TW200742858A - Probe assembly for inspecting of flat panel display - Google Patents

Probe assembly for inspecting of flat panel display

Info

Publication number
TW200742858A
TW200742858A TW096115405A TW96115405A TW200742858A TW 200742858 A TW200742858 A TW 200742858A TW 096115405 A TW096115405 A TW 096115405A TW 96115405 A TW96115405 A TW 96115405A TW 200742858 A TW200742858 A TW 200742858A
Authority
TW
Taiwan
Prior art keywords
probe head
head portion
probe
inspecting
probe assembly
Prior art date
Application number
TW096115405A
Other languages
Chinese (zh)
Other versions
TWI331221B (en
Inventor
Chan-Jung Park
Original Assignee
Kodi S Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kodi S Ltd filed Critical Kodi S Ltd
Publication of TW200742858A publication Critical patent/TW200742858A/en
Application granted granted Critical
Publication of TWI331221B publication Critical patent/TWI331221B/en

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)

Abstract

A probe related to the present invention features a first probe head portion extending forward from a central portion forming a forward diverging V-shaped notch that defines an upper arm and a lower arm for preventing the probe head portion from bending. A probe assembly related to the present invention guides slits formed by a probe head portion and grooves and holes of the probe head to prevent the probe head portion from bending and being applicable to fine pitch electrodes.
TW096115405A 2006-05-01 2007-04-30 Probe assembly for inspecting of flat panel display TWI331221B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020060039256A KR100692179B1 (en) 2006-05-01 2006-05-01 Probe assembly for inspecting of flat panel display

Publications (2)

Publication Number Publication Date
TW200742858A true TW200742858A (en) 2007-11-16
TWI331221B TWI331221B (en) 2010-10-01

Family

ID=38102957

Family Applications (1)

Application Number Title Priority Date Filing Date
TW096115405A TWI331221B (en) 2006-05-01 2007-04-30 Probe assembly for inspecting of flat panel display

Country Status (2)

Country Link
KR (1) KR100692179B1 (en)
TW (1) TWI331221B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI709751B (en) * 2018-06-07 2020-11-11 日商日本麥克隆尼股份有限公司 Probe assembly

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100760538B1 (en) 2007-06-01 2007-09-19 나노세미텍(주) Needle block for probe block with blade needle of supporter type
JP5396104B2 (en) 2009-03-05 2014-01-22 株式会社日本マイクロニクス Probe assembly
CN107025871B (en) * 2017-06-13 2021-01-26 京东方科技集团股份有限公司 Display panel detection device and detection method
KR102647469B1 (en) * 2021-11-29 2024-03-13 임동현 Micro LED inspection device

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP3750831B2 (en) * 1996-10-28 2006-03-01 株式会社日本マイクロニクス Probe assembly
KR200254022Y1 (en) * 2001-08-29 2001-11-23 윤수 Probe card for testing LCD
KR100599767B1 (en) * 2004-06-07 2006-07-13 (주)유비프리시젼 a probe and an assembly body of probe with using the above probe
KR100586011B1 (en) * 2004-08-04 2006-06-08 주식회사 코디에스 Probe block for patern inspection of flat display panel
KR20060023250A (en) * 2004-09-09 2006-03-14 주식회사 세디콘 Probe block of lcd inspection system

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI709751B (en) * 2018-06-07 2020-11-11 日商日本麥克隆尼股份有限公司 Probe assembly

Also Published As

Publication number Publication date
TWI331221B (en) 2010-10-01
KR100692179B1 (en) 2007-03-12

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees