TW200722766A - Memory test tool - Google Patents
Memory test toolInfo
- Publication number
- TW200722766A TW200722766A TW094142245A TW94142245A TW200722766A TW 200722766 A TW200722766 A TW 200722766A TW 094142245 A TW094142245 A TW 094142245A TW 94142245 A TW94142245 A TW 94142245A TW 200722766 A TW200722766 A TW 200722766A
- Authority
- TW
- Taiwan
- Prior art keywords
- test tool
- memory test
- conductive structure
- memory
- connection part
- Prior art date
Links
Landscapes
- Tests Of Electronic Circuits (AREA)
- Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
- Lead Frames For Integrated Circuits (AREA)
Abstract
There is provided a memory test tool, which is applicable to measuring electrical characteristics of memory having electrical connection terminals. The memory test tool includes: a first connection part having a first conductive structure for electrically connecting to the electrical connection terminals; a second connection part having a second conductive structure electrically connected to an external device; and a measurement part jointed with the first connection part and the second connection part. The measurement part is electrically connected to the first conductive structure and the second conductive structure, and partially exposed out of the memory test tool, so as to fast and accurately measure the electrical characteristics of memory, thereby solving the deficiencies in prior art.
Priority Applications (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94142245A TWI278639B (en) | 2005-12-01 | 2005-12-01 | Memory test tool |
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
TW94142245A TWI278639B (en) | 2005-12-01 | 2005-12-01 | Memory test tool |
Publications (2)
Publication Number | Publication Date |
---|---|
TWI278639B TWI278639B (en) | 2007-04-11 |
TW200722766A true TW200722766A (en) | 2007-06-16 |
Family
ID=38645204
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW94142245A TWI278639B (en) | 2005-12-01 | 2005-12-01 | Memory test tool |
Country Status (1)
Country | Link |
---|---|
TW (1) | TWI278639B (en) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022048286A1 (en) * | 2020-09-04 | 2022-03-10 | 苏州浪潮智能科技有限公司 | Test fixture adapter board and memory test device |
Families Citing this family (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI502596B (en) * | 2012-08-15 | 2015-10-01 | Wistron Corp | Memory testing method, memory testing apparatus, and adapter thereof |
-
2005
- 2005-12-01 TW TW94142245A patent/TWI278639B/en not_active IP Right Cessation
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
WO2022048286A1 (en) * | 2020-09-04 | 2022-03-10 | 苏州浪潮智能科技有限公司 | Test fixture adapter board and memory test device |
Also Published As
Publication number | Publication date |
---|---|
TWI278639B (en) | 2007-04-11 |
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Legal Events
Date | Code | Title | Description |
---|---|---|---|
MM4A | Annulment or lapse of patent due to non-payment of fees |