TW200942798A - Test apparatus and test method - Google Patents

Test apparatus and test method

Info

Publication number
TW200942798A
TW200942798A TW97113386A TW97113386A TW200942798A TW 200942798 A TW200942798 A TW 200942798A TW 97113386 A TW97113386 A TW 97113386A TW 97113386 A TW97113386 A TW 97113386A TW 200942798 A TW200942798 A TW 200942798A
Authority
TW
Taiwan
Prior art keywords
test
airtight
area
partitioning structure
workpiece
Prior art date
Application number
TW97113386A
Other languages
Chinese (zh)
Other versions
TWI368733B (en
Inventor
Tien-Chung Tseng
Original Assignee
Wistron Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Wistron Corp filed Critical Wistron Corp
Priority to TW097113386A priority Critical patent/TWI368733B/en
Publication of TW200942798A publication Critical patent/TW200942798A/en
Application granted granted Critical
Publication of TWI368733B publication Critical patent/TWI368733B/en

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  • Examining Or Testing Airtightness (AREA)

Abstract

A test apparatus and a test method are disclosed. The test apparatus comprises an airtight partitioning structure, a box and at least one gas sensor. An airtight area may be formed via combining the box and the airtight partitioning structure. A workpiece is disposed on the side which the box combines with the airtight partitioning structure so a test airtight area may be formed via combining the workpiece and the airtight partitioning structure. The at least one gas sensor is disposed into the test airtight area. The airtight area may contain a test gas. The at least one gas sensor may detect whether there is the test gas in the test airtight area for testing the seal status of the workpiece.
TW097113386A 2008-04-11 2008-04-11 Test apparatus and test method TWI368733B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW097113386A TWI368733B (en) 2008-04-11 2008-04-11 Test apparatus and test method

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW097113386A TWI368733B (en) 2008-04-11 2008-04-11 Test apparatus and test method

Publications (2)

Publication Number Publication Date
TW200942798A true TW200942798A (en) 2009-10-16
TWI368733B TWI368733B (en) 2012-07-21

Family

ID=44868810

Family Applications (1)

Application Number Title Priority Date Filing Date
TW097113386A TWI368733B (en) 2008-04-11 2008-04-11 Test apparatus and test method

Country Status (1)

Country Link
TW (1) TWI368733B (en)

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI461678B (en) * 2013-07-10 2014-11-21 Wistron Corp Electronic device
TWI548289B (en) * 2014-06-20 2016-09-01 致伸科技股份有限公司 Open type speaker leak test system and method

Also Published As

Publication number Publication date
TWI368733B (en) 2012-07-21

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees