200839270 九、發明說明： 【發明所屬之技術領域】 本發明涉及一種量測一個或多個電性値之電路配置。本 發明涉及發光媒體用之電子操作裝置中量測電性操作値用 的電路配置。 【先前技術】 電子式操作裝置目前幾乎都用於各種類型的發光媒體 中。此操作裝置例如可包括低壓鹵素燈、低壓放電燈和高 壓放電燈用的操作裝置。高壓放電燈用的特殊之電子式操 作裝置很緊密且有多種電性値須測量。由於上述之操作裝 置通常都經由一種微控制器來控制，則需要多個類比/數位 (A/D)轉換器，以便可量測電性値。然而，這樣會造成高的 成本，此乃因具有多個A/D轉換器之微控制器較只具有一 個A/D轉換器之微控制器昂貴很多。 於是，須設計多種測量電路，使測量電路中流有若千電 流，A/D轉換器需要電流以便可準確地進行測量。A/D轉換 器在每一測量電路中會造成不可忽略的損耗，這些損耗在 數量大的測量電路中相加而成爲可觀的數値。 【發明內容】 本發明之目的是對習知的電子式操作裝置之缺點予以改 良，以便可較有利地製造該電子式操作裝置。本發明同時 可使電子式操作裝置中的損耗功率下降。 本發明的目的以下述方式來達成：使用一種只具有一 A/D 轉換器之微控制器，但此微控制器具有多個輸出端或一個 200839270 控制邏輯。 通常，在習知的技術中是以一種分壓器來測量電壓，其 中該待測量的電壓是在一可容易操控的位準上予以標度。 待測量的電壓在一般的電子式操作裝置中具有數十至數百 伏特之値。在一種以230伏特之電源電壓來操作的操作裝 置中，電壓經電源整流器之後的數値成爲例如400伏特。 因此，須設計分壓器以測量分壓比是1 : 1 00之電壓’使400 伏特可由微控制器輸入端上的4伏特電壓來表示。爲了準 確地進行測量，A/D轉換器須使用一種大約0.3至0.4 mA 之輸入電流。因此，須設計該分壓器，使0.5至1 mA之電 流持續地流動，以便可提供至A/D轉換器。在待測量的電 壓是400伏特時，則每個分壓器中會造成大約200至400 毫瓦之損耗。 爲了測量電流，可使用一種分路（shunt)，其直接構建在 待測量的電路中。然後，測量該分路上所下降的電壓，且 利用該分路之電阻値，則可得知該處所流動的電流。 若須測量多個電壓和電流，則可設置多個分壓器或分 路，其分別具有一接取點，各接取點分別與該微控制器之 一 A/D轉換器相連接（第1圖）。 此處，依據本發明，在每一分壓器中在各電阻之間設置 一個開關元件’其可使該分壓器之電流路徑接通或關閉。 現在，爲了進行測量，須使相對應的開關元件接通，以進 行測量且該開關元件然後又斷開。現在，此開關元件依序 隨著全部待測量的數値來進行切換。若全部的數値已測量 200839270 完成，則該周期從頭開始。於是，可使用一種 轉換器之微控制器，其只需要和需測量的電 開關輸出端。 本發明以下將依據圖式的實施例來描述。 【實施方式】 第1圖顯示一種依據先前技術來測量電性 置，其由分壓器2a，5a和2b，5b所構成，這 待測量的電位開始而連接至接地端。在各電 獲得一種電壓（8a，8b)，其輸入至微控制器中 制器中轉換成一種數位値且與分壓比相乘， 電壓。每一待測量的數値都需要一種A/D轉ί 第2圖顯示本發明的電路配置，其中只測 在二個分壓器電阻2和5之間加入一開關， 徑接通或斷開。電壓直接在下方的測量元件 該開關元件上的電壓降不會導入至該測量中 只在測量時間的期間接通。於是，該測量電 可最小化。 本發明的測量方法之優點當然只有在多個 可發揮作用。第3圖顯示此種具有二個測量 路。在一共用的測量元件5上量測該測量電 電路劃分成二個路徑或更多個路徑，各路徑 關元件（3a，3b)以及一分別與開關元件串聯序 2b)，其又與待測量的電壓相連接。各開關元 (7a，7b)而由微控制器來控制。 只具有一 A/D 性値一樣多的 値用的電路配 些分壓器由一 阻之間分別可 。電壓在微控 以獲得原來的 量一種電壓。 其可使電流路 5上測量，使 。該開關元件 路之損耗功率 測量位置時才 位置的測量電 壓。然後，該 分別具有一開 jj測量元件（2a, 件藉由輸出端 200839270 第4圖顯示一種電流測量之原理上的電路構造。此處， 該開關元件是與測量元件2並聯。該測量元件上的電壓是 針對接地電位來測量且電壓經由接取處8而連接至A/D轉 換器。此處，在測量期間該開關接通，且在正常操作期間 該開關斷開，這是藉由一種反相器9來表示，該反相器9 配置在該開關元件之控制路徑中。因此，該測量元件被橋 接著且不再產生相關的損耗功率。 第5圖顯示一電路配置之另一種簡化的形式，其中上方 的測量元件是由一種開關電晶體所取代。此電晶體此處不 只操作成開關，而且是在”導通的狀態”下操作於線性區域 中，使此電晶體之路徑電阻等於該上方之測量元件電阻。 於是，可進行一種內部的測量調整，使此測量達成補償特 性。在可能情況下，仍需使用一種驅動電路來控制各電晶 體，以確保該控制電壓無論該測量元件5上的電壓是多少 通常都可保持足夠高。 第6圖顯市一種在無特定之測量元件下的電流測量。此 處，在與電壓測量時相比較下，需要較小的電阻，使電晶 體的路徑電阻在完全導通的狀態下可用作測量電阻。此種 方式的電流測量主要是用在每種情況下該電路都設有一開 關電晶體時，例如，可用在直流電壓轉換器或整流器中。 在此種情況下，電流測量當然是在電晶體導通時進行。這 需要在該開關電晶體之調整和該測量調整之間進行一種相 互作用（interaction)。 爲了測量多種電流，可使用一種例如第7圖所示的電路。 200839270 在第7圖所示的形式中，電流通常流經個別的測量元件且 只有在測量時該測量元件上的電壓才接通至A/D轉換器輸 入端。然而，此電路所顯示的缺點是：不能使損耗功率下 降。 於是，需要一種如第8圖所示的較昂貴的電路。此處， 相對於第7圖的電路而言，另外二個開關元件是與各測量 元件並聯地配置著。這些開關元件受到反相的控制，此乃 因其在測量時導通且在正常操作時關閉。因此，在正常操 ί 作時該損耗功率下降很多。第7，8圖中未反相的開關元件 可以包括一種驅動電路，此乃因該參考電位、各測量元件 • 2c或2d上的電壓、以及開關電位（即，開關輸出端7c或7d 1 上的電位）可以位於很接近之處。 一種可測量電壓和電流的電路顯示在第9圖中。於此， 須測量各路徑1 a和1 b上的電壓，路徑1 c和1 d上則須對電 流進行測量。唯一的不同點在於’在電流測量的情況下， 該測量元件5是與電流測量元件2c或2d並聯。然而，由於 Iy 電壓測量元件5之電阻至少是電流測量元件2c或2d之電阻 之十倍，則在電流測量時該元件5未起決定性的作用。通 常，該測量元件5已事先預設成較該測量元件2c或2d大 1 000倍。因此，由於該測量元件5所造成的測量上的誤差 並不顯著。在一特定的情況下若該測量元件5要對該測量 造成一次不可忽略的誤差，則亦可在該測量元件5和該A/D 轉換器輸入端8之間配置一開關元件，使該測量元件5在 電流測量時斷開。 -9- 200839270 第1 0圖顯示本發明之一較佳形式的電路圖’其中該開關 元件由一種具有一適當的驅動電路的開關電晶體（此情況下 是一種MOSFET)所構成。由於微控制器之開關輸出端通常 只可顯示相對於電路接地端之邏輯電壓，則將如上所述會 有以下的問題：該開關電晶體之開關電壓變成太小’此乃 因該測量元件5上的電壓同樣位於該邏輯電壓之範圍中。 此問題可藉由另一開關電晶體1 0來解決’此開關電晶體1 〇 是由微控制器所控制’且一種存在於該電路中的較高的電 壓（例如，1 5伏）接通至該原來的測量電晶體3之閘極，以 使該測量電晶體3接通。電阻元件1 1和1 2只用來對電流消 耗量和開/關速率進行校正。分壓器電阻元件2此處例如劃 分成串聯的電阻兀件2 a 1和2 a 2 ’以便在待測量的高電壓中使 個別的電阻元件之電壓穩固値不會被超過。 第1 1圖顯示一種省能量之電流測量的另一種形式。相對 於第8圖之測量而目’此處只使用一^種測量用的測量元件 2。每一測量路徑亦設有一開關元件，其在正常操作時接 通，且另設有一開關元件，其在進行一種測量時將該測量 路徑連接至該測量元件2。此二個開關元件分別具有互補的 功能。迨亦可藉由正常操作時接通的各開關元件之互相反 相的功能來表示。此處，在一種如第7至9圖所示的驅動 級的情況下亦需要未反相的開關元件。 因此，各開關依序關閉且量測所屬的電性値。本方法的 優點在於：多個待測量的電性値只需一個A/D轉換器。待 測量的電性値只需與一種參考電位有關。 -10- 200839270 於此，該測量以嚴格的順序來進行，使全部的測量値通 常都可受到相同的補償，或亦可進行一種不對稱的測量， 此時能以不同的周期時間來實現各測量値。例如，一種定 時器可用來驅動每一測量値，此定時器在運行時起動一種 新的測量。這樣所具有的優點是，所需的測量周期在技術 上可最佳化地形成，且隨時間而變化較大的各測量値所被 測量的次數較變化較少的測量値者還多。 在存在著多個待測量的値時，使用一個輸出端以取代微 ; 控制器上的多個開關輸出端時是有意義的，該輸出端發出 一個已編碼的數位信號，其表示全部的開關元件之開關狀 態。外部的模組在此種情況下可讀入該信號且該開關依據 該信號的內容來操作。 【圖式簡單說明】 第1圖依據先前技術來測量電性値用的電路配置。 第2圖本發明之測量一電壓用的電路配置。 第3圖本發明之測量二種電壓用的電路配置。 f ' 第4圖本發明之測量一電流用的電路配置。 第5圖本發明的電路配置，其中一開關電晶體操作在線 性區域中，以測量一電壓。 第6圖本發明的電路配置，其中使用一開關電晶體之路 徑電阻來測量電流。 第7圖本發明的電路配置，其中以一 A/D轉換器輸入端 來測量二種電流。 第8圖本發明的電路配置，其中同樣可測量二種電流， -11- 200839270 此電路配置另外設計成省能量的測量配置。 第9圖本發明的電路配置，其中可只以一 A/D轉換器輸 入端來測量電壓和電流。 第1 0圖本發明的電路配置，其中電壓測量用的開關元件 由一種具有驅動電路之MOSFET所構成。 第1 1圖本發明的電路配置，其中可測量二種電流，此電 路配置設計成省能量的測量配置，且只使用一種（高準確性 的）測量元件。 f 【主要元件之符號說明】 1 a 〜1 d 路徑 2 測量元件 2a、2b 分壓器 2c、2d 測量元件 3 測量電晶體 3 a 〜3 d 開關元件 4 微控制器 5 測量元件 5a、5b 分壓器 7 a 〜7 d 開關輸出端 8 A/D轉換器輸入端 8a、8b 電壓 9 反相器 10 開關電晶體 1 1、1 2 電阻元件 -12-200839270 IX. INSTRUCTIONS: TECHNICAL FIELD OF THE INVENTION The present invention relates to a circuit configuration for measuring one or more electrical turns. BACKGROUND OF THE INVENTION 1. Field of the Invention This invention relates to a circuit arrangement for measuring electrical operation in an electronic operating device for a light-emitting medium. [Prior Art] Electronic operating devices are currently used in almost all types of lighting media. Such an operating device may, for example, comprise operating devices for low pressure halogen lamps, low pressure discharge lamps and high pressure discharge lamps. The special electronic operating device for high-pressure discharge lamps is very compact and has a variety of electrical measurements. Since the above-described operating devices are typically controlled via a microcontroller, multiple analog/digital (A/D) converters are required to measure electrical defects. However, this causes a high cost because a microcontroller having multiple A/D converters is much more expensive than a microcontroller having only one A/D converter. Therefore, a variety of measurement circuits must be designed so that there are thousands of currents flowing in the measurement circuit, and the A/D converter requires current so that the measurement can be accurately performed. The A/D converter causes non-negligible losses in each measurement circuit, and these losses add up to a considerable number in a large number of measurement circuits. SUMMARY OF THE INVENTION It is an object of the present invention to improve the disadvantages of conventional electronic operating devices so that the electronic operating device can be manufactured more advantageously. The present invention simultaneously reduces the power loss in the electronic operating device. The object of the invention is achieved in that a microcontroller having only one A/D converter is used, but the microcontroller has multiple outputs or one 200839270 control logic. Generally, in the prior art, a voltage is measured by a voltage divider, wherein the voltage to be measured is scaled at an easily controllable level. The voltage to be measured has tens to hundreds of volts in a typical electronic operating device. In an operating device operating at a supply voltage of 230 volts, the voltage after the power rectifier is, for example, 400 volts. Therefore, a voltage divider must be designed to measure the voltage divider ratio of 1:100. The 400 volts can be represented by the 4 volts at the microcontroller input. To make accurate measurements, the A/D converter must use an input current of approximately 0.3 to 0.4 mA. Therefore, the voltage divider must be designed to allow a current of 0.5 to 1 mA to flow continuously to be supplied to the A/D converter. When the voltage to be measured is 400 volts, approximately 200 to 400 milliwatts of loss is incurred in each voltage divider. To measure the current, a shunt can be used, which is built directly into the circuit to be measured. Then, the voltage dropped on the branch is measured, and the current flowing through the shunt is used to know the current flowing in the branch. If multiple voltages and currents are to be measured, a plurality of voltage dividers or shunts may be provided, each having an access point, and each access point is respectively connected to one of the microcontroller's A/D converters (the first 1 picture). Here, in accordance with the present invention, a switching element ' is placed between each resistor in each voltage divider which turns the current path of the voltage divider on or off. Now, in order to make a measurement, the corresponding switching element has to be switched on for measurement and the switching element is then switched off again. Now, this switching element is switched in sequence with all the numbers to be measured. If all the numbers have been measured 200839270 is completed, the cycle starts from the beginning. Thus, a converter microcontroller can be used which only requires the output of the electrical switch to be measured. The invention will now be described in accordance with an embodiment of the drawings. [Embodiment] Fig. 1 shows an electrical measurement according to the prior art, which is constituted by voltage dividers 2a, 5a and 2b, 5b, and the potential to be measured starts to be connected to the ground. A voltage (8a, 8b) is obtained at each power, and its input is converted into a digital 値 in the microcontroller controller and multiplied by the voltage division ratio. Each A number to be measured requires an A/D transition. Figure 2 shows the circuit configuration of the present invention, in which only one switch is added between the two voltage divider resistors 2 and 5, and the path is turned on or off. . Measuring element with voltage directly below The voltage drop across the switching element is not introduced into this measurement. It is only switched on during the measuring time. Thus, the measurement power can be minimized. The advantages of the measuring method of the present invention are of course only applicable in a plurality of ways. Figure 3 shows that this has two measurement paths. The measuring electrical circuit is divided into two paths or more paths on a common measuring element 5, each path-closing element (3a, 3b) and a series-connected switching element 2b), respectively, to be measured The voltages are connected. Each of the switching elements (7a, 7b) is controlled by a microcontroller. A circuit with only one A/D characteristic is used with a voltage divider that can be used between the resistors and the resistors. The voltage is micro-controlled to obtain the original amount of a voltage. It can be measured on the current path 5 to make . Loss power of the switching element path The measured voltage at the position when measuring the position. Then, each has an open jj measuring component (2a, the component shows the circuit configuration in principle by current output 200839270, Fig. 4). Here, the switching component is connected in parallel with the measuring component 2. On the measuring component The voltage is measured for the ground potential and the voltage is connected to the A/D converter via the pick-up 8. Here, the switch is turned on during the measurement and the switch is turned off during normal operation, by a Inverter 9 indicates that the inverter 9 is arranged in the control path of the switching element. Therefore, the measuring element is bridged and no longer generates associated loss power. Figure 5 shows another simplification of a circuit configuration. In the form in which the upper measuring element is replaced by a switching transistor. The transistor is not only operated as a switch, but also operates in a linear region in an "on state" such that the path resistance of the transistor is equal to The upper measuring element resistance. Thus, an internal measurement adjustment can be made to achieve the compensation characteristic of the measurement. Where possible, a driving power is still required. The transistors are used to control the transistors to ensure that the control voltage is generally high enough regardless of the voltage on the measuring element 5. Figure 6 shows a current measurement without specific measuring elements. Compared with the voltage measurement, a smaller resistance is required, so that the path resistance of the transistor can be used as a measurement resistance in a fully conductive state. The current measurement in this manner is mainly used in each case. When there is a switching transistor, for example, it can be used in a DC voltage converter or a rectifier. In this case, the current measurement is of course performed when the transistor is turned on. This requires an adjustment between the switching transistor and the measurement adjustment. To perform a variety of currents, a circuit such as that shown in Figure 7 can be used. 200839270 In the form shown in Figure 7, the current typically flows through individual measuring components and only when measured The voltage across the measuring element is connected to the A/D converter input. However, the circuit shows the disadvantage of not reducing the power loss. There is a need for a more expensive circuit as shown in Fig. 8. Here, the other two switching elements are arranged in parallel with the respective measuring elements with respect to the circuit of Fig. 7. These switching elements are reversed. Control, because it is turned on during measurement and turned off during normal operation. Therefore, the power loss is greatly reduced during normal operation. The non-inverting switching elements in Figures 7 and 8 may include a driving circuit. This is because the reference potential, the voltage across the measuring elements • 2c or 2d, and the switching potential (ie, the potential at the switching output 7c or 7d 1) can be located very close. A circuit that measures voltage and current. In Figure 9, here, the voltage on each path 1 a and 1 b must be measured, and the current must be measured on paths 1 c and 1 d. The only difference is that in the case of current measurement, The measuring element 5 is connected in parallel with the current measuring element 2c or 2d. However, since the resistance of the Iy voltage measuring element 5 is at least ten times that of the current measuring element 2c or 2d, the element 5 does not play a decisive role in current measurement. Usually, the measuring element 5 has been previously preset to be 1,000 times larger than the measuring element 2c or 2d. Therefore, the measurement error caused by the measuring element 5 is not significant. In a specific case, if the measuring component 5 is to cause a non-negligible error to the measurement, a switching component can also be arranged between the measuring component 5 and the A/D converter input 8 for the measurement. Element 5 is disconnected during current measurement. -9- 200839270 FIG. 10 shows a circuit diagram of a preferred form of the invention wherein the switching element is formed by a switching transistor (in this case, a MOSFET) having a suitable driving circuit. Since the switching output of the microcontroller can only display the logic voltage relative to the ground of the circuit, the following problem will occur as described above: the switching voltage of the switching transistor becomes too small 'this is due to the measuring element 5 The voltage on the same is also in the range of the logic voltage. This problem can be solved by another switching transistor 10 that 'this switching transistor 1 〇 is controlled by the microcontroller' and a higher voltage (eg, 15 volts) present in the circuit is turned on The gate of the original measuring transistor 3 is turned on to turn the measuring transistor 3 on. Resistive elements 1 1 and 12 are only used to correct the current consumption and on/off rates. The voltage divider resistor element 2 is here, for example, divided into series resistors 2 a 1 and 2 a 2 ' so that the voltage of the individual resistor elements is not stabilized in the high voltage to be measured. Figure 11 shows another form of energy-saving current measurement. With respect to the measurement of Fig. 8, only one measurement element 2 for measurement is used here. Each measuring path is also provided with a switching element which is switched on during normal operation and which is additionally provided with a switching element which connects the measuring path to the measuring element 2 when making a measurement. The two switching elements each have a complementary function. The 迨 can also be represented by the mutually opposite function of the respective switching elements that are turned on during normal operation. Here, a non-inverting switching element is also required in the case of a driving stage as shown in Figs. 7 to 9. Therefore, each switch is sequentially turned off and the associated electrical enthalpy is measured. The advantage of this method is that a plurality of A/D converters are required for a plurality of electrical defects to be measured. The electrical enthalpy to be measured only needs to be related to a reference potential. -10- 200839270 Here, the measurements are performed in a strict order so that all measurement 値 can usually be compensated the same, or an asymmetric measurement can be performed, in which case each cycle time can be used to achieve each Measure 値. For example, a timer can be used to drive each measurement 値, which starts a new measurement at runtime. This has the advantage that the required measurement period is technically optimally formed, and that the number of measurements that vary greatly over time is more measured than the less variable measurement. In the presence of a plurality of turns to be measured, an output is used instead of micro; a plurality of switch outputs on the controller are meaningful, the output emitting an encoded digital signal representing all of the switching elements Switch state. The external module can read the signal in this case and the switch operates according to the content of the signal. [Simple description of the drawing] Fig. 1 is a circuit configuration for measuring electrical usage according to the prior art. Fig. 2 is a circuit configuration for measuring a voltage of the present invention. Fig. 3 is a circuit configuration for measuring two kinds of voltages of the present invention. f ' Fig. 4 is a circuit configuration for measuring a current according to the present invention. Figure 5 is a circuit configuration of the present invention in which a switching transistor operates in a linear region to measure a voltage. Figure 6 is a circuit configuration of the present invention in which a path resistance of a switching transistor is used to measure current. Figure 7 is a circuit configuration of the present invention in which two currents are measured at an A/D converter input. Figure 8 is a circuit configuration of the present invention in which two currents can be measured as well, -11-200839270. This circuit configuration is additionally designed to be an energy-saving measurement configuration. Figure 9 is a circuit configuration of the present invention in which voltage and current can be measured with only one A/D converter input. Fig. 10 is a circuit configuration of the present invention, in which a switching element for voltage measurement is constituted by a MOSFET having a driving circuit. Figure 1 is a circuit configuration of the present invention in which two currents can be measured, which are designed to be energy efficient measurement configurations and use only one (highly accurate) measurement component. f [Symbol description of main components] 1 a ~ 1 d Path 2 Measuring element 2a, 2b Voltage divider 2c, 2d Measuring element 3 Measuring transistor 3 a ~ 3 d Switching element 4 Microcontroller 5 Measuring element 5a, 5b Voltage regulator 7 a ~ 7 d Switch output 8 A / D converter input 8a, 8b Voltage 9 Inverter 10 Switching transistor 1 1 , 1 2 Resistance element -12-