CN113900043A - Testing equipment for measuring system conduction and loop corresponding relation for spacecraft thermal test - Google Patents
Testing equipment for measuring system conduction and loop corresponding relation for spacecraft thermal test Download PDFInfo
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- CN113900043A CN113900043A CN202111176198.5A CN202111176198A CN113900043A CN 113900043 A CN113900043 A CN 113900043A CN 202111176198 A CN202111176198 A CN 202111176198A CN 113900043 A CN113900043 A CN 113900043A
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- circuit board
- conduction
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- barrel
- thermal test
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- 238000012360 testing method Methods 0.000 title claims abstract description 62
- 238000005259 measurement Methods 0.000 claims abstract description 11
- 238000000034 method Methods 0.000 abstract description 6
- 238000002360 preparation method Methods 0.000 abstract description 5
- 238000010586 diagram Methods 0.000 description 3
- 239000004698 Polyethylene Substances 0.000 description 2
- 238000013461 design Methods 0.000 description 2
- 238000001514 detection method Methods 0.000 description 2
- 230000005284 excitation Effects 0.000 description 2
- 238000002474 experimental method Methods 0.000 description 2
- 229910000838 Al alloy Inorganic materials 0.000 description 1
- 239000000956 alloy Substances 0.000 description 1
- 230000009286 beneficial effect Effects 0.000 description 1
- 230000000694 effects Effects 0.000 description 1
- 238000003780 insertion Methods 0.000 description 1
- 230000037431 insertion Effects 0.000 description 1
- 238000007689 inspection Methods 0.000 description 1
- 238000009434 installation Methods 0.000 description 1
- 238000012986 modification Methods 0.000 description 1
- 230000004048 modification Effects 0.000 description 1
- 238000004806 packaging method and process Methods 0.000 description 1
- -1 polyethylene Polymers 0.000 description 1
- 229920000573 polyethylene Polymers 0.000 description 1
- 230000002265 prevention Effects 0.000 description 1
- 238000000926 separation method Methods 0.000 description 1
- 230000008054 signal transmission Effects 0.000 description 1
- 238000010998 test method Methods 0.000 description 1
- 239000010409 thin film Substances 0.000 description 1
- 238000012795 verification Methods 0.000 description 1
- 238000003466 welding Methods 0.000 description 1
Images
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/54—Testing for continuity
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/58—Testing of lines, cables or conductors
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/67—Testing the correctness of wire connections in electric apparatus or circuits
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/50—Testing of electric apparatus, lines, cables or components for short-circuits, continuity, leakage current or incorrect line connections
- G01R31/66—Testing of connections, e.g. of plugs or non-disconnectable joints
- G01R31/68—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board
- G01R31/69—Testing of releasable connections, e.g. of terminals mounted on a printed circuit board of terminals at the end of a cable or a wire harness; of plugs; of sockets, e.g. wall sockets or power sockets in appliances
Abstract
The invention discloses a device for testing the conduction and loop correspondence of a measurement system for a spacecraft thermal test, which comprises a cylinder, wherein one end of the cylinder is provided with a Y2-50 plug, the end of the cylinder, which is far away from the Y2-50 plug, is provided with a bottom cover, a step load circuit board is arranged inside the cylinder, a circuit board support frame matched with the step load circuit board is arranged inside the cylinder, a plurality of step load resistors are attached to the step load circuit board, and the step load resistors are connected in series. The invention aims to realize rapid testing of the corresponding relation between conduction and a loop of a measuring cable, a measuring branch box and a measuring data acquisition board card, namely a measuring system, in the preparation process of a spacecraft thermal test, and combines the conduction and the corresponding relation of the measuring system in the testing process by introducing a step load resistor into the conventional short-circuit Y2-50 plug, so that two tasks can be completed by one-time testing, and the working efficiency of the test is improved.
Description
Technical Field
The invention relates to the technical field of spacecraft ground test and experiment, in particular to a device for testing the corresponding relation between conduction and a loop of a measurement system for a spacecraft thermal experiment.
Background
The spacecraft vacuum thermal test measuring system is a core system of a spacecraft vacuum thermal test, the electrical connection and the signal transmission of the measuring system are completed through cables and electrical connectors and comprises measuring cables, a measuring branch box and a data acquisition board card, the conduction test of the measuring system is the first test in the preparation process of the vacuum thermal test, the measuring cables are short-circuited by a Y2-50 plug with all short-circuited loops, the conduction performance of the measuring system is judged whether to be intact or not by the excitation given by a digital acquisition instrument, the resistance of the cables is read back to judge whether the corresponding relation among the cables is correct or not, the measuring loops are used as the minimum basic unit of the whole measurement and control system, the correctness of the corresponding relation of each loop is a prerequisite condition for ensuring the truth and the reliability of the vacuum thermal test data, if the test of the corresponding relation of a measurement and control channel can be added in the conduction test process of the measuring system, the test preparation work efficiency can be improved, the test reliability is improved, and the test is ensured to be carried out smoothly.
At present, a conduction test operator uses Y2-50 plugs with all loop short circuits to short circuit a cable, and utilizes a measurement program to judge whether the conduction performance of a measurement system is intact or not by means of excitation given by data acquisition instrument equipment and reading back the resistance of the cable, the test method has the advantages of simple operation, clear and effective data, no error detection, and definite positioning of loop conduction, but the conduction test can only explain the loop conduction condition and can not explain the correct loop correspondence, the current loop correspondence test can only utilize a universal meter to carry out successive inspection on the cable core, the cable and a branch box are relatively heavy, the hole sites on the Y2-50 plug are relatively compact, inconvenience is brought to operation, the work is very hard, operation errors are easily brought, and the insertion of a contact pin of the universal meter is inserted wrongly, therefore, misdetection is generated, once misdetection occurs in detection of a certain channel, an operator cannot position the certain channel quickly, the whole Y2-50 plug is often required to be tested again, and if the corresponding relation of the measurement channel is checked in the process of conducting test of the measurement system, the working efficiency can be improved, meanwhile, the reliability of the test is improved, and the smooth running of the test is ensured.
Disclosure of Invention
The invention aims to: in order to solve the problems, the invention provides a testing device for the correspondence between conduction and loop of a measuring system for a spacecraft thermal test.
In order to achieve the purpose, the invention adopts the following technical scheme:
the device for testing the conduction and loop correspondence of the measuring system for the spacecraft thermal test comprises a barrel, wherein a Y2-50 plug is arranged at one end of the barrel, a bottom cover is arranged at one end, away from the Y2-50 plug, of the barrel, a step load circuit board is arranged inside the barrel, and a circuit board support frame matched with the step load circuit board is arranged inside the barrel.
Preferably, a plurality of step load resistors are attached to the step load circuit board, and 47 step load resistors are arranged in series.
Preferably, a plurality of threaded holes which are uniformly distributed are formed in the ladder load circuit board and the circuit board support frame, and the ladder load circuit board is detachably connected with the circuit board support frame through bolts.
Preferably, the circuit board support frame is provided with two through holes which are symmetrically distributed, and the circuit board support frame is detachably connected with the bottom cover through the through holes by bolts.
Preferably, the inside of the barrel is provided with an internal thread matched with a bottom cover, and the bottom cover is in threaded connection with the barrel.
In summary, due to the adoption of the technical scheme, the invention has the beneficial effects that:
the purpose of the application is to realize the conduction of a measuring cable, a measuring branch box and a measuring data acquisition board card, namely a measuring system, and the rapid test of the corresponding relation of a loop in the preparation process of a spacecraft thermal test, and realize the combination of the conduction and the corresponding relation of the measuring system in the test process by introducing a step load resistor into the conventional short-circuit Y2-50 plug, thereby realizing the completion of two tasks by one-time test and improving the test working efficiency.
Drawings
Fig. 1 shows a schematic structural diagram of a testing apparatus for measuring system conduction and loop correspondence for a spacecraft thermal test according to an embodiment of the present invention;
FIG. 2 is a schematic diagram illustrating a ladder load circuit layout according to an embodiment of the present invention;
fig. 3 is a schematic diagram illustrating a testing structure of correspondence between conduction and loop of a vacuum thermal test measurement system according to an embodiment of the present invention.
Illustration of the drawings: 1. a barrel; 2. y2-50 plug; 3. a bottom cover; 4. a step load circuit board; 5. a circuit board support frame; 6. a step load resistance; 7. and a through hole.
Detailed Description
The technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the drawings in the embodiments of the present invention, and it is obvious that the described embodiments are only a part of the embodiments of the present invention, and not all of the embodiments. All other embodiments, which can be derived by a person skilled in the art from the embodiments given herein without making any creative effort, shall fall within the protection scope of the present invention.
Referring to fig. 1-3, the present invention provides a technical solution:
a spacecraft is a measuring system for heat test to switch on and return circuit corresponding relation test equipment, including the barrel 1, the barrel 1 adopts hardened aluminum alloy material, the surface is wrapped by PE polyethylene heat shrinkable sleeve, so as to achieve the effects of skid resistance, collision prevention and wear resistance, one end of the barrel 1 is provided with Y2-50 plugs 2, 50 leads are led out from the ladder load circuit board 4 and are welded on the Y2-50 plugs 2, in order to reduce the ladder load volume, the design does not adopt an electric connector to connect the ladder load circuit board 4 with the leads, but directly welds the leads on the bonding pad of the ladder load circuit board 4, in order to ensure that the leads cannot be welded and detached due to stress, a row of through holes are additionally arranged beside the bonding pad, the leads are penetrated for welding, so as to avoid the vertical stress directly acting on the bonding pad, the Y2-50 plugs 2 are matched with the thread size of the ladder load shell head, the Y2-50 plug 2 is circularly turned and then is nested into the barrel 1 by utilizing a connecting tail cover thread, a bottom cover 3 is arranged at one end of the barrel 1 far away from the Y2-50 plug 2, a step load circuit board 4 is arranged inside the barrel 1, and a circuit board support frame 5 matched with the step load circuit board 4 is arranged inside the barrel 1.
Specifically, as shown in fig. 1 and 2, a plurality of ladder load resistors 6 are attached to the ladder load circuit board 4, 47 ladder load resistors 6 are arranged in series, the resistance value of each ladder load resistor 6 is 5 ohms, an AR12ATS0050N type thin film chip resistor is adopted, the resistor has the characteristics of high precision and good stability, the appearance is 2512 type packaging, electric installation is facilitated, and the size of the ladder load circuit board 4 is 80mm 33 mm.
Specifically, as shown in fig. 1 and 2, all be provided with a plurality of evenly distributed's screw hole on ladder load circuit board 4 and the circuit board support frame 5, can dismantle through the bolt and be connected between ladder load circuit board 4 and the circuit board support frame 5, be convenient for ladder load circuit board 4 and circuit board support frame 5's separation, for improving the components and parts integrated level, reduce ladder load circuit board 4 volume, ladder load circuit board 4 adopts double-deck board, positive and negative both sides all have ladder load resistance 6, positive and negative both sides circuit is connected through welded wire's pad.
Specifically, as shown in fig. 1, two through holes 7 are symmetrically arranged on the circuit board support frame 5, and the circuit board support frame 5 is detachably connected with the bottom cover 3 through the through holes 7 by bolts, so that the circuit board support frame 5 and the bottom cover 3 can be separated conveniently.
Specifically, as shown in fig. 1, the inside of barrel 1 is provided with the internal thread with 3 complex of bottom, bottom 3 and 1 threaded connection of barrel, and bottom 3 adopts interior mouthful of screw assembly equally and advances in barrel 1 for barrel 1 is cylindrical, is convenient for hold the power of exerting oneself, and difficult adversary leads to the fact to collide with, and the retractable hanging wire frock of bottom 3 fluting preparation is used for the wire of restricting simultaneously.
In summary, according to the testing device for the relationship between the cable conduction and the loop of the measuring system for the spacecraft thermal test provided by the embodiment, the device is easier to plug and unplug on the cable when used with the existing short-circuit plug, the existing short-circuit plug is successfully replaced in the practical application process, the design of the step load provides a reliable verification method for the accuracy of the relationship between the cable conduction and the loop of the temperature measuring system for the spacecraft thermal test, and on the basis of the existing cable conduction test, the two operations of verifying the relationship between the cable conduction and the loop are completed at one time without adding a new testing link and testing equipment, so that the working efficiency and reliability of the test of the relationship between the cable conduction and the loop are greatly improved.
The previous description of the embodiments is provided to enable any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be applied to other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.
Claims (5)
1. Measuring system switches on and return circuit corresponding relation test equipment for spacecraft thermal test, including barrel (1), its characterized in that, the one end of barrel (1) is provided with Y2-50 plug (2), the one end that Y2-50 plug (2) were kept away from in barrel (1) is provided with bottom (3), the inside of barrel (1) is provided with ladder load circuit board (4), the inside of barrel (1) is provided with circuit board support frame (5) with ladder load circuit board (4) complex.
2. The spacecraft thermal test measurement system conduction and loop correspondence testing device according to claim 1, wherein a plurality of ladder load resistors (6) are attached to the ladder load circuit board (4), 47 ladder load resistors (6) are arranged, and are connected in series.
3. The spacecraft thermal test measuring system conduction and loop correspondence testing device according to claim 1, wherein a plurality of threaded holes are uniformly distributed in both the step load circuit board (4) and the circuit board support frame (5), and the step load circuit board (4) and the circuit board support frame (5) are detachably connected through bolts.
4. The spacecraft thermal test measurement system conduction and loop correspondence test equipment according to claim 1, wherein the circuit board support frame (5) is provided with two through holes (7) which are symmetrically distributed, and the circuit board support frame (5) is detachably connected with the bottom cover (3) through the through holes (7) by bolts.
5. The spacecraft thermal test measurement system conduction and loop correspondence testing device according to claim 1, wherein the cylinder (1) is internally provided with internal threads matched with the bottom cover (3), and the bottom cover (3) is in threaded connection with the cylinder (1).
Priority Applications (1)
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CN202111176198.5A CN113900043A (en) | 2021-10-09 | 2021-10-09 | Testing equipment for measuring system conduction and loop corresponding relation for spacecraft thermal test |
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CN202111176198.5A CN113900043A (en) | 2021-10-09 | 2021-10-09 | Testing equipment for measuring system conduction and loop corresponding relation for spacecraft thermal test |
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CN202111176198.5A Pending CN113900043A (en) | 2021-10-09 | 2021-10-09 | Testing equipment for measuring system conduction and loop corresponding relation for spacecraft thermal test |
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