TW200713647A - Magnetic tunnel junction sensor - Google Patents
Magnetic tunnel junction sensorInfo
- Publication number
- TW200713647A TW200713647A TW095127621A TW95127621A TW200713647A TW 200713647 A TW200713647 A TW 200713647A TW 095127621 A TW095127621 A TW 095127621A TW 95127621 A TW95127621 A TW 95127621A TW 200713647 A TW200713647 A TW 200713647A
- Authority
- TW
- Taiwan
- Prior art keywords
- magnetic
- mtj
- electrode
- magnetic field
- tunnel junction
- Prior art date
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
- H10N50/01—Manufacture or treatment
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
-
- G—PHYSICS
- G11—INFORMATION STORAGE
- G11C—STATIC STORES
- G11C11/00—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
- G11C11/02—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements
- G11C11/16—Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using magnetic elements using elements in which the storage effect is based on magnetic spin effect
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10B—ELECTRONIC MEMORY DEVICES
- H10B61/00—Magnetic memory devices, e.g. magnetoresistive RAM [MRAM] devices
-
- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10—TECHNICAL SUBJECTS COVERED BY FORMER USPC
- Y10S—TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y10S977/00—Nanotechnology
- Y10S977/902—Specified use of nanostructure
- Y10S977/932—Specified use of nanostructure for electronic or optoelectronic application
- Y10S977/933—Spintronics or quantum computing
- Y10S977/935—Spin dependent tunnel, SDT, junction, e.g. tunneling magnetoresistance, TMR
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/192,569 US7541804B2 (en) | 2005-07-29 | 2005-07-29 | Magnetic tunnel junction sensor |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200713647A true TW200713647A (en) | 2007-04-01 |
Family
ID=37694039
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095127621A TW200713647A (en) | 2005-07-29 | 2006-07-28 | Magnetic tunnel junction sensor |
Country Status (5)
Country | Link |
---|---|
US (2) | US7541804B2 (zh) |
JP (1) | JP2009503858A (zh) |
KR (1) | KR20080033957A (zh) |
TW (1) | TW200713647A (zh) |
WO (1) | WO2007016011A2 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111863865A (zh) * | 2019-04-24 | 2020-10-30 | 上海磁宇信息科技有限公司 | 一种赝磁性隧道结单元 |
Families Citing this family (21)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7547480B2 (en) * | 2005-10-28 | 2009-06-16 | Everspin Technologies, Inc. | Magnetic tunnel junction pressure sensors and methods |
US7768083B2 (en) | 2006-01-20 | 2010-08-03 | Allegro Microsystems, Inc. | Arrangements for an integrated sensor |
US7483295B2 (en) * | 2007-04-23 | 2009-01-27 | Mag Ic Technologies, Inc. | MTJ sensor including domain stable free layer |
US8242776B2 (en) * | 2008-03-26 | 2012-08-14 | Everspin Technologies, Inc. | Magnetic sensor design for suppression of barkhausen noise |
US7965077B2 (en) | 2008-05-08 | 2011-06-21 | Everspin Technologies, Inc. | Two-axis magnetic field sensor with multiple pinning directions |
GB2467777B (en) * | 2009-02-13 | 2011-01-12 | Wolfson Microelectronics Plc | MEMS device and process |
US8482968B2 (en) * | 2010-11-13 | 2013-07-09 | International Business Machines Corporation | Non-volatile magnetic tunnel junction transistor |
US9395410B2 (en) * | 2011-06-06 | 2016-07-19 | Iii Holdings 1, Llc | Integrated circuit with sensing unit and method for using the same |
US8767446B2 (en) | 2011-10-12 | 2014-07-01 | International Business Machines Corporation | Multi-bit spin-momentum-transfer magnetoresistence random access memory with single magnetic-tunnel-junction stack |
US8975891B2 (en) | 2011-11-04 | 2015-03-10 | Honeywell International Inc. | Apparatus and method for determining in-plane magnetic field components of a magnetic field using a single magnetoresistive sensor |
WO2014142956A1 (en) * | 2013-03-15 | 2014-09-18 | Intel Corporation | Logic chip including embedded magnetic tunnel junctions |
DE102013211626A1 (de) * | 2013-06-20 | 2014-12-24 | Robert Bosch Gmbh | Sensor und Verfahren zum Erfassen einer Lage einer Wirkfläche des Sensors |
JP6105817B2 (ja) * | 2013-11-01 | 2017-03-29 | 中国科学院物理研究所 | 温度センサのためのナノ磁性多層膜とその製造方法 |
US9543067B2 (en) | 2013-12-20 | 2017-01-10 | Nxp Usa, Inc. | Magnetic pre-conditioning of magnetic sensors |
DE102014109701A1 (de) * | 2014-07-10 | 2016-01-14 | Epcos Ag | Sensor |
EP2966453B1 (en) * | 2014-07-11 | 2018-10-31 | Crocus Technology | MLU based accelerometer using a magnetic tunnel junction |
US9673893B2 (en) * | 2015-03-20 | 2017-06-06 | Oracle International Corporation | Safety-enhanced laser array |
US10082431B2 (en) | 2015-07-17 | 2018-09-25 | Honeywell International Inc. | System and methods for magnetic tunnel junction pressure sensors |
US10935612B2 (en) | 2018-08-20 | 2021-03-02 | Allegro Microsystems, Llc | Current sensor having multiple sensitivity ranges |
US10830841B1 (en) | 2019-06-19 | 2020-11-10 | International Business Machines Corporation | Magnetic tunnel junction performance monitoring based on magnetic field coupling |
US11567108B2 (en) | 2021-03-31 | 2023-01-31 | Allegro Microsystems, Llc | Multi-gain channels for multi-range sensor |
Family Cites Families (19)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
FR2624980B1 (fr) * | 1987-12-16 | 1990-03-02 | Commissariat Energie Atomique | Magnetometre vectoriel continu a capteur capacitif magnetostrictif et gradientmetre comportant application de ce capteur |
US5166612A (en) * | 1990-11-13 | 1992-11-24 | Tektronix, Inc. | Micromechanical sensor employing a squid to detect movement |
US5670712A (en) * | 1994-08-15 | 1997-09-23 | The Regents Of The University Of California | Method and apparatus for magnetic force control of a scanning probe |
JPH0961454A (ja) * | 1995-08-29 | 1997-03-07 | Tokin Corp | 半導体磁気動作型加速度センサ |
US5900729A (en) * | 1997-03-20 | 1999-05-04 | International Business Machines Corporation | Magnetic force microscopy probe with integrated coil |
US6185079B1 (en) * | 1998-11-09 | 2001-02-06 | International Business Machines Corporation | Disk drive with thermal asperity reduction circuitry using a magnetic tunnel junction sensor |
US6414086B1 (en) * | 2000-02-29 | 2002-07-02 | Howmedica Osteonics Corp. | Compositions, processes and methods of improving the wear resistance of prosthetic medical devices |
US6657431B2 (en) * | 2000-06-06 | 2003-12-02 | Brown University Research Foundation | Scanning magnetic microscope having improved magnetic sensor |
JP2002026419A (ja) | 2000-07-07 | 2002-01-25 | Sanken Electric Co Ltd | 磁電変換装置 |
US6555858B1 (en) * | 2000-11-15 | 2003-04-29 | Motorola, Inc. | Self-aligned magnetic clad write line and its method of formation |
JP3498737B2 (ja) * | 2001-01-24 | 2004-02-16 | ヤマハ株式会社 | 磁気センサの製造方法 |
US6906511B2 (en) * | 2001-05-08 | 2005-06-14 | Analog Devices, Inc. | Magnetic position detection for micro machined optical element |
JP3835354B2 (ja) * | 2001-10-29 | 2006-10-18 | ヤマハ株式会社 | 磁気センサ |
US6897650B2 (en) * | 2002-02-11 | 2005-05-24 | International Business Machines Corporation | Magnetic-field sensor device |
US7172904B2 (en) | 2002-07-31 | 2007-02-06 | Freescale Semiconductor, Inc. | High sensitivity sensor for tagged magnetic bead bioassays |
US6740947B1 (en) * | 2002-11-13 | 2004-05-25 | Hewlett-Packard Development Company, L.P. | MRAM with asymmetric cladded conductor |
US6714442B1 (en) | 2003-01-17 | 2004-03-30 | Motorola, Inc. | MRAM architecture with a grounded write bit line and electrically isolated read bit line |
US7183765B2 (en) | 2003-06-26 | 2007-02-27 | The Regents Of The University Of California | Micro-position sensor using faraday effect |
TWI365989B (en) * | 2003-12-23 | 2012-06-11 | Eliposki Remote Ltd L L C | Semiconductor device and method for manufacturing the same |
-
2005
- 2005-07-29 US US11/192,569 patent/US7541804B2/en not_active Expired - Fee Related
-
2006
- 2006-07-24 JP JP2008524013A patent/JP2009503858A/ja active Pending
- 2006-07-24 WO PCT/US2006/028576 patent/WO2007016011A2/en active Application Filing
- 2006-07-24 KR KR1020087002294A patent/KR20080033957A/ko not_active Application Discontinuation
- 2006-07-28 TW TW095127621A patent/TW200713647A/zh unknown
- 2006-10-19 US US11/584,473 patent/US7602177B2/en not_active Expired - Fee Related
Cited By (2)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
CN111863865A (zh) * | 2019-04-24 | 2020-10-30 | 上海磁宇信息科技有限公司 | 一种赝磁性隧道结单元 |
CN111863865B (zh) * | 2019-04-24 | 2024-04-12 | 上海磁宇信息科技有限公司 | 一种赝磁性隧道结单元 |
Also Published As
Publication number | Publication date |
---|---|
US7602177B2 (en) | 2009-10-13 |
KR20080033957A (ko) | 2008-04-17 |
JP2009503858A (ja) | 2009-01-29 |
US20070025027A1 (en) | 2007-02-01 |
WO2007016011A3 (en) | 2008-09-12 |
US20070159735A1 (en) | 2007-07-12 |
WO2007016011A2 (en) | 2007-02-08 |
US7541804B2 (en) | 2009-06-02 |
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