TW200729803A - Dual sine-wave time stamp method and apparatus - Google Patents

Dual sine-wave time stamp method and apparatus

Info

Publication number
TW200729803A
TW200729803A TW095139868A TW95139868A TW200729803A TW 200729803 A TW200729803 A TW 200729803A TW 095139868 A TW095139868 A TW 095139868A TW 95139868 A TW95139868 A TW 95139868A TW 200729803 A TW200729803 A TW 200729803A
Authority
TW
Taiwan
Prior art keywords
time stamp
event
time
wave time
stamp method
Prior art date
Application number
TW095139868A
Other languages
English (en)
Other versions
TWI334288B (en
Inventor
Fang Xu
Original Assignee
Teradyne Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Teradyne Inc filed Critical Teradyne Inc
Publication of TW200729803A publication Critical patent/TW200729803A/zh
Application granted granted Critical
Publication of TWI334288B publication Critical patent/TWI334288B/zh

Links

Classifications

    • GPHYSICS
    • G04HOROLOGY
    • G04FTIME-INTERVAL MEASURING
    • G04F10/00Apparatus for measuring unknown time intervals by electric means
    • G04F10/06Apparatus for measuring unknown time intervals by electric means by measuring phase
    • GPHYSICS
    • G04HOROLOGY
    • G04FTIME-INTERVAL MEASURING
    • G04F10/00Apparatus for measuring unknown time intervals by electric means

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
  • Measurement Of Velocity Or Position Using Acoustic Or Ultrasonic Waves (AREA)
TW095139868A 2005-10-28 2006-10-27 Dual sine-wave time stamp method and apparatus TWI334288B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US11/261,897 US7378854B2 (en) 2005-10-28 2005-10-28 Dual sine-wave time stamp method and apparatus

Publications (2)

Publication Number Publication Date
TW200729803A true TW200729803A (en) 2007-08-01
TWI334288B TWI334288B (en) 2010-12-01

Family

ID=37997599

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095139868A TWI334288B (en) 2005-10-28 2006-10-27 Dual sine-wave time stamp method and apparatus

Country Status (3)

Country Link
US (1) US7378854B2 (zh)
TW (1) TWI334288B (zh)
WO (1) WO2007053413A2 (zh)

Families Citing this family (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP2128570A1 (de) * 2008-05-27 2009-12-02 Siemens Aktiengesellschaft Verwendung einer Messsignalauswertung einer Lagemesseinrichtung zur Ermittlung der zeitlichen Differenz zwischen einem ersten Ereignis und einem zweiten Ereignis
US9330563B2 (en) 2013-02-12 2016-05-03 Digimarc Corporation Synchronized metrology in power generation and distribution networks
US9230429B2 (en) 2011-08-15 2016-01-05 Digimarc Corporation A/B/C phase determination and synchrophasor measurement using common electric smart meters and wireless communications
US9883259B2 (en) 2011-08-15 2018-01-30 Digimarc Corporation Synchronized metrology in power generation and distribution networks
US9461743B1 (en) * 2014-07-16 2016-10-04 Rockwell Collins, Inc. Pulse to digital detection circuit
CN105307187B (zh) * 2014-07-31 2019-06-25 深圳罗德与施瓦茨贸易有限公司 用于开始时间同步信号产生的测量装置和测量方法
CA3040295A1 (en) * 2016-10-17 2018-04-26 Zomojo Pty Ltd Precision time stamping method and system
US10749534B2 (en) * 2017-06-28 2020-08-18 Analog Devices, Inc. Apparatus and methods for system clock compensation
US11962403B2 (en) 2019-04-01 2024-04-16 Cisco Technology, Inc. Method and apparatus for network time syncing
EP3991350A4 (en) 2019-06-25 2023-08-02 Cisco Technology, Inc. METHOD AND DEVICE FOR HIGH PRECISION TIME STAMPING

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Publication number Priority date Publication date Assignee Title
DE1228303B (de) 1965-04-23 1966-11-10 Philips Patentverwaltung Einrichtung zur Synchronisation von Zaehlsignalen mit einer Taktpulsfrequenz
US3363183A (en) 1965-07-13 1968-01-09 Ibm Self-correcting clock for a data transmission system
US3612906A (en) 1970-09-28 1971-10-12 Us Navy Pulse synchronizer
FR2246117B1 (zh) 1973-09-28 1976-05-14 Labo Cent Telecommunicat
JPS52112355A (en) 1976-03-18 1977-09-20 Shin Shirasuna Electric Corp Method of detecting whether or not phase difference between two signals is constant
US4488108A (en) 1982-08-27 1984-12-11 Rockwell International Corporation Phase detector error compensation apparatus
CH660635A5 (de) * 1983-03-03 1987-05-15 Wild Heerbrugg Ag Verfahren zur digitalen phasenmessung.
US4574234A (en) * 1984-09-26 1986-03-04 Applied Magnetics Corporation System for measuring selected parameters of electrical signals and method
US4686458A (en) 1985-05-31 1987-08-11 Hughes Aircraft Company Pulse alignment system
JPS6385489A (ja) 1986-09-30 1988-04-15 Yokogawa Electric Corp 微小時間差計測装置
US5258968A (en) 1986-12-11 1993-11-02 Pioneer Electronic Corporation Tracking error signal generating device for preventing offset of the generated tracking error signal
DE3861319D1 (de) 1988-01-28 1991-01-31 Hewlett Packard Gmbh Impulsformerschaltung.
US5321700A (en) 1989-10-11 1994-06-14 Teradyne, Inc. High speed timing generator
JP2868266B2 (ja) 1990-01-25 1999-03-10 株式会社日本自動車部品総合研究所 信号位相差検出回路及び信号位相差検出方法
US5084669A (en) 1990-03-08 1992-01-28 Telefonaktiebolaget L M Ericsson Direct phase digitization
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US5420831A (en) 1992-04-07 1995-05-30 Hughes Aircraft Company Coho device for improving time measurement resolution
JP2583833Y2 (ja) 1992-10-16 1998-10-27 株式会社アドバンテスト パルス測定装置
JPH08122465A (ja) 1994-10-27 1996-05-17 Sony Tektronix Corp 時間測定装置
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US5861829A (en) * 1997-04-28 1999-01-19 Marvell Technology Group, Ltd. High-speed, low power, medium resolution analog-to-digital converter and method of stabilization
US5886660A (en) * 1997-10-28 1999-03-23 National Instruments Corporation Time-to-digital converter using time stamp extrapolation
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JP2001141784A (ja) 1999-11-10 2001-05-25 Fujitsu Ltd 半導体素子テスト回路
US6291981B1 (en) 2000-07-26 2001-09-18 Teradyne, Inc. Automatic test equipment with narrow output pulses
US6735543B2 (en) 2001-11-29 2004-05-11 International Business Machines Corporation Method and apparatus for testing, characterizing and tuning a chip interface
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Also Published As

Publication number Publication date
WO2007053413A2 (en) 2007-05-10
TWI334288B (en) 2010-12-01
WO2007053413A3 (en) 2007-09-07
US20070100570A1 (en) 2007-05-03
US7378854B2 (en) 2008-05-27

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