TW200915752A - System for testing an embedded wireless transceiver - Google Patents

System for testing an embedded wireless transceiver Download PDF

Info

Publication number
TW200915752A
TW200915752A TW97131124A TW97131124A TW200915752A TW 200915752 A TW200915752 A TW 200915752A TW 97131124 A TW97131124 A TW 97131124A TW 97131124 A TW97131124 A TW 97131124A TW 200915752 A TW200915752 A TW 200915752A
Authority
TW
Taiwan
Prior art keywords
packets
packet
test
response
mode
Prior art date
Application number
TW97131124A
Other languages
Chinese (zh)
Other versions
TWI431955B (en
Inventor
Christian Volf Olgaard
Peter J Petersen
Original Assignee
Litepoint Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Priority claimed from US11/839,814 external-priority patent/US8131223B2/en
Priority claimed from US11/839,828 external-priority patent/US7865147B2/en
Application filed by Litepoint Corp filed Critical Litepoint Corp
Publication of TW200915752A publication Critical patent/TW200915752A/en
Application granted granted Critical
Publication of TWI431955B publication Critical patent/TWI431955B/en

Links

Classifications

    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/20Monitoring; Testing of receivers
    • H04B17/29Performance testing
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B17/00Monitoring; Testing
    • H04B17/10Monitoring; Testing of transmitters
    • H04B17/15Performance testing
    • H04B17/16Test equipment located at the transmitter

Landscapes

  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Mobile Radio Communication Systems (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Transceivers (AREA)

Abstract

A test equipment for testing a wireless communication device includes a wireless transceiver and a controller. The wireless transceiver transmits a first series of packets while operating in a first mode. The wireless transceiver transmits a second series of packets while operating in a second mode. The wireless transceiver receives acknowledgment packets. The controller controls the transceiver to transmit the first series of packets. The controller counts the acknowledgment packets received by the transceiver in response to transmitting each of the first series of packets. The controller controls the transceiver to transmit the second series of packets when the count exceeds a predetermined count.

Description

200915752 九、發明說明: t:發明所屬之技術領域】 相關共審查中之專利申請案 本申請案是2006年4月14日申請之美國專利申請案第 5 11/279,778號的一部分持續申請案。該申請案亦有關於同一 天申請,表號11602.00.0027號,由發明者Christian Olgaard 提出,名為“用於測試嵌入式無線收發器之系統”的共審查 中之專利申請案。 發明領域 10 本揭示内容係有關具有一主機處理器與嵌於其中之無 線收發器的無線通訊系統,而更特定於,該類系統之產品 測試。 t先前技術3 發明背景 15 隨著無線資料通訊系統之數量與使用的增加,對於該 類系統製造商而言,以一更有時效性的方法來執行内嵌於 I. _ 該類糸統之该專無線收發益的產品測試變得日漸重要。眾 所週知,該類嵌入式收發器之產品測試的問題是該受測裝 置(DUT)與該測試控制器(例如,個人電腦)之間通常無直 20 接,例如,有線、數位控制的連接可用。反而是,通訊必 須透過亦内嵌該系統中之該主機處理器來產生。因此,由 於必須安裝或儲存測試拿刃體來於該嵌入式主機處理器中運 作,所以產品測試變得更加複雜。 針對一單一平台而言’於一嵌入式主機處理器中使用 200915752 韌體是可被接受的,但是含有以及必須支援多個平台時, 此方法馬上變得無法令人滿意。此外,一般情況是,該無 線收發器功能,例如,根據IEEE 802.11標準來操作之一無 線資料收發器,僅為該主機系統之整體功能組合的一小部 5 分。於是,致力於產生一完整功能性的無線收發器能力之 情況下,鑑於該系統之整體操作中其有限的角色,製造商 仍不熱衷花費重要的資源在整合該無線功能上。因此,所 期待的是針對該類系統提供一更簡單與更有效率的產品測 試方法,而執行各種不同系統之產品測試的情況下僅需最 10 少的改變。 C 明内 3 發明概要 於一實施例中,用於測試一無線通訊裝置之測試儀器 包括—無線收發器與一控制器。該無線收發器於一第一模 15式中操作時發射一第一序列封包。該無線收發器於一第二 模式中操作時發射一第二序列封包。該無線收發器接收應 答封包。該控制器用以響應發射該第一序列封包之每一封 包而計算該收發器接收之該等應答封包。該計數超過一預 定計數時,該控制器控制該收發器發射該第二序列封包。 20其中本案亦揭示一相關方法。 於—範例中,該收發器於該第一模式中操作時以一第 一功率準位,而於該第二模式中操作時以該第二功率準位 發射。於一範例中,該收發器於該第一模式時使用一第一 調變技術,而於該第二模式時使用一第二調變技術發射。 200915752 衣一範例中,該收發 率’而於該第二模式時以—第二f料速率發射。 於—範例中,該收發器用以響應發射該第一序列封包 而未接收該等應答封包的至少其中之—時發射—預定數量 封包,該控制器會增加該第一功率準位。 10 t於—_中’ _試儀㈣括記龍來儲存資訊。該 产括。亥第模式、该第二模式、發射之封包總數量、 曰于匕類里之應答封包的總數量、與/或接收之應答封包總數 量於-範例中’已發射—預定數量之封包並接收一最後 f答封包之後,該控制器將該f訊轉移至—分析系統。於 I巳例中,該分析系統根據該資訊來判定一靈敏度值與/或 一封包錯誤率。 '範例中,位於一測試環境中之一無線通訊系統包 括該測試儀器與一受測裝置PUT)。該DUT接收該第-序列 封包並於接收該第一序列封包之每一封包後發射該等應答 封包。 圖式簡單說明 第1圖是一位於一產品測試環境中之一無線資料通訊 系統的功能方塊圖。 〇 第2圖描繪一根據本發明目前要求之一實施例,用於測 試第1圖之該無線資料通訊系統的方法。 第3圖描繪一根據本發明目前要求之另一實施例,用於 測試第1圖之該無線資料通訊系統的方法。 第4圖描繪一根據本發明目前要求之一實施例,用於執 7 200915752 行第1圖之„亥無線資料通訊系統的信號傳輸測試之測試序 列。 第5圖描續·一根據本發明目前要求之另一實施例,用於 執行第1圖之5亥無線資料通訊系統的信號接收測試之測試 5 序列。 第6圖描繪一根據本發明目前要求之另一實施例用於 執仃第1圖之該無線資料通訊系統的信號接收測試之測試 序列。 第7圖是一根據本揭示内容之測試儀器的示範功能方 1〇 塊圖。 第8圖是—執行一接收信號強度指示(RSSI)校準測試之 該測試儀器的示範時序圖。 第9圖是一描繪該測試儀器執行該R S SI校準測試時可 採用之示範步驟的流程圖。 15 帛_是—描_無線通訊裝置可採用之示範步驟的 流程圖。 第11圖是-描綠該測試儀器執行一靈敏度測試時可採 用之示範步驟的流程圖。 第12圖是-描繪該測試儀器執行該靈敏度測試時可採 20用之替代示範步驟的流程圖。 第13圖是-該測試儀器使用改變發射功率與調變類型 來執行一靈敏度測試之示範時序圖。 第14圖是-描繪該測試儀器使用改變發射功率與調變 類型來執行-靈敏度測試時可採用之示範步驟的流程圖。 200915752 第15圖是一描繪該測試儀器使用改變發射功率與調變 類型來執行一靈敏度測試時可採用之替代示範步驟的流程 圖。 L實施方式3 5 較佳實施例之詳細說明 以下該等實施例之說明本質上僅用於示範而不意欲對 本發明、其應用、或用途加以限制。為了清楚解說,該等 圖式中之相同參考數字用於識別相同元件。該等實施例將 詳細說明足以使業界之熟於此技者可對本揭示内容加以實 10 作,而應了解在不違背本發明之精神或範疇下,其他實施 例亦可以某些變化型態來加以實作。 如本文所使用,該術語模組、電路與/或裝置參照為一 特定應用積體電路(ASIC)、一電子電路、執行一或更多軟 體或韌體程式之一處理器(共享、專屬、或群組)與記憶體、 15 一組合邏輯電路、與/或提供上述功能性之其他適當的構 件。雖然該上下文中並無明確的反面表示,但應了解上述 之個別電路元件數量上可為單一或多個。例如,該等術語 “電路”與“電路組”可包括一單一構件或多個構件,其可為 主動與/或被動構件並可連接一起或以其他方式耦合一起 20 (例如,作為一或更多的積體電路晶片)以提供上述功能性。 此外,該術語“信號”可參照為一或更多的電流、一或更多 的電壓、或者一資料信號。該片語A、B、與C至少其中之 一應視為使用一非互斥邏輯“或”來表示一邏輯性(A或B或 C)。再者,本揭示内容已於使用分離的電子電路組(較佳以 200915752 一或更多積體電路晶片的型式)之實施態樣的上下文中加 以§兒明’該類電路組之任何部分的功能可根據待處理之該 信號頻率或資料速率,使用一或更多適當規劃之處理器來 替代地加以執行。 5 參照第1圖,於一般產品測試環境中之一無線資料通訊 系統包括一受測裝置(DUT)IOO、用於控制該測試之一電腦 150、以及測試儀器160(例如,包括一向量信號產生器(VSG) 與一向量信號分析器(VSA)),所有元件之實體互連如圖所 示。該DUT 1〇〇具有若干嵌入式子系統,包括一主機處理 10器110、記憶體120(例如,非依電性記憶體)、一無線收發器 130以及一或更多的週邊裝置14〇,所有元件之實體互連如 圖所示。該主機處理器11〇經由各種不同控制介面121、 111、113來控制該記憶體12〇、無線收發器130以及週邊裝 置140。典型情況是,該記憶體120儲存該DUT 100使用之 15 程式以作為韌體。該控制電腦150大體而言透過一外部介面 151 ’例如,通用串列匯流排(UsB)、串列週邊介面(SPI)、 RS-232串列介面、等等來執行控制該DUT 100之產品測試 軟體’該控制電腦150亦經由另一介面161,例如,USB、 通用介面匯流排(GPIB)、乙太網路、等等來控制該測試儀 20器160。該測試儀器160經由一介面101與該無線收發器130 通訊,該介面可為一無線介面,但針對產品測試目的而言 通常為一有線介面。 於一典型發射器測試方案中,該控制電腦150將一或更 多命令傳送至該主機處理器110,其將該類命令轉譯為該無 10 200915752 線收發器130對應之命令。接著經由該測試介面1〇1之該測 試信號的傳輸’該控制電腦15〇(經由其介面161)從該測★式儀 器16 0擷取該等測量結果,接著於其規劃之輸出頻率與功率 時可解決該無線收發器130之一適當延遲。 5 如該範例中所呈現’該無線收發器13 0所需之今·等今人 必須通過該主機處理器110並由其轉譯。該主機處理器11〇 可為許多不同的類型,並可操作許多不同的作業系統,$ 常於該主機處理器110中提供該所需之軟體來適當轉譯該 等命令是相當困難的。一般而言,該類軟體必須針對每一 10 個應用程式來特別寫入,因而針對一系統整合器而言將該 無線收發器130整合於該DUT 100中是一相當困難的程序。 如下文中更詳細說明,根據本揭示内容之一提議的測 試方法使用一預定測試流程、或序列來提供簡化的產品測 试’以確5忍§亥嵌入式無線收發器之效能。若藉由以該測試 15 流程來預先規劃該無線收發器’則測試期間需要該無線收 發器與該主機處理器110間之最小通訊。該測試流程可上載 至該收發器130以作為該測試韌體之載入的一部分,或可替 代地,例如,以該測試定義之一預定資料區,而於該韌體 之一整合部分中完成。完成該韌體載入至該收發器130後, 20 該裝置可位於等待來自該測試儀器160之命令的一測試模 式中。此可經由作為該載入韌體之一部分、或作為該主機 處理器110所發出之一分開命令來達成。結果是,與該主機 處理器110之唯一相互作用包含該韌體之载入、該測試流程 之載入(除非其為該韌體之一整合部分)、以及可能包含將該 200915752 無線收發器130置於一產品操作測試模式中的一命令。 參照第2圖’該方法之一範例可如圖所示來描繪。該第 一步驟202中’該測試韌體大體而言由該控制電腦150轉移 至該主機處理器110。下一步驟204中,該測試韌體從該主 5 機處理器110經由該介面111轉移至該無線收發器130。應了 解因為該測試韌體亦包括該所欲的測試流程、或序列來作 為一整體部分,所以可完成該測試韌體。或者,該測試流 程資料可從該電腦150轉移至該主機處理器110,而之後傳 達至該無線收發器130。作為另一替代方案,該所欲的測試 1〇 流程資料可以是先前儲存於該記憶體120中之一資料表型 式,其可經由該介面121來擷取,並由該主機處理器110轉 移至該無線收發器130。 下一步驟206中,該無線收發器130設定於一測試操作 模式,亦即,該無線收發器130現將等待來自該測試儀器160 15 之一或更多的命令(下文中更詳細說明),例如’藉由於一預 定頻率來聽取來自該測試儀器160之一命令。該類無線收發 器130於一測試操作模式之設定可自動啟動來作為可載入 之該測試勒體的一部分,或可由該主機處理器11 〇發出之一 適當的命令來啟動。下一步驟208中,該測試儀器160之測 20 試操作可例如,藉由傳送如上述之該無線收發器130聽取的 適當命令來啟動。或者,該無線收發器130可以一預定頻率 來發射一“就緒”信號,接著該測試儀器160接收後開始傳送 —或更多的測試命令。較佳情況是,該命令組合是最小化, 例如,僅為一NEXT類型的命令’因而僅需該接收器等待一 12 200915752 良好的資料封包(例如’表示—NEXT命令),而因此更不需 任何的媒體接取控制(MAC)層的操作。接著從該測試儀器 160傳送該初始測試命令’該無線收發器130較佳發射一應 答信號以指出已接收該類命令,之後將開始來自該測試儀 5 器160之主要測試命令序列。該測試儀器160之控制會由該 控制電腦150經由該介面161監督下完成。 一隨後步驟210可包括載入該無線收發器130之該測試 韌體的更新,因此可根據從該控制電腦150經由該主機處理 器110接收的資料(例如,收發器校準資料),或從經由該主 10 機處理器110運送至該無線收發器130而儲存於記憶體120 之一資料表接收的資料,來修改各種不同的操作設定、參 數或條件。 參照第3圖,根據本發明目前要求之另一實施例的一測 試方法具有啟動系統測試操作之一第一步驟302。此造成該 15主機處理器110準備下一步驟304,其為該測試韌體從該記 憶體120經由該主機處理器110轉移至該無線收發器130。如 上所述’該測試韌體可包括該測試流程,或亦可由兩種構 件所組成’亦即,該等測試命令與測試序列資料。下一步 驟306中’該無線收發器130設定於其測試操作模式。如上 2〇所述’此可作為該測試韌體之載入的一部分來自動完成, 或可由該主機處理器110經由該介面111傳送之一適當命令 來啟動’而該類命令可由該主機處理器11〇啟動,或由該主 機處理器110用以響應其從該電腦15〇接收而運送。 下一步驟308中,啟動實際的測試。如上所述,此可為 13 200915752 該無線收發器130於該介面101啟動與該測試儀器160之通 訊,或該測試儀器160於該電腦150之控制下,經由該介面 101啟動與該無線收發器130之通訊。 之後步驟可包括如上所述,該測試韌體更新來修改各 5 種不同的測試設定、參數或條件之一步驟310。 如上所述,根據本揭示内容之一測試方法包括將該 DUT 100連同該外部測試儀器160置於一測試操作模式的 步驟。接著,有兩種一般的測試種類:該無線收發器130之 該信號發射功能的測試;與該無線收發器13 0之該信號接收 10 功能的測試。 參照第4圖,一發射測試序列之一範例可說明如下。測 試可從該DUT 100之該接收器(rx)部分等待一命令420開 始。該測試儀器160發出其命令41〇(例如,一GOTO-NEXT 命令)。接著該命令被接收後,該DUT 100之該發射器(TX) 15發出一應答信號440以指出其接收並了解該命令。接著,該 DUT 100開始發射該測試流程判定之資料信號。此由信號 傳輸時槽460、461、··.463來表示。該測試流程將判定發射 之封包數量,而該類發射封包包含該相同信號、或一多封 包傳輸時的多個信號。 20 接收該應答信號440後,該測試儀器160將等待一特定 的時間間隔430使該發射器來安排其所欲之操作(例如,頻 率準確性與功率準位)。接著該時間間隔43〇中,該測試儀 器160執行測量450、45卜接著該等測量45〇、451完成,該 測試儀器160或者該控制器電腦15〇存取該測試儀器16〇收 14 200915752 ;斗後便分析遠收集之資料並準備設定該下一測試 序列470。同樣地,其信號傳輸463完成後,該DUT 1〇〇藉 由處理任何所需之操作480來準備該測試序列的下一部分。 10 3亥測試儀器160或電腦150已完成該資料之處理47〇 後’會發出下—測試命令(例如,g〇to_next)。若該下一 測試之準備程序480尚未完成 ,則該類命令之第一個411可 不被该DUT 1〇〇接收。若是如此,則該測試儀器16〇不會接 收到任何應答信號。因此,該測試儀器160持續傳送其命令 412 ’接著於某些時間點,該等命令其中之一412被該DUT 100接收421,而一應答信號445將由該DUT 100發射。該DUT 1〇〇發射已知數量465、466...468的一全新測試信號時此為 ~全新測試序列之開始,而該測試儀器160將執行該所欲之 測量455、456,接著進一步分析並準備隨後的測試471。 應了解雖然於一產品測試環境中是相當獨特,但該測 15 試儀器160可能無法從該DUT 100接收良好的資料。此通常 表示該DUT 100不良,而捨棄該DUT 100之前期待繼續進行 該失敗的測試。該類情況中,存有兩種可能的動作過程。 根據其中之一過程,該測試儀器160可傳送一不同的命令 (例如,一 REPEAT命令而非一 GOTO-NEXT命令)。此僅為 20 —簡單的實施態樣,而該DUT 100可輕易識別該不同的命 令。然而,該測試儀器160需載入一新的命令或新資料來產 生一新的信號時會使測試變慢。或者’該測試儀器160可不 傳送另一命令,接著該DUT 100可將其解譯為表示該測量 不成功,而該DUT 100將繼續進行該初始的測試。 15 200915752 如上所述,該DUT 100傳送之該等發射信號46卜463 可為一單〆發射信號,或可為一組多封包信號。使用該類 多封包信號具有一優點是校準期間,該測試儀器160與該 DUT 100之間僅需少數通訊或不需通訊,因為藉由疊代法 5通常可達到一解決方案,如2005年8月12日申請之美國專利 申請案第11/161,692號,名為‘用於測量一信號產生器發射 之一信號的多個參數之方法’’中所說明,其揭示内容將完整 合併於本文中以供參考。 參照第5圖,用於接收ί虎之s玄期待的測試流程可說明 10如下。該測試流程不同於該信號傳輸測試流程,因為意欲 執行該測試時使該DUT 1〇〇完全不需分析(若有的話)實際 從該測試儀器160接收之資料,而是僅判定是否已接收一正 確的封包。於是,當從一接收測試變為另一測試時,該測 試儀器160不需發出一測試命令(例如,一 g〇t〇_next命 15令)。而是,較佳情況是使該DUT 1〇〇判定何時移至下一測 試。該DUT已接收一預定數量之良好信號封包時,此可僅 藉由使該DUT 100持續該下一測試來完成。 若該DUT 100已接收一良好封包而發射一應答信號,則 該測試儀器160可僅計算良好封包之數量而不需從該DUT 20 ι〇0要求該類計算,因此不需額外通訊而僅需判定該測試之 結果,因為該測試儀器160知道傳送多少封包並可僅藉由計 算從該DUT 1〇〇接收之應答信號的數量來判定接收多少封 包。該測試儀器160包括如該VSA與VSG之測試儀器時此技 術相當正確’因為其不可能有遺漏的應答信號,而該Dut 16 200915752 100之該發射器功率通常大於該VSG之該發射器功率。因 此’該VSA不可能遺漏一應答信號封包,特別是若該VSA 由該VSG發射之該信號封包的後端邊緣觸發時。此外,使 §亥VSA接收该應答封包可提供額外的優點是使該dut 1 〇〇 5 之該發射/接收開關的切換時間亦被測試。 再次參照第5圖,該測試儀器160發射該測試命令51〇。 假設該先前測試是一發射測試,則該測試命令51〇指示該 DUT 100啟動下一測試,其為一接收測試。該DUT 1〇〇接收 該命令520 ’其造成該測試動體將該接收測試58〇賦能。該 10 DUT 100之該接收器部段就緒時,一應答信號被發射54〇, 其表示該接收器之讀數。相較於封包由該測試儀器16〇傳送 直到該接收器開始接收該類封包之習知測試方法,此變得 相當重要。藉由使該DUT 100指出其讀數,該測試儀器j6〇 僅需將其VSA賦能來等待從該DUT 100接收該應答信號,接 15 著之後該測試儀器160準備接收測試530。 該測試儀器160(例如,該VSA)接收該應答信號54〇時, δ亥測s式儀态160知道該DUT 100已就緒並開始信號傳輸。因 此,該測試儀器160(例如,該VSA)開始發射一預定數量之 信號封包561、562、563、564、568、569 ,其中每一封包 20產生一對應的應答信號571、572、573、574、578、579。 該測試儀器160接收該等應答封包並針對該等接收之每一 封包而增加其内部計算。此外,如上所述,該DUT 1〇〇之 該發射/接收切換操作可藉由分析一發射測試信號563與接 收一應答彳§號573間的一間隔560來加以分析(此方法中使 17 200915752 用一應答信號是有利的,因為該類信號已包括於所有標準 或預設的收發器信號組合中,因此可避免需新增其他不必 要的信號或功能)。 此範例中,無封包錯誤產生,所以該DUT 100已接收該 5 預定數量之封包並移至下一接收測試581。同樣地,該測試 儀器160根據該接收之應答信號的數量而知道該DUT 100 已接收所有封包,並亦可準備該下一接收測試531。該DUT 100已備妥時,會發射一應答信號541以指出該類讀數,而 接著接收該應答信號551後,該測試儀器160開始發射封包 10 供下一測試561使用。該DUT 100於一預定的時間間隔中尚 未接收到封包的情況中,其可重新發射其應答信號541,例 如,針對下一測試中該DUT 100變為就緒比該測試儀器160 快的情況。 參照第6圖,若遭遇一封包錯誤,則該DUT 100無法接 15 收所有預定的良好封包數量。如圖所示,該測試流程從該 先前測試為一發射測試開始。該測試儀器160之VSG傳送該 測試命令610以指出該全新操作開始或該先前操作結束。該 DUT 100接收該命令620並針對接收測試680而準備自我賦 能。當其就緒時,該DUT 100傳送其準備接收之應答信號 20 640。此應答信號650由該測試儀器160接收,接著該測試儀 器160就緒時’例如,完成其内部設定630時,其開始發射 該預疋數置之封包661、662、663、664、668、669。該DUT 100用以響應此情況而針對該等接收之每一良好封包發射 一應答信號671、673、674、678、679。 18 200915752 5 10 15 20 如圖所示’該等封包其中之一 662不被該DUT 100接 收。於是,該DUT 100不發射對應的應答封包,圖形中由 一空的接收封包690來繪示。接著該發射序列完成後,該測 試儀器160知道其接收多少應答封包,而因為很明顯地遺漏 一封包690,所以該測試儀器160知道該DUT 1〇〇之接收器 繼續該測試流程之下一測試之前,仍繼續再等待至少一個 封包。於是’該測試儀器160將計算需由該DUT 1〇〇接收之 額外封包的數量635,並開始發射所需之封包數量69 ^。 接著接收該遺漏封包後,該DUT 1〇〇發射一應答信號 692,並開始準備該下一測試操作681。其就緒後,該 1〇〇將另一應答信號傳送至該測試儀器16〇。此範例中該 DUT 1 〇〇就緒時該測試儀器160尚未就緒。因此,該DUT丨〇〇 傳送其應答信號64卜㈣為該測試儀器⑽尚未就緒並且 不回應’於是一預定的時間間隔後’該DUT 100將傳送另 應答信號642。該測試儀器160現已就緒並接著該應答信 號651接收後,開始發射更多的資料封包的卜該贿刚 藉由傳送對應的應答封包⑺來回應該等資料封包。 丄如上所述,用於測試目的而發射之該等信號可為多封 包㈣’其中期待該咖刚僅對特定類型之資料封包回 ^例如’在*要求該發射器傳送更多封包來使得該接收 為符口進仃至下-測試所需之封包數量的情況下,以不同 。準位來發射不同的資料封包可執行實際接收器之靈敏 度測試(其巾並残待接㈣定封包)。 現參照第7圖,其綠示該測試儀器16〇之—示範功能方 19 200915752 塊圖。該測試儀器160包括一控制器702、記憶體704(例如, 非依電性記憶體)、一VSG 706、一VSA 708、與一無線收發 器710。該控制器702操作上耦合至該VSG 706、該VSA 708、記憶體704、該收發器710、以及該電腦15〇。該VSG 706 5與VSA 708操作上耦合至該收發器71〇。更特別是,該VSG 706操作上耦合至該收發器710之一發射器714,而該VSA 708操作上耦合至該收發器710之一接收器716。該控制器 702包括控制該DUT 100之測試的一測試模組218。例如, 該測试模組218可執行一接收信號強度指示器(RSSI)校準 10測試,而之後執行該無線收發器130之一靈敏度測試。 該RSSI校準測試期間,該測試儀器16〇以一第一功率準 位將一或更多封包發射至該DUT 1〇〇。用以響應該等一或 更多封包,該DUT 100將一功率準位指示器發射至該測試 儀器160,而該控制器702將其儲存於記憶體7〇4中。某些實 15施例中,該功率準位指示器指出該等一或更多封包之該 RSSI大於一預定臨界值或小於該預定臨界值。其他實施例 中,》亥功率準位指示器代表該等一或更多封包之該幻。 該測試儀器160以一第二功率準位發射一或更多封 包。某些實施例中,該控制器7 〇 2週期性增加或減少該收發 20器710之-發射功率,直到一預定的測試序列已完成。例 如’該控制器702週期性減少該發射功率時,該第二功率準 位小於該第一功率準位。然而,該控制器7 〇 2週期性增加該 發射功率時,該第二功率準位大於該第一功率準位。曰糾 實施例中’該第二功率準位是根據該功率準位指示器。例 20 200915752 如,若該功率準位指示器指出該第—功率準位大於該預定 臨界值,則該第二功率準位小於該第—功率準位。然而, 若該功率準位指示器指出該第-功率準位小於該預=臨界 值’則該第二功率準位大於該第一功率準位。此方法中, 5該測試儀器16〇搜尋該DUT 100所需來接收該等—或更多 封包之一校準功率準位。 某些實施例中,該測試儀器160根據用來校準該無線收 發器130之該第-功率準位、該第二功率準位、與/或該功 率準位指示器來判定-RSSI校準偏置。其他實施例中,該 10測試儀器160將該第一功率準位、該第二功率準位、與/或 該功率準位指示器儲存於記憶體704中,之後將其轉移至諸 如該電腦150之一分析系統中以供之後分析。 該測試儀器16 0不發射-或更多封包來執行該r s s!校 準測試,而是替代地以該第一功率準位來將一第_預定的 15封包序列(例如,一第一預定的序列)發射至該DUT 1〇〇。該 DUT 100用以響應該第一封包序列的每一封包,而將一應 答封包發射至該測試儀器160。發射一預定數量之應答封包 後,該DUT 100傳送該功率準位指示器。從該DUT 1〇〇接收 該功率準位指示器後,該測試儀器16〇以該第二功率準位來 20發射一第二預定的封包序列(例如,一第二預定的序列)。此 方法中,該測試儀器160根據該預定的封包序列(例如,預 定的序列)來搜尋該DUT 100所需之該校準功率準位。 如上所述,某些實施例中,該功率準位指示器表示該 等封包之該RSSI。該等實施例中,該測試儀器16〇可以一預 21 200915752 定功率準位來將一單一預定的封包序列(例如’一預定的序 列)發射至該DUT 1〇〇。該DUT 100用以響應該預定封包序 列的每一封包,而將—應答封包發射至該測試儀器16〇。發 射一預定數量之應答封包後,該DUT 100傳送表示該預定 5封包序列的至少其中之一的RSSI之功率準位指示器。例 如’該RSSI可於該功率準位指示器中編碼。或者,該功率 準位指示器可包括指出該RSSI之多個功率準位封包(未顯 示)。例如’若該功率準位指示器包括44個功率準位封包, 則該評估的信號強度可為_6〇dBm。雖然此範例中使用44 1〇個功率準位封包來表示一評估的信號強度-60dBm ,但業界 熟於此技者將體認任何數量之功率準位封包皆可用來表示 該評估的信號強度。 因為該測試儀器160期望接收指出該!^51之一預定數 量的全部封包(例如,全部60個封包),所以該功率準位指示 15器亦可包括未指出該RSSI之額外的填料封包(未顯示)(例 如,16個封包)’使得該相同數量之封包包括於每一功率準 位指示器中。一旦該測試儀器160已接收所有的預定數量之 全部封包(例如,44個功率準位封包與16個填料封包),該剛 試儀器160便可完成該RSSI測試並進行至該靈敏度測試。 〇 該靈敏度測试期間’其通常於該RSSI校準測試之後執 行,該控制器702設定該發射器714於至少_第一與第_才莫 式中操作。例如,某些實施例中,該發射器714於該第一模 式中操作時以一第一功率準位發射,而於該第二模式中操 作時以一第二功率準位發射。其他實施例中,該發射器714 22 200915752 於該第-模式中操作時使用-第―調變技術發射,而於該 第二模式中操作時使用-第二調變技術發射。另外的盆他 實施例中,該發射器m於該第—模式中操作時以一第_資 料速率發射,而於該第二模式中操作時以_第二資料速率 5 發射。 該收發器7U)於該第-模式中操作時,該控制器7〇2控 制該收發器710將由-時間間隔分離之一封包序列發射至 該DUT 100。該DUT 100用以響應接收該封包序列之每一封 包而將-應答封包發射至刻m—16卜該控制器7〇2用 H)以響應發射該封包序列之每-封包而計算該收發器川接 收之應答封包。 當該等應答封包之數量超過_預定計數時,該控制器 7〇2設定該收發器™於該第二模式中操作,而隨後控制該 收發器710來發射-第二封包序列。某些實施例中該測試 15儀器160根據發射多少封包以及從該DUT 1〇〇接收多少應 答封包來判定-封包錯誤率(PER)。其他實_巾,發射封 包與應答封包之數㈣存於記憶體7G4巾,其隨後轉移至諸 如該電腦150之分析系統中以供之後分析。 該控制器702可週期性減少該收發器71〇之一功率傳輸 20準位,直到該DUT 100用以響應發射該封包序列而停止發 射應答封包。或者’該控制器702可週期性增加該收發器71〇 之功率準位,直到該DUT 1〇〇用以響應該封包序列而開始 發射應答封包。 某些實施例中,該測試儀器160根據該等接收之應答封 23 200915752 包以及該等封包發射之該功率準位來判定該無線收發器 130之一靈敏度。其他實施例中,該測試儀器16〇將該測試 結果儲存於記憶體704中,隨後轉移至該電腦150以供之後 分析。 5 現參照第8圖,執行該RSSI校準測試之該測試儀器160 的一示範時序圖一般描繪於8〇〇。該範例中,該RSSI校準測 試包括一般以802、804、806、與808來識別之四個預定的 序列。雖然該範例繪示四個預定的序列,但業界熟於此技 者將體認可使用更多或更少的序列。該第一序列8〇2期間, 10該測試儀器160於時間間隔816期間將一第一封包序列 810、812、與814發射至該DUT 100。每一封包810、812、 與814由一時間間隔分開。更特別是,封包81〇與812由時間 間隔818分開,而封包812與814由時間間隔820分開。該DUT 1〇〇用以響應接收該第一封包序列810、812、與814之每一 15 封包而個別發射應答封包822、824、與826。 該DUT 100發射一預定數量之應答封包(此範例中為三) 後’該DUT 100評估該第一封包序列81〇、812、與814之一 信號強度。該信號強度可根據該第一封包序列81〇、812、 與814的其中之一或更多封包。例如,該信號強度可根據該 20第一封包序列81〇、812、814之一高能量值、一低能量值、 與/或一平均能量值。 評估該信號強度後,該D U T 10 0發射根據該信號強度之 一功率準位指示器828至該測試儀器160。某些實施例中, 該功率準位指示器828指出該第一封包序列之該評估的作 24 200915752 唬強度大於一預定臨界值或小於該預定臨界值。例如,該 評估的信號強度大於該預定臨界值時,該功率準位指示器 可包括一封包,其具有一時間持續期間比該評估的信號強 度小於該預定臨界值時的還長,反之亦然。 5 該控制器用以響應接收該功率準位指示器828,而 將該發射器714之一功率準位調整至一第二功率準位。如上 所述,某些實施例中,該控制器7〇2週期性減少(或增加)該 預定序列802、804、806、808之每一個的功率準位。其他 貫施例中,該功率準位根據該功率準位指示器828來調整。 1〇例如,若該功率準位指示器828指出該第一封包序列81〇、 812、814之該信號強度大於該預定臨界值,則該發射器15〇 之該功率準位會減少。 該第二序列804期間,該測試儀器16〇將一第二封包序 列830、832、與834發射至該DUT 100。該第二封包序列 15 830、832、834於時間間隔836期間以該第二功率準位發射。 封包830與832由時間間隔838分開。封包832與834由時間間 隔840分開。該DUT 100用以響應接收該第二封包序列 830、832、與834之每一個而個別發射應答封包842、844、 與 846。 20 該DUT 100發射一預定數量之應答封包(此範例中為三) 後’該DUT 100評估該第二封包序列830、832、834之一信 號強度。該DUT 100根據該信號強度將一功率準位指示器 848發射至該測試儀器160。該控制器702用以響應接收該功 率準位指示器848,而將該發射器714之該功率準位調整至 25 200915752 一第三功率準位。如上所述,某些實施例中,該控制器702 週期性減少(或增加)該預定序列802、804、806、808之每一 個的功率準位。其他實施例中,該功率準位根據該功率準 位指示器848來調整。例如,若該功率準位指示器848指出 5 該第二封包序列830、832、834之該信號強度小於該預定臨 界值,則該發射器150之該功率準位會減少。 該第三序列806期間,該測試儀器160將一第三封包序 列850、852、與854發射至該DUT 100。該第三封包序列 850、852、854於時間間隔856期間以該第三功率準位發射。 10 封包850與852由時間間隔858分開。封包852與854由時間間 隔860分開。該DUT 100用以響應接收該第三封包序列 850、852、與854之每一個而個別發射應答封包862、864、 與 866 〇 該D U T 10 0發射一預定數量之應答封包(此範例中為三) 15 後’該DUT 100評估該第三封包序列850、852、854之一信 號強度。該DUT 100根據該信號強度將一功率準位指示器 868發射至該測試儀器160。該控制器702用以響應接收該功 率準位指示器868,而將該發射器714之該功率準位調整至 一第四功率準位。 20 該第四序列808期間,該測試儀器160將一第四封包序 列870、872、874、與876發射至該DUT 100。該第四封包 序列870、872、874、876於時間間隔878期間以該第四功率 準位來發射。封包870與872由時間間隔880分開。封包872 與874由時間間隔882分開。封包874與876由時間間隔884分 26 200915752 開。該DUT 100用以響應接收該第四封包序列87〇、874、 與876之其中三個而個別發射應答封包886、888、與89〇。 此範例中,該DUT 1〇〇並不接收封包872因此不發射一應答 封包。 5 該DUT 100發射一預定數量之應答封包(此範例中為三) • 後’該DUT 100評估該第四封包序列870、874、876之一信 號強度。該DUT 1〇〇根據該信號強度將一功率準位指示器 892發射至該測試儀器160。該測試儀器16〇用以響應接收該 功率準位指示器892而計算一RSSI校準偏置,並根據該第一 10至第四功率準位與/或該等功率準位指示器828、848、868、 892來校準該無線收發器13〇。或者,該測試儀器16〇將該測 試結果儲存於記憶體704中,隨後轉移至諸如該電腦15〇之 一分析系統以供之後分析。 現參照第9圖,該RSSI校準測試期間該控制器7〇2可採 15用之示範步驟一般以900來識別。該程序從步驟9〇2開始。 步驟904中,該測試儀器160產生一預定的封包序列來執行 • 該RSSI校準測試。步驟906中,該測試儀器16〇發射該封包 序列之一單一封包。步驟908中,該測試儀器160判定是否 用以響應發射該單一封包而接收一應答封包。若未接收到 20 一應答封包,則步驟906中該測試儀器160再次發射該封 包。步驟908中若已接收到一應答封包,則步驟91〇中該測 試儀器160增加一應答封包計數。 步驟912中,該測試儀器16〇判定該應答封包計數是否 專於该預定的應答封包數量。若該應答封包計數不等於該 27 200915752 預定的應答封包數量,則該程序返回步驟906。然而,若該 應答封包計數等於該預定的應答封包數量,則步驟914中該 測試儀器160接收一功率準位指示器。 步驟918中’該測試儀器160判定該預定測試流程是否 5需要另一封包序列。若需要另一封包序列,則該程序返回 步驟904而該測試儀器160以一不同功率準位來產生另一預 定的封包序列。然而’若該預定測試流程不需另一序列, 則該程序於步驟920中結束。 現參照第1 〇圖’該RSSI校準測試期間該DUT 100可採 10用之示範步驟一般以10〇〇來識別。該程序從步驟1002開 始。步驟1004中,該DUT 100聽取從該測試儀器160發射之 一封包。步驟1〇06中,該DUT 100判定是否已接收來自該 測試儀器160之一封包。若未接收到一封包,則該程序返回 步驟1004。然而,若已接收到一封包,則步驟1〇〇8中該DUT 15 100用以響應該封包而發射一應答封包。 步驟1010中該DUT 100增加一應答封包計數。步驟1012 中,該DUT 100判定該應答封包計數是否等於每一序列之 一預定封包數量。若該應答封包計數不等於每一序列之該 預定封包數量’則該程序返回步驟丨〇〇4。然而,若該應答 20封包計數等於每一序列之該預定封包數量,則步驟1014中 該DUT 100評估該序列封包之一信號強度。如上所述,該 信號強度可根據該封包序列之每一個的一高能量值、一低 能量值、與/或一平均能量值。 步驟1016中,該DUT 100發射一功率準位指示器以指出 28 200915752 該信號強度是否大於-預定臨界值或小於該預定臨界值。 步驟1017中該DUT⑽判定該預定的測試流程是否需要另 一序列。若需要另-序列’則該程序返回步驟刪。然而, 右違預定的測試流程不需另一序列,則該程序於步驟麵 ' 5 中結束。 " 現參照第11圖’該靈敏度測試期間該測試儀器160可採 用之示範步驟-般以1100來識別,並通常於該rssi校準測 紅後執行。雜序從步驟u_始。步驟丨刚中,該測 試儀器160產生-預定的封包序列來測試該無線收發器13〇 之該靈敏度。步驟1106中,該測試儀器16〇發射該封包序列 之一單一封包。 步驟1108中,該測試儀器16〇用以響應發射該單一封包 而判定是否已接收到-應答封包。若已接收到—應答封 包’則步驟1110中該測試儀器160增加—應答封包計數並進 15行至步驟川2。然而,若未接收到—應答封包則該測試 儀器160僅進行至步驟。步驟1112中,該測試儀器16〇 狀該應答封包計數是否大於或等於該預定之應答封包數 量。 若該應答封包計數不大於或等於該預定之應答封包數 2〇量’則該程序返回步驟11〇6。然而,若該應答封包計數大 於或等於該預定之應答封包數量,則步驟1114中該測試儀 器160判定是否需要測試另一功率準位來判定該無線收發 器130之該靈敏度。若需要另-功率準位,則步驟1116中該 控制器7〇2調整該發射器m之該功率準位,而該程序返回 29 200915752 步驟1104。然而’若不需另一功率準位,則該程序於步驟 H18中結束。 該DUT 1〇〇期待接收一預定數量與/或測試封包序列。 因此’該DUT 1〇〇維持於該測試模式中直到其接收該預定 5數置與/或測試封包序列。某些情況中,該發射器714之該 功率準位可針對該DUT 1〇〇來設為相當低而無法從該測試 儀器160接收一或更多封包。結果是’該DUT 1〇〇可繼續於 該測試模式中操作,因為其無法接收該預定數量與/或測試 封包序列,此有效增加該測試之持續期間。於是,第12圖 10中一般以120〇識別之替代示範步驟,可由該測試儀器160執 行以確認該DUT 100接收該預定數量與/或測試封包序列。 該替代程序確認該DUT 1〇〇接收足夠的封包與/或封包序列 來離開該測試模式。 該程序從步驟1202開始。步驟1204中,該測試儀器16〇 15產生一預定的封包序列來測試該無線收發器130之該靈敏 度。步驟1206中,該測試儀器160發射該封包序列之一單一 封包。 步驟1208中,該測試儀器16〇用以響應發射該單一封包 而判定是否已接收到一應答封包。若已接收到一應答封 20包,則步驟1210中該測試儀器160增加一應答封包計數並進 仃至步驟1212。然而,若未接收到一應答封包,則該測試 儀器160僅進行至步驟1212。步驟1212中,該測試儀器 判定該發射封包的數量是否等於步驟1212中該測試所需之 預定封包。 3〇 200915752 若該發射封包的數量等於該測試所需之預定封包,則 該程序返回步驟1。然而,右该應答封包計數等於該預 定之應答封包數量,則步驟1214中該測試儀器160判定是否 需要另一功率準位來測試該無線收發器130之該靈敏度。若 5需要另一功率準位,則步驟1216中該控制器702調整該發射 器714之該功率準位,而該程序返回步驟1204。然而,若不 需另一功率準位,則步驟1218中該控制器702將該發射器 714之該功率準位設定為該DUT 100能夠接收之一預定功 率準位。例如’若針對該DUT 100而言該功率準位太低而 10無法接收一封包,則該控制器702可將該發射器714之該功 率準位增加至該預定的功率準位,以確認該DUT 100能夠 接收一或更多封包° 步驟1220中,該測試儀器160判定該應答封包計數是否 大於或等於該預定之應答封包數量。若該應答封包計數大 15 於或等於該預定之應答封包數量,則該程序於步驟1222結 束。然而,若該應答封包計數不大於或等於該預定之應答 封包數量,則步驟1224中該測試儀器160發射一封包。 步驟1226中,該測試儀器160用以響應發射該封包而判 定是否接收到一應答封包。若已接收到一應答封包,則步 20 驟1228中該測試儀器丨6〇增加該應答封包計數。然而,若未 接收到一應答封包,則該程序返回步驟丨224。 某些實施例中,該測試儀器160可使用多個調變技術而 以多個資料速率來額外執行PER測試。參照第13圖,該測 試儀器160使用改變發射功率與調變類型來執行一靈敏度 31 200915752 測試之一示範時序圖一般描繪於1300。該範例顯示以該基 本調變技術來調變之不同的IEEE 802.11資料封包。封包 1302為OFDM調變QAM64封包。封包1304為OFDM調變 QAM16封包。封包1306為OFDM調變QPSK封包。封包1308 5為OFDM調變BPSK封包。封包1310為QPSK調變CCK封 包。封包1312為BPSK調變DSSS封包。如圖所示,每一調 變技術形成一不同的功率準位。 典型情況是,不支援部段化記憶體之測試儀器中,每 一封包類型的一波形會個別載入記憶體中。然而,諸如一 10 般由1300識別之一單一波形可載入記憶體以測試所有的資 料速率。因此,載入諸如一般由1300識別之一波形於不支 援部段化記憶體之測試儀器中是有利的。 現參照第14圖,該測試儀器160使用改變調變技術與/ 或資料速率’針對該波形1300之每一封包序列(例如,針對 15 每一封包序列1302、1304、1306、1308、1310、1312)來執 行一靈敏度測試時可採用之示範步驟一般以1400來識別。 該測試啟動時程序從步驟1402開始。步驟1404中,該測試 儀器160發射該波形13〇〇之一第一封包(例如,該等封包 1302之一第一封包)。步驟1406中,該測試儀器160判定是 20否用以響應發射該第一封包而接收一應答封包。若已接收 一應答封包’則步驟1408中該測試儀器160增加一應答封包 計數(例如’封包1302之一應答封包計數)並進行至步驟 1410。然而,若未接收一應答封包,則該測試儀器16〇僅進 行至步驟1410。 32 200915752 步驟1410中,該測試儀器160判定該應答封包計數是否 大於或等於該預定之應答封包數量。若該應答封包計數不 大於或等於該預定之應答封包數量,則步驟1412中該測試 儀器160發射該波形1300之該下一封包(例如,封包1302之 5 一第二封包)而該程序返回步驟1406。然而,若該應答封包 計數等於該預定之應答封包數量,則步驟1413中該測試儀 器160判定另一封包序列(例如,封包1304)是否包括於該波 形1300中。 若另一封包序列包括於該波形1300中,則步驟1404中 10 該測試儀器160發射該波形1300中之該下一封包序列的一 第一封包(例如,封包1304之一第一封包)。然而,若另一封 包序列不包括於該波形1300中(例如,該程序具有重複循環 的封包1302-1312),則該程序於步驟1414結束。某些實施例 中,該程序於步驟1414結束時,該測試儀器160可重置一指 15 標來指向該波形1300中之該第一封包序列(例如,1302)。 現參照第15圖,該測試儀器160使用該波形1300來執行 該DUT 100之一靈敏度測試時可採用之替代示範步驟一般 以1500來識別。該程序從步驟1502開始。步驟1504中,該 測試儀器160發射該波形1300之一第一封包(例如,封包 20 1302之一第一封包)。步驟1506中,該測試儀器160判定是 否用以響應發射該波形1300之該第一封包而接收一應答封 包。 若已接收一應答封包,則步驟1508中該測試儀器160增 加一封包類型應答計數(例如,封包1302之一封包類型應答 33 200915752 。十數)。步驟1509中,該測試儀器160增加該完整波形1300 之—應答封包計數而該程序進行至步驟151 〇。若未接收一 應答封包’則該程序僅進行至步驟151〇。步驟151〇中,該 測試儀器160判定該發射之封包數量是否等於該封包類型 5 (例如,封包1302)之預定封包數量。若該發射之封包數量不 等於該預定封包數量,則步驟1512中該測試儀器160發射該 波形13 〇 〇之該下一封包(例如,封包丨3 〇 2之一第二封包)而該 程序返回步驟1506。 若該發射之封包數量等於該預定封包數量,則步驟 10 1511中該控制器702判定另一封包序列(例如,封包13〇4)是 否包括於該波形1300中。若另一封包序列包括於該波形 1300中,則該程序返回步驟1504。然而,若另一封包序列 不包括於該波形1300中(例如,該程序具有重複循環的封包 1302-1312),則步驟1514中該控制器702將該發射器714之該 15功率準位設定為該DUT 100能夠接收之一預定準位。 步驟1516中,該測試儀器160判定該應答封包計數是否 大於或等於該完整波形1300之該預定的應答封包數量。若 該應答封包計數大於或等於該預定之應答封包數量,則該 程序於步驟1518中結束。若該應答封包計數不大於或等於 2〇該預定之應答封包數量’則步驟152〇中該測試儀器16〇發射 該波形1300之一下一封包(例如,封包13〇2之—下—封包)。 步驟15 22中,該測試儀器丨6 〇判定是否用以響應發射該封包 而接收一應答封包。若已接收一應答封包,則步驟1524中 该測試儀器160增加該應答封包計數。然而,若未接收一應 34 200915752 答封包,則該程序返回步驟1520。 如上所述,除了該等優點外,藉由以—預定測試流程 來預先規劃一無線收發器,則若有的話,測_«減 無線收發器與該主機處理器間之最小通訊。此外,藉由提 5供使用該預定測試流程、或序列來執行的一咖辦測 試,以確認該嵌入式無線收發器之效能,製造商可以產品 所需之最小變化來校準一無線裝置。業界熟於此技者將體 ^到其他優點。 在不違背本發明之範脅與精神下,對業界熟於此技者 10而舌,很明顯地本發明之操作結構與方法可作其他各種不 同的修改與變動。雖然本發明已連同特定的較佳實施例來 力以4明但應了解所要求之本發明不應不當地揭限於該 類特定的實施例中。下列申請專利範圍意欲定義本發明之 fe臂’而该等申請專利範圍之範蜂中的結構與方法以及其 15等效元件亦涵蓋其中。 【圖式簡單說明】 第1圖是一位於一產品測試環境中之一無線資料通訊 系統的功能方塊圖。 第2圖描繪一根據本發明目前要求之一實施例,用於測 20試第1圖之該無線資料通訊系統的方法。 第3圖描繪一根據本發明目前要求之另一實施例,用於 測試第1圖之該無線資料通訊系統的方法。 第4圖描繪一根據本發明目前要求之一實施例,用於執 行第1圖之該無線資料通訊系統的信號傳輸測試之測試序 35 200915752 列。 第圖4田、會根據本發明目前要求之另一實施例’用於 執^丁第1圖之該無線資料通訊系統的信號接收測試之測試 序列。 第6圖描繪—根據本發明目前要求之另一實施例,用於 執订第1圖之該無線資料通訊系統的信號接收測試之測試 序列。 第7圖是一根據本揭示内容之測試儀器的示範功能方 塊圖。 ^第8圖是一執行一接收信號強度指示(RSSI)校準測試之 s亥測試儀器的示範時序圖。 ,第9圖是一描繪該測試儀器執行該R s s 1校準測試時可 採用之示範步驟的流程圖。 第10圖是-描繪該無線通訊裝置可採用之示範步 15流程圖。 第11圖是-描繪該測試儀器執行一靈敏度測試時可採 用之示範步驟的流程圖。 第12圖是-描緣該測試儀器執行該靈敏度測試時可採 用之替代示範步驟的流程圖。 0 His 帛_是-朗試儀n使収變發射功率與調變類型 來執行一靈敏度測試之示範時序圖。 ^圖是-描繪該測試儀器使用改變發射功率與調變 技來執行-靈敏度測試時可採用之示範步驟的流程圖。 第15圖是—描繪該測試儀器使用改«射功率_變 36 200915752 類型來執行一靈敏度測試時可採用之替代示範步驟的流程 圖。 【主要元件符號説明】 100…受測裝置 1404、1406、1408、1410、1412、 HH、m、113、12卜 161 …介面 1413、1414、1502、1504、1506、 • 110···主機處理器 1508、1509、1510、151 卜 1512、 120、704…記憶體 1514、1516、1518、1520、1522、 f 130、710·.·無線收發器 1524…步驟 140···週邊裝置 218···測試模組 150…電腦 410、41 卜 412、420、510、520、 151…外部介面 610、620…命令 160…測試儀器 430、560、816、818、820、836、 202、204、206、208、210、302、 838、840、856、858、860、878、 304、306、308、310、902、904、 880、882、884…時間區間 ( 906、908、910、912、914'918、 440'445'540'541'551 ' 571 ' 920、1002、1004、1006、1008、 572、573、574、578、579、640、 1010、1012、1014、1016、1017、 641'642'650'651'671 > 673 ' 1018、1102、1104、1106、1108、 674、678、679、692、822、824、 1110、1112、1114、1116、1118、 826、842、844、846、862、864、 1202、1204、1206、1208、1210、 866、886、888、890…應答信號 1212、1214、1216、1218、1220、 450、45卜 455、456…測量 1222、1224、1226、1228、1402、 460、46卜...463···信號傳輸時槽 37 200915752 465、466、...468…時間 690···空的接收封包 470、47卜56卜68l·.·測試序列 702…控制器 480…準備程序 706…VSG 530、53卜580、58卜680…接收 708.--VSA 測試 Ή4…潑^射器 56 卜 562、563、564、568、569、 716···接收器 661、662、663、664、668、669、 718…測試模組 810、812、814、830、832、834、 800…時序圖 850、852、854、870、872、874、 802、804、806、808…序列 876、1302、1304、1306、1308、 828、848、868、892…功率準位 1310、1312···信號封包 指示器 630···内部設定 900、1000、1100、1200、1400、 635、69l···封包數量 1500…示範步驟 661···資料封包 1300···波形 38。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 The application is also on the same day application, table number 11602. 00. No. 0027, filed in co-review by the inventor Christian Olgaard, entitled "System for Testing Embedded Wireless Transceivers". FIELD OF THE INVENTION The present disclosure relates to a wireless communication system having a host processor and a wireless transceiver embedded therein, and more specifically, product testing of such systems. t Prior Art 3 Background of the Invention 15 As the number and use of wireless data communication systems increase, for such system manufacturers, the embedding is performed in a more time-efficient manner.  _ This type of SiS has become increasingly important for product testing of this wireless transceiver. It is well known that the problem with product testing of such embedded transceivers is that there is typically no direct connection between the device under test (DUT) and the test controller (e.g., a personal computer), for example, a wired, digitally controlled connection is available. Rather, communication must be generated by the host processor also embedded in the system. Therefore, product testing becomes more complicated because the test blade must be installed or stored to operate in the embedded host processor. For a single platform, the use of 200915752 firmware in an embedded host processor is acceptable, but when it comes to and must support multiple platforms, this approach becomes unsatisfactory immediately. In addition, the general case is that the wireless transceiver function, for example, according to IEEE 802. The 11 standard operates one of the wireless data transceivers, which is only a fraction of the total functional combination of the host system. Thus, in an effort to create a fully functional wireless transceiver capability, manufacturers are still not keen on spending significant resources on integrating the wireless functionality in view of their limited role in the overall operation of the system. Therefore, what is expected is to provide a simpler and more efficient product testing method for such systems, and only minimal changes are required in the case of performing product testing of various systems. C 明内 3 SUMMARY OF THE INVENTION In one embodiment, a test instrument for testing a wireless communication device includes a wireless transceiver and a controller. The wireless transceiver transmits a first sequence of packets when operating in a first mode. The wireless transceiver transmits a second sequence of packets when operating in a second mode. The wireless transceiver receives the response packet. The controller is configured to calculate the response packets received by the transceiver in response to transmitting each packet of the first sequence of packets. When the count exceeds a predetermined count, the controller controls the transceiver to transmit the second sequence of packets. 20 Among them, this case also reveals a related method. In the example, the transceiver operates at a first power level when operating in the first mode and at the second power level when operating in the second mode. In one example, the transceiver uses a first modulation technique in the first mode and a second modulation technique in the second mode. In the first example of the 200915752, the transceiver rate is transmitted at the second f-rate rate in the second mode. In the example, the transceiver is responsive to transmitting the first sequence of packets without receiving at least one of the acknowledgment packets - a predetermined number of packets, the controller increasing the first power level. 10 t in -_中' _ test instrument (four) is included in the dragon to store information. This production. The first mode, the second mode, the total number of packets transmitted, the total number of response packets in the class, and/or the total number of response packets received in the example - transmitted - a predetermined number of packets received and received After a final f-acknowledgment packet, the controller transfers the information to the analysis system. In the example of the I, the analysis system determines a sensitivity value and/or a packet error rate based on the information. In the example, one of the wireless communication systems located in a test environment includes the test instrument and a device under test PUT. The DUT receives the first-sequence packet and transmits the acknowledgment packet after receiving each packet of the first sequence packet. BRIEF DESCRIPTION OF THE DRAWINGS Figure 1 is a functional block diagram of a wireless data communication system in a product test environment. Figure 2 depicts a method for testing the wireless data communication system of Figure 1 in accordance with one embodiment of the presently claimed invention. Figure 3 depicts a method for testing the wireless data communication system of Figure 1 in accordance with another embodiment of the presently claimed invention. Figure 4 depicts a test sequence for signal transmission testing of a wireless data communication system in accordance with Figure 1 of the present invention, in accordance with one embodiment of the present invention. Figure 5 depicts a present invention in accordance with the present invention. Another embodiment of the invention is directed to a test 5 sequence for performing a signal reception test of the 5H wireless data communication system of Figure 1. Figure 6 depicts a second embodiment of the present invention in accordance with the present invention. The test sequence of the signal receiving test of the wireless data communication system is shown in Fig. 7. Fig. 7 is an exemplary functional block diagram of a test instrument according to the present disclosure. Fig. 8 is a diagram of performing a received signal strength indicator (RSSI). An exemplary timing diagram of the test instrument for calibration testing. Figure 9 is a flow chart depicting exemplary steps that can be taken by the test instrument to perform the RS SI calibration test. 15 帛 _ _ _ _ wireless communication device can be used as a demonstration Flowchart of the step. Figure 11 is a flow chart of the exemplary steps that can be taken when the test instrument performs a sensitivity test. Figure 12 is - depicting the test instrument performing the sensitive A flow chart of an alternative exemplary step can be used in the test. Figure 13 is an exemplary timing diagram of the test instrument using a change in transmit power and modulation type to perform a sensitivity test. Figure 14 is a depiction of the use of the test instrument. A flow chart of exemplary steps that can be used to perform a - sensitivity test by changing the transmit power and modulation type. 200915752 Figure 15 is a representation of the test instrument that can be used to perform a sensitivity test using varying transmit power and modulation type. The following is a description of the preferred embodiments of the present invention, and is not intended to limit the scope of The same reference numerals are used to identify the same elements in the drawings. The detailed description of the embodiments will be sufficient to enable those skilled in the art to practice the disclosure, and it should be understood that In other contexts, other embodiments may be implemented in some variations. As used herein, the term module, circuit / or device reference to a specific application integrated circuit (ASIC), an electronic circuit, one or more software or firmware program (shared, exclusive, or group) and memory, 15 combo logic Circuitry, and/or other suitable components for providing the above-described functionality. Although there is no explicit reverse representation in this context, it should be understood that the individual circuit components described above may be singular or plural in number. For example, the terms "circuitry And a "circuit group" may include a single component or multiple components, which may be active and/or passive components and may be coupled together or otherwise coupled together 20 (eg, as one or more integrated circuit wafers). To provide the above functionality. Furthermore, the term "signal" can be referenced to one or more currents, one or more voltages, or a data signal. At least one of the phrases A, B, and C should be considered to represent a logical (A or B or C) using a non-exclusive logical OR. Furthermore, the present disclosure has been made in the context of implementations using separate electronic circuit sets (preferably in the form of 200915752 one or more integrated circuit chips). The function may alternatively be performed using one or more suitably programmed processors depending on the signal frequency or data rate to be processed. 5 Referring to FIG. 1, a wireless data communication system in a general product test environment includes a device under test (DUT) 100, a computer 150 for controlling the test, and a test instrument 160 (eg, including a vector signal generation) (VSG) and a Vector Signal Analyzer (VSA), the physical interconnection of all components as shown. The DUT 1 has a number of embedded subsystems, including a host processing device 110, a memory 120 (eg, non-electrical memory), a wireless transceiver 130, and one or more peripheral devices 14A. The physical interconnection of all components is shown in the figure. The host processor 11 controls the memory 12, the wireless transceiver 130, and the peripheral device 140 via various control interfaces 121, 111, 113. Typically, the memory 120 stores the 15 programs used by the DUT 100 as firmware. The control computer 150 generally performs product testing of the DUT 100 through an external interface 151 'eg, a universal serial bus (UsB), a serial peripheral interface (SPI), an RS-232 serial interface, and the like. The software 'the control computer 150 also controls the tester 20 via another interface 161, such as USB, Universal Interface Bus (GPIB), Ethernet, and the like. The test instrument 160 communicates with the wireless transceiver 130 via an interface 101, which may be a wireless interface, but is typically a wired interface for product testing purposes. In a typical transmitter test scenario, the control computer 150 transmits one or more commands to the host processor 110, which translates the commands into commands corresponding to the 10 200915752 line transceiver 130. The transmission of the test signal via the test interface 1 ' 1 then the control computer 15 〇 (via its interface 161 ) retrieves the measurements from the test instrument 16 0 , followed by its planned output frequency and power An appropriate delay of one of the wireless transceivers 130 can be resolved. 5 As required in this example, the wireless transceiver 130 needs to be translated and translated by the host processor 110. The host processor 11 can be of many different types and can operate many different operating systems, and it is quite difficult to provide the required software in the host processor 110 to properly translate the commands. In general, such software must be specifically written for every 10 applications, so integrating the wireless transceiver 130 into the DUT 100 for a system integrator is a relatively difficult procedure. As explained in more detail below, the test method proposed in accordance with one of the present disclosures uses a predetermined test flow, or sequence, to provide a simplified product test to ensure the performance of the embedded wireless transceiver. If the wireless transceiver is pre-planned by the test 15 process, the minimum communication between the wireless transceiver and the host processor 110 is required during the test. The test flow can be uploaded to the transceiver 130 as part of the loading of the test firmware, or alternatively, for example, the data area can be predetermined in one of the test definitions and completed in one of the firmware portions. . After the firmware is loaded into the transceiver 130, the device can be located in a test mode waiting for commands from the test instrument 160. This can be accomplished as part of the load firmware, or as a separate command issued by the host processor 110. As a result, the only interaction with the host processor 110 includes the loading of the firmware, the loading of the test flow (unless it is an integrated part of the firmware), and possibly the inclusion of the 200915752 wireless transceiver 130. A command placed in a product operation test mode. Referring to Figure 2, an example of the method can be depicted as shown. In the first step 202, the test firmware is generally transferred by the control computer 150 to the host processor 110. In the next step 204, the test firmware is transferred from the host processor 110 to the wireless transceiver 130 via the interface 111. It should be understood that the test firmware can be completed because the test firmware also includes the desired test flow, or sequence, as an integral part. Alternatively, the test flow data can be transferred from the computer 150 to the host processor 110 and thereafter to the wireless transceiver 130. As a further alternative, the desired test data may be a data table type previously stored in the memory 120, which may be retrieved via the interface 121 and transferred by the host processor 110 to The wireless transceiver 130. In the next step 206, the wireless transceiver 130 is set in a test mode of operation, that is, the wireless transceiver 130 will now wait for one or more commands from the test instrument 160 15 (described in more detail below), For example, 'a command from the test instrument 160 is heard by a predetermined frequency. The setting of the wireless transceiver 130 in a test mode of operation can be automatically initiated as part of the loadable tester, or can be initiated by the host processor 11 with an appropriate command. In the next step 208, the test operation of the test instrument 160 can be initiated, for example, by transmitting an appropriate command as heard by the wireless transceiver 130 as described above. Alternatively, the wireless transceiver 130 can transmit a "ready" signal at a predetermined frequency, and then the test instrument 160 begins to transmit - or more test commands upon receipt. Preferably, the command combination is minimized, for example, only a command of the NEXT type 'so only the receiver waits for a 12 200915752 good data packet (eg 'representation - NEXT command), and thus less need Any media access control (MAC) layer operation. The initial test command is then transmitted from the test instrument 160. The wireless transceiver 130 preferably transmits an answer signal to indicate that the command has been received, after which the primary test command sequence from the tester 160 will begin. Control of the test instrument 160 is accomplished by the control computer 150 via the interface 161. A subsequent step 210 can include loading an update of the test firmware of the wireless transceiver 130, and thus can be based on data received from the control computer 150 via the host processor 110 (eg, transceiver calibration data), or from The master 10 processor 110 transports the data to the wireless transceiver 130 for storage in a data sheet of the memory 120 to modify various operational settings, parameters or conditions. Referring to Figure 3, a test method in accordance with another embodiment of the presently claimed invention has a first step 302 of initiating a system test operation. This causes the 15 host processor 110 to prepare for the next step 304, from which the test firmware is transferred from the memory 120 to the wireless transceiver 130 via the host processor 110. As described above, the test firmware may include the test flow or may be composed of two components', that is, the test commands and test sequence data. In the next step 306, the wireless transceiver 130 is set in its test mode of operation. As described above, 'this may be done automatically as part of the loading of the test firmware, or may be initiated by the host processor 110 via the interface 111 to transmit an appropriate command' and the command may be executed by the host processor 11〇 is initiated, or is used by the host processor 110 to be shipped in response to receiving it from the computer 15〇. In the next step 308, the actual test is initiated. As described above, this may be 13 200915752. The wireless transceiver 130 initiates communication with the test instrument 160 at the interface 101, or the test instrument 160 is activated by the computer 150 via the interface 101 and the wireless transceiver. 130 communication. The subsequent steps may include the test firmware update to modify one of the five different test settings, parameters or conditions, step 310, as described above. As described above, a test method in accordance with one of the present disclosure includes the step of placing the DUT 100 along with the external test instrument 160 in a test mode of operation. Next, there are two general types of testing: testing of the signal transmitting function of the wireless transceiver 130; and testing of the signal with the wireless transceiver 130. Referring to Fig. 4, an example of a transmission test sequence can be explained as follows. The test can wait for a command 420 to begin from the receiver (rx) portion of the DUT 100. The test instrument 160 issues its command 41 (eg, a GOTO-NEXT command). Then, after the command is received, the transmitter (TX) 15 of the DUT 100 issues a response signal 440 to indicate that it is receiving and aware of the command. Next, the DUT 100 starts transmitting the data signal determined by the test flow. This is transmitted by the signal slots 460, 461, .... 463 to express. The test flow will determine the number of packets transmitted, and the type of transmit packet contains the same signal, or multiple signals when a multi-packet is transmitted. 20 After receiving the response signal 440, the test instrument 160 will wait for a particular time interval 430 to cause the transmitter to schedule its desired operation (e.g., frequency accuracy and power level). Then, in the time interval 43, the test instrument 160 performs the measurement 450, 45, and then the measurement is completed 45, 451, and the test instrument 160 or the controller computer 15 accesses the test instrument 16 to receive 14 200915752; After the fight, the far collected data is analyzed and the next test sequence 470 is prepared. Similarly, after its signal transmission 463 is complete, the DUT 1 prepares the next portion of the test sequence by processing any desired operations 480. 10 3 Hai test instrument 160 or computer 150 has completed the processing of this data 47 〇 'will issue the next - test command (for example, g〇to_next). If the preparation procedure 480 for the next test has not been completed, the first 411 of the type of command may not be received by the DUT 1 . If so, the test instrument 16 will not receive any response signals. Thus, the test instrument 160 continues to transmit its command 412' and then at some point in time, one of the commands 412 is received 421 by the DUT 100, and a response signal 445 is transmitted by the DUT 100. The DUT 1〇〇 emits a known number of 465, 466. . . A new test signal for 468 is the beginning of the new test sequence, and the test instrument 160 will perform the desired measurements 455, 456, followed by further analysis and preparation of the subsequent test 471. It should be understood that although quite unique in a product testing environment, the testing instrument 160 may not be able to receive good data from the DUT 100. This usually indicates that the DUT 100 is bad, and it is expected to continue the failed test before discarding the DUT 100. In this type of situation, there are two possible actions. According to one of the processes, the test instrument 160 can transmit a different command (e.g., a REPEAT command instead of a GOTO-NEXT command). This is only a simple implementation of the 20th, and the DUT 100 can easily recognize the different commands. However, the test instrument 160 needs to load a new command or new data to generate a new signal which will slow down the test. Alternatively, the test instrument 160 may not transmit another command, and the DUT 100 may interpret it to indicate that the measurement was unsuccessful, and the DUT 100 will proceed with the initial test. 15 200915752 As described above, the transmit signals 46 463 transmitted by the DUT 100 may be a single transmit signal or may be a set of multi-packet signals. The use of this type of multi-packet signal has the advantage that during calibration, only a small amount of communication or no communication is required between the test instrument 160 and the DUT 100, since a solution can usually be achieved by iterative method 5, such as 2005 8 U.S. Patent Application Serial No. 11/161,692, filed on Jan. 12, which is assigned to the ' This article is for reference. Referring to Fig. 5, the test flow for receiving the 期待 期待 期待 期待 期待 期待 can be explained as follows. The test procedure differs from the signal transmission test procedure in that it is intended to perform the test such that the DUT 1 does not need to analyze, if any, the data actually received from the test instrument 160, but only determines whether it has been received. A correct packet. Thus, when changing from a receiving test to another test, the test instrument 160 does not need to issue a test command (e.g., a g〇t〇_next command 15). Rather, it is preferable to have the DUT 1 determine when to move to the next test. When the DUT has received a predetermined number of good signal packets, this can only be done by having the DUT 100 continue for the next test. If the DUT 100 has received a good packet and transmits a response signal, the test instrument 160 can only calculate the number of good packets without requiring such calculations from the DUT 20 ι〇0, so no additional communication is required. The result of the test is determined because the test instrument 160 knows how many packets to transmit and can determine how many packets to receive by simply counting the number of response signals received from the DUT 1 . This technique is quite accurate when the test instrument 160 includes a test instrument such as the VSA and VSG' because it is unlikely to have a missing response signal, and the transmitter power of the Dut 16 200915752 100 is typically greater than the transmitter power of the VSG. Therefore, the VSA cannot miss a response signal packet, especially if the VSA is triggered by the back edge of the signal packet transmitted by the VSG. In addition, enabling the VSA to receive the response packet provides an additional advantage in that the switching time of the transmit/receive switch of the dut 1 〇〇 5 is also tested. Referring again to Figure 5, the test instrument 160 transmits the test command 51A. Assuming that the previous test is a launch test, the test command 51 indicates that the DUT 100 initiates the next test, which is a receive test. The DUT 1 receives the command 520' causing the tester to assign the receive test 58. When the receiver section of the 10 DUT 100 is ready, a response signal is transmitted 54 〇, which indicates the receiver's reading. This becomes quite important compared to the conventional test method in which the packet is transmitted by the test instrument 16 until the receiver begins to receive the packet. By having the DUT 100 indicate its reading, the test instrument j6〇 only needs to assert its VSA to wait for the response signal to be received from the DUT 100, after which the test instrument 160 is ready to receive the test 530. When the test instrument 160 (e.g., the VSA) receives the response signal 54, the delta metric 160 knows that the DUT 100 is ready and begins signal transmission. Thus, the test instrument 160 (e.g., the VSA) begins transmitting a predetermined number of signal packets 561, 562, 563, 564, 568, 569, wherein each packet 20 produces a corresponding response signal 571, 572, 573, 574. , 578, 579. The test instrument 160 receives the response packets and increments its internal calculations for each of the received packets. Moreover, as described above, the transmit/receive switching operation of the DUT 1 can be analyzed by analyzing an interval 560 between a transmit test signal 563 and a receive response § 573 (in this method, 17 200915752) It is advantageous to use a response signal because such signals are already included in all standard or preset transceiver signal combinations, thus avoiding the need to add other unnecessary signals or functions). In this example, no packet error is generated, so the DUT 100 has received the 5 predetermined number of packets and moved to the next receive test 581. Similarly, the test instrument 160 knows that the DUT 100 has received all packets based on the number of received response signals and can also prepare the next receive test 531. When the DUT 100 is ready, a response signal 541 is transmitted to indicate such readings, and after receiving the response signal 551, the testing instrument 160 begins transmitting the packet 10 for use by the next test 561. In the event that the DUT 100 has not received a packet for a predetermined time interval, it may retransmit its response signal 541, for example, for the case where the DUT 100 becomes ready to be faster than the test instrument 160 in the next test. Referring to Figure 6, if a packet error is encountered, the DUT 100 cannot receive all of the predetermined good packets. As shown, the test flow begins with the previous test being a launch test. The VSG of the test instrument 160 transmits the test command 610 to indicate the start of the new operation or the end of the previous operation. The DUT 100 receives the command 620 and prepares for self-enablement for receiving the test 680. When it is ready, the DUT 100 transmits an acknowledgement signal 20 640 that it is ready to receive. The response signal 650 is received by the test instrument 160, and when the test instrument 160 is ready', e.g., when its internal setting 630 is completed, it begins transmitting the pre-numbered packets 661, 662, 663, 664, 668, 669. The DUT 100 is responsive to this condition to transmit a response signal 671, 673, 674, 678, 679 for each good packet received. 18 200915752 5 10 15 20 As shown, one of the packets 662 is not received by the DUT 100. Thus, the DUT 100 does not transmit a corresponding response packet, which is depicted by an empty received packet 690. Then, after the transmission sequence is completed, the test instrument 160 knows how many response packets it receives, and since a packet 690 is obviously missing, the test instrument 160 knows that the DUT 1 receiver continues the test under the test. Previously, I continued to wait for at least one packet. Thus, the test instrument 160 will calculate the number 635 of additional packets to be received by the DUT 1 and start transmitting the required number of packets 69^. After receiving the missing packet, the DUT 1 transmits a response signal 692 and begins preparing for the next test operation 681. When it is ready, the other response signal is transmitted to the test instrument 16A. In this example, the test instrument 160 is not ready when the DUT 1 is ready. Therefore, the DUT transmits its response signal 64 (d) to the fact that the test instrument (10) is not ready and does not respond 'after a predetermined time interval'. The DUT 100 will transmit a further response signal 642. After the test instrument 160 is ready and then the response signal 651 is received, the data packet that begins to transmit more data packets is just forwarded by the corresponding response packet (7). As described above, the signals transmitted for testing purposes may be multiple packets (four) 'where it is expected that the coffee will only packet back a particular type of data. For example, 'requires the transmitter to transmit more packets to make the It is different when receiving the number of packets required for the test to be tested. The level of the data packet can be transmitted to perform the sensitivity test of the actual receiver (the towel is replaced by the (4) fixed packet). Referring now to Figure 7, the green shows the test instrument 16 - the exemplary functional block 19 200915752 block diagram. The test instrument 160 includes a controller 702, a memory 704 (e.g., non-electrical memory), a VSG 706, a VSA 708, and a wireless transceiver 710. The controller 702 is operatively coupled to the VSG 706, the VSA 708, the memory 704, the transceiver 710, and the computer 15A. The VSG 706 5 and VSA 708 are operatively coupled to the transceiver 71A. More specifically, the VSG 706 is operatively coupled to one of the transceivers 710, the transmitter 714, and the VSA 708 is operatively coupled to one of the transceivers 710, the receiver 716. The controller 702 includes a test module 218 that controls the testing of the DUT 100. For example, the test module 218 can perform a Received Signal Strength Indicator (RSSI) calibration 10 test followed by a sensitivity test of the wireless transceiver 130. During the RSSI calibration test, the test instrument 16 transmits one or more packets to the DUT 1 at a first power level. In response to the one or more packets, the DUT 100 transmits a power level indicator to the test instrument 160, and the controller 702 stores it in the memory 7〇4. In some embodiments, the power level indicator indicates that the RSSI of the one or more packets is greater than a predetermined threshold or less than the predetermined threshold. In other embodiments, the "Hai power level indicator" represents the illusion of the one or more packets. The test instrument 160 transmits one or more packets at a second power level. In some embodiments, the controller 7 周期性 2 periodically increases or decreases the transmit power of the transceiver 710 until a predetermined test sequence has been completed. For example, when the controller 702 periodically reduces the transmit power, the second power level is less than the first power level. However, when the controller 7 〇 2 periodically increases the transmit power, the second power level is greater than the first power level. In the embodiment, the second power level is based on the power level indicator. Example 20 200915752 For example, if the power level indicator indicates that the first power level is greater than the predetermined threshold, the second power level is less than the first power level. However, if the power level indicator indicates that the first power level is less than the pre-threshold value, the second power level is greater than the first power level. In this method, the test instrument 16 searches for the DUT 100 to receive one of the calibration power levels of one or more of the packets. In some embodiments, the test instrument 160 determines the -RSSI calibration offset based on the first power level, the second power level, and/or the power level indicator used to calibrate the wireless transceiver 130. . In other embodiments, the 10 test instrument 160 stores the first power level, the second power level, and/or the power level indicator in the memory 704, and then transfers it to, for example, the computer 150. One of the analysis systems for later analysis. The test instrument 16 0 does not transmit - or more packets to perform the rss! calibration test, but instead uses the first power level to place a predetermined sequence of 15 packets (eg, a first predetermined sequence) ) is transmitted to the DUT 1〇〇. The DUT 100 is operative to transmit a response packet to the test instrument 160 in response to each packet of the first packet sequence. After transmitting a predetermined number of response packets, the DUT 100 transmits the power level indicator. After receiving the power level indicator from the DUT 1 , the test instrument 16 transmits a second predetermined sequence of packets (e.g., a second predetermined sequence) at the second power level. In this method, the test instrument 160 searches for the calibration power level required by the DUT 100 based on the predetermined sequence of packets (e.g., a predetermined sequence). As noted above, in some embodiments, the power level indicator indicates the RSSI of the packets. In these embodiments, the test instrument 16 can transmit a single predetermined sequence of packets (e.g., ' a predetermined sequence) to the DUT 1 by a predetermined power level of 21 200915752. The DUT 100 is responsive to each packet of the predetermined packet sequence and transmits a response packet to the test instrument 16A. After transmitting a predetermined number of response packets, the DUT 100 transmits a power level indicator indicative of the RSSI of at least one of the predetermined 5 packet sequences. For example, the RSSI can be encoded in the power level indicator. Alternatively, the power level indicator can include a plurality of power level packets (not shown) that indicate the RSSI. For example, if the power level indicator includes 44 power level packets, the evaluated signal strength may be _6 〇 dBm. Although 44 1 power level packets are used in this example to represent an estimated signal strength of -60 dBm, those skilled in the art will recognize that any number of power level packets can be used to indicate the signal strength of the evaluation. Because the test instrument 160 desires to receive a predetermined number of all packets (eg, all 60 packets), the power level indicator 15 can also include additional filler packets that do not indicate the RSSI (not Display) (eg, 16 packets) 'make the same number of packets included in each power level indicator. Once the test instrument 160 has received all of the predetermined number of all packets (e.g., 44 power level packages and 16 packing packets), the test instrument 160 can complete the RSSI test and proceed to the sensitivity test. 〇 During the sensitivity test period, which is typically performed after the RSSI calibration test, the controller 702 sets the transmitter 714 to operate in at least the first and the first mode. For example, in some embodiments, the transmitter 714 transmits at a first power level when operating in the first mode and at a second power level during operation in the second mode. In other embodiments, the transmitter 714 22 200915752 is transmitted using the -th modulation technique when operating in the first mode and transmitting using the second modulation technique when operating in the second mode. In another embodiment, the transmitter m is transmitted at a first rate in operation in the first mode and at a second data rate 5 in operation in the second mode. When the transceiver 7U) is operating in the first mode, the controller 7〇2 controls the transceiver 710 to transmit a sequence of packets separated by a time interval to the DUT 100. The DUT 100 is configured to transmit a response packet to each of the packets in the sequence of packets, and to transmit the - response packet to the controller 〇2, and to calculate the transceiver in response to transmitting each packet of the packet sequence. The response packet received by Sichuan. When the number of the response packets exceeds a predetermined count, the controller 7〇2 sets the transceiver TM to operate in the second mode, and then controls the transceiver 710 to transmit a second packet sequence. In some embodiments, the test 15 instrument 160 determines the packet error rate (PER) based on how many packets are transmitted and how many response packets are received from the DUT 1 . The other real, the number of transmitting and answering packets (4) is stored in the memory 7G4, which is then transferred to an analysis system such as the computer 150 for later analysis. The controller 702 can periodically reduce the power transmission 20 level of the transceiver 71 until the DUT 100 stops transmitting the acknowledgement packet in response to transmitting the sequence of packets. Alternatively, the controller 702 can periodically increase the power level of the transceiver 71 until the DUT 1 starts to transmit a response packet in response to the packet sequence. In some embodiments, the test instrument 160 determines the sensitivity of one of the wireless transceivers 130 based on the received response mask 23 200915752 packet and the power level transmitted by the packets. In other embodiments, the test instrument 16 stores the test results in memory 704 and then transfers to the computer 150 for later analysis. 5 Referring now to Figure 8, an exemplary timing diagram of the test instrument 160 performing the RSSI calibration test is generally depicted at 8 inches. In this example, the RSSI calibration test includes four predetermined sequences that are generally identified by 802, 804, 806, and 808. While this example illustrates four predetermined sequences, those skilled in the art will recognize that more or fewer sequences are used. During the first sequence 〇2, the test instrument 160 transmits a first packet sequence 810, 812, and 814 to the DUT 100 during the time interval 816. Each packet 810, 812, and 814 is separated by a time interval. More specifically, packets 81A and 812 are separated by time interval 818, and packets 812 and 814 are separated by time interval 820. The DUT 1 is configured to individually transmit the response packets 822, 824, and 826 in response to receiving each of the 15 packets of the first packet sequence 810, 812, and 814. The DUT 100 transmits a predetermined number of response packets (three in this example) after the DUT 100 evaluates the signal strength of one of the first packet sequences 81A, 812, and 814. The signal strength may be packetized according to one or more of the first packet sequences 81A, 812, and 814. For example, the signal strength may be based on one of the first packet sequence 81 〇, 812, 814, a high energy value, a low energy value, and/or an average energy value. After evaluating the signal strength, the D U T 10 0 transmits a power level indicator 828 according to the signal strength to the test instrument 160. In some embodiments, the power level indicator 828 indicates that the evaluated strength of the first packet sequence is greater than a predetermined threshold or less than the predetermined threshold. For example, when the estimated signal strength is greater than the predetermined threshold, the power level indicator may include a packet having a duration that is longer than when the estimated signal strength is less than the predetermined threshold, and vice versa . 5 The controller is configured to adjust the power level of one of the transmitters 714 to a second power level in response to receiving the power level indicator 828. As noted above, in some embodiments, the controller 7〇2 periodically reduces (or increases) the power level of each of the predetermined sequences 802, 804, 806, 808. In other embodiments, the power level is adjusted based on the power level indicator 828. For example, if the power level indicator 828 indicates that the signal strength of the first packet sequence 81 〇, 812, 814 is greater than the predetermined threshold, the power level of the transmitter 15 会 is reduced. During the second sequence 804, the test instrument 16 transmits a second packet sequence 830, 832, and 834 to the DUT 100. The second packet sequence 15 830, 832, 834 is transmitted at the second power level during the time interval 836. Packets 830 and 832 are separated by time interval 838. Packets 832 and 834 are separated by a time interval 840. The DUT 100 is operative to transmit the response packets 842, 844, and 846 in response to receiving each of the second packet sequences 830, 832, and 834. 20 After the DUT 100 transmits a predetermined number of response packets (three in this example), the DUT 100 evaluates the signal strength of one of the second packet sequences 830, 832, 834. The DUT 100 transmits a power level indicator 848 to the test instrument 160 based on the signal strength. The controller 702 is configured to adjust the power level of the transmitter 714 to a second power level of 25 200915752 in response to receiving the power level indicator 848. As noted above, in some embodiments, the controller 702 periodically reduces (or increases) the power level of each of the predetermined sequences 802, 804, 806, 808. In other embodiments, the power level is adjusted based on the power level indicator 848. For example, if the power level indicator 848 indicates that the signal strength of the second packet sequence 830, 832, 834 is less than the predetermined threshold, then the power level of the transmitter 150 is reduced. During the third sequence 806, the test instrument 160 transmits a third packet sequence 850, 852, and 854 to the DUT 100. The third packet sequence 850, 852, 854 is transmitted at the third power level during the time interval 856. The 10 packets 850 and 852 are separated by a time interval 858. Packets 852 and 854 are separated by a time interval 860. The DUT 100 is configured to transmit a response packet 862, 864, and 866 〇 the DUT 10 0 to transmit a predetermined number of response packets in response to receiving the third packet sequence 850, 852, and 854 (three in this example) After 15 'the DUT 100 evaluates the signal strength of one of the third packet sequences 850, 852, 854. The DUT 100 transmits a power level indicator 868 to the test instrument 160 based on the signal strength. The controller 702 is configured to adjust the power level of the transmitter 714 to a fourth power level in response to receiving the power level indicator 868. During the fourth sequence 808, the test instrument 160 transmits a fourth packet sequence 870, 872, 874, and 876 to the DUT 100. The fourth packet sequence 870, 872, 874, 876 is transmitted at the fourth power level during time interval 878. Packets 870 and 872 are separated by time interval 880. Packets 872 and 874 are separated by time interval 882. Packets 874 and 876 are opened by time interval 884 points 26 200915752. The DUT 100 is operative to transmit the response packets 886, 888, and 89 个别 in response to receiving three of the fourth packet sequences 87 〇, 874, and 876. In this example, the DUT 1 does not receive the packet 872 and therefore does not transmit a response packet. 5 The DUT 100 transmits a predetermined number of response packets (three in this example). • The DUT 100 evaluates the signal strength of one of the fourth packet sequences 870, 874, 876. The DUT 1 发射 transmits a power level indicator 892 to the test instrument 160 based on the signal strength. The test instrument 16 is configured to calculate an RSSI calibration offset in response to receiving the power level indicator 892, and based on the first 10 to fourth power levels and/or the power level indicators 828, 848, 868, 892 to calibrate the wireless transceiver 13A. Alternatively, the test instrument 16 stores the test results in memory 704 and then transfers to an analysis system such as the computer 15 for later analysis. Referring now to Figure 9, the exemplary steps used by the controller 7〇2 during the RSSI calibration test are generally identified at 900. The program begins with step 9〇2. In step 904, the test instrument 160 generates a predetermined sequence of packets to perform the RSSI calibration test. In step 906, the test instrument 16 transmits a single packet of the packet sequence. In step 908, the test instrument 160 determines whether a response packet is received in response to transmitting the single packet. If a response packet is not received, the test instrument 160 transmits the packet again in step 906. If a response packet has been received in step 908, then the test instrument 160 increments a response packet count in step 91. In step 912, the test instrument 16 determines whether the response packet count is specific to the predetermined number of response packets. If the response packet count is not equal to the predetermined number of acknowledgment packets for the 27 200915752, then the process returns to step 906. However, if the response packet count is equal to the predetermined number of acknowledgement packets, then the test instrument 160 receives a power level indicator in step 914. In step 918, the test instrument 160 determines if the predetermined test procedure requires another packet sequence. If another packet sequence is required, the program returns to step 904 and the test instrument 160 generates another predetermined sequence of packets at a different power level. However, if the predetermined test procedure does not require another sequence, the program ends in step 920. Referring now to Figure 1, the exemplary steps of the DUT 100 during the RSSI calibration test are generally identified by 10 。. The program begins at step 1002. In step 1004, the DUT 100 listens to a packet transmitted from the test instrument 160. In step 1 〇 06, the DUT 100 determines whether a packet from the test instrument 160 has been received. If a packet has not been received, the program returns to step 1004. However, if a packet has been received, the DUT 15 100 in step 1 用以 8 transmits a response packet in response to the packet. In step 1010, the DUT 100 increments a response packet count. In step 1012, the DUT 100 determines if the response packet count is equal to a predetermined number of packets per sequence. If the response packet count is not equal to the predetermined number of packets per sequence', the program returns to step 丨〇〇4. However, if the response 20 packet count is equal to the predetermined number of packets per sequence, then in step 1014 the DUT 100 evaluates the signal strength of one of the sequence packets. As noted above, the signal strength can be based on a high energy value, a low energy value, and/or an average energy value for each of the packet sequences. In step 1016, the DUT 100 transmits a power level indicator to indicate 28 200915752 whether the signal strength is greater than a predetermined threshold or less than the predetermined threshold. The DUT (10) in step 1017 determines if the predetermined test flow requires another sequence. If another sequence is required, the program returns to the step delete. However, if the right-to-scheduled test flow does not require another sequence, the program ends in step '5'. " Referring now to Figure 11, the exemplary steps that the test instrument 160 can take during the sensitivity test are generally identified at 1100 and are typically performed after the rssi calibration is measured. The order starts from step u_. In the step ,, the test instrument 160 generates a predetermined sequence of packets to test the sensitivity of the wireless transceiver 13〇. In step 1106, the test instrument 16 transmits a single packet of the packet sequence. In step 1108, the test instrument 16 is configured to determine whether a response packet has been received in response to transmitting the single packet. If the - reply packet has been received, then in step 1110 the test instrument 160 increments - the response packet count and proceeds to step 15 to step 2. However, if the response packet is not received, the test instrument 160 proceeds only to the step. In step 1112, the test instrument 16 determines whether the response packet count is greater than or equal to the predetermined number of response packets. If the response packet count is not greater than or equal to the predetermined number of response packets, the program returns to step 11〇6. However, if the response packet count is greater than or equal to the predetermined number of response packets, then the test instrument 160 determines in step 1114 whether another power level needs to be tested to determine the sensitivity of the wireless transceiver 130. If another power level is required, the controller 7〇2 adjusts the power level of the transmitter m in step 1116, and the program returns to 29 200915752, step 1104. However, if no further power level is required, the program ends in step H18. The DUT 1 is expected to receive a predetermined number and/or test packet sequence. Thus, the DUT 1 is maintained in the test mode until it receives the predetermined number of sets and/or test packets. In some cases, the power level of the transmitter 714 can be set relatively low for the DUT 1 to fail to receive one or more packets from the test instrument 160. The result is that the DUT 1 〇〇 can continue to operate in the test mode because it cannot receive the predetermined number and/or test packet sequence, which effectively increases the duration of the test. Thus, an alternate exemplary step of identifying at 120 第 in Fig. 12 can be performed by the test instrument 160 to confirm that the DUT 100 receives the predetermined number and/or test packet sequence. The alternate procedure confirms that the DUT 1 receives enough packets and/or packets to leave the test mode. The program begins in step 1202. In step 1204, the test instrument 16 〇 15 generates a predetermined sequence of packets to test the sensitivity of the wireless transceiver 130. In step 1206, the test instrument 160 transmits a single packet of the packet sequence. In step 1208, the test instrument 16 is configured to determine whether a response packet has been received in response to transmitting the single packet. If a response packet 20 has been received, the test instrument 160 increments a response packet count in step 1210 and proceeds to step 1212. However, if a response packet is not received, then the test instrument 160 proceeds only to step 1212. In step 1212, the test instrument determines if the number of transmitted packets is equal to the predetermined packet required for the test in step 1212. 3〇 200915752 If the number of transmitted packets is equal to the predetermined packet required for the test, the program returns to step 1. However, the right response packet count is equal to the predetermined number of response packets, and the test instrument 160 determines in step 1214 whether another power level is required to test the sensitivity of the wireless transceiver 130. If another power level is required, the controller 702 adjusts the power level of the transmitter 714 in step 1216, and the process returns to step 1204. However, if another power level is not required, the controller 702 sets the power level of the transmitter 714 to a level at which the DUT 100 can receive a predetermined power level in step 1218. For example, if the power level is too low for the DUT 100 and 10 cannot receive a packet, the controller 702 can increase the power level of the transmitter 714 to the predetermined power level to confirm the The DUT 100 is capable of receiving one or more packets. In step 1220, the test instrument 160 determines if the response packet count is greater than or equal to the predetermined number of response packets. If the response packet count is greater than or equal to the predetermined number of response packets, then the process ends at step 1222. However, if the response packet count is not greater than or equal to the predetermined number of response packets, then the test instrument 160 transmits a packet in step 1224. In step 1226, the test instrument 160 determines whether a response packet is received in response to transmitting the packet. If a response packet has been received, the test instrument 丨6〇 increases the response packet count in step 2028. However, if a response packet is not received, the program returns to step 224. In some embodiments, the test instrument 160 can additionally perform PER testing at multiple data rates using multiple modulation techniques. Referring to Figure 13, the test instrument 160 performs a sensitivity using varying transmit power and modulation type. 31 One of the test timing diagrams for the 200915752 test is generally depicted at 1300. This example shows the different IEEE 802 that is modulated by this basic modulation technique. 11 data packets. Packet 1302 is an OFDM modulated QAM64 packet. Packet 1304 is an OFDM modulation QAM16 packet. Packet 1306 is an OFDM modulated QPSK packet. Packet 1308 5 is an OFDM modulated BPSK packet. The packet 1310 is a QPSK modulated CCK packet. The packet 1312 is a BPSK modulated DSSS packet. As shown, each modulation technique forms a different power level. Typically, in a test instrument that does not support segmented memory, a waveform of each packet type is individually loaded into the memory. However, a single waveform, such as a 1300, can be loaded into the memory to test all of the data rates. Therefore, it is advantageous to load a test instrument such as a waveform that is generally recognized by 1300 in a non-supported segmented memory. Referring now to Figure 14, the test instrument 160 uses a change modulation technique and/or data rate 'for each packet sequence of the waveform 1300 (e.g., for 15 per packet sequence 1302, 1304, 1306, 1308, 1310, 1312) The exemplary steps that can be used to perform a sensitivity test are generally identified by 1400. The test starts at step 1402. In step 1404, the test instrument 160 transmits one of the first packets of the waveform 13 (e.g., one of the first packets of the packets 1302). In step 1406, the test instrument 160 determines 20 to receive a response packet in response to transmitting the first packet. If a response packet has been received, then the test instrument 160 increments a response packet count (e.g., one of the packets of the packet 1302) in step 1408 and proceeds to step 1410. However, if a response packet is not received, the test instrument 16 〇 proceeds only to step 1410. 32 200915752 In step 1410, the test instrument 160 determines whether the response packet count is greater than or equal to the predetermined number of response packets. If the response packet count is not greater than or equal to the predetermined number of response packets, the test instrument 160 transmits the next packet of the waveform 1300 in step 1412 (eg, the second packet of the packet 1302) and the program returns to the step. 1406. However, if the response packet count is equal to the predetermined number of response packets, then the test instrument 160 determines in step 1413 whether another packet sequence (e.g., packet 1304) is included in the waveform 1300. If another packet sequence is included in the waveform 1300, the test instrument 160 in step 1404 transmits a first packet of the next packet sequence in the waveform 1300 (e.g., one of the first packets of the packet 1304). However, if another packet sequence is not included in the waveform 1300 (e.g., the program has duplicated packets 1302-1312), then the process ends in step 1414. In some embodiments, at the end of step 1414, the test instrument 160 can reset a finger to point to the first sequence of packets (e.g., 1302) in the waveform 1300. Referring now to Figure 15, an alternative exemplary step that the test instrument 160 can use to perform one of the sensitivity tests of the DUT 100 using the waveform 1300 is generally identified at 1500. The program begins in step 1502. In step 1504, the test instrument 160 transmits a first packet of the waveform 1300 (e.g., one of the first packets of the packet 20 1302). In step 1506, the test instrument 160 determines if a response packet is received in response to transmitting the first packet of the waveform 1300. If a response packet has been received, then in step 1508 the test instrument 160 adds a packet type response count (e.g., a packet type response of the packet 1302 33 200915752. Tens). In step 1509, the test instrument 160 increments the response packet count for the full waveform 1300 and the process proceeds to step 151. If a response packet is not received, the program proceeds only to step 151. In step 151, the test instrument 160 determines whether the number of transmitted packets is equal to the predetermined number of packets of the packet type 5 (e.g., packet 1302). If the number of packets to be transmitted is not equal to the predetermined number of packets, then in step 1512, the test instrument 160 transmits the next packet of the waveform 13 (eg, the second packet of the packet 丨3 〇 2) and the program returns Step 1506. If the number of transmitted packets is equal to the predetermined number of packets, then the controller 702 determines in step 10 1511 whether another packet sequence (e.g., packet 13〇4) is included in the waveform 1300. If another packet sequence is included in the waveform 1300, the process returns to step 1504. However, if another packet sequence is not included in the waveform 1300 (eg, the program has repeated cycles of packets 1302-1312), then in step 1514 the controller 702 sets the 15 power level of the transmitter 714 to The DUT 100 is capable of receiving one of the predetermined levels. In step 1516, the test instrument 160 determines if the response packet count is greater than or equal to the predetermined number of acknowledgement packets for the complete waveform 1300. If the response packet count is greater than or equal to the predetermined number of response packets, then the process ends in step 1518. If the response packet count is not greater than or equal to 2, the predetermined number of response packets, then the test instrument 16 transmits the next packet of the waveform 1300 in step 152 (e.g., packet 13 〇 2 - down - packet). In step 15 22, the test instrument determines whether to receive a response packet in response to transmitting the packet. If a response packet has been received, the test instrument 160 increments the response packet count in step 1524. However, if a response packet is not received, the program returns to step 1520. As noted above, in addition to these advantages, a wireless transceiver is pre-planned by a predetermined test flow, if any, with minimal communication between the wireless transceiver and the host processor. In addition, by acknowledging the effectiveness of the embedded wireless transceiver by using a predetermined test flow, or a sequence of tests, the manufacturer can calibrate a wireless device with minimal changes required by the product. Those skilled in the industry will appreciate other advantages. Without departing from the spirit and spirit of the invention, it is obvious to those skilled in the art that various modifications and changes can be made in the structure and method of the invention. Although the present invention has been described in connection with the preferred embodiments thereof, it should be understood that the invention should not be construed as being limited to the particular embodiments. The scope of the following patent application is intended to define the fe arm' of the present invention and the structures and methods of the vans of the claims and their equivalent elements are also encompassed. [Simple description of the diagram] Figure 1 is a functional block diagram of a wireless data communication system in a product test environment. Figure 2 depicts a method for testing the wireless data communication system of Figure 1 in accordance with one embodiment of the presently claimed invention. Figure 3 depicts a method for testing the wireless data communication system of Figure 1 in accordance with another embodiment of the presently claimed invention. Figure 4 depicts a test sequence 35 200915752 for performing the signal transmission test of the wireless data communication system of Figure 1 in accordance with one embodiment of the presently claimed invention. Figure 4 is a test sequence for signal reception testing of the wireless data communication system of Figure 1 in accordance with another embodiment of the presently claimed invention. Figure 6 depicts a test sequence for signal reception testing of the wireless data communication system of Figure 1 in accordance with another embodiment of the presently claimed invention. Figure 7 is an exemplary functional block diagram of a test instrument in accordance with the present disclosure. ^ Figure 8 is an exemplary timing diagram of a test instrument that performs a Received Signal Strength Indication (RSSI) calibration test. Figure 9 is a flow chart depicting exemplary steps that the test instrument can take when performing the Rs s 1 calibration test. Figure 10 is a flow chart depicting an exemplary step 15 that can be employed by the wireless communication device. Figure 11 is a flow chart depicting exemplary steps that the test instrument can take when performing a sensitivity test. Figure 12 is a flow diagram of an alternative exemplary step that can be taken when the test instrument performs the sensitivity test. 0 His 帛 _ is a demonstration sequence diagram for performing a sensitivity test by measuring the transmit power and modulation type. The graph is a flow chart depicting the exemplary steps that the test instrument can use to perform the -sensitivity test using varying transmit power and modulation techniques. Figure 15 is a flow diagram depicting alternative test steps that can be used when the test instrument uses a type of radiation power to change a sensitivity test. [Description of main component symbols] 100: device under test 1404, 1406, 1408, 1410, 1412, HH, m, 113, 12 161 ... interface 1413, 1414, 1502, 1504, 1506, • 110··· host processor 1508, 1509, 1510, 151, 1512, 120, 704...memory 1514, 1516, 1518, 1520, 1522, f 130, 710·. Wireless transceiver 1524...Step 140··· Peripheral device 218···Test module 150...Computer 410, 41 Bu 412, 420, 510, 520, 151... External interface 610, 620... Command 160... Test instrument 430, 560, 816, 818, 820, 836, 202, 204, 206, 208, 210, 302, 838, 840, 856, 858, 860, 878, 304, 306, 308, 310, 902, 904, 880, 882, 884... time interval (906, 908, 910, 912, 914 '918, 440 '445 '540 '541 '551 ' 571 ' 920, 1002, 1004, 1006, 1008, 572, 573, 574, 578, 579, 640 1010, 1012, 1014, 1016, 1017, 641 '642 '650 '651 '671 > 673 ' 1018, 1102, 1104, 1106, 1108, 674, 678, 679, 692, 822, 824, 1110, 1112 1114, 1116, 1118, 826, 842, 844, 846, 862, 864, 1202, 1204, 1206, 1208, 1210, 866, 886, 888, 890... response signals 1212, 1214, 1216, 1218, 1220, 450, 45 Bu 455, 456...Measure 1222, 1224, 1226, 1228, 1402, 460, 46. . . 463···Signal transmission time slot 37 200915752 465,466,. . . 468...Time 690···empty receiving packets 470, 47 Bu 56 Bu 68l·. Test sequence 702...Controller 480...Preparation procedure 706...VSG 530, 53 580, 58 680...Receive 708. -VSA test Ή4...sprayer 56 562, 563, 564, 568, 569, 716 ... receiver 661, 662, 663, 664, 668, 669, 718... test modules 810, 812, 814 830, 832, 834, 800... sequence diagrams 850, 852, 854, 870, 872, 874, 802, 804, 806, 808... sequences 876, 1302, 1304, 1306, 1308, 828, 848, 868, 892... Power level 1310, 1312···Signal packet indicator 630···Internal setting 900, 1000, 1100, 1200, 1400, 635, 69l···Package number 1500... Demonstration step 661···Data packet 1300·· · Waveform 38

Claims (1)

200915752 十、申請專利範圍·· 1·-種用於測試—無線通訊裝置之測試儀器,其包含: -無線收發器,其操作來於一第—模式中操作時發 5 子—第—序列封包,於-第二模式中操作時發射—第二 序列封包,與接收應答封包;以及 —控制器’其操作來控魏收發ϋ發射該第-序列 封包’並用以響應發射該第—相封包之每—封包而計 f該收發器接收之該等應答封包,以及該計數超過一預 1 $°十數4 ’用於控制該收發器發射該第二序列封包。 1〇 2_如申請專利範圍第1項之測試儀器,其中該收發器於該 第i式中操作時以一第一功率準位,而於該第二模式 中操作時以一第二功率準位發射。 3.如申請專利範圍第2項之測試儀器,其中該收發器用以 5 響應發射該第一序列封包而發射—預定數量之封包但 5 ^接收該等應答封包的至少其中之-時,該控制器將該 第功率準位設定為一預定的功率準位。 4·如申請專利範圍第1項之測試儀器,其中該收發器於該 第一模式時使用-第-調變技術,而於該第二模式時使 用一第二調變技術發射。 •如申請專利範圍第i項之測試儀器,其中該收發器於該 第一模式時以一第一資料速率,而於該第二模式時以— 第二資料速率發射。 6.如申请專利範圍第1項之測試儀器,更包含操作來儲存 資訊之記憶體,該資訊包括該第一模式、該第二模式、 39 200915752 發射之封包總數量、封包類型之應答封包的總數量、與 接收之波形應答封包的總數量之至少其中之一。 7. 如申請專利範圍第6項之測試儀器,其中已發射一預定 數量之封包並接收一最後應答封包之後,該控制器操作 5 來將該資訊轉移至一分析系統。 8. 如申請專利範圍第7項之測試儀器,其中該分析系統操 作來根據該資訊以判定一靈敏度值與一封包錯誤率的 至少其中之一。 9. 一種位於一測試環境中之無線通訊系統包含如申請專 10 利範圍第1項之測試儀器,並進一步包含一受測裝置 (DUT),該DUT操作來接收該第一序列封包,並且該第 一序列封包之每一封包被接收後發射該等應答封包。 10. —種用於測試一無線通訊裝置之方法,其包含下列步 驟: 15 於一第一模式操作時,發射由一預定臨界值分開之 一第一序列封包; 用以響應發射該第一序列封包之每一封包而接收 一應答封包; 計算該等接收之應答封包;以及 20 該計數超過一預定計數,並於該第二模式中操作時 發射一第二序列封包。 11. 如申請專利範圍第10項之方法,更包含於該第一模式中 操作時以一第一功率準位發射,而於該第二模式中操作 時以一第二功率準位發射。 40 200915752 +申明專利犯圍第11項之方法,更包含用以響應發射該 第—序列封包而已經發射_預定數量之封包但未接收 =等應答封包的至少其中之-時,將該第-功率準位設 定為一預定的功率準位。 5 申請專職圍⑽項之方法,更包含於該第—模式中 操作時使用—第—崎技術發射,而践第二模式中操 作時使用一第二調變技術發射。 K如申請專利範圍第1G項之方法,更包含於該第—模式中 10 糾乍時以一第一資料速率發射,而於該第二模式中操作 10 時以一第二資料速率發射。 15_如申請專利範圍第1G項之方法,更包含儲存包括該第一 模式、该第二模式、發射之封包總數量、封包類型之應 答封包的總數量、與接收之波形應答封包的總數量之至 少其中之一的資訊。 16. 如申請專利範圍第15項之方法,更包含已發射一預定數 量之封包並接收一最後應答封包之後,將該資訊轉移至 一分析系統。 17. 如申請專利範圍第15項之方法,更包含根據該資訊來判 定一靈敏度值與一封包錯誤率的至少其中之一。 41200915752 X. Patent Application Scope 1. Test instrument for testing-wireless communication device, which comprises: - a wireless transceiver, which operates to generate 5 sub-sequence packets when operating in a first mode Transmitting in the second mode - the second sequence of packets, and receiving the acknowledgement packet; and - the controller 'operating to control the transmit and receive, transmitting the first sequence packet' and responding to transmitting the first phase packet Each of the packets received by the transceiver, and the count exceeds a pre-$1 tens 4' for controlling the transceiver to transmit the second sequence of packets. 1. The test apparatus of claim 1, wherein the transceiver operates at a first power level in the ith mode and a second power level in the second mode operation Bit transmission. 3. The test apparatus of claim 2, wherein the transceiver is configured to transmit in response to transmitting the first sequence of packets - a predetermined number of packets but 5 ^ receive at least one of the response packets, the control The first power level is set to a predetermined power level. 4. The test apparatus of claim 1, wherein the transceiver uses a -first modulation technique in the first mode and a second modulation technique in the second mode. • The test apparatus of claim i, wherein the transceiver transmits at a first data rate in the first mode and at a second data rate in the second mode. 6. The test instrument of claim 1 further comprising a memory for storing information, the information including the first mode, the second mode, the total number of packets transmitted by 200915752, and the response packet of the packet type. At least one of the total number and the total number of waveform response packets received. 7. If the test instrument of claim 6 is applied, wherein a predetermined number of packets have been transmitted and a final response packet has been received, the controller operates 5 to transfer the information to an analysis system. 8. The test apparatus of claim 7, wherein the analysis system operates to determine at least one of a sensitivity value and a packet error rate based on the information. 9. A wireless communication system in a test environment comprising a test instrument as claimed in claim 1 and further comprising a device under test (DUT) operative to receive the first sequence of packets and Each of the packets of the first sequence of packets is received and transmitted. 10. A method for testing a wireless communication device, comprising the steps of: 15 in a first mode operation, transmitting a first sequence packet separated by a predetermined threshold; responsive to transmitting the first sequence Each packet of the packet receives a response packet; the received response packet is calculated; and 20 the count exceeds a predetermined count, and a second sequence packet is transmitted when operating in the second mode. 11. The method of claim 10, further comprising transmitting at a first power level when operating in the first mode and transmitting at a second power level when operating in the second mode. 40 200915752 + A method for claiming a patent, in addition to clause 11, further comprising, in response to transmitting the first sequence packet, having transmitted a predetermined number of packets but not receiving = at least one of the response packets, the first The power level is set to a predetermined power level. 5 The method for applying for full-time (10) is also included in the first-mode operation using the -Saki-Technology launch, while the second mode is used in the second mode to transmit using a second modulation technique. K, as in the method of claim 1G of the patent scope, is further included in the first mode when 10 corrections are transmitted at a first data rate, and in the second mode operation 10 is transmitted at a second data rate. 15_ The method of claim 1G, further comprising storing the first mode, the second mode, the total number of packets transmitted, the total number of response packets of the packet type, and the total number of waveform response packets received. At least one of the information. 16. If the method of claim 15 further includes transmitting a predetermined number of packets and receiving a final response packet, the information is transferred to an analysis system. 17. The method of claim 15, further comprising determining at least one of a sensitivity value and a packet error rate based on the information. 41
TW97131124A 2007-08-16 2008-08-15 System for testing an embedded wireless transceiver TWI431955B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/839,814 US8131223B2 (en) 2006-04-14 2007-08-16 System for testing an embedded wireless transceiver
US11/839,828 US7865147B2 (en) 2006-04-14 2007-08-16 System for testing an embedded wireless transceiver

Publications (2)

Publication Number Publication Date
TW200915752A true TW200915752A (en) 2009-04-01
TWI431955B TWI431955B (en) 2014-03-21

Family

ID=40351072

Family Applications (2)

Application Number Title Priority Date Filing Date
TW97131124A TWI431955B (en) 2007-08-16 2008-08-15 System for testing an embedded wireless transceiver
TW97131120A TWI442721B (en) 2007-08-16 2008-08-15 System for testing an embedded wireless transceiver

Family Applications After (1)

Application Number Title Priority Date Filing Date
TW97131120A TWI442721B (en) 2007-08-16 2008-08-15 System for testing an embedded wireless transceiver

Country Status (5)

Country Link
EP (1) EP2188925A1 (en)
CN (1) CN101828345B (en)
MX (1) MX2010001835A (en)
TW (2) TWI431955B (en)
WO (2) WO2009023521A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8693351B2 (en) * 2011-07-26 2014-04-08 Litepoint Corporation System and method for deterministic testing of packet error rate in electronic devices
US9671445B2 (en) * 2013-03-15 2017-06-06 Litepoint Corporation System and method for testing radio frequency wireless signal transceivers using wireless test signals
US9485040B2 (en) * 2013-08-05 2016-11-01 Litepoint Corporation Method for testing sensitivity of a data packet signal transceiver
US9319154B2 (en) * 2014-04-18 2016-04-19 Litepoint Corporation Method for testing multiple data packet signal transceivers with a shared tester to maximize tester use and minimize test time

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5337316A (en) * 1992-01-31 1994-08-09 Motorola, Inc. Transceiver self-diagnostic testing apparatus and method
US5481186A (en) * 1994-10-03 1996-01-02 At&T Corp. Method and apparatus for integrated testing of a system containing digital and radio frequency circuits
CN1592245A (en) * 2003-09-02 2005-03-09 皇家飞利浦电子股份有限公司 Power controlling method and apparatus for use in WLAN
GB2421401A (en) * 2004-12-15 2006-06-21 Agilent Technologies Inc Test instrument for testing a wireless device
US20060183432A1 (en) * 2005-01-12 2006-08-17 Donald Breslin Calibration using range of transmit powers
US20070002753A1 (en) * 2005-06-30 2007-01-04 Bailey Michael D System and method for testing a packet data communications device
KR20070030052A (en) * 2005-09-12 2007-03-15 엘지전자 주식회사 Method for performance testing of mobile phone, apparatus and system thereof
US20070072599A1 (en) * 2005-09-27 2007-03-29 Romine Christopher M Device manufacturing using the device's embedded wireless technology
US20070167155A1 (en) * 2006-01-19 2007-07-19 Yokogawa Electric Corporation Tester and test system for wireless device

Also Published As

Publication number Publication date
WO2009023521A1 (en) 2009-02-19
TWI431955B (en) 2014-03-21
WO2009023514A1 (en) 2009-02-19
TWI442721B (en) 2014-06-21
TW200924406A (en) 2009-06-01
CN101828345A (en) 2010-09-08
EP2188925A1 (en) 2010-05-26
CN101828345B (en) 2013-12-11
MX2010001835A (en) 2010-03-25

Similar Documents

Publication Publication Date Title
KR101331266B1 (en) Method for testing embedded wireless transceiver with minimal interaction between wireless transceiver and host processor during testing
TWI483563B (en) Apparatus, system and method for calibrating and verifying a wireless communication device
KR101967473B1 (en) System and method for deterministic testing of packet error rate in electronic devices
TWI489803B (en) Method for testing wireless devices using predefined test segments initiated by over-the-air signal characteristics
TWI442072B (en) Apparatus and method for testing a wireless transceiver
TWI578725B (en) Method for efficient parallel testing of time division duplex (tdd) communications systems
US10296433B2 (en) Method for transferring and confirming transfer of predefined data to a device under test (DUT) during a test sequence
TW201225553A (en) Achieving greater test efficiencies using acknowledgement signal suppression
TW200915752A (en) System for testing an embedded wireless transceiver
JP2008533776A5 (en)
JP2006060762A5 (en)
KR102605295B1 (en) Radio Frequency (RF) Data Packet Signal Transceiver Packet Error Rate Test Method
WO2015073400A1 (en) System and method for data packet transceiver testing after signal calibration and power settling to minimize test time
US20090319826A1 (en) Apparatus and method for testing a communication circuit
WO2015077085A1 (en) System and method for enabling testing a data link of a data packet signal transceiver
JP2006270462A (en) Radio sensor device and radio sensor system using same