TW200736640A - High voltage test mechanism for chip device and test method thereof - Google Patents

High voltage test mechanism for chip device and test method thereof

Info

Publication number
TW200736640A
TW200736640A TW095109350A TW95109350A TW200736640A TW 200736640 A TW200736640 A TW 200736640A TW 095109350 A TW095109350 A TW 095109350A TW 95109350 A TW95109350 A TW 95109350A TW 200736640 A TW200736640 A TW 200736640A
Authority
TW
Taiwan
Prior art keywords
unit
chip device
transferring
high voltage
positioning
Prior art date
Application number
TW095109350A
Other languages
Chinese (zh)
Other versions
TWI302207B (en
Inventor
Hsien-Wu Chan
Kao-Hsien Chou
Original Assignee
Chipcera Technology Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Chipcera Technology Co Ltd filed Critical Chipcera Technology Co Ltd
Priority to TW095109350A priority Critical patent/TW200736640A/en
Publication of TW200736640A publication Critical patent/TW200736640A/en
Application granted granted Critical
Publication of TWI302207B publication Critical patent/TWI302207B/zh

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  • Testing Of Individual Semiconductor Devices (AREA)

Abstract

This invention provides a high voltage test mechanism for chip device which comprises a transferring/positioning unit, a material supplying unit, a vacuum material feeding unit, a measuring unit and a classifying/material retrieving unit, and a test method. The transferring/positioning unit obtains at least a chip device provided by the material supplying unit at a first positioning point and uses the vacuum material feeding unit to place the chip device and, at the same time, retrieve the chip device to be tested by the measuring unit. When the transferring/positioning unit is at the second positioning point, the measuring unit is used to perform high voltage test of the chip device and then a classifying/material retrieving is used to perform quality classification and unload. When the transferring/positioning unit is transferring, charging and discharging actions are performed by the measuring unit to greatly save the time of high voltage test of the chip device by the measuring unit.
TW095109350A 2006-03-17 2006-03-17 High voltage test mechanism for chip device and test method thereof TW200736640A (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW095109350A TW200736640A (en) 2006-03-17 2006-03-17 High voltage test mechanism for chip device and test method thereof

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW095109350A TW200736640A (en) 2006-03-17 2006-03-17 High voltage test mechanism for chip device and test method thereof

Publications (2)

Publication Number Publication Date
TW200736640A true TW200736640A (en) 2007-10-01
TWI302207B TWI302207B (en) 2008-10-21

Family

ID=45070426

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095109350A TW200736640A (en) 2006-03-17 2006-03-17 High voltage test mechanism for chip device and test method thereof

Country Status (1)

Country Link
TW (1) TW200736640A (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108761309A (en) * 2018-05-23 2018-11-06 昆山龙雨智能科技有限公司 A kind of test device

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN108761309A (en) * 2018-05-23 2018-11-06 昆山龙雨智能科技有限公司 A kind of test device
CN108761309B (en) * 2018-05-23 2024-05-17 昆山龙雨智能科技有限公司 Testing device

Also Published As

Publication number Publication date
TWI302207B (en) 2008-10-21

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