TW200704477A - Polishing pad comprising magnetically sensitive particles and method for the use thereof - Google Patents
Polishing pad comprising magnetically sensitive particles and method for the use thereofInfo
- Publication number
- TW200704477A TW200704477A TW095122107A TW95122107A TW200704477A TW 200704477 A TW200704477 A TW 200704477A TW 095122107 A TW095122107 A TW 095122107A TW 95122107 A TW95122107 A TW 95122107A TW 200704477 A TW200704477 A TW 200704477A
- Authority
- TW
- Taiwan
- Prior art keywords
- polishing pad
- magnetically sensitive
- polishing
- sensitive particles
- provides
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
- B24B37/20—Lapping pads for working plane surfaces
- B24B37/24—Lapping pads for working plane surfaces characterised by the composition or properties of the pad materials
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D3/00—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents
- B24D3/34—Physical features of abrasive bodies, or sheets, e.g. abrasive surfaces of special nature; Abrasive bodies or sheets characterised by their constituents characterised by additives enhancing special physical properties, e.g. wear resistance, electric conductivity, self-cleaning properties
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B1/00—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes
- B24B1/005—Processes of grinding or polishing; Use of auxiliary equipment in connection with such processes using a magnetic polishing agent
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24B—MACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
- B24B37/00—Lapping machines or devices; Accessories
- B24B37/11—Lapping tools
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B24—GRINDING; POLISHING
- B24D—TOOLS FOR GRINDING, BUFFING OR SHARPENING
- B24D13/00—Wheels having flexibly-acting working parts, e.g. buffing wheels; Mountings therefor
- B24D13/14—Wheels having flexibly-acting working parts, e.g. buffing wheels; Mountings therefor acting by the front face
Abstract
The invention provides polishing pads comprising a deformable polishing pad body and magnetically sensitive particles dispersed therein, wherein one or more properties of the polishing pad are altered when in the presence of an applied magnetic field. The invention further provides a polishing system and a method for polishing a substrate involving such a polishing pad.
Applications Claiming Priority (1)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US11/158,185 US20060286906A1 (en) | 2005-06-21 | 2005-06-21 | Polishing pad comprising magnetically sensitive particles and method for the use thereof |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200704477A true TW200704477A (en) | 2007-02-01 |
Family
ID=37441575
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095122107A TW200704477A (en) | 2005-06-21 | 2006-06-20 | Polishing pad comprising magnetically sensitive particles and method for the use thereof |
Country Status (8)
Country | Link |
---|---|
US (1) | US20060286906A1 (en) |
EP (1) | EP1915234A2 (en) |
JP (1) | JP2008546551A (en) |
KR (1) | KR20080020629A (en) |
CN (1) | CN101203355A (en) |
IL (1) | IL187704A0 (en) |
TW (1) | TW200704477A (en) |
WO (1) | WO2007001700A2 (en) |
Families Citing this family (23)
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AU2005336407B2 (en) * | 2005-09-16 | 2012-06-28 | Pasquale Catalfamo | Abrasive body |
DE102007015502A1 (en) * | 2007-03-30 | 2008-10-02 | Advanced Micro Devices, Inc., Sunnyvale | CMP system with an eddy current sensor of lower height |
BRPI0812774A2 (en) | 2007-06-06 | 2014-12-02 | Novus Int Inc | FOOD SUPPLEMENTS FOR PROMOTING GROWTH, REPAIR AND MAINTENANCE OF BONE AND JOINTS |
TWI444248B (en) * | 2007-08-15 | 2014-07-11 | 羅門哈斯電子材料Cmp控股公司 | Chemical mechanical polishing method |
US7458885B1 (en) * | 2007-08-15 | 2008-12-02 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad and methods of making and using same |
US8221196B2 (en) * | 2007-08-15 | 2012-07-17 | Rohm And Haas Electronic Materials Cmp Holdings, Inc. | Chemical mechanical polishing pad and methods of making and using same |
CN102159361B (en) * | 2008-07-18 | 2014-11-05 | 3M创新有限公司 | Polishing pad with floating elements and method of making and using same |
JP5710353B2 (en) * | 2011-04-15 | 2015-04-30 | 富士紡ホールディングス株式会社 | Polishing pad and manufacturing method thereof |
ES2700581T3 (en) * | 2012-06-28 | 2019-02-18 | Dow Global Technologies Llc | A composite material, method to produce it and articles obtained from it |
SG11201601175WA (en) * | 2013-08-22 | 2016-03-30 | Cabot Microelectronics Corp | Polishing pad with porous interface and solid core, and related apparatus and methods |
KR101632718B1 (en) * | 2013-09-30 | 2016-06-22 | 주식회사 엘지화학 | Poly-urethane mounting pad |
US20150298284A1 (en) * | 2014-04-21 | 2015-10-22 | Applied Materials, Inc. | Polishing System with Front Side Pressure Control |
EP3192844B1 (en) * | 2016-01-12 | 2021-02-24 | Eoswiss Engineering Sarl | Method and device for chemical mechanical polishing |
KR20180092668A (en) * | 2017-02-10 | 2018-08-20 | 엘지이노텍 주식회사 | Magnetic sheet and wireless power receiving apparatus including the same |
WO2019139586A1 (en) * | 2018-01-11 | 2019-07-18 | Intel Corporation | Magnetic polishing pad and platen structures for chemical mechanical polishing |
US20220023991A1 (en) * | 2018-11-27 | 2022-01-27 | 3M Innovative Properties Company | Polishing pads and systems and methods of making and using the same |
CN109759966B (en) * | 2019-02-22 | 2023-07-28 | 华侨大学 | Manufacturing method of flexible polishing particle magnetic arrangement polishing disc |
JP7264775B2 (en) * | 2019-09-03 | 2023-04-25 | エヌ・ティ・ティ・アドバンステクノロジ株式会社 | Optical connector polishing pad |
CN110788743B (en) * | 2019-09-23 | 2021-11-09 | 湖南科技大学 | Magnetic field controllable slow-release magnetic substance thickening fluid flow polishing pad and polishing method |
JP7105334B2 (en) * | 2020-03-17 | 2022-07-22 | エスケーシー ソルミックス カンパニー,リミテッド | Polishing pad and method for manufacturing semiconductor device using the same |
CN112608597B (en) * | 2020-12-04 | 2022-03-04 | 四川大学 | High-energy-storage-density polymer composite material and preparation method thereof |
JP2022158419A (en) * | 2021-04-02 | 2022-10-17 | 株式会社荏原製作所 | Polishing pad, polishing device, and polishing method |
CN113263438A (en) * | 2021-05-20 | 2021-08-17 | 湘潭大学 | Bearing head for controlling polishing pressure and using method thereof |
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US496218A (en) * | 1893-04-25 | Combined rail-joint and tie | ||
US5196353A (en) * | 1992-01-03 | 1993-03-23 | Micron Technology, Inc. | Method for controlling a semiconductor (CMP) process by measuring a surface temperature and developing a thermal image of the wafer |
US5578238A (en) * | 1992-10-30 | 1996-11-26 | Lord Corporation | Magnetorheological materials utilizing surface-modified particles |
US6614529B1 (en) * | 1992-12-28 | 2003-09-02 | Applied Materials, Inc. | In-situ real-time monitoring technique and apparatus for endpoint detection of thin films during chemical/mechanical polishing planarization |
US5658183A (en) * | 1993-08-25 | 1997-08-19 | Micron Technology, Inc. | System for real-time control of semiconductor wafer polishing including optical monitoring |
US5433651A (en) * | 1993-12-22 | 1995-07-18 | International Business Machines Corporation | In-situ endpoint detection and process monitoring method and apparatus for chemical-mechanical polishing |
JP3270282B2 (en) * | 1994-02-21 | 2002-04-02 | 株式会社東芝 | Semiconductor manufacturing apparatus and semiconductor device manufacturing method |
US5489233A (en) * | 1994-04-08 | 1996-02-06 | Rodel, Inc. | Polishing pads and methods for their use |
JP3313505B2 (en) * | 1994-04-14 | 2002-08-12 | 株式会社日立製作所 | Polishing method |
WO1995029039A1 (en) * | 1994-04-22 | 1995-11-02 | Kabushiki Kaisha Toshiba | Separation type grinding surface plate and grinding apparatus using same |
US5893796A (en) * | 1995-03-28 | 1999-04-13 | Applied Materials, Inc. | Forming a transparent window in a polishing pad for a chemical mechanical polishing apparatus |
US5964643A (en) * | 1995-03-28 | 1999-10-12 | Applied Materials, Inc. | Apparatus and method for in-situ monitoring of chemical mechanical polishing operations |
JP3305557B2 (en) * | 1995-04-10 | 2002-07-22 | 大日本印刷株式会社 | Polishing tape, method for producing the same, and coating agent for the polishing tape |
US5838447A (en) * | 1995-07-20 | 1998-11-17 | Ebara Corporation | Polishing apparatus including thickness or flatness detector |
US5915915A (en) * | 1996-03-07 | 1999-06-29 | Komag, Incorporated | End effector and method for loading and unloading disks at a processing station |
JP3471520B2 (en) * | 1996-04-30 | 2003-12-02 | 富士通株式会社 | Method of manufacturing magnetoresistive head and method of manufacturing magnetoresistive head |
US5872633A (en) * | 1996-07-26 | 1999-02-16 | Speedfam Corporation | Methods and apparatus for detecting removal of thin film layers during planarization |
JPH10180611A (en) * | 1996-12-24 | 1998-07-07 | Takahiro Imahashi | Magnetic grinding method and device based on generation of plurality of alternating fields |
US6033293A (en) * | 1997-10-08 | 2000-03-07 | Lucent Technologies Inc. | Apparatus for performing chemical-mechanical polishing |
US6083839A (en) * | 1997-12-31 | 2000-07-04 | Intel Corporation | Unique chemical mechanical planarization approach which utilizes magnetic slurry for polish and magnetic fields for process control |
US6602380B1 (en) * | 1998-10-28 | 2003-08-05 | Micron Technology, Inc. | Method and apparatus for releasably attaching a polishing pad to a chemical-mechanical planarization machine |
US6719615B1 (en) * | 2000-10-10 | 2004-04-13 | Beaver Creek Concepts Inc | Versatile wafer refining |
US6224474B1 (en) * | 1999-01-06 | 2001-05-01 | Buehler, Ltd. | Magnetic disc system for grinding or polishing specimens |
US6059638A (en) * | 1999-01-25 | 2000-05-09 | Lucent Technologies Inc. | Magnetic force carrier and ring for a polishing apparatus |
US6297159B1 (en) * | 1999-07-07 | 2001-10-02 | Advanced Micro Devices, Inc. | Method and apparatus for chemical polishing using field responsive materials |
US6884153B2 (en) * | 2000-02-17 | 2005-04-26 | Applied Materials, Inc. | Apparatus for electrochemical processing |
US6979248B2 (en) * | 2002-05-07 | 2005-12-27 | Applied Materials, Inc. | Conductive polishing article for electrochemical mechanical polishing |
US6436828B1 (en) * | 2000-05-04 | 2002-08-20 | Applied Materials, Inc. | Chemical mechanical polishing using magnetic force |
US6358118B1 (en) * | 2000-06-30 | 2002-03-19 | Lam Research Corporation | Field controlled polishing apparatus and method |
US20020016139A1 (en) * | 2000-07-25 | 2002-02-07 | Kazuto Hirokawa | Polishing tool and manufacturing method therefor |
US6383065B1 (en) * | 2001-01-22 | 2002-05-07 | Cabot Microelectronics Corporation | Catalytic reactive pad for metal CMP |
US6623331B2 (en) * | 2001-02-16 | 2003-09-23 | Cabot Microelectronics Corporation | Polishing disk with end-point detection port |
EP1374310A4 (en) * | 2001-03-14 | 2008-02-20 | Univ Massachusetts | Nanofabrication |
US7097549B2 (en) * | 2001-12-20 | 2006-08-29 | Ppg Industries Ohio, Inc. | Polishing pad |
US6776688B2 (en) * | 2002-10-21 | 2004-08-17 | Texas Instruments Incorporated | Real-time polishing pad stiffness-control using magnetically controllable fluid |
KR100506934B1 (en) * | 2003-01-10 | 2005-08-05 | 삼성전자주식회사 | Polishing apparatus and the polishing method using the same |
US6935929B2 (en) * | 2003-04-28 | 2005-08-30 | Micron Technology, Inc. | Polishing machines including under-pads and methods for mechanical and/or chemical-mechanical polishing of microfeature workpieces |
US6998166B2 (en) * | 2003-06-17 | 2006-02-14 | Cabot Microelectronics Corporation | Polishing pad with oriented pore structure |
US20050241239A1 (en) * | 2004-04-30 | 2005-11-03 | Chien-Min Sung | Abrasive composite tools having compositional gradients and associated methods |
-
2005
- 2005-06-21 US US11/158,185 patent/US20060286906A1/en not_active Abandoned
-
2006
- 2006-05-24 JP JP2008518179A patent/JP2008546551A/en not_active Withdrawn
- 2006-05-24 KR KR1020077029738A patent/KR20080020629A/en not_active Application Discontinuation
- 2006-05-24 WO PCT/US2006/020194 patent/WO2007001700A2/en active Application Filing
- 2006-05-24 CN CNA2006800224133A patent/CN101203355A/en active Pending
- 2006-05-24 EP EP06760367A patent/EP1915234A2/en not_active Withdrawn
- 2006-06-20 TW TW095122107A patent/TW200704477A/en unknown
-
2007
- 2007-11-27 IL IL187704A patent/IL187704A0/en unknown
Also Published As
Publication number | Publication date |
---|---|
WO2007001700A3 (en) | 2007-02-22 |
JP2008546551A (en) | 2008-12-25 |
EP1915234A2 (en) | 2008-04-30 |
KR20080020629A (en) | 2008-03-05 |
CN101203355A (en) | 2008-06-18 |
IL187704A0 (en) | 2008-08-07 |
WO2007001700A2 (en) | 2007-01-04 |
US20060286906A1 (en) | 2006-12-21 |
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