TW200736640A - High voltage test mechanism for chip device and test method thereof - Google Patents
High voltage test mechanism for chip device and test method thereofInfo
- Publication number
- TW200736640A TW200736640A TW095109350A TW95109350A TW200736640A TW 200736640 A TW200736640 A TW 200736640A TW 095109350 A TW095109350 A TW 095109350A TW 95109350 A TW95109350 A TW 95109350A TW 200736640 A TW200736640 A TW 200736640A
- Authority
- TW
- Taiwan
- Prior art keywords
- unit
- chip device
- transferring
- high voltage
- positioning
- Prior art date
Links
Landscapes
- Testing Of Individual Semiconductor Devices (AREA)
Abstract
This invention provides a high voltage test mechanism for chip device which comprises a transferring/positioning unit, a material supplying unit, a vacuum material feeding unit, a measuring unit and a classifying/material retrieving unit, and a test method. The transferring/positioning unit obtains at least a chip device provided by the material supplying unit at a first positioning point and uses the vacuum material feeding unit to place the chip device and, at the same time, retrieve the chip device to be tested by the measuring unit. When the transferring/positioning unit is at the second positioning point, the measuring unit is used to perform high voltage test of the chip device and then a classifying/material retrieving is used to perform quality classification and unload. When the transferring/positioning unit is transferring, charging and discharging actions are performed by the measuring unit to greatly save the time of high voltage test of the chip device by the measuring unit.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW095109350A TW200736640A (en) | 2006-03-17 | 2006-03-17 | High voltage test mechanism for chip device and test method thereof |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW095109350A TW200736640A (en) | 2006-03-17 | 2006-03-17 | High voltage test mechanism for chip device and test method thereof |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200736640A true TW200736640A (en) | 2007-10-01 |
TWI302207B TWI302207B (en) | 2008-10-21 |
Family
ID=45070426
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095109350A TW200736640A (en) | 2006-03-17 | 2006-03-17 | High voltage test mechanism for chip device and test method thereof |
Country Status (1)
Country | Link |
---|---|
TW (1) | TW200736640A (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108761309A (en) * | 2018-05-23 | 2018-11-06 | 昆山龙雨智能科技有限公司 | A kind of test device |
-
2006
- 2006-03-17 TW TW095109350A patent/TW200736640A/en unknown
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN108761309A (en) * | 2018-05-23 | 2018-11-06 | 昆山龙雨智能科技有限公司 | A kind of test device |
CN108761309B (en) * | 2018-05-23 | 2024-05-17 | 昆山龙雨智能科技有限公司 | Testing device |
Also Published As
Publication number | Publication date |
---|---|
TWI302207B (en) | 2008-10-21 |
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