TW200744163A - Semiconductor device with L-shape spacer and method of fabricating the same - Google Patents

Semiconductor device with L-shape spacer and method of fabricating the same

Info

Publication number
TW200744163A
TW200744163A TW095118551A TW95118551A TW200744163A TW 200744163 A TW200744163 A TW 200744163A TW 095118551 A TW095118551 A TW 095118551A TW 95118551 A TW95118551 A TW 95118551A TW 200744163 A TW200744163 A TW 200744163A
Authority
TW
Taiwan
Prior art keywords
insulating layer
semiconductor device
substrate
fabricating
same
Prior art date
Application number
TW095118551A
Other languages
English (en)
Other versions
TWI299549B (en
Inventor
Chung-We Pan
Shi-Cheng Lin
Ching-Hung Fu
Chih-Ping Chung
Original Assignee
Promos Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Promos Technologies Inc filed Critical Promos Technologies Inc
Priority to TW095118551A priority Critical patent/TWI299549B/zh
Priority to US11/465,881 priority patent/US7524732B2/en
Publication of TW200744163A publication Critical patent/TW200744163A/zh
Application granted granted Critical
Publication of TWI299549B publication Critical patent/TWI299549B/zh

Links

Classifications

    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B41/00Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates
    • H10B41/30Electrically erasable-and-programmable ROM [EEPROM] devices comprising floating gates characterised by the memory core region
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01LSEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
    • H01L29/00Semiconductor devices specially adapted for rectifying, amplifying, oscillating or switching and having potential barriers; Capacitors or resistors having potential barriers, e.g. a PN-junction depletion layer or carrier concentration layer; Details of semiconductor bodies or of electrodes thereof ; Multistep manufacturing processes therefor
    • H01L29/40Electrodes ; Multistep manufacturing processes therefor
    • H01L29/401Multistep manufacturing processes
    • H01L29/4011Multistep manufacturing processes for data storage electrodes
    • H01L29/40114Multistep manufacturing processes for data storage electrodes the electrodes comprising a conductor-insulator-conductor-insulator-semiconductor structure
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10BELECTRONIC MEMORY DEVICES
    • H10B69/00Erasable-and-programmable ROM [EPROM] devices not provided for in groups H10B41/00 - H10B63/00, e.g. ultraviolet erasable-and-programmable ROM [UVEPROM] devices

Landscapes

  • Engineering & Computer Science (AREA)
  • Power Engineering (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Ceramic Engineering (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • General Physics & Mathematics (AREA)
  • Physics & Mathematics (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Semiconductor Memories (AREA)
  • Non-Volatile Memory (AREA)
  • Element Separation (AREA)
  • Thin Film Transistor (AREA)
TW095118551A 2006-05-25 2006-05-25 Semiconductor device with l-shape spacer and method of fabricating the same TWI299549B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW095118551A TWI299549B (en) 2006-05-25 2006-05-25 Semiconductor device with l-shape spacer and method of fabricating the same
US11/465,881 US7524732B2 (en) 2006-05-25 2006-08-21 Semiconductor device with L-shaped spacer and method of manufacturing the same

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW095118551A TWI299549B (en) 2006-05-25 2006-05-25 Semiconductor device with l-shape spacer and method of fabricating the same

Publications (2)

Publication Number Publication Date
TW200744163A true TW200744163A (en) 2007-12-01
TWI299549B TWI299549B (en) 2008-08-01

Family

ID=38748738

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095118551A TWI299549B (en) 2006-05-25 2006-05-25 Semiconductor device with l-shape spacer and method of fabricating the same

Country Status (2)

Country Link
US (1) US7524732B2 (zh)
TW (1) TWI299549B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI499043B (zh) * 2012-07-19 2015-09-01 Winbond Electronics Corp 快閃記憶體元件之製造方法

Families Citing this family (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7588982B2 (en) * 2006-08-29 2009-09-15 Micron Technology, Inc. Methods of forming semiconductor constructions and flash memory cells
KR101831936B1 (ko) 2011-12-22 2018-02-26 삼성전자주식회사 박막 형성 방법 및 이를 이용한 반도체 소자의 제조 방법
CN103579122B (zh) * 2012-08-09 2017-03-08 华邦电子股份有限公司 快闪存储器元件的制造方法
CN104716099B (zh) * 2013-12-13 2018-12-14 旺宏电子股份有限公司 非挥发性记忆体及其制造方法
US9761662B1 (en) 2017-02-03 2017-09-12 Globalfoundries Inc. Active area shapes reducing device size

Family Cites Families (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0862207A1 (de) * 1997-02-27 1998-09-02 Siemens Aktiengesellschaft Verfahren zur Herstellung eines DRAM-Grabenkondensators
US20050006795A1 (en) * 2003-07-09 2005-01-13 Cheng-Ming Yih Corner free structure of nonvolatile memory

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI499043B (zh) * 2012-07-19 2015-09-01 Winbond Electronics Corp 快閃記憶體元件之製造方法

Also Published As

Publication number Publication date
TWI299549B (en) 2008-08-01
US7524732B2 (en) 2009-04-28
US20070272962A1 (en) 2007-11-29

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