200844445 九、發明說明： ✓ 【發明所屬之技術領域】 本發明涉及一種對鏡頭模4且夕於广％ ^ f 依、、且之鏡座進行表面電阻測 試之測試裝置及測試方法。 【先前技術】 隨著攝像技術之發展’鏡頭模組於各種用途之攝像裝 置中得到廣泛之應用，鏡頭模組與各種可檇式電子裝置如 手機、電等之結合，更得到眾多消費者之青睞。 然而，隨著可檇式電子裝置朝著功能多樣化之方向發 展，其元件亦變得越來越複雜，且所述元件大多需通電才 能工作，這導致所述可檇式電子裝置很容易因為電磁干擾 而影響正常工作。 鏡頭模組通常作為攝像裝置之元件而廣泛地應用於 可檇式電子裝置中，其一般包括鏡片、鏡座、濾光片及用 於間隔鏡片與濾光片之間隔部件，如墊片等。於鏡頭模組 組裝過程中，通常需將所述鏡片、濾光片及墊片等元件藉 由一定順序裝入鏡座，再將鏡座旋入鏡座以組裝成一完整 之鏡頭模組。另外，為降低所述鏡頭模組受電磁干擾之程 度，一般還需於所述鏡座之表面塗上一層防電磁干擾 (Electromagnetic Interference，EMI)塗層 ° 當鏡座之表面塗上防電磁干擾(EMI)塗層後，還需要利 用靜電計（Electrometer)測試該塗層之電阻值是否達到要 求，以將達不到防電磁干擾需求之鏡座淘汰掉，保證產品 之良品率。而通常之做法係人手拿住靜電計之探針直接對 7 200844445 塗層之電阻值進行測試。然而，由於探針尖端十分銳利， 很容易劃破塗層而造成測試誤差，是故測試時探針需跟塗 層表面保持一定距離以確保測試之品質，可以理解的是， 採用人手操作之方式將難以達到上述之測試要求。 有鑒於此，提供一種能精確快捷之測試鏡座表面防電 磁干擾塗層之電阻之鏡座測試裝置及測試方法實為必要。 【發明内容】 下面將以具體實施例說明一種能精確快捷之測試鏡 座表面防電磁干擾塗層之電阻之鏡座測試裝置及測試方 法，其可實現測試過程中測試單元與鏡座間保持一定距離 及實現該測試之自動化。 一種鏡座測試裝置，所述鏡座測試裝置包括：一固持 單元，所述固持單元用以固持鏡座；一測試單元，所述測 試單元用以對所述固持單元固持之鏡座之表面防電磁干擾 塗層進行電阻測試；至少一夾持單元，用於夾持及輸送所 述鏡座；以及一控制單元，用以控制所述測試單元對所述 鏡座進行測試時所述測試單元與所述鏡座之距離保持一定 值，同時接收處理所述測試單元之測試值而檢定所述鏡座 是否為正品並控制所述至少一夾持單元對所述鏡座進行夾 持及移動。 以及，一種採用上述鏡座測試裝置之鏡座測試方法， 其包括以下步驟：所述夾持單元夾持所述鏡座並將所述鏡 座輸送至所述固持單元；所述固持單元將所述鏡座固持 住；所述控制單元控制所述測試單元與所述鏡座間之距離 8 200844445 試:，一 *防電 測試單元之測試值而:::述元接收處理所述 相對於先前技術，所述鏡座測試裝盆 藉由設置至少-夹掊+ # m戈方法” 由設置-控制單元_制^移動所述鏡座，同時經 之減μ ★制程中剩試單元與鏡座之間 之距離，不僅實現了鏡座測試之自動 測試品質。 λΐ逆风J早乂狂心 【實施方式】 :面將結合圖式對本發明作進—步詳細說明。 壯明麥閱圖1，本發明第一實施例提供之一種鏡座測試 =置10’用於對鏡座之表面防電磁干擾塗層之電阻進行測 減。所述鏡座_裝置1Q包括—@持單元η，—測試單元 12，至少一夾持單元133，以及一控制單元14。 所述固持單元11包括一固持部111及一用於承載鏡座 20之平臺112。該固持部^用於固持所述鏡座，優選地， 該固持部可為一夾爪，當鏡座20放 置於平臺112上時，所述 固持單元11之固持部ln，亦即所述夾爪閉合，可將所述鏡 座20固持住。 所述測試單元12用以對所述固持單元11固持之鏡座20 之表面防電磁干擾(Electromagnetic Interference，EMI)塗層 進行電阻測試，其可為一靜電計(Electrometer)，且所述靜 電計包括一對探針121。 所述控制單元14控制所述測試單元12，使其於對所述 9 200844445 鏡座20進行測試時與所賴㈣之聽㈣—定值/同時 接收處理所述測試單元12之測試值而檢定所述鏡座扣是^ 為正口口。§亥控制#元14進一步控制所述至少—失持單元 133，使其對所述鏡座2〇進行失持及移動。 所述失持單元i训於失持所述鏡座2()，其可為—失 爪，優選地’所述鏡座測試裝置10還進一步包括一懸臂18， 所述夾持單71133及所述測解元12賴於料懸臂18之 兩端’由所述懸臂18帶動其運動。另外，所述鏡座 置10可進-步包括—旋轉單元19，其連接於所述懸臂18 上如懸#18之中部，並可帶動所述懸臂ι8旋轉。可 解的是’該旋轉單元19可為-伺服馬達。 本發明實施例—提供之鏡座測試裝置1G之X作過程 固持單元133夾持所述鏡座2G並將其輪送至所述 口持早心。如圖!所示’第—托㈣ ===卿所_则所7= 牝皿21，亚罪近所述鏡座2〇,此時， 制單元14控制所述夹持單元说之央爪閉合，即可 座細持住，從而可再經由所述懸 ：:鏡 133及其夹持之鏡㈣移至所述固持單仙。攻丈持早凡 、、所，固持單元11將所述鏡座20固持住。具體地， 述控制單元14控制所述懸臂18帶動所述夹持單:立 夾持之鏡座20移動至所述固持 、、兀133及” 置於平A112f_a士 ^ + 寺 亚將所述鏡座20放 置於千至m切，所述固持部m之夹爪閉合，可將所述 10 200844445 • 鏡座20固持住。 • 所述控制單元14控制所述測試單元12與所述鏡座2〇 間之距離保持一定值，同時由所述測試單元12對所述鏡户 20之表面防電磁干擾塗層之電阻進行測試。具體 控制單元控制所述懸臂18帶動所述測試單元I]，亦即戶、 靜電計移動並靠近所述固持單元u固持之鏡細， 所述靜電計之探針12i接近所述鏡座2〇之表面，當所述ς釺 121之尖端（未標示）與所述鏡座2〇之達到—定距離時，啟動 所述測試單元12,亦即所述靜電計之開關，開始對所述梦 座20之表面防電磁干擾塗層之電阻進行測試。需要特別= 意之係’為保持測試品質，當所述測解元朗所述鏡座 20之表面防電磁干擾塗層之電阻進行測試時，需保持所〇 探針121相對所述鏡座20之表面之距離不變。 ^ 所述控制單元14接收處理所述測試單元12之測蜮值 而檢定所述鏡座20是否為正品。具體地，由實驗方法^寻 ^-妓:欠品與正品之基準值，當所述賴值小於或等於 u亥基準值日可，經由所述控制單元14可檢定與該測定值相對 應之鏡座20為正品，當所述測試值大於該基準值時，經由 口述控制單凡14可檢定與該敎值相對應之鏡座如為次 口 σ ° > 口 Ϊ —步地，#經由所述控制單元14檢定所述鏡座2〇為 人4 ’可由所述控制單元u控制所述旋轉單元工$，亦即 所述飼服馬達旋轉而帶動所述懸臂職轉，使所述央持單 兀133移至魏檢定為次品之鏡座継將其夾持，從而可藉 11 200844445 由所述懸f18帶動簡座跑所軌盤22並放置於其上。 =應Ί經由所述控制單元14檢定所述鏡座加為正品 由同樣方法藉由所述懸臂18帶動所述鏡座20至所 ^皿亚放置於其上。綜上所述，經由設置托盤21及托 將所述經檢定為次品或正品之鏡座加分開處理。 %盘^關2纟發明第二實施例提供之鏡座測試裝置 ”弟-實施例提供之鏡座測試I置iG相比，盆差別在 =所述鏡座賴裝⑽包括複數㈣單元如婦單元 、夾持單元m及夾持單元133。相·地 =制所述爽持單元131、夹持單元132及爽持單元133早 ，、對所述鏡座20進行夾持及移動。 進-步地’所料料元131、婦單元132及失 =用以夾持及輸送所述鏡座2Q，且其分別為—夹爪。所 ^早，於失持經所述測試單元12測試，並為所述 ㈣=14檢疋為次品之鏡赫。另外，所述鏡 ㈣還包括-料16 n讀單元m輯 : =連接於所述懸臂16之兩端，並由所述懸臂寺= :。優選地，所述之鏡座魏置3〇可包括一旋轉單元;7運 嶋旋轉。可以理解二 中部，亚可帶動所述 達。疋轉了以理解的是，該旋轉單切可為—飼服馬 與本發明實施例—提供之鏡座測試裝置ig之工 王目比’實施例二提供之鏡座測試裝置3()之 別在於： 「町杠之是 12 200844445 座2。=述=單=:夹持單7夹持所述鏡 ^ 早凡11具體地，第-托盤21中齡有“ 干個鏡座20 ’所述控制單元14控制所述懸：：：右 持早兀131與所述夾持單元132移至該第—托句卜並^ 所述鏡座20 ’此時，由所述控制單元 二？ ==元132之夾爪閉合，即可將所述= =二 ㈣f 16帶動所述夾持單元1取所 述夾持早元132及其夾持之鏡㈣移至所述_單元u、 料鱗單元131或所述线單元132將所述 鏡座20夾持至料_單肋，錢置於所述平臺出 可由所述控制單元14控制所述旋轉單元17，亦即所述飼服 馬達旋轉而帶動所述懸臂職轉某個角度，使所述夹持單 兀131或所述緒單元132與所相持單元^偏離某個角 度，從而可使所述測試單元12移動至所述固持單元 進一步地，當經由所述控制單元14檢定所述鏡座2〇為 次品時，可由所述控制單元14控制所述旋轉單元Μ，亦即 所述伺服馬達旋轉而帶動所述懸臂18旋轉，使所述夹持單 元133移至该被檢定為次品之鏡座2〇並將其夾持，從而可藉 由所述懸臂18帶動該鏡座20至所述托盤22並放置於其上。 ^目應地，當經由所述控制單元14檢定所述鏡座2〇為正品 時，可由所述控制單元14控制所述旋轉單元17，亦即所述 行服馬達凝轉而T動所述懸臂16旋轉，使所述夹持單元131 不會與所述夾持單元131或所述夾持單元132發生干涉。 或所述夾持單元132移至所述固持單元π，從而可藉由所述 13 200844445 夹持單元m或料料單以现紐蚊^ 〇夹=並f由所述懸臂16移動並放置於所述托；二 „。上述可知，所述懸臂16可帶動所述連接於其 而=之祕單元m及㈣單元132移動至所述、從 :可-次齡賴由所述讀單元131及所料 也 =兩=鏡座。可以理解的是，所述夾持單元ΐ3ι或所述夹 序寺早將所賴細放置於所述平臺ιΐ2上之先後次 可由所述控制單元14進行控制。 本發明實施例提供之鏡座測試裝置職測試方法，其 ^设置至少—夹持單元，如夾持單元131、夹持單元132 μΪ單元133以夹持並移動所述鏡㈣，同時經由設置一 ^早心以控㈣戌過程巾職單元12與鏡㈣之間之 測：：僅實現了鏡座2。測試之自動化如 、’、’τ、上所述’本發明確已符合發明專利之要件，爱依法 專利申4。惟’以上所述者僅為本發明之較佳實施方 ;技:毛明之範圍並不以上述實施方式為限，舉凡熟習本 ^ 轟之人士杈依本發明之精神所作之等效修飾或變化， 白應涵蓋於以下申請專利範圍内。 【圖式簡單說明】 一立圖1係本發明第一實施例提供之鏡座測試裝置之結構 圖2係本發明第二實_提供之鏡座測試裝置之結構 14 200844445 【主要元件符號說明】 鏡座測試裝置 10、30 固持單元 11 固持部 111 平臺 112 測試單元 12 探針 121 夾持單元 131、132、133控制單元 14 懸臂 16、18 旋轉單元 17、19 鏡座 20 第一托盤 21 第二托盤 22 15200844445 IX. INSTRUCTIONS: ✓ Technical Field of the Invention The present invention relates to a test apparatus and a test method for performing surface resistance testing on a lens holder 4 and a wide range of mirror mounts. [Prior Art] With the development of camera technology, the lens module has been widely used in various types of camera devices. The combination of lens modules and various portable electronic devices such as mobile phones and batteries has won many consumers. Favor. However, as portable electronic devices are moving toward functional diversification, their components are becoming more and more complex, and most of the components require power to operate, which makes the portable electronic device easy because Electromagnetic interference affects normal operation. Lens modules are commonly used in portable electronic devices as components of imaging devices, and generally include lenses, mirror mounts, filters, and spacers for spacer lenses and filters, such as spacers. During the assembly of the lens module, components such as the lens, the filter and the spacer are usually inserted into the lens holder in a certain order, and then the lens holder is screwed into the lens holder to assemble a complete lens module. In addition, in order to reduce the degree of electromagnetic interference of the lens module, it is generally required to apply an anti-electromagnetic interference (EMI) coating on the surface of the lens holder. ° When the surface of the lens holder is coated with anti-electromagnetic interference After (EMI) coating, it is also necessary to test whether the resistance value of the coating meets the requirements by using an electrometer (Electrometer), so as to eliminate the mirror seat that does not meet the anti-electromagnetic interference requirement, and ensure the yield of the product. The usual practice is to manually test the resistance of the 7 200844445 coating by holding the probe of the electrometer. However, because the tip of the probe is very sharp, it is easy to scratch the coating and cause test errors. Therefore, the probe needs to be kept at a certain distance from the surface of the coating to ensure the quality of the test. It is understandable that the method of manual operation is adopted. It will be difficult to meet the above test requirements. In view of this, it is necessary to provide a mirror mount test device and a test method capable of accurately and quickly testing the resistance of the surface of the mirror mount against the electromagnetic interference coating. SUMMARY OF THE INVENTION A mirror holder test device and a test method capable of accurately and quickly testing the resistance of an anti-electromagnetic interference coating on a surface of a mirror base will be described in the following embodiments, which can achieve a certain distance between the test unit and the lens holder during the test. And automate this test. A lens holder testing device includes: a holding unit, the holding unit is configured to hold the lens holder; a test unit, the test unit is configured to prevent the surface of the lens holder held by the holding unit The electromagnetic interference coating performs resistance testing; at least one clamping unit for clamping and conveying the lens holder; and a control unit for controlling the testing unit when the testing unit tests the lens holder The distance of the lens holder is maintained at a certain value, and the test value of the test unit is received and processed to verify whether the lens holder is genuine or not, and the at least one clamping unit is controlled to clamp and move the lens holder. And a lens holder testing method using the above-described lens holder testing device, comprising the steps of: the clamping unit clamping the lens holder and conveying the lens holder to the holding unit; The mirror holder is held; the control unit controls the distance between the test unit and the mirror base 8 200844445. Test: a test value of a *proof test unit and::: the description of the receiving process is relative to the prior art. , the lens holder test basin is moved by the setting-control unit _ system by setting at least the clamp # + # m 戈 method, and at the same time, the μ ★ ★ the remaining test unit and the mirror base in the process The distance between the two sets not only realizes the automatic test quality of the mirror test. λ ΐ ΐ J J 乂 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 【 The first embodiment provides a lens holder test=set 10' for measuring and subtracting the resistance of the surface anti-electromagnetic interference coating of the lens holder. The lens holder_device 1Q includes -@ holding unit η, - test unit 12 At least one clamping unit 133, and one The holding unit 11 includes a holding portion 111 and a platform 112 for supporting the lens holder 20. The holding portion is for holding the lens holder, and preferably, the holding portion can be a jaw. When the lens holder 20 is placed on the platform 112, the holding portion ln of the holding unit 11, that is, the clamping jaw is closed, the lens holder 20 can be held. The testing unit 12 is used for holding the lens holder 20. The surface of the mirror holder 20 held by the unit 11 is subjected to an electrical resistance test (Electromagnetic Interference (EMI) coating), which may be an electrometer, and the electrometer includes a pair of probes 121. The control unit Controlling the test unit 12 to verify the test position of the test unit 12 when the test is performed on the 9 200844445 lens holder 20 and the test (4) of the test (4). The buckle is ^ is the positive mouth. The _ hai control # yuan 14 further controls the at least - the holding unit 133 to cause the lens holder 2 to be lost and moved. The lost unit i is lost The lens holder 2(), which may be - a claw, preferably a 'the lens holder The testing device 10 further includes a cantilever 18, and the clamping unit 71133 and the measuring element 12 are driven by the cantilever 18 by the two ends of the material cantilever 18. In addition, the lens holder 10 can be The step-by-step includes a rotating unit 19 coupled to the cantilever 18 such as the middle of the suspension #18 and capable of rotating the cantilever ι8. It is solvable that the rotating unit 19 can be a servo motor. Embodiment - The X of the lens holder test device 1G is provided as a process holding unit 133 to clamp the lens holder 2G and rotate it to the mouth to hold the heart early. As shown in the figure, 'the first tray (four) ===卿所_则7= 牝 21 21, 亚 近 near the mirror seat 2 〇, at this time, the unit 14 controls the clamping unit to say that the central claw is closed, so that the seat can be held tightly, so that The suspension:: mirror 133 and its holding mirror (4) are moved to the holding unit. The holding unit 11 holds the lens holder 20 in an early manner. Specifically, the control unit 14 controls the cantilever 18 to drive the clamping sheet: the mirror holder 20 of the vertical clamping moves to the holding, the 兀133, and the 置于 置于 置于 置于 A A 112 112 112 112 112 所述 所述 所述The seat 20 is placed at a thousand to m cut, the jaws of the holding portion m are closed, and the 10 200844445 • the mirror base 20 can be held. • The control unit 14 controls the test unit 12 and the lens holder 2 The distance between the turns is maintained at a certain value, and the resistance of the surface anti-electromagnetic interference coating of the mirror 20 is tested by the test unit 12. The specific control unit controls the cantilever 18 to drive the test unit I], The mirror, the electrometer moves and is held close to the holding unit u, and the probe 12i of the electrometer is close to the surface of the lens holder 2, when the tip (not labeled) of the crucible 121 is When the mirror holder 2 reaches a certain distance, the test unit 12, that is, the switch of the electrometer, is started to test the resistance of the surface anti-electromagnetic interference coating of the dream seat 20. It is required to be special = In order to maintain the quality of the test, when the test is described by Yuen Long When the resistance of the surface anti-electromagnetic interference coating of the seat 20 is tested, the distance between the probe 121 and the surface of the lens holder 20 is kept constant. ^ The control unit 14 receives the measurement of the test unit 12 Determining whether the lens holder 20 is genuine or not. Specifically, by the experimental method, the reference value of the product and the product is found, and when the value is less than or equal to the reference value of the U-hai, the The control unit 14 can verify that the lens holder 20 corresponding to the measured value is a genuine product. When the test value is greater than the reference value, the lens holder corresponding to the threshold value can be verified by the oral control unit 14 as Port σ ° > Ϊ - step by step, # via the control unit 14 to verify that the mirror holder 2 is a person 4 ' can be controlled by the control unit u, that is, the feeding motor Rotating to drive the cantilever rotation, moving the central holding unit 133 to the mirror seat of the Wei test, and clamping it, so that the hanging track can be driven by the suspension f18 by 11 200844445 22 and placed thereon. = should be verified by the control unit 14 By the same method, the lens holder 20 is placed on the lens holder 20 by the cantilever 18 to be placed thereon. In summary, the lens holder that is verified as defective or genuine is disposed via the setting tray 21 and the tray. Adding separate processing. % disk ^ off 2 纟 invention of the second embodiment of the mirror holder test device "different-example provided by the mirror test I set iG compared to the basin difference = the mirror mount (10) includes The plural (four) unit is a woman unit, a grip unit m, and a grip unit 133. Phase/ground = The holding unit 131, the clamping unit 132, and the holding unit 133 are made early, and the mirror holder 20 is clamped and moved. The feed unit 131, the female unit 132, and the missing unit are used to clamp and convey the lens holder 2Q, which are respectively - jaws. As early as, the test is carried out by the test unit 12, and the (4)=14 check is the mirror of the defective product. In addition, the mirror (4) further includes a material 16 n reading unit m: = connected to both ends of the cantilever 16, and by the cantilever temple = :. Preferably, the mirror mount can include a rotating unit; 7 rotates. It can be understood that the middle part of the second can drive the said. It has been understood that the rotary single cut can be the same as the mirror mount test device 3 provided in the second embodiment of the present invention. The other is: "The bar is 12 200844445 Block 2. ===Single=: Clamping sheet 7 holds the mirror ^Where 11 specifically, the first tray 21 has a "dry mirror base 20" The control unit 14 controls the suspension::: the right holding early 131 and the clamping unit 132 are moved to the first to the next sentence and the mirror base 20' is at this time, by the control unit two? If the jaws of the == element 132 are closed, the = 2 (four) f 16 can be driven to move the clamping unit 1 to the clamping element 132 and its clamping mirror (4) to the _ unit u, material The scale unit 131 or the line unit 132 clamps the lens holder 20 to a material-single rib, and the money is placed on the platform. The rotation unit 17 can be controlled by the control unit 14, that is, the feeding motor Rotating to drive the cantilever to a certain angle, so that the clamping unit 131 or the guiding unit 132 is offset from the holding unit by an angle, so that the testing unit 12 can be moved to the holding unit Further, when the mirror base 2 is determined to be defective by the control unit 14, the rotating unit 控制 can be controlled by the control unit 14, that is, the servo motor rotates to drive the cantilever 18 to rotate. The clamping unit 133 is moved to the mirror holder 2, which is determined to be defective, and clamped so that the lens holder 20 can be driven to the tray 22 by the cantilever 18 and placed thereon. ^, when the lens holder 2 is verified as authentic by the control unit 14, the rotation unit 17 can be controlled by the control unit 14, that is, the clothes motor is condensed and T is The cantilever 16 rotates so that the clamping unit 131 does not interfere with the clamping unit 131 or the clamping unit 132. Or the clamping unit 132 is moved to the holding unit π so that the clamping unit m or the bill of materials can be moved and placed by the cantilever 16 by the clamping unit m or the bill of materials. In the above, the cantilever 16 can drive the connected unit m and the (4) unit 132 to move to, from: the second-order age to the reading unit 131 and It is also understood that the two = mirror holders. It can be understood that the clamping unit ΐ3ι or the ordering temple can be placed on the platform ι2 in succession by the control unit 14. The lens holder test device job test method provided by the embodiment of the invention provides at least a clamping unit, such as a clamping unit 131, a clamping unit 132, and a unit 133 for clamping and moving the mirror (4) while setting a ^ Early heart to control (four) 戌 process between the unit 12 and the mirror (four):: only the mirror holder 2. The automation of the test, such as ', 'τ, above, 'the invention has indeed met the invention patent The requirements are in accordance with the law patent application 4. However, the above is only the preferred embodiment of the present invention; The scope of the present invention is not limited to the above-mentioned embodiments, and the equivalent modifications or variations made by those skilled in the art in accordance with the spirit of the present invention shall be covered by the following patents. 1 is a structure of a lens holder testing device according to a first embodiment of the present invention. FIG. 2 is a second embodiment of the present invention. FIG. 2 is a structure of a lens holder testing device. 30 Holding unit 11 Holding portion 111 Platform 112 Testing unit 12 Probe 121 Holding unit 131, 132, 133 Control unit 14 Cantilever 16, 18 Rotating unit 17, 19 Mirror holder 20 First tray 21 Second tray 22 15