試訊號可檢測液晶顯示面板6〇之運作是否正常。其中，控制開關4〇、4〇, 可為電晶體，且具有祕電極、祕電極與祕電極^「第丨圖」所示 可知’控制開關40、40’包含第三端42，亦即電晶體中的閘極電極，而第三 端42耦接於控制訊號塾7〇，控制訊號塾7〇用來傳送控制訊號以開啟(触⑽) 或關閉(turnoff)控制開關40、40,。也就是說，當液晶顯示面板6〇於檢測狀 態時，控制訊號開啟控制開關4〇、40,，此時測試訊號可順利進入液晶顯示 8 201000992 面板60内，而執行檢測的動作。 透過控制訊號來關閉控制開關40 而當液晶顯示面板60檢測完畢後，即可 40’。因此，本發明所提出之液晶顯示面 板的檢測電路於檢測完畢後，不需多增加雷射切割的製程。在本實施例中， 掃描線端之㈣_ 40與資料線狀鮮则娜她至綱控制訊號 塾70 ’在本發明之其他實施例中，亦可提供例如兩個控制訊號塾，此時可 將掃描線歡控綱關4〇與魏_讀制關价相触在不同之控 制訊號墊。 連接模組50、50,包含短路線5〇與備用開關(dummy讀姻，且配置 在控制_ 40、40,的朋，當控制關⑽嗜其巾之—發生異常時，即 可藉由連接做50、觀鱗線5G /妓蹄㈣與_ _ %來傳送 測試訊號’此點於後將有更驗之說明。其中，控綱關⑽、⑽，的異常情 形’可為斷路或餘和電塵(她ration她age)過高，而導致控制開關4〇、4〇, 無法正常導通(turn on)等多種狀況。 接著針對連接模組50、5〇,電性連接控制開關4〇、4〇，之實施例舉例說 t明，底下之實施例，侧取「第！圖」中之部分區塊，重新繪製以作說明。 首先’明先參f 2A圖」為連接模組電性連接控綱關之第一實施例示 思圖。於此實施例中，說明利用雷射焊接而電性連接的控綱關4〇係為相 鄰之控綱關4〇。如「第2A圖」中所示，假設三個控制開關伽、4〇b、 40c分別傳送由測離3〇所提供的測試訊號到液晶顯示面板6()中的訊號線 62。此時，如果控制開關40b發生異常時，與控制删樣連接之訊號線 纪會因所對應的控制開關40b異常，而無法傳送測試訊號 ，使得該條訊號 201000992 線62無法正常操作導致液晶顯示面板6〇顯示異常。此時，可以利用雷射 焊接之方式’透過本發明所提出之連接模組50中的短路線52，將異常的控 制開關40b與鄰近的控制開關4〇a或4〇c電性連接，如圖中所示，因為短路 線52透過雷射焊接點80與控綱關伽、舰耗接，藉此電性連接控制開 關4〇a與控制開關40b。如此，測試訊號即可藉由控制開關他而傳送至原 本與控制關4Gb連接之喊線。在本實施增，雷轉接點8()較佳係位 在第-接合墊H)與控制開關40a、働之間，這樣不但可以使測試訊號正 常傳送至每-條訊號線，且在後續製程中，並不會影響掃摇線驅動電路晶 片或是資料線驅動電路晶片之訊號傳輸。 於此須說明，由於短路線52與控制開關4〇、第一接合墊1〇與第二接 合塾2〇等元件，可配置於電路板中的不同層(layer)，因此在圖中短路線^ 以虛線表示。也由於短路線52與控制開關4〇係配置於不同層，因此在未 經過雷射焊接時，是無法導通的。當控制關⑽發生異常時，才適時由例 如雷射焊接之方式透過連接模組50電性導通特定的控制開關4〇，而由其他 正常的控制開關40(如：40a、40c)來取代異常控制開關(如：働)的功能。 請參照「第2B »」為連接模組電性連接控制開關之第二實施例示意圖。 於第二實關中’綱糊雷射焊接而電性_制關*係為傳送相 同測試訊號之控制開關40。如「第扭圖」中所示，具有三個測試塾撕、 3%、撕，此三侧可料部提供之峨峨録賴之控關4〇a〜f 傳送至對應之訊號線62。更進-歩地說，測試墊伽與控制開關伽、 耦接’測試塾30b舆控制開關40b、40e输，測試墊撕與控制開關攸、 201000992 4〇驢’於是資料線62會對應接收不同測試墊¥所傳送之測試訊號。 假設，控制開關4〇e發生異常，此時，連接模組5〇藉由短路線％將異常 的控制開關4〇e與同樣傳送測試訊號的控制開關.電性連接。如圖中所 示，因為短路線52透過雷射焊接點8〇會與控制開關概、伽祕，藉此 電性連接控制開關她與控制開關4〇e。如此，由測試塾观所傳送之測試 訊號即可藉由控制開關.而傳送至原本與控制開關4〇e連接之訊號線。 請參照「第2C 」為連接模组電性連接控制開關之第三實施例示意圖。 於第三實施例中’連接模組52中更包含備用開關54。而於該實施例中，即 說明利用雷射焊接而電性連接的控制開關4〇係為傷用開關54。如「第％ 圖」中所不，假設二健制開關伽、働、4〇c分別傳送由測試塾兕所提 供的測試訊號到訊號線仏此時，如果控制酬伽發生異f，測試訊號 將無法傳送至與控制開關40a麵接之訊號線。此時，短路線52透過雷射焊 接點80會與控制開關他、備用開關54 #接，藉此電性連接控制開關伽 與備用開關54。如此’由測試塾3〇所傳送之測試訊號即可藉由備用開關 Μ而傳送至原本與控制開關他連接之訊號線。在本實施例中，雷射焊接 點80較佳係位在第-接合塾1〇與控制關他、第—接合墊1〇與備用開 關54、第二接合墊1〇與控制開關4〇a、第二接合墊2〇與備用開關％之間， 這樣不但可以使測試訊號正常傳送至每一條訊號線，且在後續製程中，並 不會影響掃描線驅動電路晶片或是資料線驅動電路晶片之訊號傳輸。其 中’備用開關54的數目可依需求而增設，並不以單一個備用開關S4為限。 於此須說明，由於短路線52與控制開關40a、40b、40c、備用開關54 11 201000992 等元件’可配置於電路板中的不同層(layer)，因此在圖中短路 、 .— 碌* 52从虛線 表示。也由於短路線52與控制開關40a、4〇b、4〇c 侑用開關54係配置於 不同層，因此在未經過雷射痒接時，是無法_的 ” 、 ，、、右疋短路線52 /、備用開關54於設計上電性耦接，當控制開關4〇a發生異常 、野，僅需要將 控制開關40a兩端透過雷射焊接與短路線52耦接即可。 此外’上述所舉之實施例，請參照「第！圖」，備用開關&係設置於 ， 驅動單元64之對側。類似的情況，備用開關54也可設置於驅動單元64 ? ^側，而為了配合備關關54之配置，本發賴提出之檢測 含：第—接合墊10、第二接合墊2〇、測試塾3〇、控制開關40及連接模組 5〇 ’也可同樣隨著備用開關54而設置於驅動單元64之同側，甚至可設置 於驅動單元64之内，而與驅動單元64整合為一體。 請參照「第3圖」，該圖所示為液晶顯示面板的檢測方法之流程圖，可 、檢測具有複數條訊號線之液晶顯示面板，該檢測方法包含下列步驟。 #驟S10 :提供複數個第一接合墊’並對應墟訊號線至該些第一接合 塾。 步驟S20 :提供複數個第二接合墊，並搞接於至少一個測試墊。 步驟S30 :提供複數個控制開關，並藉由控制開關電性連接對應之第— 接合墊與第二接合墊，傳送自測試紐供之職碱至液㈤标面板内。 步驟S4〇 .當控綱關其中之一發生異常時，提供連接模、组取代異常之 控制開關以傳送測試訊號。 於步驟S40中可包含下列步驟：以雷射悍接(kserwelding) 一短路線， 12 201000992 使該些控制開關之其中-異常晒與該些控制開關中之其他控綱關電性 連接(如第2A ®、第2B麟示）。亦或是，提·少-織關關；以雷 射焊接方式使備用開關與異常之控制開關並聯(如第2C圖所示）。 上述之液晶顯示面板的檢測方法，更可包含下列步驟：減控制開關 之第三端與備用開關(當連接模組包含備用開關時)之第三端以接收-控制 訊號’依據控制訊號，開啟(論on)或關閉(她〇均控制開關與備用開關。 軸本發_技術已独健實關揭露如上，鮮並非用以限 定本發明，任何熟習此技藝者，在不脫離本發明之精神所作些許之更動與 潤飾’皆應涵蓋於本發明的範轉内，因此本發明之保護範圍當視後附之申 請專利範圍所界定者為準。 【圖式簡單說明】 第1圖：液晶顯示面板的檢測電路之一實施例示意圖 第2A圖：連接模組電性連接控制開關之第一實施例示意圖 ^ 第2B圖.連接模組電性連接控制開關之第二實施例示意圖 第2C圖：連接模組電性連接控制開關之第三實施例示意圖 第3圖：液晶顯示面板的檢測方法之流程圖 【主要元件符號說明】 〇 1(3’ ：第一接合墊 20、2〇,：第二接合墊 30、3〇’、30a、30b、30c :測試墊 4Q、」， 〇,、40a、40b、40c、40d、40e、40f:控制開關 13 201000992 42 :第三端 50、50’ ：連接模組 52 :短路線 54 :備用開關 60 .液晶顯不面板 62 :訊號線 622 :資料線 624 :掃描線 64 :驅動單元 70 :控制訊號墊 80 :雷射焊接點201000992 IX. Description of the invention: [Technical field to which the invention pertains] The present invention is a slap-and-shoot method, which is a detection circuit and method for a liquid crystal age panel. [Prior Art] Before the liquid crystal display panel (LCD _) is used, the detection process that needs to pass through will require different detection circuit wiring to be used with different detection devices. Traditionally, no matter which-fiber-measuring circuit ship, in the general panel _ complete, all need to take the process of Ray's shot, to cut off the detection circuit and the panel wiring, so that the follow-up is busy after the point, not As for the problem of generating a signal error. However, in addition to the ease of reducing the yield of the product, the process of increasing the laser cutting is also prone to contamination when cutting. In addition, the cost of laser cutting is increased. Therefore, the f-technical project proposes to include (4) Jane in the power generation, and to add a control switch between the short-circuit wiring and the scanning line and the data line, and the control switch is turned on during the test, and the control side is allowed to ride after the test is finished. In this way, the laser cutting step can be omitted on the ship, and a more simplified process and a low-cost effect can be obtained. Although the control switch can omit the laser cutting process after the detection, however, due to the liquid crystal display factory, the panel strip sweep & line and the data line, each of the scan lines and the data line needs to be connected with a control switch. There are multiple control switches in the circuit. Since the inspection ship number is controlled by opening I,: ί 怀 n 显示 display panel in the panel and m through the detection signal: test the alternate line and the secret line intersection, to control each of the glasses e] ) The operation of the film 20001992 body _ film transistor ' τττ) is normal. When the control switch is under the number of magic big ones, when one or a few of the control switches are abnormal, some of the elements can not display the detection signal properly, so that it is easy for the tester or the detection device to judge. An abnormality occurs in the scan line, the data line, or the TFT switch, and the display panel that is actually functioning properly is discarded. Therefore, how to improve the problems arising from the detection circuit of the liquid crystal display panel in the prior art is an urgent issue to be solved. SUMMARY OF THE INVENTION In view of the above, the present invention proposes a detection circuit and method for a liquid crystal display panel. When an abnormality occurs in one of the control switches, the detection circuit or method proposed by the present invention can still easily complete the normal detection step, and the display panel of the function f is not discarded due to misjudgment, thereby improving the liquid crystal display panel. Detection efficiency and yield yield. The present invention provides a liquid crystal display panel having a plurality of driving units and a plurality of signal lines, wherein the detecting circuit includes a plurality of first bonding pads, a plurality of second bonding pads, and a plurality of liquid crystal display panels Control switches and a connection module. a plurality of first connection pads are respectively corresponding to the affinity signal lines; a plurality of second bonding ports are connected to the at least one test pad; and the plurality of control switches are electrically connected to the corresponding first bonding pads and the second bonding pads For transmitting the test signal provided by the test pad to the liquid crystal display panel; the connection module is disposed around the control switch, and is used to transmit the test signal when one of the control switches is abnormal. The present invention also provides a liquid crystal display panel detecting method for detecting a liquid crystal display panel having a plurality of signal lines. The detecting method includes the following steps: providing a plurality of first bonding pads, and coupling the signal lines to the a plurality of first bonding pads; a plurality of second bonding pads are provided, and a coupling 6 201000992 is connected to the at least one test pad; a plurality of control switches are provided, and the first bonding pads are electrically connected by the control switches The second bonding pads transmit test signals provided by the test pads to the liquid crystal display panel; and when one of the control switches controls the switch to be abnormal, 'provide a connection module to replace the abnormal control switch to transmit the Test signal. Preferred embodiments of the present invention and their effects are described below in conjunction with the drawings. [Embodiment] The term "first figure" is shown in Fig. 1. This figure shows an embodiment of a detection circuit of a liquid crystal display panel. The detection circuit of the liquid crystal display panel of the present invention is for detecting a liquid crystal display panel having a plurality of driving units 64 and a plurality of signal lines 62, wherein the detecting circuit comprises: the first bonding pads 10, 1〇, and Two bonding pads 2〇, 2〇, test pads 3〇, 3〇, control switches 4〇, 40' and connection modules 5〇, 5〇. As shown in Fig. 1, the signal line 62 includes a plurality of data lines 622 and a plurality of scanning lines 624. The plurality of first bonding pads 〇 are correspondingly coupled to the plurality of scanning lines 624, and the plurality of first bonding pads 20 are surface-contacted to the test pads 3, and the first bonding pads 1〇 and the second bonding pads 2 are used for In the subsequent process, for example, a scan line driver circuit chip (a bonding pad for the IQ coupling is used. The '3' is used to transmit the test signal to the scan line 624 of the liquid crystal display panel 60. In this embodiment, the system includes The two test pads 3 () transmit test signals to the scan lines 624, and the second joints are connected to each other in a spaced manner by two tests. 3 In other words, the odd-numbered interfaces from top to bottom塾2〇 and an even number of bonding pads 20 are respectively coupled to different test pads 30). Of course, in the other real red cases of this month, it is also possible to transmit the test signal to the scan line 624 using only one side test 624. At this time, all the second bond pads are lightly connected to the same test 塾%. 7 201000992 Similarly, a plurality of first-bond pads 10 are correspondingly coupled to a plurality of data lines, a plurality of second joints 20, lightly connected to the test 塾3〇, the first joint 塾1〇, and the second The bonding 塾 2 〇 is used in the subsequent process to 'and the bonding pad for the data line driving circuit chip _ this (four) K thief. Wherein, the test 塾30 is used to transmit the test signal to the data line milk of the liquid crystal display panel 6〇. In the present implementation, the system includes three __3()'s to transfer the sputum-like milk, and the second bonding pads 20 are lightly connected to the three sides of the three sides in a three-sided manner. In other words 'the first, fourth, seventh " joints 2g from left to right, minus one of the test pads 30, the second, the fifth, the eighth...joining塾2〇, minus another test 塾%, and the second, sixth 'ninth...join 塾2〇, compiled in the remaining test 塾). Of course, in other embodiments of the present invention, the test signal can be transmitted to the data line 622 by using only one test pad 3, and all the second bonding pads 20 are lightly connected to the same test pad 30. . A plurality of control gates 4G are electrically connected between the 帛-joint 塾 1G 鄕 three turns 2 (), for transmitting the test signal provided by the test pad 30 to the scanning line of the liquid crystal display panel 6 ,, plural The control side is closed, and the electrical connection 帛 _ 塾 塾 1G, 鄕 塾Μ 塾Μ 塾Μ, between, is used to transmit the measurement signal from 30 k to the data line 622 of the liquid crystal display panel, by the test signal It is checked whether the operation of the liquid crystal display panel 6 is normal. Wherein, the control switches 4〇, 4〇 can be a transistor, and have a secret electrode, a secret electrode and a secret electrode. The “control switch 40, 40′ includes a third end 42 , that is, electricity. The gate electrode in the crystal, and the third end 42 is coupled to the control signal 塾7〇, and the control signal 塾7〇 is used to transmit a control signal to turn on (touch (10)) or turn off the control switch 40, 40. That is to say, when the liquid crystal display panel 6 is in the detection state, the control signal turns on the control switches 4〇, 40, and the test signal can smoothly enter the liquid crystal display 8 201000992 panel 60, and the detection operation is performed. The control switch 40 is turned off by the control signal, and when the liquid crystal display panel 60 is detected, it can be 40'. Therefore, the detection circuit of the liquid crystal display panel proposed by the present invention does not need to increase the laser cutting process after the detection is completed. In this embodiment, the (four) _ 40 of the scan line end and the data line smear smother her control signal 塾 70 ′ in another embodiment of the present invention, for example, two control signals 亦可 can also be provided, Scanning line control control level 4 〇 and Wei _ reading system price are in contact with different control signal pads. The connection modules 50, 50, including the short-circuit line 5 〇 and the standby switch (dummy singularity, and the friends arranged in the control _ 40, 40, when the control is off (10) Do 50, view the scale line 5G / hoof (4) and _ _ % to transmit the test signal 'this point will be more explained later. Among them, the control case (10), (10), the abnormal situation 'can be broken or residual The electric dust (she ration herage) is too high, and the control switch 4〇, 4〇, can not be turned on normally, etc. Then, for the connection module 50, 5〇, the electrical connection control switch 4〇, 4 〇, the example of the example, t, the following example, the side of the "第! 图" part of the block, redraw for illustration. First of all, '明先f 2A diagram" for the connection module electrical A schematic diagram of the first embodiment of the connection control. In this embodiment, the control system that is electrically connected by laser welding is described as an adjacent control system. For example, "2A" As shown in the figure, it is assumed that the three control switches gamma, 4〇b, 40c respectively transmit the test signals provided by the measurement and separation to the liquid crystal display panel 6(). Signal line 62. At this time, if an abnormality occurs in the control switch 40b, the signal line connected to the control deletion sample may not transmit the test signal due to the abnormality of the corresponding control switch 40b, so that the line 201000992 line 62 cannot operate normally. The liquid crystal display panel 6〇 is abnormally displayed. At this time, the abnormal control switch 40b and the adjacent control switch 4〇a can be transmitted by the laser welding method through the short-circuit line 52 in the connection module 50 proposed by the present invention. Or 4〇c electrical connection, as shown in the figure, because the short-circuit line 52 is connected to the control gate and the ship through the laser solder joint 80, thereby electrically connecting the control switch 4〇a and the control switch 40b. The test signal can be transmitted to the shout line originally connected to the control off 4Gb by controlling the switch. In the present embodiment, the lightning transfer point 8() is preferably tied to the first bonding pad H) and the control switch 40a. Between 働 and ,, this not only enables the test signal to be transmitted to each of the signal lines normally, but also does not affect the signal transmission of the sway line driver circuit chip or the data line driver circuit chip in the subsequent process. It should be noted that, because the short-circuit line 52 and the control switch 4〇, the first bonding pad 1〇 and the second bonding layer 2〇, etc., can be arranged in different layers in the circuit board, so the short-circuit line in the figure ^ is indicated by a dotted line. Also, since the short-circuit line 52 and the control switch 4 are arranged in different layers, they are not conductive when laser welding is not performed. When an abnormality occurs in the control off (10), the specific control switch 4 is electrically turned on through the connection module 50 by, for example, laser welding, and the abnormality is replaced by other normal control switches 40 (eg, 40a, 40c). Controls the function of the switch (eg: 働). Please refer to "2B»" for a schematic diagram of a second embodiment of a connection module electrical connection control switch. In the second real-time, the laser welding and the electrical control are the control switches 40 that transmit the same test signal. As shown in the "Twisted Diagram", there are three test tears, 3%, tears, and the control passes 4〇a~f provided by the three sides of the feedable portion are transmitted to the corresponding signal line 62. Further, the test pad is connected to the control switch, coupled to the test 塾30b 舆 control switch 40b, 40e, test pad tear and control switch 攸, 201000992 4〇驴' Test pad ¥ test signal transmitted. It is assumed that the control switch 4〇e is abnormal. At this time, the connection module 5〇 electrically connects the abnormal control switch 4〇e with the control switch that also transmits the test signal by the short-circuit line %. As shown in the figure, because the short-circuit line 52 passes through the laser solder joint 8 〇 and the control switch, it is electrically connected, thereby electrically controlling the switch and the control switch 4 〇 e. In this way, the test signal transmitted by the test can be transmitted to the signal line originally connected to the control switch 4〇e by controlling the switch. Please refer to "2C" for a schematic diagram of a third embodiment of the connection module electrical connection control switch. In the third embodiment, the connection module 52 further includes a backup switch 54. In this embodiment, the control switch 4 which is electrically connected by laser welding is described as the injury switch 54. As in the "% map", it is assumed that the two health switches gamma, 働, and 4〇c respectively transmit the test signals provided by the tester to the signal line. At this time, if the control rewards are different, the test signal It will not be transmitted to the signal line that is connected to the control switch 40a. At this time, the short-circuit line 52 is connected to the control switch and the standby switch 54 through the laser-welded joint 80, thereby electrically connecting the control switch to the standby switch 54. The test signal transmitted by the tester can be transmitted to the signal line that is connected to the control switch by the standby switch. In the present embodiment, the laser solder joints 80 are preferably tied to the first and second junction pads, the first and second pads 1 and the control switch 4A. Between the second bonding pad 2〇 and the standby switch%, this not only enables the test signal to be normally transmitted to each signal line, but also does not affect the scanning line driving circuit chip or the data line driving circuit chip in the subsequent process. Signal transmission. The number of 'spare switches 54' can be added as needed, and is not limited to a single standby switch S4. It should be noted here that since the short-circuit line 52 and the control switches 40a, 40b, 40c, the standby switch 54 11 201000992 and the like can be arranged in different layers in the circuit board, short-circuit in the figure, . Indicated from the dotted line. Also, since the short-circuit line 52 and the control switches 40a, 4〇b, 4〇c, and the switch 54 are disposed in different layers, when the laser is not itch-connected, it is impossible to "", "," and "right" short-circuit line 52 /, the standby switch 54 is electrically coupled in design. When the control switch 4 〇 a is abnormal and wild, only the two ends of the control switch 40a need to be coupled to the short-circuit line 52 through laser welding. For the embodiment, please refer to "FIG. Map", and the standby switch & is disposed on the opposite side of the drive unit 64. Similarly, the backup switch 54 can also be disposed on the side of the drive unit 64, and in order to cooperate with the configuration of the backup switch 54, the test proposed by the present invention includes: the first bond pad 10, the second bond pad 2, and the test The 塾3〇, the control switch 40 and the connection module 5〇′ can also be disposed on the same side of the drive unit 64 as the backup switch 54 , and can even be disposed in the drive unit 64 , and integrated with the drive unit 64 . . Please refer to "3", which shows a flow chart of a method for detecting a liquid crystal display panel, which can detect a liquid crystal display panel having a plurality of signal lines, and the detection method includes the following steps. #STEPS10: A plurality of first bonding pads are provided and corresponding to the first signal wires to the first bonding pads. Step S20: providing a plurality of second bonding pads and engaging at least one test pad. Step S30: providing a plurality of control switches, and electrically connecting the corresponding first bonding pad and the second bonding pad by the control switch, and transmitting the self-test alkali to the liquid (5) standard panel. Step S4〇. When an abnormality occurs in one of the control centers, a control switch for connecting the mode and the group is replaced to transmit the test signal. In step S40, the following steps may be included: kersking a short circuit, 12 201000992 to make the control switches have an abnormal connection with other controllers in the control switches (such as 2A ® , 2B Lin). Or, it is necessary to make the standby switch in parallel with the abnormal control switch (as shown in Figure 2C) by laser welding. The method for detecting the liquid crystal display panel may further include the steps of: reducing the third end of the control switch and the third end of the standby switch (when the connection module includes the standby switch) to receive the control signal according to the control signal, (on) or off (she controls both the switch and the standby switch. The shaft has been exemplified above. The above is not intended to limit the invention, and anyone skilled in the art can be without departing from the spirit of the invention. All changes and refinements are intended to be included in the scope of the present invention. Therefore, the scope of protection of the present invention is defined by the scope of the appended claims. [Simplified illustration] Figure 1: Liquid crystal display Schematic diagram of one embodiment of the detection circuit of the panel. FIG. 2A is a schematic diagram of the first embodiment of the electrical connection control switch of the connection module. FIG. 2B is a schematic diagram of the second embodiment of the electrical connection control switch of the connection module. FIG. 3 is a schematic diagram of a third embodiment of a connection module electrical connection control switch. FIG. 3 is a flow chart of a method for detecting a liquid crystal display panel. [Main component symbol description] 〇1 (3': first connection Pad 20, 2〇, second bonding pad 30, 3〇', 30a, 30b, 30c: test pad 4Q, ”, 〇, 40a, 40b, 40c, 40d, 40e, 40f: control switch 13 201000992 42 : Third end 50, 50': connection module 52: short circuit line 54: spare switch 60. liquid crystal display panel 62: signal line 622: data line 624: scan line 64: drive unit 70: control signal pad 80: laser Solder joint