TW200732636A - EMI rejection for temperature sensing diodes - Google Patents
EMI rejection for temperature sensing diodesInfo
- Publication number
- TW200732636A TW200732636A TW095132630A TW95132630A TW200732636A TW 200732636 A TW200732636 A TW 200732636A TW 095132630 A TW095132630 A TW 095132630A TW 95132630 A TW95132630 A TW 95132630A TW 200732636 A TW200732636 A TW 200732636A
- Authority
- TW
- Taiwan
- Prior art keywords
- emi
- semiconductor device
- remotely located
- terminals
- located semiconductor
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K1/00—Details of thermometers not specially adapted for particular types of thermometer
- G01K1/02—Means for indicating or recording specially adapted for thermometers
- G01K1/024—Means for indicating or recording specially adapted for thermometers for remote indication
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01K—MEASURING TEMPERATURE; MEASURING QUANTITY OF HEAT; THERMALLY-SENSITIVE ELEMENTS NOT OTHERWISE PROVIDED FOR
- G01K7/00—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements
- G01K7/01—Measuring temperature based on the use of electric or magnetic elements directly sensitive to heat ; Power supply therefor, e.g. using thermoelectric elements using semiconducting elements having PN junctions
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Measuring Temperature Or Quantity Of Heat (AREA)
- Measurement Of Current Or Voltage (AREA)
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/219,151 US7622903B2 (en) | 2005-09-02 | 2005-09-02 | EMI rejection for temperature sensing diodes |
Publications (2)
Publication Number | Publication Date |
---|---|
TW200732636A true TW200732636A (en) | 2007-09-01 |
TWI394939B TWI394939B (zh) | 2013-05-01 |
Family
ID=37831039
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095132630A TWI394939B (zh) | 2005-09-02 | 2006-09-01 | 溫度量測系統及方法 |
Country Status (2)
Country | Link |
---|---|
US (1) | US7622903B2 (zh) |
TW (1) | TWI394939B (zh) |
Families Citing this family (5)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7429129B2 (en) * | 2005-02-28 | 2008-09-30 | Standard Microsystems Corporation | Proportional settling time adjustment for diode voltage and temperature measurements dependent on forced level current |
US7405552B2 (en) * | 2006-01-04 | 2008-07-29 | Micron Technology, Inc. | Semiconductor temperature sensor with high sensitivity |
US9335223B2 (en) * | 2012-09-05 | 2016-05-10 | Texas Instruments Incorporated | Circuits and methods for determining the temperature of a transistor |
DE112013006869B4 (de) * | 2013-05-17 | 2019-05-23 | Intel Corporation (N.D.Ges.D. Staates Delaware) | Chipinterner Versorgungsgenerator unter Verwendung einer dynamischen Schaltungsreferenz |
US9495049B2 (en) * | 2014-05-18 | 2016-11-15 | Himax Technologies Limited | Electronic device with touch sensitive functionality |
Family Cites Families (26)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US4016763A (en) * | 1970-02-24 | 1977-04-12 | Rosemount Inc. | Two wire current transmitter responsive to a resistive temperature sensor input signal |
US3672215A (en) | 1969-09-08 | 1972-06-27 | Worth Well Surveys Inc | Apparatus employing diode junction means for measuring subterranean temperatures |
US3679992A (en) | 1971-06-01 | 1972-07-25 | Gen Electric | Tunnel diode oscillator fm temperature sensor |
DE2256197C2 (de) * | 1972-11-16 | 1974-03-07 | Danfoss A/S, Nordborg (Daenemark) | Meßwertumformer mit einem Kompensationsbrückenkreis |
US4220041A (en) * | 1977-04-07 | 1980-09-02 | Potter Bronson M | Alien liquid detector and control |
US4228684A (en) | 1979-06-04 | 1980-10-21 | General Motors Corporation | Remote temperature measuring system with semiconductor junction sensor |
DD244112A1 (de) | 1985-12-23 | 1987-03-25 | Magdeburg Getraenkemasch | Vorrichtung zum ueberfuehren von gegenstaenden |
WO1991006839A1 (de) | 1989-11-04 | 1991-05-16 | Fraunhofer-Gesellschaft zur Förderung der angewandten Forschung e.V. | Integrierbare temperatursensorschaltung |
US5195827A (en) | 1992-02-04 | 1993-03-23 | Analog Devices, Inc. | Multiple sequential excitation temperature sensing method and apparatus |
US5419637A (en) | 1993-11-03 | 1995-05-30 | Santa Barbara Research Center | Method and apparatus for measuring temperature using an inherently calibrated p-n junction-type temperature sensor |
WO1995020751A1 (de) | 1994-01-26 | 1995-08-03 | Horst Ahlers | Temperatursensor |
GB2292221B (en) | 1994-08-09 | 1998-05-27 | Texas Instruments Ltd | Hottest temperature sensor |
US5859558A (en) * | 1997-04-11 | 1999-01-12 | Raytheon Company | Low voltage analog front end |
US5982221A (en) | 1997-08-13 | 1999-11-09 | Analog Devices, Inc. | Switched current temperature sensor circuit with compounded ΔVBE |
US6008685A (en) * | 1998-03-25 | 1999-12-28 | Mosaic Design Labs, Inc. | Solid state temperature measurement |
US6097239A (en) * | 1999-02-10 | 2000-08-01 | Analog Devices, Inc. | Decoupled switched current temperature circuit with compounded ΔV be |
US6169442B1 (en) | 1999-04-13 | 2001-01-02 | Analog Devices, Inc. | IC monitoring chip and a method for monitoring temperature of a component in a computer |
US6554470B2 (en) | 2000-11-07 | 2003-04-29 | Maxim Integrated Products, Inc. | M-level diode junction temperature measurement method cancelling series and parallel parasitic influences |
US6554469B1 (en) * | 2001-04-17 | 2003-04-29 | Analog Devices, Inc. | Four current transistor temperature sensor and method |
US6480127B1 (en) * | 2001-09-27 | 2002-11-12 | National Semiconductor Corporation | Input sub-ranging converter system for sampling semiconductor temperature sensors |
US6847319B1 (en) | 2003-07-22 | 2005-01-25 | Standard Microsystems Corporation | Temperature-to-digital converter |
JP2005134145A (ja) * | 2003-10-28 | 2005-05-26 | Seiko Instruments Inc | 温度センサ回路 |
US7010440B1 (en) * | 2003-11-25 | 2006-03-07 | Analog Devices, Inc. | Method and a measuring circuit for determining temperature from a PN junction temperature sensor, and a temperature sensing circuit comprising the measuring circuit and a PN junction |
US7112948B2 (en) * | 2004-01-30 | 2006-09-26 | Analog Devices, Inc. | Voltage source circuit with selectable temperature independent and temperature dependent voltage outputs |
US7030793B2 (en) * | 2004-02-18 | 2006-04-18 | Standard Microsystems Corporation | Accurate testing of temperature measurement unit |
US7429129B2 (en) | 2005-02-28 | 2008-09-30 | Standard Microsystems Corporation | Proportional settling time adjustment for diode voltage and temperature measurements dependent on forced level current |
-
2005
- 2005-09-02 US US11/219,151 patent/US7622903B2/en active Active
-
2006
- 2006-09-01 TW TW095132630A patent/TWI394939B/zh active
Also Published As
Publication number | Publication date |
---|---|
US7622903B2 (en) | 2009-11-24 |
US20070055473A1 (en) | 2007-03-08 |
TWI394939B (zh) | 2013-05-01 |
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