TW200835763A - Adhesive composition, adhesive film, and production method of the adhesive composition - Google Patents

Adhesive composition, adhesive film, and production method of the adhesive composition Download PDF

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Publication number
TW200835763A
TW200835763A TW096129020A TW96129020A TW200835763A TW 200835763 A TW200835763 A TW 200835763A TW 096129020 A TW096129020 A TW 096129020A TW 96129020 A TW96129020 A TW 96129020A TW 200835763 A TW200835763 A TW 200835763A
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Taiwan
Prior art keywords
meth
composition
adhesive composition
adhesive
acrylate
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TW096129020A
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Chinese (zh)
Inventor
Takahiro Asai
Koichi Misumi
Atsushi Miyanari
Yoshihiro Inao
Akihiko Nakamura
Koji Saito
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Tokyo Ohka Kogyo Co Ltd
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Publication of TW200835763A publication Critical patent/TW200835763A/en

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    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J135/00Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by a carboxyl radical, and containing at least another carboxyl radical in the molecule, or of salts, anhydrides, esters, amides, imides or nitriles thereof; Adhesives based on derivatives of such polymers
    • C09J135/06Copolymers with vinyl aromatic monomers
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J125/00Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by an aromatic carbocyclic ring; Adhesives based on derivatives of such polymers
    • C09J125/02Homopolymers or copolymers of hydrocarbons
    • C09J125/04Homopolymers or copolymers of styrene
    • C09J125/08Copolymers of styrene
    • C09J125/14Copolymers of styrene with unsaturated esters
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J133/00Adhesives based on homopolymers or copolymers of compounds having one or more unsaturated aliphatic radicals, each having only one carbon-to-carbon double bond, and at least one being terminated by only one carboxyl radical, or of salts, anhydrides, esters, amides, imides, or nitriles thereof; Adhesives based on derivatives of such polymers
    • C09J133/04Homopolymers or copolymers of esters
    • C09J133/06Homopolymers or copolymers of esters of esters containing only carbon, hydrogen and oxygen, the oxygen atom being present only as part of the carboxyl radical
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/10Adhesives in the form of films or foils without carriers
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/30Adhesives in the form of films or foils characterised by the adhesive composition
    • C09J7/38Pressure-sensitive adhesives [PSA]
    • C09J7/381Pressure-sensitive adhesives [PSA] based on macromolecular compounds obtained by reactions involving only carbon-to-carbon unsaturated bonds
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J7/00Adhesives in the form of films or foils
    • C09J7/30Adhesives in the form of films or foils characterised by the adhesive composition
    • C09J7/38Pressure-sensitive adhesives [PSA]
    • C09J7/381Pressure-sensitive adhesives [PSA] based on macromolecular compounds obtained by reactions involving only carbon-to-carbon unsaturated bonds
    • C09J7/385Acrylic polymers
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2301/00Additional features of adhesives in the form of films or foils
    • C09J2301/40Additional features of adhesives in the form of films or foils characterized by the presence of essential components
    • C09J2301/414Additional features of adhesives in the form of films or foils characterized by the presence of essential components presence of a copolymer
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2425/00Presence of styrenic polymer
    • CCHEMISTRY; METALLURGY
    • C09DYES; PAINTS; POLISHES; NATURAL RESINS; ADHESIVES; COMPOSITIONS NOT OTHERWISE PROVIDED FOR; APPLICATIONS OF MATERIALS NOT OTHERWISE PROVIDED FOR
    • C09JADHESIVES; NON-MECHANICAL ASPECTS OF ADHESIVE PROCESSES IN GENERAL; ADHESIVE PROCESSES NOT PROVIDED FOR ELSEWHERE; USE OF MATERIALS AS ADHESIVES
    • C09J2433/00Presence of (meth)acrylic polymer

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  • Chemical & Material Sciences (AREA)
  • Organic Chemistry (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Adhesives Or Adhesive Processes (AREA)
  • Adhesive Tapes (AREA)

Abstract

To provide an adhesive composition which has high heat resistance, adhesive strength in high temperature environments, and alkali resistance, and can easily be peeled after a high temperature process. This adhesive composition of the present invention containing a copolymer produced by copolymerizing a monomer composition comprising styrene, a cyclic structure-having (meth)acrylate, and a chain structure-having alkyl (meth)acrylate as a main component is characterized in that the monomer composition further contains an ethylenic double bond carboxylic acid. Heat resistance, adhesive strength under high temperature environments, alkali resistance, and peeling facility after high temperature process can thereby be improved.

Description

200835763 九、發明說明: 【發明所屬之技術領域】 本發明係關於一種接著劑組成物、接著薄膜以及該接 著劑組成物的製造方法’更詳細言之,本發明係關於在對 於半導體晶圓等半導體製品及光學類製品等進行研削等加 工之步驟中,將片材或保護基板暫時固定於該半導體類製 口口用之接著劑組成物、接著薄膜以及該接著劑組成物的製 造方法。 【先前技術】 近來,隨著行動電話與數位聲音視頻(digital AV)機器 ‘. 及1c卡等功能的提高,對於其所搭载的半導體矽晶片(以 下稱為晶片)之小型化、薄型化及高密度化的要求亦提高。 例如對於以 CSP(cMp size package)及]vtCP(multi-cliip package)為代表的複數晶片單一包裝化積體電路,亦要求其 ⑩ 薄型化。其中,就在一個半導體的封裝中可以搭載複數個 半導體晶片系統的系統級封裝(SiP)而言,使所搭載之晶片 小型化、薄型化、高密度化在實現電子機器之高性能化、 小型化及輕量化上係非常重要的技術。 為了因應薄型化商品的需求,必須使晶片薄至l5〇/zm 以下。而且對於CSP及MCP,必須使晶片薄化加工至100 /z m以下;對於ic卡,必須使晶片薄化加工至# m以 下。 以往’在SiP製品方面使用將積層之每個晶片中的電 200835763 極(b ump)與電路基板藉由線接合技術進行配線之手法。 又,為了符合薄塑化及高密度化的需求,不再使用線接合 技術’而必須採用將形成有貝通電極的晶片加以層積,且 在晶片的背面形成電極的貫通電極技術。 薄型晶片,例如藉由下述方法製造:將高純度的石夕單 結晶等加以切片做成晶圓後’在晶圓表面藉由蝕刻形成扣 等之預定、線路圖組裝成積體電㉟,藉由研削機研削所 得半導體晶圓的背面’再將研削成預定厚度後的半導體晶 圓進行切割而晶片化。此時,上述預定厚度為約1〇〇:〇 再者’在形成貫通電極時’研削至厚度為約5〇_ι〇〇 μ m。 半導體晶片之製造中,因半導體晶圓本身脆薄,且線 路圖樣中具有凹凸’搬運至研削步驟及晶片切割步驟時, 若施加外力將容易破損。再者,在研削步驟中,爲了除去 產生的研磨屑及移除研磨時所產生的熱,必須一面用精製 水洗淨半導體晶圓背面’一面進行研削處理。此時,必須 防止線路圖樣面被洗淨所用的上述精製水污染。 因此為了保護半導體晶圓之線路圖案面,同時防止半 導體晶圓之破損’將加工用黏著膜貼著於線路圖案面後進 行研削作業。 又在切割時’將保護片貼附於半導體晶圓的背面侧, 在接著固定半導體晶圓的狀態下進行切割,所得到的晶片 則用針由薄膜基材侧挑起所得到之晶片,並固定於下模板 (diepad)上。 200835763 關於此等加工黏著用薄膜及保護片,已知有在聚對苯 二曱酸伸乙酯(PET)、聚乙稀(pE)、聚丙婦(pp)、乙酸乙稀 .§旨共聚物(EVA)等基材薄膜上設置由接著劑組成物所構成 的接著劑料成者[例如專利文獻1(日本公開專利公報奸 開2003-173993號,公開日:平成15年6月20日)、專: 文獻2 (日本公開專利公報特開2〇〇1_2792〇8號,公開曰· 平成13年10月10日)、專利文獻3 (日本公開專^公報 # 特開2003_292931號,公開日:平成15年10月15日)]。 又,亦曾揭示使用階梯型矽氧寡聚物含浸於氮化鋁-氮 化硼氣孔燒結體而成的保護基板代替加工用黏著薄膜或保 護片,且將該保護基板與半導體晶圓用熱可塑性薄膜加以 “ 接著而成者[專利文獻4 (曰本公開專利.公報特開 2002-203821號、公開日:平成14年7月19日)]。又: 關於保護基板’可使用與。半導體晶圓實質上熱膨服_ 同的氧化鋁、氮化鋁、氮化硼、碳化矽等材料·再者關 籲於接著保護基板與半導體晶圓之接著劑,可以用聚酸㈣ 等熱可塑性樹脂;關於該接著劑的適用法,已提出構成厚 度為的薄膜’並旋轉塗佈接著劑組成物,乾: 後形成20#m以下薄膜的方法[專利文獻5 (曰本公開專利 公報特開2001-77304號、公開日:平成13年3月23日)]。 : 又隨著半導體元件的配線多層化,實施下述製程:使 賴㈣組成物將㈣基板接著於形縣鱗的半導體晶 圓的表面,再研磨半導體晶圓的背面,之後將研磨面^ 成鏡面狀,並於該鏡面背面側形成線路。在此情況,直至 200835763 月面側線路形成,保護基板持續接著於丰導辦 利文獻6 (日本公開專利公報特^者於+導體晶圓上[(專 日:昭和61年7^5,開昭61顧5號,公開 【發明内容】 然而’先前的上述加工用 + 成貫通電極而必須g …/專膜等,在用於為了形 又肩杯用尚溫製程乃古古如連丨 _ 時,具有所謂因高溫環境下接著強:二‘程=步驟中 產生氣體等而造成 X不足、南真工環境下 離時,殘餘物殘她題及上述㈣ 人g Z平,構成保護膠帶 成物對於·。c的高溫無耐受性,且由^層之接者劑組 著劑層產生氣體,故而接著不良。於加熱導致上述接 又’溥型半導體晶圓於研削及切割後,必須從 5蒦基板剥離。然而,上述專利文 、迂保 帶之接著劑層的接著劑組成物為環氧==成, 高溫下環_脂會變質、硬化=曰組成物,在_ ,, 因此剝離時會殘留殘餘 物’而發生所謂剝離不良的問題。 、 著伴=卜:在上料敎獻4轉㈣獻5帽記載之接 者保護基板與半導體晶圓所用之埶 镬 產生氣體,因 、迷專利文獻6所記載之半導體基板的加工方法,由 200835763 藉由真空蒸鍍之金屬膜 $體晶圓所用之接著劑 上述專利文獻6全然 於進打藉由蝕刻液的鏡面化製程及 形成,因此對於接著保護基板與半 組成物要求耐熱性及剝離性。然而 未揭示該接著劑組成物之組成。 又’據本發明者的難,在半導體晶圓及晶片之加工 H ’使用丙騎系樹脂材料的接著劑由於具有良好的抗200835763 IX. Description of the Invention: [Technical Field] The present invention relates to an adhesive composition, an adhesive film, and a method for producing the adhesive composition. In more detail, the present invention relates to semiconductor wafers and the like. In the step of performing processing such as grinding of a semiconductor product or an optical product, the sheet or the protective substrate is temporarily fixed to the adhesive composition for the semiconductor-made mouth, the film, and the method for producing the adhesive composition. [Prior Art] Recently, with the improvement of functions such as mobile phones and digital audio and video (digital AV) devices, and 1C cards, the semiconductor germanium chips (hereinafter referred to as wafers) mounted thereon have been reduced in size and thickness. The demand for higher density has also increased. For example, a single-package integrated circuit including a CSP (cMp size package) and a vtCP (multi-cliip package) is also required to be thinner. In a system-in-package (SiP) in which a plurality of semiconductor wafer systems can be mounted in a semiconductor package, the size, thickness, and density of the mounted wafers are reduced, and the performance of the electronic device is improved. And lightweight is a very important technology. In order to meet the demand for thinned products, it is necessary to make the wafer thinner than 15 〇/zm. Moreover, for CSP and MCP, the wafer must be thinned to less than 100 /z m; for ic cards, the wafer must be thinned to less than # m. Conventionally, in the case of SiP products, a method of wiring the electric 200835763 bump in each of the stacked layers and the circuit board by wire bonding technology is used. Further, in order to meet the demand for thinning and high density, it is no longer necessary to use a wire bonding technique, and it is necessary to use a through electrode technique in which a wafer having a beton electrode is laminated and an electrode is formed on the back surface of the wafer. The thin wafer is produced, for example, by slicing a high-purity singular crystal or the like into a wafer, and then assembling the integrated wiring 35 by forming a predetermined pattern on the surface of the wafer by etching or the like. The back surface of the obtained semiconductor wafer is ground by a grinding machine, and the semiconductor wafer which has been ground to a predetermined thickness is diced and wafer-formed. At this time, the predetermined thickness is about 1 〇〇: 〇 Further, when the through electrode is formed, it is ground to a thickness of about 5 〇 〇〇 〇〇 μ m. In the manufacture of a semiconductor wafer, when the semiconductor wafer itself is brittle and the film pattern is conveyed to the grinding step and the wafer cutting step, the external force is easily broken. Further, in the grinding step, in order to remove the generated polishing chips and remove the heat generated during the polishing, it is necessary to perform the grinding process while cleaning the back surface of the semiconductor wafer with purified water. At this time, it is necessary to prevent the above-mentioned purified water used for cleaning the circuit pattern surface from being contaminated. Therefore, in order to protect the line pattern surface of the semiconductor wafer and prevent breakage of the semiconductor wafer, the processing adhesive film is attached to the line pattern surface and then subjected to a grinding operation. Further, at the time of dicing, the protective sheet is attached to the back side of the semiconductor wafer, and the semiconductor wafer is diced in the state in which the semiconductor wafer is subsequently fixed, and the obtained wafer is picked up by the film from the side of the film substrate, and Fixed to the lower die (diepad). 200835763 For such processing adhesive films and protective sheets, it is known that polyethylene terephthalate (PET), polyethylene (pE), polypropylene (pp), and ethylene acetate. An adhesive material composed of an adhesive composition is provided on a base film such as (EVA) [for example, Patent Document 1 (Japanese Laid-Open Patent Publication No. 2003-173993, publication date: June 20, 2005) For the purpose of the publication: Document 2 (Japanese Laid-Open Patent Publication No. 2〇〇1_2792〇8, published on October 10, 2013), and Patent Document 3 (Japanese Open Publication No. 2003-292931, publication date: October 15, 2015)]]. Further, a protective substrate obtained by impregnating a sintered body of an aluminum nitride-boron nitride hole with a stepped oxygen oligomer is used instead of a protective film or a protective sheet for processing, and heat is applied to the protective substrate and the semiconductor wafer. The plastic film is used as a result of the following: [Patent Document 4 (Japanese Laid-Open Patent Publication No. 2002-203821, Publication Date: July 19, 2004)] The wafer is substantially hot-expanded _ the same aluminum oxide, aluminum nitride, boron nitride, tantalum carbide and other materials. In addition, the adhesive is used to protect the substrate and the semiconductor wafer, and the thermoplasticity such as polyacid (tetra) can be used. Resin; a method of applying a film having a thickness of 'the film' and spin coating an adhesive composition, and drying: forming a film of 20 #m or less [Patent Document 5 (Japanese Patent Laid-Open Publication) 2001-77304, the publication date: March 23, 2013)]: With the multilayering of the wiring of the semiconductor element, the following process is carried out: the semiconductor composition of the (4) substrate is attached to the (4) substrate Round surface, regrind On the back side of the conductor wafer, the polished surface is mirror-shaped, and a line is formed on the back side of the mirror. In this case, until the formation of the line on the side of the month of 200835763, the protective substrate continues to be followed by the document 6 (Japanese public) The patent gazette is on the +conductor wafer [(Special date: Showa 61 7^5, Kaizhao 61 Gu 5, published [invention]] However, the previous processing + into the through-electrode must be ... /Special film, etc., when used for the shape of the shoulder cup with the warm temperature process is Gu Gu Ru Lian _, has the so-called high temperature environment and then strong: two 'process = the gas generated in the step, resulting in X deficiency, south In the real work environment, when the time is left, the residue remains the same as the above (4) The human g Z is flat, which constitutes the protective tape and is not resistant to the high temperature of the c, and the gas is generated by the agent layer of the layer. Therefore, it is not good. After heating, the above-mentioned 溥-type semiconductor wafer must be peeled off from the 5 蒦 substrate after being ground and cut. However, the adhesive composition of the adhesive layer of the above patent and the protective tape is a ring. Oxygen == into, at high temperature, the ring _ fat will deteriorate,曰 = 曰 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , The method for processing a semiconductor substrate used in a semiconductor wafer, and the method for processing a semiconductor substrate described in Patent Document 6, the adhesive used for vacuum-deposited metal film $wafer wafer in 200835763. Since the mirroring process and formation of the etching liquid are performed, heat resistance and releasability are required for the protective substrate and the semi-composite. However, the composition of the adhesive composition is not disclosed. Further, according to the inventor's difficulty, in the semiconductor Processing of wafers and wafers H'Adhesives using propylene-based resin materials have good resistance

二二因*較佳 '然而,縱使使用此等丙烯酸系樹腊材料 的接耆劑’亦判明具有以下的問題點: ⑴將接著劑層與保護基板熱_著時,由於接著劑 層所吸收的水分變成氣體,使得接著界面發生泡 狀剝f’因此高溫環境下接著強度會降低。龙, 此等氣體之產生,不僅使高溫環境下之接著強度 降低—而且在真空條件下進行加王製程等之像況 ’也會爲真空環境的產生及保持帶來困擾。s ⑴在具有半導體晶圓與祕研磨液及陳顯影液 ^鹼性液體接觸之步驟之情況,驗性液體會使接 著劑組成物的接觸面因剝離、溶解、及分散等而 變差。 (3)在加熱至約200_,因耐熱性低而造成的接著 劑組成物變質及不溶於剥離液的物質形成等會 導致剝離不良。 #本發明有鐘於上述問題點,因此其目的係提供一種接 著劑組成物’其在高溫環境下,特別是於14〇c>c至細。C, 具有高接著強度、高耐熱性及耐驗性,且即使經過高溫及/ 200835763 或高真线境下的加工製程等(以下,_為「高溫製 程」)’從半導體晶圓及晶片上之剝離仍然容易。 本發明之第一態樣為一種接著劑組成物,其以包含苯 乙烯、具有%狀構造之(甲基)丙烯酸酯及由鏈狀構造構 成之(甲基)丙烯酸炫酯之單體組成物共聚而成之聚合物 做為主成分,該接著劑組成物之特徵為該單體組成物進一 步包含具浠性雙鍵之羧酸。 本發明之第二態樣係以「將上述笨乙烯、上述(甲基) 丙烯酸酯及上述(甲基)丙烯酸編旨之總量當作酬質量 份時,上述羧酸之量為1〜10質量份岌 、里切」為特徵之接著劑組成 物。 本,日月之第三態樣係以「上述羧酸為下列通式(工 R —^COOH ) m · · ·… (R1表示具有(甲基)丙_基或乙稀基的碳數為2 〜20之有機基’其亦可含有氧原子;m代表^之整數 所示之羧酸」為特徵的接著劑組成物。 本發明之第四態樣係以「上述羧酸兔 4玫畋為(甲基)丙烯酸 或下列通式(2): 200835763 (R2表示氫原子或碳數1〜4的烷基,R3表示碳數1〜5 的二價烧基三或具有環式構造的石炭數4〜20的二價有機基, 其亦可含有氧原子)所示之羧酸」為特徵的接著劑組成物。 本發明之第五態樣係-種接著薄膜,其特徵為在薄膜 上具備含有上述任一接著劑組成物的接著劑層。 本發明之第六態樣係一種接著劑組成物的製造方法, ^係製造以包含笨乙烯、具有環狀構造之(甲基)丙烯酸 •:、由鏈狀構造構成之(曱基)丙烯酸烷基酯及羧酸之混 合單體組成物所共聚而成之聚合物做為主成分的接著劑組 $物;該製造方法之特徵為在該苯乙烯、該(甲基)丙烯 - I酯及該(甲基)丙烯酸烷酯之共聚反應終止前,混入上 :述鲮酸。 本發明之第七態樣係以「於將上述羧酸、上述笨乙烯、 上述(甲基)丙烯酸酉旨及上述(甲基)丙烯酸烧醋混合後, • 開始共聚反應」為特徵之接著劑組成物的製造方法。f 本發明之其他目的、特徵及優點藉由以下記載可以充 刀明瞭。又’本發明之有利點藉由參照附圖之後續說明可 以明白。 【實施方式】 對於本發明之一實施態樣的說明如下。 在本實施態樣中,於以包含苯乙烯、具有環狀構造的 (甲基)丙烯酸酷及由鏈狀構造構成之(曱基)丙烯酸燒 酉旨的單體組成物共聚而成之聚合物做為主成分之接著劑組 11 200835763 成物中,使用所謂「在上述單 =::」一。又,在 合物含有苯乙稀嵌段」的技術手段。使用所明使上# 以說:二態樣中,雖對於上述之各技術手段加 樣。例如物並不限於下述的實施態 術手段,可以W I讀*手段。藉自組合各技 接著強度==下(特別是w至㈡之 性良好之接著劑組成物及高溫製程後之剝離容易 ;)丙:席_之單體組成物共聚而成之::物= 且具著劑組成物具有某種程度的耐熱性, 剝離容易性。 才鹼性、高溫製程後之 的缓i述:藉由進-步含有下述具烯性雙鍵 聚合物中:;=二乙烯巨單體,X,藉由於上述 度、耐熱性等提升。敗1又’可使高溫環境下的接著強 本說明書中的「主成分」是指其含量比上述接著劑組 12 200835763 成物所含的其他任一成分多之成分。大 3里,雖然只要為上述接著劑組成物中戶—上逑主成分之 量者,將無限定,但當將上述接著劑組成所含之成分_最大 質量份時,上述主成分之含量以5(^質旦物的質量當作100 以下為較佳,以70質量份以上1〇〇 份以上】00質量份 是在50質量份以上’上述接著齊i、CT為更佳。若 高溫環境下之高接著強度及耐驗性 Μ有高对熱性、Twenty-two factors are better. However, even the use of the binder of these acrylic wax materials has the following problems: (1) When the adhesive layer and the protective substrate are hot, they are absorbed by the adhesive layer. The moisture turns into a gas, causing the bubble to peel off at the interface, so the strength is lowered in the high temperature environment. Dragons, the generation of these gases not only reduces the strength of the subsequent high-temperature environment - but also the conditions of the king process, etc. under vacuum conditions, will also cause troubles in the generation and maintenance of the vacuum environment. s (1) In the case where there is a step of contacting the semiconductor wafer with the secret polishing liquid and the aging liquid, the organic liquid causes the contact surface of the adhesive composition to deteriorate due to peeling, dissolution, dispersion, and the like. (3) When heated to about 200 Å, deterioration of the composition of the adhesive due to low heat resistance and formation of a substance insoluble in the stripping liquid may cause peeling failure. The present invention has the above problems, and therefore its object is to provide an adhesive composition which is in a high temperature environment, particularly 14 〇c>c to fine. C, with high adhesion strength, high heat resistance and durability, and even after high temperature and /200835763 or high-true processing processes (hereinafter, _ "high-temperature process") 'from semiconductor wafers and wafers The stripping is still easy. A first aspect of the present invention is an adhesive composition comprising a monomer composition comprising styrene, a (meth) acrylate having a % structure, and a (meth) acrylate having a chain structure. The copolymerized polymer is used as a main component, and the adhesive composition is characterized in that the monomer composition further contains a carboxylic acid having a bismuth double bond. In the second aspect of the present invention, the amount of the carboxylic acid is 1 to 10 when the total amount of the above-mentioned stupid ethylene, the above (meth) acrylate, and the above (meth)acrylic acid is used as a part by weight. An adhesive composition characterized by a mass of 岌, 里切". The third aspect of the sun and the moon is "the above carboxylic acid is of the following formula (Working R -^COOH) m · · ·... (R1 represents the carbon number of the (meth)propionyl group or the ethylene group. The organic group of 2 to 20, which may also contain an oxygen atom; m represents a carboxylic acid represented by an integer of ^. The fourth aspect of the present invention is "the above carboxylic acid rabbit 4 rose" Is (meth)acrylic acid or the following general formula (2): 200835763 (R2 represents a hydrogen atom or an alkyl group having 1 to 4 carbon atoms, and R3 represents a divalent alkyl group having a carbon number of 1 to 5 or a carbonaceous carbon having a cyclic structure. An adhesive composition characterized by a divalent organic group of 4 to 20, which may also contain a carboxylic acid represented by an oxygen atom. The fifth aspect of the present invention is a film which is characterized by being on a film. There is provided an adhesive layer containing any of the above-described adhesive compositions. The sixth aspect of the present invention is a method for producing an adhesive composition, which is manufactured to contain (meth)acrylic acid having a stupid structure and having a cyclic structure. : a copolymer of a (meth)acrylic acid alkyl ester and a carboxylic acid mixed monomer composition composed of a chain structure The composition is a main component of the adhesive agent group; the manufacturing method is characterized in that the copolymerization reaction of the styrene, the (meth) propylene-I ester and the alkyl (meth) acrylate is terminated before the polymerization reaction is terminated. The seventh aspect of the present invention is to "start the copolymerization reaction after mixing the above carboxylic acid, the above-mentioned stupid ethylene, the above (meth)acrylic acid, and the above (meth)acrylic acid vinegar; The present invention is further described in the following description. The advantages of the present invention will be apparent from the following description with reference to the accompanying drawings. MODE FOR CARRYING OUT THE INVENTION A description of an embodiment of the present invention is as follows. In the present embodiment, (meth)acrylic acid comprising styrene, a (meth)acrylic acid having a cyclic structure, and a chain structure is formed. The polymer obtained by copolymerizing the monomer composition of the sinter is used as the main component of the group 11 200835763. The so-called "in the above single =::" is used. Further, the compound contains styrene. Paragraph technology In the case of the two states, the above-mentioned technical means are added. For example, the object is not limited to the following embodiments, and the WI can be used to read the * means. Then, the strength == under (especially the composition of the adhesive with good properties of w to (b) and the peeling after high-temperature process are easy;) C: the monomer composition of the mat is copolymerized:: substance = and composition of the agent The material has a certain degree of heat resistance and ease of peeling. The alkalinity, high temperature process is slow: by further adding the following olefinic double bond polymer:; = diethylene macromonomer , X, due to the above degree, heat resistance, etc. The failure of "1" can be used in the high temperature environment. The "principal component" in this specification refers to the content of the above-mentioned adhesive group 12 200835763 Any component with more ingredients. In the case of the third embodiment, the amount of the main component of the above-mentioned adhesive composition is not limited, but when the composition of the above-mentioned adhesive composition is the maximum mass, the content of the main component is 5 (the mass of the mass material is preferably 100 or less, more preferably 70 parts by mass or more) 00 parts by mass or more is 50 parts by mass or more. The next high, then the strength and the testability, the high heat,

容易性效果。 亦發撵良好的剝離 (苯乙烯) 根據本實施態樣之接著劑志 中含有苯乙烯。上述^丄 於上述早體組成物 , 本乙烯由於即使在200°C以上之高溫 性二 不^變質,所以可提升上述接著劑組成物的耐熱 夕上述苯乙烯的處合量,卩要能與上述單體組成物所含 進仃共聚反應,將無限定。然而,當將含有 上迷苯乙烯、上述f田甘、 ^ 萨吟攸a抑 1甲基)丙烯酸酯及上述(甲基)丙烯 日人早體組成物之總量當作議質量份時,上述苯乙 炎 50貝量份為較佳,以20至40質量份 馬更佳。若為;[〇皙| 若在50質量份以下/以上化’可使耐熱性進一步提升, 、1刀乂 ,可以抑制抗裂性的降低。 (具有環狀構造的f 义们(甲基)丙烯酸酯) 本毛月的接著劑組成物,在上述單體組成物中包含具 13 200835763 有裱狀構造的(甲基)丙烯酸酯。藉此上述接著劑組成物 _熱性可提升。又’藉著含有上述(曱基)丙烯酸酉旨, 劑組成物㈣酸的需要量’及確保被 、上述(甲基)丙烯酸酯的混合量,只要能與上述 、、且成物所包含之其他化合物進行共聚反應 作 將包含上述苯乙稀、上述(甲基)丙雜旨、上^ =酉夂燒g旨的單體組成物總量當作議質量份述土 基)丙烯酸酷的π人曰\ Τ工甲 40質量份為^二置 〇質量份為較佳,以10至 以上 土若(甲基)丙烯酸酯混合量在5質量份 到良好::步提升耐熱性;若為6。質量份以下,、可得 之氫丙烯酸酯’(甲基)丙烯酸中的羧基 又,做為I述^或含環狀基的有機基置換的構造。 以氫原子之一被有機基者’雖無特別限定,但 卜、+、s反衣狀基置換之烷基為較佳。 原子而rm ’ 為縣、萘、驗去—個以上氣 基。上述環狀基亦可早=進基^多%基,亦可為脂肪族環狀 再者,成為具有下述取代基。 於僅由碳原子及^%<狀基之基本環的環狀構造,雖不限 但以僅由碳原子=子構成者而可含有氧原子錢原子, 述烴基,雖然可為==的烴基為較佳。再者,上 以脂肪族多環狀美為更;L ,但以飽和為較佳。又, 200835763 例如,從單環 烷、雙環烷、 又1上述脂肪族環狀基的具體例可為, 料而hi:環貌、四環鮮多環燒基除去—個以上氫 更具體而言’可列舉從職、環己燒等 二)ίί:、~剛垸、降茨燒、異妓、三環癸烧、四環十 二衣除去一個以上氫原子而成之基等。其中以 、元—_料除Lx上的氫原子而成之基為Easy effect. Also, good peeling (styrene) is contained. The adhesive agent according to this embodiment contains styrene. In the above-mentioned early composition, the ethylene is not deteriorated even at a high temperature of 200 ° C or higher, so that the heat resistance of the above-mentioned adhesive composition can be improved, and the amount of the above-mentioned styrene can be improved. The copolymerization reaction contained in the above monomer composition is not limited. However, when the total amount of the styrene containing the above styrene, the above-mentioned f tiangan, the samarium sulfonate, and the above (meth) propylene daily precursor composition is regarded as the mass fraction, The above phenethylphene 50 parts is preferably used, and more preferably 20 to 40 parts by mass. If it is [〇皙], if it is 50 parts by mass or less or more, the heat resistance can be further improved, and the crack resistance can be suppressed by one knife. (F-type (meth) acrylate having a cyclic structure) The adhesive composition of the present invention comprises a (meth) acrylate having a fluorene structure of 13 200835763 in the above monomer composition. Thereby, the above-mentioned adhesive composition _ heat can be improved. In addition, the amount of the agent (4) acid required and the amount of the (meth) acrylate to be mixed with the above-mentioned (meth) acrylate are contained in the above-mentioned The other compound is subjected to a copolymerization reaction to make the total amount of the monomer composition including the above-mentioned styrene, the above-mentioned (meth)propene, and the above-mentioned oxime-burning as the mass of the base. 40 质量 质量 Τ Τ Τ 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 40 . The carboxyl group in the hydrogen acrylate '(meth)acrylic acid, which is available below the mass part, is a structure in which the organic group having a cyclic group or the like is substituted. The organic group is not particularly limited as long as it is one of the hydrogen atoms, but an alkyl group substituted with a ruthenium, a s, or a s. The atom and rm ' are counties, naphthalenes, and more than one gas base. The above cyclic group may be earlier than the base group, or may be an aliphatic ring, and may have the following substituents. The ring structure of the basic ring consisting only of a carbon atom and a ^% column may not be limited to a carbon atom = a subunit, and may contain an oxygen atom, and the hydrocarbon group may be == A hydrocarbon group is preferred. Furthermore, it is more preferable to use an aliphatic multi-ring beauty; L, but preferably saturated. Further, for example, 200835763, specific examples of the monocycloalkane, the bicycloalkane, and the above-mentioned aliphatic cyclic group may be: hi: ring appearance, tetracyclic fresh polycyclic group, more than one hydrogen, more specifically 'Can be listed as a job, the ring has been burned, etc. 2) ίί:, ~ Gang 垸, 茨 烧 、, 妓 妓, tricyclic 癸 、, 四 四 十二 衣 clothing to remove more than one hydrogen atom base. Among them, the base of the hydrogen atom on the Lx is removed.

乂土又上述環己烷及二環戊烷可進一步具有下述取代 基。 上述取代基,舉例來說,可為羥基、羧基、氰基、氧 原子(〇)等極性基,及碳數為i 1 4的直鏈或分枝狀低碳 烧基。上述環狀基,於進—步具有取代基的情況,以具有 上述極性基、上述低碳減、時具有上述極性基及上 述低碳絲二者純佳。其巾上述贿基以氧原子㈣為 特佳。 上边氫原子之-被環狀基置換而成之烧基中做為烧基 者’以複數為丨至12個_基純佳。在具有此種環狀構 造的(曱基)丙稀酸醋,例如可為丙歸酸環己基—2—丙醋。 ^ =二具有環狀構造的(甲基)丙烯酸酯,例如可為丙 烯酸苯氧基乙酯、丙婦酸苯氧基丙酯。 本說明書中所謂之「脂肪族」’是相對於芳香族的概 念:係指不具有芳香族性的基團、化合物等,例如,「脂肪 族環狀基」是表示不具有芳麵性的單·基或多環狀基。 、、一又,就上述(曱基)丙婦酸酯而言,可以使用包含下 述一者之(曱基)丙烯酸s旨:具備環狀構造且該環狀構造 15 200835763 上有取代基之(甲基)丙稀酸醋及具備環狀構造且該環狀 構造上沒有取代基之(甲基)_酸§旨。 藉由同¥包含.具傷環狀構造且該環狀構造上有取代 基之(甲基)丙烯酸酉旨及具傷環狀構造且該環狀構造上沒 有取代基之(甲基)丙稀酸酉旨,可使耐熱性及柔軟性提升。 (由鏈狀構造構成的(甲基)丙烯酸烷酯) 本發明之接著劑組成物,在上述單體組成物中包含由 鏈狀構造所構成的(曱基)丙烯酸烷酯。藉此’可以提升· 從該接著劑組成物所得到的接著劑層的柔軟性及抗裂性。 上述(甲基)丙烯酸烷酯的混合量,只要能與上述單 體組成物所含之其他化合物進行共聚反應,將沒有特別限 , 定,不過當將包含上述苯乙烯、上述(甲基)丙烯酸酯、 及上述(甲基)丙稀酸烧酯的單體組成物之總量當作100 質量份時,上述(甲基)丙烯酸烷酯的混合量以10至60 質量份為較佳。若在10質量份以上,可以進一步提升所得 _ 接著劑層之柔軟性及抗裂性,若在60質量份以下,可以抑 制耐熱性低下、剝離不良及吸濕性。 在本說明書中,上述(甲基)丙烯酸烷酯意指具有碳 數為15至20之烷基的丙烯酸系長鏈烷酯及具有碳數為1 至14之烷基的丙烯酸系烷酯。 j 關於上述丙烯酸系長鏈烷酯,可為烷基由η—十五基、 n h六基、η——^七基、η—十八基、η——h九基、η 一二十 基專所構成之丙烯酸烧酯或曱基丙烯酸烧酯。再者’該烧 16 200835763 基亦可為分枝狀。 。關於上述具有碳數為1至14之烷基之丙烯酸系烷醋, I歹J舉既存的丙烯酸系接著劑所使用之習知丙烯酸系烧 =例如,可為該垸基由甲基、乙基、丙基、丁基、2-乙 ϋ、異辛基、異*基、異癸基、十二基、月桂基、十 -土專所構成之丙烯酸烷,或甲基丙烯酸烷醋。 (具有烯性雙鍵之羧酸) 上述單體組成物進— 由包含ιρ ^ /匕3具有烯性雙鍵之羧酸。藉 溫=祕雙鍵之_所得之接著劑組成物,於高 熱性提二:〜靴之環境下之接著強度、以及耐 二使歷經高溫製程後,仍可容易地剝離。 疋於藉由上述接著劑組成物中來i I-、+、、> # 基(極性美h , 果自上述竣酸的遵 劑組成物= 著劑組成物與塗布有該擦著 升,因而接者面之界面上述接著劑組成物之極性据 此的^制高溫環境下上述接著·成物中分子絲 、解離。又,上述之單體組成物 鏈破 ,上逮,柿旨及上述(甲基)丙稀= 二笨乙 化合物,因此可以確保高耐驗性。 、、竣基 聚,2=二要具有稀性雙鍵且可與其他單體成分政 =無特別限定,但以如下列通式(1): 人刀菸The alumina and the above cyclohexane and dicyclopentane may further have the following substituents. The above substituent may, for example, be a polar group such as a hydroxyl group, a carboxyl group, a cyano group or an oxygen atom, or a linear or branched low carbon group having a carbon number of i 1 4 . The cyclic group may have a substituent, and it is preferable to have the above-mentioned polar group, the above-mentioned low carbon, and the above-mentioned polar group and the above-mentioned low carbon wire. The above-mentioned bribe base is particularly good for oxygen atoms (four). The above-mentioned hydrogen atom is replaced by a cyclic group, and the base is used as a base. In the case of the (fluorenyl) acrylate having such a cyclic structure, for example, it may be cyclohexyl-2-propyl acrylate. ^ = two (meth) acrylate having a cyclic structure, and may be, for example, phenoxyethyl acrylate or phenoxypropyl propyl acrylate. The term "aliphatic" as used in the present specification is a concept relating to aromatic: a group or a compound having no aromaticity, and for example, "aliphatic cyclic group" means a single one having no aromaticity. • A base or a polycyclic group. Further, in the case of the above (mercapto)propionate, a (fluorenyl)acrylic acid s containing one of the following may be used: a ring structure is provided and the ring structure 15 has a substituent on 200835763 (Methyl)acrylic acid vinegar and (meth)-acid having a cyclic structure and having no substituent in the cyclic structure. By (meth)acrylic acid having a structure of a wounded ring structure and having a substituent on the ring structure, and a (meth)acrylic acid having a ring structure and having no substituent on the ring structure Acidity can improve heat resistance and softness. (Alkyl (meth) acrylate composed of a chain structure) The adhesive composition of the present invention contains an alkyl (meth) acrylate composed of a chain structure in the monomer composition. Thereby, the flexibility and crack resistance of the adhesive layer obtained from the adhesive composition can be improved. The amount of the alkyl (meth)acrylate blended is not particularly limited as long as it can be copolymerized with other compounds contained in the above monomer composition, but the above-mentioned styrene and the above (meth)acrylic acid are contained. When the total amount of the monomer composition of the ester and the above (meth)acrylic acid ester is 100 parts by mass, the amount of the alkyl (meth)acrylate blended is preferably 10 to 60 parts by mass. When the amount is 10 parts by mass or more, the flexibility and crack resistance of the resulting layer can be further improved, and if it is 60 parts by mass or less, the heat resistance is lowered, the peeling failure, and the moisture absorption property can be suppressed. In the present specification, the above alkyl (meth)acrylate means an acrylic long-chain alkyl ester having an alkyl group having 15 to 20 carbon atoms and an acrylic alkyl ester having an alkyl group having 1 to 14 carbon atoms. j. Regarding the above-mentioned acrylic long-chain alkyl ester, the alkyl group may be an η-pentadecyl group, a nh hexa group, an η-^-heptyl group, an η-octadecyl group, an η-h-j-based group, or a η-twenth group. A proprietary acrylic acid ester or a mercapto acrylate. Furthermore, the burnt 16 200835763 base may also be branched. . With respect to the above-mentioned acrylic olefin vinegar having an alkyl group having 1 to 14 carbon atoms, I 歹J exemplifies a conventional acrylic ray used in an existing acryl-based adhesive. For example, the fluorenyl group may be a methyl group or an ethyl group. An alkyl acrylate consisting of propyl, butyl, 2-acetamidine, isooctyl, iso-yl, isodecyl, dodecyl, lauryl, and decyl, or alkoxy methacrylate. (Carboxylic acid having an ethylenic double bond) The above monomer composition is a carboxylic acid having an ethylenic double bond containing ιρ ^ /匕3. By means of the adhesive composition obtained by the temperature of the double key, it can be easily peeled off after the high-temperature process and the high-temperature process.藉 In the above-mentioned adhesive composition, i I-, +, , ># base (polarity h, fruit composition from the above-mentioned tannic acid = composition of the composition and coating with the rubbing rise, Therefore, the polarity of the above-mentioned adhesive composition on the interface of the contact surface is based on the molecular filaments and dissociation in the above-mentioned high-temperature environment, and the above-mentioned monomer composition is broken, and the above-mentioned persimmon and the above-mentioned (Methyl) propylene = di-p-ethyl compound, so high testability can be ensured. 竣, 竣-based poly, 2 = two have a dilute double bond and can be combined with other monomer components = no particular limitation, but Such as the following general formula (1): human knife tobacco

RsfC〇〇H)m. · .(〇 〜20^表示具有(甲基)丙浠醯基或乙縣的錢為2 之有機基’其亦可含有氧原子;m代表i〜為 < I數) 17 200835763 所示之羧酸為較佳,以(曱基)丙烯酸,或是如下列通 (2): " R2RsfC〇〇H)m. · . (〇~20^ represents an organic group having a (meth)propanyl group or a money of 2 in the county of E. It may also contain an oxygen atom; m represents i~ is < I 17 200835763 The carboxylic acid shown is preferably (mercapto)acrylic acid or as follows (2): " R2

H2C 〇 〇H ---(2)H2C 〇 〇H ---(2)

(R2表示氫原子或碳數i〜4的烷基;R3表示碳數1〜5 的一彳貝烧基,或具有環式構造的碳數4〜2〇的二價有機基, 其亦可含有氧原子)所示之羧酸為更佳。關於上述通式(2) 所示之羧酸,具體而言,可列舉R3為具有從環己烷、降莰 烷、三環癸烷、四環十二烷中除去兩個氫原子而成之基者。 此等成分可單獨使用,亦可將兩種以上混合使用。此等成 分中以(甲基)丙烯酸為更佳。此等羧酸與上述單體組成 物中之其他成分之共聚可順利地進行,再者共聚後得到的 聚合物之構造變得安定。因此,可以防止分子鏈彼此的解 離,耐熱性及高溫環境下的接著強度也提升。 上述羧酸的混合量,雖可視接著強度等接著劑組成物 的目標性質而適宜設定,但當將上述苯乙烯、上述(曱美) 丙烯酸酯及上述(曱基)丙烯酸烷基酯的總量當作1〇〇質 量份時,以1〜10質量份為較佳,以丨〜5質量份為更佳。^ 為1質量份以上,可使所得到的接著劑組成物<耐熱性及 南溫環境下的接著強度進一步提升。又,若在1〇質量份以 18 200835763 下,可以抑制接著劑組成物的吸濕性及防止膠化,又藉由 上述接著劑組成物所具有的羧基含量減少,耐鹼性也提升。 混合上述羧酸的時機,若可使上述羧酸與上述單體組 成物中紐料的齡進行共聚反應,將錢別限定。 〜。之了在使共聚反應開始前預先將上述羧酸混入 早體組成物中;亦可在其他成分之共聚反應開始後且在該 共聚反應終了前混入上述羧酸。 • 然而,以預先地將上述羧酸、上述苯乙烯、上述(甲 丙烯1¾及上述(甲基)丙烯酸烷酯混合後,再開始 反應為較佳。藉由使預先混合有上述羧酸的單體組成 、 物進行共來反應,上述羧酸可與其他成分隨機地共聚。藉 : 此,由於上述極性基將平均地存在於接著劑組成物中,上 v面中接著劑組成物之極性將進一步提升,且高溫環應 下接著劑組成物中分子鏈彼此之解離進一步受到抑制,方因 此接著強度進一步提升。 鲁3£取再者,在本說明書中,「開始共聚反應」係指與在上述 ’、K反應開始後才混入之化合物以外的化合物所混合而成 之上=單體組成物開始進行共聚反應的時點。 =際上在實施上述接著劑組成物的製造之情況,當以 合為目的時,可將構成單體組成物之化合物混合終 * 取之時點做為上述「共聚反應開始」的時點。又,該「共 應開始」的時點,在於共聚反應使用附有授 八^ ,,可為以預先混合為目的之化合物之全部種類 刀另J至J —部分供給至反應器後,作為開始擾掉的時點; 19 200835763 在設定共聚反應的反應温度之情況,可為開始加熱至該温 度的時點;在使用聚合起始劑的情況,可為添加聚合起始 劑的時點。 由於以上述任一時點做為「共聚反應開始」的時點,. 皆可以得到本發明的效果,因此可視上述接著劑組成物的 製造設備、條件等設定適當的「共聚反應開始」時點,以 控制其後續的步驟。 七夕又,在本說明書中,「使共聚反應終止」是指達成所希 望的共聚反應的時點。具體而言,可為於停止上述攪拌的 _ 時點,或由上述反應温度開始冷卻的時點,實施上述接著 劑組成物的製造。 (二官能性單體) : 上述單體組成物可進一步含有二官能性單體。藉由含 有二官能性單體,所得接著劑組成物中其構成分子可經由 該二官能性單體加以交聯。藉由交聯成三次元構造,使得 該接著劑組成物的質量平均分子量變大。已知在一般接著· 劑之技術領域中,若構成分子的質量平均分子量變大,接 著劑組成物之内部能量也會提升。由此可知對高溫環境下 接著強度之高低而言,該内部能量也是重要因素之_。又, 1接著劑組成物的質量平均分子量變大,所呈現之破璃轉 ,溫度也隨之上昇’因而接著強度也提升。換言之,上述 早體組成物藉由進-步含有二官能性單體,接 的質量平均分子量變大,高溫環境下著強度也提^物 20 200835763 再者,上述單體組成物藉由含有二官能性單體,於高 溫環境下上述接著劑組成㉗中分子鍵彼此之解離可被抑 制。因此,高溫時接著強度提升,又,即使歷經高溫製程 後,亦可以容易地剝離。再者,由於縱使減少上述缓酸之 若干使用量,仍可得到使耐熱性提升等之效果,因此可使 以其做為主成分之上述接著劑組成物之耐鹼性提升。 因此,可提供一種具耐熱性、耐鹼性及高溫環境下(特 _ 別疋140 c〜200 c )之接著強度高,且高溫製程後亦容易 剝離的接著劑組成物。 本况明書中之二官能性單體意指具備兩個官能基的化 , 合物。換言之,上述二官能性單體,雖然只要為具備翻個 : &能基1的化^物將無特別限定,但以選自下列通式: X1-R4~X2 · · . (3) (R4表示碳數2〜20之二價絲或具有雜構造與 數6〜20的二價有機基,其亦可含有氧原子;X1及X2各自 獨立,表示(甲基)丙烯酿基、乙稀基)所示之化合物組 成之群組中之至少-種二官能性單體為較佳。關於上述通 式(3)所表示的化合物,可列舉二經甲基-三環癸烧二丙 烯酸酯、新戊二醇二丙烯酸酯、1>9-壬二醇丙烯酸酯、萘二(R2 represents a hydrogen atom or an alkyl group having a carbon number of i to 4; R3 represents a mussel burnt group having a carbon number of 1 to 5, or a divalent organic group having a ring structure of 4 to 2 carbon atoms; A carboxylic acid represented by an oxygen atom is more preferred. Specific examples of the carboxylic acid represented by the above formula (2) include R3 having two hydrogen atoms removed from cyclohexane, norbornane, tricyclodecane or tetracyclododecane. Base. These components may be used singly or in combination of two or more. Among these components, (meth)acrylic acid is more preferred. The copolymerization of these carboxylic acids with the other components in the above monomer composition can be smoothly carried out, and the structure of the polymer obtained by the copolymerization becomes stable. Therefore, the dissociation of the molecular chains from each other can be prevented, and the heat resistance and the bonding strength in a high temperature environment are also improved. The amount of the carboxylic acid to be blended may be appropriately set depending on the target properties of the adhesive composition such as the strength of the adhesive, but the total amount of the above styrene, the above (comparable) acrylate, and the above (alkyl) acrylate may be used. When it is 1 part by mass, it is preferably 1 to 10 parts by mass, more preferably 丨 to 5 parts by mass. When the amount is 1 part by mass or more, the resulting adhesive composition <heat resistance and adhesion strength in a south temperature environment can be further improved. Further, when the mass of the adhesive is 18 200835763, the moisture absorption of the adhesive composition and the prevention of gelation can be suppressed, and the carboxyl group content of the adhesive composition can be reduced, and the alkali resistance is also improved. When the carboxylic acid is mixed, the carboxylic acid may be copolymerized with the age of the carboxylic acid in the monomer composition. ~. The carboxylic acid is previously mixed into the precursor composition before the start of the copolymerization reaction; the carboxylic acid may be mixed after the initiation of the copolymerization of the other components and before the end of the copolymerization reaction. • However, it is preferred to start the reaction by mixing the above carboxylic acid, the above styrene, and the above (methacrylic acid 13⁄4 and the above (meth)acrylic acid alkyl ester in advance, by preliminarily mixing the above-mentioned carboxylic acid. The body composition and the substance are co-reacted, and the carboxylic acid may be randomly copolymerized with other components. By this, since the above polar group will be present evenly in the adhesive composition, the polarity of the upper v-side intermediate composition will be Further improvement, and the high temperature ring should further inhibit the dissociation of the molecular chains from each other in the composition of the adhesive, so that the strength is further improved. In the present specification, "starting the copolymerization reaction" means When the above-mentioned K and the compounds other than the compound which are mixed in the K reaction are mixed, the above-mentioned monomer composition starts to undergo the copolymerization reaction. In the case where the above-mentioned adhesive composition is produced, For the purpose, the compound constituting the monomer composition may be mixed and finally taken as the time point of the above-mentioned "copolymerization reaction start". The point is that the copolymerization reaction is carried out by using a combination of all kinds of compounds for the purpose of premixing, and the other parts are supplied to the reactor as a point of time to start the disturbance; 19 200835763 The reaction temperature of the reaction may be the time at which the heating is started to the temperature; in the case where the polymerization initiator is used, it may be the time at which the polymerization initiator is added. Since the above-mentioned point is used as the "copolymerization start" In the present invention, the effect of the present invention can be obtained. Therefore, the appropriate "copolymerization start" can be set according to the manufacturing equipment and conditions of the above-mentioned adhesive composition to control the subsequent steps. Tanabata, in this specification, The term "terminating the copolymerization reaction" means the time at which the desired copolymerization reaction is achieved. Specifically, the above-mentioned adhesive composition can be produced at a point when the stirring is stopped or when the reaction temperature starts to be cooled. Difunctional monomer): The above monomer composition may further contain a difunctional monomer. By containing a difunctional monomer, The constituent molecules in the subsequent composition can be crosslinked via the difunctional monomer. By crosslinking into a three-dimensional structure, the mass average molecular weight of the adhesive composition becomes large. In the technical field, if the mass average molecular weight of the constituent molecules is increased, the internal energy of the adhesive composition is also increased, and it is understood that the internal energy is also an important factor in the high-low temperature in the high-temperature environment. (1) The mass average molecular weight of the composition of the adhesive becomes large, the glass transition is exhibited, and the temperature also rises. Thus, the strength is also increased. In other words, the above-mentioned early composition contains a difunctional monomer by further steps. The mass average molecular weight of the junction is increased, and the strength is also increased under the high temperature environment. 200820763 Further, the above monomer composition contains the difunctional monomer, and the above-mentioned adhesive composition 27 in the high temperature environment Dissociation can be suppressed. Therefore, the strength is increased at a high temperature, and even after a high temperature process, it can be easily peeled off. Further, since the effect of improving the heat resistance and the like can be obtained by reducing the amount of use of the above-mentioned retarding acid, the alkali resistance of the above-mentioned adhesive composition containing the main component can be improved. Therefore, it is possible to provide an adhesive composition which has high heat resistance, alkali resistance and high temperature environment (especially 140 c to 200 c) and has high adhesion strength and is easily peeled off after a high temperature process. The difunctional monomer in the present specification means a compound having two functional groups. In other words, the above-mentioned difunctional monomer is not particularly limited as long as it has a compound: & energy base 1, but is selected from the following formula: X1-R4 to X2 · (3) ( R4 represents a divalent silk having a carbon number of 2 to 20 or a divalent organic group having a hetero structure and a number of 6 to 20, which may also contain an oxygen atom; X1 and X2 are each independently, and represent a (meth)acrylic group, ethylene. It is preferred that at least one of the difunctional monomers in the group consisting of the compounds shown in the group) is preferred. Examples of the compound represented by the above formula (3) include di-methyl-tricyclic tert-doped diacrylate, neopentyl glycol diacrylate, 1>9-nonanediol acrylate, and naphthalene.

丙烯酸酯及下列通式(4 ): . 0 (R5及R6各自獨立,表示伸乙氧基或伸丙氧基;η及 21 200835763 s各自獨立,為0〜4之整數)所示之化合物。此等化合物 可以單獨使用,亦可以將兩種以上混合使用。 此等化合物之中,以選自二羥曱基-三環癸烷二丙烯酸 酯、新戊二醇二丙烯酸酯、1,9一壬二醇丙烯酸酯、萘二丙 烯酸酯及上述通式(4)所示之化合物組成之群組中選出之 至少一種二官能性單體為更佳。此等二官能性單體,易與 單體組成物之其他成分交聯,且該交聯構造亦安定。藉此, 可以得到高溫環境下的接著強度及耐熱性進一步提升之接 著劑組成物。 上述二官能性單體的量,雖可視以接著強度等為目的 之接著劑組成物之性質而適當地設定,但當將上述苯乙 烯、上述(曱基)丙烯酸酯及上述(曱基)丙烯酸烷酯的 、 總量當做100質量份時,以0.1〜0.5質量份為較佳,以 0.1〜0.3質量份為更佳。若為0.1〜0.5質量份,則所得到的 接著劑組成物在高溫環境下之接著強度及耐熱性將進一步 提升,再者,由於抑制吸濕性,因此可防止接著劑組成物 _ 之凝膠化。 再者,上述二官能性單體,雖以在共聚反應開始之前, 預先混入其餘單體組成物中為最佳,但上述二官能性單體 的一部份或全部於其餘單體組成物的共聚反應開始後才混 入,可以得到約略同樣的效果。 (苯乙烯巨單體) 上述單體組成物可進一步含有苯乙烯巨單體。藉此所 22 200835763 得到的接著劑組成物的平均分子量變大。且,高溫環境下 上述接著劑組成物中分子鏈之彼此解離受到抑制。因而, 接著劑組成物的耐熱性、高溫環境下(特別是〜2〇〇 °c)的接著強度、高溫製程後之剝離容易性等可以進一少 提升。The acrylate and the compound of the following formula (4): .0 (R5 and R6 each independently represent an ethoxy or propenoxy group; and η and 21 200835763 s are each independently, an integer of 0 to 4). These compounds may be used singly or in combination of two or more. Among these compounds, selected from the group consisting of dihydroxyindenyl-tricyclodecane diacrylate, neopentyl glycol diacrylate, 1,9-nonanediol acrylate, naphthalene diacrylate, and the above formula (4) The at least one difunctional monomer selected from the group consisting of the compounds shown is more preferred. These difunctional monomers are easily crosslinked with other components of the monomer composition, and the crosslinked structure is also stabilized. Thereby, an adhesive composition in which the bonding strength and heat resistance in a high temperature environment are further improved can be obtained. The amount of the above-mentioned difunctional monomer can be appropriately set depending on the properties of the adhesive composition for the purpose of adhesion strength, etc., but the above styrene, the above (mercapto) acrylate, and the above (fluorenyl) acrylate are used. When the total amount of the alkyl ester is 100 parts by mass, it is preferably 0.1 to 0.5 part by mass, more preferably 0.1 to 0.3 part by mass. When it is 0.1 to 0.5 parts by mass, the adhesive strength and heat resistance of the obtained adhesive composition in a high-temperature environment are further improved, and further, since the hygroscopic property is suppressed, the gel of the adhesive composition can be prevented. Chemical. Further, the above difunctional monomer is preferably mixed in the remaining monomer composition before the start of the copolymerization reaction, but a part or all of the difunctional monomer is in the remaining monomer composition. After the copolymerization reaction is started, it is mixed, and about the same effect can be obtained. (Styrene Giant Monomer) The above monomer composition may further contain a styrene macromonomer. The average molecular weight of the adhesive composition obtained by this means 22 200835763 becomes large. Further, the dissociation of the molecular chains in the above-mentioned adhesive composition is suppressed in a high temperature environment. Therefore, the heat resistance of the subsequent composition, the adhesion strength in a high temperature environment (especially ~2 〇〇 ° C), and the ease of peeling after a high temperature process can be further improved.

再者,由於縱使減少上述羧酸之若干使用量,仍矸得 到使耐熱性提升等之效果,因此可使以其做為主成分之上 述接著劑組成物之耐驗性提升。 上述苯乙烯巨單體,只要其構造中具有笨乙烯嵌段構 造且能與上述單體組成物中之其他成分共聚,將無特別隊 定,但以「由苯乙烯嵌段構造及位於該苯乙烯嵌段構凑兩 末端之有機基所構成,且上述有機中至少一個有機基臭麟 碳一碳雙鍵」之苯乙烯巨單體為較佳,更佳為如下列通式 CH -CH,Further, since the effect of improving the heat resistance can be obtained by reducing the amount of use of the above carboxylic acid, the durability of the adhesive composition can be improved as a main component. The above styrene giant monomer, as long as it has a stupid ethylene block structure in its structure and can be copolymerized with other components in the above monomer composition, will not be specially set, but is constructed by the styrene block and located in the benzene. The ethylene block is composed of organic groups at both ends, and at least one organic odorant carbon-carbon double bond of the above organic styrene macromonomer is preferred, and more preferably is CH-CH of the following formula:

• · · ( 5 ) (及R各自獨立’表示具備至少一個碳—碳雙鍵I 碳數1〜10之有機基,其亦可含有氧原子)所表示的苯心婵 巨單體。上述苯乙烯巨單體易與上述單體組成物所含厶其 他化合物共聚。因此,所得接著劑組成物之平均分子耋進 /步變大,且上述接著劑組成物中之分子鏈彼此之解難食 23 200835763 到抑制。 乙婦苯乙烯嵌段構造的苯 选寻接者触絲之㈣㈣當地 自度轉耐熱 較佳,以50〜70個為更佳。 一 20〜100個為 關於上述苯乙埽巨單體 亞合成株式會社製,箄@ . aq 7歹】舉.巨早體(東 株式會社製,等H S —⑹,巨單體(東亞合成 也可將兩種以上混合使言此二早,了早獨使用’ 組成物中其他成分-本乙烯巨單體與上述單體 他珉刀之共聚可順利地 聚合物構造亦變得安 丁且一承後侍到的 解離,所導fr::;二错此可以防止分子鍵彼此之 —二 阿〉皿裱境下的接著強度提升。 又’本乙烯巨單體的量,雖可視為目的之接著強度、 耐”、、性等接著劑組成物之性質而適當地加以 Ϊ單體组f物總量當作⑽質量份時,上述苯乙稀及上述 ,乙烯巨單體的總I為3〇〜9〇質量份,以40〜6〇質量份為 ^ ’上述苯乙烯巨單體的量,在該總量範圍内,以5〜40 貝里伤為較佳’更佳的狀況為··上述苯乙稀及上述苯乙烯 巨單體_量為30, f量份,上述苯乙烯巨單體的量, 在=總量的範圍内,為1〇〜2〇質量份。若在此範圍内,則 可谓上述接著劑組成物中,苯乙烯與苯乙烯巨單體具有適 當的比例。即’上述接著劑組成物可同時得到··苯乙稀所 產生之耐熱性提升效果,及上述苯乙烯巨單體所產生之高 溫環境下接著強度提升之效果。 24 200835763 此合上述苯乙烯巨單體的時 巨单體與上述單體組成物要τ使上遂本乙燁 行共聚反應,將沒㈣別的體以外的成分進 總之’可在共聚反應開始前 混合於單體組成物中,亦m、、⑼本乙細巨單體 了 上述苯_ 於上述苯乙埽巨單體以 & _又,以 後,再混w料乙心單體早=;絲的絲反應開始 始後,-次全,人、⑽佳,以於該共聚反應開 於依此進行::或輪數次分段混合為更佳。由 趴依此進仃混合,上述 q又狂田 巨單體之苯乙触段構;物中偏好存在來自乙烯 造一步受到抑制’其結果為高溫環境二 (本乙沐嵌段) ,名 為依照本實施態樣 合物可含有苯乙狀歲段。 成物之主成分的上述聚 物,可以防止於之:合物做為主成分的接著劑組成 體。因此,在舆:編間的…^ …1:::劑'且成物剝離等,因而可以得到高溫 衣&下接者強度提升之接著劑組成物。 又’由於可抑制在高溫環境下上述接著劑組成物中分 子鏈彼此之解離’因而可防止在高溫環境下接著劑組成物 25 200835763 的變質。因此,接著強度提升,且即使歷經高溫製程後, 也可以輕易地剝離。 且,由於即使減少上述羧酸的若干用量,仍可以得到 使耐熱性提升等效果,所以可使以其做為主成分的接著劑 組成物之耐驗性進一步提升。 從而,可使耐熱性、於高溫環境下(特別是140°C至 200°C)的接著強度及高溫製程後的剝離容易性進一步提 升。 又,本說明書中所述之「苯乙烯嵌段」係指在上述的 聚合物中,以苯乙烯為嵌段單位而進行共聚的部位。因此, 若於開始聚合後添加苯乙烯,則由於其他成分之共聚大約 終了,所以形成僅由該苯乙烯構成之嵌段體。因此,苯乙 . 烯嵌段係所謂僅由使其他單體成份之聚合開始後所添加之 苯乙烯聚合而成的嵌段共聚體。 苯乙烯嵌段從上述苯乙烯之形成係藉由下述方法進 行:將上述苯乙烯的全部或一部份,於混合該苯乙烯的殘 籲 餘部份、上述(甲基)丙烯酸酯及上述(曱基)丙烯酸烷 酯並使共聚反應開始之後且於該共聚反應終止之前,以全 部一次或是分成複數次之方式混入該共聚反應系統,亦即 進行共聚反應的反應器中。 形成苯乙烯嵌段之苯乙烯的量,係用共聚反應開始後 所添加之苯乙烯的量來調整。且其量雖可依目標接著強 < 度、耐熱性等接著劑組成物之性質而適當地設定,但將製 造本實施態樣之接著劑組成物所用之苯乙烯的全量當作 26 200835763 100質量份時,其量以5至80質量份為較佳,以10至30 質量份為更佳。 , 再者,於上述共聚反應開始後所加入之苯乙烯,以將 該苯乙烯全部一次加入為較佳。又,在共聚反應所需要時 間内,以於經過一半時間之前加入為較佳。若如此,藉由 苯乙烯密集及共聚,可在上述接著劑組成物中適當地形成 苯乙烯嵌段。 (接著劑組成物中主成分以外的成分) 在本實施態樣的接著劑組成物中,亦可配入其他添加 成分如二曱基丙烯醯胺等丙烯醯胺類;或丙烯醯基嗎嚇^等 嗎琳類。藉由這些成分的配入,耐熱性及接著性可望同時 改善。 4 在本實施態樣的接著劑組成物中,在不損害本發_:之 本質特性的範圍内,可以進一步添加具有混和性的添加 φ 劑,例如改良接著劑之性能用的加成樹脂、可塑劑、接著 助劑、安定劑、著色劑、界面活性劑等習用添加劑。-且該接著劑組成物,在不損害本發明之本質特性的範 圍内,亦可以使用調整黏度用的有機溶劑進行稀釋。關於 上述有機溶劑,可列舉丙酮、甲基乙基酮、環己酮、甲基 異戊基酮、2 —庚酮等酮類;乙二醇、乙二醇單乙酸酯、二 # 乙二醇、二乙二醇單乙酸酯、丙二醇、丙二醇單乙酸酯、 k 二丙二醇或二丙二醇單乙酸g旨之單曱基醚、單乙基醚、單 丙基醚、單丁基醚或單戍基醚等多元醇類及其衍生物;二 27 200835763 噚烷等環式醚類;及乳酸甲酯、乳酸乙酯、乙酸曱酯、乙 酸乙酯、乙酸丁酯、丙酮酸曱酯、丙酮酸乙酯、曱氧基丙 酸甲酯、乙氧基丙酸乙酯等酯類。這些成分可單獨使用, 亦可將兩種類以上混合使用。特別是以乙二醇、乙二醇單 乙酸酯、二乙二醇、二乙二醇單乙酸酯、丙二醇、丙二醇 單乙酸酯、二丙二醇或二丙二醇單乙酸酯之單甲基醚、單 乙基醚、單丙基醚、單丁基醚或單戊基醚等多元醇類及其 衍生物為較佳。 有機溶劑之使用量,依據塗佈接著劑組成物所得的膜 厚而適當地加以設定。接著劑組成物只要為可塗佈在半導 體晶圓等支撐體上的濃度,將不具有特別的限定。一般而 言,在使接著劑組成物的固形成分濃度成為20〜70質量 f %,較佳25〜60質量%的範圍内使用。 以上,對於上述為了解決習知接著劑問題用的接著劑 組成物,已說明單體組成物的成分、將其共聚而成之聚合 物之較佳構造等。可將此等加以適當地組合,藉由將此等 修 加以組合,不用說可以發揮更高的耐熱性及耐鹼性、剝離 容易性、加熱時及真空時產生的氣體量減低等相關效果。 〔共聚反應〕 上述單體組成物的共聚反應可藉由先前公知之方法進 行,而沒有特別限定。例如,藉由使用既存的攪拌裝置攪 ^ 拌上述單體組成物,可以得到本發明的接著劑組成物。 共聚反應中的温度條件雖可適當地加以設定而無特別 28 200835763 限疋,但以60〜150C為較佳,以7〇〜12〇。〇為更佳。 又,於共聚反應中,若適當,可以使用溶劑。關於上 述溶劑’可以採用上述有機_,其中以丙二醇曱鍵乙酸 酯(以下以「PGMEA」表示)為較佳。. 又,於本實施態樣的共聚反應中,若適當,可以使用 聚合起始劑。關於聚合起始劑,可卿2,2,—偶氮雙異丁 猜(A麵)、2,2,-偶氮雙(2_甲基丁猜)、2,2,—偶氮雙• (5) (and R independently) denotes a benzoquinone macromonomer represented by at least one carbon-carbon double bond I having an organic group having 1 to 10 carbon atoms, which may also contain an oxygen atom. The above styrene macromonomer is easily copolymerized with other compounds contained in the above monomer composition. Therefore, the average molecular enthalpy/step of the obtained adhesive composition becomes large, and the molecular chains in the above-mentioned adhesive composition are mutually unpleasant. 23 200835763 To suppression. Benzene styrene block structure of benzene selected to contact the wire (4) (four) local self-heating heat resistance, preferably 50 to 70 is better. One of 20 to 100 is made of the above-mentioned styrene-based macromonomer, which is manufactured by 亚@. aq 7歹]. The giant body (manufactured by Higashi Co., Ltd., HS-(6), giant monomer (East Asia Synthetic also It is possible to mix two or more kinds of two early, and to use the other components in the composition alone - the copolymerization of the present ethylene macromonomer with the above-mentioned monomer hemp knife can smoothly become a polymer structure and also The disengagement of the after-sales service, the introduction of fr::; the second mistake can prevent the molecular bond from each other - the second A 〉 裱 裱 裱 的 裱 裱 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 。 本 本 本Then, when the total amount of the monomer group f is appropriately taken as (10) parts by mass according to the properties of the adhesive composition such as strength, resistance, and the like, the total I of the above-mentioned styrene and the above-mentioned ethylene macromonomer is 3. 〇~9〇 parts by mass, 40~6〇 parts by mass ^^ The amount of the above styrene macromonomer, in the total amount range, 5~40 Berry injury is better 'Better condition is · - the amount of the above styrene and the above styrene macromonomer is 30, f parts, the amount of the above styrene macromonomer, in the range of = total amount In the range of 1 to 2 parts by mass, it is said that the above-mentioned adhesive composition has an appropriate ratio of styrene to styrene macromonomer. That is, the above-mentioned adhesive composition can be simultaneously obtained. · The heat-resisting effect of styrene and the effect of the subsequent strength increase in the high temperature environment generated by the above styrene giant monomer. 24 200835763 The above-mentioned styrene giant monomer and the above monomer The composition requires τ to cause the copolymerization reaction of the upper oxime, and the components other than the other components are mixed into the monomer composition before the start of the copolymerization reaction, and m, (9) The above-mentioned benzene_ is in the above-mentioned phenethyl amide macromonomer to & _, and later, remixing the material of the bismuth monomer early =; after the silk reaction begins, the second time, the person, (10) is good, The copolymerization reaction is carried out according to the following: or a plurality of rounds of mixing is better. According to the mixing and mixing, the above q is also a pheno-styrene structure of the giant monomer; Ethylene is inhibited in one step, and the result is high temperature environment II According to the present embodiment, the above-mentioned polymer which can contain a benzene stellate-like segment, which is a main component of the product, can be prevented from being composed of a compound which is a main component of the composition. The ...^ ...1:::agent' and the peeling of the product, so that the adhesive composition of the high-temperature coat & the lower strength can be obtained. Also, the above-mentioned adhesive composition can be suppressed in a high temperature environment. The dissociation of the molecular chains from each other' thus prevents deterioration of the adhesive composition 25 200835763 in a high temperature environment. Therefore, the strength is increased, and even after a high temperature process, it can be easily peeled off. Moreover, even if the above carboxylic acid is reduced In some applications, the heat resistance can be improved, and the durability of the adhesive composition containing the main component can be further improved. Therefore, heat resistance, adhesion strength in a high temperature environment (especially 140 ° C to 200 ° C), and ease of peeling after a high temperature process can be further improved. In addition, the "styrene block" as used in the present specification means a site in which copolymerization is carried out in the above-mentioned polymer in the form of block units of styrene. Therefore, if styrene is added after the initiation of the polymerization, since the copolymerization of the other components is completed, a block body composed only of the styrene is formed. Therefore, the styrene block is a block copolymer obtained by polymerizing only styrene added after the polymerization of other monomer components is started. The formation of the styrene block from the above styrene is carried out by: adding all or a part of the above styrene to the residual portion of the styrene, the above (meth) acrylate and the above The (mercapto)alkyl acrylate is mixed into the copolymerization reaction system, that is, the reactor in which the copolymerization reaction is carried out, after the initiation of the copolymerization reaction and before the termination of the copolymerization reaction, all at once or in plural. The amount of styrene forming the styrene block is adjusted by the amount of styrene added after the start of the copolymerization reaction. Further, the amount thereof may be appropriately set depending on the nature of the adhesive composition such as strength and heat resistance, and the total amount of styrene used for producing the adhesive composition of the present embodiment is regarded as 26 200835763 100 In the case of parts by mass, the amount is preferably 5 to 80 parts by mass, more preferably 10 to 30 parts by mass. Further, styrene added after the start of the above copolymerization reaction is preferably added all at once in the styrene. Further, it is preferred to add it before the half time is required in the time required for the copolymerization reaction. If so, the styrene block can be suitably formed in the above-mentioned adhesive composition by dense styrene and copolymerization. (Component other than the main component in the adhesive composition) In the adhesive composition of the present embodiment, other additive components such as acrylamide such as dimercaptopropeneamine may be blended; or acrylonitrile may be scared. ^ Wait for the class. With the incorporation of these components, heat resistance and adhesion are expected to improve at the same time. In the adhesive composition of the present embodiment, an additive φ agent having a miscibility, for example, an additive resin for improving the performance of the adhesive, may be further added, within a range not impairing the essential properties of the present invention. Conventional additives such as plasticizers, auxiliaries, stabilizers, colorants, surfactants, and the like. Further, the adhesive composition may be diluted with an organic solvent for adjusting the viscosity within a range not impairing the essential characteristics of the present invention. Examples of the organic solvent include ketones such as acetone, methyl ethyl ketone, cyclohexanone, methyl isoamyl ketone, and 2-heptanone; ethylene glycol, ethylene glycol monoacetate, and two #乙二Alcohol, diethylene glycol monoacetate, propylene glycol, propylene glycol monoacetate, k dipropylene glycol or dipropylene glycol monoacetic acid g, monodecyl ether, monoethyl ether, monopropyl ether, monobutyl ether or Polyols such as monodecyl ether and derivatives thereof; 2 27 200835763 cyclic ethers such as decane; and methyl lactate, ethyl lactate, decyl acetate, ethyl acetate, butyl acetate, decyl pyruvate, An ester such as ethyl pyruvate, methyl methoxypropionate or ethyl ethoxypropionate. These components may be used singly or in combination of two or more. Especially monomethyl groups of ethylene glycol, ethylene glycol monoacetate, diethylene glycol, diethylene glycol monoacetate, propylene glycol, propylene glycol monoacetate, dipropylene glycol or dipropylene glycol monoacetate Polyols such as ether, monoethyl ether, monopropyl ether, monobutyl ether or monopentyl ether and derivatives thereof are preferred. The amount of the organic solvent used is appropriately set depending on the film thickness obtained by applying the adhesive composition. The composition of the subsequent composition is not particularly limited as long as it is a concentration that can be applied to a support such as a semiconductor wafer. In general, the solid content concentration of the adhesive composition is used in the range of 20 to 70% by mass, preferably 25 to 60% by mass. As described above, in the above-mentioned adhesive composition for solving the conventional adhesive problem, a component of the monomer composition, a preferred structure of a polymer obtained by copolymerizing the same, and the like have been described. These can be appropriately combined, and by combining these modifications, it is needless to say that higher heat resistance and alkali resistance, easiness of peeling, and reduction in the amount of gas generated during heating and vacuum can be exhibited. [Copolymerization reaction] The copolymerization reaction of the above monomer composition can be carried out by a conventionally known method, and is not particularly limited. For example, the adhesive composition of the present invention can be obtained by stirring the above monomer composition using an existing stirring device. Although the temperature conditions in the copolymerization reaction can be appropriately set without particular limitation, it is preferably 60 to 150 C, and is preferably 7 to 12 Torr. It is better. Further, in the copolymerization reaction, a solvent can be used as appropriate. The above organic solvent can be used for the above solvent, and propylene glycol hydrazone acetate (hereinafter referred to as "PGMEA") is preferred. Further, in the copolymerization reaction of the present embodiment, a polymerization initiator may be used as appropriate. Regarding the polymerization initiator, it can be 2,2,-azobisisobutyl guess (A side), 2,2,-azobis(2_methylbutyl guess), 2,2,-azo double

異丁酸二甲酯、1,1’一偶氮雙(環己烷—1—甲腈)、4,4i — 偶氮雙(4-氰基戊酸)等偶氮化合物;癸醯基過氧化物、 月桂醯基過氧化物、笨曱醯基過氧化物、雙(3,5,5—三甲 基己酸基)過氧化物、琥崎過氧化物、三級—丁基邏氧 —2-乙基己錢、三級—丁基過氧特戊_、⑴,3_四甲 過氧_2-乙基己_旨等有機過氧化物。此等成分可單 =用,亦可將兩種以上混合使用。χ 單體組成㈣組合及反應條”定, 亚無特別限定。 ^接者溥膜〕 上述本發明之接著劑組成物可視各 方法。例如,可以採用在液體狀 用各種利用 等被加工體上而形成接著劑層之=’·塗佈於半導體晶圓 發明之接著薄膜後,㈣先於可 2可輯用形成本 2述任-種接著劑組成物的“:::薄含 餘’然後將此薄膜(接著薄膜)貼附於被加工體上 29 200835763 (接著薄膜法)。 =,本發明之接㈣财薄膜上具料有上述任一 種接者劑組成物的接著劑層。 因此,上述單體組成物藉由 可將極性基導入上述接著劑:由::步:有上述羧酸時, 熱性、高溫環境下之得到具備高耐 程後可容易地剝離之接著=度及耐驗性,且經歷高溫製 時二=體Γ成物進-步含有上述二官能性單體 再者,在上述單體組二子能性單體來交聯。 情況,構成上述接著===述笨乙婦巨單體之 大,又,曰之接者劑組成物之平均分子量變 大又,该接者劑層具有來自 段構造。藉此,於*勒早體之本乙烯肷 彼此之解離受到抑r:t著劑組成物中分子鏈 的上者=為上述接著劑層之主成分 ^ 有本乙烯嵌段的情況,可以防止上述 處產::體物與塗佈有該接著劑組成物之被接著面之界面 著可以侍到具有更高的耐熱性、高溫環境下之接 者強=鹼,且制離容易性優良之接著薄膜。 上返接者薄膜、 著劑層而㈣。》^進“步將保護薄膜被覆於上述接 I,m , 、Μ蚁况,藉由將接著劑層上的保護薄膜 膜Γ接-=重4於被加卫體上後’將上㈣ t 剝離,可啸容易地在被加工體上設置接著 劑層。 30 200835763 與在被加工體上直接塗 相較,可以形成膜厚均 攸而,若使用上述接著薄膜, 佈接著劑喊物所形成的接著劑層 -性及表面平祕較為良好之層。An azo compound such as dimethyl isobutyrate, 1,1'-azobis(cyclohexane-1-carbonitrile), 4,4i-azobis(4-cyanovaleric acid); Oxide, lauryl peroxide, alum-based peroxide, bis(3,5,5-trimethylhexanoate) peroxide, succinate peroxide, tertiary butyl oxo An organic peroxide such as 2-ethylhexan, tert-butylperoxypenta-, (1), 3-tetramethylperoxy-2-ethylhexyl. These ingredients may be used alone or in combination of two or more.单体 The monomer composition (4) and the reaction strip are determined, and the sub-layer is not particularly limited. The binder composition of the present invention can be used as the above-mentioned adhesive composition. For example, it can be used in a liquid form for various applications such as use. After the formation of the adhesive layer = '· is applied to the adhesive film of the semiconductor wafer invention, (4) before the second can be used to form the "::: thin residual" of the composition of the second embodiment of the present invention This film (following the film) was attached to the object to be processed 29 200835763 (following the film method). =, the adhesive film of the present invention is provided with an adhesive layer of any of the above-mentioned carrier compositions. Therefore, the monomer composition can be introduced into the above-mentioned adhesive by using a polar group: when: the above-mentioned carboxylic acid is obtained, the heat resistance and the high temperature environment are obtained, and the high resistance is obtained, and then the peeling degree can be easily peeled off and Testability, and when subjected to high temperature production, the second body is further composed of the above-mentioned difunctional monomer, and further crosslinked in the above monomer group. In other words, it constitutes the above-mentioned === the size of the stupid female giant monomer, and the average molecular weight of the composition of the sputum is increased, and the connector layer has a segment structure. Thereby, the dissociation of the present vinyl hydrazines in the precursors is suppressed by the above: the upper part of the molecular chain in the composition of the agent = the main component of the above-mentioned adhesive layer, and the presence of the present ethylene block can prevent The above-mentioned production: the interface between the body and the surface to which the composition of the adhesive is applied can serve a strong heat resistance, a high temperature environment, a strong base, and excellent ease of separation. Then the film. The upper return film and the coating layer (4). 》^“Into the step, the protective film is coated on the above I, m, and Μ ant, by splicing the protective film on the adhesive layer -= weighs 4 after being applied to the body, 'will (4) t When peeling off, it is easy to provide an adhesive layer on the object to be processed. 30 200835763 Compared with the direct coating on the object to be processed, it is possible to form a uniform film thickness, and if the above-mentioned adhesive film is used, a cloth adhesive is formed. The layer of the adhesive layer - the layer of the surface and the flatness is relatively good.

★ €接著;!膜之製造所使用之上述薄膜,只要為可使 薄膜上所製膜的接著劑層自薄膜剝離,且可將接著劑層轉 =於保4基板及晶圓等被處理面上的離型薄膜,將無限 疋^如可列舉由膜厚為15〜125μιη的聚對苯二甲酸伸 =曰(polyethylene phthalate)、聚乙烯、聚丙稀、聚碳酸醋、 ?最氯乙鱗合賴㈣膜所構成之可撓性薄膜。上述薄膜 在必要日寸,4 了使轉印變得容易,以進行離型處理為較佳。 關於在上述薄膜上形成接著劑層的方法,可依所希望 的接者劑層膜厚及均-性採取適#的習知方法,而益特別 的限定,例如,可列舉使用塗抹器、棒塗佈器、線塗佈器、 報塗佈器、簾流塗佈H等,以使㈣上之上述接著劑層歡 乾燥膜厚成為10〜1__之方式,塗佈本發明接著^且 成物之方法。其中輥塗佈器由於可效率良好地 均 一性優良且厚度厚的膜,故而較佳。 、予句 又,使用上述保護薄膜的情況,該保護薄膜雖然只要 可t上述接著劑層剝離’將沒有特別的限定,不過以例如 對苯二曱酸伸以旨薄膜、聚丙稀薄膜、聚乙烯薄膜為較佳。 又,上述各保護薄膜以塗佈或燒結矽為較佳。因為從上述 2著劑層之剝離容易。上述保護薄膜的厚度,雖無特別= 疋’但以15〜125μιη為較佳。@為可以確保具備保護薄膜 之上述接著薄膜的柔軟性。 、、 31 200835763 上述接著薄膜的使用方法’雖無特別限定,但例如在 使用保護薄膜的情況,可列舉將保護薄膜剝離後,於將露 =的接著劑層重疊於被加工體之上,藉由使加純移動於 溥膜上(形成接著劑層之面的被面),而將接著劑層熱壓著 於被加卫體表面之方法。此時,由接㈣__保護薄 膜’藉=依序捲曲輥⑽成輥狀,可轉及再利用。 本貫施態樣的接著劑組成物,雖然只要用於 做為接著齡成物’將祕職定,不過較佳做為將半導 體晶圓的精密加工用保護基板接著於半導體晶圓等基板用 的接者劑組成物。本發_接著劑組成物,特別適合在將 半導體晶H等基板切削薄板化時,做為將該基板貼附於支 稽板用的歸齡㈣(勤,日本公開翻公 屬 一 191550號公報)。 幵 〔剝離液〕 移除本實施態樣之接著频絲__液,可以使 用通常用的剝離液,從環境負荷及剝離性的觀點士之以 腦EA及乙酸口旨、甲基乙基_做為主成分的她夜為特 佳0 &lt;實施例&gt; 以下就確認本發明之接著劑組成物之接著強度等之實 施例加以説明。 、 、 又,以下實施例及比較例之接著劑組成物的評價,藉 32 200835763 由測定各個的耐熱性、吸濕性、柔軟性、不同温度條件下 之接著強度、於200°c之氣體產生量(以下,以「產生氣 體」表示)而進行。以下說明此等之測定方法。 ^ (财熱性、吸濕性、產生氣體的測定方法) 將下述的Λ施例及比較例之各接著劑組成物塗佈於石夕 晶圓上後’將各個塗佈膜由4代升溫至2贼,測定 鲁膜的脫離氣體量,藉由該氣體量進行評價。 可藉由上述脫離氣體量評價时熱性及吸濕性的理由如 :述〜σ之’至l〇〇c所測定到的脫離氣體量為來自水 H氣或其共戟體。由於上述水蒸氣或其共沸氣體係來咱 ,接著劑組成物所吸濕的水分,因此可根據至1〇代所測得 的脫離氣體量評價吸濕性。又,力HKTC以上所測定到的 脫離氣體量係來自接著劑組成物本身因熱分解所產生的氣 體。因此,100°C以上,特別是綱。c附近溫度的脫離氣體 • 量可以用來評價接著劑組成物的耐熱性。 上述脫離氣體量的測定是採用TDS法( Desorption SpeCtr〇scopy,升溫脱離分析法)。TDs測定裝 置(放出氣體測定裝置)係採用電子科學股份有限公司所 製造之 EMD —WA1000。 TDS裝置的測定條件為’寬度:1〇〇,中心質量數:5〇, I增加值(Gain):9’掃描速度:4,電子倍增器加速電壓㈣也 r Volt) :1.3KV。 耐熱性的評價:於20(TC的情況,藉由上述TDS測定 33 200835763 裝置所求付的強度(In(jensity )在1 〇〇〇〇〇以下且金屬顯微 鏡未觀察到殘渣的情況記為〇;雖然在100000以上,但金 屬顯微鏡觀察不到殘渣的情況記為△,100000以上且金屬 顯微鏡觀祭到殘渣的情況記為x。 吸濕性的評價,於100°c之上述強度(Intensity)在 10000以下的情況記為〇,10000以上的情況記為X。 又’在產生氣體的評價時,200°C下,藉由上述TDS 測定裝置所得到的強度(Indensity)在100000以下的情況 記為〇,100000以上的情況記為X。 (於各温度的接著強度) 將貫施例及比較例之接著劑組成物塗佈於矽晶圓上 後,在150 C進行3分鐘的乾燥。之後,將玻璃基板於2〇〇 C、附加1kg的重量下進行接著後,將該玻璃基板加以拉 伸,然後利用縱型電動計測立台「Μχ —5_」(imada 月又伤有限公司製)計算出石夕晶圓剝離時的接著強度。 (柔軟性之評價) 使用旋塗器將各接著劑組成物以1〇〇〇rpm塗佈於6吋 矽曰曰圓上歷時25秒之後,在熱板上於2〇(rc加熱3分鐘, 可在上述矽晶圓上得到塗膜層。接著,由目視觀察上述塗 佈膜層有無裂痕的存在’將具有裂痕的膜層記為χ,將無裂 痕的膜層記為〇。又,所使用的石夕晶圓厚度為 200835763 (耐鹼性的評價) 關於耐驗性,係在矽晶圓上沴佑奋 著劑組成物後,在20(TC乾烊3八/二及比較例之接 質· τ_ (氫氧溶 察塗佈之膜是否溶解。以目視確認塗佈之= 〇,確認轉者記為X。★ €Next;! The film used for the production of the film may be a release film which can be used to peel the adhesive layer formed on the film from the film, and can transfer the adhesive layer to the surface to be processed such as the substrate and the wafer. The infinite 疋^ can be exemplified by a polyethylene terephthalate, a polyethylene, a polypropylene, a polycarbonate, a polychlorophthalic acid, and a film having a thickness of 15 to 125 μm. Flexible film. It is preferable that the above-mentioned film is easy to transfer in order to carry out the release treatment in a necessary day. The method of forming the adhesive layer on the above-mentioned film can be specifically defined according to the desired film thickness and uniformity of the desired carrier layer, and for example, an applicator or a stick can be used. An applicator, a wire applicator, a newspaper applicator, a curtain coating H, or the like, so that the film thickness of the above-mentioned adhesive layer on (4) is 10 to 1 mm, and the present invention is applied. The method of things. Among them, the roll coater is preferred because it can be efficiently and uniformly uniform and has a thick film. In the case of using the above-mentioned protective film, the protective film is not particularly limited as long as it can be peeled off from the above-mentioned adhesive layer, but for example, a film of a terephthalic acid, a polypropylene film, or a polyethylene is used. A film is preferred. Further, it is preferable that each of the above protective films is coated or sintered. Because the peeling from the above two agent layers is easy. The thickness of the above protective film is preferably 15 to 125 μm although it is not particularly = 疋'. @ is to ensure the flexibility of the above-mentioned adhesive film having the protective film. 31 200835763 The method of using the above-mentioned adhesive film is not particularly limited. For example, when a protective film is used, the protective film is peeled off, and the adhesive layer of the exposed layer is superposed on the object to be processed. The adhesive layer is heat-pressed on the surface of the body to be cured by moving the pure film on the enamel film (the surface on which the surface of the adhesive layer is formed). At this time, it is rolled into a roll shape by the (4) __ protective film **, and can be transferred and reused. The adhesive composition of the present invention is preferably used as a substrate for precision machining of a semiconductor wafer, and is preferably used for a substrate such as a semiconductor wafer. The composition of the receiver. The composition of the present invention is particularly suitable for the purpose of cutting a substrate such as a semiconductor crystal H into a sheet for the purpose of attaching the substrate to the branch board (4) (Minute, Japanese Laid-Open Patent Publication No. 191550) ).幵[Peeling liquid] The removal of the subsequent filament __ liquid of the present embodiment can be carried out using a usual peeling liquid, from the viewpoint of environmental load and peelability, brain EA and acetic acid, methyl ethyl _ The night which is the main component is particularly good. <Examples> Hereinafter, examples of the adhesion strength and the like of the adhesive composition of the present invention will be described. Further, the evaluation of the adhesive composition of the following examples and comparative examples was carried out by measuring the heat resistance, hygroscopicity, flexibility, and the subsequent strength under different temperature conditions and gas at 200 ° C by 32 200835763. The amount (hereinafter, expressed as "generating gas") is performed. The measurement methods of these are described below. ^ (Method for measuring the heat, moisture absorption, and gas generation) After applying the respective adhesive compositions of the following examples and comparative examples to the Shihwa wafer, the temperature of each coating film was increased by 4 generations. To 2 thieves, the amount of detached gas of the film was measured, and the amount of the gas was evaluated. The reason for the heat and hygroscopicity in the evaluation of the amount of the released gas is as follows: the amount of the degassed gas measured by the ~ to 〇〇c is derived from the water H gas or its conjugate. Since the water vapor or its azeotropic gas system is dehydrated and the binder composition absorbs moisture, the hygroscopicity can be evaluated based on the amount of the degassed gas measured in the first generation. Further, the amount of the released gas measured by the force HKTC or higher is derived from the gas generated by the thermal decomposition of the adhesive composition itself. Therefore, above 100 ° C, especially the program. The detachment gas at the temperature near c • The amount can be used to evaluate the heat resistance of the adhesive composition. The above-mentioned amount of liberated gas was measured by a TDS method (Desorption SpeCtr〇scopy). The TDs measuring device (release gas measuring device) is an EMD-WA1000 manufactured by Electronic Science Co., Ltd. The measurement conditions of the TDS device were 'width: 1 〇〇, center mass number: 5 〇, I added value (Gain): 9' scanning speed: 4, electron multiplier acceleration voltage (4) and r Volt): 1.3 KV. Evaluation of heat resistance: In the case of TC (in the case of TC, the intensity (In(jensity)) of the device was measured by the above-mentioned TDS measurement 33 200835763, and the residue was not observed in the metal microscope. In the case of 100,000 or more, the case where the residue is not observed by the metal microscope is denoted by Δ, and the case where the metal microscope observes the residue is denoted by x. The evaluation of the hygroscopicity is the above-mentioned strength at 100 ° C (Intensity) In the case of 10000 or less, it is referred to as 〇, and in the case of 10000 or more, it is referred to as X. In addition, when the gas is evaluated, the intensity (Indensity) obtained by the TDS measuring apparatus at 200 ° C is 100000 or less. In the case of 〇, 100000 or more is referred to as X. (Essential strength at each temperature) The adhesive compositions of the respective examples and comparative examples were applied onto a ruthenium wafer, and then dried at 150 C for 3 minutes. After the glass substrate was placed at a weight of 2 〇〇C and a weight of 1 kg, the glass substrate was stretched, and then the vertical electric measuring platform "Μχ-5_" (manufactured by Imada Yuesei Co., Ltd.) was used for calculation. Stone Adhesive strength at the time of wafer peeling. (Evaluation of flexibility) Each adhesive composition was applied to a 6-turn circle at 1 rpm for 25 seconds using a spinner, and then placed on a hot plate. 2〇(rc heating for 3 minutes, a coating layer can be obtained on the above-mentioned tantalum wafer. Then, the presence or absence of cracks in the coating film layer is visually observed. 'The cracked film layer is marked as a flaw, and the crack-free film is formed. The layer is recorded as 〇. In addition, the thickness of the Shixi wafer used is 200835763 (Evaluation of alkali resistance). Regarding the testability, after the composition of the 奋 奋 奋 奋 , , on the 矽 wafer, at 20 (TC dry 烊3/2 and the quality of the comparative example τ_ (Whether the film prepared by the hydrogen-oxygen solution coating was dissolved. The coating = 〇 was visually confirmed, and it was confirmed that the transfer was recorded as X.

〔實施例1〜5、比較例1〕 (甲基)丙烯 酯,具有烯性 實施例1〜5), 組成物(比較 比較使用包含苯乙烯、具有環狀構造之 酸酯、由鏈狀構造構成之(甲基)丙烯酸烷 雙鍵之叛酸之單體組成物之接著劑組成物( 與使用不含上述叛酸之單體組成物之接著劑 例1)之性質。 將實施例1〜5、比較例1中單體組成物之組成及籍油 聚合該單體組成物所得到之上述接著劑組成物之 ^ 量示於表1。 【表1】 組成(質量份) 實施 例1 實施 例2 .實施 例3 實施 例4 1 實施 例5 比較一 Α,τ 1 甲基丙烯酸甲酯 15 15 15 15 W J w/ 15 1夕1J丄 1 ^ 甲基丙烯酸正丁酯 13 13 13 13 13 丄D 1 〇 苯乙烯 52 52 52 52 52 丙烯酸笨氧基乙酯 20 20 20 20 20 O jL OA 丙烯酸(共聚反應 開始後混合) 5 5 0 0 0 ΖΛ) 0 丙烯酸(共聚反應 開始前混合) 0 0 5 10 15 0 平均分子量 87000 105000 105000 105000 J05000 86000 35 200835763 貫施例1、2之接著劑組成物以如下之方法得到。 在具備回流冷却器、攪拌機、温度計及氮氣導入管且 合里為300ml之四口燒瓶中,混合做為溶劑的pGMEA 53.85g,及如表!所示做為單體的丙烯酸苯氧基乙酯2如、 曱基丙烯酸甲酯15g、甲基丙烯酸正丁酯13g、苯乙烯 52g、丙烯酸5g,然後開始吹入氮氣。藉由開始攪拌而使 聚合開始,一面攪拌一面升溫至9〇。〇後,將由pGMEA 3 8 · 4 5 g及做為聚合起始劑的三級丁基過氧_ 2 _乙基己酸酯所 組成的混合液由滴加喷嘴連續滴加2小時,滴加速度保持❿ 一定。又,依照表1所記載之各實施例所對應的接著劑組 成物平均分子量,調整三級丁基過氧_2_乙基己酸酯的添加 量,以使各實施例的接著劑組成物具有表i所記載之平均 ' 分子量。 將滴加終了後所得到的聚合反應液於保持原狀下,於 90°C熟成1小時後,將PGMEA 25.10g及三級丁基過氧_2-乙基己酸酯0.3g所構成之混合液經一小時滴加。之後,將⑩ ^^合反應液於保持原狀下,於9〇°c熟成1小時後,將ι,ΐ,3,3 —四曱基丁基過氧-2-乙基己酸酯i.og —次全部投入。 接著’將聚合反應液於保持原狀下,於9〇t熟成3小 時後’使聚合反應液升溫至觀察到溶劑回流為止,再經過 1小時的熟成,使聚合終止。 實施例3〜5之接著劑組成物以下述方法得到。 在具備回流冷却器、攪拌機、温度計及氮氣導入管且 容量為300ml之四口燒杯中,加入做為溶劑的pgmea 36 200835763 4〇g ’及如表1所; 田甘 之做為單體的丙烯酸苯氧基乙酯20g、 甲基丙烯酸甲舻! &lt; 9 g、甲基丙稀酸正丁酯13g、苯乙稀 52g、丙烯酸,姑、μ • g然後開始吹入氮氣。開始攪拌並使聚合 » Λ抑面攪拌一面升溫至90°C後,將由PGMEA 17.3g #廢為單體的丙烯酸所構成之混合液(在實補3為5g、 Λ^4為1()&amp;在實施例5為15g),以及由PGMEA17.3g 仪為承。起始劑的三級丁基過氧-2-乙基己酸酯l.〇g所 成的混合液分職由滴加时嘴連續滴加2小時,並使 滴加速度保持一定。 、滴力、、、了後’將所得到的聚合反應液於保持原狀下, 於9〇C熟成1小時後’將PGMEA79.9g及三級丁基過氧-2-乙基己酸S旨G.2g所形成之混合液經一小時滴加。之後,將 來合反應液於保持原狀下再熟成丨小時後,將一四 甲基丁基過氧-2·乙基己酸酯h〇g 一次全部投入。 :; 接著,將聚合反應液於保持原狀下,於9(TC熟成3-小 0守後,使聚合反應液升溫至觀察到溶劑回流為止,再經過 1小時的熟成後,使聚合終止。 比較例1之接者劑組成物,除了不含丙浠酸之外,以 與實施例1相同之方法得到。 因此,在表1中所謂「共聚反應開始前混合」係表示 甲基丙烯酸甲酯、曱基丙烯酸正丁酯、苯乙烯、丙烯酸苯 氧基乙酯、丙烯酸,全部依表1所示之量加以混合Ji開始 共聚反應。 又,在表1中所謂「共聚反應開始後混合」係表示於 37 200835763 上述各實施例中接著劑組成物的製造方法所記載的甲基丙 烯酸甲酯、甲基丙烯酸正丁酯、苯乙烯、及丙烯酸苯氧基 乙醋依表1所示之量加以混合,待升溫至卯^後,依表1 所示之量混入丙烯酸。 對於上述實施例1〜5及比較例1,比較於140°C的接著 強度、氣體產生、耐熱性、柔軟性、吸濕性及耐鹼性並將 結果示於表2。[Examples 1 to 5, Comparative Example 1] (Meth) propylene ester having olefinic examples 1 to 5), and a composition (comparatively used styrene, an acid ester having a cyclic structure, and a chain structure) The nature of the adhesive composition of the monomer composition of the (meth)acrylic acid alkyl double bond and the use of the adhesive composition of the monomer composition containing no such acid-removing agent. 5. The composition of the monomer composition in Comparative Example 1 and the amount of the above-mentioned adhesive composition obtained by polymerizing the monomer composition are shown in Table 1. [Table 1] Composition (parts by mass) Example 1 Implementation Example 2 Example 3 Example 4 1 Example 5 Comparison of one Α, τ 1 methyl methacrylate 15 15 15 15 WJ w / 15 1 1 1J 丄 1 ^ n-butyl methacrylate 13 13 13 13 13 丄D 1 styrene 52 52 52 52 52 Phenoxyethyl acrylate 20 20 20 20 20 O jL OA Acrylic acid (mixed after the start of copolymerization) 5 5 0 0 ΖΛ) 0 Acrylic acid (mixed before the start of copolymerization) 0 0 5 10 15 0 Average molecular weight 87000 105000 105000 105000 J05000 86000 35 200835763 Examples 1 and 2 of the adhesive compositions obtained in the following method. PGMEA 53.85g was mixed as a solvent in a four-necked flask equipped with a reflux condenser, a stirrer, a thermometer, a nitrogen inlet tube and a 300 ml aliquot. As the monomer, phenoxyethyl acrylate 2 such as methyl methacrylate 15 g, n-butyl methacrylate 13 g, styrene 52 g, and acrylic acid 5 g were shown, and then nitrogen gas was started to be blown. The polymerization was started by starting the stirring, and the temperature was raised to 9 Torr while stirring. After the crucible, a mixture of pGMEA 3 8 · 4 5 g and tertiary butyl peroxy-2-ethylhexanoate as a polymerization initiator was continuously added dropwise by a dropping nozzle for 2 hours. Keep ❿ sure. Further, according to the average molecular weight of the adhesive composition corresponding to each of the examples described in Table 1, the addition amount of the tertiary butylperoxy-2-ethylhexanoate was adjusted so that the adhesive composition of each example was It has the average 'molecular weight' as stated in Table i. The polymerization reaction solution obtained after the completion of the dropwise addition was aged at 90 ° C for 1 hour, and then a mixture of 25.30 g of PGMEA and 0.3 g of tertiary butyl peroxy-2-ethylhexanoate was added. The solution was added dropwise over one hour. After that, the reaction solution was kept in the original state, and after aging at 9 ° C for 1 hour, i, ΐ, 3, 3-tetradecyl butyl peroxy-2-ethylhexanoate i. Og - all the inputs. Then, the polymerization reaction solution was allowed to stand at 9 Torr for 3 hours, and then the polymerization reaction solution was heated until the reflux of the solvent was observed, and the mixture was aged for 1 hour to terminate the polymerization. The adhesive compositions of Examples 3 to 5 were obtained in the following manner. In a four-pot beaker with a reflux condenser, a stirrer, a thermometer, and a nitrogen inlet tube and a capacity of 300 ml, pgmea 36 200835763 4〇g ' as a solvent and as shown in Table 1; Tian Ganzhi as a monomer Phenyl acrylate 20g, methyl methacrylate! &lt; 9 g, 13 g of n-butyl methacrylate, 52 g of styrene, acrylic acid, and μ·g were then blown with nitrogen. The mixture was stirred and the temperature was raised to 90 ° C while stirring, and then a mixture of PGMEA 17.3 g #available as acrylic acid was used (in the case of 3, 5 g, Λ^4, 1 () &amp;; 15g in Example 5, and by PGMEA 17.3g. The mixture of the initiator ternary butyl peroxy-2-ethylhexanoate l. 〇g was continuously added dropwise for 2 hours from the mouth, and the dropping rate was kept constant. After the dropping reaction, the resulting polymerization reaction solution was maintained in the original state, and after ripening at 9 ° C for 1 hour, 'PGMEA 79.9 g and tertiary butyl peroxy-2-ethylhexanoic acid were used. The mixture formed by G.2g was added dropwise over one hour. Thereafter, the reaction mixture was aged for another hour, and all of the tetramethylbutylperoxy-2·ethylhexanoate h〇g was added all at once. Then, the polymerization reaction solution was kept in the original state, and after the TC was aged to 3, the polymerization reaction solution was heated until the reflux of the solvent was observed, and after further aging for 1 hour, the polymerization was terminated. The carrier composition of Example 1 was obtained in the same manner as in Example 1 except that it did not contain propionic acid. Therefore, the phrase "mixing before the start of copolymerization" in Table 1 means methyl methacrylate, N-butyl methacrylate, styrene, phenoxyethyl acrylate, and acrylic acid were all mixed in an amount shown in Table 1 to initiate copolymerization. Further, in Table 1, "mixing after the start of copolymerization reaction" means 37,37,35,763, Methyl methacrylate, n-butyl methacrylate, styrene, and phenoxyacetic acid acrylate described in the above-described respective examples of the method for producing an adhesive composition are mixed according to the amounts shown in Table 1. After the temperature was raised to 卯^, acrylic acid was mixed in an amount shown in Table 1. For the above Examples 1 to 5 and Comparative Example 1, the bonding strength at 140 ° C, gas generation, heat resistance, flexibility, and moisture absorption were compared. Sex and alkali resistance The results are shown in Table 2.

【表2】【Table 2】

對於實施例1〜5及比較例1,比較該等於23¾ 12(TC、14(rc、200X;之接著強度。將其結果示於表3及第 圖中。且,在第一圖中,橫軸表示各溫度條件,縱輛 示其接著強度(kgf/cm2)。 又For Examples 1 to 5 and Comparative Example 1, the comparison was made equal to 233⁄4 12 (TC, 14 (rc, 200X; the subsequent strength. The results are shown in Table 3 and the figure. And, in the first figure, the horizontal The axis indicates each temperature condition, and the vertical direction indicates the strength of the joint (kgf/cm2).

【表3】 备遥度條件下的接著強度(kgfcm2) 23〇C 140°C _ 比較例1 4.2 8.4 實施例1 3.9 9.8 __實施例2___ 5.2 9.8 -_ 實施例3 4.8 112 一 實施例4 5.6 11.0 ^ 實施例5 一 5.4 11.0[Table 3] Adhesion strength under remote conditions (kgfcm2) 23〇C 140°C _ Comparative Example 1 4.2 8.4 Example 1 3.9 9.8 __Example 2___ 5.2 9.8 -_ Example 3 4.8 112 A Example 4 5.6 11.0 ^ Example 5 A 5.4 11.0

38 200835763 本發明之接著劑組成物,如同上述,為以含有苯乙烯、 具有環狀構造的(甲基)丙烯酸g旨及由鏈狀構造構成之($ 基)丙烯酸烷酯的單體組成物共聚而成之聚合物做 分的接著劑組成物,其中,上述單體組成物進一步含有且 烯性雙鍵之㈣。因此,上述接著劑組成物中,極性基的 增加,因而上述接著劑組成物及塗佈有該接著劑組成物之 被接著層界面中上述該接著劑組成物的極性向上提升,且 __環境下i述接著劑組成物中之分子鏈彼此之解離進-步受到抑制,又’上述之單體組成物中,藉由含有上述苯 乙烯、上述丙騎自旨及上述(曱基)丙騎錢等不具资 羧基之化合物,可確保耐驗性。 、 從而可以發揮所谓「提供一種耐熱性、高溫環境下 (特別S 14(TC〜200t:)之接著強度高及具有耐驗性,且 在高溫製程後可容㈣剝離的接著劑組成物」的效果。: 又,本發明之接著薄膜,如同上述,可以在薄膜上—具 籲2¾有上述任接著劑組成物的接著劑層。因而,上述的 早體組成物’藉由進一步含有上述羧酸,可將極性基導入 士,著劑:中。從而’可以提供一種具高耐熱性、高溫 从下之接著強度高及具耐驗性,且高溫製程後剝離容易 的接著薄膜。 s X,本發明之接著·錢的製造方法,#同上述, 在將上述苯乙稀、上述(甲基)丙稀酸醋及上述(曱基) 1 ⑽魏基S旨之絲反應終了前,混人上酸。因此, 上述舰’與上述單體組成物中上述護酸以外的成分進行 39 200835763 機共聚反應。藉此,上述極性基均一地存在於接著劑組 成物中’ X ’局溫環境下,接著劑組成物巾的分子鏈彼此 •之解離受到抑制。因此上述界面的極性提升,接著強 提升。 么彳文而可以發揮所謂「提供一種具有耐熱性、高溫環 境下(特別*14(rc〜200。〇之接著強度高及具耐驗性, 且在^溫製程後可容易地剝離的接著劑組成物」的效果。 發明的詳細説明項所述之具體的實施態樣或實施例, 已明確,露本發明的技術内容,不過不應狹義地解釋成僅 限於此等具體實施例,在本發明之精神及記載於後的申請 專利範圍内,可以實施各種變更。 又,本發明的接著劑組成物及接著薄膜具有高耐熱性 f f驗陡、低吸濕性、加熱時產生極少氣體、又易藉由剝 離液進行剝離。因此適合用於歷經高溫製程、高真空製程, 使用驗等各種化學藥品之製程的半導體晶圓或晶片之加工 步驟。 【圖式簡單說明】 第圖係顯示在本發明之實施例中,將含有乙烯性雙 +加於單體組成物所得到之接著劑組成物於不同 度條件下之接著強度的比較結果。 【主要元件符號說明】 益。 川、38 200835763 The adhesive composition of the present invention is a monomer composition containing styrene, a (meth)acrylic acid having a cyclic structure, and a (meth)acrylic acid alkyl ester composed of a chain structure. A polymer composition obtained by copolymerization, wherein the monomer composition further contains (4) an olefinic double bond. Therefore, in the above-mentioned adhesive composition, the polar group is increased, and thus the polarity of the above-mentioned adhesive composition in the above-mentioned adhesive composition and the interface of the adhesive layer coated with the adhesive composition is increased upward, and __environment The dissociation of the molecular chains in the composition of the adhesive agent is inhibited, and the above monomer composition is obtained by containing the above styrene, the above-mentioned propylene riding and the above (曱基) A compound such as money that does not have a carboxyl group ensures durability. Therefore, it is possible to exhibit an "adhesive composition which provides a heat resistance, a high-temperature environment (especially S 14 (TC to 200t:) with high bonding strength and durability, and can be subjected to (four) peeling after a high-temperature process" Further, the film of the present invention, as described above, may be on the film - an adhesive layer having the above-mentioned adhesive composition. Thus, the above-mentioned precursor composition ' further contains the above carboxylic acid The polar group can be introduced into the coating, the agent: medium. Thus, it is possible to provide a bonding film which has high heat resistance, high temperature from the bottom, high strength and durability, and easy peeling after high-temperature processing. s X, this In the same manner as described above, in the above, the above-mentioned styrene, the above (meth)acrylic acid vinegar, and the above-mentioned (mercapto) 1 (10) Weiji S are finally reacted. Therefore, the above-mentioned ship's and the above-mentioned monomer composition are subjected to a copolymerization reaction of a component other than the above-mentioned acid-protecting agent, whereby the above-mentioned polar group is uniformly present in the 'X' local temperature environment of the adhesive composition. then The dissociation of the molecular chains of the constituent tissues is suppressed. Therefore, the polarity of the above-mentioned interface is increased, and then the strength is increased. The text can be used to provide a heat-resistant and high-temperature environment (special *14 (rc~200). The effect of the adhesive composition having high strength and durability, and which can be easily peeled off after the temperature treatment process. The specific embodiment or embodiment described in the detailed description of the invention has been clarified. The technical content of the present invention is not limited to the specific embodiments, and various modifications can be made within the spirit of the present invention and the scope of the appended claims. Further, the composition of the adhesive of the present invention And the film has high heat resistance, high sensitivity, low hygroscopicity, little gas generated during heating, and easy peeling by the stripping solution. Therefore, it is suitable for various chemicals such as high temperature process, high vacuum process, and use. The processing steps of the semiconductor wafer or wafer of the process. [Simplified description of the drawings] The figure shows that in the embodiment of the present invention, it will contain ethylene double + Comparison of the adhesion strength of the composition of the adhesive obtained by adding the monomer composition under different conditions. [Explanation of main component symbols] Benefit.

Claims (1)

200835763 十、申請專利範圍: 一種接著劑㈣物’細包含苯乙烯、具有環狀構造之 、(=基己丙烯酸酯及由鏈狀構造構成之(甲基)丙烯酸 ^旨之單體組成物共心狀聚合物做為主成分之接夂 著劑組成物,其特徵為該單體組成物進一步 雙鍵之羧酸。 3/、缔性200835763 X. Patent application scope: An adhesive (four) of a monomer composition containing fine styrene, a cyclic structure, (= hexyl acrylate, and a (meth) acrylate composed of a chain structure The core polymer is used as a binder composition of the main component, which is characterized by further carboxylic acid of the double bond of the monomer composition. 2·如申請專鄉圍第丨項之接著齡成物,其中當將該苯 該(甲基)丙烯酸醋及該(甲基)丙稀酸燒酿的 、、么1當作100質量份時,該羧酸的量為丨〜忉質量份。 3·如申請專利範圍第1項之接著餘成物,其中該^ 如下列通式(1): ^ R1—fc〇OH )m · · ·⑴ (Rl表示具有(甲基)丙烯醯基或乙烯基的碳數為 2〜20之有機基,其可含有氧原子;m代表卜3之整數) 所示之羧酸。 … 4.如申請專利範圍第1項之接著劑組成物,其中該缝酸為 (甲基)丙烯酸或下列通式(2): R2 I H2C=C2. If you apply for the age-old product of the 乡 围 丨 , , , , , , , , , , , , , 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该 该The amount of the carboxylic acid is 丨 to 忉 parts by mass. 3. According to the remainder of the patent application, the remainder is the following formula (1): ^ R1 - fc 〇 OH ) m · · · (1) (Rl represents a (meth) acrylonitrile group or The carboxylic acid having a vinyl group having a carbon number of 2 to 20 and which may contain an oxygen atom; m represents an integer of 3). 4. The adhesive composition of claim 1, wherein the slit acid is (meth)acrylic acid or the following formula (2): R2 I H2C=C oh · · -(2) (R2表示氫原子或碳數1〜4攸基;R3表示後數! 41 200835763 〜5的二價烷基,或具有環狀構造的碳數4〜20的二價 有機基,其可含有氧原子)所示之羧酸。 5. —種接著薄膜,其特徵為在薄膜上具備接著劑層,該接 著劑層含有如申請專利範圍第1至4項中任一項之接著 劑組成物。 6· —種接著劑組成物之製造方法,其係製造以包含苯乙烯 、具有環狀構造之(甲基)丙烯酸酯、由鏈狀構造構成 之(曱基)丙烯酸烷酯及羧酸之單體組成物共聚而成之 聚合物做為主成分的接著劑組成物,該製造方法之特徵 為在該苯乙烯、該(甲基)丙烯酸酯及該(曱基)丙烯 酸烷酯之共聚反應終止前,混入羧酸。 7.如申請專利範圍第6項之接著劑組成物之製造方法,其 中於將該羧酸、該苯乙烯、該(甲基)丙烯酸酯及該(甲 基)丙烯酸烷酯混合之後,開始共聚反應。 42· · · - (2) (R2 represents a hydrogen atom or a carbon number of 1 to 4 fluorenyl; R3 represents a post-number! 41 200835763 〜5 of a divalent alkyl group, or a divalent alkyl group having a cyclic structure of 4 to 20 carbon atoms An organic group which may contain a carboxylic acid represented by an oxygen atom). A film which is characterized in that an adhesive layer is provided on the film, and the adhesive layer contains the adhesive composition according to any one of claims 1 to 4. a method for producing an adhesive composition, which comprises producing a styrene, a (meth) acrylate having a cyclic structure, an alkyl (meth) acrylate and a carboxylic acid An adhesive composition comprising a polymer obtained by copolymerizing a bulk composition as a main component, the method of manufacturing characterized in that the copolymerization reaction of the styrene, the (meth) acrylate and the alkyl (meth) acrylate is terminated The carboxylic acid is mixed before. 7. The method for producing an adhesive composition according to claim 6, wherein the copolymerization is started after the carboxylic acid, the styrene, the (meth) acrylate, and the alkyl (meth) acrylate are mixed. reaction. 42
TW096129020A 2006-09-07 2007-08-07 Adhesive composition, adhesive film, and production method of the adhesive composition TW200835763A (en)

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JPH023483A (en) * 1988-06-13 1990-01-09 Sekisui Chem Co Ltd Hot-melt pressure-sensitive adhesive composition
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