TW200724949A - Test sequence optimization method and design tool - Google Patents

Test sequence optimization method and design tool

Info

Publication number
TW200724949A
TW200724949A TW095130119A TW95130119A TW200724949A TW 200724949 A TW200724949 A TW 200724949A TW 095130119 A TW095130119 A TW 095130119A TW 95130119 A TW95130119 A TW 95130119A TW 200724949 A TW200724949 A TW 200724949A
Authority
TW
Taiwan
Prior art keywords
test
sequence
devices
test sequence
fault coverage
Prior art date
Application number
TW095130119A
Other languages
English (en)
Inventor
Bertrand Jacques Leonard Vandewiele
Shaji Krishnan
Original Assignee
Koninkl Philips Electronics Nv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Koninkl Philips Electronics Nv filed Critical Koninkl Philips Electronics Nv
Publication of TW200724949A publication Critical patent/TW200724949A/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3172—Optimisation aspects, e.g. using functional pin as test pin, pin multiplexing
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequences
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequences by preliminary fault modelling, e.g. analysis, simulation
    • G01R31/31835—Analysis of test coverage or failure detectability

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
TW095130119A 2005-08-19 2006-08-16 Test sequence optimization method and design tool TW200724949A (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
EP05107630 2005-08-19

Publications (1)

Publication Number Publication Date
TW200724949A true TW200724949A (en) 2007-07-01

Family

ID=37757953

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095130119A TW200724949A (en) 2005-08-19 2006-08-16 Test sequence optimization method and design tool

Country Status (6)

Country Link
US (1) US20080234967A1 (zh)
EP (1) EP1929317A2 (zh)
JP (1) JP2009505096A (zh)
CN (1) CN101243324A (zh)
TW (1) TW200724949A (zh)
WO (1) WO2007020602A2 (zh)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102193037A (zh) * 2010-03-08 2011-09-21 苹果公司 老化测试方法和系统
US8893133B2 (en) 2010-09-01 2014-11-18 International Business Machines Corporation Dynamic test scheduling by ordering tasks for performance based on similarities between the tasks
US9310437B2 (en) * 2011-03-25 2016-04-12 Taiwan Semiconductor Manufacturing Company, Ltd. Adaptive test sequence for testing integrated circuits
US8689066B2 (en) 2011-06-29 2014-04-01 International Business Machines Corporation Integrated circuit test optimization using adaptive test pattern sampling algorithm
US10521288B2 (en) * 2012-11-07 2019-12-31 International Business Machines Corporation Collaborative application testing
US8806401B1 (en) * 2013-03-15 2014-08-12 Atrenta, Inc. System and methods for reasonable functional verification of an integrated circuit design
US8813019B1 (en) * 2013-04-30 2014-08-19 Nvidia Corporation Optimized design verification of an electronic circuit
GB2529842A (en) * 2014-09-03 2016-03-09 Ibm Generating coverage metrics for black-box testing
US9760663B2 (en) 2014-10-30 2017-09-12 Synopsys, Inc. Automatic generation of properties to assist hardware emulation
ES2962265T3 (es) * 2015-11-30 2024-03-18 Nextracker Llc Sistemas y métodos para planificar y ejecutar automáticamente pruebas in situ en sistemas eléctricos y mecánicos
US10102090B2 (en) * 2016-05-16 2018-10-16 International Business Machines Corporation Non-destructive analysis to determine use history of processor
CN108627755A (zh) * 2017-03-22 2018-10-09 株洲中车时代电气股份有限公司 一种电路板全过程测试覆盖率分析方法
JP6693903B2 (ja) * 2017-03-23 2020-05-13 株式会社日立製作所 ハードウェア試験装置及びハードウェア試験方法
US12038477B1 (en) 2021-09-30 2024-07-16 Cadence Design Systems, Inc. Method, product, and system for protocol state graph neural network exploration

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5539652A (en) * 1995-02-07 1996-07-23 Hewlett-Packard Company Method for manufacturing test simulation in electronic circuit design
US5844909A (en) * 1997-03-27 1998-12-01 Nec Corporation Test pattern selection method for testing of integrated circuit
US6941497B2 (en) * 2002-01-15 2005-09-06 Agilent Technologies, Inc. N-squared algorithm for optimizing correlated events

Also Published As

Publication number Publication date
WO2007020602A3 (en) 2007-10-18
CN101243324A (zh) 2008-08-13
EP1929317A2 (en) 2008-06-11
WO2007020602A2 (en) 2007-02-22
US20080234967A1 (en) 2008-09-25
JP2009505096A (ja) 2009-02-05

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