200917125 九、發明說明： 【發明所屬之技術領域】 本發明係有關於—種基本輸入輸出系統的除錯方 法’尤指一種利用溫度的變化或通用輸入/輸出按紐的輸出 狀態，來進行基本輸入輪出系統（Bi〇s)除錯的除錯方法。 【先前技術】200917125 IX. INSTRUCTIONS: [Technical field to which the invention pertains] The present invention relates to a method for debugging a basic input/output system, particularly a state in which a change in temperature or a general-purpose input/output button is used to perform basic Input wheeling system (Bi〇s) debugging method. [Prior Art]
' 電腦裝置的基本輸入輸出系統（BASIC INPUT/0UTPUT SYSTEM，BIOS)會讀寫由QfOS製造出來的隨機存取記憶體 (RAM)。BIOS經由讀寫CMOS來得知目前電腦裝置的運作 組怨，或是將某些電腦組態的設定值紀錄到CMOS，並作適 當的開機環境設定。 一般說來，電腦裝置的基本輸入輸出系統（BI〇s)在 開機（boot)過程中，開機程式（boot program)每隔一 段程序會經由一輸入/輸出埠位址80H送出一特殊代碼 (code)’而此特殊代碼會被連接於輸入/輸出埠位址8〇h 的一除錯監測卡（port 80卡）所讀取，除錯監測卡會透 過發光二極體（LED)將特殊代碼顯示出來，以達到通電自 我測試（Power On Self Test ; POST)的功能。 前述的通電自我測試（Power On Self Test ; POST) 功能，僅僅提供使用者於電腦開機時進行初步簡易的除錯 判斷。然而’在基本輸入輪出系統（BIOS)的測試階段中， 常會發生許多的問題，此時，設計端需要針對基本輸入輪 出糸統（B10S)的開機程式進行相關的檢測及除錯，以解 決這些問題。 在基本輸入輸出系統（BIOS)的檢測及除錯階段中， 5 200917125 „需於開機程式中預先設定某 呈式燒錄於—_晶片中，然後双將開機 輸入/輪出埠檢測點的内容會透過 ^ _> 〇 H迗至除鍅監測卡，工程師即γ ^ ，顯示檢測點的内容，進行除錯的二了根據除 …、而，在前述的除錯方式中，當卩彳肖 輯，即在檢測點形成無窮迴圈，以檢測 _晶片上，接著，將勵s晶;:=: =燒錄於 内容，進行除錯的判斷。 根據下-個檢測點的 BIOS ^ ?, ^ ^ -L ^ 間，響檢:=在效:；^^^^ ^ +在基本輸入輸出系統（BI0S)的檢測及 &中，也可用-般外接的機器來達成美太二„ (_)的檢測及除錯，此機 ^ ^入輸出糸統 ⑽幻暫存器的值，以及執二；入系統 ==㈣住㈤g)的程序 ，孤喟彺下執仃。但疋，此除錯機 主機板的特殊線路與連接器支援。貝，而且需要有 出系統（_的檢測及除錯來講Hr般基本輸入輸 f發明内容】 不貫m。 6 200917125 有鑑於此，本發明提供基本輸入輸出系統的除铒 法’係可以用來解決BIOS晶片在檢測及除錯階段中， 多次的插/拔，所造成時間的耗費以及元件的損害等缺'、、'。 同時’使用本發明的除錯方法幾乎不需額外費:且^右 操作方便、迅速及廉價的效益。 >、有 本發明使用的基本輸入輸出系統係設置於一主 上’而除錯方法的步驟如下：f&，預設一除錯程序於一 開機程式中；接著’基本輸人輸出线執行該開機程式； 然後’依據該除錯程序，該基本輸人輸出系統判斷 值是否為該除錯程序之一預設值；前述判斷中，若是= 值為預設值’驗據該除錯程序，基本輸人輸出系統 一待測值，反之若不是，則跳出該除錯程序，基本輸入 出系統繼續執行該開機程式。 别 根據前述除錯方本發明提供有二個實施例， ^施判斷狀祕是否為除錯程序之·㈣步驟。在第— 貫施例中，本發明使用一通用輸出輸入介面（Gei^raiThe basic input/output system (BASIC INPUT/OUTPUT SYSTEM, BIOS) of the computer device reads and writes the random access memory (RAM) manufactured by QfOS. The BIOS reads and writes CMOS to know the current operation of the computer device, or records certain computer configuration settings to CMOS and makes appropriate boot environment settings. Generally speaking, during the boot process of the basic input/output system (BI〇s) of the computer device, the boot program sends a special code (code) via an input/output address 80H every other program. ) and this special code will be read by a debug monitor card (port 80 card) connected to the input/output port 8〇h. The debug card will pass the special code through the LED (LED). Displayed to achieve the Power On Self Test (POST) feature. The aforementioned Power On Self Test (POST) function only provides the user with a preliminary and simple debugging judgment when the computer is turned on. However, in the test phase of the basic input round-out system (BIOS), many problems often occur. At this time, the design side needs to perform related detection and debugging for the basic input wheel-out system (B10S) boot program. solve these problems. In the detection and debugging phase of the basic input/output system (BIOS), 5 200917125 „In the boot program, a certain format is required to be programmed in the -_chip, and then the dual input will be turned on/off. Through ^ _> 〇H迗 to the 鍅 鍅 monitoring card, the engineer is γ ^ , the content of the detection point is displayed, and the debugging is performed according to the division, in the above-mentioned debugging mode, when the 卩彳 辑That is, an infinite loop is formed at the detection point to detect the _ wafer, and then, the excitation s crystal;:=:= is burned to the content, and the debugging is performed. According to the BIOS of the next detection point ^, ^ ^ -L ^, check: = in effect:; ^^^^ ^ + In the detection and & of the basic input and output system (BI0S), you can also use the external device to achieve the beauty of the two „ (_ The detection and debugging of this machine ^ ^ into the output system (10) magic register value, and the implementation of the second; into the system == (four) live (five) g) of the program, squatting. However, the special circuit and connector support of this debugger motherboard is supported. In addition, in order to detect and debug, the basic input and output of Hr is inconsistent. 6 200917125 In view of this, the present invention provides a method for removing the basic input and output system. In order to solve the problem that the BIOS chip is inserted/extracted multiple times during the detection and debugging stages, the time and the damage of the components are insufficient, etc. At the same time, there is almost no additional cost for using the debugging method of the present invention: And ^ right operation is convenient, rapid and inexpensive. >, the basic input and output system used in the present invention is set on a main' and the steps of the debugging method are as follows: f&, preset a debugging program in one In the boot program; then the 'basic input output line executes the boot program; then 'according to the debug program, the basic input output system determines whether the value is one of the preset values of the debug program; in the foregoing judgment, if yes = The value is the default value 'acceptance of the debugging program, the basic input output system is a measured value, and if not, the debug program is jumped out, and the basic input system continues to execute the booting program. The present invention provides debug party has two embodiments, ^ administered is determined whether the secret-shaped step (iv) of the debugging process in the first - consistent embodiment, the present invention uses a general purpose input-output interface (Gei ^ rai
Purpose I/O ; GPI0)作為狀態值的輸出，此時’除錯程 的預設值為邏輯’’丨”或邏輯’，Q”。另外，在第二實施例 中’本發明使用—SUPERI/0晶片侧主機板的溫度值， 並將此溫度值作為狀態值，此時，除錯程序的預設值為— 溫度範圍值。 '本發明利用溫度的變化或通用輸入,/輸出按鈕的輪出 狀態:讓基本輪人輸出系統得以跳出執行中的除錯程序， 而龜續7L成開機程式。同時，於開機後，工程師可以重新 设疋開機程式巾的除錯程序’並直接利用麟工具將更新 後的開機程式燒入BI〇S晶片中。如此，使用本發明的除錯 7 200917125 方法來進行BI〇s晶片的檢測及除錯，即不需要繁複的插/ 拔動作’因而加快了檢測及除錯的時間，以及節省了元件 的使用率。 以上的概述與接下來的詳細說明皆為示範性質，是為 了進一步說明本發明的申請專利範圍。而有關本發明的其 他目的與優點，將在後續的說明與圖示加以闡述。 【實施方式】 々第一圖為適用本發明除錯方法的電腦架構示意圖。在 ^圖中，主機板10上設置有一 BIOS晶片11、一 SUPERI/0 晶片13、一處理單元12及一輸入/輸出埠14，前述各元件 f整合並且電性連接於主機板1Q上。另外，輸入/輸出埠 4進-步連接於一測試卡丨6，其中，輸入/輸出蜂腿 j輪人/輸出埠位址麵（未標示），係被用來作為一系 务死除錯埤·。 其士& ^ ’ #乡、阋弟，马本發明第一實施例之 統的除錯方法流程示意圖。在本發明第一 =技，需要於一開機程式中編輯-除錯程序 10)。接下來，基本輸人輸出系 =機程式⑽)。然後，基本輪入輪出系統 據Γ錯程序’基本輪入輪出系統從-通=Purpose I/O; GPI0) is the output of the status value. At this time, the default value of the 'error line' is logic ''丨' or logic ', Q'. Further, in the second embodiment, the present invention uses the temperature value of the SUPERI/0 wafer side motherboard, and uses this temperature value as the state value. At this time, the preset value of the debug program is - the temperature range value. The invention utilizes temperature change or universal input, and the output of the output button: the basic wheel output system can be jumped out of the debug program in execution, and the turtle continues to 7L into the boot program. At the same time, after booting up, the engineer can reset the debugger of the boot program towel and directly use the Lin tool to burn the updated boot program into the BI〇S chip. Thus, the debug 7 200917125 method of the present invention is used for the detection and debugging of the BI 〇s wafer, that is, the complicated insertion/removal action is not required, thereby speeding up the detection and debugging time, and saving the component usage rate. . The above summary and the following detailed description are exemplary in order to further illustrate the scope of the claims. Other objects and advantages of the invention will be set forth in the description and drawings. [Embodiment] The first figure is a schematic diagram of a computer architecture to which the debugging method of the present invention is applied. In the figure, the motherboard 10 is provided with a BIOS chip 11, a SUPERI/0 chip 13, a processing unit 12, and an input/output port 14, and the foregoing components f are integrated and electrically connected to the motherboard 1Q. In addition, the input/output 埠4 is connected in a step-by-step manner to a test card 丨6, wherein the input/output bee leg j-wheel person/output 埠 address surface (not shown) is used as a system for killing and debugging.埤·. Chevalier & ^ ’ #乡,阋弟, Ma Ben invention schematic diagram of the debugging method of the first embodiment. In the first technique of the present invention, it is necessary to edit-debug the program in a boot program 10). Next, the basic input output system = machine program (10)). Then, the basic round-in and turn-out system is based on the wrong procedure. The basic round-in and turn-out system is from - pass =
出輪入介面（General PurpQse y L 狀態值⑶4)。再，依據該除錯裎序1〇)取仔一 GPIO 匈斷⑽狀態值是否為該除錯程土林人輪出系統 判斷步驟S16為，，是，，時，依據該除^值⑽）。當 出系統送出一待測值（S18)。反之，a王序，基本輸入輪 否”時’基本輪蘭統跳步為驟 8 200917125 二以：〜執行開機程式’或者，跳出該除錯程序以* 成開機程式的執行（S17)。 斤以凡 復參考第二圖’在步驟（S18)後’待測值透過 、反上之輸入/輸出埠位址80H送入測試卡ι6，以淮〜 顯示（⑽，朗試卡16可為—七段顯㈣。同時=:丁 ’基本輪入輸出系統持續判斷該狀態值是否ί ㈣设值（S16)，並於該剛狀態值與預設值相同時= 入步驟（s⑻，反之，進入步驟（S17)。 W進 復參閱第二圖，從步驟S14到步驟S18係為除 執打=步驟。依據除錯料的執行，基本輸人輸出系= ^取得GPIQ狀態值，Gpi(}狀態值為邏輯” 1”或邏輯，于 〇”。依據除錯㈣的執行，基本輸人輸出系統會判斷前述 G0PI〇狀態值與除錯程序的預設值邏輯” Γ或邏輯，，0” 疋否相付合。當符合時，基本輪人輸出系統會依據除錯程 序的執行，進而輸出待測值，並且重複判斷GPI0狀態值與 除錯，序的預設值。若是GPI0狀態值不符合除錯裎序的預 α又值h基本幸别入輸出系統會跳出該除錯程序，而繼續執 行開機程式。 在前述步驟（S14)中，通用輸出輸入介面（General Purpose I/O ; GPI0)連接有一個通用輸入/輸出按鈕，使 用者可以操控該通用輪入/輸出按鈕的開（turn 〇n)或關 (turn off)來達成GPl〇狀態值的變化，並將此Gpi〇狀 態值的變化送至通用輸出輸入介面（General Purp〇se I/O ； GPI0)〇 配合第一圖，請參閱第三圖，為本發明第二實施例之 基本輸入輸出系統的除錯方法流程示意圖。在本發明第三 9 ZUUVI/IZ^ 實施例中，首 ⑽）。接下來機程式中編輯m呈序 _機程式（S22):=U^執行該具有除财序 程序，並依據該 i 入輪出系统執行該除錯 圆/。晶片本輪入輪出續^ 再，依據該除錯程序，.的—溫度狀態值（兑4)。 ,ίϊί該除錯程序的:預:溫;;溫度狀態值 Ί是”時，依據除錯程序，：本於當判斷步 =測值(叫反之，當判斷=入輪出系統送 基本輸入輪出系統 賢(S26)為”否，，時， 繼續執行開機 u雜^序，亚回到步驟（S22)以 式的執行（S27)X。或者跳出名除錯程序以完成開機程 復茶考第二 機板10上之’在步驟（S28)後’待測值透過該主 顯示，該測輸出埠位址隨送入測試卡16,以進行 後，基本輪人h為一七段顯示器。同時，在步驟⑽） 預設溫度統持續判斷該溫度狀態值是否落入該 圍時，再:欠ϋΛ4 ’並m度值再次落人預設溫度範 卢夂^入步驟（S28)，反之，則再次進入步驟（S27)〇 设芩閱第三圖，從步驟S24到步驟S28係為除錯裎庠 。依據除錯程序的執行，基本輸入輸出系統得 。I钱板1〇的溫度狀態值，該溫度狀態值為一類比數 彳。，于、錯科會判斷前述溫度狀態值是否落人除錯程序的 職溫度範_。當落人時，基本輸人輪出系統會依據除 錯魟序的執行，而輸出該待測值，並重複判斷主機板10 的m·度狀態值是否落入除錯程序的預設溫度範圍。若是主 機板10的溫度狀態值不再落入除錯程序的預設溫度範圍 10 200917125 =式基本輪人輪出系統跳出該除錯程序，而繼續執行開機 上竿中，溫度狀態值可以是主機板W 上^兀件的>皿度值，在此以主機板1〇上的cpu 用者可㈣主機板1G上CPU的散熱片取下或裝回， 溫度狀態值的改變。 達到 本發明利用溫度的變化或通用輪 狀態，基本輪入輸出系統得以跳出執出 =r二二γτ後，工二 更新後的«程錢直接湘魏工具將 續本發_除錯方法來進行基本輸人輪出率 的檢測及除錯’即不需要繁複的 ;= 而加=及除錯的時間，以及節省了元件的使用率 '，牙'上所述，本發明提供基本輪入 法’係可_來解決露晶片在檢測‘錯^ _方 多次的插/拔，所造成時間的耗費 ;:：缺因為 同時，賴發明的除錯方法 操作方便、迅速且廉價的效益。費用且有 按，以上所述，僅為本發明最佳 限於此，任何熟悉該項本:: =r思及之變化或修飾，皆可涵蓋在以下本 【圖式簡單說明】 第-圖為適用本發明除錯方法的電腦_示意圖； 200917125 第二圖為本發明第一實施例之基本輸入輸出系統的 除錯方法流程示意圖；及 第三圖為本發明第二實施例之基本輸入輸出系統的 除錯方法流程示意圖。 【主要元件符號說明】 主機板10 BIOS晶片11 處理單元12 SUPERI/0 晶片 13 輸入/輸出埠14 測試卡16 12The wheeling interface (General PurpQse y L status value (3) 4). Then, according to the debugging sequence 1〇), the GPIO Hungarian (10) state value is the debugged forester rounding system. The determining step S16 is, and is, according to the dividing value (10). When the system sends out a value to be measured (S18). On the other hand, a king order, the basic input round no "when the basic round of the Lancome jumps to step 8 200917125 two to: ~ execute the boot program 'or, jump out of the debugger to * into the execution of the boot program (S17). Referring to the second figure 'after step (S18)', the value to be measured is transmitted, and the input/output address is 80H, and the test card is sent to the test card ι6 to display ((10), the test card 16 can be - Seven segments (4). At the same time =: D' basic wheel input and output system continuously determines whether the state value is ί (4) set value (S16), and when the state value is the same as the preset value = enter step (s (8), otherwise, enter Step (S17). Referring to the second figure, from step S14 to step S18, in addition to the execution of the step = step. According to the execution of the debug material, the basic input output system = ^ obtains the GPIQ state value, Gpi (} state The value is logic "1" or logic, in 〇". According to the execution of debugging (four), the basic input output system will judge the logic value of the aforementioned G0PI〇 status value and the default value of the debug program" Γ or logic, 0" 疋No, if it is met, the basic wheel output system will be executed according to the debugging procedure. In turn, the value to be measured is output, and the GPI0 state value and the debugging default value are repeatedly determined. If the GPI0 state value does not meet the pre-allocation value of the debugging sequence, the value h is fortunate that the output system will jump out of the debugging program. And continue to execute the boot program. In the foregoing step (S14), the general-purpose output input interface (General Purpose I/O; GPI0) is connected with a universal input/output button, and the user can control the opening of the universal wheel input/output button. (turn 〇n) or turn off to achieve a change in the GPl state value, and send the change in the Gpi state value to the general-purpose output input interface (General Purp〇se I/O; GPI0) Please refer to the third figure, which is a schematic flowchart of the debugging method of the basic input/output system according to the second embodiment of the present invention. In the third 9 ZUUVI/IZ^ embodiment of the present invention, the first (10)). Edit m-sequence_machine program (S22): =U^ executes the program with the financial order, and executes the debug circle according to the i-in and out-out system. Wrong program, the value of the temperature state (for 4). , ί Ϊί The debugging program: pre-temperature;; temperature state value Ί is ", according to the debugging procedure,: in the judgment step = measured value (calling the opposite, when judging = entering the round-out system to send the basic input round out System Xian (S26) is "No, when, continue to execute the boot sequence, return to step (S22) to execute (S27) X. Or jump out of the name debug program to complete the boot process. On the board 10, after the step (S28), the value to be tested passes through the main display, and the measured output address is sent to the test card 16, and after the basic round person h is a seven-segment display. At the same time, in step (10)), the preset temperature system continuously determines whether the temperature state value falls into the circumference, and then: owes 4' and the m-degree value falls again to the preset temperature range (S28), and vice versa. Then, the process proceeds to step S27 again, and the third figure is referred to, and step S24 to step S28 are debugged. According to the execution of the debugging program, the basic input and output system is obtained. The temperature state value of the I board, which is an analogy. , Yu, and the wrong department will judge whether the aforementioned temperature state value falls into the operating temperature range of the debugging program. When falling, the basic input rounding system outputs the value to be tested according to the execution of the debugging sequence, and repeatedly determines whether the m·degree state value of the motherboard 10 falls within the preset temperature range of the debugging program. . If the temperature state value of the motherboard 10 no longer falls within the preset temperature range of the debug program 10 200917125 = the basic wheel human wheel out system jumps out of the debug program, and continues to execute the power on, the temperature state value can be the host The value of the value of the board on the board W can be removed or replaced by the CPU of the motherboard 1 (c) on the motherboard 1G, and the temperature state value is changed. After the change of the utilization temperature or the general wheel state of the present invention is reached, the basic wheel-in and output system can be jumped out and executed = r two γτ, and after the second update of the work, the direct payment of the Xiang Wei tool will be continued. The detection and debugging of the basic input rotation rate does not require complicated; = plus and = the time of debugging, and the use of the component is saved, 'the tooth', the basic round-in method is provided. 'System can be used to solve the time-consuming cost of detecting the 'wrong ^ _ square plug-in / pull-out;:: At the same time, relying on the invention's debugging method is convenient, rapid and inexpensive. The cost and the press, as mentioned above, are only the best limitation of the present invention. Any familiarity with the item:: =r think of changes or modifications, can be covered in the following [simplified description of the figure] Computer for explaining the debugging method of the present invention_schematic diagram; 200917125 The second diagram is a schematic flowchart of the debugging method of the basic input/output system according to the first embodiment of the present invention; and the third diagram is the basic input/output system of the second embodiment of the present invention. Schematic diagram of the process of debugging. [Main component symbol description] Motherboard 10 BIOS chip 11 Processing unit 12 SUPERI/0 Chip 13 Input/output 埠 14 Test card 16 12