TW200937507A - Wafer cleaning apparatus - Google Patents

Wafer cleaning apparatus Download PDF

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Publication number
TW200937507A
TW200937507A TW97106513A TW97106513A TW200937507A TW 200937507 A TW200937507 A TW 200937507A TW 97106513 A TW97106513 A TW 97106513A TW 97106513 A TW97106513 A TW 97106513A TW 200937507 A TW200937507 A TW 200937507A
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Taiwan
Prior art keywords
wafer
cleaning machine
strip
wafer cleaning
disposed
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TW97106513A
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Chinese (zh)
Inventor
Ming-Hsing Kao
Chian-Ming Ngo
Boon-Siong Tan
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United Microelectronics Corp
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Priority to TW97106513A priority Critical patent/TW200937507A/en
Publication of TW200937507A publication Critical patent/TW200937507A/en

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Abstract

A wafer cleaning apparatus used for cleaning a first uncleaned surface of a wafer is provided. The wafer cleaning apparatus includes a case, a spin device, a cover, at least one first spray bar, and at least one exhaust device. The spin device is disposed in the case and used for carrying the wafer and spinning perpendicularly to the ground. The cover is disposed in the case and used for covering the spin device. The first spray bar is disposed at one side of the spin device and used for spraying a volatile cleaning solution onto the first uncleaned surface of the wafer, in which the sprayed volatile cleaning solution is of a bar shape. The exhaust device is disposed on the sidewall of the case.

Description

200937507 r ·、24 26064twf.doc/n 九、發明說明: 【發明所屬之技術領域】200937507 r ·, 24 26064twf.doc/n IX. Description of the invention: [Technical field to which the invention pertains]

本發明是有關於一 種晶圓清洗機台。 【先前技術】 圓洗最頻繁之製程步驟就是晶 ❹ η B 的乃是為了擔在進行半導體製程 的古:化學機械研磨製程等製程)之後附著於晶圓表面上 品後續製程的_非h i 物會對於產 二以㈣&響非吊大。金屬雜質的污染會造成卜 ,電、縮減少數載子的生命期、降侧極氧化層之 =電屢。微粒之附著則會影響微影製程圖案轉移之真二 乂/音古至造成電路結構之短路。因此,在晶圓清洗製程中, =:的去除附著於晶圓表面之有機化合物、金屬雜質 習知技術在對晶圓進行清洗時,會將晶圓放置 :上並使其平行於地面進行㈣,—邊旋轉—邊利用注^ 機構將水倾於晶圓上進行歧,並且姻鄉晶圓的^ 式將水旋乾。然而,在完成此清洗步驟之後,常 表面發現水潰(watermark),使得清洗效率不佳,^ = 半導體元件的品質及良率。 咖降低 【發明内容】 ,鑑於此’本發明的目的就是在提供—種晶圓清洗機 σ ’此有效地提升對晶圓的清洗效率。 5 200937507 ----------- .24 26064twf.doc/n ^ 本發明提出一種晶圓清洗機台,適用於對晶圓的第— 待清洗面進行清洗。晶圓清洗機台包括殼體、旋轉裝置、 罩體、至少一個第一條狀喷灑器及至少一個排氣裝^。 轉裝置配置於殼體内,用以承載晶圓並垂直於地面進行旋 轉。罩體配置於殼體中並覆蓋旋轉裝置。第一條狀噴灑器 =置於旋轉裝置的一侧,用以喷灑揮發性清洗液至晶圓^The present invention is directed to a wafer cleaning machine. [Prior Art] The most frequent process step for the round wash is that the wafer η B is used for the subsequent process of attaching to the wafer surface after the process of performing the semiconductor process: the chemical mechanical polishing process. For the second production (four) & The pollution of metal impurities will cause the electricity, shrinkage, reduction of the life of the carrier, and the reduction of the polar oxide layer. The adhesion of the particles will affect the true dipole/tone of the lithography process pattern to cause a short circuit in the circuit structure. Therefore, in the wafer cleaning process, =: removal of organic compounds and metal impurities attached to the surface of the wafer. When cleaning the wafer, the wafer is placed on the substrate and paralleled to the ground (4). , - Rotate - use the injection mechanism to pour water onto the wafer for dissimilarity, and the wafer of the marriage wafer spins the water. However, after this cleaning step is completed, watermarks are often found on the surface, resulting in poor cleaning efficiency, ^ = quality and yield of semiconductor components. SUMMARY OF THE INVENTION In view of the above, the object of the present invention is to provide a wafer cleaning machine σ' which effectively improves the cleaning efficiency of the wafer. 5 200937507 ----------- .24 26064twf.doc/n ^ The present invention provides a wafer cleaning machine suitable for cleaning the first to be cleaned surface of a wafer. The wafer cleaning machine includes a housing, a rotating device, a cover, at least one first strip sprayer, and at least one venting device. The rotating device is disposed in the housing for carrying the wafer and rotating perpendicular to the ground. The cover is disposed in the housing and covers the rotating device. First strip sprayer = placed on one side of the rotating device to spray volatile cleaning solution to the wafer ^

第一待清洗面,且所喷灑的揮發性清洗液呈條狀。排氣裝 置配置於該殼體的側壁上。 ’、、 依照本發明的一實施例所述,在上述之晶圓清洗機台 中’旋轉装置包括旋轉台。 σ 依照本發明的一實施例所述,在上述之晶圓清洗機二 中,更包括多個固定機構,配置於旋轉裝置上,用以= 圓固定於旋轉裝置上。 aa 依照本發明的一實施例所述’在上述之晶圓清洗機a 中’固疋機構包括多個固定爽。 依照本發明的一實施例所述’在上述之晶圓清洗機△ 中’固定機構包括吸附裝置。 口 依照本發明的一實施例所述’在上述之晶圓清洗機二 中’第一條狀噴灑器的喷灑方式包括對準晶圓的徑向: 噴灑。The first surface to be cleaned, and the volatile cleaning liquid sprayed is in the form of a strip. The exhaust device is disposed on a side wall of the housing. According to an embodiment of the present invention, in the wafer cleaning machine described above, the rotating device includes a rotating table. According to an embodiment of the present invention, in the above wafer cleaning machine 2, a plurality of fixing mechanisms are further disposed on the rotating device for fixing the circle to the rotating device. Aa According to an embodiment of the present invention, the fixing mechanism in the wafer cleaning machine a described above includes a plurality of fixings. According to an embodiment of the present invention, the fixing mechanism in the above-described wafer cleaning machine Δ includes an adsorption device. Portion According to an embodiment of the present invention, the spraying method of the first strip sprayer in the above-described wafer washer 2 includes aligning the radial direction of the wafer: spraying.

依照本發明的一實施例所述,在上述之晶圓清洗機台 中’當第一條狀噴灑器的數量為多個時,第一條狀嘴麗器 的排列方式包括彼此相交而呈放射狀排列。 TO 依照本發明的一實施例所述,在上述之晶圓清洗機台 6 200937507 124 26064twf.doc/n 中,第一條狀喷灑器包括至少一排點狀喷灑孔。 依照本發明的一實施例所述,在上述之晶圓清洗機台 中,第一條狀喷灑器包括至少一條條狀喷灑孔。 依照本發明的一實施例所述,在上述之晶圓清洗機台 中,旋轉裝置包括多個滾動炎輪。 依照本發明的一實施例所述,在上述之晶圓清洗機台 中,更包括至少一個第二條狀喷灑器,配置於旋轉裝置另 Φ 一側,用以喷灑揮發性清洗液至晶圓的第二待清洗面,且 所喷灑的揮發性清洗液呈條狀。 依照本發明的一實施例所述,在上述之晶圓清洗機台 中,第二待清洗面為第一待清洗面的相反面。 依照本發明的一實施例所述,在上述之晶圓清洗機台 中,第二條狀喷灑器的喷灑方式包括對準晶圓的徑向進行 喷灑。 依照本發明的一實施例所述,在上述之晶圓清洗機台 中,當第二條狀喷灑器的數量為多個時,第二條狀喷灑器 0 的排列方式包括彼此相交而呈放射狀排列。 依照本發明的一實施例所述,在上述之晶圓清洗機台 中,第二條狀噴灑器包括至少一排點狀喷灑孔。 依照本發明的一實施例所述,在上述之晶圓清洗機台 中,第二條狀喷灑器包括至少一條條狀喷灑孔。 依照本發明的一實施例所述,在上述之晶圓清洗機台 中,揮發性清洗液為異丙醇或丙酮。 依照本發明的一實施例所述,在上述之晶圓清洗機台 200937507 ----------- .24 26064twf.doc/n 中’更包括注水裝置,配置於罩體中,用以提供水至晶圓。 依照本發明的一實施例所述’在上述之晶圓清洗機台 中,水包括去離子水。 "" 依照本發明的一實施例所述,在上述之晶圓清洗機台 中,當排氣裝置的數量為多個時,排氣裝置配置於殼體的 同一側壁上。 依照本發明的一實施例所述,在上述之晶圓清洗機台According to an embodiment of the present invention, in the above-mentioned wafer cleaning machine table, when the number of the first strip-shaped sprinklers is plural, the arrangement of the first strip-shaped nozzles includes radial intersections with each other. arrangement. TO In accordance with an embodiment of the present invention, in the wafer cleaning machine 6 200937507 124 26064twf.doc/n, the first strip sprayer includes at least one row of spotted spray holes. According to an embodiment of the present invention, in the above wafer cleaning machine, the first strip sprayer includes at least one strip spray hole. In accordance with an embodiment of the present invention, in the wafer cleaning machine described above, the rotating device includes a plurality of rolling rollers. According to an embodiment of the present invention, the wafer cleaning machine includes at least one second strip sprayer disposed on the other side of the rotating device for spraying the volatile cleaning liquid to the crystal. The second second surface to be cleaned, and the volatile cleaning liquid sprayed is strip-shaped. According to an embodiment of the invention, in the wafer cleaning machine, the second surface to be cleaned is the opposite surface of the first surface to be cleaned. In accordance with an embodiment of the present invention, in the wafer cleaning machine described above, the spraying method of the second strip sprayer includes spraying in the radial direction of the wafer. According to an embodiment of the present invention, in the above wafer cleaning machine, when the number of the second strip sprayers is plural, the arrangement of the second strip sprayers 0 includes intersecting each other. Radial arrangement. According to an embodiment of the present invention, in the above wafer cleaning machine, the second strip sprayer includes at least one row of dot spray holes. According to an embodiment of the invention, in the above wafer cleaning machine, the second strip sprayer comprises at least one strip spray hole. According to an embodiment of the present invention, in the above wafer cleaning machine, the volatile cleaning liquid is isopropyl alcohol or acetone. According to an embodiment of the present invention, the above-mentioned wafer cleaning machine platform 200937507 ----------- .24 26064twf.doc/n further includes a water injection device disposed in the cover body. Used to supply water to the wafer. According to an embodiment of the invention, in the wafer cleaning machine described above, the water comprises deionized water. "" According to an embodiment of the present invention, in the wafer cleaning machine described above, when the number of exhaust devices is plural, the exhaust devices are disposed on the same side wall of the casing. According to an embodiment of the present invention, in the above wafer cleaning machine

中,當排氣裝置的數量為多個時,排氣裝置配置於殼體 多個侧壁上。 基於亡述,由於本發明所提出的晶圓清洗機台具有第 一條狀喷灑器且利用旋轉裝置旋轉晶圓,所以能夠更均勹 地且更快速地贿發性清洗液賴於晶 面 上,因此能夠提高清洗效率。 先面 此外 隹本發明所提出的晶圓清洗機台在對晶圓進行 清洗溶?本身具有揮發性’ •利用旋轉晶圓 留物!’力乾燥速度’因此能避免在晶圓上留下殘 ,進而可s高半導體元件的品質及良率。 喷麗:發明所提出的晶圓清洗機台具有第二條狀 可以對晶圓的第二待清洗面進行清洗, 而月b更全面性地對晶圓進行清洗。 易懂為和其他目的、特徵和優點能更明顯 明如下。、牛實施例,並配合所附圖式,作詳細說 【實施方式】 8 200937507 -----------,24 26064twf.doc/n 弟一實施你丨 =1所、%示為本發明第—實施例及第二實施例之晶圓 >月洗機α的上視圖。圖2所緣示為本發明第—實施例之晶 圓=洗機台沿著圖i中Α_Α,剖面線的剖面圖。圖3及圖4 所^為本發明第-實施例之條狀噴灑器的正視圖。圖5 為本發明第-實施例之條狀噴灑器排列方式的示意 圖。Wherein, when the number of exhaust devices is plural, the exhaust device is disposed on a plurality of side walls of the casing. Based on the above description, since the wafer cleaning machine of the present invention has the first strip sprayer and rotates the wafer by the rotating device, the flushing cleaning liquid can be more uniformly and quickly relied on the crystal face. Therefore, the cleaning efficiency can be improved. In addition, the wafer cleaning machine proposed by the present invention cleans and dissolves the wafer. Volatile in itself' • Use rotating wafers to keep things! The 'force drying speed' thus avoids leaving a residue on the wafer, which in turn can improve the quality and yield of the semiconductor component. Spray: The wafer cleaning machine proposed by the invention has a second strip to clean the second surface to be cleaned, and the b is more comprehensively cleaned. It is easy to understand and other purposes, features and advantages can be more clearly as follows. The cow embodiment, in conjunction with the drawing, is described in detail [Embodiment] 8 200937507 -----------, 24 26064twf.doc/n The first implementation of your 丨=1,% A top view of the wafer > month washing machine α of the first embodiment and the second embodiment of the present invention. Fig. 2 is a cross-sectional view showing the crystal circle of the first embodiment of the present invention = the washing machine table along the Α_Α in Fig. i. 3 and 4 are front views of the strip sprinkler of the first embodiment of the present invention. Fig. 5 is a schematic view showing the arrangement of the strip sprinklers of the first embodiment of the present invention.

μ同時參照圖1及圖2 ’晶圓清洗機台適用於對 晶圓200的待清洗面搬進行清洗。待清洗面2〇2可以是 晶圓的正面或背面’在本實施财是以待清洗面观為晶 圓200的正面為例進行說明。 晶圓清洗機台100包括殼體102、旋轉裝置1〇4、固定 機構1〇6、罩體1〇8、條狀喷麗器11〇、排氣裝置112及注 水裝置114。 旋轉裝置104配置於殼體102内,用以承載晶圓2〇〇 並垂直於地面進行旋轉。旋轉裝置1G4例如是由馬達所驅 動的旋轉台。此外,由於晶圓清洗機台1〇〇中的旋轉裝置 104為垂直於地面進行旋轉,因此晶圓清洗機台1〇〇可設 計成直立式,而非習知技術中平台式的晶圓清洗機台。因 此,可以更有效地且更有彈性地進行空間的利用。 固定機構106配置於旋轉裝置1〇4上,用以將晶圓2〇〇 固定於旋轉裝置104上,以避免晶圓2〇〇在旋轉的過程中 與旋轉裝置104分離。固定機構106例如是固定夾。在其 他實施例中,固定機構106可為吸附裝置。 9μ Simultaneously referring to Figs. 1 and 2', the wafer cleaning machine is adapted to clean the surface to be cleaned of the wafer 200. The surface to be cleaned 2〇2 may be the front side or the back side of the wafer. In the present embodiment, the front side of the wafer to be cleaned is taken as an example of the front side of the wafer 200. The wafer cleaning machine table 100 includes a casing 102, a rotating device 1〇4, a fixing mechanism 1〇6, a cover 1〇8, a strip-shaped sprayer 11〇, an exhaust device 112, and a water injection device 114. The rotating device 104 is disposed in the housing 102 for carrying the wafer 2〇〇 and rotating perpendicular to the ground. The rotating device 1G4 is, for example, a rotary table driven by a motor. In addition, since the rotating device 104 in the wafer cleaning machine 1 is rotated perpendicular to the ground, the wafer cleaning machine 1 can be designed to be upright instead of the platform-type wafer cleaning in the prior art. Machine. Therefore, space utilization can be performed more efficiently and more flexibly. The fixing mechanism 106 is disposed on the rotating device 1〇4 for fixing the wafer 2〇〇 to the rotating device 104 to prevent the wafer 2 from being separated from the rotating device 104 during the rotation. The fixing mechanism 106 is, for example, a fixing clip. In other embodiments, the securing mechanism 106 can be an adsorption device. 9

Ο 200937507 …一-一,〜,24 26064twf.doc/n 罩體108配置於殼體102中並覆蓋旋轉裝置1〇4,可 用以保護位於其中的構件,並防止在清洗過程中所使 溶液四處飛濺。 條狀噴灑器110配置於旋轉裝置1〇4的一側,用以喷 轉發性清洗液至晶圓細的待清洗面搬,且所喷麗的 揮發性清洗液呈練,而能均勻地且快速地將揮發性清洗 ,凝,晶® 2GG的待清洗面观。條狀喷灑器11〇的數 2以是-個或多個。條狀賴器η㈣賴方式例如是 對準晶圓200的徑向進行喷,可更均勻地將揮發性清洗 ^喷凝至晶圓200的待清洗面搬。揮發性清洗液例如是 異丙醇或丙酮等揮發性液體。 值得注意的是,在本實施例中,待清洗面2〇2是朝 條狀喷mu m之開口。在其他實施例中,隨著 =配置方式的不同,條狀喷· 110可配置於旋轉裝置 104的另一侧。 ^外,请同時參照圖3及圖4,由條狀嘴灑器11〇所 界生清洗液之所以里條狀的原因在於:條狀噴灑 ^ η可匕括至少—排點狀噴灑孔116(如圖3所示的四排) 3疋至^條條狀喷麗孔118(如圖4所示的四條)。 另外,請參照圖5,條狀噴灑器11〇的數量例如是四 仁並不用以限制本發明。此時,條狀噴灑器的排 歹,方式例如是彼此相交而呈放射狀排列。如此一來,可以 提高揮發性清洗液的噴灑效率及均勻度。 請繼續參照圖1及圖2,排氣裝置112配置於該殼體 200937507 -----------.24 26064twf.doc/nΟ 200937507 ... one-one, ~, 24 26064twf.doc/n The cover 108 is disposed in the housing 102 and covers the rotating device 1〇4, which can be used to protect the components located therein and prevent the solution from being made during the cleaning process. Splash. The strip sprinkler 110 is disposed on one side of the rotating device 1〇4 for spraying the reversible cleaning liquid to the thin surface to be cleaned, and the sprayed volatile cleaning liquid is practiced, and can be evenly and Quickly clean the surface of the volatile cleaning, condensate, and crystal 2GG to be cleaned. The number 2 of the strip sprayers 11 is one or more. The strip-shaped spacer η (four) is applied, for example, to the radial direction of the wafer 200, and the volatile cleaning is more uniformly sprayed onto the surface to be cleaned of the wafer 200. The volatile cleaning liquid is, for example, a volatile liquid such as isopropyl alcohol or acetone. It is to be noted that, in the present embodiment, the surface to be cleaned 2〇2 is an opening which is sprayed toward the strip. In other embodiments, the strip spray 110 may be disposed on the other side of the rotating device 104 as the configuration is different. In addition, please refer to FIG. 3 and FIG. 4 at the same time, the reason why the cleaning liquid is bounded by the strip nozzle 11 is that the strip spray η can include at least the row of spray holes 116. (four rows as shown in Fig. 3) 3疋 to ^ strips of spray holes 118 (four as shown in Figure 4). Further, referring to Fig. 5, the number of strip sprinklers 11A, for example, four cores, is not intended to limit the present invention. At this time, the rows of the sprinklers are arranged in a radial arrangement, for example, intersecting each other. In this way, the spraying efficiency and uniformity of the volatile cleaning solution can be improved. 1 and 2, the exhaust device 112 is disposed in the housing 200937507 -----------.24 26064twf.doc/n

❹ 102的侧壁上,可對殼體1〇2内的腔室進行抽氣。如此一 來’可以避免揮發性清洗液揮發之後外溢到環境令而造成 污染’也可以加快晶圓200的乾燥速度。排氣裝置112例 如是真空泵。排氣裝置112的數量可為一個或多個。當排 氣裝置112的數量為多個時,排氣裝置112可配置於殼體 102的同一侧壁上或是配置於殼體1〇2的多個側壁上。在 本實施例中的兩個排氣裝置112是以配置於殼體1〇2的同 一侧壁上為例進行說明。 注水裝置114配置於罩體1〇8中,用以提供水至晶圓 200 ’可用以辅助清洗晶圓2〇〇的待清洗面2〇2。其中,所 使用的水例如是去離子水。 由上述第一實施例可知,晶圓清洗機台100具有條狀 喷灑器110 ’加上利用旋轉裝置104旋轉晶圓200,所以可 以提高將揮發性清洗液喷灑於晶圓200的待清洗面2〇2上 的均勻度及逮度,因此能夠提高清洗效率。 此外,在晶圓清洗機台1〇〇在對晶〇〇 =溶液本身具有揮發性,且利用旋轉晶圓二時抽 ㈣,式加快乾?速度,因此能避免在晶® 2⑻上留下殘 ,進而可提高半導體元件的品質及良率。 差二實施你丨 圖6所繪示為本發明第二實^ 圖1,Α·Α,剖面_剖面i 日日1U錢台沿著 請同時參照圖i、圖2及圖 用於料曰® 日日圓π冼機台100,適 用於對日日0 200的待清洗面搬及待清洗面綱進^ 200937507 24 26064twf.doc/n 洗。待清洗面202及待清洗面204彼此互為相反面,分別 為晶圓200的正面或背面。 晶圓清洗機台1⑻,包括殼體102、罩體108、條狀喷 灑器110、排氣裝置112、注水裝置114、旋轉裝置12〇及 f狀魏器122。在圖6中,與圖2中相同的構件則使用 相同的標號並省略其說明。 ΟOn the side wall of the crucible 102, the chamber in the casing 1〇2 can be evacuated. In this way, it is possible to prevent the volatile cleaning liquid from evaporating to the environment and causing contamination, which can also accelerate the drying speed of the wafer 200. The exhaust unit 112 is, for example, a vacuum pump. The number of exhaust devices 112 can be one or more. When the number of the exhausting devices 112 is plural, the exhausting devices 112 may be disposed on the same side wall of the housing 102 or on the plurality of side walls of the housing 1〇2. The two exhaust devices 112 in this embodiment are described by being disposed on the same side wall of the casing 1〇2 as an example. The water injection device 114 is disposed in the cover body 〇8 for providing water to the wafer 200' to assist in cleaning the wafer 2 to be cleaned surface 2〇2. Among them, the water used is, for example, deionized water. As can be seen from the above first embodiment, the wafer cleaning machine 100 has a strip sprinkler 110' and the wafer 200 is rotated by the rotating device 104, so that it is possible to improve the spraying of the volatile cleaning liquid on the wafer 200. The uniformity and the degree of catch on the face 2〇2 can improve the cleaning efficiency. In addition, in the wafer cleaning machine 1 〇〇 对 〇〇 = solution itself is volatile, and using the rotating wafer two times pumping (four), speed up the dry speed, thus avoiding leaving a residue on the crystal 2 (8) Further, the quality and yield of the semiconductor element can be improved. Figure 2 shows the second actual figure of Figure 2, Α·Α, section_profile i day 1U money station along with please refer to figure i, figure 2 and figure for material 曰® The Japanese yen π 冼 machine 100 is suitable for washing the surface to be cleaned and the surface to be cleaned on the day 0 0, 200937507 24 26064twf.doc/n. The surface to be cleaned 202 and the surface to be cleaned 204 are opposite to each other, and are respectively the front side or the back side of the wafer 200. The wafer cleaning machine 1 (8) includes a housing 102, a cover 108, a strip sprayer 110, an exhaust device 112, a water injection device 114, a rotating device 12A, and an f-shaped diverter 122. In Fig. 6, the same members as those in Fig. 2 are denoted by the same reference numerals and the description thereof will be omitted. Ο

Q =巾的晶®清洗機台刚,朗2巾的晶圓清洗機台 ⑻=樣是使用揮發性清洗液對晶圓細進行清洗,兩者 間的差異在於:圖6中的旋轉裝置12〇與圖 ^〇4的_不同;以及圖6中的晶圓清洗機台剛’二 包括配置於旋轉裝置12G —側的條狀_器⑽之外更 包括配置於旋轉裝置12G另—側的條狀噴灑器122。 並传120例如是多個滾動夾輪’用以夾住晶請 並使晶圓200進行旋轉。 的待ΪΐΓΐ1! 122是用以賴揮發性清洗液至晶圓200 洗面2G4 ’且所_的揮發性清 喷澳器122可為一個或多個。條狀嗜 ^狀條狀 =方式及功鎖舰賴器11G大致㈣故於此不再 置,是’注水裝置114例如是移動式注水褒 ί 供至晶圓細的待清洗面202及待清ί :主水裝置他實施财,晶^清洗機台贈可包括兩個 庄水裝置114,而能將水同時提供至 搬及待清洗面2〇4。 圓200的待》月洗面 12 200937507 t24 26064twfdoc/n 由上述第二實施例可知,晶圓清洗機台1〇〇,在旋轉裝 置120的兩側分別具有條狀嘴灑器11〇及條狀喷灑器 122,可同時對晶圓200的待清洗面2〇2及待清洗面2〇4 進行清洗,而能更全面性地對晶圓2〇〇進行清洗。 綜上所述,上述實施例至少具有下列優點: ❹Q = towel crystal cleaning machine, the wafer cleaning machine (8) of the Lang 2 towel = the sample is cleaned with a volatile cleaning solution, the difference between the two is: the rotating device 12 in Figure 6 〇 is different from the _ of FIG. 4; and the wafer cleaning machine in FIG. 6 includes the strip-shaped device (10) disposed on the side of the rotating device 12G, and further includes the other side disposed on the rotating device 12G. Strip sprinkler 122. The pass 120 is, for example, a plurality of rolling pinwheels </ RTI> for clamping the wafer and rotating the wafer 200. The standby 1! 122 is used to treat the volatile cleaning liquid to the surface of the wafer 200, and the volatile cleaning unit 122 may be one or more. Strip-like strip-like method and mode locker 11G is roughly (four), so it is no longer placed here. It is a 'water injection device 114, for example, a mobile water injection 褒 供 for the wafer to be cleaned surface 202 and to be cleaned ί : The main water device he implements the money, the crystal cleaning machine can include two water-making devices 114, and can supply water to the moving and to-be-cleaned surface 2〇4 at the same time. The round wash surface of the circle 200 200937507 t24 26064twfdoc/n According to the second embodiment, the wafer cleaning machine 1 has a strip nozzle 11 〇 and a strip spray on both sides of the rotating device 120 The sprinkler 122 can simultaneously clean the surface to be cleaned 2〇2 of the wafer 200 and the surface to be cleaned 2〇4, and can clean the wafer 2更 more comprehensively. In summary, the above embodiment has at least the following advantages:

1. 由於本發明的晶圓清洗機台能夠更均勻地且更快速 地將揮發性清洗液於晶圓的待清洗面上,因此可以避 免水痕的產生,大幅地提升清洗效率。 2. 本發明所提出的晶圓清洗機台能避免在晶圓上留下 殘留物,進而可提高半導體元件的品質及良率。 3. 在本發明所提出的晶圓清洗機台中,當旋轉裝置的 兩侧分別具有條狀噴灑器時,能更全面性地對晶圓^行产 洗。 /月 —雖然本發a犯啸佳實施例揭露如上,然其並非用以 限=本發明’任何熟習此技藝者,在不脫離本發明之精神 和範圍内,當可作些許之更動與潤飾,因此本發明 #巳圍當視後附之申請專利範圍所界定者為準。 ’、 【圖式簡單說明】 13 200937507 ___________ 24 26064twf.doc/n 圖5所繪示為本發明第一實施例之條狀喷灑器排列方 式的示意圖。 圖6所繪示為本發明第二實施例之晶圓清洗機台沿著 圖1中A-A’剖面線的剖面圖。 【主要元件符號說明】 100 :晶圓清洗機台 102 :殼體 0 104、120 :旋轉裝置 106 :固定機構 108 :罩體 110、122 :條狀喷灑器 112 :排氣裝置 114 :注水裝置 116 :點狀喷灑孔 118 :條狀喷灑孔 200 ·晶圓 ❹ 202、204:待清洗面 141. Since the wafer cleaning machine of the present invention can more uniformly and quickly transfer the volatile cleaning liquid to the surface to be cleaned of the wafer, the generation of water marks can be avoided, and the cleaning efficiency can be greatly improved. 2. The wafer cleaning machine proposed by the present invention can avoid leaving residues on the wafer, thereby improving the quality and yield of the semiconductor device. 3. In the wafer cleaning machine of the present invention, when the strips are respectively provided on both sides of the rotating device, the wafer can be more comprehensively washed. / month - although the present invention is disclosed above, it is not intended to limit the invention to any skilled person, and may make some changes and refinements without departing from the spirit and scope of the invention. Therefore, the invention is defined as defined in the scope of the patent application. </ br> <br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br><br> FIG. Fig. 6 is a cross-sectional view showing the wafer cleaning machine of the second embodiment of the present invention taken along line A-A' of Fig. 1. [Main component symbol description] 100: Wafer cleaning machine 102: Housing 0 104, 120: Rotating device 106: Fixing mechanism 108: Cover 110, 122: Strip sprinkler 112: Exhaust device 114: Water injection device 116: dot spray hole 118: strip spray hole 200 · wafer crucible 202, 204: surface to be cleaned 14

Claims (1)

200937507 24 26064twf.doc/n 申請專利範圍: 種晶圓清洗機台,適用於對一晶圓的—第一待清 圓清洗機台包括: 洗面進行清洗,該日-日 一殼體; —旋轉裝置,配置於該殼體内,用以承载該晶圓並垂 直於地面進行旋轉; 一罩體’配置於該殼體中並覆蓋該旋轉裝置; 至少一個第一條狀喷灑器,配置於該旋轉裝置的一 侧,用以噴灑一揮發性清洗液至該晶圓的該第—待清洗 面’且所噴灑的該揮發性清洗液呈條狀;以及 至少一個排氣裝置,配置於該殼體的側壁上。 2·如申請專利範圍第1項所述之晶圓清洗機台,i 該旋轉裝置包括一旋轉台。 八 3·如申請專利範圍第2項所述之晶圓清洗機台,更包 ~多個固定機構,配置於該旋轉裝置上,用以將該晶 定於該旋轉裝置上。 4. 如申請專利範圍第3項所述之晶圓清洗機台,盆 該些固定機構包括多個固定夾。 5. 如申請專利範圍第3項所述之晶圓清洗機台,1 該些固定機構包括—吸附裝置。 § 6丨.如申請專利範圍第1項所述之晶圓清洗機台,其中 個第—條狀賴器的倾方式包括對準該“ k向進行噴灑。 7.如申請專利範圍第1項所述之晶圓清洗機台,其中 15 24 26064twf.doc/n200937507 24 26064twf.doc/n Patent application scope: The wafer cleaning machine is suitable for a wafer. The first to be cleaned the cleaning machine includes: washing the surface for cleaning, the day-day is a shell; a device disposed in the housing for carrying the wafer and rotating perpendicular to the ground; a cover 'disposed in the housing and covering the rotating device; at least one first strip sprayer disposed at One side of the rotating device for spraying a volatile cleaning liquid to the first to-be-cleaned surface of the wafer and the sprayed volatile cleaning liquid is strip-shaped; and at least one exhausting device disposed at the On the side wall of the housing. 2. The wafer cleaning machine of claim 1, wherein the rotating device comprises a rotary table. 8. The wafer cleaning machine of claim 2, further comprising a plurality of fixing mechanisms disposed on the rotating device for crystallizing the rotating device. 4. The wafer cleaning machine of claim 3, wherein the fixing mechanism comprises a plurality of fixing clips. 5. The wafer cleaning machine of claim 3, wherein the fixing mechanism comprises an adsorption device. § 6丨. The wafer cleaning machine according to claim 1, wherein the tilting mode of the first strip-shaped device comprises aligning the “k-direction spraying. 7. If the patent application scope is the first item The wafer cleaning machine, wherein 15 24 26064twf.doc/n 200937507 田該至少一個第一條狀喷灑器的數量為多個時,該些第一 條狀喷m器的排列方式包括彼此相交而呈放射狀排列。 8. 如申請專利範圍第j項所述之晶圓清洗機台其十 至少—個第—條狀喷麗器包括至少-排點狀喷灌孔。 9. 如申請專利範圍第丨項所述之晶圓清洗機台,其令 〜至少-個第-條狀噴漏包括至少—條條狀喷灌孔。 10. 如申請專利範圍第i項所述之晶圓清洗機台其中 該旋轉裝置包括多個滾動夾輪。 n.如申請專利範圍第10項所述之晶圓清洗機台,更 匕括至少一個第二條狀噴灑器,配置於該旋轉裝置另一 2用以喷麗該揮發性清洗液至該晶圓的一第二待清洗 面,且所噴灑的該揮發性清洗液呈條狀。 中姑^如中請專職11第11項所述之晶®清洗機台,其 k第二待清洗面為該第一待清洗面的相反面。 13.如巾請專利翻第u項所述之晶圓清洗機台,其 M v 一個第二條狀喷灑器的喷灑方式包括對準該晶圓 的役向進行噴灑。 H·如申請專利範圍第u項所述之晶圓清洗機台,其 _ &amp;至夕個苐一條狀喷麗器的數量為多個時,該些第 ^、狀嘴壤器的排列方式包括彼此相交而呈放射狀排列。 中#15:如申請專利範圍第11項所述之晶圓清洗機台,其 “至^個第二條狀噴灑器包括至少一排點狀喷灑孔。 16:如申請專利範圍第u項所述之晶圓清洗機台其 &amp;至夕個第二條狀噴灑器包括至少一條條狀喷灑孔。 16 200937507 24 26064twf.doc/n 17.如申請專利範圍第丨項所述之晶圓清洗機台,其中 該揮發性清洗液為異丙醇或丙酮。 18·如申請專利範圍第1項所述之晶圓清洗機台,更包 括一注水裝置,配置於該罩體中,用以提供一水至該晶圓。 19.如申請專利範圍第1項所述之晶m清洗機台,其中 該水包括一去離子水。 μ 20.如申請專利範圍第i項所述之晶圓清洗機台,200937507 When the number of at least one first strip sprayer is plural, the first strip sprayers are arranged in such a manner that they intersect each other and are radially arranged. 8. The wafer cleaning machine of claim j, wherein the at least one strip-shaped sprayer comprises at least a row of dot-shaped sprinkling holes. 9. The wafer cleaning machine of claim 2, wherein the at least one strip-shaped blast comprises at least one strip-shaped sprinkling hole. 10. The wafer cleaning machine of claim i wherein the rotating device comprises a plurality of rolling pinch wheels. n. The wafer cleaning machine of claim 10, further comprising at least one second strip sprayer disposed on the other rotating device to spray the volatile cleaning liquid to the crystal A second cleaning surface to be cleaned, and the volatile cleaning liquid sprayed is strip-shaped. Zhonggu ^If you want to use the Crystal® cleaning machine mentioned in Item 11 of the full-time, the second cleaning surface of k is the opposite side of the first surface to be cleaned. 13. A wafer cleaning machine as described in claim 5, wherein the spraying of the second strip sprayer comprises spraying the alignment of the wafer. H. The wafer cleaning machine described in the scope of the patent application, in which the number of the _ &; 苐 苐 苐 喷 喷 , , , , , , Including the intersection of each other and radial arrangement. [#15] The wafer cleaning machine of claim 11, wherein the "second strip sprayer comprises at least one row of spotted spray holes." The wafer cleaning machine includes at least one strip spray nozzle. 16 200937507 24 26064twf.doc/n 17. The crystal according to the scope of the patent application a circular cleaning machine, wherein the volatile cleaning liquid is isopropyl alcohol or acetone. 18. The wafer cleaning machine according to claim 1, further comprising a water injection device disposed in the cover body. The crystal m cleaning machine according to claim 1, wherein the water comprises a deionized water. μ 20. The crystal according to the scope of claim i Round washing machine, 當該至少一個排氣装置的數量為多個時,該些排 ς 置於該殼體的同一側壁上。 义' 圓清洗機台,其中 ,該麟氣《置配 21·如申睛專利範圍第1項所述之晶 當該至少一個排氣裝置的數量為多個時 置於該殼體的多個側壁上。When the number of the at least one venting device is plural, the vents are placed on the same side wall of the casing.义' Round cleaning machine, wherein the lining of the lining of the lining of the lining of the ninth aspect of the invention, the number of the at least one venting device is a plurality of On the side wall. 1717
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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9539621B2 (en) 2009-12-11 2017-01-10 United Microelectronics Corp. Wafer cleaning device and method thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US9539621B2 (en) 2009-12-11 2017-01-10 United Microelectronics Corp. Wafer cleaning device and method thereof

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