TW200722766A - Memory test tool - Google Patents

Memory test tool

Info

Publication number
TW200722766A
TW200722766A TW094142245A TW94142245A TW200722766A TW 200722766 A TW200722766 A TW 200722766A TW 094142245 A TW094142245 A TW 094142245A TW 94142245 A TW94142245 A TW 94142245A TW 200722766 A TW200722766 A TW 200722766A
Authority
TW
Taiwan
Prior art keywords
test tool
memory test
conductive structure
memory
connection part
Prior art date
Application number
TW094142245A
Other languages
Chinese (zh)
Other versions
TWI278639B (en
Inventor
Tom Ji
Zhi-Feng Chen
Original Assignee
Inventec Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Inventec Corp filed Critical Inventec Corp
Priority to TW94142245A priority Critical patent/TWI278639B/en
Application granted granted Critical
Publication of TWI278639B publication Critical patent/TWI278639B/en
Publication of TW200722766A publication Critical patent/TW200722766A/en

Links

Landscapes

  • Tests Of Electronic Circuits (AREA)
  • Printing Elements For Providing Electric Connections Between Printed Circuits (AREA)
  • Lead Frames For Integrated Circuits (AREA)

Abstract

There is provided a memory test tool, which is applicable to measuring electrical characteristics of memory having electrical connection terminals. The memory test tool includes: a first connection part having a first conductive structure for electrically connecting to the electrical connection terminals; a second connection part having a second conductive structure electrically connected to an external device; and a measurement part jointed with the first connection part and the second connection part. The measurement part is electrically connected to the first conductive structure and the second conductive structure, and partially exposed out of the memory test tool, so as to fast and accurately measure the electrical characteristics of memory, thereby solving the deficiencies in prior art.
TW94142245A 2005-12-01 2005-12-01 Memory test tool TWI278639B (en)

Priority Applications (1)

Application Number Priority Date Filing Date Title
TW94142245A TWI278639B (en) 2005-12-01 2005-12-01 Memory test tool

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW94142245A TWI278639B (en) 2005-12-01 2005-12-01 Memory test tool

Publications (2)

Publication Number Publication Date
TWI278639B TWI278639B (en) 2007-04-11
TW200722766A true TW200722766A (en) 2007-06-16

Family

ID=38645204

Family Applications (1)

Application Number Title Priority Date Filing Date
TW94142245A TWI278639B (en) 2005-12-01 2005-12-01 Memory test tool

Country Status (1)

Country Link
TW (1) TWI278639B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022048286A1 (en) * 2020-09-04 2022-03-10 苏州浪潮智能科技有限公司 Test fixture adapter board and memory test device

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI502596B (en) * 2012-08-15 2015-10-01 Wistron Corp Memory testing method, memory testing apparatus, and adapter thereof

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
WO2022048286A1 (en) * 2020-09-04 2022-03-10 苏州浪潮智能科技有限公司 Test fixture adapter board and memory test device

Also Published As

Publication number Publication date
TWI278639B (en) 2007-04-11

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees