TW200713305A - Bit line control circuit for semiconductor memory device - Google Patents

Bit line control circuit for semiconductor memory device

Info

Publication number
TW200713305A
TW200713305A TW095123936A TW95123936A TW200713305A TW 200713305 A TW200713305 A TW 200713305A TW 095123936 A TW095123936 A TW 095123936A TW 95123936 A TW95123936 A TW 95123936A TW 200713305 A TW200713305 A TW 200713305A
Authority
TW
Taiwan
Prior art keywords
overdriving
bit line
voltage
memory device
semiconductor memory
Prior art date
Application number
TW095123936A
Other languages
Chinese (zh)
Other versions
TWI304991B (en
Inventor
Khil-Ohk Kang
Original Assignee
Hynix Semiconductor Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hynix Semiconductor Inc filed Critical Hynix Semiconductor Inc
Publication of TW200713305A publication Critical patent/TW200713305A/en
Application granted granted Critical
Publication of TWI304991B publication Critical patent/TWI304991B/en

Links

Classifications

    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/06Sense amplifiers; Associated circuits, e.g. timing or triggering circuits
    • G11C7/08Control thereof
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/4074Power supply or voltage generation circuits, e.g. bias voltage generators, substrate voltage generators, back-up power, power control circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409Read-write [R-W] circuits 
    • G11C11/4091Sense or sense/refresh amplifiers, or associated sense circuitry, e.g. for coupled bit-line precharging, equalising or isolating
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C11/00Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor
    • G11C11/21Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements
    • G11C11/34Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices
    • G11C11/40Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors
    • G11C11/401Digital stores characterised by the use of particular electric or magnetic storage elements; Storage elements therefor using electric elements using semiconductor devices using transistors forming cells needing refreshing or charge regeneration, i.e. dynamic cells
    • G11C11/4063Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing
    • G11C11/407Auxiliary circuits, e.g. for addressing, decoding, driving, writing, sensing or timing for memory cells of the field-effect type
    • G11C11/409Read-write [R-W] circuits 
    • G11C11/4094Bit-line management or control circuits
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C5/00Details of stores covered by group G11C11/00
    • G11C5/14Power supply arrangements, e.g. power down, chip selection or deselection, layout of wirings or power grids, or multiple supply levels
    • G11C5/143Detection of memory cassette insertion or removal; Continuity checks of supply or ground lines; Detection of supply variations, interruptions or levels ; Switching between alternative supplies
    • GPHYSICS
    • G11INFORMATION STORAGE
    • G11CSTATIC STORES
    • G11C7/00Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/12Bit line control circuits, e.g. drivers, boosters, pull-up circuits, pull-down circuits, precharging circuits, equalising circuits, for bit lines

Landscapes

  • Engineering & Computer Science (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Computer Hardware Design (AREA)
  • Power Engineering (AREA)
  • Dram (AREA)

Abstract

A semiconductor memory device includes a bit line sense amplifier for sensing and amplifying data applied on a bit line; a first driver for driving a pull-up voltage line of the bit line sense amplifier to a voltage applied on a normal driving voltage terminal; an overdriving signal generator for generating an overdriving signal defining an overdriving period in response to an active command; an overdriving control signal generator for receiving the overdriving signal to generate an overdriving control signal for selectively performing an overdriving operation according to a voltage level of an overdriving voltage; and a second driver for driving the normal driving voltage terminal to the overdriving voltage in response to the overdriving control signal.
TW095123936A 2005-09-29 2006-06-30 Bit line control circuit for semiconductor memory device TWI304991B (en)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
KR20050090911 2005-09-29
KR1020050132504A KR100652797B1 (en) 2005-09-29 2005-12-28 Sense amplifier overdriver control circuit and method for controlling sense amplifier of semiconductor device

Publications (2)

Publication Number Publication Date
TW200713305A true TW200713305A (en) 2007-04-01
TWI304991B TWI304991B (en) 2009-01-01

Family

ID=37731717

Family Applications (1)

Application Number Title Priority Date Filing Date
TW095123936A TWI304991B (en) 2005-09-29 2006-06-30 Bit line control circuit for semiconductor memory device

Country Status (3)

Country Link
KR (1) KR100652797B1 (en)
CN (1) CN100545944C (en)
TW (1) TWI304991B (en)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI686816B (en) * 2015-07-17 2020-03-01 韓商愛思開海力士有限公司 Driving signal control circuit and driving apparatus

Families Citing this family (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN102780485B (en) * 2012-07-27 2014-07-16 华南理工大学 Configurable D latch for chaos computing
KR102414690B1 (en) * 2017-11-30 2022-07-01 에스케이하이닉스 주식회사 Semiconductor Memory Apparatus

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI686816B (en) * 2015-07-17 2020-03-01 韓商愛思開海力士有限公司 Driving signal control circuit and driving apparatus

Also Published As

Publication number Publication date
TWI304991B (en) 2009-01-01
CN1941190A (en) 2007-04-04
CN100545944C (en) 2009-09-30
KR100652797B1 (en) 2006-12-01

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees