TW200813447A - Apparatus and operational method of a cable and a connector tester - Google Patents

Apparatus and operational method of a cable and a connector tester Download PDF

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Publication number
TW200813447A
TW200813447A TW95132777A TW95132777A TW200813447A TW 200813447 A TW200813447 A TW 200813447A TW 95132777 A TW95132777 A TW 95132777A TW 95132777 A TW95132777 A TW 95132777A TW 200813447 A TW200813447 A TW 200813447A
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Taiwan
Prior art keywords
connector
resistance
joint
test
tested
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TW95132777A
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Chinese (zh)
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TWI307775B (en
Inventor
Shui-Sen Dai
Jien-Deng Kao
Shih-Huih Sun
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Chung Shan Inst Of Science
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Priority to TW95132777A priority Critical patent/TWI307775B/en
Publication of TW200813447A publication Critical patent/TW200813447A/en
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Publication of TWI307775B publication Critical patent/TWI307775B/en

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  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Measurement Of Resistance Or Impedance (AREA)

Abstract

The present invention provides an apparatus and an operational method of a cable and a connector tester, which is used to test the connection status of a tested cable with its connector for rapidly eliminating the malfunction; wherein, the tester includes a resistance loader, a test platform, and a resistor sensor; wherein, the first connector of the resistance loader is plugged into the first connector of the tested cable, and the second connector of the test platform is plugged into the second connector of the tested cable; when measuring the tested cable and the connector, coupling the first probe of the resistance sensor with the first end of the resistor of the resistance loader, and coupling the second probe of the resistance sensor with the testing element of the test platform for measuring the connection status between the tested cable and the connector. Moreover, the present invention further configures a computer system, and the test platform is configured with a plurality of switches coupled with the second connector. The computer system controls the switching of the plurality of switches on the test platform to automatically measure the connection status of the tested cable and the connector.

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200813447 九、發明說明: 【發明所屬之技術領域】 本發明係有關於一種測試裝置及其方法,特別是一種電纜與接頭之測 試裝置及其方法,其係適用於驗證各型電纜及其接頭之線路狀態,以迅速 排除電纜及其接頭之故障原因。 【先前技術】 電子控制系統之架構隨著功能需求演進而愈來愈複雜,控制系統内部 €乡見數里巨幅增加,導致施工與維護不便,測試檢驗時間冗長與後勤維修 困難等缺點。尤其是大制系紐積龐大無法任意旋轉,再加上各功能 模組結構複雜,且大型控㈣_使狀電纜線與其接頭之數量日:辦b 加,以及每-種電纜線之單位佈線空間不一,導致控制系統之佈線=係 為錯綜複雜’傳統魏與其接敎佈線駐與量繼證方法極林便 知電路之驗證方式係為使用_多功能電錶或一歐姆錶逐一量 之狀態,但时些魏為蚊於牆射或地底mm搬移 = 缓之======㈣㈣她輸,若欲測試電 可完成檢測,由於電信二檢測人紐過對講機互相配合,方 路狀態需依大樓之樓層數:況;定耗二=人 完成測試域财才祕知雜魏之_«。如此 因此,如何使檢時間。 迅速地進行排除電現及其接頭之、,β路狀^1^加方便以及迅速,進而 之課題。藉此,本發明即提出、2 ’即為現今觀工程專家所亟待解決 簡化測試m枝又=3魏離狀崎妓《方法,其係 速地杈測電纜與其接頭之線路狀態。 200813447 【發明内容】 本發明之主要目的’在於提供轉_之戦裝置及其方法, 其係運用-電阻細ϋ量測—電阻負脑之電阻制值,以用於線路驗 證,以方便進行佈線獻,以及迅速偵測失致原因,快速排除故障現象, 降低控制糸統驗證測試成本。 本發明之:欠要目的’在提供—種電賴接狀職裝置及其方法,其係 ^供核組化設狀測試裝置’以及自動化控㈣制方式,以減輕操作人 員負荷而降低與接頭之檢測成本,因而提高後齡修之效率。 本發明係為-種電__之測試裝置及其方法,藉以精確輔測電規 及其接頭之線路狀態,並迅速執行故障排除任務,其中測試裝置係包括一 電阻感測器、-電阻負載器…測試平台,電阻負載器之—第—連接器插 設-待測電纜之-第-接頭,測試平台之_第二連接器插設待測電缓之一 萬^妾頭’以使用電阻感測器量測待測、第—接頭與第二接頭之線路 «。另外’本發明之測試裝置更包含_電腦系統、—電阻量測值搁取器 ^中電腦系統係儲存―測試程式、待測電_其接頭之規格 、貝m統係依據制魏之規格選擇—對照電阻值表,以及自 ::=r儲存電阻量測值之統計資訊。如一 細說明月之目的、*徵與優點能更明顯紐,配合所關式,作詳 【實施方式】 本^明^供-種電纜與接頭之測試裝置及其方法,其 德續 檢測⑽。、的元成魏及其翻之檢·務,以提升賴 目所7^其麵本發日狀—概實關之電路® ;本發明之1 繞與接頭之測試裝置係句人一 月之 …禮感測器10、一電阻負載器2〇、以及一2 200813447 p::〗:二阻感測益10係為一歐姆錶,或為-多功能電錶之電阻錶,電 第二探針Η量測—待測電路^與—第二探針14’以透過第一探針U與 量測值,或由-發光二極體;It)用;^由數值顯示待測電路元件之電阻 之導通斷路狀態。電阻負载哭2〇係^曰不燈之燈光明滅顯示待測電路元件 一第-連 24,複數電^ 22 =魏_ 22、—制針腳%與 數針腳,複數電阻器 12 =一2=弟=係分細妾第一連接器“之複 η係由Μ個電阻器組成,26。其中,複數電阻器 〜且呈現Rl<R2<R3qR U阻值分別為HR3至 或呈現10。百萬歐咖)>R: = ^ 中前例之複數電阻值,係依相等或不;:之遞減現象。其 器之電阻差值R.>0。/之/且錄战遞增,兩相鄰電阻 為μ令·:π阻差T相等,則其表示式係 之帝1¾佶总& ± M !。至於後例之複數個電阻器 ^紐δΓ 不等之電阻差值ARi遞減,亦即該等複數電阻器之 二=r^Ri<G。或者與前兩例均不相同之第三情況,該複數電 值係依相錢料之雜錄之織,且鋪 之絕對值均大於該等複數個電阻器之誤差值。 时間之電阻錄 阻哭本發明之魏與接頭測試裳備之關鍵條件為,這些複數電 值丨2ΓΓ同’並且所有之複數個電阻器之電阻差值战之絕對 值丨叫均極大於電阻器' 22之電阻誤差值(ε )。亦即,M > > ε。 測試平台30係設置一第二連接器32 £ ==_之一第一接頭㈣m平台3〇之第二連接二:測 第翻44’其…接頭42分職__4°之複數線 係包含髓制魏40之複數線路46,複數線路46 第一产斜1?路Wm。當®測待測電纜40時,將使電阻感測器10之 木水2雛娜w 26 ’減電_ 1G H針關接複數 7 200813447 貝J〇式元件34,以分別透過每一線路%量 承上述,若電阻感測器10從每一線^數廷阻器22之電阻量測值。 同,並呈單向遞增現象,即Ri<r <r路46所測得之電阻量測值均不相 象,即0心3>至Rm_1>Rm2。或者,或呈單向遞減現 之電阻差值之任意組合狀態,且該複數個電阻係依相等或不等 於該電阻器之誤差值。 間之黾阻差值之絕對值大 如、電嶋所表示之數值,職示待測魏 妥當且無短路之虞。若電阻感^為,正吊^路狀態,即每一線路46均隔離 崎測值,職亍°°⑴之調結祕具有至少兩個之相同電 只J衣7F具有相同電阻量 用待測電缓4〇之控制系統會有極大之運作 如路故障狀態,對於使 10無法透過待測電纜4〇、第風險而導致損壞。若電阻感測器 測電阻器22之電阻量· 之其中-線路你量 則表示待測魏秦第—接頭42 _路^法使發光二極體指示燈亮燈, 態。 、’、罘—接碩44之該線路46為斷路故障狀 免-^夕^發明之測試裝置更包含1腦系統知,其传設置-次料座52 二接頭44之量測結果至:#料庫% '第—接頭42與第 與第二接頭44之量測结果於 ^仏顯不待測電纜4〇、第-接頭42 〇 , Γ140 、载益20之複數電阻器22之第_端,以,·亦可直接柄接電阻 件’以進行待測電_、第-接頭42與^二=,別_則試元 ^設計之測試裝置,其係設置電係為一模組 30,以用於驗證測試待測電纜40 電負载益20與測試平台 .42 4第-拉s 員/、係用於輕接待測電纜40之镇in 接頭44°㈣細瞻侧叫 8 200813447 連接器24與測試平台3G之第二連接器&係為分別支援各種針腳數 =讀接頭’例如:第-連接器24料二連㈣32依據針峨量劃分 〇胳25- 5〇、75、動、.·等對應等級之連接器,以插設於對應針腳數量 。如第二圖與第三圖所示,其係分別舉例說明第一連接器Μ與 弟一連接裔32如何支援對應針腳數量之電纜接頭。 圖所不’其係為本發明之_較佳實施例之電阻負载器之 圖。柄明之電阻負載器20係設置各式規格之第一連接器24,各規格 :連接器24依據其針腳數量分別編妾對應數量之電阻器η之第_端,北 ^腳ΓίΓ接各電A 22之第:端。電㈣载器2G魏據待測電鏡40 42 ^ ? 二弟„器24之支援規格係包含—15針腳第一連接器M2、—㈣ 腳弟連接斋244與一 40針腳第一:% ^ “ 針腳及料腳之第-接頭42 她246,以分別支援15針腳、25 本發之—ΐ佳實糊之測試料之電路圖。 接哭32忙栌立口…又σ工規格之第二連接器32,各式規格之第二連 妾⑽2依據其針腳數量分·接對應數量 。 依據待測電缵40夕笛-拉π ^ ϋ什μ判忒十台30係 二連接器32,·:第—規格崎獅設職針腳規格之第 ,,. —遠接11。324與一 40針腳第二連接器326,以 杈15針腳、25針腳及40針腳之第二接頭44。 別支 树Γ之—紐實關之流糊。本發明之電 42血篦、1 ,、百先知步驟_所不,檢視待測電纜40、第—接頭 幻與弟二接頭44之規格,以依據待測魏 弟^ 娜橡貞_ ♦咖心及測= 之乐-連接5 32。例如第二圖 口 第一連接器施細針腳第-連接哭胳,以及242、25針腳 連接器322、25針腳第-、鱼… 弟二圖所不之15針腳第二 Ρ弟-連接㈣40針腳第二連接器326。且步驟si〇〇 9 200813447 更包0步,&,其係選擇一對照電阻值表, 頭42與第二接頭44之規袼選擇出對應之對照電電欖40、第一接 測器ίο電阻量測值。 值表,以供對照電阻残 接、、貝按步1^8110所示,插設電阻哭2 咖0之第-接頭42,其中電阻編㈣·連接器24至待剛 電阻器22之第一端分職接第—連接器數驗器22,轉數 示,插設測試平台3〇 、+腳。再按步驟S120& 測試平台㈣設置複數測二;之第一 接器32之複數針腳。按步驟⑽所示 =34係分_接第二連 至電阻負载器2〇之電阻器U之第二端,再依甩步驟tr〇之第—探針12 —1〇之乐二探針14至測試平台30之測古式元件 所不’耗接電阻感 量測-戦元件34所對應之待測電纔4〇、第。再按步驟Sl50所示, 路46,以取得每一線路46之線路狀態。、與弟二接頭44之線 旨按步’驟16〇所示’判斷是否完成待測 碩44之線路量測,若判斷為完成線路量測 弟-接頭42與第二接 為未完成線路量測,則接續 執:步行步驟S17° ’若判斷 12改以輕接下一測試元件%, 乂感測器10之第二探針 4Γ =碩42與第二接頭44之線路46。按步34對應待測電變 个、、係储存電阻感測器1〇之量測結果,豆中 所不’儲存量測結 或發光二極體指示燈燈號明滅結果里以:偷果^電阻量測值之統 接頭42與第二接頭44之線路狀態。 果Μ判断待測電纜40、第— 待測電纜40、第—接頭芯: 阻值表及量測結果,判斷待測電覺州二之線路狀態’係依據對照電 感測器1〇透過待測電緩40%==接頭44之線路 …至v兩個_之她量_,觸 “ 42知二接頭44量測 44為路故障狀態;若電阻 ’ ^ 、弟-接頭42與第二接頭 44 42 見叫、弟一接頭42與第二接 200813447 1〇^it^40^^42 測值符合—對;不同數值之該複數電阻量測值,且該複數電阻量 正常狀態。、則待測魏4〇、第一接頭42與第二接頭44為 貼故、第—接頭42與第二接頭44遇有故障現象,則黏 又丨早铩戴於故P早之待測電纜4〇、第一 障待測電纜40之故障飧路、 /、弟一接碩44,以指示故 以上戶w 2 M進行必要之維護措施。 大型控制系ΐ第二_44之線路狀態,特別是 輪㈣接Μ , 及驗__之大迦«統之輸入 而接五員。如此更降低控制系統之驗證戦成本。 ' 接-音^發明除了使用手動方式進行測試待測仙、第—接頭42斑第二 ❹第==態’更可使用自動化控制進行測試待測购〇、第:接頭 Z興弟一接頭44之線路狀態。 只 蝴她___。本發明之 =置更^置電餘祕、,庫62與—顯示裝置料,且電阻感 上測鋪取器16,測試平台3°更設置-針腳位址解 30了用於 以搭配電阻感測器1G、電阻_2()與測試平台 、里’、·制賴4G、第—接頭42與第二接頭44之狀態,J:中複數 =8=繼電器。電腦系統⑼係用以執行—測試程式,以依據待測電 ί值声^=42與第二铜44之規格彳_庫62選擇對應之—對照電 ,。貧料庫62係用以儲存測試程式、待測 4〇、第一接頭㈣第 一接碩44之規格、對照電阻值表、電阻量測值。 <弘月〇系、克60歸,則趣式控制複數開㈣%之切換導通與斷 =以量測待測魏4〇、第—接頭42與第二接頭44之線路狀態,其中電 岛系統60之測雜式產生一針腳位址f料至針腳位址解碼器%,以經由針 200813447 腳位址解碼36控制複數開關38。且電腦系統6G更經由電阻量測值操取哭 Μ從電阻感測器H)取得量測結果,以及經由顯示裝置料顯示電阻感· 10之量測結果。 一如第/、圖所7F,其係為本發明之另一較佳實施例之流程圖。本發明之測 试方法更採用自動化控制量測待測電纜4〇、第一接頭幻與第二接頭糾之 ^。魏按步驟_所示,啟動—電腦純,明始執行-測試程式於 測制_0、第—接頭42與第二接頭44之線路。按步驟s2i〇 ==電纜!"、.Γ接頭42與第二接頭44之規格選擇對應之—對照電 接哭及分別捕對應規格之電阻負載器2°與測試平台3。之第一連 溴4料二連接㈣。按步驟顯 、 接器24至待測電纘4〇夕笛i 又电丨1貝戟杰20之乐一連 22,複數電阻哭22八Mi 頭42 ’其中電阻負載器20設置複數電阻器 =禮』分別_第_連接器24之複數針腳。 之第式平台30之第二連接器32至待測電㈣ 3S 36 3S ; „ 阻感測器ω之第—探針12至電奸驟綱所示,耗接電 %之第二端,電 之弟一奴針Μ至測試平台3〇之開 36控_ 38之切換。按腳位^卿㈣至針腳位址解碼器 40、第-接頭42與第二接頭44之線路:’夏測-開關38對應之待測電纜 接續,按步驟S270所示斷二 右判斷為未完成線路量測,線路量測,則接續執行步驟咖, 探針12改叫接下—_接痛仃步驟⑽,且電阻感測器1〇 果存入資料廉6 、 、'、 46。按步驟S280所示,將Θ、al 抖庠62 ,以進行__ 所不I整之1測 見U弟—接頭42與第二接頭44 量測結 之 第—接頭&與第二接二量測下—開關料應待測電纜‘ 果存入資料庠62 ,以紐細^16。按步驟_所示,將完整之 12 200813447 狀悲,其係依據資料記錄與對昭 驟汹〇所示,透過蹲示_置64 —表之比較進行判斷線路狀態。按步 ^ 衣置64頌不待測電纜40、第一技涵μ 44之線路狀態判斷結果。 矣員42與第二接頭 其中,顯示裳置64顯示待測電纜 、 之、、泉路狀恶,右電阻减測哭1〇 接頭幻與第二接頭44量測出至少兩個相物覽4。、第一 顯示待測電纜4G、第—接頭㈣第_ =2,測值,則顯示裝置64 測器1〇無法細峨物、第接—4=為短路故障崎,若電阻感 佶曰丨日一 接頭42與第二接頭44量測屮雷阳旦:目丨| ’、頒不裝置64顯示待測電纜40、第一接頭42盥第 、 里“ 障狀態,若爷雷阳咸 、”弟一接碩44為斷路故 八% H w感J為10透過待測電纜40、第—接頭42 i f I# 44 ===不隨值之該複數電阻量聰,且該複數電頭一 直表,則顯示裝置64顯示待測_4()、第_ 液付口對 態。若顯示裝置64所顯示判斷結果為顯顺 ,曝觸_獻_辦之麵施。 -電_= —^係為—觀纜與接頭之測顺置及其方法,其係利用 用於旦二二:阻負載讀一測試平台,以對一待測電繞進行量測, 、里4制g纟威其接敵狀態,其巾電阻貞絲 阻m之弟一板針連接電阻負載器’以及第二探針分別連接測試平 口之禝數測試讀’以分別量測複數測試元件對應之複數針腳之狀態。另 齡本r月之測試裝置更設置—電腦系統、―資料庫、—顯示裝置、一針 P位址解碼器、與—電阻值擷取器,以自動量測待測電纜、第一接頭與第二 接頭之狀態,進而降低驗證測試之成本。 明沾=舰者,僅為本發明其中的較佳實施例而已,並非用來限定本發 、以㈣圍’亦即凡依本發明帽專利範圍所作的均等變化與修飾 為本發明專利範圍所涵蓋。 13 200813447 【圖式簡單說明】 第一圖係本發明之一較佳實施例之電路圖; 第二圖係本發明之一較佳實施例之電阻負載器之電路圖; 第三圖係本發明之一較佳實施例之測試平台之電路圖; 第四圖係本發明之一較佳實施例之流程圖; 第五圖係本發明之另一較佳實施例之電路圖;及 第六圖係本發明之另一較佳實施例之流程圖。 【主要元件符號說明】200813447 IX. Description of the Invention: [Technical Field] The present invention relates to a test apparatus and method thereof, and more particularly to a cable and joint test apparatus and method thereof, which are suitable for verifying various types of cables and their joints. Line status to quickly troubleshoot the cable and its connectors. [Prior Art] The architecture of the electronic control system is becoming more and more complicated as the functional requirements evolve. The internal control system has a huge increase in the number of townships, resulting in inconvenience in construction and maintenance, lengthy test and inspection time, and logistical maintenance difficulties. In particular, the large system can not be rotated arbitrarily, and the structure of each functional module is complicated, and the number of large-scale control (four) _ messy cable and its joints: b plus, and the wiring of each cable The space is different, resulting in the wiring of the control system = the complexity of the 'traditional Wei and its connection wiring and the number of follow-up methods. The way to verify the circuit is to use the state of _ multi-function meter or one ohm meter one by one, However, when Wei is a mosquito in the wall or the ground moves mm = slow ====== (four) (four) she loses, if the test can be completed, the telecom two testers interact with the walkie-talkie, the state of the square road depends on The number of floors in the building: the situation; the fixed consumption two = people complete the test domain financial secrets know Wei Weizhi _ «. So, therefore, how to make time for inspection. It is possible to quickly eliminate the electric current and its joints, and to increase the convenience and speed of the β-shaped path. Therefore, the present invention proposes that 2 ′ is a problem that the current engineering experts need to solve, simplifying the test, and then measuring the line state of the cable and its joints. 200813447 [Summary of the Invention] The main object of the present invention is to provide a device and method for the same, which is a resistor-reducing resistance-resistance negative resistance value for circuit verification to facilitate wiring. Dedicated, and quickly detect the cause of the loss, quickly eliminate the phenomenon of failure, reduce the cost of control system verification test. The invention has the following objectives: a provision for providing a type of electric splicing device and a method thereof, a system for arranging a nuclear test device, and an automatic control system for reducing the load on the operator and reducing the joint The cost of testing increases the efficiency of repairing the latter age. The invention is a test device and a method thereof for accurately measuring the line state of the electric gauge and the joint thereof, and quickly performing the troubleshooting task, wherein the test device comprises a resistance sensor, a resistive load Test platform, resistance loader - the first connector plug - the cable to be tested - the first connector, the test platform _ the second connector is inserted into the test to be tested one thousand ^ 妾 head to use the resistor The sensor measures the line to be tested, the first joint and the second joint. In addition, the test device of the present invention further includes a computer system, a resistance measurement value, a computer system, a test program, a tester, a specification of the connector, and a specification of the system. - A comparison of the resistance value table and the statistical information from the ::=r storage resistance measurement. For example, the purpose of the month, the * levy and advantages can be more obvious, with the closed type, for details [Embodiment] This ^ Ming ^ supply-type cable and joint test device and its method, its continuous detection (10). Yuan Chengwei and its inspections, in order to improve the appearance of the surface of the — 所 — — 概 概 概 概 概 概 概 概 概 概 概 ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ; ... Sense sensor 10, a resistance loader 2 〇, and a 2 200813447 p:: 〗: The two resistance sense 10 is an ohmmeter, or a multimeter meter ohmmeter, electric second probe ΗMeasurement—the circuit to be tested^ and the second probe 14' are transmitted through the first probe U and the measured value, or by the light-emitting diode; It); the value of the circuit component to be tested is displayed by the value The conduction is turned off. Resistive load crying 2 〇 曰 曰 曰 曰 曰 明 明 明 明 明 明 明 待 待 待 待 待 待 待 待 待 待 待 待 待 待 待 待 待 , , , 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 = The system is divided into the first connector "The complex η system consists of a resistor, 26. Among them, the complex resistor ~ and presents Rl < R2 < R3qR U resistance values are HR3 to or present 10. Million Euro Coffee)>R: = ^ The complex resistance value of the previous example is equal or not;: the decrement phenomenon. The resistance difference of the device is R.>0.// and the recording is increasing, two adjacent resistors For the μ command ·: π the resistance difference T is equal, then the expression is the system of the total 13 ° 佶 total & ± M !. As for the latter example of the plurality of resistors ^ Γ Γ Γ unequal resistance difference ARi is decreasing, that is, The second of the plurality of resistors = r^Ri < G. or the third case which is different from the previous two cases, the complex electric value is woven according to the miscellaneous records of the materials, and the absolute value of the shop is greater than the The error value of a plurality of resistors. The resistance of the time is recorded. The key condition of the test of the Wei and the joint test of the invention is that these complex electrical values are the same as 'and all complex' The absolute value of the resistance difference of the resistors is greater than the resistance error value (ε) of the resistor '22. That is, M >> ε. The test platform 30 is provided with a second connector 32 £ ==_One of the first joints (four) m platform 3〇 The second connection two: the first turn 44' its... joint 42 split __4 ° the plural line contains the complex line 40 of the marrow Wei 40, the complex line 46 One production oblique 1? Wm. When the cable 40 is to be tested, the wooden sensor 2 of the resistance sensor 10 will be used to reduce the power _ 1G H pin to close the number 7 200813447 shell J 元件 element 34 In order to pass through each line %, the resistance sensor 10 measures the resistance from each line of the resistor 22, and is in a one-way increment phenomenon, that is, Ri<r <r The measured resistance values measured by 46 are not similar, that is, 0 core 3 > to Rm_1 > Rm2. Or, or any combination of unidirectionally decreasing resistance difference values, and the plurality of resistances are equal or It is not equal to the error value of the resistor. The absolute value of the difference between the two is as large as the value indicated by the power, and the job is to be tested and the short circuit is not available. The resistance is ^, the state of the hanging road, that is, each line 46 is isolated from the measured value, and the level of the joint ° ° ° (1) has at least two of the same electricity only J clothing 7F has the same resistance with the power to be tested The control system of the 〇 4〇 has a great operation, such as a road fault state, and causes damage to the cable 10 that cannot pass through the cable to be tested. The resistance sensor measures the resistance of the resistor 22. Your quantity means that the Wei Qin No. - joint 42 _ road ^ method is to make the light-emitting diode indicator light up. , ', 罘 接 接 44 44 之 之 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 44 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明 发明The measurement results of the stock % 'coupling joint 42 and the second and second joints 44 are displayed on the first end of the plurality of resistors 22, the first joint 42 〇, the Γ 140, and the second resistor 44 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , In order to verify the test cable 40 to be tested, the electrical load is 20 and the test platform. 42 4 - pull s / / is used for the light reception cable 40 in the town of the joint 44 ° (four) look at the side called 8 200813447 connector 24 The second connector & test platform 3G supports the number of pins respectively = read connector 'for example: the first connector 24 is connected to the second connector (four) 32 according to the amount of needles divided into 25-25, 75, moving,. • A connector of the corresponding level is inserted into the corresponding number of pins. As shown in the second and third figures, respectively, it is exemplified how the first connector Μ and the buddy 32 can support the cable connector corresponding to the number of stitches. The figure is a diagram of a resistive loader of the preferred embodiment of the present invention. The resistor loader 20 of the handle is provided with a first connector 24 of various specifications, and each specification: the connector 24 respectively encodes the corresponding number of resistors η according to the number of pins, and the north end is connected to each electric A. 22nd: End. Electric (four) carrier 2G Wei according to the electronic microscope to be tested 40 42 ^ ? Two brothers 24 support specifications include - 15 pin first connector M2 - (four) foot brother connected 244 and a 40 pin first: % ^ " The pin and the base of the foot-joint 42 are 246 to support the circuit diagram of the test material of 15 pins and 25 hairs respectively. Weeping 32 is busy with the mouth... and the second connector 32 of the Sigma specification, the second connection of each type of specification (10) 2 is divided according to the number of stitches. According to the electric 缵 40 夕 - 拉 拉 π π μ 忒 忒 忒 忒 忒 忒 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 30 The 40-pin second connector 326 has a second connector 44 of 15 pins, 25 pins, and 40 pins. Don't support the tree - the new real customs. The electric 42 blood sputum, 1, and hundred prophetic steps of the present invention _ no, the specifications of the cable 40 to be tested, the first joint and the second joint 44 are determined according to the Wei Di ^ 贞 rubber _ ♦ 咖心And test = music - connection 5 32. For example, the second connector, the first connector, the fine pin, the first connection, the crying, and the 242, 25-pin connector 322, the 25-pin, the first, the fish... The second, the second, the 15-pin, the second brother--the connection (four) 40-pin The second connector 326. And step si〇〇9 200813447 further includes 0 steps, &, which selects a comparison resistance value table, and the head 42 and the second joint 44 are selected to correspond to the corresponding electric power LED 40, the first receiver ίο resistor Measurement value. The value table, for the control resistor is stuck, and the step is shown in step 1^8110, and the first connector 42 is inserted into the resistor crying 2, wherein the resistor is programmed to the first of the resistor 22 The terminal is connected to the connector-number detector 22, and the number is rotated, and the test platform 3〇 and + are inserted. Then, according to step S120 & test platform (4), the plurality of pins of the first connector 32 are set. According to the step (10), the =34 system is connected to the second end of the resistor U connected to the resistance loader 2, and then the second probe 14 of the step 12 The measured elements of the test platform 30 are not 'supplied with the sense of resistance measurement' - the voltage to be tested corresponding to the element 34 is only 4, and the first. Then, as shown in step S50, the path 46 is taken to obtain the line state of each line 46. And the line of the second joint 44 is determined according to the step 'step 16〇' to determine whether the line measurement of the master 44 to be tested is completed, and if it is determined that the line quantity measurement is completed, the connector 42 and the second connection are uncompleted lines. Test, then continue: walk step S17 ° 'If it is judged that 12 is changed to lightly connect the next test component %, the second probe 4 of the sensor 10 is the line 42 of the master 42 and the second connector 44. According to step 34, the measurement result of the electric power to be measured, and the storage resistance sensor 1〇, the non-storage measurement of the bean or the light-emitting diode indicator light is extinguished in the result: stealing the fruit ^ The line state of the resistor 42 and the second connector 44. Μ Μ Μ 待 待 待 待 Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ Μ 待 待 待 待 待 待 待 待 待 待 待 待 待 待 待 待 待 待 待 待 待 待 待Electric slow 40% == the line of the joint 44 ... to v two _ her amount _, touch "42 know two joint 44 measurement 44 for the road fault state; if the resistance ' ^, the brother - joint 42 and the second joint 44 42 See, call a joint 42 and the second connection 200813447 1〇^it^40^^42 The measured value is in accordance with - the pair; the value of the complex resistance measured by different values, and the complex resistance is normal. Wei 4〇, the first joint 42 and the second joint 44 are attached, and the first joint 42 and the second joint 44 are in failure, and the adhesive is worn earlier than the cable to be tested. The faulty circuit of the fault-tolerant cable 40, /, the brother of the first access 44, to indicate the above-mentioned household w 2 M to carry out the necessary maintenance measures. The large-scale control system ΐ the second _44 line state, especially the wheel (four) Μ , and the test of __ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The test is to be tested, the first joint, the second spot, the second spot, the == state, and the test can be used to test the 〇, the first: the joint Z Xingdi, a joint 44 of the line state. Only her ___. The invention has the advantages of setting the voltage and remaining secrets, the library 62 and the display device material, and the resistance sensing upper measuring device 16, the test platform 3° setting-pin address solution 30 for matching the resistance feeling The state of the detector 1G, the resistance _2 () and the test platform, the inside, the 4G, the first connector 42 and the second connector 44, J: the middle complex = 8 = relay. The computer system (9) is used to perform - The test program is based on the voltage of the test to be tested ^=42 and the specification of the second copper 44 彳 _ 62 62 corresponding to the - control electricity. The poor library 62 is used to store the test program, to be tested 4 〇, the first One connector (four) first connection master 44 specifications, control resistance value table, resistance measurement value. <Hongyue system, gram 60 return, then interesting control complex open (four)% of the switch on and off = by measurement Measuring the line state of the Wei 4〇, the first joint 42 and the second joint 44, wherein the measuring method of the electric island system 60 generates a pin address f material to the pin address solution %, to control the complex switch 38 via pin 200813447 pin address decoding 36. And the computer system 6G fetches the measurement result from the resistance sensor H) via the resistance measurement value, and displays the resistance through the display device The measurement result of the sense 10 is as follows. Figure 7F is a flow chart of another preferred embodiment of the present invention. The test method of the present invention uses an automatic control to measure the cable to be tested. The first joint phantom and the second joint are corrected. According to the step _, the start-computer pure, start-execution-test program is used to measure the line of the _0, the first joint 42 and the second joint 44. According to the steps s2i 〇 == cable! ", Γ joint 42 and the second joint 44 are selected correspondingly - the control is connected to cry and separately capture the corresponding specification of the resistance load 2 ° and the test platform 3. The first bromine 4 material is connected to the second (four). According to the steps of the display, the connector 24 to the test 缵 4 〇 笛 i i and the electric 丨 1 戟 戟 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 20 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 22 』Multiple pins of ___ connector 24 respectively. The second connector 32 of the first platform 30 to the electricity to be tested (4) 3S 36 3S; „ the first of the resistance detector ω—the probe 12 to the electric rape principle, the second end of the power consumption, the electricity The brother of a slave to the test platform 3 〇 open 36 control _ 38 switch. Press the foot ^ Qing (four) to the pin address decoder 40, the first connector 42 and the second connector 44 line: 'summer test - The switch 38 corresponding to the cable to be tested is connected, and according to step S270, the second line is judged as the unfinished line measurement, and the line measurement is performed, then the step coffee is executed, and the probe 12 is changed to the next step - the pain step (10). And the resistance sensor 1 is stored in the data 6, , ', 46. As shown in step S280, Θ, al 庠 62, to perform __ not a whole 1 test see U brother - connector 42 The first connector 44 and the second connector 44 measure the junction - the second and the second measurement - the switch material should be tested cable 'is stored in the data 庠 62, to the button ^ 16. According to step _, will The complete 12 200813447 sorrow, based on the data record and the display of the show, the comparison of the _ set 64 - table to determine the state of the line. Step by step clothing set 64 颂 untested cable 40 The first state culvert μ 44 line state judgment result. The employee 42 and the second joint, wherein the display skirt 64 displays the cable to be tested, and the spring road-like evil, the right resistance minus the test crying 1 joint joint magic and the second The connector 44 measures at least two phase objects 4. The first display cable 4G to be tested, the first connector (four) _ = 2, the measured value, the display device 64 can not be fine, the first connection - 4=For the short-circuit fault, if the resistance is sensed, the joint 42 and the second joint 44 are measured. Lei Yangdan: witness | ', the device 64 indicates the cable to be tested 40, the first connector 42 In the "barrier state, if the Lord Leiyang salty," the younger one received the 44 for the disconnection, so the eight percent H w sense J is 10 through the cable to be tested 40, the first joint 42 if I# 44 === not worthy The plurality of electric resistances are constant, and the plurality of electric heads are always displayed, and the display device 64 displays the _4 () and the _ liquid dispensing interfaces to be tested. If the display result displayed by the display device 64 is succinct, the exposure _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ Circumference measurement, 里 4 纟 纟 其 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接 接Measure the state of the plurality of pins corresponding to the plurality of test components separately. The test device of the other ages is set up - computer system, "database", - display device, one pin P address decoder, and - resistance value extractor In order to automatically measure the state of the cable to be tested, the first joint and the second joint, thereby reducing the cost of the verification test. The vehicle is only the preferred embodiment of the present invention, and is not intended to limit the present invention. The equivalent changes and modifications made by (4) Wai, that is, the patent scope of the present invention are covered by the scope of the invention. BRIEF DESCRIPTION OF THE DRAWINGS FIG. 1 is a circuit diagram of a preferred embodiment of the present invention; FIG. 2 is a circuit diagram of a resistive loader according to a preferred embodiment of the present invention; The circuit diagram of a preferred embodiment of the present invention; the fourth embodiment is a flowchart of a preferred embodiment of the present invention; the fifth diagram is a circuit diagram of another preferred embodiment of the present invention; and the sixth diagram is a circuit diagram of the present invention. A flow chart of another preferred embodiment. [Main component symbol description]

10 電阻感測器 12 第一探針 14 第二探針 16 電阻量測值擷取器 20 電阻負載器 22 電阻器 24 第一連接器 26 共同針腳 30 測試平台 32 第二連接器 34 測試元件 36 針腳位址解碼器 38 開關 40 待測電纜 42 第一接頭 44 弟-一接頭 46 線路 50 電腦糸統 14 200813447 52 資料庫 54 顯示裝置 60 電腦糸統 62 資料庫 64 顯示裝置10 Resistance Sensor 12 First Probe 14 Second Probe 16 Resistance Measurement Picker 20 Resistance Loader 22 Resistor 24 First Connector 26 Common Pin 30 Test Platform 32 Second Connector 34 Test Element 36 Pin Address Decoder 38 Switch 40 Cable to be tested 42 First connector 44 Brother-one connector 46 Line 50 Computer system 14 200813447 52 Library 54 Display device 60 Computer system 62 Library 64 Display device

Claims (1)

200813447 十、申請專利範圍: 1. 一種電纜與接頭之測試裝置,其包括: 一^負賴,其係設置複數電阻器與—第—連接器,該複數電_ ==難接鮮-連接器之複數針腳,該第 二 待測電纜之一第一接頭; 又 一 彳她Γ—帛:咖肖她,麵測試元 (_be)與—第:探針,該第 列=雛=電阻負載器之該電阻器之第二端,該第二探針純該 接頭^件,以量測該待測電纔、該第—接頭與該第二 我'頌之一線路。 2二ΓΓ:=1項所述之電_頭之測試裝置,其中該電阻感測 ::…满錶或—多功能電錶之電阻錶或—發光二極體(LED)指示 3· =ΐ!=圍/ L項所述之電緵與接頭之測試裝置,其中該電阻負載 端,該第-探_接該制針腳_賴數電阻器之第一 4.===項所述之電购之測試裝置,其中該複數電阻 5+ ==::=之電_*頭之測試裝置,中該複數電阻 6.二=範電;與接頭之測試裝置’其中該複數電阻 相鄰兩兩/、:/ #之包阻差值’呈現單向遞增之狀態,且該 7 士㈣1Γ ϋ之電阻差值之絕對值大於該電阻11之誤差值者。 σ月利範圍第5項所述之電豐盥接頭 值均不相同,俜依相笨Μ裝置,其中該複數電阻 係依相寺或不專之電阻差值,呈現單向遞減之狀態,且該 16 200813447 相:兩電阻器之電阻差值之絕對值大於該電阻器之誤差值 •:二請專概,5賴述之電额_之職裝置,其巾該複 複數SI哭相等或阻差值之任意組合排列狀態’且該 9·如申請專利範圍第i項所述之電镜與接頭之測 ^雖者。 元件係為測試端子或測試孔。帛^以衣置,其中該複數測試 1〇.=請專利範„丨項所述之魏與接頭之測試裝置,其中 =右透過該待測、該第—接頭與該第二接頭量測出至少兩個相= U 、鶴—接頭與該第二接頭為短路故障狀能。 •二專^範圍第i項所述之電賴接頭之測試裝置,其中該電_測 。。右热法透過該待測電纜、該第一接頭與該 ^ 值申則該__、該第-接顯郷二接頭觸路故阻量測 ^申請專利範圍第丨項所述之電_接頭之測試裝置,其h =透過該待測電镜、該第一接頭與該第二接頭分別量測出不只同數值^ 该複數電阻量離,且該複數電阻量測值符合—對BS ° 測魏、該第-接頭與該第二接頭為正常狀態。,、、、^值表,則該待 —種電纜與接頭之測試方法,其包含: 插設—電阻負«之-第-連接器至-待測_之_第—接頭,該電 t負細設置複數電阻器,該複數電阻器之第_端分難接 連接器之複數針腳; 插設一測試平台之一第二連接器至該待測電一 、兄、弟—接頭,該、、p丨IΉ、 平台設置複制試元件’職數職元件分顺 接 、 數針腳耦接; 一史倩时之稷 李馬接一電阻感測器之一第一探針至該電阻倉恭叩 端; 貝甄夯之該電阻器之第二 絲該電阻感測器之-第二探針至該測試平台之該剛試元件 分別量測該測試元件對應該待測電纜、該第—接頭與节第_接頭之 17 200813447 線路。 14·如申請專利範圍第13項所述之電_接頭 該測試元件對應該待測電镜、該第一接頭與妨接=其中於分別量測 中,若量測出兩個以上相同電阻量測值,則判斷路时驟 碩與該第二接頭為短路故障狀態。 、弟-接 15·如申w專利關第13項所述之電賴接頭之 該測試元件對辆制、該第—接 ^ =於2量測200813447 X. Patent application scope: 1. A test device for cables and connectors, comprising: a negative resistor, which is provided with a plurality of resistors and a first connector, the plurality of electrical _ == difficult to connect fresh - connector a plurality of stitches, one of the first connectors of the second cable to be tested; another one of her Γ-帛: 咖肖, her face test element (_be) and - the first: probe, the first column = chick = resistance loader The second end of the resistor, the second probe is purely connected to measure the power to be tested, the first connector and the second one. 2 ΓΓ: The test device of the electric _ head described in item 1, wherein the resistance sensing:: ... full meter or - multi-function meter ohmmeter or - illuminating diode (LED) indication 3 · = ΐ! = test device for the electric cymbal and the joint described in the item L, wherein the resistance load end, the first _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The test device, wherein the multi-resistance 5+ ==::= electric_* head test device, the multi-resistance 6.2=fan electric; and the joint test device 'where the complex resistance is adjacent to two/two/ , : / #包包差差' presents a one-way incremental state, and the absolute value of the resistance difference of the 7th (four) 1Γ 大于 is greater than the error value of the resistor 11. The value of the electric Fengfeng joints mentioned in item 5 of the sigma lunar range is different, and the 电阻 相 Μ , , , , , , , , , , , , , , , 复 复 复 复 复 复 复 复 复 复 复 复 复 复 复 复 复 复The 16 200813447 phase: the absolute value of the resistance difference between the two resistors is greater than the error value of the resistor. •: Please specify the power of the _ _ _ _ _ _ _ _ equipment, the towel of the complex number SI cry equal or resistance Any combination of the differences is in a state of 'the same as the measurement of the electron microscope and the joint described in the item i of the patent application. The component is a test terminal or test hole.帛^在衣置, wherein the plural test 1〇.=Please refer to the test device of the Wei and the joint described in the patent, wherein = right through the test, the first joint and the second joint are measured At least two phases = U, crane-joint and the second joint are short-circuit fault-like energy. 2. The test device of the electric-connected joint described in item i, wherein the electric-test is performed. The test cable for the cable to be tested, the first connector and the value of the __, the first connector, the second connector, and the test device, The h = through the electronic mirror to be tested, the first joint and the second joint respectively measure not only the same value ^ the complex resistance is measured, and the complex resistance measurement value is consistent - the BS ° measurement Wei, the first - The connector and the second connector are in a normal state.,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,,, _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ A second connector of a test platform is inserted to the power to be tested, the brother, the brother-joint, the p, I, the platform set copy test component, the job component is divided, the pin coupler Connected; a Shiqian 稷 Li Ma connected to a first sensor of a resistance sensor to the resistance warehouse Christine; Beckham's second wire of the resistor of the resistance sensor - the second probe The test component of the test platform is respectively measured for the test component corresponding to the cable to be tested, the first connector and the section _ connector 17 200813447 line. 14 · The power as described in claim 13 The test component corresponds to the electron microscope to be tested, the first joint and the splicing=in the respective measurement, if two or more identical resistance measurements are measured, the road timing and the second joint are judged. The short-circuit fault state. The younger-connected 15· The test component of the electric splicing joint described in the 13th patent of the patent application is the system, and the first connection is measured by 2 則判斷該待測覽、該第一接頭與該第二接頭之:阻莖測值, 16·如申往袁刹r网一 安貝之線路為斷路故障狀態。 負載哭之-ΓΙ 述之魏與接頭之峨方法,其中插設一電阻 員載时之一乐一連接器至一待測電纜之一第一接頭之I 該待測魏、該第—接頭以及該第二接:規格匕二 擇對應之一對照電阻值表。 17·=申請專利範圍第16項所述之電纜與接頭之測試方法,其中若該待測電 to值表,則判斷該待測電纜、該第—接頭與該第二接頭為正常。 18·—種電纜與接頭之測試裝置,其包括: 一電,負载器,其係設置複數電阻器與一第一連接器,該複數電阻器 之第*而分別耦接該第一連接器之複數針腳,該第一連接哭插設一 待測電纜之一第一接頭; W 測Λ平口,其係設置一第二連接器與複數開關,該複數開關之第一 端分別與該第二連接器之複數針腳耦接,該第二連接器插設於該待 測電纜之一第二接頭; 一電阻感測器,其係設置一第一探針(probe)與一第二探針,該第 一探針輕接該電阻負載器之該電阻器之第二端,該第二探針耦接該 測試平台之該複數開關之第二端;及 一电腦系統’控制該複數開關之切換,以量測該待測電纜、該第一接 18 200813447 頭與該第二接頭之一線路。 19. 如申請專利範圍第18項所述之電境與接頭之測試 更設置-針腳位址解碼器,其係分㈣接該複朗=該測試平台 系統,該電腦系统產生一針腳位址編石馬資料至該針卿乂⑽馬接該電腦 制該複數開關之切換。 止解碼器,以控 20. 如申請專利範圍第19項所述之電鐵與接頭之測試 更設置-資料庫,其雜存該測試程式,以及該待測雜中^腦系統 與該第二接頭之規格,並記錄該複數電阻之電 二接= 相關統計資訊。 星寺相關貧料及其 21·如申請專利範圍第18項所述 更可為繼電器。、 、'見、接頭之測試震置,其中該複數開關 22.如申請專利範圍第18項 更設置-電阻值摘取^賴取!機裝置,其中該電腦系統 範圍第18。項所感測器之電阻量測值。 器係為一歐姆錶或—多功”聲^、5、之測°式4置,其中该電阻感測 燈。 飞彳功月㈣錶之電阻錶或一發光二極體(LED)指示 綱之電_接頭之$槪置,其中該電阻負載 端,今第_广:同針腳’ 1亥共同針輸接該複數電阻器之第二 °亥弟一板針係耦接該共同針腳。 25·如申請專利範圍第18 器之電阻料不_。 μ雛奴戦«,其中該複數電阻 26·如申請專利範圍第% 值係遞增。 ^之电、·見與接碩之測試裝置,其中該複數電阻 27·如申請專利範圍第26 值係依-固定值遞增,該固定值置值其中該複數電阻 28如申嗜直士丨々々㈤斤 Λ引且為之决差值0 戈甲。巧專利乾圍第18項所述 器若透過該待測電纔、該第一 試裝置,其令該電阻感測 w、μ乐一接頭量測出至少兩個相同之 200813447 電阻量測值,職_魏、轉—接神 29.如申請細邮18項所述之電纟嶋頭之晴3置ΓΓ障狀態。 為右無法透過該待測錄、該第_接頭與該第 旦、=電阻感測 值,則該待測電缓、該第 、里測出電阻量測 3〇·如申請專利範圍第18項所' Λ —碩為斷路故障狀態。 器若透職制料該電阻感測 測魏、該第-接頭與該第二接頭為正常_。 值表,則該待 Ή·一種電纜與接頭之測試方法,其包含: 啟動一電腦系統; 、插設-電阻負載器之一第一連接器至—待 阻負載器設置複《阻器,該複第卜接頭,該電 連接器之複數針腳; ^分別耦接該第一 插m則试平台之-第二連接器至該待測電缓之 平台設置複數開關,該複數開關之楚&、 罘一接頭,該測試 數針腳· ; 而分別與該第二連接器之複 包阻負餘之該複數電阻器之 _ 耦接一電阻感測器之一第一探針至該 一第二端; 耦接該電阻感測器之-第二探針 二端,該電腦,_制該複_^^;之該__之一第 分別量測每-對__魏、 路。 文為弟二接頭之一線 32·如申請專利範圍第31項所述之電纜| 職統之步驟,更包含,,她於啟動一電 遠第二接頭之規格,且選擇對庫 、、弘i 4第-接頭以及 33如由μ , 伴鳩之對照電阻值表。 33·如申凊專利範圍第32項所述之電規與 每-開關對應該待測電緵、該第一接頭輕二'去’其中於分別量測 ww弟一接頭之—線路之步驟, 20 200813447 若該待測電纜之複數電阻量測值分別為不同數值,且該複數電阻量測值 符合該對照電阻值表,則判斷該待測電纜、該第一接頭與該第二接頭為 ..正常狀態。 34·如申請專利範圍第31項所述之電纜與接頭之測試方法,其中於分別量測 每一開關對應該待測電纜、該第一接頭與該第二接頭之一線路之步驟, 更包含一步驟,其係擷取該電阻感測器之量測結果。 35.如申請專利範圍第31項所述之電纜與接頭之測試方法,其中於分別量測 每一開關對應該待測電纜、該第一接頭與該第二接頭之一線路之步驟 後,更包含一步驟,其係儲存一量測結果至一資料庫。Then determining the to-be-viewed, the first joint and the second joint: the stem stem measurement value, 16·If the line to the Yuansha r network and the Amber line is an open circuit fault state. Load crying - 峨 之 魏 魏 与 与 与 与 与 与 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏 魏The second connection: the specification 匕2 corresponds to one of the control resistance value tables. 17·=The test method for the cable and the joint described in claim 16 wherein, if the power to value table is to be tested, it is determined that the cable to be tested, the first connector and the second connector are normal. 18. The test device for a cable and a connector, comprising: an electric, loader, which is provided with a plurality of resistors and a first connector, wherein the plurality of resistors are coupled to the first connector respectively a plurality of pins, the first connection is crying and inserting a first connector of a cable to be tested; W measuring a flat port, which is provided with a second connector and a plurality of switches, and the first end of the plurality of switches is respectively connected to the second connection The plurality of pins are coupled to the second connector of the cable to be tested; the resistor is provided with a first probe and a second probe. The first probe is lightly connected to the second end of the resistor of the resistive loader, the second probe is coupled to the second end of the plurality of switches of the test platform; and a computer system controls the switching of the plurality of switches, Measuring the cable to be tested, the first connection 18 200813447 head and one of the second connectors. 19. If the test of the environment and the joint described in the application for the scope of the patent is in the 18th, the pin address decoder is set up (4) to the test platform system, and the computer system generates a pin address. Shima data to the needle Qing 乂 (10) horse connected to the computer to switch the complex switch. The decoder is controlled to 20. The test of the electric iron and the joint as described in claim 19 of the patent scope is further set-database, and the test program is mixed, and the brain system and the second are to be tested. The specification of the connector, and record the electrical connection of the complex resistor = relevant statistical information. Xingsi related poor materials and 21· can be relays as described in item 18 of the patent application scope. , , 'See, joint test shock, which is the complex switch 22. If you apply for the scope of the 18th item, the setting - the resistance value is taken, the machine is installed, and the computer system is the 18th. The measured value of the resistance of the sensor. The device is an ohm meter or - multi-function sound ^, 5, the measured type 4, wherein the resistance sensing lamp. The flying gong (4) table of the resistance meter or a light-emitting diode (LED) indicator The _ connector of the 槪 , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , , · If the resistance material of the 18th device is not _. μ chick slave «, the complex resistor 26 · as the patent application range is increased by the % value. ^ The power, see and connect the test device, The complex resistor 27· is incremented according to the value of the 26th value of the patent application range, and the fixed value is set, wherein the complex resistor 28 is like a singularity of the singularity of the singularity of the singularity. If the device described in Item 18 of the patented dry circumference passes through the power to be tested, the first test device causes the resistance sensing w and the μ-one connector to measure at least two identical 200813447 resistance measurements. , _ _ Wei, turn - pick up the gods 29. If you apply for the fine mail, the electric hoe head of the 18th is the state of the barrier. The method passes through the to-be-recorded, the _th joint and the first denier, and the resistance sensed value, and the electric resistance to be tested, the first and the second measured resistance measurement are 3〇, as in the 18th item of the patent application scope. Λ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ _ The utility model comprises: starting a computer system; inserting one of the first connectors of the resistance loader to the load device to be refracted to set a "resistor, the complex connector, the plurality of pins of the electrical connector; ^ respectively coupled The first plug-in test platform-the second connector is connected to the platform to be tested to set a plurality of switches, the plurality of switches are Chu &, a joint, the test number of pins; and respectively the second The plurality of resistors of the plurality of resistors are coupled to the first probe of the one of the resistance sensors to the second end; coupled to the second probe of the resistance sensor , the computer, _ the system _ ^ ^; the __ one of the first measurement each - pair __ Wei, Lu. One of the two joints of the second joint 32. The cable according to the scope of claim 31 of the patent application, the steps of the occupation, and more, she started the specification of a second joint of the electric remote, and selected the library, the Hong i 4 - Connector and 33 such as μ, with reference to the resistance value table. 33. As stated in the 32nd paragraph of the patent scope of the application, the switch should be tested with the switch, and the first connector is lighter. 'In the step of separately measuring the ww-one-connector--the line, 20 200813447 If the complex resistance measurement values of the cable to be tested are different values, and the complex resistance measurement value meets the comparison resistance value table, then judge The cable to be tested, the first connector and the second connector are in a normal state. 34. The method of testing a cable and a joint according to claim 31, wherein the step of measuring each of the switches corresponding to the cable to be tested, the first joint and the second joint is further included In one step, the system takes the measurement result of the resistance sensor. 35. The test method for a cable and a joint according to claim 31, wherein after measuring each of the switches corresponding to the cable to be tested, the first joint and the second joint, A step is included that stores a measurement result to a database. 36·如申請專利範圍第31項所述之電纜與接頭之測試方法,其中於分別量測 每一開關對應該待測電纜、該第一接頭與該第二接頭之一線路之步驟, 若量測出兩個以上相同電阻量測值,則判斷該待測電纜、該第一接頭與 該第二接頭為短路故障狀態。 37.如申請專利範圍第31項所述之電纜與接頭之測試方法,其中於分別量測 每一開關對應該待測電纜、該第一接頭與該第二接頭之一線路之步驟, 若該電阻感測器無法透過該待測電纜之該線路量測出電阻量測值,則判 斷該待測電纜、該第一接頭與該第二接頭之該線路為斷路故障狀態。36. The method of testing a cable and a joint according to claim 31, wherein measuring each of the switches to correspond to a cable to be tested, a line of the first connector and the second connector, If two or more identical resistance measurements are detected, it is determined that the cable to be tested, the first connector and the second connector are in a short-circuit fault state. 37. The method for testing a cable and a connector according to claim 31, wherein the step of measuring each of the switches corresponding to the cable to be tested, the first connector and the second connector, respectively, if The resistance sensor cannot measure the resistance measurement value through the line quantity of the cable to be tested, and determines that the line of the cable to be tested, the first connector and the second connector is in an open circuit fault state.
TW95132777A 2006-09-05 2006-09-05 Apparatus and operational method of cable connector tester TWI307775B (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113740611A (en) * 2021-07-30 2021-12-03 深圳供电局有限公司 System and method for measuring contact resistance of elbow-shaped structure of cable terminal of distribution switch cabinet
CN113900043A (en) * 2021-10-09 2022-01-07 北京卫星环境工程研究所 Testing equipment for measuring system conduction and loop corresponding relation for spacecraft thermal test

Cited By (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113740611A (en) * 2021-07-30 2021-12-03 深圳供电局有限公司 System and method for measuring contact resistance of elbow-shaped structure of cable terminal of distribution switch cabinet
CN113900043A (en) * 2021-10-09 2022-01-07 北京卫星环境工程研究所 Testing equipment for measuring system conduction and loop corresponding relation for spacecraft thermal test
CN113900043B (en) * 2021-10-09 2024-05-28 北京卫星环境工程研究所 Measurement system conduction and loop corresponding relation test equipment for spacecraft thermal test

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