TW200708747A - Time jitter injection testing circuit and related testing method - Google Patents

Time jitter injection testing circuit and related testing method

Info

Publication number
TW200708747A
TW200708747A TW094129510A TW94129510A TW200708747A TW 200708747 A TW200708747 A TW 200708747A TW 094129510 A TW094129510 A TW 094129510A TW 94129510 A TW94129510 A TW 94129510A TW 200708747 A TW200708747 A TW 200708747A
Authority
TW
Taiwan
Prior art keywords
testing
circuit
jitter injection
testing method
time jitter
Prior art date
Application number
TW094129510A
Other languages
English (en)
Other versions
TWI277748B (en
Inventor
Jimmy Hsu
Min-Sheng Lin
Original Assignee
Via Tech Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Via Tech Inc filed Critical Via Tech Inc
Priority to TW094129510A priority Critical patent/TWI277748B/zh
Priority to US11/425,393 priority patent/US7516374B2/en
Publication of TW200708747A publication Critical patent/TW200708747A/zh
Application granted granted Critical
Publication of TWI277748B publication Critical patent/TWI277748B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30—Marginal testing, e.g. by varying supply voltage
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31716—Testing of input or output with loop-back
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2822—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere of microwave or radiofrequency circuits
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2832—Specific tests of electronic circuits not provided for elsewhere
    • G01R31/2836—Fault-finding or characterising
    • G01R31/2839—Fault-finding or characterising using signal generators, power supplies or circuit analysers
TW094129510A 2005-08-29 2005-08-29 Time jitter injection testing circuit and related testing method TWI277748B (en)

Priority Applications (2)

Application Number Priority Date Filing Date Title
TW094129510A TWI277748B (en) 2005-08-29 2005-08-29 Time jitter injection testing circuit and related testing method
US11/425,393 US7516374B2 (en) 2005-08-29 2006-06-21 Testing circuit and related method of injecting a time jitter

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
TW094129510A TWI277748B (en) 2005-08-29 2005-08-29 Time jitter injection testing circuit and related testing method

Publications (2)

Publication Number Publication Date
TW200708747A true TW200708747A (en) 2007-03-01
TWI277748B TWI277748B (en) 2007-04-01

Family

ID=37856733

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094129510A TWI277748B (en) 2005-08-29 2005-08-29 Time jitter injection testing circuit and related testing method

Country Status (2)

Country Link
US (1) US7516374B2 (zh)
TW (1) TWI277748B (zh)

Families Citing this family (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7936809B2 (en) * 2006-07-11 2011-05-03 Altera Corporation Economical, scalable transceiver jitter test
US7801205B2 (en) * 2007-08-07 2010-09-21 Advantest Corporation Jitter injection circuit, electronics device, and test apparatus
US8264236B2 (en) * 2007-11-28 2012-09-11 Advantest (Singapore) Pte Ltd System and method for electronic testing of devices
US7834639B2 (en) * 2008-01-30 2010-11-16 Advantest Corporation Jitter injection circuit, pattern generator, test apparatus, and electronic device
CN103454508B (zh) * 2012-05-30 2016-10-05 路华科技(深圳)有限公司 四通道过流过压保护测试仪
US9577818B2 (en) * 2015-02-04 2017-02-21 Teradyne, Inc. High speed data transfer using calibrated, single-clock source synchronous serializer-deserializer protocol

Family Cites Families (8)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
FR2699359B1 (fr) * 1992-12-16 1995-02-24 Thierry Houdoin Procédé de simulation de transmission sur un réseau de transmission par transfert asynchrone et simulateur de transmission sur un tel réseau.
US5835501A (en) * 1996-03-04 1998-11-10 Pmc-Sierra Ltd. Built-in test scheme for a jitter tolerance test of a clock and data recovery unit
US6285197B2 (en) * 1998-07-31 2001-09-04 Philips Electronics North America Corporation System and method for generating a jittered test signal
EP1213870A1 (en) * 2001-08-22 2002-06-12 Agilent Technologies, Inc. (a Delaware corporation) Jitter generation with delay unit
US7171601B2 (en) * 2003-08-21 2007-01-30 Credence Systems Corporation Programmable jitter generator
JP4425735B2 (ja) * 2004-07-22 2010-03-03 株式会社アドバンテスト ジッタ印加回路、及び試験装置
TWI270254B (en) * 2005-09-16 2007-01-01 Univ Nat Chiao Tung Reprogrammable switched-capacitor input circuit for receiving digital test stimulus signal in analog test
US7394277B2 (en) * 2006-04-20 2008-07-01 Advantest Corporation Testing apparatus, testing method, jitter filtering circuit, and jitter filtering method

Also Published As

Publication number Publication date
US7516374B2 (en) 2009-04-07
TWI277748B (en) 2007-04-01
US20070061658A1 (en) 2007-03-15

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