TW200904774A - Dielectric ceramic and laminated ceramic capacitor - Google Patents

Abstract

To provide a dielectric ceramic, which has high permittivity, has specific permittivity which varies depending upon temperature so as to satisfy X5R characteristics in EIA specifications, and can realize high insulation resistance even in the case of low applied voltage, and a laminated ceramic capacitor which comprises the dielectric ceramic as a dielectric layer and is excellent in service life properties in a high-temperature load test. A dielectric ceramic composed mainly of barium titanate having a different Ca concentration. The dielectric ceramic contains, based on 100 moles of barium constituting the dielectric ceramic, 0.05 to 0.3 mole, in terms of V2O5, of vanadium, 0 to 1 mole, in terms of MgO, of magnesium, 0 to 0.5 mole, in terms of MnO, of manganese, and 0.4 to 1.5 moles, in terms of RE2O3, of a rare earth element (RE) selected from yttrium, dysprosium, holmium, and erbium. In an X-ray diffraction chart of the dielectric ceramic, the diffraction intensity of (004) plane, which shows tetragonal barium titanate, is larger than the diffraction intensity of (400) plane which shows cubic barium titanate.

Description

200904774 IX. Description of the Invention: [Technical Field] The present invention relates to a dielectric particle composed of barium titanate as a main component, and its use as a dielectric layer [Prior Art] In recent years, the increase in the density of electronic circuits has increased the miniaturization of electronic components. With this phenomenon, each of the laminated ceramic & capacitors! The dielectric stratification of the layer evolves and requires that the dielectric ceramics used as a capacitor can be maintained even if thinned. In particular, in terms of miniaturization and large capacitance of a medium-voltage capacitor using a high rated voltage, it is highly demanding for dielectric ceramics. Conventionally, the material constituting the internal electrode layer is made of a base metal and is electrostatically charged.

A technique in which the temperature change of the capacitor (hereinafter referred to as "temperature change of the dielectric constant") satisfies the X5R characteristic of the EH specification (-55 to 85 〇C, ΑΟ±15% or less) is as in I; the applicant of the present application is in Patent Document 1. Revealed the dielectric pottery. This technology uses a crystal particle composed of two kinds of barium titanate having different calcium concentrations to form a dielectric ceramic. The crystal particles are formed into a core shell by containing magnesium, a rare earth element (RE) and manganese. The structure, thereby increasing the dielectric constant, and the life characteristics in the high temperature load test of the insulation resistance (IR) is improved. However, with the rapid development of miniaturization and large capacitance, it is required to further improve reliability. Further, the dielectric ceramic layer for the dielectric layer constituting the laminated ceramic capacitor is as described in Patent Document 1, and the temperature variation of the dielectric constant satisfies the X5R characteristic of the εια specification 97111695 5 200904774, and the high temperature load test of the insulation resistance. Dielectric ceramics capable of improving life characteristics are also known as disclosed in Patent Documents 2 and 3. The dielectric ceramic disclosed in Patent Document 2 contains magnesium, a rare earth element, vanadium, or the like in the barium titanate which is a main component of the crystal particles constituting the dielectric ceramic, and is formed in an X-ray diffraction pattern. The ray of the (2〇〇) plane around the ray disk (〇〇2) partially overlaps to form a crystal structure with a wide ray.

It is called "core-shell structure", which is used to improve the insulation breakdown voltage and the life characteristics in the insulation load test. Further, in the dielectric ceramics disclosed in Patent Document 3, by adjusting the valence of the ruthenium dissolved in the bismuth citrate to a value close to the valence of 4, the electron mobility existing in the crystallization = is suppressed and suppressed. (4) Excessive occurrence of barium titanate = precipitation of vanadium and chemical compounds 'formed in the crystal particles, vanadium is moderately concentrated == phase of the core-shell structure', thereby raising the high temperature load test" L Patent Literature 1] Japanese Laid-Open Patent Publication No. Hei. No. Hei. No. Hei. Hei. No. Hei. No. Hei. No. Hei. No. Hei. == Patent Document Η Reveals that the temperature variation of the dielectric constant and the electrical constant satisfies the X5R characteristic of the ΕΙΑ specification. When the electrical potential plus the electromigration is low, a high insulation resistance can be obtained, and when the preparation is applied, the insulation resistance is lowered. For the larger problem, the voltage applied is increased, and the dielectric layer of the dielectric ceramic layer is used as the layer of the dielectric f layer "p 97111695 200904774". Taguchi; the insulation resistance of the ceramics is reduced, resulting in the situation of human + #, which is quite difficult; ^, ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ ^ Life characteristics. The purpose of the invention is to provide a high dielectric constant and a change in the dielectric constant of the X5R characteristic of the EU specification, even if the temperature of the ^^ number of cases can still obtain a high dielectric resistance, when the voltage is lower = the lower dielectric ceramic . &quot;The reduction of the edge-resistance of the dielectric ceramics is excellent in the performance of the _ ^ 贞 试验 试验 您 您 您 您 您 您 您 您 您 您 您 您 您 您 您 您 您 杠 杠 杠 杠 杠 杠 杠 杠 杠 杠 杠 杠(Means for Solving the Problem) The dielectric ceramics of the present invention are made of titanic acid and barium titanate: and the composition is 0 05~0 3 苴I s. Vanadium is V2〇5 Conversion meter Zengye (^ stem according to the price of the card (a) Moer ~ Mengyi (four) for the special meter. 5 Mo, and from the 钇, 镝, 鈥 and molybdenum according to the Α 族 _ _ _ _ _ _ _ _ _ 2: The dilute particle system has a working crystal group composed of the above-mentioned barium titanate and the crystal particles of the above-mentioned material in an amount of not more than 2 atom%, and: the above-mentioned barium titanate is mainly used, and the above _In the X-ray diffraction diagram of the X-ray diffraction diagram of the · 曰 〇 〇 ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; 〇4) The diffraction intensity of the surface is greater than the diffraction intensity of the (4GG) plane representing the cubic crystal barium titanate. In addition, the above-mentioned dielectric ceramics are the most inferior to the 钡1〇〇mole constituting the above-mentioned barium titanate. Good content: the above-mentioned magnesium in terms of MgO conversion 0~0} Moer, the above manganese in terms of MnO conversion 0~5 mol, and one of the above rare earth elements selected from 钇, 镝, 鈥 and bait跗 〇 〇 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 971 Preferably, the dielectric ceramic is contained below the 钡1(10) mole constituting the barium titanate, and the cadmium is in the range of 〇1 to 〇3 mol, and the magnesium is in terms of MgO. 3. 3~9 Mo, manganese Μ 〇 〇 〇 的 的 的 的 的 的 的 的 的 的 的 的 的 的 的 的 的 的 的 的 的 的 的 的 的 及 的 及 及 及 及 及 及 及 及 及 及 及 及 及 及 及 及 及 及 及 及 及〇9摩尔, and the average particle diameter of the above crystal particles is 0. 33~57 / / m. The above dielectric ceramic system is better than the 钡1〇〇莫耳 constituting the above-mentioned barium titanate. In the range of 3 mA or less in terms of Tb4〇7, the dielectric ceramic is preferably contained in the 钡1〇〇2 ear of the barium titanate. 6 ohms or less: The laminated ceramic capacitor of the present invention is characterized in that: the laminated body of the electric shell layer and the internal electrode layer composed of the above dielectric ceramic The reason why the rare earth element is set to "跗" is based on the Rare earth element of the rare earth element in the periodic table. (Invention effect) - (1) The dielectric pottery of the present invention is relative to titanic acid钡 , , , , : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : : 'At the same time, in the X-ray diffraction diagram of the dielectric Tao Xian, the table 97111695 200904774 shows that the diffraction intensity of the (004) plane of the barium titanate tetragonal system is larger than that of the (400) plane representing the barium titanate cubic system. Shooting intensity. Thereby, a high dielectric constant can be formed and the temperature variation of the dielectric constant satisfies the X5R characteristic of the ΠΑ specification. Further, when the applied voltage is low, a high insulation resistance can be obtained, and when the voltage is increased, the insulation resistance is lowered less (the voltage dependence of the insulation resistance is small). (2) The dielectric ceramic according to the present invention is characterized in that: 镁1〇〇 Γ 构成 构成 构成 下 下 下 下 下 下 下 下 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 And the rare earth element (RE) selected from lanthanum, cerium, lanthanum and bait is 〜5 to 15 mol in terms of RE4, and the X-ray diffraction pattern of the dielectric ceramic indicates the titanate-locked tetragonal system The (f)4) plane w-strength is greater than the diffraction intensity indicating the (complete) face of the barium titanate cubic system. In this way, the temperature variation of the electric constant can satisfy the KM characteristic of the HA specification, and the thinning of the dielectric ceramic and the dielectric g layer for the laminated ceramic capacitor can ensure high insulation and high temperature load life. Cao (3) In the dielectric metamorphology of the Ming, when the content of the town is set to (10), the temperature of the dielectric constant can be changed to the x7R characteristic of the A specification. 'At the same time, when the applied voltage is low, 7 I 彖 resistance can be obtained and the voltage dependence of the insulation resistance is smaller. ϋ本 &amp;月;1Electrical chemistry<When the clock content is set to When MnO is exchanged for two moles, a dielectric ceramic tile having a small voltage dependence of the insulation resistance can be obtained, and the dielectric loss can be reduced. (5) The dielectric of the present invention is preferably relative to the yttrium yttrium titanate. (10) 97111695 200904774 II: There are: Μ Μ Μ Μ 1 1 1 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 From the age, steel, titanium and newcomers, buried, and secret conversion 0. W ^ species of rare earth elements (10) Imol, while the average particle size of the crystal particles will II: full rate can be obtained by lattice ° rejection rate ... 'Shu dielectric loss of the dielectric ceramic. Mo: i Ben: Ming: In the case of human dielectric pottery, when compared with the composition of strontium titanate 钡1 〇0, ==================================================== The insulation resistance of the pottery. For example, when the dielectric layer of this layer of ceramics is used, it is possible to change the life characteristics of the test. (7) In the dielectric ceramic of the present invention, I dry field is compared with the 钡100 耳 构成 ' 更 更 更 更 更 更 更 更 当 当 当 当 当 当 当 当 当 当 当 当 当 当 当 当 当 当 当The change in the dielectric suspension of the dielectric ceramics at the time of change. For example, the use of such a medium-density dielectric ♦ „ „ , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , The capacitance of the device changes, which can improve the yield. Light (8) The laminated ceramics of the present invention has a high dielectric constant by using the above dielectric layer, and the X5R characteristic of the full-scale temperature change of the dielectric constant is more satisfying (10) characteristics. Even if the interlayer of the interlayer is layered, high insulation can be ensured. _ I. A laminated ceramic capacitor with excellent life characteristics in the test.彳The same temperature load test [Embodiment] ° 97111695 200904774 Figure shows the enlarged view of the electric ceramics, which is a schematic diagram of the crystalline particles and the grain boundary phase. The dielectric pottery of the present invention consists of a crystal particle la of a first crystal group mainly composed of a titanate lock having a (four) degree of 0.2 atom% or less, and a titanate of a barium titanate having a mother concentration of G. 4 material UX. The crystal particles 1 b of the 2 crystal group and the grain boundary phase 2 are composed.

The dielectric metamorphism of the present invention is characterized in that: barium titanate is the main component, and the composition of the barium titanate is 0. 05~0. Mohr, magnesium in terms of Mg0 conversion ^ ~ 丨 Mo Er, manganese in terms of MnO conversion 〇 ~ 〇. 5 Mo Er, and tilt, 镝, 鈥 and financial options] species of rare earth elements (RE) in terms of RE4 conversion 0.4 ~1.5 m, and X-ray diffraction pattern of dielectric ceramics, indicating that the diffraction intensity of the (10)4) plane of the barium titanate tetragonal system is greater than the diffraction intensity of the (side) surface of the barium titanate cubic system. . Thereby, the dielectric constant of the dielectric ceramic can reach more than 3 ,, and the temperature change of the dielectric constant satisfies the X5R characteristic of the EIA specification, and the DC voltage value per unit thickness (1/ζιη) is 315 yen. Dielectric ceramics with an insulation resistance of 12. 2xl G8Q or more and an insulation resistance of almost no reduction at 12.", that is, the reason is that under vanadium which constitutes barium titanate, vanadium. The Rie V2〇5 conversion is less than 0. 05 Moule, or the rare earth elements (RE) selected from 钇, 镝, 、, 大 and 铒 are less than 〇4莫耳 in terms of RE2〇3 In the case of 'the base unit (j # m), the DC voltage value of the applied voltage is set to 12 & 5V, the insulation resistance is 2&gt;&lt;1〇8〇 or less' compared to the DC voltage value is set to 3 Under the insulation resistance value at 15V, the insulation resistance is lowered. I. 9711 (10) 5 11 200904774 Furthermore, the reason is relative to the 钡1〇〇 Mo, which constitutes barium titanate, if the vanadium content depends on V2〇 5 The conversion meter is more than 0·3 moles, and the DC voltage value per unit thickness is set to 3.15V and 12·..., the insulation power is 1 and low. 1 χ 108 Ω. — Furthermore, the reason is that the content of arsenic (RE) from 钇, 镝, 鈥 and bait is more than 丨.5 mol, or manganese content in terms of RE&quot;3. When the amount of force is less than 3 _, the dielectric constant is less than 3 _ ^. / Again, the reason is that when the magnesium content is more than i mole in terms of Mg ,, the temperature change of the electrostatic capacitance is not When the X5R characteristic of the EIA standard is satisfied, and the DC voltage value per unit thickness (l#m) is set to 3·15v and 12_5v, the insulation resistance decreases, and the life characteristics in the high-temperature load test decrease. Furthermore, the dielectric ceramics of the present invention is as described above, and the focus is on the diffraction pattern of the χ ray, and the diffraction intensity of the (〇〇4) plane of the square tetragonal barium titanate is greater than G for cubic titanium. The diffraction intensity of the (400) side of the acid strontium is particularly the result of the formation of the crystal of the invention of the dielectric Tao, which is preferably occupied by a crystal phase which represents a nearly single phase of the tetragonal system. Figure 2 (a) The X-ray diffraction pattern of the sample Nq.4 of the dielectric ceramics of the present invention is shown in Table 6 of the embodiment to be described later. Fig. 2(b) shows the table. In the comparative example dielectric ceramic sample Ν〇·51 χ ray diffraction diagram. The X-ray diffraction pattern shown in Fig. 2(b) belongs to the sputum barium titanate as the main knives and has a core-shell structure. The X-ray diffraction pattern of the dielectric ceramics formed by the crystal particles is between the (10) 4) face and the (deleted) face of the barium titanate tetragonal system. 9711695 12 200904774 The second is the barium titanate cubic system. The diffraction intensity of the (4〇〇) face [(〇4〇) face, () face heavy] is greater than the diffraction intensity of the (10)4) face of the barium titanate tetragonal system. The crystal structure has such a structure that the rare earth element (RE) is not dissolved in the strong dielectric phase portion (core portion) of the inside of the crystal particle, and the rare earth element (RE) is dissolved in the ferroelectric phase portion. The surrounding Changshang Emperor (4) is equivalent to the dielectric ceramics described in the special description of the core shell structure. C. The dielectric ceramic is formed by adding at least an oxide powder of a rare earth element (10)) to a powder containing barium titanate as a main component, and then forming it by firing. In this case, the crystal particles having a core-shell structure, such as a rare earth element (10), are diffused in the shell portion belonging to the peripheral portion of the crystal particle, and the component of the rare earth element (10) is not solid-solved in the core portion. Inside the crystal particles, a defect state including a large number of oxygen pores is formed. Therefore, when a DC voltage is applied, an oxygen hole or the like is likely to be a carrier for carrying electric charges inside the crystal particles, and it is judged that the insulation of the dielectric U is lowered. On the other hand, the dielectric ceramic of the present invention is as shown in FIG. 2( a ), and the X-ray diffraction pattern of the dielectric ceramics indicates that the diffraction intensity of the (10) plane of the barium titanate tetragonal system is larger than that of titanium. The diffracted surface of the acid crystal cubic system is strong, that is, the dielectric ceramic system of the present invention is as shown in Fig. 2(a), and the (10) plane indicating the barium titanate tetragonal system is clearly present (2 Bu Gang (near) and (to) face (10): 101. X-ray diffraction peak near), between the (4) (4) plane and the (4GG) plane indicating the barium titanate tetragonal system, the (400) plane representing the titanate lock cube 97111695 13 200904774 crystal system appears [(〇4 〇) surface, (4〇〇) surface overlap] The diffraction intensity is smaller than the diffraction intensity of the (〇0 4) plane representing the Qin &amp; pin square crystal system. &lt;Specially, when the diffraction intensity of the (10) 4) plane representing the titanate crystal system is Ixt, the diffraction intensity of the (4 〇〇) plane representing the cubic crystal of barium titanate is again, Ixc b ' Ixt The ratio of /Ixc is preferably κ 4~2. If the ratio is ~., the crystal growth ratio of the tetragonal crystal system is increased, and the rate of change of the insulation resistance can be further reduced, and the life characteristics in the high temperature load test can be improved. In the present invention, the dielectric ceramics, lanthanum, manganese, and rare earth elements (10) are solid-solved inside the crystal grains to form a substantially uniform crystal phase of the tetragonal system. The station suppresses the formation of defects such as oxygen holes in the crystal particles, and conveys the charge of the charge. Therefore, it is judged that the dielectric ceramic insulating property is lowered when the DC voltage is applied. & Gentleman is composed of crystal particles 1 a of the first crystal group and sub-lb of the second crystal group; "the average particle diameter of the scoop, preferably u. 15~〇. 7# m. The reason why the family element (10)) uses the choice of self-discipline, 镝, 鈥 and ethnic elements is that it is difficult to obtain high insulation when it is dissolved in the acid lock, and it is improved from the dielectric ceramics. The reason for the electric constant is preferably 钇. The above-mentioned, and in the middle of the ear, by 钡100 with respect to the composition of barium titanate, the conversion is two:%: according to: 2. 5 conversion meter 0 preparation °. 3 mole , (10) 0 0, cadmium, moir, manganese _ 〇 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 0.5 Rule 9711695 200904774 The X7R characteristic of the grid and the dielectric layer of the dielectric ceramic a capacitor when the two θ b is applied to the laminated ceramic in this case 'by the crystallization of the crystallization group and the high temperature load life. Crystallized particles lb欉ώ^日日日日日日日日日日日日日日日日日日日日日日日日日日日日日日日日日日It is better to set it as μ U7~〇.4#m. It is::, 'It is best to use barium titanate as the main component, and it is relative to the 钡100m under the composition of the titanium , Α士毒〇05~0 3 U ^, the next 3: 鈒 According to V2〇5 conversion.” 3 Mo, manganese _ conversion 〇. 5 Moel below: Tube leaves... &quot;Selected rare earth The family element (10) is changed according to the version 〇3, and the content of the town at the same time is converted to 10% in terms of %〇. Two: The temperature change of the w number satisfies the nR characteristic of the EIA specification, and the same, &amp; DC voltage is between Ιϋ2·5V per unit thickness 〇#m) of the dielectric layer, and the insulation resistance increasing tendency is obtained ( : I)) Insulating dielectric ceramics. In the above composition, it is preferable to select a rare earth group of yttrium, lanthanum, lanthanum and cerium from 0.05 to 0.3 mol in terms of vanadium in terms of V2 〇5 with respect to 钡100 构成 which constitutes barium titanate. The element (this) is calculated according to 胧2〇3 5·5~1·5 mol, and magnesium is calculated in terms of Mg〇, and the manganese content is 0 mol in terms of MnO. Thereby, the loss of the dielectric ceramic can be further reduced. Here, "the amount of 0 moles and the content of manganese in the case of 钡1〇〇mole constituting barium titanate" means that magnesium and manganese are not substantially contained in the dielectric ceramics. For example, the amount below the detection limit of ICP emission spectroscopic analysis (0.5 / zg / g or less). 97111695 15 200904774 The preferred composition is in the range of 0.3 mol or less in terms of Tb4〇7 in terms of 钡1〇〇mol comprising strontium titanate. , if it is more than the 钡1〇〇mole that constitutes barium titanate,

In the range below Tm4〇7, the dielectric ceramic μ = resistance can be increased in the range below 3 m. When the above-mentioned dielectric layer is used as the laminated electric layer, the life in the high-temperature load test can be further improved. When the amount of the test is more than 〇3 mol in terms of Tb4〇7, the dielectric constant of the ceramic is lowered.上述Electricity In the above composition, 钡1〇〇 with respect to the composition of barium titanate contains: vanadium in terms of V2〇5 conversion nn QV takes 0 s n Q for the Gan?矣 冲 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0 0.9 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 镁 0.9 0.9 0.9 镁 0.9 0.9 Family elements (10) according to the heart;; Therefore, when the dielectric layer is applied to the dielectric layer per unit thickness (1#11〇, the DC power is repeatedly set to 3.15^12.5^, and the insulation resistance helmet between the 3. Research and 12.5V is lowered.) * , , , ~ low clear shape, can obtain high insulation, and "sorrowful high reliability dielectric Tao Jing, at the same time can make the dielectric constant of more than 4000, and the dielectric loss is less than 13.5%. In this case, the composition The average particle size of the dielectric ceramic (four) crystal grains is preferably u· dd~U. 57/zm. In addition, in the above composition, the 钡100 molar two of the composition of the barium titanate r: hungry v 2 0 5 conversion meter 0.1~0.3 moer, town espresso change ^100.3~0·9 Mo Er, Zhong Yi _ conversion words ten 0. 05~0.5 Mo Er, and the discipline, 镝, 鈥 and 铒 one, RE2〇3 conversion meter 4~〇9茬 ear, fighter, family 疋素(10)依..9莫耳,同知有轼轼Tb4〇7 conversion meter 97111695 16 200904774 0.3 Mo + ear below the range, The insulation resistance of the dielectric ceramic can be further improved, thereby further increasing the high-temperature load life, and the constant of the dielectric ceramic can be increased by more than 5 GGG. Further, by setting this composition, When the average particle diameter of the crystal particles is in the range of 0.5b to 0.57#m, the dielectric constant can be increased to 6010 or more. * Further, the dielectric ceramic of the present invention is relative to the 钡1〇〇 constituting barium titanate. Moer's: It can be further included in the range of 0.6 m or less in terms of conversion according to Υ^〇3. If this composition is used, the dielectric constant can be suppressed even if the firing temperature changes by about 5 〇艽. Therefore, even if a large-scale baking furnace which is prone to temperature fluctuation is used, variations in the dielectric properties (dielectric constant, dielectric loss, etc.) of each dielectric ceramic can be reduced, and the yield can be improved. In order to obtain a sufficient effect by utilizing the content of cerium, it is preferable to use 3. 3 摩尔 or more. The dielectric ceramic of the present invention is mainly composed of barium titanate as described above, and contains yttrium in the above ratio. (2) In addition, the dielectric ceramics of the present invention can be maintained at a ratio of 2% by mass or less in dielectric ceramics. :: The glass component of the sinter adjuvant and other added components. The Ϊ constitutes the crystal grain + la of the first crystal group, and the average particle diameter of the crystal particles 1 constituting the second crystal grain lb, and the polished surface of the section is subjected to cross-section polishing, and the use of the penetration gold ', ', + The image that is not visible in the mirror is read in the computer, and the diagonal and the line are on the surface of the mirror. On the diagonal line, there is a sinusoidal injury, and the sputum is smashed. The puller profile is centered and the area of each particle is determined, and the diameter when substituted with a phase of 9711695 17 200904774 is calculated, and the average value of the calculated crystal is obtained. Phase = (four) degrees in the crystal grains, elemental analysis was carried out by using a penetrating electron microscope of about 3 crystal particles present in the surface of the dielectric (four) cross section. The size of the spot of the two f: beamlets is set to 5, and the analyzed area is on the straight line drawn from the vicinity of the grain boundary of the ^^^, toward the center, according to the roughly equal interval = ::, and the analysis value is The average value of the analysis value of the W point between the vicinity of the grain boundary and the central portion, Ba, T1, Ca, V, Mg, 豨+ * detected by each measurement point of the sho One, the total amount of rare earth private sputum (RE) and Μη is set to l〇(U ' and the Ca concentration at this time is obtained. The selected crystal particles are calculated by image processing from the veranda and each particle is replaced by The diameter of the circle with the same area, and the particle diameter of the particle size is within the range of the average crystal grain size side. It is regarded as the knotted day particle. The outer part is called the "central part of the crystal particle". The radius of 1/3 of the radius of 1/3 is the range of the radius of the circle; 'the vicinity of the grain boundary of the crystal grain' means the area inside the crystal grain η: the inner side of the crystal particle The circle will be read into the computer using the image displayed by the lens, and the inscribed circle will be drawn in the written object. The dielectric ceramics of the central portion of the m-particles are as described above, and the crystal particles have the following: 1, the crystal particles of the crystal group 1, and the crystal particles lb of the second crystal group. When the crystal particles 1 &amp; face 97111695 18 200904774 constituting the i-th crystal group are set to Cl, and the area of the crystal particles lb constituting the second crystal group is C2, 'C2/(C1+C2) is preferably 0.8~. 0.99. The crystal particles lb constituting the second crystal group exhibit a high Curie temperature as compared with the crystal particles la constituting the first crystal group because of the solid solution of calcium. Therefore, the second crystal is formed. The crystallized particle ratio of the group 'by setting it within the above range' can increase the dielectric constant at high temperatures while having the advantage that the temperature change of the dielectric constant can satisfy the eia specification and the X5R characteristic. The area ratio of the crystal particles 1a constituting the first crystal group to the crystal particles lb of the crystal group is calculated by using the area data obtained when the average particle diameter is obtained. First, it is for the manufacture of the dielectric ceramics of the present invention. The second line of the study is explained. The first name is "BT= Preparation: Barium titanate powder with a purity of 99% or more (the following "BC / I at the end; ^, and 钦 钡 钡 固 固 固 ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( ( And _ powder, choose! species Su +, 203 powder, H 〇 203 powder and Er203 powder, select 70 kinds of oxide powder and MnC 〇 3 powder. Another #, ^ dielectric ceramic with right 筮 9 丄# _ 士 ^力,, in the case of oxides (IV), rare earth elements:: Use Tb4〇7 powder. In addition, the case of 33 rare earth elements is useful powder. It is preferable to make the fractional system to replace the partial A site with the titanic acid as the solid solution of the main knives. According to the "head-based amount, it is preferable to set MCa instead of 97111695 0.2. The right Ca substitution amount is within the range. By the coexistence of 19 200904774 with the first crystal particles 1 a 槿Ρ μ &amp; ,, , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , Thereby, when used as a capacitor, excellent temperature characteristics can be obtained in the temperature range of use. Further, the Ca contained in the second crystal particles lb is dissolved in the form (4) dispersed in the second crystal particles ib. Again: the average granule pinch of the BT...BCT powder is preferably .5 (four). When the average particle diameter of the BT powder and the BCT powder is as large as above, the first crystal particles 1a and the second crystal particles 1b have U properties, and thus have an advantage of increasing the dielectric constant. When the average particle diameter of the other powder and the BCT powder is 〇15&quot;, the additives such as the rare earth element (10) and the clock can be easily dissolved to the i-th crystal particle 1 a and the first. 4 s private Ί k ^, brother Z,,, the mouth of the day pull 1b inside, and as will be described later, and there are (four) &quot;T powder and BCT powder, respectively crystallized crystal group of crystal ..., and constitute the second crystal Group Ϊ = the advantage of the growth ratio. Τ Τ powder and aerospace powder == agent from the scratch powder, Dy2 〇 3 powder, Η〇 2 〇 3 powder and _ ^ end, select a rare earth element (10) oxide powder, make 7 two flat 2 Q end, V2 〇5 powder, Mg0 powder, and MnC〇3 powder, i is preferably used in combination with a dielectric powder such as a lamp powder and a powder, and a BT powder and a βα powder: a second molar. Powder W Mo, Μ = .5 mol, from Υ2〇3 powder, Dy2〇3 powder, Η〇2〇3 powder and 97111695 20 200904774 βι*2〇3 powder _ selected pendulum. .... Mo Er ====R£) According to the (10) conversion, the rare earth element Tb4〇7 powder. Depending on the case, the second Yb2〇3 powder is added to 0.6 mol of the 3rd rare earth element. However, if the dispersibility in the amount of the material is lowered, it is difficult to obtain the uniformity = it is preferably set within the above composition range. . Secondly, after (4) = competition, after degreasing, it is fired in a reducing environmental towel. U 7 body is applied additionally. 'When manufacturing the dielectric ceramics of the present invention, if it can be in the range of (4) human electric hiding, it is also possible to add a sintering aid to the glass breaking powder:: The two-story is to be the main raw material powder. Βτ powder and BCT and: When it is set to _f, it is preferable to add 0.5 to 2 parts by mass / σ juice amount. When the firing temperature is a sintering aid such as glass powder, the solid solution of the bismuth powder and Βα powder is added. With = crystal: the reason for growth, it is best to set the thief. When the :::: 兀 镱 镱 镱 镱 镱 镱 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 On the other hand, when the (9) auxiliary agent is not used, such as glass powder or the like, and the pressure baking is performed by a hot press method or the like, it is possible to:: less than 1050. (Sintering at a temperature. In the present invention, in order to obtain the dielectric ceramic 'by using a fine particle of βτ powder and BCT powder' and adding a predetermined amount of the above-mentioned additive, and firing according to the above /JHL degree Then, the average particle diameter of the barium powder containing the various additives and the BCT powder is burned to be more than twice as large as before and after the firing = 97111695 21 200904774. By the average particle diameter of the calcined crystal particles, The average particle diameter of the calcined powder containing vanadium and other additives is twice or more, and the crystal particles 1 contain at least vanadium, a rare earth element (RE), and a second earthworm, and optionally contain magnesium. It is dissolved in the crystal particles and the whole of manganese. The result is that it can suppress the occurrence of defects such as oxygen pores in the crystal particles, and it is judged that the carrier that transports the charge is in a small state. ^The person's wealth, after firing And again in the weak reduction environment: treatment. The heat treatment of the last item is to re-oxidize the reduced dielectric ceramic during firing in a reducing environment, and when firing

The insulation resistance is returned to the German and the temperature from the sore „T is the reason why the amount of reoxidation can be increased under the condition that the growth of the crystal grains of the second crystal group is further suppressed. In the case of the first crystal group, the pull crystal la and the crystal crystal particles constituting the second crystal group can be brought into the form of the insulating crystal particles. Electric (4). &quot; =3 shows the outer layer P electrode 4 at the two end portions of the capacitor body 1G in the example of the laminated ceramic capacitor of the present invention. In addition, the Raytheon 7 3-^^ body 10 is made of dielectric The product layer 5 and the internal electrode layer 7 are stacked in a stack. The bank 5 is composed of a slab, a +, a squirrel, and a seven-layer body 10A. Therefore, the dielectric is formed by a dielectric. In addition, in Fig. 3作 穑 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 卩 本 本 本 本 本 本 本 本 本 本 本The laminated ceramics capacitor of the present invention can obtain high dielectric constant by using the dielectric layer 5 system to make 9711695 22 200904774 electric ceramics. And the temperature characteristic of the dielectric constant, the _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ Here, in (4), it is preferable that the thickness of the dielectric layer 5 is set to be less than &lt; 2.5/^, which contributes to the lamination of the ceramics, and the change of the electrostatic capacitance of the present invention and electricity: Capacitance, crystallization, dielectric Μ 5 thickness, take and electric valley temperature characteristics E stability of the internal electrode layer 7 is even better on the 22nd. Viewpoint, preferably such as paving J) manufacturing cost It is preferable to use the dielectric f # /蜀 of the present invention, in particular, from the viewpoint of the formation of the layer 5 to the firing, it is preferable that the external electrode 4 is formed, for example, of Cu or yttrium. The alloy paste is applied secondly to the system of the laminated ceramics capacitors. The special organic paint is added to the powder. Then, the ceramic slurry is used to form a sheet of 5-week-made ceramic powder. The law forms the pottery j main 4, the slit coating method is to make the dielectric shoulder 5 ancient: ^ Μ, the thickness of the ceramic sheet Preferably, it is set to be 4: the lining of the glutenization, and the high insulation ** μ m 〇 in the obtained ceramic embryo # pattern. The internal electrode 成为 is printed on the main surface to form a rectangular internal electrode 〜, these The alloy powder; the material of the conductor paste, preferably Ni, the number, and the 庇 Γ has formed the internal electrode pattern of the opacity sheet and the upper and lower pieces of the opaque sheet overlap the desired sheet 97_ into the (four) electrode pattern In the case of ceramics, according to 23 200904774, the upper and lower layers are in the same number of sheets. The internal electricity in the sheet laminate is formed into a sheet laminate. The half pattern is staggered. The pattern is successively oriented toward the long side: The two-layer laminated body is cut into a lattice shape, and the capacitor body molded body is formed by exposing the internal electricity. By this = 亟, the state of the internal electrode pattern after the cut-off electric cross is formed. ° The end faces of the molded body are staggered and exposed. After the body is formed, the body is degreased, and the pottery is the same firing condition and weakly reduced. Then, the heat treatment is performed, and then the coating is applied to the paste of the capacitor body, and the external electrode rubber 4 is applied to the main electrode 4 by twisting and baking. In addition, the externality can improve the mountability and form an electric clock film. Container: ::::: For the dielectric ceramics of the present invention [Examples] [Example 1] Two: Preparation: βτ powder, βα powder (composition system P f X=G·G5), _ powder , powder, Dy2〇3 ♦ minute, = end, = powder, - =: two = BT powder and the powder of the town, etc., and then mix the various powders of the additives according to the ratio shown in Tables 2 and 3. The raw material powder such as Hai is used in a purity of 99·(10). In addition, the average particle size of the powder and the BCT powder is as follows for the samples No. 1-Bu 49, 52, 53 Knife and 97111695 24 200904774 56 90. 1//m 'On the sample Ν〇. &quot;ο与5ι The average particle size is 0.25 (four), and the average particle size 〇12" is used for the sample N〇1_54, 55. Y2〇3#^ ' Dy2〇3t^ 'H〇2〇3#^ ' 'n-terminated, MnC〇3 powder and The V2〇5 powder is a glass powder composed of an average particle diameter of 1 US powder and BCT powder, and the auxiliary agent is made of SiG2=55, Ba(tetra), (10)7, and (4)%. Glass, DPT The addition of the glass terminal is set to 1 part by mass of the total amount of the β Τ powder and the BCT powder, and is set to be the same as the powder of the raw material powder (4). Wet mixing is carried out with a mixture of stupid and alcoholic alcohol. '' : The wet mixed powder is put into a mixed solvent of polyethylene glycol, and it is made to be mixed with the mixed formula of Du M J m T. (4) 祖# 5mm oxidized wrong grinding ball is applied to wet 2.5 (four) ceramic slab....The thickness of the 'thick piece is formed by the squeegee method to form a rectangular inner average particle size with Ni as the main component. 3&quot; Λ 胶 11 胶 胶 胶 胶 胶 11 胶 胶 胶 仫 仫 仫 仫 仫 仫 仫 仫 仫 仫 仫 仫 仫 仫 仫 Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni Ni The printed pottery enamel reads. On the top and bottom of it, there are 360 pieces of the compensation layer, and the layer "electricity% clock: strip:::: including the layer, and then cut into the established ^ in..." _, Shi... When burning r: 97111695 25 200904774 2 in the moon: 4 hours of reoxidation treatment, the electric body is made. The size of the capacitor body is the thickness of the beneficial layer 2, the inner electrode layer is a bank: the right 48Χ〇.48_3' dielectric is additionally, the so-called "effective area"; = \ effective area is 0 · 3 ^ end face exposed way, The "inner body" is formed in different directions, and the burned capacitor has a weight of 4 areas. Macro 5|Floor... After the 仃 仃 笱 笱 笱 , , , , , , , 笱 笱 笱 笱 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四 四A layered ceramic capacitor is produced by sequentially performing electroplating on the surface. Further, the second and second are set to 10 samples for the laminated ceramic electric macros, and the evaluation is performed. Evaluation of temperature muscle, frequency lGkH7 ^ take the thousand mean. The dielectric constant is measured by the electrostatic capacitance: it is obtained from the measurement condition of the dielectric ==:. The other electrode layer is effective -55~125 °C range _set # When + $ μ degree characteristics are based on temperature coffee (four) disk = cut capacitor. Insulation resistance is based on DC power, and is commonly used. Conditional assessment. The insulation resistance of Tables 5, 6 and 9 is indicated by the exponential notation for inserting E between the mantissa and the 抨. The number of days of the shot is measured. The high temperature load test is based on the temperature (10)/(4)). The number of samples in the test is set to crystal:::: two groups of crystal particles, and the "97111695 - the average particle size of the crystal particles" constituting the second crystal group is for the dielectric ceramics 26 200904774 The grinding surface 'takes the shirt image displayed by the transmission electron microscope into the computer' and draws a diagonal line on the surface of the enamel, and performs the crystallization of the crystal rim present on the diagonal of the hai Image processing, and calculate the area of each particle, calculate the straight position when substituted with a circle having the same area, and obtain an average value of about 50 crystal particles of the obtained crystal. Further, the average particle diameter of the crystal particles is determined. The average grain growth rate of the dielectric powder. The calcium concentration in the relevant crystal particles is estimated to be about 30 crystal particles in the dielectric f-layer polishing surface which is ground in the cross section of the laminated ceramic capacitor. Elemental analysis was performed using a penetrating electron microscope with an attached elemental analysis machine. At this time, the spot size of the electron beam was set to _, and the analyzed place was on a straight line drawn from the vicinity of the grain boundary of the crystal grain toward the center. The points are set at substantially equal intervals. The analysis value is an average value of 4 to 5 points between the vicinity of the grain boundary and the center portion, and Ba, Ti, Ga, which are detected from the respective defects of the crystal particles. The total amount of v, Mg, rare earth element (10)) and Μη is set to 譲, and the concentration at this time is obtained. In this case, the selected crystal particles are obtained from the rim by image processing to determine the area of each particle, and are calculated. When the diameter of the crystal having the same area is substituted, the diameter of the crystal particle obtained by the diameter is regarded as a crystal particle within a range of ±60% of the average crystal grain size. The central portion is set to be within a range of 1/3 of the radius from the center of the inscribed circle of the crystal particle, and the vicinity of the grain boundary of the crystal particle is set to a region from the grain boundary to the inside of the crystal particle. The inscribed circle of the particle will use the transmission electron microscope 97111695 27 200904774::: The image shown 'Draws the inscribed circle on the computer surface, and then determines the central part of the crystal particle from the face of the face. j The composition of the dielectric ceramics will constitute The ratio of the area ratio of the crystal particles of the crystal group to the crystal particles of the second crystal group [C2/(CHC2), the area of the crystal particles ia of the first crystal group is represented by u, / the second crystal group is formed. The area of the crystal particles, b, is represented by ^, and is calculated from the area data of the average particle diameter of the crystal particles amp &amp; and 针对 for about 5 上述 of the above. In the sample shown in Table 丨 3, the sample N 1. 1~Heart, Μ' and 56 90 C2/(C1+C2) system 9. 9. Related samples Ν〇. 5〇, 51 and 54 C2/(C1+C2) 〇. 75. Related samples C2/(C1+C2) of N〇. 55 is 0·8. Further, it indicates the diffraction intensity of the (〇〇4) plane of the tetragonal barium titanate, and the surface of the cubic crystal barium titanate ( The ratio of the diffraction intensity of the surface was measured by using an X-ray diffraction apparatus having a Cuk α-tube, measuring at an angle of 2 0 102°, and measuring the ratio of the peak intensities. Further, the sample composition analysis of the obtained sintered body was carried out by ICPUnductively coupied Piasma analysis or atomic absorption analysis. In this case, the obtained dielectric ceramic, the mixture mixed with boric acid and sodium carbonate and dissolved, dissolved in hydrochloric acid, firstly subjected to qualitative analysis of the elements contained in the dielectric ceramic by atomic absorption analysis, and then, Each element of the special standard was diluted as a standard sample with a standard solution, and quantified by performing ICP emission spectrometry. In addition, the valence of each element is the number of valences shown in the periodic table and the oxygen demand is obtained. 97111695 28 200904774 The composition and firing temperature are as shown in Table 丨3. The composition of the oxide system is as follows: The elements in the sintered body are shown as 7 to 9. Among them, 矣 / p table 6 does not, the characteristic results are as follows, the components of the table are below the detection limit (in the iCP analysis of the dielectric ceramics, when Moer. C0.5#g/g or less), It is regarded as 0. The composition of the raw materials is not shown in Table 3. The composition of the dielectric pottery is shown in Table 7 ^ The degree of wearing, Table 4~6. The ratio of diffraction intensity, 纴"立早心斤不系) 丨X-ray dielectric loss of ceramics, absolute: = dielectric constant of electric ceramics, life characteristics during inspection. Temperature characteristics of book number, high temperature load test 97111695 29 200904774 [Table l] Sample No. MgO MnC〇3 V2〇 5 rare earth element second rare earth element (Tb4〇7) firing temperature molmoule type mol Moer °C 1-1 0.15 0.5 0.1 Υ2〇3 1 0 1130 1-2 0.1 0.5 0.1 Υ2〇 3 1 0 1130 1-3 0. 02 0.5 0.1 Υ2〇3 1 0 1130 1- 4 0 0.5 0.1 Υ2〇3 1 0 1130 1-5 0.05 0.2 0.1 Υ2〇3 1 0 1130 1- 6 0.02 0.2 0.1 Υ2〇 3 1 0 1130 1- 7 0 0.2 0.1 Υ2〇3 1 0 1130 1-8 0. 05 0 0.1 Υ2〇3 1 0 1130 1-9 0. 02 0 0.1 Υ2〇3 1 0 1130 1-10 0 0 0.1 Υ2〇3 1 0 1130 * 1- 11 0 0.5 0 Υ2〇3 1 0 1130 1- 12 0 0.5 0 .05 Υ2〇3 1 0 1130 1- 13 0 0.5 0.12 Υ2〇3 1 0 1130 1- 14 0 0.5 0.15 Υ2〇3 1 0 1130 1-15 0 0.5 0.2 Υ2〇3 1 0 1130 1-16 0 0.5 0.3 Υ2〇3 1 0 1130 *1-17 0 0.5 0.4 Υ2〇3 1 0 1130 1- 18 0.15 0.5 0.1 Υ2〇3 1 0.2 1130 1-19 0.1 0.5 0.1 Υ2〇3 1 0.2 1130 1- 20 0.02 0.5 0.1 Υ2 〇3 1 0.2 1130 1- 21 0 0.5 0.1 Υ2〇3 1 0.2 1130 1- 22 0.05 0.2 0.1 Υ2〇3 1 0.2 1130 1- 23 0.02 0.2 0.1 Υ2〇3 1 0.2 1130 1- 24 0 0.2 0.1 Υ2〇3 1 0.2 1130 1- 25 0.05 0.1 0.1 Υ2〇3 1 0.2 1130 1- 26 0. 02 0.1 0.1 Υ2〇3 1 0.2 1130 1-27 0 0.1 0.1 Υ2〇3 1 0.2 1130 1- 28 0.05 0 0.1 Υ2〇3 1 0.2 1130 Symbol * means a sample that exceeds the scope of the present invention. 97111695 30 200904774 [Table 2] Sample No. MgO MnC〇3 V2〇5 Rare earth element Second rare earth element (Tb4〇7) Firing temperature Moramole type Molmole °C 1- 29 0 02 0 0.1 Υ2〇3 1 0.2 1130 1- 30 0 0 0.1 Υ2〇3 1 0.2 1130 1- 31 0 0 0.1 Υ2〇3 1 0.05 1130 1- 32 0 0 0.1 Υ2〇3 1 0.1 1130 1- 33 0 0 0.1 Υ2〇3 1 0.3 1130 1- 34 0 0 0.1 Υ2〇3 1 0.4 1130 氺1- 35 0 0.5 0 Υ2〇3 1 0.2 1130 1- 36 0 0.5 0.05 Υ2〇3 1 0.2 1130 1- 37 0 0.5 0.12 Υ2〇3 1 0.2 1130 1- 38 0 0.5 0.15 Υ2〇3 1 0.2 1130 1- 39 0 0.5 0.2 Υ2〇3 1 0.2 1130 1- 40 0 0.5 0.3 Υ2〇3 1 0.2 1130 氺1- 41 0 0.5 0.4 Υ2〇3 1 0.2 1130 1- 42 0 0 0.1 Dy2〇3 1 0.2 1130 1- 43 0 0 0.1 Η〇2〇3 1 0.2 1130 1- 44 0 0 0.1 ΕΓ2〇3 1 0.2 1130 氺1- 45 0 0 0.1 Υ2〇3 0 0.2 1130 1- 46 0 0 0.1 Υ2〇3 0.5 0.2 1130 1- 47 0 0 0.1 Υ2〇3 1.5 0.2 1130 氺1- 48 0 0 0.1 Υ2〇3 2 0.2 1130 氺1- 49 0 0.7 0.1 Υ2〇3 1 0.2 1130 t 1- 50 0 0 0.1 Υ2〇3 1 0 1130 氺1- 51 0.15 0. 5 0 Υ2〇3 1 0 1130 1- 52 0 0 0.1 Υ2〇3 1 0.2 1200 1- 53 0 0 0.1 Υ2〇3 1 0.2 1200 1- 54 0 0 0.1 Υ2〇3 1 0.2 1050 1- 55 0 0 0.1 Υ2〇3 1 0.2 1100 Symbol* means a sample that exceeds the scope of the present invention. 97111695 31 200904774 [Table 3]

Sample No. MgO MnCOa V2〇5 Rare earth element second rare earth element () firing temperature Momomore Moir type Molmole °c 1-56 0. 75 0.3 0.05 Υ2〇3 0. 75 0 1150 1- 57 0.75 0.3 0.1 Υ2〇3 0.75 0 1150 1- 58 0.75 0.3 0.15 Υ2〇3 0.75 0 1150 1- 59 0. 75 0.3 0.2 Υ2〇3 0. 75 0 1150 1- 60 0. 75 0.3 0.3 Υ2〇 3 0. 75 0 1150 1-61 0.3 0.3 0.1 Υ2〇3 0.75 0 1150 1- 62 0.4 0.3 0.1 Υ2〇3 0. 75 0 1150 1- 63 0.5 0.3 0.1 Υ2〇3 0. 75 0 1150 1- 64 0.9 0.3 0.1 Υ2〇3 0.75 0 1150 1- 65 1 0.3 0.1 Υ2〇3 0. 75 0 1150 * 1- 66 1.1 0.3 Υ2〇3 0. 75 0 1150 *1-67 0.75 0.3 0.1 Υ2〇3 0.3 0 1150 1-68 0.75 0.3 0.1 Υ2〇3 0.4 0 1150 1- 69 0.75 0.3 0.1 Υ2〇3 0.6 0 1150 1-70 0.75 0.3 0.1 Υ2〇3 0.9 0 1150 1-71 0.75 0.3 0.1 Υ2〇3 1 0 1150 1- 72 0.75 0.05 0.1 Υ2〇3 0.75 0 1150 1-73 0. 75 0.1 0.1 Υ2〇3 0. 75 0 1150 1- 74 0. 75 0.2 0.1 Υ2〇3 0. 75 0 1150 1-75 0. 75 0.4 0.1 Υ2〇3 0.75 0 1150 1- 76 0. 75 0.5 0.1 Υ2〇3 0. 75 0 1150 1-77 0.75 0.3 0.1 Υ2〇3 0. 75 0 1120 1-78 0.75 0.3 0.1 Υ2〇3 0.75 0 1180 Wood 1- 79 0.75 0.3 0 Υ2〇3 0.75 0 1150 1-80 0.75 0.3 0.15 Dy2〇3 0.75 0 1150 1-81 0. 75 0.3 0.15 Η〇2〇 3 0. 75 0 1150 1-82 0.75 0.3 0.15 ΕΓ2〇3 0. 75 0 1150 1-83 0.75 0.3 0.1 Υ2〇3 0. 75 0.05 1150 1-84 0. 75 0.3 0.1 Υ2〇3 0.75 0.1 1150 1- 85 0.75 0.3 0.1 Υ2〇3 0.75 0.2 1150 1-86 0.75 0.3 0.1 Υ2〇3 0.75 0.3 1150 1- 87 0.75 0.3 0.1 Υ2〇3 0.75 0.4 1150 1- 88 0.75 0.3 0.1 Dy2〇3 0.75 0.2 1150 1-89 0.75 0.3 0.1 Η〇 2 〇 3 0. 75 0.2 1150 1- 90 0.75 0.3 0.1 ΕΓ 2 〇 3 0. 75 0.2 1150 The symbol * refers to a sample that exceeds the scope of the present invention. 97111695 32 200904774 [Table 4] Sample No. MgO MnO V2〇5 Rare Earth Group Element 2nd Rare Earth Element (Tb4〇7) Moromole Moir Type Molmers 1- 1 0.15 0.5 0.1 Y2〇3 1 0 1-2 0.1 0.5 0.1 Υ2〇3 1 0 1- 3 0.02 0.5 0.1 Υ2〇3 1 0 1-4 0 0.5 0.1 Υ2〇3 1 0 1-5 0.05 0.2 0.1 Υ2〇3 1 0 1- 6 0.02 0.2 0.1 Υ203 1 0 1-7 0 0.2 0.1 m 1 0 1- 8 0.05 0 0.1 γ203 1 0 1-9 0.02 0 0.1 γ203 1 0 1-10 0 0 0.1 γ203 1 0 氺1- 11 0 0.5 0 Υ203 1 0 1 - 12 0 0.5 0.05 γ203 1 0 1- 13 0 0.5 0.12 γ203 1 0 1- 14 0 0.5 0.15 γ203 1 0 1-15 0 0.5 0.2 γ203 1 0 1- 16 0 0.5 0.3 γ203 1 0 *1-17 0 0.5 0.4 γ203 1 0 1- 18 0.15 0.5 0.1 γ203 1 0.2 1-19 0.1 0.5 0.1 Υ203 1 0.2 1- 20 0.02 0.5 0.1 γ203 1 0.2 1-21 0 0.5 0.1 γ203 1 0.2 1-22 0.05 0.2 0.1 γ203 1 0.2 1 - 23 0.02 0.2 0.1 γ203 1 0.2 1-24 0 0.2 0.1 γ203 1 0.2 1- 25 0.05 0.1 0.1 γ203 1 0.2 1- 26 0.02 0.1 0.1 γ203 1 0.2 1- 27 0 0.1 0.1 γ203 1 0.2 1- 28 0.05 0 0.1 γ 203 1 0.2 Symbol * means a sample that exceeds the scope of the present invention. 97111695 33 200904774 [Table 5]

Sample No. MgO MnO V2〇5 rare earth element second rare earth element (Tb4〇7) Moramole type Moer 1-29 0. 02 0 0.1 Y2〇3 1 0.2 1- 30 0 0 0.1 Υ2〇3 1 0.2 1- 31 0 0 0.1 Υ2〇3 1 0. 05 1- 32 0 0 0.1 Υ2〇3 1 0.1 1- 33 0 0 0.1 Υ2〇3 1 0.3 1-34 0 0 0.1 Υ2〇3 1 0.4 *1-35 0 0.5 0 Υ2〇3 1 0.2 1-36 0 0.5 0.05 Υ2〇3 1 0.2 1-37 0 0.5 0.12 Υ2〇3 1 0.2 1- 38 0 0.5 0.15 Υ2〇3 1 0.2 1- 39 0 0.5 0.2 Υ2〇3 1 0.2 1- 40 0 0.5 0.3 Υ2〇3 1 0.2 Wood 1- 41 0 0.5 0.4 Υ2〇3 1 0.2 1-42 0 0 0.1 Dy2〇3 1 0.2 1-43 0 0 0.1 Η〇 2〇3 1 0.2 1- 44 0 0 0.1 ΕΓ2〇3 1 0.2 ^ 1- 45 0 0 0.1 Υ2〇3 0 0.2 1- 46 0 0 0.1 Υ2〇3 0.5 0.2 1- 47 0 0 0.1 Υ2〇3 1.5 0.2氺1 - 48 0 0 0.1 Υ2〇3 2 0.2 * 1- 49 0 0.7 0.1 Υ2〇3 1 0.2 *1-50 0 0 0.1 Υ2〇3 1 0 Wood 1- 51 0.15 0.5 0 Υ2〇3 1 0 1- 52 0 0 0.1 Υ2〇3 1 0.2 1-53 0 0 0.1 Υ2〇3 1 0.2 1- 54 0 0 0.1 Υ2〇3 1 0.2 1-55 0 0 0.1 Υ2〇3 1 0.2 Mark* means crossing the scope of the invention Sample outside. 97111695 34 200904774 [Table 6] Sample No. MgO MnO V2〇5 Rare earth element second rare earth element (Tb4〇7) Moramole type Moermoole 1-56 0. 75 0.3 0. 05 Y2 〇3 0.75 0 1- 57 0.75 0.3 0.1 Υ2〇3 0.75 0 1- 58 0. 75 0.3 0.15 Υ2〇3 0.75 0 1- 59 0. 75 0.3 0.2 Υ2〇3 0.75 0 1-60 0. 75 0.3 0.3 Υ2 〇3 0.75 0 1- 61 0.3 0.3 0.1 Υ2〇3 0.75 0 1- 62 0.4 0.3 0.1Υ2〇3 0. 75 0 1-63 0.5 0.3 0.1 Υ2〇3 0. 75 0 1-64 0.9 0.3 0.1 Υ2〇3 0.75 0 1-65 1 0.3 0.1 Υ2〇3 0.75 0 *1-66 1.1 0.3 0.1 Υ2〇3 0.75 0 *1-67 0.75 0.3 0.1 Υ2〇3 0.3 0 1- 68 0.75 0.3 0.1 Υ2〇3 0.4 0 1- 69 0.75 0.3 0.1 Υ2〇3 0.6 0 1-70 0.75 0.3 0.1 Υ2〇3 0.9 0 1- 71 0. 75 0.3 0.1 Υ2〇3 1 0 1-72 0.75 0.05 0.1 Υ2〇3 0.75 0 1-73 0.75 0.1 0.1 Υ2〇3 0. 75 0 1-74 0. 75 0.2 0.1 Υ2〇3 0.75 0 1- 75 0.75 0.4 0.1 Υ2〇3 0.75 0 1- 76 0. 75 0.5 0.1 Υ2〇3 0. 75 0 1-77 0 75 0.3 0.1 Υ2〇3 0.75 0 1-78 0. 75 0.3 0.1 Υ2〇3 0.75 0 *1-79 0.75 0.3 0 Υ2〇3 0.75 0 1-80 0.75 0.3 0.15 Dy2〇3 0 .75 0 1- 81 0.75 0.3 0.15 Η〇2〇3 0.75 0 1- 82 0.75 0.3 0.15 Er2〇3 0.75 0 1-83 0. 75 0.3 0.1 Υ2〇3 0.75 0.05 1-84 0. 75 0.3 0.1 Υ2〇 3 0.75 0.1 1-85 0.75 0.3 0.1 Υ2〇3 0.75 0.2 1-86 0.75 0.3 0.1 Υ2〇3 0.75 0.3 1-87 0. 75 0.3 0.1 Υ2〇3 0. 75 0.4 1- 88 0. 75 0.3 0.1 Dy2〇 3 0.75 0.2 1-89 0. 75 0.3 0.1 Η〇2〇3 0. 75 0.2 1-90 0.75 0.3 0.1 ΕΓ2〇3 0.75 0.2 The symbol * refers to a sample that exceeds the scope of the present invention. 97111695 35 200904774 [Former Ή

Tmt knot lie long rate yjm. Diffraction round Lin Shen do (25 Ό (25Ό County fM# high temperature negative | woven in ###色(170°C'30V) (IZW/jm) μιη % ^350^ 1.6 _ 3700 % Ω Ω X5R# X7RW X '&quot;Z one----- 'J* ^ 10 ' 1-1 0.35 20 7.0Ε+08 7. 0Ε+08 〇一 1- 2 0.32 320 1.6 3800 18 7 0Ε+08 7. 0Ε+08 〇〇55 s 1-3 0.31 310 1.6 3800 17 7. 0Ε+08 7. 0Ε+08 〇〇56 1- 4 0. 30 300 1.6 3700 16 7.0Ε+08 7. 2Ε+08 〇〇57 1- 5 0.32 320 1.6 3800 17 6.0Ε+08 6. ΟΕ+08 〇〇55 1-6 0.31 310 1.6 3800 16 6. 0Ε+08 6. 0Ε+08 〇〇56 1-7 0.30 300 1.6 3700 15 6.0Ε+08 6. 2Ε+08 〇〇57 1-8 0.32 320 1.6 3800 16 5. 0Ε+08 5.0Ε+08 〇〇55 ～ 1- 9 0.31 310 1.6 3800 15 5. 0Ε+ 08 5.0Ε+08 〇〇56 1-10 0.30 300 1.6 3800 14 5.0Ε+08 5.2Ε+08 〇〇60 ~~~ 氺1- 11 0.27 270 1.1 4000 14 9. 0Ε+08 2.0Ε+08 〇〇 7 1- 12 0.29 290 1.3 3800 16 8. 0Ε+08 8. 3Ε+08 〇〇53 ～ 1-13 0.31 310 1.4 3720 16 6. 5Ε+08 6.6Ε+08 〇〇55 ～ 1- 14 0.32 320 1.5 3630 17 4. 5Ε+08 4. 7Ε+08 〇〇 56 ～ 1- 15 0.34 340 1.8 3350 22 3. 5Ε+08 3.6Ε+08 〇〇57 1-16 0.34 340 2 3350 22 3.0Ε+08 3.2Ε+08 〇〇57 * 1- 17 0.34 340 2.2 3200 25 9. 0Ε+07 9.0Ε+07 〇〇57 ～ 1- 18 0.35 350 1.6 3700 20 7.2Ε+08 7. 2Ε+08 〇X 50 1- 19 0.32 320 1.6 3800 18 7.2Ε+08 7. 2Ε+08 〇〇65 1- 20 0.31 310 1.6 3800 17 7.2Ε+08 7. 2Ε+08 〇〇67 1-21 0.30 300 1.6 3700 16 7.2Ε+08 7.4Ε+08 〇〇67 1-22 0.32 320 1.6 3800 17 6.2Ε+08 6. 2Ε+08 〇〇65 1- 23 0.31 310 1.6 3800 16 6.2Ε+08 6.2Ε+08 〇〇67 1-24 0.30 300 1.6 3800 16 6·2Ε+08 6. 3Ε+08 〇 〇71 ～ 1-25 0. 32 320 1.6 3800 17 6.2Ε+08 6.2Ε+08 〇〇65 1- 26 0.31 310 1.6 3800 16 5.3Ε+08 5.3Ε+08 〇〇— 67 1-27 0.30 300 1.6 3800 15 5. 3Ε+08 5. 5Ε+08 〇~ 〇71 1-28 0.32 ^ 士320 1.6 Face AL ΛΑ β 3800 *Late 〇17 5.3Ε+08 5. 3Ε+08 〇〇65 *氺Ixt /Ixc ratio: the diffraction intensity of the (004) plane representing the tetragonal system is set to Ixt, and the diffraction intensity of the (004) plane indicating the cubic system is set to j.

1^1 Tvf /Tvr* lU Ο ^ AAL . The value of 1 means that the diffraction intensity of the (004) plane of the tetragonal system is larger than that of the (〇〇4) plane of the cubic system. Means that the diffraction intensity of the (004) plane of the tetragonal system is smaller than the (〇〇4) plane of the cubic system: 〇: the case of satisfying X7R, X: the case of not satisfying X7R # :〇: When the case of X5R is satisfied, X: the case where X5R is not satisfied ## The insulation resistance is expressed by an index symbol in which E is inserted between the mantissa portion and the index portion. 36 97111695 200904774 [Table 8]

Tmb. U mm (25Ό (25Ό earn tni## 攸153⁄43⁄43⁄43⁄4 special 14 *···**) that knocks down %^ (10). C, 30V) (3.15V/^ In) (12.5V/^in) 卿% — — Ω Ω m xam 'J domain 1-29 0.31 310 &quot; 1.6 -3800 16 5.2Ε+08 5. 2E+08 67 1- 30 0. 30 300 1.6 3800 14 5.2Ε+08 5.4E+08 〇〇71 1- 31 0. 30 300 1.6 3900 14 5.2Ε+08 5.4E+08 〇〇62 1- 32 0. 30 300 1.6 3850 14 5.2Ε+08 5.4E +08 〇〇66 1- 33 0. 30 300 1.6 3700 14 5.2Ε+08 5.4E+08 〇〇57 1- 34 0. 30 300 1.6 3500 14 5.3Ε+08 5.5E+08 〇〇57 Wood 1— 35 0.27 270 1.1 4000 14 9.1Ε+08 2.0E+08 〇〇7 1- 36 0.29 290 1.4 3800 16 8.1E+08 8.2E+08 〇〇64 1- 37 0.31 310 1.4 3720 16 6.6E+08 6.7E +08 〇〇76 1- 38 0. 32 320 1.5 3630 17 4.6E+08 4.7E+08 〇〇80 1- 39 0. 34 340 1.8 3350 22 3.7E+08 3.8E+08 〇〇84 1- 40 0.33 330 2 3350 22 3.2E+08 3.3E+08 〇〇58 氺1- 41 0. 34 340 2.2 3200 25 9.0E+07 9. 0E+07 〇〇58 1- 42 0.30 300 1.6 3700 14 5.1E+ 08 5. 2E+08 〇〇70 1- 43 0 .30 300 1.6 3700 14 5.1E+08 5. 3E+08 〇〇70 1- 44 0.30 ^Too 1.6 3700 14 5.1E+08 5. 2E+08 〇〇70 氺1–45 0.30 300 1.6 3800 15 5.0E +08 2. 0E+08 〇〇11 1- 46 0.30 300 1.6 3800 14 5.0E+08 5.1E+08 〇〇70 1- 47 0.30 300 1.6 3800 14 5.1E+08 5.2E+08 〇〇70 0. 30 300 1.6 2950 14 5.2E+08 5.3E+08 〇〇70 *1-49 0.30 300 1.6 2950 15 5.1E+08 5. 2E+08 〇〇70 *1-50 0.30 120 0.6 3400 14 5.1E+08 1.0E+08 XX 5 Wood 1- 51 0.30 120 0.4 3350 16 8.1E+08 1. 5E+08 〇〇4 1- 52 0.40 400 1.6 4100 18 7.2E+08 7.3E+08 〇〇55 1- 53 0.43 430 1.6 4400 24 7.2E+08 7.3E+08 〇〇54 1- 54 0.24 240 1.6 3000 23 7.1E+08 7.2E+08 〇〇55 1- 55 0. 27 270 1.6 3100 23 7.1E+08 7. 2E+08 〇〇55 Mark* means a sample that exceeds the scope of the present invention. Woody. The diffraction intensity of the (004) plane of the non-square aa system is Ixt', and the diffraction intensity of the (〇〇4) plane of the cubic crystal system is set to lx. The ratio of Ixt/Ixc. ° ^ Ixt / Ixc is a value greater than 1 means that the diffraction intensity of the (004) plane of the tetragonal system is larger than the diffraction intensity of the (004) plane of the cubic system. • A value in which Ixt/Ixc is less than 1 means that the diffraction intensity of the (〇〇4) plane of the tetragonal system is smaller than the diffraction intensity of the (〇〇4) plane of the cubic system. μ 林* :〇: satisfies X7R, X: does not satisfy X7R# :〇: When X5R is satisfied, X: X5R is not satisfied ##Insulation resistance is inserted between the mantissa and the exponent指数 指数 指数 》 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 97 //an) pm % — one % Ω Ω 1- 56 0.46 1.3 3800 16 8.0E+08 8. 3E+08 〇_ a 53 1- 57 0.44 440 1.6 4500 10 7.1E+08 7.1E+08 〇55 1 -58 0.39 1.5 4320 9.6 4.5E+08 4. 7E+08 〇56 1- 59 0.36 360 1.8 4200 9.1 3. 5E+08 3. 6E+08 〇57 1- 60 0. 32 320 2.0 4000 8.5 3. 0E +08 3. 2E+08 〇57 1-61 0.48 480 1.3 4800 10.7 7. 2E+08 7. 2E+08 〇56 1-62 0.47 470 1.4 4670 10.5 7.2E+08 7. 2E+08 〇56 1- 63 0. 46 460 1.5 4620 10.1 7. 2E+08 7. 2E+08 〇56 1-64 0.41 410 1.5 4120 9.2 7. 3E+08 7. 3E+08 〇57 1- 65 0.39 390 1.6 3980 8.9 7.4E +08 7. 4E+08 〇58 *1-66 0.36 360 1.6 3700 8.9 7.4E+08 7_ 4E+08 X 58 Μ- 67 0.49 490 1.4 4760 11.7 7· 1E+08 2. 0E+08 〇15 1-68 0.49 490 1.4 4760 11.7 7. 2E+08 7. 2E+08 〇56 1-69 0.40 400 1.4 4360 10.2 7. 2E+08 7. 2E+08 〇56 1-70 0.33 330 1.4 4020 9.1 7. 3E+08 7. 3E+08 〇57 1- 71 0.31 310 1.5 3600 8.8 7. 5E+08 7. 5E+08 〇58 1-72 0.44 440 1.3 4390 10 6. 0E+08 6. 0E+08 〇55 1-73 0.44 440 1.4 4470 11 6.1E+08 6.1E+08 〇56 1- 74 0.44 440 1.4 4490 11 6. 2E+08 6. 2E+08 〇56 1- 75 0.46 460 1.4 4500 11.3 6. 3E+ 08 6. 3E+08 〇57 1-76 0.45 450 1.5 4300 13 6. 5E+08 6.5E+08 〇58 1- 77 0. 28 280 1.5 4000 10 7. 0E+08 7. 0E+08 〇54 1 - 78 0. 50 500 1.6 4700 12.3 7.1E+08 7.1E+08 〇55 *1-79 0.16 160 0.8 3000 8.5 9. 0E+08 2.0E+08 〇9 1-80 0.44 440 1.6 4480 10.1 5.1E+ 08 5.1E+08 〇一54 1TM 81 0. 44 440 1.6 4470 10 5.1E+08 5.1E+08 〇54 1- 82 0.43 430 1.6 4450 10 5.1E+08 5.1E+08 〇54 1- 83 0.51 510 1.6 6010 10.5 7. 5E+08 7. 6E+08 〇66 1- 84 0.52 520 1.6 6020 10.5 7. 0E+08 7.1E+08 〇67 1-85 0. 55 550 1.6 6100 11 6. 9E+08 7. 0E+08 〇71 1- 86 0.56 560 1.6 Γ 6150 11.6 6. 9E+08 7 0E+08 〇71 1-87 0. 57 568 1.6 6030 13.1 6. 8E+08 6. 9E+08 〇72 1- 88 0.54 540 1.6 6090 11 6. 9E+08 7. 0E+08 〇70 1- 89 0. 54 540 1.6 6080 11 6. 9E+08 7. 0E+08 〇70 1-90 Mark #格” 0.53 530 &amp; Lu Ming Yi 1.6 6010 11 6. 9E+08 7. 0E+08 〇70 ^ The diffraction intensity of the (QG4) plane of the fxf/ΐχ^ΐ system is set to Ixt, and the diffraction intensity of the (10)4) plane representing the cubic system is set to Ixc Γ

• More than that. 1 Miscellaneous watch * square crystal (four) (10) 4) face _ sister shirt cubic crystal '(four) (10) 4) face • this value of 33 ^ 3⁄43⁄4 ^ 1 mine shirt square crystal (four) (10) 4) surface winding (four) degree secret green cubic crystal (four) (_ face f : 〇: When X5R is satisfied, X: Less than η X5R is surprised. ## The insulation resistance is expressed by the exponential notation inserted between the mantissa and the exponent. 97111695 38 200904774 Results from Tables 1 to 9 It is known that the sample of the present invention N〇.Bu 2~ι〇' 12~16, 18~34, 36~40, 42~44, 46, 47, 52~65, 68~78 and 80~90, dielectric The constant is more than 3000, and the temperature change of the dielectric constant satisfies the X5R characteristic of the EIA specification. When the DC power value per unit thickness (1#m) is set to 3.15V and 12.5V, no insulation resistance is reduced. Dielectric ceramics with low voltage dependence of insulation resistance. In addition, the life characteristics in the high-temperature load test are more than 53 hours under 17 (rc, 15v/#m strips. Samples N〇, 1216, 18 3", 36~40, 42~44, 46, 47, 52~65, 68~78 and 8〇~9〇, belonging to the main component of barium titanate, and relative to the composition of barium titanate Contains: Vanadium according to Vz〇5 conversion 〇·05~〇.3 Moule, magnesium according to this 〇 conversion meter 0~1 Moer's manganese Mn〇 conversion meter 〇~〇5 莫, and from 钇, 镝The rare earth element (RE) selected from 鈥, 鈥 and 铒 is 0·4~1.5 mol in terms of REz〇3, and contains more calcium. At the same time, the crystal granules have the main body and the concentration 〇 - 2 atom% or less of crystal particles constitute a first crystal group, and a second crystal group consisting of crystal particles mainly composed of barium titanate and having a calcium concentration of 原子 4 atom% or more, and X in the dielectric ceramics The ray diffraction pattern t ' indicates that the diffraction intensity of the (〇〇4) plane of the tetragonal barium titanate is larger than the diffraction intensity of the (004) plane of the cubic crystal barium titanate. Further, the sample No. 1 - 〖~10, 12~16, 19~34, 36~40, 42~44, 46 47, and 52~55 'The temperature change of the electrostatic capacitance satisfies the X7R characteristic of the El A specification'. The applied DC voltage is in the dielectric layer. The thickness per unit (_) is between 3.15V and 12.5V, and no insulation resistance is found. (4) High insulation dielectric ceramics. Sample No. 2~10, 12~16 , 19′′ 4, 97111695 39 200904774 36~40, 42~44, 46, 47, and π, composition, and relative to the composition, titanium dim: 5, belongs to the barium titanate钡 钡丨〇〇 钒 钒 V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V V Select the anvil chain 丄 ^ According to the RE2 〇 3 conversion 〇 5 ~ i grass, rare earth 兀 ( (RE) 0 ~ (M Moer. Mohr, and magnesium is set to be in accordance with _ conversion meter, and magnesium is set to 〇12-16, ?1, 〇7 on M7 on 〇 今 今 - 式 式 式 No. 4, 7, 10, 27, 3 〇~34, 36~4〇, 42~44, can obtain the applied DC Thunder force into the ± and 52~55 ' 3. (10) and 12 ^ threshold Λ f layer per unit thickness (1 &quot;) High insulation dielectric ceramics. The edge resistance &amp; plus tendency (positive change) = two 〇 3 〇 ' if and the same amount of hunger and rare earth = = there is a town, or the two components of the electric tile 4 枓 No · 1 - 2, 9 And the sample No. 1-19~29 叮 叮 丨 电 eight electric losses. Sample No. !-10, 30 #_, can be reduced &quot; Aikawa belongs to the main component of barium titanate, and: 冓i-hai titanium g 钡 〇〇i 〇〇 Moer conversion meter 0U. 3 Mo Er, and ^ engage in 3 have · Su Yi V205 rare earth 竑 _ kdd, 攸钇, 镝, 鈥 and bait selected rare known alizarin (RE) according to _3 conversion 〇 5

MgO ^ ^ ^ π ^ ^ 3 corps, the sub-magnesium according to the electrostatic ear ' and the conversion meter is set to 〇 Mo Er, the temperature change of the electrostatic electric valley meets the X7R characteristics of the ΕίΑ specification. ^者' relative to the people who constitute the titanic acid lock, contains: 鈒 〇 〇 换算 换算 换算 换算 换算 换算 〇 〇 〇 〇 〇 〇 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫_3

Change 瞀 ^ According to _ conversion meter (four). 1 Mo Er, and Meng MnO ... 10 0 ~ 0.5 Moer ' and contains money according to 7 conversion 〇〇 5 ~ 〇 · 3 Mo 97111695 200904774 Ear sample No. 1- 2-9 Features.

No. 1-19-34 ^ Λ (\ 1 12~16 under ~4〇, compared with the sample without bismuth, the life in the high temperature load test is further improved, OiWU, 72~76, 78 80~90 , will be able to obtain the first, ώ ^, force straight μ 昼 in the dielectric layer per single (l #m) is 3.15V and 12 5卩 door * &gt; 曰 mother early position full ancient insulation Between .5V, there is no ▲ edge m wheat with insulation resistance reduction, and the dielectric constant can reach above the side, the loss can be below 13.1%. Samples N〇1_57~59, 6〇~64, 68^〇 Shell 72~76, 78, 80~90 ' belongs to the 钡_莫耳=下, which contains: 鈒 V V2〇5 conversion !. !~〇. 3 Moer, Zhenyi _ change Icing juice 0.3~0.9 Moule, fiercely _ conversion meter 〇〇 5 〇. 5 Mo Er, and Ji Ji, steel, Qin and Ming towel through 1 · ( # β ,, 久蚪肀 select 1 kind of rare earth The element (RE) is 0.4 to U in terms of RE2〇3, and the average particle diameter of the above crystal particles is 33·33~0. 57y m. Among them, in the composition of 0 05 to 03 mol in the conversion of TbA 'The sample No. 8 in which the average particle diameter of the crystal particles is within the range of G.5pQ57//in 3 to 90, the dielectric constant can be increased by more than 6〇1〇. In contrast, the composition is different from the sample of the present invention, or the grain growth ratio is less than 2 times, in the x-ray diffraction pattern of the dielectric ceramic, The diffraction intensity of the (004) plane of the tetragonal barium titanate is less than the diffraction intensity of the (4 Å) plane representing the cubic crystal barium titanate, and the sample exceeding the scope of the present invention is Ν〇., ^, 17, 35 , 4b 45, 48~51, 66, 67, and 79 'The dielectric constant is less than 3000, or the dielectric constant temperature change does not satisfy the X5R characteristic of the ΕΙΑ specification, or the DC voltage value applied per unit thickness (lem) For the 12.5V///m application, 9711695 41 200904774, the insulation resistance measurement is less than 1〇8ω, and the performance is less than 15 hours. The life of the directional temperature load test is special [Example 2], except for the actual case j shown 36-40^42^44 &gt; 46 M7&gt;52^6S 1 ^1 ° ' 1 6 ' 18^34 'Into, add Yb2〇3 powder 〇35, 68~78 and 80~9〇 Each group of the same example 1 was prepared in the same manner as the sample, and:::, the rest were measured according to the actual method, respectively, and the same crystal grains were the same as in Example 1. The average particle size, dielectric insulating resistance of dielectric ceramics, temperature characteristics of dielectric constant, "〃", and evaluation, and evaluation (sample 2 small 78). In addition to the sample N 〇 卜 Y Y Y Y Y n n n n n n n n n n n n n n n n n n n n n n n n n n n n n n n n n n n n n n n n n n n n The same as in the first embodiment, the composition of the dielectric ceramics, the X-ray U intensity ratio, the average particle diameter of the crystal particles, the dielectric constant of the dielectric ceramic, the dielectric loss, the insulation resistance, and the dielectric constant were measured. The temperature characteristics and the life characteristics of the high-temperature load test were evaluated and evaluated (sample No. 2-79 to 85). In addition, the composition of the sample No. 69 shown in the actual _1 was added to the Yb2〇3 conversion meter. 〇~0.9 mol, and the firing temperature was set to 119 Torr, and the other samples were prepared in the same manner as in Example 1, and the composition of the dielectric ceramic was measured in the same manner as in Example 1, respectively. X-ray diffraction intensity ratio, average particle diameter of crystal particles, Dielectric ceramics 97111695 42 200904774 dielectric constant, dielectric loss, permanent ♦ also, color edge resistance, dielectric constant temperature, high temperature load test life # β ^ amrp will be, and the implementation of the evaluation of the official r No.2 -86~92). f Estimate (4 Tables 10 13 shows the starting materials of 14 to 17 of the group of dielectric ceramics shown in the wind #, the heart into μ degrees, the table J 亢旳 composition, Table 18~21 X-ray diffraction Intensity ratio, gentleman's day private worker recognizes Dingzhu)) 丨电陶 £ Dielectric constant, the average particle size of the intrusion particles, the infusion, the dielectric of the pottery = 2::: life: r' dielectric A characteristic, [Table 10]

97111695 43 200904774 [Table 11]

Sample No. MgO MnC〇3 V2〇5 The first rare earth element second rare earth element (Tb4〇7) The third rare earth element (YbzOa) firing temperature Momomore Moir type Moermoole C 2-27 0.02 0 0.1 Y2〇3 1 0.2 0.35 1130 2- 28 0 0 0.1 Υ2〇3 1 0.2 0.35 1130 2- 29 0 0 0.1 Υ2〇3 1 0.05 0.35 1130 2-30 0 0 0.1 Υ2〇3 1 0.1 0.35 1130 2-31 0 0 0.1 Υ2〇3 1 0.3 0.35 1130 2-32 0 0 0.1 Υ2〇3 1 0.4 0.35 1130 2-33 0 0.5 0.05 Υ2〇3 1 0.2 0.35 1130 2-34 0 0.5 0.12 Υ2〇 3 1 0.2 0.35 1130 2-35 0 0.5 0.15 Υ2〇3 1 0.2 0.35 1130 2-36 0 0.5 0.2 Υ2〇3 1 0.2 0.35 1130 2-37 0 0.5 0.3 Υ2〇3 1 0.2 0.35 1130 2-38 0 0 0.1 Dy2〇3 1 0.2 0.35 1130 2-39 0 0 0.1 Η〇2〇3 1 0.2 0.35 1130 2- 40 0 0 0.1 Er2〇3 1 0.2 0.35 1130 2-41 0 0 0.1 Υ2〇3 0.5 0.2 0.35 1130 2- 42 0 0 0.1 Υζ〇3 1.5 0.2 0.35 1130 2-43 0 0 0.1 Υ2〇3 1 0.2 0.35 1200 2-44 0 0 0.1 Υ2〇3 1 0.2 0.35 1200 2- 45 0 0 0.1 Υ2〇3 1 0.2 0.35 1050 2-46 0 0 0.1 Υ2〇3 1 0.2 0.35 1100

97111695 44 200904774 [Table 12]

Sample No. MgO MnC〇3 m Rare earth element Second rare earth element (Tb4〇7) Third rare earth element (Yb2〇3) Firing temperature Molmers Moir type Moermoole V 2- 47 0.75 0.3 0.05 Y2〇3 0.75 0 0.35 1150 2- 48 0.75 0.3 0.1 Υ2〇3 0.75 0 0.35 1150 2-49 0.75 0.3 0.15 Υ2〇3 0.75 0 0.35 1150 2- 50 0.75 0.3 0.2 Υ2〇3 0.75 0 0.35 1150 2-51 0.75 0.3 0.3 Υ2〇3 0.75 0 0.35 1150 2-52 0.3 0.3 0.1 Υ2〇3 0.75 0 0.35 1150 2-53 0.4 0.3 0.1 Υ2〇3 0.75 0 0.35 1150 2-54 0.5 0.3 0.1 Υ2〇3 0.75 0 0. 35 1150 2- 55 0.9 0.3 0.1 Υ2〇3 0.75 0 0.35 1150 2- 56 1 0.3 0.1 Υ2〇3 0.75 0 0.35 1150 2-57 0.75 0.3 0.1 Υ2〇3 0.4 0 0.35 1150 2-58 0. 75 0.3 0.1 Υ2〇3 0.6 0 0.35 1150 2-59 0. 75 0.3 0.1 Υ2〇3 0.9 0 0.35 1150 2-60 0.75 0.3 0.1 Υ2〇3 1 0 0.35 1150 2-61 0.75 0.05 0.1 Υ2〇3 0.75 0 0.35 1150 2 -62 0.75 0.1 0.1 Υ2〇3 0.75 0 0.35 1150 2-63 0.75 0.2 0.1 Υ2〇3 0.75 0 0.35 1150 2-64 0.75 0.4 0.1 Υ2〇3 0.75 0 0.35 1150 2-65 0.75 0.5 0.1 Υ2〇3 0.75 0 0.35 1150 2 - 66 0.75 0.3 0.1 Υ2〇3 0.75 0 0.35 1120 2-67 0.75 0.3 0.1 Υ2〇3 0.75 0 0.35 1180 2- 68 0.75 0.3 0.15 Dy2〇3 0.75 0 0.35 1150 2- 69 0.75 0.3 0.15 Η〇2〇3 0.75 0 0. 35 1150 2-70 0.75 0.3 0.15 Er2〇3 0.75 0 0.35 1150 2- 71 0.75 0.3 0.1 Υζ〇3 0.75 0.05 0.35 1150 2-72 0.75 0.3 0.1 Υζ〇3 0.75 0.1 0.35 1150 2- 73 0.75 0.3 0.1 Υ2〇3 0.75 0.2 0.35 1150 2-74 0.75 0.3 0.1 Υ2〇3 0. 75 0.3 0.35 1150 2-75 0.75 0.3 0.1 Υ203 0.75 0.4 0.35 1150 2- 76 0.75 0.3 0.1 Dy2〇3 0.75 0.2 0.35 1150 2-77 0 75 0.3 0.1 Η〇2〇3 0.75 0.2 0.35 1150 2- 78 0. 75 0.3 0.1 Er2〇3 0.75 0.2 0.35 1150 97111695 45 200904774 [Table 13] Sample No. MgO MnC〇3 V2〇5 Rare Earth Group No. 2 Rare earth element (Tb4〇7) Third rare earth element (Yb2〇3) Firing temperature Momomore Moir type Moer Moer °C 2- 79 0 0 0.1 Y2〇3 1 0.2 0 1170 2 -80 0 0 0.1 Υζ〇3 1 0.2 0.2 1170 2-81 0 0 0.1 Υ2〇3 1 0.2 0.3 1170 2-82 0 0 0.1 Υ2〇3 1 0.2 0.5 1170 2-83 0 0 0.1 Υ2〇3 1 0.2 0.6 1170 2-84 0 0 0.1 Υ2〇3 1 0.2 0.7 1170 2-85 0 0 0.1 Υ2〇3 1 0.2 0.9 1170 2-86 0.75 0.3 0.1 Υ2〇3 0.6 0 0 1190 2- 87 0.75 0.3 0.1 Υ2〇3 0.6 0 0.2 1190 2 -88 0. 75 0.3 0.1 Υ2〇3 0.6 0 0.3 1190 2-89 0.75 0.3 0.1 Υ2〇3 0.6 0 0.5 1190 2-90 0.75 0.3 0.1 Υ2〇3 0.6 0 0.6 1190 2-91 0. 75 0.3 0.1 Υ2〇 3 0.6 0 0.7 1190 2-92 0. 75 0.3 0.1 Υ2〇3 0.6 0 0.9 1190

1 46 97111695 200904774 [Table 14]

Sample No. MgO MnO V2〇5 Rare earth element second rare earth element (Tb4〇7) Third rare earth element (Yb2〇3) Moramole type Moer Moer 2-1 0.15 0.5 0.1 Y2〇3 1 0 0.35 2-2 0.1 0.5 0.1 Υ2〇3 1 0 0.35 2- 3 0.02 0.5 0.1 Ϊ2〇3 1 0 0. 35 2-4 0 0.5 0.1 Υ2〇3 1 0 0.35 2-5 0.05 0.2 0.1 Υ2〇3 1 0 0.35 2-6 0.02 0.2 0.1 Υ2〇3 1 0 0.35 2-7 0 0.2 0.1 Υ2〇3 1 0 0.35 2-8 0.05 0 0.1 Υ2〇3 1 0 0.35 2-9 0.02 0 0.1 Υ2〇 3 1 0 0. 35 2-10 0 0 0.1 Υ2〇3 1 0 0.35 2-11 0 0.5 0.05 Υ2〇3 1 0 0.35 2-12 0 0.5 0.12 Υ2〇3 1 0 0.35 2-13 0 0.5 0.15 Υ2〇 3 1 0 0.35 2-14 0 0.5 0.2 Υ2〇3 1 0 0.35 2-15 0 0.5 0.3 Υ2〇3 1 0 0.35 2-16 0.15 0.5 0.1 Υ2〇3 1 0.2 0.35 2-17 0.1 0.5 0.1 Υ2〇3 1 0.2 0.35 2- 18 0.02 0.5 0.1 Υ2〇3 1 0.2 0.35 2-19 0 0.5 0.1 Υ2〇3 1 0.2 0.35 2-20 0.05 0.2 0.1 Υ2〇3 1 0.2 0.35 2-21 0.02 0.2 0.1 Υ2〇3 1 0.2 0.35 2-22 0 0.2 0.1 Υ2〇3 1 0.2 0.35 2-23 0.05 0.1 0.1 Υ2〇3 1 0.2 0.35 2-24 0.02 0.1 0.1 Υ2〇3 1 0.2 0.35 2-25 0 0.1 0.1 Υ2〇3 1 0.2 0.35 2-26 0.05 0 0.1 Υ2〇3 1 0.2 0.35 97111695 47 200904774 [Table 15]

Sample No. MgO MnO V2〇5 Rare earth element Second rare earth element (Tb4〇7) Third rare earth element (Yb2〇3) Moramole type Moermoole 2-27 0.02 0 0.1 Y2〇3 1 0.2 0.35 2-28 0 0 0.1 γ2〇3 1 0.2 0.35 2-29 0 0 0.1 Υ2〇3 1 0.05 0.35 2-30 0 0 0.1 Υ2〇3 1 0.1 0.35 2-31 0 0 0.1 Υ2〇 3 1 0.3 0.35 2-32 0 0 0.1 γ2〇3 1 0.4 0.35 2-33 0 0.5 0.05 Υ2〇3 1 0.2 0.35 2- 34 0 0.5 0.12 Υ2〇3 1 0.2 0.35 2-35 0 0.5 0.15 Υ2〇3 1 0.2 0.35 2-36 0 0.5 0.2 Υ2〇3 1 0.2 0.35 2-37 0 0.5 0.3 Υ2〇3 1 0.2 0.35 2-38 0 0 0.1 Dy2〇3 1 0.2 0.35 2-39 0 0 0.1 Η〇2〇3 1 0.2 0.35 2- 40 0 0 0.1 Er2〇3 1 0.2 0.35 2- 41 0 0 0.1 Υ2〇3 0.5 0.2 0.35 2-42 0 0 0.1 Ϊ2〇3 1.5 0.2 0.35 2-43 0 0 0.1 Υ2〇3 1 0.2 0.35 2-44 0 0 0.1 Υ2〇3 1 0.2 0.35 2- 45 0 0 0.1 Υ2〇3 1 0.2 0.35 2-46 0 0 0.1 Υ2〇3 1 0.2 0.35 48 97111695 200904774 [Table 16]

Sample No. MgO MnO V2〇5 Rare earth element second rare earth element (Tb4〇7) Third rare earth element (YbaOa) Moramole type Moermoole 2-47 0.75 0.3 0.05 Y2〇 3 0.75 0 0.35 2-48 0.75 0.3 0.1 Υ2〇3 0.75 0 0.35 2-49 0.75 0.3 0.15 Υ2〇3 0.75 0 0.35 2-50 0.75 0.3 0.2 Υ2〇3 0.75 0 0.35 2-51 0.75 0.3 0.3 Υ2〇3 0.75 0 0.35 2-52 0.3 0.3 0.1 Υ2〇3 0.75 0 0.35 2-53 0.4 0.3 Υ2〇3 0.75 0 0.35 2-54 0.5 0.3 0.1 Υ2〇3 0.75 0 0.35 2-55 0.9 0.3 0.1 Υ2〇3 0.75 0 0.35 2-56 1 0.3 0.1 Υ2〇3 0.75 0 0.35 2- 57 0.75 0.3 0.1 Υ2〇3 0.4 0 0.35 2-58 0.75 0.3 0.1 Υ2〇3 0.6 0 0.35 2-59 0.75 0.3 0.1 Υ2〇3 0.9 0 0.35 2- 60 0.75 0.3 0.1 Υ2〇3 1 0 0.35 2-61 0.75 0. 05 0.1 Υ2〇3 0.75 0 0.35 2-62 0.75 0.1 0.1 Υζ〇3 0.75 0 0.35 2-63 0.75 0.2 0.1 Υ2〇3 0. 75 0 0.35 2- 64 0.75 0.4 0.1 Υ2〇3 0.75 0 0.35 2-65 0.75 0.5 0.1 Υ2〇3 0.75 0 0.35 2-66 0.75 0.3 0.1 Υ2〇3 0.75 0 0.35 2-67 0.75 0.3 0.1 Υ2〇3 0.75 0 0.35 2- 68 0.75 0.3 0.15 Dy2〇3 0.75 0 0. 35 2-69 0.75 0.3 0.15 Η〇2〇3 0.75 0 0.35 2-70 0.75 0.3 0.15 Er2〇3 0.75 0 0.35 2-71 0.75 0.3 0.1 Υ2〇3 0.75 0.05 0.35 2-72 0.75 0.3 0.1 Υ2〇3 0.75 0.1 0.35 2-73 0.75 0.3 0.1 Υ2〇3 0.75 0.2 0.35 2-74 0.75 0.3 0.1 Υ2〇3 0.75 0.3 0.35 2- 75 0.75 0.3 0.1 Υ2〇3 0.75 0.4 0.35 2- 76 0.75 0.3 0.1 Dy2〇3 0.75 0.2 0.35 2 -77 0.75 0.3 0.1 Η〇2〇3 0.75 0.2 0. 35 2-78 0.75 0.3 0.1 Er2〇3 0.75 0.2 0.35 97111695 49 200904774 [Table π] Sample No. MgO MnO VaOs Rare earth element second rare earth element (Tb4 〇7) 3rd rare earth element (Yb2〇3) Moramole type Moer Moer 2-79 0 0 0.1 Y2〇3 1 0.2 0 2-80 0 0 0.1 Υ2〇3 1 0.2 0.2 2- 81 0 0 0.1 Υ2〇3 1 0.2 0.3 2- 82 0 0 0.1 Υ2〇3 1 0.2 0.5 2-83 0 0 0.1 Υ2〇3 1 0.2 0.6 2-84 0 0 0.1 Ϊ2〇3 1 0.2 0.7 2- 85 0 0 0.1 Υ2〇3 1 0.2 0.9 2-86 0.75 0.3 0.1 Υ2〇3 0.6 0 0 2-87 0.75 0.3 0.1 Υ2〇3 0.6 0 0.2 2-88 0.75 0.3 0.1 Υ2〇3 0.6 0 0.3 2-89 0.75 0.3 0.1 Υ2〇3 0.6 0 0.5 2-90 0.75 0.3 0.1 Υ2〇3 0.6 0 0.6 2-91 0.75 0.3 0.1 Υ2〇3 0.6 0 0.7 2-92 0.75 0.3 0.1 Υ2〇3 0.6 0 0.9

97111695 50 200904774 [Table 18]

Thanks for the long-rate diffraction pattern of crystalline particles (25 嫌 suspected loss (25. 〇 insulation 1 imM sex 13⁄4 temperature negative test in the life clock ί· color (170 ° C '30V) (3-15V/&quot ;m) (12.5V//an) m Γ % — % Ω Ω XTRfelsf: hour 2-1 0. 35 350 1.6 3700 20 7. 0Ε+08 7. 0Ε+08 X -—_,叮^ 9 2- 2 0.32 320 1.6 3800 18 7. 0Ε+08 7. 0Ε+08 〇〇54 2-3 0.31 310 1.6 3800 17 7. 0Ε+08 7. ΟΕ+08 〇〇55 2-4 0.30 300 1.6 3700 16 7. 0Ε+08 7. 2Ε+08 〇〇56 2-5 0.32 320 1.6 3800 17 6. 0Ε+08 6. 0Ε+08 〇〇54 2-6 0.31 310 1.6 3800 16 6. 0Ε+08 6. 0Ε+08 〇〇55 2-7 0.30 300 1.6 3700 15 6. 0Ε+08 6. 2Ε+08 〇〇56 2-8 0.32 320 1.6 3800 16 5. 0Ε+08 5. ΟΕ+08 〇〇54 ~~ 2-9 0.31 310 L6 3800 15 5. 0Ε+08 5. 0Ε+08 〇〇55 2-10 0. 30 300 1.6 3800 14 5. 0Ε+08 5. 2Ε+08 〇〇59 2-11 0.29 Γ&quot; 290 1.3 3800 16 8. 0Ε+08 8. 3Ε+08 〇〇52 2- 12 0.31 “310 1.4 3720 16 6. 5Ε+08 6. 6Ε+08 〇〇54 2- 13 0.32 320 1.5 3630 17 4. 5Ε+08 4 . 7Ε+08 〇〇55 2-14 0.34 340 1.8 3350 22 3. 5Ε+08 3. 6Ε+08 〇ο 56 2-15 0.34 340 2 3350 22 3. 0Ε+08 3. 2Ε+08 〇ο 56 2-16 0.35 350 1.6 3700 20 7. 2Ε+08 7. 2Ε+08 〇X 49 2- 17 0.32 320 1.6 3800 18 7. 2Ε+08 7. 2Ε+08 〇ο 64 2-18 0.31 310 1.6 3800 17 7. 2Ε+08 7. 2Ε+08 〇ο 66 ~~ 2- 19 0.30 300 1.6 3700 16 7. 2Ε+08 7.4Ε+08 〇ο 66 2-20 0.32 320 1.6 3800 17 6. 2Ε+08 6. 2Ε+08 〇〇64 2-21 0.31 310 1.6 3800 16 6. 2Ε+08 6. 2Ε+08 〇〇66 2-22 0.30 300 1.6 3800 16 6. 2Ε+08 6. 3Ε+08 〇ο 70 2-23 0. 32 320 1.6 3800 17 6. 2Ε+08 6. 2Ε+08 ο 〇64~ 2-24 0.31 310 1.6 3800 16 5. 3Ε+08 5. 3Ε+08 〇〇66 2-25 0.30 300 1.6 3800 15 5. 3Ε+08 5. 5Ε+08 ο 〇 70 2-26 *Wood: Adenine 0.32 壬 不 不 320 320 320 320 320 320 320 320 3 1.6 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 3 The degree of circumstance is set to ^1 by the ^4) surface of the standing ^^. i u. uLiuw I χ·〇〇〇υυ u D. 0tfW 5.3E+08 〇〇64. The value at 1 means that the diffraction intensity of the (004) plane of the tetragonal system is greater than that of the cubic system (004). The case of the diffraction intensity of the surface. The value of .I^t/Ixc specific gas of less than 1 means that the diffraction intensity of the (〇〇4) plane of the tetragonal system is smaller than the diffraction intensity of the (〇〇4) plane of the cubic system. \ *林:〇: satisfies X7R, x: does not satisfy X7R# :〇: When X5R is satisfied, X: X5R is not satisfied ##Insulation resistance is inserted between the mantissa and the exponent The exponential notation of E. 51 97111695 200904774 [Table 19] Ο Xiehujie ion flat soil ^ &amp; extinction rate lining diffraction η dielectric record (25 〇〇 dielectric loss (25 ° unicorn 1 119 # sex----- ^ (10) in high temperature. C, 30V) (3_ 15V/&quot;m) (ΙΖδν/卿) jum % — — Ω Ω X®# J LMfWsc 2-27 0.31 310 1.6 3800 16 5. 2E+08 5.2E +08 Ο 66 2-28 0.30 300 1.6 3800 14 5. 2E+08 5.4E+08 〇〇70·~~ 2-29 0.30 300 1.6 3900 14 5. 2E+08 5.4E+08 〇〇2-30 0.30 300 1.6 3850 14 5. 2E+08 5.4E+08 〇〇65~~~~~ 2-31 0.30 300 1.6 3700 14 5.2E+08 5.4E+08 〇〇56~~~~~~ 2-32 0.30 300 1.6 3500 14 5.3E+08 5.5E+08 〇〇56~~~~~~ 2-33 0.29 290 1.4 3800 16 8.1E+08 8.2E+08 〇〇63~~ 2-34 0.31 310 1.4 3720 16 6.6E+08 6. 7E+08 〇〇75 2-35 0.32 320 1.5 3630 17 4· 6E+08 4. 7E+08 〇〇79^ 2-36 0.34 340 1.8 3350 22 3. 7E+08 3.8E+ 08 〇〇83 2-37 0.33 330 2 3350 22 3. 2E+08 3.3E+08 〇〇_ ----. 57 2-38 0.30 300 1.6 3700 14 5.1E+08 5. 2E+08 〇〇69 ~ 2-39 0.30 300 1.6 3700 14 5.1E+08 5.3E+08 〇〇69 2-40 0.30 300 1.6 3700 14 5.1E+08 5.2E+08 〇〇69 2-41 0.30 300 1.6 3800 14 5.0E+08 5.1E+08 〇〇69 2-42 0.30 300 1.6 3800 14 5.1E+08 Γ5.2Ε+08 〇〇69 2-43 0.40 400 1.6 4100 18 7. 2E+08 7. 3Ε+08 〇〇54 ^' 2-44 0.43 430 1.6 4400 24 7. 2E+08 7. 3Ε+08 〇 〇53 2-45 0.24 240 1.6 3000 23 7.1E+08 7. 2Ε+08 〇〇54~ 2-46 0. 27 270 Bu1·6 3100 23 7.1E+08 7. 2Ε+08 〇Ο 54 S4fxf/ The diffraction intensity of the (004) plane of the lif ί system is set to Ixt, which will represent the cubic system - the strength 詨 is ~^

• The value of the clear If/ is a value indicating that the diffraction intensity of the (004) plane of the tetragonal system is greater than the ratio of the (004) plane representing the cubic system. 004) The diffraction intensity of the surface is smaller than that of the (004) plane representing the cubic system: 〇: the case of full ^_X7R, X: the case where X7R is not satisfied # :〇: When X5R is satisfied, X: not The case where X5R is satisfied ## The insulation resistance is expressed by an index symbol in which E is inserted between the mantissa portion and the index portion. 97111695 52 200904774 [Table 20] Long rate

U-dielectric recording of the diffraction pattern (25°〇 dielectric loss (25°〇 insulation ψιΜ (3.15V/ jum) (1Z 5V/ jum)) b life load characteristic (170〇C, 30V) 2 -47 2-48 2- 49 2- 50 2- 51 2- 52 2-53 2- 54 2- 55 2-56 I- 57 2-58 2-59 2-60 2-61 2-62 2-63 2-64 2-65 2-66 2-67 2-68 2-69 I- 70 2-71 2-72 I- 73 2-74 2-75 2-76 2-77 2-78 /zm(Hi 0.44 0. 39 ).36 0. 32 0.48 0.47 0.46 0.41 0.39 0.49 0.40 0.33 0.31 0.44 λ 44 0.44 0.46 0.45 0.28 ).50 0.44 0.44 0.43 0.51 0.52 0.55 0.56 0.57 0. 54 0.54 0. 53 460 440 390 360 320 480 470 460 410 390 490 400 330 310 440 440 440 460 450 280 500 440 440 430 510 520 550 560 568 540 540 530 1.3

1J 1·! 1.8 2.0 1.3 1·! 1·! 1.1 1.4 1.- 1.' 1.! 1.3 1.』 1. 1.4 1.5 1.5 li 1.1 1. 1.6 1.6 1.6 1. 1.6 li 1.6 1. 1. 3800 4500 4320 4200 4000 4800 4670 4620 4120 3980 4760 4360 4020 3600 4390 4470 4490 4500 4300 4000 4700 4480 4470 4450 6010 6020 6100 6150 6030 6090 6080 6010 % 9.6 9.1 8.5 10.7 10.5 10.1 9.2 8.9 11. 10.2 3.1 8.8 11 11 11.3 13 12.3 10.1 10 10.5 10. 11 11. 13.1 11 11 11 Dan 8. 0E+08 ϋ 8. 3E+08 X5R# 52 7.1E+08 7.1E+08 〇54 4. 5E+08 4. 7E+08 〇55 3 5E+08 3. 0E+08 7. 2E+08 7. 2E+08 7. 2E+08 7. 3E+08 7.4E+08 7. 2E+08 7. 2E+08 7. 3E+08 7.5E +08 6. 0E+08 6.1Ε+08 6. 2Ε+08 6. 3Ε+08 6. 5Ε+08 7. 0E+08 7.1E+08 5.1E+08 5.1E+08 5.1E+08 7. 5E +08 7. 0E+08 6. 9E+08 6. 9E+08 6.8E+08 6. 9E+08 6. 9E+08 6. 9E+08 3. 6E+08 3. 2E+08 7. 2E+ 08 7. 2E+08 7.2E+08 7. 3E+08 7.4E+08 7. 2E+08 7. 2E+08 7. 3E+08 7. 5E+08 6. 0E+08 6.1Ε+08 6. 2Ε+08 6. 3Ε+08 6. 5Ε+08 7. 0E+08 7.1E+08 5.1E+08 5.1E+08 5.1E+08 7. 6E+08 7.1E+08 7. 0E+08 7. 0E+08 3. 9E+08 7. 0E+08 7. 0E+08 7. 0E+08 〇〇〇 〇〇〇〇〇〇〇〇〇〇〇〇〇〇〇〇〇〇〇〇〇〇〇〇55 55 55 57 55 55 &quot;56&quot; 57 54 55 55 56 57 53 54 53 71 The finger of 'Ilf»1 whose intensity is set to the intensity/degree ratio indicates that the diffraction intensity of the (〇〇4) plane of the tetragonal system is larger than the (10)4) plane of the cubic system. The diffraction intensity of the tetragonal (4) _) plane is smaller than the case where the cubic crystal (4) (10) 4) plane is L: 〇 3 feet. 'x: The case where X5R is not satisfied. ## The insulation resistance is based on the insertion of E between the mantissa portion and the index portion. The index symbol indicates. 97111695 53 200904774 [Table 21] Crystalline particle _ _ _ _ _ _ _ high temperature negative (170eC '30V) trial long rate diffraction pattern of 5 grade Yulin dielectric miscellaneous (25 ° 〇 dielectric loss (25 〇〇 (3.15V///m) 02. δν/,ωη) Dielectric special |± JUID %_ — % Ω Ω Delete X7Rrn 71 2-79 0. 35 350 1.7 4200 14 5. 2Ε+08 5.4Ε+08 2 -80 0.35 350 1.7 4200 14 5. 2Ε+08 5.4Ε+08 〇〇------- 69 2-81 0. 33 330 1.6 3900 14 5. 2Ε+08 5.4Ε+08 〇〇68 2- 82 0. 32 320 1.6 3900 15 5. 2Ε+08 5. 4Ε+08 〇〇64 2-83 0.32 320 1.6 3900 16 5. 2Ε+08 5.4Ε+08 〇〇62 2-84 0. 32 320 1.6 3850 17 5. 2Ε+08 5.4Ε+08 〇〇45 2-85 0.31 310 1.6 3750 19 5. 2Ε+08 5. 4Ε+08 〇〇33 2-86 0.45 450 1.7 4700 11 7.1Ε+08 7.1Ε+08 X 55 ' 2-87 0.45 450 1.7 4700 11 7.1Ε+08 7.1Ε+08 〇X 55 2-88 0.42 420 1.6 4470 12 7.1Ε+08 7.1Ε+08 〇X 54 2-89 0.42 420 1.6 4430 12 7.1 Ε+08 7.1Ε+08 〇X 54 2-90 0.42 420 1.8 4410 13 7.1Ε+08 7.1Ε+08 〇X 53 2-91 0.42 420 1.6 4400 13 7.1Ε+08 7.1Ε+08 〇X 43~~ ~ 2-92 | Too: il 吏 0.41 士 · τ 士 410 曰 each from rn 1.6 kh 4390 15 Swift helmet lv 7. 0 Ε +08 7. 0 Ε +08 〇 X 30 when Ixt / Ixc ratio. ** ** * Xc Γ • 1 The value indicates that the diffraction intensity of the (004) plane of the tetragonal system is greater than the (004) plane of the cubic system. The value of the comparison of Ixt/Ixc is less than 1, which means that the (004) plane of the tetragonal system is wound. The incident intensity is smaller than the diffraction intensity indicating the (004) plane of the cubic crystal system. &lt;# :〇: When X5R is satisfied, X: X5R is not satisfied. Lin* :〇: X7R is satisfied, X: X7R is not satisfied. ##Insulation resistance is between the mantissa and the index. Insert the exponential notation of E. From the results shown in Tables 10 to 21, it is known that "the Yb2〇3 conversion meter contains 〇. 35 莫 s material No. 2-1 to 78' can be obtained with and without the composition of the mirror. Sample No. 1-1 to 10, 12 to 16, 18 to 34, 36 to 40, 42 to 44, 46, 47, 52 to 65, 68 to 78, and 80 to 90 were respectively graded. Further, in the sample No. 2-79 to 85, the conversion γ!). The conversion meter contains 0. 3 to 0. 6 moles of sample No. 2-81 to 83 'the firing temperature is higher than the example The dielectric ceramic firing temperature of sample No. 1-30 shown in Fig. 1 was 4 高 higher. (:, However, it still has characteristics similar to those of the dielectric ceramics of the sample No. 1-30 shown in the first embodiment. 54 97111695 200904774 Furthermore, in the sample No. 2-86 to 92, the conversion Yb2〇3 The conversion meter contains 0. 3~0·6 moles of sample No. 2 to 88 to 90, and the firing temperature is 4 〇t higher than the dielectric ceramic firing temperature of the sample No. However, it still has the characteristics of substantially the same level as the dielectric ceramic of the sample N〇. _69 shown in Example 1. From this, it is known from the dielectric ceramics of the sample N〇. 2_8, 83, 88 to 9 〇. By using 〇·3~〇6mol according to Yb2〇3 conversion, the dielectric properties of dielectric ceramics can be reduced even if the firing temperature is changed within 4 (the range of TC) (dielectric constant, BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a schematic view showing a micro-structure of a dielectric ceramic of the present invention. Fig. 2 (a) is an X-ray diffraction pattern of a sample of a dielectric ceramic of the present invention; (b) is a cross-sectional view of a sample of a comparative dielectric dilator, N 〇. 5丨. Fig. 3 is a schematic cross-sectional view showing an example of a multilayer ceramic capacitor of the present invention. Ming] 1 'la' lb grain boundary phase crystal particles external electrode 4 5 7 dielectric layer 10 of the capacitor internal electrode layer laminate body 10A 9711169555

Claims (1)

200904774 X. Application for patent garden: 1. A dielectric ceramic, which is made of barium titanate bismuth (10) material: 77, which is for the composition 0 05~0 3 H. 5 conversion is calculated as 0.05 0.3 m, 依 Mn 换算 换算 换算 〇 〇 〇 〇 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫 莫The rare earth element 选择 selected from the group consisting of yttrium, lanthanum, titanium (10), and yam further contains | bow, and has: the above-mentioned barium titanate as the main body, and the above-mentioned calcium han is at 原子. 2 atom% The first knot composed of the following crystal particles and the first one composed of the above-mentioned day and day particles with the above-mentioned barium titanate as the main 0/IV, . ^ H and the upper roll rolling degree of 0.4 atomic enthalpy 2 crystallization, where the diffraction intensity of the (_) plane in the X-ray diffraction pattern of the dielectric ceramic is greater than that of the table spear: square: the diffraction intensity of the tetragonal barium titanate. (40) face of the Japanese-Japanese-Japanese-Korean lock 2. If the scope of the patent application is 丨忐μ m π , 丨 丨 是 , , , , , , , , , , , 相对 相对 相对 相对 相对 相对 相对 相对 相对η ! h Guan Xiu "The following system contains: according to the MgO conversion, the above-mentioned town of Moh, according to _ conversion is 0~0.5 m above ^^ and according to his (1) conversion (a) ~ with Mo's heart One of the above-mentioned rare earth elements (10) selected from the pin and the oblique. 3. If the scope of the patent application is 2, the amount of the meter is calculated according to the meter, and the above-mentioned town contains 4. The dielectric ceramics according to item 3 of the patent application scope, wherein the above-mentioned fierce contains 9711695 56 200904774 The quantity is measured in terms of MnO. 5 _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ For the above table of 〇3 〇9 Mo, the above clock according to Mno conversion is 〇〇5~〇.5 Mo, and the calculation according to the secret is 〇.4~〇9莫耳之纪,钢,钦And oblique 6 as the dielectric chemistry of any one of the scopes of the patent application, the basin is under the 钡100 构成 constituting the above-mentioned barium titanate, and the system further contains the 换算.3 Mo ear (four) circumference. Under the money. A dielectric ceramic according to any one of the first to fifth aspects of the patent scope of the present invention, which has a U.S. In the range below Moher, there are 8. multilayered ceramic capacitors, which are characterized by a dielectric layer composed of a dielectric ceramic of Shen &quot; and a J body. 1 electrode layer laminate 97111695 57