200828008 九、發明說明： 【發明所屬之技術領域】 本發明係關於-種用於測試電腦前置控制面板之連接 益之測試儀’尤指-種可用於測試多種電腦之前置控制面 板之連接器之測試儀。 【先前技術】 大多數伺服器或桌上型電腦都會有_前置控制面板， 其主要功能相同且大致結構均㈣，但不同電腦之前置控 制面板之連接器之訊號有所不同，因是，製造商在生産過 程中，往往需要針對不同機型設計不同之測試儀，如此， 延長了測試周期且提高了測試成本。 因是，實有必要對習知之電腦連接器測試儀進行改 良，以消除上述缺失。 【發明内容】 鑒於上述内容，有必要提供一種電腦連接器測試儀， 其可用於測試多種電腦之前置控制面板之連接器。 、一種電腦連接器測試儀，用於測試電腦之控制面板之 連接裔，其包括一可編程之微型控制器、至少一接收該微 型控制器輸出之測試訊號並向該控制面板之一連接器發出 汛唬之第二測試通道、至少一與該第二測試通道對應並接 收該控制面板之另一連接器訊號後向該微型控制器發出訊 ，之第一測試通道、一用於控制該微型控制器向該第二測 f通道發出該測試訊號之第一控制電路及一由該微型控制 為控制並用於顯示該第一及第二測試通道測試結果之顯示 200828008 電路，該微型控制器透過判斷該測試訊號是否經過由該第 二測試通道、控制面板之一連接器、控制面板、控制面板 之另一連接為及第一測試通道組成之迴路返回至該微型控 制裔，以控制該顯示電路顯示該控制面板之連接器是否為 良品之測試結果。 相較習知技術，本發明之較佳實施方式採用微型控制 器作爲測試電路之控制元件，其可根據不同之電腦控制面 板進行編私以滿足不同之測試需求，具有良好地通用性， 從而縮短了測試周期並降低了測試成本。 【實施方式】 請參照圖1，本發明電腦連接器測試儀之較佳實施方 式包括一盒體10、一設於該盒體1〇内部之電路板3〇及一 盖ά又於該盒體1〇頂部之蓋板5 〇 〇 該盒體10 —側設有兩第一開口 u及兩第二開口 12， 該盒體10相對一側設有兩第三開口 13。該盒體1〇内部一 端没有一電池槽14用於裝設給該電腦連接器測試儀提供 電源Vcc之電池組（未標號）。 該電路板30 —端設有兩第一連接器31及兩第二連接 32 ’該電路板30相對一端設有兩第三連接器％。每一 第一連接态31具有2*5個引腳，每一第三連接器33具有 2* 12個引腳。該等第一連接器31、第二連接器32及第三 連接器33依次分別與該盒體1〇兩側之第一開口 n、第二 開口 12及第三開口 13相對應。該電路板3〇上設有複數雙 向發光二極體342、一發光二極體344、一第一開關％及 200828008 等雙向發光二極體 該兩組雙向發光二 一第二開關36。本較佳實施方式中，該 342共48個，其中每24個形成一組， 極體342在該電路板3〇上排列形成一矩陣。 該蓋板5 0上對應該等雙向發光二極體3 4 2排列形成之 矩陣設有一矩形顯示窗52、對應該發光二級管3料設有一 開孔54、對應該第一開關35母右一丨 ^闹關Μ叹有開孔55及對應該第二 開關3 6設有一開孔5 6。 請繼縯參_ 2，組裝時，該電路板30收容於該盒體 10内部，該第-連接器31、第二連接器32及第三連接器 33分別通過該盒體1〇兩側之第一開口 π、第二開口 u 及第三開口 13與外部相通。該雙向發光二極體342、發光 二極體344一、第一開關35及第二開關36分別對應該蓋板 50上之顯不窗52、開孔54、開孔55及開孔％。 請繼續參閱圖3,設於該電路板3〇上用於測試待測控 制面板之電路還包括一微型控制器m、兩分別與該第 接器32相對應之4位鎖存器372、兩分別與該第三連接哭 33對應之12位之鎖存11 374、兩分別與該第-連接哭31 對應之4位之緩衝器38、兩用於放大電流之驅動電路：、 電容C1及C2、電阻R1、R2及们。在本較佳實施方式中， 該微型控制器U1選用8051微型控制器。 該微㈣.m之輸料輸出之#料分職由該鎖 ^ 372傳輸至對應之第二連接器％，每一鎖存器3 :應之第二連接器32形成-第二測試通道;該微型控制哭 讥之片選埠P3.4連接至該鎖存器372令之—料 200828008 Ρ3·4通過一反閘U2接至該鎖存器372中之另一，該片選 埠Ρ3·4用於選通兩第二測試通道中之一。 、 該第一連接器31分別通過對應之緩衝器38將資料傳 輸至該微型控制器U1之輸入埠，該片選埠ρ3.4連接至該 緩衝器38中之一，該片選琿ρ3·4通過一反閘U2接至談 緩衝器38中之另一。每一第一連接器31與對應之緩衝器 38形成一第一測試通道。該片選埠Ρ3·4用於選通兩第一 測試通道中之一。其中，該第一測試通道分別與該第二測 試通道--對應。 該微型控制器U1之另12個輸出璋輸出之資料分別傳 輸至該鎖存器374，每一鎖存器374輸出之資料分別傳輸 至該驅動電路39，每一驅動電路39均驅動一組雙向發光 二極體342，每組雙向發光二極體342對應一第三連接器 33。每一鎖存器374與對應之驅動電路39及對應之一組雙 向發光二極體342形成一第三測試通道。該微型控制器耵工 之自定義埠Ρ2·4連接至該鎖存器374中之一，該自定義璋 Ρ2·4通過一反閘U2接至該鎖存器374中之另一；該微型 控制器U1之自定義槔Ρ2·5連接至該驅動電路39中之一， 該自定義璋Ρ2·5通過一反閘U2接至該驅動電路39中之 另一。該自定義埠Ρ2·4與Ρ2.5通過位操作共同選通兩第 三測試通道中之一。 該微型控制态U1之自定義琿Ρ2·6接至一 ΝΡΝ型電晶 體Q1之基極，該電晶體Q1之集極接至該發光二極體3料 之陰極，該發光二極體344之陽極經由一電阻R3接至該 200828008 電源Vcc，該電晶體W之射極接地。該電晶體Q1、發光 二極體344及電阻R3 έ日士 、、且成一用於顯示該第二測試通道及 •其對應第-測試通道職結果之顯示電路。 該微型控制器U1夕+ μ * 一 、 之中斷琿Ρ3·3直接接至該電源 同⑽心胃第―開關35及-電阻R1串聯連接之 電路接地，一電容C1徨姑丄 % 連接於該中斷琿Ρ3·3與該電源Vcc 之間。該電容Cl、第一 „ M w 弟開關35及電阻R1組成一用於控 制弟一及苐二測試通道之第-控制電路。 該微型控制器U1之曹宕搶p 里疋琿Reset經由一電阻R2接 地，一電容C2與該第一鬥關、， 饮 ^ 弟—開關36亚聯連接於該電源Vcc與 Γ二=ReSet之間。該電容C2、第二開關36及電阻们 、、且成用於控制該微型控制哭川舌— 祛田拉⑦、 重定之第二控制電路。 使用k ’透過對該微型於告 WWm, 料控I U1進行編程使其符合 該存測别置控制面板之測試 器測試儀之第―、第二及第二用貝科線將該電腦連接 弟一連接器與該待測前置控制面 内邱葙α 士 不丁 J该微型控制器U1根據其 段時間就通過該片選埠34發出一選通訊 -測試通道，則被選通之第二;;=通這及與其對應之第 之連接器、待測控制面板待二=板=側控制面板 被選通之第-測試通^成之_==之另一連接器及 3月， ，对成迴路。按下該笫一 關35，該中斷埠p3 3由高雪承 ^ 開 诠η 由電千轉換爲低電平，即該中鼢 ^3觸發，此時，若自被選通之第二測試通道^ 號經由待測控制面板之連接器、控制面板、被選通; 11 200828008 第一測试通道返回至該微型控制器U1，則該自定義埠2·6 -輸出高電平使得該電晶體Q1導通，該發光二極體344發 -光，即可传知該待測控制面板之相應連接器爲良品，若自 被選通之第二測試通道發出之測試訊號無法返回至該微型 控制為U1，則該自定義埠2·6輸出低電平使得該電晶體 Q1截止，該發光二極體344不發光，即可得知該待測前面 板之相應連接器存在品質問題。 該微型控制器U1根據内部程式對該自定義埠Ρ2·5及 Ρ2·6進行位操作以選通其中一第三測試通道，此時，若被 選通之第三測試通道之對應一組雙向發光二極體均發 光，則該待測前置控制面板之相應連接器爲良品，若有不 發光之雙向發光二極體342,則該待測前置控制面板之相 應連接器存在品質問題。 备需要測試另一待測前面板時，按一下該第二開關 36，該微型控制器υ}之重定埠Reset由低電平轉爲高電 平，即該重定璋Reset觸發，該微型控制器U]L重定。 由於該微型控制器U1具有可編程功能，該電腦連接 裔測試儀可根據不同之電腦前置控制面板進行編程，使其 可適用於待測前面板。由此，既節省了測試過程中投入之 研發成本，又可縮短測試周期。 在上述較佳實施方式中，可根據實際需要測試之前置 控制面板之連接器之數量，選擇不同之微型控制器以設置 相應數目之測試通道，從而滿足測試需求。 綜上所述’本發明符合發明專利要件，爰依法提出專 12 200828008 利申。月&以上所述者僅為本發明之較佳實施方式，舉 凡U案技藝之人士，在爰依本發明精神所作之等效修 飾或變化，皆應涵蓋於以下之申請專利範圍内。 【圖式簡單說明】 圖1係本發明電腦連接器測試儀之較佳實施方式之立 體分解圖。 圖2係圖1之立體組裝圖。 圖3係本發明電腦連接器測試儀之較佳實施方式之電 路原理圖。 【主要元件符號說明】 盒體 10 第一開口 11 第二開口 12 第三開口 13 電池槽 14 電路板 30 微型控制器 U1 反閘 U2 第一連接器 31 第二連接器 32 弟二連接器 33 雙向發光二極體 342 發光二極體 344 第一開關 35 第二開關 36 鎖存器 372, 374 緩衝器 38 驅動電路 39 電容 Cl，C2 電阻 Rl，R2, R3 電晶體 Q1 盍板 50 顯示窗 52 「歼J子L 54, 55, 56 13200828008 IX. Description of the Invention: [Technical Field] The present invention relates to a tester for testing the connection benefit of a computer front control panel, and in particular, can be used to test the connection of various computer front control panels. Tester. [Prior Art] Most servers or desktop computers have a _ front control panel, the main functions are the same and the general structure is (4), but the signals of the connectors of the front panel of different computers are different, because In the production process, manufacturers often need to design different testers for different models, thus extending the test cycle and increasing the test cost. Therefore, it is necessary to improve the conventional computer connector tester to eliminate the above deficiency. SUMMARY OF THE INVENTION In view of the foregoing, it is desirable to provide a computer connector tester that can be used to test connectors of various computer front control panels. a computer connector tester for testing a connection of a control panel of a computer, comprising a programmable microcontroller, at least one test signal receiving the output of the microcontroller, and transmitting to a connector of the control panel a second test channel, at least one corresponding to the second test channel and receiving another connector signal of the control panel, and transmitting a signal to the microcontroller, the first test channel, and one for controlling the micro control a first control circuit for issuing the test signal to the second measurement f channel and a display 200828008 circuit controlled by the micro control for displaying the first and second test channel test results, the microcontroller Whether the test signal is returned to the micro control body through a loop composed of the second test channel, one of the control panel connectors, the control panel, the other connection of the control panel, and the first test channel, to control the display circuit to display the Whether the connector of the control panel is a good test result. Compared with the prior art, the preferred embodiment of the present invention uses a microcontroller as a control component of the test circuit, which can be customized according to different computer control panels to meet different test requirements, and has good versatility, thereby shortening The test cycle and reduced test costs. [Embodiment] Referring to Figure 1, a preferred embodiment of the computer connector tester of the present invention comprises a casing 10, a circuit board 3 disposed inside the casing 1 and a cover and a casing. 1 〇 top cover plate 5 〇〇 The box body 10 is provided with two first openings u and two second openings 12 on the side, and the box body 10 is provided with two third openings 13 on one side. There is no battery slot 14 at the inner end of the casing 1 for mounting a battery pack (not labeled) for supplying power to the computer connector tester. The first end of the circuit board 30 is provided with two first connectors 31 and two second connections 32'. The circuit board 30 is provided with two third connectors % at opposite ends. Each of the first connection states 31 has 2*5 pins, and each of the third connectors 33 has 2*12 pins. The first connector 31, the second connector 32, and the third connector 33 respectively correspond to the first opening n, the second opening 12, and the third opening 13 on both sides of the casing 1 in turn. The circuit board 3 is provided with a plurality of bidirectional light-emitting diodes 342, a light-emitting diode 344, a first switch%, and a second-way light-emitting diode such as 200828008. The two sets of two-way light-emitting two-second switches 36 are provided. In the preferred embodiment, the 342 is a total of 48, wherein each of the 24 groups is formed, and the polar bodies 342 are arranged on the circuit board 3 to form a matrix. A rectangular display window 52 is disposed on the matrix of the cover plate 50 corresponding to the arrangement of the two-way light-emitting diodes 3 4 2 , and an opening 54 is formed corresponding to the light-emitting diode 3, corresponding to the first switch 35 A 丨 闹 Μ 有 有 有 有 有 有 有 有 有 有 有 有 有 有 有 有 有 有 有 有 有In the assembly, the circuit board 30 is housed in the inside of the casing 10. The first connector 31, the second connector 32 and the third connector 33 pass through the sides of the casing 1 respectively. The first opening π, the second opening u, and the third opening 13 communicate with the outside. The two-way LED 342, the LED 344, the first switch 35 and the second switch 36 respectively correspond to the display window 52, the opening 54, the opening 55 and the opening % of the cover 50. Referring to FIG. 3, the circuit for testing the control panel to be tested on the circuit board 3A further includes a microcontroller m, two 4-bit latches 372 corresponding to the connector 32, and two 12-bit latch 11 374 corresponding to the third connection cry 33, two 4-bit buffers 38 corresponding to the first-connected cry 31, and two driving circuits for amplifying current: capacitors C1 and C2 , resistors R1, R2 and them. In the preferred embodiment, the microcontroller U1 selects an 8051 microcontroller. The material output of the micro (four).m is distributed by the lock 372 to the corresponding second connector %, and each latch 3: the second connector 32 forms a second test channel; The micro-control crying chip option P3.4 is connected to the latch 372 so that the material 200828008 Ρ3·4 is connected to the other of the latches 372 through a reverse gate U2, and the slice is selected 埠Ρ3· 4 is used to gate one of the two second test channels. The first connector 31 transmits data to the input port of the microcontroller U1 through the corresponding buffer 38, and the chip select 3.4 3.4 is connected to one of the buffers 38, and the slice selects ρ3· 4 is connected to the other of the talk buffers 38 via a reverse gate U2. Each first connector 31 forms a first test channel with a corresponding buffer 38. The slice selection ·3·4 is used to gate one of the two first test channels. The first test channel corresponds to the second test channel. The data of the other 12 output ports of the microcontroller U1 are respectively transmitted to the latch 374, and the data outputted by each latch 374 is respectively transmitted to the driving circuit 39, and each driving circuit 39 drives a set of two-way. The light emitting diodes 342 each of the two-way light emitting diodes 342 correspond to a third connector 33. Each of the latches 374 forms a third test channel with the corresponding driving circuit 39 and a corresponding group of bidirectional LEDs 342. The microcontroller's custom 埠Ρ2·4 is connected to one of the latches 374, and the custom 璋Ρ2·4 is connected to the other of the latches 374 via a reverse gate U2; the miniature The custom 槔Ρ2·5 of the controller U1 is connected to one of the drive circuits 39, and the custom 璋Ρ2·5 is connected to the other of the drive circuits 39 via a reverse gate U2. The custom 埠Ρ2·4 and Ρ2.5 together strobe one of the two third test channels by bit operation. The custom 珲Ρ2·6 of the micro control state U1 is connected to the base of the ΝΡΝ-type transistor Q1, and the collector of the transistor Q1 is connected to the cathode of the illuminating diode 3, and the illuminating diode 344 is The anode is connected to the 200828008 power supply Vcc via a resistor R3, and the emitter of the transistor W is grounded. The transistor Q1, the light-emitting diode 344, and the resistor R3, and the display circuit for displaying the second test channel and the corresponding first-test channel result. The microcontroller U1 + μ μ 一 一 μ · · · · · · · · · · · 珲Ρ 珲Ρ 珲Ρ 珲Ρ 珲Ρ 珲Ρ 珲Ρ 珲Ρ 珲Ρ 珲Ρ 珲Ρ 珲Ρ μ μ μ μ μ μ μ μ μ μ μ μ μ μ μ μ μ μ μ μ Interrupt 珲Ρ3·3 between the power supply Vcc. The capacitor C1, the first „M w 弟 switch 35 and the resistor R1 constitute a first control circuit for controlling the first and second test channels. The controller U1 is robbed by the Reset via a resistor. R2 is grounded, a capacitor C2 is connected to the first bucket, and the sinker-switch 36 is connected in parallel between the power source Vcc and the second resistor = ReSet. The capacitor C2, the second switch 36, and the resistors are formed. Used to control the micro control of the crying tongue - Putian pull 7, re-determined the second control circuit. Using k ' through the micro-WWm, the material control I U1 is programmed to conform to the deposit and control control panel The first, second, and second of the tester tester connect the computer to the connector and the front control plane to be tested. The microcontroller U1 is based on the time of the microprocessor U1. The selected communication-test channel is sent through the slice selection 34, and the second is gated;;= the corresponding connector, the control panel to be tested, the second panel = the side control panel is selected. Pass the first-test to the other connector of _== and March, the pair is looped. Press the 笫Off 35, the interrupt 埠p3 3 is converted from high voltage to low level by the high snow, and the middle 鼢^3 is triggered. At this time, if the second test channel of the strobe is controlled by the test to be tested The connector of the panel, the control panel, is gated; 11 200828008 The first test channel returns to the microcontroller U1, then the custom 埠2·6 - output high level makes the transistor Q1 turn on, the light emitting two The polar body 344 emits light, and it can be known that the corresponding connector of the control panel to be tested is good. If the test signal sent from the second test channel that is gated cannot be returned to the micro control, U1, the customization The output level of 埠2·6 is such that the transistor Q1 is turned off, and the light-emitting diode 344 does not emit light, so that the quality problem of the corresponding connector of the front panel to be tested is known. The microcontroller U1 is based on the internal program pair. The custom 埠Ρ2·5 and Ρ2·6 perform bit operations to strobe one of the third test channels. At this time, if a corresponding set of bidirectional light emitting diodes of the strobed third test channel are both illuminated, then the The corresponding connector of the front control panel to be tested is a good product, if any If the two-way light-emitting diode 342 is illuminated, there is a quality problem in the corresponding connector of the front control panel to be tested. When another front panel to be tested needs to be tested, press the second switch 36, the microcontroller υ} The reset RESET changes from low level to high level, that is, the reset 璋Reset trigger, the microcontroller U]L is reset. Since the microcontroller U1 has a programmable function, the computer connection tester can be different according to different The computer front control panel is programmed to be applicable to the front panel to be tested. Thereby, the research and development cost invested in the test process is saved, and the test period can be shortened. In the above preferred embodiment, according to the actual You need to test the number of connectors on the front control panel and select different microcontrollers to set the corresponding number of test channels to meet the test requirements. In summary, the invention conforms to the patent requirements of the invention, and is proposed according to law. The above descriptions are only the preferred embodiments of the present invention, and those skilled in the art of the present invention should be included in the following claims. BRIEF DESCRIPTION OF THE DRAWINGS Fig. 1 is a perspective exploded view of a preferred embodiment of the computer connector tester of the present invention. 2 is a perspective assembled view of FIG. 1. Figure 3 is a circuit diagram of a preferred embodiment of the computer connector tester of the present invention. [Main component symbol description] Box 10 First opening 11 Second opening 12 Third opening 13 Battery slot 14 Circuit board 30 Microcontroller U1 Reverse gate U2 First connector 31 Second connector 32 Young connector 33 Bidirectional Light-emitting diode 342 Light-emitting diode 344 First switch 35 Second switch 36 Latch 372, 374 Buffer 38 Drive circuit 39 Capacitance Cl, C2 Resistance Rl, R2, R3 Transistor Q1 盍 50 display window 52 "歼J子 L 54, 55, 56 13