TW200733280A - Improved automatic test equipment (ATE) and method of implementing the same - Google Patents
Improved automatic test equipment (ATE) and method of implementing the sameInfo
- Publication number
- TW200733280A TW200733280A TW095105217A TW95105217A TW200733280A TW 200733280 A TW200733280 A TW 200733280A TW 095105217 A TW095105217 A TW 095105217A TW 95105217 A TW95105217 A TW 95105217A TW 200733280 A TW200733280 A TW 200733280A
- Authority
- TW
- Taiwan
- Prior art keywords
- test equipment
- automatic test
- improved automatic
- ate
- memory
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/317—Testing of digital circuits
- G01R31/3181—Functional testing
- G01R31/319—Tester hardware, i.e. output processing circuits
- G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
- G01R31/31919—Storing and outputting test patterns
Landscapes
- Engineering & Computer Science (AREA)
- General Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Tests Of Electronic Circuits (AREA)
Priority Applications (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW095105217A TWI294153B (en) | 2006-02-16 | 2006-02-16 | Improved automatic test equipment (ate) and method of implementing the same |
US11/550,748 US20070192661A1 (en) | 2006-02-16 | 2006-10-18 | Automatic Test Equipment (ATE) Realized Through Sharing Same Memory Space by Instruction Data and Vector Data |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW095105217A TWI294153B (en) | 2006-02-16 | 2006-02-16 | Improved automatic test equipment (ate) and method of implementing the same |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200733280A true TW200733280A (en) | 2007-09-01 |
TWI294153B TWI294153B (en) | 2008-03-01 |
Family
ID=38370179
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095105217A TWI294153B (en) | 2006-02-16 | 2006-02-16 | Improved automatic test equipment (ate) and method of implementing the same |
Country Status (2)
Country | Link |
---|---|
US (1) | US20070192661A1 (zh) |
TW (1) | TWI294153B (zh) |
Families Citing this family (4)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US8310385B2 (en) * | 2009-05-13 | 2012-11-13 | Qualcomm, Incorporated | Systems and methods for vector-based analog-to-digital converter sequential testing |
CN105092992B (zh) * | 2014-04-15 | 2020-01-07 | 爱德万测试公司 | 用于在ate上进行向量控制的测试的方法和设备 |
CN107885711B (zh) * | 2017-11-13 | 2021-04-30 | 中国电子科技集团公司第四十一研究所 | 一种智能仪器的自动交检方法 |
US11430536B2 (en) | 2018-12-20 | 2022-08-30 | Advantest Corporation | Software-focused solution for arbitrary all-data odd sector size support |
Family Cites Families (6)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4764925A (en) * | 1984-06-14 | 1988-08-16 | Fairchild Camera & Instrument | Method and apparatus for testing integrated circuits |
US4875210A (en) * | 1988-01-06 | 1989-10-17 | Teradyne, Inc. | Automatic circuit tester control system |
US5657486A (en) * | 1995-12-07 | 1997-08-12 | Teradyne, Inc. | Automatic test equipment with pipelined sequencer |
US5737512A (en) * | 1996-05-22 | 1998-04-07 | Teradyne, Inc. | Fast vector loading for automatic test equipment |
GB9805054D0 (en) * | 1998-03-11 | 1998-05-06 | Process Intelligence Limited | Memory test system with buffer memory |
US6591213B1 (en) * | 2001-02-27 | 2003-07-08 | Inovys Corporation | Systems for providing zero latency, non-modulo looping and branching of test pattern data for automatic test equipment |
-
2006
- 2006-02-16 TW TW095105217A patent/TWI294153B/zh not_active IP Right Cessation
- 2006-10-18 US US11/550,748 patent/US20070192661A1/en not_active Abandoned
Also Published As
Publication number | Publication date |
---|---|
TWI294153B (en) | 2008-03-01 |
US20070192661A1 (en) | 2007-08-16 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |