TW200736632A - Integrated circuit testing apparatus - Google Patents

Integrated circuit testing apparatus

Info

Publication number
TW200736632A
TW200736632A TW095111425A TW95111425A TW200736632A TW 200736632 A TW200736632 A TW 200736632A TW 095111425 A TW095111425 A TW 095111425A TW 95111425 A TW95111425 A TW 95111425A TW 200736632 A TW200736632 A TW 200736632A
Authority
TW
Taiwan
Prior art keywords
integrated circuit
testing apparatus
circuit testing
connecting module
pcb
Prior art date
Application number
TW095111425A
Other languages
Chinese (zh)
Other versions
TWI325500B (en
Inventor
Shih-Chi Chen
Original Assignee
King Yuan Electronics Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by King Yuan Electronics Co Ltd filed Critical King Yuan Electronics Co Ltd
Priority to TW95111425A priority Critical patent/TWI325500B/en
Publication of TW200736632A publication Critical patent/TW200736632A/en
Application granted granted Critical
Publication of TWI325500B publication Critical patent/TWI325500B/en

Links

Abstract

An apparatus with a flexible printed circuit board (PCB) for testing packaged integrated circuits is disclosed herein. The apparatus includes a connecting module, which electrically connects with a load board. The connecting module includes a flexible PCB positioned between an integrated circuit under test and the load board.
TW95111425A 2006-03-31 2006-03-31 Integrated circuit testing apparatus TWI325500B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW95111425A TWI325500B (en) 2006-03-31 2006-03-31 Integrated circuit testing apparatus

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW95111425A TWI325500B (en) 2006-03-31 2006-03-31 Integrated circuit testing apparatus

Publications (2)

Publication Number Publication Date
TW200736632A true TW200736632A (en) 2007-10-01
TWI325500B TWI325500B (en) 2010-06-01

Family

ID=45074259

Family Applications (1)

Application Number Title Priority Date Filing Date
TW95111425A TWI325500B (en) 2006-03-31 2006-03-31 Integrated circuit testing apparatus

Country Status (1)

Country Link
TW (1) TWI325500B (en)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI507703B (en) * 2011-11-01 2015-11-11 Apple Inc Electronic device and methods and systems for testing electronic devices
TWI548880B (en) * 2014-05-15 2016-09-11 漢民科技股份有限公司 Printed circuit board of probing card

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI507703B (en) * 2011-11-01 2015-11-11 Apple Inc Electronic device and methods and systems for testing electronic devices
TWI548880B (en) * 2014-05-15 2016-09-11 漢民科技股份有限公司 Printed circuit board of probing card

Also Published As

Publication number Publication date
TWI325500B (en) 2010-06-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees