TW200642221A - Method for testing electrical parameters, light form and angle of divergence of laser diode - Google Patents

Abstract

The present invention provides a method for testing electrical parameters, light form and angle of divergence of a laser diode. Particularly, the present invention can increase the efficiency in measuring response characteristic of electrical parameters, light form and angle of divergence of a laser. The invented method comprises: (1) the test for electrical parameters of a laser diode, which comprises the use of an alternating measurement process to effectively reduce the overall time required in measuring the response characteristic in which a test signal is inputted to perform a first-stage pulse measurement on a first under-test device (e.g. a laser diode with wavelength a), and another test signal is inputted to perform a first-stage pulse measurement on a second under-test device (e.g. a laser diode with wavelength b) when the first under-test device is waiting for the next-stage pulse measurement; (2) the test of light form and angle of divergence of a laser diode, in which a rotary measurement bar is used, together with one or more sets of photo diodes, for measurement, a driving electrical current is alternatively applied to a first under-test device (e.g. laser diode with wavelength a) and a second under-test device (e.g. laser diode with wavelength b) when a set of photo diode is under test, so that the rotary measurement bar, during its scanning measurement process, can distinguish and record the light form, angle of divergence responses alternatively emitted from the first and the second under-test devices, thereby effectively reducing the overall measurement time.