TW200700733A - Flat-type probe apparatus for inspecting flat panel display device - Google Patents

Flat-type probe apparatus for inspecting flat panel display device

Info

Publication number
TW200700733A
TW200700733A TW094135043A TW94135043A TW200700733A TW 200700733 A TW200700733 A TW 200700733A TW 094135043 A TW094135043 A TW 094135043A TW 94135043 A TW94135043 A TW 94135043A TW 200700733 A TW200700733 A TW 200700733A
Authority
TW
Taiwan
Prior art keywords
probe
flat
display device
panel display
inspecting
Prior art date
Application number
TW094135043A
Other languages
English (en)
Other versions
TWI287091B (en
Inventor
Soon-Cheol Choi
Original Assignee
Kodi S Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Kodi S Co Ltd filed Critical Kodi S Co Ltd
Publication of TW200700733A publication Critical patent/TW200700733A/zh
Application granted granted Critical
Publication of TWI287091B publication Critical patent/TWI287091B/zh

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/06—Measuring leads; Measuring probes
    • G01R1/067—Measuring probes
    • G01R1/073—Multiple probes
    • G01R1/07307—Multiple probes with individual probe elements, e.g. needles, cantilever beams or bump contacts, fixed in relation to each other, e.g. bed of nails fixture or probe card
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G—PHYSICS
    • G09—EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09G—ARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00—Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/006—Electronic inspection or testing of displays and display drivers, e.g. of LED or LCD displays

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • General Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Measuring Leads Or Probes (AREA)
  • Liquid Crystal (AREA)
TW094135043A 2005-06-21 2005-10-07 Flat-type probe apparatus for inspecting flat panel display device TWI287091B (en)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
KR1020050053340A KR100638106B1 (ko) 2005-06-21 2005-06-21 평판형 디스플레이장치 검사용 프로브장치

Publications (2)

Publication Number Publication Date
TW200700733A true TW200700733A (en) 2007-01-01
TWI287091B TWI287091B (en) 2007-09-21

Family

ID=37621827

Family Applications (1)

Application Number Title Priority Date Filing Date
TW094135043A TWI287091B (en) 2005-06-21 2005-10-07 Flat-type probe apparatus for inspecting flat panel display device

Country Status (2)

Country Link
KR (1) KR100638106B1 (zh)
TW (1) TWI287091B (zh)

Cited By (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113848356A (zh) * 2021-10-25 2021-12-28 武汉精毅通电子技术有限公司 一种探针模组及其制备方法

Families Citing this family (1)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100854757B1 (ko) * 2007-01-25 2008-08-27 주식회사 나노픽셀 프로브 및 이를 이용한 디스플레이 패널 검사용 프로브블록

Family Cites Families (3)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2000214184A (ja) 1999-01-26 2000-08-04 Micronics Japan Co Ltd プロ―ブ装置
JP4171148B2 (ja) 1999-11-12 2008-10-22 株式会社日本マイクロニクス プローブ装置
JP2001004662A (ja) 1999-06-22 2001-01-12 Micronics Japan Co Ltd プローブ装置

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN113848356A (zh) * 2021-10-25 2021-12-28 武汉精毅通电子技术有限公司 一种探针模组及其制备方法
CN113848356B (zh) * 2021-10-25 2024-05-03 武汉精毅通电子技术有限公司 一种探针模组及其制备方法

Also Published As

Publication number Publication date
TWI287091B (en) 2007-09-21
KR100638106B1 (ko) 2006-10-24

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Legal Events

Date Code Title Description
MM4A Annulment or lapse of patent due to non-payment of fees