TW200945980A - Manufacturing method for circuit wiring board - Google Patents

Manufacturing method for circuit wiring board Download PDF

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Publication number
TW200945980A
TW200945980A TW98104040A TW98104040A TW200945980A TW 200945980 A TW200945980 A TW 200945980A TW 98104040 A TW98104040 A TW 98104040A TW 98104040 A TW98104040 A TW 98104040A TW 200945980 A TW200945980 A TW 200945980A
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TW
Taiwan
Prior art keywords
layer
coating film
metal
resin
film
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TW98104040A
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Chinese (zh)
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TWI449482B (en
Inventor
Yasushi Enomoto
Yasufumi Matsumura
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Nippon Steel Chemical Co
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    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/10Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
    • H05K3/18Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material
    • H05K3/181Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material by electroless plating
    • H05K3/182Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material by electroless plating characterised by the patterning method
    • H05K3/184Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern using precipitation techniques to apply the conductive material by electroless plating characterised by the patterning method using masks
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C18/00Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating
    • C23C18/16Chemical coating by decomposition of either liquid compounds or solutions of the coating forming compounds, without leaving reaction products of surface material in the coating; Contact plating by reduction or substitution, e.g. electroless plating
    • C23C18/1601Process or apparatus
    • C23C18/1633Process of electroless plating
    • C23C18/1646Characteristics of the product obtained
    • C23C18/165Multilayered product
    • C23C18/1653Two or more layers with at least one layer obtained by electroless plating and one layer obtained by electroplating
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K1/00Printed circuits
    • H05K1/02Details
    • H05K1/03Use of materials for the substrate
    • H05K1/05Insulated conductive substrates, e.g. insulated metal substrate
    • H05K1/056Insulated conductive substrates, e.g. insulated metal substrate the metal substrate being covered by an organic insulating layer
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/01Dielectrics
    • H05K2201/0137Materials
    • H05K2201/0154Polyimide
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2201/00Indexing scheme relating to printed circuits covered by H05K1/00
    • H05K2201/02Fillers; Particles; Fibers; Reinforcement materials
    • H05K2201/0203Fillers and particles
    • H05K2201/0206Materials
    • H05K2201/0236Plating catalyst as filler in insulating material
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K2203/00Indexing scheme relating to apparatus or processes for manufacturing printed circuits covered by H05K3/00
    • H05K2203/11Treatments characterised by their effect, e.g. heating, cooling, roughening
    • H05K2203/1157Using means for chemical reduction
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05KPRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
    • H05K3/00Apparatus or processes for manufacturing printed circuits
    • H05K3/10Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern
    • H05K3/105Apparatus or processes for manufacturing printed circuits in which conductive material is applied to the insulating support in such a manner as to form the desired conductive pattern by conversion of non-conductive material on or in the support into conductive material, e.g. by using an energy beam

Abstract

A manufacturing method for a circuit wiring board includes the steps of: forming (S1) a coating film by applying a coating liquid containing a polyimide precursor resin and a metallic compound onto a base; forming (S2) a resist mask into a pattern on the surface of the coating film; forming (S3) a metal deposition layer by reducing metal ions present in the coating film; forming (S4) circuit wiring having a pattern by plating on the metal deposition layer; and forming (S5) a polyimide resin layer by imidizing a layer of the polyimide precursor resin by heat treatment.

Description

200945980 六、發明說明: 【發明所屬之技術々貝域j 本發明係關於電子零件中所用 法,詳言之,係關於在聚酿亞胺樹脂伟線基板之製造方 路佈線所成之電路佈線基板之製造方、、形成具有圖案的電 【先前技術】 法 於電子器材之電子電路中係使用對由 構成的積層板進行電路加工的印刷、邑緣材與導電材所 絕緣基板表面(及内部以導^㈣ °印刷#線板係於 計之導體圖案者,依作為基材的絕緣體樹//依據電氣設 =為板狀的剛性印刷佈線板與富於柔軟二種:: 佈線板。可撓性印刷佈線板,其特徵為 撓 反複屈曲之可動部中為〜…撓性’於經常 印刷佈線板可在電== 又,㈣可撓性 為節省*門之二 之狀態收容’故亦可用作 間之佈線材料。作為可撓性印刷佈線板的材料之可 梏t基板夕採用絕緣樹脂,例如,聚醯亞胺酯或聚醯亞胺 曰其使用量以有耐熱性之聚醯亞胺樹脂佔絕對多量。另 方面’於導電材料’就導電性考量,通常係用銅箔。 近年來’隨著電子零件之小型化與信號傳遞速度之高速 化’於可撓性印刷基板等之電路基板中必須要微細的精細間 、氣路。作為形成微細的精細間距線路的方法,周知者為蒸 鍍法與濺鍍法等之方法,惟藉由此等方法所形成之金屬祺, 098104040 200945980 其與聚醯亞胺樹脂基材之接㈣度的偏差大,或於 易產生針孔,是其問題。再者,於上述方法中,由於包^ ‘純刻處理將聚酿亞胺樹脂基材上之不要的種層二 1㈣)去除之倾,會抖__贿__發生過度 蚀刻的顧慮。 又 ❹ ❹ 近年來,作為可維持比較好的聚醢亞胺樹脂基材與金屬腺 之密著性者’曾被提出的方法為例如,於專敎獻丨搞 示之稱為直接金屬化(Direet MetalizatiQn)法之方法 此種方法所㈣之金屬膜,其—部份係埋人於聚醯亞胺樹於 基材之樹脂巾,可剩高密雜。應肢直接金屬化,不^ 種層之㈣處理。例如,於專利文獻2中,曾揭示:在聚酿 亞胺樹脂基材表面軸®案雜的難路,供⑽溶液到此 微流路中,在聚醯亞胺樹脂基材表面形成改質層後,再使金 屬離子與此改質層接觸,而將此金屬離子還原以形成金屬骐 的方法。另一方面,於專利文獻3中,曾揭示:使疏水性物 質附著於聚醯亞胺表面’對其露出部進行選擇性的鹼處理之 方法。 專利文獻1:日本專利特開2001-73159號公報 專利文獻2:日本專利特開2007—103479號公報 專利文獻3 :日本專利特開2007-242689號公報 【發明内容】 (發明所欲解決之問題) 098104040 5 200945980 然而 ’如專利文獻2之發明般,用形成微流路之圖案形成 法時’作為用以形成微流路溝之遮罩材,必須選擇耐鹼性的 材質,材質的選定並非容易,是其問題。又,用專利文獻2 方法為了提雨圖案的精度,於遮罩材加工時必須有甚高 的尺寸精度,為其問題。尤其,若聚醯亞胺樹脂基材與遮罩 =的接觸部分之加卫精度若低,於兩者之間會產生間隙,致 3金屬離子溶液、還原溶液等之處理液會滲出至該處,因而 會有使圖案精度降低、麟電路之電氣特性造成不良影響之 顧慮。 ;專和文獻3之發θ种,為了對聚酿亞胺表面附著以不溶 解於驗水溶液的疏水性物質,則必須施行電漿處理,而且欲 '、疏Xf生物質時亦須電襞處理。又,於專利文獻3之發明 ;疏水1±物質之附著前,須藉由光微影技術形成遮罩 層’於附著後’必須有剝離遮罩層之步驟。此意味著,為了 ㈣為遮罩的疏水性物質形成圖案,須有形;遮罩唐 /阻圖案)並將其剝離之步驟,步驟數極多且繁雜 ,是其問 題0 本發月之目的在於’提供—種將以往之繁雜的製造步驟簡 化=製造微細的精細間距且電路佈線與絕緣樹脂層之密著 可罪性尚的電路佈線基板之方法。 (解決問題之手段) 《月之電路佈線基板之製造方法,係於聚醯亞胺樹脂層 098104040 200945980 上形成電路佈線所成的電路佈線基板之製造方法;其特徵在 於,具備有下述諸步驟: • a)藉由在基材上塗佈含有親亞胺前驅物樹脂(聚酿亞胺 •樹脂的前驅物)與金屬化合物之塗佈液,使其乾燥而形成塗 佈膜之步驟; -b)以光阻層被覆上述塗佈膜之表面,進行圖案形成而形成 . 光阻遮罩之步驟; ❹ 藉由使上述塗佈臈中的金屬離子還原,使金屬析出於上 述塗佈膜表層部之未被上述光阻遮罩被覆的區域而形成金 屬析出層之步驟; d) 於上述金屬析出層上,藉由非電解鑛敷及/或電鑛形成 具有圖案的電路佈線之步驟;及 e) 藉由對上述塗佈膜中之聚醢亞胺前驅物樹脂層進行熱 處理使其酿亞胺化,形成上述聚醯亞胺樹脂層之步驟。 © 又,本發明之電路佈線基板之製造方法,於上述a)步驟 之後,進而具備.f)藉由對上述塗佈膜以含有金屬離子之水 溶液含次’使其乾燥,以使上述塗佈财的金屬離子含有量 增加之步驟;或於上述a)步驟之後,進而具備:g)對上述 •塗佈膜以氨水溶液或!級胺或2級胺的水溶液含浸之步驟。 (發明效果) 依據本發明之電路料基板之製造方法,由於不須種層 (金屬析出層)之银刻步驟等,以將以往繁雜的製造步驟簡化 098104040 7 200945980 之簡易步驟可形成微細的精細間距電路,故不須大規模的設 資而且’可製造電路佈線與絕緣樹脂層(聚醯亞胺樹 L密著可#性局之電路佈線基板,故其產業價值甚高。 本發明之其他目的、特徵及好處係以下述說明而可充分了 解。 【實施方式】 以下,就本發明之實施形態,適當地邊參照圖丨及圖2 詳細地做說明。圖丨為表示本實施形態的電路佈線基板之製 造方法的主要的步驟順序之流程圖;圖2為各步驟之說明 圖。 以本發明之製造方法得到之電路佈線基板1〇(),例如,如 圖2(e)所示般,係於聚醯亞胺樹脂層3上形成電路佈線9 所構成。聚醯亞胺樹脂層3之形態並無特別限定,例如,可 為聚醯亞胺樹脂的薄膜(片),亦可為積層於金屬箔、玻璃 板、樹知薄膜等基材1之狀態者。又,此處,作為基材1, 可舉出:積層有聚醯亞胺樹脂層3的片狀之樹脂、玻璃基 板、陶瓷、或金屬箔等。又,基材1亦可用聚醯亞胺樹脂構 成。聚醯亞胺樹脂層3之全體厚度可定為3〜1〇〇//m的範圍 内’以3〜50的範圍内為佳。 聚醯亞胺樹脂,可藉由使聚醯亞胺前驅物樹脂醯亞胺化 (硬化)而形成,此處,所謂「聚醯亞胺前驅物樹脂」,亦包 含在其分子骨架中含有威光性基(例如乙烯性不飽和烴基) 098104040 8 200945980 者。醢亞胺化之詳情於後敘述。 [步驟a :塗佈膜形成步驟] 於本實施形態之電路佈線基板之製造方法中,藉由將含有 聚醯亞胺前驅物樹脂與金屬化合物之塗佈液塗佈於基材1 上,使其乾燥,如圖1及圖2(a)所示般形成塗佈膜3a(步驟 S1)。 作為聚醯亞胺前驅物樹脂(以下亦有僅記為「前驅物」之 情形),可使用由公知的酸酐與二胺所得之公知的聚醯亞胺 的前驅物’可用公知的方法製造。前驅物,例如,可使四叛 酸二酐與二胺以大致等莫耳溶解於有機溶劑中,在〇〜100 °C範圍内之溫度下攪拌30分鐘〜24小時,使其進行聚合反 應而付到。反應時’可用使得到的前驅物於有機溶劑中成為 5〜30重量%的範圍内(以1〇〜20重量%的範圍内為佳)的 方式來溶解反應成分。有關聚合反應時所用的有機溶劑宜使 用具有極性者,作為有機極性溶劑,可舉出例如:N,N_二曱 基曱醯胺、N,N-二曱基乙醯胺(DMAc)、N〜曱基_2_吡咯烷_、 2-丁酮、二曱亞砜、二甲基硫酸、環己_、二哼烷、四氫呋 嗔、m三甘二f醚等。此等溶劑可並用2種以上 使用,再者’亦可部分地使用二曱苯、曱笨之類的芳香族烴。 合成之前驅物可作成為溶液狀態使用。通常,以作為反應 溶劑溶液使用為佳,必要時,亦可濃縮、稀釋或以其他溶劑 取代。又,由於前驅物通常有優異的溶劑可溶性而可有利 098104040 9 200945980 使用。如此調整之溶液,藉由添加金屬化合物可利用作為塗 佈液。 前驅物,以選定為於醯亞胺化後含有熱可塑性聚醯亞胺樹 脂為佳。藉由使用熱可塑性樹脂,可提高與金屬析出層7(後 述)之密著性。此種熱可塑性聚醯亞胺樹脂,以玻璃轉化溫 度為350°C以下者為佳,以200〜320〇C為更佳。 作為熱可塑性聚醯亞胺樹脂之前驅物,以具有以下述通弋 ⑴表示之構造單位者躲,式⑴中,An絲以式⑵' =⑶或式⑷表示之2價芳香族基,An表示 =芳香族基’於式⑵〜式⑷中,R,表二) 6叫賈烴基姐氧基,n表示獨立之卜4的碳 ^表_立之單鍵或選自個3)叫 •广、,-或侧_中之2價基,。 二 位之存在莫耳比,為0.1〜1.0的範圍。 成早 [化1]200945980 VI. Description of the Invention: [Technology of the invention] The invention relates to the use of electronic components, and in particular, the circuit wiring formed by the manufacturing route of the fiber-reinforced polyimide substrate The manufacturing method of the substrate and the formation of a patterned electric system [Prior Art] In the electronic circuit of the electronic device, the surface of the substrate (and the inside of the insulating substrate) which is used for circuit processing of the laminated board formed by the laminated board and the conductive material is used. The printed circuit board is printed on the conductor pattern, and the insulator tree is used as the substrate. / According to the electrical design = rigid printed wiring board with plate shape and soft type:: wiring board. The flexible printed wiring board is characterized in that the flexible portion of the flexural bending is ~...flexible 'in the case of the regular printed wiring board can be in the electric == and (4) the flexibility is saved in the state of the second door. It can be used as a wiring material for the interlayer. As a material of the flexible printed wiring board, an insulating resin such as polyimide or polyimide can be used as a material for heat-resistant polyimide. Imine In addition, the amount of grease is an absolute amount. In other respects, the conductivity of the conductive material is usually made of copper foil. In recent years, 'the miniaturization of electronic components and the speed of signal transmission speed are on the circuit of flexible printed circuit boards. A fine fine space and a gas path are required in the substrate. As a method of forming a fine fine pitch line, a known method such as a vapor deposition method and a sputtering method, but a metal crucible formed by such a method, 098104040 200945980 The deviation from the (four) degree of the polyamidene resin substrate is large, or pinholes are easily generated, and further, in the above method, since the package is processed, the polyimide resin base is used. If the material is not on the layer 2 (4)), the removal will be shaken, the __ bribe __ over-etching concerns. ❹ ❹ In recent years, as a method for maintaining a relatively good adhesion between a polyimide substrate and a metal gland, a method that has been proposed is, for example, a direct metallization ( Direet MetalizatiQn) Method The metal film of the method (4), which is partially embedded in the resin towel of the polyimide substrate, can be left with high density. Direct metallization of the limbs, not (4) treatment. For example, in Patent Document 2, it has been revealed that in the case where the surface axis of the polyanilin resin substrate is miscellaneous, the (10) solution is supplied to the microfluidic path to form a modified surface on the surface of the polyimide resin substrate. After the layer, metal ions are brought into contact with the reforming layer to reduce the metal ions to form a metal ruthenium. On the other hand, in Patent Document 3, a method of selectively causing a hydrophobic substance to adhere to a surface of a polyimide to selectively expose the exposed portion thereof is disclosed. Patent Document 1: Japanese Laid-Open Patent Publication No. 2001-73159. Patent Document 2: Japanese Patent Laid-Open Publication No. 2007-103479 (Patent Document No. 2007-242689) SUMMARY OF INVENTION (Problems to be Solved by the Invention) 098104040 5 200945980 However, as in the case of the invention of Patent Document 2, when a pattern forming method for forming a micro flow path is used, as a mask material for forming a micro flow path groove, an alkali-resistant material must be selected, and the material selection is not Easy, is the problem. Further, in the method of Patent Document 2, in order to improve the accuracy of the rain pattern, it is necessary to have a high dimensional accuracy in the processing of the mask material, which is a problem. In particular, if the adhesion precision of the contact portion of the polyimide substrate and the mask = is low, a gap is formed between the two, and the treatment liquid such as the metal ion solution or the reducing solution may ooze out there. Therefore, there is a concern that the accuracy of the pattern is lowered and the electrical characteristics of the circuit are adversely affected. Specialized in the θ species of the literature 3, in order to adhere to the surface of the poly-imine to dissolve the hydrophobic substance in the aqueous solution, it must be treated with plasma, and it is necessary to treat the Xf biomass. . Further, in the invention of Patent Document 3, before the adhesion of the hydrophobic 1± substance, the mask layer must be formed by photolithography to have a step of removing the mask layer after adhesion. This means that in order to (4) form a pattern for the hydrophobic substance of the mask, it must be shaped; the mask is masked and stripped, and the number of steps is extremely complicated and complicated, which is the problem. 'Providing a method for simplifying the complicated manufacturing steps in the past = a method of manufacturing a circuit board having a fine fine pitch and having a circuit wiring and an insulating resin layer in close contact with each other. (Means for Solving the Problem) The method for manufacturing a circuit wiring board of the month is a method for manufacturing a circuit wiring board formed by forming a circuit wiring on a polyimide film layer 098104040 200945980, and is characterized in that the following steps are provided : a) a step of forming a coating film by applying a coating liquid containing a pro-imine precursor resin (precursor of a poly-bromide resin) and a metal compound on a substrate to dry it; b) a step of coating the surface of the coating film with a photoresist layer to form a photoresist mask; ❹ reducing the metal ions in the coated crucible to precipitate the metal on the surface of the coating film a step of forming a metal deposition layer not in the region covered by the photoresist mask; d) a step of forming a patterned circuit wiring by electroless ore and/or electric ore on the metal deposition layer; e) a step of forming the above-mentioned polyimine resin layer by subjecting the polyimine precursor resin layer in the above coating film to heat treatment by heat treatment. Further, in the method for producing a circuit board of the present invention, after the step a), further comprising: f) drying the coating film with a metal ion-containing aqueous solution to make the coating The step of increasing the metal ion content; or after the step a), further comprising: g) applying the ammonia solution to the coating film described above or! A step of impregnation of an aqueous solution of a primary or secondary amine. (Effect of the Invention) According to the method for manufacturing a circuit material substrate of the present invention, since the silver etching step of the seed layer (metal deposition layer) is not required, the simple steps of 098104040 7 200945980 can be simplified to form fine fineness. Since the pitch circuit is used, it is not necessary to provide a large-scale capital supply, and the circuit wiring and the insulating resin layer can be manufactured (the polyimine tree L is densely packed with a circuit board, so the industrial value is very high. Others of the present invention The purpose, the features, and the advantages of the present invention will be fully described below with reference to the drawings and FIG. 2 as an embodiment of the present invention. FIG. 2 is an explanatory diagram of the steps of the main steps of the method of manufacturing the wiring board; FIG. 2 is an explanatory diagram of each step. The circuit wiring board 1 (?) obtained by the manufacturing method of the present invention is, for example, as shown in FIG. 2(e) The structure of the polyimine resin layer 3 is formed by forming the circuit wiring 9. The form of the polyimine resin layer 3 is not particularly limited, and for example, it may be a film of a polyimide film. In addition, the substrate 1 may be in the form of a metal foil, a glass plate, or a substrate 1 such as a film. Further, as the substrate 1, a sheet-like layer in which a polyimide layer 3 is laminated may be mentioned. a resin, a glass substrate, a ceramic, a metal foil, etc. Further, the substrate 1 may be made of a polyimide resin. The entire thickness of the polyimide layer 3 may be set to be in the range of 3 to 1 Å/m. 'It is preferably in the range of 3 to 50. The polyimine resin can be formed by imidating (hardening) the polyimine precursor resin quinone, here, the term "polyimine precursor resin" Also included is a light-emitting group (for example, an ethylenically unsaturated hydrocarbon group) in the molecular skeleton of 098104040 8 200945980. Details of the oxime imidization will be described later. [Step a: Coating film forming step] In the present embodiment In the method for producing a circuit board, the coating liquid containing the polyimide precursor resin and the metal compound is applied onto the substrate 1 and dried, as shown in FIGS. 1 and 2(a). The coating film 3a is formed as it is (step S1). As a polyimide precursor resin (hereinafter also referred to as "only" In the case of the precursor, a precursor of a known polyimine which can be obtained by using a known acid anhydride and a diamine can be produced by a known method. The precursor, for example, can be a tetra-baric acid dianhydride and a diamine. The solvent is substantially dissolved in an organic solvent, and stirred at a temperature in the range of 〇100 ° C for 30 minutes to 24 hours, and then subjected to polymerization reaction. The reaction can be used to make the precursor in an organic solvent. The reaction component is dissolved in a range of 5 to 30% by weight (preferably in the range of 1 Torr to 20% by weight). The organic solvent used in the polymerization reaction is preferably used as an organic polar solvent. For example, N,N-didecylamine, N,N-dimercaptoacetamide (DMAc), N~mercapto-2-pyrrolidine, 2-butanone, disulfoxide, Dimethyl sulphate, cyclohexanyl, dioxane, tetrahydrofurazan, m trisuccinyl ether, and the like. These solvents may be used in combination of two or more kinds, and in addition, aromatic hydrocarbons such as diphenylbenzene and hydrazine may be partially used. The precursor of the synthesis can be used as a solution state. Usually, it is preferably used as a reaction solvent solution, and if necessary, it may be concentrated, diluted or substituted with another solvent. Also, since the precursor is generally excellent in solvent solubility, it can be advantageously used in 098104040 9 200945980. The solution thus adjusted can be utilized as a coating liquid by adding a metal compound. The precursor is preferably selected to contain a thermoplastic polyimine resin after imidization. By using a thermoplastic resin, the adhesion to the metal deposition layer 7 (described later) can be improved. Such a thermoplastic polyimine resin preferably has a glass transition temperature of 350 ° C or less, more preferably 200 to 320 ° C. As a precursor of the thermoplastic polyimine resin, a divalent aromatic group represented by the formula (2)' = (3) or (4) in the formula (1) is used as a precursor of the structural unit represented by the following (1), An Representing = aromatic group 'in formula (2) to formula (4), R, Table 2) 6 is a sulphate-based oxy group, n is an independent singularity of 4 carbon _ 立立单键 or selected from 3) Broad,, or - the valence of 2 in the side. The presence of the two digits is in the range of 0.1 to 1.0. Early [Chemical 1]

於上述通式(1)中,An可稱為二胺之殘基, »〇C.⑻ Ar2可稱為酸酐 098104040 200945980 之殘基’故較佳之聚醯亞胺樹脂可藉由二胺與酸酐做說明。 然而’熱可塑性之聚醯亞胺樹脂之前驅物並非限定於依此法 所獲得者。 作為較佳的適用於熱可塑性聚醯亞胺樹脂的前驅物之調 製之二胺,可舉出例如:4,4’ -二胺基二苯基醚、2,_曱氧 基―4,4,—二胺基苯醯苯胺、1,4-雙(4-胺基苯基)苯、1,3- 雙(4-胺基笨基)苯、2, 2_雙[4-(4-胺基苯氧基)苯基]丙烷、 ❹ 2, 2’ -二曱基-4,4,-二胺基聯苯、3, 3’ -二羥基-4, 4,- 二胺基聯苯、4, 4’ -二胺基苯醯苯胺等。此外,尚可舉出於 後述之低熱膨脹性聚醯亞胺樹脂的說明中所舉出者。此等之 中,作為特佳之二胺成分,可舉出:選自1,3-雙(4-胺基苯 氧基)-2, 2-二曱基丙烷(DANPG)、2, 2-雙[4-(4-胺基苯氧基) 苯基]丙烷(BAPP)、1, 3-雙(3-胺基苯氧基)苯(APB)、對苯二 胺(p-PDA)、3,4’ -二胺基二苯醚(DAPE34)、4,4’ -二胺基 ❹ 二苯醚(DAPE44)中之1種以上的二胺。 作為較佳之適用於熱可塑性聚醯亞胺樹脂的前驅物之調 製中所用之酸酐’可舉出例如:均苯四甲酸酐、3,3’,4,4’-聯苯四羧酸二酐、3,3’,4,4’ -聯苯砜四羧酸二酐、4,4’ -氧二苯二曱酸酐。此外,尚可使用於後述之低熱膨脹性聚醯 亞胺樹脂的說明中所舉出之酸酐。此等之中,作為特佳之酸 酐,可舉出:選自均苯四甲酸酐(PMDA)、3,3’,4, 4’ -聯苯 四羧酸二酐(BPDA)、3,3’,4,4’ -二苯基酮四羧酸二酐 098104040 11 200945980 (BTDA)、3’3,4,4’ -聯苯翻㈣二軒(隨)中之 上之酸酐。 二胺'酸酐可分別單獨使用其i種,亦可2 _上並用。 又,亦可並用上述以外之二胺及酸酐。 於熱可塑性聚醯亞胺樹脂的前驅物中,以上述式⑴表示 =構造單位,可存在於均聚㈣,亦可存在於共聚物之構造 位中。於具有複數構造單位之共聚物的情況,可為嵌段共 聚物的形態而存在,亦可為無規共聚物_態而存在。以式 ⑴表示之構造單位雖為複數,惟亦可為1種或為2種以上。 較佳者為,以由式⑴表示的構造單位作為主成分,更佳者 為’含㈣莫耳%以上(以8G莫耳%以上為更佳)之前驅物。 本實施形態中,為了調製塗佈液,作為含有前驅物之溶 2 ’較佳者亦可使用市售品。可舉出例如:新日鐵化學⑻ 之熱可塑性聚醯亞胺前驅物樹脂清漆spi_2〇霞商品 =)、同SP卜画(商品名)、同SPh_g(商品名)、東麗(股) 製之Toraynish #3000(商品名)等。 作為與前驅物—起含有於㈣液中之金屬化合物用以形 ^屬析出層7之含有較還原處理(後述)中所用還原劑之 氧化還原電位高的氧化還原電位之金屬種的化合物,並益特 :]限制地皆可使用。作為金屬化合物,可舉出含有糾 種去。d、Ag、AU、Pt、如、Fe、C。、Cr、Rh、Ru 等之金屬In the above formula (1), An may be referred to as a residue of a diamine, and »〇C.(8) Ar2 may be referred to as a residue of an acid anhydride 098104040 200945980'. Therefore, a preferred polyimine resin may be a diamine and an acid anhydride. To explain. However, the term "thermoplastic polyimine resin precursor" is not limited to those obtained by this method. Preferred diamines which are suitable for the preparation of the precursor of the thermoplastic polyimine resin include, for example, 4,4'-diaminodiphenyl ether and 2,_decyloxy-4,4. ,-diaminophenylaniline, 1,4-bis(4-aminophenyl)benzene, 1,3-bis(4-aminophenyl)benzene, 2, 2_bis[4-(4- Aminophenoxy)phenyl]propane, 2,2'-dimercapto-4,4,-diaminobiphenyl, 3,3'-dihydroxy-4,4,-diaminobiphenyl , 4, 4'-diaminobenzidine and the like. Further, it is also exemplified in the description of the low thermal expansion polyimine resin described later. Among these, as a particularly preferred diamine component, it is selected from the group consisting of 1,3-bis(4-aminophenoxy)-2,2-dimercaptopropane (DANPG), 2, 2-double [4-(4-Aminophenoxy)phenyl]propane (BAPP), 1, 3-bis(3-aminophenoxy)benzene (APB), p-phenylenediamine (p-PDA), 3 One or more kinds of diamines of 4'-diaminodiphenyl ether (DAPE34) and 4,4'-diamino hydrazine diphenyl ether (DAPE44). The acid anhydride used in the preparation of a precursor suitable for use in the thermoplastic polyimide resin may be, for example, pyromellitic anhydride or 3,3',4,4'-biphenyltetracarboxylic dianhydride. , 3,3',4,4'-diphenyl sulfone tetracarboxylic dianhydride, 4,4'-oxydiphenyl phthalic anhydride. Further, the acid anhydride described in the description of the low thermal expansion polyimide resin described later can be used. Among these, as a particularly preferred acid anhydride, it is selected from the group consisting of pyromellitic anhydride (PMDA), 3,3', 4, 4'-biphenyltetracarboxylic dianhydride (BPDA), and 3,3'. , 4,4'-diphenyl ketone tetracarboxylic dianhydride 098104040 11 200945980 (BTDA), 3'3,4,4'-biphenyl turned over (tetra) two Xuan (with) anhydride. The diamine 'anhydride can be used alone or in combination. Further, diamines and acid anhydrides other than the above may be used in combination. The precursor of the thermoplastic polyimine resin is represented by the above formula (1) = structural unit, may be present in homopolymer (IV), or may be present in the structural position of the copolymer. In the case of a copolymer having a plurality of structural units, it may be in the form of a block copolymer or may be in the form of a random copolymer. The structural unit represented by the formula (1) is plural, but may be one type or two or more types. Preferably, the structural unit represented by the formula (1) is used as a main component, and more preferably a precursor containing (tetra) mol% or more (more preferably 8 Gmol% or more). In the present embodiment, in order to prepare a coating liquid, a commercially available product may be used as a solvent containing a precursor. For example, Nippon Steel Chemical Co., Ltd. (8) Thermoplastic Polyimine Precursor Resin Varnish spi_2 〇 商品 商品 = = = = = = = = = = = = = = = = = = = = = = = = = = = ( = ( ( ( ( ( ( ( ( ( Toraynish #3000 (trade name) and so on. a metal compound containing a metal compound contained in the (IV) liquid as a precursor, and a metal species having a redox potential higher than that of the reducing agent used in the reduction treatment (described later) in the precipitation layer 7 and Yite:] All restrictions can be used. As the metal compound, it is possible to include a correction. d, Ag, AU, Pt, such as, Fe, C. Metals such as Cr, Rh, Ru, etc.

裡者。作為金屬化合物,可用治·、+、A BS J述金屬之鹽或有機羰基錯合 098104040 ❹ ❹ 12 200945980 體等。作為金屬之鹽’可舉出例如:鹽酸鹽、硫酸鹽、乙酸 鹽、草酸鹽、檸檬酸鹽等。金屬鹽,較佳者可使用前述金屬 .為Cu、Nl、Pd者。x ’作為可與上述金屬形成有機幾基錯 .合體之有機幾基化合物,可舉出例如:乙㈣嗣、苯f酿丙 嗣、二苯甲醯甲烧等之万-二_貝、乙酿乙酸乙醋等之万— - 氧代羧酸酯等。 作為金屬化合物之較佳具體例可舉出:Ni(CH3C00)2、 ❹ Cu(CH3COO)2、Pd(CH3C00)2、NiS〇4、CuS〇4、PdS〇4、NiC〇3、 CuC〇3、PdC〇3、N1CI2、C11CI2、PdCl2、NiBn、CuBr2、PdBr2、Inside. As the metal compound, it is possible to use a metal salt or an organic carbonyl group of 098,040,040, ❹ ❹ 12 200945980. The salt of the metal may, for example, be a hydrochloride, a sulfate, an acetate, an oxalate or a citrate. As the metal salt, the above metal can be preferably used. It is Cu, Nl, or Pd. x ' as an organic group-based compound which can form an organic base group with the above-mentioned metal, and examples thereof include: bis(b) fluorene, benzene f propylene phthalocyanine, benzophenone carbaryl, etc. Stuffed with acetic acid, such as ethyl vinegar, etc. - oxocarboxylate. Preferable specific examples of the metal compound include Ni(CH3C00)2, ❹Cu(CH3COO)2, Pd(CH3C00)2, NiS〇4, CuS〇4, PdS〇4, NiC〇3, CuC〇3. , PdC〇3, N1CI2, C11CI2, PdCl2, NiBn, CuBr2, PdBr2

Ni(N〇3)2、NiC2〇4、Ni(MO2)2、Cu(NH4)2C14、Cul、Cu(N〇3)2、 Pd(N〇3)2、Ni(CH3C0CH2C0CH3)2、Cu(CH3COCH2C〇CH3)2、 Pd(CH3C0CH2C0CH3)2 等。 於含有前驅物與金屬化合物的塗佈液中,會於金屬化合物 解離所產生的金屬離子與前驅物之間產生3維之交聯形成 ©反應因此隨著時間經過,塗佈液會向增黏-膠化進行, 致對基材1之塗佈變得困難。為了防止此等增黏、膠化,以 在塗佈液中添加作為安定劑之黏度調整劑為佳。藉由黏度調 整劑之添加’塗佈液中的金屬離子會與黏度調整劑形成螯合 錯U體代替與前驅物形成螯合錯合體。如此般,藉由黏度調 整#1可阻礙前驅物與金屬離子之形成 3維交聯’可抑制增黏 與膠化。 曰 作為黏度調整劑,以選定與金屬離子反應性高(亦即,可 098104040 13 200945980 v成金屬錯合體)的低分子有機化合物為佳 合物的分子息、,cn on 低分子有機化 里以50〜300的範圍内為佳。作 劑之具體例,可臬山加1 · 乍為此專黏度調整 舉出例如.乙酿基丙酮、乙 咬、咪咬、甲基料等。又,黏度調整 :乙S曰…比 為相對於可 添加量,較佳者 糾範圍内,W耳的職内為佳M1〜5〇莫界 塗佈液中的金屬化合物之調配量係相 合物及黏度調整劑的合計議重量份,定為5= 物、金屬= 範圍内,以10〜4。重量份的範圍内為佳。理由在於量: 況下,金屬化合物若未達5重量份,由於藉由還原處理= 酿亞胺前驅物樹脂層表面的金屬離子之析出少,導致導體廣 例如非電解鑛敷)的厚度不均一,若超過重量份 佈液中無法溶解的金屬鹽會沈澱之故。 , 又’塗佈液中’作為上述成分以外之任意成分,可調配例 如平滑劑、消泡劑、密著性賦予劑、交聯劑等。 _ 將塗佈液塗佈於基材1的方法並無特別限制,可用例如逗 點式、模具式、刀式、唇式(lipc〇ater)等之塗佈機塗佈。 又,於基材1上塗佈塗佈液後,使其乾燥,形成塗佈膜 3a。於乾燥中,係以使前驅物之脫水閉環的進行所致之醯亞 胺化不為終了的方式控制溫度。作為乾燥的方法並無特別限 制,例如,可於60〜200。(:範圍内的溫度條件下進行丨~60 分鐘的範圍内之時間,較佳者為,於6〇〜15〇乞範圍内的溫 098104040 200945980 度條件下進打乾燥。殘留前驅物的狀態,於使其含浸於含有 金屬離子的水溶液所必要的。乾燥後的前驅物之層,其前驅 物構造之一部伤經醯亞胺化亦無妨,惟作為醯亞胺化率宜為 50/以下'以20%以下為佳),前驅物構造宜殘留5〇%以 上又鈉驅物之驢亞胺化率,可藉由傅里葉(F〇urier)轉 -換紅外分光光度計(市售品:日本分光製FT/IR62())以透過 法測定聚醯亞胺薄膜的紅外線吸收光譜,用^麵⑽]之苯 ®環碳氫鍵作為基準,由UL1之來自醯亞胺基的吸光度 算出。 塗佈膜3a可為單層,亦可為由複數的塗佈膜如所形成之 積層構造。於作成為複數的情況,可在由不同的構成成分所 成之前驅物層上依序塗佈其他前驅物形成。於前驅物層係由 3層以上_搞情況’相同構成的前驅物亦可使用2次以 上。層構造解的2層或單層’尤其是單層,由於於產業上 〇二:’二較佳。又’塗佈媒3a之厚度(乾燥後)宜 在3,:範圍内’以在3〜範園内為佳。 於形成由複數層所構成的塗佈 含有金屬=物,亦可只於部分 化合物為佳。 層)的轉㈣含有金屬 於以複數層構成塗佈臈3a之情况 聚酿亞胺樹脂層3,以使前驅物層鄰接於電路佈線9之 乂成為於後述之醯亞胺化 098104040 15 200945980 後為熱可塑性之聚醯亞胺樹脂層為佳。又,複數層中之至少 1層’以使前驅物層形成為於醯亞胺化後為低熱膨脹性之聚 酿亞胺樹脂為佳。若以此種低熱膨脹性聚醯亞胺樹脂作為絕 緣樹脂層使用,則可抑制作為電路佈線基板之反翹,故較有 利。於聚醯亞胺樹脂層係以低熱膨脹性聚醯亞胺樹脂層與熱 可塑性樹脂層構成的情況,其合計厚度之1/2以上(以2/3 〜9/10為佳)以由低熱膨脹性聚醯亞胺樹脂層構成為佳。 又,就耐熱性與尺寸安定性之考量,熱可塑性聚醯亞胺樹脂 層的一層之厚度宜為5//m以下,以在1〜4以m的範圍為佳。 聚醯亞胺樹脂層全體之線熱膨脹係數宜為3〇χ1(Γ6(1/κ)以 下,以在5xl〇-6〜25xl〇-6(l/K)的範圍為佳。 低熱膨脹性聚醯亞胺樹脂,具體而言,為線熱膨脹係數為 lxl(T6〜30xl〇-6(l/K)的範圍内(以 1χ1〇-6〜25χ1〇—6(1/κ)的 範圍内為佳,α 15xl(T6〜25χ1(Γ6(1/Κ)的範圍内為更佳)的 低熱膨服性之聚醜亞胺樹脂。此種低熱膨脹性聚醯亞胺樹 脂,以具有以下述通式(7)表示的構造單位的聚醯亞胺樹脂 為佳。於式(7)中,An表示以式(8)或式(9)表示之4價芳香 族基’ An表示以式(10)或式⑴)表示之2價芳香族基,^ 為獨立之碳數1〜6的1價烴基或烷氧基,v及γ表示獨立 之單鍵或碳數1〜15之2價烴基、選自〇、s、c〇、s〇、s〇2、 或C0NH中之2價基,m表示獨立之〇〜4的整數,q表示構 成單位之存在莫耳比,為^丨〜^的範圍。 098104040 16 200945980 [化2]Ni(N〇3)2, NiC2〇4, Ni(MO2)2, Cu(NH4)2C14, Cul, Cu(N〇3)2, Pd(N〇3)2, Ni(CH3C0CH2C0CH3)2, Cu( CH3COCH2C〇CH3)2, Pd(CH3C0CH2C0CH3)2, and the like. In the coating liquid containing the precursor and the metal compound, a three-dimensional cross-linking is formed between the metal ion generated by dissociation of the metal compound and the precursor to form a reaction, so that the coating liquid is thickened over time. - Gelation proceeds, making coating of the substrate 1 difficult. In order to prevent such adhesion and gelation, it is preferred to add a viscosity adjusting agent as a stabilizer to the coating liquid. By the addition of the viscosity modifier, the metal ions in the coating liquid form a chelate misalignment with the viscosity modifier instead of forming a chelate complex with the precursor. In this way, by adjusting the viscosity #1, the formation of the precursor and the metal ions can be hindered, and the three-dimensional crosslinking can inhibit the adhesion and gelation. As a viscosity modifier, 曰 on low molecular organic organic compounds with high reactivity with metal ions (ie, 098104040 13 200945980 v metal complex) The range of 50 to 300 is better. As a specific example of the agent, it is possible to adjust the viscosity of the mountain by adding 1 · 乍 for the specific viscosity, for example, ethyl acetonide, B biting, microphone biting, methyl material, and the like. Moreover, the viscosity adjustment: B 曰 曰 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 比 W W W W W W W W W And the total weight fraction of the viscosity modifier is set to 5 = 4 in the range of material = metal = 10 to 4. The range of parts by weight is preferred. The reason is that the amount is as follows: if the amount of the metal compound is less than 5 parts by weight, the thickness of the metal ion on the surface of the resin layer of the yammine precursor is reduced by the reduction treatment, resulting in uneven thickness of the conductor, such as electroless ore. If more than a part by weight of the metal salt that cannot be dissolved in the cloth liquid will precipitate. Further, as the optional component other than the above components, the "coating liquid" may be, for example, a smoothing agent, an antifoaming agent, a tackifier, a crosslinking agent or the like. The method of applying the coating liquid to the substrate 1 is not particularly limited, and it can be applied by a coater such as a comma type, a mold type, a knife type, or a lip type. Further, the coating liquid is applied onto the substrate 1, and then dried to form a coating film 3a. In the drying, the temperature is controlled in such a manner that the imidization by the progress of the dehydration ring closure of the precursor is not finalized. The method of drying is not particularly limited, and for example, it may be 60 to 200. (: The time in the range of 丨~60 minutes under the temperature condition within the range, preferably, the temperature is 098104040 200945980 degrees in the range of 6〇~15〇乞. The state of the residual precursor, It is necessary to impregnate the aqueous solution containing metal ions. The layer of the precursor after drying may be imidized by one of the precursor structures, but the imidization ratio is preferably 50/min. 'Belows less than 20%), the precursor structure should be more than 5% by weight and the yttrium imidization rate of sodium drive can be obtained by F傅urier conversion-infrared spectrophotometer (commercially available) Product: FT/IR62() of Japan Spectrophotometer) The infrared absorption spectrum of the polyimide film was measured by the transmission method, and the absorbance from the quinone imine group of UL1 was determined by using the benzene® ring hydrocarbon bond of the surface (10)]. Calculated. The coating film 3a may be a single layer or a laminated structure formed of a plurality of coating films. In the case of a plurality of precursors, other precursors may be sequentially applied to the precursor layer formed of different constituent components. The precursor having the same composition of three or more layers of the precursor layer may be used twice or more. The two-layer or single-layer' of the layer structure solution, especially the single layer, is preferred because of the industry. Further, the thickness of the coating medium 3a (after drying) is preferably in the range of 3::, preferably in the range of 3 to Fan. It is preferable to form a coating containing a plurality of layers to contain a metal = material, and it is preferable to use only a part of the compound. The transition of the layer (4) contains the metal in the case where the coating layer 3a is formed of a plurality of layers, and the polyimide layer 3 is formed so that the precursor layer is adjacent to the circuit wiring 9 after the imidization of 098104040 15 200945980 described later. It is preferred that the thermoplastic polyimide layer is a thermoplastic resin layer. Further, at least one of the plurality of layers is preferably such that the precursor layer is formed into a polyiimide resin having a low thermal expansion property after imidization. When such a low thermal expansion polyimide resin is used as the insulating resin layer, it is possible to suppress the warpage of the circuit wiring board, which is advantageous. When the polyimine resin layer is composed of a low thermal expansion polyimide resin layer and a thermoplastic resin layer, the total thickness is 1/2 or more (more preferably 2/3 to 9/10). The heat-expandable polyimine resin layer is preferably formed. Further, in consideration of heat resistance and dimensional stability, the thickness of one layer of the thermoplastic polyimide film layer is preferably 5 / / m or less, preferably in the range of 1 to 4 in m. The linear thermal expansion coefficient of the entire polyimide resin layer is preferably 3〇χ1 (Γ6(1/κ) or less, preferably in the range of 5xl〇-6~25xl〇-6 (l/K). Low thermal expansion poly The quinone imine resin, specifically, has a linear thermal expansion coefficient of lxl (T6 to 30xl -6 (l/K) in the range of 1 χ 1 〇 6 to 25 χ 1 〇 6 (1/κ). Preferably, α 15xl (T6~25χ1 (better in the range of Γ6(1/Κ)) is a low thermal expansion polyurethane resin. The low thermal expansion polyimine resin has the following The polyimine resin of the structural unit represented by the formula (7) is preferred. In the formula (7), An represents a tetravalent aromatic group 'An represented by the formula (8) or the formula (9), and represents an Or a divalent aromatic group represented by the formula (1)), wherein it is an independently monovalent hydrocarbon group or alkoxy group having 1 to 6 carbon atoms, and v and γ represent an independent single bond or a divalent hydrocarbon group having 1 to 15 carbon atoms; a divalent group selected from 〇, s, c〇, s〇, s〇2, or C0NH, m represents an integer of 〇4, and q represents the presence of a molar ratio of the constituent unit, which is ^丨~^ Scope 098104040 16 200945980 [Chemical 2]

人 Y N—Ar4—— …(7)Person Y N-Ar4 - ...(7)

上述構造單位可存在於均聚物中,或以共聚物的構造單位 存在。於具有複數的構造單位之共聚物的情況,可作為嵌段 共聚物存在,亦可作為無規共聚物存在。 於上述通式(7)中,An可說是二胺的殘基,Ar4可說是酸 酐的殘基,茲就較佳之聚醯亞胺樹脂藉由二胺與酸酐做說 明。然而,低熱膨脹性聚醯亞胺樹脂並非限定於藉由此方法 〇 所得者。 作為於低熱膨脹性聚醯亞胺樹脂層的形成所用之酸酐,較 佳者可例示出:均苯四曱酸酐、3,3’,4, 4’ -聯苯四羧酸二 酐、3,3’,4,4’ -二苯基颯四羧酸二酐、4,4’ -氧二苯二甲 酸酐。又,作為酸酐,較佳者亦可例示出:2,2’,3,3’-、 2,3,3’,4’ -或3,3’,4,4’ -二苯基酮四羧酸二酐、 2,3’,3,4’ -聯苯四羧酸二酐、2,2’,3,3’ -聯苯四羧酸二 酐、2,3’,3,4’ -二苯基醚四羧酸二酐、雙(2,3-二羧苯基) 098104040 17 200945980 醚二酐等。再者,作為_,較佳者亦可例示出: 3,3^ ,4,r - ^2,3,3^ ,r 2 r 3>3„ 羧酸二酐、2,2-雙(2’3-或3,4_二羧苯基)_丙烷二酐、雙 (2,3-ic ^ ¢(2,3-,¾ 3, 4-^^^ 基 >風二11’卜雙(2’ 3_或3, 4_二解基)_乙烧二軒等。The above structural unit may be present in the homopolymer or in the structural unit of the copolymer. In the case of a copolymer having a plurality of structural units, it may be present as a block copolymer or as a random copolymer. In the above formula (7), An can be said to be a residue of a diamine, and Ar4 can be said to be a residue of an acid anhydride. The preferred polyimine resin is described by a diamine and an acid anhydride. However, the low thermal expansion polyimine resin is not limited to those obtained by this method. The acid anhydride used for the formation of the low thermal expansion polyimine resin layer is preferably exemplified by pyromellitic anhydride, 3,3', 4, 4'-biphenyltetracarboxylic dianhydride, and 3. 3',4,4'-diphenylphosphonium tetracarboxylic dianhydride, 4,4'-oxydiphthalic anhydride. Further, as the acid anhydride, preferred examples are: 2,2',3,3'-, 2,3,3',4'- or 3,3',4,4'-diphenyl ketone four Carboxylic dianhydride, 2,3',3,4'-biphenyltetracarboxylic dianhydride, 2,2',3,3'-biphenyltetracarboxylic dianhydride, 2,3',3,4' - Diphenyl ether tetracarboxylic dianhydride, bis(2,3-dicarboxyphenyl) 098104040 17 200945980 Ether dianhydride or the like. Further, as _, preferred examples are also: 3,3^,4,r - ^2,3,3^,r 2 r 3>3„carboxylic acid dianhydride, 2,2-double (2 '3- or 3,4_dicarboxyphenyl)-propane dianhydride, double (2,3-ic ^ ¢(2,3-,3⁄4 3, 4-^^^ base > wind 2 11' b double (2' 3_ or 3, 4_ two solution base) _ E-burn two Xuan and so on.

作為其他酸酐,可舉出例如:^卜以仏或 1’ 2, 9, 10-菲-四羧酸二酐、2, 3, 6,卜蒽四羧酸二酐、& 2— 雙(3,4-—賴—苯基)四氟丙烧二針、2,3,5,6_環己燒二 酐、2’3’6’7一萘四羧酸二酐、1,2, 5, 6-萘四羧酸二酐T 1’4’5,8-萘四羧酸二酐、48__二甲基_12,3,5,6,7_六氫萘 -1,2, 5, 6-四羧酸二酐、2, 6-或2, 7_二氯萘—κ 5, 8_四綾 酸二奸、2’ 3’ 6’ 7-(或 I 4, 5, 8-)四氯萘-1,4, 5, 8-(或 2, 3, 6, 7-)四叛酸二酐、2,3,8,9-、3,4,9,10-、4,5,1〇,1卜 或5,6,11,12-茈-四羧酸二酐、環戊烷_1,2,3,4_四羧酸二 〇 酐、吡畊-2,3,5,6-四羧酸二酐、吡咯啶_2,3,4,5_四羧酸二 酐、噻吩-2,3,4’5-四羧酸二酐、4,4,_雙(2,3—二羧氧苯氧 基)二苯基甲烷二酐等。 作為形成低熱膨脹性聚醯亞胺樹脂所用的二胺,較佳者可 例示出:4,4’ -二胺二苯醚、2’ _曱氧基_4,4,_二胺基苯 醯笨胺、1,4-雙(4-胺基苯氧基)苯、13_雙(4_胺基苯氧基) 苯、2,2’ -雙[4-(4-胺基苯氧基)苯]丙烷、2,2,_二曱基 -4,4,_二胺基聯笨、3,3’ _二羥基-4,4,_二胺基聯苯、 098104040 18 200945980 4’4’ -二胺基苯醯苯胺等作為二胺,較佳者可例示出: 2’ \雙[4-(3_胺絲氧基)祕]城、雙[4_(4_胺基苯氧 苯基]碾、雙[4-(3-胺基苯氧基)笨基]硬、雙[4_(4_胺基 • ^祕)]聯笨、雙[4-(3_胺縣輪)]聯笨、雙Π-(4-胺基 苯氧基)]聯苯、雙[1-(3_胺基苯氧基)]聯苯、雙[4-(4-胺基 笨氧基)笨基]甲烷、雙[4_(3一胺基苯氧基)苯基]甲烧、雙 -[4-(4-胺基苯氧基)笨基]醚、雙[4-(3-胺基苯氧基)苯基] ❹趟、雙[4-(4-胺基苯氧基)]二苯基,雙[4_(3_胺基苯氧基)] 二苯基酮、雙[4, 4,-(4-胺基苯氧基)]苯醯苯胺、雙 [4, 4 -(3-胺基苯氧基)]苯醯苯胺、9, 9-雙[4-(4-胺基笨氧 基)苯基]g、9, 9-雙[4-(3-胺基苯氧基)苯基]苐等。 作為其他二胺,可舉出例如:2, 2-雙[4-(4-胺基苯氧基) 苯基]六氟丙烷、2,2-雙[4-(3-胺基苯氧基)苯基]六氟丙 烷、4’4’ -亞甲基二-〇-甲苯胺、4, 4’ -亞甲基二-2, 6-二甲 © 苯胺、4,4’ _亞甲基-2,6-二乙苯胺、4, 4,_二胺基二苯基 丙烷、3,3’ _二胺基二苯基丙烷、4, 4,_二胺基二苯基乙 烧、3,3’ -二胺基二苯基乙烷、4,4,-二胺基二苯基甲烷、 3, 3’ -二胺基二苯基甲烷、4, 4’ -二胺基二苯硫醚、3,3’ -二胺基二笨硫醚、4,4’ -二胺基二苯基硬、3,3’ -二胺基二 苯基砜、4,4’ -二胺基二苯基醚、3,3-二胺基二苯基醚、 3,4’-二胺基二苯基醚、聯苯胺、3,3’-二胺基聯苯、3,3’-二曱基-4,4’ -二胺基聯苯、3,3’ -二曱氧基聯苯胺、4,4”- 098104040 19 200945980As other acid anhydrides, for example, 仏 or 1' 2, 9, 10-phenanthrene-tetracarboxylic dianhydride, 2, 3, 6, diterpene tetracarboxylic dianhydride, & 2 - double ( 3,4-Lai-phenyl) tetrafluoropropanone two-needle, 2,3,5,6-cyclohexane dianhydride, 2'3'6'7-naphthalenetetracarboxylic dianhydride, 1,2, 5,6-naphthalenetetracarboxylic dianhydride T 1 '4'5,8-naphthalenetetracarboxylic dianhydride, 48__dimethyl_12,3,5,6,7-hexahydronaphthalene-1,2, 5,6-tetracarboxylic dianhydride, 2,6- or 2,7-dichloronaphthalene-κ 5, 8_tetradecanoic acid, 2' 3' 6' 7- (or I 4, 5, 8 -) tetrachloronaphthalene-1,4,5, 8-(or 2, 3, 6, 7-) tetra-retensive dianhydride, 2,3,8,9-,3,4,9,10-,4 , 5,1〇,1b or 5,6,11,12-茈-tetracarboxylic dianhydride, cyclopentane_1,2,3,4_tetracarboxylic acid diacetic anhydride, pyridin-2,3 , 5,6-tetracarboxylic dianhydride, pyrrolidine 2,3,4,5-tetracarboxylic dianhydride, thiophene-2,3,4'5-tetracarboxylic dianhydride, 4,4,_double (2,3-Carboxyoxyphenoxy)diphenylmethane dianhydride. As the diamine used for forming the low thermal expansion polyimine resin, preferred examples are: 4,4'-diamine diphenyl ether, 2'-methoxy group 4,4,-diaminophenyl hydrazine Stupid amine, 1,4-bis(4-aminophenoxy)benzene, 13-bis(4-aminophenoxy)benzene, 2,2'-bis[4-(4-aminophenoxy) Benzene]propane, 2,2,-diindolyl-4,4,-diamino-based stupid, 3,3'-dihydroxy-4,4,-diaminobiphenyl, 098104040 18 200945980 4'4 '-Diaminobenzidine aniline or the like as a diamine, preferably exemplified by: 2' \bis[4-(3_amine-siloxy)), bis[4_(4-aminophenoxybenzene) Grinding, bis[4-(3-aminophenoxy) stupyl] hard, bis[4_(4-amino group)] stupid, double [4-(3_amine county)] Bismuth, biguanide-(4-aminophenoxy)]biphenyl, bis[1-(3-aminophenoxy)]biphenyl, bis[4-(4-aminophenyloxy) stupid Methane, bis[4-(3-aminophenoxy)phenyl]methane, bis-[4-(4-aminophenoxy)phenyl]ether, bis[4-(3-amino) Phenoxy)phenyl]indole, bis[4-(4-aminophenoxy)]diphenyl, bis[4-(3-aminophenoxy)]diphenyl ketone, bis[4, 4,-(4-amine Phenoxy)]phenylaniline, bis[4,4-(3-aminophenoxy)]phenylanilide, 9,9-bis[4-(4-aminophenyloxy)phenyl]g 9,9-bis[4-(3-aminophenoxy)phenyl]anthracene, etc. As other diamines, for example, 2,2-bis[4-(4-aminophenoxy) Phenyl]hexafluoropropane, 2,2-bis[4-(3-aminophenoxy)phenyl]hexafluoropropane, 4'4'-methylenebis-indole-toluidine, 4, 4 '-Methylene-2,6-dimethylaniline, 4,4'-methylene-2,6-diethylaniline, 4,4,-diaminodiphenylpropane, 3,3' _Diaminodiphenylpropane, 4, 4,-diaminodiphenylethane, 3,3'-diaminodiphenylethane, 4,4,-diaminodiphenylmethane, 3, 3'-diaminodiphenylmethane, 4,4'-diaminodiphenyl sulfide, 3,3'-diaminodiphenyl sulfide, 4,4'-diaminodiphenyl Hard, 3,3'-diaminodiphenyl sulfone, 4,4'-diaminodiphenyl ether, 3,3-diaminodiphenyl ether, 3,4'-diaminodiphenyl Ether, benzidine, 3,3'-diaminobiphenyl, 3,3'-dimercapto-4,4'-diaminobiphenyl, 3,3'-dimethoxyoxybenzidine, 4 , 4"- 0981 04040 19 200945980

:胺基-p-三聯苯、3, 3” _二胺基_p_三聯苯、間苯二胺、對 苯一胺、2,6-二胺^比啶、1,4_雙(4_胺基苯氧基)笨、n 雙(4-胺基苯氧基)笨、4 4,〜[14_伸苯基雙(卜曱基亞乙 基)]雙苯胺、4, 4’ -[1,3-料基雙(卜甲基亞乙基)]雙笨 胺、雙(P-胺基環己基)曱烧、雙(pi胺基十丁基苯基) 峻、雙(P_f甲基一占一胺基戊基)苯、P-雙(2-甲基-4-胺基 戍基)苯、P-雙(1,卜二甲基_5一胺基戊基)苯、(,卜二胺基 蔡、2’6~一胺基萘、2,4—雙(沒-胺基-t-丁基)甲苯、2,4-^職甲苯、m~二甲苯-2, 5-二胺、p-二甲苯_2, 5_二胺:m— 本私P 一曱本一胺、2, 6-二胺基吼π定、2, 5-二胺基 比啶、2’ 5一二胺基~1,3, 4-»等二唑、哌畊等。:Amino-p-terphenyl, 3,3"-diamino-p-terphenyl, m-phenylenediamine, p-phenylamine, 2,6-diamine pyridine, 1,4 bis (4 _Aminophenoxy) stupid, n bis(4-aminophenoxy) stupid, 4 4,~[14_phenylphenylbis(diphenylethylene)diphenylamine, 4, 4'-[1 , 3-butyl bis(polyethylidene)] bis-amine, bis(P-aminocyclohexyl) fluorene, bis(pi-amino-dodecylphenyl), bis (P_f methyl one) Aminopentyl)benzene, P-bis(2-methyl-4-aminoindenyl)benzene, P-bis(1,b dimethyl-5-aminopentyl)benzene, (diamine) Kecai, 2'6-monoaminonaphthalene, 2,4-bis(no-amino-t-butyl)toluene, 2,4-^-toluene, m-xylene-2, 5-diamine, P-xylene-2,5-diamine: m- Benz P-monoamine, 2,6-diamino hydrazine, 2,5-diaminopyridinium, 2'-5-diamine Base ~1,3, 4-» and other diazoles, piperage and so on.

酸針及二胺,可分別單獨使用其1種,或可2種以上並用。 又亦可與上述酸軒或二胺一起使用未包含於上述通式⑺ 八他^酐或—胺’此情況’未包含於上述通式⑺之其他 酸軒或—胺的使用比例宜為⑽莫耳%以下,以莫耳%以 ^為佳。藉由選擇酸針或二胺的麵、或於使用2種以上的 :野或,胺之情況並選定其分別之莫耳比,可控制熱膨腾 性、接著性、玻璃轉化點(Tg)等。 非熱可塑性聚醢亞胺樹脂的前驅物溶液,市售品亦可適合 =用’可舉出例如:宇部興產(股)製之非熱可塑性聚醯亞胺 :驅物樹脂清漆(—)之㈣加心(商品名)、同 kVarnish_s(商品名)等。 098104040 20 200945980 [步驟b:光阻圖案形成步驟] 然後,如圖1及圖2(b)所示般,在如上述般形成的塗佈 膜3a表面被覆光阻層5作為遮罩,形成光阻圖案(步騾 S2)。光阻圖案之形成,可使用公知的方法,並無特別限定。 可利用例如:將感光性光阻層合或塗佈於塗佈膜3a的表 面,形成光阻層5後,進行曝光、顯影、硬化而形成光阻圖 - 案之光微影技術。 ❹[步驟c :金屬析出層形成步驟] 接著,於本實施形態之電路基板的製造方法中,如圖^ 及圖2(c)所示般,於未被光阻層5遮蔽的露出區域,藉由 使塗佈膜3a中的金屬還原,形成金屬析出層?(步驟μ)。 還原處理之料尤錢㈣式勤、法财利。濕式還原法, 係藉由使塗佈膜3a浸潰到含有還原劑的溶液(還原劑溶液) 中’於未被光阻層5遮蔽之露出區域將金屬離子還原的方 ❹法。於此濕式還原法中,係可抑制存在於塗佈膜^内部(例 如’餘層部深的位置之深料或光_ 5正下方之被覆部) 的金屬離子於其所在處被還原而以金屬形騎出,同時可於 塗佈膜3a的表層部優先地析出金屬,為有效的方法。又’ •於濕式還原法中,金屬析出之不均偏少,可於短時間内形成 均一的金屬析出層7。如此得到的金屬析出層7,其一部份 係埋入於塗佈膜3a(聚醯亞胺前驅物樹脂層)的表層部,故 可得到高密著力。 098104040 21 200945980 作為還原劑,較佳者為例如 基胺戰等之爛化合物棚聽硼納、氫化蝴鉀、二甲 磷酸納、甲藤、聯胺之化合物,可作成為例如次亞 溶液中之氣合物的類農等产之t原劑峨用。還原劑 几的範圍内,以為例如005〜〇.5莫耳 劑溶液中_化合物之濃、__為更佳。還原 如中含4請5料心塗佈膜 a有之金屬離子的還原會不足, 由於缝合物的作用,聚酿亞胺前媒物樹鹿會溶解 到10 式還原處理中,將未被光阻層5遮蔽的區域浸潰 SI。,。的範圍内(以50〜7 =劑錢中2。秒〜3❹分鐘(以3。㈣分二 刀鐘〜5分鐘為更佳)之昧η。 屬離早舍n 時s1精由浸潰,塗佈膜3a中的金 子會因遇原劑的作用而被還原,於塗佈膜如的表 使金屬析出成粒子狀。於還原的終點,在塗佈膜3a中之表 層部以外(例如深層部或祕層5的正下方之被 幾乎無金屬離子存在的狀態。其理由在於,伴隨著在塗佈膜 3a表層部之金屬析出’塗佈膜%中的金屬離子一邊荖 均一的濃度分布下,-邊往塗佈臈3a中之未被遮蔽的區域 之表層縣動,移動之金屬離子在表層部附近被還原而析 金屬。於還原的終點’在塗佈獏3a巾為幾乎残留有 離子的狀L #使,塗佈膜3a中殘留有金屬離子,亦可 由後述的酸處理可將殘留的金屬離子去除。還原終點之判 098104040 22 200945980 疋例如’可藉由對塗佈膜3a的截面用能量分散型X射線 (EDX)刀析裝置測定’讀取殘留金屬離子之原子重量%而確 認0 於本實施形態中,作為電路佈線9的種層之金屬析出層 7僅七成於未進仃圖案形成的光阻層5被覆的部分,於光 P且層5的下。卩未形成’其結果不須要有用以去除種層之快 '速剌⑴袖etdllng)步驟,可期減少步驟數與提高電路 ❹ 佈線基板可靠性。 [步驟d :電路佈線形成步驟] 其次’如圖1及圖2⑷所示般,在金屬析出層7上藉由 非電解鍍敷及/或電鍍形成具有圖案的電路佈線9(步驟 S4)。非電解錄係藉由將形成有金屬析出層7的塗佈膜加 次潰於非電解鑛敷液而進行(非電解鍍敷步驟)。藉由此非電 解鑛敷可形成非電解鍍敷層。此非電解職層係作為其後進 Ο 行的電鍍之核。 ϋ 作為非電解鍍敷步驟中所用之非電解鑛敷液,就對聚酿亞 胺前驅物難的影響之考量,以選擇中性〜弱酸性的次亞磷 酸系之錄鍍敷液、或㈣之錄鍍敷液為佳。作為次亞磷酸系 之鎳鑛敷液的市售品,可舉出例如:TQP_Nik_d^; 奥野錢卫業(股)製)。又,作為⑽之舰敷液的市售品, 可舉出例如.Tc)p~Chemiall〇y B-1(商品名;奥野製藥工業 (股)製)’ Top〜Chemiaiioy 66(商品名;奥野製藥工業(股) 098104040 23 200945980 製)。又,非電解鍍敷的pH以調整為4〜7的中性〜弱酸性 為佳。此情況下,可使用例如:硫酸、鹽酸、硝酸、硼酸、 碳酸等之無機酸、乙酸、羥基乙酸、檸檬酸、酒石酸等有機 酸,再者,亦可組合硼酸、碳酸、乙酸、檸檬酸等之弱酸與 其等之鹼鹽以賦予緩衝作用。非電解鍍敷的溫度以定為80 〜95°C的範圍内為佳,以85〜90°C的範圍内為更佳。又, 非電解鍍敷步驟之處理時間可定為20秒〜10分鐘,以30 秒〜5分鐘為佳,以1分鐘〜3分鐘為更佳。 然後,以非電解鍍敷層作為核施行電鍍形成電鍍層(電鍍 步驟)。藉由電鍍以將非電解鍍敷層覆蓋的方式形成電鍍 層。電鍍,係於含有例如硫酸、硫酸銅、鹽酸及光澤劑[例 如,作為市售品之日本瑪德密公司製之瑪丘斯貝克(商品名)] 的組成之鍍敷液中,以非電解鍍敷層作為陰極,以Cu等之 金屬作為陽極而施行。電鍍中之電流密度,以定為例如0. 2 〜3. 5A/dm2的範圍内為佳。又,作為電鑛之陽極,例如,可 用Cu以外之Ni、Co等金屬。 形成具有圖案之電路佈線9後,將不需要的光阻層5剝 離,剝離光阻層5的方法並無限定,較佳者為例如,浸潰於 1〜4重量%濃度的氫氧化納水溶液、氫氧化釺水溶液等之 鹼溶液中的方法。又,若於醯亞胺化後剝離光阻層5,則因 光阻剝離用之鹼溶液等的作用,會有造成聚醯亞胺樹脂變質 等之不良影響之虞,故光阻層5之剝離,以在次一步驟的聚 098104040 24 200945980 醯亞fee刖驅物樹脂之醯亞胺化之如進行為佳。惟,於光阻層 5係作成為電路佈線9的電路間絕緣層之一部份的情況,光 阻層5之剝離並非必要,不受此限。 於此,再就塗佈膜3a中之金屬離子之去除做說明。於濕 式還原處理中,例如,於使用氫氧化蝴納、氫氧化爛钾、二 甲胺硼等之金屬鹽的情況,或於光阻層5之剝離中,使用氫 . 氧化鈉、氫氧化鉀等之金屬鹽的情況’會有來自前述金屬鹽 ❹的金屬離子存在於塗佈膜3a中之情況,故以將其去除為 佳。金屬離子之去除,可浸潰於酸之水溶液中進行,此時之 可適用的酸’為了使與聚醯胺酸的羧基配位結合的金屬離子 解離’以選擇較聚醯胺酸強的酸(酸解離常數pKa為3. 5以 下)為佳’再者’以選擇不會溶解還原所析出之金屬的酸為 佳。作為此種酸之具體例,可舉出例如:檸檬酸 (pKa-2. 87)、草酸(pKa=1. 〇4)等。又,鹽酸、硝酸、硫酸等 ©之強酸有溶解金屬析出層7之虞,又乙酸(pKa=4 56)之酸強 度低難赠去金屬離子,故不佳。作為用以去除金屬離子的 ^責處理之條件’較佳者為’於濃度為卜Μ重量%的範園 内(以5〜1〇重量%的範圍内為佳)、溫度20〜50°C的範圍 内之酸的水溶液中,浸潰2〜1〇分鐘的範圍内。藉由進行如 t酸處1於還原終了後或光阻層剝離後,亦可將殘留於 塗佈膜3a中之來自沐人η 目於金屬化合物的金屬離子同時去除。 又,去除金屬離子的方 ^石决’例如,於「第17次微電子研討 098104040 25 200945980 會(Microelectronics Symposium)預備稿集」,2007 年 9 月,179頁〜182頁中亦有揭示。 [步驟e :醯亞胺化步驟] 其次’如圖1及圖2(e)所示般,使塗佈膜3a藉由熱處理 而酿亞胺化’形成聚醯亞胺樹脂層3(步驟S5)。醯亞胺化的 方法並無特別限制’較佳者可採用例如,於80〜400°C的範 -圍内之溫度條件下加熱1〜60分鐘範圍内的時間之熱處 · 理。為了抑制藉由還原及鍍敷而形成之電路佈線層9的金屬 ◎ 氧化’以於低氧環境下之熱處理為佳,具體而言,以於氮氣 或稀有氣體等之惰性氣體環境下、氫等之還原氣體環境、或 真空中進行為佳。又,步驟S5之醯亞胺化步驟,以於步驟 S4之電路佈線形成步驟之後進行為佳,惟於步驟s4的步驟 之前進行亦無問題。 [步驟f :金屬離子含浸步驟] 又,於本發明之電路佈線基板的製造方法中,較佳者為,❹ 在上述步驟a之後,進而具備Ο對塗佈膜3a以含有金屬離 子的水溶液(金屬離子溶液)含浸,使其乾燥,藉此使塗佈膜 3a中的金屬離子含有量增加之步驟。藉由此含浸,使存在 於塗佈膜3a中的自由幾基(即未形成與來自金屬化合物之 金屬之鹽的叛基)成為金屬鹽。 作為此步驟f(金屬離子含浸步驟)中所用之金屬離子,可 - 用與上述步驟a(塗佈膜形成步驟)中使用的塗佈液中所含 098104040 26 200945980 有的金屬化合物相同者。 於金屬離子含浸步驟中所用的金屬離子溶液中,以含有金 屬化合物30〜300mM的範图为丛, 内為佳,以含有50〜1_的範 圍内為更佳。金屬化合物的遺4 /晨度右未達30mM,則金屬離子 含浸到塗佈膜如中所需的時間會過長,故不佳,若超過 漏’塗佈膜3a的表面會有腐餘(溶解)之虞。 ❹ 金屬離子溶液,於金屬化Mm pH為目的之緩衝液等成分。 含浸方法,只要是可使金屬離子溶液與塗 接觸的方法皆可,並無特別限制,可利用公知/表面 用例如,㈣法、喷祕、毛刷塗佈切刷含:使 度可為0〜1〇〇°C,以20〜机附近之常溫為佳。^的溫 時間,於使用浸漬法的情況,例如,以 又,含浸 丄刀雀童5 f D+、 ❹ 以5分鐘〜2小時為更佳。浸潰時間即使超v、時為佳’ 金屬離子對塗佈膜3a之含浸程度會有達到恆~小時,由於 含浸後須進行乾燥。乾燥方法並無特別限定疋,傾向。 然乾燥、用空氣搶之噴吹乾燥、或用烤 用例如自 π鐵之乾烽梦 件,宜為10〜15〇t下5秒〜60分鐘, ’、等。乾燥條 ^ 25 〜1c π 〇 秒〜30分鐘為佳,以30〜腻下^分〇0下1〇 於步驟ί後,可進行步驟b之光m圖案形、馬更隹。 之 金屬析出層形成步騾,惟,由於具俤步驟=步驛及步驟c 胺前驅物樹脂層之塗佈膜把内的金屬 可使聚驅亞 098104040 27 的量(亦即, 200945980 膜3a内的金屬離子之含有量)增加。其結果,由於步领 得到的金屬析出層7係作成為膜狀,故可省略非電解鍍數步 驟。非電解鍍敷,由於有鍍敷液之管理與廢液處理之繁雜的 問題,故若能不使用非電解鍍敷而可形成對基材的密著性優 異之電路佈線,其產業上的價值非常大。基於此種考量, 特 佳者為,於步驟a形成塗佈膜3a後,再施行步驟f之金屬 離子含浸步驟以使塗佈膜3a中的金屬離子量增加。又,亦 可依於選擇步驟b之光阻圖案形成步驟中所使用的光阻劑 之材質,於步驟b後(即步驟c前)使未被形成有圖案的光阻 〇 層5被覆之塗佈膜3a的露出部份與金屬離子溶液接觸而進 行步驟f之金屬離子含浸步驟。 [步驟g :胺處理步驟] 又,本發明之電路佈線基板之製造方法中,較佳者為, 上述a)步驟之後進而具備:g)對上述塗佈膜%以氨水^ 或1級胺或2級胺水溶液含浸之步驟。藉由以氨水溶液或: 級胺或2級胺水溶液(以下,亦稱為胺水溶液)含浸,胺水溶〇 液中的胺會與存在於塗佈膜3a中的金屬離子之螯合錯合體. 的配位子進行配位子取代,生成金屬離子的胺錯合體。如此 生成之胺錯合體,於將金屬離子還原時配位子會成為容易游 離的狀態,其結果,可在塗佈膜3a表層部均一地發生金冑* 離子之還狀應。1級贼2級H為水溶㈣可,並無— 特別限定,惟以脂肪族胺為佳。作為此等脂肪族胺之具體 098104040 28 200945980 200945980 醇胺、 丁醇胺、二乙 例’可舉出例如:乙醇胺、兩 丙醇胺、乙二胺、二乙胺等。又 双、二乙醇胺、一 丙醇胺、丁醇胺、二乙醇胺、二丙知肪族胺中,以乙醇胺、 等之中’尤以取用容易且經濟 性優t胺等之醇胺為更佳。此 溶液’較佳者可於濃度為1〜3〇重、之氨為特佳。作為胺水 重量%的範圍内為佳)、液溫為〗量义的範圍内(以1〇〜30 。(:的範圍内為佳)使用。胺水溶、 的範圍内(以10〜50 ❹ 定,可使用例如:浸潰法、噴霧法^的3次方法並無特別限 使用浸潰法的情況,處理10秒〜2 2缝料。例如’於 2小時(以1〜30分鐘為佳) 疋有效的。胺水溶液的濃度或溫度若未達上述下限,會有配 位子取代不完全之傾向,又,於超過上述上限之情況,存在 塗佈膜3a中的金屬離子會有容易溶出之傾向。 含浸後之塗佈膜3a,可直接交付到次一步驟,亦可於含 浸後對塗佈膜3a進行乾燥。 Ο 於步驟g之胺處理步驟之後,亦可進行步驟b之光阻圖案 形成步驟及步驟c之金屬析出層形成步驟,惟,由於具備步 驟g,於步驟c得到的金屬析出層7係作成為膜狀,故可省 略非電解鍍敷步驟。 於施行上述步驟f、步驟g而省略非電解鍍敷步驟的情 況,塗佈膜3a之厚度以作成為2/zm以上為佳。藉由作成為 此厚度,可使塗佈膜3a中含有足夠量的金屬離子。又,步 驟f之金屬離子含浸步驟與步驟g之胺處理步驟可僅施行其 098104040 29 200945980 亦可實仃兩者。此情況下,由於可形成緻密的膜狀之金 屬析出層7’故較佳。於施行步驟f與步驟^雙方的情況, 可不拘其順序,惟以在步驟f之後進行步驟g為佳。 ——* , 本實施形態的電_線基板之製造綠,藉由進行上述之 步驟a〜步驟e ’必要時亦可進行步驟f及/或步驟宮,可在 基材1與具有聚醯亞胺樹脂層3的絕緣樹脂層上作成形成有 密著性優異的電路佈線9之電路佈線基板謂。此方法,為 步驟數少、且不須特殊㈣材與U等的㈣方法,而且不 須有用以去除金屬析出層之勤】步驟,故產業上之利用價值 甚大。 其次’就本發明藉由實施例具體地做說明,惟本發明並不 因此等實施例而受到任何限定。又,本發明之實施例中只 要未經特職明’各種測定、評估係依據下述者。又,本實 施例中所用的簡稱同上述。 [密著性之評估] 雀著性之評估,係製作3匪寬的電路佈線之測定用試驗 片,用Strograph Ml(東洋精機製作所公司製),藉由測定 於至皿下沿90方向拉離強度而進行評估。又,密著性之評 估,只要拉離強度為〇.5kN/m以上,於實用上即無問題,惟 為了得到更優異的密著性,以l.0kN/m以上為佳。 [線熱膨脹係數之測定] 線熱膨脹係數,係用Thermo-Mechanical Analyzer(熱機 098104040 30 200945980 械式分析儀)(Seiko instruments公司製),使試樣升溫至 25〇°C,再於該溫度保持1〇分鐘後,以5〇c/分鐘的速度冷 部’藉由求出由24〇ΐ至loot的平均線熱膨脹係數(CTE) 進行評估。 [玻璃轉化溫度之測定] 玻璃轉化溫度’係使用黏彈性分析儀(RheometricThe acid needle and the diamine may be used alone or in combination of two or more. Further, it is also possible to use, together with the above-mentioned acid or diamine, the use ratio of the other acid or amine which is not contained in the above formula (7) octa-anhydride or -amine 'in this case' not included in the above formula (7) is preferably (10) The molar percentage is below, and the molar percentage is preferably ^. Control of thermal swell, adhesion, glass transition point (Tg) by selecting the surface of the acid needle or diamine, or by using two or more types of: wild or amine, and selecting the respective molar ratios. Wait. A precursor solution of a non-thermoplastic polyimine resin, which is also commercially available, can be suitably used. For example, a non-thermoplastic polyimine made from Ube Industries, Ltd.: a resin varnish (-) (4) Plus (trade name), same as kVarnish_s (trade name). 098104040 20 200945980 [Step b: photoresist pattern forming step] Then, as shown in FIG. 1 and FIG. 2(b), the surface of the coating film 3a formed as described above is coated with the photoresist layer 5 as a mask to form light. Resistance pattern (step S2). A well-known method can be used for formation of a photoresist pattern, and it is not specifically limited. For example, a photosensitive photoresist can be laminated or applied on the surface of the coating film 3a to form a photoresist layer 5, followed by exposure, development, and hardening to form a photo-pattern technique of a photoresist pattern. ❹ [Step c: Metal deposition layer forming step] Next, in the method of manufacturing the circuit board of the present embodiment, as shown in FIG. 2 and FIG. 2(c), in the exposed region which is not blocked by the photoresist layer 5, Is the metal deposition layer formed by reducing the metal in the coating film 3a? (Step μ). The material of the reduction treatment is (4) type diligence and legal wealth. The wet reduction method is a method of reducing metal ions in an exposed region which is not blocked by the photoresist layer 5 by dipping the coating film 3a into a solution (reducing agent solution) containing a reducing agent. In the wet reduction method, it is possible to suppress the metal ions existing inside the coating film (for example, the deep portion of the remaining portion or the coating portion directly under the light _ 5) from being reduced at the place where it is located. It is an effective method to preferentially precipitate the metal in the surface layer portion of the coating film 3a while riding in a metal shape. Further, in the wet reduction method, unevenness in metal precipitation is less, and a uniform metal deposition layer 7 can be formed in a short time. The metal deposition layer 7 thus obtained is partially embedded in the surface layer portion of the coating film 3a (polyimine precursor resin layer), so that high adhesion can be obtained. 098104040 21 200945980 As a reducing agent, a compound such as a amide compound such as a base amine warfare can be used as a gas in a sub-solution, for example, a compound of borax, hydrogenated potassium, sodium dimethate, formate, and hydrazine. The compound of the compound is used for the production of the original agent. Within the range of the reducing agent, it is preferable that the concentration of the compound is __, for example, 005~〇.5 molar solution. If the reduction is as low as possible, the reduction of the metal ions in the coating film a will be insufficient. Due to the action of the suture, the pre-formal material of the pre-mineral material will dissolve into the 10-type reduction treatment and will not be light. The area covered by the resist layer 5 is impregnated with SI. ,. Within the range (to 50~7 = agent money in 2. seconds ~ 3 ❹ minutes (to 3. (four) minutes two knives ~ 5 minutes for better) 昧 η. genus from early morning n s1 fine by dipping, The gold in the coating film 3a is reduced by the action of the original agent, and the metal is precipitated into a particle shape on the surface of the coating film. The end point of the reduction is outside the surface layer portion of the coating film 3a (for example, deep layer). The state in which the metal layer is almost absent immediately below the portion or the secret layer 5. The reason is that the metal concentration in the coating film % of the coating film 3a is uniformly distributed under the concentration distribution of the metal ions in the coating film. - The surface layer of the unmasked area in the coating crucible 3a moves, and the moving metal ions are reduced in the vicinity of the surface layer to precipitate a metal. At the end point of the reduction, there is almost an ion remaining in the coating 貘3a towel. In the form L#, metal ions remain in the coating film 3a, and residual metal ions can be removed by acid treatment described later. The determination of the reduction end point 098104040 22 200945980 疋 For example, the cross section of the coating film 3a can be used. Determination of 'read residual gold' by energy dispersive X-ray (EDX) knife analyzer In the present embodiment, the metal deposition layer 7 which is the seed layer of the circuit wiring 9 is only a portion which is covered with the photoresist layer 5 which is not formed in the pattern, and is in the light P layer. The lower part of 5. The 卩 is not formed. The result does not need to be used to remove the quick layer of the 'speed 剌 (1) sleeve etdllng) step, which can reduce the number of steps and improve the reliability of the circuit 布线 wiring substrate. [Step d: circuit wiring forming step Next, as shown in FIG. 1 and FIG. 2 (4), a patterned circuit wiring 9 is formed on the metal deposition layer 7 by electroless plating and/or plating (step S4). The electroless recording system is formed by The coating film of the metal deposition layer 7 is applied to the electroless ore solution in a secondary crushing process (electroless plating step), whereby the electroless plating layer can be formed by the electroless mineral deposit. The core of the plating after the enthalpy. ϋ As the non-electrolytic ore solution used in the electroless plating step, the influence of the difficulty on the precursor of the brewing imine is considered to select the neutral to weakly acidic hypophosphorous acid system. It is better to record the plating solution or (4) the plating solution. The phosphite-based nickel plating solution of commercially available products include, for example: TQP_Nik_d ^; Wei Qian Okuno Industry (shares) Ltd.). In addition, as a commercial item of the ship's liquid of (10), for example, Tc)p~Chemiall〇y B-1 (trade name; manufactured by Okuno Pharmaceutical Co., Ltd.) 'Top~Chemiaiioy 66 (trade name; Okuno) Pharmaceutical Industry (shares) 098104040 23 200945980). Further, the pH of the electroless plating is preferably adjusted to a neutral to weak acidity of 4 to 7. In this case, for example, an inorganic acid such as sulfuric acid, hydrochloric acid, nitric acid, boric acid or carbonic acid, an organic acid such as acetic acid, glycolic acid, citric acid or tartaric acid may be used, or boric acid, carbonic acid, acetic acid, citric acid or the like may be combined. The weak acid and its alkali salt provide a buffering effect. The temperature of the electroless plating is preferably in the range of 80 to 95 ° C, more preferably in the range of 85 to 90 ° C. Further, the treatment time of the electroless plating step may be set to 20 seconds to 10 minutes, preferably 30 seconds to 5 minutes, and more preferably 1 minute to 3 minutes. Then, electroplating is performed by electroless plating using the electroless plating layer as a core (electroplating step). The plating layer is formed by electroplating to cover the electroless plating layer. Electroplating is carried out in a plating solution containing a composition of, for example, sulfuric acid, copper sulfate, hydrochloric acid, and a glossing agent (for example, Machusbeck (trade name) manufactured by Mademan Co., Ltd., which is a commercial product). The plating layer is used as a cathode, and a metal such as Cu is used as an anode. The range of the current density in the electroplating is preferably in the range of, for example, 0.2 to 3. 5 A/dm 2 . Further, as the anode of the electric ore, for example, a metal such as Ni or Co other than Cu can be used. After the circuit wiring 9 having the pattern is formed, the unnecessary photoresist layer 5 is peeled off, and the method of peeling off the photoresist layer 5 is not limited, and for example, it is preferably impregnated with a sodium hydroxide aqueous solution having a concentration of 1 to 4% by weight. A method in an alkali solution such as an aqueous solution of cesium hydroxide. In addition, when the photoresist layer 5 is removed after the imidization, the action of the alkali solution for the photoresist stripping or the like may adversely affect the deterioration of the polyimide resin, and the photoresist layer 5 Stripping is preferably carried out in the next step of the polymerization of the yttrium of the 098104040 24 200945980 fe fe fe 刖 刖 。 。 。. However, in the case where the photoresist layer 5 is formed as a part of the inter-circuit insulating layer of the circuit wiring 9, the peeling of the photoresist layer 5 is not necessary and is not limited thereto. Here, the removal of the metal ions in the coating film 3a will be described. In the wet reduction treatment, for example, in the case of using a metal salt such as phosgen hydroxide, lanthanum hydroxide or dimethylamine boron, or in the peeling of the photoresist layer 5, hydrogen is used. In the case of a metal salt such as potassium, there is a case where a metal ion derived from the metal salt is present in the coating film 3a, so that it is preferably removed. The removal of metal ions can be carried out by immersing in an aqueous acid solution. In this case, the applicable acid 'dissociation of metal ions for coordination with the carboxyl group of poly-proline to select a stronger acid than polyamine (The acid dissociation constant pKa is 3.5 or less) is preferably 'further' to select an acid which does not dissolve the metal precipitated by the reduction. Specific examples of such an acid include citric acid (pKa-2.87) and oxalic acid (pKa=1. 〇4). Further, hydrochloric acid, nitric acid, sulfuric acid or the like has a strong acid which dissolves the metal precipitate layer 7, and acetic acid (pKa = 4 56) has a low acid strength and is difficult to give away metal ions, which is not preferable. As a condition for removing the metal ions, it is preferable that the concentration is in the range of the weight % of the dip (preferably in the range of 5 to 1% by weight), and the temperature is 20 to 50 ° C. In the aqueous solution of the acid in the range, it is immersed in the range of 2 to 1 minute. The metal ions from the metal compound remaining in the coating film 3a can also be simultaneously removed by performing the reduction of the t-acid 1 after the end of the reduction or after the photoresist layer is peeled off. Further, the removal of metal ions is disclosed, for example, in "The 17th Microelectronics Discussion 098104040 25 200945980 (Microelectronics Symposium) Proposal Collection", September 2007, pages 179 to 182. [Step e: hydrazine imidization step] Next, as shown in FIG. 1 and FIG. 2(e), the coating film 3a is imidized by heat treatment to form the polyimide film layer 3 (step S5). ). The method of ruthenium imidization is not particularly limited. Preferably, for example, it is possible to heat at a temperature in the range of from 1 to 60 minutes under a temperature range of from 80 to 400 °C. In order to suppress the metal ◎ oxidation of the circuit wiring layer 9 formed by reduction and plating, it is preferable to heat-treat in a low-oxygen environment, specifically, in an inert gas atmosphere such as nitrogen or a rare gas, hydrogen, or the like. It is preferred to carry out the reducing gas atmosphere or in a vacuum. Further, the imidization step in the step S5 is preferably carried out after the circuit wiring forming step of the step S4, but it is also carried out before the step of the step s4. [Step f: Metal ion impregnation step] In the method for producing a circuit wiring board of the present invention, it is preferable that after the step a, the coating film 3a is further provided with an aqueous solution containing a metal ion. The metal ion solution is impregnated and dried to thereby increase the content of metal ions in the coating film 3a. By this impregnation, the free radicals present in the coating film 3a (i.e., the base which does not form a salt with the metal derived from the metal compound) become a metal salt. The metal ion used in this step f (metal ion impregnation step) can be the same as the metal compound of 098104040 26 200945980 contained in the coating liquid used in the above step a (coating film forming step). In the metal ion solution used in the metal ion impregnation step, a pattern containing a metal compound of 30 to 300 mM is preferably a cluster, and more preferably a range of 50 to 1 _. If the metal compound is 4 or less than 30 mM, the time required for the metal ions to be impregnated into the coating film may be too long, so that it is not preferable, and if it exceeds the surface of the coating film 3a, there is a residue ( Dissolve). ❹ A metal ion solution, such as a buffer for metallization of Mm pH. The impregnation method is not particularly limited as long as it can contact the metal ion solution with the coating, and can be used by a known/surface method, for example, (4), spray, and brush coating: the degree can be 0. ~1〇〇°C, preferably at room temperature near 20~ machine. The temperature of ^ is used in the case of using the dipping method, for example, in addition, the impregnation of the sickle bird 5 f D+, ❹ is preferably 5 minutes to 2 hours. The impregnation time is excellent even if it is superv, and the impregnation degree of the metal ion to the coating film 3a is constant to hour, and it is required to be dried after impregnation. The drying method is not particularly limited, and tends to be. However, it is dry, blown dry with air, or baked with a dry dream such as π iron, preferably 10 to 15 minutes under 10 to 15 minutes, ‘, etc. Dry strip ^ 25 ~ 1c π 〇 seconds ~ 30 minutes is better, to 30 ~ greasy down ^ min 〇 0 down 1 〇 After step ί, step b light m pattern shape, horse more 隹. The metal precipitation layer forms a step, but the amount of the metal can be 098104040 27 due to the coating film of the amine precursor resin layer having the steps of step = step and step c (ie, 200945980 film 3a) The content of metal ions is increased). As a result, since the metal deposition layer 7 obtained by the step is formed into a film shape, the electroless plating step can be omitted. In the electroless plating, there is a problem that the management of the plating solution and the disposal of the waste liquid are complicated. Therefore, if the electroless plating can be used, the circuit wiring excellent in adhesion to the substrate can be formed, and the industrial value thereof can be obtained. Very big. Based on such considerations, it is particularly preferable to form the coating film 3a in the step a, and then perform the metal ion impregnation step of the step f to increase the amount of metal ions in the coating film 3a. Moreover, depending on the material of the photoresist used in the step of forming the photoresist pattern in step b, the photoresist layer 5 not formed with the pattern may be coated after step b (ie, before step c). The exposed portion of the film 3a is brought into contact with the metal ion solution to carry out the metal ion impregnation step of the step f. [Step g: Amine Treatment Step] Further, in the method for producing a circuit wiring board of the present invention, it is preferable that the step a) is further provided with: g) ammonia or a first amine to the coating film % or A step of impregnation of a 2-grade aqueous amine solution. By impregnation with an aqueous solution of ammonia or a 1:min or a second aqueous amine (hereinafter also referred to as an aqueous amine solution), the amine in the aqueous amine solution will chelate with the metal ions present in the coating film 3a. The ligand is substituted with a ligand to form an amine complex of metal ions. When the metal ion is reduced, the ligand becomes a state in which it is easily liberated, and as a result, the metal ruthenium ion can be uniformly formed in the surface layer portion of the coating film 3a. Grade 1 thief 2 grade H is water soluble (four) Yes, no - special, but aliphatic amines are preferred. Specific examples of such aliphatic amines 098104040 28 200945980 200945980 Alcoholamines, butanolamines, and diethylamines are exemplified by ethanolamine, dipropanolamine, ethylenediamine, diethylamine and the like. Further, among the bis, diethanolamine, monopropanolamine, butanolamine, diethanolamine, and dipropylamine aliphatic amines, it is more preferable to use an alcoholamine such as ethanolamine or the like, which is easy to use and economical. good. Preferably, the solution is preferably present at a concentration of from 1 to 3 Torr. It is preferably in the range of the weight % of the amine water, and the liquid temperature is within the range of 1 〇 to 30. (It is preferably in the range of (::)). The range of the amine is water-soluble (with 10 to 50 ❹). For example, the three-time method of the dipping method and the spraying method can be used, and the dipping method is not particularly limited, and the sewing material is processed for 10 seconds to 2 seconds. For example, 'in 2 hours (1 to 30 minutes is preferred) If the concentration or temperature of the aqueous amine solution does not reach the above lower limit, there is a tendency that the ligand substitution is incomplete, and if the upper limit is exceeded, the metal ions in the coating film 3a may be easily eluted. The coating film 3a after impregnation can be directly delivered to the next step, and the coating film 3a can be dried after impregnation. 之后 After the amine treatment step in step g, the photoresist of step b can also be performed. In the pattern forming step and the metal deposition layer forming step in the step c, the metal deposition layer 7 obtained in the step c is formed into a film shape by the step g, so that the electroless plating step can be omitted. Step g and omitting the case of the electroless plating step The thickness of the coating film 3a is preferably 2/zm or more. By making this thickness, a sufficient amount of metal ions can be contained in the coating film 3a. Further, the metal ion impregnation step of step f and the step g are The amine treatment step can be carried out only by performing 098104040 29 200945980. In this case, it is preferable to form a dense film-like metal deposition layer 7'. In the case of performing both step f and step Regardless of the order, it is preferable to carry out the step g after the step f. ——*, the green of the electric-ray substrate of the present embodiment is green, and by performing the above steps a to e', step f can be performed if necessary. And/or a step circuit, a circuit wiring board in which the circuit wiring 9 having excellent adhesion is formed on the insulating material layer having the polyimide 1 and the polyimide resin layer 3 can be formed. There is no need for special (four) materials and U (four) methods, and there is no need to use the steps to remove the metal deposition layer, so the industrial use value is very large. Secondly, the present invention is specifically illustrated by the examples, The invention is not so etc. The embodiment is not limited in any way. Further, as long as there is no special purpose, the various measurements and evaluations are based on the following. Further, the abbreviations used in the present embodiment are the same as above. [Evaluation of adhesion In the evaluation of the nature of the bird's eye, a test piece for measuring the circuit wiring of 3 inches wide was produced, and it was evaluated by Strograph Ml (manufactured by Toyo Seiki Seisakusho Co., Ltd.) by measuring the strength in the direction of 90 in the direction of the dish. As for the evaluation of the adhesion, as long as the tensile strength is 〇.5 kN/m or more, there is no problem in practical use, but in order to obtain more excellent adhesion, it is preferably 1.0 kN/m or more. [Line thermal expansion coefficient The measurement of the linear thermal expansion coefficient was carried out by using a Thermo-Mechanical Analyzer (manufactured by Seiko Instruments Co., Ltd.) to raise the temperature of the sample to 25 ° C, and then maintaining the temperature for 1 minute. The cold section at a speed of 5 〇 c/min was evaluated by finding the average linear thermal expansion coefficient (CTE) from 24 loo to loot. [Measurement of glass transition temperature] Glass transition temperature 'Use viscoelastic analyzer (Rheometric

Science F_ Ε·(股)製rsA-II) ’用l〇mm寬之試樣,於邊施 ❹予1Hz的振動下’邊以10°C/分鐘的速度由室溫升溫至400 c之時’由損失正切(Tan5)的極大值求出。 [還原處理後析出之金屬粒子的平均粒徑之測定] 用掃描型透過電子顯微鏡(Hitachi Hitechnologies公司 製),以倍率5〇, 〇〇〇倍觀察試樣的截面,觀察得全金屬粒子 之平均粒徑。 [金屬層之片電阻之測定] G 用電阻測量器(三菱化學公司製MCP-T610),以依據JISK 7194的方法進行金屬層之片電阻之測定。又,以金屬層之 片電阻之測定值為超過50Q/〇(〇hm/square)的情況評估 為「難以電鍍」之水準,為50Ω/□以下的情況評估為「可 . 電鍍」之水準。又,為30Ω/□以下的情況則評估為金屬層 作為導電性皮膜「特別優異」。 [反翹之評估方法] 藉由裁斷機將導體層形成樹脂薄膜裁斷,作成1 Ocmxl0cm 098104040 31 200945980 尺寸的試驗片,將此試驗片載置於桌上時自桌面拱起最高部 分之離桌面的咼度,用游標尺(nonius)測量。以該高度作為 導體層形成樹脂薄膜的反翹量,於反翹量未達2mm的情況, 評估為「無反勉」。 [製作例1] 於500ml的可分離式燒瓶中,於邊攪拌下將2〇. 7g的2,_ . 曱氧基-4,4,-二胺基苯醯苯胺(0·08莫耳)溶解於343g的 DMAc中。然後,於氮氣流中將28· 5g的PMDA(〇· 13莫耳)及 ❹ 10.3g的DAPE44(0.〇5莫耳)加入該溶液中。然後,繼續攪 拌約3 J時進行I合反應,得到黏稠的聚醯亞胺前驅物樹脂 溶液Si。 將得到的聚酿亞胺前驅物樹脂溶液Si塗佈於不錄鋼基材 上,於130 C乾燥5分鐘,以15分鐘時間升溫至36代完成 醯亞胺化’得到積層於不細基材之㈣亞胺薄膜。自不銹 鋼基材將此聚酿亞胺薄膜剝離,得到25_厚度的聚醢亞胺 0 薄膜S2。此聚醯亞胺薄膜&的線熱膨脹係數為14·6χ 1(Γ6(1/Κ)。 [製作例2] 於500ml的可分離式燒瓶中,於邊攪拌下將的 ΒΑΡΡ(0. 05莫耳)溶解於25〇g的DMc中。然後於氣氣流 中將14. 7g的BPDA(〇.〇5莫耳)加入該溶液中。然後,繼續 授拌約3 j時進行聚合反應,得到黏祠的聚酿亞胺前驅物樹 098104040 32 200945980 、· 脂溶液τ!。 將得到的聚醯亞胺前驅物樹脂溶液Tl塗佈於不銹鋼基材 上,於130°C乾燥5分鐘。其後,以15分鐘時間升溫至36〇 /C使塗佈膜完成醯亞胺化,將基板去除,得到厚度 聚醯亞胺薄膜%。得到之聚醯亞胺薄膜I的玻璃轉化溫度 - 為252°C,線熱膨脹係數為52χ1(Γ6(1/Κ)。 . [製作例3] ❹ 於製作例2所製作的聚醯亞胺前驅物樹脂溶液Τι中加入 7· 91g的吡啶(〇.丨莫耳)’攪拌20分鐘。對此混合物添加將 市售之鎳(II)乙醯乙酸酯二水合物22· 0g(0· 08莫耳)溶解 於160ml的N-曱基-2-吡咯啶酮(以下簡稱為NMp)所成之溶 液。於室溫下攪拌1小時,藉此,製作成藍色的聚醯亞胺前 驅物鎳錯合體溶液A。 [製作例4] G 將無鹼玻璃(旭硝子(股)製AN-1〇〇)之試驗片12.5cmx 12. 5cm(厚0· 7mm),用50°C的5N氫氧化鈉水溶液處理5分 鐘。然後’將試驗片之玻璃基板以純水洗淨,乾燥之後,浸 潰到1重量%的3-胺基丙基三曱氧烧石夕烧(以下簡稱為「γ -APS」)水溶液。將此玻璃基板自r-APS水溶液取出之後, 加以乾餘’於150C下加熱5分鐘,得到玻璃基材 [實施例1] 在玻璃基材G上以使醯亞胺化後之厚度成為丨· 4μιη的方 098104040 33 200945980 式塗佈聚酼亞胺前驅物鎳錯合體溶液A,藉由在13〇^乾燥 20分鐘,得到塗佈膜ai。 然後’在上述塗佈膜al表面以乾膜光阻劑(旭化成(股) 製’商品名:Sunphoto AQ,l〇/zm厚度)於溫度ii〇°c進行 層合,透過光罩進行紫外線曝光’以0. 5重量%之碳酸鈉水 溶液顯影’形成50//m{佈線幅/佈線間隔(L/S)=20//m/30// m}的光阻圖案’得到形成有光阻圖案之玻璃基板bl。 將上述玻璃基板bl浸潰於50mM氫化硼鈉水溶液(5〇°c) 中3为鐘’於未被光阻層遮蔽區域的塗佈膜ai表面形成鎳 析出層,得到玻璃基板cl。進行此塗佈膜al表層部的截面 觀察之結果,確認得知自塗佈膜al之最表面至約1〇〇ηιη的 床度’畨集存在平均粒徑約4〇nm的鎳粒子(鎳粒子為埋入之 狀態)。然後,將此玻璃基板cl,浸潰於溫度別它之非電解 鎳鑛敷浴(奥野製藥工業(股)製,商品名:TQp_Nik〇r〇n 丽-S)中30秒鐘’藉此形成作為銅電鍵的底材之錄層。再 對形成之鎳層,於銅電鍍以電流密度2A/dm2的電流密 度進行電鑛,形成銅屎唐in, 风』与度1的銅佈線,得到有玻璃基板 cH。 將得到之玻璃基板dl浸清於2重量%的氫氧化納水溶液 (25C)中3分鐘’將光阻圖案剝離後再浸潰於1〇重量% 的草酸水溶液(抓)中2分鳍,藉此將前金屬離子去除。 將上述玻璃基板dl以離子交換水洗淨後,在氮氣環境下 098104040 200945980 加熱至尊c,於同溫度下以5分鐘的時岐聚醢亞胺前驅 物樹月旨酸亞胺化。織,在氮氣環境下冷卻至常溫,得_ 成有㈣線之玻祕板eb _之形成有銅佈線之玻璃基 板el,其銅佈線之拉離強度為14kN/m,密著性優異。 [實施例2] ❹ 、在不銹鋼基材上以使醯亞胺化後之厚度成為2一的方 =佈聚酿亞胺前驅物樹脂溶液Si,藉由在13〇〇c乾燥2〇 W[得到《亞胺前驅物樹脂層。在此樹脂層上以使酿亞 =後之厚度成為L4"m的方式塗佈聚醯亞胺前驅物錄錯 。體溶液A,藉由在職乾㈣分鐘得到塗佈膜^。 除了將實施例i中之塗佈膜al改為使用塗佈膜以以外, 施例i同樣的做法得到形成有光阻圖案之聚酿亞 脂層b2、錄析出前驅物樹脂層c2、形成有銅佈 & 2驅物樹脂層犯及形成有銅佈線之聚酿亞胺樹脂廣 . 冷進仃此塗佈膜a2表層部的截面觀察之結果,確認 •仵知自塗佈膜犯之最表面至約100nm的深 均—,粒子(絲粒子為埋入之狀態)密= j之之聚酿亞胺樹脂層e2自不錢鋼基材剝 之薄膜2mr^_e2’。得狀軸有銅佈線 著優Γ。 鋼佈線之拉離強度為密 [實施例3] 098104040 35 200945980 使用實施例2中之塗 ’ 乙酸鎳水溶液(25。〇中,將此塗佈膜&2浸潰於獅 n L θ 10分鐘,使鎳離子含浸於塗佈膜 a2,以形成金屬離子含有層⑸。 除了使用金屬離子合古 以外,以與實施例i㈤代替㈣例1中之㈣膜al 亞胺前驅物樹脂層b3及做法得到形成有光阻圖案之聚酿 ㈣«層eh 析出前驅物樹脂層C3。鎳析出前 電性皮膜特別優異層之片電阻為_□,作為導 鑛浴中以2Α~的雷^錦析出前驅物樹脂層C3,在銅電 _佈線,度進行電錄,形成銅膜厚度1〇_ 有鋼佈線之前驅物樹脂層d3,以與實 施例1⑽的做法得 e3。藉由將所得到 /有銅佈線之㈣亞胺樹脂層 不錄鋼基材剝離,Z成有鋼佈線之㈣亞胺樹脂層e3自 形成有銅佈線之_ %騎_線之賴e3,。得到之 度為+會㈣,其_線之拉離強 [實施例4] ' 在不錄鋼基持上 式塗佈聚醯亞^胺化後之厚錢為如m的方 藉此得到聚酿=_樹脂溶液-在挪C乾燥20分鐘, 化後之厚度成$ 2 ^物翻層。在此樹脂層切舰亞胺 通溶液a,在魏頻料物錄錯合 佈膜a4浸潰於25重=㈣’得到議…將此塗 氦水溶液(25。〇中2分鐘,使其含 098104040 〇 〇 36 200945980 /又至塗佈膜a4。然後’將塗佈膜a4自氨水溶液中拉起 洗、乾燥,得到塗佈膜a4,。 除了使用塗佈膜&4’代替實施例i中之塗佈膜U以外, λ施例1同樣的做法制形成有光阻圖案之聚酿亞 ::=Γ?層b4及錄析出前驅物樹脂層c4。鎳析出前驅 $曰θ c4中的錄析出層之片電阻為42Ω/α ❹ 性皮膜。對此鎳析出前驅物樹脂層c4,在銅電 ^ 2A/dm2的電产贫# 傾電鍍冷中以 線,r鑛,形成銅膜厚度1〇_的銅佈 _ ^ /成有鋼佈線之前驅物樹脂層d4,以與實施例i 5 得到形成有銅佈線之聚醯亞胺樹脂層e4。藉由 形成有鋼佈線之聚醯亞胺樹脂層64自不錄鋼基 佈線之ιΓ㈣成有銅佈線之薄膜e4’。得到之形成有銅 Γ1 :e4’,不會反紐,其銅佈線之拉離強度為 1.4kN/m,密著性優異。 n [實施例5] 225 以外,係餘=⑽水频2㈣浸潰2分鐘 醯亞胺前驅物樹 c5中的錦析出層之片電卩^析出樹脂層c5。錄析出樹脂層 此錄析_旨層口,形成導電性皮膜。對 行電鍍,形成鋼膜厚度心^中以2A/dm2的電流密度進 “贝的銅佈線,得到形成有銅佈線 098104040 200945980 不會 之前驅物樹脂層d5’以與實施例1同樣的做法得到形成有 銅佈線之聚醯亞胺樹脂層e5。藉由將所得到之形成有銅佈 線之聚醯亞胺樹脂層e5自不銹鋼基材剝離,得到形成有麵 佈線之薄膜e5’ 。得到之形成有銅佈線之薄膜e5, 反翹,其銅佈線之拉離強度為1.4kN/m,密著性優異。 [參考例] 將聚醯亞胺薄膜(東麗-杜邦(股)製,商品名:Kaptc>nEN, 100mmxl00mmx25/zm 厚,線熱膨脹係數(CTE)16xl(T6/K)浸漬 於50°C之5N的氫氧化鉀水溶液中1〇分鐘。然後,對浸潰 的聚醯亞胺薄膜以離子交換水充分水洗,再浸潰於丨重量% 濃度的鹽酸水溶液(25°C)中30秒後,再以離子交換水充分 水洗,以壓縮空氣喷吹乾燥,得到經表面處理之聚醯亞胺薄 膜。於此表面處理之聚醯亞胺薄膜之一面的鹼處理層厚度為 1· 4 y m。 然後,將上述薄膜浸潰於lOOmM乙酸鎳水溶液(25°C)中 10分鐘,對驗處理層以鎳離子含浸而形成金屬離子含有 層。然後,於金屬離子含有層表面以乾膜光阻(旭化成(股) 製,商〇〇名.Sunphoto AQ , l〇em厚度)於溫度ii〇°c下進 行層合,透過光遮罩進行紫外線曝光,以〇. 5重量%的碳酸 鈉水溶液顯影形成50 # m{佈線寬/佈線間隔(L/S)=20以 m/30//m}的光阻圖案,得到形成有光阻圖案之薄膜。 將上述薄臈浸潰於50mM氫化硼鈉水溶液(5〇。〇中3分 098104040 200945980 鐘’於未被光阻層遮蔽區域的金屬離子含有層之表面形成錄 析出層’使其浸潰於溫度8〇。(:之非電解鎳鍍敷浴(奥野製藥 工業(股)製,商品名:Top-Nikoron T0M-S)中30秒鐘,藉 ••此形成作為鋼賴的騎之錄層。再對形成之鎳層,於銅^ 鍍浴中以電流密度2A/W的電流密錢行電鍍 -度W的銅佈線,對形成的鋼佈線之 _=銅= , 拉離強度為0. 7kN/m。 進仃汗估,其 ❹ 將上述實施例1〜5及參考γ 彙整示於表1及表2。 彳中之試驗的概要與試驗結果Science F_ Ε·() rsA-II) 'With a sample of l〇mm width, while applying a vibration of 1 Hz to the side while raising the temperature from room temperature to 400 c at a rate of 10 ° C / min 'It is obtained from the maximum value of the loss tangent (Tan5). [Measurement of the average particle diameter of the metal particles precipitated after the reduction treatment] The cross section of the sample was observed by a scanning electron microscope (manufactured by Hitachi Hitechnologies Co., Ltd.) at a magnification of 5 〇, and the average of the whole metal particles was observed. Particle size. [Measurement of sheet resistance of metal layer] G The sheet resistance of the metal layer was measured by a method according to JIS K 7194 using a resistance measuring instrument (MCP-T610 manufactured by Mitsubishi Chemical Corporation). In addition, when the measured value of the sheet resistance of the metal layer is more than 50 Q / 〇 (〇hm / square), the level of "hard plating" is evaluated, and when it is 50 Ω / □ or less, the level of "electroplating" is evaluated. In addition, when it is 30 Ω / □ or less, it is evaluated as a metal layer, and it is "excellent" as a conductive film. [Evaluation method of anti-warping] The conductor layer was formed into a resin film by a cutting machine to prepare a test piece of 1 Ocm x 10 cm 098104040 31 200945980 size, and the test piece was placed on the table and the highest part of the table was arched from the table top. The twist is measured with a vernier scale (nonius). The amount of the anti-warpage of the resin film formed by using this height as the conductor layer was evaluated as "no ruthenium" when the amount of anti-warpage was less than 2 mm. [Production Example 1] In a 500 ml separable flask, 2 _. 7 g of 2,_. 曱oxy-4,4,-diaminophenyl anilide (0·08 mol) was stirred with stirring. Dissolved in 343 g of DMAc. Then, 28.5 g of PMDA (〇·13 mol) and 10.3 g of DAPE 44 (0.15 mol) were added to the solution under a nitrogen stream. Then, the I-coupling reaction was carried out while stirring was continued for about 3 J to obtain a viscous polyimine precursor resin solution Si. The obtained polyacrylimide precursor resin solution Si was coated on a non-recorded steel substrate, dried at 130 C for 5 minutes, and heated to 36 generations in 15 minutes to complete the yttrium imidization to obtain a laminate on the non-fine substrate. (4) an imine film. The polyamidide film was peeled off from a stainless steel substrate to obtain a 25 mm thick polyimine 0 film S2. The linear thermal expansion coefficient of the polyimine film &amp was 14·6 χ 1 (Γ6 (1/Κ). [Production Example 2] In a 500 ml separable flask, the crucible was stirred under stirring (0. 05). The molars were dissolved in 25 μg of DMc, and then 14.7 g of BPDA (〇.〇5 mol) was added to the solution in a gas stream. Then, the polymerization was carried out while continuing to stir for about 3 j. Adhesive polyacrylimide precursor tree 098104040 32 200945980, · Lipid solution τ!. The obtained polyamidene precursor resin solution T1 was coated on a stainless steel substrate and dried at 130 ° C for 5 minutes. The temperature of the coating was raised to 36 〇/C in 15 minutes to complete the imidization of the coating film, and the substrate was removed to obtain a film thickness of polyimine film. The glass transition temperature of the obtained polyimide film I was 252°. C, the coefficient of thermal expansion of the wire was 52 χ 1 (Γ6 (1/Κ). [Production Example 3] 7 7·91 g of pyridine was added to the polyimine precursor resin solution prepared in Production Example 2 (〇.丨莫[ear]) Stir for 20 minutes. Add this commercially available nickel(II) acetamidine acetate dihydrate 22·0g (0·08 mol) to 160ml. A solution of N-mercapto-2-pyrrolidone (hereinafter abbreviated as NMp) was stirred at room temperature for 1 hour to prepare a blue polyimine precursor nickel complex solution A. Production Example 4] G A test piece of an alkali-free glass (AN-1 制 manufactured by Asahi Glass Co., Ltd.) was treated with 12.5 cm x 12.5 cm (thickness: 0.77 mm), and treated with a 5N aqueous sodium hydroxide solution at 50 ° C for 5 minutes. Then, the glass substrate of the test piece was washed with pure water, and after drying, it was immersed in a 1% by weight aqueous solution of 3-aminopropyltrioxoxacin (hereinafter abbreviated as "γ-APS"). After the glass substrate was taken out from the r-APS aqueous solution, it was dried while being heated at 150 C for 5 minutes to obtain a glass substrate. [Example 1] The thickness of the glass substrate G was imidized to 丨·4 μιη The square 098104040 33 200945980 coated polyimine precursor nickel complex solution A was dried at 13 ° C for 20 minutes to obtain a coating film ai. Then 'dry film resist on the surface of the above coating film a Agent (Asahi Kasei (stock) system 'product name: Sunphoto AQ, l〇 / zm thickness) is laminated at a temperature of ii 〇 ° c, through the mask External exposure 'developed with 0.5% by weight aqueous sodium carbonate solution' to form a photoresist pattern of 50//m {wiring width/wiring interval (L/S)=20//m/30//m} The glass substrate bl of the photoresist pattern. The glass substrate bl is immersed in a 50 mM sodium borohydride aqueous solution (5 〇 ° C) for 3 minutes to form a nickel deposition layer on the surface of the coating film ai which is not blocked by the photoresist layer. , the glass substrate cl is obtained. As a result of observing the cross-section of the surface layer portion of the coating film a, it was confirmed that the nickel particles (nickel) having an average particle diameter of about 4 Å were present from the outermost surface of the coating film a1 to a bed of about 1 〇〇ηη. The particles are in a buried state). Then, the glass substrate cl was immersed in an electroless nickel ore bath (manufactured by Okuno Pharmaceutical Co., Ltd., trade name: TQp_Nik〇r〇n-Li-S) for 30 seconds. A recording layer of a substrate as a copper bond. Further, the formed nickel layer was subjected to electro-mineralization at a current density of 2 A/dm 2 at the current of copper plating to form a copper wiring of copper sputum in, wind and degree 1, and a glass substrate cH was obtained. The obtained glass substrate dl was immersed in a 2% by weight aqueous sodium hydroxide solution (25C) for 3 minutes. The photoresist pattern was peeled off and then immersed in a 1% by weight aqueous solution of oxalic acid (scratch). This removes the former metal ions. After the glass substrate dl was washed with ion-exchanged water, it was heated to a maximum of 098104040 200945980 under a nitrogen atmosphere, and the ruthenium imine precursor was imidized at the same temperature for 5 minutes. The woven fabric was cooled to a normal temperature in a nitrogen atmosphere, and a glass substrate el, which was formed with a copper wiring, was formed, and the copper wiring was pulled at a strength of 14 kN/m, and the adhesion was excellent. [Example 2] 、 On a stainless steel substrate, the thickness of the yttrium iodide was made into a square = cloth-polyimide precursor resin solution Si, which was dried by 2 〇W at 13 °c [ The imine precursor resin layer was obtained. The polyimine precursor precursor was recorded on the resin layer in such a manner that the thickness of the powder was changed to L4 " m. Body solution A, obtained by working on the dry (four) minutes. In the same manner as in the example i, except that the coating film a1 in the example i was changed to a coating film, the polyimide layer b2 in which the photoresist pattern was formed and the precursor resin layer c2 were formed were formed. The copper cloth & 2 drive resin layer is made up of the copper-lined polyimide resin. The result of cross-section observation of the surface layer of the coating film a2 is confirmed. The surface is about 100 nm deep—the particles (the silk particles are in a state of being embedded), and the poly-imine resin layer e2 is peeled off from the steel substrate by 2mr^_e2'. The shaft has copper wiring. The tensile strength of the steel wiring is dense [Example 3] 098104040 35 200945980 Using the coating of nickel acetate solution in Example 2 (25. In the crucible, the coating film & 2 was immersed in the lion n L θ 10 minutes The nickel ion is impregnated into the coating film a2 to form the metal ion-containing layer (5). In addition to the use of the metal ion complex, the film i-imine precursor resin layer b3 and the method of the fourth embodiment are replaced with the example (i) A poly-baked (four) «layer eh precipitation precursor resin layer C3 formed with a photoresist pattern is obtained. The sheet resistance of the electrode layer which is particularly excellent before the precipitation of nickel is _□, and is used as a pre-extrusion of 2 Α~ The resin layer C3 is subjected to electro-recording in copper electrical wiring to form a copper film thickness of 1 〇 _ with a steel wiring before the resin layer d3, and e3 is obtained by the method of the embodiment 1 (10). The (IV) imide resin layer of the copper wiring is not peeled off from the steel substrate, and the (4) imine resin layer e3 of the Z-made steel wiring is formed from the copper wiring. The degree of the obtained is + (4) , the tension of the _ line is strong [Example 4] 'The thickness of the coating on the uncoated steel base For the m-like side, the poly-brew = _ resin solution - dried in the C for 20 minutes, the thickness of the layer is turned into a $ 2 ^ layer. In this resin layer, the ship imine solution a, in the Wei frequency Record the wrong cloth film a4 immersed in 25 weight = (four) 'get it... apply this 氦 aqueous solution (25. 〇 2 minutes, make it contain 098104040 〇〇36 200945980 / again to the coating film a4. Then 'will The coating film a4 was pulled up from the aqueous ammonia solution and dried to obtain a coating film a4. The same procedure as in Example 1 was carried out except that the coating film & 4' was used instead of the coating film U in Example i. A polystyrene layer formed with a photoresist pattern::=Γ? layer b4 and a precursor resin layer c4 are deposited. The sheet resistance of the precipitated layer in the nickel precipitation precursor $曰θ c4 is 42 Ω/α ❹ film. Nickel precipitates the precursor resin layer c4, in the electrolysis of copper electricity 2A/dm2, the electroplating is cold, and the copper ore is formed into a copper film with a thickness of 1〇__ The resin layer d4 was obtained by the polyimine resin layer e4 in which the copper wiring was formed in the same manner as in the example i 5. The polyimine resin layer 64 formed with the steel wiring was not recorded from the steel-based wiring. Γ (4) is formed into a copper wiring film e4'. The copper iridium 1: e4' is formed, and the copper wiring has a tensile strength of 1.4 kN/m, and the adhesion is excellent. n [Example 5] 225 In addition, the remainder = (10) water frequency 2 (four) impregnation for 2 minutes, the sheet of the precipitated layer of the yttrium imide precursor tree c5, the resin layer c5 is deposited, and the resin layer is deposited. The film was plated to form a steel film thickness, and the current density of 2 A/dm 2 was used to enter the copper wiring of the shell, and the copper wiring 098104040 200945980 was formed without the precursor resin layer d5' being the same as in the first embodiment. This results in a polyimine resin layer e5 formed with a copper wiring. The obtained polyimide film layer e5 on which the copper wiring was formed was peeled off from the stainless steel substrate to obtain a film e5' on which the surface wiring was formed. The film e5 having the copper wiring formed thereon was obtained, and the copper wiring had a tensile strength of 1.4 kN/m, which was excellent in adhesion. [Reference Example] A polyimide film (manufactured by Toray-DuPont Co., Ltd., trade name: Kaptc > nEN, 100 mm x 100 mm x 25 / zm thick, linear thermal expansion coefficient (CTE) 16 x 1 (T6 / K) was immersed at 50 ° C 5N potassium hydroxide aqueous solution was used for 1 minute. Then, the impregnated polyimine film was sufficiently washed with ion-exchanged water, and then immersed in an aqueous solution of hydrochloric acid (25 ° C) for 30 seconds. Then, it is sufficiently washed with ion-exchanged water and spray-dried with compressed air to obtain a surface-treated polyimine film. The thickness of the alkali-treated layer on one surface of the surface-treated polyimine film is 1.4 μm. The film was immersed in a 100 mM aqueous solution of nickel acetate (25 ° C) for 10 minutes, and a metal ion-containing layer was formed by impregnating the treated layer with nickel ions. Then, a dry film photoresist was formed on the surface of the metal ion-containing layer (Asahi Kasei (share), Shangyi name. Sunphoto AQ, l〇em thickness) is laminated at a temperature of ii 〇 °c, exposed to ultraviolet light through a light mask, and developed by a 5 wt% aqueous solution of sodium carbonate. # m{Wiring width/wiring interval (L/S)=20 in m/30 a resist pattern of //m}, and a film formed with a photoresist pattern is obtained. The above-mentioned thin crucible is immersed in a 50 mM aqueous solution of sodium borohydride (5 〇. 3 minutes 098104040 200945980 〇 in the masked area without the photoresist layer) On the surface of the metal ion-containing layer, a precipitated layer is formed to be immersed at a temperature of 8 〇. (: an electroless nickel plating bath (manufactured by Okuno Pharmaceutical Co., Ltd., trade name: Top-Nikoron T0M-S) 30 seconds, borrowed •• This is formed as the riding layer of the steel lai. Then, in the formed nickel layer, in the copper plating bath, the copper wiring of the plating-degree W is carried out with a current density of 2A/W. For the formed steel wiring, _=copper=, the pull-off strength is 0.7 kN/m. Into the sweat evaluation, the above Examples 1 to 5 and the reference γ are shown in Table 1 and Table 2. Summary of the test and test results

098104040 39 200945980 [表1] 實施例1 實施例2 實施例3 塗佈膜 (聚醯亞胺前驅物樹脂層) 單層 2層 2層 金屬離子含浸 聚醯亞胺樹脂的種類 熱可塑性 (Tg=252〇C) 熱可塑性 (Tg=252〇C) + 低熱膨脹性 [CTE=14.6 xlO'6(l/K)] 熱可塑性 (Tg=252〇C) + 低熱膨脹性 [CTE=14.6 xlO_6(l/K)] 金屬(Ni)析出層的狀態 平均粒徑40nm 之Ni粒子為 埋入狀態 平均粒徑50nm 之Ni粒子為 埋入狀態 膜狀 (片電阻 25Ω/Π) 非電解鍍敷步驟 必要 必要 不要 佈線的拉離強度 [kN/m] 1.4 1. 4 1.4 [表2] 實施例4 實施例5 參考例 塗伟膜 (聚醯亞胺前驅物樹脂層) 2層 氨含浸 2層 乙醇胺含浸 驗處理 聚醯亞胺樹脂的種類 熱可塑性 (Tg=252〇C) + 低熱膨脹性 [CTE=14.6 xlO'6(l/K)] 熱可塑性 (Tg=252〇C) + 低熱膨脹性 [CTE=14.6 xlO'6(l/K)] 低熱膨脹性 [CTE=16 xlO'6(l/K)] 金屬(Ni)析出層的狀態 膜狀 (片電阻 42Ω/Π) 膜狀 (片電阻 45Ω/Π) — 非電解鍍敷步驟 不要 不要 必要 佈線的拉離強度 [kN/m] 1.4 1.4 0. 7 098104040 40 200945980 由表1及表2可確認得知:實施例丨〜實施例5的方法所 製造之作為電路佈線基板的銅佈線形成樹脂層,任 一者之拉 離強度皆為l./m’非常大’於可撓式佈線板等用途中所 :要求之密著性’與參考例相較,遠為優異。 尤其於藉由用聚醯亞胺前驅物鎳錯合體溶液A,玻璃轉 ’ U為35GC以下之熱可塑性聚醯亞胺樹脂(Tg=252<5c) ❹ ’所域的表面樹脂層之實施例丨及實施例2巾,於金屬析出 層开/成步驟中所析出的鎳粒子係以埋入上述熱可塑性聚酿 亞胺樹脂的前婦層巾充分深度(約1__狀||存在,其 對提高密著性有貢獻。 再者於線熱膨脹係數$ 1χ1〇_6〜級ι〇_6(ι/κ)的範圍内 之低熱膨脹性聚醯亞胺樹脂[GTE=14.6X1G、1/K)]上,積層 上述熱可塑性聚醜亞胺樹脂形成多層構造之實施例2〜實 Ο ㈣純由於鄰接金相層的層係配置熱可雜聚醯亞胺 述相同的理由可得到密著性非常優異且低 熱膨脹性之聚醯亞脍組 抑制基板之反趣。一積層構造,因而顯示出可有效地 離子、容為聚醯亞胺前驅物樹脂層的塗佈膜以金屬 ^ , 電阻為25[0/口],非常小,故即使 呈理_步驟’料可直接騎魏處理的狀態。 其理由在於,糾金屬離子含浸,塗佈膜中的鎳離子量變得 098104040 200945980 豐富而使析出之金屬鎳層可形成為緻密膜狀之故。 又’使作為聚醯亞麟驅物樹脂層的塗佈膜於胺水溶液中 進行次潰處理,於經氨或胺含浸之實施例4〜實施例5中, 還原處理後的鎳析出層形成為膜狀,其片電阻亦小,達 5〇[Ω/ΙΙ1]以下,即使不進行非電解鍍敷步驟,亦為可直接 電鍍處理的狀態。其理由在於,藉由胺水溶液的含浸,與塗 佈膜中的金屬離子之間所形成之胺錯合體,具有於將金屬離 子還原時可使配位子容易游離的性質,故金屬離子之還原可 於塗佈膜表層部均一進行,而使鎳析出層形成為膜狀之故。 又’本發明並非限定於上述實施形態,在不脫離本發明主 旨的各種變化皆可能,其等變化皆為本發明之範圍。 (產業上之可利用性) 本發明之方法可適用於各種電子零件中所使用的印刷佈 線基板等之電路佈線基板的製造。 【圖式簡單說明】 圖1為表示本發明之實施形態的電路佈線基板之製造方 法的主要步驟順序之流程圖。 圖2(a)至(e)為圖1的各步驟之說明圖。 【主要元件符號說明】 1 底層(基材) 3a 塗佈膜 3 聚醯亞胺樹脂層 098104040 42 200945980 5 光阻層 7 金屬析出層 9 電路佈線 100 電路佈線基板098104040 39 200945980 [Table 1] Example 1 Example 2 Example 3 Coating film (polyimine precursor resin layer) Type of single-layer, 2-layer, 2-layer metal ion impregnated polyimide resin Thermoplasticity (Tg= 252〇C) Thermoplasticity (Tg=252〇C) + Low thermal expansion [CTE=14.6 xlO'6(l/K)] Thermoplasticity (Tg=252〇C) + Low thermal expansion [CTE=14.6 xlO_6(l /K)] In the state of the metal (Ni) precipitation layer, the Ni particles having an average particle diameter of 40 nm are in the buried state, and the Ni particles having an average particle diameter of 50 nm are in a buried state (sheet resistance: 25 Ω/Π). Do not pull the tensile strength [kN / m] 1.4 1. 4 1.4 [Table 2] Example 4 Example 5 Reference Example Tu Wei film (polyimine precursor resin layer) 2 layers of ammonia impregnation 2 layers of ethanolamine impregnation test Type of Polyimine Resin Treated Thermoplasticity (Tg=252〇C) + Low Thermal Expansion [CTE=14.6 xlO'6(l/K)] Thermoplasticity (Tg=252〇C) + Low Thermal Expansion [CTE= 14.6 xlO'6(l/K)] Low thermal expansion [CTE=16 xlO'6(l/K)] State of metal (Ni) precipitation layer Film (sheet resistance 42 Ω / Π) Membrane (sheet resistance 45 Ω / Π) — electroless plating In the procedure, the pull-out strength of the necessary wiring is not required [kN/m] 1.4 1.4 0. 7 098104040 40 200945980 It can be confirmed from Table 1 and Table 2 that the method of the embodiment 丨 to the embodiment 5 is manufactured as a circuit wiring substrate. The copper wiring forms a resin layer, and the tensile strength of either one is l./m' is very large. In the use of a flexible wiring board or the like: the required adhesion is far superior to the reference example. In particular, an embodiment of a surface resin layer in which the glass is converted to a thermoplastic polyimine resin (Tg=252 < 5c) ❹ ' of 35 GC or less by using the polyimine precursor nickel complex solution A In the case of the second embodiment, the nickel particles deposited in the metal deposition layer opening/forming step are present in a sufficient depth (about 1___||, which is embedded in the front layer of the thermoplastic polyimide resin. It contributes to the improvement of the adhesion. Further, the low thermal expansion polyimine resin in the range of the linear thermal expansion coefficient of $1χ1〇_6~grade ι〇_6(ι/κ) [GTE=14.6X1G, 1/ K)], the second layer of the above-mentioned thermoplastic poly-imine resin is laminated to form a multilayer structure. (4) Purely, the heat can be obtained by the same layer of the adjacent layer of the metallographic layer. The polyruthenium group, which is very excellent in nature and low in thermal expansion, suppresses the objectivity of the substrate. A laminated structure, thus showing that the coating film which can effectively ionize and accommodate the polyimide film of the polyimide precursor has a metal resistance of 25 [0/□], which is very small, so even if it is a rational Can directly ride the state of Wei treatment. The reason for this is that the metal ion is impregnated, and the amount of nickel ions in the coating film becomes rich in 098104040 200945980, so that the deposited metallic nickel layer can be formed into a dense film. Further, the coating film which is a resin layer of the polyfluorene-liner was subjected to a secondary decompression treatment in an aqueous amine solution, and in Examples 4 to 5 in which ammonia or amine was impregnated, the nickel precipitation layer after the reduction treatment was formed as In the form of a film, the sheet resistance is also small, up to 5 〇 [Ω / ΙΙ 1] or less, and it can be directly plated even if the electroless plating step is not performed. The reason is that the amine complex formed between the metal ion in the coating film by the impregnation of the aqueous amine solution has the property of allowing the ligand to be easily released when the metal ion is reduced, so the reduction of the metal ion It can be uniformly formed on the surface layer portion of the coating film, and the nickel deposition layer is formed into a film shape. The present invention is not limited to the embodiments described above, and various changes may be made without departing from the spirit and scope of the invention. (Industrial Applicability) The method of the present invention can be applied to the manufacture of a circuit wiring board such as a printed wiring board used in various electronic parts. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a flow chart showing the main steps of a method of manufacturing a circuit wiring board according to an embodiment of the present invention. 2(a) to (e) are explanatory views of the respective steps of Fig. 1. [Main component symbol description] 1 Underlayer (substrate) 3a Coating film 3 Polyimide resin layer 098104040 42 200945980 5 Photoresist layer 7 Metal deposition layer 9 Circuit wiring 100 Circuit wiring substrate

098104040 43098104040 43

Claims (1)

200945980 七、申δ青專利範圍·· 1.-種電路佈線基板之製造方法,其係㈣製造於聚酿亞 胺樹脂層上形成電路佈線所成之電路饰線基板者 ;其特徵在 於具備有下逃步驟: a)藉由在基材上塗佈含有聚_胺前驅物樹脂(聚酿亞胺 樹脂㈣與金屬化合物之塗饰液,使其乾燥而形成塗 佈膜之步驟;200945980 VII. Application scope of δ 青青·· 1. A method for manufacturing a circuit wiring board, which is a circuit board substrate formed by forming a circuit wiring on a polyacrylamide resin layer; The step of escaping: a) forming a coating film by coating a coating liquid containing a poly-amine precursor resin (polyamide resin (4) and a metal compound on a substrate and drying it; b)以光阻層被覆上述塗佈膜之表面,進行形成圖案而形成 光阻遮罩之步驟; ,)藉由使上述塗佈膜中的金屬離子還原使金屬析出於上 述塗佈膜表層部之未被上述光阻遮罩被覆的區域而形成金 屬析出層之步驟; d) 於上述金屬析出層上,藉由非電解鍍敷及/或電鍛形成 具有圖案的電路佈線之步驟;及b) a step of coating the surface of the coating film with a photoresist layer to form a pattern to form a photoresist mask; and) depositing a metal into the surface layer portion of the coating film by reducing metal ions in the coating film a step of forming a metal deposition layer without being covered by the photoresist mask; d) a step of forming a patterned circuit wiring by electroless plating and/or electric forging on the metal deposition layer; e) 藉由對上述塗佈膜中之聚醯亞胺前驅物樹脂層進行熱 處理使其醯亞胺化,形成上述聚醯亞胺樹脂層之步驟。 2.如U利範®第1項之電路佈線基板之製造方法,其 中,於上述a)步驟之後,進而具備:f)藉由對上述塗佈膜 以含有金屬離子之水溶液含浸,使其乾燥,錢上述塗佈膜 中的金屬離子含有量增加之步驟。e) a step of forming the above-mentioned polyimine resin layer by heat-treating the polyimide phase of the polyimide film in the coating film. 2. The method of manufacturing a circuit board according to the first aspect of the present invention, further comprising: f) impregnating the coating film with an aqueous solution containing a metal ion, and drying the method; The step of increasing the content of metal ions in the coating film described above. 3·如申請專利範圍第!項之電路佈線基板之製造方法,其 中’於上述a)步驟之後,進而具備:g)對上述塗佈膜以氨 水溶液或1級胺或2級胺的水溶液含浸之步驟。 098104040 443. If you apply for a patent scope! The method for producing a circuit wiring board according to the invention, further comprising the step of: g) impregnating the coating film with an aqueous ammonia solution or an aqueous solution of a primary amine or a secondary amine. 098104040 44
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