TW200724237A - Diagnostic system for gel dispensing condition and method thereof - Google Patents

Diagnostic system for gel dispensing condition and method thereof

Info

Publication number
TW200724237A
TW200724237A TW094145947A TW94145947A TW200724237A TW 200724237 A TW200724237 A TW 200724237A TW 094145947 A TW094145947 A TW 094145947A TW 94145947 A TW94145947 A TW 94145947A TW 200724237 A TW200724237 A TW 200724237A
Authority
TW
Taiwan
Prior art keywords
gel
image
diagnostic system
dispensing condition
gel dispensing
Prior art date
Application number
TW094145947A
Other languages
English (en)
Other versions
TWI277452B (en
Inventor
Jian-Wei Chen
Jiunn-Nian Jeng
Original Assignee
Ind Tech Res Inst
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ind Tech Res Inst filed Critical Ind Tech Res Inst
Priority to TW094145947A priority Critical patent/TWI277452B/zh
Priority to KR1020060055485A priority patent/KR100743801B1/ko
Application granted granted Critical
Publication of TWI277452B publication Critical patent/TWI277452B/zh
Publication of TW200724237A publication Critical patent/TW200724237A/zh

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B05SPRAYING OR ATOMISING IN GENERAL; APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05CAPPARATUS FOR APPLYING FLUENT MATERIALS TO SURFACES, IN GENERAL
    • B05C11/00Component parts, details or accessories not specifically provided for in groups B05C1/00 - B05C9/00
    • B05C11/10Storage, supply or control of liquid or other fluent material; Recovery of excess liquid or other fluent material
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84Systems specially adapted for particular applications
    • G01N21/88Investigating the presence of flaws or contamination
    • G01N21/8851Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
    • G01N2021/8887Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques

Landscapes

  • Engineering & Computer Science (AREA)
  • Computer Vision & Pattern Recognition (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Application Of Or Painting With Fluid Materials (AREA)
  • Coating Apparatus (AREA)
  • Testing And Monitoring For Control Systems (AREA)
  • Automatic Analysis And Handling Materials Therefor (AREA)
TW094145947A 2005-12-22 2005-12-22 Diagnostic system for gel dispensing condition and method thereof TWI277452B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW094145947A TWI277452B (en) 2005-12-22 2005-12-22 Diagnostic system for gel dispensing condition and method thereof
KR1020060055485A KR100743801B1 (ko) 2005-12-22 2006-06-20 주입한 겔의 진단시스템 및 그 진단방법

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW094145947A TWI277452B (en) 2005-12-22 2005-12-22 Diagnostic system for gel dispensing condition and method thereof

Publications (2)

Publication Number Publication Date
TWI277452B TWI277452B (en) 2007-04-01
TW200724237A true TW200724237A (en) 2007-07-01

Family

ID=38365853

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094145947A TWI277452B (en) 2005-12-22 2005-12-22 Diagnostic system for gel dispensing condition and method thereof

Country Status (2)

Country Link
KR (1) KR100743801B1 (zh)
TW (1) TWI277452B (zh)

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI578042B (zh) * 2013-03-07 2017-04-11 鴻海精密工業股份有限公司 光通訊模組組裝裝置
TWI797801B (zh) * 2021-10-29 2023-04-01 鴻騏新技股份有限公司 疊合件的點膠品質的檢測方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP5280702B2 (ja) * 2008-02-18 2013-09-04 武蔵エンジニアリング株式会社 液体材料の塗布方法、その装置およびそのプログラム

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH04346288A (ja) * 1991-05-23 1992-12-02 Matsushita Electric Ind Co Ltd 描画方法
KR0148968B1 (ko) * 1995-04-29 1998-12-15 배순훈 비젼 시스템을 이용한 도포량 자동조절장치 및 그 제어방법
JP4424165B2 (ja) 2004-11-15 2010-03-03 株式会社日立プラントテクノロジー 液滴塗布装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI578042B (zh) * 2013-03-07 2017-04-11 鴻海精密工業股份有限公司 光通訊模組組裝裝置
TWI797801B (zh) * 2021-10-29 2023-04-01 鴻騏新技股份有限公司 疊合件的點膠品質的檢測方法

Also Published As

Publication number Publication date
KR20070066829A (ko) 2007-06-27
TWI277452B (en) 2007-04-01
KR100743801B1 (ko) 2007-07-30

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees