TW200811429A - A method and system for measuring the liquid crystal polar anchoring energy - Google Patents

A method and system for measuring the liquid crystal polar anchoring energy Download PDF

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TW200811429A
TW200811429A TW95131156A TW95131156A TW200811429A TW 200811429 A TW200811429 A TW 200811429A TW 95131156 A TW95131156 A TW 95131156A TW 95131156 A TW95131156 A TW 95131156A TW 200811429 A TW200811429 A TW 200811429A
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liquid crystal
crystal cell
light
phase
voltage
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TW95131156A
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TWI318683B (en
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Shug-June Hwang
min-hua Xu
Hsin-Her Yu
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Univ Nat United
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Abstract

The invention discloses and develops a simple while accurate method to determine the anchoring energy by using a common-path optical heterodyne interferometer arrangement. By measuring the phase retardation of the LC cell versus the applied voltage, the polar anchoring energy of the homogeneously aligned cell can be precisely obtained.

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200811429 九、發明說明: 【發明所屬之技術領域】 本發明係有關於一種向列型液晶盒表面錨定能量(p〇lar anchoring energy)特性之測定方法及系統,尤指一種對液晶盒施加 電壓’並配合共光程差頻干涉技術,分析水平配向液晶盒的液晶分 子在電麗作用下之相位變化,進而簡單、快速地得到該液晶盒在電 φ 壓作用下之液晶分子之傾角錨定能量者。 【先前技術】 ㈣齡賴蝴的—侧發,研究液晶在表面龍肖與錯定 迠1為當今工業科學發展的一個重要方向,其中包括河¥八垂直配向 及IPS橫向電場所服之弱錨定力等—技術開發,因此液晶與固體 界面接觸的錨定作用受到了廣泛的關注。然而不同的銷定特性往往 ¥致液aa盒電光效應及顯示特性產生極大的差異,如起始電壓 _ (Vth)、光穿透率、對比度等,並影響其是否能適用於特定型式之液 晶顯示器,其中錨定能量主要取決於(1)配向膜的物化作用力,如 氣鍵(Hydrogen bond)、凡得瓦力(van der Waals force)及Dipole-dipole force;(2)機械力效應,即溝槽(Groove)或配向膜表面型態。而目前 • 研究液晶表面傾角與錨定能量可以分為破壞性與非破壞性兩種。破 壞性方法有:(一)利用原子力顯微鏡(Atomic F〇rce Mier()sa)pie, afm)由直接破片觀測與量測表面錨定能(如參考文獻:Jan. Appi. Phys·,32, ΡΡ· L1242〜L1244, 1993);(二)以光二倍頻訊號求得液晶 5 200811429 分子與表面的傾角,由於所需量測的雷射為脈衝雷射會造成配向膜 之損壞(如參考文獻:Phys· Rev·,A39, PP·3745〜3747, 1989);(三)藉 由紅外光譜分析定向摩擦造成配向膜分子旋轉重排,液晶分子的表 面錨定能量會隨摩擦強度增強而變大(如參考文獻·· M〇LCiyst.Liqe Cryst”28,pp.755~757,1988)。非破壞性方法有··(一)半洩漏導波 (Half leaky guided wave)方法(如參考文獻·· j. Appl· Phys,85⑵, ρρ·728〜733, 1999),被用來探討在共平面電場作用下之平行配向液 晶分子的指向矢失真,即利用外加電場前後液晶盒内彈性自由能改 變所引發的液晶指向矢失真變化的分佈圖與半洩漏導波的反射數 據相擬合比較,而得到扭轉彈性常數Km及扭轉錨定能量;(二)利 用激發表㈣漿波去制液晶分子在絲_角,崩制表面的 : AppL Optics, 27(19), p.p.4098-4011, 1988); (三)高電場技術(如參考文獻·· j· Αρρ1· Phys,57, pp452〇〜4526, 985)外加咼電场來造成液晶盒的相位延遲發生,由相位延遲大 小與電壓及電容值的乘積(CV)關係求得傾角錯定能;⑻簡化高 電場法(R-V)(如參考文獻· j. Appl. Phys.K% 1999),利用外加高電場於液晶盒上,測得在不同高電場作用下液 ,分子所造狀她延㈣,並藉由實驗及理論數健擬來比對出 最為接近之錨定能量。 在眾多錯定能量係數測量的研究中,高電場技術是最為廣泛被 應用’但該技術往往需要同時量測液晶盒的電容值和相位延遲,為 了測里電谷值’在製作液晶盒時必須先完成電極的圖案定義,然而 200811429 在電極圖案定義需要侧的製程,但侧溶液除了可移除不必要的 電極區外,亦往往會意外地傷害到受保護的電極區,此傷害會造成 附近區域的液晶指向矢排列不均,而導致錯定能量的測量誤差,且 此製作過程亦較為複雜。除此之外,高電場法在實驗上對於液晶盒 的厚度限制在40〜5〇flm的範圍,因此對於商用液晶盒(厚度~50_的 置測則不適用;另外,液晶盒厚度之均勻性亦會影響電容值量測的 準確性。由於高電場法種種的限制及缺點,因此簡化高電場法(R V) • 被提出來加以改善,簡化高電場法(R-v)係藉由提供不肖電壓施加 於液晶盒上,記錄不同電壓下所對應的光學相位延遲變化量,並且 與理論數值模擬結果相比對擬合出傾角錯定能量。 綜上所述,液晶分子相位延遲與電壓相依性的量測對錨定能量 的測量是非常重要,目前在相位量測的方法有(1)橢圓偏光儀(如參 考文獻· Jan. J. AppL Phys·,44(2),PP. 932〜939,1993); (2)旋轉檢偏板 法(如參考文獻· J· AppL Phys” 86(8),ρρ·4199〜4211,1999); (3) • Senarmont 技術(如參考文獻:J· Appl. PhyS·,86(8),ΡΡ·4199〜4212, 1999);橢圓偏光儀主要在於測量光入射至液晶盒後的反射光強度, 且利用偵測到的反射光強度來換算出折射率變化,進而得出相位延 - 遲量,然而由於光通過液晶盒時之介質材料的吸收及反射,往往造 _ 成量測上的嚴重誤差,且由於此儀器設備較為昂貴,因此較不為廣 泛使用;而旋轉檢偏板法則是藉由旋轉檢偏板來達到移頻機制,並 將參考光及測試光之光強度輸入鎖相放大器來截取兩訊號的相位 差值,由於旋轉檢偏器所產生的移頻機制太過於機械化,且易受環 7 200811429 境干擾及機械老化之影響;另外Senarmont技術主要在於利用光強 度的偵測而後回推相位值,然而由於光功率穩定性欠佳,且實驗上 液晶盒液晶指向矢方位角必需同時與偏光片及λ/4波片夾45角 度,因此角度的精準性及光功率的擾動往往會影響實驗取值。故如 何克服由環境、詩光轉齡及繁軸光學崎所造錢晶盒參 數量測上的誤差性與不便性就顯得非常重要。 有鑑於顯示器廣視角技術的應用範圍日趨廣泛,倘若使用習知 技術的光學系統來測量液晶盒傾角錨定能量,往往會因外在環境擾 動、雷射光轉穩定度、_基板不平坦或不均勻性及多重光束的 干涉效應等因素造成量測的嚴重誤差,因此如何準柄量測液晶層 邊界表面之自由能將是—賴鍵。本發明人基於豐富的學識與經 驗,積極努力投入研究液晶顯示技術,經潛心研發,終於發展出一 新穎及解_量綠;本_之方法係_非破雜共光程外差 干涉技術來測量液晶盒的相位延遲,_改良賴化高電場(r v) 技術針對在冋電場作用下液晶盒的雙折射性所導致相位延遲進行 啦,探討外加的糕無晶盒之她延遲她性,進關定傾角 錨定能量。由於本發_共光料差干涉制緣巾之兩正交且差 頻的線偏振光是屬共光程(即傳播路徑相同),故本系統所測定的相 位值完全是由液晶盒試#本身所提供,可排除環賴動所帶來的影 響及咖干涉效應等問題,因此本系統為—套精確、快速、 架,簡單之共光料差干涉系統,且具備制之進步性、符合簡化 測里細作权序及產業利用性之發明,勢必能對於液晶盒傾角錯定能 8 200811429 而成為未來液晶盒 里測及顯示斋廣視角的設計自由度上加以提升, 參數量測技術發展之趨勢。200811429 IX. Description of the Invention: [Technical Field] The present invention relates to a method and system for determining the characteristics of a p向lar anchoring energy of a nematic liquid crystal cell, and more particularly to applying a voltage to a liquid crystal cell. 'With the common optical path difference frequency interference technology, the phase change of the liquid crystal molecules of the horizontal alignment liquid crystal cell under the action of the electric sensation is analyzed, and the inclination of the liquid crystal molecules under the action of the electric φ pressure is simply and quickly obtained. Energy person. [Prior Art] (4) The age of Laihuao-side hair, research on the surface of the dragon and the wrong 迠1 is an important direction for the development of industrial science today, including the river ¥ eight vertical alignment and the weak anchor of the IPS horizontal electric field service. Constant force and so on - technology development, so the anchoring effect of liquid crystal and solid interface contact has received extensive attention. However, different pinning characteristics often cause significant differences in the electro-optic effect and display characteristics of the liquid-activating a-box, such as the starting voltage _ (Vth), light transmittance, contrast, etc., and affect whether it can be applied to a specific type of liquid crystal. a display in which the anchoring energy is mainly dependent on (1) the physicochemical forces of the alignment film, such as a hydrogen bond, a van der Waals force, and a Dipole-dipole force; (2) a mechanical force effect, That is, the groove type (Groove) or the alignment film surface type. At present, the study of liquid crystal surface tilt angle and anchor energy can be divided into destructive and non-destructive. Destructive methods include: (i) Atomic F〇rce Mier()sa), afm) observation and measurement of surface anchoring energy by direct fragmentation (eg reference: Jan. Appi. Phys., 32, ΡΡ· L1242~L1244, 1993); (2) Calculate the tilt angle of the liquid crystal with the optical double frequency signal. 200811429 The tilt angle of the molecule and the surface, the laser of the required laser will cause the damage of the alignment film (such as reference) : Phys· Rev·, A39, PP·3745~3747, 1989); (3) The orientation and friction of the alignment film molecules caused by the directional friction analysis by infrared spectroscopy, the surface anchoring energy of the liquid crystal molecules will increase as the friction intensity increases. (eg, References · M〇LCiyst.Liqe Cryst 28, pp. 755-757, 1988). Non-destructive methods include (a) Half leaky guided wave methods (eg references) · j. Appl· Phys, 85(2), ρρ·728~733, 1999), used to investigate the directoral distortion of parallel-aligned liquid crystal molecules under the action of a coplanar electric field, that is, the elastic free energy change in the liquid crystal cell before and after the applied electric field is applied. Distribution map and half leakage of liquid crystal director distortion The reflected data of the guided wave is fitted and compared to obtain the torsional elastic constant Km and the torsional anchoring energy; (2) using the excitation table (4) to remove the liquid crystal molecules at the silk angle and collapse the surface: AppL Optics, 27( 19), pp4098-4011, 1988); (3) High electric field technology (eg reference j· Αρρ1· Phys, 57, pp452〇~4526, 985) plus the electric field to cause phase delay of the liquid crystal cell The tilt error energy is obtained from the product of the phase delay magnitude and the product of voltage and capacitance (CV); (8) Simplified high electric field method (RV) (eg, reference j. Appl. Phys.K% 1999), using the extra high The electric field is measured on the liquid crystal cell, and the liquid is measured under the action of different high electric fields. The molecules are shaped by the molecule (4), and the closest anchoring energy is compared by experimental and theoretical numbers. In the research of measurement, high electric field technology is the most widely used 'but the technology often needs to measure the capacitance value and phase delay of the liquid crystal cell at the same time. In order to measure the electricity valley value', the pattern definition of the electrode must be completed before making the liquid crystal cell. , however, 200811429 needs to be defined in the electrode pattern Side process, but in addition to removing unnecessary electrode areas, the side solution often accidentally damages the protected electrode area, which causes uneven alignment of liquid crystal directors in nearby areas, resulting in misaligned energy. The measurement error is complicated, and the manufacturing process is complicated. In addition, the high electric field method experimentally limits the thickness of the liquid crystal cell to a range of 40 to 5 〇 flm, so for a commercial liquid crystal cell (thickness of ~50_) The measurement is not applicable; in addition, the uniformity of the thickness of the liquid crystal cell also affects the accuracy of the capacitance measurement. Due to various limitations and shortcomings of the high electric field method, the simplified high electric field method (RV) is proposed to be improved, and the simplified high electric field method (Rv) is applied to the liquid crystal cell by providing a non-discriminatory voltage to record different voltages. The optical phase delay varies, and the tilt angle is mismatched compared to the theoretical numerical simulation results. In summary, the measurement of phase retardation and voltage dependence of liquid crystal molecules is very important for the measurement of anchor energy. At present, there are (1) ellipsometers for phase measurement (eg, reference. Jan. J. AppL) Phys·, 44(2), PP. 932~939, 1993); (2) Rotary analyzer method (eg reference J. AppL Phys) 86(8), ρρ·4199~4211, 1999); 3) • Senarmont technology (eg reference: J. Appl. PhyS., 86 (8), ΡΡ 4199~4212, 1999); ellipsometer is mainly used to measure the intensity of reflected light after the light is incident on the liquid crystal cell, and utilize The detected intensity of the reflected light is converted into a refractive index change, thereby obtaining a phase delay-delay amount. However, due to the absorption and reflection of the dielectric material when the light passes through the liquid crystal cell, a serious error in the measurement is often caused, and Because the instrument is relatively expensive, it is less widely used. The rotary analyzer method uses a rotating analyzer to achieve the frequency shifting mechanism, and the reference light and the intensity of the test light are input to the lock-in amplifier to intercept two. The phase difference of the signal, due to the frequency shifting mechanism generated by the rotating analyzer Mechanized and susceptible to environmental disturbances and mechanical aging of the ring 7 200811429; Sennmont technology mainly uses the detection of light intensity and then push back the phase value, however, due to poor optical power stability, and experimental liquid crystal cell liquid crystal director The azimuth must be angled with the polarizer and the λ/4 wave plate at the same time. Therefore, the accuracy of the angle and the disturbance of the optical power often affect the experimental value. Therefore, how to overcome the environment, the age of poetry and the optical axis It is very important to measure the error and inconvenience in the measurement of the parameters of the crystal box. In view of the wide application range of the wide viewing angle technology of the display, if the optical system of the prior art is used to measure the tilting energy of the liquid crystal cell, it is often Due to external environmental disturbances, laser light stability, _ substrate unevenness or inhomogeneity and interference effects of multiple beams, the measurement of the free energy of the boundary layer of the liquid crystal layer will be - Lai Key. Based on the rich knowledge and experience, the inventor actively worked hard to research liquid crystal display technology, and after careful research and development, finally made A novel and solution _ quantity green is exhibited; the method of _ _ non-breaking common optical path heterodyne interference technology to measure the phase delay of the liquid crystal cell, _ improved Laihua high electric field (rv) technology for the action of the electric field The phase retardation caused by the birefringence of the liquid crystal cell is discussed. She discusses the delay of the addition of the cake without the crystal box, and the anchoring energy is set in the tilting angle. And the linearly polarized light of the difference frequency belongs to the common optical path (that is, the propagation path is the same), so the phase value measured by the system is completely provided by the liquid crystal cell test # itself, which can eliminate the influence of the loop and the coffee. Interference effects and other issues, so the system is a set of accurate, fast, frame, simple common light interference system, and has the progress of the system, in line with the simplified measurement of fine-grain order and industrial utilization, it is bound to The tilt angle of the liquid crystal cell is 8 200811429 and it will become the design freedom in the future measurement and display of the viewing angle of the LCD, and the development of the parameter measurement technology.

目刖習知專伽案技術,有巾軸瞻彳公麵案第569063 破發明-在至少-邊板上包含有改_輯件以提供無任何記情 效應之方位·晶裝置,以战度針對傾細定能量做為測量依 據’由於以光功率為主的測量系統有其缺點,如環境擾動、雷射光 功率穩定度及干涉效鱗騎造成制上的誤差,峨造成研發製 程上之困難,且影響產品性質與效能。此外,日本公止第 雛祕89號專利前案—量測液晶材料物性的方法轉置二係 利用-光_伽,透過絲她之蠕後錢取其光功率之大小 而後回推液晶盒參數’然職置所使狀絲树與絲量測架構 較為複雜。另外,日本公告第篇3413G5號專案—祕〇(1如 device f〇revaluatinginterface,其係利用偏振片正交於液晶盒,並記 錄下光在通職晶錢之錢度魏_她晶细定能量,然雷 射光源的功轉定性及環境擾動亦會_辟及擾制量的準確 性。細上所述,習知技術特徵方法與本發明不同。 【發明内容】 本發明之主要特色為針對習知量測技術所提出之光強度檢測 技術進行改善,倾出共絲外差干㈣行液晶盒懒錯定能 量的測^,該技術不受光多奸涉、f射辨穩定度、介f吸收等 因素所衫響;故能降低外界擾動所導致之測量誤差值、提高產業量 測之精確性、進錄;I魏架賴單及操作單純符合簡化測量操 9 200811429 作程序及產㈣廊。本發顿雜難 zee_雙穩頻雷 射來設計-共光程外差干涉量測系統,此线所測量的是由液 晶雙折射所糾s及P雜光物崎雜hawdation), 因此可即時且精確分析水平㈣向列迦晶分子在電場影響下之 光學相位特性變化’且辅以數值理論模擬方式來分析電壓與相位延 遲之相關曲線,再將實驗結果與理論分析值她合味進而得到 在外加電%作用下之液晶分子之傾角錯定能量。 【實施方式】 壹•本發明的技術原理與實施 本叙明向列型液晶盒表面錨定能量特性測定技術的基本特 徵’是以平行配向的液晶盒做為待測物,並於該液晶盒施加電壓, 再配合共光程差頻干涉技術分析該液晶盒的液晶分子在電壓作用 下之相位變化,且辅以理論數值模擬方式分析在特定液晶盒參數下 的相位變化,並將實驗結果與理論分析相擬合及比較,進而得到該 液晶盒在電壓作用下之液晶分子之傾角錨定能量。 為能讓審查員及在本技術領域而具通常知識者對本發明之 原理、特徵以及操作方式更為具體了解,在此將針對干涉系統 理論、傾角錨定能理論及實施例配合圖式分別進行說明,並舉 一可行的實施例配合圖式說明如下。 (一)傾角錨定能理論 液晶分子具有彈性,一般而言可將液晶的彈性係數定義為在受 200811429 到不同外力矩作用下,液晶將分別發生Kn展曲(splay)、κ22扭曲 (twist)及Κ:33彎西(bend)三種不同的形變後欲恢復至原來平衡狀態之 能力’因此根據Oseen-Frank液晶連續彈性形變理論,液晶分子因 形變所產生之單位體積内彈性位能密度可表示成: 其中^為液晶分子平均指向矢。在這裡我們假設靠近配向膜表面之 液晶分子只屬於傾斜模式而沒有扭轉型態,因此可將公式(〖)重寫 成· ^=^n(V^)2+^33^xVxn)2 (2) 當外加電場及液晶分子與邊界的作用力存在時,我們可以將彈性自 由能表示為: U ^ EL+U EM)dz + U Sl+U S2 ⑶ 其中UEM疋義為外加電場於液晶盒時,液晶分子所感受之電位能, Usi、US2則分別為液晶_配向膜界面間之表面自由能密度。 此處的表面自由能usl、uS2可以Rapini_Papoular近似式表示為:Seeing the technique of the customary gamma, the affliction of the 轴 569 569 569 063 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 569 As for the measurement of the declining energy, the measurement system based on optical power has its shortcomings, such as environmental disturbance, laser light power stability and interference caused by interference scale riding, which makes the development process difficult. And affect the nature and effectiveness of the product. In addition, the Japanese patent No. 89 patent pending case - measuring the physical properties of liquid crystal materials transposed two systems using - light _ gamma, through the silk after her creep money to take the size of its optical power and then push back the liquid crystal box parameters ' However, the structure of the silk tree and silk measurement structure is more complicated. In addition, Japan's announcement No. 3413G5 project - secrets (such as device f〇 revaluating interface, which uses polarizing plates orthogonal to the liquid crystal cell, and records the light in the price of the official crystal money Wei _ her crystal fine energy However, the performance of the laser light source and the environmental disturbance will also affect the accuracy of the disturbance. As described above, the conventional technical feature method is different from the present invention. [Summary of the Invention] The main features of the present invention are directed to The light intensity detection technology proposed by the conventional measurement technology is improved, and the measurement of the energy of the collinearity difference (four) line of the liquid crystal cell is lazy, and the technique is not affected by light, and the stability of the f-ray is determined. Absorption and other factors are shocked; therefore, it can reduce the measurement error value caused by external disturbances, improve the accuracy of industrial measurement, and record; I Wei Lai Lai and operation simply meet the simplified measurement operation 9 200811429 Procedures and production (four) gallery Benton's miscellaneous zee_ bistable frequency laser to design - common optical path heterodyne interference measurement system, this line is measured by liquid crystal birefringence s and P light haze hawdation), therefore Instant and accurate analysis of levels (4) The phase change of the optical phase under the influence of the electric field' is supplemented by a numerical theory simulation method to analyze the correlation curve between voltage and phase delay, and then the experimental results are compared with the theoretical analysis values to obtain the liquid crystal molecules under the action of externally applied electricity. The dip angle is the wrong energy. [Embodiment] The technical principle of the present invention and the implementation of the basic characteristics of the method for determining the energy characteristics of the nematic liquid crystal cell are as follows: a liquid crystal cell with parallel alignment as a test object, and in the liquid crystal cell The voltage is applied, and the phase change of the liquid crystal molecules of the liquid crystal cell under the action of voltage is analyzed by the common optical path difference frequency interference technique, and the phase change under the specific liquid crystal cell parameters is analyzed by theoretical numerical simulation, and the experimental results are compared with the experimental results. The theoretical analysis is fitted and compared to obtain the tilt anchoring energy of the liquid crystal molecules under the voltage of the liquid crystal cell. In order to enable the examiner and those of ordinary skill in the art to have a more specific understanding of the principles, features and operation modes of the present invention, the theory of the interferometric system, the theory of the tilt anchoring energy, and the embodiment and the schema are separately performed. The description and the possible embodiments are described below with reference to the drawings. (1) Inclination anchoring theory The liquid crystal molecules have elasticity. Generally speaking, the elastic coefficient of liquid crystal can be defined as the splay and κ22 twist of the liquid crystal under the action of different external moments from 200811429. And Κ: 33 bend west (bend) the ability to return to the original equilibrium state after three different deformations. Therefore, according to the Oseen-Frank liquid crystal continuous elastic deformation theory, the elastic potential energy density per unit volume of liquid crystal molecules due to deformation can be expressed. Cheng: where ^ is the average director of the liquid crystal molecules. Here we assume that the liquid crystal molecules near the surface of the alignment film belong only to the tilt mode without the twist pattern, so the formula (〖) can be rewritten as ^^=^n(V^)2+^33^xVxn)2 (2) When the applied electric field and the force of the liquid crystal molecules and the boundary exist, we can express the elastic free energy as: U ^ EL+U EM)dz + U Sl+U S2 (3) where UEM is the applied electric field in the liquid crystal cell, The potential energy felt by the liquid crystal molecules, Usi and US2 are the surface free energy densities between the liquid crystal and the alignment film interfaces, respectively. The surface free energy usl, uS2 here can be expressed as a Rapini_Papoular approximation:

Us,a =^wesin2 Αθ + ^ψφύη2 Αφ ⑷ 其中we與分別代表傾角錨定能與扭轉角錨定能。分別表 示液晶分子在傾角方向(tilt angle)與扭轉角方向(azimuthal)之偏離 200811429 角。然而本質上在Rapini_Papoular近似式裡液晶盒内實際的傾 角及扭轉角攸能量油聽合。在這裡我們是财平排列的液晶 盒(無扭轉)來進行傾觸m粉析,因此此處的液晶盒内為無 扭轉之型態,我們可將公式(4)表示為: us =-Wesm2A0 ⑶Us, a =^wesin2 Αθ + ^ψφύη2 Αφ (4) where we and respectively represent the inclination anchoring energy and the torsion angle anchoring energy. It indicates the deviation of the liquid crystal molecules from the tilt angle to the azimuthal direction (200811429), respectively. However, in essence, in the Rapini_Papoular approximation, the actual tilt angle and torsion angle in the liquid crystal cell are matched. Here we are the liquid crystal cell (no twist) arranged for the balance, so the liquid crystal cell inside is not twisted. We can express the formula (4) as: us =-Wesm2A0 (3)

在平衡狀態下,總自由能量達到最小值,即δυ=〇,利用變分 法求得自由能最顿可獲得聯立_lapLagrange絲式的兩表面 力矩平衡方程式: r 由 j cos2 θ-\- K33 sin2 θ) άθ dz -sin 2^ (Κη -Κ33)θ2-ι-ε0ΑεΕΐ\ϊ 2=0 1 sin 2(6^--^) 2cos2 sin2 θ) άθ dzIn the equilibrium state, the total free energy reaches the minimum value, ie δυ=〇, and the free energy is obtained by the variational method. The two-surface moment balance equation of the simultaneous _lapLagrange wire type can be obtained: r by j cos2 θ-\- K33 sin2 θ) άθ dz -sin 2^ (Κη -Κ33)θ2-ι-ε0ΑεΕΐ\ϊ 2=0 1 sin 2(6^--^) 2cos2 sin2 θ) άθ dz

Wosin2(0r0D) z=d 2Ψη^θ)^(κ,3ύη2θ) ⑹ (6)式中的Θ為液晶分子之傾角(tiit angle)、〜為液晶分子預傾 角。由於液晶分子具有介電異向雜,因此我墙外加電場以電位 移方式來表式,在外加電場作用下之施加電壓與電位移關係式 為·· ν^Ε^^ί~^-θ ⑺ 其中认為ζ方向的電位移,&及ε//分別為與液晶軸向垂直及平行 的介電常數且Αε:=ε/Γεχ。由於在不同電位移作用下,液晶指向矢之 12 200811429 =間分佈亦將不同,請配合第—圖之數值分析圖參看,外加電場改 變液晶指向矢_角,因而導致液晶盒巾各層指向矢的變化。在邊 界液晶指向理論上並不是目定不麟,在低電場時,即很容易讓中 間層的液晶傾纽變,但衫近邊界之液晶層指向的改變卻很小。 然而在高電場時,巾騎液晶指向矢已經與電場額—致而傾角不 再改變(easy axis),而邊界的液晶層傾角會隨著電場增強而持續増 加虽外加在液晶盒上之電場到達某一飽和電壓(非操作電壓)時, 包含邊界騎有液晶層指_會隨著f場方向—致;因此我們藉由 改蔓電壓;M、的方式來觀祭液晶指向矢改變所引走之相位延遲,便 可以得知财能的大小。-賴肢佈θ⑻被制,光相位延遲即 可容易以式(8)計算求得: Γ: 2π ~λ •|%“外))一《±]^ ⑻ nnn, sin2 θ + nl cos2 θ ⑼ 其中 (二)干涉系統理論 本發明所需之液晶的光相位延遲量則可藉由本發明裝置 (請參看第二圖所示)來測得,本發明差頻干涉技術的具體實施方 式,採用一雙穩頻雷射外差干涉量測系統,該系統包括有:一雙穩 頻雷射光源(10) (Zeeman Laser波長為632.8nm)系統,用以產生 13 200811429 兩個不同頻率的s及p線偏極光;一分光器(11),將光分為兩路傳 接’分別為參考光及測試光;二檢偏板(12)(13),該檢偏板之穿透 軸與水平方向夾45。角,使s及p線偏極光產生干涉拍頻(Beat)m 號;二光偵測器(14)(15),分別接收測試光與參考光的訊號;及一 相位計(16),用以擷取測試光與參考光間的相位差值;待測物之液晶 盒(20)為水平排列向列型液晶盒。 本發明利用Zeeman雙穩頻雷射建立共光程外差干涉 _ (Heter〇dyne Interferometer)量測系統來精確量測液晶盒的相位 延遲(Phase retardation),由Zeeman雷射射出兩道具有頻率各為 ωι、〇>2且互相正交的線偏振光,當光通過分光鏡(η)後產生兩個不 同的路徑光’分別為參考光及測試光路徑,首先在參考光中的兩個 互相正交的線偏振光經過檢偏板(13)後即產生干涉,隨即進入光偵 測器(14)被加以接收;另一道測試光則通過待測液晶盒(2〇),因液晶 具有雙折射特性,造成通過液晶盒(20)的二正交線偏振光產生相位 _ 延遲Γ ’隨後再通過檢偏板(12)而產生干涉,最後被光偵測器(15) 加以檢測,再利用相位計(16)將光偵測器(14)及(15)所接收的訊號加 以處理比較,以得到二訊號間的相位差值。 首先我們以方程式來表示參考光束中的二個具有不同頻率之s - 極化及p極化之電場表示為:Wosin2(0r0D) z=d 2Ψη^θ)^(κ, 3ύη2θ) (6) The Θ in the formula (6) is the titer angle of the liquid crystal molecules, and ~ is the pretilt angle of the liquid crystal molecules. Since the liquid crystal molecules have dielectric anisotropy, the electric field applied to the wall is expressed by electric displacement, and the relationship between the applied voltage and the electric displacement under the applied electric field is ·· ν^Ε^^ί~^-θ (7) It is considered that the electric displacement in the ζ direction, & ε// is a dielectric constant perpendicular to and parallel to the liquid crystal axis, and Α ε:= ε / Γ ε χ. Since the distribution of the liquid crystal directors will be different under different electric displacements, please refer to the numerical analysis diagram of the figure, and the applied electric field changes the director angle of the liquid crystal, thus causing the directors of the liquid crystal tissue to be oriented. Variety. In the boundary liquid crystal pointing theory is not ambiguous. In the low electric field, it is easy to change the liquid crystal of the middle layer, but the change of the liquid crystal layer pointing near the boundary is small. However, in the case of a high electric field, the liquid crystal director has an angle of inclination with the electric field, and the inclination angle of the liquid crystal layer of the boundary continues to increase as the electric field increases, although the electric field applied to the liquid crystal cell reaches. When a certain saturation voltage (non-operating voltage) is included, the boundary with the liquid crystal layer refers to the direction of the f field; therefore, we change the vine voltage; M, the way to observe the liquid crystal director change With the phase delay, you can know the size of the financial resources. - The limb θ(8) is made, and the optical phase delay can be easily calculated by the formula (8): Γ: 2π ~λ •|% “outside)) “±]^ (8) nnn, sin2 θ + nl cos2 θ (9) (2) Interferometric System Theory The optical phase retardation amount of the liquid crystal required by the present invention can be measured by the device of the present invention (refer to the second figure), and the specific implementation manner of the differential frequency interference technique of the present invention adopts a A bistable frequency laser heterodyne interference measurement system comprising: a dual-stabilized laser source (10) (Zeeman Laser wavelength 632.8 nm) system for generating 13 200811429 two different frequencies of s and p Line polarized light; a beam splitter (11), splitting the light into two paths 'respectively reference light and test light respectively; second detecting plate (12) (13), the penetration axis and horizontal direction of the analyzer Clip 45. The angle causes the s and p-line polarized light to generate an interference beat (M) Beat; the second photodetector (14) (15) receives the test light and the reference light respectively; and a phase meter (16) ) for capturing the phase difference between the test light and the reference light; the liquid crystal cell (20) of the object to be tested is a horizontally arranged nematic liquid crystal cell. The present invention utilizes Zeeman bistable The laser establishes a Heter〇dyne Interferometer measurement system to accurately measure the phase retardation of the liquid crystal cell, and the Zeeman laser emits two channels each having a frequency of ωι, 〇 > And mutually orthogonal linearly polarized light, when the light passes through the beam splitter (η), two different paths of light are generated as reference light and test light path, respectively. First, two mutually orthogonal linearly polarized lights in the reference light After the analyzer (13) is detected, interference occurs, and then enters the photodetector (14) to be received; the other test light passes through the liquid crystal cell to be tested (2〇), because the liquid crystal has birefringence characteristics, resulting in passing through the liquid crystal cell. (20) The two orthogonal linearly polarized light produces phase _ delay Γ 'Subsequent interference is generated by the analyzer (12), which is finally detected by the photodetector (15), and then the light is used by the phase meter (16). The signals received by the detectors (14) and (15) are processed and compared to obtain the phase difference between the two signals. First, we use equations to represent two of the reference beams with different frequencies of s - polarization and p The electric field of polarization is expressed as:

Erl(t) = Arl exp(/^〇 nm (11)Erl(t) = Arl exp(/^〇 nm (11)

Er2(t) = Ar2 exp(iw2t) 200811429Er2(t) = Ar2 exp(iw2t) 200811429

其中Arl、Ar2及ωι、吻分別為參考光中的兩正交偏振光之振_ 及頻率’當光束經過檢偏板(13)時,兩偏極光即產生拍頻(bJ 干涉。fL5虎,其光強度可表示如下: /r=/〇+Ar cosKa, ^〇}2)t] -/〇+Ar cos(^i) (12) 其中IG為DC直流成份,%為兩正交線偏極光的頻率差。而剩 試光訊號在通過液晶盒後,因液晶分子的雙折射性而產生—相 籲位延遲量,其兩線偏極光的電場表示如下: (13)Among them, Arl, Ar2, and ωι, kiss are respectively the vibration _ and frequency of two orthogonally polarized lights in the reference light. When the beam passes through the analyzer (13), the two polar lights generate the beat frequency (bJ interference. fL5 tiger, The light intensity can be expressed as follows: /r=/〇+Ar cosKa, ^〇}2)t] -/〇+Ar cos(^i) (12) where IG is DC DC component and % is two orthogonal line offset The frequency difference of the aurora. After the test light signal is passed through the liquid crystal cell, due to the birefringence of the liquid crystal molecules, the phase shift delay amount is obtained, and the electric field of the two-line polarized light is expressed as follows: (13)

Esi(t) = As2 txp(iw2t + V) (14) 其中Asl、A。及Γ!、ΓΖ分別為测試光中二線偏極光的振幅及讀 光通過液晶分子所引發之相位,經過檢偏板(12)後亦產生一拍頻 干涉訊號,其光強度可表示為·· ' 八=/0+a c〇s[(6;广%)ί+(η—Γ2)] = h+As cos(^i + J) (15) 其中I〇為DC直流程份,Γ為測試光通過異向性的液晶分子所 造成之相位延遲,可以表示為Γ2=(2;γ//1)△心j。此相位 差Γ(即待測訊息)乃被紀錄在拍頻訊號的相位項裡,因此只要將 此干涉信號與一個同頻率的參考信號相互比較,再利用電子電 路處理技術即可將相位延遲量Γ解析出。 15 200811429 本發明之共光程干涉系統(如第二圖)所測量的相位差值乃 單純為液晶分子的折射率分佈所造成的相位延遲所貢獻,因此 不党外界所引進的雜散光及光源強度不穩定所影響;藉由此外 是干涉系統可準確、快速及高靈敏度地獲得在不同電壓作用 下’液晶分子因電場作用而重新排列所造成的微量相位變化, 请配合參看第三圖所示。配合著此系統所具備的差頻干涉技 術,我們可以探討液晶分子在電場影響下之光學相位特性之變 化,藉由改變電壓方式來觀察所引起之光學相位延遲量且辅以理 論數值模擬方式,利用實驗所得的相位延遲與極大電壓的倒數(1/v) 關係圖與理論模擬結果相比較擬合,便可推知錨定能量大小,請配 合參看第四圖及第五圖所示。 月 (三)具體實施例 為能更具體了解本發明之雜方式,請參看第—至第五圖所 不,以說明本發明裝置顧在液晶盒_肖錨定能量_定。首先 我們先以基板清洗、向液塗佈與刷磨、_子撒佈、轉塗佈、 熱壓合等技術來製作—個水平配觸液晶盒,本實驗财所採用之 間隙子的厚度為8·75,,再利順的液晶材料灌注於該液晶盒内, ^ ^ n±==L52l? ^ Κιι=1Ζ8χΐ^ Κ33 20·6χ1〇 N、%=19 3及£丄=5 2,此液晶盒為我們在本 所要測定的試片。 將製作完成的液晶盒⑽被放置在圖二的實驗裝置中之位 16 二ϋίΛ:乂j三 -乂·:、.:c 二二二:-,. 200811429Esi(t) = As2 txp(iw2t + V) (14) where Asl, A. And Γ!, ΓΖ respectively test the amplitude of the second-line polarized light in the light and the phase induced by the liquid crystal molecules. After the analyzer (12), a beat frequency interference signal is also generated, and the light intensity can be expressed as ·· ' 八=/0+ac〇s[(6;广%) ί+(η—Γ2)] = h+As cos(^i + J) (15) where I〇 is DC straight flow, Γ To test the phase delay caused by light passing through anisotropic liquid crystal molecules, it can be expressed as Γ2=(2; γ//1) Δ heart j. The phase difference 即 (ie, the message to be tested) is recorded in the phase term of the beat signal, so that the interference signal can be compared with a reference signal of the same frequency, and the phase delay amount can be obtained by using the electronic circuit processing technique. Γ Analyzed. 15 200811429 The phase difference measured by the common optical path interference system of the present invention (as shown in the second figure) is simply contributed by the phase delay caused by the refractive index distribution of the liquid crystal molecules, so the stray light and the light source introduced by the outside party are not The intensity is unstable; the interference system can accurately, quickly and sensitively obtain the slight phase change caused by the rearrangement of the liquid crystal molecules by the electric field under different voltages. Please refer to the third figure. . With the difference frequency interference technology of this system, we can investigate the change of optical phase characteristics of liquid crystal molecules under the influence of electric field, and observe the optical phase delay caused by changing the voltage mode and supplemented by theoretical numerical simulation. Using the experimentally obtained phase delay and the reciprocal (1/v) relationship between the maximum voltage and the theoretical simulation results, the anchoring energy can be inferred. Please refer to the fourth and fifth figures. (3) Specific Embodiments In order to more specifically understand the hybrid mode of the present invention, please refer to the first to fifth figures to illustrate that the device of the present invention takes care of the liquid crystal cell. First of all, we first make a horizontal touch-contact liquid crystal cell with substrate cleaning, liquid coating and brushing, _ sub-spraying, transfer coating, hot pressing and other techniques. The thickness of the gap used in this experiment is 8.75, the liquid crystal material of Lishun is poured into the liquid crystal cell, ^^ n±==L52l? ^ Κιι=1Ζ8χΐ^ Κ33 20·6χ1〇N, %=19 3 and £丄=5 2, The liquid crystal cell is the test piece we want to measure at the company. The completed liquid crystal cell (10) is placed in the experimental device of Figure 2. 16 ϋ Λ Λ: 乂 j 三 - 乂 ·:, .: c 22:-,. 200811429

利用本發明之共光程外差干涉量測系統來量測液晶盒在外加電 盔作用下的相位變化。藉由Zeeman雷射光源發射出同時具有兩個 不同頻率且互相垂直的線偏極雷射光束,該雷射光束先經過一分光 器(11)而產生一參考光及通過該液晶盒(20)上的測試光,並利用檢 偏板(12)(13)分別使得參考光及測試光訊號的二互相垂直偏振光產 生拍頻訊號的干涉現象,並分別各由光偵測器(14)和(15)加以接 收’且再將訊號輸入至相位計(16)内進行相位量測,進而可求得外 加電壓與相位變化之相依性。由於訊號光中的兩互相正交的差頻線 偏振光是共光程傳遞,所以由相位計所得到的相位完全是由液晶盒 的又折射特性所貝獻。藉由本發明裝置測量相位延遲與外加電壓的 關係’本實驗例之外加電壓的範圍是從〇v到7〇v。其中,本發明 之外差干涉1測裝置亦適用於一反射式的水平配列的液晶盒之錯 疋此里測里,當測試光經過液晶盒内的反射鏡後會反射,而再由光 偵測益接收,亦可達到相位偵測的目的。 經過-系狀變外加電壓後產生的關她變化之量測而得 到如圖三_位與電壓_侧,由於則錨定能量大小的測定是 利用實驗所得_位延遲對極大電壓的倒數(1/v賺圖來與理論 數健擬結果相比較擬合,便可推知傾角錯定係數值。因此在利用 ^|^(Mouse =片的厚度與麵角,柯代人套錄驗行分析;故—開始利二 、只,所付的電顯相位之關係圖,藉由外插的技巧求得最大相位延 遲里便可求件液晶盒的厚度(如參考文獻··脏EjWpTe也,⑼, 17 -;ι 200811429 PP. 77〜81,2005);至於預傾角的量測則是利用晶體旋轉法,利用本 發明策置來測量相位與光入射角度的相依性,由實驗的量測結果找 出發生最大相位延遲量的入射角度,即可精準的測量液晶盒的預傾 角值(如參考文獻:Society for Information Display,IDW/AD,05, 1, pp. 209-210, 2005)〇 將液晶材料的相關參數(n//、n±、Kll、k33、%及ε±)及所測量得 到液晶盒厚度與預傾角代入Mouse LCD軟體,並分別給定不同的 傾角錨定能來模擬外加不同的電壓與傾角分佈的關連性,如圖一所 示’再由傾角分佈得到不同電壓所造成的相位變化。由於在高電壓 作用時’液晶盒的相位對外加電壓的倒數(R4/V)會是線性關係, 本發明實驗例所比對擬合的高電壓範圍是取在40-65v的區間内(此 段為線性區),利用給定不同的傾角錨定能所模擬的相位變化與電 壓倒數的相依性來與實驗所得相位_1/v的曲線相比對擬合,如圖四 之R4/V實驗曲線與模擬結果之比較圖所示,圖中所模擬出之傾角 錯定能量範圍為5.8*l(T3J/m2〜6.3*HT3J/m2的R-1/V曲線與本發明 實驗例結果最為接近。因此我們再將圖四作刻度放大後截取高電壓 作用下所量測的部份結果進行第二次比對,希望藉由模擬出來的相 位延遲與電壓關係曲線(R4/V)和實驗數據西線比對得出最合理之 傾角銷定能量,如圖五之R4/v比擬(fltting)曲線所示,即可成 功的獲得該液晶盒試片的錨定能量為5.95*1〇-3J/m2,此能量乃為強 錦定能量之範_。 18 200811429 貳·本發明的技術特點 , 1 •相域取技術:本㈣針雜晶盒_液晶分子介電異向性隨 外加電壓變化而產生之相位延遲變化量,以共光程外差干涉之 方式直接針對液晶盒内分子取向的相位變化做截取,而非透過 光強度再換算回相位之方式。因此,經本發明所提供的技術可 精準獲致相位延遲量,再利用理論分析與實驗結果相比擬回推 液晶盒傾㈣定能量,在產業量測之進步性、精聰及高靈敏 性應用上是極具發展潛力。 2 ·光學雜··本發日鳩由—ZeemanLa㈣鍵立之聽程外差干 涉系統,將水平排列液晶盒置於此光學系統中,即可施加電壓 於液晶導電層上,並進行液晶分子因外加電壓所造成的相位延 遲罝之量測;因此符合簡化測量操作程序及產業利用性之發明。 3 ·光學理論·♦在傳統的高電場技術中保留了電容項,所以在進 彳于制取值的過財還需料量測得知液晶盒電容值,才 能推得錫定能。本發明之錯定能量理論是運用簡化高電場 (R-V)技術改良而來的,利用外加電壓在大於六倍的臨界電 壓,及造成最大相位差的80%所對應的電壓區間内,會有相 ‘ 纟延遲與電壓倒數呈—線性關係,在這線性區間内,進行 實驗及理賴麟果的崎(fiuing)H⑽肖财能的值; 如此-來在比對的過程中就不需要先行量測電容的大小。 $此方法操作簡易,另本法亦適用於商用型的薄液晶盒的 罝測’同時本發明之共光程設計可精確測量液晶盒的相位 19 200811429 延遲量,因此可提供產業之運用。 參•本發明之技術功效 1 ·本發明之光學系統是屬共光程干涉,由於兩互相正交之線偏極 光的行進路徑皆相同,因此兩偏振光之間的相位差完全是由液 晶分子之折射異向性所造成。另外因本系統所擷取的訊號是相 位而非光強度,故可避免外界環境擾動、雷射功率不穩及多光 束干涉的影響,故可達到高精確、高靈敏之量測。 2·本發明所使用的光學系統架構簡易且高精密,其雷射穩定度、 相位解析度(達nm)皆優於傳統測量系統;且不需複雜之光學校 正、光功率檢測,並於不破壞樣品液晶盒之下進行液晶盒的傾 角錨定能量測量。 3 ·本發顿裝置可同時細於減盒厚歧麵肖的量測,而不 需更換或加入任何光學組件;反觀習知技術,往往針對不同Lc 參數,其裝置亦將不同,因此本技麟點優異於習知技術,故 可達多功能之效益。 本發明纽乃咖—價位低廉、架構簡單的共光料轩涉褒 置進订相城取’不t如f知麟賴量光功率方式之繁雜實驗程 序且不易又糾擾動之干擾。另外,我們可同時藉由本發明裳置 來進行液B曰風又電麼擾動所造成的相位變化以及光入射角與相位 延遲之相’械魏晶盒解度及麵肖,料需要如 習知技術必料私_參數量_錢硕的光學制系統故 20 200811429 本發明裝置具衫舰_效益。將制得_傾纽厚度帶入模 擬軟體’亚社給定不同錯定能量條件下,理論分析液晶盒的相位⑻ /'1/V關係BJ ’藉由模擬出來的相位延遲與電壓倒數關係曲線 (R 1/V)和貝驗1聽果比對得出最合理之傾角錨定能量。 以上所述,僅為本發明之一可行實施例,並非用以限定本發明 之專利細’凡舉依據下列申請翻細所述之内容、舰以及其 精神而為之其他變化的等效實施,皆應包含於本發明之專利範圍 内。本發明所具體狀於申請翻_之結構特徵,未見於同類技 術’且具實用性、進步性與產業利用性,已符合發明專利要件,爰 依法具文提㈣請’騎肖局依法核予專利以賴本申請人合 法之權益。 【圖式簡單說明】 圖式簡單說明: (一)圖式部份: 第一圖為本發明液晶盒在不同電壓下其液晶分子之傾角分佈示意 圖; 第-圖為本發明之共絲外差干涉系統架構示意圖; 第三圖為本發明量測液晶盒相位變化與電壓關係示意圖; 第四圖為本發明R-1/V實驗結果與理論模擬比較圖;及 第五圖為本發明R-1/V實驗與理論配比圖。 【主要元件符號說明】 (10)雙頻雷射光源 (11)分光器 21 200811429 (12)(13)檢偏板 (14)(15)光偵測器 * (16)相位計 (20)液晶盒 22The phase shift of the liquid crystal cell under the action of an external helmet is measured by the common optical path heterodyne interference measuring system of the present invention. A Zeeman laser light source emits a line-biased laser beam having two different frequencies and perpendicular to each other, the laser beam passing through a beam splitter (11) to generate a reference light and passing through the liquid crystal cell (20) The test light is applied, and the interference plate (12) (13) is used to respectively generate the interference phenomenon of the beat signal by the two mutually perpendicularly polarized light of the reference light and the test light signal, respectively, and respectively by the light detector (14) and (15) Received and then input the signal into the phase meter (16) for phase measurement, and then the dependence of the applied voltage on the phase change can be obtained. Since the two mutually orthogonal differential-frequency linearly polarized light in the signal light is a common optical path transmission, the phase obtained by the phase meter is completely derived from the refraction characteristics of the liquid crystal cell. The relationship between the phase delay and the applied voltage is measured by the apparatus of the present invention. The range of the applied voltage in this experimental example is from 〇v to 7〇v. Wherein, the heterodyne interference 1 measuring device of the present invention is also applicable to the reflection of a reflective horizontally arranged liquid crystal cell. When the test light passes through the mirror in the liquid crystal cell, the light is reflected, and then the light is detected. For the purpose of receiving, it can also achieve the purpose of phase detection. After measuring the change of the voltage generated by the addition of the voltage, the magnitude of the anchor energy is determined by the _bit delay of the experiment and the reciprocal of the maximum voltage (1). /v earning a graph to compare with the theoretical number of results, we can infer the value of the misalignment coefficient of the dip. Therefore, using ^|^(Mouse = thickness and face angle of the film, the Kede people will be checked and analyzed; Therefore, starting with the second, only the relationship diagram of the electric phase phase, the maximum phase delay can be obtained by extrapolation techniques to determine the thickness of the liquid crystal cell (eg, References, Dirty EjWpTe, (9), 17 -; ι 200811429 PP. 77~81, 2005); As for the pretilt angle measurement, the crystal rotation method is used, and the dependence of the phase on the incident angle of the light is measured by the method of the present invention, and the measurement result of the experiment is found. The angle of incidence of the maximum phase delay can be accurately measured for the pretilt value of the cell (eg, Reference: Society for Information Display, IDW/AD, 05, 1, pp. 209-210, 2005) Related parameters of the material (n//, n±, K11, k33, %, and ε±) and The amount of liquid crystal cell thickness and pretilt angle are substituted into the Mouse LCD software, and different tilt anchoring energies are given to simulate the correlation between different voltages and dip distributions. As shown in Figure 1, 'the voltage is different from the dip distribution. The phase change caused. Since the reciprocal (R4/V) of the phase applied voltage of the liquid crystal cell will be linear when the high voltage is applied, the high voltage range of the comparative example of the experimental example of the present invention is taken at 40-65v. Within the interval (this segment is a linear region), the phase dependence of the simulated phase change and the reciprocal of the voltage with a given dip anchoring energy is compared with the experimental phase _1/v curve, as shown in the figure. The comparison between the R4/V experimental curve and the simulation results of the four is shown in the figure. The simulated tilt angle energy range is 5.8*l (R-1/V curve of T3J/m2~6.3*HT3J/m2 and this The results of the experimental example are the closest. Therefore, we will enlarge the graph in Fig. 4 and intercept the partial results measured under the high voltage for the second comparison. It is hoped that the simulated phase delay and voltage curve (R4) /V) and experimental data west line ratio The most reasonable angle of the pinning energy is obtained. As shown in the R4/v flut curve of Figure 5, the anchoring energy of the liquid crystal cell test piece can be successfully obtained to be 5.95*1〇-3J/m2. Energy is a model of strong kinetic energy. 18 200811429 贰·Technical characteristics of the invention, 1 • Phase-domain technique: This (four) needle crystal box _ liquid crystal molecular dielectric anisotropy with the applied voltage changes The amount of delay variation is directly intercepted by the phase difference of the molecular orientation in the liquid crystal cell by means of the common optical path heterodyne interference, instead of the light intensity and then converted back to the phase. Therefore, the technology provided by the invention can accurately obtain the phase delay amount, and then use the theoretical analysis and the experimental result to push back the liquid crystal cell (four) constant energy, which is in the progress of the industrial measurement, the precision and the high sensitivity application. Great development potential. 2·Optical Miscellaneous··································································································· The measurement of the phase delay 造成 caused by the applied voltage; therefore, it conforms to the invention of simplifying the measurement operation procedure and industrial applicability. 3 · Optical theory · ♦ In the traditional high-field technology, the capacitor term is retained. Therefore, it is necessary to measure the capacitance of the liquid crystal cell in order to obtain the value of the liquid crystal cell capacitor. The wrong energy theory of the present invention is improved by using a simplified high electric field (RV) technology, and the applied voltage is in a voltage range corresponding to more than six times the threshold voltage and causing 80% of the maximum phase difference. ' 纟 Delay is inversely related to the voltage reciprocal. In this linear interval, the experiment is performed and the value of the Ficing H(10) Xiao Caineng is considered; so that there is no need to advance the amount in the alignment process. Measure the size of the capacitor. The method is simple and easy to operate, and the method is also applicable to the measurement of a commercial thin liquid crystal cell. Meanwhile, the common optical path design of the present invention can accurately measure the phase of the liquid crystal cell 19 200811429, thereby providing an industrial application. The technical effect of the present invention is as follows: 1. The optical system of the present invention belongs to the common optical path interference, and since the traveling paths of the two mutually orthogonal linear polarized lights are the same, the phase difference between the two polarized lights is completely composed of liquid crystal molecules. Caused by the refraction anisotropy. In addition, because the signal captured by the system is phase rather than light intensity, it can avoid the influence of external environment disturbance, laser power instability and multi-beam interference, so it can achieve high precision and high sensitivity measurement. 2. The optical system used in the present invention is simple and highly precise, and its laser stability and phase resolution (up to nm) are superior to conventional measurement systems; and no complicated optical correction, optical power detection, and no The tilt anchor energy measurement of the liquid crystal cell is performed under the sample cell. 3 · The Benton device can measure the thickness of the box at the same time without replacing or adding any optical components. In contrast, the conventional technology often has different devices for different Lc parameters, so the technology is different. The lining is superior to the conventional technology, so it can reach the benefits of multi-functionality. The invention of the present invention is a low-priced, simple structure of the common light material 轩 involved in the phase of the city to take the 'nothing, such as the knowledge of the optical power of the complex experimental procedures and difficult to disturb the interference. In addition, we can simultaneously perform the phase change caused by the liquid B hurricane and the electric disturbance by the skirt of the present invention, and the phase of the incident angle and the phase retardation of the material, and the material needs to be as known. Technology must be private _ parameter quantity _ Qian Shuo's optical system so 20 200811429 The device of the invention has a shirt ship _ benefits. The thickness of the obtained _ 纽 纽 带 模拟 模拟 模拟 模拟 模拟 模拟 模拟 模拟 亚 亚 亚 亚 亚 亚 亚 亚 亚 亚 亚 亚 亚 亚 亚 亚 给 给 给 给 给 给 给 给 给 给 给 给 给 给 给 给 给 给 给 给 给 给 给(R 1/V) and Beacon 1 compare the results to obtain the most reasonable tilt anchoring energy. The above is only one of the possible embodiments of the present invention, and is not intended to limit the scope of the patents of the present invention. All should be included in the scope of the patent of the present invention. The invention is specific to the structural features of the application, and is not found in the same technology' and has practicality, advancement and industrial applicability, and has met the requirements of the invention patent, and has been submitted according to law (4) The patent is based on the lawful interest of the applicant. [Simple description of the diagram] The following is a brief description: (1) Schematic part: The first figure is a schematic diagram of the inclination distribution of liquid crystal molecules of the liquid crystal cell of the present invention at different voltages; Schematic diagram of the structure of the interference system; the third figure is a schematic diagram of the relationship between the phase change and the voltage of the measuring liquid crystal cell of the present invention; the fourth figure is a comparison chart of the experimental results and the theoretical simulation of the R-1/V of the present invention; and the fifth figure is the R- of the present invention. 1/V experimental and theoretical ratio chart. [Description of main component symbols] (10) Dual-frequency laser light source (11) Beam splitter 21 200811429 (12) (13) analyzer board (14) (15) photodetector* (16) phase meter (20) liquid crystal Box 22

Claims (1)

200811429 十、申請專利範圍: 1·種向列型液晶盒表面錨定能量特性之測定方法,包括·· 以液晶盒做為待測物; 對於該液晶盒施加電壓; 配合共光程外差頻干涉技術以分析該液晶盒的液晶分子在電 壓作用下之相位變化,並測量出電場作用下液晶相位變化與電壓的 倒數(1/V)的關係;及 將該相位變化辅以數學模擬方式分析,並將該量測結果與理論 數值相比對擬合,進而得到該液晶盒在電壓作用下之液晶分子之傾 角錯定能量。 2. 如申請專利細第i項所述的方法’其中,截取高電壓作用下所 置測的結果進行第二次比對擬合,進而精確得到該錯定能量。 3. 如申”月專利範圍第1項所述的方法,其中,該液晶盒已經過摩擦 配向處理,使魏晶纽量财可被定義出下縣度之則錫定能 • 量。 4. 如申請專利細们項所述的方法,其中,所測量得到的相位變 化經數學計算而得到鎌晶盒的厚度及麵角,再以該厚度及預傾 ♦角計算出該液晶盒之理論傾角錨定能量。 、 • 5.如巾請專利細第4項所述的方法,其中,以該液晶盒之厚度及預 傾角計算出該理論錯定能量的方式,是將該厚度及預傾角代入 Mouse LCD軟體而求得該理論傾角錨定能量。 6·如申請專利範圍第!項所述的方法,其中,所得的相位變化經數學 23 200811429 計算而得到該液晶盒的厚声 ^ 又預傾角,再以該厚度及預傾角計算出 該液晶盒之理論傾角錯定能吾 化此里,另給定不同的傾角錨定能所模擬出 電壓與傾角分佈所計算後的相 ^ 變化’亚將该相位變化與量測所得 相位變化曲線相比對擬人, 人& α再截取尚電壓作用下所量測的結果進行 第二次比對,進而精確得到該錨定能量。 7.如申請專利範圍第6項所述的方法,其中,以該液晶盒之厚度及預200811429 X. Patent application scope: 1. The method for determining the anchoring energy characteristics of the nematic liquid crystal cell, including · using the liquid crystal cell as the object to be tested; applying voltage to the liquid crystal cell; The interference technique analyzes the phase change of the liquid crystal molecules of the liquid crystal cell under the action of voltage, and measures the relationship between the phase change of the liquid crystal and the reciprocal of the voltage (1/V) under the action of the electric field; and analyzes the phase change by mathematical simulation And comparing the measured result with the theoretical value, thereby obtaining the misalignment energy of the tilt angle of the liquid crystal molecule under the voltage of the liquid crystal cell. 2. The method described in the patent application item i, wherein the result of the high voltage is intercepted for the second alignment, and the misaligned energy is accurately obtained. 3. The method of claim 1, wherein the liquid crystal cell has been subjected to frictional alignment processing, so that the Wei Jing New Energy can be defined as the tin level of the lower county. The method of claim 1, wherein the measured phase change is mathematically calculated to obtain a thickness and a face angle of the crystal box, and the theoretical tilt angle of the liquid crystal cell is calculated by the thickness and the pre-tilt angle. The method of claim 4, wherein the method of calculating the theoretically determined energy by the thickness and the pretilt angle of the liquid crystal cell is to substitute the thickness and the pretilt angle. The Mouse LCD software is used to obtain the theoretical tilt anchoring energy. 6. The method of claim 2, wherein the resulting phase change is calculated by Math 23 200811429 to obtain a thick sound of the liquid crystal cell and a pretilt angle. Then, the theoretical tilt angle of the liquid crystal cell is calculated by the thickness and the pretilt angle, and the phase change of the voltage and the dip distribution calculated by different tilt anchor energies is given. The phase change Compared with the phase curve obtained by the measurement, the second comparison is performed on the results measured by the anthropomorphic, human & alpha re-intercepting voltage, and the anchoring energy is accurately obtained. The method of claim 6, wherein the thickness of the liquid crystal cell and the pre- 傾角計Μ紐論缺能量財式,是_厚度及麵角代入 Mouse LCD軟體而求得談理論傾角錨定能量。 8.如申請專利細_所述財法,其巾,其中,紐晶盒經過摩 擦配向,使該液晶盒於量測中可被定義出下壓深度之傾角錫定能 9.如申請專利範圍第6或4項所述的方法,其中,將液晶盒的相關參 數n" ru、Kn、1C33、ε"、ε〇_及所測量得到液晶盒厚度與預傾角代 鳩_ LCD軟體’並分別給定不_則缺能來模擬外加不同 的電壓與儲分佈關雜,再賴肖分佈制不同電壓所造成的 相位變化。 10·如申請專利細第1項所述的方法,其巾,储由改變施加在該 液晶盒的電壓大小,並量綱液晶盒之液晶指向因不同電壓而改變 所引起的相位延遲與變化,將該相位變化辅以數學模擬方式分析, 並將該量測結果與理論數值相比對擬合,進而得到該液晶盒在電壓 作用下之液晶分子之傾角錨定能量。。 11·如申請專利範圍第1項所述的方法,其中,該差頻干涉技術是以 24 200811429 一外差干涉置測糸統來置測該液晶盒’得到該液晶盒在外加電壓作 用下的相位變化。 12·如申請專利範圍第11項所述的方法,其中,該外差干涉量測系統 量測該液晶盒的相位變化之方式,是先發射一同時具有兩個不同頻 率且互相垂直的偏極光之雷射光束,該雷射光束經一分光器而產生 一參考光及通過該液晶盒上的測試光,並利用檢偏板分別使在參考 光及測試光訊號的二互相垂直偏振光產生拍頻訊號外差干涉現 _ 象’並分別各由光偵測器和加以接收,再輸入至相位計,進而求得 該相位變化。 13·如申請專利範圍第U項所述的方法,其中,該外差干涉量測系統 包括有: 一雙頻雷射光源,用以產生穩頻雷射,該雷射同時具有兩個不 同頻率且互相垂直之偏極光; 一分光器,用以對該兩互相垂直的偏極光作用而產生一參考光 肇及一作用在該液晶盒上的測試光; 二檢偏板,分別使在參考光及訊號光中的二垂直光在45。方向 產生拍頻干涉; - 二光偵測器,分別接收該測試光與該參考光;及 - 至少一相位計,用以求得該測試光與該參考光之間的相位差 值。 14·如申請專利範圍第i項所述的方法,其中,該液晶盒為一水平配 列的液晶盒。 25 200811429 、15·如申响專利範圍第1項所述的方法,其中,所比對擬合的高電>1 範圍是取在40-70V的區間内。 16·-種向列酿晶錄面斷能量特性之測定系統咬―假用以作 用在液晶盒的外差干涉量測裝置,該外差干涉量測裝置包括有: 一雙頻雷射光源,用以產生穩頻雷射,該雷射同時具有兩個不 同頻率且互相垂直之偏極光; 一分光器,用以使含有兩互相垂直的偏極光的光束分開而產生 馨一參考光及一作用在該液晶盒上的測試光; 二檢偏板,並使該二偏極光產生拍頻訊號外差干涉現象,· 二光偵測器,分別接收該測試光與該參考光;及 至少一相位計,用以求得該測試光與該參考光的相位差值。 17.如申請專利範圍第16項所述之測定系統,該外差干涉量測裝置亦 適用於一反射式的水平配列的液晶盒之錨定能量測量。The dip meter Μ 论 论 缺 缺 缺 缺 缺 缺 缺 缺 缺 缺 缺 缺 缺 缺 缺 Mouse Mouse Mouse Mouse Mouse Mouse Mouse Mouse Mouse Mouse Mouse Mouse Mouse Mouse Mouse 8. As claimed in the patent _ the financial method, the towel, wherein the button is subjected to frictional alignment, so that the liquid crystal cell can be defined in the measurement of the inclination depth of the depression. 9. If the patent application scope The method according to Item 6 or 4, wherein the relevant parameters of the liquid crystal cell n" ru, Kn, 1C33, ε ", ε 〇 _ and the measured liquid crystal cell thickness and pretilt angle 鸠 _ LCD software ' and respectively Given the absence of _, the lack of energy to simulate the addition of different voltages and storage distribution, and then the distribution of different voltages caused by the phase change. 10. The method of claim 1, wherein the towel is stored by varying the magnitude of the voltage applied to the liquid crystal cell and the phase retardation and change caused by the change in the liquid crystal orientation of the liquid crystal cell due to different voltages. The phase change is analyzed by mathematical simulation, and the measured result is compared with the theoretical value, thereby obtaining the tilt anchoring energy of the liquid crystal molecule under the voltage of the liquid crystal cell. . 11. The method of claim 1, wherein the difference frequency interference technique is to measure the liquid crystal cell by using a heterodyne interferometry system of 24 200811429 to obtain the liquid crystal cell under the applied voltage. Phase change. 12. The method of claim 11, wherein the heterodyne interference measurement system measures the phase change of the liquid crystal cell by first emitting a polarized light having two different frequencies and being perpendicular to each other. a laser beam, which generates a reference light and a test light passing through the liquid crystal cell through a beam splitter, and uses the analyzer to respectively generate two mutually perpendicularly polarized light of the reference light and the test light signal. The frequency difference heterodyne interference _ image 'is separately received by the photodetector and then input to the phase meter to determine the phase change. 13. The method of claim U, wherein the heterodyne interference measurement system comprises: a dual frequency laser source for generating a frequency stabilized laser having two different frequencies simultaneously And a polarizing light perpendicular to each other; a beam splitter for generating a reference pupil and a test light acting on the liquid crystal cell by the two mutually perpendicular polarized lights; and the second detecting plate respectively making the reference light And the two vertical lights in the signal light are at 45. The direction generates beat frequency interference; - the two photodetectors respectively receive the test light and the reference light; and - at least one phase meter for determining a phase difference between the test light and the reference light. 14. The method of claim i, wherein the liquid crystal cell is a horizontally arranged liquid crystal cell. The method of claim 1, wherein the range of the fitted high power > 1 is taken within the range of 40-70V. 16·-Determination of the energy characteristics of the nematic data recording system. The system bite-false is used to act on the heterodyne interference measuring device of the liquid crystal cell. The heterodyne interference measuring device comprises: a dual-frequency laser light source, For generating a frequency-stabilized laser, the laser has two polarized lights of different frequencies and perpendicular to each other; a beam splitter for separating the beams containing two mutually perpendicular polarized lights to generate a reference light and a function a test light on the liquid crystal cell; a second detecting plate, and causing the two polarized lights to generate a beat signal heterodyne interference phenomenon, the two photodetectors respectively receiving the test light and the reference light; and at least one phase And determining a phase difference between the test light and the reference light. 17. The assay system of claim 16, wherein the heterodyne interference measuring device is also adapted for anchor energy measurement of a reflective horizontally arranged liquid crystal cell. 2626
TW95131156A 2006-08-24 2006-08-24 A method and system for measuring the liquid crystal polar anchoring energy TWI318683B (en)

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Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110501337A (en) * 2019-08-27 2019-11-26 东南大学 The test method of liquid crystal arrangement orientation in a kind of ordered porous nm interference film

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN110501337A (en) * 2019-08-27 2019-11-26 东南大学 The test method of liquid crystal arrangement orientation in a kind of ordered porous nm interference film
CN110501337B (en) * 2019-08-27 2022-04-26 东南大学 Method for testing liquid crystal arrangement orientation in ordered porous nano interference film

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