TW200700168A - Method and system for processing substrates with sonic energy that reduces or eliminates damage to semiconductor devices - Google Patents
Method and system for processing substrates with sonic energy that reduces or eliminates damage to semiconductor devicesInfo
- Publication number
- TW200700168A TW200700168A TW095107855A TW95107855A TW200700168A TW 200700168 A TW200700168 A TW 200700168A TW 095107855 A TW095107855 A TW 095107855A TW 95107855 A TW95107855 A TW 95107855A TW 200700168 A TW200700168 A TW 200700168A
- Authority
- TW
- Taiwan
- Prior art keywords
- sonic energy
- reduces
- semiconductor devices
- processing substrates
- eliminates damage
- Prior art date
Links
Classifications
-
- B—PERFORMING OPERATIONS; TRANSPORTING
- B08—CLEANING
- B08B—CLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
- B08B3/00—Cleaning by methods involving the use or presence of liquid or steam
- B08B3/04—Cleaning involving contact with liquid
- B08B3/10—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration
- B08B3/12—Cleaning involving contact with liquid with additional treatment of the liquid or of the object being cleaned, e.g. by heat, by electricity or by vibration by sonic or ultrasonic vibrations
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01L—SEMICONDUCTOR DEVICES NOT COVERED BY CLASS H10
- H01L21/00—Processes or apparatus adapted for the manufacture or treatment of semiconductor or solid state devices or of parts thereof
- H01L21/67—Apparatus specially adapted for handling semiconductor or electric solid state devices during manufacture or treatment thereof; Apparatus specially adapted for handling wafers during manufacture or treatment of semiconductor or electric solid state devices or components ; Apparatus not specifically provided for elsewhere
- H01L21/67005—Apparatus not specifically provided for elsewhere
- H01L21/67011—Apparatus for manufacture or treatment
- H01L21/67017—Apparatus for fluid treatment
- H01L21/67028—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like
- H01L21/6704—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing
- H01L21/67051—Apparatus for fluid treatment for cleaning followed by drying, rinsing, stripping, blasting or the like for wet cleaning or washing using mainly spraying means, e.g. nozzles
Landscapes
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Power Engineering (AREA)
- Cleaning Or Drying Semiconductors (AREA)
Applications Claiming Priority (2)
Application Number | Priority Date | Filing Date | Title |
---|---|---|---|
US65956605P | 2005-03-08 | 2005-03-08 | |
US66050705P | 2005-03-10 | 2005-03-10 |
Publications (1)
Publication Number | Publication Date |
---|---|
TW200700168A true TW200700168A (en) | 2007-01-01 |
Family
ID=36954027
Family Applications (1)
Application Number | Title | Priority Date | Filing Date |
---|---|---|---|
TW095107855A TW200700168A (en) | 2005-03-08 | 2006-03-08 | Method and system for processing substrates with sonic energy that reduces or eliminates damage to semiconductor devices |
Country Status (3)
Country | Link |
---|---|
US (2) | US20060260638A1 (zh) |
TW (1) | TW200700168A (zh) |
WO (1) | WO2006096814A2 (zh) |
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI400606B (zh) * | 2007-06-27 | 2013-07-01 | Semes Co Ltd | 用於探針檢測器操作比率之計算系統及其計算方法 |
Families Citing this family (12)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US7571059B2 (en) * | 2006-06-28 | 2009-08-04 | Sun Microsystems, Inc. | Mechanism for determining an accelerated test specification for device elements |
US8045605B2 (en) * | 2006-12-25 | 2011-10-25 | Advantest Corporation | Jitter amplifier circuit, signal generation circuit, semiconductor chip, and test apparatus |
US9228785B2 (en) | 2010-05-04 | 2016-01-05 | Alexander Poltorak | Fractal heat transfer device |
US10852069B2 (en) | 2010-05-04 | 2020-12-01 | Fractal Heatsink Technologies, LLC | System and method for maintaining efficiency of a fractal heat sink |
CN102468126B (zh) * | 2010-11-05 | 2013-10-23 | 无锡华润上华半导体有限公司 | 圆片清洗方法 |
US9155140B2 (en) * | 2012-06-07 | 2015-10-06 | Gabriel Yavor | Optical waveform generator |
EP3021649B1 (en) * | 2013-07-10 | 2020-02-19 | FUJI Corporation | Method for managing and device for managing nozzle cleaning period |
US11257667B2 (en) | 2016-04-06 | 2022-02-22 | Acm Research (Shanghai) Inc. | Methods and apparatus for cleaning semiconductor wafers |
US10830545B2 (en) | 2016-07-12 | 2020-11-10 | Fractal Heatsink Technologies, LLC | System and method for maintaining efficiency of a heat sink |
WO2019018446A1 (en) | 2017-07-17 | 2019-01-24 | Fractal Heatsink Technologies, LLC | SYSTEM AND METHOD FOR MULTI-FRACTAL THERMAL DISSIPATOR |
CN111386157B (zh) * | 2017-11-15 | 2022-12-27 | 盛美半导体设备(上海)股份有限公司 | 用于清洗半导体晶圆的方法 |
CN117672817B (zh) * | 2024-01-31 | 2024-05-07 | 粤芯半导体技术股份有限公司 | 含氟气体刻蚀残留物的清洗方法、晶圆及其制备方法 |
Family Cites Families (7)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
US2003A (en) * | 1841-03-12 | Improvement in horizontal windivhlls | ||
AU2552492A (en) * | 1991-08-23 | 1993-03-16 | United States of America as represented by The Secretary Department of Health and Human Services, The | Raf protein kinase therapeutics |
US6039059A (en) * | 1996-09-30 | 2000-03-21 | Verteq, Inc. | Wafer cleaning system |
KR100566911B1 (ko) * | 2001-06-25 | 2006-04-03 | 주식회사 삼양사 | 약물 전달체용 음이온기-함유 양친성 블록 공중합체 및 그의 양이온성 약물과의 복합체 |
US6845778B2 (en) * | 2002-03-29 | 2005-01-25 | Lam Research Corporation | In-situ local heating using megasonic transducer resonator |
US7185661B2 (en) * | 2002-05-06 | 2007-03-06 | Akrion Technologies, Inc. | Reciprocating megasonic probe |
US6880560B2 (en) * | 2002-11-18 | 2005-04-19 | Techsonic | Substrate processing apparatus for processing substrates using dense phase gas and sonic waves |
-
2006
- 2006-03-08 US US11/370,361 patent/US20060260638A1/en not_active Abandoned
- 2006-03-08 US US11/370,707 patent/US20060260639A1/en not_active Abandoned
- 2006-03-08 TW TW095107855A patent/TW200700168A/zh unknown
- 2006-03-08 WO PCT/US2006/008452 patent/WO2006096814A2/en active Application Filing
Cited By (1)
Publication number | Priority date | Publication date | Assignee | Title |
---|---|---|---|---|
TWI400606B (zh) * | 2007-06-27 | 2013-07-01 | Semes Co Ltd | 用於探針檢測器操作比率之計算系統及其計算方法 |
Also Published As
Publication number | Publication date |
---|---|
WO2006096814A2 (en) | 2006-09-14 |
WO2006096814A3 (en) | 2007-01-25 |
US20060260639A1 (en) | 2006-11-23 |
US20060260638A1 (en) | 2006-11-23 |
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